KR102073676B1 - Method and apparatus for inspecting flat panel display - Google Patents

Abstract

An embodiment of the present invention relates to a method and apparatus for inspecting a flat plate, comprising: an illumination device disposed spaced apart from an upper surface of an object and irradiated with light toward an upper surface of the object; A photographing apparatus for photographing an image using light reflected from the upper surface, a controller for controlling the lighting apparatus and the photographing apparatus to move on a plane parallel to and spaced apart from the upper surface of the object, and an image connected to the photographing apparatus and processing the photographed image. The processor may include a processor, and the image processor may provide a flat panel inspection apparatus that samples a part of pixels included in the captured image and performs a binarization operation on the sampled pixels.

Description

Flat plate inspection method and apparatus {METHOD AND APPARATUS FOR INSPECTING FLAT PANEL DISPLAY}

Embodiments of the present invention relate to a plate inspection method and apparatus, and more particularly, to a plate inspection method and apparatus that can reduce the inspection time during the optical inspection of the plate.

The demand for display is increasing in accordance with the development of information and communication technology and the demand of diversified information society, and as the display device, compactness, power saving, etc. are replaced instead of the CRT (Cathode-Ray Tube) device, which is conventionally used as most display devices. According to the needs of flat panel displays (FPD, Flat Panel Display) is being developed. Flat panel displays that are commonly used now include electroluminescent display (ELD), liquid crystal display (LCD: TFT-LCD, TN / STN), plasma display panel, organic EL, and the like.

In order to maintain the stable quality of such a flat panel display, the development of materials, the development of processes, etc. are important, but there is no defect in a panel such as glass or plastic used for manufacturing.

In general, as a method of inspecting a defect of a flat panel display, a method of irradiating light onto a panel surface and inspecting a defect on a panel surface from an optical change of the irradiated light is used. That is, the light irradiated from the light source is sequentially irradiated to the flat panel display as a test object through a path such as a mirror, a lens, a liquid crystal plate, and the inspector can determine the presence of a defect such as a scratch or a stain. However, when the brightness of the light is unstable, it may not be possible to accurately determine whether there is a defect due to structurally uneven brightness in the flat panel display.

In addition, a method of automatically inspecting a defect of the flat panel display using a camera may be used. However, when photographing and analyzing the image of the flat panel display with the camera as described above, there was a problem that takes a lot of inspection time.

Embodiments of the present invention can provide a flat plate inspection method and apparatus that can reduce the inspection time.

Embodiments of the present invention can provide a flat plate inspection method and apparatus that can achieve similar results while reducing the inspection time compared to the conventional case when the distribution of stains relative to the total area is small during flat plate inspection.

Problems to be solved through embodiments of the present invention are not limited to the above-mentioned problems, and other tasks not mentioned above may be clearly understood by those skilled in the art from the following description. There will be.

An apparatus for inspecting a flat plate according to an embodiment of the present invention is disposed spaced apart from an upper surface of an object and irradiated with light toward an upper surface of the object, disposed to be spaced apart from an upper surface of the object and irradiated from the illumination device. A photographing apparatus which photographs an image using light reflected from an upper surface of the controller, a controller which controls the lighting apparatus and the photographing apparatus to move on a plane parallel to and spaced apart from and parallel to the upper surface of the object, and connected to the photographing apparatus and photographing An image processor may be configured to process the captured image, and the image processor may sample a part of pixels included in the photographed image, and perform a binarization operation on the sampled pixel.

According to an embodiment of the present invention, a flat plate inspection method includes: irradiating light toward an upper surface of an object, photographing an image by using light reflected from the upper surface of the object, and a part of pixels included in the captured image Sampling may be performed, and performing a binarization operation on the sampled pixels.

The photographed image may be a two-dimensional image, and the image processor may sample a portion of pixels included in the photographed image at a predetermined sampling interval in the X-axis direction and a predetermined sampling interval in the Y-axis direction. Can be.

In addition, the sampling interval in the X-axis direction and the sampling interval in the Y-axis direction may be the same.

In addition, the image processing unit performs the binarization operation on the pixels of arbitrary coordinates (a, b) sampled, and then if coordinates (a + (sampling interval in the X-axis direction), b) is If the image is not out of the area of the photographed image, the binarization operation is performed on the pixel of the coordinate (a + (sampling interval in the X axis direction), and if the coordinate (a + (sampling interval in the X axis direction) ), b) is outside the area of the captured image and the coordinates (0, b + (sampling interval in the Y-axis direction)) do not leave the area of the captured image, the coordinate (0, b + (the Y The binarization operation), and if the coordinates (a + (sampling interval in the X-axis direction), b) and the coordinates (0, b + (the Y-axis direction) Sampling interval) is outside the area of the photographed image. Processing can be terminated.

Further, the binarization operation indicates the arbitrary pixel as 1 when the intensity value of any pixel is greater than the first threshold value and less than or equal to the second threshold value, and the contrast value is less than or equal to or greater than the first threshold value. When larger than the second threshold value, the operation represents the arbitrary pixel as 0. When the image processing unit performs the binarization operation on the pixel of the arbitrary coordinates (a, b) sampled, the photographing operation is performed. The binarization operation is performed on all pixels existing within a range of (sampling interval in the X-axis direction) * (sampling interval in the Y-axis direction) with respect to the coordinates (a, b) in the captured image. can do.

Further, the binarization operation indicates the arbitrary pixel as 1 when the intensity value of any pixel is greater than the first threshold value and less than or equal to the second threshold value, and the contrast value is less than or equal to or greater than the first threshold value. When larger than the second threshold value, the operation represents the arbitrary pixel as 0. When the image processing unit performs the binarization operation on the pixel of the arbitrary coordinates (a, b) sampled, the photographing operation is performed. (A-(sampling interval in the X-axis direction) / 2, b-(sampling interval in the Y-axis direction) / 2), coordinates (a + (sampling interval in the X-axis direction) / 2, b-(sampling interval in the Y-axis direction) / 2), coordinates (a-(sampling interval in the X-axis direction) / 2, b + (sampling interval in the Y-axis direction) / 2 ) And coordinates (a + (sampling interval in the X-axis direction) / 2, b + (sampling interval in the Y-axis direction The binarization operation may be performed on all pixels existing in the rectangular region with each vertex).

In addition, the binarization operation may be an operation of representing the arbitrary pixel as 0 or 1 using the intensity value of the arbitrary pixel.

Further, the binarization operation indicates the arbitrary pixel as 1 when the intensity value of any pixel is greater than the first threshold value and less than or equal to the second threshold value, and the contrast value is less than or equal to or greater than the first threshold value. When larger than the second threshold value, the operation may be performed to represent the arbitrary pixel as zero.

The image processor may sample a portion of pixels included in the photographed image at a predetermined sampling interval.

In addition, the captured image may be a black and white image or a color image.

The performing of the binarization operation may include obtaining a coordinate of a next sample pixel in the captured image by using a sampling interval in the X-axis direction and a sampling interval in the Y-axis direction, and converting a current coordinate to the next sample. A shifting step of shifting the coordinates of the pixel, a binarization step of performing the binarization operation on the sample pixels of the moved current coordinates, and determining whether the sample pixel of the shifted current coordinates is the last sample pixel; Ending if the sample pixel of the current coordinate is the last sample pixel, and repeating the moving step to the binarization step if the sample pixel of the moved current coordinate is not the last sample pixel. have.

Also, in the moving step, when the coordinates before the movement of the current coordinates are coordinates (a, b), if coordinates (a + (sampling interval in the X-axis direction), b) of the captured image The coordinate of the next sample pixel is the coordinate (a + (sampling interval in the X-axis direction) if not leaving the area, and if the coordinate (a + (sampling interval in the X-axis direction), b) is the photographing If the coordinates (0, b + (sampling interval in the Y-axis direction)) do not leave the region of the captured image, the coordinates of the next sample pixel are the coordinates (0, b + (the Y). Axial direction)), and if the coordinates (a + (sampling interval in the X axis direction), b) and the coordinates (0, b + (sampling interval in the Y axis direction)) are If it is out of the area of the captured image can be terminated.

Further, the binarization operation indicates the arbitrary pixel as 1 when the intensity value of any pixel is greater than the first threshold value and less than or equal to the second threshold value, and the contrast value is less than or equal to or greater than the first threshold value. If greater than the second threshold value, the operation represents the arbitrary pixel as 0. Between the binarization step and the repetition step, if the result of the binarization operation on the sample pixel of the moved current coordinate is 1, the The binarization operation is performed on all pixels existing within a range of (sampling interval in the X-axis direction) * (sampling interval in the Y-axis direction) with respect to the moved current coordinates in the captured image. And further comprising a range binarization step, wherein the iterative step includes the range binarization step from the moving step if the sample pixel of the moved current coordinate is not the last sample pixel. Up can be repeated.

Further, the binarization operation indicates the arbitrary pixel as 1 when the intensity value of any pixel is greater than the first threshold value and less than or equal to the second threshold value, and the contrast value is less than or equal to or greater than the first threshold value. If greater than the second threshold value, the operation represents the arbitrary pixel as 0. Between the binarization step and the repetition step, if the result of the binarization operation on the sample pixel of the moved current coordinate is 1, the When the current coordinate shifted is called coordinate (a, b), the coordinate (a-(sampling interval in the X-axis direction) / 2, b-(sampling interval in the Y-axis direction) in the captured image / 2), coordinates (a + (sampling interval in the X-axis direction) / 2, b-(sampling interval in the Y-axis direction) / 2), coordinates (a-(sampling interval in the X-axis direction) / 2, b + (sampling interval in the Y-axis direction) / 2) and coordinates (a + (in the X-axis direction) And a binarization step of performing the binarization operation on all pixels existing in the rectangular region having each sampling interval) / 2, b + (the sampling interval in the Y-axis direction) / 2) as the vertices. The repeating step may be repeated from the moving step to the range binarization step if the sample pixel of the moved current coordinate is not the last sample pixel.

According to the embodiment of the present invention, it is possible to shorten the inspection time when inspecting the plate.

According to an exemplary embodiment of the present invention, when the distribution of the stains relative to the total area is small during the flat plate inspection, similar results may be obtained while reducing the inspection time.

1 is a perspective view showing the configuration of a flat plate inspection apparatus according to an embodiment of the present invention.
2 is a color histogram for explaining a binarization method according to an embodiment of the present invention.
3 is a flowchart illustrating a process of inspecting a flat plate according to an embodiment of the present invention.
4 is a reference view for explaining a flat plate inspection method according to an embodiment of the present invention.
5 is a reference diagram for comparing a binarization result according to a conventional method and a binarization result according to an embodiment of the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, the accompanying drawings are only described in order to more easily disclose the contents of the present invention, and the scope of the present invention is not limited to the scope of the accompanying drawings that can be easily understood by those of ordinary skill in the art. You will know.

In addition, throughout the specification, when a part is 'connected' to another part, it is not only 'directly connected' but also 'indirectly connected' with one or more other components in between. It is included if there is. In addition, when a part is said to "include" a certain component, it does not mean that except for the other components unless otherwise stated that may include other components other than.

Hereinafter, a method and apparatus for inspecting a flat plate according to an exemplary embodiment of the present invention will be described in detail with reference to the accompanying drawings.

1 is a perspective view showing the configuration of a flat plate inspection apparatus according to an embodiment of the present invention. Referring to FIG. 1, an apparatus for inspecting a flat plate according to an embodiment of the present invention may be disposed spaced apart from an upper surface of an object 100 to illuminate light toward the upper surface of the object 100, the object. A photographing apparatus 120 disposed to be spaced apart from an upper surface of the photographing apparatus 100 and photographing light reflected from the upper surface of the object 100 by the illumination apparatus 110, the illumination apparatus 110, and the photographing apparatus ( The controller 130 controls the 120 to move on a plane parallel to and spaced apart from the upper surface of the object 100, and an image connected to the photographing apparatus 120 and processing an image photographed by the photographing apparatus 120. It may include a processor 140.

The lighting device 110 may be spaced apart from the top surface of the object 100. The object 100 can be anything as long as it can be optically inspected by the plate inspection apparatus. The object 100 may be, for example, an OLED panel. The lighting device 110 may irradiate light toward the upper surface of the object 100.

The photographing apparatus 120 may be spaced apart from an upper surface of the object 100. The photographing apparatus 120 may photograph the light reflected from the illumination device 110 and reflected from the upper surface of the object 100. The photographing apparatus 120 may be, for example, a camera.

The controller 130 may control the lighting apparatus 110 and the photographing apparatus 120 to move. The controller 130 may move the photographing apparatus 120 to allow the photographing apparatus 120 to photograph each part of the upper surface of the object 100. In addition, since the photographing apparatus 120 photographs the light emitted from the illumination apparatus 110, the controller 130 may move the illumination apparatus 110 together with the photographing apparatus 120. The controller 130 is spaced apart from and parallel to the upper surface of the object 100 so that the photographing apparatus 120 uniformly photographs the light reflected from the upper surface of the object 100. It can be controlled to move on a plane. In addition, the controller 130 may control the lighting device 110 to move on the plane as well.

The image processor 140 may be connected to the photographing apparatus 120. The image processor 140 may receive the image photographed by the photographing apparatus 120 and process the image. Depending on the type of the photographing apparatus 120, the image photographed by the photographing apparatus 120 may be a black and white image or a color image.

The image processor 140 may process the image in various ways according to the purpose of the inspection. In general, the purpose of inspecting the flat plate is to check whether the flat plate configuration is uniform, to check whether there is a defective part, and to detect the location of the flat plate. In the following description, it is assumed that the flat panel display irradiates light and detects a spot where spots are observed using the reflected light. That is, the object 100 may be a flat panel display.

The image processor 140 binarizes the image photographed by the photographing apparatus 120 to determine whether the light reflected from a specific point on the upper surface of the object 100 corresponds to normal or unevenness. ) Can be performed.

Binarization refers to a process for obtaining a binary (0 or 1) image from a monochrome image or a color image in which each pixel may have different brightness or different colors. The numerical value of each pixel can be binarized against a specific threshold. The binarization may be used as a means for detecting a specific region of the entire image, and when the binarized image is obtained, various geometrical analyzes may be performed using the binarized image.

2 is a color histogram for explaining a binarization method according to an embodiment of the present invention. The horizontal axis of the color histogram of FIG. 2 represents a contrast value of 256 gray levels, and the vertical axis represents a frequency of pixels having each contrast value. The color histogram of FIG. 2 may be a result of photographing and reflecting light reflected on all portions of the upper surface of another object of the same kind as the object 100.

Referring to the histogram of FIG. 2, it can be seen that the frequency is high in the portion where the contrast value is 40 to 60, and the frequency is also high in the portion where the contrast value is 80 to 130. That is, it can be seen that the original image having the result as shown in FIG. 2 is mainly composed of a dark region having a contrast value of 40 to 60 and a bright region having a contrast value of 80 to 130. Therefore, a pixel having an intensity value less than or equal to T1 with respect to T1 of FIG. 2 may be referred to as a dark area. In addition, pixels having a contrast value larger than T2 on the basis of T2 can be determined as noise. Therefore, a portion having a contrast value larger than T1 and smaller than or equal to T2 may be referred to as a bright area.

Since the original image photographs the light reflected from all parts of the upper surface of the object of the same type as the object 100, the original image may be a two-dimensional image. Coordinates of arbitrary pixels in the image will be referred to as (x, y). In addition, the contrast value of the pixel at (x, y) will be referred to as f (x, y).

In an exemplary embodiment of the present invention, a portion having a contrast value larger than T1 and less than or equal to T2 by binarizing each pixel of the image has a binarization result of 1, and has a contrast value less than or equal to T1. Or a pixel having a contrast value greater than T2 may be defined as having a binarization result of zero. Therefore, to binarize each pixel, we can use the following function: The binarization result for the pixel at (x, y) will be referred to as g (x, y).

If the time required to perform the binarization operation on one pixel is Tp, it is necessary to perform the binarization operation on all the pixels of the 2D image having (W pixels) * (H pixels). The time T can be obtained as follows.

Therefore, if the light reflected from all parts of the upper surface of the object 100 is photographed and the binarization operation is performed on all the pixels of the photographed image, the time required for the binarization is the size of the upper surface of the object 100 or the like. It is proportional to the size of the captured image. Therefore, if the photographed image has a high resolution, it takes a lot of time for binarization, and therefore, a lot of time may be required for image processing using the binarization result.

In the flat plate inspection method according to an embodiment of the present invention can improve the problems as described above can shorten the inspection time during the flat plate inspection. In addition, when the distribution of spots relative to the total area is small at the time of flat plate inspection, similar results can be obtained while reducing the inspection time as compared with the related art.

3 is a flowchart illustrating a process of inspecting a flat plate according to an embodiment of the present invention. 4 is a reference view for explaining a flat plate inspection method according to an embodiment of the present invention.

Referring to FIG. 3, in the planar inspection method according to an exemplary embodiment of the present invention, first, an operation (S1) of setting an interval of pixels to be sampled from an entire image may be performed. The spacing of the pixels to be sampled can be determined in various ways depending on the purpose of the inspection. The spacing can be determined, for example, by one eighth of the expected size of the bright area corresponding to the blob. An interval of pixels to be sampled may be set according to the determined interval, and pixels may be sampled while moving according to the set interval. In addition, in the case of a two-dimensional image, the sampling interval in the X-axis direction and the sampling interval in the Y-axis direction may be independently set, or may be set to the same value. Hereinafter, an embodiment in which the sampling interval in the X-axis direction and the sampling interval in the Y-axis direction are the same will be described, and the sampling interval will be referred to as i.

Next, a moving step (S100) of obtaining a position of the next sample pixel in the image according to the interval and moving the current position to the position of the next sample pixel may be performed. If you start sampling for the first time, you can start sampling from the coordinates (0, 0). Let the coordinates of the current sample pixel be (a, b) and the coordinates of the next sample pixel be (c, d). The values of c and d can be obtained in various ways depending on the embodiment. In this embodiment, sampling may be performed sequentially according to the interval of the sample pixels. Therefore, the coordinate of the next sample pixel may be (a + i, b) or (a, b + i). Hereinafter, an embodiment in which an image is first sampled along the X axis, then moved along the Y axis by i and then again along the X axis, will be described.

Therefore, if the previous sample of (a, b) is sampled, the candidate of the coordinate of the next sample pixel may be (a + i, b). If the position corresponding to (a + i, b) is past the end of the image, the candidate of the coordinate of the next sample pixel may be (0, b + i). If the position corresponding to (0, b + i) passes the end of the image, it may be determined that there are no more sample pixels, and the sampling may be terminated.

Next, a binarization step S110 of performing binarization on the pixel at the current position may be performed. The binarization calculation method is as described above.

Next, a comparison step (S120) of comparing the values resulting from the binarization may be performed. If the result of the binarization is 1, the binarization is performed for all pixels existing in the range of (sampling interval for the X axis) * (sampling interval for the Y axis) in the image based on the current position. A range binarization step (S130) may be performed. In this embodiment, since the sampling interval on the X axis and the sampling interval on the Y axis are both i, when the current position is (a, b) (a-i / 2, b-i / 2), (a + i / 2, b-i / 2), (a-i / 2, b + i / 2), (a + i / 2, b + i / 2) for every pixel that exists within a rectangular area with each vertex Binarization can be performed for

Referring to the embodiment shown in FIG. 4, sample pixels in bright areas were sampled. When the binarization operation is performed on the sample pixel, 1 may be obtained as a result. In the embodiment shown in FIG. 4, since the sampling interval Pw on the X-axis and the sampling interval Ph on the Y-axis are both 11, 2 for all pixels existing within the range of 11 * 11 around the sample pixel. A digitization operation can be performed and the result is shown in the lower right part of FIG.

If the result of the binarization of the pixel at the current position is 0, the next step may be performed without performing the above process.

Next, it is determined whether the pixel of the current position is the last sample pixel, and if it is the last pixel, the step is terminated, and if it is not the last pixel, the repeating step (S140) to repeat from the moving step (S100) to the range binarization step (S130) Can be performed. Whether the pixel at the current position is the last sample pixel may be determined using a method similar to that in the moving step S100.

As described above, the time required to perform a binarization operation on a two-dimensional image having (W pixels) * (H pixels) according to the flat plate inspection method according to an embodiment of the present invention is represented by the following equation. Can be obtained by In the equation below, Pw is the sampling interval for the X axis, and Ph is the sampling interval for the Y axis. In addition, C represents the number of pixels having a g (x, y) value of 1 among all the pixels sampled.

Here, since C is the number of pixels having a g (x, y) value of 1 among all the sampled pixels, the following inequality can be established.

Accordingly, it can be seen that the time T ′ required by the flat plate inspection method according to the embodiment of the present invention is less than or equal to the time T required to perform the binarization operation on all pixels as in the prior art. .

Therefore, the flat plate inspection method according to the embodiment of the present invention can shorten the inspection time during the flat plate inspection. In particular, when the distribution of spots is smaller than the size of the entire image, C becomes smaller and thus the inspection time may be further shortened.

5 is a reference diagram for comparing a binarization result according to a conventional method with a binarization result according to an embodiment of the present invention. The left part of FIG. 5 illustrates a result of performing a binarization operation on all pixels of the captured image according to a conventional method. 5 shows a result of performing a binarization operation according to the flat plate inspection method according to an exemplary embodiment of the present invention.

As can be seen by comparing the results shown in Figure 5, when performing the binarization operation according to the plate inspection method according to an embodiment of the present invention, similar results can be obtained while reducing the inspection time compared to the prior art.

Although described above with reference to the embodiments of the present invention, which is merely an example and not limiting the present invention, those skilled in the art to which the present invention pertains without departing from the essential characteristics of the embodiments of the present invention. It will be appreciated that various modifications and applications not illustrated above are possible. For example, each component specifically shown in the embodiment of the present invention may be modified. And differences relating to these modifications and applications will have to be construed as being included in the scope of the invention defined in the appended claims.

100: object
110: lighting device
120: recording device
130: control unit
140: image processing unit

Claims (10)

An illumination device disposed spaced apart from an upper surface of the object and irradiating light toward the upper surface of the object;
A photographing apparatus arranged to be spaced apart from an upper surface of the object and photographing an image by using light reflected from the upper surface of the object to be irradiated from the illumination device;
A controller for controlling the illumination device and the photographing device to move on a plane spaced apart from and parallel to an upper surface of the object; And
An image processor connected to the photographing apparatus and processing the photographed image;
The image processor samples a portion of the pixels included in the captured image and performs a binarization operation on the sampled pixels.
The photographed image is a two-dimensional image, and the image processor samples a portion of pixels included in the photographed image at a predetermined sampling interval in the X-axis direction and a predetermined sampling interval in the Y-axis direction,
The binarization operation indicates the arbitrary pixel as 1 when the intensity value of any pixel is greater than the first threshold value and less than or equal to the second threshold value, and the contrast value is less than or equal to or greater than the first threshold value. Is greater than a threshold, the operation represents the arbitrary pixel as zero,
The first threshold value and the second threshold value are defined by a value obtained by multiplying the time required to perform the binarization operation on one pixel by the number of pixels included in the captured image.
If the result of performing the binarization operation on the pixels of the arbitrary coordinates (a, b) sampled is 1, the image processor is configured to be centered on the coordinates (a, b) in the captured image (the X And a binarization operation for all pixels existing within a range of a sampling interval in the axial direction) * (the sampling interval in the Y-axis direction). delete The method of claim 1,
And a sampling interval in the X-axis direction and a sampling interval in the Y-axis direction are the same. The method of claim 1,
The image processing unit performs the binarization operation on the pixels of arbitrary coordinates (a, b) sampled, and then if coordinates (a + (sampling interval in the X-axis direction), b) are taken If not out of the area of the image, the binarization operation is performed on the pixel of the coordinate (a + (sampling interval in the X-axis direction), b), and if the coordinate (a + (sampling in the X-axis direction) Interval), b) is outside the area of the captured image and the coordinates (0, b + (the sampling interval in the Y-axis direction)) do not leave the area of the captured image. The binarization operation for the Y-axis direction), and if the coordinates (a + (sampling interval in the X-axis direction), b) and the coordinates (0, b + (the Y-axis) Sampling interval in the direction) is outside the area of the photographed image. Flatbed inspection device to shut down. delete An illumination device disposed spaced apart from an upper surface of the object and irradiating light toward the upper surface of the object;
A photographing apparatus arranged to be spaced apart from an upper surface of the object and photographing an image by using light reflected from the upper surface of the object to be irradiated from the illumination device;
A controller for controlling the illumination device and the photographing device to move on a plane spaced apart from and parallel to an upper surface of the object; And
An image processor connected to the photographing apparatus and processing the photographed image;
The image processor samples a portion of the pixels included in the captured image and performs a binarization operation on the sampled pixels.
The photographed image is a two-dimensional image, and the image processor samples a portion of pixels included in the photographed image at a predetermined sampling interval in the X-axis direction and a predetermined sampling interval in the Y-axis direction,
The binarization operation represents the arbitrary pixel as 1 when the intensity value of any pixel is greater than the first threshold value and less than or equal to the second threshold value, and the contrast value is less than or equal to the first threshold value or the second value. Is greater than a threshold, the operation represents the arbitrary pixel as zero,
The first threshold value and the second threshold value are defined by a value obtained by multiplying the time required to perform the binarization operation on one pixel by the number of pixels included in the captured image.
If the result of performing the binarization operation on the pixel of the arbitrary coordinates (a, b) sampled is 1, the image processing unit coordinates (a-(sampling interval in the X-axis direction) in the captured image). / 2, b-(sampling interval in the Y-axis direction) / 2), coordinates (a + (sampling interval in the X-axis direction) / 2, b-(sampling interval in the Y-axis direction) / 2 ), Coordinates (a-(sampling interval in the X-axis direction) / 2, b + (sampling interval in the Y-axis direction) / 2) and coordinates (a + (sampling interval in the X-axis direction) / And 2) b + (sampling interval in the Y-axis direction) / 2) for the binarization operation for all pixels existing in the rectangular region with each vertex. delete delete delete The method of claim 1,
And the photographed image is a black and white image or a color image.

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