ZA908717B - Discriminating spectroscopy of the optical profile of a transparent object obtained by frustrated evanescent field scanning optical microscopy - Google Patents

Discriminating spectroscopy of the optical profile of a transparent object obtained by frustrated evanescent field scanning optical microscopy

Info

Publication number
ZA908717B
ZA908717B ZA908717A ZA908717A ZA908717B ZA 908717 B ZA908717 B ZA 908717B ZA 908717 A ZA908717 A ZA 908717A ZA 908717 A ZA908717 A ZA 908717A ZA 908717 B ZA908717 B ZA 908717B
Authority
ZA
South Africa
Prior art keywords
discriminating
spectroscopy
object obtained
evanescent field
transparent object
Prior art date
Application number
ZA908717A
Other languages
English (en)
Inventor
Frederique De Fornel
De Fornel Frederique
Jean-Pierre Goudonnet
Goudonnet Jean-Pierre
Original Assignee
Spiral Rech & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=9386975&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ZA908717(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Spiral Rech & Dev filed Critical Spiral Rech & Dev
Publication of ZA908717B publication Critical patent/ZA908717B/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22Probes, their manufacture, or their related instrumentation, e.g. holders
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
ZA908717A 1989-10-31 1990-10-31 Discriminating spectroscopy of the optical profile of a transparent object obtained by frustrated evanescent field scanning optical microscopy ZA908717B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8914289A FR2653906B1 (fr) 1989-10-31 1989-10-31 Spectroscopie discriminante du profil optique d'un objet transparent, obtenu par microscopie optique a balayage en champ evanescent frustre, et microscopes de ce type mettant en óoeuvre ledit procede.

Publications (1)

Publication Number Publication Date
ZA908717B true ZA908717B (en) 1991-08-28

Family

ID=9386975

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA908717A ZA908717B (en) 1989-10-31 1990-10-31 Discriminating spectroscopy of the optical profile of a transparent object obtained by frustrated evanescent field scanning optical microscopy

Country Status (12)

Country Link
EP (1) EP0426559A1 (ja)
JP (1) JPH05506089A (ja)
CN (1) CN1056354A (ja)
AU (1) AU6871191A (ja)
BR (1) BR9007810A (ja)
CA (1) CA2072111A1 (ja)
FI (1) FI921915A (ja)
FR (1) FR2653906B1 (ja)
HU (1) HUT62702A (ja)
OA (1) OA09543A (ja)
WO (1) WO1991006844A1 (ja)
ZA (1) ZA908717B (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2685127B1 (fr) 1991-12-13 1994-02-04 Christian Licoppe Photonanographe a gaz pour la fabrication et l'analyse optique de motifs a l'echelle nanometrique.
US5351127A (en) * 1992-06-17 1994-09-27 Hewlett-Packard Company Surface plasmon resonance measuring instruments
KR100262878B1 (ko) * 1993-10-04 2000-08-01 포만 제프리 엘 근접시야 광학현미경 및 그 측정방법
CN100590437C (zh) * 2007-04-16 2010-02-17 中国科学院物理研究所 结合磁镊观测生物大分子的全反射近场显微镜
CN101694547B (zh) * 2009-03-04 2014-03-26 王晓明 一种物体外轮廓非线性多级放大光学成像技术原理、装置和摄像方法
DE102014112285A1 (de) * 2014-08-27 2016-03-03 Carl Zeiss Microscopy Gmbh Verfahren zum Korrigieren einer Farbwiedergabe eines digitalen Mikroskops sowie digitales Mikroskop
NL2021205B1 (en) * 2018-06-28 2020-01-07 Univ Eindhoven Tech Method and system for performing terahertz near-field measurements

Also Published As

Publication number Publication date
FR2653906A1 (fr) 1991-05-03
HU9201448D0 (en) 1992-09-28
CN1056354A (zh) 1991-11-20
EP0426559A1 (fr) 1991-05-08
HUT62702A (en) 1993-05-28
BR9007810A (pt) 1992-09-01
WO1991006844A1 (fr) 1991-05-16
OA09543A (fr) 1992-11-15
JPH05506089A (ja) 1993-09-02
FI921915A0 (fi) 1992-04-29
FI921915A (fi) 1992-04-29
CA2072111A1 (fr) 1991-05-01
AU6871191A (en) 1991-05-31
FR2653906B1 (fr) 1992-05-22

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NO921600D0 (no) Diskriminerende spektroskopi av den optiske profil av et gjennomsiktig objekt oppnaadd ved hjelp av forstyrret, kortvarig, feltskanderende optisk mikroskopi