JP5608556B2 - 前方結像型光干渉断層(oct)システムおよびプローブ - Google Patents
前方結像型光干渉断層(oct)システムおよびプローブ Download PDFInfo
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- JP5608556B2 JP5608556B2 JP2010520345A JP2010520345A JP5608556B2 JP 5608556 B2 JP5608556 B2 JP 5608556B2 JP 2010520345 A JP2010520345 A JP 2010520345A JP 2010520345 A JP2010520345 A JP 2010520345A JP 5608556 B2 JP5608556 B2 JP 5608556B2
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- lens
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- oct
- oct system
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B3/00—Simple or compound lenses
- G02B3/12—Fluid-filled or evacuated lenses
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0062—Arrangements for scanning
- A61B5/0066—Optical coherence imaging
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/68—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient
- A61B5/6846—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient specially adapted to be brought in contact with an internal body part, i.e. invasive
- A61B5/6847—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient specially adapted to be brought in contact with an internal body part, i.e. invasive mounted on an invasive device
- A61B5/6852—Catheters
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
- G02B26/105—Scanning systems with one or more pivoting mirrors or galvano-mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B3/00—Simple or compound lenses
- G02B3/12—Fluid-filled or evacuated lenses
- G02B3/14—Fluid-filled or evacuated lenses of variable focal length
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B2562/00—Details of sensors; Constructional details of sensor housings or probes; Accessories for sensors
- A61B2562/02—Details of sensors specially adapted for in-vivo measurements
- A61B2562/0233—Special features of optical sensors or probes classified in A61B5/00
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B2562/00—Details of sensors; Constructional details of sensor housings or probes; Accessories for sensors
- A61B2562/02—Details of sensors specially adapted for in-vivo measurements
- A61B2562/028—Microscale sensors, e.g. electromechanical sensors [MEMS]
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B2562/00—Details of sensors; Constructional details of sensor housings or probes; Accessories for sensors
- A61B2562/02—Details of sensors specially adapted for in-vivo measurements
- A61B2562/0285—Nanoscale sensors
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B2562/00—Details of sensors; Constructional details of sensor housings or probes; Accessories for sensors
- A61B2562/12—Manufacturing methods specially adapted for producing sensors for in-vivo measurements
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0082—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence adapted for particular medical purposes
- A61B5/0084—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence adapted for particular medical purposes for introduction into the body, e.g. by catheters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/65—Spatial scanning object beam
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B2207/00—Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
- G02B2207/101—Nanooptics
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B2207/00—Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
- G02B2207/109—Sols, gels, sol-gel materials
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
Description
力/面積)は、式(1)に示すように、レンズ表面上のナノ粒子の磁気モーメント表面密度(MS)と磁場勾配(∇B)のベクトル積に比例することできる。
Σα=(MS・∇)B (式1)
させることによって、マイクロレンズの光学パワーを変えることができる。特定の表面応力(Σα)の活性化により、マイクロレンズの表面プロファイル(h(r))を変化させ
、それによって光学パワーを変えることができる。
Σl=(Ml・∇)B (式2)
Claims (10)
- 前方結像光干渉断層(OCT)システムであって、
基準経路とサンプル経路とを備えており、
前記サンプル経路は、単一の動作平面内で内軸及び外軸の2本の軸を中心に回転して、前記サンプル経路に沿って伝送される光を撮像されるべきサンプルに向けるように構成されるスキャニングリフレクタ表面を含み、
前記スキャニングリフレクタ表面は、トーションばねと、内軸を回転させるための内部ローターコームとによって、フレーム内に懸架されており、
前記内部ローターコームは、長さ方向がトーションばねと平行となるようにスキャニングリフレクタ表面の両側に沿って配備され、
前記フレームは、トーションばねの直交方向に並んで配置されたジンバルにより接合パッド内に取り付けられ、互い違いになった垂直コーム駆動アクチュエータにより外軸が回転可能であり、
レンズアセンブリをさらに備えており、
(A)前記レンズアセンブリが、前記スキャニングリフレクタ表面と前記サンプルとの間に動作可能に配置されて、前記スキャニングリフレクタが、前記レンズアセンブリの背面焦点面の周りに配置されるか、あるいは、(B)前記スキャニングリフレクタ表面が、前記レンズアセンブリと前記サンプルとの間に動作可能に配置され、
前記レンズアセンブリは、チューナブルレンズを備えており、該チューナブルレンズが、(A)複数のナノ粒子でドープまたは被覆された弾性変形可能なベース材料および(B)前記レンズの辺縁部の周りに動作可能に配置された複数の磁気粒子、のうち少なくとも一方を備える、OCTシステム。 - 前記チューナブルレンズは、複数のナノ粒子でドープまたは被覆された弾性変形可能なベース材料を備え、前記弾性変形可能なベース材料が、流体、液体、ゲルおよび気体からなる群から選択される、請求項1に記載されるOCTシステム。
- 前記スキャニングリフレクタ表面が、金属性または誘電性材料の1つまたは複数の層で被覆されたシリコンを含む、請求項1に記載されるOCTシステム。
- 前記ナノ粒子が、印加された磁界によって励磁されるように構成される、請求項1に記載されるOCTシステム。
- 単一の動作平面内の前記2本の軸を中心にして前記スキャニングリフレクタ表面を回転させると、前記サンプル経路に沿って伝送される光によって、任意のラスタパターンで前記サンプルのインタロゲーションが生じる、請求項1から4のいずれかに記載されるOCTシステム。
- 前記チューナブルレンズが、該チューナブルレンズに磁界を印加することによって調整される、請求項1に記載されるOCTシステム。
- 前記チューナブルレンズは、複数のナノ粒子でドープまたは被覆された弾性変形可能なベース材料を備え、前記印加された磁界により1つまたは複数の磁化ナノ粒子を移動させ、前記ナノ粒子の移動により、前記ベース材料が変形してレンズ調整が行われる、請求項6に記載されるOCTシステム。
- 前記スキャニングリフレクタ表面の反射率が30%以上である、請求項1に記載されるOCTシステム。
- 前記レンズアセンブリおよび前記スキャニングリフレクタ表面が、内視鏡ポートまたは開口を通って被検対象内に挿入されるように寸法設定されたプローブ内に動作可能に配置される、請求項1に記載されるOCTシステム。
- 単一の動作平面内の前記2本の軸を中心にして前記スキャニングリフレクタ表面を回転させると、前記サンプル経路に沿って伝送される光によって、任意のラスタパターンで前記サンプルのインタロゲーションが生じる、請求項1に記載されるOCTシステム。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US95525507P | 2007-08-10 | 2007-08-10 | |
US60/955,255 | 2007-08-10 | ||
PCT/US2008/072805 WO2009023635A1 (en) | 2007-08-10 | 2008-08-11 | Forward-imaging optical coherence tomography (oct) systems and probe |
Publications (3)
Publication Number | Publication Date |
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JP2010536041A JP2010536041A (ja) | 2010-11-25 |
JP2010536041A5 JP2010536041A5 (ja) | 2011-10-06 |
JP5608556B2 true JP5608556B2 (ja) | 2014-10-15 |
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Application Number | Title | Priority Date | Filing Date |
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JP2010520345A Expired - Fee Related JP5608556B2 (ja) | 2007-08-10 | 2008-08-11 | 前方結像型光干渉断層(oct)システムおよびプローブ |
Country Status (4)
Country | Link |
---|---|
US (3) | US8531676B2 (ja) |
EP (1) | EP2191227A4 (ja) |
JP (1) | JP5608556B2 (ja) |
WO (1) | WO2009023635A1 (ja) |
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