AT266922B - Method for producing a protective layer from a semiconductor nitrogen compound for semiconductor purposes - Google Patents
Method for producing a protective layer from a semiconductor nitrogen compound for semiconductor purposesInfo
- Publication number
- AT266922B AT266922B AT404767A AT404767A AT266922B AT 266922 B AT266922 B AT 266922B AT 404767 A AT404767 A AT 404767A AT 404767 A AT404767 A AT 404767A AT 266922 B AT266922 B AT 266922B
- Authority
- AT
- Austria
- Prior art keywords
- semiconductor
- producing
- protective layer
- nitrogen compound
- purposes
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 229910017464 nitrogen compound Inorganic materials 0.000 title 1
- 150000002830 nitrogen compounds Chemical class 0.000 title 1
- 239000011241 protective layer Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
- C23C16/345—Silicon nitride
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/0217—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02211—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound being a silane, e.g. disilane, methylsilane or chlorosilane
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/291—Oxides or nitrides or carbides, e.g. ceramics, glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES0103578 | 1966-05-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
AT266922B true AT266922B (en) | 1968-12-10 |
Family
ID=7525306
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT404767A AT266922B (en) | 1966-05-02 | 1967-04-28 | Method for producing a protective layer from a semiconductor nitrogen compound for semiconductor purposes |
Country Status (4)
Country | Link |
---|---|
AT (1) | AT266922B (en) |
CH (1) | CH488290A (en) |
GB (1) | GB1134352A (en) |
NL (1) | NL6703526A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2557079A1 (en) * | 1975-12-18 | 1977-06-30 | Ibm Deutschland | METHOD FOR PRODUCING A MASKING LAYER |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4066037A (en) * | 1975-12-17 | 1978-01-03 | Lfe Corportion | Apparatus for depositing dielectric films using a glow discharge |
-
1967
- 1967-03-06 NL NL6703526A patent/NL6703526A/xx unknown
- 1967-04-28 CH CH615267A patent/CH488290A/en not_active IP Right Cessation
- 1967-04-28 AT AT404767A patent/AT266922B/en active
- 1967-05-01 GB GB19916/67A patent/GB1134352A/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2557079A1 (en) * | 1975-12-18 | 1977-06-30 | Ibm Deutschland | METHOD FOR PRODUCING A MASKING LAYER |
Also Published As
Publication number | Publication date |
---|---|
NL6703526A (en) | 1967-11-03 |
DE1544288A1 (en) | 1970-03-05 |
DE1544288B2 (en) | 1975-06-12 |
GB1134352A (en) | 1968-11-20 |
CH488290A (en) | 1970-03-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CH505473A (en) | Method of manufacturing a semiconductor device | |
CH532959A (en) | Process for crystallizing a binary semiconductor compound | |
CH512144A (en) | Method for manufacturing a semiconductor device | |
CH432656A (en) | Method for manufacturing a semiconductor device | |
CH516227A (en) | Method of manufacturing a junction semiconductor device | |
CH403436A (en) | Method for manufacturing a semiconductor device | |
CH498490A (en) | Method for manufacturing a semiconductor component | |
CH497793A (en) | Process for producing a protective layer from a silicon or germanium nitrogen compound on the surface of a semiconductor crystal | |
AT307504B (en) | Method for manufacturing a semiconductor component | |
CH525027A (en) | Method for epitaxially depositing a semiconductor compound | |
CH516476A (en) | Method for producing a crystal of a compound semiconductor | |
AT256940B (en) | Method for producing an epitaxial, crystalline layer, in particular a semiconductor layer | |
CH458299A (en) | Method for producing a monocrystalline semiconductor layer | |
DE1800347B2 (en) | METHOD OF MANUFACTURING A SEMICONDUCTOR ARRANGEMENT | |
CH416575A (en) | Method for manufacturing a semiconductor device | |
AT266922B (en) | Method for producing a protective layer from a semiconductor nitrogen compound for semiconductor purposes | |
AT318009B (en) | Method for producing a metal layer from a plurality of metal films on surfaces of semiconductor components | |
CH519790A (en) | Method for manufacturing a semiconductor device | |
CH457630A (en) | Method for manufacturing a semiconductor detector | |
AT292786B (en) | METHOD OF MANUFACTURING A SEMICONDUCTOR ARRANGEMENT | |
CH436504A (en) | Method for producing a line from superconductor wire | |
CH470759A (en) | Method for manufacturing a semiconductor component | |
CH468721A (en) | Method for the simultaneous manufacture of a multiplicity of semiconductor components | |
CH452708A (en) | Method for producing a semiconductor device consisting of semiconductor regions isolated from one another | |
CH500592A (en) | Method for producing epitaxial semiconductor layers on a substrate body |