CN105806513A - Device and method for calibrating high-precision temperature sensor - Google Patents
Device and method for calibrating high-precision temperature sensor Download PDFInfo
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- CN105806513A CN105806513A CN201610151324.4A CN201610151324A CN105806513A CN 105806513 A CN105806513 A CN 105806513A CN 201610151324 A CN201610151324 A CN 201610151324A CN 105806513 A CN105806513 A CN 105806513A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/005—Calibration
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- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
The invention provides a device and method for calibrating a high-precision temperature sensor in order to solve the problems that temperature calibration is conducted after finished products are assembled in the prior art, cost is high, and calibration speed is slow.The device comprises a testing plate, a to-be-calibrated high-precision temperature sensor, a high-precision temperature standard element and a high-precision analog-digital converter, and the to-be-calibrated high-precision temperature sensor, the high-precision temperature standard element and the high-precision analog-digital converter are arranged on the testing plate.The device further comprises a reading unit.The high-precision temperature standard element and the high-precision analog-digital converter are sequentially connected with the reading unit.The to-be-calibrated high-precision temperature sensor is connected with the reading unit.The method includes the steps that the to-be-calibrated high-precision temperature sensor and the high-precision temperature standard element are heated to target temperature, values of the to-be-calibrated high-precision temperature sensor and the high-precision temperature standard element are read respectively, and calibration data is obtained according to the read values.By means of the device and method, temperature testing and calibration of the high-precision temperature sensor are finished in the chip stage, cost is effectively reduced, and calibration speed is high.
Description
[technical field]
The present invention relates to electronic devices and components field, especially a kind of device and method calibrating temperature sensors of high precision.
[background technology]
After temperature sensors of high precision is produced, owing to being limited to production technology, it is difficult to accomplish concordance completely.Cause final product can only ensure certain linearity, but temperature offset amount and slope all exist a degree of error.For making final products reach the high accuracy of requirement, such as 0.1 degree Celsius, it is necessary to temperature sensor is calibrated on product line, to ensure that final products meet required precision.Existing scheme is to carry out the calibration of temperature at product end, and owing to being assembled into product, target temperature loads and calibration parameter reads and storage is required for expensive equipment, and cost is higher, and calibration speed is slow.
[summary of the invention]
The invention provides a kind of device and method calibrating temperature sensors of high precision, be assembled into the laggard trip temperature calibration of finished product in order to solve prior art, cost is higher, and the problem that calibration speed is slow.
A kind of device calibrating temperature sensors of high precision of the present invention, including: test board, and it is placed in the temperature sensors of high precision to be calibrated on described test board, high-precision temperature reference element and high-precision adc, also include: read unit；Described high-precision temperature reference element, high-precision adc and reading unit are sequentially connected, and described temperature sensors of high precision to be calibrated is connected with reading unit；When calibration, described test board being heated to target temperature, high-precision adc and temperature sensors of high precision to be calibrated are carried out readings by described reading unit, and draw calibration data.
Wherein, include inside described temperature sensors of high precision to be calibrated: non-volatile storage medium, for storing described calibration data, and when using described temperature sensors of high precision to be calibrated, read described calibration data by temperature sensors of high precision to be calibrated, complete self-aligning.
Wherein, described high-precision temperature reference element is integrated on described test board.
A kind of method calibrating temperature sensors of high precision of the present invention, comprises the following steps: S1, temperature sensors of high precision to be calibrated and high-precision temperature reference element is heated to target temperature；S2, respectively temperature sensors of high precision to be calibrated and high-precision temperature reference element are carried out readings；S3, according to described readings, draw calibration data.
Wherein, further comprise the steps of: S4, temperature sensors of high precision to be calibrated reads described calibration data, completes the calibration of self.
Wherein, by the readings of described temperature sensors of high precision to be calibrated and the readings of high-precision temperature reference element are contrasted in step S3, described calibration data is obtained.
Wherein, in step S2, respectively temperature sensors of high precision to be calibrated and high-precision temperature reference element are carried out at least 2 readings；And, the calibration data described in step S3 includes: temperature deviation after matching and slope.
The device and method of the calibration temperature sensors of high precision of the present invention, namely completes temperature test and the calibration of temperature sensors of high precision, effectively reduces cost, and calibration speed is fast at chip stage.
[accompanying drawing explanation]
Fig. 1 is the apparatus structure schematic diagram of the embodiment of the present invention 1；
Fig. 2 is the method step flow chart of the embodiment of the present invention 2.
[detailed description of the invention]
Embodiment 1, the present embodiment the device of calibration temperature sensors of high precision, shown in Figure 1, including: test board 11, and it is placed in the temperature sensors of high precision to be calibrated 12 on test board 11, high-precision temperature reference element 13 and high-precision adc 14, also include: read unit 15.Concrete annexation is that high-precision temperature reference element 13, high-precision adc 14 and reading unit 15 are sequentially connected, and temperature sensors of high precision 12 to be calibrated is connected with reading unit 15.Being more highly preferred to, high-precision temperature reference element 13 can be integrated on described test board 11；Temperature sensors of high precision 12 to be calibrated is internal also to be included: non-volatile storage medium 121, for storing described calibration data, and when product end uses temperature sensors of high precision 12 to be calibrated, temperature sensors of high precision 12 to be calibrated read described calibration data, complete self-aligning.
In implementing, temperature sensors of high precision 12 to be calibrated can adopt bluetooth chip temperature.Survey (FT) stage eventually at chip, when design test board 11 (loadboard), by bluetooth chip temperature, high-precision temperature reference element 13 (the high-precision temperature element namely calibrated, such as critesistor or other temperature device) and high-precision adc 14 (high-precision adc) put together, and close as far as possible.When test, by external equipment, test board 11 is heated target temperature, reads unit 15 and complete readings.The readings of the high-precision temperature reference element 13 that the temperature at this moment oneself detected by comparing bluetooth chip temperature arrives with outside high-precision adc 14 measurement, it is possible to calibration temperature sensor within bluetooth chip temperature.After obtaining bluetooth chip temperature internal temperature sensor calibration data, it is written on the non-volatile storage medium 121 within bluetooth chip temperature.This calibration data is read, it is possible to obtain temperature data accurately during normal use.For better calibration data, at least two (secondary) temperature can be measured when calibration, it is possible to obtain the temperature deviation after matching and slope so that the temperature survey of product is more accurate.
Embodiment 2, the present embodiment the method for calibration temperature sensors of high precision, shown in Figure 2, comprise the following steps:
S21, temperature sensors of high precision to be calibrated and high-precision temperature reference element are heated to target temperature.
S22, respectively temperature sensors of high precision to be calibrated and high-precision temperature reference element are carried out readings.
S23, according to described readings, draw calibration data.
S24, temperature sensors of high precision to be calibrated read described calibration data, complete the calibration of self.
In implementing, temperature sensors of high precision to be calibrated can adopt bluetooth chip temperature.Survey (FT) stage eventually at chip, when design test board (loadboard), by bluetooth chip temperature, high-precision temperature reference element (the high-precision temperature element namely calibrated, such as critesistor or other temperature device) and high-precision adc (high-precision adc) put together, and close as far as possible.When test, by external equipment, test board is heated target temperature, then respectively bluetooth chip temperature and high-precision temperature reference element is carried out readings.The readings of the high-precision temperature reference element that the temperature at this moment oneself detected by comparing bluetooth chip temperature arrives with outside high-precision adc measurement, it is possible to calibration temperature sensor within bluetooth chip temperature.After obtaining bluetooth chip temperature internal temperature sensor calibration data, it is written on the non-volatile storage medium within bluetooth chip temperature.This calibration data is read, it is possible to obtain temperature data accurately during normal use.For better calibration data, at least two (secondary) temperature can be measured when calibration, it is possible to obtain the temperature deviation after matching and slope so that the temperature survey of product is more accurate.
Here description of the invention and application are all simply illustrative and exemplary, are not intended to limit the scope of the invention in above-described embodiment.The deformation of embodiments disclosed herein and change are entirely possible, and for those skilled in the art, the various parts with equivalence of replacing of embodiment are all known.Those skilled in the art it is also clear that, when without departing from the spirit of the present invention or substitutive characteristics, the present invention can in other forms, structure, layout, ratio, and realize with other assembly, material and parts, and when without departing from the scope of the invention and spirit, it is possible to embodiments disclosed herein is carried out other deformation and changes.
Claims (7)
1. the device and method calibrating temperature sensors of high precision, it is characterized in that, including: test board, and it is placed in the temperature sensors of high precision to be calibrated on described test board, high-precision temperature reference element and high-precision adc, also include: read unit；Described high-precision temperature reference element, high-precision adc and reading unit are sequentially connected, and described temperature sensors of high precision to be calibrated is connected with reading unit；
When calibration, described test board being heated to target temperature, high-precision adc and temperature sensors of high precision to be calibrated are carried out readings by described reading unit, and draw calibration data.
2. the device calibrating temperature sensors of high precision as claimed in claim 1, it is characterized in that, include inside described temperature sensors of high precision to be calibrated: non-volatile storage medium, for storing described calibration data, and when using described temperature sensors of high precision to be calibrated, read described calibration data by temperature sensors of high precision to be calibrated, complete self-aligning.
3. the device calibrating temperature sensors of high precision as claimed in claim 1, it is characterised in that described high-precision temperature reference element is integrated on described test board.
4. a calibration temperature sensors of high precision method, it is characterised in that comprise the following steps:
S1, temperature sensors of high precision to be calibrated and high-precision temperature reference element are heated to target temperature；
S2, respectively temperature sensors of high precision to be calibrated and high-precision temperature reference element are carried out readings；
S3, according to described readings, draw calibration data.
5. the method calibrating temperature sensors of high precision as claimed in claim 4, it is characterised in that further comprise the steps of: S4, temperature sensors of high precision to be calibrated reads described calibration data, completes the calibration of self.
6. the method calibrating temperature sensors of high precision as claimed in claim 4, it is characterised in that by the readings of described temperature sensors of high precision to be calibrated and the readings of high-precision temperature reference element are contrasted in step S3, obtain described calibration data.
7. the method calibrating temperature sensors of high precision as claimed in claim 4, it is characterised in that in step S2, respectively temperature sensors of high precision to be calibrated and high-precision temperature reference element are carried out at least 2 readings；And, the calibration data described in step S3 includes: temperature deviation after matching and slope.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201610151324.4A CN105806513A (en) | 2016-03-17 | 2016-03-17 | Device and method for calibrating high-precision temperature sensor |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610151324.4A CN105806513A (en) | 2016-03-17 | 2016-03-17 | Device and method for calibrating high-precision temperature sensor |
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| CN105806513A true CN105806513A (en) | 2016-07-27 |
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| CN201610151324.4A Pending CN105806513A (en) | 2016-03-17 | 2016-03-17 | Device and method for calibrating high-precision temperature sensor |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111721444A (en) * | 2020-05-28 | 2020-09-29 | 上海申矽凌微电子科技有限公司 | Mass production method and system for calibrating temperature sensor chip |
| CN112556884A (en) * | 2019-09-25 | 2021-03-26 | 奥迪股份公司 | Calibration of charging device for electric vehicle |
| WO2023272908A1 (en) * | 2021-06-28 | 2023-01-05 | 谢嘉仪 | High-precision temperature measurement method and system |
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| US20070014329A1 (en) * | 2005-07-18 | 2007-01-18 | Manoj Sinha | System and method for automatically calibrating a temperature sensor |
| CN101078656A (en) * | 2006-05-19 | 2007-11-28 | 科维迪恩股份公司 | Thermometer calibration |
| CN101750170A (en) * | 2008-12-11 | 2010-06-23 | 上海华虹Nec电子有限公司 | Calibration system and calibration method of temperature sensor chip |
| CN205748720U (en) * | 2016-03-17 | 2016-11-30 | 北京智联安科技有限公司 | A kind of device calibrating temperature sensors of high precision |
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Patent Citations (5)
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| US6283628B1 (en) * | 1998-09-11 | 2001-09-04 | Airpax Corporation, Llc | Intelligent input/output temperature sensor and calibration method therefor |
| US20070014329A1 (en) * | 2005-07-18 | 2007-01-18 | Manoj Sinha | System and method for automatically calibrating a temperature sensor |
| CN101078656A (en) * | 2006-05-19 | 2007-11-28 | 科维迪恩股份公司 | Thermometer calibration |
| CN101750170A (en) * | 2008-12-11 | 2010-06-23 | 上海华虹Nec电子有限公司 | Calibration system and calibration method of temperature sensor chip |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112556884A (en) * | 2019-09-25 | 2021-03-26 | 奥迪股份公司 | Calibration of charging device for electric vehicle |
| CN112556884B (en) * | 2019-09-25 | 2023-09-22 | 奥迪股份公司 | Calibration of charging device of electric vehicle |
| CN111721444A (en) * | 2020-05-28 | 2020-09-29 | 上海申矽凌微电子科技有限公司 | Mass production method and system for calibrating temperature sensor chip |
| CN111721444B (en) * | 2020-05-28 | 2022-07-22 | 上海申矽凌微电子科技有限公司 | Mass production method and system for calibrating temperature sensor chip |
| WO2023272908A1 (en) * | 2021-06-28 | 2023-01-05 | 谢嘉仪 | High-precision temperature measurement method and system |
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Application publication date: 20160727 |