TW341329U - A frequency analysis digital tester - Google Patents

A frequency analysis digital tester

Info

Publication number
TW341329U
TW341329U TW086207595U TW86207595U TW341329U TW 341329 U TW341329 U TW 341329U TW 086207595 U TW086207595 U TW 086207595U TW 86207595 U TW86207595 U TW 86207595U TW 341329 U TW341329 U TW 341329U
Authority
TW
Taiwan
Prior art keywords
frequency analysis
digital tester
analysis digital
tester
frequency
Prior art date
Application number
TW086207595U
Other languages
Chinese (zh)
Inventor
Han-Dong Guan
Original Assignee
Powerchip Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Powerchip Semiconductor Corp filed Critical Powerchip Semiconductor Corp
Priority to TW086207595U priority Critical patent/TW341329U/en
Publication of TW341329U publication Critical patent/TW341329U/en

Links

TW086207595U 1997-05-10 1997-05-10 A frequency analysis digital tester TW341329U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086207595U TW341329U (en) 1997-05-10 1997-05-10 A frequency analysis digital tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086207595U TW341329U (en) 1997-05-10 1997-05-10 A frequency analysis digital tester

Publications (1)

Publication Number Publication Date
TW341329U true TW341329U (en) 1998-09-21

Family

ID=54635620

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086207595U TW341329U (en) 1997-05-10 1997-05-10 A frequency analysis digital tester

Country Status (1)

Country Link
TW (1) TW341329U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI820456B (en) * 2021-01-08 2023-11-01 大陸商勝達克半導體科技（上海）股份有限公司 Method for suppressing non-synchronized spectral leakage of automatic testing machine

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI820456B (en) * 2021-01-08 2023-11-01 大陸商勝達克半導體科技（上海）股份有限公司 Method for suppressing non-synchronized spectral leakage of automatic testing machine

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