WO2024077614A1

WO2024077614A1 - Method for testing sampling chip, test apparatus, control device, and storage medium

Info

Publication number: WO2024077614A1
Application number: PCT/CN2022/125483
Authority: WO
Inventors: 周芳杰; 楚乐; 吴国秀
Original assignee: 宁德时代新能源科技股份有限公司
Priority date: 2022-10-14
Filing date: 2022-10-14
Publication date: 2024-04-18

Abstract

The present application provides a method for testing a sampling chip, a test apparatus, a control device, a computer readable storage medium, and a computer program product. The method for testing a sampling chip comprises: according to a working mode of a battery cell coupled to a sampling chip, configuring a coupling mode of a high-voltage source across the sampling chip, wherein the sampling chip is used for collecting information of the battery cell, and the high-voltage source is used for providing a voltage across the sampling chip when simulating an open circuit of the battery cell; simulating the open circuit of the battery cell by means of a switching circuit according to the coupling mode of the high-voltage source; and determining a working state of the sampling chip in the open-circuit period of the battery cell.

Description

Method and device for testing sampling chip, control device and storage medium

Technical Field

The present application relates to the field of battery technology, and in particular to a method and a testing device for testing a sampling chip, a computer-readable storage medium of a control device, and a computer program product.

Background technique

Energy conservation and emission reduction are the key to the sustainable development of the automobile industry. Electric vehicles have become an important part of the sustainable development of the automobile industry due to their advantages in energy conservation and environmental protection. For electric vehicles, battery technology is an important factor in their development.

In some cases, during the driving of an electric vehicle, the connection circuit between battery cells may be open due to broken battery poles, desoldering of copper bars, loosening of fixing screws, etc., thus affecting the safety performance of the battery and the associated sampling chip.

Summary of the invention

The present application aims to solve at least one of the technical problems existing in the prior art. To this end, one purpose of the present application is to provide a method and a testing device for testing a sampling chip, a control device, a computer-readable storage medium, and a computer program product, so as to test the performance of the sampling chip in advance and avoid problems such as fire and burning during use.

An embodiment of the first aspect of the present application provides a method for testing a sampling chip, comprising: configuring a coupling mode of a high-voltage source across the sampling chip according to an operating mode of a battery cell coupled to the sampling chip, wherein the sampling chip is used to collect information of the battery cell, and the high-voltage source is used to provide a voltage across the sampling chip when simulating an open circuit in the battery cell; simulating an open circuit in the battery cell via a switching circuit according to the coupling mode of the high-voltage source; and determining the operating state of the sampling chip during the period when the battery cell is open circuit.

In the technical solution of the embodiment of the present application, by setting the coupling mode of the high-voltage source, the high voltage appearing at both ends of the sampling chip when the connection circuit between the battery cells is open can be simulated, and the working condition of the sampling chip when the battery cell is open can be reproduced more realistically. Therefore, the working state of the chip under the above-mentioned harsh working conditions can be tested in advance during the design stage of the sampling chip, effectively avoiding problems such as sparks or burning during the operation of the vehicle, and improving the safety performance of the battery and the vehicle. At the same time, configuring the coupling mode of the positive and negative electrodes of the high-voltage source according to the working mode of the battery cell can cover different working conditions during the driving process of the vehicle, making the test results more accurate and reliable.

In some embodiments, according to the working mode of the battery cell coupled to the sampling chip, the coupling method of the high voltage source across the sampling chip includes: when the working mode of the battery cell is discharge: coupling the positive electrode of the high voltage source to the first sampling lead of the sampling leads of the battery cell; and coupling the negative electrode of the high voltage source to the second sampling lead of the sampling leads of the battery cell that is different from the first sampling lead, wherein the voltage on the second sampling lead is higher than the voltage on the first sampling lead. By coupling the positive electrode of the high voltage source to any sampling lead of the sampling leads of the battery cell, and coupling the negative electrode of the high voltage source to another sampling lead of the battery cell with a relatively high voltage, the high voltage at both ends of the sampling chip at the moment when the battery cell is in a discharge condition can be truly simulated. In this case, it is only necessary to configure so that the voltage on the sampling lead to which the positive electrode of the high voltage source is coupled is lower than the voltage on the sampling lead to which the negative electrode of the high voltage source is coupled, so that multiple configuration methods can be realized, making the operation more flexible.

In some embodiments, according to the working mode of the battery cell coupled to the sampling chip, the coupling method of the high-voltage source across the sampling chip also includes: when the working mode of the battery cell is discharge: further coupling the positive electrode of the high-voltage source to the sampling chip ground wire, and wherein among all the sampling leads of the battery cell, the voltage on the first sampling lead is the lowest, and the second sampling lead and the first sampling lead are located in the same sampling channel of the sampling chip. By configuring the positive electrode of the high-voltage source to be coupled to the sampling chip ground wire and the sampling lead with the lowest voltage, and configuring the positive and negative electrodes of the high-voltage source to be respectively coupled to the same sampling channel of the sampling chip, the entire sampling chip can be verified, thereby improving the accuracy and credibility of the performance evaluation of the sampling chip.

In some embodiments, according to the working mode of the battery cell coupled to the sampling chip, the coupling method of the high voltage source across the sampling chip includes: when the working mode of the battery cell is charging: coupling the positive electrode of the high voltage source to the third sampling lead of the sampling leads of the battery cell; and coupling the negative electrode of the high voltage source to the fourth sampling lead of the sampling leads of the battery cell, wherein the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead. By coupling the positive electrode of the high voltage source to any sampling lead of the sampling leads of the battery cell, and coupling the negative electrode of the high voltage source to another sampling lead of the battery cell with a relatively low voltage, the high voltage at both ends of the sampling chip at the moment when the battery cell is in a charging condition can be truly simulated. In this case, it is only necessary to configure so that the voltage on the sampling lead to which the positive electrode of the high voltage source is coupled is higher than the voltage on the sampling lead to which the negative electrode of the high voltage source is coupled, so a variety of configuration methods can be implemented, making the operation more flexible.

In some embodiments, according to the working mode of the battery cell coupled to the sampling chip, the coupling method of the high-voltage source across the sampling chip further includes: when the working mode of the battery cell is charging: further coupling the positive electrode of the high-voltage source to the battery lead; and further coupling the negative electrode of the high-voltage source to the sampling chip ground wire, and wherein, among all the sampling leads of the battery cell, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest. By configuring the positive and negative electrodes of the high-voltage source to be coupled to the sampling leads with the highest and lowest voltages, respectively, the entire sampling chip can be verified, thereby improving the accuracy and credibility of the performance evaluation of the sampling chip.

In some embodiments, determining the working state of the sampling chip during the period when the battery cell is open-circuited includes: obtaining a recording result of the sampling chip during the period when the battery cell is open-circuited via a recording device; and determining whether the sampling chip is burned during the period when the battery cell is open-circuited according to the recording result. The working state of the sampling chip during the evaluation of the sampling chip can be recorded in real time via the recording device, which can timely detect whether the sampling chip has a fault such as fire or burning, and can provide a basis for subsequent improvement of the sampling chip design.

In some embodiments, the method for testing the sampling chip further includes: performing additional testing on the sampling chip to determine whether the working state of the sampling chip during the period when the battery cell is open-circuited satisfies a preset rule, based on the determination that the working state of the sampling chip during the period when the battery cell is open-circuited indicates that the sampling chip is not burned. By performing additional testing on the chip that is not burned, it can be determined during the testing phase whether the sampling chip that has experienced the battery cell open-circuit condition can still be used normally, thereby avoiding the use of a sampling chip that has not been burned but whose performance cannot meet normal working conditions in a vehicle, thereby further improving the safety performance of the battery and the vehicle.

In some embodiments, the sampling chip is an analog front-end (AFE) chip. The analog front-end AFE chip can collect information such as voltage and temperature of the series-connected cells to achieve real-time monitoring of the battery status. It is one of the very important sampling chips in the battery management system. By testing the AFE chip, it is more conducive to ensuring the safe and reliable operation of the entire battery unit.

In some embodiments, the voltage of the battery cell is 4.25V, and the number of battery cells in series is equal to the number of sampling channels of the sampling chip. By setting the cell voltage, the standard that the sampling chip needs to meet during vehicle driving can be standardized, and by configuring the sampling channels to be fully equipped, it is easier to simulate the occurrence of failures such as fire and burning of the sampling chip when the battery cell is open-circuited, which is conducive to more accurately evaluating the safety performance of the sampling chip.

The second aspect of the present application provides a test device, including: a battery module, which is configured to provide electrical energy; a sampling chip, which is coupled to the battery module and configured to collect information of the battery module; a high voltage source, which is configured to have a corresponding coupling mode with the sampling chip according to the working mode of the battery module to provide a voltage across the sampling chip when simulating an open circuit in the battery module; and a switch circuit, which is configured to simulate an open circuit in the battery module according to the coupling mode of the high voltage source. This embodiment can obtain the same technical effect as the corresponding method for testing the sampling chip described above.

In some embodiments, the high voltage source is further configured to: when the working mode of the battery module is discharge, the positive electrode of the high voltage source is coupled to the first sampling lead of the sampling leads of the battery module; and the negative electrode of the high voltage source is coupled to the second sampling lead of the sampling leads of the battery module that is different from the first sampling lead, wherein the voltage on the second sampling lead is higher than the voltage on the first sampling lead. This embodiment can achieve the same technical effect as the corresponding method for testing the sampling chip described above.

In some embodiments, the high voltage source is further configured to: when the working mode of the battery module is discharge, further couple the positive electrode of the high voltage source to the sampling chip ground line, and wherein, among all the sampling leads of the battery module, the voltage on the first sampling lead is the lowest, and the second sampling lead and the first sampling lead are located in the same sampling channel of the sampling chip. This embodiment can achieve the same technical effect as the above-mentioned corresponding method for testing the sampling chip.

In some embodiments, the high voltage source is further configured to: when the working mode of the battery module is charging, the positive electrode of the high voltage source is coupled to the third sampling lead of the sampling leads of the battery module; and the negative electrode of the high voltage source is coupled to the fourth sampling lead of the sampling leads of the battery module, wherein the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead. This embodiment can achieve the same technical effect as the above-mentioned corresponding method for testing and evaluating the sampling chip.

In some embodiments, the high voltage source is further configured to: when the working mode of the battery module is charging, further make: the positive electrode of the high voltage source coupled to the battery lead, and the negative electrode of the high voltage source coupled to the sampling chip ground wire, and wherein, among all the sampling leads of the battery module, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest. This embodiment can obtain the same technical effect as the above-mentioned corresponding method for testing the sampling chip.

In some embodiments, the testing device further comprises: a recording device configured to record the working state of the control sampling chip during the period when the battery module is open-circuited. This embodiment can achieve the same technical effect as the above-mentioned corresponding method for testing the sampling chip.

In some embodiments, the testing device further includes: an additional testing device, the additional testing device being configured to: perform an additional test on the sampling chip to determine whether the working state of the sampling chip meets the preset regulations within the preset voltage range and the preset temperature range, based on the working state of the sampling chip during the open circuit of the battery module indicating that the sampling chip has not been burned. This embodiment can achieve the same technical effect as the corresponding method for testing the sampling chip described above.

In some implementations, the sampling chip is an analog front end AFE chip. This embodiment can achieve the same technical effect as the above-mentioned corresponding method for testing the sampling chip.

In some embodiments, the voltage of each battery cell in the battery module is not less than 3.65V, and the number of battery cells in the battery module is equal to the number of sampling channels of the sampling chip. This embodiment can achieve the same technical effect as the corresponding method for testing the sampling chip.

An embodiment of the third aspect of the present application provides a control device, comprising: at least one processor; and a memory communicatively connected to the at least one processor, wherein the memory stores instructions executable by the at least one processor, and when the instructions are executed by the at least one processor, the at least one processor executes the method for testing a sampling chip according to the present application.

An embodiment of a fourth aspect of the present application provides a computer-readable storage medium storing a computer program, which implements the method for testing a sampling chip according to the present application when executed by a processor.

An embodiment of the fifth aspect of the present application provides a computer program product, including a computer program, wherein the computer program implements the method for testing a sampling chip according to the present application when executed by a processor.

The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below.

BRIEF DESCRIPTION OF THE DRAWINGS

In the accompanying drawings, unless otherwise specified, the same reference numerals throughout the multiple drawings represent the same or similar parts or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings only depict some embodiments disclosed in the present application and should not be regarded as limiting the scope of the present application.

FIG1 is a schematic structural diagram of a vehicle according to some embodiments of the present application;

FIG2 is a schematic diagram of an exploded structure of a battery according to some embodiments of the present application;

FIG3 is a schematic diagram of the exploded structure of a battery cell according to some embodiments of the present application;

FIG4 is a flow chart of a method for testing a sampling chip according to some embodiments of the present application;

FIG5 is a schematic diagram of a flow chart of configuring a coupling method of a high voltage source according to an operating mode of a battery cell in some embodiments of the present application;

FIG6 is a schematic diagram showing a coupling method of a high voltage source under a discharge condition according to some embodiments of the present application;

FIG7 is a schematic diagram of a flow chart of configuring the coupling mode of the positive electrode and the negative electrode of the high voltage source according to the working mode of the battery cell in some other embodiments of the present application;

FIG8 is a schematic diagram showing a coupling method of a high voltage source under a charging condition according to some embodiments of the present application;

FIG9 is a structural block diagram of a testing device according to some embodiments of the present application;

FIG10 is a structural block diagram of a control device in some embodiments of the present application; and

FIG. 11 is a flow chart of a method for testing a sampling chip according to other embodiments of the present application.

Description of reference numerals:

Vehicles 1000;

Battery 100, controller 200, motor 300;

Box body 10, first part 11, second part 12;

Battery cell 20, end cover 21, electrode terminal 21a, housing 22, battery cell assembly 23, and tab 23a;

Battery module 610, cell monitor unit (CMU) 620, AFE chip 625, high voltage source 630, switch circuit 640, loop 1, loop 2, loop 3;

Battery module 810, cell monitoring unit CMU 820, AFE chip 825, high voltage source 830, switch circuit 840, loop 4, loop 5, loop 6;

Battery module 910 , sampling chip 920 , high voltage source 930 , switch circuit 940 , recording device 950 .

Detailed ways

The following embodiments of the technical solution of the present application will be described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.

Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

In the description of the embodiments of the present application, the term "and/or" is only a description of the association relationship of associated objects, indicating that three relationships may exist. For example, A and/or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character "/" in this article generally indicates that the associated objects before and after are in an "or" relationship.

In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

In the description of the embodiments of the present application, the orientations or positional relationships indicated by technical terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", and "circumferential" are based on the orientations or positional relationships shown in the accompanying drawings and are only for the convenience of describing the embodiments of the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the embodiments of the present application.

In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

At present, from the perspective of market development, the application of power batteries is becoming more and more extensive. Power batteries are not only used in energy storage power systems such as hydropower, thermal power, wind power and solar power stations, but also widely used in electric vehicles such as electric bicycles, electric motorcycles, electric cars, as well as military equipment and aerospace and other fields. With the continuous expansion of the application field of power batteries, the market demand is also constantly expanding.

The applicant has noticed that during the driving of electric vehicles such as electric cars, as the battery is charged and discharged, the following situations may occur: the battery pole is broken, the copper bar is desoldered due to thermal expansion and contraction, the fixing screws are loose, etc. The above situations may cause the connection circuit between the battery cells to be open. At the moment of the open circuit, a high voltage will be generated at both ends of the sampling chip coupled to the open circuit point, which may cause the sampling chip to burn instantly and catch fire, thereby affecting the normal operation of the battery and the safety performance of the electric vehicle.

In order to alleviate the problem of sampling chip burning caused by an open circuit in the connection loop between battery cells, the applicant has found that the sampling chip can be tested and evaluated according to actual needs. For example, the corresponding test scheme can be determined according to the type of electric vehicle in which the battery cell and the sampling chip are used. However, on the one hand, the test scheme is usually aimed at sampling chips that have been mass-produced, and when the evaluation results indicate that the sampling chip cannot meet the needs, it is necessary to select chips produced by other manufacturers. On the other hand, the evaluation results of the sampling chip obtained according to different test schemes may be different, which will lead to poor versatility of the sampling chip and increase the complexity of producing the sampling chip to a certain extent.

Based on the above technical problems discovered, the applicant has conducted in-depth research and provided a method and test device, control equipment, computer-readable storage medium and computer program product for testing sampling chips. The coupling mode of the high-voltage source is configured according to the working mode of the battery cell to simulate the high voltage that appears at both ends of the sampling chip when the connection circuit between the cells is open, and determine the working state of the sampling chip under this high voltage. In this way, the working condition of the sampling chip when the cell is open can be reproduced more realistically, which is conducive to determining the working state of the chip under the above-mentioned harsh working conditions in advance during the design stage of the sampling chip, effectively avoiding problems such as sparks or fires during vehicle driving, and improving the safety performance of the battery and the vehicle. At the same time, configuring the coupling mode of the high-voltage source according to the working mode of the cell can cover different working conditions during the operation of the vehicle, making the test results more accurate and reliable.

The embodiments of the present application can be applied to any sampling chip for collecting battery cell information.

For the convenience of description, the following embodiments are described by taking a vehicle 1000 as an example of an electrical device according to an embodiment of the present application.

Please refer to Figure 1, which is a schematic diagram of the structure of a vehicle 1000 provided in some embodiments of the present application. The vehicle 1000 may be a fuel vehicle, a gas vehicle or a new energy vehicle, and the new energy vehicle may be a pure electric vehicle, a hybrid vehicle or an extended-range vehicle, etc. A battery 100 is provided inside the vehicle 1000, and the battery 100 may be provided at the bottom, head or tail of the vehicle 1000. The battery 100 may be used to power the vehicle 1000, for example, the battery 100 may be used as an operating power source for the vehicle 1000. The vehicle 1000 may also include a controller 200 and a motor 300, and the controller 200 is used to control the battery 100 to power the motor 300, for example, for the starting, navigation and driving power requirements of the vehicle 1000.

In some embodiments of the present application, the battery 100 can not only serve as an operating power source for the vehicle 1000, but also serve as a driving power source for the vehicle 1000, replacing or partially replacing fuel or natural gas to provide driving power for the vehicle 1000.

Please refer to FIG. 2, which is an exploded view of a battery 100 provided in some embodiments of the present application. The battery 100 includes a box 10 and a battery cell 20, and the battery cell 20 is contained in the box 10. Among them, the box 10 is used to provide a storage space for the battery cell 20, and the box 10 can adopt a variety of structures. In some embodiments, the box 10 may include a first part 11 and a second part 12, and the first part 11 and the second part 12 cover each other, and the first part 11 and the second part 12 jointly define a storage space for accommodating the battery cell 20. The second part 12 may be a hollow structure with one end open, and the first part 11 may be a plate-like structure, and the first part 11 covers the open side of the second part 12, so that the first part 11 and the second part 12 jointly define a storage space; the first part 11 and the second part 12 may also be hollow structures with one side open, and the open side of the first part 11 covers the open side of the second part 12. Of course, the box 10 formed by the first part 11 and the second part 12 can be in a variety of shapes, such as a cylinder, a cuboid, etc.

In the battery 100, there may be multiple battery cells 20, and the multiple battery cells 20 may be connected in series, in parallel, or in a mixed connection. A mixed connection means that the multiple battery cells 20 are both connected in series and in parallel. The multiple battery cells 20 may be directly connected in series, in parallel, or in a mixed connection, and then the whole formed by the multiple battery cells 20 is accommodated in the box 10; of course, the battery 100 may also be a battery module formed by connecting multiple battery cells 20 in series, in parallel, or in a mixed connection, and then the multiple battery modules are connected in series, in parallel, or in a mixed connection to form a whole, and accommodated in the box 10. The battery 100 may also include other structures, for example, the battery 100 may also include a busbar component for realizing electrical connection between the multiple battery cells 20.

Each battery cell 20 may be a secondary battery or a primary battery, or a lithium-sulfur battery, a sodium-ion battery, or a magnesium-ion battery, but is not limited thereto. The battery cell 20 may be cylindrical, flat, rectangular, or in other shapes.

Please refer to FIG. 3, which is a schematic diagram of the exploded structure of a battery cell 20 provided in some embodiments of the present application. The battery cell 20 refers to the smallest unit that constitutes a battery. As shown in FIG. 3, the battery cell 20 includes an end cap 21, a housing 22, a battery cell assembly 23 and other functional components.

The end cap 21 refers to a component that covers the opening of the shell 22 to isolate the internal environment of the battery cell 20 from the external environment. Without limitation, the shape of the end cap 21 can be adapted to the shape of the shell 22 to match the shell 22. Optionally, the end cap 21 can be made of a material with a certain hardness and strength (such as aluminum alloy), so that the end cap 21 is not easily deformed when squeezed and collided, so that the battery cell 20 can have a higher structural strength and the safety performance can also be improved. Functional components such as electrode terminals 21a can be provided on the end cap 21. The electrode terminal 21a can be used to electrically connect to the battery cell assembly 23 for outputting or inputting electrical energy of the battery cell 20. In some embodiments, the end cap 21 can also be provided with a pressure relief mechanism for releasing the internal pressure when the internal pressure or temperature of the battery cell 20 reaches a threshold. The material of the end cap 21 can also be a variety of materials, such as copper, iron, aluminum, stainless steel, aluminum alloy, plastic, etc., and the embodiments of the present application do not impose special restrictions on this. In some embodiments, an insulating member may be provided inside the end cap 21, and the insulating member may be used to isolate the electrical connection components in the housing 22 from the end cap 21 to reduce the risk of short circuit. For example, the insulating member may be plastic, rubber, or the like.

The shell 22 is a component used to cooperate with the end cap 21 to form the internal environment of the battery cell 20, wherein the formed internal environment can be used to accommodate the battery cell assembly 23, electrolyte and other components. The shell 22 and the end cap 21 can be independent components, and an opening can be set on the shell 22, and the internal environment of the battery cell 20 is formed by covering the opening with the end cap 21 at the opening. Without limitation, the end cap 21 and the shell 22 can also be integrated. Specifically, the end cap 21 and the shell 22 can form a common connection surface before other components are put into the shell, and when the interior of the shell 22 needs to be encapsulated, the end cap 21 covers the shell 22. The shell 22 can be of various shapes and sizes, such as a rectangular parallelepiped, a cylindrical shape, a hexagonal prism, etc. Specifically, the shape of the shell 22 can be determined according to the specific shape and size of the battery cell assembly 23. The material of the shell 22 can be various, such as copper, iron, aluminum, stainless steel, aluminum alloy, plastic, etc., and the embodiment of the present application does not impose any special restrictions on this.

The battery cell assembly 23 is a component in the battery cell 100 where electrochemical reactions occur. One or more battery cell assemblies 23 may be contained in the housing 22. The battery cell assembly 23 is mainly formed by winding or stacking positive and negative electrode sheets, and a separator is usually provided between the positive and negative electrode sheets. The parts of the positive and negative electrode sheets with active materials constitute the main body of the battery cell assembly, and the parts of the positive and negative electrode sheets without active materials each constitute a tab 23a. The positive tab and the negative tab may be located together at one end of the main body or respectively at both ends of the main body. During the charge and discharge process of the battery, the positive active material and the negative active material react with the electrolyte, and the tab 23a connects the electrode terminals to form a current loop.

Fig. 4 is a flow chart of a method 400 for testing a sampling chip according to some embodiments of the present application. As shown in Fig. 4, the method 400 may include: step S410, according to the working mode of the battery cell coupled to the sampling chip, configuring the coupling mode of the high-voltage source across the sampling chip, wherein the sampling chip is used to collect information of the battery cell, and the high-voltage source is used to provide a voltage across the sampling chip when simulating an open circuit of the battery cell; step S420, according to the coupling mode of the high-voltage source, simulating an open circuit of the battery cell via a switch circuit; and step S430, determining the working state of the sampling chip during the period when the cell is open.

The sampling chip may be any chip used to collect information related to a battery cell (eg, the battery cell described above with reference to FIG. 3 ).

The working mode of the battery cell may include a charging mode and a discharging mode. In some examples, when it is desired to test the performance of the battery cell sampling the chip in the charging mode, the working mode of the battery cell is determined to be the charging mode, and when it is desired to test the performance of the battery cell sampling the chip in the discharging mode, the working mode of the battery cell is determined to be the discharging mode.

The high voltage source may be any device for providing a high voltage across the sampling chip when the battery cell is open circuited, such as a high voltage excitation device. The voltage of the high voltage source may be, for example, several hundred volts to several thousand volts.

A switch circuit can represent a circuit with two states, "on" and "off". Examples of switch circuits may include, but are not limited to, logic gate circuits, bistable triggers, transistor circuits, etc. By controlling the on and off of the switch circuit, it is possible to simulate whether the connection loop between battery cells is open, making the operation easier and effectively avoiding the situation where the connection loop between battery cells cannot be simulated due to improper human operation.

By setting the coupling mode of the high-voltage source, the high voltage that appears at both ends of the sampling chip when the connection circuit between the battery cells is open can be simulated, and the working condition of the sampling chip when the battery cell is open can be reproduced more realistically. Therefore, the working state of the chip under the above-mentioned harsh working conditions can be determined in advance during the design stage of the sampling chip, effectively avoiding problems such as sparks or fires during vehicle operation, and improving the safety performance of the battery and the vehicle. At the same time, configuring the coupling mode of the high-voltage source according to the working mode of the battery cell can cover different working conditions during vehicle operation, making the evaluation results more accurate and reliable.

FIG5 is a flow chart of configuring the coupling mode of the high voltage source according to the working mode of the battery cell in some embodiments of the present application. Referring to FIG5, as combined with step S410 shown in FIG4, according to the working mode of the battery cell coupled to the sampling chip, the coupling mode of the high voltage source across the sampling chip may include: step S510, when the working mode of the battery cell is discharge, coupling the positive electrode of the high voltage source to the first sampling lead of the sampling leads of the battery cell; and step S520, when the working mode of the battery cell is discharge, coupling the negative electrode of the high voltage source to the second sampling lead of the sampling leads of the battery cell that is different from the first sampling lead, wherein the voltage on the second sampling lead is higher than the voltage on the first sampling lead.

Typically, the sampling chip is coupled to the battery cell via a sampling lead. Each battery cell is provided with two sampling pins, and two sampling leads connected to the two sampling pins together with the battery cell and the sampling chip constitute a sampling channel. The sampling chip can obtain the voltage of the battery cell by collecting the voltage values on the two sampling leads.

According to some embodiments of the present application, the first sampling lead and the second sampling lead can be any group of sampling leads of the battery cell, as long as the voltage on the second sampling lead is higher than the voltage on the first sampling lead, and are not limited to the first sampling lead and the second sampling lead being located in the same channel of the sampling chip.

By coupling the positive electrode of the high voltage source to any of the sampling leads of the battery cell, and coupling the negative electrode of the high voltage source to another sampling lead of the battery cell on which the voltage is relatively high, the high voltage at both ends of the sampling chip can be truly simulated when the battery cell is in a discharge condition and an open circuit occurs. In this case, it is only necessary to configure the voltage on the sampling lead to which the positive electrode of the high voltage source is coupled to be lower than the voltage on the sampling lead to which the negative electrode of the high voltage source is coupled, so a variety of configurations can be achieved, making the operation more flexible.

According to some embodiments of the present application, according to the working mode of the battery cell coupled to the sampling chip, the coupling method of configuring the high-voltage source across the sampling chip may also include: when the working mode of the battery cell is discharge: further coupling the positive electrode of the high-voltage source to the sampling chip ground line, and wherein, among all the sampling leads of the battery cell, the voltage on the first sampling lead is the lowest, and the second sampling lead and the first sampling lead are located in the same sampling channel of the sampling chip.

The sampling chip ground line can be coupled to the sampling lead line with the lowest voltage thereon for current drainage.

By configuring the positive electrode of the high voltage source to be coupled to the sampling chip ground wire and the sampling lead with the lowest voltage, and configuring the positive and negative electrodes of the high voltage source to be coupled to the same sampling channel of the sampling chip, the entire sampling chip can be verified, thereby improving the accuracy and credibility of the performance evaluation of the sampling chip. The coupling method of the positive and negative electrodes of the high voltage source when the battery cell is in the discharge mode will be described in detail below in conjunction with FIG.

FIG6 is a schematic diagram showing a coupling method of a high voltage source under discharge conditions in some embodiments of the present application. Referring to FIG6 , an integrated circuit 600 including a battery module 610 having 12 cells, a cell monitoring unit CMU 620, a high voltage source 630, and a switch circuit 640 is shown, wherein the CMU is a circuit module obtained by production according to a typical recommended circuit design of an AFE chip, and may include one or more AFE chips and corresponding protectors, etc.

The positive electrode of the high voltage source 630 is coupled to the sampling chip ground wire GND and the sampling lead Cell0 of the battery cell, and the negative electrode of the high voltage source 630 is coupled to the sampling lead Cell1 of the battery cell. It can be seen that the voltage on the sampling lead Cell0 is the lowest among all the sampling leads, and the sampling lead Cell0 and the sampling lead Cell1 are located in the same sampling channel of the sampling chip.

After the configuration of the positive and negative electrodes of the high-voltage source is completed, the switch circuit 640 can be closed, and the high-voltage source 630 can be used to simulate the open circuit of the cell connection loop in the battery module 610. In this case, the current will return from the positive electrode of the high-voltage source 630 to the negative electrode of the high-voltage source 630 via loop 1 (indicated by the solid arrow) to form a high voltage at both ends of the AFE sampling chip 625. If the AFE chip 625 has a fault such as burning or catching fire at this time, the current will return from the positive electrode of the high-voltage source 630 to the negative electrode of the high-voltage source 630 via loop 2 (indicated by the dotted arrow), and so on, until the entire AFE chip 625 is burned, at which time the current will return from the positive electrode of the high-voltage source 630 to the negative electrode of the high-voltage source 630 via loop 3 (indicated by the dotted arrow).

In this case, the entire AFE chip can be tested, which is beneficial to improving the accuracy of the performance evaluation of the sampling chip.

It should be understood that, although FIG. 6 shows an AFE chip, the coupling method of the positive and negative electrodes of the high voltage source described above can be applicable to any sampling chip configured to collect relevant information of a battery cell.

It should also be understood that, for illustrative purposes and not limiting, FIG6 only shows one coupling method of the positive and negative electrodes of the high voltage source when the battery cell is in the discharge mode. However, the AFE chip may have other numbers of sampling channels, the battery module may have other numbers of sampling leads, and as described above, the positive and negative electrodes of the high voltage source may be coupled to any set of sampling leads of the sampling leads of the battery cell, as long as the voltage on the sampling lead to which the positive electrode of the high voltage source is coupled is lower than the voltage on the sampling lead to which the negative electrode of the high voltage source is coupled.

In addition, for the purpose of clarity, FIG. 6 only shows a switch circuit 640 having one switch. It should also be understood that an open circuit in a battery cell can be simulated via a switch circuit having one or more switches. In some examples, the positive and negative electrodes of the high voltage source can be coupled to one or more sampling leads of the battery cell, respectively, wherein each sampling lead is configured with a corresponding switch. By controlling the opening and closing of these switches through a control circuit such as a host computer, a variety of configurations of the positive and negative electrodes of the high voltage source can be achieved, avoiding the situation where the sampling leads are incorrectly connected due to the operation, while saving manpower.

FIG7 is a flow chart of configuring the coupling mode of the high voltage source according to the working state of the battery cell in some other embodiments of the present application. Referring to FIG7, as combined with step S410 shown in FIG4, according to the working mode of the battery cell coupled to the sampling chip, the coupling mode of configuring the high voltage source across the sampling chip may include: step S710, when the working mode of the battery cell is charging, coupling the positive electrode of the high voltage source to the third sampling lead of the sampling leads of the battery cell; and step S720, when the working mode of the battery cell is charging, coupling the negative electrode of the high voltage source to the fourth sampling lead of the sampling leads of the battery cell, wherein the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead.

In the above embodiment, the definition of the sampling lead and the sampling channel is similar to that when the battery cell is in the discharge mode, so it is not repeated here.

According to some embodiments of the present application, the third sampling lead and the fourth sampling lead can be any group of sampling leads of the sampling leads of the battery cell, as long as the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead, and are not limited to the third sampling lead and the fourth sampling lead being located in the same channel of the sampling chip.

By coupling the positive electrode of the high voltage source to any of the sampling leads of the battery cell, and coupling the negative electrode of the high voltage source to another sampling lead of the battery cell with a relatively low voltage, the high voltage across the sampling chip at the moment when the battery cell is in a charging state and an open circuit occurs can be truly simulated. In this case, it is only necessary to configure the voltage on the sampling lead to which the positive electrode of the high voltage source is coupled to be higher than the voltage on the sampling lead to which the negative electrode of the high voltage source is coupled, so a variety of configurations can be implemented, making the operation more flexible.

According to some embodiments of the present application, according to the working mode of the battery cell coupled to the sampling chip, the coupling method of configuring the high-voltage source across the sampling chip may also include: when the working mode of the battery cell is charging: further coupling the positive electrode of the high-voltage source to the battery lead; and further coupling the negative electrode of the high-voltage source to the sampling chip ground line, and wherein, among all the sampling leads of the battery cell, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest.

The battery lead may be characterized as a lead whose voltage is the sum of the battery cell voltages. The sampling chip ground wire may be coupled to the sampling lead with the lowest voltage for current drainage.

By configuring the positive and negative electrodes of the high voltage source to be coupled to the sampling leads with the highest and lowest voltages respectively, the entire sampling chip can be verified, thereby improving the accuracy of the performance evaluation of the sampling chip. The coupling method of the positive and negative electrodes of the high voltage source when the battery cell is in the charging mode will be described in detail below in conjunction with FIG. 8.

FIG8 is a schematic diagram showing a coupling method of a high voltage source under charging conditions in some embodiments of the present application. Referring to FIG8 , an integrated circuit 800 including a battery module 810 having 12 cells, a CMC 820, a high voltage source 830, and a switch circuit 840 is shown. Similarly, the CMC 820 is a circuit module designed by an AFE chip 825 according to a typical recommended circuit, and may include one or more AFE chips and corresponding protection circuits, etc.

The negative electrode of the high voltage source 830 is coupled to the sampling chip ground wire GND and the sampling lead Cell0 of the battery cell, and the positive electrode of the high voltage source 830 is coupled to the battery lead VBAT+ and the sampling lead Cell12 of the battery cell. It can be seen that the voltage on the sampling lead Cell0 is the lowest among all the sampling leads, and the voltage on the sampling lead Cell12 is the highest among all the sampling leads.

After the configuration of the positive and negative electrodes of the high-voltage source is completed, the switch circuit 840 can be closed, and the high-voltage source 830 can be used to simulate the opening of the connection loop of the battery cell in the battery module 810. In this case, the current will return from the positive electrode of the high-voltage source 830 to the negative electrode of the high-voltage source 830 via loop 4 (indicated by the solid arrow) to form a high voltage at both ends of the AFE sampling chip 825. If the AFE chip 825 has a fault such as burning or catching fire at this time, the current will return from the positive electrode of the high-voltage source 830 to the negative electrode of the high-voltage source 830 via loop 5 (indicated by the dotted arrow), and so on, until the entire AFE chip 825 is burned, at which time the current will return from the positive electrode of the high-voltage source 830 to the negative electrode of the high-voltage source 830 via loop 6 (indicated by the dotted arrow).

It should be understood that, although FIG. 8 shows an AFE chip, the coupling method of the positive and negative electrodes of the high voltage source described above can be applicable to any sampling chip configured to collect relevant information of a battery cell.

It should also be understood that, for illustrative purposes and not limiting, FIG8 only shows one coupling method of the positive and negative electrodes of the high voltage source when the battery cell is in the charging mode. The AFE chip may have other numbers of sampling channels, the battery module may have other numbers of sampling leads, and as described above, the positive and negative electrodes of the high voltage source may be coupled to any set of sampling leads of the battery cell, as long as the voltage on the sampling lead to which the positive electrode of the high voltage source is coupled is higher than the voltage on the sampling lead to which the negative electrode of the high voltage source is coupled, and is not limited to being located in the same sampling channel of the sampling chip.

In addition, for the purpose of clarity, FIG8 only shows a switch circuit 840 with one switch. Similar to the embodiment in which the battery cell is in the discharge mode, an open circuit of the battery cell can be simulated via a switch circuit with one or more switches. The configuration and operation of the one or more switches can refer to the one or more switches described above for the battery cell in the discharge mode. For the sake of brevity, the operation, features and advantages are not described in detail here.

According to some embodiments of the present application, step S430, determining the working state of the sampling chip during the period when the battery cell is open circuited, may include: obtaining, via a recording device, recording results about the sampling chip during the period when the battery cell is open circuited; and determining, based on the recording results, whether the sampling chip is burned during the period when the battery cell is open circuited.

In some examples, the recording device may be a video recording device such as a camera, etc. By capturing or recording an image or video of the sample chip during the open circuit of the battery cell, and further determining whether the sample chip is burned by image analysis.

In other examples, the recording device may be, for example, a thermometer including a thermal sensor, an infrared thermal imager including an infrared sensor, etc. By recording the temperature change of the sampling chip or the temperature distribution diagram of the entire circuit during the open circuit of the battery cell, it can be determined in time whether the sampling chip is burned.

It should be understood that the recording device can also be any device or apparatus capable of determining whether the sample chip is burned, and is not limited to the above embodiments. The scope of the subject matter claimed in the present application is not limited in this respect.

The working status of the sampling chip can be recorded in real time via the recording device. On the one hand, it can be discovered in time whether the sampling chip has any faults such as fire or burning. On the other hand, it can provide a basis for subsequent improvements in the sampling chip design.

According to some embodiments of the present application, with continued reference to FIG. 4 , the method 400 may further include: step S440, based on determining that the working state of the sampling chip during the open circuit of the battery cell indicates that the sampling chip has not been burned, performing an additional test on the sampling chip to determine whether the working state of the sampling chip meets a preset rule within a preset voltage range and a preset temperature range.

According to some embodiments of the present application, an additional test may be a power supply voltage range test, which may include: placing a sampling chip such as an analog front-end (Analog Front-End, AFE) chip in an incubator, and adjusting the incubator temperature to a preset temperature value; powering on the sampling chip, and adjusting the battery cell voltage to a preset voltage value, and checking whether the test sample function meets the specified requirements; when the temperature of the sampling chip reaches stability, maintaining a specified operating time under this condition; and during operation, real-time monitoring of the working status of the sampling chip to see whether it meets the specified requirements.

In some examples, the supply voltage range test described above may be performed on six sample chips such as AFE chips.

In some examples, the specified operating time may be 24 hours.

In some examples, the supply voltage range test of the sampling chip can be performed using the preset temperature values and preset voltage values in Table 1.

Table 1

预设温度值Preset temperature value	预设电压值Preset voltage value
-40℃-40℃	1.50VN_min1.50VN_min
+125℃+125℃	1.50VN_min1.50VN_min
-40℃-40℃	5.00VN5.00VN
+125℃+125℃	5.00VN5.00VN
+25℃+25℃	3.65VN3.65VN

According to some other embodiments of the present application, the additional test may also be a power supply current range test, which may include: placing a sampling chip such as an AFE chip in an incubator, and adjusting the incubator temperature to a preset temperature value; powering on the sampling chip, and adjusting the battery cell voltage to a preset voltage value, and checking whether the test sample function meets the specified requirements; when the temperature of the sampling chip reaches a stable state, setting the sampling chip to enter a shutdown state; maintaining a specified operating time under this condition; during operation, monitoring the operating current of the sampling chip in real time and recording it; repeating the above process to complete the sleep state and running state current tests.

In some examples, the supply current range test described above may be performed on six sample chips such as AFE chips.

In some examples, the specified run time may be 15 minutes.

In some examples, the supply current range test of the sampling chip can be performed using the preset temperature values and preset voltage values in Table 1.

According to some other embodiments of the present application, the additional test may also be a cell voltage sampling accuracy test, including: placing a sampling chip such as an AFE chip in an incubator, and adjusting the incubator temperature to a preset temperature value; powering on the sampling chip, and adjusting the battery cell voltage to a preset voltage value, and checking whether the test sample function meets the specified requirements; when the temperature of the sampling chip becomes stable, reading the single cell voltage value collected by the sampling chip; comparing the voltage value collected by the sampling chip with the detection equipment value, and recording; and repeating the above process to complete the cell voltage sampling accuracy test at all set temperatures.

In some examples, the supply current range test described above may be performed on 32 sample chips such as AFE chips.

In some examples, the number of battery cell strings may be N, illustratively 8, 12, 16, 18, etc.

In some examples, the sampling chip may be a sampling chip that has been aged for 1000 hours at +125° C., and the aging conditions may refer to AECQ-100XXXX.

In some examples, the specified run time may be 1 minute.

In some examples, the cell voltage sampling accuracy test can be performed on the sampling chip using the preset temperature values and preset voltage values in Table 2.

Table 2

预设温度值Preset temperature value	预设电压值Preset voltage value
-40℃-40℃	0.5V、1.5V、3.0V、3.3V、3.6、4.25、5.0V0.5V, 1.5V, 3.0V, 3.3V, 3.6, 4.25, 5.0V
-20℃-20℃	0.5V、1.5V、3.0V、3.3V、3.6、4.25、5.0V0.5V, 1.5V, 3.0V, 3.3V, 3.6, 4.25, 5.0V
0℃0℃	0.5V、1.5V、3.0V、3.3V、3.6、4.25、5.0V0.5V, 1.5V, 3.0V, 3.3V, 3.6, 4.25, 5.0V
+25℃+25℃	0.5V、1.5V、3.0V、3.3V、3.6、4.25、5.0V0.5V, 1.5V, 3.0V, 3.3V, 3.6, 4.25, 5.0V
+65℃+65℃	0.5V、1.5V、3.0V、3.3V、3.6、4.25、5.0V0.5V, 1.5V, 3.0V, 3.3V, 3.6, 4.25, 5.0V

According to some further embodiments of the present application, an additional test may also be a cell temperature sampling accuracy test, including: placing a sampling chip such as an AFE chip in an incubator, and adjusting the incubator temperature to a preset temperature value; powering on the sampling chip, and adjusting the battery cell voltage to a preset voltage value, and checking whether the test sample function meets the specified requirements; when the temperature of the sampling chip becomes stable, reading the temperature sampling line voltage value collected by the sampling chip; comparing the voltage value collected by the sampling chip with the detection equipment value, and recording it; and repeating the above process to complete the temperature sampling line voltage value accuracy test at all set temperatures.

In some examples, the specified run time may be 1 minute.

In some examples, the cell voltage sampling accuracy test can be performed on the sampling chip using the preset temperature values and preset voltage values in Table 3.

table 3

According to some further embodiments of the present application, the additional test may also be a leakage current diagnostic threshold test, including: a) completing the construction of a simulation test bench for a sampling chip such as an AFE chip according to the leakage current diagnostic threshold test requirements; b) powering on the sampling chip and adjusting the battery cell voltage to a preset voltage value to check whether the test sample function meets the specified requirements; c) using a waveform generator to generate specific waveform interference and apply it to the corresponding diagnostic channel; d) observing and recording the changes in the diagnostic channel threshold through a host computer; and repeating processes c to d to complete the test requirements for the remaining channels.

In some examples, the sampling chip may be a sampling chip that has passed the power supply voltage range test as described above and whose functional status meets the A-level requirements specified in Table 4, wherein the functional status A-level of the no-power/off-state/sleep-state test is determined by powering on after the test.

In some examples, the interference waveform parameters may be: frequency 1 kHz to 20 kHz, amplitude ±300 mV.

In some examples, the interference duration may be 5 minutes.

Table 4

According to some embodiments of the present application, the sampling chip may be an analog front-end (AFE) chip.

The analog front end refers to the processing of the analog signal given by the signal source and digitizing it. It has modules such as ADC, multiplexer, and state machine. In this article, it can refer to the analog front end AFE chip used in electric vehicles. The AFE chip is a sampling chip with multiple sampling channels, which is used to collect information such as voltage and temperature of series-connected cells and supports the battery balancing function management at the same time to achieve real-time monitoring of the cell status.

Testing and evaluating the AFE chip can help ensure the safe and reliable operation of the entire battery unit.

According to some embodiments of the present application, the voltage of the battery cell is 4.25V, and the number of battery cell strings is equal to the number of sampling channels of the sampling chip.

By setting the battery cell voltage, the standards that the sampling chip needs to meet during vehicle driving can be standardized, and by configuring the sampling channel to be fully equipped, it can be easier to simulate faults such as fire and burning that occur in the sampling chip when the battery cell is open-circuited, which is conducive to more accurate evaluation of the safety performance of the sampling chip.

According to some embodiments of the present application, the above method for testing the sampling chip can be performed on 6 sampling chips from 3 batches (for example, 2 sampling chips in each batch). In some examples, when the above method for testing the sampling chip is performed on the 6 sampling chips, if it is determined that all the chips have not had a fault such as burning or catching fire, it can be determined that the sampling chip meets the standards or regulations that need to be met during the driving of the vehicle. If it is determined that one or more of the chips have a fault such as burning or catching fire, it can be determined that the sampling chip does not meet the standards or regulations that need to be met during the driving of the vehicle, and the sampling chip manufacturer needs to make further improvements to the design of the sampling chip.

In other examples, when it is determined that none of the sampling chips has experienced failures such as burning or fire, the functionality of all the sampling chips can continue to be verified using the additional testing methods described above to determine whether the sampling chips can still operate normally after experiencing the high voltage caused by an open cell circuit.

By setting a unified standard, the methods used by sampling chip manufacturers to test and evaluate sampling chips can be standardized, thereby reducing the differences in evaluation results and improving the versatility of sampling chips. This also alleviates the human and material resources required for further improvement of sampling chips to a certain extent.

FIG9 is a block diagram of a test device 900 according to some embodiments of the present application. As shown in FIG9 , the test device 900 may include a battery module 910, which is configured to provide electrical energy; a sampling chip 920, which is coupled to the battery module 910 and configured to collect information of the battery module 910; a high voltage source 930, which is configured to have a corresponding coupling mode with the sampling chip 920 according to the working mode of the battery module, so as to provide a voltage across the sampling chip 920 when simulating an open circuit of the battery module; and a switch circuit 940, which is configured to simulate an open circuit of the battery module according to the coupling mode of the high voltage source.

According to some embodiments of the present application, the high voltage source 930 is further configured as follows: when the working mode of the battery module is discharge, the positive electrode of the high voltage source is coupled to the sampling chip ground line and the first sampling lead of the sampling leads of the battery module; and the negative electrode of the high voltage source is coupled to the second sampling lead of the sampling leads of the battery module that is different from the first sampling lead, wherein the voltage on the second sampling lead is higher than the voltage on the first sampling lead.

According to some embodiments of the present application, the high voltage source 930 is further configured to: when the working mode of the battery module is discharge, the positive electrode of the high voltage source is further coupled to the ground line of the sampling chip, and wherein, among all the sampling leads of the battery module, the voltage on the first sampling lead is the lowest, and the second sampling lead and the first sampling lead are located in the same sampling channel of the sampling chip.

According to some embodiments of the present application, the high voltage source 930 is further configured as follows: when the working mode of the battery module is charging, the positive electrode of the high voltage source is coupled to the third sampling lead among the sampling leads of the battery module; and the negative electrode of the high voltage source is coupled to the fourth sampling lead among the sampling leads of the battery module, wherein the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead.

According to some embodiments of the present application, the high voltage source 930 is further configured as follows: when the working mode of the battery module is charging, the positive electrode of the high voltage source is coupled to the battery lead, and the negative electrode of the high voltage source is coupled to the sampling chip ground line, and wherein, among all the sampling leads of the battery module, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest.

According to some embodiments of the present application, the testing device 900 may further include a recording device 950 configured to record the working status of the sampling chip during an open circuit of the battery module.

According to some embodiments of the present application, the testing device 900 may further include an additional testing device, which is configured to: based on determining that the working state of the sampling chip during an open circuit in the battery module indicates that the sampling chip has not been burned, perform additional testing on the sampling chip to determine whether the working state of the sampling chip meets preset regulations within a preset voltage range and a preset temperature range.

According to some embodiments of the present application, the sampling chip is an analog front end AFE chip.

According to some embodiments of the present application, the voltage of each battery cell in the battery module is 4.25V, and the number of battery cells in the battery module is equal to the number of sampling channels of the sampling chip.

It should be understood that the various modules of the test device 900 shown in FIG9 may correspond to the various steps in the method 400 described with reference to FIG4. Therefore, the operations, features and advantages described above for the method 400 are also applicable to the device 900 and the modules included therein. For the sake of brevity, some operations, features and advantages are not described in detail here.

The above-mentioned embodiment can simulate the high voltage that appears at both ends of the sampling chip when the connection circuit between the battery cells is open, and more realistically reproduce the working condition of the sampling chip when the battery cell is open. Therefore, the working state of the chip under the above-mentioned harsh working conditions can be evaluated in advance during the design stage of the sampling chip, effectively avoiding problems such as sparks or fires during vehicle operation, and improving the safety performance of the battery and the vehicle. At the same time, configuring the coupling method of the high-voltage source according to the working mode of the battery cell can cover different working conditions during the operation of the vehicle, making the evaluation results more accurate and reliable. In addition, the above-mentioned embodiment can also standardize the methods of testing and evaluating sampling chips by sampling chip manufacturers by setting unified standards, thereby reducing the differences in evaluation results and improving the versatility of the sampling chip.

An embodiment of the present application provides a control device, including at least one processor; and a memory connected to the at least one processor in communication, wherein the memory stores instructions that can be executed by the at least one processor, and when the instructions are executed by the at least one processor, the at least one processor executes the above-mentioned method for testing a sampling chip.

An embodiment of the present application provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, the computer program implements the above-mentioned method for testing a sampling chip.

An embodiment of the present application provides a computer program product, including a computer program, wherein the computer program implements the above-mentioned method for testing a sampling chip when executed by a processor.

Fig. 10 shows an example configuration of a control device 1000 that can be used to implement the methods described herein. For example, the above-mentioned test apparatus can be fully or at least partially implemented by the control device 1000 or a similar device or system.

The control device 1000 can be a variety of different types of devices. Examples of the control device 1000 include, but are not limited to: a desktop computer, a server computer, a laptop or netbook computer, a mobile device (e.g., a tablet computer, a cellular or other wireless phone (e.g., a smart phone), a notepad computer, a mobile station), a wearable device (e.g., glasses, a watch), a car computer, etc.

The control device 1000 may include at least one processor 1002, memory 1004, communication interface(s) 1006, a display device 1008, other input/output (I/O) devices 1010, and one or more mass storage devices 1012 that are capable of communicating with each other, such as via a system bus 1014 or other appropriate connection.

The processor 1002 may be a single processing unit or multiple processing units, all of which may include a single or multiple computing units or multiple cores. The processor 1002 may be implemented as one or more microprocessors, microcomputers, microcontrollers, digital signal processors, central processing units, state machines, logic circuits, and/or any device that manipulates signals based on operating instructions. Among other capabilities, the processor 1002 may be configured to obtain and execute computer-readable instructions stored in the memory 1004, mass storage device 1012, or other computer-readable media, such as program code of an operating system 1016, program code of an application program 1018, program code of other programs 1020, and the like.

The memory 1004 and the mass storage device 1012 are examples of computer-readable storage media for storing instructions that are executed by the processor 1002 to implement the various functions described above. For example, the memory 1004 may generally include both volatile memory and non-volatile memory (e.g., RAM, ROM, etc.). In addition, the mass storage device 1012 may generally include a hard drive, a solid-state drive, a removable medium, including external and removable drives, a memory card, a flash memory, a floppy disk, an optical disk (e.g., a CD, a DVD), a storage array, a network attached storage, a storage area network, etc. The memory 1004 and the mass storage device 1012 may all be collectively referred to herein as memory or computer-readable storage media, and may be a non-transitory medium capable of storing computer-readable, processor-executable program instructions as computer program code, which may be executed by the processor 1002 as a specific machine configured to implement the operations and functions described in the examples herein.

A number of programs may be stored on mass storage device 1012. These programs include operating system 1016, one or more application programs 1018, other programs 1020, and program data 1022, and they may be loaded into memory 1004 for execution. Examples of such applications or program modules may include, for example, computer program logic (e.g., computer program code or instructions) for implementing the following functions: method 400 (including any suitable steps of method 400) and/or other embodiments described herein.

Although illustrated in FIG10 as being stored in the memory 1004 of the control device 1000, the modules 1016, 1018, 1020, and 1022, or portions thereof, may be implemented using any form of computer-readable media accessible by the control device 1000. As used herein, "computer-readable media" includes at least two types of computer-readable media, namely, computer-readable storage media and communication media.

Computer-readable storage media include volatile and non-volatile, removable and non-removable media implemented by any method or technology for storing information, such as computer-readable instructions, data structures, program modules or other data. Computer-readable storage media include but are not limited to RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disk (DVD), or other optical storage device, magnetic cassette, magnetic tape, magnetic disk storage device or other magnetic storage device, or any other non-transmission medium that can be used to store information for access by a control device. In contrast, communication media can embody computer-readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transmission mechanism. Computer-readable storage media as defined herein do not include communication media.

One or more communication interfaces 1006 are used to exchange data with other devices, such as through a network, direct connection, etc. Such communication interfaces can be one or more of the following: any type of network interface (e.g., a network interface card (NIC)), a wired or wireless (such as IEEE 802.11 wireless LAN (WLAN)) wireless interface, a Worldwide Interoperability for Microwave Access (Wi-MAX) interface, an Ethernet interface, a Universal Serial Bus (USB) interface, a cellular network interface, a BluetoothTM interface, a Near Field Communication (NFC) interface, etc. The communication interface 1706 can facilitate communication within a variety of network and protocol types, including wired networks (e.g., LAN, cable, etc.) and wireless networks (e.g., WLAN, cellular, satellite, etc.), the Internet, etc. The communication interface 1006 can also provide communication with external storage devices (not shown) such as storage arrays, network attached storage, storage area networks, etc.

In some examples, a display device 1008 such as a monitor may be included for displaying information and images to the user. Other I/O devices 1010 may be devices that receive various inputs from the user and provide various outputs to the user, and may include a touch input device, a gesture input device, a camera, a keyboard, a remote control, a mouse, a printer, an audio input/output device, and the like.

The technology described herein can be supported by these various configurations of the control device 1000, and is not limited to the specific examples of the technology described herein. For example, the function can also be implemented in whole or in part on the "cloud" by using a distributed system. The cloud includes and/or represents a platform for resources. The platform abstracts the underlying functions of the hardware (e.g., server) and software resources of the cloud. Resources may include applications and/or data that can be used when performing computing processing on a server away from the control device 1000. Resources may also include services provided over the Internet and/or through a subscriber network such as a cellular or Wi-Fi network. The platform can abstract resources and functions to connect the control device 1000 to other devices. Therefore, the implementation of the functions described herein can be distributed throughout the cloud. For example, the functions can be implemented partially on the control device 1000 and partially through a platform that abstracts the functions of the cloud.

As shown in FIG. 11 , a method 1100 for testing an AFE chip provided in some embodiments of the present application may include the following steps S1110 to S1140 .

In step S1110, when the working mode of the battery cell coupled to the AFE chip is discharge: the positive electrode of the high voltage source is coupled to the AFE chip ground wire and the first sampling lead of the sampling leads of the battery cell; and the negative electrode of the high voltage source is coupled to the second sampling lead of the sampling leads of the battery cell which is different from the first sampling lead, wherein the voltage on the second sampling lead is higher than the voltage on the first sampling lead, and wherein the voltage on the first sampling lead is the lowest among all the sampling leads of the battery cell, and the second sampling lead and the first sampling lead are located in the same sampling channel of the AFE chip.

In step S1120, when the working mode of the battery cell coupled to the AFE chip is charging: the positive electrode of the high voltage source is coupled to the battery lead and the third sampling lead of the sampling leads of the battery cell; and the negative electrode of the high voltage source is coupled to the AFE chip ground wire and the fourth sampling lead of the sampling leads of the battery cell, wherein, among all the sampling leads of the battery cell, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest.

In step S1130 , an open circuit of the battery cell is simulated via a switch circuit according to the coupling mode of the positive electrode and the negative electrode of the high voltage source.

In step S1140, a recording result of the AFE chip during the period when the battery cell is open-circuited is obtained through a recording device, and it is determined whether the AFE chip is burned during the period when the battery cell is open-circuited according to the recording result.

The features of each step in the above method 1100 are the same as the corresponding steps in the method 400. For the sake of brevity, they will not be described again here.

The method 1100 of the embodiment of the present application can simulate the high voltage that appears at both ends of the AFE chip when the connection circuit between the battery cells is open, and more realistically reproduce the working condition of the AFE chip when the battery cell is open. Therefore, the working state of the chip under the above-mentioned harsh working conditions can be determined in advance during the AFE chip design stage, effectively avoiding problems such as sparks or fires during vehicle operation, and improving the safety performance of the battery and the vehicle. At the same time, configuring the coupling method of the positive and negative electrodes of the high-voltage source according to the working mode of the battery cell can cover different working conditions during the operation of the vehicle, so that the obtained results are more accurate and reliable. In addition, the above embodiment can also standardize the method of testing and evaluating the sampling chip by the sampling chip manufacturer by setting a unified standard, thereby reducing the difference in evaluation results and improving the versatility of the AFE chip.

Some examples of the present application are described below.

Example 1. A method for testing and evaluating a sampling chip, comprising: configuring a coupling method of a high-voltage source across the sampling chip according to an operating mode of a battery cell coupled to the sampling chip, wherein the sampling chip is used to collect information about the battery cell, and the high-voltage source is used to provide a voltage across the sampling chip when simulating an open circuit in the battery cell; simulating an open circuit in the battery cell via a switching circuit according to the coupling method of the high-voltage source; and determining the operating state of the sampling chip during the open circuit in the battery cell.

Example 2. A method according to Example 1, wherein, according to the working mode of the battery cell coupled to the sampling chip, a coupling method for configuring the high-voltage source across the sampling chip includes: when the working mode of the battery cell is discharge: coupling the positive electrode of the high-voltage source to a first sampling lead among the sampling leads of the battery cell; and coupling the negative electrode of the high-voltage source to a second sampling lead among the sampling leads of the battery cell that is different from the first sampling lead, wherein the voltage on the second sampling lead is higher than the voltage on the first sampling lead.

Example 3. According to the method described in Example 2, according to the working mode of the battery cell coupled to the sampling chip, the coupling method of configuring the high-voltage source across the sampling chip also includes: when the working mode of the battery cell is discharge: further coupling the positive electrode of the high-voltage source to the sampling chip ground line, and wherein, among all the sampling leads of the battery cell, the voltage on the first sampling lead is the lowest, and the second sampling lead and the first sampling lead are located in the same sampling channel of the sampling chip.

Example 4. A method according to Example 1, wherein, according to the working mode of the battery cell coupled to the sampling chip, a coupling method for configuring the high-voltage source across the sampling chip includes: when the working mode of the battery cell is charging: coupling the positive electrode of the high-voltage source to the third sampling lead among the sampling leads of the battery cell; and coupling the negative electrode of the high-voltage source to the fourth sampling lead among the sampling leads of the battery cell, wherein the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead.

Example 5. According to the method described in Example 4, according to the working mode of the battery cell coupled to the sampling chip, the coupling method of configuring the high-voltage source across the sampling chip also includes: when the working mode of the battery cell is charging: further coupling the positive electrode of the high-voltage source to the battery lead; and further coupling the negative electrode of the high-voltage source to the sampling chip ground wire, and wherein, among all the sampling leads of the battery cell, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest.

Example 6. A method according to any one of Examples 1-5, wherein determining the working state of the sampling chip during an open circuit in the battery cell comprises: obtaining, via a recording device, recording results about the sampling chip during an open circuit in the battery cell; and determining whether the sampling chip is burned during an open circuit in the battery cell based on the recording results.

Example 7, according to the method described in any one of Examples 1-6, further comprising: based on determining that the working state of the sampling chip during an open circuit of the battery cell indicates that the sampling chip has not been burned, performing additional testing on the sampling chip to determine whether the working state of the sampling chip satisfies preset rules within a preset voltage range and a preset temperature range.

Example 8. The method according to any one of Examples 1-7, wherein the sampling chip is an analog front end (AFE) chip.

Example 9. The method according to any one of Examples 1-8, wherein the voltage of the battery cell is 4.25V, and wherein the number of battery cell strings is equal to the number of sampling channels of the sampling chip.

Example 10. A testing device, comprising: a battery module, the battery module being configured to provide electrical energy; a sampling chip, the sampling chip being coupled to the battery module and being configured to collect information of the battery module; a high voltage source, the high voltage being configured to: have a corresponding coupling method with the sampling chip according to a working mode of the battery module, so as to provide a voltage across the sampling chip when simulating an open circuit in the battery module; and a switching circuit, the switching circuit being configured to: simulate an open circuit in the battery module according to the coupling method of the high voltage source.

Example 11. A testing device according to Example 10, wherein the high voltage source is further configured such that: when the working mode of the battery module is discharge, the positive electrode of the high voltage source is coupled to a first sampling lead among the sampling leads of the battery module; and the negative electrode of the high voltage source is coupled to a second sampling lead among the sampling leads of the battery module that is different from the first sampling lead, wherein the voltage on the second sampling lead is higher than the voltage on the first sampling lead.

Example 12. A testing device according to Example 11, wherein the high voltage source is further configured to: when the working mode of the battery module is discharge, further couple the positive electrode of the high voltage source to the ground line of the sampling chip, and wherein, among all the sampling leads of the battery module, the voltage on the first sampling lead is the lowest, and the second sampling lead and the first sampling lead are located in the same sampling channel of the sampling chip.

Example 13. A testing device according to Example 10, wherein the high voltage source is further configured such that: when the working mode of the battery module is charging, the positive electrode of the high voltage source is coupled to the third sampling lead of the sampling leads of the battery module; and the negative electrode of the high voltage source is coupled to the fourth sampling lead of the sampling leads of the battery module, wherein the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead.

Example 14. A testing device according to Example 13, wherein the high voltage source is further configured to: when the working mode of the battery module is charging, further make: the positive electrode of the high voltage source coupled to the battery lead, and the negative electrode of the high voltage source coupled to the sampling chip ground line, and wherein, among all the sampling leads of the battery module, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest.

Example 15. The testing device according to any one of Examples 10-14 further includes: a recording device configured to record the working status of the sampling chip during an open circuit in the battery module.

Example 16. The testing device according to Example 15 further includes: an additional testing device, which is configured to: based on determining that the working state of the sampling chip during an open circuit in the battery module indicates that the sampling chip has not been burned, perform additional testing on the sampling chip to determine whether the working state of the sampling chip meets preset regulations within a preset voltage range and a preset temperature range.

Example 17. A test device according to any one of Examples 10-16, wherein the sampling chip is an analog front-end AFE chip.

Example 18. A testing device according to any one of Examples 10-17, wherein the voltage of each battery cell in the battery module is 4.25V, and wherein the number of battery cell strings in the battery module is equal to the number of sampling channels of the sampling chip.

Example 19. A control device, comprising: at least one processor; and a memory communicatively connected to the at least one processor, wherein the memory stores instructions that can be executed by the at least one processor, and when the instructions are executed by the at least one processor, the at least one processor performs a method as described in any one of Examples 1 to 9.

Example 20. A computer-readable storage medium storing a computer program, which implements the method described in any one of Examples 1-9 when executed by a processor.

Example 21 A computer program product comprises a computer program, wherein the computer program implements the method of any one of Examples 1-9 when executed by a processor.

Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and they should all be included in the scope of the claims and specification of the present application. In particular, as long as there is no structural conflict, the various technical features mentioned in the various embodiments can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

Claims

A method for testing a sampling chip, comprising:

According to the working mode of the battery cell coupled to the sampling chip, a coupling mode of the high-voltage source across the sampling chip is configured, wherein the sampling chip is used to collect information of the battery cell, and the high-voltage source is used to provide a voltage across the sampling chip when simulating an open circuit of the battery cell;

According to the coupling mode of the high voltage source, simulating an open circuit of the battery cell via a switch circuit; and

Determine the working state of the sampling chip during the period when the battery cell is open-circuited.
The method according to claim 1, wherein, according to the working mode of the battery cell coupled to the sampling chip, configuring the coupling mode of the high voltage source across the sampling chip comprises:

When the working mode of the battery cell is discharging:

coupling the positive electrode of the high voltage source to a first sampling lead among the sampling leads of the battery cell; and

coupling the negative electrode of the high voltage source to a second sampling lead of the sampling leads of the battery cell which is different from the first sampling lead,

Wherein, the voltage on the second sampling lead is higher than the voltage on the first sampling lead.
The method according to claim 2, wherein, according to the working mode of the battery cell coupled to the sampling chip, configuring the coupling mode of the high voltage source across the sampling chip further comprises:

When the working mode of the battery cell is discharge: further coupling the positive electrode of the high voltage source to the sampling chip ground line, and

Among all the sampling leads of the battery cell, the voltage on the first sampling lead is the lowest, and the second sampling lead and the first sampling lead are located in the same sampling channel of the sampling chip.
The method according to claim 1, wherein, according to the working mode of the battery cell coupled to the sampling chip, configuring the coupling mode of the high voltage source across the sampling chip comprises:

When the working mode of the battery cell is charging:

coupling the positive electrode of the high voltage source to a third sampling lead among the sampling leads of the battery cell; and

coupling the negative electrode of the high voltage source to a fourth sampling lead among the sampling leads of the battery cell,

Wherein, the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead.
The method according to claim 4, wherein, according to the working mode of the battery cell coupled to the sampling chip, configuring the coupling mode of the high voltage source across the sampling chip further comprises:

When the working mode of the battery cell is charging:

further coupling the positive electrode of the high voltage source to a battery lead; and

The negative electrode of the high voltage source is further coupled to the sampling chip ground line, and

Among all the sampling leads of the battery cell, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest.
The method according to any one of claims 1 to 5, wherein determining the working state of the sampling chip during the period when the battery cell is open-circuited comprises:

Obtaining, via a recording device, a recording result of the sampling chip during the period when the battery cell is open-circuited; and

Determine whether the sampling chip is burned during the open circuit of the battery cell according to the recorded result.
The method according to any one of claims 1 to 6, further comprising:

Based on determining that the working state of the sampling chip during the open circuit of the battery cell indicates that the sampling chip has not been burned, the sampling chip is additionally tested to determine whether the working state of the sampling chip meets preset rules within a preset voltage range and a preset temperature range.
The method according to any one of claims 1-7, wherein the sampling chip is an analog front-end AFE chip.
The method according to any one of claims 1 to 8, wherein the voltage of the battery cell is 4.25V, and wherein the number of strings of the battery cells is equal to the number of sampling channels of the sampling chip.
A testing device, comprising:

a battery module configured to provide electrical energy;

a sampling chip, the sampling chip being coupled to the battery module and configured to collect information of the battery module;

A high voltage source, wherein the high voltage source is configured to have a corresponding coupling mode with the sampling chip according to the working mode of the battery module, so as to provide a voltage across the sampling chip when simulating an open circuit of the battery module; and

A switch circuit is configured to simulate an open circuit of the battery module according to a coupling mode of the high voltage source.
The testing device according to claim 10, wherein the high voltage source is further configured to:

When the working mode of the battery module is discharge,

The positive electrode of the high voltage source is coupled to a first sampling lead among the sampling leads of the battery module; and

The negative electrode of the high voltage source is coupled to a second sampling lead among the sampling leads of the battery module which is different from the first sampling lead.

Wherein, the voltage on the second sampling lead is higher than the voltage on the first sampling lead.
The testing device according to claim 11, wherein the high voltage source is further configured to:

When the working mode of the battery module is discharge, the positive electrode of the high voltage source is further coupled to the sampling chip ground line, and

Among all the sampling leads of the battery module, the voltage on the first sampling lead is the lowest, and the second sampling lead and the first sampling lead are located in the same sampling channel of the sampling chip.
The testing device according to claim 10, wherein the high voltage source is further configured to:

When the working mode of the battery module is charging,

The positive electrode of the high voltage source is coupled to a third sampling lead among the sampling leads of the battery module; and

The negative electrode of the high voltage source is coupled to a fourth sampling lead among the sampling leads of the battery module,

Wherein, the voltage on the fourth sampling lead is lower than the voltage on the third sampling lead.
The testing device according to claim 13, wherein the high voltage source is further configured to:

When the working mode of the battery module is charging, further:

The positive electrode of the high voltage source is coupled to a battery lead; and

The negative electrode of the high voltage source is coupled to the sampling chip ground line, and

Among all the sampling leads of the battery module, the voltage on the third sampling lead is the highest, and the voltage on the fourth sampling lead is the lowest.
The testing device according to any one of claims 10 to 14, further comprising:

A recording device is configured to record the working status of the sampling chip during the period when the battery module is open-circuited.
The testing device according to claim 15, further comprising:

An additional testing device is configured to: based on determining that the working state of the sampling chip during the open circuit of the battery module indicates that the sampling chip has not been burned, perform additional testing on the sampling chip to determine whether the working state of the sampling chip meets preset regulations within a preset voltage range and a preset temperature range.
The test device according to any one of claims 10-16, wherein the sampling chip is an analog front-end AFE chip.
The testing device according to any one of claims 10-17, wherein the voltage of each battery cell in the battery module is 4.25V, and wherein the number of battery cells in the battery module is equal to the number of sampling channels of the sampling chip.
A control device, comprising:

at least one processor; and

A memory communicatively connected to the at least one processor, wherein the memory stores instructions executable by the at least one processor, and when the instructions are executed by the at least one processor, the at least one processor performs the method according to any one of claims 1 to 9.
A computer-readable storage medium stores a computer program, wherein the computer program implements the method according to any one of claims 1 to 9 when executed by a processor.
A computer program product comprises a computer program, wherein the computer program implements the method according to any one of claims 1 to 9 when executed by a processor.