JPH11222664A - Metal mask, formation of resistor by using this metal mask and production of resistor using this metal mask - Google Patents

Metal mask, formation of resistor by using this metal mask and production of resistor using this metal mask

Info

Publication number
JPH11222664A
JPH11222664A JP10022889A JP2288998A JPH11222664A JP H11222664 A JPH11222664 A JP H11222664A JP 10022889 A JP10022889 A JP 10022889A JP 2288998 A JP2288998 A JP 2288998A JP H11222664 A JPH11222664 A JP H11222664A
Authority
JP
Japan
Prior art keywords
metal mask
resistor
forming
pair
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10022889A
Other languages
Japanese (ja)
Inventor
Kenji Senda
謙治 仙田
Hiroyuki Yamada
博之 山田
Mitsunari Nakatani
光成 中谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP10022889A priority Critical patent/JPH11222664A/en
Publication of JPH11222664A publication Critical patent/JPH11222664A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Non-Adjustable Resistors (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent the incident limitation of sputter particles in the corner parts of aperture flanks and to form a thin-film resistor which is thick in the film thickness at ends and has excellent electrical characteristics by forming a taper increased in a hole diameter toward a sputter vapor deposition source in the aperture of the metal mask. SOLUTION: A pair of electrodes 64, 64 are formed on a heat resistant and insulative substrate 61 mainly composed of Al2 O3 and a pair of the opposite flanks of the metal masks 62 made of iron, etc., having the square aperture 63 are placed thereon. The metal masks are in close contact with the electrodes so as to be overlapped and one aligned. The sputter particles from the sputter vapor deposition source are supplied to the aperture 63 of the metal mask 62 to deposit the thin-film resistor of Ni-Cr, etc., across the electrodes 64, 64 on the substrate 61. At this time, the other pair of the opposite flanks of the metal mask 62 are provided with the taper 65 increases in the hole diameter toward the sputter vapor deposition source of the aperture 63. The angle of inclination of the taper 65 is preferably set at about 15 to 80 deg., more particularly about 30 to 65 deg. with the surface of the metal mask 62.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、メタルマスク、こ
のメタルマスクを用いた抵抗体の形成方法およびこのメ
タルマスクを用いた抵抗器の製造方法に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a metal mask, a method for forming a resistor using the metal mask, and a method for manufacturing a resistor using the metal mask.

【0002】[0002]

【従来の技術】近年、電子機器の小型化に伴い、回路基
板に使用される電子部品に対しても実装密度を上げるた
め、ますます小形化への要求が高まっている。抵抗器に
対しても、電子回路の無調整化のため、小形かつ抵抗値
許容差の高精度な抵抗器への要求が高まってきている。
2. Description of the Related Art In recent years, with the miniaturization of electronic devices, there has been an increasing demand for miniaturization in order to increase the mounting density of electronic components used for circuit boards. For resistors, there is an increasing demand for resistors that are small and have a high tolerance in resistance value in order to eliminate the need for adjustment of electronic circuits.

【0003】以下、従来のメタルマスク、従来のメタル
マスクを用いた抵抗体の形成方法、および従来のメタル
マスクを用いた抵抗器の製造方法について、図面を参照
しながら説明する。
Hereinafter, a conventional metal mask, a method of forming a resistor using the conventional metal mask, and a method of manufacturing a resistor using the conventional metal mask will be described with reference to the drawings.

【0004】図7は、従来のメタルマスクの断面図であ
る。1は金属または磁性体でできたメタルマスク、2は
開孔部である。ここで、メタルマスクは、金属または磁
性体の板をフォトリソ法を用いて開孔部2を作製する。
この時、開孔部2側面のマスク表面に対する角度はほぼ
直角である。
FIG. 7 is a sectional view of a conventional metal mask. 1 is a metal mask made of a metal or a magnetic material, and 2 is an opening. Here, in the metal mask, the opening 2 is formed on a metal or magnetic plate by using a photolithography method.
At this time, the angle of the side surface of the opening 2 with respect to the mask surface is substantially a right angle.

【0005】以下に、従来のメタルマスクを用いた抵抗
体の形成方法について、以下に図面を用いて説明する。
Hereinafter, a conventional method of forming a resistor using a metal mask will be described with reference to the drawings.

【0006】図8(a)は従来のメタルマスクを用いた
抵抗体形成時のメタルマスクの置載を示す平面図であ
る。(b)は同X−X断面図、(c)は同Y−Y断面図
である。図9はスパッタ工法による抵抗体形成時の図8
(a)におけるY−Y断面図であり、図中の矢印はスパ
ッタ粒子の入射方向を示す。
FIG. 8A is a plan view showing mounting of a metal mask when forming a resistor using a conventional metal mask. (B) is an XX sectional view of the same, and (c) is a YY sectional view of the same. FIG. 9 is a view showing FIG. 8 when a resistor is formed by a sputtering method.
It is a YY sectional view in (a), and the arrow in a figure shows the incidence direction of sputtered particles.

【0007】メタルマスク12の方形の開孔部13が、
基板11に作製した一対の電極14に対して重畳するよ
うに密着して位置合わせをする。この時、メタルマスク
の開孔部13の側面はメタルマスク表面に対してほぼ直
角である。この状態で、抵抗体としてNi−Cr等のス
パッタ蒸着源を用い、スパッタ工法によりマスク開孔部
13の基板11上に薄膜抵抗体15を形成する。
The rectangular opening 13 of the metal mask 12
Positioning is performed in close contact with a pair of electrodes 14 formed on the substrate 11 so as to overlap. At this time, the side surface of the opening 13 of the metal mask is substantially perpendicular to the surface of the metal mask. In this state, a thin film resistor 15 is formed on the substrate 11 of the mask opening 13 by a sputtering method using a sputter deposition source such as Ni-Cr as a resistor.

【0008】以下に、従来のメタルマスクを用いた抵抗
器の製造方法を、図面を参照しながら説明する。
Hereinafter, a method of manufacturing a resistor using a conventional metal mask will be described with reference to the drawings.

【0009】図10は従来のメタルマスクを用いた抵抗
器の製造方法を示す工程図である。まず、図10(a)
に示すように、96%アルミナを含有してなる基板31
の上面および下面の側部に、金属有機物等からなる電極
ペーストをスクリーン印刷・乾燥する。その後、焼成炉
で加熱することにより、電極ペーストの有機成分だけを
飛ばし、金属成分だけを基板31上に焼き付け、上面電
極層32および下面電極層(図示せず)を形成する。
FIG. 10 is a process chart showing a conventional method for manufacturing a resistor using a metal mask. First, FIG.
As shown in the figure, a substrate 31 containing 96% alumina
An electrode paste made of a metal organic substance or the like is screen-printed and dried on the upper and lower sides of the substrate. Thereafter, by heating in a firing furnace, only the organic components of the electrode paste are skipped, and only the metal components are baked on the substrate 31 to form the upper electrode layer 32 and the lower electrode layer (not shown).

【0010】次に、図10(b)に示すように、上面電
極層32を形成した基板31の上面に図8にある、従来
のメタルマスクを密着させ、スパッタ装置に入れ、抵抗
体層33をスパッタ工法によりパターン形成する。この
時、メタルマスクの開孔部の側面はほぼ直角である。
Next, as shown in FIG. 10B, the conventional metal mask shown in FIG. 8 is brought into close contact with the upper surface of the substrate 31 on which the upper electrode layer 32 has been formed, and put into a sputtering apparatus to form a resistor layer 33. Is formed by sputtering. At this time, the side surface of the opening of the metal mask is substantially perpendicular.

【0011】次に、抵抗体層33を安定な抵抗体にする
ために、熱処理を行う。次に、図10(c)に示すよう
に、抵抗体層33の抵抗値を所定の値に修正するために
レーザートリミング等により、トリミング溝34を施し
て抵抗値修正を行う。
Next, heat treatment is performed to make the resistor layer 33 a stable resistor. Next, as shown in FIG. 10C, a trimming groove 34 is formed by laser trimming or the like to correct the resistance value of the resistor layer 33 to a predetermined value, and the resistance value is corrected.

【0012】次に、図10(d)に示すように、トリミ
ング溝34を施して抵抗値修正した抵抗体層33(本図
では図示せず)を保護するために、樹脂ペーストを抵抗
体層33を覆うようにスクリーン印刷し、熱硬化して保
護層35を形成する。
Next, as shown in FIG. 10D, a resin paste is applied to the resistor layer 33 (not shown in FIG. 1) to protect the resistor layer 33 (not shown in the drawing) whose resistance has been corrected by forming a trimming groove 34. Screen printing is performed so as to cover 33, and heat curing is performed to form a protective layer 35.

【0013】次に、図10(e)に示すように、基板3
1の側面に上面電極層32および/または抵抗体層33
と下面電極層(図示せず)とを接続するように、スパッ
タ工法によりNi−Cr等の薄膜からなる側面電極層3
6を形成する。
Next, as shown in FIG.
The upper electrode layer 32 and / or the resistor layer 33 on one side surface
Side electrode layer 3 made of a thin film of Ni-Cr or the like by a sputtering method so as to connect the lower electrode layer (not shown) to the lower electrode layer.
6 is formed.

【0014】最後に、必要に応じて、露出している上面
電極層32と下面電極層(図示せず)と側面電極層36
に、電気めっきによって、Niめっき層(図示せず)、
はんだめっき層(図示せず)を形成して、抵抗器を製造
していた。
Finally, if necessary, the exposed upper electrode layer 32, lower electrode layer (not shown), and side electrode layer 36 are exposed.
A Ni plating layer (not shown) by electroplating;
A resistor was manufactured by forming a solder plating layer (not shown).

【0015】[0015]

【発明が解決しようとする課題】しかしながら、上記従
来のメタルマスクを用いて、スパッタ工法により抵抗体
の薄膜抵抗体の形成する場合は、図9に示すように、ス
パッタ粒子の入射方向は様々(図中の矢印で示す)であ
り、メタルマスク12の開孔部13端部へのスパッタ粒
子の入射が、メタルマスク12の側面によって制限さ
れ、基板上の薄膜抵抗体15の端部の膜厚が薄くなる。
このため、レーザートリミング等により、抵抗体の一部
を除去して抵抗値の修正を行った場合、抵抗体の端部付
近に負荷が集中し、抵抗体のパルス特性などの電気的特
性が劣化するという課題があった。
However, when a thin-film resistor is formed by a sputtering method using the above-described conventional metal mask, the incident direction of the sputtered particles varies as shown in FIG. (Indicated by an arrow in the drawing), the incidence of sputtered particles on the end of the opening 13 of the metal mask 12 is limited by the side surface of the metal mask 12, and the thickness of the end of the thin film resistor 15 on the substrate Becomes thinner.
Therefore, if the resistance is corrected by removing part of the resistor by laser trimming, etc., the load will concentrate near the end of the resistor, and the electrical characteristics such as the pulse characteristics of the resistor will deteriorate. There was a problem to do.

【0016】本発明は、上記課題を解決するものであ
り、電気的特性に優れた薄膜抵抗体を形成するためのメ
タルマスクを提供するものである。
The present invention has been made to solve the above problems, and has as its object to provide a metal mask for forming a thin film resistor having excellent electric characteristics.

【0017】[0017]

【課題を解決するための手段】上記目的を達成するため
に、本発明のメタルマスクは、スパッタ蒸着源の方向に
したがって孔径を大きくしたテーパを設けたものであ
る。
In order to achieve the above object, a metal mask according to the present invention is provided with a taper whose hole diameter increases in the direction of a sputter deposition source.

【0018】[0018]

【発明の実施の形態】本発明の請求項1に記載の発明
は、開孔部にスパッタ蒸着源の方向にしたがって孔径を
大きくしたテーパを有することを特徴としたメタルマス
クである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The invention according to claim 1 of the present invention is a metal mask characterized in that the opening has a taper whose hole diameter increases in the direction of the sputter deposition source.

【0019】また、請求項2に記載の発明は、請求項1
記載の開孔部は、一対の辺のみ孔径を大きくしたテーパ
を有する抵抗体形成用メタルマスクである。
The invention described in claim 2 is the first invention.
The described opening is a resistor-forming metal mask having a taper in which the hole diameter is increased only on a pair of sides.

【0020】また、請求項3に記載の発明は、開孔部に
スパッタ蒸着源の方向にしたがって孔径を大きくしたテ
ーパを有するメタルマスクを用いて、スパッタ工法によ
り薄膜抵抗体を形成する抵抗体の形成方法である。
According to a third aspect of the present invention, there is provided a resistor for forming a thin film resistor by a sputtering method using a metal mask having a tapered hole having a hole diameter increased in the direction of a sputter deposition source in an opening. It is a forming method.

【0021】また、請求項4に記載の発明は、開孔部
は、一対の辺のみ孔径を大きくしたテーパを有するメタ
ルマスクを用い、薄膜抵抗体を形成する抵抗体の形成方
法である。
Further, the invention according to claim 4 is a method for forming a thin film resistor, wherein the opening portion uses a tapered metal mask in which only a pair of sides has a larger hole diameter.

【0022】また、請求項5に記載の発明は、請求項4
記載の電極を形成した基板に、メタルマスクを用い、一
対の前記電極に対して孔径を大きくした辺と隣り合う辺
を前記電極と接続するように電極を形成した位置合わせ
をして、薄膜抵抗体を形成するものである。
The invention described in claim 5 is the same as the invention in claim 4.
Using a metal mask on the substrate on which the electrodes described above are formed, aligning the electrodes so that the sides adjacent to the side having a larger hole diameter with respect to the pair of electrodes are connected to the electrodes, and the thin film resistance is adjusted. It forms the body.

【0023】また、請求項6に記載の発明は、請求項5
記載の電極は、Au系、Cu系、Ni系、Ag系の薄膜
または厚膜からなる抵抗体の形成方法である。
The invention described in claim 6 is the same as the invention in claim 5
The electrode described is a method for forming a resistor made of a thin film or a thick film of Au, Cu, Ni, or Ag.

【0024】また、請求項7に記載の発明は、電極を形
成した基板に、開孔部にスパッタ蒸着源の方向にしたが
って孔径を大きくしたテーパを有するメタルマスクを用
い、一対の前記電極に対して孔径を大きくした辺と隣り
合う辺を前記電極と接続するように前記電極を形成した
位置合わせをして、薄膜抵抗を形成する工程を含むもの
である。
According to a seventh aspect of the present invention, a metal mask having a tapered hole whose diameter is increased in the direction of the sputter deposition source is formed on the substrate on which the electrode is formed. And forming a thin-film resistor by positioning the electrode so that the side adjacent to the side having the larger hole diameter is connected to the electrode.

【0025】(実施の形態1)以下、本発明の実施の形
態1による、メタルマスク、このメタルマスクを用いた
抵抗体の形成方法およびこのメタルマスクを用いた抵抗
器の製造方法について、図面を参照しながら説明する。
(Embodiment 1) A metal mask, a method for forming a resistor using the metal mask, and a method for manufacturing a resistor using the metal mask according to Embodiment 1 of the present invention will be described below. It will be described with reference to FIG.

【0026】図1は本発明の実施の形態1におけるメタ
ルマスクの断面図である。図において、51は金属また
は磁性体、好ましくは鉄製のメタルマスク、52は開孔
部、53はマスク表面に対し15〜80度、好ましくは
30〜65度の角度をつけた同開孔部の側面のテーパで
ある。
FIG. 1 is a sectional view of a metal mask according to the first embodiment of the present invention. In the drawing, 51 is a metal mask made of a metal or a magnetic material, preferably iron, 52 is an opening, 53 is an opening formed at an angle of 15 to 80 degrees, preferably 30 to 65 degrees with respect to the mask surface. The side surface is tapered.

【0027】以下に、本発明の実施の形態1におけるメ
タルマスクを用いた抵抗体の形成方法について、図面を
参照しながら説明する。
A method for forming a resistor using a metal mask according to the first embodiment of the present invention will be described below with reference to the drawings.

【0028】図2(a)は本発明実施の形態1における
メタルマスクを用いた抵抗体形成時のメタルマスクの置
載を示す平面図、図2(b)は同X−X断面図、図2
(c)は同Y−Y断面図である。図3は図2(a)にお
けるY−Y断面図である。
FIG. 2A is a plan view showing the mounting of a metal mask when a resistor is formed using the metal mask according to the first embodiment of the present invention, and FIG. 2
(C) is a sectional view taken along the line YY. FIG. 3 is a sectional view taken along line YY in FIG.

【0029】まず、メタルマスク62の方形の開孔部6
3が、基板61上に形成した一対の電極64に対して重
畳するように密着して位置合わせをする。この時、メタ
ルマスク62の方形の開孔部の向かい合う一対の側面
は、図1に示すように、メタルマスクの表面に対し15
度〜80度、好ましくは30〜65度の角度をつけたテ
ーパ65を有する。位置合わせは、この辺と隣り合う辺
を一対の電極64に接続するように行う。
First, the rectangular opening 6 of the metal mask 62 is formed.
3 is brought into close contact with a pair of electrodes 64 formed on the substrate 61 and aligned. At this time, a pair of side surfaces facing the rectangular opening of the metal mask 62 are, as shown in FIG.
It has a taper 65 angled from 80 to 80 degrees, preferably from 30 to 65 degrees. Positioning is performed so that a side adjacent to this side is connected to the pair of electrodes 64.

【0030】この後、基板61およびメタルマスク62
をスパッタ装置に入れ、Ni−Cr等の抵抗体材料を、
スパッタ工法によりマスク開孔部63の基板61上に抵
抗体66を形成する。この時、図3に示すように、メタ
ルマスクの開孔部の一対の側面に設けられたテーパ65
により、開孔部側面のスパッタ粒子の入射が制限されに
くくなり、抵抗体端部の膜厚は従来のメタルマスクを用
いて抵抗体を形成した場合に比べ厚くなり、抵抗体の電
気的特性が向上する。
Thereafter, the substrate 61 and the metal mask 62
Into a sputtering device, and a resistor material such as Ni-Cr
A resistor 66 is formed on the substrate 61 in the mask opening 63 by a sputtering method. At this time, as shown in FIG. 3, a taper 65 provided on a pair of side surfaces of the opening portion of the metal mask is provided.
As a result, the incidence of sputtered particles on the side surface of the opening becomes less likely to be restricted, and the film thickness at the end of the resistor becomes thicker than when a resistor is formed using a conventional metal mask, and the electrical characteristics of the resistor are reduced. improves.

【0031】以下に、本発明実施の形態1におけるメタ
ルマスクを用いた抵抗器の製造方法について、図面を参
照しながら説明する。
A method for manufacturing a resistor using a metal mask according to the first embodiment of the present invention will be described below with reference to the drawings.

【0032】図4は本発明の実施の形態1における抵抗
器の製造方法を示す工程図である。まず、図4(a)に
示すように、耐熱性および絶縁性に優れた96%アルミ
ナを含有してなる基板81の上面および下面の側部に、
Auを主成分とする金属有機物等からなる電極ペースト
をスクリーン印刷・乾燥する。次に、有機成分だけを飛
ばし、金属成分だけを基板81上に焼き付けるために、
ベルト式連続焼成炉によって約850℃の温度で、45
分のプロファイルによって焼成し、上面電極層82およ
び下面電極層(図示せず)を形成する。
FIG. 4 is a process chart showing a method of manufacturing the resistor according to the first embodiment of the present invention. First, as shown in FIG. 4A, on the upper and lower sides of a substrate 81 containing 96% alumina having excellent heat resistance and insulation properties,
An electrode paste made of a metal organic material or the like containing Au as a main component is screen-printed and dried. Next, in order to skip only the organic component and burn only the metal component on the substrate 81,
At a temperature of about 850 ° C., 45
Baking is performed according to a minute profile to form an upper electrode layer 82 and a lower electrode layer (not shown).

【0033】次に、図4(b)に示すように、上面電極
層82を形成した基板81の上面に図1に示す、本発明
のメタルマスクを密着させ、Ni−Cr等の抵抗体層8
3をスパッタ工法により形成する。この時、本発明のメ
タルマスクでは、開孔部の側面にテーパがあるため、ス
パッタ粒子の入射が遮断されることはなく、抵抗体層8
3の端部の膜厚は従来のメタルマスクを用いた抵抗体形
成時より厚くなり、抵抗体の電気的特性が向上する。
Next, as shown in FIG. 4B, the metal mask of the present invention shown in FIG. 1 is adhered to the upper surface of the substrate 81 on which the upper electrode layer 82 is formed, and a resistor layer such as Ni--Cr is formed. 8
3 is formed by a sputtering method. At this time, in the metal mask of the present invention, since the side surface of the opening has a taper, the incidence of sputtered particles is not interrupted, and the resistance layer 8
The thickness of the end portion 3 becomes thicker than when a resistor is formed using a conventional metal mask, and the electrical characteristics of the resistor are improved.

【0034】次に、抵抗体層83を安定な抵抗体にする
ために、約300〜400℃の雰囲気中で熱処理を行
う。
Next, in order to make the resistor layer 83 a stable resistor, a heat treatment is performed in an atmosphere of about 300 to 400 ° C.

【0035】次に、図4(c)に示すように、抵抗体層
83の抵抗値を所定の値に修正するためにレーザートリ
ミング等により、トリミング溝84を施して抵抗値修正
を行う。
Next, as shown in FIG. 4C, in order to correct the resistance value of the resistor layer 83 to a predetermined value, a trimming groove 84 is formed by laser trimming or the like to correct the resistance value.

【0036】次に、図4(d)に示すように、トリミン
グ溝84を施して抵抗値修正した抵抗体層83(本図で
は図示せず)を保護するために、エポキシ系の樹脂ペー
ストをスクリーン印刷し、約200℃、30分の条件で
熱硬化して保護層85を形成する。
Next, as shown in FIG. 4D, an epoxy-based resin paste is applied to protect the resistor layer 83 (not shown in FIG. 4) whose resistance has been corrected by forming a trimming groove 84. Screen printing is performed, and thermosetting is performed at about 200 ° C. for 30 minutes to form a protective layer 85.

【0037】次に、図4(e)に示すように、基板81
の側面に上面電極層82および/または抵抗体層83と
下面電極層(図示せず)とを接続するように、スパッタ
工法によりNi−Cr等の薄膜からなる側面電極層86
を形成する。
Next, as shown in FIG.
Side electrode layer 86 made of a thin film of Ni-Cr or the like by a sputtering method so that upper electrode layer 82 and / or resistor layer 83 and the lower electrode layer (not shown) are connected to the side surfaces of
To form

【0038】最後に、必要に応じて露出している上面電
極層82と下面電極層(図示せず)と側面電極層86の
はんだ付け時の電極食われの防止およびはんだ付け時の
信頼性の確保のため、電気めっきによって、Niめっき
層(図示せず)、はんだめっき層(図示せず)を形成し
て、抵抗器を製造するものである。
Finally, prevention of electrode erosion during soldering of the exposed upper electrode layer 82, lower electrode layer (not shown), and side electrode layer 86, as required, and reliability during soldering. For the purpose of securing, a Ni plating layer (not shown) and a solder plating layer (not shown) are formed by electroplating to manufacture a resistor.

【0039】以上のように構成、製造された本発明の実
施の形態1における抵抗器は、抵抗体層の端部の膜厚
が、従来のメタルマスクを用いて形成されたものに比べ
厚くなる。これによって、電気的特性の優れた薄膜抵抗
器の製造が可能となる。
In the resistor according to the first embodiment of the present invention constructed and manufactured as described above, the thickness of the end portion of the resistor layer is larger than that formed using a conventional metal mask. . Thus, it becomes possible to manufacture a thin film resistor having excellent electric characteristics.

【0040】以下、従来のメタルマスクを用いて製造し
た抵抗器と、本発明の実施の形態1のメタルマスクを用
いて製造した抵抗器について、以下に示す実験方法にて
比較した。
Hereinafter, a resistor manufactured using the conventional metal mask and a resistor manufactured using the metal mask of the first embodiment of the present invention were compared by the following experimental method.

【0041】実験方法としては、パルス特性を評価する
ため、定格電圧の3倍の負荷を1秒間印加、25秒間無
印加のサイクルを10000回繰り返した後の抵抗値変
化率を測定した結果を図11に示す。
As an experimental method, in order to evaluate the pulse characteristics, the resistance value change rate after repeating a cycle of applying a load three times the rated voltage for 1 second and applying no load for 25 seconds 10,000 times is shown in FIG. 11 is shown.

【0042】図11から明らかなように、本発明の実施
の形態1における抵抗器は、従来の抵抗器に比べ、抵抗
値変化率は小さくなり、電気的特性の向上が図れた。
As is apparent from FIG. 11, the resistance in the resistor according to the first embodiment of the present invention is smaller than that of the conventional resistor, and the electrical characteristics are improved.

【0043】(実施の形態2)以下、本発明の実施の形
態2による、メタルマスク、このメタルマスクを用いた
抵抗体の形成方法およびこのメタルマスクを用いた抵抗
器の製造方法について、図面を参照しながら説明する。
(Embodiment 2) A metal mask, a method of forming a resistor using the metal mask, and a method of manufacturing a resistor using the metal mask according to a second embodiment of the present invention will be described below. It will be described with reference to FIG.

【0044】抵抗体の形成に、図5に示す断面を持つ、
開孔部92側面に階段型のテーパ93を設けたメタルマ
スクを用いる。この時、開孔部92側面のメタルマスク
91上面の端と下面の端に囲まれた平面と、メタルマス
ク表面との角度94は、15度〜80度、好ましくは3
0〜65度である。
For the formation of the resistor, the section shown in FIG.
A metal mask having a stepped taper 93 on the side surface of the opening 92 is used. At this time, the angle 94 between the plane surrounded by the upper end and the lower end of the metal mask 91 on the side surface of the opening 92 and the metal mask surface is 15 degrees to 80 degrees, preferably 3 degrees.
0 to 65 degrees.

【0045】このメタルマスクを用いた、抵抗体の形成
方法および抵抗器の製造方法は実施の形態1と同じであ
り、効果についても同様であるため、説明を省略する。
The method of forming the resistor and the method of manufacturing the resistor using this metal mask are the same as those of the first embodiment, and the effects are the same.

【0046】(実施の形態3)以下、本発明の実施の形
態3による、メタルマスク、このメタルマスクを用いた
抵抗体の形成方法およびこのメタルマスクを用いた抵抗
器の製造方法について、図面を参照しながら説明する。
(Embodiment 3) A metal mask, a method of forming a resistor using the metal mask, and a method of manufacturing a resistor using the metal mask according to a third embodiment of the present invention will be described below. It will be described with reference to FIG.

【0047】抵抗体の形成に、図6に示す断面を持つ、
開孔部102側面に曲率を持つ面のテーパ103を設け
たメタルマスクを用いる。この時、開孔部102側面の
メタルマスク101上面の端と下面の端に囲まれた平面
と、メタルマスク表面との角度104は、15度〜80
度、好ましくは30〜65度である。
For the formation of the resistor, the section shown in FIG.
A metal mask having a tapered surface 103 having a curvature on the side surface of the opening 102 is used. At this time, the angle 104 between the plane surrounded by the upper and lower edges of the metal mask 101 on the side surface of the opening 102 and the metal mask surface is 15 degrees to 80 degrees.
Degrees, preferably 30 to 65 degrees.

【0048】このメタルマスクを用いた、抵抗体の形成
方法および抵抗器の製造方法は実施の形態1と同じであ
り、また効果についても同様であるため、説明を省略す
る。
The method for forming the resistor and the method for manufacturing the resistor using this metal mask are the same as those in the first embodiment, and the effects are the same.

【0049】[0049]

【発明の効果】以上のように、本発明によるメタルマス
クを用いて、スパッタ工法により薄膜抵抗体を形成すれ
ば、開孔部の一対の側面に設けられたテーパにより、開
孔部側面のスパッタ粒子の入射が制限されにくくなり、
抵抗体端部の膜厚は、従来のメタルマスクを用いて抵抗
体を形成した場合に比べ厚くなり、抵抗体の電気的特性
が向上する。
As described above, if a thin film resistor is formed by the sputtering method using the metal mask according to the present invention, the sputter on the side surface of the opening is formed by the taper provided on the pair of side surfaces of the opening. Particle incidence is less likely to be restricted,
The thickness of the end portion of the resistor becomes thicker than when the resistor is formed using a conventional metal mask, and the electrical characteristics of the resistor are improved.

【0050】したがって、本発明によるメタルマスクを
用いて、スパッタ工法により薄膜抵抗体を形成すれば、
電気的特性に優れた抵抗器を提供できる。
Therefore, if a thin film resistor is formed by a sputtering method using the metal mask according to the present invention,
A resistor excellent in electric characteristics can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態1におけるメタルマスクの
断面図
FIG. 1 is a cross-sectional view of a metal mask according to a first embodiment of the present invention.

【図2】同要部であるメタルマスクを用いて抵抗体の形
成を説明する模式図
FIG. 2 is a schematic view for explaining formation of a resistor using a metal mask which is a main part of the same.

【図3】同要部であるメタルマスクを用いた抵抗体形成
時の状態を示す断面図
FIG. 3 is a cross-sectional view showing a state when a resistor is formed using a metal mask, which is a main part of the same.

【図4】同要部であるメタルマスクを用いた抵抗器の製
造方法の工程図
FIG. 4 is a process chart of a method for manufacturing a resistor using a metal mask, which is a main part of the method.

【図5】本発明の実施の形態2におけるメタルマスクの
断面図
FIG. 5 is a sectional view of a metal mask according to a second embodiment of the present invention.

【図6】本発明の実施の形態3におけるメタルマスクの
断面図
FIG. 6 is a sectional view of a metal mask according to a third embodiment of the present invention.

【図7】従来のメタルマスクの断面図FIG. 7 is a sectional view of a conventional metal mask.

【図8】同要部であるメタルマスクを用いて抵抗体の形
成を説明する模式図
FIG. 8 is a schematic diagram for explaining formation of a resistor using a metal mask as a main part of the same.

【図9】同要部であるメタルマスクを用いた抵抗体形成
時の状態を示す断面図
FIG. 9 is a cross-sectional view showing a state when a resistor is formed using a metal mask, which is a main part of the same.

【図10】同要部であるメタルマスクを用いた抵抗器の
製造方法の工程図
FIG. 10 is a process chart of a method for manufacturing a resistor using a metal mask, which is an essential part of the method.

【図11】従来の抵抗器と本発明の実施の形態1による
抵抗器との特性比較した図
FIG. 11 is a diagram comparing characteristics between a conventional resistor and the resistor according to the first embodiment of the present invention.

【符号の説明】[Explanation of symbols]

51 メタルマスク 52 開孔部 53 テーパ 51 metal mask 52 opening 53 taper

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 開孔部にスパッタ蒸着源の方向にしたが
って孔径を大きくしたテーパを有するメタルマスク。
1. A metal mask having a tapered opening having a hole diameter increased in the direction of a sputter deposition source.
【請求項2】 開孔部は、一対の辺のみ孔径を大きくし
たテーパを有する請求項1記載のメタルマスク。
2. The metal mask according to claim 1, wherein the opening has a taper in which only a pair of sides has a larger diameter.
【請求項3】 基板に、開孔部にスパッタ蒸着源の方向
にしたがって孔径を大きくしたテーパを有するメタルマ
スクを用いて、スパッタ工法により薄膜抵抗体を形成す
る抵抗体の形成方法。
3. A method of forming a thin-film resistor by a sputtering method using a metal mask having a tapered hole whose diameter increases in the direction of a sputter deposition source on a substrate.
【請求項4】 基板に開孔部は、一対の辺のみ孔径を大
きくしたテーパを有するメタルマスクを用い、薄膜抵抗
体を形成する請求項3記載の抵抗体の形成方法。
4. The method for forming a resistor according to claim 3, wherein the opening portion of the substrate is formed by using a metal mask having a tapered hole having only one pair of sides and having a larger diameter.
【請求項5】 電極を形成した基板に、メタルマスクを
用い、一対の前記電極に対して孔径を大きくした辺と隣
り合う辺を前記電極と接続するように前記電極を形成し
た位置合わせをして、薄膜抵抗体を形成する請求項4記
載の抵抗体の形成方法。
5. A substrate on which an electrode is formed is positioned using a metal mask such that the electrode is formed such that a side adjacent to a side having a larger hole diameter with respect to the pair of electrodes is connected to the electrode. 5. The method for forming a resistor according to claim 4, wherein the thin film resistor is formed.
【請求項6】 電極は、Au系、Cu系、Ni系、Ag
系の薄膜または厚膜からなる請求項5記載の抵抗体の形
成方法。
6. The electrode is made of Au-based, Cu-based, Ni-based, Ag
6. The method for forming a resistor according to claim 5, comprising a thin film or a thick film.
【請求項7】 電極を形成した基板に、開孔部にスパッ
タ蒸着源の方向にしたがって孔径を大きくしたテーパを
有するメタルマスクを用い、一対の前記電極に対して孔
径を大きくした辺と隣り合う辺を前記電極と接続するよ
うに前記電極を形成した位置合わせをして、薄膜抵抗を
形成する工程を含む抵抗器の製造方法。
7. A substrate on which electrodes are formed, a metal mask having a tapered hole whose diameter is increased in the direction of the sputter deposition source in an opening portion, and adjacent to a side having a larger hole diameter for a pair of the electrodes. A method for manufacturing a resistor, comprising the steps of forming a thin-film resistor by aligning the electrode so that a side is connected to the electrode.
JP10022889A 1998-02-04 1998-02-04 Metal mask, formation of resistor by using this metal mask and production of resistor using this metal mask Pending JPH11222664A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10022889A JPH11222664A (en) 1998-02-04 1998-02-04 Metal mask, formation of resistor by using this metal mask and production of resistor using this metal mask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10022889A JPH11222664A (en) 1998-02-04 1998-02-04 Metal mask, formation of resistor by using this metal mask and production of resistor using this metal mask

Publications (1)

Publication Number Publication Date
JPH11222664A true JPH11222664A (en) 1999-08-17

Family

ID=12095246

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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