CN103335729A - High-precision infrared temperature measurement sensor - Google Patents
High-precision infrared temperature measurement sensor Download PDFInfo
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- CN103335729A CN103335729A CN2013102815727A CN201310281572A CN103335729A CN 103335729 A CN103335729 A CN 103335729A CN 2013102815727 A CN2013102815727 A CN 2013102815727A CN 201310281572 A CN201310281572 A CN 201310281572A CN 103335729 A CN103335729 A CN 103335729A
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Abstract
The invention relates to a high-precision infrared temperature measurement sensor. At present, no element temperature sensor is additionally mounted in the domestic infrared temperature measurement sensor, and approximate curve selection calculation is carried out by selecting a temperature sensor on an outer zero calibration baffle, so that the temperature measurement precision is influenced by variation of an outer environment temperature, and a temperature measurement error is increased when the variation of the environment temperature is rapider. The sensor comprises an element temperature sensor (3), wherein the element temperature sensor is electrically connected with an element temperature conversion plate (8); the element temperature conversion plate is electrically connected with a system host (7); the system host is electrically connected with a voltage-stabilized power supply plate (6) and a signal amplification plate (2) respectively; the signal amplification plate is electrically connected with the voltage-stabilized power supply plate, and electrically connected with an infrared thermosensitive element (1); the system host is electrically connected with a baffle motor; and the baffle motor (5) is connected with a zero calibration baffle (4). The sensor is used for measuring the temperature.
Description
technical field:
the present invention relates to a kind of high precision infrared temperature-test sensor, especially for railway vehicle wheel temperature axle temperature detection.
background technology:
infrared temperature-test sensor is as the non-contact measurement of target temperature, the height of its precision directly affects the accuracy of measured object temperature, self temperature of the infra-red heat photosensitive elements of the precision of infrared temperature-test sensor and self inside is relevant, especially be operated in variation of ambient temperature faster in environment the time when infrared temperature probe, the infra-red heat photosensitive elements of infrared temperature-test sensor inside self temperature variation exists and lags behind, and then affects temperature measurement accuracy.
domestic infrared temperature-test sensor inside does not install first temperature sensor additional at present, but choose the temperature sensor on the plate of zero span, outside school, carry out the approximate treatment of selected songs line, thereby changed by ambient temperature and affect temperature measurement accuracy, especially when variation of ambient temperature is very fast, temperature measurement error can increase.
the operating ambient temperature of the input-output characteristic curve and it of infra-red heat photosensitive elements self is relevant, under different operating ambient temperatures, input-output characteristic curve is different, be illustrated in figure 1 target temperature T at the varying environment temperature and the family curve of output voltage V, curve y is the target temperature T of infra-red heat photosensitive elements when environment temperature is M and the family curve of output voltage V, and curve k is the target temperature T of infra-red heat photosensitive elements when environment temperature is N and the family curve of output voltage V.Tradition does not have the rule of thumb approximate treatment of first temperature sensor, if the voltage collected is V1, the real work curve is Y, corresponding actual infrared temperature is T1, may choose the k curve calculation and show that temperature is T2 when calculating, brought the deviation of T2-T1 size, especially, when the temperature of environment temperature and infra-red heat photosensitive elements differs larger, it is large that the infrared thermography error can become.
summary of the invention:
the purpose of this invention is to provide a kind of high precision infrared temperature-test sensor.
above-mentioned purpose realizes by following technical scheme:
a kind of high precision infrared temperature-test sensor, its composition comprises: first temperature sensor, described first temperature sensor is electrically connected to first temperature change-over panel, described unit temperature change-over panel is electrically connected to system host, described system host is electrically connected to stabilized voltage supply plate, signal amplification board respectively, described signal amplification board is electrically connected to described stabilized voltage supply plate, and described signal amplification board is electrically connected to the infra-red heat photosensitive elements; Described system host is electrically connected to the baffle plate motor, and described baffle plate motor is connected with zero span, school plate.
beneficial effect:
1. the present invention is installed first temperature sensor additional near the infra-red heat photosensitive elements of sensor internal, this yuan of temperature sensor is used for measuring the operating ambient temperature of infra-red heat photosensitive elements specially, and then can choose the input-output characteristic curve of infra-red heat photosensitive elements under this operating ambient temperature and carry out thermometric, as Fig. 1, if the unit's temperature collected is M, just can directly choose curve Y is measured, thereby temperature measurement accuracy and temperature-measuring range have greatly been improved, after selecting first temperature sensor to carry out trade-off curve, can realize the temperature in the scope of Measurement accuracy-40 ℃～600 ℃, greatly improved the accuracy of thermometric, there is integrated level high, temperature measurement error is little, temperature-measuring range is wide, accuracy is high and be easy to realize, and the advantage of high reliability.
2. the present invention has installed zero span, school plate and has controlled zero span, school plate and open the motor of closing near the infra-red heat photosensitive elements front end of the inside of infrared temperature-test sensor, because zero span, school plate is arranged on the inside of infrared temperature-test sensor, therefore the temperature of zero span, school plate is more stable, has further improved the precision of infrared temperature-test sensor thermometric.
3. table 1 is that tradition there is not Canadian dollar temperature sensor and the present invention to add after first temperature sensor the correlation data while measuring same target temperature, and " target temperature " is the actual temperature of testee; " outside surface calculated value " is tradition while not installing first temperature sensor additional, with the temperature of sensor outside surface, carries out the calculated value that the selected songs line draws; " first temperature calculated value " is that the present invention adds after first temperature sensor the calculated value that carries out the selected songs line; " outside surface calculation deviation " is that " outside surface calculated value " does difference with " target temperature "; " first temperature calculation deviation " is that " first temperature calculated value " does difference with " target temperature "; By data in table, can find out: traditional maximum deflection difference value is 4.7 ℃, and only-0.7 ℃ of deviation maximal value of the present invention, improved temperature measurement accuracy greatly.
| Target temperature (℃) | The outside surface calculated value (℃) | The warm calculated value of unit (℃) | The outside surface calculation deviation (℃) | The warm calculation deviation of unit (℃) |
| 39.4 | 40 | 39.6 | 0.6 | 0.2 |
| 49.7 | 51.1 | 49.9 | 1.4 | 0.2 |
| 59.8 | 62 | 60.1 | 2.2 | 0.3 |
| 69.8 | 72.6 | 70.1 | 2.8 | 0.3 |
| 80.1 | 83.3 | 80.3 | 3.2 | 0.2 |
| 90.4 | 93.7 | 90.2 | 3.3 | -0.2 |
| 100.4 | 103.7 | 99.6 | 3.3 | -0.8 |
| 110.6 | 114.6 | 110.1 | 4 | -0.5 |
| 120.8 | 125 | 120.1 | 4.2 | -0.7 |
| 131.1 | 135.8 | 130.4 | 4.7 | -0.7 |
table 1.
the accompanying drawing explanation:
accompanying drawing 1 is target temperature at the varying environment temperature of the present invention and the graph of relation of output voltage.
accompanying drawing 2 is structural representations of the present invention.In figure, 1 is the infra-red heat photosensitive elements, and 2 is the signal amplification board, and 3 is first temperature sensor, and 4 is zero span, school plate, and 5 is the baffle plate motor, and 6 is the stabilized voltage supply plate, and 7 is system host, and 8 is first temperature change-over panel, and 9 is platinum sensor.
accompanying drawing 3 is according to the different calculated values of table 1 drafting and the correlation curve figure of target temperature.
accompanying drawing 4 is structural representations of signal amplification board of the present invention.
accompanying drawing 5 is structural representations of unit of the present invention temperature change-over panel.
accompanying drawing 6 is structural representations of stabilized voltage supply plate of the present invention.
embodiment:
embodiment 1:
a kind of high precision infrared temperature-test sensor, its composition comprises: first temperature sensor 3, described first temperature sensor is electrically connected to first temperature change-over panel 8, described unit temperature change-over panel is electrically connected to system host 7, described system host is electrically connected to stabilized voltage supply plate 6, signal amplification board 2 respectively, described signal amplification board is electrically connected to described stabilized voltage supply plate, and described signal amplification board is electrically connected to infra-red heat photosensitive elements 1; Described system host is electrically connected to baffle plate motor 5, and described baffle plate motor is connected with zero span, school plate 4.
embodiment 2:
according to the described high precision infrared temperature-test sensor of embodiment 1, the input signal of signal amplification board is respectively after the amplification and processing compensation of amplifier U1A, U1B, U2, and output signal is delivered to system host.The platinum sensor 9 of the warm change-over panel of unit is through current conversion chip U3 conversion and after Q1 triode electric current amplifies, and system host is delivered in electric current output, has long transmission distance, the characteristics that anti-outside electromagnetic interference is strong.The stabilized voltage supply plate+output+12V supply signal amplification board work after the voltage stabilizing of U4 power supply of 18V input voltage, for amplification board provides the positive working power of high stable,-18V input voltage output-12V after the voltage stabilizing of U5 power supply supplies with the work of signal amplification board, for the signal amplification board provides the negative working power of high stable, make infrared temperature-test sensor reliably working of the present invention.
embodiment 3:
according to the described high precision infrared temperature-test sensor of embodiment 1 or 2, the present invention selects platinum resistance as first temperature sensor of measuring infra-red heat photosensitive elements operating ambient temperature, selects the AD590 current sensor as first temperature sensor of measuring infra-red heat photosensitive elements operating ambient temperature.
Claims (1)
1. a high precision infrared temperature-test sensor, its composition comprises: first temperature sensor, it is characterized in that: described first temperature sensor is electrically connected to first temperature change-over panel, described unit temperature change-over panel is electrically connected to system host, described system host is electrically connected to stabilized voltage supply plate, signal amplification board respectively, described signal amplification board is electrically connected to described stabilized voltage supply plate, and described signal amplification board is electrically connected to the infra-red heat photosensitive elements; Described system host is electrically connected to the baffle plate motor, and described baffle plate motor is connected with zero span, school plate.
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| CN2013102815727A CN103335729A (en) | 2013-07-06 | 2013-07-06 | High-precision infrared temperature measurement sensor |
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| CN1820190A (en) * | 2003-07-09 | 2006-08-16 | 贺利氏电子耐特国际股份公司 | Method and apparatus for calibration and measurement of temperatures in melts by optical fibers |
| CN101078656A (en) * | 2006-05-19 | 2007-11-28 | 科维迪恩股份公司 | Thermometer calibration |
| CN201653554U (en) * | 2010-02-23 | 2010-11-24 | 宝山钢铁股份有限公司 | Infrared thermogragh calibrating device |
| US20120249799A1 (en) * | 2011-03-30 | 2012-10-04 | Yukiko Shibata | Image capture device, pixel output level compensation method for same, infrared camera system, and interchangeable lens system |
| CN202947798U (en) * | 2012-12-21 | 2013-05-22 | 周振林 | High speed high temperature infrared photon temperature detector |
| CN103134595A (en) * | 2011-12-05 | 2013-06-05 | 株式会社腾龙 | Infrared camera |
| CN203298877U (en) * | 2013-07-06 | 2013-11-20 | 哈尔滨威克科技有限公司 | High-precision infrared temperature measurement sensor |
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- 2013-07-06 CN CN2013102815727A patent/CN103335729A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1244253A (en) * | 1997-09-22 | 2000-02-09 | 西铁城钟表股份有限公司 | Radiation thermometer and method for adjusting the same |
| JP2001330512A (en) * | 2000-05-19 | 2001-11-30 | Fujitsu Ltd | Infrared image pickup device |
| JP2003247889A (en) * | 2002-02-25 | 2003-09-05 | Mitsubishi Electric Corp | Infrared image pickup apparatus |
| CN1820190A (en) * | 2003-07-09 | 2006-08-16 | 贺利氏电子耐特国际股份公司 | Method and apparatus for calibration and measurement of temperatures in melts by optical fibers |
| CN101078656A (en) * | 2006-05-19 | 2007-11-28 | 科维迪恩股份公司 | Thermometer calibration |
| CN201653554U (en) * | 2010-02-23 | 2010-11-24 | 宝山钢铁股份有限公司 | Infrared thermogragh calibrating device |
| US20120249799A1 (en) * | 2011-03-30 | 2012-10-04 | Yukiko Shibata | Image capture device, pixel output level compensation method for same, infrared camera system, and interchangeable lens system |
| CN103134595A (en) * | 2011-12-05 | 2013-06-05 | 株式会社腾龙 | Infrared camera |
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| CN203298877U (en) * | 2013-07-06 | 2013-11-20 | 哈尔滨威克科技有限公司 | High-precision infrared temperature measurement sensor |
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