BR112022022575A2 - Propriedades materiais a partir de imagem bidimensional - Google Patents
Propriedades materiais a partir de imagem bidimensionalInfo
- Publication number
- BR112022022575A2 BR112022022575A2 BR112022022575A BR112022022575A BR112022022575A2 BR 112022022575 A2 BR112022022575 A2 BR 112022022575A2 BR 112022022575 A BR112022022575 A BR 112022022575A BR 112022022575 A BR112022022575 A BR 112022022575A BR 112022022575 A2 BR112022022575 A2 BR 112022022575A2
- Authority
- BR
- Brazil
- Prior art keywords
- sem
- image
- dimensional
- images
- material properties
- Prior art date
Links
- 239000000463 material Substances 0.000 title abstract 2
- 238000001878 scanning electron micrograph Methods 0.000 abstract 5
- 239000011435 rock Substances 0.000 abstract 2
- 238000005314 correlation function Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000011148 porous material Substances 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/24—Earth materials
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/11—Region-based segmentation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/136—Segmentation; Edge detection involving thresholding
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/143—Segmentation; Edge detection involving probabilistic approaches, e.g. Markov random field [MRF] modelling
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/174—Segmentation; Edge detection involving the use of two or more images
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/97—Determining parameters from multiple pictures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/401—Imaging image processing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/418—Imaging electron microscope
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/50—Detectors
- G01N2223/507—Detectors secondary-emission detector
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/616—Specific applications or type of materials earth materials
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10056—Microscopic image
- G06T2207/10061—Microscopic image from scanning electron microscope
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10072—Tomographic images
- G06T2207/10081—Computed x-ray tomography [CT]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30181—Earth observation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Software Systems (AREA)
- Environmental & Geological Engineering (AREA)
- Medicinal Chemistry (AREA)
- Food Science & Technology (AREA)
- Remote Sensing (AREA)
- Geology (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Computer Graphics (AREA)
- Geometry (AREA)
- Probability & Statistics with Applications (AREA)
- Quality & Reliability (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
PROPRIEDADES MATERIAIS A PARTIR DE IMAGEM BIDIMENSIONAL. Um método para analisar uma amostra de rocha inclui realizar imagens de microscópio eletrônico de varredura (SEM) de uma pluralidade de faces físicas de uma amostra de rocha para gerar imagens de SEM bidimensionais (2D) das faces físicas, aplicando uma função de correlação cruzada a uma primeira imagem de SEM 2D e uma segunda imagem de SEM 2D para gerar um volume de modelo digital tridimensional (3D) com base na primeira e segunda imagens de SEM 2D, e determinar uma distribuição de probabilidade de um tamanho de poro do volume de modelo digital 3D com base em um valor de intensidade de imagem de um pixel em cada uma dentre a primeira e segunda imagens de SEM 2D.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US202063021885P | 2020-05-08 | 2020-05-08 | |
PCT/US2021/031619 WO2021226595A1 (en) | 2020-05-08 | 2021-05-10 | Material properties from two-dimensional image |
Publications (1)
Publication Number | Publication Date |
---|---|
BR112022022575A2 true BR112022022575A2 (pt) | 2023-01-17 |
Family
ID=76197642
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112022022579A BR112022022579A2 (pt) | 2020-05-08 | 2021-05-10 | Propriedades materiais a partir de imagem bidimensional |
BR112022022575A BR112022022575A2 (pt) | 2020-05-08 | 2021-05-10 | Propriedades materiais a partir de imagem bidimensional |
BR112022022560A BR112022022560A2 (pt) | 2020-05-08 | 2021-05-10 | Propriedades de material a partir de imagem bidimensional |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112022022579A BR112022022579A2 (pt) | 2020-05-08 | 2021-05-10 | Propriedades materiais a partir de imagem bidimensional |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112022022560A BR112022022560A2 (pt) | 2020-05-08 | 2021-05-10 | Propriedades de material a partir de imagem bidimensional |
Country Status (9)
Country | Link |
---|---|
US (3) | US11885757B2 (pt) |
EP (3) | EP4147201A1 (pt) |
CN (3) | CN115668288A (pt) |
AR (3) | AR122055A1 (pt) |
AU (3) | AU2021266799A1 (pt) |
BR (3) | BR112022022579A2 (pt) |
CA (3) | CA3177655A1 (pt) |
MX (3) | MX2022013995A (pt) |
WO (3) | WO2021226595A1 (pt) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115668288A (zh) * | 2020-05-08 | 2023-01-31 | Bp北美公司 | 源自二维图像的材料性质 |
US20220207256A1 (en) * | 2020-12-30 | 2022-06-30 | Fei Company | Charged particle microscope systems and clustering processes for high dynamic range sample analysis |
US20230244072A1 (en) * | 2022-01-31 | 2023-08-03 | Saudi Arabian Oil Company | Quantifying effects of dolomitization on porosity under petrographic microscope |
CN115375680B (zh) * | 2022-10-24 | 2023-02-03 | 中国煤炭地质总局勘查研究总院 | 矿物智能识别方法、装置及存储介质 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2006132861A1 (en) * | 2005-06-03 | 2006-12-14 | Baker Hughes Incorporated | Pore-scale geometric models for interpetation of downhole formation evaluation data |
WO2009140738A1 (en) * | 2008-05-23 | 2009-11-26 | The Australian National University | Image data processing |
US20130168071A1 (en) * | 2010-05-20 | 2013-07-04 | Universiteit Gent | 3d porous material comprising machined side |
US9201026B2 (en) * | 2012-03-29 | 2015-12-01 | Ingrain, Inc. | Method and system for estimating properties of porous media such as fine pore or tight rocks |
US20140052420A1 (en) * | 2012-08-20 | 2014-02-20 | Ingrain Inc. | Digital Rock Analysis Systems and Methods that Estimate a Maturity Level |
CA2997249A1 (en) | 2012-11-01 | 2014-05-08 | Ingrain, Inc. | Characterization of rock and other samples by process and system for the preparation of samples using castable mounting materials |
US20140270393A1 (en) * | 2013-03-15 | 2014-09-18 | Bp Corporation North America Inc. | Systems and methods for improving direct numerical simulation of material properties from rock samples and determining uncertainty in the material properties |
CA2912191C (en) * | 2013-08-06 | 2021-06-15 | Bp Corporation North America Inc. | Image-based direct numerical simulation of petrophysical properties under simulated stress and strain conditions |
US10167704B2 (en) | 2013-08-28 | 2019-01-01 | Board Of Regents, The University Of Texas System | Reservoir pressure prediction and methods of execution |
US10551520B2 (en) * | 2014-11-13 | 2020-02-04 | Colorado School Of Mines | Surface relaxivity calculation using nuclear magnetic resonance (NMR) measurement, three dimensional (3D) rock model and NMR response simulation |
US10198804B2 (en) * | 2015-04-15 | 2019-02-05 | Halliburton Energy Services, Inc. | Method for determining fabric and upscaled properties of geological sample |
US10578568B2 (en) * | 2015-04-29 | 2020-03-03 | Colorado School Of Mines | Water/oil/gas emulsions/foams characterization using low field nuclear magnetic resonance |
US10184906B2 (en) * | 2015-05-06 | 2019-01-22 | Cgg Services Sas | Identification, quantification and prediction of free silicon in geological formation and its contribution to rock properties |
EP3358339B1 (en) * | 2015-10-02 | 2019-07-31 | Repsol, S.A. | Method for providing a numerical model of a sample of rock |
US10107769B2 (en) * | 2016-01-11 | 2018-10-23 | Carl Zeiss X-Ray Microscopy Inc. | Multimodality mineralogy segmentation system and method |
CA3125967A1 (en) * | 2019-01-08 | 2020-07-16 | Schlumberger Canada Limited | Methods and systems for characterizing a porous rock sample employing combined capillary pressure and nmr measurements |
US11530998B2 (en) * | 2019-01-10 | 2022-12-20 | Halliburton Energy Services, Inc. | Method and system to analyze geologic formation properties |
US11415501B2 (en) * | 2019-10-16 | 2022-08-16 | King Fahd University Of Petroleum And Minerals | Method of determining absolute permeability |
CN115668288A (zh) * | 2020-05-08 | 2023-01-31 | Bp北美公司 | 源自二维图像的材料性质 |
US20230408431A1 (en) * | 2020-11-03 | 2023-12-21 | Shell Oil Company | Calibrating direct flow simulations of rock samples |
US12098992B2 (en) * | 2021-03-31 | 2024-09-24 | Saudi Arabian Oil Company | Evaluating source rock permeability using 3D model |
US20230288606A1 (en) * | 2022-03-10 | 2023-09-14 | Bp Corporation North America Inc. | Flow simulation in porous media |
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2021
- 2021-05-10 CN CN202180036949.5A patent/CN115668288A/zh active Pending
- 2021-05-10 AU AU2021266799A patent/AU2021266799A1/en active Pending
- 2021-05-10 WO PCT/US2021/031619 patent/WO2021226595A1/en unknown
- 2021-05-10 WO PCT/US2021/031617 patent/WO2021226594A1/en unknown
- 2021-05-10 AU AU2021269135A patent/AU2021269135A1/en active Pending
- 2021-05-10 AU AU2021268363A patent/AU2021268363A1/en active Pending
- 2021-05-10 CA CA3177655A patent/CA3177655A1/en active Pending
- 2021-05-10 US US17/316,144 patent/US11885757B2/en active Active
- 2021-05-10 CA CA3177809A patent/CA3177809A1/en active Pending
- 2021-05-10 CN CN202180036866.6A patent/CN115668287A/zh active Pending
- 2021-05-10 EP EP21729385.1A patent/EP4147201A1/en active Pending
- 2021-05-10 MX MX2022013995A patent/MX2022013995A/es unknown
- 2021-05-10 MX MX2022013993A patent/MX2022013993A/es unknown
- 2021-05-10 MX MX2022013992A patent/MX2022013992A/es unknown
- 2021-05-10 BR BR112022022579A patent/BR112022022579A2/pt active Search and Examination
- 2021-05-10 CA CA3177815A patent/CA3177815A1/en active Pending
- 2021-05-10 CN CN202180033504.1A patent/CN115552461A/zh active Pending
- 2021-05-10 US US17/316,070 patent/US11530997B2/en active Active
- 2021-05-10 US US17/316,099 patent/US11982635B2/en active Active
- 2021-05-10 EP EP21729384.4A patent/EP4147200A1/en active Pending
- 2021-05-10 EP EP21729166.5A patent/EP4147198A1/en active Pending
- 2021-05-10 WO PCT/US2021/031614 patent/WO2021226593A1/en unknown
- 2021-05-10 BR BR112022022575A patent/BR112022022575A2/pt active Search and Examination
- 2021-05-10 BR BR112022022560A patent/BR112022022560A2/pt active Search and Examination
- 2021-05-11 AR ARP210101280A patent/AR122055A1/es unknown
- 2021-05-11 AR ARP210101279A patent/AR122054A1/es unknown
- 2021-05-11 AR ARP210101278A patent/AR122053A1/es unknown
Also Published As
Publication number | Publication date |
---|---|
CN115668288A (zh) | 2023-01-31 |
CA3177809A1 (en) | 2021-11-11 |
BR112022022579A2 (pt) | 2023-01-17 |
WO2021226595A1 (en) | 2021-11-11 |
AR122054A1 (es) | 2022-08-10 |
AU2021266799A1 (en) | 2022-12-08 |
EP4147200A1 (en) | 2023-03-15 |
CA3177815A1 (en) | 2021-11-11 |
US20210349042A1 (en) | 2021-11-11 |
MX2022013995A (es) | 2023-02-09 |
US20210349070A1 (en) | 2021-11-11 |
MX2022013993A (es) | 2023-02-09 |
BR112022022560A2 (pt) | 2023-01-17 |
AU2021269135A1 (en) | 2022-12-08 |
WO2021226594A1 (en) | 2021-11-11 |
WO2021226593A1 (en) | 2021-11-11 |
AU2021268363A1 (en) | 2022-12-08 |
MX2022013992A (es) | 2023-03-09 |
EP4147201A1 (en) | 2023-03-15 |
US11885757B2 (en) | 2024-01-30 |
AR122055A1 (es) | 2022-08-10 |
US11982635B2 (en) | 2024-05-14 |
CN115668287A (zh) | 2023-01-31 |
CA3177655A1 (en) | 2021-11-11 |
AR122053A1 (es) | 2022-08-10 |
US11530997B2 (en) | 2022-12-20 |
CN115552461A (zh) | 2022-12-30 |
US20210349041A1 (en) | 2021-11-11 |
EP4147198A1 (en) | 2023-03-15 |
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B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
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Free format text: AS CLASSIFICACOES ANTERIORES ERAM: G06T 7/00 , G06T 7/11 , G06T 7/136 Ipc: G06T 7/11 (2017.01), G06T 7/136 (2017.01), G06T 7/ |