AR120451A1 - Sistema de imagenología de semillas de rayos x, dispositivo de rayos x de gabinete y métodos de evaluación de semillas - Google Patents

Sistema de imagenología de semillas de rayos x, dispositivo de rayos x de gabinete y métodos de evaluación de semillas

Info

Publication number
AR120451A1
AR120451A1 ARP200103138A ARP200103138A AR120451A1 AR 120451 A1 AR120451 A1 AR 120451A1 AR P200103138 A ARP200103138 A AR P200103138A AR P200103138 A ARP200103138 A AR P200103138A AR 120451 A1 AR120451 A1 AR 120451A1
Authority
AR
Argentina
Prior art keywords
ray
seed
seeds
cabinet
imaging system
Prior art date
Application number
ARP200103138A
Other languages
English (en)
Inventor
Eric L Borrowman
Govind Chaudhary
Donald J Essner
Alfred B Garson
Johnny J Kotyk
Original Assignee
Monsanto Technology Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Monsanto Technology Llc filed Critical Monsanto Technology Llc
Publication of AR120451A1 publication Critical patent/AR120451A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0098—Plants or trees
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/301—Accessories, mechanical or electrical features portable apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/308—Accessories, mechanical or electrical features support of radiation source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3306—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object rotates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/612—Specific applications or type of materials biological material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/64—Specific applications or type of materials multiple-sample chamber, multiplicity of materials

Abstract

Un dispositivo de rayos X de gabinete para obtener imágenes de semillas incluye una fuente de rayos X configurada para transmitir un haz de rayos X a lo largo de una trayectoria de haz. Un soporte de semillas está configurado para contener semillas y colocarse selectivamente en el dispositivo de rayos X de manera que la trayectoria del haz cruce el soporte de semillas y el haz de rayos X atraviese al menos algunas de las semillas. Un detector de rayos X está configurado para detectar el haz de rayos X después de pasar a través de las semillas, de modo que se puedan formar una o más imágenes de rayos X de las semillas. La protección de rayos X autoportante puede extenderse circunferencialmente alrededor del haz de rayos X para mitigar la transmisión de rayos X fuera del dispositivo. Un mecanismo de accionamiento puede mover automáticamente el soporte de semillas de modo que se tomen imágenes de rayos X discretas de subconjuntos de semillas en una operación automática de imagenología de semillas. Se pueden realizar varias evaluaciones de semillas y evaluaciones de procesos de semillas utilizando el dispositivo.
ARP200103138A 2019-11-13 2020-11-12 Sistema de imagenología de semillas de rayos x, dispositivo de rayos x de gabinete y métodos de evaluación de semillas AR120451A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201962934855P 2019-11-13 2019-11-13

Publications (1)

Publication Number Publication Date
AR120451A1 true AR120451A1 (es) 2022-02-16

Family

ID=75846514

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP200103138A AR120451A1 (es) 2019-11-13 2020-11-12 Sistema de imagenología de semillas de rayos x, dispositivo de rayos x de gabinete y métodos de evaluación de semillas

Country Status (5)

Country Link
US (1) US11630095B2 (es)
EP (1) EP4058791A4 (es)
AR (1) AR120451A1 (es)
AU (1) AU2020383497A1 (es)
WO (1) WO2021097093A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3764766A4 (en) 2018-03-14 2022-02-23 Monsanto Technology LLC SEED IMAGING
MX2020013129A (es) 2018-06-11 2021-02-18 Monsanto Technology Llc Seleccion de semillas.
AU2020383497A1 (en) * 2019-11-13 2022-05-26 Monsanto Technology Llc X-ray seed imaging system, cabinet x-ray device, and methods of evaluating seeds

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Also Published As

Publication number Publication date
WO2021097093A1 (en) 2021-05-20
US20210140900A1 (en) 2021-05-13
US11630095B2 (en) 2023-04-18
AU2020383497A1 (en) 2022-05-26
EP4058791A1 (en) 2022-09-21
EP4058791A4 (en) 2024-03-06

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