AR116929A1 - Método para actualizar el umbral de referencia de al menos un parámetro operativo, unidad de protección para la mitigación de un evento simple de latchup (sel) en un dispositivo electrónico usando el umbral de referencia y disposición para la mitigación de un evento simple de latchup (sel) en un conjunto - Google Patents
Método para actualizar el umbral de referencia de al menos un parámetro operativo, unidad de protección para la mitigación de un evento simple de latchup (sel) en un dispositivo electrónico usando el umbral de referencia y disposición para la mitigación de un evento simple de latchup (sel) en un conjuntoInfo
- Publication number
- AR116929A1 AR116929A1 ARP190103158A ARP190103158A AR116929A1 AR 116929 A1 AR116929 A1 AR 116929A1 AR P190103158 A ARP190103158 A AR P190103158A AR P190103158 A ARP190103158 A AR P190103158A AR 116929 A1 AR116929 A1 AR 116929A1
- Authority
- AR
- Argentina
- Prior art keywords
- radiation
- threshold
- sel
- current threshold
- reference threshold
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
- H02H3/08—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess current
- H02H3/10—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess current additionally responsive to some other abnormal electrical conditions
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/005—Circuit means for protection against loss of information of semiconductor storage devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H5/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection
- H02H5/005—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to ionising radiation; Nuclear-radiation circumvention circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0409—Online test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5002—Characteristic
Landscapes
- Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Power Sources (AREA)
- Emergency Protection Circuit Devices (AREA)
Abstract
Se desarrolla una estrategia adaptativa para optimizar un umbral de la corriente que se toma como referencia para iniciar un proceso de mitigación, aplicando un auto-ajuste a lo largo de la vida útil de un dispositivo electrónico (407) a proteger contra fenómenos SEL en ambientes susceptibles de radiación ionizante, tal como satélites en órbitas terrestres. Para calcular el umbral de corriente, el método entra a un modo de aprendizaje dentro de segmentos de tiempo en que el flujo de radiación es menor que un umbral predeterminado de radiación. Cuando el flujo de radiación excede el umbral de radiación se pasa a un modo de protección durante el cual se suspende la actualización del umbral de corriente y se utiliza el último umbral de corriente calculada anteriormente para detectar la probabilidad de un evento SEL, en cuyo caso se activa un proceso de mitigación de sus efectos (317). Se dota a cada dispositivo a proteger con una unidad de protección (405) que estima (310) y actualiza (311) su propio umbral de corriente independientemente y en paralelo con los demás. Una disposición (406) que incluye un conjunto de dispositivos a proteger guarda el umbral de radiación (401) e incluye un medidor de flujo de radiación (402) y un comparador (403) que envía una señal a cada unidad de protección indicativa del flujo medido relativo al umbral guardado.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ARP190103158A AR116929A1 (es) | 2019-10-31 | 2019-10-31 | Método para actualizar el umbral de referencia de al menos un parámetro operativo, unidad de protección para la mitigación de un evento simple de latchup (sel) en un dispositivo electrónico usando el umbral de referencia y disposición para la mitigación de un evento simple de latchup (sel) en un conjunto |
EP20807674.5A EP4052338A1 (en) | 2019-10-31 | 2020-10-30 | Method for updating the reference threshold of at least one operational parameter, protection unit for the mitigation of a single event latchup (sel) in an electronic device using the reference threshold and arrangement for the mitigation of a single event latchup (sel) in an array |
PCT/EP2020/080518 WO2021084073A1 (en) | 2019-10-31 | 2020-10-30 | Method for updating the reference threshold of at least one operational parameter, protection unit for the mitigation of a single event latchup (sel) in an electronic device using the reference threshold and arrangement for the mitigation of a single event latchup (sel) in an array |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ARP190103158A AR116929A1 (es) | 2019-10-31 | 2019-10-31 | Método para actualizar el umbral de referencia de al menos un parámetro operativo, unidad de protección para la mitigación de un evento simple de latchup (sel) en un dispositivo electrónico usando el umbral de referencia y disposición para la mitigación de un evento simple de latchup (sel) en un conjunto |
Publications (1)
Publication Number | Publication Date |
---|---|
AR116929A1 true AR116929A1 (es) | 2021-06-30 |
Family
ID=73452160
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ARP190103158A AR116929A1 (es) | 2019-10-31 | 2019-10-31 | Método para actualizar el umbral de referencia de al menos un parámetro operativo, unidad de protección para la mitigación de un evento simple de latchup (sel) en un dispositivo electrónico usando el umbral de referencia y disposición para la mitigación de un evento simple de latchup (sel) en un conjunto |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP4052338A1 (es) |
AR (1) | AR116929A1 (es) |
WO (1) | WO2021084073A1 (es) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2023006501A2 (fr) * | 2021-07-30 | 2023-02-02 | Airbus Defence And Space Sas | Système électronique spatial |
LU102862B1 (en) * | 2021-09-30 | 2023-04-03 | OroraTech GmbH | Dynamic latch-up protection |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1287103C (en) | 1986-04-22 | 1991-07-30 | Jim Pinard | Cmos latch-up recovery circuit |
US5212616A (en) | 1991-10-23 | 1993-05-18 | International Business Machines Corporation | Voltage regulation and latch-up protection circuits |
US5672918A (en) | 1994-08-18 | 1997-09-30 | The United States Of America As Represented By The United States Department Of Energy | System level latchup mitigation for single event and transient radiation effects on electronics |
EP0725442B1 (en) | 1995-01-31 | 2002-11-27 | STMicroelectronics S.r.l. | Monolithic output stage self-protected against latch-up phenomena |
US5828110A (en) | 1995-06-05 | 1998-10-27 | Advanced Micro Devices, Inc. | Latchup-proof I/O circuit implementation |
US6064555A (en) | 1997-02-25 | 2000-05-16 | Czajkowski; David | Radiation induced single event latchup protection and recovery of integrated circuits |
US6028341A (en) | 1998-03-09 | 2000-02-22 | United Microelectronics Corp. | Latch up protection and yield improvement device for IC array |
JP2006350425A (ja) | 2005-06-13 | 2006-12-28 | Japan Aerospace Exploration Agency | 半導体装置のシングルイベント補償回路 |
US7907378B2 (en) | 2005-10-20 | 2011-03-15 | Microchip Technology Incorporated | Automatic detection of a CMOS device in latch-up and cycling of power thereto |
US8896978B2 (en) * | 2012-06-15 | 2014-11-25 | Texas Instruments Incorporated | Integrated circuit with automatic deactivation upon exceeding a specific ion linear energy transfer (LET) value |
US8685800B2 (en) | 2012-07-27 | 2014-04-01 | Freescale Semiconductor, Inc. | Single event latch-up prevention techniques for a semiconductor device |
US8891215B2 (en) | 2012-12-11 | 2014-11-18 | Globalfoundries Singapore Pte. Ltd. | High noise immunity with latch-up free ESD clamp |
US9391448B2 (en) | 2013-09-17 | 2016-07-12 | The Boeing Company | High current event mitigation circuit |
CN103701087A (zh) | 2013-11-28 | 2014-04-02 | 兰州空间技术物理研究所 | 一种空间单粒子锁定效应在轨监测方法 |
CN103762558A (zh) | 2014-01-21 | 2014-04-30 | 北京航空航天大学 | 一种可恢复式抗单粒子闩锁电源接口电路 |
WO2016080909A1 (en) | 2014-11-19 | 2016-05-26 | Nanyang Technological University | Electronic circuit for single-event latch-up detection and protection |
US9960593B2 (en) * | 2015-07-31 | 2018-05-01 | Harris Corporation | Single event latchup (SEL) current surge mitigation |
US10886723B2 (en) * | 2015-07-31 | 2021-01-05 | Harris Corporation | Adaptive single event latchup (SEL) current surge mitigation |
US10048997B2 (en) | 2016-05-04 | 2018-08-14 | Hamilton Sundstrand Corporation | Single event latch up mitigation in solid state power controllers |
US9793899B1 (en) | 2016-12-16 | 2017-10-17 | Xilinx, Inc. | Mitigation of single event latchup |
US10204906B2 (en) | 2016-12-16 | 2019-02-12 | Intel Corporation | Memory with single-event latchup prevention circuitry |
US10289178B1 (en) | 2017-04-04 | 2019-05-14 | Xilinx, Inc. | Configurable single event latch-up (SEL) and electrical overvoltage stress (EOS) detection circuit |
CN107134758B (zh) | 2017-05-08 | 2019-02-22 | 哈尔滨工业大学 | 一种空间环境下cmos器件单粒子闩锁效应防护装置 |
CN208401733U (zh) | 2018-04-28 | 2019-01-18 | 北京鹏宇思睿科技有限公司 | 一种星上设备用防浪涌及防单粒子闩锁的电路模块 |
CN108494240B (zh) | 2018-04-28 | 2023-10-24 | 北京鹏宇思睿科技有限公司 | 一种星上设备用防浪涌及防单粒子闩锁的电路模块 |
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2019
- 2019-10-31 AR ARP190103158A patent/AR116929A1/es active IP Right Grant
-
2020
- 2020-10-30 EP EP20807674.5A patent/EP4052338A1/en not_active Withdrawn
- 2020-10-30 WO PCT/EP2020/080518 patent/WO2021084073A1/en active Search and Examination
Also Published As
Publication number | Publication date |
---|---|
EP4052338A1 (en) | 2022-09-07 |
WO2021084073A1 (en) | 2021-05-06 |
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