ZA914250B - Process and sensor for continuously measuring the thickness of a coating - Google Patents

Process and sensor for continuously measuring the thickness of a coating

Info

Publication number
ZA914250B
ZA914250B ZA914250A ZA914250A ZA914250B ZA 914250 B ZA914250 B ZA 914250B ZA 914250 A ZA914250 A ZA 914250A ZA 914250 A ZA914250 A ZA 914250A ZA 914250 B ZA914250 B ZA 914250B
Authority
ZA
South Africa
Prior art keywords
coating
sensor
thickness
continuously measuring
continuously
Prior art date
Application number
ZA914250A
Other languages
English (en)
Inventor
Aloyse Schoos
Schoos Aloyse
Original Assignee
Arbed
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arbed filed Critical Arbed
Publication of ZA914250B publication Critical patent/ZA914250B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
ZA914250A 1990-06-20 1991-06-04 Process and sensor for continuously measuring the thickness of a coating ZA914250B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
LU87751A LU87751A1 (fr) 1990-06-20 1990-06-20 Procede et capteur pour la mesure en continu de l'epaisseur d'un revetement

Publications (1)

Publication Number Publication Date
ZA914250B true ZA914250B (en) 1992-05-27

Family

ID=19731239

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA914250A ZA914250B (en) 1990-06-20 1991-06-04 Process and sensor for continuously measuring the thickness of a coating

Country Status (9)

Country Link
EP (1) EP0469267B1 (ko)
JP (1) JPH04232403A (ko)
KR (1) KR920001175A (ko)
AU (1) AU7840491A (ko)
BR (1) BR9102558A (ko)
CA (1) CA2043748A1 (ko)
DE (1) DE69103357D1 (ko)
LU (1) LU87751A1 (ko)
ZA (1) ZA914250B (ko)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3815017A (en) * 1967-02-23 1974-06-04 M Brunner Beat frequency method and apparatus for measuring the thickness of a layer of material overlying a metallic surface
US3679968A (en) * 1970-03-16 1972-07-25 Jean Claude Commercon Method and device for measuring the thickness of a metal deposit on an insulating support
NZ205098A (en) * 1982-08-06 1997-01-29 Australian Wire Ind Pty Wire, conductive coating on magnetic substrate: thickness determination
FR2572175A1 (fr) * 1984-10-24 1986-04-25 Stein Heurtey Procede et dispositif pour mesurer l'epaisseur de couches metalliques minces deposees sur un support conducteur

Also Published As

Publication number Publication date
LU87751A1 (fr) 1992-01-15
EP0469267B1 (fr) 1994-08-10
AU7840491A (en) 1992-01-02
CA2043748A1 (en) 1991-12-21
JPH04232403A (ja) 1992-08-20
BR9102558A (pt) 1992-01-21
EP0469267A1 (fr) 1992-02-05
KR920001175A (ko) 1992-01-30
DE69103357D1 (de) 1994-09-15

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