JP2001300451A - Ultraviolet irradiation device - Google Patents

Ultraviolet irradiation device

Info

Publication number
JP2001300451A
JP2001300451A JP2000123581A JP2000123581A JP2001300451A JP 2001300451 A JP2001300451 A JP 2001300451A JP 2000123581 A JP2000123581 A JP 2000123581A JP 2000123581 A JP2000123581 A JP 2000123581A JP 2001300451 A JP2001300451 A JP 2001300451A
Authority
JP
Japan
Prior art keywords
ultraviolet light
inert gas
light irradiation
light source
housing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000123581A
Other languages
Japanese (ja)
Inventor
Yasuo Kogure
靖男 木暮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoya Candeo Optronics Corp
Original Assignee
Hoya Schott Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoya Schott Corp filed Critical Hoya Schott Corp
Priority to JP2000123581A priority Critical patent/JP2001300451A/en
Publication of JP2001300451A publication Critical patent/JP2001300451A/en
Pending legal-status Critical Current

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  • Cleaning In General (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PROBLEM TO BE SOLVED: To enhance the efficiency of cleaning, and modifying a material to be treated by an ultraviolet irradiation device. SOLUTION: This ultraviolet irradiation device 10 has a light, transmission window 20 for irradiating the material to be treated W with ultraviolet light from a lamp house 14 which houses a dielectric barrier excimer lamp 12. The lamp house 14 is filled with an inert gas such as nitrogen introduced therein and the light transmission window 20 has an opening 22 formed for conducting the flow of the inert gas into a space between the material W and the window 20. When the material W is irradiated with the ultra-violet light, the inert gas present in the lamp house 14 finds its way out through the opening 22 and consequently, the surface atmosphere of the material W is filled with the inert gas during irradiating the material W with the ultraviolet light. Thus the attenuation of the ultraviolet light in the region of the atmosphere is inhibited.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、紫外光とオゾンの
共同作用を用いて半導体ウェハやガラス基板の表面を洗
浄し又は改質するために使用される紫外光照射装置に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an ultraviolet light irradiation apparatus used for cleaning or modifying the surface of a semiconductor wafer or a glass substrate by using the synergistic action of ultraviolet light and ozone.

【0002】[0002]

【従来の技術】近年、紫外光とオゾンの協同作用を利用
して金属、半導体物質或いはガラス等の被処理物表面の
洗浄又は改質を行う技術が広く研究されている。この技
術は一般にUVオゾン法として知られている。UVオゾ
ン法によれば、これら被処理物を傷めることなく、その
表面に付着した有機汚染物質を除去し、またその表面に
酸化膜の層を形成することができるという利点がある。
2. Description of the Related Art In recent years, techniques for cleaning or modifying the surface of an object to be processed, such as a metal, a semiconductor material, or glass, by utilizing the cooperative action of ultraviolet light and ozone have been widely studied. This technique is commonly known as the UV ozone method. According to the UV ozone method, there is an advantage that the organic contaminants adhering to the surface can be removed and an oxide film layer can be formed on the surface without damaging the object.

【0003】UVオゾン法では、低圧水銀ランプから放
射される紫外光である185nmの光を、酸素を含む空
気或いは酸素ガスに照射してオゾンを発生させる。この
オゾンよりオゾンの分解ガスである活性酸素種を発生さ
せ、これを被処理物の表面に接触させる。UVオゾン法
による被処理物の洗浄においては、この接触によって被
処理物の表面に付着した有機汚染物は酸化され、二酸化
炭素や水などの低分子酸化物に変化されて、その表面上
から除去される。これによって、被処理物の表面をドラ
イ精密洗浄することができる。UVオゾン法による被処
理物の洗浄又は改質の詳細については、「オゾン利用の
新技術」(三ゆう書房、昭和61年11月20日発行)
に詳しい。
In the UV ozone method, 185 nm light, which is ultraviolet light emitted from a low-pressure mercury lamp, is irradiated on air containing oxygen or oxygen gas to generate ozone. This ozone generates active oxygen species, which is a decomposition gas of ozone, and brings it into contact with the surface of the object. In the cleaning of the object to be treated by the UV ozone method, the organic contaminants adhered to the surface of the object to be treated are oxidized by this contact, converted into low molecular oxides such as carbon dioxide and water, and removed from the surface. Is done. As a result, the surface of the workpiece can be dry-precisely cleaned. For details of the cleaning or reforming of the object to be treated by the UV ozone method, see "New technology using ozone" (Miyu Shobo, issued November 20, 1986).
Familiar with.

【0004】一方で、低圧水銀ランプは、その特徴的な
輝線のため前記UVオゾン洗浄方法の普及に大きく貢献
していたが、近年、より効率の良いUVオゾン洗浄が行
える光源として誘電体バリアエキシマランプが知られる
ようになり、UVオゾン洗浄光源として従来の低圧水銀
ランプからの置き換えが進んでいる。誘電体バリアエキ
シマランプは低圧水銀ランプの欠点であった基板への熱
放射と点灯性能などの問題を解消し、更にはより短波長
の輝線を持つため、有機化合物の切断に優れ、活性酸素
の生成をより効率良く行うことができるという利点があ
る。
On the other hand, low-pressure mercury lamps have greatly contributed to the spread of the above-mentioned UV ozone cleaning method because of their characteristic bright lines. However, in recent years, a dielectric barrier excimer has been used as a light source capable of performing more efficient UV ozone cleaning. Lamps have become known and replacement of conventional low-pressure mercury lamps as UV ozone cleaning light sources is in progress. Dielectric barrier excimer lamps eliminate the drawbacks of low-pressure mercury lamps, such as heat radiation to substrates and lighting performance. There is an advantage that generation can be performed more efficiently.

【0005】図3は、従来の誘電体バリアエキシマラン
プを用いた紫外光照射装置の一構成例を示している。図
に示すように、ランプ装置60は、金属容器61内にエ
キシマランプ62を備える。エキシマランプ62は、石
英ガラスからなる内筒管62aと外筒管62bの間の空
間にキセノンなどの放電用ガス63を封入し、交流電源
64によりその内外に設けた電極62c及び62d(外
側の電極は網目状)間に高電圧を印加し、これによって
紫外光を放射する。すなわち、高電圧を印加された誘電
体である石英ガラスは、誘電体バリア放電(無声放電)
により微小放電を生成し、そのエネルギーによって内部
に封入された放電用ガス63を励起、結合させ、その励
起状態のガス分子が基底状態に戻る過程でガス特有の波
長の光を放射するものである。
FIG. 3 shows an example of the configuration of a conventional ultraviolet light irradiation device using a dielectric barrier excimer lamp. As shown in the figure, the lamp device 60 includes an excimer lamp 62 in a metal container 61. In the excimer lamp 62, a discharge gas 63 such as xenon is sealed in a space between an inner tube 62a and an outer tube 62b made of quartz glass, and electrodes 62c and 62d (outside electrodes) provided inside and outside thereof by an AC power supply 64. A high voltage is applied between the electrodes (mesh-like), thereby emitting ultraviolet light. That is, quartz glass, which is a dielectric to which a high voltage is applied, causes dielectric barrier discharge (silent discharge).
A small discharge is generated, and the energy thereof excites and combines the discharge gas 63 enclosed therein, and emits light having a wavelength specific to the gas in the process of returning the excited gas molecules to the ground state. .

【0006】ランプ装置60の金属容器61には、合成
石英ガラスからなる光透過窓65が備えられ、エキシマ
ランプ62にから放射された紫外光はここを透過して被
処理物Wへ照射される。金属容器61内には、常時窒素
などの不活性ガスが毎分数リットル程度流入され、これ
によってエキシマランプ62からの紫外光の減衰を最小
に抑えるようにしている。光透過窓65から容器外へ出
た紫外光は、被処理物Wの置かれた酸素を含む雰囲気内
で、その光化学反応によってオゾン及び特性酸素種を生
成してこれを被処理物Wの表面に接触させ、また直接的
にこの紫外光を被処理物に照射させ、これらの協同作業
で被処理物表面の洗浄又は改質が達成される。
The metal container 61 of the lamp device 60 is provided with a light transmitting window 65 made of synthetic quartz glass, and the ultraviolet light radiated from the excimer lamp 62 is transmitted therethrough to irradiate the workpiece W. . An inert gas such as nitrogen is constantly introduced into the metal container 61 at a rate of several liters per minute, so that the attenuation of the ultraviolet light from the excimer lamp 62 is minimized. The ultraviolet light that has exited from the container through the light transmission window 65 generates ozone and characteristic oxygen species by a photochemical reaction in an oxygen-containing atmosphere in which the object W is placed, and generates the ozone and the characteristic oxygen species on the surface of the object W. , And the object is irradiated with the ultraviolet light directly, and the cleaning or modification of the surface of the object is achieved by the cooperative operation.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、前記従
来の紫外光照射装置においては、以下のような問題があ
った。
However, the conventional ultraviolet light irradiation apparatus has the following problems.

【0008】(1)前記金属容器61内の空間は不活性
ガスで充填されているため、該金属容器内においては紫
外光の減衰は抑えられるものの、光透過窓65と被処理
物Wとの間の空間は大気雰囲気にあり、この空間におい
て紫外光は酸素により吸収され減衰する。これによって
紫外光の直接照射による被処理物表面の洗浄又は改質の
効果が低下する。
(1) Since the space inside the metal container 61 is filled with an inert gas, the attenuation of the ultraviolet light is suppressed in the metal container, but the space between the light transmitting window 65 and the workpiece W is not increased. The space between them is in the atmosphere, in which ultraviolet light is absorbed and attenuated by oxygen. As a result, the effect of cleaning or modifying the surface of the workpiece by direct irradiation with ultraviolet light is reduced.

【0009】(2)前記合成石英からなる光透過窓65
には、紫外光の照射により、僅かの鉄やマンガン等の不
純物によってカラーセンターが生じ黒化するいわゆるソ
ラリゼーションが発生する。ソラリゼーションにより紫
外光の透過光量は減衰し、その結果、被処理物表面の洗
浄又は改質の効果が低下する。
(2) Light transmitting window 65 made of the synthetic quartz
The so-called solarization, in which a color center is generated due to slight impurities such as iron and manganese due to irradiation of ultraviolet light, and blackening occurs. The amount of transmitted ultraviolet light is attenuated by the solarization, and as a result, the effect of cleaning or modifying the surface of the object to be treated is reduced.

【0010】(3)エキシマランプによる洗浄又は改質
の効果を上げるためには、被処理物Wに対してエキシマ
ランプ62をできるだけ接近させることが好ましいが、
この間には所定厚さの光透過窓65が介在しているた
め、その距離には限界がある。
(3) In order to enhance the effect of cleaning or reforming by the excimer lamp, it is preferable to bring the excimer lamp 62 as close to the workpiece W as possible.
Since the light transmission window 65 having a predetermined thickness intervenes between them, the distance is limited.

【0011】(4)UVオゾン法においては、前述した
ように、オゾン及び紫外光の直接照射による協同作用に
よって被処理物の洗浄又は改質を達成するが、紫外光の
直接照射による洗浄の効果を上げるために、光透過窓と
被処理物の間の距離を短くすると、オゾンの生成効率が
低下し、一方で、この距離を長くすると前述のよう紫外
光の照射効率が低下するという問題がある。
(4) In the UV ozone method, as described above, the object to be processed is cleaned or modified by the cooperative action of direct irradiation of ozone and ultraviolet light, but the effect of cleaning by direct irradiation of ultraviolet light is achieved. When the distance between the light transmitting window and the object to be processed is reduced to increase the efficiency, the efficiency of ozone generation decreases. On the other hand, when the distance is increased, the irradiation efficiency of ultraviolet light decreases as described above. is there.

【0012】従って本発明の目的は、被処理物の被処理
面に対して紫外光を照射してその処理を行うための紫外
光照射装置において、前記従来の問題を解決し、その処
理の効率を更に向上し、またその処理時間を短くするこ
とにある。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide an ultraviolet light irradiation apparatus for irradiating a surface to be processed of an object with ultraviolet light to perform the processing, thereby solving the above-mentioned conventional problems and improving the efficiency of the processing And to shorten the processing time.

【0013】本発明の別の目的は、比較的簡便な装置構
成によって前記目的を達成することにある。
Another object of the present invention is to achieve the above object by a relatively simple device configuration.

【0014】本発明の更に別の目的は、オゾンの生成効
率を改善し、また紫外光の直接照射の効率を改善して、
これらの協同作用によって効率的な被処理物の洗浄又は
改質を実現することができる紫外光照射装置を提供する
ことにある。
Still another object of the present invention is to improve the efficiency of ozone generation and the efficiency of direct irradiation of ultraviolet light,
It is an object of the present invention to provide an ultraviolet light irradiation device capable of realizing efficient cleaning or modification of an object to be processed by these cooperative actions.

【0015】[0015]

【課題を解決するための手段】前記目的を達成するため
本発明の紫外光照射装置は、紫外光を放射する好適には
誘電体バリアエキシマランプからなる紫外光照射光源
と、前記紫外光照射光源を収容する筐体と、前記筐体内
に窒素などの不活性ガスを導入するための不活性ガス供
給手段と、前記筐体に設けられ、前記紫外光照射光源か
らの光を前記筐体外に置かれた前記被処理物に対し照射
可能にする光透過窓であって、前記筐体内に導入された
不活性ガスを、該光透過窓と前記被処理物との間の空間
に流出させる不活性ガス流出開口を備えたものとで構成
される。
To achieve the above object, an ultraviolet light irradiating apparatus according to the present invention comprises an ultraviolet light irradiating light source, preferably comprising a dielectric barrier excimer lamp, which emits ultraviolet light, and the ultraviolet light irradiating light source. And an inert gas supply means for introducing an inert gas such as nitrogen into the housing; and a light provided from the ultraviolet light irradiation light source provided in the housing and disposed outside the housing. A light-transmitting window that enables irradiation of the object to be processed, wherein the inert gas introduced into the housing flows out into a space between the light-transmitting window and the object to be processed. A gas outlet opening.

【0016】前記紫外光照射装置においては、被処理物
に対する紫外光の照射の際に、前記不活性ガス流出開口
から筐体内の不活性ガスが流出される。これにより被処
理物に対する紫外光の照射の間、被処理物表面の雰囲気
は、該不活性ガスで満たされ、この領域での紫外光の減
衰は抑えられる。
In the ultraviolet light irradiating apparatus, when the object to be processed is irradiated with ultraviolet light, the inert gas in the housing flows out of the inert gas outflow opening. Thus, during the irradiation of the object to be processed with the ultraviolet light, the atmosphere on the surface of the object to be processed is filled with the inert gas, and the attenuation of the ultraviolet light in this region is suppressed.

【0017】本発明においては、前記不活性ガス流出開
口が、前記紫外光照射光源と前記被処理物に挟まれる前
記光透過窓の領域に形成され、これによって前記紫外光
照射光源からの光の一部が該不活性ガス流出開口を介し
て直接前記被処理物の被処理面に照射されることが好ま
しい。
In the present invention, the inert gas outflow opening is formed in a region of the light transmitting window between the ultraviolet light irradiation light source and the object to be processed, whereby light from the ultraviolet light irradiation light source is formed. It is preferable that a part of the material is irradiated directly onto the surface of the object to be processed through the inert gas outlet.

【0018】本発明の実現に際しては、光透過窓に比較
的小さ目の不活性ガス流出開口を形成し、紫外光照射光
源からの紫外光の大半が光透過窓を透過して被処理物に
与えられるよう構成することもできるが、前記構成に従
って紫外光の一部を直接的に被処理物に照射させること
によって、該紫外光の直接照射による洗浄又は改質の効
率が著しく向上する。
In implementing the present invention, a relatively small inert gas outflow opening is formed in the light transmission window, and most of the ultraviolet light from the ultraviolet light irradiation light source passes through the light transmission window and is given to the object to be processed. However, by directly irradiating a part of the ultraviolet light to the object according to the above configuration, the efficiency of the cleaning or the modification by the direct irradiation of the ultraviolet light is remarkably improved.

【0019】この場合に、前記紫外光照射光源が円筒状
のものであり、前記不活性ガス流出開口が、前記円筒状
の紫外光照射光源の径方向及び軸方向に広がる開口領域
を有する略矩形状のものであることが好ましい。
In this case, the ultraviolet light irradiation light source has a cylindrical shape, and the inert gas outflow opening has a substantially rectangular shape having an opening region extending in a radial direction and an axial direction of the cylindrical ultraviolet light irradiation light source. It is preferably of a shape.

【0020】また、前記紫外光照射光源が、前記不活性
ガス流出開口を覆うように配置され、これによって前記
不活性ガス流出開口の両側における前記紫外光照射光源
と前記光透過窓の間に、前記不活性ガスの流路を形成す
るように本発明を構成することができる。
Further, the ultraviolet light irradiation light source is disposed so as to cover the inert gas outflow opening, whereby between the ultraviolet light irradiation light source and the light transmission window on both sides of the inert gas outflow opening. The present invention can be configured to form the flow path of the inert gas.

【0021】該不活性ガスの流路によって、筐体内の不
活性ガスを指向性を持って対象の領域に流出させるよう
にすることができる。
The inert gas flow path allows the inert gas in the housing to flow into the target area with directivity.

【0022】また、本発明においては、前記紫外光照射
光源に対向する前記光透過窓の領域を、他の領域よりも
薄く形成し、前記紫外光照射光源を前記光透過窓に近接
して配置することが好ましい。
In the present invention, a region of the light transmitting window facing the ultraviolet light irradiating light source is formed thinner than other regions, and the ultraviolet light irradiating light source is arranged close to the light transmitting window. Is preferred.

【0023】このような構成を採用することによって、
紫外光照射光源と被処理物表面との接近距離をより短く
することができるようになり、本紫外光照射装置により
処理効率が更に改善される。
By adopting such a configuration,
The approach distance between the ultraviolet light irradiation light source and the surface of the processing object can be further reduced, and the processing efficiency is further improved by the ultraviolet light irradiation apparatus.

【0024】本発明の紫外光照射装置は、また、光透過
窓で仕切られた第1の室と第2の室を有する筐体と、前
記筐体の第1の室内に収容された紫外光を放射する紫外
光照射光源と、前記筐体の第1の室内に不活性ガスを導
入するための不活性ガス供給手段と、前記筐体の第2の
室内に酸素を供給する酸素供給手段と、前記筐体に設け
られ、前記紫外光照射光源からの光を前記筐体外に置か
れた前記被処理物に対し照射可能にすると共に、前記第
1の室内に導入された不活性ガスを、該光透過窓と前記
被処理物との間の空間に流出させる不活性ガス流出開口
と、前記紫外光照射光源からの光によって前記第2の室
内で生成されるオゾンを、前記被処理物の被処理面上に
流出させるオゾン流出開口とを備えて構成することがで
きる。
The ultraviolet light irradiation apparatus of the present invention also includes a housing having a first chamber and a second chamber separated by a light transmitting window, and an ultraviolet light housed in the first chamber of the housing. An ultraviolet irradiation light source that emits light, inert gas supply means for introducing an inert gas into the first chamber of the housing, and oxygen supply means for supplying oxygen to the second chamber of the housing. Provided in the housing, while allowing the light from the ultraviolet light irradiation light source to irradiate the object to be processed placed outside the housing, the inert gas introduced into the first chamber, An inert gas outflow opening that flows out into a space between the light transmitting window and the processing object, and ozone generated in the second chamber by light from the ultraviolet light irradiation light source, to generate ozone in the processing object. An ozone outflow opening that allows the ozone to flow out onto the surface to be processed.

【0025】前記構成を備えた紫外光照射装置において
は、前記室内に供給された酸素と紫外光照射光源からの
紫外光によってオゾンが生成され、前記オゾン流出開口
から被処理物表面に供給される。該オゾンの供給によっ
て、被処理物表面上のオゾン濃度が向上し、その洗浄及
び改質は一層効率的に行われるようになる。
In the ultraviolet light irradiating apparatus having the above structure, ozone is generated by the oxygen supplied into the room and the ultraviolet light from the ultraviolet light irradiating light source, and is supplied to the surface of the processing object from the ozone outflow opening. . By the supply of the ozone, the ozone concentration on the surface of the object to be treated is improved, and the cleaning and the modification are performed more efficiently.

【0026】前記紫外光照射装置において本発明は、ま
た、前記光透過窓に対し前記被処理物を所定の接近距離
で支承可能とする基台と、前記光透過窓に対する被処理
物との所定の接近距離を維持しながら、前記基台と前記
筐体とを、前記紫外光照射光源の径方向に相対的に移動
させる移動手段とを備えて構成することが好ましい。
In the ultraviolet light irradiation apparatus, the present invention also provides a base for enabling the object to be supported at a predetermined close distance with respect to the light transmitting window, and a predetermined position between the base and the light transmitting window. It is preferable to include a moving unit that relatively moves the base and the housing in the radial direction of the ultraviolet light irradiation light source while maintaining the approach distance.

【0027】この場合において、前記オゾン流出開口
が、前記被処理物の移動方向における前記不活性ガス流
出開口の下流側に位置していることが好ましい。
In this case, it is preferable that the ozone outlet is located downstream of the inert gas outlet in the moving direction of the object.

【0028】UVオゾン法においては、紫外光を被処理
物表面の有機化合物に照射することによって化学結合を
切断し、これらをオゾンや活性酸素種の酸化力によって
飛散除去させる。本構成による紫外光照射装置に従え
ば、不活性ガス流出開口下の位置で、紫外光の照射によ
り切断分離された有機化合物は、その下流側のオゾン流
出開口下の位置に移動されたときに、ここで飛散除去さ
れることとなる。
In the UV ozone method, chemical bonds are broken by irradiating an organic compound on the surface of an object with ultraviolet light, and these are scattered and removed by the oxidizing power of ozone and active oxygen species. According to the ultraviolet light irradiation device according to this configuration, the organic compound cut and separated by the irradiation of the ultraviolet light at the position below the inert gas outflow opening is moved to a position below the ozone outflow opening on the downstream side thereof. Are scattered and removed here.

【0029】また、本発明においては、前記室を前記紫
外光照射光源の両側に形成し、前記オゾン流出開口を前
記被処理物の移動方向における前記不活性ガス流出開口
の両側に形成しても良い。
Further, in the present invention, the chamber may be formed on both sides of the ultraviolet light irradiation light source, and the ozone outflow opening may be formed on both sides of the inert gas outflow opening in the moving direction of the workpiece. good.

【0030】[0030]

【発明の実施の形態】以下、図示した一実施形態に基い
て本発明を詳細に説明する。以下では、被処理物として
の液晶用ガラス基板に対し、紫外光を照射してその表面
の有機汚染物を除去する紫外光照射装置を例に本発明を
説明する。図1は本発明の第1の実施形態に係る紫外光
照射装置の概略側断面図である。図に示すように本発明
の紫外光照射装置10は、エキシマランプ12を内部に
備えたランプハウス14を有する。ランプハウス14内
に設置されるエキシマランプ12は、略円柱状の外形を
有し、その円周面より紫外光を放射する。一つの実施例
において、ランプ管内の封入ガスはキセノンであり、1
72nmの紫外光を照射する。もっとも、本発明におい
ては、封入ガスとして他のもの、例えば、弗化ネオン
(108nm)、アルゴン(126nm)、クリプトン
(146nm)、弗素(154nm)、塩化アルゴン
(175nm)、弗化アルゴン(193nm)等を充填
したものを用いても良く、また、紫外光を発光領域とし
て塩化クリプトン(222nm)、弗化クリプトン(2
48nm)、塩化キセノン(308nm)、弗化キセノ
ン(351nm)等を充填したもの用いても良い。ま
た、エキシマランプ12の励起方法は、誘電体バリア放
電、高周波放電、マイクロ波、又は電子ビームの何れか
を用いることができる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail based on one embodiment shown in the drawings. Hereinafter, the present invention will be described with an example of an ultraviolet light irradiation apparatus that irradiates a glass substrate for liquid crystal as an object to be processed with ultraviolet light to remove organic contaminants on the surface thereof. FIG. 1 is a schematic side sectional view of an ultraviolet light irradiation device according to a first embodiment of the present invention. As shown in the drawing, the ultraviolet light irradiation device 10 of the present invention has a lamp house 14 having an excimer lamp 12 inside. The excimer lamp 12 installed in the lamp house 14 has a substantially cylindrical outer shape, and emits ultraviolet light from a circumferential surface thereof. In one embodiment, the fill gas in the lamp tube is xenon,
Irradiate with 72 nm ultraviolet light. In the present invention, however, other gas such as neon fluoride (108 nm), argon (126 nm), krypton (146 nm), fluorine (154 nm), argon chloride (175 nm), and argon fluoride (193 nm) are used as the sealing gas. Or the like may be used, and krypton chloride (222 nm), krypton fluoride (2
48 nm), xenon chloride (308 nm), xenon fluoride (351 nm), or the like may be used. The excimer lamp 12 can be excited by any one of a dielectric barrier discharge, a high-frequency discharge, a microwave, and an electron beam.

【0031】ランプハウス14は、またその内部に例え
ば鏡面加工されたアルミニウム製の反射ミラー16を備
える。反射ミラー16は、エキシマランプ12の上部及
び側部を覆い、エキシマランプ12の上方及び側方へ照
射された光を下方、すなわち被処理物Wへ向けて集光さ
せる。なお、ランプハウス14の内壁面を鏡面加工する
ことによって、前記反射ミラー16に代えることもでき
る。
The lamp house 14 also has a reflection mirror 16 made of, for example, mirror-finished aluminum inside thereof. The reflection mirror 16 covers the upper part and the side part of the excimer lamp 12, and condenses the light irradiated above and to the side of the excimer lamp 12 downward, that is, toward the workpiece W. The reflecting mirror 16 can be replaced by mirror-finishing the inner wall surface of the lamp house 14.

【0032】前記ランプハウス14は略密閉容器で、そ
の内部には不活性ガスが導入される。これによって、エ
キシマランプ12からの紫外光が酸素によりランプハウ
ス14内で減衰する程度を抑える。不活性ガスとして、
光を吸収しにくい窒素、アルゴン、ヘリウム、ネオンな
どを用いることができるが、コストを考慮した場合窒素
ガスが好適に用いられる。紫外光照射装置10は、前記
不活性ガスをランプハウス14内に導入するために図示
しない不活性ガスの導入装置を有している。ランプハウ
ス14は、不活性ガスを導入するためにガス導入口18
を備え、少なくとも紫外光の照射期間中、ここからラン
プハウス内に不活性ガスが導入される。不活性ガスの導
入装置は、例えば、ガスボンベ等のガス供給源、供給さ
れる不活性ガスの流量を制御するマスフローコントロー
ラ、及びガス導入口18に設けられた電磁弁を含んで構
成することができ、この場合、ガス供給源からの不活性
ガスを、マスフローコントローラによって流量制御し、
電磁弁を開閉制御してガス導入口18よりランプハウス
14内へ導く。
The lamp house 14 is a substantially closed container into which an inert gas is introduced. This suppresses the extent to which the ultraviolet light from the excimer lamp 12 is attenuated in the lamp house 14 by oxygen. As an inert gas,
Although nitrogen, argon, helium, neon, or the like, which does not easily absorb light, can be used, nitrogen gas is preferably used in consideration of cost. The ultraviolet light irradiation device 10 has an inert gas introduction device (not shown) for introducing the inert gas into the lamp house 14. The lamp house 14 has a gas inlet 18 for introducing an inert gas.
The inert gas is introduced into the lamp house from here during at least the irradiation period of the ultraviolet light. The inert gas introduction device can be configured to include, for example, a gas supply source such as a gas cylinder, a mass flow controller that controls the flow rate of the supplied inert gas, and an electromagnetic valve provided at the gas inlet 18. In this case, the flow rate of the inert gas from the gas supply source is controlled by a mass flow controller,
The solenoid valve is controlled to open and close, and is guided from the gas inlet 18 into the lamp house 14.

【0033】ランプハウス14の下面には光透過窓20
が設けられ、エキシマランプ12から放射される紫外光
は、該光透過窓20を透過して、被処理物Wの表面へ照
射される。光透過窓20として、幅広い波長領域におけ
る優れた光透過性を有する有水合成石英ガラスを用いる
ことが好ましい。エキシマランプ12内にキセノンガス
よりも更に短波長の紫外光を照射するガスを用いる場
合、透過率の減衰の少ない、フッ化カルシウム、フッ化
マグネシウム、フッ化リチウム、サファイアなどをこの
窓材として用いることができる。この光透過窓20に
は、筐体内部の不活性ガスを被処理物Wの表面上へ流出
させる不活性ガス流出開口22が形成されている。
A light transmitting window 20 is provided on the lower surface of the lamp house 14.
Is provided, and the ultraviolet light radiated from the excimer lamp 12 passes through the light transmission window 20 and irradiates the surface of the workpiece W. As the light transmission window 20, it is preferable to use water-containing synthetic quartz glass having excellent light transmittance in a wide wavelength range. When a gas that irradiates ultraviolet light having a wavelength shorter than that of xenon gas is used in the excimer lamp 12, calcium fluoride, magnesium fluoride, lithium fluoride, sapphire, or the like that has a small attenuation of transmittance is used as the window material. be able to. The light transmission window 20 has an inert gas outflow opening 22 through which an inert gas inside the housing flows out onto the surface of the workpiece W.

【0034】不活性ガス流出開口22は、エキシマラン
プ12の直下における光透過窓20の領域に形成され、
ランプの径方向及び軸方向に広がる略矩形状のものであ
る。図に示すように、該不活性ガス流出開口22によっ
て、エキシマランプ12の下面の領域は、ランプハウス
14の外側へ露出しており、ここからエキシマランプ1
2の紫外光の一部は、直接的に、すなわち光透過窓20
を介することなく、被処理物Wの表面に照射される。こ
れと共に、不活性ガス流出開口22からは、ランプハウ
ス14内に導入された不活性ガスが、被処理物Wの表面
に向けて流出される。
The inert gas outflow opening 22 is formed in the region of the light transmission window 20 immediately below the excimer lamp 12,
It is a substantially rectangular shape that extends in the radial and axial directions of the lamp. As shown in the figure, the region of the lower surface of the excimer lamp 12 is exposed to the outside of the lamp house 14 by the inert gas outflow opening 22, and the excimer lamp 1
A portion of the ultraviolet light of the second
Irradiates the surface of the processing object W without passing through. At the same time, the inert gas introduced into the lamp house 14 flows out from the inert gas outflow opening 22 toward the surface of the workpiece W.

【0035】図に示すように、エキシマランプ12は、
前記不活性ガス流出開口22をその内側から覆うよう
に、これに近接して配置され、また、不活性ガス流出開
口22の対向する辺を規定する光透過窓20の領域は、
その内側、すなわちエキシマランプ12に対向する面を
斜めにエッジ加工され、これによってエキシマランプ1
2と光透過窓20のエッジ加工された領域間に、不活性
ガスの流路24、24が形成されている。該流路24に
よってランプハウス14内の不活性ガスは、指向性を持
って不活性ガス流出開口22から被処理物Wの表面に噴
出される。該不活性ガス流出開口22から噴出された不
活性ガスによって、被処理物Wの表面上の所定範囲の領
域(不活性ガス流出開口直下及びその周辺の領域)は、
その雰囲気で満たされ、この領域に照射される紫外光
(その大半は不活性ガス流出開口22を通って直接照射
される)は、酸素による減衰を受けることがない。
As shown in the figure, the excimer lamp 12
An area of the light transmission window 20 which is disposed close to the inert gas outlet opening 22 so as to cover the inert gas outlet opening 22 from the inside thereof and defines opposite sides of the inert gas outlet opening 22,
The inside thereof, that is, the surface facing the excimer lamp 12 is obliquely edge-processed.
Inert gas passages 24 are formed between the light transmission window 20 and the edge-processed region of the light transmission window 20. The inert gas in the lamp house 14 is jetted from the inert gas outlet 22 to the surface of the workpiece W with directivity by the flow path 24. Due to the inert gas ejected from the inert gas outflow opening 22, a predetermined area on the surface of the workpiece W (the area immediately below the inert gas outflow opening and its surrounding area)
Ultraviolet light that is filled with the atmosphere and illuminates this region (most of which is directly illuminated through the inert gas outlet 22) is not attenuated by oxygen.

【0036】紫外光照射装置10は、また、ランプハウ
ス14の下に、被処理物Wを移送可能に載置し固定する
ための搬送装置26を備える。搬送装置26は、矩形状
の被処理物Wを水平方向に搬送し、エキシマランプ12
による紫外光の照射範囲を通過させる機構である。搬送
装置26は、被処理物を安定して載置し、これと共に移
動される載置台28を備える。載置台の高さ位置は、こ
れに載置される被処理物Wの上面、すなわち被処理面と
ランプハウス14の底部、すなわち光透過窓20との距
離が、10mm以下、好ましくは5〜1mmの範囲にな
るように設定される。ランプ装置と被処理面との距離を
短くすることによって、洗浄又は改質の効率が向上する
ことは当業者であれば明らかであろう。
The ultraviolet light irradiating apparatus 10 further includes a transport device 26 for placing and fixing the workpiece W so as to be transportable below the lamp house 14. The transfer device 26 transfers the rectangular workpiece W in the horizontal direction, and the excimer lamp 12
Is a mechanism for passing the ultraviolet light irradiation range. The transfer device 26 includes a mounting table 28 on which the object to be processed is stably mounted and moved together with the object. The height position of the mounting table is such that the distance between the upper surface of the object W to be mounted thereon, ie, the surface to be processed, and the bottom of the lamp house 14, ie, the light transmitting window 20, is 10 mm or less, preferably 5 to 1 mm. Is set to be within the range. It will be apparent to those skilled in the art that by shortening the distance between the lamp device and the surface to be treated, the efficiency of cleaning or reforming is improved.

【0037】図では示されていないが、少なくとも載置
台28及びその上に載置される被処理物Wは、密閉され
た処理室内に配置することが好ましい。これは、被処理
物Wへの紫外光照射により生成されるオゾンガスなどの
外部への漏洩を防止してその安全性を確保するためであ
る。また、処理室内へのガス流入口を設け、処理室内壁
をテフロン(登録商標)シートなどの弗素樹脂材で覆う
ように構成して、酸素流体を含まない塩素ガスや弗素ガ
スなどの腐食性ガスを処理室内に充填できるようにして
も良い。
Although not shown in the drawing, it is preferable that at least the mounting table 28 and the workpiece W mounted thereon are disposed in a closed processing chamber. This is to prevent the ozone gas or the like generated by the irradiation of the object W with ultraviolet light from leaking to the outside and to ensure the safety thereof. In addition, a gas inlet into the processing chamber is provided, and a wall of the processing chamber is covered with a fluorine resin material such as a Teflon (registered trademark) sheet, so that a corrosive gas such as a chlorine gas or a fluorine gas containing no oxygen fluid is provided. May be filled in the processing chamber.

【0038】次に、前記構成の紫外光照射装置10によ
り被処理物Wを洗浄する際の作用について説明する。洗
浄の実施に際し、被処理物Wは載置台28上に固定さ
れ、搬送装置26によって図中矢印方向に移送されなが
ら、ランプハウス14下を通過し、エキシマランプ12
による処理を受ける。エキシマランプ12の点灯に先立
って、ガス導入口18からランプハウス14内に不活性
ガスが導入され、その一部が不活性ガス流出開口22か
らその直下の被処理物Wの表面上に噴出される。
Next, the operation when the object to be processed W is cleaned by the ultraviolet light irradiation apparatus 10 having the above-described configuration will be described. At the time of cleaning, the workpiece W is fixed on the mounting table 28 and passes below the lamp house 14 while being transported by the transport device 26 in the direction of the arrow in FIG.
Process. Prior to the lighting of the excimer lamp 12, an inert gas is introduced into the lamp house 14 from the gas inlet 18 and a part thereof is ejected from the inert gas outflow opening 22 onto the surface of the workpiece W immediately below the same. You.

【0039】エキシマランプ12の点灯によって、その
紫外光は、一部、すなわちエキシマランプ12の下面の
領域から照射される紫外光が、不活性ガス流出開口22
から直接被処理物Wの表面に照射される。このとき、開
口22を介して照射される紫外光は、酸素や光透過窓に
よる減衰の影響を受けることがないので、効率的に被処
理物Wの表面に到達し、その表面に付着した有機化合物
の化学結合が切断される。前記不活性ガス流出開口22
の直下でその紫外光によって処理を受けた被処理物Wの
領域は、搬送装置26の送りによって、光透過窓20の
下方に移動される。この位置において、エキシマランプ
12からの紫外光は光透過窓20を介してランプハウス
14の外へ至り、先に不活性ガス流出開口22の位置で
処理を受けた被処理物Wの領域へ到達する。このとき、
光透過窓20と被処理物Wとの間の空間においては、前
記不活性ガス流出開口22から流出される不活性ガスの
濃度は低くなっており、従って該空間において、その空
間中の酸素と紫外光によってオゾンや活性酸素種が生成
されている。先に開口22おける紫外光の照射によって
被処理物Wから切断された有機化合物は、このオゾンや
活性酸素種の酸化力によって飛散除去され、効果的に洗
浄される。
When the excimer lamp 12 is turned on, a part of the ultraviolet light, that is, the ultraviolet light emitted from the region on the lower surface of the excimer lamp 12 is turned into the inert gas outflow opening 22.
From the surface of the workpiece W. At this time, since the ultraviolet light irradiated through the opening 22 is not affected by the attenuation by oxygen or the light transmission window, the ultraviolet light efficiently reaches the surface of the processing target W and the organic light adhering to the surface. The chemical bond of the compound is broken. The inert gas outlet opening 22
The area of the workpiece W that has been processed by the ultraviolet light immediately below the area is moved below the light transmission window 20 by the transport of the transport device 26. At this position, the ultraviolet light from the excimer lamp 12 reaches the outside of the lamp house 14 through the light transmission window 20 and reaches the region of the workpiece W which has been processed at the position of the inert gas outlet 22 previously. I do. At this time,
In the space between the light transmission window 20 and the workpiece W, the concentration of the inert gas flowing out from the inert gas outflow opening 22 is low. Ozone and active oxygen species are generated by ultraviolet light. The organic compound previously cut from the processing object W by the irradiation of the ultraviolet light through the opening 22 is scattered and removed by the oxidizing power of the ozone and the active oxygen species, and is effectively cleaned.

【0040】このように本実施形態における紫外光照射
装置10においては、その不活性ガス流出開口22の位
置で、被処理物Wから切断された有機化合物は、その下
流の光透過窓20の位置で、オゾン及び活性酸素種によ
って飛散除去されることとなる。なお、本実施形態にお
いては不活性ガス流出開口22の上流側においても、オ
ゾン及び活性酸素種が生成されているので、この領域に
おいても被処理物Wは洗浄される。
As described above, in the ultraviolet light irradiation device 10 according to the present embodiment, the organic compound cut from the processing object W at the position of the inert gas outflow opening 22 is positioned at the position of the light transmission window 20 downstream thereof. Then, it is scattered and removed by ozone and active oxygen species. In this embodiment, ozone and active oxygen species are also generated on the upstream side of the inert gas outflow opening 22, so that the workpiece W is also cleaned in this region.

【0041】次に、本発明の第2の実施形態について説
明する。図2は本発明の第2の実施形態に係る紫外光照
射装置の概略側断面図である。概略的に、本実施形態に
係る紫外光照射装置30は、ランプハウス32内に光透
過窓34で仕切られたオゾン生成室38を備え、先の実
施形態において光透過窓20と被処理物Wとの間の空間
で生成されるオゾンや活性酸素種を、このオゾン生成室
38で生成して被処理物Wの表面に供給するものであ
る。
Next, a second embodiment of the present invention will be described. FIG. 2 is a schematic side sectional view of an ultraviolet light irradiation device according to a second embodiment of the present invention. Schematically, the ultraviolet light irradiation device 30 according to the present embodiment includes an ozone generation chamber 38 partitioned by a light transmission window 34 in a lamp house 32, and the light transmission window 20 and the workpiece W in the previous embodiment. Ozone and active oxygen species generated in the space between the target and the target object W are generated in the ozone generation chamber 38 and supplied to the surface of the workpiece W.

【0042】図に示すように本実施形態の紫外光照射装
置30は、ランプハウス32内に光透過窓34で仕切ら
れたランプ室36及びその両側の2つのオゾン生成室3
8、38を備える。ランプ室36内には、先の実施形態
と同様にエキシマランプ40が配置されており、ここに
はガス導入口42から図示しない導入装置によって不活
性ガスが導入される。ランプ室36の下面には、先の実
施形態における光透過窓に代えて、不透光性の下面板4
4が備えられ、ここに不活性ガス流出開口46が形成さ
れている。従って、本実施形態においては、エキシマラ
ンプ40からの紫外光は、下面板44のある位置では遮
断され、不活性ガス流出開口46の位置からのみ被処理
物Wに照射される。
As shown in the figure, an ultraviolet light irradiation device 30 of this embodiment comprises a lamp house 32 in a lamp house 32 partitioned by a light transmitting window 34 and two ozone generating chambers 3 on both sides thereof.
8, 38 are provided. An excimer lamp 40 is disposed in the lamp chamber 36 as in the previous embodiment, and an inert gas is introduced from the gas inlet 42 by an introduction device (not shown). On the lower surface of the lamp chamber 36, instead of the light transmitting window in the above embodiment, a light-transmissive lower plate 4 is provided.
4 wherein an inert gas outlet opening 46 is formed. Therefore, in the present embodiment, the ultraviolet light from the excimer lamp 40 is blocked at a certain position of the lower surface plate 44 and is applied to the workpiece W only from the position of the inert gas outlet 46.

【0043】前記2つのオゾン生成室38、38には、
酸素導入口48、48が形成され、エキシマランプ40
による紫外光の照射中に、ここから酸素が導入される。
すなわち、酸素導入口48には、酸素供給源、マスフロ
ーコントローラ及び電磁弁を含んで構成される図示しな
い酸素導入装置が接続され、所定のタイミングで流量制
限された酸素がオゾン生成室38に供給される。各オゾ
ン生成室38内には、光透過窓34を介して、エキシマ
ランプ40からの紫外光が照射され、前記供給された酸
素と反応し、ここでオゾン及び活性酸素種が生成され
る。各オゾン生成室38の下面には、オゾン流出開口5
0が形成され、前記生成されたオゾン及び活性酸素種
は、ここから被処理物Wの表面に噴出される。本実施形
態において、オゾン生成室38(更には、オゾン流出開
口50)は、搬送装置52による被処理物Wの移動方向
に関し、ランプ室36(更には、不活性ガス流出開口4
6)の上流側及び下流側に配置されている。
In the two ozone generating chambers 38, 38,
The oxygen inlets 48 and 48 are formed, and the excimer lamp 40 is formed.
Oxygen is introduced from here during the irradiation of ultraviolet light.
That is, an oxygen introducing device (not shown) including an oxygen supply source, a mass flow controller, and an electromagnetic valve is connected to the oxygen introducing port 48, and oxygen whose flow rate is limited at a predetermined timing is supplied to the ozone generating chamber 38. You. Ultraviolet light from an excimer lamp 40 is irradiated into each of the ozone generation chambers 38 through the light transmission window 34 and reacts with the supplied oxygen, where ozone and active oxygen species are generated. An ozone outlet 5 is provided on the lower surface of each ozone generating chamber 38.
0 is formed, and the generated ozone and active oxygen species are ejected from here onto the surface of the workpiece W. In the present embodiment, the ozone generation chamber 38 (further, the ozone outflow opening 50) is connected to the lamp chamber 36 (further, the inert gas outflow opening 4) with respect to the moving direction of the workpiece W by the transfer device 52.
6) are arranged on the upstream side and the downstream side.

【0044】本実施形態に係る紫外光照射装置30にお
いても、先の実施形態と同様に、その中央の領域で、不
活性ガス流出開口46を通してエキシマランプ40の光
が直接被処理物Wの表面に照射され、効率的にその洗浄
が行われ、更にその同じ領域に対してこの処理の前後
で、オゾン流出開口50から噴出されるオゾンによる洗
浄が重ねて行われることとなる。本実施形態による場
合、両オゾン生成室38で生成されるオゾンの量を所望
のものに制御できるので、更に効果的に被処理物の洗浄
が行える。
In the ultraviolet light irradiating apparatus 30 according to the present embodiment, similarly to the previous embodiment, the light of the excimer lamp 40 passes directly through the inert gas outflow opening 46 to the surface of the workpiece W in the central region, as in the previous embodiment. Then, the cleaning is efficiently performed, and the same region is repeatedly cleaned with ozone ejected from the ozone outlet 50 before and after this processing. According to the present embodiment, the amount of ozone generated in the two ozone generation chambers 38 can be controlled to a desired value, so that the object can be more effectively cleaned.

【0045】なお、本実施形態においてはランプ室36
の下面を不透光性の下面板44で構成したが、先の実施
形態と同様に光透過窓によってこれを構成しても良い。
また、本発明の実施に際し、オゾン生成室38をランプ
室36の下流側のみに形成しても良い(すなわち、被処
理物が紫外光の直接照射による処理を受けた後に、オゾ
ンによる処理を受けるようにする)。
In this embodiment, the lamp chamber 36
The lower surface is formed by the light-transmissive lower plate 44, but may be formed by a light-transmitting window as in the previous embodiment.
In practicing the present invention, the ozone generation chamber 38 may be formed only on the downstream side of the lamp chamber 36 (that is, the object to be processed is subjected to the treatment by the direct irradiation of the ultraviolet light and then to the treatment with the ozone. To do).

【0046】以上、本発明の一実施形態を図面に沿って
説明した。しかしながら本発明は前記実施形態に示した
事項に限定されず、特許請求の範囲の記載に基いてその
変更、改良等が可能であることは明らかである。例え
ば、前記実施形態においては、不活性ガス流出開口を介
して不活性ガスを被処理物の表面上に流出させると共
に、該開口から紫外光が直接被処理物へ照射するように
これを比較的広く構成した。しかしながら、比較的小さ
目の不活性ガス流出開口を形成し、紫外光の大半は光透
過窓を透過して被処理物に与えられるよう構成してもよ
い。
The embodiment of the present invention has been described with reference to the drawings. However, it is apparent that the present invention is not limited to the matters described in the above embodiments, and that changes, improvements, and the like can be made based on the description in the claims. For example, in the above-described embodiment, the inert gas is caused to flow out through the inert gas outflow opening onto the surface of the object to be processed, and the inert gas is relatively emitted from the opening such that the ultraviolet light directly irradiates the object to be processed. Widely configured. However, a relatively small inert gas outflow opening may be formed so that most of the ultraviolet light passes through the light transmission window and is given to the object to be processed.

【0047】[0047]

【発明の効果】以上の如く本発明によれば、光透過窓と
被処理物との間にも効率的に不活性ガスが供給され、こ
れによって紫外光の被処理物への到達効率が改善され、
よって紫外光照射装置による処理の効率が向上し、また
その処理時間を短くすることができるようになる。
As described above, according to the present invention, an inert gas is efficiently supplied also between the light transmitting window and the object to be processed, thereby improving the efficiency of ultraviolet light reaching the object to be processed. And
Therefore, the efficiency of processing by the ultraviolet light irradiation device is improved, and the processing time can be shortened.

【0048】また、本発明によれば、不活性ガス流出開
口より光透過窓を介することなく直接紫外光を被処理物
に照射させることができ、また被処理物に対する紫外光
照射光源をより接近して配置することができるので、一
層の処理効率が期待できる。
Further, according to the present invention, the object to be processed can be directly irradiated with ultraviolet light from the inert gas outflow opening without passing through the light transmission window, and the ultraviolet light source for the object to be processed can be brought closer. Since they can be arranged in the same manner, further processing efficiency can be expected.

【0049】更に、本発明においては、紫外光照射光源
を用いてオゾンが生成され、該オゾンが被処理物の表面
に供給されるので、更に処理効率が改善される。
Further, in the present invention, ozone is generated using an ultraviolet light irradiation light source and the ozone is supplied to the surface of the object to be processed, so that the processing efficiency is further improved.

【0050】本発明に従って構成される紫外光照射装置
は、比較的簡便な構成であり、従来の装置と同等のコス
トにより前記効果を達成することができる。
The ultraviolet light irradiation device constructed according to the present invention has a relatively simple structure, and can achieve the above effects at the same cost as the conventional device.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施形態に係る紫外光照射装置
の概略側断面図である。
FIG. 1 is a schematic side sectional view of an ultraviolet light irradiation device according to a first embodiment of the present invention.

【図2】本発明の第2の実施形態に係る紫外光照射装置
の概略側断面図である。
FIG. 2 is a schematic side sectional view of an ultraviolet light irradiation device according to a second embodiment of the present invention.

【図3】従来の誘電体バリアエキシマランプを用いた紫
外光照射装置の一構成例を示す図である。
FIG. 3 is a diagram showing a configuration example of a conventional ultraviolet light irradiation device using a dielectric barrier excimer lamp.

【符号の説明】[Explanation of symbols]

W 被処理物 10 紫外光照射装置 12 エキシマランプ 14 ランプハウス 16 反射ミラー 18 ガス導入口 20 光透過窓 22 不活性ガス流出開口 24 流路 26 搬送装置 28 載置台 30 紫外光照射装置 32 ランプハウス 34 光透過窓 36 ランプ室 38 オゾン生成室 40 エキシマランプ 42 ガス導入口 44 下面板 46 不活性ガス流出開口 48 酸素導入口 50 オゾン流出開口 52 搬送装置 54 載置台 W Object to be processed 10 Ultraviolet light irradiation device 12 Excimer lamp 14 Lamp house 16 Reflector mirror 18 Gas inlet 20 Light transmission window 22 Inert gas outflow opening 24 Flow path 26 Transport device 28 Mounting table 30 Ultraviolet light irradiation device 32 Lamp house 34 Light transmission window 36 Lamp chamber 38 Ozone generation chamber 40 Excimer lamp 42 Gas inlet 44 Lower plate 46 Inert gas outlet 48 Oxygen inlet 50 Ozone outlet 52 Transfer device 54 Mounting table

Claims (11)

【特許請求の範囲】[Claims] 【請求項1】 被処理物の被処理面に対して紫外光を照
射してその処理を行うための紫外光照射装置において、 紫外光を放射する紫外光照射光源と、 前記紫外光照射光源を収容する筐体と、 前記筐体内に不活性ガスを導入するための不活性ガス供
給手段と、 前記筐体に設けられ、前記紫外光照射光源からの光を前
記筐体外に置かれた前記被処理物に対し照射可能にする
光透過窓であって、前記筐体内に導入された不活性ガス
を、該光透過窓と前記被処理物との間の空間に流出させ
る不活性ガス流出開口を備えたものと、を備えた紫外光
照射装置。
1. An ultraviolet light irradiation apparatus for irradiating an object to be treated with ultraviolet light by irradiating the object with ultraviolet light, comprising: an ultraviolet light irradiation light source that emits ultraviolet light; A housing for accommodating, an inert gas supply means for introducing an inert gas into the housing, and a cover provided on the housing and receiving light from the ultraviolet light source outside the housing. A light transmission window that enables irradiation of a processing object, and an inert gas outflow opening that allows an inert gas introduced into the housing to flow out into a space between the light transmission window and the processing object. And an ultraviolet light irradiation device comprising:
【請求項2】 前記不活性ガス流出開口が、前記紫外光
照射光源と前記被処理物に挟まれる前記光透過窓の領域
に形成され、これによって前記紫外光照射光源からの光
の一部が該不活性ガス流出開口を介して直接前記被処理
物の被処理面に照射される請求項1に記載の紫外光照射
装置。
2. The method according to claim 1, wherein the inert gas outflow opening is formed in a region of the light transmission window sandwiched between the ultraviolet light irradiation light source and the object, so that a part of the light from the ultraviolet light irradiation light source is formed. The ultraviolet light irradiation apparatus according to claim 1, wherein the surface of the object to be processed is irradiated directly through the inert gas outlet.
【請求項3】 前記紫外光照射光源が円筒状のものであ
り、前記不活性ガス流出開口が、前記円筒状の紫外光照
射光源の径方向及び軸方向に広がる開口領域を有する略
矩形状のものである請求項1又は2に記載の紫外光照射
装置。
3. The ultraviolet light irradiating light source is cylindrical, and the inert gas outflow opening has a substantially rectangular shape having an opening region extending in a radial direction and an axial direction of the cylindrical ultraviolet light irradiating light source. The ultraviolet light irradiation device according to claim 1, wherein the ultraviolet light irradiation device is a device.
【請求項4】 前記紫外光照射光源が、前記不活性ガス
流出開口を覆うように配置され、これによって前記不活
性ガス流出開口の両側における前記紫外光照射光源と前
記光透過窓の間に、前記不活性ガスの流路を形成した請
求項3に記載の紫外光照射装置。
4. The ultraviolet light irradiation light source is disposed so as to cover the inert gas outflow opening, whereby between the ultraviolet light irradiation light source and the light transmission window on both sides of the inert gas outflow opening, The ultraviolet light irradiation device according to claim 3, wherein a flow path of the inert gas is formed.
【請求項5】 前記紫外光照射光源に対向する前記光透
過窓の領域を、他の領域よりも薄く形成し、前記紫外光
照射光源を前記光透過窓に近接して配置した請求項4に
記載の紫外光照射装置。
5. The apparatus according to claim 4, wherein a region of the light transmission window facing the ultraviolet light irradiation light source is formed thinner than another region, and the ultraviolet light irradiation light source is arranged close to the light transmission window. The ultraviolet light irradiation device as described in the above.
【請求項6】 前記光透過窓に対し前記被処理物を所定
の接近距離で支承可能とする基台と、 前記光透過窓に対する被処理物との所定の接近距離を維
持しながら、前記基台と前記筐体とを、前記紫外光照射
光源の径方向に相対的に移動させる移動手段と、を更に
備えた請求項1〜5の何れかに記載の紫外光照射装置。
6. A base capable of supporting the object to be processed at a predetermined close distance to the light transmitting window; and a base while maintaining a predetermined distance between the object to be processed and the light transmitting window. The ultraviolet light irradiation device according to any one of claims 1 to 5, further comprising a moving unit that relatively moves the table and the housing in a radial direction of the ultraviolet light irradiation light source.
【請求項7】 被処理物の被処理面に対して紫外光を照
射してその処理を行うための紫外光照射装置において、 光透過窓で仕切られた第1の室と第2の室を有する筐体
と、 前記筐体の第1の室内に収容された紫外光を放射する紫
外光照射光源と、 前記筐体の第1の室内に不活性ガスを導入するための不
活性ガス供給手段と、 前記筐体の第2の室内に酸素を供給する酸素供給手段
と、 前記筐体に設けられ、前記紫外光照射光源からの光を前
記筐体外に置かれた前記被処理物に対し照射可能にする
と共に、前記第1の室内に導入された不活性ガスを、該
光透過窓と前記被処理物との間の空間に流出させる不活
性ガス流出開口と、 前記紫外光照射光源からの光によって前記第2の室内で
生成されるオゾンを、前記被処理物の被処理面上に流出
させるオゾン流出開口と、を備えた紫外光照射装置。
7. An ultraviolet light irradiation apparatus for irradiating an object to be processed with ultraviolet light by irradiating the surface with the ultraviolet light, wherein the first chamber and the second chamber separated by a light transmitting window are provided. A housing having: an ultraviolet light irradiation light source that emits ultraviolet light accommodated in a first room of the housing; and an inert gas supply unit for introducing an inert gas into the first room of the housing. Oxygen supply means for supplying oxygen into the second chamber of the housing; and irradiating light from the ultraviolet light irradiation light source provided on the housing to the object placed outside the housing. And an inert gas outflow opening for allowing the inert gas introduced into the first chamber to flow out into the space between the light transmitting window and the object to be processed; Causing ozone generated in the second chamber by light to flow out onto the surface of the object to be processed; And an ozone outflow opening.
【請求項8】 前記紫外光照射光源が円筒状のものであ
り、前記不活性ガス流出開口が、前記円筒状の紫外光照
射光源の径方向及び軸方向に広がる開口領域を有する略
矩形状のものである請求項7に記載の紫外光照射装置。
8. The ultraviolet light irradiation light source has a cylindrical shape, and the inert gas outflow opening has a substantially rectangular shape having an opening region extending in a radial direction and an axial direction of the cylindrical ultraviolet light irradiation light source. The ultraviolet light irradiation device according to claim 7, wherein the ultraviolet light irradiation device is used.
【請求項9】 前記光透過窓に対し前記被処理物を所定
の接近距離で支承可能とする基台と、 前記光透過窓に対する被処理物との所定の接近距離を維
持しながら、前記基台と前記筐体とを、前記紫外光照射
光源の径方向に相対的に移動させる移動手段と、を更に
備えた請求項7又は8に記載の紫外光照射装置。
9. A base for supporting the object to be processed at a predetermined close distance to the light transmitting window; and a base while maintaining a predetermined close distance between the object to be processed and the light transmitting window. 9. The ultraviolet light irradiation device according to claim 7, further comprising a moving unit that relatively moves the table and the housing in a radial direction of the ultraviolet light irradiation light source. 10.
【請求項10】 前記オゾン流出開口が、前記被処理物
の移動方向における前記不活性ガス流出開口の下流側に
位置している請求項9に記載の紫外光照射装置。
10. The ultraviolet light irradiation apparatus according to claim 9, wherein the ozone outflow opening is located downstream of the inert gas outflow opening in the moving direction of the workpiece.
【請求項11】 前記第2の室が前記紫外光照射光源の
両側に形成され、前記オゾン流出開口が前記被処理物の
移動方向における前記不活性ガス流出開口の両側に形成
されている請求項9に記載の紫外光照射装置。
11. The second chamber is formed on both sides of the ultraviolet light irradiation light source, and the ozone outflow opening is formed on both sides of the inert gas outflow opening in the moving direction of the processing object. 10. The ultraviolet light irradiation device according to 9.
JP2000123581A 2000-04-25 2000-04-25 Ultraviolet irradiation device Pending JP2001300451A (en)

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DE102017203351A1 (en) 2017-03-01 2018-09-06 Süss Microtec Photomask Equipment Gmbh & Co. Kg Device for applying a liquid medium exposed to UV radiation to a substrate
DE102017203351B4 (en) 2017-03-01 2021-08-05 Süss Microtec Photomask Equipment Gmbh & Co. Kg Device for applying a liquid medium exposed to UV radiation to a substrate
RU2756470C2 (en) * 2017-03-01 2021-09-30 Зюсс Микротек Фотомаск Эквипмент Гмбх Унд Ко. Кг Device for applying liquid medium loaded with ultraviolet radiation to substrate
CN110402170A (en) * 2017-03-01 2019-11-01 休斯微科光罩仪器股份有限公司 Device for being coated on the liquid medium to substrate irradiated by ultraviolet light

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