JP5004669B2 - Imaging component, imaging unit, and manufacturing method thereof - Google Patents

Description

  The present invention relates to an imaging component and an imaging unit that are applied to an optical sensor or the like using an imaging element such as a CCD type or a CMOS type. The present invention also relates to a method for manufacturing an imaging component and a method for manufacturing an imaging unit.

  2. Description of the Related Art Conventionally, imaging components for mounting an image sensor such as a CCD type or a CMOS type are known. In the imaging component, light emitted from the subject is projected as an image on the light receiving unit of the imaging device, and this image is electrically converted by the imaging device and output. In addition, as for an imaging component, a lens etc. are mounted on an imaging component as needed.

  In such an imaging component, the lens is curved while the light receiving part of the image sensor is flat. Therefore, the optical distance to the lens is different between the central part and the peripheral part of the light receiving part of the image sensor. In some cases, the image projected on the light receiving portion of the image sensor becomes a blurred image. Therefore, as a method for dealing with such a phenomenon, a method using two or more lenses is considered. However, providing a plurality of lenses leads to a significant increase in cost of imaging components and an increase in size of the imaging unit.

  Therefore, it is considered to adjust the image by bending the light receiving portion of the image sensor. In such an imaging component, the upper surface of the substrate is formed in a predetermined shape in a curved shape or stepped shape, and after the imaging device is curved along the shape of the substrate, the imaging device is fixed with a resin or the like. Is formed.

A ceramic substrate is known as such a substrate for an imaging component. For example, when the upper surface of the substrate is formed in a curved shape, the upper surface of the substrate is curved when the ceramic green sheet is fired. It can form by the method of baking.
JP 2001-156278 A

  However, the substrate on which the image sensor is mounted may vary in a curved state or a staircase state in the manufacturing process. For example, when the ceramic green sheet is fired, the upper surface of the substrate may be inadvertently warped. When variations occur in the state of the upper surface of the substrate in this way, the curved state of the image sensor mounted on the substrate also varies, and it becomes impossible to accurately project an image on the light receiving portion of the image sensor. There is a problem that the image is electrically converted by the image sensor and cannot be taken out as a clear image.

  The present invention has been devised in view of the above problems, and its purpose is to accurately project an image on a light-receiving portion of a curved image sensor when photographing a subject, and to accurately perform an electrical operation with the image sensor. An object of the present invention is to provide an imaging component and an imaging unit that can be converted into a signal and taken out as a clear image.

An imaging component according to the present invention includes a substrate having a concave portion on an upper surface and an imaging element disposed on the upper surface of the substrate so as to cover the concave portion, and the imaging device is curved downward and convex. The light receiving portion has an opening area larger than that of the light receiving portion in a plan view, and the image sensor is positioned so that the light receiving portion is located inside the edge of the recessed portion. It is arrange | positioned at the said board | substrate and is supported by the said board | substrate outside the said recessed part , It is characterized by the above-mentioned.

An imaging component according to the present invention includes a substrate having a through-hole penetrating vertically and an imaging element disposed on the upper surface of the substrate so as to cover the through-hole, and the imaging element is convexly curved downward And has a light receiving portion, and in plan view, the area of the opening of the through hole is larger than the area of the light receiving portion, and the imaging element has the light receiving portion that is larger than the edge of the through hole. It arrange | positions at the said board | substrate so that it may be located inside, and is supported by the said board | substrate outside the said through-hole.

  The imaging unit of the present invention is characterized by including the imaging component of the present invention and a translucent member disposed on the imaging element of the imaging component.

  The imaging unit of the present invention is characterized in that the translucent member is made of glass or resin.

  The imaging unit of the present invention includes the imaging component of the present invention and a heat dissipating member disposed in contact with the lower side of the imaging element of the imaging component.

An imaging component manufacturing method according to the present invention includes a substrate having a through-hole penetrating vertically and an image sensor arranged to cover the through-hole on an upper surface of the substrate, It is convexly curved and has a light receiving portion, and in plan view, the area of the opening of the through hole is larger than the area of the light receiving portion, and the image sensor includes the light receiving portion of the through hole. A method of manufacturing an imaging component that is disposed on the substrate so as to be positioned on the inner side of the edge and supported on the substrate on the outer side of the through hole, the first step of preparing an imaging device; The second step of arranging the image pickup element on the substrate and the third step of bending the image pickup element by sucking the image pickup element from the through-hole of the substrate are characterized.

An imaging component manufacturing method according to the present invention includes a substrate having a through-hole penetrating vertically and an image sensor arranged to cover the through-hole on an upper surface of the substrate, It is convexly curved and has a light receiving portion, and in plan view, the area of the opening of the through hole is larger than the area of the light receiving portion, and the image sensor includes the light receiving portion of the through hole. A method of manufacturing an imaging component that is arranged on the substrate so as to be located on the inner side of the edge and supported by the substrate on the outer side of the through-hole, and preparing an imaging element that is curved downward and convex in advance A first step of arranging the curved imaging device on the substrate, a third step of adjusting the degree of curvature by sucking the imaging device from the through-hole of the substrate, It is characterized by going through.

An image pickup unit manufacturing method according to the present invention includes a substrate having a through-hole penetrating vertically and an image pickup device disposed on an upper surface of the substrate so as to cover the through-hole, and the image pickup device is provided below It is convexly curved and has a light receiving portion, and in plan view, the area of the opening of the through hole is larger than the area of the light receiving portion, and the image sensor includes the light receiving portion of the through hole. An imaging component that is disposed on the substrate so as to be located on the inner side of the edge and supported by the substrate on the outer side of the through hole; and a translucent member that is disposed on the imaging element of the imaging component; A first step of preparing an imaging device, a second step of arranging the imaging device on the substrate, and a translucent member on the imaging device. A third step of placement and the imaging element through the substrate? By suction, it is characterized in that through the a fourth step of bending the imaging element.

  An imaging component according to the present invention includes a substrate having a recess on an upper surface thereof, and an imaging element disposed on the upper surface of the substrate so as to cover the recess, and the imaging device is convexly curved downward. Is supported by the substrate at the opening edge of the recess. As a result, the curved state of the image sensor in the recess can be finely adjusted according to product variations of the substrate and the image sensor, so that the image can be accurately projected onto the light receiving portion of the image sensor, The element can be accurately converted into an electric signal and a clear image can be taken out.

  An imaging component according to the present invention includes a substrate having a through-hole penetrating vertically and an imaging device disposed on the upper surface of the substrate so as to cover the through-hole, and the imaging device is curved convexly downward. At the same time, the imaging element is supported by the substrate at the opening edge of the through hole. From this, the curved state of the image sensor in the through hole can be finely adjusted according to each product variation of the substrate and the image sensor, so that the image can be accurately projected on the light receiving portion of the image sensor, The image sensor can accurately convert the signal into an electric signal, and a clear image can be taken out.

  Since the imaging unit of the present invention includes the imaging component of the present invention and a translucent member disposed on the imaging element of the imaging component, a clear image can be obtained by using the imaging component of the present invention. The imaging unit can be taken out.

  The translucent member of the imaging unit of the present invention is made of glass or resin. From this, it can be set as the imaging unit which can take out a clear image similarly to the above-mentioned.

  Since the imaging unit of the present invention includes the imaging component of the present invention and a heat radiating member disposed in contact with the lower side of the image sensor of the imaging component, the heat of the image sensor is transferred to the heat radiating member. Therefore, it is possible to suppress the temperature of the image sensor from becoming high, so it is possible to suppress the occurrence of distortion in the image sensor due to heat, and to suppress the occurrence of distortion in the projected image. It can be taken out.

  The manufacturing method of an imaging component according to the present invention includes a first step of preparing an imaging device, a second step of arranging the imaging device on a substrate, and a first step of bending the imaging device by suction from a through-hole of the substrate. 3 steps are followed. From this, it is possible to bend the image pickup element by suction so that the image pickup element is bent through the through hole. Therefore, the imaging component can accurately project an image on the light receiving portion of the imaging element, and a clear image can be taken out.

  The manufacturing method of the imaging component of the present invention includes a first step of preparing an imaging element that is curved downward and convex in advance, a second step of arranging the curved imaging element on a substrate, and the through-hole of the substrate. A third step of adjusting the degree of curvature by sucking the image sensor is performed. From this, the curved state of the image sensor can be easily adjusted. Therefore, the imaging component can project an image on the light receiving portion of the imaging element with higher accuracy, and can extract a clear image.

  The manufacturing method of the imaging unit of the present invention includes a first step of preparing an imaging device, a second step of arranging the imaging device on a substrate, and a third step of arranging a translucent member on the imaging device. And a fourth step of bending the image pickup device by sucking the image pickup device from the through hole of the substrate. As a result, the curved state of the image sensor can be adjusted while confirming the state of the image projected on the light receiver of the image sensor, so that the image pickup unit projects the image onto the light receiver of the image sensor with high accuracy. be able to. Accordingly, it is possible to accurately convert the electric signal into an electric signal by the image pickup device and to extract a clear image.

  The imaging component of the present invention will be described with reference to the drawings. Fig.1 (a) is a top view which shows an example of embodiment of the imaging component of this invention, (b) is a top view of the board | substrate in (a). FIG. 2 is a cross-sectional view taken along line A-A ′ of FIG. In these drawings, 1 is an imaging component, 2 is a substrate, 2a is a recess, 3 is an imaging element, 3a is a light receiving portion, and 4 is a wiring conductor.

  The imaging component 1 of the present invention includes a substrate 2 having a recess 2a on the upper surface, and an image sensor 3 disposed on the upper surface of the substrate 2 so as to cover the recess 2a. The image sensor 3 is convexly curved downward. In addition, the image sensor 3 is supported by the substrate 2 at the opening edge of the recess 2a.

  In FIG. 1 (a), a region serving as the inner peripheral surface of the recess 2a is transmitted and indicated by a broken line.

The substrate 2 of the present invention is made of ceramics or the like, and is made of an electrically insulating material such as an aluminum oxide sintered body, a mullite sintered body, an aluminum nitride sintered body, or a silicon carbide sintered body. When the substrate 2 is made of an aluminum oxide sintered body, a suitable organic solvent or solvent for the raw material powder such as alumina (Al ₂ O ₃ ), silica (SiO ₂ ), calcia (CaO), magnesia (MgO), etc. Add and mix to make a mud-like shape, and then apply the well-known doctor blade method and calender roll method, etc. to form a ceramic green sheet by forming into a sheet shape, then punch the ceramic green sheet appropriately In addition, a plurality of sheets are laminated as necessary, and are fired at a high temperature (about 1500 to 1800 ° C.).

  In addition, the substrate 2 has a recess 2a formed on the upper surface. Such recesses 2a are formed by forming through holes for the recesses 2a in some ceramic green sheets for the substrate 2 by a punching method using a die or punching, a laser processing method, or the like, and laminating with other ceramic green sheets. Can be formed.

  The wiring conductor 4 functions as a copper electric circuit for connecting the image pickup device disposed on the substrate 2 to the external electric circuit substrate. The wiring conductor 4 is made of metal powder metallization such as tungsten, molybdenum, copper, or silver. The metallized paste for the wiring conductor 4 is printed on the ceramic green sheet for the substrate 2 by screen printing or the like, and the metallized paste is applied to the substrate. It is deposited and formed in a predetermined region by firing together with a ceramic green sheet for use.

  The metallized paste for the wiring conductor 4 is mixed and kneaded by a kneading means such as a ball mill, a three-roll mill, a planetary mixer, etc. with an organic binder, an organic solvent, and a dispersant as required added to the main component metal powder. Will be produced. Glass or ceramic powder may be added to match the sintering behavior of the ceramic green sheet or to increase the bonding strength with the substrate 2 after sintering.

  Further, the wiring conductor 4 formed on the surface and inside of the substrate 2 is electrically connected by a through conductor penetrating the substrate 1 as necessary. Such penetrating conductors are penetrated for penetrating conductors by a punching method using a die or punching or a processing method such as laser processing on a ceramic green sheet for a substrate prior to printing and application of a metallized paste for forming the wiring conductor 4. Holes are formed, and metallized paste for through conductors is filled in the through holes by printing means such as a screen printing method, and this is fired together with the ceramic green sheet for the substrate 2 to form each region. The metallized paste for the through conductor is produced in the same manner as the metallized paste for the wiring conductor 4, but is prepared to have a viscosity suitable for filling depending on the amount of the organic binder or organic solvent.

  Further, if the surface of the wiring conductor 4 exposed is coated with a metal having excellent corrosion resistance such as nickel (Ni) or gold (Au), the wiring conductor 4 can be effectively prevented from being oxidized and corroded. In addition, the bonding between the wiring conductor 4 and the electronic component, the electrical connection between the wiring conductor 4 and the Au wire, the solder bump, and the like, and the bonding between the wiring conductor 4 and the external circuit board can be made strong. Accordingly, a Ni plating layer having a thickness of about 1 to 10 μm and a gold (Au) plating layer having a thickness of about 0.1 to 3 μm are sequentially formed on the exposed portion of the surface of the wiring conductor 4 by an electrolytic plating method or an electroless plating method. It is attached.

  The imaging device 3 is disposed at the opening edge of the recess 2a so as to be bonded to the upper surface of the substrate 2 by a bonding member 6 such as epoxy resin or solder and to cover the recess 2a. An electrode (not shown) of the image sensor 3 is connected to the wiring conductor 4 of the substrate 2 through an electrical connection means such as a bonding wire 5.

  The image sensor 3 has a CCD-type and CMOS-type light receiving portion 3a formed on a silicon substrate. When the subject is photographed, the light emitted from the subject is displayed as an image. Projected. And it is taken out as an image by converting into an electrical signal with the image pick-up element 3.

  Note that the image sensor 3 may be electrically connected to the wiring conductor of the substrate 2 by flip-chip bonding by an ultrasonic bonding method or the like. Note that a bonding material such as an epoxy resin may be applied around the bonding portion of the imaging element 3 in order to reinforce the bonding between the substrate 2 and the imaging element 3.

  And in this invention, the image pick-up element 3 is curving convexly downward. Note that “being convexly curved downward” means that the imaging device 3 disposed on the upper surface of the substrate 2 is curved from the opening surface side of the concave portion 2a toward the bottom surface side of the concave portion 2a. . Therefore, the curved state of the image sensor 3 in the recess 2a can be finely adjusted according to the product variations of the substrate 2 and the image sensor 3, so that the image is accurately projected on the light receiving unit 3a of the image sensor 3. Therefore, the image pickup device 3 can accurately convert the signal into an electric signal and take out a clear image.

  The image sensor 3 is placed on the upper surface of the substrate 2 in a state where the image sensor 3 is curved in a convex manner downward (from the opening surface of the recess 2 a to the bottom surface of the recess 2 a), and is fixed by the joining member 6. Therefore, it is arranged to be curved downward and convex.

  Further, when the image pickup device 3 is viewed in plan, the area of the opening of the concave portion 2a is larger than the area of the light receiving portion 3a of the image pickup device 3, and the light receiving portion 3a of the image pickup device 3 is inside the opening edge of the concave portion 2a. It is preferable to be disposed on the substrate 2 so as to be positioned. As a result, even if there is a difference in the degree of curvature of the image pickup device 3 between the region inside the opening edge of the recess 2a and the region outside the opening edge of the recess 2a, the light receiving portion 3a of the image pickup device 3 The distortion of the degree of curvature can be reduced, and the image can be easily projected onto the light receiving unit 3a of the image sensor 3 with high accuracy.

  Also, as shown in FIG. 3, the substrate 2 may be a recess 2a having a plurality of steps, and the image sensor 3 may be housed in the recess 2a. Even in this case, for the same reason as described above, on the upper surface of the substrate 2 at the stage where the image pickup device 3 is mounted, the light receiving portion 3a is positioned on the substrate 2 so as to be located inside the opening edge of the recess 2a. It is preferable to arrange the image sensor 3. In addition, as shown in FIG. 4, the wiring conductor 4 may be formed by being led out in the side surface direction of the substrate 2.

  As shown in FIGS. 5 and 6, the imaging component 1 includes a substrate 2 having a through-hole 2 b penetrating vertically and an imaging element 3 arranged on the upper surface of the substrate 2 so as to cover the through-hole 2 b. The imaging device 3 may be convexly curved downward, and the imaging device 3 may be supported by the substrate 2 at the opening edge of the through hole 2b. 5A is a plan view showing an example of the embodiment of the imaging component of the present invention, and FIG. 5B is a plan view of the substrate in FIG. 5A. FIG. 6 is a cross-sectional view taken along line B-B ′ of FIG. Also in FIG. 5A, similarly to the above, the region which becomes the inner peripheral surface of the through hole 2b is transmitted and indicated by a broken line. In addition, the convexly curved downward means that the imaging element 3 disposed on the upper surface of the substrate 2 opens from the opening surface of the through hole 2b on the upper surface side of the substrate 2 to the through hole 2b on the lower surface side of the substrate 2. It is curved toward the direction of the surface. From this, the curved state of the image sensor 3 in the through hole 2b can be finely adjusted according to each product variation of the substrate 2 and the image sensor 3, so that the image is accurately displayed on the light receiving portion 3a of the image sensor 3. The image can be projected, and the image pickup device 3 can accurately convert the signal into an electric signal, and a clear image can be taken out.

  Moreover, the through-hole 2b can be manufactured by the same method as the recessed part 2a. For example, the through hole 2b can be formed by forming a through hole for the through hole 2b in the ceramic green sheet for the substrate 2 by a punching method using a die or punching, a laser processing method, or the like. In addition, when the board | substrate 2 consists of two or more layers, after forming the through-hole for through-holes 2b in each of the ceramic green sheets for board | substrates 2, one through-hole 2b is formed by laminating | stacking these ceramic green sheets. Alternatively, after the ceramic green sheets for the substrate 2 are laminated, one through hole 2b may be formed in these ceramic green sheets. What is necessary is just to select according to the thickness of the board | substrate 2, the magnitude | size of the through-hole 2b, a shape, etc.

  The image pickup device 3 is mounted on the upper surface of the substrate 2 by sucking the image pickup device 3 from the lower surface side of the substrate 2 through the through hole 2 b and fixing the image pickup device 3 by the bonding member 6. And curved downward (from the opening surface of the through hole 2b on the upper surface side of the substrate 2 to the opening surface of the through hole 2b on the lower surface side of the substrate 2).

  Further, the shape of the through hole 2b in a plan view can be a polygonal shape such as a square shape, a circular shape, or the like. In addition, in order to bend the image pick-up element 3 equally in the through-hole 2b, it is preferable that the shape of the through-hole 2b is circular.

  Similarly to the above, when the image pickup device 3 is viewed in plan, the area of the opening of the through hole 2b is larger than the area of the light receiving portion 3a of the image pickup device 3, and the light receiving portion 3a of the image pickup device 3 is the through hole 2b. It is preferable to arrange on the board | substrate 2 so that it may be located inside the opening edge. As a result, even if a difference occurs in the degree of curvature of the image sensor 3, distortion of the degree of curvature of the light receiving unit 3 a of the image sensor 3 can be reduced, and an image can be accurately displayed on the light receiving unit 3 a of the image sensor 3. Easy to project.

  Further, as shown in FIGS. 7 and 8, a step may be provided on the lower surface side of the substrate 2. In FIG. 7B, a step is provided only on the two opposite sides on the lower surface side of the substrate 2. However, a step is provided on all four sides to surround the through hole 2 b on the lower surface side of the substrate 2. Such a frame portion may be used. Moreover, when providing a level | step difference in the upper surface side and the lower surface side of the board | substrate 2, respectively, it is preferable that the inner wall surface of these level | step differences is located in the upper surface side and the lower surface side in planar view. Thereby, when a plurality of ceramic green sheets for the substrate 2 are stacked, it is possible to suppress the stacking failure between these ceramic green sheets and the deformation of the substrate 2 on the surface on which the imaging element 3 is mounted.

  In addition, as shown in FIG. 9, the image sensor 3 may be one in which the light receiving unit 3 a is eccentrically arranged. In such a case, the deviation of the degree of curvature with respect to the center of the light receiving unit 3 is suppressed. Therefore, the concave portion 2a and the through hole 2b are formed in the substrate 2 in accordance with the arrangement of the light receiving portion 3a of the image pickup device 3 so that the center of the light receiving portion 3a of the image pickup device 3 is positioned at the center of the concave portion 2a or the through hole 2b. In addition, the image sensor 3 may be disposed on the upper surface of the substrate 2.

  Moreover, as shown in FIG. 10, the joining member 6 may be applied or filled in the through hole 2b. In this case, the lower surface of the image sensor 3 can be protected by the bonding member 6. Moreover, the joining member 6 may be applied or filled in the recess 2a.

  As shown in FIG. 11, the imaging unit 10 of the present invention includes the above-described imaging component 1 and a translucent member 11 disposed on the imaging element 3 of the imaging component 1. For this reason, by using the above-described imaging component 1, the imaging unit 10 that can extract a clear image can be obtained.

  Note that the translucent member 11 can be a potting material made of a resin such as an epoxy resin, a plate-like window member made of a resin such as glass or an epoxy resin, a lens, or the like. For example, as shown in FIG. 11, when the translucent member 11 is a plate-shaped window member, the window member is bonded to the substrate 2 with an adhesive such as epoxy resin or glass, and the imaging element 3 and the imaging element. The three light receiving portions 3 can be protected. In addition, as shown in FIG. 12, when the translucent member 11 is made of a potting material, the potting material is applied on the image sensor 3 to protect the image sensor 3 and the light receiving unit 3 of the image sensor 3. it can. As shown in FIG. 13, when the translucent member 11 is a lens, the lens is attached to the lens fixing member 13 and receives light transmitted through the lens through the opening 13 a of the lens fixing member 13. It can enter into part 3a. The lens fixing member 13 is made of resin, metal, or the like, and is fixed to the substrate 2 with an adhesive such as epoxy resin or solder, or is fixed to the substrate 2 with a flange or the like provided in advance on the lens fixing member 13.

  In addition, when the wiring conductor 4 of the board | substrate 2 and the electrode of the image pick-up element 3 are electrically connected by the bonding wire 5 grade | etc., As shown in FIG. 14, the wiring conductor of the board | substrate 2, the bonding wire 5, or the image pick-up element 3 is shown. These electrodes may be partially protected by a sealing material 12 such as an epoxy resin. Moreover, as shown in FIG. 15, you may combine the translucent members 11, such as a window member and a lens.

  Further, the imaging unit 10 may include the imaging component 1 and a heat radiating member that is disposed in contact with the lower side of the imaging element 3 of the imaging component 1. Accordingly, the heat of the image sensor 3 can be transferred to the heat radiating member so that the temperature of the image sensor 3 can be prevented from being increased. Therefore, the image sensor 3 is prevented from being distorted by heat and projected. Generation of distortion in the image can be suppressed, and a clear image can be extracted. In addition, when the imaging unit 10 is mounted on the external circuit board, it is preferable that the heat dissipation member and the external circuit board are in contact with each other in order to dissipate the heat of the heat dissipation member. Further, a heat radiating member may be formed in advance on the external circuit board side, and the heat radiating member may be brought into contact with the lower surface of the image sensor 3 when the imaging unit 10 is mounted on the external circuit board.

  Next, the manufacturing method of the imaging component of this invention is demonstrated using figures. FIG. 16 is a cross-sectional view showing an example of an embodiment of a method for manufacturing an imaging component according to the present invention. Note that the description of the reference numerals in these drawings is omitted because the same reference numerals as those of the imaging component 1 described above are used.

  The method for manufacturing an imaging component according to the present invention includes a first step of preparing the imaging device 3, a second step of arranging the imaging device on the substrate 2, and sucking the imaging device 3 from the through hole 2 b of the substrate 2. This is followed by the third step of bending.

  First, as shown in FIG. 16A, as a first step, a substrate 2 having a through hole 2b penetrating vertically and an imaging element 3 having a light receiving portion 3a on the upper surface are prepared. Next, as illustrated in FIG. 16B, as a second step, the imaging element 3 is disposed on the upper surface of the substrate 2 so as to cover the through hole 2 b of the substrate 2. Then, as shown in FIG. 16C, as a third step, the image pickup device 3 is sucked down from the lower surface of the substrate 2 through the through hole 2b, thereby lowering the image pickup device 3 (on the upper surface side of the substrate 2). Curved convexly from the opening surface of the through hole 2b toward the opening surface of the through hole 2b on the lower surface side of the substrate 2. From this, the image pickup device 3 can be bent by suction, and the image pickup device can be bent through the through hole 2b. Therefore, the imaging component 1 can accurately project an image on the light receiving unit 3a of the imaging device 3, and a clear image can be taken out.

  In the third step described above, when the imaging element 3 is sucked from the lower surface of the substrate 2 through the through hole 2b, the bending state of the imaging element 3 can be easily adjusted by adjusting the degree of bending of the imaging element 3. Can be adjusted. Therefore, the imaging component 1 can project an image on the light receiving unit 3a of the imaging device 3 with higher accuracy, and can extract a clear image.

  In the second step described above, it is preferable that the image pickup device 3 is disposed on the substrate 2 and then connected to the wiring conductor 4 formed on the substrate 2. For this reason, the electrode of the imaging device 3 and the wiring conductor 4 of the substrate 2 are electrically connected before the imaging device 3 is bent. After the bending, the electrode of the imaging device 3 and the wiring of the substrate 2 are connected. Compared with the case where the conductor 4 is electrically connected, it is easy to make an electrical connection. Therefore, it is possible to suppress the occurrence of a problem in the electrical connection between the electrode of the imaging element 3 and the wiring conductor 4 of the substrate 2. . Therefore, the imaging component 1 having excellent reliability can be obtained.

  Next, a method for manufacturing the imaging unit of the present invention will be described with reference to the drawings. FIG. 17 is a cross-sectional view showing an example of an embodiment of a method for manufacturing an imaging unit according to the present invention. It should be noted that description of reference numerals in these drawings is omitted because the same reference numerals as those of the imaging unit 10 described above are used.

  In the manufacturing method of the imaging unit of the present invention, the first step of preparing the imaging device 3, the second step of arranging the imaging device 3 on the substrate 2, and the translucent member 11 are arranged on the imaging device 3. And a fourth step of bending the image pickup device 3 by sucking the image pickup device 3 from the through hole 2b of the substrate 2.

  First, as shown in FIG. 17A, as a first step, a substrate 2 having a through hole 2b penetrating vertically and an imaging element 3 having a light receiving portion 3a on its upper surface are prepared. Next, as shown in FIG. 17B, as a second step, the image sensor 3 is arranged on the upper surface of the substrate 2 so as to cover the through hole 2 b of the substrate 2. Then, as shown in FIG. 17 (c), as the third step, the translucent member 11 is arranged on the image pickup device 3, and as shown in FIG. 17 (d), as the fourth step, the image pickup device. By sucking 3 from the lower surface of the substrate 2 through the through hole 2b, the imaging element 3 is bent convexly downward (from the upper surface to the lower surface of the substrate 2). Thus, the curved state of the image sensor 3 can be adjusted while confirming the state of the image projected on the light receiver 3 a of the image sensor 3, so that the image pickup unit 10 can be connected to the light receiver 3 a of the image sensor 3. An image can be projected with high accuracy. Accordingly, the image pickup device 3 can accurately convert the signal into an electric signal and extract a clear image.

  Further, after mounting the imaging unit 10 on the external circuit board and connecting the wiring conductor 4 of the substrate 2 and the wiring conductor of the external circuit board, the imaging element 3 is sucked through the through hole 2b, and the imaging element 3 is removed. It may be curved convexly downward. The connection between the wiring conductor 4 and the wiring conductor of the external circuit board may be performed by soldering or the like, or the wiring conductor such as a conductive pin provided on the external circuit board may be connected to the board 2. The wiring conductor may be contacted and electrically connected.

  It should be noted that the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the scope of the present invention. For example, as illustrated in FIGS. 18 and 19, the imaging component 1 and the imaging unit 10 include, on the upper surface or the lower surface of the substrate 2, semiconductor elements such as IC chips and LSI chips other than the imaging element 3, various sensors, capacitors, and the like. The electronic component 14 may be mounted. These electronic components 14 are electrically connected to the wiring conductors 4 of the substrate 2 by means of electrical connection means (not shown) such as bonding wires, as in the case of the imaging device 3. The electronic component 14 may be electrically connected to the wiring conductor 4 of the substrate 2 by solder or the like.

(A) is a top view which shows an example of embodiment of the imaging component of this invention, (b) is a top view of the board | substrate in (a). It is sectional drawing in the A-A 'line | wire of Fig.1 (a). It is sectional drawing which shows an example of embodiment of the imaging component of this invention. It is sectional drawing which shows an example of embodiment of the imaging component of this invention. (A) is a top view which shows an example of embodiment of the imaging component of this invention, (b) is a top view of the board | substrate in (a). It is sectional drawing in the B-B 'line of Fig.5 (a). (A) is a top view which shows an example of embodiment of the imaging component of this invention, (b) is a bottom view of the imaging component in (a). It is sectional drawing in the C-C 'line of FIG. It is a top view which shows an example of embodiment of the imaging component of this invention. It is sectional drawing which shows an example of embodiment of the imaging component of this invention. It is sectional drawing which shows an example of embodiment of the imaging unit of this invention. It is sectional drawing which shows an example of embodiment of the imaging unit of this invention. It is sectional drawing which shows an example of embodiment of the imaging unit of this invention. It is sectional drawing which shows an example of embodiment of the imaging unit of this invention. It is sectional drawing which shows an example of embodiment of the imaging unit of this invention. It is sectional drawing which shows an example of embodiment of the manufacturing method of the imaging component of this invention. It is sectional drawing which shows an example of embodiment of the manufacturing method of the imaging unit of this invention. It is sectional drawing which shows an example of embodiment of the imaging unit of this invention. It is sectional drawing which shows an example of embodiment of the imaging unit of this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Imaging component 2 ... Board | substrate 2a ... Recessed part 2b ... Through-hole 3 ... Imaging element 3a ... Light-receiving part 4 ... Wiring conductor 7 ... Projection part 10 ... Imaging unit 11 ... translucent member 12 ... sealing material 13 ... lens fixing member 14 ... electronic component

Claims (8)

A substrate having a recess on the upper surface;
An image sensor disposed on the upper surface of the substrate so as to cover the recess,
The image sensor is convexly curved downward and has a light receiving portion,
In plan view, the area of the opening of the recess is larger than the area of the light receiving part,
The imaging element is an imaging component that is disposed on the substrate such that the light receiving portion is located inside an edge of the recess, and is supported by the substrate outside the recess. A substrate having a through-hole penetrating vertically;
An image sensor disposed on the upper surface of the substrate so as to cover the through-hole,
The image sensor is convexly curved downward and has a light receiving portion,
In a plan view, the area of the opening of the through hole is larger than the area of the light receiving part,
The imaging element is an imaging component that is disposed on the substrate such that the light receiving portion is located inside an edge of the through hole, and is supported by the substrate outside the through hole. The imaging component according to claim 1,
An imaging unit comprising: a translucent member disposed on an imaging element of the imaging component.   The imaging unit according to claim 3, wherein the translucent member is made of glass or resin. The imaging component according to any one of claims 1 to 4,
And a heat dissipating member disposed in contact with the lower side of the image sensor of the imaging component. A substrate having a through-hole penetrating vertically and an image sensor disposed on the upper surface of the substrate so as to cover the through-hole, and the image sensor is convexly curved downward and includes a light receiving portion In plan view, the area of the opening of the through hole is larger than the area of the light receiving part, and the imaging element is arranged so that the light receiving part is located inside the edge of the through hole. A method of manufacturing an imaging component that is disposed on a substrate and supported by the substrate outside the through hole,
A first step of preparing an image sensor;
A second step of disposing the image sensor on the substrate;
A third step of bending the imaging element by sucking from the through-hole of the substrate;
The manufacturing method of the imaging component which passes through. A substrate having a through-hole penetrating vertically and an image sensor disposed on the upper surface of the substrate so as to cover the through-hole, and the image sensor is convexly curved downward and includes a light receiving portion In plan view, the area of the opening of the through hole is larger than the area of the light receiving part, and the imaging element is arranged so that the light receiving part is located inside the edge of the through hole. A method of manufacturing an imaging component that is disposed on a substrate and supported by the substrate outside the through hole,
A first step of preparing an image sensor that is convexly curved downward in advance;
A second step of disposing the curved imaging element on the substrate;
And a third step of adjusting the degree of curvature by sucking the image sensor from the through hole of the substrate. A substrate having a through-hole penetrating vertically and an image sensor disposed on the upper surface of the substrate so as to cover the through-hole, and the image sensor is convexly curved downward and includes a light receiving portion In plan view, the area of the opening of the through hole is larger than the area of the light receiving part, and the imaging element is arranged so that the light receiving part is located inside the edge of the through hole. is disposed on the substrate, wherein at the outer side of the through hole, an imaging part being supported on said substrate,
A translucent member disposed on an imaging element of the imaging component, and a manufacturing method of an imaging unit comprising:
A first step of preparing an image sensor;
A second step of disposing the image sensor on the substrate;
Manufacturing of an imaging unit through a third step of arranging a translucent member on the imaging device and a fourth step of bending the imaging device by sucking the imaging device from the through-hole of the substrate. Method.

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