AR122054A1 - Propiedades materiales de imagen bidimensional - Google Patents

Propiedades materiales de imagen bidimensional

Info

Publication number
AR122054A1
AR122054A1 ARP210101279A ARP210101279A AR122054A1 AR 122054 A1 AR122054 A1 AR 122054A1 AR P210101279 A ARP210101279 A AR P210101279A AR P210101279 A ARP210101279 A AR P210101279A AR 122054 A1 AR122054 A1 AR 122054A1
Authority
AR
Argentina
Prior art keywords
rock
digital
rock sample
fabrics
planes
Prior art date
Application number
ARP210101279A
Other languages
English (en)
Inventor
Nirjhor Chakraborty
Glen L Gettemy
Original Assignee
Bp America
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bp America filed Critical Bp America
Publication of AR122054A1 publication Critical patent/AR122054A1/es

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24—Earth materials
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/143—Segmentation; Edge detection involving probabilistic approaches, e.g. Markov random field [MRF] modelling
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/174—Segmentation; Edge detection involving the use of two or more images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/97—Determining parameters from multiple pictures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/418—Imaging electron microscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/507—Detectors secondary-emission detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G06T2207/10061—Microscopic image from scanning electron microscope
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10072—Tomographic images
    • G06T2207/10081—Computed x-ray tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30181—Earth observation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Software Systems (AREA)
  • Food Science & Technology (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Remote Sensing (AREA)
  • Medicinal Chemistry (AREA)
  • Geometry (AREA)
  • Computer Graphics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Quality & Reliability (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

Un método para analizar una muestra de roca incluye segmentar un volumen de imagen digital correspondiente a una imagen de la muestra de roca, para asociar vóxeles en el volumen de imagen digital con una pluralidad de fábricas de roca de la muestra de roca. El método también incluye la identificación de un conjunto de planos digitales a través del volumen de imagen digital. El conjunto de planos digitales se intersecta con cada una de la pluralidad de fábricas de roca. El método incluye además el mecanizado de la muestra de roca para exponer las caras físicas que corresponden a los planos digitales identificados, la realización de imágenes de microscopio electrónico de barrido (SEM) de las caras físicas para generar imágenes SEM bidimensionales (2D) de las caras físicas, y la realización de procesamiento de imágenes en las imágenes SEM para determinar una propiedad material asociada a cada una de las fábricas de roca.
ARP210101279A 2020-05-08 2021-05-11 Propiedades materiales de imagen bidimensional AR122054A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US202063021885P 2020-05-08 2020-05-08

Publications (1)

Publication Number Publication Date
AR122054A1 true AR122054A1 (es) 2022-08-10

Family

ID=76197642

Family Applications (3)

Application Number Title Priority Date Filing Date
ARP210101279A AR122054A1 (es) 2020-05-08 2021-05-11 Propiedades materiales de imagen bidimensional
ARP210101280A AR122055A1 (es) 2020-05-08 2021-05-11 Propiedades materiales de imagen bidimensional
ARP210101278A AR122053A1 (es) 2020-05-08 2021-05-11 Propiedades materiales de imagen bidimensional

Family Applications After (2)

Application Number Title Priority Date Filing Date
ARP210101280A AR122055A1 (es) 2020-05-08 2021-05-11 Propiedades materiales de imagen bidimensional
ARP210101278A AR122053A1 (es) 2020-05-08 2021-05-11 Propiedades materiales de imagen bidimensional

Country Status (9)

Country Link
US (3) US11530997B2 (es)
EP (3) EP4147201A1 (es)
CN (3) CN115668288A (es)
AR (3) AR122054A1 (es)
AU (3) AU2021269135A1 (es)
BR (3) BR112022022579A2 (es)
CA (3) CA3177809A1 (es)
MX (3) MX2022013992A (es)
WO (3) WO2021226593A1 (es)

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US20230244072A1 (en) * 2022-01-31 2023-08-03 Saudi Arabian Oil Company Quantifying effects of dolomitization on porosity under petrographic microscope
CN115375680B (zh) * 2022-10-24 2023-02-03 中国煤炭地质总局勘查研究总院 矿物智能识别方法、装置及存储介质

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Also Published As

Publication number Publication date
US11982635B2 (en) 2024-05-14
AU2021269135A1 (en) 2022-12-08
US20210349042A1 (en) 2021-11-11
AU2021268363A1 (en) 2022-12-08
CN115552461A (zh) 2022-12-30
MX2022013993A (es) 2023-02-09
AR122055A1 (es) 2022-08-10
BR112022022575A2 (pt) 2023-01-17
WO2021226595A1 (en) 2021-11-11
CN115668287A (zh) 2023-01-31
MX2022013992A (es) 2023-03-09
WO2021226593A1 (en) 2021-11-11
BR112022022579A2 (pt) 2023-01-17
US20210349041A1 (en) 2021-11-11
EP4147201A1 (en) 2023-03-15
AU2021266799A1 (en) 2022-12-08
CA3177809A1 (en) 2021-11-11
MX2022013995A (es) 2023-02-09
BR112022022560A2 (pt) 2023-01-17
US11530997B2 (en) 2022-12-20
CA3177655A1 (en) 2021-11-11
US20210349070A1 (en) 2021-11-11
WO2021226594A1 (en) 2021-11-11
EP4147200A1 (en) 2023-03-15
CN115668288A (zh) 2023-01-31
AR122053A1 (es) 2022-08-10
US11885757B2 (en) 2024-01-30
CA3177815A1 (en) 2021-11-11
EP4147198A1 (en) 2023-03-15

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