BR9808381A - Integrated circuit and integrated circuit test process - Google Patents
Integrated circuit and integrated circuit test processInfo
- Publication number
- BR9808381A BR9808381A BR9808381-3A BR9808381A BR9808381A BR 9808381 A BR9808381 A BR 9808381A BR 9808381 A BR9808381 A BR 9808381A BR 9808381 A BR9808381 A BR 9808381A
- Authority
- BR
- Brazil
- Prior art keywords
- integrated circuit
- rom
- test process
- user
- cpu
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Microcomputers (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Patente de Invenção: <B>"CIRCUITO INTEGRADO E PROCESSO PARA TESTE DO CIRCUITO INTEGRADO"<D>. Circuito integrado com uma CPU e uma ROM de usuário caracterizado por uma ROM de teste, cujo espaço de endereço se encontra dentro do espaço de endereço da ROM de usuário, uma RAM externa à CPU bem como um dispositivo de comutação, que possibilita um acesso apenas à ROM de usuário ou à ROM de teste e é irreversivelmente deslocável para um estado, que permite apenas um acesso à ROM de usuário.Invention Patent: <B> "INTEGRATED CIRCUIT AND PROCESS FOR TESTING THE INTEGRATED CIRCUIT" <D>. Integrated circuit with a CPU and a user ROM characterized by a test ROM, whose address space is within the address space of the user ROM, a RAM external to the CPU as well as a switching device, which allows access only to the user ROM or the test ROM and is irreversibly movable to a state, which allows only access to the user ROM.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19711478A DE19711478A1 (en) | 1997-03-19 | 1997-03-19 | Integrated circuit and method for testing the integrated circuit |
PCT/DE1998/000608 WO1998041880A2 (en) | 1997-03-19 | 1998-03-02 | Integrated circuit and method for testing the same |
Publications (1)
Publication Number | Publication Date |
---|---|
BR9808381A true BR9808381A (en) | 2000-05-23 |
Family
ID=7823916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR9808381-3A BR9808381A (en) | 1997-03-19 | 1998-03-02 | Integrated circuit and integrated circuit test process |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP0968436A2 (en) |
JP (1) | JP2001527669A (en) |
KR (1) | KR20000076351A (en) |
CN (1) | CN1251183A (en) |
BR (1) | BR9808381A (en) |
DE (1) | DE19711478A1 (en) |
WO (1) | WO1998041880A2 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3198997B2 (en) * | 1997-08-28 | 2001-08-13 | 日本電気株式会社 | Microcomputer and burn-in test method thereof |
EP0992809A1 (en) | 1998-09-28 | 2000-04-12 | Siemens Aktiengesellschaft | Circuit with deactivatable scan path |
DE10101234A1 (en) * | 2001-01-11 | 2002-07-18 | Giesecke & Devrient Gmbh | Testing non-volatile memory involves producing test pattern, write access to memory with test pattern, read access to acquire test result and comparison with test pattern for agreement |
US7325181B2 (en) | 2003-02-24 | 2008-01-29 | Stmicroelectronics S.A. | Method and device for selecting the operating mode of an integrated circuit |
CN1829127B (en) * | 2006-04-20 | 2011-06-29 | 北京星河亮点通信软件有限责任公司 | Method for building communication terminal test instrumentation control platform based on microkernel |
CN102592683B (en) * | 2012-02-23 | 2014-12-10 | 苏州华芯微电子股份有限公司 | Method for entering chip test mode and related device |
CN103021471B (en) * | 2012-12-24 | 2016-08-03 | 上海新储集成电路有限公司 | A kind of memorizer and storage method thereof |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0758502B2 (en) * | 1988-06-30 | 1995-06-21 | 三菱電機株式会社 | IC card |
JP3125070B2 (en) * | 1990-12-14 | 2001-01-15 | 三菱電機株式会社 | IC card |
JPH06236447A (en) * | 1993-02-09 | 1994-08-23 | Mitsubishi Electric Corp | Microcomputer for ic card |
-
1997
- 1997-03-19 DE DE19711478A patent/DE19711478A1/en not_active Withdrawn
-
1998
- 1998-03-02 WO PCT/DE1998/000608 patent/WO1998041880A2/en not_active Application Discontinuation
- 1998-03-02 CN CN98803503A patent/CN1251183A/en active Pending
- 1998-03-02 JP JP54000998A patent/JP2001527669A/en active Pending
- 1998-03-02 BR BR9808381-3A patent/BR9808381A/en not_active IP Right Cessation
- 1998-03-02 KR KR1019997008452A patent/KR20000076351A/en not_active Application Discontinuation
- 1998-03-02 EP EP98916822A patent/EP0968436A2/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
CN1251183A (en) | 2000-04-19 |
WO1998041880A3 (en) | 1999-01-14 |
JP2001527669A (en) | 2001-12-25 |
KR20000076351A (en) | 2000-12-26 |
DE19711478A1 (en) | 1998-10-01 |
EP0968436A2 (en) | 2000-01-05 |
WO1998041880A2 (en) | 1998-09-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 4A, 5A,6A, 7A, 8A E 9A ANUIDADES |
|
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: REFERENTE AO DESPACHO 8.6 NA RPI 1892 DE 10/04/2007 |