JP2007033197A - Method and program for identifying generation source of electromagnetic wave interference signal - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To identify the generation source of electromagnetic wave interference signal relatively easily in a short time. <P>SOLUTION: The generation source of electromagnetic wave interference signal is identified by collating the characteristics of electromagnetic wave interference signal measured in distance field or a signal corresponding to it with the characteristics of the electromagnetic wave interference signal of the generation signal of each interference signal measured in the vicinity field. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to an electromagnetic wave interference signal generation source method suitable for specifying an electromagnetic wave interference signal generation source of an electronic apparatus having a digital circuit, and a program for executing the electromagnetic wave interference signal generation source specifying process.

  In many electronic devices having digital circuits, an electromagnetic wave radiated from a clock oscillation circuit or the like for driving a CPU, a bus, an external memory, or the like is an electromagnetic wave interference signal (EMI: Electron) that disturbs the functions of other electronic devices or the like. EMI related industrial standards by public organizations such as the American National Standards Institute (ANSI) and the International Special Committee on Radio Interference (CISPR). The EMI level is regulated by government agencies such as the Federal Communications Commission (FCC). For this reason, generally, the peak value (PK: Peak) or quasi-peak value (QP: Quasi Peak) of the electromagnetic interference signal radiated from electronic devices etc. is the limit of the radiation level specified in FCC rules, CISPR22 standard, etc. Standard conformance judgment is performed to determine whether or not the value (limit) is satisfied.

  When an electronic device or the like fails to meet the standard limit, the product designer repeatedly performs EMI countermeasure examination and standard conformance determination. This EMI countermeasure study generally depends on the intuition and experience of the product designer. Furthermore, since the technology of digital electronic devices in recent years has been diversified, there is a tendency for fundamental waves and harmonics such as multiple clock signals or digital transmission signals synchronized therewith to be complicatedly superimposed, and the sources of electromagnetic interference signals It is difficult to specify the transmission path.

  Therefore, it becomes difficult to select an optimal countermeasure means for electromagnetic interference signals, which tends to cause a rise in product cost due to excessive EMI countermeasures and an increase in burden on product designers due to an increase in EMI countermeasure examination time.

Patent Document 1 has a description of an example of a conventional electromagnetic radiation measurement method.
JP 2001-343409 A

  As a method for reducing the problems in the conventional electromagnetic radiation measurement method described above, there are already a plurality of patent applications, but the methods proposed so far have the following problems.

Problem 1)
In the conventional process of generating the electromagnetic wave interference signal and its transmission path, when the modulation rate of the electromagnetic wave interference signal is very low, that is, when the signal level ratio between the carrier wave and the sideband is large (for example, 40 dB or more), Since the sideband level is lower than the minimum sensitivity of the EMI measuring device, the sideband (modulation frequency) cannot be extracted, and the EMI generation source and the transmission path cannot be specified. FIG. 12 shows a waveform example in which the level of the sideband is equal to or lower than the lowest sensitivity of the EMI measuring device (in this example, 0 dB is the lowest sensitivity). In this example, all signal components other than the carrier wave are equal to or lower than 0 dB.

Problem 2)
When the sideband level is less than or equal to the optimum sensitivity of the EMI measuring device (for example, S / N is 30 dB or less), the sideband includes a measurement error. On the other hand, the error contained in the carrier wave is small, and the modulation rate cannot be accurately extracted from these values, and the accuracy of specifying the EMI generation source and the transmission path is lowered. FIG. 16 is an example of a waveform in which the sideband level is less than the optimum sensitivity of the EMI measuring device. The carrier and sideband signals exceed 0 dB, but the sideband level is a low level in the vicinity of 0 dB. It has become.

Problem 3)
If the sideband level is fluctuating, in order to accurately extract the modulation rate and modulation frequency, slow down the sweep time of the measuring instrument or increase the number of sweeps, so that the sideband level is accurately It takes time to get it.

  In view of these points, it is an object of the present invention to satisfactorily specify the source of an electromagnetic interference signal and the transmission path even when the sideband level is low.

  The present invention demodulates a signal in a predetermined frequency range of an electromagnetic interference signal measured in the far field or near field, extracts a signal in a frequency band corresponding to the audio frequency band of the demodulated signal in the predetermined frequency range, and extracts the extracted frequency By analyzing the frequency of the band signal and calculating the modulation frequency, the source of the electromagnetic interference signal or its transmission path is specified.

  By performing such processing, it is possible to shorten the extraction time of a plurality of modulation frequencies and improve detection accuracy.

  According to the present invention, the extraction time of a plurality of modulation frequencies can be shortened, and the generation source of the electromagnetic wave interference signal or its transmission path can be well identified. Also, modulation frequency extraction near or below the lowest sensitivity level (noise floor in the case of a spectrum analyzer) of the EMI measuring device is realized. The extracted modulation frequency can be recorded in a computer or the like and used as profile information used at the time of EMI feature matching.

  Here, when performing far-field EMI feature profile information and near-field EMI feature extraction / collation, priority is given to near-field EMI feature extraction / collation to narrow down the EMI generation source and transmission path. Thus, the total verification time for specifying the EMI generation source and the transmission path can be shortened.

  Also, the signal level observed below the optimum sensitivity of the measuring instrument using the measurement error characteristics disclosed as the characteristics of the EMI measuring instrument or the relationship between the S / N of the EMI measuring instrument and the measurement error obtained by an arbitrary method. By performing the above correction and calculating the level ratio of the carrier wave and the sideband, it is possible to improve the accuracy of calculating the modulation factor of the electromagnetic interference signal observed below the optimum sensitivity of the EMI measuring device.

  Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings.

  FIG. 1 is a configuration example of an electromagnetic field measurement system in an anechoic chamber, and FIG. 2 is a configuration example of an entire system that performs EMI feature extraction in the far field using the system. As shown in FIG. 2, the EMI measuring device 11 and the coaxial relay switch matrix 12 such as a spectrum analyzer and an EMI receiver used in the anechoic chamber 10 and driving the antenna positioner for the turntable 5 and the antenna 7 shown in FIG. It is configured as an electromagnetic field automatic measurement system configuration in which the apparatus is controlled by a general purpose interface bus (GPIB) or the like which is a standard for measuring equipment connection. That is, as a measurement system configuration, as shown in FIG. 1, a turntable 5 is provided in a reference ground plane 6 composed of an anechoic chamber, and a non-metallic base 4 is installed on the turntable 5. Then, the device under test (EUT) 1 and the peripheral devices 2 and 3 are arranged on the table 4, and measurement is performed while rotating on the turntable 5. The receiving antenna 7 is attached to the antenna mast 8 so that the antenna height can be varied within a range of 1 m to 4 m, for example.

  As shown in FIG. 2, the signal received by the receiving antenna 7 is measured by the spectrum analyzer 11 which is an EMI measuring device, and the measurement signal is supplied to the computer device 22 installed on the measurement room 20 side. Here, in this example, a sound board 22a that performs audio signal input processing is connected as the computer device 22, and the output (AF OUT) of the spectrum analyzer 11 is connected to the analog audio signal input terminal (AF IN) of the sound board 22a. ). The analog signal input to the sound board 22a is subjected to processing for converting an analog signal in the audio frequency (AF) band into a digital signal. In the computer device 22, the frequency components of the digitized signal are analyzed by performing a fast Fourier transform process or the like, and sidebands are extracted. The processing in the computer device 22 is performed by executing EMI evaluation software having these processing functions. Here, the audio frequency band is a frequency band corresponding to a so-called audible band such as 0 Hz to 20 kHz.

  The GPIB terminals of the spectrum analyzer 11 and the coaxial relay switch matrix 12 are connected to the GPIB board 22b of the computer device 22 via the GPIB extender 13 on the anechoic chamber 10 side and the GPIB extender 21 on the measurement chamber 20 side. In the example of FIG. 2, the GPIB extenders 13 and 21 are connected by optical fiber cables, and the GPIB extenders 13 and 21 and the devices are connected by GPIB cables.

  In addition, devices such as a turntable controller 23, an antenna position controller 24, a signal generator 25, and an EMI receiver 26 are connected to the GPIB board 22c of the computer device 22. As an antenna used for EMI detection in the far field, a dipole, biconical, logperiodic antenna, or the like is generally used.

  FIG. 3 is a system configuration example in the near-field EMI feature extraction / collation. An EMI measuring device 11 such as a spectrum analyzer or an EMI receiver, and an automatic electromagnetic field measuring system for controlling them with GPIB or the like. The EMI measuring device 11 is connected to an electromagnetic field sensor 11a as a magnetic field probe installed in the vicinity of the device under test (EUT) 1. In FIG. 3, the details of the configuration controlled by GPIB or the like are omitted.

  Here, the analog signal of the audio frequency (AF) band output from the EMI measuring device 11 is supplied to the audio signal input (AFIN) of the sound board 22a of the computer device 22, and converted into a digital signal by the sound board 22a. Then, the computer device 22 is made to take in. The captured digitized signal is processed by EMI evaluation software having a function of analyzing and analyzing a frequency component of the signal and extracting and collating sidebands.

Next, before describing the processing of the present embodiment, the definitions of terms used in the following description are given. FIG. 4 is a waveform showing these words.
Fc: carrier frequency fs: sideband frequency Frequency at fc ± fd, fd: modulation frequency. Frequency difference calculated by | fc−fs | Lc: carrier level Ls: sideband level Lm: modulation rate. Level difference calculated by | Lc−Ls | f _AF : Modulation frequency calculated by the frequency analysis function (fd = f _AF )
Extracted EMI feature-1: Profile information where the extracted EMI features are fc and _fAF (including 0) Extracted EMI feature-2: The extracted EMI features are fc, _fAF and Ls Profile information

Further, the extraction condition of the modulation frequency f _AF will be described.
It shows the initial condition setting example for extracting a modulation frequency f _AF using a spectrum analyzer with the demodulation function of the detection signal.
Center frequency: The frequency finely adjusted in step 4 of FIG.
・ Frequency span: Set to zero span ・ RBW (Resolution bandwidth): Maximum frequency of audio frequency (AF) output in spectrum analyzer + α
For example, when AF = 20 kHz, RBW = 100 kHz.
-VBW (Video bandwidth): Normally, automatic (Auto) is set.
-SWT (Sweep Time): Usually, it is set to automatic (Auto).
DEMOD (AF Demodulators): At the time of EMI feature extraction / collation of the modulation frequency f _AF that performs demodulation of AM or FM, the same conditions as the setting at the time of modulation frequency f _AF extraction are set.

In addition, an initial condition setting example in the case of extracting the modulation factor Lm using a spectrum analyzer with a demodulation function is shown.
· The center frequency: later steps 4 fine adjustment has been used frequency and frequency span of FIG. 5: a least twice the modulation frequency f _AF calculated in step 11 of FIG. 6 to be described later. For example, when f _AF = 10 kHz, the frequency span is 30 kHz.
RBW: Set to 1/2 or less of the modulation frequency f _AF calculated in step 11 of FIG. 6 described later. For example, when f _AF = 10 kHz, RBW = 1 kHz.
VBW: Normally set to automatic (Auto).
SWT: Usually set to automatic (Auto).
At the time of EMI feature extraction / collation of the modulation factor Lm, the same conditions as the setting at the time of modulation factor Lm extraction are set.

Next, the EMI feature extraction method of this example will be described with reference to a flowchart. In the case of this example, not only when the S / N of the sideband as shown in FIG. 15 is sufficient, for example, the level of the sideband as shown in FIG. It is characterized in that the modulation frequency f _AF can be accurately extracted in a short time near or below the lowest sensitivity (noise floor) of the measuring device and when the modulation rate is several percent or less.

  In the following, an EMI feature extraction procedure will be described using a spectrum analyzer as an example of an EMI measuring device. First, the electromagnetic field measurement process will be described with reference to the flowchart of FIG. 5. The maximum value is acquired for each frequency by using the maximum value hold function of the spectrum analyzer (step S1). Then, it is determined whether or not the standard limit (predetermined margin) is satisfied (step S2). If the standard limit (predetermined margin) is satisfied, the measurement is terminated. If the standard limit (predetermined margin) is not satisfied, the standard limit is determined. All the frequencies that do not satisfy the above are extracted (step S3), the maximum radiation frequency is identified for each frequency (step S4), the frequency radiation direction is identified (step S5), and the QP value is obtained for each frequency (step S6). . At this time, the Quasi Peak detection mode of the EMI receiver is used. Then, a limit is determined for each frequency (step S7). Then, after selecting a frequency (for example, a frequency at which a predetermined margin with respect to the standard limit is insufficient) from which the feature of EMI is desired to be extracted (step S8), EMI feature extraction is performed according to the flowchart of FIG.

Next, the processing shown in the flowchart of FIG. 6 for performing EMI feature extraction will be described. First, the setting of the spectrum analyzer is set as the modulation frequency f _AF extraction condition described in item 4 (step S9). In step S10 and step S11, the AF signal output demodulated by the demodulation function of the spectrum analyzer is input to the sound board. Here, the signal is digitized and then taken into a computer, and frequency conversion is performed using a frequency analysis function (for example, a fast Fourier transform function in an audio frequency band) to extract a modulation frequency _fAF . FIG. 13 is a diagram showing an example of extraction results of the modulation frequency f _AF . The example of FIG. 13 is an example of the modulation frequency extraction result of an AM modulation wave with a modulation frequency of 8 kHz and a modulation rate of 1%. There may be a plurality of modulation frequencies f _AF .

Next, in step S12, it is determined whether or not the modulation frequency f _AF has been extracted. If the modulation frequency f _AF as shown in FIG. 13 is extracted, the process proceeds to step S13. If the modulation frequency f _AF is not extracted as shown in FIG. 14, for example, the process proceeds to step S20.

In step S13, the above-described modulation factor Lm extraction condition is set. In step S14, Lm extraction data is acquired. Here, for example, one of the following is performed.
1) Utilize the MaxHold function of the spectrum analyzer.
2) Utilize the average function of the spectrum analyzer.
3) Utilizing the Clear / Write function of the spectrum analyzer, the spectrum data for each sweep is taken into the computer and the maximum waveform or average waveform is calculated.

Next, in step S15, the frequency of the maximum value and the carrier frequency fc in the resulting waveform in step S14, the modulation frequency f _AF (= fd) using sideband frequency fs calculated in step S11 (= fc ± f _AF ) is calculated. Next, the levels Lc and Ls at the calculated fc and fs are extracted. In step S16, the modulation factor Lm (= Lc−Ls) is calculated using the carrier wave and sideband levels Lc and Ls extracted in step S15.

  When the S / N of the sideband level Ls is not sufficient (usually 30 dB or less), the sideband level Ls includes a measurement error as shown in FIG. Therefore, the coincidence rate at the time of EMI feature matching is deteriorated. Therefore, in step S17, the difference between the sideband level Ls and the noise floor is calculated, and the sideband frequency fs that is equal to or higher than the threshold value AdB (for example, A = 15 dB when the measurement error is 1 dB or less) is extracted. To do. If the sideband frequency fs is extracted in step S17, the process proceeds to step S19. If the sideband frequency fs is not extracted, the process proceeds to step S20 (step S18).

In step S19, the carrier frequency fc, the modulation frequency f _AF , and the modulation factor Lm are extracted and stored in the computer device as EMI feature-2, which is used as profile information at the time of EMI feature matching.

In step S20, the carrier frequency fc, and stored in a computer device a modulation frequency f _AF as extraction EMI features -1, and profile information when EMI feature matching.

In the process up to this point, for data processing computation time reduction, in step S13~ step S17 in FIG. 6, are extracted modulation factor Lm by utilizing a modulation frequency f _AF calculated by the frequency analysis function Alternatively, the modulation factor Lm may be extracted by another known process.

  Next, an EMI feature extraction / collation procedure will be described using a spectrum analyzer as an example of an EMI measuring device.

  In order to identify the source and transmission path of EMI observed in the far field, the features extracted by the EMI feature extraction method of the flowchart of FIG. 6 and the EMI features in the near field are shown in FIGS. In accordance with the flowcharts shown in FIG. 9 and FIG. 10, collation is performed, and the coincidence rate is calculated. The coincidence rate calculation of the EMI feature matching is repeatedly performed in real time until the matching end flag is established.

  First, the flowchart of FIG. 7 will be described. In step S21, the frequency fc extracted by the EMI feature extraction method of the flowchart of FIG. 6 is set in the spectrum analyzer. Then, if the EMI feature of the frequency set in step S21 is the extracted EMI feature-1, the process proceeds to step S23, and if it is the extracted EMI feature-2, the process proceeds to step S24 (step S22). In step S23, the EMI feature matching method shown in FIG. 8 is called. In step S24, the EMI feature matching method shown in FIG. 9 is called.

Next, the flowchart of the EMI feature matching method shown in FIG. 8 will be described. In step S25, the modulation frequency f _AF extraction condition used in the EMI feature extraction method of the frequency set in step S21 of FIG. To do.

  Then, when the collation end flag is established during the collation (for example, when the collation end button is clicked), the collation is terminated. If the verification end flag is not established, step S27 is executed (step S26).

In step S27, the AF signal output demodulated by the demodulation function of the spectrum analyzer is input to the sound board. Here, the signal is digitized and then taken into a computer, and frequency conversion is performed using a frequency analysis function (for example, AF frequency band FFT function) to extract the modulation frequency f _AF (step S28) (see FIG. 13). There may be a plurality of modulation frequencies f _AF .

Then, to calculate the matching rate from the modulation frequency f _AF of the calculated modulation frequency f _AF and extracted EMI characterized -1 in step S28 (step S29, S30), outputs a coincidence rate of the modulation frequency f _AF in a computer display (Step S31). Then, the process returns to step S26. The method for calculating the coincidence rate of the modulation frequency f _AF is arbitrary. For example, of two modulation frequencies f _AF , 50% is set when one wave matches, and 100% when both waves match.

Next, the flowchart shown in FIG. 9 will be described. In step S32, extraction conditions for the modulation frequency f _AF are set. The spectrum analyzer setting here is the same as the modulation frequency f _AF extraction condition used in the EMI feature extraction method set in step S21 of FIG.

Next, in the middle of collation, when the collation end flag is established (for example, by clicking the collation end button), collation is terminated. If the collation end flag is not established, the process proceeds to step S34 (step S33). In steps S34 and S35, the AF signal output demodulated by the demodulation function of the spectrum analyzer is input to the sound board. Here, the signal is digitized and then taken into a computer, and frequency conversion is performed using a frequency analysis function (for example, an AF frequency band FFT function) to extract a modulation frequency f _AF (see FIG. 13). The modulation frequency f _AF may be more present.

Step S36, step S37, as the step S38, the calculated percent identity from the modulation frequency f _AF extraction and fAF calculated in step S35 EMI features -2 outputs a coincidence rate of the modulation frequency f _AF in a computer display . The method for calculating the coincidence rate of the modulation frequency f _AF is arbitrary. For example, there is a ratio of the number of coincidence of the modulation frequency f _AF at the time of collation.

  Thereafter, as step S39, if the coincidence rate calculated in step S37 is equal to or greater than the threshold value A% (for example, A = 75), the process proceeds to step S40, and if the coincidence rate is less than the threshold value A%, the process proceeds to step S33. Return.

  In step S40, in order to improve the coincidence accuracy between the generation source and the transmission path, the process proceeds to step S41 when collation by the modulation factor Lm is performed, and returns to step S33 when not performed. Selection of execution / non-execution of collation based on the modulation factor Lm may be set in advance.

In step S41, the setting of the spectrum analyzer is set to be the same as the modulation factor Lm extraction condition used in the frequency EMI feature extraction method set in step 21 of FIG. Thereafter, the modulation factor Lm extraction data is acquired in step S42. Acquisition of the modulation factor Lm extraction data is performed, for example, in any of the following.
1) Utilize the MaxHold function of the spectrum analyzer.
2) Utilize the Average function of the spectrum analyzer.
3) Utilizing the Clear / Write function of the spectrum analyzer, the spectrum data for each sweep is taken into the computer and the maximum waveform or average waveform is calculated.

Then, in step S43, the frequency fc of the carrier wave the maximum value in the waveform obtained in step S42, calculates the fs (= fc ± fAF) using the modulation frequency f _AF calculated in step S35 (= fd) . Next, Lc and the level Ls at the calculated sideband frequency fs are extracted. In step S44, the modulation factor Lm (= Lc−Ls) is calculated using the levels Lc and Ls extracted in step S43.

  Here, in step S17 of FIG. 6, when the threshold A is set to 15 dB or less, since the measurement error shown in FIG. 11 is included, the matching rate deteriorates. In order to suppress this, the presence / absence of measurement error correction is set in advance. If measurement error correction is to be performed, the process proceeds to step 46; otherwise, the process proceeds to step S47 (step S45).

In step S46, the measurement error correction method shown in the flowchart of FIG. 10 is called. Thereafter, as step S47 and step S48, the coincidence rate is calculated using the modulation frequency f _AF calculated in step S43 and the modulation rate Lm of the extracted EMI feature-2, and is output to the computer display. Then, the process returns to step S32. The method for calculating the coincidence rate of the modulation rate Lm is arbitrary. For example, there is a method of weighting the difference between the modulation rate Lm of the extracted EMI feature-2 and the modulation rate Lm at the time of collation and calculating a ratio according to the weighting result. is there.

  Next, the measurement error correction method shown in the flowchart of FIG. 10 will be described. This processing is performed not only for the sideband level Ls at the time of EMI feature extraction / collation, but also for the sideband level Ls of the extracted EMI feature-2 acquired in advance.

  First, in step S49, (sideband level) − (noise floor level) is calculated. Next, in step S50, the measurement error in the value calculated in step S49 is obtained using the relationship between S / N and measurement error as shown in FIG. Further, since the level of the sideband is high by the measurement error, the modulation factor Lm is corrected (subtracted) by the measurement error in step S51.

In the description so far, in order to shorten the data processing calculation time, in step S41 to step S44 and step S46, the modulation rate Lm is extracted by using the modulation frequency f _AF calculated by the frequency analysis function, and the modulation rate is calculated. Although the matching rate of Lm is calculated, another matching process may be applied to calculate the matching rate between the modulation frequency fd and the modulation rate Lm.

By performing the processing of the present embodiment described so far, the following effects are obtained.
-EMI source and transmission path identification time reduction By using the frequency analysis function to calculate the modulation frequency and extract and collate EMI characteristics, the time can be greatly reduced. For example,
・ The observation time required to obtain the maximum value of the sideband level is 10 s.
・ Sweep time is 200ms
・ The number of frequencies to extract the modulation frequency is 2
・ The number of clock oscillation sources is 5
・ 4 observation points per site
Then, the extraction time of the modulation frequency has conventionally required 10 s × 4 × 5 = 200 s, but in the present embodiment, it becomes 200 ms × 4 × 5 = 4 s, and the extraction time can be reduced to 1/50. .

・ Improvement of verification accuracy EMI modulation with a modulation rate of several percent that cannot be recognized by conventional methods, or modulation of EMI near or slightly below the minimum sensitivity (noise floor in the case of a spectrum analyzer) of the sideband level Verification can be realized by extracting the frequency. Also, the modulation factor calculation angle can be improved by using the measurement error correction method for the sidebands below the optimum sensitivity. The combination of the above two methods can improve the accuracy of more EMI feature matching.

・ Reduced designer's burden The EMI generation source and the transmission route can be specified in a short time and accurately without depending on the evaluation skill of the product designer. Designers can concentrate on devising EMI countermeasures.

In the embodiment described so far, an example in which measurement is performed using one EMI measuring device has been described. However, for example, as illustrated in FIG. 17, the signal is extracted from an electromagnetic field sensor 11 a (Magnetic-Probe or the like). The EMI may be simultaneously input to the two EMI measuring devices 11 and 32 via the duplexer 31. The analog audio band signal (AF signal) demodulated by one of the EMI measuring devices 11 is input to the sound board 22a of the computer device 22, analog / digital converted, and subjected to frequency analysis by FFT or the like, and the modulation frequency f _AF is obtained. Extraction / collation is performed, and the output of the other EMI measuring device 32 is also input to the computer device 22 to simultaneously extract and collate the modulation factor Lm in another process. By doing in this way, EMI feature extraction / collation can be performed at higher speed.

Further, when an EMI measuring device having no audio demodulation function is used as the EMI measuring device, for example, as shown in FIG. 18, the intermediate frequency (IF) output from the EMI measuring device 11 is changed to an AM / that is a radio broadcast receiver. Input to the FM receiver 33 to demodulate the audio frequency. This is digitized by the sound board 22a or the like of the computer device 22 and taken into the computer device 22, and the modulation frequency f _AF is extracted using a frequency analysis function (for example, AF frequency band FFT function). By performing extraction / collation using this modulation frequency f _AF , detection can be performed in the same manner as in the above-described example.

It is a block diagram which shows the example of a measurement system with which one embodiment of this invention is applied. It is a block diagram which shows the example of the EMI feature extraction system to which one embodiment of this invention is applied. It is a block diagram which shows the example of an EMI feature extraction and collation system with which one embodiment of this invention is applied. It is a wave form diagram for demonstrating the definition of EMI characteristic data. It is a flowchart which shows the example of an electromagnetic field measurement by one embodiment of this invention. It is a flowchart which shows the example of EMI feature extraction by one embodiment of this invention. It is a flowchart which shows the example of the EMI feature matching procedure by one embodiment of this invention. It is a flowchart which shows the example (Example 1) of EMI feature matching by one embodiment of this invention. It is a flowchart which shows the example (Example 2) of EMI feature matching by one embodiment of this invention. It is a flowchart which shows the example of a measurement error correction by one embodiment of this invention. It is a characteristic view which shows the example of a relationship between S / N and a measurement error. It is a wave form diagram which shows the example of a modulation waveform. It is a wave form diagram which shows the example of a modulation waveform extraction result. It is a wave form diagram which shows the example of an unmodulated waveform extraction result. It is a wave form diagram which shows the example whose S / N of a sideband is 10 dB or more. It is a wave form diagram which shows the example whose S / N of a sideband is 5 dB or less. It is a block diagram which shows the example of the EMI feature extraction system by other embodiment of this invention. It is a block diagram which shows the example of the EMI measurement system by other embodiment of this invention.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Device under test (EUT), 2, 3 ... Peripheral device, 4 ... Non metal stand, 5 ... Turntable, 6 ... Reference ground plane, 7 ... Receiving antenna, 8 ... Antenna mast, 10 ... Anechoic chamber, DESCRIPTION OF SYMBOLS 11 ... EMI measuring apparatus (spectrum analyzer), 11a ... Electromagnetic field sensor, 12 ... Coaxial relay switch, 13 ... GPIB extender, 20 ... Measurement room, 21 ... GPIB extender, 22 ... Computer apparatus, 22a ... Sound board, 22b, 22c ... GPIB board, 23 ... Turntable controller, 24 ... Antenna position controller, 25 ... Signal generator, 26 ... EMI receiver, 31 ... Demultiplexer, 32 ... EMI measuring instrument, 33 ... AM / AM receiver

Claims (4)

Demodulate the signal of the predetermined frequency range of the electromagnetic interference signal measured in the far field or near field,
Extracting a signal in a frequency band corresponding to the audio frequency band of the demodulated signal in the predetermined frequency range;
A method for identifying an electromagnetic wave interference signal source, wherein the extracted frequency band signal is subjected to frequency analysis to calculate a modulation frequency, and an electromagnetic wave interference signal source or a transmission path thereof is specified. In the electromagnetic wave interference signal generation source identifying method according to claim 1,
When extracting and collating feature profile information of electromagnetic interference signals in the far field and electromagnetic interference signals in the near field, the feature extraction and verification of the electromagnetic interference signals in the near field is prioritized and the source of the electromagnetic interference signal And a method of identifying the source of the electromagnetic interference signal, characterized by narrowing down the transmission path. In the electromagnetic wave interference signal generation source identifying method according to claim 1,
Using the measurement error characteristics of the measurement device of the electromagnetic interference signal, the signal level observed near the lowest sensitivity of the measurement device is corrected to calculate the level ratio between the carrier wave and the sideband. Source identification method. In the program that performs the processing to identify the source of the electromagnetic interference signal by implementing it in the arithmetic processing unit,
Demodulation processing for demodulating a signal in a predetermined frequency range of the electromagnetic interference signal measured in the far field or near field;
An extraction process for extracting a signal in a frequency band corresponding to an audio frequency band of the demodulated signal in the predetermined frequency range;
A program for performing a specific process of calculating a modulation frequency by analyzing a frequency of the extracted signal in a frequency band and specifying a generation source of an electromagnetic interference signal or a transmission path thereof.

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