CA2589377A1 - Thermometer calibration - Google Patents
Thermometer calibration Download PDFInfo
- Publication number
- CA2589377A1 CA2589377A1 CA002589377A CA2589377A CA2589377A1 CA 2589377 A1 CA2589377 A1 CA 2589377A1 CA 002589377 A CA002589377 A CA 002589377A CA 2589377 A CA2589377 A CA 2589377A CA 2589377 A1 CA2589377 A1 CA 2589377A1
- Authority
- CA
- Canada
- Prior art keywords
- temperature sensor
- temperature
- primary
- reference temperature
- set forth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 claims 19
- 230000001419 dependent effect Effects 0.000 claims 5
- 210000003454 tympanic membrane Anatomy 0.000 claims 2
- 239000007788 liquid Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
- G01J5/14—Electrical features thereof
- G01J5/16—Arrangements with respect to the cold junction; Compensating influence of ambient temperature or other variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Radiation Pyrometers (AREA)
Abstract
A method for calibrating a thermometer is disclosed. The thermometer comprises a primary temperature sensor for determining the temperature of a target. The thermometer also comprises a reference temperature sensor positioned proximate to the primary temperature sensor and being responsive to an extraneous temperature affecting the primary temperature sensor. One calibration method calibrates the reference temperature sensor. This calibration can utilize a non-electrically conductive liquid bath for temperature control. Another calibration method calibrates the reference temperature sensor and the primary temperature sensor.
Claims (25)
1. A method for calibrating a thermometer, said thermometer comprising a primary temperature sensor and a reference temperature sensor, said reference temperature sensor being positioned proximate to the primary temperature sensor and being responsive to an extraneous temperature affecting the primary temperature sensor, said method comprising:
controlling the temperature of the reference temperature sensor to a first temperature value;
measuring a characteristic of the reference temperature sensor at said first temperature value;
repeating the controlling and measuring for at least one other temperature value different than the first temperature value; and utilizing the temperature values and the measured characteristics to solve a calibration equation, said calibration equation relating temperature and measured characteristic of the reference temperature sensor for use in calibrating the reference temperature sensor.
controlling the temperature of the reference temperature sensor to a first temperature value;
measuring a characteristic of the reference temperature sensor at said first temperature value;
repeating the controlling and measuring for at least one other temperature value different than the first temperature value; and utilizing the temperature values and the measured characteristics to solve a calibration equation, said calibration equation relating temperature and measured characteristic of the reference temperature sensor for use in calibrating the reference temperature sensor.
2. A method as set forth in claim 1 wherein said repeating comprises:
controlling the temperature of the reference temperature sensor to a second temperature value;
measuring a characteristic of the reference temperature sensor at said second temperature value;
controlling the temperature of the reference temperature sensor to a third temperature value; and measuring a characteristic of the reference temperature sensor at said third temperature value.
controlling the temperature of the reference temperature sensor to a second temperature value;
measuring a characteristic of the reference temperature sensor at said second temperature value;
controlling the temperature of the reference temperature sensor to a third temperature value; and measuring a characteristic of the reference temperature sensor at said third temperature value.
3. A method as set forth in claim 2 wherein said utilizing comprises utilizing the first, second, and third temperature values and the three corresponding measured characteristics to solve the following calibration equation for a, b, and c:
where T s is the temperature of the reference temperature sensor, R is the measured characteristic of the reference temperature sensor, and a, b, and c are calibration coefficients of the reference temperature sensor calculated based upon the three temperature values and the three corresponding measured characteristics.
where T s is the temperature of the reference temperature sensor, R is the measured characteristic of the reference temperature sensor, and a, b, and c are calibration coefficients of the reference temperature sensor calculated based upon the three temperature values and the three corresponding measured characteristics.
4. A method as set forth in claim 1 wherein said controlling comprises controlling the temperature of a temperature-dependent resistor being responsive to an extraneous temperature affecting a thermopile.
5. A method as set forth in claim 4 wherein said measuring comprises measuring a resistance of the temperature-dependent resistor.
6. A method as set forth in claim 1 wherein said controlling the temperature comprises immersing the reference temperature sensor in a temperature-controlled bath.
7. A method as set forth in claim 6 wherein said controlling the temperature comprises immersing the thermometer in the temperature-controlled bath.
8. A method as set forth in claim 6 wherein said controlling the temperature further comprises controlling the temperature of the bath to within a range from about 0.005 degrees C (~ 0.009 degrees F) to about ~ 0.01 degrees C ( 0.018 degrees F) of the desired bath temperature.
9. A method as set forth in claim 6 wherein said controlling the temperature further comprises maintaining the reference temperature sensor in the temperature-controlled bath for a period of between about 15 minutes and about 30 minutes before measuring said characteristic.
10. A method as set forth in claim 6 further comprising maintaining the reference temperature sensor in the temperature-controlled bath until the measured characteristic of the reference temperature sensor changes less than about 0.1 percent in at least about one minute.
11. A method as set forth in claim 1 further comprising using the calibrated reference temperature sensor for calibrating the primary temperature sensor.
12. A method for calibrating a thermometer, said thermometer comprising a primary temperature sensor, said method comprising:
positioning a reference temperature sensor proximate to the primary temperature sensor for detecting an extraneous temperature affecting the primary temperature sensor;
calibrating the reference temperature sensor; and calibrating the primary temperature sensor based upon the calibration of the reference temperature sensor.
positioning a reference temperature sensor proximate to the primary temperature sensor for detecting an extraneous temperature affecting the primary temperature sensor;
calibrating the reference temperature sensor; and calibrating the primary temperature sensor based upon the calibration of the reference temperature sensor.
13. A method as set forth in claim 12 wherein said calibrating the reference temperature sensor further comprises:
controlling the temperature of the reference temperature sensor to a first temperature value;
measuring a characteristic of the reference temperature sensor at said first temperature value;
repeating the controlling and measuring for at least one other temperature value different than the first temperature value; and utilizing the temperature values and the measured characteristics to solve a calibration equation, said calibration equation relating temperature and measured characteristic of the reference temperature sensor for use in calibrating the reference temperature sensor.
controlling the temperature of the reference temperature sensor to a first temperature value;
measuring a characteristic of the reference temperature sensor at said first temperature value;
repeating the controlling and measuring for at least one other temperature value different than the first temperature value; and utilizing the temperature values and the measured characteristics to solve a calibration equation, said calibration equation relating temperature and measured characteristic of the reference temperature sensor for use in calibrating the reference temperature sensor.
14. A method as set forth in claim 13 wherein said repeating comprises controlling the temperature of the reference temperature sensor to a second temperature;
measuring a characteristic of the reference temperature sensor at said second temperature;
controlling the temperature of the reference temperature sensor to a third temperature;
and measuring a characteristic of the reference temperature sensor at said third temperature.
measuring a characteristic of the reference temperature sensor at said second temperature;
controlling the temperature of the reference temperature sensor to a third temperature;
and measuring a characteristic of the reference temperature sensor at said third temperature.
15. A method as set forth in claim 14 wherein said utilizing comprises utilizing the first, second, and third temperature values and the three corresponding measured characteristics to solve the following calibration equation for a, b, and c:
where T s is the temperature of the reference temperature sensor, R is the measured characteristic of the reference temperature sensor, and a, b, and c are calibration coefficients of the reference temperature sensor calculated based upon the three temperature values and the three corresponding measured characteristics.
where T s is the temperature of the reference temperature sensor, R is the measured characteristic of the reference temperature sensor, and a, b, and c are calibration coefficients of the reference temperature sensor calculated based upon the three temperature values and the three corresponding measured characteristics.
16. A method as set forth in claim 13 wherein said calibrating the primary temperature sensor comprises:
exposing the primary temperature sensor to a first radiation source at a predetermined first source temperature value;
measuring the output voltage of the primary temperature sensor during exposure of the primary temperature sensor to the first radiation source;
measuring the characteristic of the reference temperature sensor during exposure of the primary temperature sensor to the first radiation source;
repeating the exposing and both measurings for at least one other radiation source emitting a different amount of radiation at a predetermined temperature value different than the first radiation source; and utilizing the measured output voltages, the measured characteristics of the reference temperature sensor, and the predetermined temperature values of the radiation sources to solve a second calibration equation, said second calibration equation relating measured output voltage of the primary temperature sensor, measured characteristic of the reference temperature sensor, and the predetermined temperature values of the radiation sources for use in calibrating the primary temperature sensor.
exposing the primary temperature sensor to a first radiation source at a predetermined first source temperature value;
measuring the output voltage of the primary temperature sensor during exposure of the primary temperature sensor to the first radiation source;
measuring the characteristic of the reference temperature sensor during exposure of the primary temperature sensor to the first radiation source;
repeating the exposing and both measurings for at least one other radiation source emitting a different amount of radiation at a predetermined temperature value different than the first radiation source; and utilizing the measured output voltages, the measured characteristics of the reference temperature sensor, and the predetermined temperature values of the radiation sources to solve a second calibration equation, said second calibration equation relating measured output voltage of the primary temperature sensor, measured characteristic of the reference temperature sensor, and the predetermined temperature values of the radiation sources for use in calibrating the primary temperature sensor.
17. A method as set forth in claim 16 wherein said repeating comprises:
exposing the primary temperature sensor to a second radiation source at a predetermined second source temperature value;
measuring the output voltage of the primary temperature sensor during exposure of the primary temperature sensor to the second radiation source;
measuring the characteristic of the reference temperature sensor during exposure of the primary temperature sensor to the second radiation source;
exposing the primary temperature sensor to a third radiation source at a predetermined third source temperature value;
measuring the output voltage of the primary temperature sensor during exposure of the primary temperature sensor to the third radiation source; and measuring the characteristic of the reference temperature sensor during exposure of the primary temperature sensor to the third radiation source.
exposing the primary temperature sensor to a second radiation source at a predetermined second source temperature value;
measuring the output voltage of the primary temperature sensor during exposure of the primary temperature sensor to the second radiation source;
measuring the characteristic of the reference temperature sensor during exposure of the primary temperature sensor to the second radiation source;
exposing the primary temperature sensor to a third radiation source at a predetermined third source temperature value;
measuring the output voltage of the primary temperature sensor during exposure of the primary temperature sensor to the third radiation source; and measuring the characteristic of the reference temperature sensor during exposure of the primary temperature sensor to the third radiation source.
18. A method as set forth in claim 17 wherein said utilizing comprises utilizing the first, second, and third predetermined radiation source temperature values, the three corresponding measured output voltages, and the three corresponding measured characteristics to solve the following second calibration equation for d, e, and f:
V tp = d+(e+fT s)(T s4-T t4) where V tp is the measured output voltage of the primary temperature sensor, T s is a calibrated temperature value of the reference temperature sensor based upon the measured characteristic of the reference temperature sensor, T, is the radiation source temperature value, and d, e, and f are calibration coefficients of the primary temperature sensor calculated based upon the three predetermined radiation source temperature values, the three corresponding measured output voltages of the primary temperature sensor, and the three corresponding measured characteristics of the reference temperature sensor.
V tp = d+(e+fT s)(T s4-T t4) where V tp is the measured output voltage of the primary temperature sensor, T s is a calibrated temperature value of the reference temperature sensor based upon the measured characteristic of the reference temperature sensor, T, is the radiation source temperature value, and d, e, and f are calibration coefficients of the primary temperature sensor calculated based upon the three predetermined radiation source temperature values, the three corresponding measured output voltages of the primary temperature sensor, and the three corresponding measured characteristics of the reference temperature sensor.
19. A method as set forth in claim 12 wherein said calibrating the reference temperature sensor and said calibrating the primary temperature sensor occur at the same time.
20. A method as set forth in claim 12 wherein said calibrating the reference temperature sensor comprises controlling the temperature of the reference temperature sensor to no more than three distinct temperature values and wherein said calibrating the primary temperature sensor comprises exposing the primary temperature sensor to no more than three distinct radiation sources at three distinct, predetermined source temperature values.
21. A method as set forth in claim 12 wherein said positioning comprises embedding the reference temperature sensor on the primary temperature sensor.
22. A method as set forth in claim 12 wherein said positioning comprises positioning a temperature-dependent resistor proximate to a thermopile for detecting an extraneous temperature affecting the thermopile.
23. A tympanic thermometer comprising:
a primary temperature sensor adapted to determine the temperature of a tympanic membrane based upon the radiation emitted from the tympanic membrane; and a reference temperature sensor being responsive to an extraneous temperature affecting the primary temperature sensor, said reference temperature sensor calibrated by controlling the temperature of the reference temperature sensor to a first temperature value;
measuring a characteristic of the reference temperature sensor at said first temperature value;
repeating the controlling and measuring for at least one other temperature value different than the first temperature value; and utilizing the temperature values and the measured characteristics to solve a calibration equation, said calibration equation relating temperature and measured characteristic of the reference temperature sensor for use in calibrating the reference temperature sensor.
a primary temperature sensor adapted to determine the temperature of a tympanic membrane based upon the radiation emitted from the tympanic membrane; and a reference temperature sensor being responsive to an extraneous temperature affecting the primary temperature sensor, said reference temperature sensor calibrated by controlling the temperature of the reference temperature sensor to a first temperature value;
measuring a characteristic of the reference temperature sensor at said first temperature value;
repeating the controlling and measuring for at least one other temperature value different than the first temperature value; and utilizing the temperature values and the measured characteristics to solve a calibration equation, said calibration equation relating temperature and measured characteristic of the reference temperature sensor for use in calibrating the reference temperature sensor.
24. A tympanic thermometer as set forth in claim 23 wherein said primary temperature sensor is a thermopile and said reference temperature sensor is a temperature-dependent resistor.
25. A tympanic thermometer as set forth in claim 24 wherein said temperature-dependent resistor is embedded on said thermopile.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/419,360 US7507019B2 (en) | 2006-05-19 | 2006-05-19 | Thermometer calibration |
| US11/419,360 | 2006-05-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2589377A1 true CA2589377A1 (en) | 2007-11-19 |
| CA2589377C CA2589377C (en) | 2011-11-01 |
Family
ID=38434075
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2589377A Active CA2589377C (en) | 2006-05-19 | 2007-05-16 | Thermometer calibration |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US7507019B2 (en) |
| EP (2) | EP1857797B1 (en) |
| CN (1) | CN101078656B (en) |
| AT (1) | ATE546716T1 (en) |
| AU (1) | AU2007202230B2 (en) |
| CA (1) | CA2589377C (en) |
| ES (2) | ES2822325T3 (en) |
| TW (1) | TWI336772B (en) |
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Also Published As
| Publication number | Publication date |
|---|---|
| EP2295943A1 (en) | 2011-03-16 |
| ES2822325T3 (en) | 2021-04-30 |
| CN101078656B (en) | 2012-11-07 |
| TWI336772B (en) | 2011-02-01 |
| EP1857797A1 (en) | 2007-11-21 |
| AU2007202230B2 (en) | 2009-08-27 |
| ATE546716T1 (en) | 2012-03-15 |
| AU2007202230A1 (en) | 2007-12-06 |
| EP1857797B1 (en) | 2012-02-22 |
| US7731418B2 (en) | 2010-06-08 |
| US7507019B2 (en) | 2009-03-24 |
| TW200804777A (en) | 2008-01-16 |
| US20070268953A1 (en) | 2007-11-22 |
| US20090154519A1 (en) | 2009-06-18 |
| ES2380690T3 (en) | 2012-05-17 |
| EP2295943B1 (en) | 2020-07-08 |
| CA2589377C (en) | 2011-11-01 |
| CN101078656A (en) | 2007-11-28 |
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