ZA200410045B - Material segregation density, and moisture analyzing apparatus and method - Google Patents

Material segregation density, and moisture analyzing apparatus and method

Info

Publication number
ZA200410045B
ZA200410045B ZA200410045A ZA200410045A ZA200410045B ZA 200410045 B ZA200410045 B ZA 200410045B ZA 200410045 A ZA200410045 A ZA 200410045A ZA 200410045 A ZA200410045 A ZA 200410045A ZA 200410045 B ZA200410045 B ZA 200410045B
Authority
ZA
South Africa
Prior art keywords
analyzing apparatus
material segregation
segregation density
moisture
moisture analyzing
Prior art date
Application number
ZA200410045A
Other languages
English (en)
Inventor
Donald J Geisel
Original Assignee
Donald J Geisel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Donald J Geisel filed Critical Donald J Geisel
Publication of ZA200410045B publication Critical patent/ZA200410045B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/42—Road-making materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Road Repair (AREA)
  • Geophysics And Detection Of Objects (AREA)
ZA200410045A 2002-05-30 2004-12-13 Material segregation density, and moisture analyzing apparatus and method ZA200410045B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/159,675 US6677763B2 (en) 2001-05-23 2002-05-30 Material segregation, density, and moisture analyzing apparatus and method

Publications (1)

Publication Number Publication Date
ZA200410045B true ZA200410045B (en) 2006-06-28

Family

ID=29709683

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA200410045A ZA200410045B (en) 2002-05-30 2004-12-13 Material segregation density, and moisture analyzing apparatus and method

Country Status (7)

Country Link
US (1) US6677763B2 (xx)
EP (1) EP1512022A4 (xx)
JP (1) JP4060315B2 (xx)
CN (1) CN100339716C (xx)
AU (1) AU2003234124B2 (xx)
WO (1) WO2003102606A1 (xx)
ZA (1) ZA200410045B (xx)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6784671B2 (en) * 2002-02-04 2004-08-31 Mississippi State University Moisture and density detector (MDD)
EP2345890A3 (en) * 2003-10-24 2012-10-03 Troxler Electronic Laboratories, Inc. Pavement material microwave density measurement methods and apparatuses
US8299808B2 (en) 2005-03-18 2012-10-30 Troxler Electronic Laboratories Inc. Apparatuses and systems for density gauge calibration and reference emulation
US7705614B2 (en) * 2005-03-18 2010-04-27 Troxler Electronic Laboratories, Inc. Apparatuses and systems for density gauge reference emulation
US7589340B2 (en) * 2005-03-31 2009-09-15 S.C. Johnson & Son, Inc. System for detecting a container or contents of the container
US7569810B1 (en) 2005-08-30 2009-08-04 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for measuring the density of material
US20070085241A1 (en) * 2005-10-14 2007-04-19 Northrop Grumman Corporation High density performance process
JP4345850B2 (ja) * 2006-09-11 2009-10-14 ソニー株式会社 通信システム及び通信装置
JP4345851B2 (ja) * 2006-09-11 2009-10-14 ソニー株式会社 通信システム並びに通信装置
JP4893483B2 (ja) * 2006-09-11 2012-03-07 ソニー株式会社 通信システム
FR2917166B1 (fr) * 2007-06-05 2012-04-27 Toulouse Inst Nat Polytech Procede et dispositif de detection d'eau dans une structure alveolaire.
WO2009089172A2 (en) 2008-01-04 2009-07-16 Troxler Electronic Laboratories, Inc. Nuclear gauges and methods of configuration and calibration of nuclear gauges
US20110101997A1 (en) * 2008-03-07 2011-05-05 Agrichem, Inc. Flush-Mounted Capacitive Sensor Mount
US20090223578A1 (en) * 2008-03-07 2009-09-10 Joel Gulbranson Flush-mounted capacitive sensor mount
KR101615354B1 (ko) * 2009-03-26 2016-04-25 주식회사 씨유네트웍스 아스팔트 도로포장의 다짐밀도 측정장치
BR112014028202A2 (pt) * 2012-05-30 2017-06-27 Gen Electric método de medição e sensor de constituinte de material
US9804112B2 (en) 2013-11-20 2017-10-31 Transtech Systems, Inc. Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy
CN104280298A (zh) * 2014-09-28 2015-01-14 广东惠利普路桥信息工程有限公司 沥青混合料稳定度试验仪
US10527570B2 (en) 2016-01-12 2020-01-07 Transtech Systems, Inc. Determining location of electromagnetic impedance spectrographic analysis using electromagnetic impedance tomography
CN107817275B (zh) * 2017-09-06 2020-05-19 山东科技大学 混凝土离析检测装置及方法
CN107480463B (zh) * 2017-09-07 2020-02-04 中国建筑土木建设有限公司 水泥混凝土结构内部气泡离析程度的计算方法
JP7051080B2 (ja) * 2017-11-15 2022-04-11 国立研究開発法人産業技術総合研究所 可搬式水分量計測装置
ES2949034T3 (es) * 2018-06-21 2023-09-25 Chrysos Corporation Ltd Sistema y método para la medición de la humedad

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2691759A (en) * 1946-03-01 1954-10-12 Elmer L Younker Device for dielectric constant determination
US2631759A (en) * 1947-11-08 1953-03-17 Sinclair Refining Co Slide valve for controlling the flow of suspended solids
US4616425A (en) * 1983-01-27 1986-10-14 Iowa State University Research Foundation Moisture measurement apparatus and method
US4626773A (en) * 1984-10-26 1986-12-02 Exxon Production Research Co. Method and means for determining rock properties using time-domain dielectric spectroscopy
US5103181A (en) * 1988-10-05 1992-04-07 Den Norske Oljeselskap A. S. Composition monitor and monitoring process using impedance measurements
JP3160428B2 (ja) * 1993-07-12 2001-04-25 株式会社東芝 濃度計
CN1059761C (zh) * 1996-04-17 2000-12-20 财团法人工业技术研究院 全向性水平极化阿尔福德回线式带状天线
US6114863A (en) 1998-04-29 2000-09-05 General Electric Company Method for determining the presence of water in materials
CN2374858Y (zh) * 1998-07-13 2000-04-19 中国科学院上海技术物理研究所 数字式微波介质水份仪
DE19925468A1 (de) * 1999-06-03 2000-12-07 Hauni Maschinenbau Ag Streufeldsonde
US6400161B1 (en) * 2001-05-23 2002-06-04 Donald Joseph Geisel Material segregation and density analyzing apparatus and method

Also Published As

Publication number Publication date
AU2003234124A1 (en) 2003-12-19
US20020180460A1 (en) 2002-12-05
CN100339716C (zh) 2007-09-26
WO2003102606A1 (en) 2003-12-11
JP4060315B2 (ja) 2008-03-12
EP1512022A1 (en) 2005-03-09
AU2003234124B2 (en) 2007-08-02
EP1512022A4 (en) 2013-01-16
CN1659443A (zh) 2005-08-24
JP2005528618A (ja) 2005-09-22
US6677763B2 (en) 2004-01-13

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