CH497795A - Field effect transistor with a protective diode - Google Patents

Field effect transistor with a protective diode

Info

Publication number
CH497795A
CH497795A CH1531069A CH1531069A CH497795A CH 497795 A CH497795 A CH 497795A CH 1531069 A CH1531069 A CH 1531069A CH 1531069 A CH1531069 A CH 1531069A CH 497795 A CH497795 A CH 497795A
Authority
CH
Switzerland
Prior art keywords
field effect
effect transistor
protective diode
diode
protective
Prior art date
Application number
CH1531069A
Other languages
German (de)
Inventor
Klaus Dipl Ing Reindl
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of CH497795A publication Critical patent/CH497795A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0248Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0248Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0255Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Formation Of Insulating Films (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
CH1531069A 1968-10-16 1969-10-13 Field effect transistor with a protective diode CH497795A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19681803392 DE1803392A1 (en) 1968-10-16 1968-10-16 Protection device for a field effect transistor

Publications (1)

Publication Number Publication Date
CH497795A true CH497795A (en) 1970-10-15

Family

ID=5710660

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1531069A CH497795A (en) 1968-10-16 1969-10-13 Field effect transistor with a protective diode

Country Status (7)

Country Link
AT (1) AT303819B (en)
CH (1) CH497795A (en)
DE (1) DE1803392A1 (en)
FR (1) FR2020823A1 (en)
GB (1) GB1229385A (en)
NL (1) NL6913792A (en)
SE (1) SE343431B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5910587B2 (en) * 1977-08-10 1984-03-09 株式会社日立製作所 Semiconductor device protection device
KR920007171A (en) * 1990-09-05 1992-04-28 김광호 High Reliability Semiconductor Device
DE102006052863B4 (en) 2006-11-09 2018-03-01 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Protective structure for semiconductor sensors and their use
US9514995B1 (en) 2015-05-21 2016-12-06 Globalfoundries Inc. Implant-free punch through doping layer formation for bulk FinFET structures

Also Published As

Publication number Publication date
FR2020823A1 (en) 1970-07-17
NL6913792A (en) 1970-04-20
SE343431B (en) 1972-03-06
DE1803392A1 (en) 1970-06-18
GB1229385A (en) 1971-04-21
AT303819B (en) 1972-12-11

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Legal Events

Date Code Title Description
PL Patent ceased