BR112022022575A2 - Propriedades materiais a partir de imagem bidimensional - Google Patents

Propriedades materiais a partir de imagem bidimensional

Info

Publication number
BR112022022575A2
BR112022022575A2 BR112022022575A BR112022022575A BR112022022575A2 BR 112022022575 A2 BR112022022575 A2 BR 112022022575A2 BR 112022022575 A BR112022022575 A BR 112022022575A BR 112022022575 A BR112022022575 A BR 112022022575A BR 112022022575 A2 BR112022022575 A2 BR 112022022575A2
Authority
BR
Brazil
Prior art keywords
sem
image
dimensional
images
material properties
Prior art date
Application number
BR112022022575A
Other languages
English (en)
Inventor
L Gettemy Glen
Chakraborty Nirjhor
Saidian Milad
Original Assignee
Bp Corp North America Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bp Corp North America Inc filed Critical Bp Corp North America Inc
Publication of BR112022022575A2 publication Critical patent/BR112022022575A2/pt

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24Earth materials
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00Three dimensional [3D] modelling, e.g. data description of 3D objects
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/11Region-based segmentation
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/136Segmentation; Edge detection involving thresholding
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/143Segmentation; Edge detection involving probabilistic approaches, e.g. Markov random field [MRF] modelling
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/174Segmentation; Edge detection involving the use of two or more images
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/97Determining parameters from multiple pictures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/401Imaging image processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/418Imaging electron microscope
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/50Detectors
    • G01N2223/507Detectors secondary-emission detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/616Specific applications or type of materials earth materials
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10024Color image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10056Microscopic image
    • G06T2207/10061Microscopic image from scanning electron microscope
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10072Tomographic images
    • G06T2207/10081Computed x-ray tomography [CT]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30181Earth observation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Software Systems (AREA)
  • Environmental & Geological Engineering (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Remote Sensing (AREA)
  • Geology (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Computer Graphics (AREA)
  • Geometry (AREA)
  • Probability & Statistics with Applications (AREA)
  • Quality & Reliability (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

PROPRIEDADES MATERIAIS A PARTIR DE IMAGEM BIDIMENSIONAL. Um método para analisar uma amostra de rocha inclui realizar imagens de microscópio eletrônico de varredura (SEM) de uma pluralidade de faces físicas de uma amostra de rocha para gerar imagens de SEM bidimensionais (2D) das faces físicas, aplicando uma função de correlação cruzada a uma primeira imagem de SEM 2D e uma segunda imagem de SEM 2D para gerar um volume de modelo digital tridimensional (3D) com base na primeira e segunda imagens de SEM 2D, e determinar uma distribuição de probabilidade de um tamanho de poro do volume de modelo digital 3D com base em um valor de intensidade de imagem de um pixel em cada uma dentre a primeira e segunda imagens de SEM 2D.
BR112022022575A 2020-05-08 2021-05-10 Propriedades materiais a partir de imagem bidimensional BR112022022575A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202063021885P 2020-05-08 2020-05-08
PCT/US2021/031619 WO2021226595A1 (en) 2020-05-08 2021-05-10 Material properties from two-dimensional image

Publications (1)

Publication Number Publication Date
BR112022022575A2 true BR112022022575A2 (pt) 2023-01-17

Family

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Family Applications (3)

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BR112022022579A BR112022022579A2 (pt) 2020-05-08 2021-05-10 Propriedades materiais a partir de imagem bidimensional
BR112022022575A BR112022022575A2 (pt) 2020-05-08 2021-05-10 Propriedades materiais a partir de imagem bidimensional
BR112022022560A BR112022022560A2 (pt) 2020-05-08 2021-05-10 Propriedades de material a partir de imagem bidimensional

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Country Status (9)

Country Link
US (3) US11885757B2 (pt)
EP (3) EP4147201A1 (pt)
CN (3) CN115668288A (pt)
AR (3) AR122055A1 (pt)
AU (3) AU2021266799A1 (pt)
BR (3) BR112022022579A2 (pt)
CA (3) CA3177655A1 (pt)
MX (3) MX2022013995A (pt)
WO (3) WO2021226595A1 (pt)

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CN115375680B (zh) * 2022-10-24 2023-02-03 中国煤炭地质总局勘查研究总院 矿物智能识别方法、装置及存储介质

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Also Published As

Publication number Publication date
CN115668288A (zh) 2023-01-31
CA3177809A1 (en) 2021-11-11
BR112022022579A2 (pt) 2023-01-17
WO2021226595A1 (en) 2021-11-11
AR122054A1 (es) 2022-08-10
AU2021266799A1 (en) 2022-12-08
EP4147200A1 (en) 2023-03-15
CA3177815A1 (en) 2021-11-11
US20210349042A1 (en) 2021-11-11
MX2022013995A (es) 2023-02-09
US20210349070A1 (en) 2021-11-11
MX2022013993A (es) 2023-02-09
BR112022022560A2 (pt) 2023-01-17
AU2021269135A1 (en) 2022-12-08
WO2021226594A1 (en) 2021-11-11
WO2021226593A1 (en) 2021-11-11
AU2021268363A1 (en) 2022-12-08
MX2022013992A (es) 2023-03-09
EP4147201A1 (en) 2023-03-15
US11885757B2 (en) 2024-01-30
AR122055A1 (es) 2022-08-10
US11982635B2 (en) 2024-05-14
CN115668287A (zh) 2023-01-31
CA3177655A1 (en) 2021-11-11
AR122053A1 (es) 2022-08-10
US11530997B2 (en) 2022-12-20
CN115552461A (zh) 2022-12-30
US20210349041A1 (en) 2021-11-11
EP4147198A1 (en) 2023-03-15

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Legal Events

Date Code Title Description
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B15K Others concerning applications: alteration of classification

Free format text: AS CLASSIFICACOES ANTERIORES ERAM: G06T 7/00 , G06T 7/11 , G06T 7/136

Ipc: G06T 7/11 (2017.01), G06T 7/136 (2017.01), G06T 7/