JPS5750654A - Defect detector - Google Patents

Defect detector

Info

Publication number
JPS5750654A
JPS5750654A JP55126329A JP12632980A JPS5750654A JP S5750654 A JPS5750654 A JP S5750654A JP 55126329 A JP55126329 A JP 55126329A JP 12632980 A JP12632980 A JP 12632980A JP S5750654 A JPS5750654 A JP S5750654A
Authority
JP
Japan
Prior art keywords
circuit
transducer
wide range
waves
frequency characteristics
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55126329A
Other languages
Japanese (ja)
Inventor
Mitsuaki Koyakata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55126329A priority Critical patent/JPS5750654A/en
Publication of JPS5750654A publication Critical patent/JPS5750654A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques

Abstract

PURPOSE:To make the detection of AE waves possible in frequency bands of a wide range by correcting the frequency characteristics of a transducer flat, and applying the same to a signal processing circuit. CONSTITUTION:A transducer 1 is mounted in a prescribed position of a structural material (a) and detects the AE waves from a defect A. Filter circuits 2 cover AE wave frequency bands of a wide range. The outputs of the respective filters are supplied to a waveform synthesizing circuit 4 via each amplifier 3. The amplifiers 3 have amplification factors differing with each filter circuit, and the frequency characteristics synthesized by the circuit 4 are roughly flat over a wide range, thus the specific frequency characteristics possessed by the transducer 1 are corrected flat. The output signal of the circuit 4 is applied to a processing circuit 5, so that the formation and growth of the defect A are observed based on the intensity and generation position of the AE waves.
JP55126329A 1980-09-11 1980-09-11 Defect detector Pending JPS5750654A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55126329A JPS5750654A (en) 1980-09-11 1980-09-11 Defect detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55126329A JPS5750654A (en) 1980-09-11 1980-09-11 Defect detector

Publications (1)

Publication Number Publication Date
JPS5750654A true JPS5750654A (en) 1982-03-25

Family

ID=14932484

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55126329A Pending JPS5750654A (en) 1980-09-11 1980-09-11 Defect detector

Country Status (1)

Country Link
JP (1) JPS5750654A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017063956A (en) * 2015-09-29 2017-04-06 キヤノン株式会社 Subject information acquisition apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017063956A (en) * 2015-09-29 2017-04-06 キヤノン株式会社 Subject information acquisition apparatus

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