ZA954901B - Analysing a material sample - Google Patents
Analysing a material sampleInfo
- Publication number
- ZA954901B ZA954901B ZA954901A ZA954901A ZA954901B ZA 954901 B ZA954901 B ZA 954901B ZA 954901 A ZA954901 A ZA 954901A ZA 954901 A ZA954901 A ZA 954901A ZA 954901 B ZA954901 B ZA 954901B
- Authority
- ZA
- South Africa
- Prior art keywords
- analysing
- material sample
- sample
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9412839A GB9412839D0 (en) | 1994-06-25 | 1994-06-25 | A method of designing an experiment for analysing a material sample |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ZA954901B true ZA954901B (en) | 1996-12-13 |
Family
ID=10757371
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ZA954901A ZA954901B (en) | 1994-06-25 | 1995-06-13 | Analysing a material sample |
Country Status (2)
| Country | Link |
|---|---|
| GB (2) | GB9412839D0 (en) |
| ZA (1) | ZA954901B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3889183B2 (en) * | 1998-05-18 | 2007-03-07 | 株式会社リガク | Diffraction condition simulation device, diffraction measurement system, and crystal analysis system |
| GB2497170B (en) | 2011-11-29 | 2018-02-21 | Rigaku Denki Co Ltd | X-ray analysis apparatus |
| JP6377582B2 (en) * | 2015-08-06 | 2018-08-22 | 株式会社リガク | X-ray analysis operation guide system, operation guide method, and operation guide program |
-
1994
- 1994-06-25 GB GB9412839A patent/GB9412839D0/en active Pending
-
1995
- 1995-01-19 GB GB9500999A patent/GB2290689A/en not_active Withdrawn
- 1995-06-13 ZA ZA954901A patent/ZA954901B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| GB9412839D0 (en) | 1994-08-17 |
| GB9500999D0 (en) | 1995-03-08 |
| GB2290689A (en) | 1996-01-03 |
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