CN112098737A - Method and device for measuring microwave electric field intensity - Google Patents
Method and device for measuring microwave electric field intensity Download PDFInfo
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Abstract
The invention provides a method and a device for measuring the intensity of a microwave electric field, wherein the method for measuring the intensity of the microwave electric field comprises the following steps: the method is based on the quantum superheterodyne principle, has clear principle and is easy to realize and apply, and utilizes the Reidberg atoms as a microwave sensitive medium to realize high-sensitivity measurement on the microwave electric field intensity.
Description
Technical Field
The invention relates to the field of microwave electric field intensity measurement, in particular to a method and a device for measuring microwave electric field intensity.
Background
High sensitivity measurement of microwave electric field strength plays an important role in astronomy, communication, radar, and other fields. At present, the microwave electric field intensity is generally measured by using traditional sensor equipment such as an antenna, an electric field probe and the like, and the detection sensitivity is about 1V/m. In recent years, with the development of quantum technology, research on a microwave electric field strength high-sensitivity measurement method using quantum technology is being attempted internationally.
The microwave electric field intensity measurement scheme based on the quantum EIT-AT effect is limited by the width of a detection light transparent window, the width of the detection light window is influenced by factors such as laser line width, photon shot noise, and Reedberg atom decoherence, and the like, and the precise measurement of an extremely weak microwave electric field is difficult to realize.
Therefore, a measurement method is needed to solve the above problems.
Disclosure of Invention
In order to solve at least one of the above problems, an aspect of the present invention provides a method for measuring the intensity of a microwave electric field, wherein atoms in a rydberg state are located at positions where a local microwave electric field and a signal microwave electric field to be measured can be induced; and receiving a detection signal of a set frequency band or frequency after the atoms are irradiated by the detection light by using a detector so as to determine the intensity of the microwave electric field of the signal according to the detection signal.
Further, the calculation formula of the microwave electric field intensity is as follows:
|E|＝Elocal area+ESignalcos(Δωt+Δφ)
Wherein E isLocal areaFor local microwave electric field amplitude, ESignalThe amplitude of the signal microwave electric field is shown, delta omega is the frequency difference between the local microwave and the signal microwave, delta phi is the phase difference between the local microwave and the signal microwave, and the phase difference between the local microwave electric field and the signal microwave electric field is constant.
In some embodiments, the set frequency band or frequency is generated according to the frequencies of the local microwave electric field and the signal microwave electric field to be measured; or, further comprising: and acquiring the set frequency band or frequency.
In some embodiments, the set atoms are excited using the coupled light and the probe light to obtain the atoms.
In certain embodiments, the atom is a base atom.
The embodiment of the second aspect of the invention provides a device for measuring the intensity of a microwave electric field, which comprises an atomic gas chamber, a measuring device and a control device, wherein atoms excited to a rydberg state are contained in the atomic gas chamber, and the atomic gas chamber is positioned at a position capable of inducing a local microwave electric field and a signal microwave electric field to be measured; and the detector is used for receiving a detection signal of a set frequency band or frequency after the atoms are irradiated by the detection light so as to determine the intensity of the microwave electric field of the signal according to the detection signal.
In some embodiments, the method further comprises a rydberg state atom excitation component for exciting atoms in the atom gas chamber to the rydberg state.
In some embodiments, the rydberg state atom excitation assembly includes a probe light optical path unit and a coupling light optical path unit, which cooperate to excite atoms in the two-photon excitation atom gas chamber to a rydberg state.
In some embodiments, the probe light path unit includes: the linear polarization detection light emitted by the detection light laser enters the atomic gas chamber after passing through the first half-wave plate, the first laser isolator, the second half-wave plate, the first polarization beam splitting prism, the first reflector and the third half-wave plate in sequence;
the coupled light path unit includes: the linear polarization coupling light emitted by the coupling light laser enters the atomic gas chamber after passing through the sixth half-wave plate, the second laser isolator, the fifth half-wave plate, the third polarization beam splitting prism and the dichroic mirror in sequence;
and the detection light passes through the atomic gas chamber, then sequentially passes through the dichroic mirror and the fourth half-wave plate and then enters the detector.
In some embodiments, the detector is a balanced homodyne detector, and the detection light generated by the balanced homodyne detector is split into two beams by the beam splitter, wherein one beam enters the balanced homodyne detector, and the other beam enters the balanced homodyne detector after being reflected by the second reflecting mirror.
The invention has the beneficial effects that:
the invention provides a method and a device for measuring the intensity of a microwave electric field, wherein the method for measuring the intensity of the microwave electric field comprises the following steps: the method is based on the quantum superheterodyne principle, has clear principle and is easy to realize and apply, and utilizes the Reidberg atoms as a microwave sensitive medium to realize high-sensitivity measurement on the microwave electric field intensity.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic diagram illustrating a method for measuring the electric field intensity of a microwave in an embodiment of the present invention.
Fig. 2 is a schematic view showing a device for measuring the intensity of a microwave electric field in the embodiment of the present invention.
Reference numeral, 1, probe light laser of fig. 2; 2. a first 1/2 wave plate; 3. a first laser isolator; 4. a second 1/2 wave plate; 5. a first polarization beam splitter prism; 6. a first reflector; 7. a third 1/2 wave plate; 8. a base atom gas cell; 9. a local microwave module; 10. a signal microwave module; 11. a dichroic mirror; 12. a fourth 1/2 wave plate; 13. a second polarization beam splitter prism; 14. a second reflector; 15. a balanced homodyne detector; 16. a third polarization beam splitter prism; 17. a fifth 1/2 wave plate; 18. a second laser isolator; 19. a sixth 1/2 wave plate; 20. a coupled light laser.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
As shown in fig. 1, the present invention provides a method for measuring microwave electric field intensity, comprising the following steps:
s11: arranging atoms in a rydberg state at a position where a local microwave electric field and a signal microwave electric field to be detected can be induced;
s12: and receiving a detection signal of a set frequency band or frequency after the atoms are irradiated by the detection light by using a detector so as to determine the intensity of the microwave electric field of the signal according to the detection signal.
The invention provides a method for measuring the intensity of a microwave electric field, which is characterized in that atoms in a Reedberg state are arranged at positions which can induce a local microwave electric field and a signal microwave electric field to be measured; the measuring method is based on the quantum superheterodyne principle, and realizes high-sensitivity measurement on the microwave electric field intensity by using the Reedberg atoms as microwave sensitive media.
It is obvious to those skilled in the art that the rydberg atom refers to a state of an atom in which an electron in the atom is excited to a large-sized orbit compared with an ion entity, which has a high number of principal quanta.
In some embodiments, the present invention may use the preset rydberg state atoms, or may excite the atoms of the atomic gas chamber to the rydberg state by excitation, which is not limited herein.
It will be appreciated that the rydberg regime requires two beams to be formed by two-photon excitation, which may include probe light or may be separate beams.
Preferably, the coupling light and the detection light couple light to excite atoms in the atom gas chamber to a rydberg state by two-photon excitation.
Preferably, the atoms in the atomic gas cell are rubidium atoms.
Further, the microwave electric field intensity calculation formula is as follows:
|E|＝Elocal area+ESignalcos(Δωt+Δφ)
Wherein E isLocal areaFor local microwave electric field amplitude, ESignalThe amplitude of the signal microwave electric field is shown, delta omega is the frequency difference between the local microwave and the signal microwave, and delta phi is the phase difference between the local microwave and the signal microwave.
Furthermore, the phase difference between the local microwave electric field and the signal microwave electric field is constant.
In some embodiments, the signal in the probe light of the present invention is a signal having a frequency equal to a frequency difference between a local microwave electric field and a signal microwave electric field, and the present invention may generate the set frequency band or frequency according to the frequencies of the local microwave electric field and the signal microwave electric field to be measured; or, further comprising: and acquiring the set frequency band or frequency without limitation.
Preferably, the signal frequency in the probe light is 100 kHz.
Further, a detector is used for receiving a detection signal of a set frequency band or frequency after the atoms are irradiated by the detection light, so that the intensity of the microwave electric field of the signal is determined according to the detection signal.
Preferably, the detector is a balanced homodyne detector, the detection light generated by the balanced homodyne detector is divided into two beams by the beam splitter, one beam enters the balanced homodyne detector, and the other beam enters the balanced homodyne detector after being reflected by the second reflector, so that the measurement of the sensitivity of the microwave electric field intensity is realized.
It can be seen from the foregoing embodiments that the present invention provides a method for measuring the intensity of a microwave electric field, which comprises disposing atoms in a rydberg state at a position where a local microwave electric field and a signal microwave electric field to be measured can be induced, then a detector is used for receiving detection signals of a set frequency band or frequency after the atoms are irradiated by the detection light, the measuring method of the invention is based on the quantum superheterodyne principle and utilizes the rydberg atoms as the microwave sensitive medium to realize the high-sensitivity measurement of the microwave electric field intensity, the method not only can obviously improve the measurement sensitivity of the microwave electric field intensity, has clear principle and simple structure, is easy to realize and apply, breaks through the existing indexes, and realizes the purpose of improving the measurement precision of the microwave electric field by one order of magnitude, thereby providing a new technical basis for the precise measurement research of the microwave electric field intensity.
Based on the same inventive concept, another aspect of the present invention provides a measuring apparatus for microwave electric field intensity, as shown in fig. 2, and the following describes in detail the structure and measuring method of the measuring apparatus for microwave electric field intensity shown in fig. 2.
As shown in fig. 2, in the measuring device for the microwave electric field intensity, linearly polarized light emitted by a detection light laser 1 passes through a first half-wave plate 2 and a first laser isolator 3, so that the working mode of the detection light laser 1 is not affected by feedback of a subsequent light path; the detection light passes through the second half-wave plate 4 and the first polarization beam splitter prism 5 and is used for adjusting the light intensity of the detection light; the detection light is reflected by the first reflector 6 and then enters the alkali atom gas chamber 8 through the third half-wave plate 7;
the linearly polarized probe light emitted by the coupled light laser 20 passes through the sixth half-wave plate 19 and the second laser isolator 18, so that the working mode of the coupled light laser 20 is not influenced by feedback of a subsequent light path; the coupling light passes through a fifth half-wave plate 17 and a third polarization beam splitter prism 16 and is used for adjusting the light intensity of the detection light; the coupling light is reflected by the dichroic mirror 11 and enters the alkali atom gas chamber 8, and atoms in the alkali atom gas chamber 8 are excited to a Reidberg state by the coupling light and the detection light through two-photon excitation;
the local microwave module 9 is used for generating a local microwave electric field in the alkali atom gas chamber 8, the signal microwave module is used for generating a signal microwave electric field in the alkali atom gas chamber 8, the signal microwave electric field is coupled and resonated at an atomic level, and the phase difference between the local microwave electric field and the signal microwave electric field is constant;
after passing through the dichroic mirror 11, the detection light is divided into two beams through the fourth half-wave plate 12 and the second polarization beam splitter prism 13, one beam directly enters the balanced homodyne detector 15, the other beam enters the balanced homodyne detector 15 after being reflected by the second reflecting mirror 14, and finally high-sensitivity measurement on the microwave electric field intensity is realized.
As is clear to a person skilled in the art, the half-wave plate is used for rotating linearly polarized light, because linearly polarized light is perpendicularly incident to the half-wave plate, transmitted light is still linearly polarized light, and if the included angle between the vibration plane and the main cross section of the crystal is theta during incidence, the vibration plane of the linearly polarized light which is transmitted is rotated by an angle of 2 theta from the original direction. In the present invention, the number of the half-wave plates on the detection light path and the coupling light path may be two, three or one, and the present invention is not limited thereto.
It is understood that the detection light laser and the coupling light laser emit linearly polarized light.
As is clear to those skilled in the art, the linearly polarized light vibrates in the light propagation direction, the light vector vibrates only in a fixed direction, and the locus of the end points of the light vector is a straight line. The direction of the light vector and the propagation direction of the light form a plane, and the vibration plane of the linearly polarized light is fixed and cannot rotate.
In the specific implementation mode of the invention, the balanced homodyne detector is used for subtracting quantum noise, has special effects of low noise and high sensitivity, and can effectively detect the electric field intensity.
Preferably, the wavelength of the detection light generated by the detection light laser 1 is 780nm, and the ultrastable cavity frequency stabilization method is used for realizing the stabilization of the laser frequency of the detection light and the narrowing of the laser line width;
preferably, the wavelength of the coupling light generated by the coupling light laser 20 is 480nm, and the laser frequency of the coupling light is stabilized and the line width of the laser is narrowed by using an ultrastable cavity frequency stabilization method;
preferably, the local microwave electric field is constant out of phase with the signal microwave electric field.
As can be seen from the above embodiments, the present invention provides a device for measuring the intensity of a microwave electric field, which is capable of locating atoms in a Reedberg state at a position where a local microwave electric field and a signal microwave electric field to be measured can be induced, then a detector is used for receiving detection signals of a set frequency band or frequency after the atoms are irradiated by the detection light, the measuring method of the invention is based on the quantum superheterodyne principle and utilizes the rydberg atoms as the microwave sensitive medium to realize the high-sensitivity measurement of the microwave electric field intensity, the method not only can obviously improve the measurement sensitivity of the microwave electric field intensity, has clear principle and simple structure, is easy to realize and apply, breaks through the existing indexes, and realizes the purpose of improving the measurement precision of the microwave electric field by one order of magnitude, thereby providing a new technical basis for the precise measurement research of the microwave electric field intensity.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments can be referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, as for the apparatus embodiment, since it is substantially similar to the method embodiment, the description is relatively simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
In the description of the present specification, reference to the description of the terms "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the embodiments of the present specification. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example.
Furthermore, the various embodiments or examples and features of the various embodiments or examples described in this specification can be combined and combined by those skilled in the art without contradiction. The above description is only an embodiment of the present disclosure, and is not intended to limit the present disclosure. Various modifications and changes may occur to those skilled in the art to which the embodiments of the present disclosure pertain. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the embodiments of the present specification should be included in the scope of the claims of the embodiments of the present specification.
Claims (10)
1. A method for measuring the electric field intensity of a microwave is characterized by comprising the following steps:
arranging atoms in a rydberg state at a position where a local microwave electric field and a signal microwave electric field to be detected can be induced;
and receiving a detection signal of a set frequency band or frequency after the atoms are irradiated by the detection light by using a detector so as to determine the intensity of the microwave electric field of the signal according to the detection signal.
2. The method of claim 1, wherein the microwave electric field strength is calculated as follows:
|E|＝Elocal area+ESignalcos(Δωt+Δφ)
Wherein E isLocal areaFor local microwave electric field amplitude, ESignalThe amplitude of the signal microwave electric field, delta omega is the frequency difference between the local microwave and the signal microwave, and delta phi is the costThe phase difference between the ground microwave and the signal microwave is constant.
3. The measurement method according to claim 1, further comprising:
generating the set frequency band or frequency according to the frequency of the local microwave electric field and the frequency of the signal microwave electric field to be detected; or, further comprising: and acquiring the set frequency band or frequency.
4. The measurement method according to claim 1, further comprising:
and exciting the set atoms by using the coupling light and the detection light to obtain the atoms.
5. The method of measurement according to claim 1, wherein the atom is a base atom.
6. A device for measuring the intensity of a microwave electric field, comprising:
the atomic gas chamber is used for containing atoms excited to a rydberg state and is positioned at a position where a local microwave electric field and a signal microwave electric field to be detected can be induced;
and the detector receives a detection signal of a set frequency band or frequency after the atoms are irradiated by the detection light so as to determine the intensity of the microwave electric field of the signal according to the detection signal.
7. The measurement device of claim 6, further comprising:
and the rydberg state atom excitation assembly excites atoms in the atom gas chamber to the rydberg state.
8. The measurement device of claim 7, further comprising:
the rydberg state atom excitation component comprises a detection light optical path unit and a coupling light optical path unit, wherein the detection light optical path unit and the coupling light optical path unit are matched to excite atoms in an atom air chamber to a rydberg state through two photons.
9. The measurement device of claim 8,
the probe light path unit includes: the linear polarization detection light emitted by the detection light laser enters the atomic gas chamber after passing through the first half-wave plate, the first laser isolator, the second half-wave plate, the first polarization beam splitting prism, the first reflector and the third half-wave plate in sequence;
the coupled light path unit includes: the linear polarization coupling light emitted by the coupling light laser enters the atomic gas chamber after passing through the sixth half-wave plate, the second laser isolator, the fifth half-wave plate, the third polarization beam splitting prism and the dichroic mirror in sequence;
and the detection light passes through the atomic gas chamber, then sequentially passes through the dichroic mirror and the fourth half-wave plate and then enters the detector.
10. A measuring device according to claim 6,
the detector is a balanced zero-beat detector, detection light generated by the balanced zero-beat detector is divided into two beams through a beam splitter, one beam enters the balanced zero-beat detector, and the other beam enters the balanced zero-beat detector after being reflected by a second reflecting mirror.
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| CN112730999A (en) * | 2020-12-23 | 2021-04-30 | 中国科学院大学 | Device and method for measuring microwave electric field intensity |
| CN113341235A (en) * | 2021-05-31 | 2021-09-03 | 中国科学院空间应用工程与技术中心 | Measuring device |
| CN113341352A (en) * | 2021-05-31 | 2021-09-03 | 中国科学院空间应用工程与技术中心 | Measuring device |
| CN113376445A (en) * | 2021-06-08 | 2021-09-10 | 合肥衡元量子技术有限公司 | Deep learning enhanced Reedberg atom multi-frequency microwave receiver and detection method |
| CN114430566A (en) * | 2021-11-29 | 2022-05-03 | 军事科学院系统工程研究院网络信息研究所 | Wireless communication network guarantee method based on Reedberg atomic antenna |
| CN115561518A (en) * | 2022-11-16 | 2023-01-03 | 中国人民解放军国防科技大学 | Electromagnetic wave frequency measuring method and device based on rydberg atoms |
| CN116243059A (en) * | 2022-12-19 | 2023-06-09 | 中国科学院空间应用工程与技术中心 | Antenna near-field testing method based on Redburg atoms |
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