WO2023135624A1 - Semiconductor-component-separating device and semiconductor component separation and attachment method using same - Google Patents

Semiconductor-component-separating device and semiconductor component separation and attachment method using same Download PDF

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Publication number
WO2023135624A1
WO2023135624A1 PCT/JP2022/000461 JP2022000461W WO2023135624A1 WO 2023135624 A1 WO2023135624 A1 WO 2023135624A1 JP 2022000461 W JP2022000461 W JP 2022000461W WO 2023135624 A1 WO2023135624 A1 WO 2023135624A1
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WO
WIPO (PCT)
Prior art keywords
semiconductor component
circuit board
electronic circuit
heating
jig
Prior art date
Application number
PCT/JP2022/000461
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French (fr)
Japanese (ja)
Inventor
藤田隆雄
久保剛志
鈴木智明
敬太 竹山
田中健之
和田重雄
Original Assignee
デンオン機器株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by デンオン機器株式会社 filed Critical デンオン機器株式会社
Priority to PCT/JP2022/000461 priority Critical patent/WO2023135624A1/en
Priority to JP2023553949A priority patent/JP7451001B2/en
Publication of WO2023135624A1 publication Critical patent/WO2023135624A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/60Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation

Definitions

  • the present invention relates to a semiconductor component separating device and a semiconductor component separating and mounting method using the same.
  • Patent Document 1 a semiconductor component having a package structure of Ball Grid Array (BGA) mounted on a printed wiring board substrate, for example, an IC such as a semiconductor integrated circuit or a semiconductor device, has an adverse effect on surrounding electronic components.
  • BGA Ball Grid Array
  • a method for repairing a semiconductor device has been proposed, which eliminates the risk of causing damage to the semiconductor device and enables efficient removal from the printed wiring board substrate.
  • a heat transfer plate having good heat conductivity and having a larger area than the upper surface of the semiconductor component to be peeled off is adhered to the entire upper surface of the semiconductor component using a thermosetting resin, and the heater tool is pressed against the heat transfer plate. This heats the heat transfer plate and the semiconductor component, softens the underfill, melts the solder, and cures the thermosetting resin. With the thermosetting resin cured in this way, a stripping tool is engaged with the protruding portion of the heat transfer plate that protrudes outward from the upper surface of the semiconductor component, and the heat transfer plate is integrated with the semiconductor component and removed from the printed wiring board. It is peel off.
  • Patent Document 2 IC chips (semiconductor parts) such as a BGA structure CPU (Central Processing Unit) and MCP (Multi Chip Package) mounted on a printed wiring board are printed without damaging them.
  • a semiconductor component separating method has been proposed for separating from a wiring board substrate.
  • a linear member having a diameter of 50% to 90% of the distance between the semiconductor component to be separated and the substrate is brought into contact with the end of the resin material placed between the substrate and the semiconductor component and the substrate.
  • the solder and the resin material arranged between are softened.
  • the linear member is moved along the surface of the substrate while being in contact with the end of the resin material.
  • the linear member in contact with the end of the resin material is pressed against the substrate.
  • a Ball Grid Array (BGA) structure When semiconductor components such as semiconductor integrated circuits are mounted on substrates such as printed wiring board substrates, a Ball Grid Array (BGA) structure may be adopted. When mounted in a BGA structure, the board and the semiconductor component are generally connected and fixed by solder balls and resin (underfill).
  • BGA Ball Grid Array
  • FIG. 1 shows an example of a state in which a plurality of electrodes 6 are arranged on the bottom surface of a semiconductor component 2. As shown in FIG.
  • solder joints 3 When a shock or the like is applied from the outside to the solder joints 3 between the substrate 1 such as a printed wiring board substrate and the semiconductor component 2 such as a semiconductor integrated circuit, the solder joints 3 are damaged as shown in FIG. There is a possibility that a crack 4 or the like will occur in the connection, resulting in poor connection.
  • an underfill (sealing material) 5 is filled in the gap between the soldered semiconductor component 2 and the substrate 1, as shown in FIG.
  • the underfill 5 protects the connection of the semiconductor component 2 and makes it resistant to impact. However, if the semiconductor component 2 needs to be replaced due to a defect in the semiconductor component 2 or the like, the presence of the underfill 5 makes replacement work unnecessary. it won't be easy.
  • the solder when heat is applied, the solder becomes liquid due to thermal melting, but the underfill softens slightly even when heated, but does not soften to the point where the semiconductor component can be easily peeled off.
  • Another object of the present invention is to provide a semiconductor component separating apparatus capable of automatically removing semiconductor components mounted on an electronic circuit board from the electronic circuit board in a reusable manner without destroying them. ing. Another object of the present invention is to propose a semiconductor component separating method and a semiconductor component mounting method using the semiconductor component separating apparatus described above.
  • the present invention includes aspects exemplified below.
  • a heating mechanism for heating a semiconductor component mounted on an electronic circuit board from above the semiconductor component a removal jig; a jig insertion mechanism for inserting the removal jig between the electronic circuit board and the semiconductor component;
  • the removal jig inserted between the electronic circuit board and the semiconductor component is a jig for moving the electronic circuit board upward while supporting the semiconductor component upward.
  • a semiconductor component separating apparatus comprising: a tool lifting mechanism; [2] The semiconductor component separating apparatus according to [1], further comprising an angle adjusting mechanism for adjusting an angle at which the removing jig is inclined with respect to the semiconductor component.
  • the semiconductor component is mounted on the side facing the semiconductor component into which the removal jig is inserted.
  • the semiconductor component separating apparatus according to [1] or [2], further comprising a semiconductor component supporting mechanism for supporting the semiconductor component so that the component does not move.
  • the semiconductor component separation according to any one of [1] to [3], wherein a first heating mechanism for heating the removal jig and adjusting the heating state of the removal jig is attached to the removal jig. Device.
  • the semiconductor component In a state in which the removal jig supports the semiconductor component on the upper side, the semiconductor component is moved with the removal jig in cooperation with the removal jig when the lifting operation is performed by the jig elevating mechanism.
  • the semiconductor component separating apparatus according to any one of [1] to [4], further comprising a semiconductor component holding mechanism that performs the lifting operation while holding the semiconductor component between the two.
  • the semiconductor component holding mechanism is a vacuum suction holding mechanism.
  • the semiconductor component holding mechanism is a plate-shaped holding mechanism that holds the semiconductor component together with the removal jig.
  • the temperature state of the electronic circuit board at the position where the semiconductor component being heated is mounted is adjusted from the lower surface side of the electronic circuit board at the position where the semiconductor component being heated is mounted.
  • the temperature adjusting mechanism is a second heating mechanism that heats the electronic circuit board from below at a position where the heated semiconductor component is mounted.
  • the temperature adjusting mechanism is a cooling mechanism that provides a cooling effect to the electronic circuit board at a position where the heated semiconductor component is mounted.
  • [18] a step of removing solder and underfill residue on the board-side pattern surface after removal of the semiconductor component in the electronic circuit board after removal of the semiconductor component; a step of performing solder printing or solder transfer onto a new semiconductor component newly attached to the board-side pattern surface of the electronic circuit board in place of the semiconductor component removed from the electronic circuit board; and/or a step of performing solder printing or dispensing supply on the board-side pattern surface of the electronic circuit board; a step of aligning the board-side pattern of the electronic circuit board with the electrode of the new semiconductor component; A method of attaching a semiconductor component to an electronic circuit board, comprising the step of heating the new semiconductor component after alignment using the semiconductor component separating apparatus according to any one of [1] to [16].
  • the present invention it is possible to provide a semiconductor component separating apparatus capable of automatically removing a semiconductor component mounted on an electronic circuit board from the electronic circuit board in a reusable form without destroying it. Further, according to the present invention, it is possible to provide a semiconductor component separating method and a semiconductor component mounting method using the above-described semiconductor component separating apparatus.
  • FIG. 2 is a diagram showing an example of a state in which a plurality of electrodes are arranged on the lower surface of a semiconductor component in a surface-mount package-on-package (POP) structure soldered to an electronic circuit board;
  • FIG. 4 is a partially omitted cross-sectional view illustrating a state in which a crack is generated in a soldered joint between a substrate and a semiconductor component due to external impact or the like being applied to the soldered joint;
  • FIG. POP package-on-package
  • FIG. 10 is a view for explaining how a semiconductor component is manually removed from a substrate using a thin hard metal with a thin tip such as tweezers; 1 is a partially omitted side view showing an example of the overall configuration of a semiconductor component separating apparatus according to an embodiment of the present invention; FIG. FIG. 4 is a partially omitted front view for explaining an example of each operation of a jig insertion mechanism, a semiconductor component holding mechanism, and a semiconductor component support mechanism in the semiconductor component separating apparatus according to the embodiment of the present invention; FIG.
  • FIG. 4 is a partially omitted front view for explaining another example of each operation of the jig insertion mechanism, the jig lifting mechanism, the semiconductor component holding mechanism, and the semiconductor component support mechanism in the semiconductor component separating apparatus according to the embodiment of the present invention;
  • the removal jig moves to be inserted between the substrate and the semiconductor component to be removed mounted on the substrate.
  • omitted one part to demonstrate. 1 is a partially omitted side view for explaining an example of a structure in which a first heating mechanism is attached to a removal jig in a semiconductor component separating apparatus according to an embodiment of the present invention;
  • FIG. FIG. 4 is a conceptual diagram explaining the mechanism of occurrence of solder flash or the like that may occur when removing a semiconductor component from a substrate;
  • the semiconductor component separating apparatus of this embodiment includes a heating mechanism 7 and a semiconductor component removing mechanism 9 having a removing jig 8 .
  • the heating mechanism 7 heats the semiconductor component 2 to be removed mounted on the electronic circuit board 1 from above the semiconductor component 2 and is present between the electronic circuit board 1 and the semiconductor component 2.
  • a heating means that heats the solder until it exceeds its melting point.
  • the heating of the semiconductor component 2 to be removed by the heating mechanism 7 is local heating in a range equivalent to the size of the semiconductor component 2 .
  • 4 to 6 exemplify a semiconductor component having a surface-mounted POP structure soldered to the electronic circuit board 1. As shown in FIG. Therefore, in FIGS. 4 to 6, each semiconductor component is represented by reference numerals 2a, 2b, and 2c, respectively. They may be collectively indicated as "semiconductor component 2".
  • the above-described local heating of the semiconductor component 2 to be removed by the heating mechanism 7 heats the semiconductor component 2 to be removed from above, and the semiconductor component 2 to be removed and the electronic circuit board 1 are heated.
  • the solder is heated to a temperature above its melting point.
  • the underfill existing between the semiconductor component 2 to be removed and the electronic circuit board 1 is heated to a predetermined temperature by the above-described heating by the heating mechanism 7, depending on the type of the underfill. soften to some extent.
  • Heat sources such as hot air, infrared rays, and lasers can be used as the heating mechanism 7 described above. Regardless of which heat source is used as the heating mechanism 7, local heating is performed from above within a range equivalent to the size of the semiconductor component 2 to be removed for a predetermined heating time. As a result, the semiconductor component 2 to be removed is heated while minimizing the heat transfer to other components existing around the semiconductor component 2 .
  • the temperature profile conditions necessary for performing the above-described local heating are the electronic circuit board 1, the semiconductor component 2 to be removed, the solder existing between the electronic circuit board 1 and the semiconductor component 2 to be removed, and the underlayer. It is possible to set in advance based on the properties of the fill and cause the heating mechanism 7 consisting of a heat source such as hot air, infrared rays, or laser to perform the above-described local heating under the control of a control means (not shown).
  • a control means not shown.
  • the semiconductor component 2 to be removed is locally heated from above using the heating mechanism 7 composed of various heat sources such as hot air, infrared rays, and laser, as described later.
  • a mechanism for temperature control (heating or cooling) from the lower surface of the electronic circuit board 1 can be combined.
  • the thickness of the tip of the removal jig 8 (the vertical size of the tip of the removal jig 8 in FIGS. 4 and 8) is thin enough to be inserted between the electronic circuit board 1 and the semiconductor component 2. It is a thin plate-like or needle-like jig. As shown in FIGS. 4 to 6, at least the thickness in the vertical direction in the drawing at the tip of the thin plate-like or needle-like removal jig 8 is equal to that of the semiconductor component 2 mounted on the electronic circuit board 1. It is thin enough to be inserted into the vertical gap formed between the lower side surface of the electronic circuit board 1 and the upper side surface of the electronic circuit board 1 .
  • a thin plate-like or needle-like removal jig 8 is inserted between the electronic circuit board 1 and the semiconductor component 2 in the direction indicated by the arrow 30 in FIGS.
  • the width of the removal jig 8 which is the size in the direction perpendicular to the insertion direction, is determined by the size of the components arranged on the electronic circuit board 1 around the semiconductor component 2 to be removed and the semiconductor component 2 to be removed. On the other hand, it is determined according to the size of the gap to be approached in the direction indicated by the arrow 30 .
  • minute chip parts 10 such as 0402 parts (0.4 mm ⁇ 0.2 mm) are often mounted without gaps around the semiconductor parts 2 to be removed. Therefore, when the removal jig 8 passes between the vertically mounted 0402 components adjacent to each other and accesses the semiconductor component 2 to be removed in the direction indicated by the arrow 30, the removal jig 8
  • the width is less than 0.2 mm because it corresponds to 0.2 mm when the 0402 component (0.4 mm x 0.2 mm) is vertically mounted + mounting clearance width (gap between adjacent chip components 10). Something becomes desirable. However, if the environment of peripheral components permits, a wider width than this may be used.
  • the thin plate-like or needle-like removal jig 8 with a thin tip and a small width is inserted between the electronic circuit board 1 and the semiconductor component 2 to be removed, as will be described later.
  • a large force is applied. Therefore, it is desirable to use a hard metal that can withstand this.
  • the above-described heating by the heating mechanism 7 can raise the temperature of the solder existing between the semiconductor component 2 to be removed and the electronic circuit board 1 to a temperature exceeding the melting point.
  • the underfill existing between the semiconductor component 2 to be removed and the electronic circuit board 1 is only softened to some extent. For this reason, an operation of inserting a removal jig 8, which will be described later, between the electronic circuit board 1 and the semiconductor component 2 to be removed, and an operation of lifting the semiconductor component 2 while supporting it on the removal jig 8, which will be described later.
  • the underfill is completely destroyed in order to remove the semiconductor component 2 to be removed from the electronic circuit board 1 .
  • the removal jig 8 is inserted between the electronic circuit board 1 and the semiconductor component 2 to be removed, and is used when removing the semiconductor component 2 to be removed from the electronic circuit board 1. It is desirable to use a hard metal that can withstand the large force to which it is subjected.
  • the semiconductor component removal mechanism 9 includes a jig insertion mechanism and a jig elevating mechanism.
  • the jig insertion mechanism is a mechanism that moves the removal jig 8 in the direction indicated by the arrow 30 (FIG. 5) and inserts the removal jig 8 between the electronic circuit board 1 and the semiconductor component 2b.
  • the jig elevating mechanism moves the removal jig 8 inserted between the electronic circuit board 1 and the semiconductor component 2b as shown in FIG. is a mechanism for causing the electronic circuit board 1 to move upward. After the lifting operation, the removal jig 8 is moved in the direction indicated by the arrow 30 by the jig insertion mechanism and removed to the position where the operation of inserting it between the electronic circuit board 1 and the semiconductor component 2b is performed. It is a mechanism that causes the jig 8 to move downward.
  • a linear drive type jig insertion mechanism and jig lifting mechanism can be used as the jig insertion mechanism and jig lifting mechanism. If it is a linear drive system, precision and high rigidity can be exhibited.
  • the removal jig 8 is inserted in the direction of arrow 30 and lifted in the direction of arrow 31. At the time, it can be performed while maintaining the insertion angle and height of the removal jig 8 . Since the removal jig 8 can be inserted in the direction of arrow 30 and raised in the direction of arrow 31 while maintaining the insertion angle and height of the removal jig 8, the tip side of the removal jig 8 tilts toward the electronic circuit board 1 side. It is also possible to prevent the possibility of damaging the electronic circuit board 1 due to deformation or the like.
  • a jig elevating mechanism based on a linear driving method can be one that performs the lifting and lowering operations of the removal jig 8 described above by a sliding method.
  • the semiconductor component removal mechanism 9 may further include an angle adjustment mechanism that adjusts the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed.
  • the base end of the removal jig 8 is rotatably supported by a rotation support shaft 11 extending parallel to the upper plane of the electronic circuit board 1.
  • a linear drive mechanism (not shown) allows the removal jig 8 to rotate around the rotation support shaft 11 as indicated by arrows 32a and 32b in FIG. there is
  • This provides an angle adjustment mechanism for adjusting the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed. Since the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed is adjusted, the angle adjustment mechanism described above is used to adjust the angle between the electronic circuit board 1 and the semiconductor component 2 to be removed. It also adjusts the insertion angle of the removal jig 8 for inserting the tip into the gap.
  • the height of the peripheral components may interfere with the removal jig 8 .
  • the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed is adjusted so as to avoid interference due to the height of the peripheral components. It can be adjusted and work according to the implementation environment.
  • the insertion angle for inserting the tip of the removal jig 8 into the gap between the electronic circuit board 1 and the semiconductor component 2 to be removed can be adjusted to an appropriate insertion angle. As the insertion angle becomes closer to horizontal with respect to the electronic circuit board 1 as shown in FIG. Easier to get in.
  • the semiconductor component removal mechanism 9 can be configured without an angle adjustment mechanism.
  • the angle adjustment mechanism is not limited to the one described above, and various mechanisms and configurations can be used as long as the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed can be adjusted as described above. can be adopted.
  • the semiconductor component separation apparatus of this embodiment can be configured to further include a semiconductor component support mechanism 12 .
  • the semiconductor component support mechanism 12 is configured so that the removal jig 8 is inserted between the electronic circuit board 1 and the semiconductor component 2 by the jig insertion mechanism. supports the semiconductor component 2 so that the semiconductor component 2 does not move on the side opposite to the side of the semiconductor component 2 into which is inserted.
  • the semiconductor component support mechanism 12 is arranged on the opposite side of the semiconductor component 2 to be removed.
  • the removed semiconductor component 2 is shown by the arrow 30 . Moving together can be reliably prevented by the removal jig 8 that continues to move in the direction. Therefore, the removed semiconductor component 2 is moved together with the removal jig 8 that continues to move in the direction of the arrow 30, thereby preventing contact with peripheral components located on the opposite side of the semiconductor component 2 to be removed. However, it is possible to prevent secondary misalignment of peripheral parts.
  • At least the portion of the semiconductor component support mechanism 12 that contacts the semiconductor component 2 is desirably made of a material with a low specific heat.
  • the heating mechanism 7 locally heats the semiconductor component 2 to be removed. If heat is taken away from the semiconductor component 2, a temperature difference will occur in the heat distribution of the semiconductor component 2, which may affect removal.
  • Such a possibility can be prevented by forming at least the portion of the semiconductor component support mechanism 12 that contacts the semiconductor component 2 with a material having a small specific heat.
  • the first heating mechanism 13 can be attached to the removing jig 8 as shown in FIG.
  • the first heating mechanism 13 heats the removal jig 8 and adjusts the heating state of the removal jig 8 .
  • the softened state of the underfill may be uncertain. For example, there is a difference in the softening temperature depending on the type of underfill material, and slight individual differences in the case of performing a plurality of amounts of work make the softening state of the underfill uncertain.
  • the removal jig 8 is provided with the first heating mechanism 13 for heating the removal jig 8 and adjusting the heating state of the removal jig 8 . It is heated and its heating state is adjusted. As a result, the solder and underfill in the semiconductor component 2 to be removed are also heated via the removal jig 8, and their heating states are adjusted. Therefore, it becomes possible to easily insert the tip of the removing jig 8 by pushing it between the electronic circuit board 1 and the semiconductor component 2 while destroying the underfill.
  • the semiconductor component 2 to be removed can be more reliably and efficiently removed from the electronic circuit board 1, and work efficiency can be improved.
  • the first heating mechanism 13 heats the removing jig 8 and adjusts the heating state of the removing jig 8 under the control of a control means (not shown) provided in the semiconductor component separating apparatus. .
  • the position where the first heating mechanism 13 is attached to the removal jig 8 is not limited to the position illustrated in FIG. It can be attached to the removal jig 8 at various possible positions.
  • the heating mechanism 7 locally heats the semiconductor component 2 to be removed from above, so that the solder melts and the underfill softens in the semiconductor component 2 to be removed. If it is sufficiently observed, the semiconductor component 2 can be removed without performing the above-described heating adjustment by the first heating mechanism 13 . Therefore, a semiconductor component separating apparatus in which the removal jig 8 is not provided with the first heating mechanism 13 can also be used.
  • the semiconductor component separating apparatus of this embodiment described above can be configured to further include a semiconductor component holding mechanism.
  • the semiconductor component holding mechanism lifts the semiconductor component 2b to be removed by the jig lifting mechanism described above in the direction indicated by the arrow 31 while the removal jig 8 is supporting the semiconductor component 2b to be removed from above as shown in FIG. 2, the semiconductor component 2 to be removed is held between the removal jig 8 and the removal jig 8, and is lifted in the direction indicated by the arrow 31.
  • the semiconductor component holding mechanism lifts the semiconductor component 2b to be removed by the jig lifting mechanism described above in the direction indicated by the arrow 31 while the removal jig 8 is supporting the semiconductor component 2b to be removed from above as shown in FIG. 2, the semiconductor component 2 to be removed is held between the removal jig 8 and the removal jig 8, and is lifted in the direction indicated by the arrow 31.
  • This semiconductor component holding mechanism can be the vacuum suction holding mechanism 14 shown in FIG. In a state where the removal jig 8 supports the semiconductor component 2b to be removed upward as shown in FIG. The semiconductor component 2 is vacuum-sucked by the vacuum suction holding mechanism 14, and while holding the semiconductor component 2 to be removed between the removal jig 8 in cooperation with the removal jig 8, the upward movement in the direction indicated by the arrow 31 is performed. It is something to do.
  • the above-described semiconductor component holding mechanism is a flat plate that holds the semiconductor component 2 to be removed between itself and the removal jig 8 in cooperation with the removal jig 8. It can also be a shape-retaining mechanism.
  • the flat plate-shaped holding mechanism can be made of metal or synthetic resin.
  • the plate-like plate-like holding mechanism 15 shown in FIG. It faces and holds the semiconductor component 2 between itself and the removal jig 8 in cooperation with the removal jig 8 .
  • the lower surface of the flat plate-like holding mechanism 15 and the upper surface of the semiconductor component 2 to be removed are opposed to each other with a small clearance 16 interposed therebetween, so that the removal jig 8 can hold the semiconductor component to be removed.
  • the removal jig 8 in a state where the semiconductor component 2b is supported upward, the removal jig 8 cooperates with the removal jig 8 to remove the semiconductor component 2 to be removed when performing the upward movement in the direction indicated by the arrow 31. While being held between , the upward movement in the direction indicated by the arrow 31 can be performed.
  • the size of the clearance 16 is set within a range that allows such operation.
  • the lower surface of the plate-like holding mechanism 15 directly contacts the upper surface of the semiconductor component 2 to be removed without the clearance 16 as shown in FIG. It is also possible to use a plate-like plate-like holding mechanism as described above.
  • the lower surface of the plate-like plate-like holding mechanism directly abuts the upper surface of the semiconductor component 2 to be removed, and the semiconductor component 2 to be removed is held in cooperation with the removal jig 8 .
  • the plate-shaped holding mechanism is heated and a second heating mechanism (non ) can be provided in the plate-shaped holding mechanism.
  • a second heating mechanism heats the plate-like plate-like holding mechanism described above and heats the plate-like plate-like holding mechanism under the control of a control means (not shown) provided in the semiconductor component separating apparatus. adjust the state.
  • the semiconductor component separating apparatus removes the semiconductor component 2 to be removed from the electronic circuit board 1 and raises it, the semiconductor component 2 tilts to the left and right or to the front with respect to the insertion direction of the removal jig 8 indicated by the arrow 30. , there is a risk of contact with peripheral components of the semiconductor component 2 to be removed. In such a case, the semiconductor component 2 to be removed is locally heated from above by the heating means 7, and the heat is transferred to the peripheral components, sometimes resulting in melting of the solder. Therefore, if the semiconductor component 2 moving upward tilts as described above and comes into contact with peripheral components, the peripheral components will be displaced.
  • the semiconductor component separating apparatus is provided with the semiconductor component support mechanism 12, the displacement of the semiconductor component 2 in the direction indicated by the arrow 30 in which the removing jig 8 faces the semiconductor component 2 is suppressed. can do.
  • the semiconductor component holding mechanism is the above-described vacuum suction holding mechanism 14 (FIG. 5)
  • the semiconductor component 2 to be removed is lowered from above, and lifted together with the removal jig 8 while sucking and holding the semiconductor component 2.
  • It can be in the form of
  • the vacuum suction holding mechanism 14 It is sucked and held by the vacuum suction holding mechanism 14. Therefore, by inserting the removal jig 8 between the electronic circuit board 1 and the semiconductor component 2 to be removed, or by lifting the semiconductor component 2 while supporting it on the removal jig 8, the object to be removed can be removed.
  • the suction force from the vacuum suction holding mechanism 14 also acts on the complete destruction of the underfill for removing the semiconductor component 2 from the electronic circuit board 1 .
  • the vacuum suction holding mechanism 14 (FIG. 5) waits at a position that does not interfere with the local heating of the semiconductor component 2 to be removed by the heating mechanism 7, and the heating from the heating mechanism 7 reaches the solder melting temperature.
  • the vacuum suction holding mechanism 14 may be lowered from above the semiconductor component 2 before or after the solder is melted.
  • the plate-shaped holding mechanism is made to stand by at a position that does not interfere with the local heating of the semiconductor component 2 to be removed by the heating mechanism 7, and the heating is performed.
  • the plate-shaped holding mechanism 15 is lowered from above the semiconductor component 2 to the state shown in FIG.
  • the plate-shaped holding mechanism 15 is lowered until the lower side surface of the semiconductor component 2 abuts against the upper side surface. 6, the removal jig 8 supports the semiconductor component 2b to be removed by the jig elevating mechanism.
  • the semiconductor component 2 to be removed While holding the semiconductor component 2 to be removed between the removal jig 8 in cooperation with the jig 8 , the semiconductor component 2 to be removed is lifted in the direction indicated by the arrow 31 so that the semiconductor component 2 to be removed is mounted on the electronic circuit board 1 . It is possible to prevent the semiconductor component 2 from tilting leftward, rightward, or frontward with respect to the insertion direction of the removal jig 8 indicated by the above-described arrow 30 when the semiconductor component 2 is lifted while being supported by the removal jig 8 .
  • the heated semiconductor component 2 is mounted from the lower surface side of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted. It is possible to adopt a configuration having a temperature adjustment mechanism that adjusts the temperature state of the electronic circuit board 1 at the position where it is located.
  • the semiconductor components to be removed from the electronic circuit board 1 by using the semiconductor component separating apparatus of this embodiment are mainly integrated circuit components. Integrated circuit components are often filled with underfill in the same manner as the semiconductor components from which they are removed.
  • the semiconductor component 2 to be removed is locally heated from above by the heating mechanism 7.
  • problems such as solder flash may occur.
  • the heating by the heating mechanism 7 performs local heating from above in a range equivalent to the size of the semiconductor component 2 to be removed for a predetermined heating time. Since the heat transfer to other parts existing in the surrounding area is suppressed to a minimum value, it is not necessary to provide the above-mentioned temperature control mechanism if no thermal effect on the surrounding area is confirmed in this state. .
  • the temperature state of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted is adjusted from the lower surface side of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted.
  • a second heating mechanism 19 (FIG. 4) is adopted that heats the electronic circuit board 1 from below at the position where the heated semiconductor component 2 is mounted. be able to.
  • the temperature control mechanism described above prevents the temperature rise of the electronic circuit board 1 and peripheral components, suppresses heat propagation, and secures the temperature difference between the semiconductor component 2 to be removed and the peripheral components. will be cooled.
  • the use of the second heating mechanism 19 (FIG. 9) for heating the electronic circuit board 1 from below is only for the complete cooling effect. This is because the temperature of the component 2 may not reach the temperature required to melt the solder as described above.
  • the necessary temperature profile conditions are set in advance, and the heating mechanism 7 is controlled by the control means (not shown) to perform local heating.
  • the necessary temperature profile conditions are set in advance, and the second heating mechanism 19 is controlled by control means (not shown).
  • the above-described warming can be performed by
  • the temperature state of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted is measured from the lower surface side of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted.
  • a cooling mechanism may be adopted that gives a cooling effect from below to the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted.
  • the electronic circuit board 1 is a board with a large specific heat, it is desirable to employ a cooling mechanism that provides a cooling effect.
  • an air cooling mechanism that blows air against the lower surface of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted can be employed.
  • the necessary temperature profile conditions are set in advance, and the control means (not shown) controls the air cooling mechanism (not shown) to the lower surface of the electronic circuit board 1 at a desired air flow rate and air velocity. It can be configured to blow air.
  • a heat radiation cooling mechanism (not shown) that is attached to the lower surface of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted as a cooling mechanism and performs cooling by heat radiation can also be adopted.
  • a heat sink, a thermally conductive material, or the like can be employed as the heat dissipation cooling mechanism, and these are attached to the lower surface of the electronic circuit board 1 at the position where the semiconductor component 2 being heated is mounted, or the like. can be employed.
  • the above-described second heating mechanism 19 and the cooling mechanism can be used together.
  • the semiconductor component separating apparatus of this embodiment can be configured to further include a third heating mechanism for heating the lower surface side of the electronic circuit board 1 .
  • This cold solder causes peel-off of the board pattern when removing the semiconductor component 2 to be removed. Therefore, it is desirable to take this countermeasure. As a countermeasure against this, the preheating effect of the entire electronic circuit board 1 is effective.
  • the above-described third heating mechanism for heating the lower surface side of the electronic circuit board 1 is employed to exhibit the preheating effect of the entire electronic circuit board 1 .
  • an infrared heater 20 is arranged below the electronic circuit board 1 as a third heating mechanism.
  • a heat source other than an infrared heater can be used, but it is desirable to use a heat source with high heat permeability, such as an infrared heater.
  • the semiconductor component 2 While the temperature of the entire electronic circuit board 1 is maintained at, for example, 150° C. or higher by the infrared heater 20, the semiconductor component 2 is removed as described above by the semiconductor component separating device. By doing so, the heat locally given to the semiconductor component 2 to be removed does not escape from the semiconductor component 2, and the ⁇ t in the electronic circuit board 1 can be collectively removed without cold soldering.
  • the semiconductor component mounted on the electronic circuit board can be automatically removed from the electronic circuit board in a reusable form without being destroyed.
  • a new semiconductor component can be attached to the board-side pattern surface after removal of the semiconductor component in the electronic circuit board from which the semiconductor component has been removed. Examples of these are introduced below.
  • a semiconductor component separating method using the semiconductor component separating apparatus of the embodiment described above is carried out as follows.
  • This heating also softens the underfill existing between the semiconductor component 2 to be removed and the electronic circuit board 1 .
  • the removal jig 8 is inserted between the semiconductor component 2 to be removed and the electronic circuit board 1 by the above-described operations of the jig insertion mechanism and the jig elevating mechanism provided in the semiconductor component removal mechanism 9 . .
  • the angle adjustment mechanism described above is used to appropriately adjust the insertion angle of the removal jig 8 whose tip is inserted into the gap between the electronic circuit board 1 and the semiconductor component 2 to be removed.
  • the semiconductor component support mechanism 12 is operated as described above so that the semiconductor component 2 to be removed does not move.
  • the heating and temperature control of the removal jig 8, the solder, and the underfill by the first heating mechanism 13 are appropriately performed as necessary.
  • the removal jig 8 supporting the semiconductor component 2 to be removed from the electronic circuit board 1 is separated from the electronic circuit board 1 by the lifting operation described above by the jig elevating mechanism provided in the semiconductor component removal mechanism 9 . .
  • the semiconductor component holding mechanism described above is used, and the semiconductor component holding mechanism and the removing jig 8 work together to raise the semiconductor component 2 while holding it between the semiconductor component holding mechanism and the removing jig 8. By doing so, the semiconductor component 2 can also be separated from the electronic circuit board 1 .
  • the temperature control mechanism described above performs temperature control so that the temperature is suitable for removing the semiconductor component 2 while inserting the removal jig and separating the semiconductor component 2 to be removed. That is, the electronic circuit board by the above-described temperature control mechanism for suppressing the local heating from the upper side by the heating mechanism 7 to the semiconductor component 2 to be removed and the thermal effect on the peripheral parts of the semiconductor component 2 to be removed While performing temperature control by heating or cooling from the lower side of the electronic circuit board 1 as described above, and further heating the entire lower surface side of the electronic circuit board 1 by the third heating mechanism described above, the removal jig described above The semiconductor component 2 to be inserted and removed is separated.
  • the semiconductor component mounting method using the semiconductor component separating apparatus of the above-described embodiment is performed as follows. Remove solder and underfill residue.
  • solder printing or solder transfer is performed on a new semiconductor component to be newly attached to the board-side pattern surface of the electronic circuit board 1.
  • Solder is printed or dispensed onto the board-side pattern surface of the electronic circuit board 1 .
  • solder printing or solder transfer to the new semiconductor component and solder printing or dispensing supply to the board-side pattern surface of the electronic circuit board 1 may be performed.
  • the new semiconductor component after alignment is locally heated by the heating mechanism 7 in the semiconductor component separating apparatus of the above-described embodiment, and the new semiconductor component is attached to the electronic circuit board 1 .
  • the problem with heating is that it causes problems due to the thermal effects on peripheral components, so the temperature adjustment mechanism described above makes the temperature suitable for attaching semiconductor components, just as when removing them. Adjust the temperature as follows. That is, the new semiconductor component aligned with the mounting position as described above is locally heated from the upper side by the heating mechanism 7, and the above-described temperature control mechanism for suppressing the thermal effect on peripheral components. While controlling the temperature by heating or cooling from the lower side of the circuit board 1 and further heating the entire lower surface side of the electronic circuit board 1 by the above-described third heating mechanism, the new semiconductor component is attached to the electronic circuit board 1.

Abstract

Provided is a semiconductor-component-separating device in which a semiconductor component mounted on an electronic circuit board can be automatically removed from the electronic circuit board in a reusable form without destruction. Provided are a method for separating the semiconductor component from the electronic circuit board and a method for attaching the semiconductor component to the electronic circuit board using the semiconductor separating device. The semiconductor-component-separating device comprises: a heating mechanism that performs heating of the semiconductor component mounted on the electronic circuit board from the upper side of the semiconductor component; a removal jig; a jig insertion mechanism that inserts the removal jig between the electronic circuit board and the semiconductor component; and a jig lifting mechanism that performs a lifting operation of the removal jig inserted between the electronic circuit board and the semiconductor component in the upward direction of the electronic circuit board in a state with the semiconductor component supported on the upper side. Provided are a method for separating the semiconductor component from the electronic circuit board and a method for attaching the semiconductor component to the electronic circuit board using the semiconductor-component-separating device.

Description

半導体部品分離装置並びにこれを用いた半導体部品分離及び取付方法Semiconductor component separation device and semiconductor component separation and mounting method using the same
 この発明は半導体部品分離装置並びにこれを用いた半導体部品分離及び取付方法に関する。 The present invention relates to a semiconductor component separating device and a semiconductor component separating and mounting method using the same.
 半導体部品分離装置については従来から種々の提案が行われている。 Various proposals have been made for semiconductor component separation equipment.
 例えば、特許文献1には、プリント配線板基板に実装されているBall Grid Array(BGA)のパッケージ構造を持つ半導体部品、例えば、半導体集積回路、半導体装置などのICを、周囲の電子部品に悪影響を及ぼすおそれを無くしてプリント配線板基板から能率良く剥がせるとする半導体装置のリペア方法が提案されている。 For example, in Patent Document 1, a semiconductor component having a package structure of Ball Grid Array (BGA) mounted on a printed wiring board substrate, for example, an IC such as a semiconductor integrated circuit or a semiconductor device, has an adverse effect on surrounding electronic components. A method for repairing a semiconductor device has been proposed, which eliminates the risk of causing damage to the semiconductor device and enables efficient removal from the printed wiring board substrate.
 剥離対象の半導体部品の上面よりも面積が大きい良伝熱性の伝熱板を熱硬化性樹脂を用いて半導体部品上面の全面に密着させて接着させ、前記伝熱板にヒータツールを押圧する。これにより伝熱板および半導体部品を加熱し、アンダーフィルを軟化させかつハンダを溶融させると共に熱硬化性樹脂を硬化させる。こうして熱硬化性樹脂を硬化させた状態で、引き剥がし具を半導体部品上面より外側へ突出している伝熱板の突出部に係合させ、伝熱板を半導体部品と一体にしてプリント配線板から剥がすものである。 A heat transfer plate having good heat conductivity and having a larger area than the upper surface of the semiconductor component to be peeled off is adhered to the entire upper surface of the semiconductor component using a thermosetting resin, and the heater tool is pressed against the heat transfer plate. This heats the heat transfer plate and the semiconductor component, softens the underfill, melts the solder, and cures the thermosetting resin. With the thermosetting resin cured in this way, a stripping tool is engaged with the protruding portion of the heat transfer plate that protrudes outward from the upper surface of the semiconductor component, and the heat transfer plate is integrated with the semiconductor component and removed from the printed wiring board. It is peel off.
 また、特許文献2には、プリント配線板基板に実装されているBGA構造のCPU(Central Processing Unit)や、MCP(Multi Chip Package)などのICチップ(半導体部品)を、損傷することなく、プリント配線板基板から分離するという半導体部品分離方法が提案されている。 In addition, in Patent Document 2, IC chips (semiconductor parts) such as a BGA structure CPU (Central Processing Unit) and MCP (Multi Chip Package) mounted on a printed wiring board are printed without damaging them. A semiconductor component separating method has been proposed for separating from a wiring board substrate.
 分離対象となる半導体部品と基板との間隔の50%~90%の直径を有する線状部材を基板との間に配置された樹脂材の端部に接触させて、前記半導体部品と前記基板との間に配置されたはんだと前記樹脂材とを軟化させる。線状部材を樹脂材の端部に接触させた状態で基板の表面に沿って移動させるものである。線状部材を基板の表面に沿って移動させる際は、樹脂材の端部に接触させた線状部材を基板側へ押し付けるとしている。 A linear member having a diameter of 50% to 90% of the distance between the semiconductor component to be separated and the substrate is brought into contact with the end of the resin material placed between the substrate and the semiconductor component and the substrate. The solder and the resin material arranged between are softened. The linear member is moved along the surface of the substrate while being in contact with the end of the resin material. When the linear member is moved along the surface of the substrate, the linear member in contact with the end of the resin material is pressed against the substrate.
特開2006-303266号公報JP 2006-303266 A 特開2016-119336号公報JP 2016-119336 A
 半導体集積回路、等の半導体部品が、プリント配線板基板、等の基板に実装される場合には、Ball Grid Array(BGA)構造が採用されることがある。BGA構造で実装されている場合、基板と半導体部品との間は、はんだボールと、樹脂(アンダーフィル)とによって接続、固定が行われているのが一般的である。 When semiconductor components such as semiconductor integrated circuits are mounted on substrates such as printed wiring board substrates, a Ball Grid Array (BGA) structure may be adopted. When mounted in a BGA structure, the board and the semiconductor component are generally connected and fixed by solder balls and resin (underfill).
 また、電子回路基板上にはんだ接続された表面実装のPackage On Package(POP)構造など2段重ねを含む集積回路などでは、半導体部品の下面に電極が配列されている構造になる。図1は、半導体部品2の下面に複数個の電極6が配列されている状態の一例を示すものである。 In addition, in integrated circuits that include a two-tiered structure such as a surface-mounted Package On Package (POP) structure soldered to an electronic circuit board, electrodes are arranged on the bottom surface of the semiconductor component. FIG. 1 shows an example of a state in which a plurality of electrodes 6 are arranged on the bottom surface of a semiconductor component 2. As shown in FIG.
 プリント配線基板、等の基板に実装されている半導体集積回路、等の半導体部品を前記基板から分離する方法については上述したように種々の提案が行われている。 As described above, various proposals have been made for methods of separating a semiconductor component such as a semiconductor integrated circuit mounted on a board such as a printed wiring board from the board.
 しかし、基板に実装されている半導体部品を前記基板から分離することは今日においても容易なことではない。 However, even today, it is not easy to separate semiconductor components mounted on a board from the board.
 例えば、上述したPOP構造の場合、はんだ接合部であるバンプに対してはんだごてなどで外部から直接アプローチすることは困難である。 For example, in the case of the POP structure described above, it is difficult to directly approach the bumps, which are the solder joints, from the outside with a soldering iron or the like.
 プリント配線板基板、等の基板1と、半導体集積回路、等の半導体部品2との間のはんだ接合部3に外部から衝撃などが加えられると、図2に示したように、はんだ接合部3にクラック4などが発生し、接続不良となる可能性がある。 When a shock or the like is applied from the outside to the solder joints 3 between the substrate 1 such as a printed wiring board substrate and the semiconductor component 2 such as a semiconductor integrated circuit, the solder joints 3 are damaged as shown in FIG. There is a possibility that a crack 4 or the like will occur in the connection, resulting in poor connection.
 このため、BGA構造では、はんだ接続された半導体部品2と基板1とのの隙間に、図3図示のように、アンダーフィル(封止材)5が充填される。 Therefore, in the BGA structure, an underfill (sealing material) 5 is filled in the gap between the soldered semiconductor component 2 and the substrate 1, as shown in FIG.
 アンダーフィル5は半導体部品2の接続を保護し衝撃に強くなるが、半導体部品2の不具合などで半導体部品2の交換を必要とする場合にはアンダーフィル5が存在していることで交換作業が簡単ではなくなる。 The underfill 5 protects the connection of the semiconductor component 2 and makes it resistant to impact. However, if the semiconductor component 2 needs to be replaced due to a defect in the semiconductor component 2 or the like, the presence of the underfill 5 makes replacement work unnecessary. it won't be easy.
 例えば、熱を加えることで、はんだは熱溶融により液状になるが、アンダーフィルは加熱してもやや軟化するものの、半導体部品を容易に剥がすことができる状態にまでは軟化しない。 For example, when heat is applied, the solder becomes liquid due to thermal melting, but the underfill softens slightly even when heated, but does not soften to the point where the semiconductor component can be easily peeled off.
 このため、上述したような半導体部品の交換作業には加熱に加え力学的な方法によりアンダーフィルを破壊することが必用になる。 For this reason, in addition to heating, it is necessary to destroy the underfill by a mechanical method when replacing semiconductor parts as described above.
 上述したように、従来から種々の提案が行われているが、現状では、加熱した上で、図3に示すように、手作業によりピンセットなど薄く先端の細い硬質な金属を用いて取り外しを行うことが現実的な取り外し方法になっている。 As described above, various proposals have been made in the past, but at present, after heating, as shown in FIG. This is a realistic removal method.
 しかし、このような、手作業による取り外しでは、作業者による感覚的なセンスや、高度な技術習得が必要になる。このため、作業を行うことのできる人を選ぶことが必要になっていた。 However, such manual removal requires a sensory sense and advanced skill acquisition by the operator. For this reason, it has become necessary to select a person who can do the work.
 そこで、この発明は、電子回路基板に実装されている半導体部品を、破壊することなく再利用可能な形で電子回路基板から自動的に取り外すことのできる半導体部品分離装置を提案することを目的にしている。また、この発明は、前述の半導体部品分離装置を用いた半導体部品分離方法及び、半導体部品取付方法を提案することを目的にしている。 SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a semiconductor component separating apparatus capable of automatically removing semiconductor components mounted on an electronic circuit board from the electronic circuit board in a reusable manner without destroying them. ing. Another object of the present invention is to propose a semiconductor component separating method and a semiconductor component mounting method using the semiconductor component separating apparatus described above.
 本願発明は、以下に例示する態様を含むものである。
[1]
 電子回路基板に実装されている半導体部品に対して前記半導体部品の上側から加熱を行う加熱機構と、
 取り外し治具と、
 前記電子回路基板と、前記半導体部品との間に、前記取り外し治具を挿入させる治具挿入機構と、
 前記電子回路基板と前記半導体部品との間に挿入されている前記取り外し治具を、前記半導体部品を上側に支持している状態で、前記電子回路基板の上方向への上昇動作を行わせる治具昇降機構と
 を備えている半導体部品分離装置。
[2]
 前記半導体部品に対して前記取り外し治具が傾斜している角度を調整する角度調整機構を更に備えている[1]の半導体部品分離装置。
[3]
 前記取り外し治具が、前記治具挿入機構によって前記電子回路基板と前記半導体部品との間に挿入される際に、前記取り外し治具が挿入される前記半導体部品の側に対向する側において前記半導体部品が移動しないように前記半導体部品を支持する半導体部品支持機構を更に備えている[1]又は[2]の半導体部品分離装置。
[4]
 前記取り外し治具を加温すると共に前記取り外し治具の加温状態を調整する第一の加温機構が前記取り外し治具に付帯されている[1]~[3]のいずれかの半導体部品分離装置。
[5]
 前記取り外し治具が、前記半導体部品を上側に支持している状態で、前記治具昇降機構によって前記上昇動作を行う際に、前記取り外し治具と共同して前記半導体部品を前記取り外し治具との間で保持しつつ前記上昇動作を行う半導体部品保持機構を更に備えている[1]~[4]のいずれかの半導体部品分離装置。
[6]
 前記半導体部品保持機構は、バキューム吸着保持機構である[5]の半導体部品分離装置。
[7]
 前記半導体部品保持機構は、前記取り外し治具と共同して前記半導体部品を前記取り外し治具との間で保持する平板状の板状保持機構である[5]の半導体部品分離装置。
[8]
 前記板状保持機構を加温すると共に前記板状保持機構の加温状態を調整する第二の加温機構が前記板状保持機構に備えられている[7]の半導体部品分離装置。
[9]
 前記板状保持機構は、前記半導体部品の上側面との間にわずかなクリアランスを存在させて前記半導体部品の上側面と対向し、前記取り外し治具と共同して前記半導体部品を前記取り外し治具との間で保持する[7]の半導体部品分離装置。
[10]
 前記加熱機構による前記半導体部品に対する加熱は、前記半導体部品のサイズと同等の範囲での局所的な加熱である[1]~[9]のいずれかの半導体部品分離装置。
[11]
 加熱が行われている前記半導体部品が実装されている位置の前記電子回路基板の下面側から、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板の温度状態を調整する温度調整機構を更に備えている[1]~[10]のいずれかの半導体部品分離装置。
[12]
 前記温度調整機構は、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板を下側から加温する第二の加温機構である[11]の半導体部品分離装置。
[13]
 前記温度調整機構は、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板に対して冷却効果を与える冷却機構である[11]の半導体部品分離装置。
[14]
 前記冷却機構は、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板に対して下側から風を吹き付ける空冷機構である[13]の半導体部品分離装置。
[15]
 前記冷却機構は、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板に下側から取り付けられて放熱による冷却を行う放熱冷却機構である[13]の半導体部品分離装置。
[16]
 前記電子回路基板の下面側を加温する第三の加温機構を更に備えている[1]~[15]のいずれかの半導体部品分離装置。
[17]
 [1]~[16]のいずれかの半導体部品分離装置を用いて、電子回路基板に実装されている取り外し対象の半導体部品に対して上側から加熱を行いつつ、前記取り外し治具を、取り外し対象の前記半導体部品と、前記電子回路基板との間に挿入させ、前記取り外し治具を上昇させることで取り外し対象の前記半導体部品を前記電子回路基板から取り外す半導体部品分離方法。
[18]
 半導体部品の取り外しが行われた後の電子回路基板における前記半導体部品取り外し後の基板側パターン面におけるはんだ及びアンダーフィル残渣を除去する工程と、
 前記電子回路基板から取り外された前記半導体部品に替えて新たに前記電子回路基板の前記基板側パターン面に取り付ける新規半導体部品へのはんだ印刷又ははんだ転写を行う工程、及び/又は、
 前記電子回路基板における前記基板側パターン面にはんだ印刷又はディスペンス供給を行う工程と、
 前記電子回路基板における前記基板側パターンと、前記新規半導体部品の電極の位置合わせを行う工程と、
 位置合わせ後の前記新規半導体部品に対して、[1]~[16]のいずれかの半導体部品分離装置を用いて加熱を行う工程
 とを備えている電子回路基板への半導体部品取付方法。
The present invention includes aspects exemplified below.
[1]
a heating mechanism for heating a semiconductor component mounted on an electronic circuit board from above the semiconductor component;
a removal jig;
a jig insertion mechanism for inserting the removal jig between the electronic circuit board and the semiconductor component;
The removal jig inserted between the electronic circuit board and the semiconductor component is a jig for moving the electronic circuit board upward while supporting the semiconductor component upward. A semiconductor component separating apparatus comprising: a tool lifting mechanism;
[2]
The semiconductor component separating apparatus according to [1], further comprising an angle adjusting mechanism for adjusting an angle at which the removing jig is inclined with respect to the semiconductor component.
[3]
When the removal jig is inserted between the electronic circuit board and the semiconductor component by the jig insertion mechanism, the semiconductor component is mounted on the side facing the semiconductor component into which the removal jig is inserted. The semiconductor component separating apparatus according to [1] or [2], further comprising a semiconductor component supporting mechanism for supporting the semiconductor component so that the component does not move.
[4]
The semiconductor component separation according to any one of [1] to [3], wherein a first heating mechanism for heating the removal jig and adjusting the heating state of the removal jig is attached to the removal jig. Device.
[5]
In a state in which the removal jig supports the semiconductor component on the upper side, the semiconductor component is moved with the removal jig in cooperation with the removal jig when the lifting operation is performed by the jig elevating mechanism. The semiconductor component separating apparatus according to any one of [1] to [4], further comprising a semiconductor component holding mechanism that performs the lifting operation while holding the semiconductor component between the two.
[6]
The semiconductor component separating apparatus according to [5], wherein the semiconductor component holding mechanism is a vacuum suction holding mechanism.
[7]
The semiconductor component separating apparatus according to [5], wherein the semiconductor component holding mechanism is a plate-shaped holding mechanism that holds the semiconductor component together with the removal jig.
[8]
The semiconductor component separating apparatus according to [7], wherein the plate-like holding mechanism is provided with a second heating mechanism for heating the plate-like holding mechanism and adjusting the heating state of the plate-like holding mechanism.
[9]
The plate-shaped holding mechanism faces the upper side surface of the semiconductor component with a slight clearance therebetween, and cooperates with the removal jig to hold the semiconductor component by the removal jig. The semiconductor component separation device of [7] held between.
[10]
The semiconductor component separating apparatus according to any one of [1] to [9], wherein the heating of the semiconductor component by the heating mechanism is local heating in a range equivalent to the size of the semiconductor component.
[11]
The temperature state of the electronic circuit board at the position where the semiconductor component being heated is mounted is adjusted from the lower surface side of the electronic circuit board at the position where the semiconductor component being heated is mounted. The semiconductor component separating apparatus according to any one of [1] to [10], further comprising a temperature adjusting mechanism for controlling the temperature.
[12]
The semiconductor component separating apparatus according to [11], wherein the temperature adjusting mechanism is a second heating mechanism that heats the electronic circuit board from below at a position where the heated semiconductor component is mounted.
[13]
The semiconductor component separating apparatus according to [11], wherein the temperature adjusting mechanism is a cooling mechanism that provides a cooling effect to the electronic circuit board at a position where the heated semiconductor component is mounted.
[14]
The semiconductor component separating apparatus according to [13], wherein the cooling mechanism is an air cooling mechanism that blows air from below to the electronic circuit board at the position where the heated semiconductor component is mounted.
[15]
The semiconductor component separation apparatus of [13], wherein the cooling mechanism is a heat radiation cooling mechanism that is attached from below to the electronic circuit board at the position where the semiconductor component being heated is mounted and performs cooling by heat radiation. .
[16]
The semiconductor component separating apparatus according to any one of [1] to [15], further comprising a third heating mechanism for heating the lower surface side of the electronic circuit board.
[17]
Using the semiconductor component separation apparatus according to any one of [1] to [16], while heating the semiconductor component to be removed mounted on the electronic circuit board from above, the removal jig is moved to the object to be removed. and the electronic circuit board, and removing the semiconductor component to be removed from the electronic circuit board by lifting the removing jig.
[18]
a step of removing solder and underfill residue on the board-side pattern surface after removal of the semiconductor component in the electronic circuit board after removal of the semiconductor component;
a step of performing solder printing or solder transfer onto a new semiconductor component newly attached to the board-side pattern surface of the electronic circuit board in place of the semiconductor component removed from the electronic circuit board; and/or
a step of performing solder printing or dispensing supply on the board-side pattern surface of the electronic circuit board;
a step of aligning the board-side pattern of the electronic circuit board with the electrode of the new semiconductor component;
A method of attaching a semiconductor component to an electronic circuit board, comprising the step of heating the new semiconductor component after alignment using the semiconductor component separating apparatus according to any one of [1] to [16].
 この発明によれば、電子回路基板に実装されている半導体部品を、破壊することなく再利用可能な形で電子回路基板から自動的に取り外すことのできる半導体部品分離装置を提供することができる。また、この発明によれば、前述の半導体部品分離装置を用いた半導体部品分離方法及び、半導体部品取付方法を提供することができる。 According to the present invention, it is possible to provide a semiconductor component separating apparatus capable of automatically removing a semiconductor component mounted on an electronic circuit board from the electronic circuit board in a reusable form without destroying it. Further, according to the present invention, it is possible to provide a semiconductor component separating method and a semiconductor component mounting method using the above-described semiconductor component separating apparatus.
電子回路基板上にはんだ接続された表面実装のPackage On Package(POP)構造で半導体部品の下面に複数個の電極が配列されている状態の一例を表す図。FIG. 2 is a diagram showing an example of a state in which a plurality of electrodes are arranged on the lower surface of a semiconductor component in a surface-mount package-on-package (POP) structure soldered to an electronic circuit board; 基板と半導体部品との間のはんだ接合部に外部から衝撃などが加えられる等してはんだ接合部にクラックが発生した状態を説明する一部を省略して表す断面図。FIG. 4 is a partially omitted cross-sectional view illustrating a state in which a crack is generated in a soldered joint between a substrate and a semiconductor component due to external impact or the like being applied to the soldered joint; ピンセットなど薄く先端の細い硬質な金属を用いて半導体部品を手作業で基板から取り外す状態を説明する図。FIG. 10 is a view for explaining how a semiconductor component is manually removed from a substrate using a thin hard metal with a thin tip such as tweezers; 本発明の一実施形態に係る半導体部品分離装置の全体構成の一例を表す一部を省略した側面図。1 is a partially omitted side view showing an example of the overall configuration of a semiconductor component separating apparatus according to an embodiment of the present invention; FIG. 本発明の一実施形態に係る半導体部品分離装置における治具挿入機構、半導体部品保持機構、半導体部品支持機構による各動作の一例を説明する一部を省略した正面図。FIG. 4 is a partially omitted front view for explaining an example of each operation of a jig insertion mechanism, a semiconductor component holding mechanism, and a semiconductor component support mechanism in the semiconductor component separating apparatus according to the embodiment of the present invention; 本発明の一実施形態に係る半導体部品分離装置における治具挿入機構、治具上昇機構、半導体部品保持機構、半導体部品支持機構による各動作の他の例を説明する一部を省略した正面図。FIG. 4 is a partially omitted front view for explaining another example of each operation of the jig insertion mechanism, the jig lifting mechanism, the semiconductor component holding mechanism, and the semiconductor component support mechanism in the semiconductor component separating apparatus according to the embodiment of the present invention; 本発明の一実施形態に係る半導体部品分離装置において、基板に実装されている取り外し対象の半導体部品に対して、取り外し治具が、基板と半導体部品との間に挿入されるべく移動する状態を説明する一部を省略した平面図。In the semiconductor component separating apparatus according to the embodiment of the present invention, the removal jig moves to be inserted between the substrate and the semiconductor component to be removed mounted on the substrate. The top view which abbreviate|omitted one part to demonstrate. 本発明の一実施形態に係る半導体部品分離装置において、第一の加温機構が取り外し治具に付帯されている構造の一例を説明する一部を省略した側面図。1 is a partially omitted side view for explaining an example of a structure in which a first heating mechanism is attached to a removal jig in a semiconductor component separating apparatus according to an embodiment of the present invention; FIG. 半導体部品を基板から取り外す際に生じることがあるはんだフラッシュなどの発生メカニズムを説明する概念図。FIG. 4 is a conceptual diagram explaining the mechanism of occurrence of solder flash or the like that may occur when removing a semiconductor component from a substrate;
 この実施形態の半導体部品分離装置は、加熱機構7と、取り外し治具8を備えている半導体部品取り外し機構9とを備えている。 The semiconductor component separating apparatus of this embodiment includes a heating mechanism 7 and a semiconductor component removing mechanism 9 having a removing jig 8 .
 加熱機構7は、電子回路基板1に実装されている取り外し対象の半導体部品2に対して半導体部品2の上側から加熱を行って、電子回路基板1と半導体部品2との間に存在しているはんだがその融点を越えるまで加熱する加熱手段である。取り外し対象の半導体部品2に対する加熱機構7による加熱は、半導体部品2のサイズと同等の範囲での局所的な加熱である。なお、図4~図6では、電子回路基板1上にはんだ接続された表面実装のPOP構造からなる半導体部品を例示している。そこで、図4~図6では、各半導体部品をそれぞれ符号2a、2b、2cで表しているが、本明細書、図面において、電子回路基板1に実装される半導体集積回路、等の半導体部品を総称して「半導体部品2」と表示することがある。 The heating mechanism 7 heats the semiconductor component 2 to be removed mounted on the electronic circuit board 1 from above the semiconductor component 2 and is present between the electronic circuit board 1 and the semiconductor component 2. A heating means that heats the solder until it exceeds its melting point. The heating of the semiconductor component 2 to be removed by the heating mechanism 7 is local heating in a range equivalent to the size of the semiconductor component 2 . 4 to 6 exemplify a semiconductor component having a surface-mounted POP structure soldered to the electronic circuit board 1. As shown in FIG. Therefore, in FIGS. 4 to 6, each semiconductor component is represented by reference numerals 2a, 2b, and 2c, respectively. They may be collectively indicated as "semiconductor component 2".
 取り外し対象の半導体部品2に対する加熱機構7による上述した局所的な加熱は、取り外し対象となる半導体部品2の上部から加熱を行って、取り外し対象の半導体部品2と電子回路基板1との間に存在しているはんだが融点を超える温度まで温度上昇させるものである。 The above-described local heating of the semiconductor component 2 to be removed by the heating mechanism 7 heats the semiconductor component 2 to be removed from above, and the semiconductor component 2 to be removed and the electronic circuit board 1 are heated. The solder is heated to a temperature above its melting point.
 なお、加熱機構7による上述の加熱により、取り外し対象の半導体部品2と電子回路基板1との間に存在しているアンダーフィルは、その種類にもよるが、所定の温度まで加熱されることである程度まで軟化する。 The underfill existing between the semiconductor component 2 to be removed and the electronic circuit board 1 is heated to a predetermined temperature by the above-described heating by the heating mechanism 7, depending on the type of the underfill. soften to some extent.
 上述した加熱機構7としては、熱風、赤外線、レーザーなどの熱源を用いることができる。いずれの熱源を加熱機構7として用いる場合であっても、取り外し対象となる半導体部品2のサイズと同等の範囲で上部から局所的な加熱を、所定の加熱時間行う。これにより、取り外し対象となる半導体部品2の周辺に存在している他の部品に対する熱伝播を最小値に抑えた加熱を行う。 Heat sources such as hot air, infrared rays, and lasers can be used as the heating mechanism 7 described above. Regardless of which heat source is used as the heating mechanism 7, local heating is performed from above within a range equivalent to the size of the semiconductor component 2 to be removed for a predetermined heating time. As a result, the semiconductor component 2 to be removed is heated while minimizing the heat transfer to other components existing around the semiconductor component 2 .
 上述した局所的な加熱を行うことに必用な温度プロファイル条件を電子回路基板1、取り外し対象の半導体部品2、電子回路基板1と取り外し対象の半導体部品2との間に存在しているはんだ、アンダーフィルの特性などに基づいてあらかじめ設定しておき、不図示の制御手段からの制御によって、熱風、赤外線、レーザーなどの熱源からなる加熱機構7に上述した局所的な加熱を行わせることができる。 The temperature profile conditions necessary for performing the above-described local heating are the electronic circuit board 1, the semiconductor component 2 to be removed, the solder existing between the electronic circuit board 1 and the semiconductor component 2 to be removed, and the underlayer. It is possible to set in advance based on the properties of the fill and cause the heating mechanism 7 consisting of a heat source such as hot air, infrared rays, or laser to perform the above-described local heating under the control of a control means (not shown).
 上述した熱風、赤外線、レーザーなどの種々の熱源からなる加熱機構7を用いて、上述したように、取り外し対象の半導体部品2に対して、上側から、局所的に加熱を行う際、後述するように、電子回路基板1の下面から調温(加熱や、冷却)を行う機構を組み合わせることができる。 As described above, when the semiconductor component 2 to be removed is locally heated from above using the heating mechanism 7 composed of various heat sources such as hot air, infrared rays, and laser, as described later, In addition, a mechanism for temperature control (heating or cooling) from the lower surface of the electronic circuit board 1 can be combined.
 取り外し治具8は、先端部におけるその厚み(図4、図8における取り外し治具8の先端部の上下方向のサイズ)が、電子回路基板1と半導体部品2との間に挿入できる程度の薄い薄板状又は針状の治具である。図4~図6に図示されているように、少なくとも、薄板状又は針状の取り外し治具8の先端における図面中で上下方向になる厚みは、電子回路基板1に実装されている半導体部品2の下側面と、電子回路基板1の上側面との間に形成されている上下方向の隙間に挿入できる薄さを持った厚みである。 The thickness of the tip of the removal jig 8 (the vertical size of the tip of the removal jig 8 in FIGS. 4 and 8) is thin enough to be inserted between the electronic circuit board 1 and the semiconductor component 2. It is a thin plate-like or needle-like jig. As shown in FIGS. 4 to 6, at least the thickness in the vertical direction in the drawing at the tip of the thin plate-like or needle-like removal jig 8 is equal to that of the semiconductor component 2 mounted on the electronic circuit board 1. It is thin enough to be inserted into the vertical gap formed between the lower side surface of the electronic circuit board 1 and the upper side surface of the electronic circuit board 1 .
 薄板状又は針状の取り外し治具8は、図5~7に矢印30で示す方向で、電子回路基板1と半導体部品2との間に挿入される。この挿入方向に直交する方向の大きさである取り外し治具8の幅は、取り外し対象の半導体部品2の周辺で電子回路基板1に配備されている部品のサイズや、取り外し対象の半導体部品2に対して矢印30で示す方向でアプローチする隙間の大きさに合わせて決定される。 A thin plate-like or needle-like removal jig 8 is inserted between the electronic circuit board 1 and the semiconductor component 2 in the direction indicated by the arrow 30 in FIGS. The width of the removal jig 8, which is the size in the direction perpendicular to the insertion direction, is determined by the size of the components arranged on the electronic circuit board 1 around the semiconductor component 2 to be removed and the semiconductor component 2 to be removed. On the other hand, it is determined according to the size of the gap to be approached in the direction indicated by the arrow 30 .
 図7図示のように、取り外し対象となる半導体部品2の周辺には、0402部品(0.4mm×0.2mm)などの微細なチップ部品10が隙間なく実装されていることが多い。そこで、取り外し治具8が、縦に実装され、隣接している0402部品同士の間を通過して、矢印30で示す方向で取り外し対象となる半導体部品2にアクセスするときには、取り外し治具8の幅は、0402部品(0.4mm×0.2mm)が縦に実装されたときの0.2mm+実装クリアランス幅(隣のチップ部品10との間の隙間)に対応する為、0.2mm未満であることが望ましいものとなる。ただし、周辺部品の環境が許せばこれよりも大きな幅でも良い。 As shown in FIG. 7, minute chip parts 10 such as 0402 parts (0.4 mm×0.2 mm) are often mounted without gaps around the semiconductor parts 2 to be removed. Therefore, when the removal jig 8 passes between the vertically mounted 0402 components adjacent to each other and accesses the semiconductor component 2 to be removed in the direction indicated by the arrow 30, the removal jig 8 The width is less than 0.2 mm because it corresponds to 0.2 mm when the 0402 component (0.4 mm x 0.2 mm) is vertically mounted + mounting clearance width (gap between adjacent chip components 10). Something becomes desirable. However, if the environment of peripheral components permits, a wider width than this may be used.
 このように、先端が薄く、幅が小さい薄板状又は針状の取り外し治具8は、後述するように、電子回路基板1と取り外し対象となる半導体部品2との間に挿入して、取り外し対象となる半導体部品2を電子回路基板1から取り外す際に大きな力を受ける。そこで、これに堪え得る硬質な金属製とすることが望ましい。 In this way, the thin plate-like or needle-like removal jig 8 with a thin tip and a small width is inserted between the electronic circuit board 1 and the semiconductor component 2 to be removed, as will be described later. When removing the semiconductor component 2 from the electronic circuit board 1, a large force is applied. Therefore, it is desirable to use a hard metal that can withstand this.
 加熱機構7による上述した加熱により、取り外し対象の半導体部品2と電子回路基板1との間に存在しているはんだは融点を超える温度まで温度上昇することが可能である。一方、同じく、取り外し対象の半導体部品2と電子回路基板1との間に存在しているアンダーフィルは、ある程度までの軟化にとどまっていることが考えられる。このため、電子回路基板1と取り外し対象となる半導体部品2との間への後述する取り外し治具8の挿入動作や、取り外し治具8の上に半導体部品2を支持しての後述する上昇動作によって、取り外し対象の半導体部品2を電子回路基板1から取り外すための、アンダーフィルの完全破壊が行われることになる。 The above-described heating by the heating mechanism 7 can raise the temperature of the solder existing between the semiconductor component 2 to be removed and the electronic circuit board 1 to a temperature exceeding the melting point. On the other hand, similarly, it is conceivable that the underfill existing between the semiconductor component 2 to be removed and the electronic circuit board 1 is only softened to some extent. For this reason, an operation of inserting a removal jig 8, which will be described later, between the electronic circuit board 1 and the semiconductor component 2 to be removed, and an operation of lifting the semiconductor component 2 while supporting it on the removal jig 8, which will be described later. Thus, the underfill is completely destroyed in order to remove the semiconductor component 2 to be removed from the electronic circuit board 1 .
 これらの点を考慮して、取り外し治具8は、電子回路基板1と取り外し対象となる半導体部品2との間に挿入して、取り外し対象となる半導体部品2を電子回路基板1から取り外す際に受ける大きな力に堪え得る硬質な金属製とすることが望ましい。 In consideration of these points, the removal jig 8 is inserted between the electronic circuit board 1 and the semiconductor component 2 to be removed, and is used when removing the semiconductor component 2 to be removed from the electronic circuit board 1. It is desirable to use a hard metal that can withstand the large force to which it is subjected.
 半導体部品取り外し機構9は、治具挿入機構と、治具昇降機構とを備えている。 The semiconductor component removal mechanism 9 includes a jig insertion mechanism and a jig elevating mechanism.
 治具挿入機構は、取り外し治具8を矢印30(図5)で示す方向に移動させて、取り外し治具8を電子回路基板1と、半導体部品2bとの間に挿入させる機構である。 The jig insertion mechanism is a mechanism that moves the removal jig 8 in the direction indicated by the arrow 30 (FIG. 5) and inserts the removal jig 8 between the electronic circuit board 1 and the semiconductor component 2b.
 治具昇降機構は、電子回路基板1と半導体部品2bとの間に挿入されている取り外し治具8を、図6図示のように、半導体部品2bを上側に支持している状態で、矢印31で示す電子回路基板1の上方向への上昇動作を行わせる機構である。また、上昇動作を行わせた後、治具挿入機構によって取り外し治具8を矢印30で示す方向に移動させて電子回路基板1と半導体部品2bとの間に挿入させる動作が行われる位置まで取り外し治具8を下降させる動作を行わせる機構である。 The jig elevating mechanism moves the removal jig 8 inserted between the electronic circuit board 1 and the semiconductor component 2b as shown in FIG. is a mechanism for causing the electronic circuit board 1 to move upward. After the lifting operation, the removal jig 8 is moved in the direction indicated by the arrow 30 by the jig insertion mechanism and removed to the position where the operation of inserting it between the electronic circuit board 1 and the semiconductor component 2b is performed. It is a mechanism that causes the jig 8 to move downward.
 治具挿入機構、治具昇降機構としてはリニア駆動方式の治具挿入機構、治具昇降機構を採用することができる。リニア駆動方式であれば、精密で、なお且つ、高い剛性を発揮させることができる。 A linear drive type jig insertion mechanism and jig lifting mechanism can be used as the jig insertion mechanism and jig lifting mechanism. If it is a linear drive system, precision and high rigidity can be exhibited.
 そこで、取り外し治具8が電子回路基板1と半導体部品2bとの間に挿入される際に大きな力を受ける場合でも半導体部品取り外し機構9に変形が生じる、等の不具合が発生することを防止できる。 Therefore, even if the removing jig 8 receives a large force when it is inserted between the electronic circuit board 1 and the semiconductor component 2b, it is possible to prevent problems such as deformation of the semiconductor component removing mechanism 9 from occurring. .
 また、精密で、なお且つ、高い剛性を発揮できるリニア駆動方式の治具挿入機構、治具昇降機構を採用することで、取り外し治具8を矢印30方向で挿入させ、矢印31方向で上昇させる際に、取り外し治具8の挿入角度と高さを維持しながら行うことができる。取り外し治具8の挿入角度と高さを維持しながら矢印30方向に挿入させ、矢印31方向に上昇させることができるので、取り外し治具8の先端側が電子回路基板1の側に向かって傾く、変形する、等によって電子回路基板1を損傷させる可能性を未然に防止することもできる。 Further, by adopting a precise and highly rigid linear drive type jig insertion mechanism and jig elevating mechanism, the removal jig 8 is inserted in the direction of arrow 30 and lifted in the direction of arrow 31. At the time, it can be performed while maintaining the insertion angle and height of the removal jig 8 . Since the removal jig 8 can be inserted in the direction of arrow 30 and raised in the direction of arrow 31 while maintaining the insertion angle and height of the removal jig 8, the tip side of the removal jig 8 tilts toward the electronic circuit board 1 side. It is also possible to prevent the possibility of damaging the electronic circuit board 1 due to deformation or the like.
 リニア駆動方式による治具昇降機構は、上述した取り外し治具8の上昇及び下降動作をスライド方式で行わせるものにすることができる。 A jig elevating mechanism based on a linear driving method can be one that performs the lifting and lowering operations of the removal jig 8 described above by a sliding method.
 半導体部品取り外し機構9は、更に、取り外し対象の半導体部品2に対して取り外し治具8が傾斜している角度を調整する角度調整機構を備えている構成にすることができる。 The semiconductor component removal mechanism 9 may further include an angle adjustment mechanism that adjusts the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed.
 図6図示の実施形態は、取り外し治具8の基端が、電子回路基板1の上側平面に対して平行に伸びている回転支持軸11に回転可能に支持されているものである。図6図示の実施形態では、不図示のリニア駆動機構によって、取り外し治具8が回転支持軸11を中心として、図8に矢印32a、32bで示されているように回動できるようになっている。これによって、取り外し対象の半導体部品2に対して取り外し治具8が傾斜している角度を調整する角度調整機構である。取り外し対象の半導体部品2に対して取り外し治具8が傾斜している角度を調整するものであることから、上述した角度調整機構は、電子回路基板1と取り外し対象の半導体部品2との間の隙間に先端を挿入させる取り外し治具8の挿入角度を調整するものでもある。 In the embodiment shown in FIG. 6, the base end of the removal jig 8 is rotatably supported by a rotation support shaft 11 extending parallel to the upper plane of the electronic circuit board 1. In the embodiment shown in FIG. 6, a linear drive mechanism (not shown) allows the removal jig 8 to rotate around the rotation support shaft 11 as indicated by arrows 32a and 32b in FIG. there is This provides an angle adjustment mechanism for adjusting the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed. Since the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed is adjusted, the angle adjustment mechanism described above is used to adjust the angle between the electronic circuit board 1 and the semiconductor component 2 to be removed. It also adjusts the insertion angle of the removal jig 8 for inserting the tip into the gap.
 取り外し対象の半導体部品2の周辺における微細なチップ部品10などの周辺部品の実装密度が高い場合、周辺部品の高さが取り外し治具8に干渉する可能性がある。 When the mounting density of peripheral components such as fine chip components 10 around the semiconductor component 2 to be removed is high, the height of the peripheral components may interfere with the removal jig 8 .
 上述した角度調整機構を備えていることで、このような場合に、周辺部品の高さによる干渉を避けるように、取り外し対象の半導体部品2に対して取り外し治具8が傾斜している角度を調整し、実装環境に合わせて作業を行うことができる。 By providing the above-described angle adjustment mechanism, in such a case, the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed is adjusted so as to avoid interference due to the height of the peripheral components. It can be adjusted and work according to the implementation environment.
 また、この角度調整機構により、電子回路基板1と取り外し対象の半導体部品2との間の隙間に取り外し治具8の先端を挿入させる挿入角度を適切な挿入角度に調整することもできる。挿入角度が、図6に図示されているような、電子回路基板1に対して水平に近い状態になるほど取り外し治具8は、電子回路基板1と取り外し対象の半導体部品2との間の隙間に入り込みやすくなる。 Also, with this angle adjustment mechanism, the insertion angle for inserting the tip of the removal jig 8 into the gap between the electronic circuit board 1 and the semiconductor component 2 to be removed can be adjusted to an appropriate insertion angle. As the insertion angle becomes closer to horizontal with respect to the electronic circuit board 1 as shown in FIG. Easier to get in.
 なお、周辺部品の干渉や作業性に問題がない場合は、半導体部品取り外し機構9が、角度調整機構を備えていない構成にすることもできる。 If there is no problem with interference of peripheral parts or workability, the semiconductor component removal mechanism 9 can be configured without an angle adjustment mechanism.
 取り外し対象の半導体部品2に対して取り外し治具8が傾斜している角度を上述したように調整できるものであれば、角度調整機構は上記で説明したものに限られず種々の機構、構成のものを採用することができる。 The angle adjustment mechanism is not limited to the one described above, and various mechanisms and configurations can be used as long as the angle at which the removal jig 8 is inclined with respect to the semiconductor component 2 to be removed can be adjusted as described above. can be adopted.
 この実施形態の半導体部品分離装置は、更に、半導体部品支持機構12を備えている構成にすることができる。 The semiconductor component separation apparatus of this embodiment can be configured to further include a semiconductor component support mechanism 12 .
 半導体部品支持機構12は、図4、図5図示のように、取り外し治具8が、治具挿入機構によって電子回路基板1と半導体部品2との間に挿入される際に、取り外し治具8が挿入される半導体部品2の側に対向する側において半導体部品2が移動しないように半導体部品2を支持する。 As shown in FIGS. 4 and 5, the semiconductor component support mechanism 12 is configured so that the removal jig 8 is inserted between the electronic circuit board 1 and the semiconductor component 2 by the jig insertion mechanism. supports the semiconductor component 2 so that the semiconductor component 2 does not move on the side opposite to the side of the semiconductor component 2 into which is inserted.
 取り外し治具8を、治具挿入機構によって電子回路基板1と半導体部品2との間に挿入する際に押し込む力が逃げてしまうと取り外し治具8の先端がスムーズに電子回路基板1と半導体部品2との間に入り込めないことがある。 When the removal jig 8 is inserted between the electronic circuit board 1 and the semiconductor component 2 by the jig insertion mechanism, if the pushing force escapes, the tip of the removal jig 8 smoothly inserts the electronic circuit board 1 and the semiconductor component. Sometimes you can't get in between 2.
 このような現象が発生することを未然に防止すべく、治具挿入機構によって、取り外し治具8が電子回路基板1と半導体部品2との間に挿入される際に、図4、図5に示すように、取り外し対象の半導体部品2の反対側に半導体部品支持機構12が配置されるものである。 In order to prevent such a phenomenon from occurring, when the removal jig 8 is inserted between the electronic circuit board 1 and the semiconductor component 2 by the jig insertion mechanism, a As shown, the semiconductor component support mechanism 12 is arranged on the opposite side of the semiconductor component 2 to be removed.
 このような半導体部品支持機構12を更に備えていることで、取り外し治具8が矢印30で示す方向に押された際に、同時に、電子回路基板1が矢印30で示す方向にズレてしまうことを防止できる。 By further providing such a semiconductor component support mechanism 12, when the removal jig 8 is pushed in the direction indicated by the arrow 30, the electronic circuit board 1 is simultaneously displaced in the direction indicated by the arrow 30. can be prevented.
 また、取り外し治具8が、電子回路基板1と半導体部品2との間に押し込まれたことで、半導体部品2が電子回路基板1から取り外された後にも、取り外された半導体部品2が矢印30方向へ移動し続ける取り外し治具8によって一緒に移動することを確実に防止できる。そこで、取り外された半導体部品2が、矢印30方向へ移動し続ける取り外し治具8によって一緒に移動することで、取り外し対象の半導体部品2の反対側に位置している周辺部品への接触を防止し二次的な周辺部品の位置ズレを防止することができる。 Further, since the removing jig 8 is pushed between the electronic circuit board 1 and the semiconductor component 2 , even after the semiconductor component 2 has been removed from the electronic circuit board 1 , the removed semiconductor component 2 is shown by the arrow 30 . Moving together can be reliably prevented by the removal jig 8 that continues to move in the direction. Therefore, the removed semiconductor component 2 is moved together with the removal jig 8 that continues to move in the direction of the arrow 30, thereby preventing contact with peripheral components located on the opposite side of the semiconductor component 2 to be removed. However, it is possible to prevent secondary misalignment of peripheral parts.
 なお、半導体部品支持機構12の、少なくとも半導体部品2と接触する部分は、比熱の小さな材料で形成されていることが望ましい。 It should be noted that at least the portion of the semiconductor component support mechanism 12 that contacts the semiconductor component 2 is desirably made of a material with a low specific heat.
 上述したように、加熱機構7によって、取り外し対象の半導体部品2に対して局所的な加熱が行われるが、半導体部品支持機構12の半導体部品2に接触している部分によって取り外し対象の半導体部品2から熱が奪われるようなことになると、半導体部品2の熱分布に温度差が生まれて、取り外しに影響が生じるおそれがある。 As described above, the heating mechanism 7 locally heats the semiconductor component 2 to be removed. If heat is taken away from the semiconductor component 2, a temperature difference will occur in the heat distribution of the semiconductor component 2, which may affect removal.
 半導体部品支持機構12の、少なくとも半導体部品2と接触する部分を、比熱の小さな材料で形成することにより、このような可能性を防止することができる。 Such a possibility can be prevented by forming at least the portion of the semiconductor component support mechanism 12 that contacts the semiconductor component 2 with a material having a small specific heat.
 上述したこの実施形態の半導体部品分離装置において、図8図示のように、第一の加温機構13が取り外し治具8に付帯されている構成にすることができる。 In the semiconductor component separating apparatus of this embodiment described above, the first heating mechanism 13 can be attached to the removing jig 8 as shown in FIG.
 第一の加温機構13は、取り外し治具8を加温し、取り外し治具8の加温状態を調整するものである。 The first heating mechanism 13 heats the removal jig 8 and adjusts the heating state of the removal jig 8 .
 上述したように、加熱機構7によって、取り外し対象の半導体部品2に対して、上側から、局所的な加熱を行っても、アンダーフィルの軟化状態が不確実な場合がある。例えば、アンダーフィル材の種類によって軟化する温度の違いがあることや、複数の量の作業を行う場合に、僅かな個体差によって、アンダーフィルの軟化状態が不確実になるものである。 As described above, even if the semiconductor component 2 to be removed is locally heated from above by the heating mechanism 7, the softened state of the underfill may be uncertain. For example, there is a difference in the softening temperature depending on the type of underfill material, and slight individual differences in the case of performing a plurality of amounts of work make the softening state of the underfill uncertain.
 アンダーフィルの軟化が不十分な場合、等の原因で、取り外し治具8の先端を、電子回路基板1と半導体部品2との間に押し込み、挿入することが困難になることがある。 If the softening of the underfill is insufficient, it may be difficult to push the tip of the removal jig 8 between the electronic circuit board 1 and the semiconductor component 2 and insert it.
 上述したように、取り外し治具8を加温し、取り外し治具8の加温状態を調整する第一の加温機構13が取り外し治具8に付帯されていることで、取り外し治具8が加温され、その加温状態が調整される。これにより、取り外し対象の半導体部品2におけるはんだ、アンダーフィルも取り外し治具8を介して加温され、それらの加温状態が調整される。そこで、アンダーフィルを破壊しながら、取り外し治具8の先端を、電子回路基板1と半導体部品2との間に押し込み、挿入することが容易に行えるようになる。 As described above, the removal jig 8 is provided with the first heating mechanism 13 for heating the removal jig 8 and adjusting the heating state of the removal jig 8 . It is heated and its heating state is adjusted. As a result, the solder and underfill in the semiconductor component 2 to be removed are also heated via the removal jig 8, and their heating states are adjusted. Therefore, it becomes possible to easily insert the tip of the removing jig 8 by pushing it between the electronic circuit board 1 and the semiconductor component 2 while destroying the underfill.
 これによって、取り外し対象の半導体部品2を、より確実に、また、より効率よく、電子回路基板1から取り外せるようになり、作業効率を向上させることができる。 As a result, the semiconductor component 2 to be removed can be more reliably and efficiently removed from the electronic circuit board 1, and work efficiency can be improved.
 第一の加温機構13は、半導体部品分離装置に配備されている不図示の制御手段からの制御の下で、取り外し治具8を加温すると共に取り外し治具8の加温状態を調整する。 The first heating mechanism 13 heats the removing jig 8 and adjusts the heating state of the removing jig 8 under the control of a control means (not shown) provided in the semiconductor component separating apparatus. .
 第一の加温機構13を取り外し治具8に付帯する位置は図8に例示した位置に限られず、上述した取り外し治具8を加温すると共に取り外し治具8の加温状態を調整することのできる種々の位置で取り外し治具8に付帯させることができる。 The position where the first heating mechanism 13 is attached to the removal jig 8 is not limited to the position illustrated in FIG. It can be attached to the removal jig 8 at various possible positions.
 なお、上述したように、加熱機構7によって、取り外し対象の半導体部品2に対して、上側から、局所的な加熱を行うことで、取り外し対象の半導体部品2におけるはんだの溶融とアンダーフィルの軟化が十分にみられる場合は、第一の加温機構13による上述した加温調整を行うことなく半導体部品2の取り外しを行うことができる。そこで、取り外し治具8に第一の加温機構13が付帯されていない半導体部品分離装置とすることもできる。 As described above, the heating mechanism 7 locally heats the semiconductor component 2 to be removed from above, so that the solder melts and the underfill softens in the semiconductor component 2 to be removed. If it is sufficiently observed, the semiconductor component 2 can be removed without performing the above-described heating adjustment by the first heating mechanism 13 . Therefore, a semiconductor component separating apparatus in which the removal jig 8 is not provided with the first heating mechanism 13 can also be used.
 上述したこの実施形態の半導体部品分離装置は、更に、半導体部品保持機構を備えている構成にすることができる。 The semiconductor component separating apparatus of this embodiment described above can be configured to further include a semiconductor component holding mechanism.
 半導体部品保持機構は、取り外し治具8が、取り外し対象の半導体部品2bを図6図示のように、上側に支持している状態で、上述した治具昇降機構によって矢印31で示す方向の上昇動作を行う際に、取り外し治具8と共同して取り外し対象の半導体部品2を取り外し治具8との間で保持しつつ、矢印31で示す方向の上昇動作を行うものである。 As shown in FIG. 6, the semiconductor component holding mechanism lifts the semiconductor component 2b to be removed by the jig lifting mechanism described above in the direction indicated by the arrow 31 while the removal jig 8 is supporting the semiconductor component 2b to be removed from above as shown in FIG. 2, the semiconductor component 2 to be removed is held between the removal jig 8 and the removal jig 8, and is lifted in the direction indicated by the arrow 31. As shown in FIG.
 この半導体部品保持機構は、図5に図示されているバキューム吸着保持機構14とすることができる。取り外し治具8が、取り外し対象の半導体部品2bを図6図示のように、上側に支持している状態で、治具昇降機構によって矢印31で示す方向の上昇動作を行う際に、取り外し対象の半導体部品2をバキューム吸着保持機構14でバキューム吸引し、取り外し治具8と共同して取り外し対象の半導体部品2を取り外し治具8との間で保持しつつ、矢印31で示す方向の上昇動作を行うものである。 This semiconductor component holding mechanism can be the vacuum suction holding mechanism 14 shown in FIG. In a state where the removal jig 8 supports the semiconductor component 2b to be removed upward as shown in FIG. The semiconductor component 2 is vacuum-sucked by the vacuum suction holding mechanism 14, and while holding the semiconductor component 2 to be removed between the removal jig 8 in cooperation with the removal jig 8, the upward movement in the direction indicated by the arrow 31 is performed. It is something to do.
 また、上述の半導体部品保持機構は、図6に図示しているように、取り外し治具8と共同して取り外し対象の半導体部品2を、取り外し治具2との間で保持する平板状の板状保持機構にすることもできる。平板状の板状保持機構は、金属製または合成樹脂製にすることができる。 As shown in FIG. 6, the above-described semiconductor component holding mechanism is a flat plate that holds the semiconductor component 2 to be removed between itself and the removal jig 8 in cooperation with the removal jig 8. It can also be a shape-retaining mechanism. The flat plate-shaped holding mechanism can be made of metal or synthetic resin.
 図6図示の平板状の板状保持機構15は、取り外し対象の半導体部品2の上側面との間に、図6図示のように、わずかなクリアランス16を存在させて半導体部品2の上側面と対向し、取り外し治具8と共同して半導体部品2を取り外し治具8との間で保持するものである。 6, the plate-like plate-like holding mechanism 15 shown in FIG. It faces and holds the semiconductor component 2 between itself and the removal jig 8 in cooperation with the removal jig 8 .
 平板状の板状保持機構15の下側面と、取り外し対象の半導体部品2の上側面とがわずかなクリアランス16を介在させて対向していることで、取り外し治具8が、取り外し対象の半導体部品2bを図6図示のように、上側に支持している状態で、矢印31で示す方向の上昇動作を行う際に、取り外し治具8と共同して取り外し対象の半導体部品2を取り外し治具8との間で保持しつつ、矢印31で示す方向の上昇動作を行うことができる。クリアランス16の大きさはこのような動作を可能とする範囲に設定される。 The lower surface of the flat plate-like holding mechanism 15 and the upper surface of the semiconductor component 2 to be removed are opposed to each other with a small clearance 16 interposed therebetween, so that the removal jig 8 can hold the semiconductor component to be removed. As shown in FIG. 6, in a state where the semiconductor component 2b is supported upward, the removal jig 8 cooperates with the removal jig 8 to remove the semiconductor component 2 to be removed when performing the upward movement in the direction indicated by the arrow 31. While being held between , the upward movement in the direction indicated by the arrow 31 can be performed. The size of the clearance 16 is set within a range that allows such operation.
 また、図示していないが、図6図示のようなクリアランス16を存在させずに、平板状の板状保持機構15の下側面が、直接、取り外し対象の半導体部品2の上側面に当接する形態で上述した平板状の板状保持機構にすることもできる。 Although not shown, the lower surface of the plate-like holding mechanism 15 directly contacts the upper surface of the semiconductor component 2 to be removed without the clearance 16 as shown in FIG. It is also possible to use a plate-like plate-like holding mechanism as described above.
 なお、このように、平板状の板状保持機構の下側面が、取り外し対象の半導体部品2の上側面に、直接、当接する形態で、取り外し治具8と共同して取り外し対象の半導体部品2を、取り外し治具2との間で保持する板状保持機構の場合には、当該板状保持機構を加温すると共に板状保持機構の加温状態を調整する第二の加温機構(不図示)が板状保持機構に備えられている構成にすることができる。 In addition, in this manner, the lower surface of the plate-like plate-like holding mechanism directly abuts the upper surface of the semiconductor component 2 to be removed, and the semiconductor component 2 to be removed is held in cooperation with the removal jig 8 . In the case of a plate-shaped holding mechanism that holds between the removal jig 2, the plate-shaped holding mechanism is heated and a second heating mechanism (non ) can be provided in the plate-shaped holding mechanism.
 第二の加温機構(不図示)は、半導体部品分離装置に配備されている不図示の制御手段からの制御の下で、上述した平板状の板状保持機構を加温すると共にその加温状態を調整する。 A second heating mechanism (not shown) heats the plate-like plate-like holding mechanism described above and heats the plate-like plate-like holding mechanism under the control of a control means (not shown) provided in the semiconductor component separating apparatus. adjust the state.
 平板状の板状保持機構の下側面が、取り外し対象の半導体部品2の上側面に、直接、当接する場合、取り外し対象の半導体部品2から熱が奪われ、加熱機構7によって加熱されている取り外し対象の半導体部品2と電子回路基板1との間に存在しているはんだ、アンダーフィルが硬化してしまうと取り外しが困難になる場合がある。 When the lower side surface of the flat plate-shaped holding mechanism directly abuts the upper side surface of the semiconductor component 2 to be removed, heat is taken from the semiconductor component 2 to be removed, and the heating mechanism 7 heats the removal. If the solder or underfill existing between the target semiconductor component 2 and the electronic circuit board 1 hardens, it may become difficult to remove.
 図6に図示しているように、わずかなクリアランス16が存在している場合にはこのような問題は生じないが、平板状の板状保持機構の下側面が、取り外し対象の半導体部品2の上側面に、直接、当接する場合には、上述した第二の加温機構(不図示)が板状保持機構に備えられていることで、このような不具合が生じることを防止できる。 As shown in FIG. 6, if there is a slight clearance 16, this problem does not occur, but the lower surface of the plate-like plate-like holding mechanism does not allow the semiconductor component 2 to be removed to be removed. When the plate-like holding mechanism is provided with the above-described second heating mechanism (not shown) in the case of direct contact with the upper surface, such a problem can be prevented.
 半導体部品分離装置が、取り外し対象の半導体部品2を電子回路基板1から取り外して上昇させる際に、半導体部品2が矢印30で示す取り外し治具8の挿入方向に対して左右又は手前へ傾くことで、取り外し対象の半導体部品2の周辺部品と接触してしまうおそれがある。このような時に、加熱手段7によって取り外し対象の半導体部品2に対して上側から局所的に行っていた加熱により周辺部品にも熱が伝わって、ときにははんだの溶融が生じることがある。そこで、上昇移動する半導体部品2が前述したように傾く等して周辺の部品に接触すると周辺部品が位置ズレを起こすことになる。 When the semiconductor component separating apparatus removes the semiconductor component 2 to be removed from the electronic circuit board 1 and raises it, the semiconductor component 2 tilts to the left and right or to the front with respect to the insertion direction of the removal jig 8 indicated by the arrow 30. , there is a risk of contact with peripheral components of the semiconductor component 2 to be removed. In such a case, the semiconductor component 2 to be removed is locally heated from above by the heating means 7, and the heat is transferred to the peripheral components, sometimes resulting in melting of the solder. Therefore, if the semiconductor component 2 moving upward tilts as described above and comes into contact with peripheral components, the peripheral components will be displaced.
 半導体部品分離装置が上述した半導体部品保持機構を備えていることで、このような問題が生じる可能性を未然に防止することができる。 By having the semiconductor component holding mechanism described above in the semiconductor component separating apparatus, the possibility of such a problem occurring can be prevented.
 上述したように、半導体部品分離装置が半導体部品支持機構12を備えていることで、取り外し治具8が半導体部品2の方向に向かってくる矢印30で示す方向での半導体部品2のズレは抑制することができる。 As described above, since the semiconductor component separating apparatus is provided with the semiconductor component support mechanism 12, the displacement of the semiconductor component 2 in the direction indicated by the arrow 30 in which the removing jig 8 faces the semiconductor component 2 is suppressed. can do.
 半導体部品保持機構が、取り外し治具8が、取り外し対象の半導体部品2bを図6図示のように、上側に支持している状態で、矢印31で示す方向の上昇動作を行う際に、取り外し治具8と共同して取り外し対象の半導体部品2を取り外し治具8との間で保持しつつ、矢印31で示す方向の上昇動作を行うようにする。これによって、取り外し対象の半導体部品2が電子回路基板1から取り外されて、取り外し治具8に支持されて上昇する際の、上述した矢印30で示す取り外し治具8の挿入方向に対して左右又は手前へ半導体部品2が傾くことを防止できる。 When the semiconductor component holding mechanism moves upward in the direction indicated by an arrow 31 with the removal jig 8 supporting the semiconductor component 2b to be removed upward as shown in FIG. While holding the semiconductor component 2 to be removed between the removal jig 8 and the removal jig 8 in cooperation with the removal jig 8 , the lifting operation is performed in the direction indicated by the arrow 31 . As a result, when the semiconductor component 2 to be removed is removed from the electronic circuit board 1 and lifted while being supported by the removal jig 8, the direction of insertion of the removal jig 8 indicated by the above-described arrow 30 can be shifted leftward or rightward with respect to the insertion direction. It is possible to prevent the semiconductor component 2 from tilting forward.
 半導体部品保持機構を上述したバキューム吸着保持機構14(図5)にする場合は、取り外し対象の半導体部品2の上側から下降させ、半導体部品2を吸着・保持しながら取り外し治具8と一緒に上昇させる形態にすることができる。 When the semiconductor component holding mechanism is the above-described vacuum suction holding mechanism 14 (FIG. 5), the semiconductor component 2 to be removed is lowered from above, and lifted together with the removal jig 8 while sucking and holding the semiconductor component 2. It can be in the form of
 バキューム吸着保持機構14によって吸着・保持する。そこで、電子回路基板1と取り外し対象となる半導体部品2との間への取り外し治具8の挿入動作や、取り外し治具8の上に半導体部品2を支持しての上昇動作によって、取り外し対象の半導体部品2を電子回路基板1から取り外すための、アンダーフィルの完全破壊に関して、バキューム吸着保持機構14からの吸引力も作用することになる。 It is sucked and held by the vacuum suction holding mechanism 14. Therefore, by inserting the removal jig 8 between the electronic circuit board 1 and the semiconductor component 2 to be removed, or by lifting the semiconductor component 2 while supporting it on the removal jig 8, the object to be removed can be removed. The suction force from the vacuum suction holding mechanism 14 also acts on the complete destruction of the underfill for removing the semiconductor component 2 from the electronic circuit board 1 .
 なお、バキューム吸着保持機構14(図5)は、取り外し対象となる半導体部品2に対する加熱機構7による局所的な加熱に邪魔にならない位置で待機させ、加熱機構7からの加熱によってはんだ溶融温度に到達する前、あるいは、はんだ溶融後に、バキューム吸着保持機構14を半導体部品2の上側から下降させる形態にすることができる。 The vacuum suction holding mechanism 14 (FIG. 5) waits at a position that does not interfere with the local heating of the semiconductor component 2 to be removed by the heating mechanism 7, and the heating from the heating mechanism 7 reaches the solder melting temperature. The vacuum suction holding mechanism 14 may be lowered from above the semiconductor component 2 before or after the solder is melted.
 半導体部品保持機構を上述した平板状の板状保持機構にする場合も、取り外し対象となる半導体部品2に対する加熱機構7による局所的な加熱に邪魔にならない位置で板状保持機構を待機させ、加熱機構7からの加熱によってはんだ溶融温度に到達する前、あるいは、はんだ溶融後に、図6図示の状態にまで板状保持機構15を半導体部品2の上側から下降させる、あるいは、図示していないが、板状保持機構15の下側面が半導体部品2の上側面に当接するまで下降させる。そして、治具昇降機構によって取り外し治具8が、取り外し対象の半導体部品2bを図6図示のように、上側に支持している状態で、矢印31で示す方向の上昇動作を行う際に、取り外し治具8と共同して取り外し対象の半導体部品2を取り外し治具8との間で保持しつつ、矢印31で示す方向の上昇動作を行うことで、取り外し対象の半導体部品2が電子回路基板1から取り外されて、取り外し治具8に支持されて上昇する際の、上述した矢印30で示す取り外し治具8の挿入方向に対して左右又は手前へ半導体部品2が傾くことを防止できる。 When the semiconductor component holding mechanism is the plate-shaped holding mechanism described above, the plate-shaped holding mechanism is made to stand by at a position that does not interfere with the local heating of the semiconductor component 2 to be removed by the heating mechanism 7, and the heating is performed. Before reaching the melting temperature of the solder by heating from the mechanism 7 or after the solder has melted, the plate-shaped holding mechanism 15 is lowered from above the semiconductor component 2 to the state shown in FIG. The plate-shaped holding mechanism 15 is lowered until the lower side surface of the semiconductor component 2 abuts against the upper side surface. 6, the removal jig 8 supports the semiconductor component 2b to be removed by the jig elevating mechanism. While holding the semiconductor component 2 to be removed between the removal jig 8 in cooperation with the jig 8 , the semiconductor component 2 to be removed is lifted in the direction indicated by the arrow 31 so that the semiconductor component 2 to be removed is mounted on the electronic circuit board 1 . It is possible to prevent the semiconductor component 2 from tilting leftward, rightward, or frontward with respect to the insertion direction of the removal jig 8 indicated by the above-described arrow 30 when the semiconductor component 2 is lifted while being supported by the removal jig 8 .
 上述したこの実施形態の半導体部品分離装置は、更に、加熱が行われている半導体部品2が実装されている位置の電子回路基板1の下面側から、加熱が行われている半導体部品2が実装されている位置における電子回路基板1の温度状態を調整する温度調整機構を備えている構成にすることができる。 In the semiconductor component separating apparatus of this embodiment described above, the heated semiconductor component 2 is mounted from the lower surface side of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted. It is possible to adopt a configuration having a temperature adjustment mechanism that adjusts the temperature state of the electronic circuit board 1 at the position where it is located.
 この実施形態の半導体部品分離装置を用いて電子回路基板1から取り外す対象となる半導体部品は、集積回路部品が主で、その実装位置の電子回路基板1の真裏や、周辺に実装された別の集積回路部品には、取り外し対象になっている半導体部品と同じようにアンダーフィルが充填されていることが多い。 The semiconductor components to be removed from the electronic circuit board 1 by using the semiconductor component separating apparatus of this embodiment are mainly integrated circuit components. Integrated circuit components are often filled with underfill in the same manner as the semiconductor components from which they are removed.
 この実施形態の半導体部品分離装置を用いて半導体部品2を電子回路基板1から取り外す際には、上述したように、加熱機構7によって取り外し対象の半導体部品2に対する局所的な加熱が上側から行われるが、この加熱によって、取り外し対象の半導体部品2と電子回路基板1との間に存在しているはんだが溶融する際に、はんだフラッシュなどの不具合が生起されることがある。 When the semiconductor component 2 is removed from the electronic circuit board 1 using the semiconductor component separating apparatus of this embodiment, as described above, the semiconductor component 2 to be removed is locally heated from above by the heating mechanism 7. However, when the solder existing between the semiconductor component 2 to be removed and the electronic circuit board 1 melts due to this heating, problems such as solder flash may occur.
 図10を用いてこのメカニズムを説明する。はんだが熱膨張する体積変化に対しアンダーフィルの流動化が起きない為、膨張したはんだが行き場を失いアンダーフィル材と半導体部品2又は電子回路基板1の界面を破り、図10に符号17で示しているブリッジ(ショート)や、符号18で示しているオープン(はんだ未接続)を発生させ、2次的な不具合を引き起こしてしまうものである。 This mechanism will be explained using FIG. Since the underfill does not fluidize due to the thermal expansion of the solder, the expanded solder loses its place to go and breaks the interface between the underfill material and the semiconductor component 2 or the electronic circuit board 1. This causes a bridge (short) or an open (unsoldered connection) indicated by reference numeral 18 to cause secondary problems.
 そこで、取り外し対象ではない部品に対しては、当該部品と電子回路基板1との間に存在しているはんだを溶融温度に到達させない温度管理を行うことが望ましい。 Therefore, it is desirable to perform temperature control so that the solder existing between the part and the electronic circuit board 1 does not reach the melting temperature for parts that are not to be removed.
 上述したように、加熱機構7による加熱は、取り外し対象となる半導体部品2のサイズと同等の範囲で上部から局所的な加熱を、所定の加熱時間行い、これによって、取り外し対象となる半導体部品2の周辺に存在している他の部品に対する熱伝播を最小値に抑えたものであるので、この状態で周辺への熱影響が確認されないものであれば、上述した温度調整機構を設ける必要はない。 As described above, the heating by the heating mechanism 7 performs local heating from above in a range equivalent to the size of the semiconductor component 2 to be removed for a predetermined heating time. Since the heat transfer to other parts existing in the surrounding area is suppressed to a minimum value, it is not necessary to provide the above-mentioned temperature control mechanism if no thermal effect on the surrounding area is confirmed in this state. .
 ただし、周辺部品への熱影響が懸念される場合には、上述した2次的な不具合が発生するおそれがあるので、これを未然に防止すべく、上述した温度調整機構を設けておくことが望ましい。 However, if there is concern about thermal effects on peripheral components, the above-mentioned secondary problems may occur. desirable.
 上述した温度調整機構を設けておくことで、電子回路基板1と周辺部品の温度上昇を防ぎ、熱伝播を抑えて、取り外し対象の半導体部品2と、周辺部品との温度差を確保することができる。 By providing the temperature control mechanism described above, it is possible to prevent the temperature rise of the electronic circuit board 1 and the peripheral components, suppress the heat propagation, and secure the temperature difference between the semiconductor component 2 to be removed and the peripheral components. can.
 加熱が行われている半導体部品2が実装されている位置の電子回路基板1の下面側から、加熱が行われている半導体部品2が実装されている位置における電子回路基板1の温度状態を調整する上述の温度調整機構としては、加熱が行われている半導体部品2が実装されている位置における電子回路基板1を下側から加温する第二の加温機構19(図4)を採用することができる。 The temperature state of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted is adjusted from the lower surface side of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted. As the above-described temperature adjusting mechanism, a second heating mechanism 19 (FIG. 4) is adopted that heats the electronic circuit board 1 from below at the position where the heated semiconductor component 2 is mounted. be able to.
 上述した温度調整機構は、電子回路基板1と周辺部品の温度上昇を防ぎ、熱伝播を抑えて、取り外し対象の半導体部品2と、周辺部品との温度差を確保するものであるから、一般的には、冷却を行うことになる。上述したように、電子回路基板1を下側から加温する第二の加温機構19(図9)を用いるのは、完全な冷却効果だけの場合、温度を引き過ぎてしまい取り外し対象の半導体部品2の温度が上述したようにハンダを溶融させることに必要な温度にまで上がらなくなってしまうことがあるからである。 The temperature control mechanism described above prevents the temperature rise of the electronic circuit board 1 and peripheral components, suppresses heat propagation, and secures the temperature difference between the semiconductor component 2 to be removed and the peripheral components. will be cooled. As described above, the use of the second heating mechanism 19 (FIG. 9) for heating the electronic circuit board 1 from below is only for the complete cooling effect. This is because the temperature of the component 2 may not reach the temperature required to melt the solder as described above.
 電子回路基板1を下側から加温する第二の加温機構19(図4)を用いることでこのようになることを防ぐことができる。 This can be prevented by using the second heating mechanism 19 (FIG. 4) that heats the electronic circuit board 1 from below.
 上述したように、加熱機構7からの加熱を行う際には、必用な温度プロファイル条件をあらかじめ設定しておき、不図示の制御手段からの制御によって加熱機構7に局所的な加熱を行わせている。第二の加温機構19によって電子回路基板1を下側から加温する場合も、必用な温度プロファイル条件をあらかじめ設定しておき、不図示の制御手段からの制御によって第二の加温機構19による上述の加温を行うことができる。 As described above, when heating is performed by the heating mechanism 7, the necessary temperature profile conditions are set in advance, and the heating mechanism 7 is controlled by the control means (not shown) to perform local heating. there is Also when the electronic circuit board 1 is heated from below by the second heating mechanism 19, the necessary temperature profile conditions are set in advance, and the second heating mechanism 19 is controlled by control means (not shown). The above-described warming can be performed by
 また、加熱が行われている半導体部品2が実装されている位置の電子回路基板1の下面側から、加熱が行われている半導体部品2が実装されている位置における電子回路基板1の温度状態を調整する上述の温度調整機構としては、加熱が行われている半導体部品2が実装されている位置における電子回路基板1に対して下側から冷却効果を与える冷却機構を採用することもできる。 Further, the temperature state of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted is measured from the lower surface side of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted. As the above-described temperature adjustment mechanism for adjusting , a cooling mechanism may be adopted that gives a cooling effect from below to the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted.
 電子回路基板1が比熱が大きな基板である場合には、冷却効果を与える冷却機構を採用することが望ましい。 If the electronic circuit board 1 is a board with a large specific heat, it is desirable to employ a cooling mechanism that provides a cooling effect.
 この冷却機構としては、加熱が行われている半導体部品2が実装されている位置における電子回路基板1の下側面に対して風を吹き付ける空冷機構(不図示)を採用することができる。空冷機構による冷却も、必用な温度プロファイル条件をあらかじめ設定しておき、不図示の制御手段からの制御によって空冷機構(不図示)から電子回路基板1の下側面に対して所望の風量、風速で風を吹き付ける構成にすることができる。 As this cooling mechanism, an air cooling mechanism (not shown) that blows air against the lower surface of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted can be employed. For cooling by the air cooling mechanism, the necessary temperature profile conditions are set in advance, and the control means (not shown) controls the air cooling mechanism (not shown) to the lower surface of the electronic circuit board 1 at a desired air flow rate and air velocity. It can be configured to blow air.
 また、冷却機構として加熱が行われている半導体部品2が実装されている位置における電子回路基板1の下側面に取り付けられて放熱による冷却を行う放熱冷却機構(不図示)を採用することもできる。放熱冷却機構としては、ヒートシンクや熱伝導材などを採用することができ、これらが、加熱が行われている半導体部品2が実装されている位置における電子回路基板1の下側面に貼り付け、等によって取り付けられている構成を採用することができる。 Further, a heat radiation cooling mechanism (not shown) that is attached to the lower surface of the electronic circuit board 1 at the position where the heated semiconductor component 2 is mounted as a cooling mechanism and performs cooling by heat radiation can also be adopted. . A heat sink, a thermally conductive material, or the like can be employed as the heat dissipation cooling mechanism, and these are attached to the lower surface of the electronic circuit board 1 at the position where the semiconductor component 2 being heated is mounted, or the like. can be employed.
 なお、空冷機構(不図示)と、放熱冷却機構(不図示)とを併用することもできる。 It should be noted that an air cooling mechanism (not shown) and a heat radiation cooling mechanism (not shown) can be used together.
 また、上述した、第二の加温機構19と、冷却機構(空冷機構あるいは、放熱冷却機構、又はこれらの双方)とを併用することもできる。 Also, the above-described second heating mechanism 19 and the cooling mechanism (air cooling mechanism, radiation cooling mechanism, or both) can be used together.
 この実施形態の半導体部品分離装置は、更に、電子回路基板1の下面側を加温する第三の加温機構を備えている構成にすることができる。 The semiconductor component separating apparatus of this embodiment can be configured to further include a third heating mechanism for heating the lower surface side of the electronic circuit board 1 .
 上述したように、加熱機構7による上からの局所的な加熱と、電子回路基板1の下側からの温度調整機構による上述した温度調整を行っても取り外し対象の半導体部品2内で温度のばらつきが生じることがあるある。これは、取り外し対象の半導体部品2のグランドラインが、電子回路基板1の内装のグランド層(ベタ層)に接続されている為、取り外し対象の半導体部品2に対して局所的に加熱を行っても、内層に熱が逃げてしまい半導体部品2のグランドライン電極の温度だけが上がらずにコールドソルダーが引き起こされるものである。 As described above, even if local heating from above by the heating mechanism 7 and temperature adjustment from below the electronic circuit board 1 by the temperature adjustment mechanism described above are performed, temperature variations within the semiconductor component 2 to be removed may occur. This is because the ground line of the semiconductor component 2 to be removed is connected to the internal ground layer (solid layer) of the electronic circuit board 1, so that the semiconductor component 2 to be removed is locally heated. Also, heat escapes to the inner layer, and the temperature of the ground line electrode of the semiconductor component 2 does not rise, resulting in cold soldering.
 このコールドソルダーは、取り外し対象の半導体部品2を取り外す際に基板パターンのピールオフを引き起こす原因となる。そこで、この対策を行っておくことが望ましい。この対策としては、電子回路基板1全体のプリヒート効果が有効である。 This cold solder causes peel-off of the board pattern when removing the semiconductor component 2 to be removed. Therefore, it is desirable to take this countermeasure. As a countermeasure against this, the preheating effect of the entire electronic circuit board 1 is effective.
 上述した、電子回路基板1の下面側を加温する第三の加温機構は、電子回路基板1全体のプリヒート効果を発揮させるために採用されるものである。 The above-described third heating mechanism for heating the lower surface side of the electronic circuit board 1 is employed to exhibit the preheating effect of the entire electronic circuit board 1 .
 図4図示の実施形態では、電子回路基板1の下側に、第三の加温機構として、赤外線ヒーター20を配置している。赤外線ヒーター以外の熱源を採用することもできるが、赤外線ヒーターのように、熱の浸透性の高い熱源を採用することが望ましい。 In the embodiment shown in FIG. 4, an infrared heater 20 is arranged below the electronic circuit board 1 as a third heating mechanism. A heat source other than an infrared heater can be used, but it is desirable to use a heat source with high heat permeability, such as an infrared heater.
 赤外線ヒーター20によって、例えば、電子回路基板1全体の温度を150℃以上に保持しつつ、半導体部品分離装置による、上述した、半導体部品2の取り外しを行う。このようにすることで、取り外し対象の半導体部品2に対して局所的に与えた熱が半導体部品2から逃げず、電子回路基板1内のΔtをまとめてコールドソルダーのない取り外しを行える。 While the temperature of the entire electronic circuit board 1 is maintained at, for example, 150° C. or higher by the infrared heater 20, the semiconductor component 2 is removed as described above by the semiconductor component separating device. By doing so, the heat locally given to the semiconductor component 2 to be removed does not escape from the semiconductor component 2, and the Δt in the electronic circuit board 1 can be collectively removed without cold soldering.
 以上に説明したこの実施形態の半導体部品分離装置により、電子回路基板に実装されている半導体部品を、破壊することなく、再利用可能な形で電子回路基板から自動的に取り外すことができる。また、半導体部品の取り外しが行われた後の電子回路基板における半導体部品取り外し後の基板側パターン面に対して新しい半導体部品を取り付けることができる。以下に、これらの一例を紹介する。 With the semiconductor component separating apparatus of this embodiment described above, the semiconductor component mounted on the electronic circuit board can be automatically removed from the electronic circuit board in a reusable form without being destroyed. In addition, a new semiconductor component can be attached to the board-side pattern surface after removal of the semiconductor component in the electronic circuit board from which the semiconductor component has been removed. Examples of these are introduced below.
<半導体部品の分離方法>
 上述した実施形態の半導体部品分離装置を用いた半導体部品分離方法は次のようにして行われる。
<Method for Separating Semiconductor Parts>
A semiconductor component separating method using the semiconductor component separating apparatus of the embodiment described above is carried out as follows.
(取り外し対象の半導体部品に対する局所的な加熱工程)
 上述した実施形態の半導体部品分離装置における加熱機構7により、上記で説明した種々の実施形態で、取り外し対象の半導体部品2に対して、取り外し対象の半導体部品2の周辺に存在している周辺部品への熱伝搬を最小値に抑えた、局所的な加熱を行う。
(Local heating process for semiconductor components to be removed)
With the heating mechanism 7 in the semiconductor component separating apparatus of the above-described embodiments, peripheral components existing around the semiconductor component 2 to be removed in the various embodiments described above are heated. Provides localized heating with minimal heat transfer to
 これによって、取り外し対象の半導体部品2と電子回路基板1との間に存在しているはんだがその融点を越えるようになるまで加熱する。 As a result, the solder existing between the semiconductor component 2 to be removed and the electronic circuit board 1 is heated until it exceeds its melting point.
 また、この加熱によって、取り外し対象の半導体部品2と電子回路基板1との間に存在しているアンダーフィルを軟化させる。 This heating also softens the underfill existing between the semiconductor component 2 to be removed and the electronic circuit board 1 .
(取り外し治具の挿入)
 引き続いて、半導体部品取り外し機構9が備えている治具挿入機構、治具昇降機構による上述した動作により、取り外し治具8を、取り外し対象の半導体部品2と電子回路基板1との間に挿入させる。
(Inserting removal jig)
Subsequently, the removal jig 8 is inserted between the semiconductor component 2 to be removed and the electronic circuit board 1 by the above-described operations of the jig insertion mechanism and the jig elevating mechanism provided in the semiconductor component removal mechanism 9 . .
 この際、必要があれば、上述した角度調整機構により、電子回路基板1と取り外し対象の半導体部品2との間の隙間に先端を挿入させる取り外し治具8の挿入角度を適宜調整する。 At this time, if necessary, the angle adjustment mechanism described above is used to appropriately adjust the insertion angle of the removal jig 8 whose tip is inserted into the gap between the electronic circuit board 1 and the semiconductor component 2 to be removed.
 また、取り外し対象の半導体部品2が移動しないように、半導体部品支持機構12を上述したように動作させる。 Also, the semiconductor component support mechanism 12 is operated as described above so that the semiconductor component 2 to be removed does not move.
 なお、取り外し治具8、はんだ、アンダーフィルに対する第一の加温機構13による加温、調温は、必要に応じて、適宜実施する。 The heating and temperature control of the removal jig 8, the solder, and the underfill by the first heating mechanism 13 are appropriately performed as necessary.
(取り外し対象の半導体部品2の分離)
 引き続いて、取り外し対象の半導体部品2を上側に支持している状態の取り外し治具8を半導体部品取り外し機構9が備えている治具昇降機構による上述した上昇動作により、電子回路基板1から分離させる。
(Separation of semiconductor component 2 to be removed)
Subsequently, the removal jig 8 supporting the semiconductor component 2 to be removed from the electronic circuit board 1 is separated from the electronic circuit board 1 by the lifting operation described above by the jig elevating mechanism provided in the semiconductor component removal mechanism 9 . .
 取り外し対象の半導体部品2と電子回路基板1との間に取り外し治具8が挿入された際にアンダーフィルが部分的にしか破壊されていないときには、この上昇動作によってアンダーフィルが全壊されることになる。 If the underfill is only partially destroyed when the removal jig 8 is inserted between the semiconductor component 2 to be removed and the electronic circuit board 1, the underfill is completely destroyed by this upward movement. Become.
 なお、上述した半導体部品保持機構を使用し、半導体部品保持機構と取り外し治具8とが共同して、半導体部品保持機構と取り外し治具8との間に半導体部品2を保持しつつ上昇動作を行うことで、半導体部品2を電子回路基板1から分離させることもできる。 The semiconductor component holding mechanism described above is used, and the semiconductor component holding mechanism and the removing jig 8 work together to raise the semiconductor component 2 while holding it between the semiconductor component holding mechanism and the removing jig 8. By doing so, the semiconductor component 2 can also be separated from the electronic circuit board 1 .
 また、上述した温度調整機構によって、温度状態が、半導体部品2の取り外しに好適になるように調温を行いつつ取り外し治具の挿入、取り外し対象の半導体部品2の分離を行う。すなわち、取り外し対象の半導体部品2に対する、加熱機構7による上側からの局所的な加熱と、取り外し対象の半導体部品2の周辺の部品に対する熱影響を抑制するための上述した調温機構による電子回路基板1の下側からの上述した加温あるいは冷却による調温、更には、上述した第三の加温機構による電子回路基板1の下面側に対する全体的な加温を行いつつ、上述した取り外し治具の挿入、取り外し対象の半導体部品2の分離を行う。 In addition, the temperature control mechanism described above performs temperature control so that the temperature is suitable for removing the semiconductor component 2 while inserting the removal jig and separating the semiconductor component 2 to be removed. That is, the electronic circuit board by the above-described temperature control mechanism for suppressing the local heating from the upper side by the heating mechanism 7 to the semiconductor component 2 to be removed and the thermal effect on the peripheral parts of the semiconductor component 2 to be removed While performing temperature control by heating or cooling from the lower side of the electronic circuit board 1 as described above, and further heating the entire lower surface side of the electronic circuit board 1 by the third heating mechanism described above, the removal jig described above The semiconductor component 2 to be inserted and removed is separated.
<半導体部品の取付方法>
 上述した実施形態の半導体部品分離装置を用いた半導体部品取付方法は次のようにして行われる
 半導体部品2の取り外しが行われた後の電子回路基板1における半導体部品取り外し後の基板側パターン面におけるはんだ及びアンダーフィル残渣を除去する。
<Method for mounting semiconductor parts>
The semiconductor component mounting method using the semiconductor component separating apparatus of the above-described embodiment is performed as follows. Remove solder and underfill residue.
 電子回路基板1から取り外された半導体部品2に替えて新たに電子回路基板1の基板側パターン面に取り付ける新規半導体部品へのはんだ印刷又ははんだ転写を行う。 In place of the semiconductor component 2 removed from the electronic circuit board 1, solder printing or solder transfer is performed on a new semiconductor component to be newly attached to the board-side pattern surface of the electronic circuit board 1.
 あるいは、
 電子回路基板1における前記基板側パターン面にはんだ印刷又はディスペンス供給を行う。
or,
Solder is printed or dispensed onto the board-side pattern surface of the electronic circuit board 1 .
 なお、新規半導体部品へのはんだ印刷又ははんだ転写と、電子回路基板1における基板側パターン面にはんだ印刷又はディスペンス供給との双方を行うことにしてもよい。 It should be noted that both solder printing or solder transfer to the new semiconductor component and solder printing or dispensing supply to the board-side pattern surface of the electronic circuit board 1 may be performed.
 次に、電子回路基板1における前記基板側パターンと、前記新規半導体部品の電極の位置合わせを行う。 Next, the board-side pattern on the electronic circuit board 1 and the electrodes of the new semiconductor component are aligned.
 その後、位置合わせ後の前記新規半導体部品に対して、上述した実施形態の半導体部品分離装置における加熱機構7により局所的な加熱を行って、新規半導体部品を電子回路基板1に取り付ける。 After that, the new semiconductor component after alignment is locally heated by the heating mechanism 7 in the semiconductor component separating apparatus of the above-described embodiment, and the new semiconductor component is attached to the electronic circuit board 1 .
 なお、加熱は周辺部品への熱影響により不具合が発生することが課題となるため、取り外しを行うときと同じように、上述した温度調整機構によって、温度状態が、半導体部品の取り付けに好適になるように調温を行う。すなわち、取り付け位置に上述したように位置合わせされた前記新規半導体部品に対する、加熱機構7による上側からの局所的な加熱と、周辺の部品に対する熱影響を抑制するための上述した調温機構による電子回路基板1の下側からの上述した加温あるいは冷却による調温、更には、上述した第三の加温機構による電子回路基板1の下面側に対する全体的な加温を行いつつ、新規半導体部品の電子回路基板1への取り付けを行う。 The problem with heating is that it causes problems due to the thermal effects on peripheral components, so the temperature adjustment mechanism described above makes the temperature suitable for attaching semiconductor components, just as when removing them. Adjust the temperature as follows. That is, the new semiconductor component aligned with the mounting position as described above is locally heated from the upper side by the heating mechanism 7, and the above-described temperature control mechanism for suppressing the thermal effect on peripheral components. While controlling the temperature by heating or cooling from the lower side of the circuit board 1 and further heating the entire lower surface side of the electronic circuit board 1 by the above-described third heating mechanism, the new semiconductor component is attached to the electronic circuit board 1.
 以上、添付図面を参照して本発明の実施形態を説明したが、本発明は上述した実施形態に限定されることなく、特許請求の範囲の記載から把握される技術的範囲において種々に変更可能である。 Although the embodiments of the present invention have been described above with reference to the accompanying drawings, the present invention is not limited to the above-described embodiments, and can be variously modified within the technical scope grasped from the description of the claims. is.

Claims (18)

  1.  電子回路基板に実装されている半導体部品に対して前記半導体部品の上側から加熱を行う加熱機構と、
     取り外し治具と、
     前記電子回路基板と、前記半導体部品との間に、前記取り外し治具を挿入させる治具挿入機構と、
     前記電子回路基板と前記半導体部品との間に挿入されている前記取り外し治具を、前記半導体部品を上側に支持している状態で、前記電子回路基板の上方向への上昇動作を行わせる治具昇降機構と
     を備えている半導体部品分離装置。
    a heating mechanism for heating a semiconductor component mounted on an electronic circuit board from above the semiconductor component;
    a removal jig;
    a jig insertion mechanism for inserting the removal jig between the electronic circuit board and the semiconductor component;
    The removal jig inserted between the electronic circuit board and the semiconductor component is a jig for moving the electronic circuit board upward while supporting the semiconductor component upward. A semiconductor component separating apparatus comprising: a tool lifting mechanism;
  2.  前記半導体部品に対して前記取り外し治具が傾斜している角度を調整する角度調整機構を更に備えている請求項1記載の半導体部品分離装置。 The semiconductor component separating apparatus according to claim 1, further comprising an angle adjusting mechanism for adjusting an angle at which the removing jig is inclined with respect to the semiconductor component.
  3.  前記取り外し治具が、前記治具挿入機構によって前記電子回路基板と前記半導体部品との間に挿入される際に、前記取り外し治具が挿入される前記半導体部品の側に対向する側において前記半導体部品が移動しないように前記半導体部品を支持する半導体部品支持機構を更に備えている請求項1又は2記載の半導体部品分離装置。 When the removal jig is inserted between the electronic circuit board and the semiconductor component by the jig insertion mechanism, the semiconductor component is mounted on the side facing the semiconductor component into which the removal jig is inserted. 3. The semiconductor component separating apparatus according to claim 1, further comprising a semiconductor component supporting mechanism for supporting said semiconductor component so that said component does not move.
  4.  前記取り外し治具を加温すると共に前記取り外し治具の加温状態を調整する第一の加温機構が前記取り外し治具に付帯されている請求項1~3のいずれか一項に記載の半導体部品分離装置。 4. The semiconductor according to any one of claims 1 to 3, wherein a first heating mechanism for heating said removal jig and adjusting a heating state of said removal jig is attached to said removal jig. Parts separation device.
  5.  前記取り外し治具が、前記半導体部品を上側に支持している状態で、前記治具昇降機構によって前記上昇動作を行う際に、前記取り外し治具と共同して前記半導体部品を前記取り外し治具との間で保持しつつ前記上昇動作を行う半導体部品保持機構を更に備えている請求項1~4のいずれか一項に記載の半導体部品分離装置。 In a state in which the removal jig supports the semiconductor component on the upper side, the semiconductor component is moved with the removal jig in cooperation with the removal jig when the lifting operation is performed by the jig elevating mechanism. 5. The semiconductor component separating apparatus according to claim 1, further comprising a semiconductor component holding mechanism that performs the lifting operation while holding the semiconductor component between the two.
  6.  前記半導体部品保持機構は、バキューム吸着保持機構である請求項5記載の半導体部品分離装置。 The semiconductor component separating apparatus according to claim 5, wherein the semiconductor component holding mechanism is a vacuum suction holding mechanism.
  7.  前記半導体部品保持機構は、前記取り外し治具と共同して前記半導体部品を前記取り外し治具との間で保持する平板状の板状保持機構である請求項5記載の半導体部品分離装置。 6. The semiconductor component separating apparatus according to claim 5, wherein the semiconductor component holding mechanism is a plate-shaped holding mechanism that holds the semiconductor component together with the removal jig between itself and the removal jig.
  8.  前記板状保持機構を加温すると共に前記板状保持機構の加温状態を調整する第二の加温機構が前記板状保持機構に備えられている請求項7記載の半導体部品分離装置。 The semiconductor component separating apparatus according to claim 7, wherein the plate-like holding mechanism is provided with a second heating mechanism for heating the plate-like holding mechanism and adjusting the heating state of the plate-like holding mechanism.
  9.  前記板状保持機構は、前記半導体部品の上側面との間にわずかなクリアランスを存在させて前記半導体部品の上側面と対向し、前記取り外し治具と共同して前記半導体部品を前記取り外し治具との間で保持する請求項7記載の半導体部品分離装置。 The plate-shaped holding mechanism faces the upper side surface of the semiconductor component with a slight clearance therebetween, and cooperates with the removal jig to hold the semiconductor component by the removal jig. 8. The semiconductor component separating apparatus according to claim 7, wherein the semiconductor component is held between
  10.  前記加熱機構による前記半導体部品に対する加熱は、前記半導体部品のサイズと同等の範囲での局所的な加熱である請求項1~9のいずれか一項に記載の半導体部品分離装置。 The semiconductor component separating apparatus according to any one of claims 1 to 9, wherein the heating of the semiconductor component by the heating mechanism is local heating in a range equivalent to the size of the semiconductor component.
  11.  加熱が行われている前記半導体部品が実装されている位置の前記電子回路基板の下面側から、加熱が行われている前記電気半導体部品が実装されている位置における前記電子回路基板の温度状態を調整する温度調整機構を更に備えている請求項1~10のいずれか一項に記載の半導体部品分離装置。 The temperature state of the electronic circuit board at the position where the heated electrical semiconductor component is mounted is measured from the lower surface side of the electronic circuit board at the position where the heated semiconductor component is mounted. The semiconductor component separating apparatus according to any one of claims 1 to 10, further comprising a temperature adjusting mechanism for adjusting.
  12.  前記温度調整機構は、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板を下側から加温する第二の加温機構である請求項11記載の半導体部品分離装置。 12. The semiconductor component separating apparatus according to claim 11, wherein the temperature adjusting mechanism is a second heating mechanism that heats the electronic circuit board from below at a position where the heated semiconductor component is mounted. .
  13.  前記温度調整機構は、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板に対して冷却効果を与える冷却機構である請求項11記載の半導体部品分離装置。 12. The semiconductor component separating apparatus according to claim 11, wherein the temperature adjusting mechanism is a cooling mechanism that provides a cooling effect to the electronic circuit board at a position where the heated semiconductor component is mounted.
  14.  前記冷却機構は、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板に対して下側から風を吹き付ける空冷機構である請求項13記載の半導体部品分離装置。 14. The semiconductor component separating apparatus according to claim 13, wherein the cooling mechanism is an air cooling mechanism that blows air from below to the electronic circuit board at the position where the heated semiconductor component is mounted.
  15.  前記冷却機構は、加熱が行われている前記半導体部品が実装されている位置における前記電子回路基板に下側から取り付けられて放熱による冷却を行う放熱冷却機構である請求項13記載の半導体部品分離装置。 14. The semiconductor component separation according to claim 13, wherein said cooling mechanism is a heat radiation cooling mechanism that is attached from below to said electronic circuit board at a position where said semiconductor component being heated is mounted and performs cooling by heat radiation. Device.
  16.  前記電子回路基板の下面側を加温する第三の加温機構を更に備えている請求項1~15のいずれか一項に記載の半導体部品分離装置。 The semiconductor component separating apparatus according to any one of claims 1 to 15, further comprising a third heating mechanism for heating the lower surface side of the electronic circuit board.
  17.  請求項1~請求項16のいずれか一項に記載されている半導体部品分離装置を用いて、電子回路基板に実装されている取り外し対象の半導体部品に対して上側から加熱を行いつつ、前記取り外し治具を、取り外し対象の前記半導体部品と、前記電子回路基板との間に挿入させ、前記取り外し治具を上昇させることで取り外し対象の前記半導体部品を前記電子回路基板から取り外す半導体部品分離方法。 Using the semiconductor component separation apparatus according to any one of claims 1 to 16, while heating the semiconductor component to be removed mounted on the electronic circuit board from above, the removal A semiconductor component separating method comprising inserting a jig between the semiconductor component to be removed and the electronic circuit board, and lifting the removal jig to remove the semiconductor component to be removed from the electronic circuit board.
  18.  半導体部品の取り外しが行われた後の電子回路基板における前記半導体部品取り外し後の基板側パターン面におけるはんだ及びアンダーフィル残渣を除去する工程と、
     前記電子回路基板から取り外された前記半導体部品に替えて新たに前記電子回路基板の前記基板側パターン面に取り付ける新規半導体部品へのはんだ印刷又ははんだ転写を行う工程、及び/又は、
     前記電子回路基板における前記基板側パターン面にはんだ印刷又はディスペンス供給を行う工程と、
     前記電子回路基板における前記基板側パターンと、前記新規半導体部品の電極の位置合わせを行う工程と、
     位置合わせ後の前記新規半導体部品に対して、請求項1~請求項16のいずれか一項に記載されている半導体部品分離装置を用いて加熱を行う工程
     とを備えている電子回路基板への半導体部品取付方法。
    a step of removing solder and underfill residue on the board-side pattern surface after removal of the semiconductor component in the electronic circuit board after removal of the semiconductor component;
    a step of performing solder printing or solder transfer onto a new semiconductor component newly attached to the board-side pattern surface of the electronic circuit board in place of the semiconductor component removed from the electronic circuit board; and/or
    a step of performing solder printing or dispensing supply on the board-side pattern surface of the electronic circuit board;
    a step of aligning the board-side pattern of the electronic circuit board with the electrode of the new semiconductor component;
    and a step of heating the new semiconductor component after alignment using the semiconductor component separating apparatus according to any one of claims 1 to 16. Semiconductor component mounting method.
PCT/JP2022/000461 2022-01-11 2022-01-11 Semiconductor-component-separating device and semiconductor component separation and attachment method using same WO2023135624A1 (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009218436A (en) * 2008-03-11 2009-09-24 Panasonic Corp Mounted structure of electronic component, mounting method and repairing method of the mounted structure, and printed board
JP2011211073A (en) * 2010-03-30 2011-10-20 Fujitsu Ltd Repairing device for electronic component, repairing method, and heat transfer cap member for use in repair
JP2021082637A (en) * 2019-11-15 2021-05-27 三菱電機株式会社 Rework condition learning device, rework condition determination device, and rework device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009218436A (en) * 2008-03-11 2009-09-24 Panasonic Corp Mounted structure of electronic component, mounting method and repairing method of the mounted structure, and printed board
JP2011211073A (en) * 2010-03-30 2011-10-20 Fujitsu Ltd Repairing device for electronic component, repairing method, and heat transfer cap member for use in repair
JP2021082637A (en) * 2019-11-15 2021-05-27 三菱電機株式会社 Rework condition learning device, rework condition determination device, and rework device

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