WO2024114905A1 - Détermination d'une fréquence d'oscillation d'un système oscillant - Google Patents

Détermination d'une fréquence d'oscillation d'un système oscillant Download PDF

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Publication number
WO2024114905A1
WO2024114905A1 PCT/EP2022/083907 EP2022083907W WO2024114905A1 WO 2024114905 A1 WO2024114905 A1 WO 2024114905A1 EP 2022083907 W EP2022083907 W EP 2022083907W WO 2024114905 A1 WO2024114905 A1 WO 2024114905A1
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WO
WIPO (PCT)
Prior art keywords
oscillation
frequency
vibration
sampling frequency
fsi
Prior art date
Application number
PCT/EP2022/083907
Other languages
German (de)
English (en)
Inventor
Stefan Klehr
Original Assignee
Siemens Aktiengesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Aktiengesellschaft filed Critical Siemens Aktiengesellschaft
Priority to PCT/EP2022/083907 priority Critical patent/WO2024114905A1/fr
Publication of WO2024114905A1 publication Critical patent/WO2024114905A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H13/00—Measuring resonant frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G01R19/2509—Details concerning sampling, digitizing or waveform capturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis

Definitions

  • the invention relates to a device for determining an oscillation frequency of an oscillation.
  • the invention also relates to a use of a device for determining an oscillation frequency of an oscillation.
  • the invention also relates to a method for determining an oscillation frequency of an oscillation and a computer program product.
  • the Nyquist-Shannon sampling theorem applies.
  • the signal can then be reconstructed exactly if the sampling theorem is observed, ie if the sample frequency is fs h 2 * f max . If this condition is not met, aliasing frequencies can occur, whereby higher-frequency signal components are folded into the useful frequency range.
  • the Nyquist-Shannon sampling theorem is not observed here.
  • Anti-aliasing filters can be used to prevent aliasing. However, there are vibration systems or corresponding measuring points where an anti-aliasing filter cannot be used.
  • a digital magnetic field sensor for example, can measure the magnetic flux density with an adjustable sampling frequency f s (e.g. 10...,400Hz). Aliasing effects can also occur here if the magnetic field has higher frequencies than f s /2. Since an anti-aliasing filter cannot be used in the case of the magnetic field sensor for physical reasons, the sampling frequency must be of the magnetic field sensor must be correspondingly higher (e.g. 400Hz).
  • Magnetic field sensors can be used to detect slip in asynchronous motors.
  • One method for detecting slip is to observe the time course of the magnetic flux density during operation.
  • a slip frequency f SC hiu P f can be observed in the magnetic rotating field of the motor.
  • This slip frequency ( ⁇ 5 Hz) the frequency of which is to be measured, is, however, superimposed by the rotating field frequency fdusfeid (e.g. 49...50 Hz) of the asynchronous motor.
  • a low sampling frequency (e.g. 10Hz) is basically sufficient and desirable.
  • a higher sampling frequency has a negative impact on power consumption, memory requirements and computing effort and can, for example, reduce battery life and increase the necessary hardware equipment of the sensor electronics.
  • the superimposed frequency of the rotating field e.g. 49Hz
  • the magnetic field had to be sampled at a much higher frequency (minimum 100 Hz, and even higher at higher rotating field frequencies) to avoid aliasing frequencies. Otherwise, the slip frequency measurement was not possible up to now.
  • the invention is based on the object of specifying a device and a method for determining an oscillation frequency of an oscillation system, which enable a high measurement accuracy while at the same time requiring little energy and material.
  • This object is achieved by a device for determining a first oscillation frequency of an oscillation of a vibration system according to claim 1. Furthermore, the object is achieved by using a device according to claim 9. Furthermore, the object is achieved by a method for determining a first vibration frequency of a vibration of a vibration system according to claim 11. Furthermore, the object is achieved by a computer program product according to claim 14. Advantageous further developments emerge from the dependent claims.
  • a device for determining a first oscillation frequency of an oscillation of an oscillation system, wherein the oscillation of the oscillation system has at least one second oscillation frequency in addition to the first oscillation frequency, and wherein the second oscillation frequency is greater in magnitude than the first oscillation frequency, has at least the following parts:
  • a detection system which is designed to measure the vibration of the vibration system with at least one predeterminable sampling frequency
  • a processing unit which is designed to determine vibration frequencies of the measured vibration of the vibration system.
  • the device is characterized in that the detection system is further designed to metrologically detect the vibration of the vibration system with a first sampling frequency and at least one second sampling frequency different from the first, wherein the first sampling frequency and the second sampling frequency are less than twice the second vibration frequency of the vibration, and that the processing unit is further designed to determine the first vibration frequency from a comparison of the vibration metrologically detected with the first sampling frequency and the vibration metrologically detected with the second sampling frequency.
  • the device according to the invention can be used advantageously in vibration systems that have the above-mentioned conditions.
  • An oscillation of the vibration The vibration system has at least two different vibration frequencies.
  • the device is not intended for use in a vibration system with only a single vibration frequency.
  • the detection system can measure the vibration of the vibration system using a first and a second sampling frequency.
  • a detection system can, for example, comprise a passive sensor unit such as a pressure sensor and a supply unit which supplies the passive sensor unit with electrical energy for the measurement.
  • a detection system can also comprise an active sensor unit which does not require an external energy supply.
  • the detection system is designed and intended to measure the vibration of the vibration system using both a first sampling frequency and a second sampling frequency.
  • the first sampling frequency and the second sampling frequency are smaller in magnitude than twice the second vibration frequency of the vibration. In other words: the conditions of the Nyquist-Shannon sampling theorem are not met, so there is deliberate undersampling of the vibration of the vibration system. If sampling were only carried out using a single sampling frequency, it would generally not be possible to distinguish the aliasing frequencies of the second vibration frequency caused by the undersampling from the first vibration frequency being sought.
  • the processing unit is designed to compare the vibrations detected with the respective sampling frequency and to determine the first vibration frequency from this comparison.
  • the device according to the invention can operate with lower sampling frequencies by deliberately undersampling the vibration, which leads to a reduction in energy consumption and a reduction in the requirements for the hardware of the detection system.
  • the first oscillation frequency of the oscillation system can be determined despite potentially occurring aliasing effects without the need for anti-aliasing filtering.
  • the processing unit can be designed to determine the first oscillation frequency as part of the comparison of the oscillation measured with the first sampling frequency and the oscillation measured with the second sampling frequency by searching for an oscillation frequency that is measured both when the oscillation is sampled with the first sampling frequency and when the oscillation is sampled with the second sampling frequency. This is based on the knowledge that the aliasing frequencies of the first and second oscillation frequencies of the oscillation of the oscillation system that occur during sampling with the first sampling frequency and those that occur during sampling with the second sampling frequency differ from one another in terms of magnitude.
  • the first oscillation frequency that is actually being sought does not represent an aliasing frequency and is therefore measured identically at both sampling frequencies. By comparing the results of the two samples, the first oscillation frequency can be identified as a matching element.
  • the two sampling frequencies can be specified manually by a user of the device, as long as the first sampling frequency and the second sampling frequency are smaller in magnitude than twice the second oscillation frequency of the oscillation - i.e. an actual undersampling with respect to the second oscillation frequency takes place. If the first sampling frequency and the second sampling frequency are selected to be too low, it may be the case that the first oscillation frequency that is to be determined is also undersampled. In this case, the processing unit would not be able to determine a first oscillation frequency, whereupon the operator would have to manually, based on experience and/or assumed values for the first oscillation frequency, higher amounts for the two sampling frequencies could be specified.
  • the device is designed to reduce the first sampling frequency and the second sampling frequency in an iterative process, starting from initial, relatively high sampling frequencies, to minimum sampling frequency values, such that the oscillation frequency can just be measured both when the oscillation is sampled with the first sampling frequency and when the oscillation is sampled with the second sampling frequency.
  • the device is capable of changing the frequency values of the two sampling frequencies in a step-by-step process, i.e. increasing or decreasing them, starting from initial values for the two sampling frequencies, which may be, for example, in the range of the second oscillation frequency or, at very low sampling frequencies, close to zero.
  • initial values for the two sampling frequencies which may be, for example, in the range of the second oscillation frequency or, at very low sampling frequencies, close to zero.
  • the oscillation of the oscillation system is measured for each pair of sampling frequencies and the two samples are compared with one another.
  • the sampling frequencies are gradually reduced and the measurement results are compared until a common oscillation frequency (the first oscillation frequency sought) can no longer be found. If relatively low values are assumed, the sampling frequencies are gradually increased and the measurement results are compared until a common oscillation frequency (the first oscillation frequency sought) can be found. In both cases, pairs of (minimum) sampling frequencies can be determined automatically which are optimal or at least almost optimal in terms of minimal energy consumption.
  • the user of the device can select or specify whether the automated search for optimal sampling frequencies is carried out at relatively small or relatively large initial values. This can be of particular interest to the user if he has an idea of the approximate magnitude of the first oscillation frequency of the oscillation system.
  • the detection system is designed to measure the vibration of the vibration system in parallel with the first sampling frequency and at least the second sampling frequency that is different from the first.
  • the vibration of the vibration system is measured at the same time with the first and the second sampling frequency.
  • the detection system can have a first detection unit which is designed and intended to measure the vibration of the vibration system at the first sampling frequency.
  • the detection system can have a second detection unit which is designed and intended to measure the vibration of the vibration system at at least the second sampling frequency.
  • the detection system can have a first sensor and a second sensor, which are in particular of the same type, with each sensor detecting the vibration at a respective sampling frequency. The redundancy achieved in this embodiment can be used advantageously for safety-relevant applications.
  • the detection system can also have a detection unit that is designed to measure the vibration of the vibration system with the first sampling frequency and with at least the second sampling frequency. Two different detection units are therefore not necessarily required.
  • the detection system can be designed in such a way that the detection unit is given appropriate specifications with regard to the scanning.
  • the detection system has system has a microcontroller or a comparable unit that specifies a fixed sampling frequency (for example as the first sampling frequency) for the detection unit.
  • the microcontroller/comparable unit triggers further samplings of the detection unit in such a way that the detection unit additionally measures the vibration of the vibration system with a second sampling frequency (for example as the second sampling frequency).
  • the advantage here is that only a single detection unit is required.
  • the detection system can also have a (single) detection unit that is designed to measure the vibration of the vibration system within a first time period at the first sampling frequency and within a second time period different from the first time period at least at the second sampling frequency different from the first, one after the other.
  • the two samples are not carried out in parallel, but one after the other.
  • the previously formulated object is also achieved by using a device as explained above for determining a first oscillation frequency of an oscillation of an oscillation system, wherein the oscillation of the oscillation system has, in addition to the first oscillation frequency, at least one second oscillation frequency which is greater in magnitude than the first oscillation frequency.
  • the vibration system is an electromagnetic motor, wherein the first vibration frequency is attributable to a slip of the motor and the second vibration frequency to a magnetic field generated by a rotation of the motor.
  • the vibration frequencies of the slip and the motor are generally relatively far apart.
  • a vibration frequency (the second vibration frequency) of the motor can be 50 Hz
  • a vibration frequency of the slip (the first vibration frequency) can be 2 Hz, for example.
  • the conditions of the Nyquist-Shannon sampling theorem would have to be met in known methods and the sampling frequency would have to be selected to be at least 100 Hz. This entails relatively high demands on the detection electronics and a relatively high energy requirement.
  • two sampling frequencies can be selected which are significantly lower.
  • a first sampling frequency of 5 Hz and a second sampling frequency of 6 Hz could be used.
  • the invention is not restricted to these two numerical examples.
  • the problem explained above is also solved by a method for determining a first oscillation frequency of an oscillation of an oscillation system, wherein the oscillation of the oscillation system has, in addition to the first oscillation frequency, at least one second oscillation frequency which is greater in magnitude than the first oscillation frequency.
  • the method comprises the following steps: a) metrologically detecting an oscillation of the oscillation system using a detection system with a first sampling frequency and at least one second sampling frequency which is different from the first, wherein the first sampling frequency and the second sampling frequency are less in magnitude than twice the second oscillation frequency of the oscillation, b) determining the first oscillation frequency of the oscillation of the oscillation system by comparing the oscillation measured with the first sampling frequency and the oscillation measured with the second sampling frequency.
  • the first oscillation frequency is determined as part of the comparison of the oscillation measured with the first sampling frequency and the oscillation measured with the second sampling frequency by the processing unit searching for an oscillation frequency which is measured both when the oscillation is sampled at the first sampling frequency and when the oscillation is sampled at the second sampling frequency.
  • the first sampling frequency and the second sampling frequency are changed, starting from initial sampling frequencies, in an iterative process towards minimum sampling frequencies, such that the first oscillation frequency can just be measured both when the oscillation is sampled with the first sampling frequency and when the oscillation is sampled with the second sampling frequency.
  • the object is achieved by a computer program product comprising instructions which, when the program is executed by a device as explained above, cause the device to carry out a method as explained above.
  • FIG 1 shows a first embodiment of a device according to the invention
  • FIG 2 shows a second embodiment of a device according to the invention
  • FIG 3 shows a third embodiment of a device according to the invention.
  • FIG 4 shows a comparison of sampled oscillations in the frequency spectrum.
  • FIG 1 shows a device 1 according to the invention, which comprises a detection system 2 and a processing unit 3.
  • the detection system 2 has a first detection unit 4 and a second detection unit 5, each of which is designed as a magnetic field sensor of the same type.
  • the detection system 2 also comprises a first part 6a of a microcontroller 6.
  • the first part 6a of the microcontroller 6 is designed to specify a sampling frequency for the two detection units 4, 5.
  • the detection units 4, 5 use the sampling frequency to detect a magnetic oscillation 7 of an oscillation system 8 designed as an electric motor.
  • the magnetic oscillation 7 has an oscillation function designated B (t) in FIG. 1.
  • a second part 6b of the microcontroller 6 is designed as a processing unit 6b, the functionality of which is explained with reference to FIG 4.
  • the first part 6a of the microcontroller 6 specifies a first sampling frequency f si for the first detection unit 4 and a second sampling frequency f S 2 for the second detection unit 5.
  • the first sampling frequency f si and the second sampling frequency f S 2 differ from one another in terms of their magnitude.
  • the magnetic oscillation function B (t) is shown schematically in a time curve diagram.
  • the first detection unit 4 samples the oscillation function B (t) with a specific sampling period T si - the sampling times are marked with circles in FIG. 1.
  • the second detection unit 5 samples the oscillation function B (t) with a specific sampling period T S 2 , which in this case is smaller than the sampling period T si of the first detection unit 4 - the sampling times are marked with crosses in FIG. 1.
  • the two detection units 4, 5 carry out the detection of the magnetic oscillation function B (t) in parallel. After the detection of the magnetic oscillation function B (t), the oscillation frequencies of the magnetic oscillation function are determined, which is explained in detail using FIG 4.
  • FIG 2 shows a further device 1 according to the invention, which comprises a detection system 2 and a processing unit 3.
  • the detection system 2 has only one detection unit 9.
  • the detection unit 9 samples the oscillation function B (t) within a first time period (bottom left in FIG 2) at a specific sampling rate T si - the sampling times are marked with circles in FIG 2.
  • T si the sampling rate
  • the detection unit 9 samples the oscillation function B (t) at a sampling rate T S 2 .
  • the device 1 in this exemplary embodiment uses two different sampling frequencies one after the other (and not in parallel).
  • the first part 6a of the microcontroller 6 of the detection unit 9 specifies a first sampling frequency f si or a sampling rate with which the magnetic oscillation function B (t) is sampled (symbolized with circles in FIG 3 below).
  • the microcontroller triggers a sampling by the detection unit 9 at further, additional points in time (symbolized with crosses in FIG 3 below). These additional triggers are specified in such a way that the detection unit 9 effectively samples the magnetic oscillation function B (t) with two different sampling frequencies f si, f s 2 .
  • FIG 4 a frequency spectrum 10, 11 of the magnetic resonance signals sampled with a specific sampling frequency is shown. see oscillation function B (t) from FIGS 1-3.
  • the upper frequency spectrum 10 is assigned to a sample with a first sampling frequency f si with a value of 10 Hz.
  • the lower frequency spectrum 11 is assigned to a sample with a second sampling frequency f S 2 with a value of 15 Hz.
  • the measurements were carried out with one of the devices 1 according to one of FIGS. 1-3.
  • the processing unit 6b of the microcontroller 6 carries out a frequency analysis of the sampled vibration function B (t), the results of which are the frequency spectra in FIG. 4.
  • a frequency of the rotating magnetic field with a value of 49 Hz can be seen, which represents the second vibration frequency of the "motor” vibration system.
  • an alias frequency with a value of 1 Hz is created (FIG. 4 above).
  • the frequency of the slip of the motor can be seen as the first vibration frequency of the "motor” vibration system with a value of 2 Hz. From this single measurement alone, it would not be possible to determine which frequency represents the desired frequency of the slip of the motor.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)

Abstract

L'invention concerne un dispositif (1) pour déterminer une première fréquence d'oscillation (fSchlupf) d'une oscillation (7) d'un système oscillant (8), l'oscillation (7) du système oscillant (8) ayant, en plus de la première fréquence d'oscillation (fSchlupf), au moins une seconde fréquence d'oscillation ( fDrehfeld), la seconde fréquence d'oscillation (fDrehfeld) ayant une amplitude supérieure à celle de la première fréquence d'oscillation (fSchlupf), le dispositif (1) comprenant : - un système de détection (2) qui est conçu pour détecter de manière métrologique l'oscillation (7) du système oscillant (8) à au moins une fréquence d'échantillonnage spécifiable (fs1, fs2), - une unité de traitement (6b) qui est conçue pour déterminer des fréquences d'oscillation (fDrehfeld, f Schlupf) de l'oscillation détectée métrologiquement (7) du système oscillant (8). Le dispositif (1) est caractérisé en ce que le système de détection (2) est également conçu pour détecter de manière métrologique l'oscillation (7) du système oscillant (8) à une première fréquence d'échantillonnage (fs1) et au moins une seconde fréquence d'échantillonnage (fs2) différente de la première fréquence d'échantillonnage (fs1), la première fréquence d'échantillonnage (fs1) et la seconde fréquence d'échantillonnage (fs2) étant inférieures à deux fois la seconde fréquence d'oscillation (fDrehfeld) de l'oscillation (7), et en ce que l'unité de traitement (6b) est également conçue pour déterminer la première fréquence d'oscillation (fSchlupf) en comparant l'oscillation (7) détectée métrologiquement à la première fréquence d'échantillonnage (fs1) et l'oscillation (7) détectée métrologiquement à la seconde fréquence d'échantillonnage (fs2).
PCT/EP2022/083907 2022-11-30 2022-11-30 Détermination d'une fréquence d'oscillation d'un système oscillant WO2024114905A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/EP2022/083907 WO2024114905A1 (fr) 2022-11-30 2022-11-30 Détermination d'une fréquence d'oscillation d'un système oscillant

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PCT/EP2022/083907 WO2024114905A1 (fr) 2022-11-30 2022-11-30 Détermination d'une fréquence d'oscillation d'un système oscillant

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005019841A2 (fr) * 2003-08-04 2005-03-03 Gradient Procede de traitement du signal pour le calcul de spectres de signaux sous-echantillonnes
DE102015208679A1 (de) 2015-05-11 2016-11-17 Contitech Antriebssysteme Gmbh Verfahren zur Schlupfmessung in Riementrieben
WO2019049199A1 (fr) * 2017-09-05 2019-03-14 三菱電機株式会社 Système d'affichage de données, dispositif d'affichage, et procédé d'affichage de données
CN113533529A (zh) * 2021-05-18 2021-10-22 西安交通大学 单个或均布叶端定时传感器提取叶片间固有频率差值方法
WO2022147684A1 (fr) * 2021-01-06 2022-07-14 罗伯特·博世有限公司 Procédé et appareil d'identification d'anomalies dans un appareil mécanique ou un composant mécanique

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005019841A2 (fr) * 2003-08-04 2005-03-03 Gradient Procede de traitement du signal pour le calcul de spectres de signaux sous-echantillonnes
DE102015208679A1 (de) 2015-05-11 2016-11-17 Contitech Antriebssysteme Gmbh Verfahren zur Schlupfmessung in Riementrieben
WO2019049199A1 (fr) * 2017-09-05 2019-03-14 三菱電機株式会社 Système d'affichage de données, dispositif d'affichage, et procédé d'affichage de données
WO2022147684A1 (fr) * 2021-01-06 2022-07-14 罗伯特·博世有限公司 Procédé et appareil d'identification d'anomalies dans un appareil mécanique ou un composant mécanique
CN113533529A (zh) * 2021-05-18 2021-10-22 西安交通大学 单个或均布叶端定时传感器提取叶片间固有频率差值方法

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