WO2024053718A1 - Resist composition, method for forming resist pattern, compound, and polymer compound - Google Patents

Resist composition, method for forming resist pattern, compound, and polymer compound Download PDF

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Publication number
WO2024053718A1
WO2024053718A1 PCT/JP2023/032751 JP2023032751W WO2024053718A1 WO 2024053718 A1 WO2024053718 A1 WO 2024053718A1 JP 2023032751 W JP2023032751 W JP 2023032751W WO 2024053718 A1 WO2024053718 A1 WO 2024053718A1
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group
carbon atoms
formula
substituent
single bond
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PCT/JP2023/032751
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French (fr)
Japanese (ja)
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広樹 加藤
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東京応化工業株式会社
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    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C309/00Sulfonic acids; Halides, esters, or anhydrides thereof
    • C07C309/01Sulfonic acids
    • C07C309/02Sulfonic acids having sulfo groups bound to acyclic carbon atoms
    • C07C309/03Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
    • C07C309/07Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton
    • C07C309/12Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton containing esterified hydroxy groups bound to the carbon skeleton
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C381/00Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
    • C07C381/12Sulfonium compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F20/00Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride, ester, amide, imide or nitrile thereof
    • C08F20/02Monocarboxylic acids having less than ten carbon atoms, Derivatives thereof
    • C08F20/10Esters
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor

Definitions

  • the present invention relates to a resist composition, a resist pattern forming method, a compound, and a polymer compound.
  • Resist materials are required to have lithography properties such as sensitivity to these exposure light sources and resolution capable of reproducing patterns with minute dimensions.
  • chemically amplified resist compositions have conventionally been used that contain a base component whose solubility in a developer changes due to the action of an acid, and an acid generator component that generates an acid upon exposure. is used.
  • a resin having a plurality of structural units is generally used as the base component in order to improve lithography properties and the like.
  • acid generators have been proposed so far.
  • onium salt acid generators such as iodonium salts and sulfonium salts, oxime sulfonate acid generators, diazomethane acid generators, nitrobenzyl sulfonate acid generators, iminosulfonate acid generators, disulfone acid generators, etc. It has been known.
  • the present invention has been made in view of the above circumstances, and provides a resist composition that achieves high sensitivity and has good lithography properties, a method for forming a resist pattern using the resist composition, and a resist composition useful for the resist composition.
  • An object of the present invention is to provide a polymer compound and a compound that can be used to synthesize the polymer compound.
  • a first aspect of the present invention is a resist composition that generates an acid upon exposure to light and whose solubility in a developing solution changes due to the action of the acid.
  • This is a resist composition characterized in that the resin component (A1) has a structural unit (a0) represented by the following general formula (a0-1).
  • R 01 is a divalent linking group or a single bond.
  • R 02 is an acid dissociable group.
  • Y 00 is a divalent linking group or a single bond.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • V 01 is a single bond, an alkylene group or a fluorinated alkylene group.
  • R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group.
  • M m+ is an m-valent onium cation.
  • m is an integer of 1 or more.
  • a second aspect of the present invention includes a step of forming a resist film on a support using the resist composition according to the first aspect, a step of exposing the resist film, and a step of exposing the resist film to light after the exposure.
  • This is a resist pattern forming method characterized by having a step of developing and forming a resist pattern.
  • a third aspect of the present invention is a compound characterized by being represented by the following general formula (a0-m1).
  • R 01 is a divalent linking group or a single bond.
  • R 02 is an acid dissociable group.
  • Y 00 is a divalent linking group or a single bond.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • V 01 is a single bond, an alkylene group or a fluorinated alkylene group.
  • R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group.
  • M m+ is an m-valent onium cation.
  • m is an integer of 1 or more.
  • a fourth aspect of the present invention is a polymer compound characterized by having a structural unit represented by the following general formula (a0-1).
  • R 01 is a divalent linking group or a single bond.
  • R 02 is an acid dissociable group.
  • Y 00 is a divalent linking group or a single bond.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • V 01 is a single bond, an alkylene group or a fluorinated alkylene group.
  • R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group.
  • M m+ is an m-valent onium cation.
  • m is an integer of 1 or more.
  • a resist composition capable of achieving high sensitivity and having good lithography properties a resist pattern forming method using the resist composition, a polymer compound useful for the resist composition, and the polymer compound can provide compounds that can be used for the synthesis of
  • alkyl group includes linear, branched, and cyclic monovalent saturated hydrocarbon groups. The same applies to the alkyl group in the alkoxy group.
  • alkylene group includes linear, branched, and cyclic divalent saturated hydrocarbon groups.
  • halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
  • Constant unit means a monomer unit (monomer unit) that constitutes a high molecular compound (resin, polymer, copolymer).
  • substituent there are cases in which a hydrogen atom (-H) is substituted with a monovalent group and a case in which a methylene group (-CH 2 -) is substituted with a divalent group. including both.
  • Exposure is a concept that includes radiation irradiation in general.
  • an "acid-decomposable group” is a group having acid-decomposability that allows at least a portion of the bonds in the structure of the acid-decomposable group to be cleaved by the action of an acid.
  • acid-decomposable groups whose polarity increases due to the action of an acid include groups that decompose under the action of an acid to produce a polar group.
  • the polar group include a carboxy group, a hydroxyl group, an amino group, and a sulfo group (-SO 3 H).
  • the acid-decomposable group includes a group in which the polar group is protected with an acid-dissociable group (for example, a group in which the hydrogen atom of an OH-containing polar group is protected with an acid-dissociable group).
  • Acid-dissociable group means (i) a group having acid-dissociable properties that allows the bond between the acid-dissociable group and an atom adjacent to the acid-dissociable group to be cleaved by the action of an acid; (ii) A group in which the bond between the acid-dissociable group and an atom adjacent to the acid-dissociable group can be cleaved by further decarboxylation reaction after some bonds are cleaved by the action of an acid. , refers to both.
  • the acid-dissociable group constituting the acid-dissociable group needs to be a group with lower polarity than the polar group generated by dissociation of the acid-dissociable group.
  • the “base material component” is an organic compound that has film-forming ability.
  • Organic compounds used as base material components are broadly classified into non-polymers and polymers.
  • the non-polymer those having a molecular weight of 500 or more and less than 4,000 are usually used (hereinafter referred to as "low-molecular compound”).
  • “resin”, “high molecular compound”, or “polymer” refers to a polymer having a molecular weight of 1000 or more.
  • the molecular weight of the polymer the weight average molecular weight calculated by GPC (gel permeation chromatography) in terms of polystyrene is used.
  • “Derived structural unit” means a structural unit formed by cleavage of multiple bonds between carbon atoms, for example, ethylenic double bonds.
  • the hydrogen atom bonded to the ⁇ -position carbon atom may be substituted with a substituent.
  • the substituent (R ⁇ x ) that substitutes the hydrogen atom bonded to the ⁇ -position carbon atom is an atom or group other than a hydrogen atom.
  • derivative is a concept that includes target compounds in which the hydrogen atom at the ⁇ -position is substituted with other substituents such as alkyl groups and halogenated alkyl groups, as well as derivatives thereof. These derivatives include those in which the hydrogen atom of the hydroxyl group of the target compound is replaced with an organic group; the hydrogen atom at the ⁇ position may be substituted with a substituent; Good target compounds include those to which a substituent other than a hydroxyl group is bonded. Note that the ⁇ position refers to the first carbon atom adjacent to a functional group, unless otherwise specified. Examples of the substituent for substituting the hydrogen atom at the ⁇ -position of hydroxystyrene include those similar to R ⁇ x , such as an alkyl group and a halogenated alkyl group.
  • the resist composition of this embodiment generates acid upon exposure, and its solubility in a developer changes due to the action of the acid.
  • a resist composition contains a base component (A) (hereinafter also referred to as "component (A)”) whose solubility in a developer changes due to the action of an acid.
  • the component (A) includes a resin component that generates acid upon exposure and whose solubility in a developer changes due to the action of the acid.
  • the resist film when the resist film is developed, if the resist composition is positive type, the exposed portion of the resist film is dissolved and removed to form a positive resist pattern, and if the resist composition is negative type, the resist pattern is The unexposed portions of the film are dissolved and removed to form a negative resist pattern.
  • the resist composition of this embodiment may be a positive resist composition or a negative resist composition. Further, the resist composition of the present embodiment may be used in an alkaline development process using an alkaline developer in the development process during resist pattern formation, and in the development process, a developer containing an organic solvent (organic developer) may be used. It may also be used for a solvent development process using a liquid).
  • organic developer organic developer
  • component (A) includes a resin component (A1) whose solubility in a developer changes due to the action of an acid (hereinafter also referred to as "component (A1)").
  • component (A1) the resin component (A1) whose solubility in a developer changes due to the action of an acid (hereinafter also referred to as "component (A1)").
  • component (A1) the polarity of the base material component changes before and after exposure, so that good development contrast can be obtained not only in an alkaline development process but also in a solvent development process.
  • component (A) at least one of another high molecular compound and a low molecular compound may be used together with the component (A1).
  • one kind of component (A) may be used alone, or two or more kinds may be used in combination.
  • the component (A1) is a resin component whose solubility in a developer changes due to the action of an acid.
  • Component (A1) has a structural unit (a0) represented by the general formula (a0-1) described below. In addition to the structural unit (a0), the component (A1) may have other structural units as necessary.
  • the structural unit (a0) is a structural unit represented by the following general formula (a0-1).
  • R 01 is a divalent linking group or a single bond.
  • R 02 is an acid dissociable group.
  • Y 00 is a divalent linking group or a single bond.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • V 01 is a single bond, an alkylene group or a fluorinated alkylene group.
  • R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group.
  • M m+ is an m-valent onium cation.
  • m is an integer of 1 or more.
  • R 01 is a divalent linking group or a single bond.
  • the divalent linking group for R 01 include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
  • the divalent hydrocarbon group is preferably a linear or branched aliphatic hydrocarbon group.
  • the linear aliphatic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, even more preferably 1 to 4 carbon atoms, and has 1 to 4 carbon atoms. 3 is particularly preferred.
  • the branched aliphatic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably 3 to 6 carbon atoms, even more preferably 3 or 4 carbon atoms, particularly 3 carbon atoms. preferable.
  • the linear or branched hydrocarbon group may be saturated or unsaturated, but saturated is preferred.
  • R 01 is a divalent linking group containing a hetero atom
  • H may be substituted with a substituent such as an alkyl group or an acyl group.
  • the substituent alkyl group, acyl group, etc. preferably has 1 to 10 carbon atoms, more preferably 1 to 8 carbon atoms, and particularly preferably 1 to 5 carbon atoms.
  • Y21 is preferably a linear aliphatic hydrocarbon group, more preferably a linear alkylene group, even more preferably a linear alkylene group having 1 to 5 carbon atoms, and a methylene group or an ethylene group. Particularly preferred.
  • Y 22 is preferably a linear or branched aliphatic hydrocarbon group, more preferably a methylene group, an ethylene group, or an alkylmethylene group.
  • the alkyl group in the alkylmethylene group is preferably a linear alkyl group having 1 to 5 carbon atoms, more preferably a linear alkyl group having 1 to 3 carbon atoms, and most preferably a methyl group.
  • m" is an integer of 0 to 3, preferably an integer of 0 to 2, and 0 or 1 is more preferred, and 1 is particularly preferred.
  • a' is 1 to is an integer of 10, preferably an integer of 1 to 8, more preferably an integer of 1 to 5, even more preferably 1 or 2, and most preferably 1.
  • b' is an integer of 1 to 10, and An integer of 1 to 5 is preferred, an integer of 1 to 5 is more preferred, 1 or 2 is even more preferred, and 1 is most preferred.
  • R 01 is preferably a divalent linking group containing a hetero atom or a single bond.
  • R 02 is an acid dissociable group.
  • the acid-dissociable group in R 02 include those that have been proposed as acid-dissociable groups for base resins for chemically amplified resist compositions.
  • examples of acid-dissociable groups proposed as acid-dissociable groups for base resins for chemically amplified resist compositions include "acetal-type acid-dissociable groups” and “tertiary alkyl ester-type acid-dissociable groups” described below. "group” and "secondary alkyl ester type acid dissociable group”.
  • Acetal type acid dissociable group examples of the acetal-type acid-dissociable group in R 02 include acid-dissociable groups represented by the following general formula (a1-r-1).
  • Ra' 1 and Ra' 2 are each a hydrogen atom or an alkyl group.
  • Ra' 3 is a hydrocarbon group, and Ra' 3 may be bonded to either Ra' 1 or Ra' 2 to form a ring.
  • At least one of Ra' 1 and Ra' 2 is preferably a hydrogen atom, and more preferably both are hydrogen atoms.
  • the alkyl group is preferably an alkyl group having 1 to 5 carbon atoms.
  • linear or branched alkyl groups are preferably mentioned. More specifically, examples include methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, isobutyl group, tert-butyl group, pentyl group, isopentyl group, neopentyl group, etc. More preferred, and methyl group is particularly preferred.
  • the hydrocarbon group for Ra' 3 includes a linear or branched alkyl group, or a cyclic hydrocarbon group.
  • the linear alkyl group preferably has 1 to 5 carbon atoms, more preferably 1 to 4 carbon atoms, and even more preferably 1 or 2 carbon atoms.
  • Specific examples include methyl group, ethyl group, n-propyl group, n-butyl group, n-pentyl group, and the like. Among these, methyl group, ethyl group or n-butyl group are preferred, and methyl group or ethyl group is more preferred.
  • the branched alkyl group preferably has 3 to 10 carbon atoms, more preferably 3 to 5 carbon atoms. Specific examples include isopropyl group, isobutyl group, tert-butyl group, isopentyl group, neopentyl group, 1,1-diethylpropyl group, 2,2-dimethylbutyl group, and isopropyl group is preferred.
  • the hydrocarbon group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group, and may be a polycyclic group or a monocyclic group.
  • the aliphatic hydrocarbon group which is a monocyclic group a group obtained by removing one hydrogen atom from a monocycloalkane is preferable.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane.
  • the aliphatic hydrocarbon group which is a polycyclic group is preferably a group obtained by removing one hydrogen atom from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms. Examples include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
  • the aromatic hydrocarbon group of Ra' 3 is an aromatic hydrocarbon group
  • the aromatic hydrocarbon group is a hydrocarbon group having at least one aromatic ring.
  • This aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 ⁇ electrons, and may be monocyclic or polycyclic.
  • the aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, even more preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms.
  • aromatic ring examples include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; aromatic heterocycles in which some of the carbon atoms constituting the aromatic hydrocarbon ring are substituted with heteroatoms; Can be mentioned.
  • heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • aromatic heterocycle include a pyridine ring and a thiophene ring.
  • the aromatic hydrocarbon group in Ra' 3 is a group obtained by removing one hydrogen atom from the aromatic hydrocarbon ring or aromatic heterocycle (aryl group or heteroaryl group); A group in which one hydrogen atom is removed from an aromatic compound (e.g.
  • biphenyl, fluorene, etc. a group in which one hydrogen atom of the aromatic hydrocarbon ring or aromatic heterocycle is substituted with an alkylene group (e.g., benzyl group , phenethyl group, 1-naphthylmethyl group, 2-naphthylmethyl group, 1-naphthylethyl group, arylalkyl group such as 2-naphthylethyl group, etc.).
  • the alkylene group bonded to the aromatic hydrocarbon ring or aromatic heterocycle preferably has 1 to 4 carbon atoms, more preferably 1 to 2 carbon atoms, and has 1 carbon atom. This is particularly preferred.
  • the cyclic hydrocarbon group at Ra' 3 may have a substituent.
  • this substituent include -R P1 , -R P2 -O-R P1 , -R P2 -CO-R P1 , -R P2 -CO- OR P1 , -R P2 -O-CO-R P1 , -R P2 -OH, -R P2 -CN or -R P2 -COOH (hereinafter these substituents are also collectively referred to as "Ra x5 "), and the like.
  • R P1 is a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms, or a monovalent cyclic saturated hydrocarbon group having 6 to 30 carbon atoms. It is a monovalent aromatic hydrocarbon group.
  • R P2 is a single bond, a divalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, a divalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms, or a group having 6 to 20 carbon atoms. 30 divalent aromatic hydrocarbon groups.
  • the hydrogen atoms of the chain saturated hydrocarbon group, aliphatic cyclic saturated hydrocarbon group, and aromatic hydrocarbon group of R P1 and R P2 may be substituted with fluorine atoms.
  • the aliphatic cyclic hydrocarbon group may have one or more of the above substituents, or may have one or more of each of the above substituents.
  • Examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms include methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, heptyl group, octyl group, decyl group, etc. It will be done.
  • Examples of the monovalent aliphatic saturated hydrocarbon group having 3 to 20 carbon atoms include cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group, cycloheptyl group, cyclooctyl group, cyclodecyl group, cyclododecyl group, etc.
  • Monocyclic aliphatic saturated hydrocarbon group bicyclo[2.2.2]octanyl group, tricyclo[5.2.1.02,6]decanyl group, tricyclo[3.3.1.13,7]decanyl
  • Examples include polycyclic aliphatic saturated hydrocarbon groups such as a group, a tetracyclo[6.2.1.13,6.02,7]dodecanyl group, and an adamantyl group.
  • monovalent aromatic hydrocarbon groups having 6 to 30 carbon atoms include groups obtained by removing one hydrogen atom from an aromatic hydrocarbon ring such as benzene, biphenyl, fluorene, naphthalene, anthracene, and phenanthrene. .
  • the cyclic group is preferably a 4- to 7-membered ring, more preferably a 4- to 6-membered ring.
  • Specific examples of the cyclic group include a tetrahydropyranyl group, a tetrahydrofuranyl group, and the like.
  • Tertiary alkyl ester type acid dissociable group examples include acid-dissociable groups represented by the following general formula (a1-r-2).
  • Ra' 4 to Ra' 6 are each a hydrocarbon group, and Ra' 5 and Ra' 6 may be bonded to each other to form a ring.
  • * represents a bond with the oxygen atom bonded to R 02 in the general formula (a0-1).
  • the hydrocarbon group for Ra' 4 includes a linear or branched alkyl group, a chain or cyclic alkenyl group, or a cyclic hydrocarbon group.
  • Straight chain or branched alkyl group, cyclic hydrocarbon group (monocyclic aliphatic hydrocarbon group, polycyclic aliphatic hydrocarbon group, aromatic hydrocarbon group) in Ra' 4 ) is the same as Ra' 3 above.
  • the chain or cyclic alkenyl group for Ra' 4 is preferably an alkenyl group having 2 to 10 carbon atoms. Examples of the hydrocarbon groups for Ra' 5 and Ra' 6 include the same ones as for Ra' 3 above.
  • Ra' 10 is a linear or branched alkyl group having 1 to 12 carbon atoms, which may be partially substituted with a halogen atom or a heteroatom-containing group; shows.
  • Ra' 11 represents a group forming an aliphatic cyclic group together with the carbon atom to which Ra' 10 is bonded.
  • Ya is a carbon atom.
  • Xa is a group that forms a cyclic hydrocarbon group together with Ya. Some or all of the hydrogen atoms possessed by this cyclic hydrocarbon group may be substituted.
  • Ra 101 to Ra 103 are each independently a hydrogen atom, a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, or a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms; be. Some or all of the hydrogen atoms possessed by the chain saturated hydrocarbon group and aliphatic cyclic saturated hydrocarbon group may be substituted. Two or more of Ra 101 to Ra 103 may be bonded to each other to form a cyclic structure.
  • Yaa is a carbon atom.
  • Xaa is a group that forms an aliphatic cyclic group together with Yaa.
  • Ra 104 is an aromatic hydrocarbon group which may have a substituent.
  • Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms. Some or all of the hydrogen atoms possessed by this chain saturated hydrocarbon group may be substituted.
  • Ra' 14 is a hydrocarbon group which may have a substituent. * indicates a bond (the same applies hereinafter). ]
  • Ra' 10 is a linear or branched alkyl group having 1 to 12 carbon atoms, which may be partially substituted with a halogen atom or a heteroatom-containing group. It is the basis.
  • the linear alkyl group in Ra' 10 has 1 to 12 carbon atoms, preferably 1 to 10 carbon atoms, more preferably 1 to 5 carbon atoms, and further preferably 1 to 3 carbon atoms. Preferred are methyl and ethyl groups, particularly preferred. Examples of the branched alkyl group in Ra' 10 include the same ones as in Ra' 3 above.
  • the alkyl group at Ra' 10 may be partially substituted with a halogen atom or a heteroatom-containing group.
  • some of the hydrogen atoms constituting the alkyl group may be substituted with a halogen atom or a heteroatom-containing group.
  • some of the carbon atoms (methylene group, etc.) constituting the alkyl group may be substituted with a heteroatom-containing group.
  • the heteroatom here include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • Ra' 11 (the aliphatic cyclic group formed together with the carbon atom to which Ra' 10 is bonded) is the monocyclic group of Ra' 3 in formula (a1-r-1).
  • the group mentioned as an aliphatic hydrocarbon group (alicyclic hydrocarbon group) which is a polycyclic group is preferable.
  • monocyclic alicyclic hydrocarbon groups are preferred, and specifically, cyclopentyl groups and cyclohexyl groups are more preferred.
  • Ra' 11 (the aliphatic cyclic group formed together with the carbon atom to which Ra' 10 is bonded) may be unsaturated, and specifically, a cyclopentenyl group and a cyclohexenyl group are preferable.
  • Ra' 11 (the aliphatic cyclic group formed with the carbon atom to which Ra' 10 is bonded) may have a substituent, such as an iodine atom, a bromine atom, a fluorine atom, an alkoxy Examples include groups (methoxy group, ethoxy group, propoxy group, butoxy group, etc.).
  • the cyclic hydrocarbon group formed by Xa together with Ya is a cyclic monovalent hydrocarbon group (aliphatic Examples include groups obtained by further removing one or more hydrogen atoms from a hydrocarbon group.
  • the cyclic hydrocarbon group formed by Xa and Ya may have a substituent. Examples of this substituent include those similar to the substituents that the cyclic hydrocarbon group in Ra' 3 above may have.
  • the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms in Ra 101 to Ra 103 includes, for example, a methyl group, an ethyl group, a propyl group, a butyl group, Examples include pentyl group, hexyl group, heptyl group, octyl group, and decyl group.
  • Examples of the monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms in Ra 101 to Ra 103 include cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group, cycloheptyl group, cyclooctyl group, Monocyclic aliphatic saturated hydrocarbon groups such as cyclodecyl group and cyclododecyl group; bicyclo[2.2.2]octanyl group, tricyclo[5.2.1.02,6]decanyl group, tricyclo[3.3.
  • Ra 101 to Ra 103 are preferably a hydrogen atom or a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, and among these, a hydrogen atom, a methyl group, or an ethyl group is preferable. More preferred is a hydrogen atom, particularly preferred.
  • Examples of the substituent of the chain saturated hydrocarbon group or aliphatic cyclic saturated hydrocarbon group represented by Ra 101 to Ra 103 include the same groups as Ra x5 described above.
  • Groups containing a carbon-carbon double bond formed by two or more of Ra 101 to Ra 103 bonding to each other to form a cyclic structure include, for example, a cyclopentenyl group, a cyclohexenyl group, a methylcyclopentenyl group, a methyl Examples include a cyclohexenyl group, a cyclopentylideneethenyl group, and a cyclohexylideneethenyl group. Among these, a cyclopentenyl group, a cyclohexenyl group, and a cyclopentylideneethenyl group are preferred from the viewpoint of ease of synthesis.
  • the aliphatic cyclic group formed by Xaa together with Yaa is a carbonized aliphatic group that is a monocyclic group or polycyclic group of Ra' 3 in formula (a1-r-1).
  • the groups listed as hydrogen groups are preferred.
  • the aromatic hydrocarbon group for Ra 104 includes a group obtained by removing one or more hydrogen atoms from an aromatic hydrocarbon ring having 5 to 30 carbon atoms.
  • Ra 104 is preferably a group in which one or more hydrogen atoms are removed from an aromatic hydrocarbon ring having 6 to 15 carbon atoms, and more preferably a group in which one or more hydrogen atoms are removed from benzene, naphthalene, anthracene, or phenanthrene.
  • a group obtained by removing one or more hydrogen atoms from benzene, naphthalene or anthracene is more preferable
  • a group obtained by removing one or more hydrogen atoms from benzene or naphthalene is particularly preferable
  • a group obtained by removing one or more hydrogen atoms from benzene is more preferable.
  • a group obtained by removing one or more hydrogen atoms from benzene is more preferable.
  • Ra 104 in formula (a1-r2-3) may have include methyl group, ethyl group, propyl group, hydroxy group, carboxy group, halogen atom, alkoxy group (methoxy group, (ethoxy group, propoxy group, butoxy group, etc.), alkyloxycarbonyl group, etc.
  • Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms.
  • the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms in Ra' 12 and Ra' 13 the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms in the above Ra 101 to Ra 103 can be used. Examples include those similar to hydrocarbon groups. Some or all of the hydrogen atoms possessed by this chain saturated hydrocarbon group may be substituted.
  • Ra' 12 and Ra' 13 are preferably an alkyl group having 1 to 5 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, further preferably a methyl group or an ethyl group, and particularly preferably a methyl group.
  • examples of the substituent include the same groups as Ra x5 described above.
  • Ra' 14 is a hydrocarbon group that may have a substituent.
  • the hydrocarbon group for Ra' 14 includes a linear or branched alkyl group, or a cyclic hydrocarbon group.
  • the linear alkyl group in Ra' 14 preferably has 1 to 5 carbon atoms, more preferably 1 to 4 carbon atoms, and even more preferably 1 or 2 carbon atoms.
  • Specific examples include methyl group, ethyl group, n-propyl group, n-butyl group, n-pentyl group, and the like. Among these, methyl group, ethyl group or n-butyl group are preferred, and methyl group or ethyl group is more preferred.
  • the branched alkyl group in Ra' 14 preferably has 3 to 10 carbon atoms, more preferably 3 to 5 carbon atoms. Specific examples include isopropyl group, isobutyl group, tert-butyl group, isopentyl group, neopentyl group, 1,1-diethylpropyl group, 2,2-dimethylbutyl group, and isopropyl group is preferred.
  • the hydrocarbon group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group, and may be a polycyclic group or a monocyclic group.
  • the aliphatic hydrocarbon group which is a monocyclic group a group obtained by removing one hydrogen atom from a monocycloalkane is preferable.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane.
  • the aliphatic hydrocarbon group which is a polycyclic group is preferably a group obtained by removing one hydrogen atom from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms. Examples include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
  • Ra' 14 examples include those similar to the aromatic hydrocarbon group in Ra 104 .
  • Ra' 14 is preferably a group obtained by removing one or more hydrogen atoms from an aromatic hydrocarbon ring having 6 to 15 carbon atoms, and a group obtained by removing one or more hydrogen atoms from benzene, naphthalene, anthracene, or phenanthrene.
  • a group obtained by removing one or more hydrogen atoms from benzene, naphthalene or anthracene is even more preferable, a group obtained by removing one or more hydrogen atoms from benzene or naphthalene is particularly preferable, a group obtained by removing one or more hydrogen atoms from benzene is most preferred.
  • substituents that Ra' 14 may have include the same substituents as those that Ra 104 may have.
  • the substituent that Ra' 14 may have is preferably a methyl group, ethyl group, propyl group, iodine atom, bromine atom, fluorine atom, alkoxy group (methoxy group, ethoxy group, propoxy group, butoxy group, etc.) ) etc.
  • Secondary alkyl ester type acid dissociable group examples of the secondary alkyl ester type acid-dissociable group in R 02 include acid-dissociable groups represented by the following general formula (a1-r-4).
  • Ra' 10 is a hydrocarbon group.
  • Ra' 11a and Ra' 11b are each independently a hydrogen atom, a halogen atom, or an alkyl group.
  • Ra' 12 is a hydrogen atom or a hydrocarbon group.
  • Ra' 10 and Ra' 11a or Ra' 11b may be bonded to each other to form a ring.
  • Ra' 11a or Ra' 11b and Ra' 12 may be bonded to each other to form a ring.
  • * represents a bond with the oxygen atom bonded to R 02 in the general formula (a0-1). ]
  • examples of the hydrocarbon groups at Ra' 10 and Ra' 12 include those similar to those for Ra' 3 above.
  • the alkyl groups for Ra' 11a and Ra' 11b include the same alkyl groups as for Ra' 1 above.
  • the alkyl group is preferably an alkyl group having 1 to 5 carbon atoms. Specifically, linear or branched alkyl groups are preferably mentioned. More specifically, examples include methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, isobutyl group, tert-butyl group, pentyl group, isopentyl group, neopentyl group, etc.
  • the hydrocarbon group at Ra' 10 and Ra' 12 and the alkyl group at Ra' 11a and Ra' 11b may have a substituent.
  • this substituent include the above-mentioned Ra x5 .
  • Ra' 10 and Ra' 11a or Ra' 11b may be bonded to each other to form a ring.
  • the ring may be polycyclic, monocyclic, alicyclic, or aromatic.
  • the alicyclic ring and aromatic ring may contain a heteroatom.
  • the ring formed by bonding Ra' 10 and Ra' 11a or Ra' 11b to each other is a monocycloalkene, a monocycloalkene in which some of the carbon atoms are heteroatoms (oxygen atom, sulfur atom, etc.). etc.), monocycloalkadienes are preferred, cycloalkenes having 3 to 6 carbon atoms are preferred, and cyclopentene or cyclohexene is preferred.
  • the ring formed by bonding Ra' 10 and Ra' 11a or Ra' 11b to each other may be a fused ring.
  • Specific examples of the condensed ring include indane and the like.
  • the ring formed by bonding Ra' 10 and Ra' 11a or Ra' 11b to each other may have a substituent.
  • this substituent include the above-mentioned Ra x5 .
  • Ra' 11a or Ra' 11b and Ra' 12 may be bonded to each other to form a ring, and as the ring, Ra' 10 and Ra' 11a or Ra' 11b may be bonded to each other to form a ring. Examples include those similar to the rings that are formed.
  • the acid dissociable group in R 02 a tertiary alkyl ester type acid dissociable group and a secondary alkyl ester type acid dissociable group are preferable, and the acid dissociable group in the above general formula (a1-r2-1) is preferable.
  • a group represented by the general formula (a1-r2-1) is even more preferable.
  • Y 00 is a divalent linking group or a single bond.
  • the divalent linking group in Y 00 include those similar to the divalent linking group in R 01 above.
  • the divalent linking group in Y 00 is preferably a divalent linking group containing a hetero atom, and (main chain side) -Y 21 -O- (R 00 side) is more preferable.
  • This Y 21 is preferably a linear aliphatic hydrocarbon group, more preferably a linear alkylene group, even more preferably a linear alkylene group having 1 to 5 carbon atoms, and a methylene group or an ethylene group. is particularly preferred.
  • Y 00 is preferably a divalent linking group, more preferably a divalent linking group containing a hetero atom.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • the aromatic hydrocarbon group in R 00 is a hydrocarbon group having at least one aromatic ring.
  • This aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 ⁇ electrons, and may be monocyclic or polycyclic.
  • the aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, even more preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms. However, the number of carbon atoms does not include the number of carbon atoms in the substituents.
  • Specific examples of the aromatic ring include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene.
  • the aromatic hydrocarbon group in R 00 includes a group obtained by removing two hydrogen atoms from an aromatic hydrocarbon ring (arylene group); an aromatic compound containing two or more aromatic hydrocarbon rings (for example, biphenyl, Examples include groups obtained by removing two hydrogen atoms from (such as fluorene).
  • the aromatic hydrocarbon group may or may not have a substituent.
  • the substituent here is a substituent that substitutes a hydrogen atom possessed by an aromatic hydrocarbon group.
  • the hydrogen atom bonded to the aromatic hydrocarbon ring in the aromatic hydrocarbon group may be substituted with a substituent.
  • the substituent include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, and a hydroxyl group.
  • the alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and more preferably a methyl group, ethyl group, propyl group, n-butyl group, or tert-butyl group.
  • the alkoxy group as the substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, ethoxy group, n-propoxy group, iso-propoxy group, n-butoxy group, or tert-butoxy group. , methoxy group, and ethoxy group are more preferred.
  • the halogen atom as the substituent is preferably an iodine atom, a bromine atom, or a fluorine atom. Examples of the halogenated alkyl group as the substituent include groups in which some or all of the hydrogen atoms of the alkyl group are substituted with the halogen atoms.
  • R 00 in the general formula (a0-1) is preferably an aromatic hydrocarbon group having a substituent from the viewpoint of achieving both high sensitivity and lithography properties.
  • the substituent of the aromatic hydrocarbon group in R 00 is preferably one or more selected from the group consisting of a halogen atom, an alkyl group, and an alkoxy group, from the viewpoint of high sensitivity, and among these, a halogen atom More preferably, it is one or more selected from the group consisting of an iodine atom, a bromine atom, and a fluorine atom, and an iodine atom is particularly preferable.
  • R 00 in the general formula (a0-1) is preferably a group represented by the following general formula (R 00 -1).
  • R a1 and R a2 each independently represent a halogen atom, an alkyl group, or an alkoxy group.
  • m0 is an integer from 0 to 2. 0 ⁇ n1 ⁇ m0 ⁇ 2+2. 0 ⁇ n2 ⁇ 4. 0 ⁇ n1+n2 ⁇ m0 ⁇ 2+4.
  • Either *11 or *12 represents a bond with Y 00 in the general formula (a0-1).
  • Either *21 or *22 represents a bond with Y 01 in the general formula (a0-1).
  • R a1 and R a2 each independently represent a halogen atom, an alkyl group, or an alkoxy group.
  • the halogen atom, alkyl group, and alkoxy group in R a1 and R a2 are the same as the halogen atom, alkyl group, and alkoxy group exemplified in the explanation of the substituent of the aromatic hydrocarbon group in R 00 mentioned above. , preferably a halogen atom.
  • m0 is preferably 0 or 1, more preferably 0.
  • n2 is preferably 1 or 2, more preferably 2.
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • Y 01 may contain atoms other than the oxygen atom.
  • atoms other than oxygen atoms include carbon atoms, hydrogen atoms, sulfur atoms, and nitrogen atoms.
  • Oxygen atom-containing connecting group a combination of the non-hydrocarbon oxygen atom-containing connecting group and an alkylene group, and the like.
  • a sulfonyl group (-SO 2 -) may be further linked to this combination.
  • Examples of such divalent linking groups containing an oxygen atom include linking groups represented by the following general formulas (y-al-1) to (y-al-8), respectively.
  • the bond to R 00 in the above formula (a0-1) is the following general formula (y-al-1) to It is V' 101 in (y-al-8).
  • V' 101 is an alkylene group having 1 to 5 carbon atoms or a single bond
  • V' 102 is a divalent saturated hydrocarbon group having 1 to 30 carbon atoms or a single bond.
  • the divalent saturated hydrocarbon group in V' 102 is preferably an alkylene group having 1 to 30 carbon atoms, more preferably an alkylene group having 1 to 10 carbon atoms, and preferably an alkylene group having 1 to 5 carbon atoms. More preferably, it is an alkylene group.
  • the alkylene group in V' 101 and V' 102 may be a linear alkylene group or a branched alkylene group, with a linear alkylene group being preferred.
  • the alkylene group in V' 101 and V' 102 is a methylene group [-CH 2 -]; -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 -, etc.
  • alkylmethylene groups ethylene; Group [-CH 2 CH 2 -]; -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 ) Alkylethylene group such as CH 2 -; trimethylene group (n-propylene group) [-CH 2 CH 2 CH 2 -]; -CH (CH 3 ) CH 2 CH 2 -, -CH 2 CH (CH 3 ) Alkyltrimethylene group such as CH 2 -; tetramethylene group [-CH 2 CH 2 CH 2 CH 2 -]; -CH (CH 3 ) CH 2 CH 2 CH 2 -, -CH 2 CH (CH 3 ) CH 2 Examples include alkyltetramethylene groups such as CH 2 -; pentamethylene groups [-CH 2 CH 2 CH 2 CH 2 CH 2 -], and the like.
  • a part of the methylene group in the alkylene group in V' 101 or V' 102 may be substituted with a divalent aliphatic cyclic group having 5 to 10 carbon atoms.
  • the aliphatic cyclic group is a divalent group obtained by removing one hydrogen atom from a cyclic aliphatic hydrocarbon group (monocyclic aliphatic hydrocarbon group, polycyclic aliphatic hydrocarbon group).
  • a cyclohexylene group, a 1,5-adamantylene group, or a 2,6-adamantylene group is more preferable.
  • Y 01 is preferably a divalent linking group containing an ester bond or a divalent linking group containing an ether bond, each represented by the above formulas (y-al-1) to (y-al-6).
  • a linking group is more preferred, and a linking group represented by the above formula (y-al-1), formula (y-al-3), or formula (y-al-6) is even more preferred.
  • V 01 is a single bond, an alkylene group, or a fluorinated alkylene group.
  • the alkylene group and fluorinated alkylene group in V 01 preferably have 1 to 4 carbon atoms.
  • Examples of the fluorinated alkylene group in V 01 include groups in which some or all of the hydrogen atoms of the alkylene group in V 01 are substituted with fluorine atoms.
  • V 01 is preferably a linear alkylene group having 1 to 4 carbon atoms, a linear fluorinated alkylene group having 1 to 4 carbon atoms, or a single bond, and is preferably a methylene group (-CH 2 - ), an ethylene group (-CH 2 CH 2 -), and a linear fluorinated alkylene group having 1 to 3 carbon atoms are more preferable.
  • Y 01 and V 01 do not form a single bond at the same time.
  • R 03 is preferably a fluorine atom or a fluorinated alkyl group, more preferably a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms, and R 03 is a fluorine atom or a fluorinated alkyl group. It is even more preferable that there be.
  • the anion moiety of the structural unit (a0) is preferably an anion represented by any of the formulas (a0-an-1) to (a0-an-12), and is preferably an anion represented by any of the formulas (a0-an-1) to (a0-an-1) to (a0-an-1) to (a0-an-1). a0-an-5) and an anion represented by any one of formulas (a0-an-9) to (a0-an-11) are more preferred.
  • M m+ is an m-valent onium cation, and m is an integer of 1 or more.
  • the onium cation in M m+ is preferably a sulfonium cation or an iodonium cation.
  • Preferred cation moieties ((M m+ ) 1/m ) include onium cations represented by the following general formulas (ca-1) to (ca-3), respectively.
  • R 201 to R 207 each independently represent an aryl group, an alkyl group, or an alkenyl group that may have a substituent.
  • R 201 to R 203 and R 206 to R 207 may be bonded to each other to form a ring together with the sulfur atom in the formula.
  • R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms.
  • R 210 is an aryl group which may have a substituent, an alkyl group which may have a substituent, an alkenyl group which may have a substituent, or -SO 2 - which may have a substituent. It is a containing cyclic group.
  • examples of the aryl group in R 201 to R 207 include unsubstituted aryl groups having 6 to 20 carbon atoms, such as phenyl group and naphthyl group. preferable.
  • the alkyl group in R 201 to R 207 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms.
  • the alkenyl group in R 201 to R 207 preferably has 2 to 10 carbon atoms.
  • R 201 to R 207 and R 210 may have include an alkyl group, a halogen atom, a halogenated alkyl group, a carbonyl group, a cyano group, an amino group, an aryl group, and the following general formula: Examples include groups represented by (car-r-1) to (car-r-7), respectively.
  • R' 201 is each independently a hydrogen atom, a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkyl group which may have a substituent. It is a good chain alkenyl group.
  • Cyclic group that may have a substituent The cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group.
  • Aliphatic hydrocarbon group means a hydrocarbon group without aromaticity. Further, the aliphatic hydrocarbon group may be saturated or unsaturated, and is usually preferably saturated.
  • the aromatic hydrocarbon group in R' 201 is a hydrocarbon group having an aromatic ring.
  • the aromatic hydrocarbon group preferably has 3 to 30 carbon atoms, more preferably 5 to 30 carbon atoms, even more preferably 5 to 20 carbon atoms, particularly preferably 6 to 15 carbon atoms, Most preferably 6 to 10 carbon atoms.
  • the number of carbon atoms does not include the number of carbon atoms in substituents.
  • the aromatic ring possessed by the aromatic hydrocarbon group in R' 201 is benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, or a ring in which some of the carbon atoms constituting these aromatic rings are substituted with heteroatoms.
  • the aromatic hydrocarbon group in R' 201 is a group in which one hydrogen atom is removed from the aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one of the hydrogen atoms in the aromatic ring is alkylene
  • arylalkyl groups such as benzyl group, phenethyl group, 1-naphthylmethyl group, 2-naphthylmethyl group, 1-naphthylethyl group, and 2-naphthylethyl group).
  • the alkylene group (alkyl chain in the arylalkyl group) preferably has 1 to 4 carbon atoms, more preferably 1 to 2 carbon atoms, and particularly preferably 1 carbon atom.
  • Examples of the cyclic aliphatic hydrocarbon group for R' 201 include aliphatic hydrocarbon groups containing a ring in the structure.
  • the aliphatic hydrocarbon group containing a ring in its structure includes an alicyclic hydrocarbon group (a group in which one hydrogen atom is removed from an aliphatic hydrocarbon ring), and an alicyclic hydrocarbon group that is linear or branched. Examples thereof include a group bonded to the end of a chain aliphatic hydrocarbon group, and a group in which an alicyclic hydrocarbon group is interposed in the middle of a linear or branched aliphatic hydrocarbon group.
  • the alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, more preferably 3 to 12 carbon atoms.
  • the alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group.
  • the monocyclic alicyclic hydrocarbon group a group obtained by removing one or more hydrogen atoms from a monocycloalkane is preferable.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane.
  • the polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 30 carbon atoms.
  • the polycycloalkanes include polycycloalkanes having polycyclic skeletons such as adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane; condensed ring systems such as cyclic groups having steroid skeletons; More preferred are polycycloalkanes having a polycyclic skeleton.
  • cyclic aliphatic hydrocarbon group for R' 201 a group obtained by removing one or more hydrogen atoms from a monocycloalkane or a polycycloalkane is preferable, and a group obtained by removing one hydrogen atom from a polycycloalkane is preferable. More preferred are adamantyl groups and norbornyl groups, and most preferred are adamantyl groups.
  • the linear or branched aliphatic hydrocarbon group that may be bonded to the alicyclic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms. , more preferably 1 to 4 carbon atoms, particularly preferably 1 to 3 carbon atoms.
  • a linear alkylene group is preferable, and specifically, a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [ -(CH 2 ) 3 -], tetramethylene group [-(CH 2 ) 4 -], pentamethylene group [-(CH 2 ) 5 -], and the like.
  • a branched alkylene group is preferable, and specifically, -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 - and other alkylmethylene groups; CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 Alkylethylene groups such as CH 3 ) 2 -CH 2 -; -CH(CH 3 )CH 2 CH 2 -, alkyltrimethylene groups such as -CH 2 CH(CH 3 )CH 2 -; -CH(CH 3 ) Examples include alkylal
  • cyclic hydrocarbon group in R' 201 may contain a heteroatom such as a heterocycle.
  • heteroatom such as a heterocycle. Examples include lactone-containing cyclic groups, -SO 2 --containing cyclic groups, and other heterocyclic groups represented by the following chemical formulas (r-hr-1) to (r-hr-16), respectively.
  • Examples of the substituent in the cyclic group of R' 201 include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, and the like.
  • the alkyl group as a substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably a methyl group, ethyl group, propyl group, n-butyl group, or tert-butyl group.
  • the alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, ethoxy group, n-propoxy group, iso-propoxy group, n-butoxy group, or tert-butoxy group. Most preferred are methoxy and ethoxy groups.
  • a fluorine atom is preferable.
  • halogenated alkyl group as a substituent examples include an alkyl group having 1 to 5 carbon atoms, such as a methyl group, ethyl group, propyl group, n-butyl group, and tert-butyl group, in which some or all of the hydrogen atoms are Examples include groups substituted with the aforementioned halogen atoms.
  • the carbonyl group as a substituent is a group that substitutes a methylene group (-CH 2 -) constituting a cyclic hydrocarbon group.
  • Chain-like alkyl group which may have a substituent The chain alkyl group of R' 201 may be either linear or branched.
  • the linear alkyl group preferably has 1 to 20 carbon atoms, more preferably 1 to 15 carbon atoms, and most preferably 1 to 10 carbon atoms.
  • the branched alkyl group preferably has 3 to 20 carbon atoms, more preferably 3 to 15 carbon atoms, and most preferably 3 to 10 carbon atoms.
  • 1-methylethyl group 1-methylpropyl group, 2-methylpropyl group, 1-methylbutyl group, 2-methylbutyl group, 3-methylbutyl group, 1-ethylbutyl group, 2-ethylbutyl group
  • Examples include 1-methylpentyl group, 2-methylpentyl group, 3-methylpentyl group, and 4-methylpentyl group.
  • Chain-like alkenyl group which may have a substituent The chain alkenyl group for R' 201 may be either linear or branched, and preferably has 2 to 10 carbon atoms, more preferably 2 to 5 carbon atoms, and The number of carbon atoms is more preferably 2 to 4, and the number of carbon atoms is particularly preferably 3.
  • Examples of the linear alkenyl group include a vinyl group, a propenyl group (allyl group), and a butenyl group.
  • Examples of the branched alkenyl group include 1-methylvinyl group, 2-methylvinyl group, 1-methylpropenyl group, and 2-methylpropenyl group.
  • a straight chain alkenyl group is preferable, a vinyl group and a propenyl group are more preferable, and a vinyl group is particularly preferable.
  • substituents on the chain alkyl group or alkenyl group of R' 201 include an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, and a cyclic group in the above R' 201 . etc.
  • the cyclic group that may have a substituent, the chain alkyl group that may have a substituent, or the chain alkenyl group that may have a substituent for R'201 is other than those mentioned above.
  • a cyclic group that may have a substituent or a chain alkyl group that may have a substituent those similar to the acid-dissociable group represented by the above formula (a1-r-2) can also be mentioned.
  • R' 201 is preferably a cyclic group that may have a substituent, and more preferably a cyclic hydrocarbon group that may have a substituent. More specifically, for example, a phenyl group, a naphthyl group, a group obtained by removing one or more hydrogen atoms from a polycycloalkane; a lactone-containing cyclic group; a -SO 2 --containing cyclic group, and the like are preferable.
  • R 201 to R 203 and R 206 to R 207 are sulfur atoms, when bonding with each other to form a ring with the sulfur atom in the formula; Heteroatoms such as oxygen atoms and nitrogen atoms, carbonyl groups, -SO-, -SO 2 -, -SO 3 -, -COO-, -CONH- or -N(R N )- (where R N is a carbon atom They may be bonded via a functional group such as an alkyl group of numbers 1 to 5.).
  • one ring in the formula containing a sulfur atom in its ring skeleton is preferably a 3- to 10-membered ring, particularly a 5- to 7-membered ring.
  • the ring formed include, for example, a thiophene ring, a thiazole ring, a benzothiophene ring, a dibenzothiophene ring, a 9H-thioxanthene ring, a thioxanthone ring, a thianthrene ring, a phenoxathiine ring, a tetrahydrothiophenium ring, a tetrahydrothio Examples include a pyranium ring.
  • R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, preferably a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, and when they are an alkyl group, they are bonded to each other. may be used to form a ring.
  • R 210 is an aryl group which may have a substituent, an alkyl group which may have a substituent, an alkenyl group which may have a substituent, or -SO 2 - which may have a substituent. It is a containing cyclic group. Examples of the aryl group for R 210 include unsubstituted aryl groups having 6 to 20 carbon atoms, with phenyl and naphthyl groups being preferred.
  • the alkyl group for R 210 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms.
  • the alkenyl group for R 210 preferably has 2 to 10 carbon atoms.
  • the —SO 2 —-containing cyclic group which may have a substituent in R 210 is preferably a “—SO 2 —containing polycyclic group.”
  • Suitable cations represented by the formula (ca-1) include cations represented by the following chemical formulas (ca-1-1) to (ca-1-75).
  • g1, g2, and g3 indicate the number of repetitions, g1 is an integer of 1 to 5, g2 is an integer of 0 to 20, and g3 is an integer of 0 to 20. ]
  • R'' 201 is a hydrogen atom or a substituent, and the substituent is the same as the substituent that R 201 to R 207 and R 210 to R 212 may have. ]
  • Suitable cations represented by formula (ca-2) include diphenyliodonium cations, bis(4-tert-butylphenyl)iodonium cations, and the like.
  • Suitable cations represented by the above formula (ca-3) include cations represented by the following formulas (ca-3-1) to (ca-3-6).
  • M m+ a cation represented by the above formula (ca-1) is preferable. Further, as M m+ , an m-valent onium cation having a fluorine atom is preferable from the viewpoint of increasing sensitivity. This M m+ is preferably a cation represented by the following formula (ca-1-1).
  • Rf 201 to Rf 203 each independently represent an aryl group that may have a substituent, an alkyl group that may have a substituent, or an alkenyl group that may have a substituent] .
  • Rf 201 to Rf 203 may be bonded to each other to form a ring together with the sulfur atom in the formula. However, at least one of Rf 201 to Rf 203 contains at least one fluorine atom.
  • Rf 201 to Rf 203 in the formula (ca-1-1) are the same as R 201 to R 203 in the formula (ca-1), respectively. However, at least one of Rf 201 to Rf 203 contains at least one fluorine atom.
  • the cation represented by formula (ca-1-1) preferably contains three or more fluorine atoms. Any one of Rf 201 to Rf 203 may have three or more fluorine atoms, and the total number of fluorine atoms contained in Rf 201 to Rf 203 may be three or more.
  • the structural unit (a0) is preferably a structural unit represented by any of the formulas (a0-1) to (a0-13), and is preferably a structural unit represented by any of the formulas (a0-1) to (a0-6), the formula (a0-1) to -10) to (a0-12) are more preferred.
  • the number of structural units (a0) contained in the component (A1) may be one or more.
  • the proportion of the structural unit (a0) in the component (A1) is preferably 5 to 50 mol%, and 10 to 45 mol%, based on the total (100 mol%) of all the structural units constituting the component (A1). It is more preferably 20 to 40 mol%, even more preferably 25 to 35 mol%.
  • the proportion of the structural unit (a0) is at least the lower limit of the above-mentioned preferable range, sensitivity is further improved.
  • the proportion of the structural unit (a0) is below the upper limit of the preferable range, lithography properties such as pattern size uniformity are further improved.
  • the component (A1) may have other structural units as necessary.
  • Other structural units include, for example, the structural unit (a1) containing an acid-decomposable group whose polarity increases by the action of an acid (excluding those corresponding to the structural unit (a0)); the general formula (a10- Structural unit (a10) represented by 1); Structural unit (a2) containing a lactone-containing cyclic group; Structural unit (a8) derived from a compound represented by general formula (a8-1) described below, etc. Can be mentioned.
  • the structural unit (a1) is a structural unit containing an acid-decomposable group whose polarity increases under the action of an acid.
  • Examples of the acid-dissociable group constituting the acid-decomposable group include those that have been proposed as acid-dissociable groups for base resins for chemically amplified resist compositions.
  • Examples of acid-dissociable groups proposed as acid-dissociable groups for base resins for chemically amplified resist compositions include “acetal-type acid-dissociable groups,””tertiary alkyl ester-type acid-dissociable groups,” and “tertiary acid-dissociable groups.” Examples include “class alkyloxycarbonyl acid dissociable group” and "secondary alkyl ester type acid dissociable group.” Regarding the "acetal type acid dissociable group”, “tertiary alkyl ester type acid dissociable group”, and “secondary alkyl ester type acid dissociable group” in the structural unit (a1), the above-mentioned structural unit (a0) These are the same as the “acetal type acid dissociable group", “tertiary alkyl ester type acid dissociable group", and “secondary alkyl ester type acid dissociable group” explained in .
  • Tertiary alkyloxycarbonylic acid dissociable group examples include acid dissociable groups represented by the following general formula (a1-r-3).
  • Ra' 7 to Ra' 9 are each an alkyl group.
  • each of Ra' 7 to Ra' 9 is preferably an alkyl group having 1 to 5 carbon atoms, more preferably an alkyl group having 1 to 3 carbon atoms.
  • the total number of carbon atoms in each alkyl group is preferably 3 to 7, more preferably 3 to 5, and most preferably 3 to 4. preferable.
  • the structural unit (a1) is a structural unit derived from an acrylic ester in which the hydrogen atom bonded to the ⁇ -position carbon atom may be substituted with a substituent, a structural unit derived from acrylamide, hydroxystyrene or hydroxyl.
  • a structural unit in which at least a portion of the hydrogen atoms in the hydroxyl group of a structural unit derived from a styrene derivative is protected by a substituent containing the acid-decomposable group, a structural unit derived from vinylbenzoic acid or a vinylbenzoic acid derivative, - Examples include structural units in which at least a portion of the hydrogen atoms in C( O)-OH are protected by a substituent containing the acid-decomposable group.
  • structural units (a1) are preferably structural units derived from acrylic esters in which the hydrogen atom bonded to the ⁇ -position carbon atom may be substituted with a substituent.
  • Preferred specific examples of the structural unit (a1) include structural units represented by the following general formula (a1-1) or (a1-2).
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • Va 1 is a divalent hydrocarbon group which may have an ether bond.
  • n a1 is an integer from 0 to 2.
  • Ra 1 is an acid-dissociable group represented by the above general formula (a1-r-1), (a1-r-2) or (a1-r-4).
  • Wa 1 is n a2 + monovalent hydrocarbon group
  • n a2 is an integer of 1 to 3
  • Ra 2 is represented by the above general formula (a1-r-1) or (a1-r-3). It is an acid dissociable group.
  • R is the same as above.
  • R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom or a methyl group is particularly preferred.
  • the divalent hydrocarbon group in Va 1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.
  • the aliphatic hydrocarbon group as the divalent hydrocarbon group in Va 1 may be saturated or unsaturated, and is usually preferably saturated. More specifically, the aliphatic hydrocarbon group includes a linear or branched aliphatic hydrocarbon group, an aliphatic hydrocarbon group containing a ring in its structure, and the like.
  • the linear aliphatic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, even more preferably 1 to 4 carbon atoms, and has 1 to 4 carbon atoms. 3 is most preferred.
  • a linear alkylene group is preferable, and specifically, a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [ -(CH 2 ) 3 -], tetramethylene group [-(CH 2 ) 4 -], pentamethylene group [-(CH 2 ) 5 -], and the like.
  • the branched aliphatic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably 3 to 6 carbon atoms, even more preferably 3 or 4 carbon atoms, and has 3 carbon atoms. Most preferred.
  • a branched alkylene group is preferable, and specifically, -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 - and other alkylmethylene groups; CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 Alkylethylene groups such as CH 3 ) 2 -CH 2
  • Examples of the aliphatic hydrocarbon group containing a ring in the structure include an alicyclic hydrocarbon group (a group obtained by removing two hydrogen atoms from an aliphatic hydrocarbon ring), and an alicyclic hydrocarbon group in which the alicyclic hydrocarbon group is linear or branched. Examples include a group bonded to the end of a chain aliphatic hydrocarbon group, and a group in which an alicyclic hydrocarbon group is interposed in the middle of a linear or branched aliphatic hydrocarbon group. Examples of the linear or branched aliphatic hydrocarbon group include those similar to the linear aliphatic hydrocarbon group or the branched aliphatic hydrocarbon group.
  • the alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, more preferably 3 to 12 carbon atoms.
  • the alicyclic hydrocarbon group may be polycyclic or monocyclic.
  • As the monocyclic alicyclic hydrocarbon group a group obtained by removing two hydrogen atoms from a monocycloalkane is preferable.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane.
  • the polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms.
  • Examples include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
  • the aromatic hydrocarbon group as the divalent hydrocarbon group in Va 1 is a hydrocarbon group having an aromatic ring.
  • the aromatic hydrocarbon group preferably has 3 to 30 carbon atoms, more preferably 5 to 30 carbon atoms, even more preferably 5 to 20 carbon atoms, particularly preferably 6 to 15 carbon atoms, and most preferably 6 to 12 carbon atoms. preferable.
  • the number of carbon atoms does not include the number of carbon atoms in the substituents.
  • examples of the aromatic ring possessed by the aromatic hydrocarbon group include aromatic hydrocarbon rings such as benzene, biphenyl, fluorene, naphthalene, anthracene, and phenanthrene; Examples include aromatic heterocycles substituted with atoms.
  • the heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • the aromatic hydrocarbon group includes a group obtained by removing two hydrogen atoms from the aromatic hydrocarbon ring (arylene group); a group obtained by removing one hydrogen atom from the aromatic hydrocarbon ring (aryl group); ) in which one of the hydrogen atoms is substituted with an alkylene group (for example, arylalkyl such as benzyl group, phenethyl group, 1-naphthylmethyl group, 2-naphthylmethyl group, 1-naphthylethyl group, 2-naphthylethyl group) (a group obtained by removing one hydrogen atom from an aryl group in the group), and the like.
  • the number of carbon atoms in the alkylene group (alkyl chain in the arylalkyl group) is preferably 1 to 4, more preferably 1 to 2, and particularly preferably 1.
  • Ra 1 is an acid-dissociable group represented by the general formula (a1-r-1), (a1-r-2) or (a1-r-4), An acid dissociable group represented by the above general formula (a1-r-2) or (a1-r-4) is preferable.
  • the n a2 +1-valent hydrocarbon group in Wa 1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.
  • the aliphatic hydrocarbon group means a hydrocarbon group without aromaticity, and may be saturated or unsaturated, and is usually preferably saturated.
  • the aliphatic hydrocarbon group is a linear or branched aliphatic hydrocarbon group, an aliphatic hydrocarbon group containing a ring in its structure, or a linear or branched aliphatic hydrocarbon group. Examples include groups in which a ring-containing aliphatic hydrocarbon group is combined in the structure.
  • the n a2 +1 valence is preferably 2 to 4, more preferably 2 or 3.
  • Ra 2 is an acid dissociable group represented by the above general formula (a1-r-1) or (a1-r-3).
  • R ⁇ represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
  • the number of structural units (a1) contained in the component (A1) may be one or more.
  • the structural unit (a1) the structural unit represented by the above formula (a1-1) is more preferable because the characteristics (sensitivity, shape, etc.) in lithography using electron beam or EUV can be more easily improved; for EB Alternatively, it is preferable to select one in which the acid-dissociable group is a cyclic group because it is suitable for EUV use because of enhanced reactivity.
  • the structural unit (a1) is a structural unit represented by the above formula (a1-1), in which Ra 1 is represented by the above general formula (a1-r-2) or (a1-r-4).
  • it is an acid-dissociable group; a structural unit represented by the above formula (a1-1), in which Ra 1 is an acid-dissociable group represented by the above general formula (a1-r-2); Particularly preferred is a structural unit represented by the above formula (a1-1), in which Ra 1 is an acid-dissociable group represented by the above general formula (a1-r2-1). is most preferable.
  • the proportion of the structural unit (a1) in the component (A1) is preferably 5 to 40 mol%, and 10 to 30 mol%, based on the total (100 mol%) of all structural units constituting the component (A1). is more preferable, and even more preferably 15 to 25 mol%.
  • lithography properties such as sensitivity, resolution, and uniformity of pattern dimensions are improved.
  • it is below the upper limit of the above-mentioned preferable range a balance with other structural units can be maintained, and various lithography properties will be improved.
  • the structural unit (a10) is a structural unit represented by the following general formula (a10-1).
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • Ya x1 is a single bond or a divalent linking group.
  • Wa x1 is an aromatic hydrocarbon group which may have a substituent.
  • n ax1 is an integer of 1 or more.
  • R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms. Particularly preferred are atoms or methyl groups.
  • Ya x1 is a single bond or a divalent linking group.
  • the divalent linking group in Ya x1 is not particularly limited, but suitable examples include a divalent hydrocarbon group which may have a substituent, a divalent linking group containing a hetero atom, and the like.
  • Wa x1 is an aromatic hydrocarbon group which may have a substituent.
  • the aromatic hydrocarbon group in Wa x1 include a group obtained by removing (na x1 +1) hydrogen atoms from an aromatic ring that may have a substituent.
  • the aromatic ring here is not particularly limited as long as it is a cyclic conjugated system having 4n+2 ⁇ electrons.
  • the aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, even more preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms.
  • aromatic ring examples include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; aromatic heterocycles in which some of the carbon atoms constituting the aromatic hydrocarbon ring are substituted with heteroatoms; can be mentioned.
  • heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • aromatic heterocycle include a pyridine ring and a thiophene ring.
  • the aromatic hydrocarbon group in Wa x1 is an aromatic compound containing an aromatic ring that may have two or more substituents (e.g.
  • Wa x1 is preferably a group obtained by removing ( nax1 +1) hydrogen atoms from benzene, naphthalene, anthracene, or biphenyl, and a group obtained by removing ( nax1 +1) hydrogen atoms from benzene or naphthalene. is more preferred, and a group obtained by removing (n ax1 +1) hydrogen atoms from benzene is even more preferred.
  • the aromatic hydrocarbon group in Wa x1 may or may not have a substituent.
  • the substituent include an alkyl group, an alkoxy group, a halogen atom, and a halogenated alkyl group.
  • Examples of the alkyl group, alkoxy group, halogen atom, and halogenated alkyl group as the substituent include those listed as the substituent for the cyclic group of R'201 .
  • the substituent is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, more preferably a linear or branched alkyl group having 1 to 3 carbon atoms, and is preferably an ethyl group or a methyl group. A group is more preferred, and a methyl group is particularly preferred.
  • the aromatic hydrocarbon group in Wa x1 preferably has no substituent.
  • n ax1 is an integer of 1 or more, preferably an integer of 1 to 10, more preferably an integer of 1 to 5, even more preferably 1, 2 or 3, and 1 or 2 is Particularly preferred.
  • R ⁇ represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
  • the number of structural units (a10) contained in the component (A1) may be one or more.
  • the proportion of the structural unit (a10) in the component (A1) is as follows: It is preferably 40 to 95 mol%, more preferably 45 to 90 mol%, even more preferably 50 to 80 mol%, and particularly preferably 60 to 75 mol%.
  • Component (A1) may have a structural unit (a2) containing a lactone-containing cyclic group (excluding the structural unit (a1)).
  • the lactone-containing cyclic group of the structural unit (a2) is effective in increasing the adhesion of the resist film to the substrate when the component (A1) is used to form the resist film.
  • the structural unit (a2) for example, the acid diffusion length can be appropriately adjusted, the adhesion of the resist film to the substrate can be increased, and the solubility during development can be appropriately adjusted, so that the lithography properties can be improved. etc. will be good.
  • the lactone ring is counted as the first ring, and when there is only a lactone ring, it is called a monocyclic group, and when it has other ring structures, it is called a polycyclic group regardless of the structure.
  • the lactone-containing cyclic group may be a monocyclic group or a polycyclic group.
  • the lactone-containing cyclic group in the structural unit (a2) is not particularly limited and any arbitrary group can be used. Specifically, groups represented by the following general formulas (a2-r-1) to (a2-r-7) can be mentioned.
  • R'' is a hydrogen atom, an alkyl group, or a lactone-containing cyclic group
  • A'' has 1 to 1 carbon atoms, which may include an oxygen atom (-O-) or a sulfur atom (-S-); 5 alkylene group, oxygen atom or sulfur atom, n' is an integer of 0 to 2, and m' is 0 or 1.
  • * indicates a bond (the same applies hereinafter).
  • the alkyl group at Ra' 21 is preferably an alkyl group having 1 to 6 carbon atoms.
  • the alkyl group is preferably linear or branched. Specific examples include methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, isobutyl group, tert-butyl group, pentyl group, isopentyl group, neopentyl group, and hexyl group. Among these, methyl group or ethyl group is preferred, and methyl group is particularly preferred.
  • the alkoxy group for Ra' 21 is preferably an alkoxy group having 1 to 6 carbon atoms.
  • the alkoxy group is preferably linear or branched. Specifically, a group in which the alkyl group mentioned above as the alkyl group in Ra' 21 and an oxygen atom (-O-) are connected can be mentioned.
  • the halogen atom at Ra' 21 is preferably a fluorine atom. Examples of the halogenated alkyl group at Ra' 21 include groups in which part or all of the hydrogen atoms of the alkyl group at Ra' 21 are substituted with the halogen atoms.
  • a fluorinated alkyl group is preferable, and a perfluoroalkyl group is particularly preferable.
  • R" is a hydrogen atom, an alkyl group, or a lactone-containing cyclic group.
  • the alkyl group in R'' may be linear, branched, or cyclic, and preferably has 1 to 15 carbon atoms.
  • R'' is a linear or branched alkyl group, it preferably has 1 to 10 carbon atoms, more preferably 1 to 5 carbon atoms, and is a methyl or ethyl group. is particularly preferred.
  • R'' is a cyclic alkyl group, it preferably has 3 to 15 carbon atoms, more preferably 4 to 12 carbon atoms, and most preferably 5 to 10 carbon atoms.
  • groups obtained by removing one or more hydrogen atoms from a monocycloalkane such as cyclopentane and cyclohexane; adamantane, norbornane examples include groups obtained by removing one or more hydrogen atoms from polycycloalkanes such as isobornane, tricyclodecane, and tetracyclododecane.
  • Examples of the lactone-containing cyclic group in R'' include the same groups as those represented by the general formulas (a2-r-1) to (a2-r-7).
  • the hydroxyalkyl group in Ra' 21 preferably has 1 to 6 carbon atoms, and specifically includes a group in which at least one hydrogen atom of the alkyl group in Ra' 21 is substituted with a hydroxyl group. It will be done.
  • Ra' 21 is preferably each independently a hydrogen atom or a cyano group.
  • the alkylene group having 1 to 5 carbon atoms in A'' is linear or branched.
  • alkylene groups such as methylene group, ethylene group, n-propylene group, isopropylene group, etc.
  • specific examples include the terminal or sulfur atom of the alkylene group.
  • groups in which -O- or -S- is present between carbon atoms such as -O-CH 2 -, -CH 2 -O-CH 2 -, -S-CH 2 -, -CH 2 -S -CH 2 -, etc.
  • A'' is preferably an alkylene group having 1 to 5 carbon atoms or -O-, more preferably an alkylene group having 1 to 5 carbon atoms, and most preferably a methylene group.
  • the structural unit (a2) is preferably a structural unit derived from an acrylic ester in which the hydrogen atom bonded to the ⁇ -position carbon atom may be substituted with a substituent.
  • the structural unit (a2) is preferably a structural unit represented by the following general formula (a2-1).
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • Ya 21 is a single bond or a divalent linking group.
  • La 21 is -O-, -COO-, -CON(R')-, -OCO-, -CONHCO- or -CONHCS-, and R' represents a hydrogen atom or a methyl group.
  • Ra 21 is a lactone-containing cyclic group.
  • R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms. Particularly preferred are atoms or methyl groups.
  • the divalent linking group for Ya 21 is not particularly limited, but includes a divalent hydrocarbon group that may have a substituent, a divalent linking group containing a hetero atom, etc. are preferably mentioned.
  • Ya 21 is preferably a single bond, and La 21 is preferably -COO- or -OCO-.
  • Ra 21 is a lactone-containing cyclic group.
  • Preferable examples of the lactone-containing cyclic group in Ra 21 include groups represented by the aforementioned general formulas (a2-r-1) to (a2-r-7).
  • the number of structural units (a2) contained in the component (A1) may be one or more.
  • the proportion of the structural unit (a2) is 1 to 20 mol% with respect to the total (100 mol%) of all structural units constituting the component (A1). It is preferably 1 to 15 mol%, and even more preferably 1 to 10 mol%.
  • the proportion of the structural unit (a2) is at least the lower limit of the above-mentioned preferable range, the effect of containing the structural unit (a2) can be sufficiently obtained, and when it is below the upper limit, other effects can be obtained. It is possible to maintain a balance with the structural units of , and various lithography properties can be improved.
  • the structural unit (a8) is a structural unit derived from a compound represented by the following general formula (a8-1).
  • W 2 is a polymerizable group-containing group.
  • Ya x2 is a single bond or a (na x2 +1)-valent linking group. Ya x2 and W 2 may form a condensed ring.
  • R 1 is a fluorinated alkyl group having 1 to 12 carbon atoms.
  • R 2 is an organic group having 1 to 12 carbon atoms which may have a fluorine atom, or a hydrogen atom.
  • R 2 and Ya x2 may be bonded to each other to form a ring structure.
  • n ax2 is an integer from 1 to 3.
  • the "polymerizable group" in the polymerizable group-containing group of W2 is a group that enables a compound having a polymerizable group to be polymerized by radical polymerization, etc. A group containing multiple bonds.
  • the polymerizable group-containing group may be a group consisting only of a polymerizable group, or a group consisting of a polymerizable group and another group other than the polymerizable group.
  • groups other than the polymerizable group include a divalent hydrocarbon group which may have a substituent, a divalent linking group containing a hetero atom, and the like.
  • the fused ring formed by Ya x2 and W 2 includes a fused ring formed by the polymerizable group at the W 2 site and Ya x2 , and a fused ring formed by Ya x2 and a group other than the polymerizable group at the W 2 site. Examples include fused rings.
  • the condensed ring formed by Ya x2 and W 2 may have a substituent.
  • R ⁇ represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
  • the number of structural units (a8) contained in the component (A1) may be one or more.
  • the proportion of the structural unit (a8) is 1 to 20 mol% with respect to the total (100 mol%) of all the structural units constituting the component (A1). It is preferably 1 to 15 mol%, and even more preferably 1 to 10 mol%.
  • the component (A1) contained in the resist composition may be used alone or in combination of two or more.
  • the component (A1) used in this embodiment is a polymer compound having a structural unit (a0), preferably a polymer compound having a repeating structure of a structural unit (a0) and a structural unit (a10); a structural unit Examples include polymer compounds having a repeating structure of (a0), a structural unit (a1), and a structural unit (a10).
  • the component (A1) is prepared by dissolving monomers for inducing each structural unit in a polymerization solvent, and then initiating radical polymerization of, for example, azobisisobutyronitrile (AIBN), dimethyl azobisisobutyrate (for example, V-601, etc.). It can be manufactured by adding an agent and polymerizing it.
  • the component (A1) can be prepared by dissolving a monomer inducing the structural unit (a0) and a monomer inducing the structural unit (a10) in a polymerization solvent, and then adding the above-mentioned radical polymerization initiator thereto. It can be produced by additionally polymerizing and then performing a deprotection reaction.
  • a chain transfer agent such as HS-CH 2 -CH 2 -CH 2 -C(CF 3 ) 2 -OH in combination
  • -C(CF 3 ) is added to the terminal.
  • 2 -OH group may be introduced.
  • a copolymer into which a hydroxyalkyl group is introduced in which some of the hydrogen atoms of the alkyl group are replaced with fluorine atoms can reduce development defects and reduce LER (line edge roughness: unevenness of line sidewalls). It is effective in reducing
  • the weight average molecular weight (Mw) of the component (A1) is not particularly limited, and is preferably from 1,000 to 40,000, more preferably from 2,000 to 20,000, and from 5,000 to 10,000 is more preferable.
  • Mw of component (A1) is below the preferable upper limit of this range, it has sufficient solubility in a resist solvent to be used as a resist, and when it is above the preferable lower limit of this range, it has good dry etching resistance.
  • the cross-sectional shape of the resist pattern is good.
  • the molecular weight dispersity (Mw/Mn) of component (A1) is not particularly limited, and is preferably 1.0 to 4.0, more preferably 1.0 to 3.0, particularly 1.0 to 2.0. preferable.
  • Mn indicates a number average molecular weight.
  • the resist composition of the present embodiment contains, as the (A) component, a base material component (hereinafter referred to as "(A2) ) may be used in combination.
  • the component (A2) is not particularly limited, and may be arbitrarily selected from a large number of components conventionally known as base components for chemically amplified resist compositions.
  • component (A2) one type of high molecular compound or low molecular compound may be used alone, or two or more types may be used in combination.
  • the proportion of component (A1) in component (A) is preferably 25% by mass or more, more preferably 50% by mass or more, even more preferably 75% by mass or more, and 100% by mass, based on the total mass of component (A). It may be. When the proportion is 25% by mass or more, a resist pattern that is excellent in various lithography properties such as high sensitivity, resolution, and uniformity of pattern dimensions is easily formed.
  • the content of component (A) may be adjusted depending on the thickness of the resist film to be formed.
  • the resist composition of this embodiment may further contain other components in addition to the component (A) described above.
  • Other components include, for example, the following components (B), (D), (E), (F), and (S).
  • the resist composition of this embodiment may further contain an acid generator component (B) that generates acid upon exposure.
  • Component (B) is not particularly limited, and those that have been proposed as acid generators for chemically amplified resist compositions can be used.
  • Such acid generators include onium salt acid generators such as iodonium salts and sulfonium salts; oxime sulfonate acid generators; diazomethane-based acid generators such as bisalkyl or bisarylsulfonyl diazomethanes and poly(bissulfonyl)diazomethanes; Acid generators include a wide variety of acid generators such as nitrobenzylsulfonate acid generators, iminosulfonate acid generators, and disulfone acid generators.
  • Examples of onium salt-based acid generators include compounds represented by the following general formula (b-1) (hereinafter also referred to as “component (b-1)”), and compounds represented by the general formula (b-2). Examples include a compound (hereinafter also referred to as “component (b-2)”) or a compound represented by general formula (b-3) (hereinafter also referred to as “component (b-3)”).
  • R 101 and R 104 to R 108 each independently represent a cyclic group that may have a substituent, a chain alkyl group that may have a substituent, or a substituent. It is a chain alkenyl group that may have.
  • R 104 and R 105 may be bonded to each other to form a ring structure.
  • R 102 is a fluorinated alkyl group having 1 to 5 carbon atoms or a fluorine atom.
  • Y 101 is a divalent linking group or a single bond containing an oxygen atom.
  • V 101 to V 103 each independently represent a single bond, an alkylene group, or a fluorinated alkylene group.
  • L 101 to L 102 are each independently a single bond or an oxygen atom.
  • L 103 to L 105 are each independently a single bond, -CO- or -SO 2 -.
  • m is an integer of 1 or more, and M' m+ is an m-valent onium cation.
  • R 101 is a cyclic group that may have a substituent, a chain alkyl group that may have a substituent, or a substituent It is a chain alkenyl group which may have.
  • Cyclic group that may have a substituent The cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group.
  • Aliphatic hydrocarbon group means a hydrocarbon group without aromaticity. Moreover, it is preferable that the aliphatic hydrocarbon group is saturated.
  • the aromatic hydrocarbon group in R 101 is a hydrocarbon group having an aromatic ring.
  • the number of carbon atoms in the aromatic hydrocarbon group is preferably 3 to 30, more preferably 5 to 30, even more preferably 5 to 20, particularly preferably 6 to 15, and most preferably 6 to 10. .
  • the number of carbon atoms does not include the number of carbon atoms in substituents.
  • the aromatic ring possessed by the aromatic hydrocarbon group in R 101 is benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, or some of the carbon atoms constituting these aromatic rings are substituted with heteroatoms. Examples include aromatic heterocycles.
  • the heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • the aromatic hydrocarbon group in R 101 includes a group in which one hydrogen atom is removed from the aromatic ring (aryl group: e.g., phenyl group, naphthyl group, etc.), a group in which one hydrogen atom in the aromatic ring is alkylene Examples include groups substituted with groups (eg, benzyl group, phenethyl group, 1-naphthylmethyl group, etc.).
  • the number of carbon atoms in the alkylene group (alkyl chain in the arylalkyl group) is preferably 1 to 4, more preferably 1 to 2, and particularly preferably 1.
  • Examples of the cyclic aliphatic hydrocarbon group in R 101 include aliphatic hydrocarbon groups containing a ring in the structure.
  • the aliphatic hydrocarbon group containing a ring in its structure includes an alicyclic hydrocarbon group (a group in which one hydrogen atom is removed from an aliphatic hydrocarbon ring), and an alicyclic hydrocarbon group that is linear or branched. Examples thereof include a group bonded to the end of a chain aliphatic hydrocarbon group, and a group in which an alicyclic hydrocarbon group is interposed in the middle of a linear or branched aliphatic hydrocarbon group.
  • the alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, more preferably 3 to 12 carbon atoms.
  • the alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group.
  • the monocyclic alicyclic hydrocarbon group a group obtained by removing one or more hydrogen atoms from a monocycloalkane is preferable.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane.
  • the polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 30 carbon atoms.
  • the polycycloalkanes include polycycloalkanes having polycyclic skeletons such as adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane; condensed ring systems such as cyclic groups having steroid skeletons; More preferred are polycycloalkanes having a polycyclic skeleton.
  • cyclic aliphatic hydrocarbon group for R 101 a group obtained by removing one or more hydrogen atoms from a monocycloalkane or polycycloalkane is preferable, and a group obtained by removing one hydrogen atom from a polycycloalkane is more preferable.
  • an adamantyl group and a norbornyl group are more preferable, and an adamantyl group is particularly preferable.
  • the linear aliphatic hydrocarbon group that may be bonded to the alicyclic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, and even more preferably 1 to 4 carbon atoms. , 1 to 3 are most preferred.
  • a linear alkylene group is preferable, and specifically, a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [ -(CH 2 ) 3 -], tetramethylene group [-(CH 2 ) 4 -], pentamethylene group [-(CH 2 ) 5 -], and the like.
  • the branched aliphatic hydrocarbon group that may be bonded to the alicyclic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably 3 to 6 carbon atoms, and even more preferably 3 or 4 carbon atoms. , 3 are most preferred.
  • a branched alkylene group is preferable, and specifically, -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 - and other alkylmethylene groups; CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 Alkylethylene groups such as CH 3 ) 2 -CH 2 -; -CH(CH 3 )CH 2 CH 2 -, alkyltrimethylene groups such as -CH 2 CH(CH 3 )CH 2 -; -CH(CH 3 ) Examples include alkylal
  • the cyclic hydrocarbon group in R 101 may contain a heteroatom such as a heterocycle.
  • * represents a bond bonded to Y 101 in formula (b-1).
  • R is a hydrogen atom, an alkyl group, a lactone-containing cyclic group, or a -SO 2 --containing cyclic group;
  • B" has 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom is an alkylene group, an oxygen atom or a sulfur atom, and n' is an integer of 0 to 2. * indicates a bond.
  • Rb' 51 , B", and n' in the general formulas (b5-r-1) to (b5-r-4) are represented by the general formulas (a0-s-1) to (a0-s-4) ), respectively, are the same as Rb' 51 , B'', and n'.
  • Examples of the substituent in the cyclic group of R 101 include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, and the like.
  • the alkyl group as a substituent is preferably an alkyl group having 1 to 5 carbon atoms.
  • the alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, ethoxy group, n-propoxy group, iso-propoxy group, n-butoxy group, or tert-butoxy group. Most preferred are methoxy and ethoxy groups.
  • the halogen atom used as a substituent is preferably a fluorine atom, a bromine atom, or an iodine atom.
  • the halogenated alkyl group as a substituent include an alkyl group having 1 to 5 carbon atoms, such as a methyl group, an ethyl group, a propyl group, an n-butyl group, a tert-butyl group, etc., in which some or all of the hydrogen atoms are Examples include groups substituted with the aforementioned halogen atoms.
  • the carbonyl group as a substituent is a group that substitutes a methylene group (-CH 2 -) constituting a cyclic hydrocarbon group.
  • the cyclic hydrocarbon group in R 101 may be a fused cyclic group containing a fused ring in which an aliphatic hydrocarbon ring and an aromatic ring are fused.
  • the fused ring include one in which one or more aromatic rings are fused to a polycycloalkane having a polycyclic skeleton of a bridged ring system.
  • Specific examples of the bridged ring polycycloalkanes include bicycloalkanes such as bicyclo[2.2.1]heptane (norbornane) and bicyclo[2.2.2]octane.
  • the fused ring type is preferably a group containing a fused ring in which two or three aromatic rings are fused to a bicycloalkane, and a group containing a fused ring in which two or three aromatic rings are fused to a bicyclo[2.2.2]octane. More preferred are groups containing fused rings.
  • Specific examples of the fused cyclic group for R 101 include those represented by the following formulas (r-br-1) to (r-br-2). In the formula, * represents a bond bonded to Y 101 in formula (b-1).
  • substituents that the fused cyclic group in R 101 may have include alkyl groups, alkoxy groups, halogen atoms, halogenated alkyl groups, hydroxyl groups, carbonyl groups, nitro groups, aromatic hydrocarbon groups, and aliphatic groups. Examples include cyclic hydrocarbon groups. Examples of the alkyl group, alkoxy group, halogen atom, and halogenated alkyl group as a substituent for the fused cyclic group include those listed as the substituent for the cyclic group in R 101 above.
  • Examples of the aromatic hydrocarbon group as a substituent for the fused cyclic group include a group in which one hydrogen atom is removed from the aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one hydrogen atom is removed from the aromatic ring, A group in which one of the groups is substituted with an alkylene group (for example, an arylalkyl group such as a benzyl group, a phenethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group, a 2-naphthylethyl group, etc.), the above Examples include heterocyclic groups represented by the chemical formulas (r-hr-1) to (r-hr-6), respectively.
  • Examples of the alicyclic hydrocarbon group as a substituent for the fused cyclic group include groups obtained by removing one hydrogen atom from a monocycloalkane such as cyclopentane and cyclohexane; adamantane, norbornane, isobornane, tricyclodecane, and tetracycloalkane; A group obtained by removing one hydrogen atom from a polycycloalkane such as cyclododecane; a lactone-containing cyclic group represented by the above general formulas (a2-r-1) to (a2-r-7); a lactone-containing cyclic group represented by the above general formula -SO 2 --containing cyclic groups represented by (b5-r-1) to (b5-r-4), respectively; represented by the formulas (r-hr-7) to (r-hr-16), respectively; Examples include heterocyclic groups such as
  • the chain alkyl group for R 101 may be either linear or branched.
  • the linear alkyl group preferably has 1 to 20 carbon atoms, more preferably 1 to 15 carbon atoms, and most preferably 1 to 10 carbon atoms.
  • the branched alkyl group preferably has 3 to 20 carbon atoms, more preferably 3 to 15 carbon atoms, and most preferably 3 to 10 carbon atoms.
  • 1-methylethyl group 1-methylpropyl group, 2-methylpropyl group, 1-methylbutyl group, 2-methylbutyl group, 3-methylbutyl group, 1-ethylbutyl group, 2-ethylbutyl group
  • Examples include 1-methylpentyl group, 2-methylpentyl group, 3-methylpentyl group, and 4-methylpentyl group.
  • Chain-like alkenyl group which may have a substituent:
  • the chain alkenyl group for R 101 may be linear or branched, and preferably has 2 to 10 carbon atoms, more preferably 2 to 5, and even more preferably 2 to 4 carbon atoms. 3 is particularly preferred.
  • Examples of the linear alkenyl group include a vinyl group, a propenyl group (allyl group), and a butenyl group.
  • Examples of the branched alkenyl group include 1-methylvinyl group, 2-methylvinyl group, 1-methylpropenyl group, and 2-methylpropenyl group.
  • a straight chain alkenyl group is preferable, a vinyl group and a propenyl group are more preferable, and a vinyl group is particularly preferable.
  • Examples of the substituent in the chain alkyl group or alkenyl group of R 101 include an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, and the cyclic group in R 101 above. Can be mentioned.
  • R 101 is preferably a cyclic group that may have a substituent, and more preferably a cyclic hydrocarbon group that may have a substituent.
  • the cyclic hydrocarbon group includes a phenyl group, a naphthyl group, a group obtained by removing one or more hydrogen atoms from a polycycloalkane; the general formulas (a2-r-1) to (a2-r- 7) Lactone-containing cyclic groups represented by formulas (b5-r-1) to (b5-r- 4 ) are preferred, and polycycloalkane-containing cyclic groups are preferred.
  • a group obtained by removing one or more hydrogen atoms from is more preferable, and an adamantyl group is even more preferable.
  • Y 101 is a single bond or a divalent linking group containing an oxygen atom.
  • Y 101 may contain atoms other than the oxygen atom.
  • atoms other than oxygen atoms include carbon atoms, hydrogen atoms, sulfur atoms, and nitrogen atoms.
  • the divalent linking group containing an oxygen atom include linking groups represented by the above general formulas (y-al-1) to (y-al-8), respectively.
  • the bond to R 101 in the above formula (b-1) is the general formula (y-al-1) to (y-al-1) to (y-al-8).
  • -al-8) is V' 101 .
  • Y 101 is preferably a divalent linking group containing an ester bond or a divalent linking group containing an ether bond, each represented by the above formulas (y-al-1) to (y-al-6). A linking group is more preferred.
  • V 101 is a single bond, an alkylene group, or a fluorinated alkylene group.
  • the alkylene group and fluorinated alkylene group in V 101 preferably have 1 to 4 carbon atoms.
  • V 101 is preferably a single bond or a linear alkylene group having 1 to 4 carbon atoms.
  • Y 101 and V 101 in formula (b-1) do not simultaneously become a single bond.
  • R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms.
  • R 102 is preferably a fluorine atom or a perfluoroalkyl group having 1 to 5 carbon atoms, and more preferably a fluorine atom.
  • anion moiety represented by the formula (b-1) include, for example, when Y 101 is a single bond, fluorinated alkyl sulfonate anions such as trifluoromethanesulfonate anions and perfluorobutanesulfonate anions. ;
  • Y 101 is a divalent linking group containing an oxygen atom, examples thereof include anions represented by any of the following formulas (an-1) to (an-3).
  • R''101 is an aliphatic cyclic group which may have a substituent, a monovalent heterocyclic group represented by the above chemical formulas (r-hr-1) to (r-hr-6), respectively.
  • R''102 is an aliphatic cyclic group which may have a substituent, and is represented by the above formula (r-br-1) or (r-br-2).
  • R''103 is an aromatic cyclic group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain alkenyl group which may have a substituent.
  • V" 101 is a single bond, an alkylene group having 1 to 4 carbon atoms, or a fluorinated alkylene group having 1 to 4 carbon atoms.
  • R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms.
  • v'' are each independently an integer from 0 to 3
  • q'' are each independently an integer from 0 to 20
  • n'' is 0 or 1.
  • the aliphatic cyclic group which may have a substituent for R'' 101 , R'' 102 and R'' 103 is the group exemplified as the cyclic aliphatic hydrocarbon group for R 101 in formula (b-1) above. It is preferable that the substituent is the same as the substituent that may substitute the cyclic aliphatic hydrocarbon group in R 101 in the formula (b-1).
  • the aromatic cyclic group which may have a substituent in R" 101 and R" 103 is the group exemplified as the aromatic hydrocarbon group in the cyclic hydrocarbon group in R 101 in formula (b-1) above. It is preferable that Examples of the substituent include the same substituents that may substitute the aromatic hydrocarbon group in R 101 in formula (b-1).
  • the chain alkyl group which may have a substituent in R'' 101 is preferably the group exemplified as the chain alkyl group in R 101 in formula (b-1) above.
  • the chain alkenyl group which may have a substituent in R'' 103 is preferably the group exemplified as the chain alkenyl group in R 101 in formula (b-1) above.
  • the alkylene group and fluorinated alkylene group in V" 101 preferably have 1 to 3 carbon atoms, more preferably 1 or 2 carbon atoms.
  • V" 101 include -CH 2 -, -( Examples include CH 2 ) 2 -, -CFH-, -CH 2 CFH-, -CH(CF 3 )-, and the like.
  • the anion moiety represented by the formula (b-1) is preferably an anion moiety represented by the formula (an-1).
  • R''101 in (an-1) is an aromatic cyclic group which may have a substituent are preferable, and those which are a phenyl group which may have a substituent are more preferable.
  • the substituent include a hydroxy group, an alkyl group, or a halogen atom.
  • the halogen atom is preferably a bromine atom or an iodine atom, and more preferably an iodine atom.
  • R 104 and R 105 each independently represent a cyclic group that may have a substituent, or a chain group that may have a substituent. is an alkyl group or a chain alkenyl group which may have a substituent, and examples thereof include those similar to R 101 in formula (b-1). However, R 104 and R 105 may be bonded to each other to form a ring. R 104 and R 105 are preferably a chain alkyl group that may have a substituent, and are a linear or branched alkyl group or a linear or branched fluorinated alkyl group. is more preferable.
  • the chain alkyl group preferably has 1 to 10 carbon atoms, more preferably 1 to 7 carbon atoms, and even more preferably 1 to 3 carbon atoms.
  • the number of carbon atoms in the chain alkyl group of R 104 and R 105 is preferably as small as possible within the range of the number of carbon atoms mentioned above, for reasons such as good solubility in a resist solvent.
  • the greater the number of hydrogen atoms substituted with fluorine atoms the stronger the acid strength, and the higher the resistance to high energy light and electron beams of 250 nm or less. This is preferable because it improves transparency.
  • the proportion of fluorine atoms in the chain alkyl group is preferably 70 to 100%, more preferably 90 to 100%, and most preferably all hydrogen atoms are substituted with fluorine atoms. It is a perfluoroalkyl group.
  • V 102 and V 103 are each independently a single bond, an alkylene group, or a fluorinated alkylene group, and each of them is the same as V 101 in formula (b-1). Can be mentioned.
  • L 101 and L 102 are each independently a single bond or an oxygen atom.
  • R 106 to R 108 each independently represent a cyclic group that may have a substituent, or a chain that may have a substituent. is an alkyl group or a chain alkenyl group which may have a substituent, and examples thereof include those similar to R 101 in formula (b-1).
  • L 103 to L 105 are each independently a single bond, -CO- or -SO 2 -.
  • M' m+ represents an m-valent onium cation.
  • sulfonium cations and iodonium cations are preferred.
  • m is an integer of 1 or more.
  • Preferred cation moieties include onium cations represented by the above general formulas (ca-1) to (ca-3), respectively.
  • cations represented by the general formula (ca-1) are more preferred, and cations represented by the formulas (ca-1-1) to (ca-1-75) are even more preferred.
  • the component (B) may be used alone or in combination of two or more.
  • the component (A1) since the component (A1) has the structural unit (a0), it is not necessary to contain the component (B).
  • component (b-1) is preferred as component (B).
  • the content of component (B) in the resist composition is preferably 0 to 30 parts by weight, more preferably 0 to 20 parts by weight, and even more preferably 0 to 10 parts by weight, based on 100 parts by weight of component (A1).
  • the content of component (B) in the resist composition is preferably 0 to 30 parts by weight, more preferably 0 to 20 parts by weight, and even more preferably 0 to 10 parts by weight, based on 100 parts by weight of component (A1).
  • the resist composition of this embodiment further contains a base component (hereinafter also referred to as “component (D)”) that traps the acid generated by exposure (that is, controls the diffusion of acid). It is preferable to contain.
  • Component (D) acts as a quencher (acid diffusion control agent) that traps acid generated by exposure in the resist composition.
  • Component (D) includes, for example, a photodegradable base (D1) that decomposes upon exposure and loses acid diffusion controllability (hereinafter referred to as “component (D1)”), and a nitrogen-containing organic compound that does not fall under the component (D1).
  • Compound (D2) (hereinafter referred to as "component (D2)") and the like can be mentioned.
  • component (D1) a photodegradable base
  • component (D1) it becomes easier to improve both the characteristics of increasing sensitivity and suppressing the occurrence of coating defects.
  • the compound exemplified as component (D1) described below may be used as the above-mentioned acid generator component (component (B)) depending on the combination with other compounds.
  • Component (D1) By using a resist composition containing component (D1), when forming a resist pattern, the contrast between exposed areas and unexposed areas of the resist film can be further improved.
  • Component (D1) is not particularly limited as long as it decomposes upon exposure and loses acid diffusion control properties, and may be a compound represented by the following general formula (d1-1) (hereinafter referred to as "component (d1-1)"). ), a compound represented by the following general formula (d1-2) (hereinafter referred to as "(d1-2) component”), and a compound represented by the following general formula (d1-3) (hereinafter referred to as "(d1-2) component”).
  • Components (d1-1) to (d1-3) do not act as quenchers because they decompose in the exposed areas of the resist film and lose their acid diffusion control properties (basicity), but they do not act as quenchers in the unexposed areas of the resist film. Acts as a char.
  • Rd 1 to Rd 4 are a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent. It is. However, it is assumed that no fluorine atom is bonded to the carbon atom adjacent to the S atom in Rd 2 in formula (d1-2).
  • Yd 1 is a single bond or a divalent linking group.
  • m is an integer of 1 or more, and M m+ are each independently an m-valent onium cation.
  • Rd 1 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkyl group which may have a substituent. It is a good chain alkenyl group, and the same groups as R' 201 above can be mentioned. Among these, Rd 1 is an aromatic hydrocarbon group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain type which may have a substituent. Alkyl groups are preferred.
  • substituents that these groups may have include a hydroxyl group, an oxo group, an alkyl group, an aryl group, a fluorine atom, a fluorinated alkyl group, and the above general formulas (a2-r-1) to (a2-r- Examples include a lactone-containing cyclic group represented by 7), an ether bond, an ester bond, or a combination thereof.
  • an ether bond or an ester bond is included as a substituent, it may be via an alkylene group, and in this case, the substituent is represented by the above formulas (y-al-1) to (y-al-6), respectively.
  • a linking group is preferred.
  • an aromatic hydrocarbon group, an aliphatic cyclic group, or a chain alkyl group in Rd 1 is represented by the above general formulas (y-al-1) to (y-al-8), respectively, as a substituent.
  • an aromatic hydrocarbon group or an aliphatic cyclic group in Rd 1 in formula (d3-1) V′ 101 in the above general formulas (y-al-1) to (y-al-8) is bonded to the carbon atom constituting the , or chain alkyl group.
  • Preferred examples of the aromatic hydrocarbon group include a phenyl group, a naphthyl group, and a polycyclic structure containing a bicyclooctane skeleton (a polycyclic structure consisting of a bicyclooctane skeleton and other ring structures).
  • the aliphatic cyclic group is more preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane such as adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
  • the chain alkyl group preferably has 1 to 10 carbon atoms, and specifically includes a methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, heptyl group, and octyl group.
  • nonyl group, decyl group, etc. 1-methylethyl group, 1-methylpropyl group, 2-methylpropyl group, 1-methylbutyl group, 2-methylbutyl group, 3-methylbutyl group, 1- Examples include branched alkyl groups such as ethylbutyl group, 2-ethylbutyl group, 1-methylpentyl group, 2-methylpentyl group, 3-methylpentyl group, and 4-methylpentyl group.
  • the chain alkyl group is a fluorinated alkyl group having a fluorine atom or a fluorinated alkyl group as a substituent
  • the number of carbon atoms in the fluorinated alkyl group is preferably 1 to 11, more preferably 1 to 8. 1 to 4 are more preferred.
  • the fluorinated alkyl group may contain atoms other than fluorine atoms. Examples of atoms other than fluorine atoms include oxygen atoms, sulfur atoms, and nitrogen atoms.
  • M m+ is an m-valent onium cation.
  • the same cations as the cations represented by the above general formulas (ca-1) to (ca-3) are preferably mentioned, and the onium cations represented by the above general formula (ca-1) are preferably mentioned.
  • Cations are more preferred, and cations represented by the formulas (ca-1-1) to (ca-1-75) are even more preferred.
  • Component (d1-1) may be used alone or in combination of two or more.
  • Rd 2 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkyl group which may have a substituent. It is a good chain alkenyl group, and examples include those similar to R' 201 above. However, it is assumed that no fluorine atom is bonded to the carbon atom adjacent to the S atom in Rd 2 (not substituted with fluorine). As a result, the anion of the component (d1-2) becomes an appropriately weak acid anion, and the quenching ability of the component (D) is improved.
  • Rd 2 is preferably a chain alkyl group that may have a substituent or an aliphatic cyclic group that may have a substituent; More preferably, it is a formula group.
  • the chain alkyl group preferably has 1 to 10 carbon atoms, more preferably 3 to 10 carbon atoms.
  • the aliphatic cyclic group includes a group obtained by removing one or more hydrogen atoms from adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc. (which may have a substituent); one or more camphor More preferably, it is a group from which a hydrogen atom is removed.
  • the hydrocarbon group of Rd 2 may have a substituent, and examples of the substituent include the hydrocarbon group (aromatic hydrocarbon group, aliphatic cyclic group) of Rd 1 of the above formula (d1-1). , chain alkyl group) may be included.
  • M m+ is an m-valent onium cation, and is the same as M m+ in the above formula (d1-1).
  • Component (d1-2) may be used alone or in combination of two or more.
  • Rd 3 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a substituent. It is a chain alkenyl group, and examples thereof include those similar to R' 201 above, and it is preferably a cyclic group containing a fluorine atom, a chain alkyl group, or a chain alkenyl group. Among these, a fluorinated alkyl group is preferred, and the same fluorinated alkyl group as Rd 1 above is more preferred.
  • Rd 4 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkyl group which may have a substituent. It is an alkenyl group, and the same groups as R' 201 above can be mentioned. Among these, preferred are alkyl groups, alkoxy groups, alkenyl groups, and cyclic groups that may have substituents.
  • the alkyl group in Rd 4 is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, and specifically, methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, isobutyl group.
  • the alkoxy group in Rd 4 is preferably an alkoxy group having 1 to 5 carbon atoms, and specific examples of the alkoxy group having 1 to 5 carbon atoms include methoxy group, ethoxy group, n-propoxy group, iso-propoxy group, Examples include n-butoxy group and tert-butoxy group. Among them, methoxy group and ethoxy group are preferred.
  • alkenyl group for Rd 4 examples include the same alkenyl groups as for R' 201 above, and vinyl group, propenyl group (allyl group), 1-methylpropenyl group, and 2-methylpropenyl group are preferable. These groups may further have an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms as a substituent.
  • Examples of the cyclic group in Rd 4 include the same cyclic groups as in R' 201 above, including one or more cycloalkanes such as cyclopentane, cyclohexane, adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
  • An alicyclic group from which a hydrogen atom has been removed, or an aromatic group such as a phenyl group or a naphthyl group is preferable.
  • Rd 4 is an alicyclic group, the resist composition dissolves well in an organic solvent, resulting in good lithography properties. Further, when Rd 4 is an aromatic group, the resist composition has excellent light absorption efficiency and good sensitivity and lithography properties in lithography using EUV or the like as an exposure light source.
  • Yd 1 is a single bond or a divalent linking group.
  • the divalent linking group in Yd 1 is not particularly limited, but includes divalent hydrocarbon groups that may have substituents (aliphatic hydrocarbon groups, aromatic hydrocarbon groups), divalent hydrocarbon groups containing heteroatoms, etc. Examples include linking groups such as These are the divalent hydrocarbon group which may have a substituent, the divalent linking group for R 01 in formula (a0-1) above, and the divalent linking group containing a hetero atom, respectively. Examples include those similar to the valent linking group.
  • Yd 1 is preferably a carbonyl group, an ester bond, an amide bond, an alkylene group, or a combination thereof.
  • the alkylene group is more preferably a linear or branched alkylene group, and even more preferably a methylene group or an ethylene group.
  • M m+ is an m-valent onium cation, and is the same as M m+ in formula (d1-1) above.
  • Component (d1-3) may be used alone or in combination of two or more.
  • the component (D1) any one of the components (d1-1) to (d1-3) above may be used alone, or two or more thereof may be used in combination.
  • the component (D1) preferably contains the component (d1-1) described above.
  • the content of component (D1) in the resist composition is preferably 0.5 to 15 parts by mass, and 1 to 15 parts by mass, based on 100 parts by mass of component (A1). It is more preferably 10 parts by weight, and even more preferably 2 to 9 parts by weight.
  • the content of component (D1) is at least the preferable lower limit, particularly good lithography properties and resist pattern shape are likely to be obtained.
  • it is below the upper limit sensitivity can be maintained well and throughput is also excellent.
  • component (d1-1) is preferably 50% by mass or more, more preferably 70% by mass or more, It is more preferably 90% by mass or more, and component (D) may consist only of compound (d1-1) component.
  • (D1) Method for producing component The method for producing the components (d1-1) and (d1-2) is not particularly limited, and they can be produced by known methods. Furthermore, the method for producing component (d1-3) is not particularly limited, and is produced, for example, in the same manner as the method described in US2012-0149916.
  • Component (D) may contain a nitrogen-containing organic compound component (hereinafter referred to as "component (D2)") that does not correspond to component (D1) above.
  • component (D2) is not particularly limited as long as it acts as an acid diffusion control agent and does not fall under the component (D1), and any known components may be used.
  • aliphatic amines are preferred, and among these, secondary aliphatic amines and tertiary aliphatic amines are particularly preferred.
  • Aliphatic amines are amines having one or more aliphatic groups, and the aliphatic groups preferably have 1 to 12 carbon atoms.
  • aliphatic amines examples include amines (alkyl amines or alkyl alcohol amines) or cyclic amines in which at least one hydrogen atom of ammonia NH 3 is substituted with an alkyl group or hydroxyalkyl group having 12 or less carbon atoms.
  • alkyl amines and alkyl alcohol amines include monoalkylamines such as n-hexylamine, n-heptylamine, n-octylamine, n-nonylamine, and n-decylamine; diethylamine, di-n-propylamine, di- -Dialkylamines such as n-heptylamine, di-n-octylamine, dicyclohexylamine; trimethylamine, triethylamine, tri-n-propylamine, tri-n-butylamine, tri-n-pentylamine, tri-n-hexylamine , tri-n-heptylamine, tri-n-octylamine, tri-n-nonylamine, tri-n-decylamine, tri-n-dodecylamine; diethanolamine, triethanolamine, diisopropanolamine, tri- Examples include alkylamine
  • Examples of the cyclic amine include heterocyclic compounds containing a nitrogen atom as a heteroatom.
  • the heterocyclic compound may be monocyclic (aliphatic monocyclic amine) or polycyclic (aliphatic polycyclic amine).
  • Specific examples of the aliphatic monocyclic amine include piperidine and piperazine.
  • the aliphatic polycyclic amine preferably has 6 to 10 carbon atoms, specifically, 1,5-diazabicyclo[4.3.0]-5-nonene, 1,8-diazabicyclo[5 .4.0]-7-undecene, hexamethylenetetramine, 1,4-diazabicyclo[2.2.2]octane, and the like.
  • aliphatic amines include tris(2-methoxymethoxyethyl)amine, tris ⁇ 2-(2-methoxyethoxy)ethyl ⁇ amine, tris ⁇ 2-(2-methoxyethoxymethoxy)ethyl ⁇ amine, tris ⁇ 2 -(1-methoxyethoxy)ethyl ⁇ amine, tris ⁇ 2-(1-ethoxyethoxy)ethyl ⁇ amine, tris ⁇ 2-(1-ethoxypropoxy)ethyl ⁇ amine, tris[2- ⁇ 2-(2-hydroxy) Examples include ethoxy)ethoxy ⁇ ethyl]amine, triethanolamine triacetate, and triethanolamine triacetate is preferred.
  • an aromatic amine may be used as the component (D2).
  • aromatic amines include 4-dimethylaminopyridine, pyrrole, indole, pyrazole, imidazole or derivatives thereof, tribenzylamine, 2,6-diisopropylaniline, N-tert-butoxycarbonylpyrrolidine, 2,6-di-tert -butylpyridine, 2,6-di-tert-butylpyridine and the like.
  • component (D2) is preferably an alkylamine, more preferably a trialkylamine having 5 to 10 carbon atoms.
  • Component (D2) may be used alone or in combination of two or more.
  • the content of component (D2) in the resist composition is preferably 0.01 to 5 parts by mass, and 0.01 to 5 parts by mass, based on 100 parts by mass of component (A1). It is more preferably 1 to 5 parts by weight, and even more preferably 0.5 to 5 parts by weight.
  • the content of the component (D2) is at least the preferable lower limit, particularly good lithography properties and resist pattern shape are likely to be obtained. On the other hand, when it is below the upper limit, sensitivity can be maintained well and throughput is also excellent.
  • the resist composition of this embodiment contains organic carboxylic acids, phosphorus oxoacids, and derivatives thereof as optional components for the purpose of preventing sensitivity deterioration, improving resist pattern shape, storage stability over time, etc.
  • At least one compound (E) selected from the group consisting of (hereinafter referred to as "component (E)") can be contained.
  • the organic carboxylic acid include acetic acid, malonic acid, citric acid, malic acid, succinic acid, benzoic acid, and salicylic acid, among which salicylic acid is preferred.
  • the phosphorus oxoacid include phosphoric acid, phosphonic acid, and phosphinic acid, and among these, phosphonic acid is particularly preferred.
  • one kind of component (E) may be used alone, or two or more kinds may be used in combination.
  • the content of component (E) is preferably 0.01 to 5 parts by mass, and 0.05 to 3 parts by mass, based on 100 parts by mass of component (A1). is more preferable. By setting it within the above range, the lithography characteristics are further improved.
  • the resist composition of this embodiment may contain a fluorine additive component (hereinafter referred to as "component (F)") as a hydrophobic resin.
  • component (F) is used to impart water repellency to the resist film, and by being used as a resin separate from the component (A1), the lithography properties can be improved.
  • the component (F) is described, for example, in JP-A No. 2010-002870, JP-A No. 2010-032994, JP-A No. 2010-277043, JP-A No. 2011-13569, and JP-A No. 2011-128226.
  • the following fluorine-containing polymer compounds can be used.
  • component (F) includes a polymer having a structural unit (f1) represented by the following general formula (f1-1).
  • This polymer includes a polymer (homopolymer) consisting only of the structural unit (f1) represented by the following formula (f1-1); a copolymer of the structural unit (f1) and the above structural unit (a1); ; It is preferable that it is a copolymer of the structural unit (f1), a structural unit derived from acrylic acid or methacrylic acid, and the structural unit (a1), and the structural unit (f1) and the structural unit (a1) More preferably, it is a copolymer with.
  • the structural unit (a1) copolymerized with the structural unit (f1) is a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate, 1-methyl-1-adamantyl ( A structural unit derived from meth)acrylate is preferred, and a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate is more preferred.
  • R is the same as above, and Rf 102 and Rf 103 each independently represent a hydrogen atom, a halogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Rf 102 and Rf 103 may be the same or different. nf 1 is an integer from 0 to 5, and Rf 101 is an organic group containing a fluorine atom. ]
  • R bonded to the carbon atom at the ⁇ position is the same as described above.
  • R a hydrogen atom or a methyl group is preferable.
  • the halogen atoms of Rf 102 and Rf 103 are preferably fluorine atoms.
  • Examples of the alkyl group having 1 to 5 carbon atoms for Rf 102 and Rf 103 include those similar to the alkyl group having 1 to 5 carbon atoms for R above, and methyl group or ethyl group is preferable.
  • the halogenated alkyl group having 1 to 5 carbon atoms in Rf 102 and Rf 103 includes a group in which some or all of the hydrogen atoms of the alkyl group having 1 to 5 carbon atoms are substituted with a halogen atom.
  • the halogen atom is preferably a fluorine atom.
  • Rf 102 and Rf 103 are preferably a hydrogen atom, a fluorine atom, or an alkyl group having 1 to 5 carbon atoms, more preferably a hydrogen atom, a fluorine atom, a methyl group, or an ethyl group, and even more preferably a hydrogen atom.
  • nf 1 is an integer of 0 to 5, preferably 0 to 3, and more preferably 1 or 2.
  • Rf 101 is an organic group containing a fluorine atom, and preferably a hydrocarbon group containing a fluorine atom.
  • the hydrocarbon group containing a fluorine atom may be linear, branched or cyclic, and preferably has 1 to 20 carbon atoms, preferably 1 to 15 carbon atoms. More preferably, the number of carbon atoms is 1 to 10, particularly preferred. Further, in the hydrocarbon group containing a fluorine atom, it is preferable that 25% or more of the hydrogen atoms in the hydrocarbon group are fluorinated, more preferably 50% or more are fluorinated, and 60% or more are fluorinated.
  • Rf 101 is more preferably a fluorinated hydrocarbon group having 1 to 6 carbon atoms, such as trifluoromethyl group, -CH 2 -CF 3 , -CH 2 -CF 2 -CF 3 , -CH(CF 3 ) 2 , -CH 2 -CH 2 -CF 3 and -CH 2 -CH 2 -CF 2 -CF 2 -CF 3 are particularly preferred.
  • the weight average molecular weight (Mw) of the component (F) (based on polystyrene standards determined by gel permeation chromatography) is preferably from 1,000 to 50,000, more preferably from 5,000 to 40,000, and most preferably from 10,000 to 30,000. When it is below the upper limit of this range, there is sufficient solubility in a resist solvent for use as a resist, and when it is above the lower limit of this range, the water repellency of the resist film is good.
  • the molecular weight dispersity (Mw/Mn) of component (F) is preferably 1.0 to 5.0, more preferably 1.0 to 3.0, and most preferably 1.0 to 2.5.
  • one kind of component (F) may be used alone, or two or more kinds may be used in combination.
  • the content of component (F) is preferably 0.5 to 10 parts by mass, and preferably 1 to 10 parts by mass, based on 100 parts by mass of component (A1). It is more preferable that it is part.
  • the resist composition of this embodiment can be manufactured by dissolving a resist material in an organic solvent component (hereinafter referred to as "component (S)").
  • component (S) organic solvent component
  • the (S) component may be used alone or as a mixed solvent of two or more.
  • PGMEA, PGME, ⁇ -butyrolactone, EL, and cyclohexanone are preferred.
  • component (S) a mixed solvent of PGMEA and a polar solvent is also preferable.
  • the blending ratio (mass ratio) may be appropriately determined in consideration of the compatibility between PGMEA and the polar solvent.
  • component (S) a mixed solvent of at least one selected from PGMEA and EL and ⁇ -butyrolactone is also preferred. In this case, the mass ratio of the former to the latter is preferably 70:30 to 95:5.
  • the amount of component (S) to be used is not particularly limited, and is appropriately set at a concentration that allows coating on a substrate, etc., depending on the thickness of the coating film. Generally, component (S) is used so that the solid content concentration of the resist composition is in the range of 0.1 to 20% by weight, preferably 0.2 to 15% by weight.
  • impurities and the like may be removed using a porous polyimide membrane, a porous polyamide-imide membrane, or the like.
  • the resist composition may be filtered using a filter made of a porous polyimide membrane, a filter made of a porous polyamide-imide membrane, a filter made of a porous polyimide membrane and a porous polyamide-imide membrane, or the like.
  • the polyimide porous membrane and the polyamideimide porous membrane include those described in JP-A No. 2016-155121.
  • the resist composition of the present embodiment described above contains a resin component (A1) having a structural unit (a0) represented by the general formula (a0-1).
  • a0 a structural unit represented by the general formula (a0-1).
  • the structural unit (a0) has an acid generating group that generates an acid upon exposure to light via an aromatic hydrocarbon group (R 00 ) which may have a substituent on one side chain, and On the other hand, it has an acid-decomposable site.
  • R 00 aromatic hydrocarbon group
  • an anion moiety which is an acid generating group is incorporated into the resin component (A1).
  • the acid-generating groups are uniformly distributed throughout the resist film, the acid generated by exposure uniformly acts on acid-decomposable sites in the resist film.
  • the structural unit (a0) has an aromatic hydrocarbon group (R 00 ) which may have a substituent at the link between the main chain and the acid generating group, the unexposed part of the resist film The effect of inhibiting dissolution is enhanced. It is presumed that the above-mentioned effects work synergistically to achieve higher sensitivity and further improvement of lithography characteristics such as uniformity of pattern dimensions.
  • the resist pattern forming method according to the second aspect of the present invention includes a step of forming a resist film on a support using the resist composition according to the first aspect of the present invention, and exposing the resist film to light.
  • This method includes a step of developing the exposed resist film to form a resist pattern.
  • One embodiment of such a resist pattern forming method includes, for example, a resist pattern forming method performed as follows.
  • the resist composition of the above-described embodiment is applied onto a support using a spinner or the like, and a bake (post-apply bake (PAB)) treatment is performed, preferably for 40 to 120 seconds at a temperature of 80 to 150°C. is applied for 60 to 90 seconds to form a resist film.
  • a bake post-apply bake (PAB)
  • PAB post-apply bake
  • the resist film is exposed to light through a mask (mask pattern) on which a predetermined pattern is formed, or with an electron beam without passing through the mask pattern, using an exposure device such as an electron beam lithography device or an EUV exposure device. Selective exposure is performed by drawing by direct irradiation.
  • a bake (post-exposure bake (PEB)) treatment is performed, for example, at a temperature of 80 to 150° C.
  • the development process is performed using an alkaline developer in the case of an alkaline development process, and is performed using a developer containing an organic solvent (organic developer) in the case of a solvent development process.
  • a rinsing process is performed.
  • a rinsing treatment in the case of an alkaline development process, water rinsing using pure water is preferable, and in the case of a solvent development process, it is preferable to use a rinsing liquid containing an organic solvent.
  • a treatment may be performed to remove the developer or rinse agent adhering to the pattern using a supercritical fluid.
  • drying is performed. In some cases, a bake process (post-bake) may be performed after the development process.
  • the support is not particularly limited, and conventionally known supports can be used, such as substrates for electronic components and substrates on which predetermined wiring patterns are formed. More specifically, examples include silicon wafers, metal substrates such as copper, chromium, iron, and aluminum, and glass substrates. As the material for the wiring pattern, for example, copper, aluminum, nickel, gold, etc. can be used.
  • the wavelength used for exposure is not particularly limited, and may include ArF excimer laser, KrF excimer laser, F2 excimer laser, EUV (extreme ultraviolet), VUV (vacuum ultraviolet), EB (electron beam), X-ray, soft X-ray, etc. It can be done using radiation.
  • the resist pattern forming method of this embodiment is a method useful in a case where the resist film is exposed to EUV (extreme ultraviolet rays) or EB (electron beam) in the step of exposing the resist film.
  • the method of exposing the resist film may be normal exposure (dry exposure) performed in an inert gas such as air or nitrogen, or liquid immersion lithography.
  • immersion exposure the space between the resist film and the lowest lens of the exposure device is filled in advance with a solvent (immersion medium) that has a refractive index greater than that of air, and exposure (immersion exposure) is performed in that state.
  • the immersion medium is preferably a solvent having a refractive index greater than that of air and less than the refractive index of the resist film to be exposed, such as water, fluorine-based inert liquid, silicone-based solvent, carbonized Examples include hydrogen-based solvents. Water is preferably used as the immersion medium.
  • Examples of the alkaline developer used in the alkaline development process include a 0.1 to 10% by mass tetramethylammonium hydroxide (TMAH) aqueous solution.
  • TMAH tetramethylammonium hydroxide
  • the organic solvent contained in the organic developer used for development in the solvent development process may be any organic solvent as long as it can dissolve component (A1) (component (A1) before exposure), and may be selected from known organic solvents. You can choose as appropriate. Specific examples include polar solvents such as ketone solvents, ester solvents, alcohol solvents, nitrile solvents, amide solvents, and ether solvents, hydrocarbon solvents, and the like.
  • ester solvents include methyl acetate, butyl acetate, ethyl acetate, isopropyl acetate, pentyl acetate, isopentyl acetate, amyl acetate, propylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl Ether acetate, ethyl-3-ethoxypropionate, 3-methoxybutyl acetate, 3-methyl-3-methoxybutyl acetate, methyl formate, ethyl formate, butyl formate, propyl formate, ethyl lactate, butyl lactate, propyl lactate, butane
  • Examples include butyl acid, methyl 2-hydroxyisobutyrate, isoamyl acetate, isobutyl isobutyrate, and butyl propionate.
  • nitrile solvents examples include acetonitrile, propionitrile, valeronitrile, butyronitrile, and the like.
  • additives can be added to the organic developer as necessary.
  • additives include surfactants.
  • the surfactant is not particularly limited, for example, ionic or nonionic fluorine-based and/or silicon-based surfactants can be used.
  • the development process can be carried out by a known development method, such as a method in which the support is immersed in a developer for a certain period of time (dipping method), a method in which the support is heaped up on the surface of the support by surface tension, and then left for a certain period of time. (paddle method), spraying the developer onto the surface of the support (spray method), and applying the developer onto the rotating support while scanning the developer application nozzle at a constant speed. Examples include a method of continuous dispensing (dynamic dispensing method), etc.
  • organic solvent contained in the rinsing liquid used for rinsing after development in the solvent development process for example, among the organic solvents listed as organic solvents used in the organic developer, those that do not easily dissolve the resist pattern are appropriately selected. It can be used as Generally, at least one solvent selected from hydrocarbon solvents, ketone solvents, ester solvents, alcohol solvents, amide solvents, and ether solvents is used. Any one type of these organic solvents may be used alone, or two or more types may be used in combination. Further, it may be used in combination with an organic solvent other than those mentioned above or water.
  • the rinsing process (cleaning process) using a rinsing liquid can be performed by a known rinsing method.
  • the rinsing method include a method of continuously applying a rinsing liquid onto a support rotating at a constant speed (rotary coating method), a method of immersing the support in a rinsing liquid for a certain period of time (dipping method), Examples include a method of spraying a rinsing liquid onto the surface of the support (spray method).
  • the resist pattern forming method of the present embodiment described above since the above-described resist composition is used, it is possible to achieve high sensitivity and form a resist pattern with good lithography characteristics such as uniformity of pattern dimensions. be able to.
  • the resist composition of the embodiment described above, and various materials used in the pattern forming method of the embodiment described above e.g., resist solvent, developer, rinse solution, composition for forming an antireflective film, composition for forming a top coat
  • the material does not contain impurities such as metals, metal salts containing halogens, acids, alkalis, components containing sulfur atoms, or phosphorus atoms.
  • impurities containing metal atoms include Na, K, Ca, Fe, Cu, Mn, Mg, Al, Cr, Ni, Zn, Ag, Sn, Pb, Li, or salts thereof. can.
  • the content of impurities contained in these materials is preferably 200 ppb or less, more preferably 1 ppb or less, even more preferably 100 ppt (parts per trillion) or less, particularly preferably 10 ppt or less, and substantially free of impurities (parts per trillion). most preferably below the detection limit).
  • the compound according to the third aspect of the present invention is a compound represented by the following general formula (a0-m1) (hereinafter also referred to as “compound (a0)").
  • R 01 is a divalent linking group or a single bond.
  • R 02 is an acid dissociable group.
  • Y 00 is a divalent linking group or a single bond.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • V 01 is a single bond, an alkylene group or a fluorinated alkylene group.
  • R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group.
  • M m+ is an m-valent onium cation.
  • m is an integer of 1 or more.
  • R 01 , R 02 , Y 00 , R 00 , Y 01 , V 01 , R 03 , M m+ and m are R 01 in the above general formula (a0-1), The same as R 02 , Y 00 , R 00 , Y 01 , V 01 , R 03 , M m+ and m, respectively.
  • Suitable examples of the compound (a0) include compounds in which R 02 in the formula (a0-m1) is an acid-dissociable group represented by the above-mentioned general formula (a1-r-2).
  • a compound in which R 02 in the formula (a0-m1) is an acid-dissociable group represented by the above-mentioned general formula (a1-r-4) is preferably mentioned. It will be done.
  • R 00 in the formula (a0-m1) is an aromatic hydrocarbon group having a substituent, and the substituent is composed of a halogen atom, an alkyl group, and an alkoxy group.
  • Preferred examples include one or more compounds selected from the group.
  • suitable examples of the compound (a0) include compounds in which R 00 in the formula (a0-m1) is a group represented by the above-mentioned general formula (R 00 -1).
  • M m+ is an m-valent onium cation, preferably a cation represented by the above general formula (ca-1).
  • Compound (a0) of this embodiment can be produced by combining known methods.
  • One embodiment of the method for producing compound (a0) includes a production method including the following steps (I) to (IV).
  • Xh is a halogen atom.
  • R 01 is a divalent linking group or a single bond.
  • R 02 is an acid dissociable group.
  • R 01 and R 02 in the above reaction formula are the same as the explanations for R 01 and R 02 described above.
  • Xh is a halogen atom, preferably a chlorine atom.
  • the reaction temperature conditions in step (I) are not particularly limited, and are, for example, about 0 to 120°C.
  • the reaction time of step (I) is not particularly limited, and is, for example, about 1 to 12 hours.
  • reaction solvent used in step (I) examples include dichloromethane (CH 2 Cl 2 ), dichloroethane, chloroform, tetrahydrofuran (THF), N,N-dimethylformamide, acetonitrile, propionitrile, N,N'-dimethylacetamide. , dimethyl sulfoxide and the like.
  • a basic catalyst may be selected and used as appropriate.
  • basic catalysts include tertiary amines such as trimethylamine, triethylamine, and tributylamine; aromatic amines such as pyridine, dimethylaminopyridine, and pyrrolidinopyridine; diazabicyclononene (DBN), and diazabicycloundecene. (DBU), etc.
  • the compound in the reaction solution may be isolated and purified. Conventionally known methods can be used for isolation and purification.
  • R 02 is an acid dissociable group.
  • R 01 is a divalent linking group or a single bond.
  • Y 00a is a group derived from aldehyde.
  • Y 00a is a group derived from aldehyde, such as a group derived from formaldehyde (-CH 2 -OH).
  • the reaction temperature conditions in step (II) are not particularly limited, and are, for example, about 0 to 120°C.
  • the reaction time of step (II) is not particularly limited, and is, for example, about 1 to 24 hours.
  • reaction solvent used in step (II) examples include toluene, dichloromethane (CH 2 Cl 2 ), dichloroethane, chloroform, tetrahydrofuran (THF), N,N-dimethylformamide, acetonitrile, propionitrile, N,N'- Examples include dimethylacetamide, dimethylsulfoxide, and the like.
  • a basic catalyst may be selected and used as appropriate.
  • the basic catalyst include tertiary amines such as potassium tert-butoxide, trimethylamine, triethylamine, and tributylamine; aromatic amines such as pyridine, dimethylaminopyridine, and pyrrolidinopyridine; diazabicyclooctane (DABCO), Examples include diazabicyclononene (DBN) and diazabicycloundecene (DBU).
  • the compound in the reaction solution may be isolated and purified. Conventionally known methods can be used for isolation and purification.
  • V 01 is a single bond, an alkylene group, or a fluorinated alkylene group.
  • R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group.
  • M m+ is an m-valent onium cation.
  • m is an integer of 1 or more.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • Y 01a and Y 01b are groups that form Y 01 after the reaction in step (III).
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • Y 01 and V 01 never become a single bond at the same time.
  • Y 00b is a group that is condensed with Y 00a to form Y 00 .
  • Y 00 is a divalent linking group or a single bond.
  • V 01 , R 03 , M m+ , m, R 00 , Y 01 and Y 00 in the above reaction formula are the same as for V 01 , R 03 , M m+ , m, R 00 , Y 01 and Y 00 described above.
  • Y 01a and Y 01b are groups that form Y 01 after the reaction in step (III).
  • Y 01a is a hydroxy group (-OH)
  • Y 00b is a group that is condensed with Y 00a to form Y 00 .
  • Y 00b is a hydroxy group (-OH)
  • Y 00a is a formaldehyde-derived group (-CH 2 -OH)
  • Y 00 forms -CH 2 -O-.
  • the reaction temperature conditions in step (III) are not particularly limited, and are, for example, about 0 to 50°C.
  • the reaction time of step (III) is not particularly limited, and is, for example, about 1 to 12 hours.
  • reaction solvent used in step (III) examples include dichloromethane, dichloroethane, chloroform, diethyl ether, tetrahydrofuran, N,N-dimethylformamide, acetonitrile, propionitrile, N,N'-dimethylacetamide, and dimethylsulfoxide. .
  • a condensing agent is appropriately selected and used.
  • the condensing agent include dicyclohexylcarbodiimide, diisopropylcarbodiimide (DIC), 1-ethyl-3-(3-dimethylaminopropyl)carbodiimide hydrochloride, and carbonyldiimidazole (CDI).
  • a basic catalyst may be selected and used as appropriate.
  • basic catalysts include tertiary amines such as trimethylamine, triethylamine, and tributylamine, aromatic amines such as pyridine, pyrrolidinopyridine, and 4-(dimethylamino)pyridine (DMAP), and diazabicyclononene (DBN). ), diazabicycloundecene (DBU), and the like.
  • the compound in the reaction solution may be isolated and purified. Conventionally known methods can be used for isolation and purification.
  • step (IV) a compound represented by the following general formula (a0-m0-4) and a compound represented by the following general formula (a0-m0-7) are reacted to form the desired general formula ( A compound represented by a0-m1) is obtained.
  • R 02 is an acid dissociable group.
  • R 01 is a divalent linking group or a single bond.
  • Y 00a is a group derived from aldehyde.
  • Y 00b is a group that is condensed with Y 00a to form Y 00 .
  • Y 00 is a divalent linking group or a single bond.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • V 01 is a single bond, an alkylene group or a fluorinated alkylene group. Y 01 and V 01 never become a single bond at the same time.
  • R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group.
  • M m+ is an m-valent onium cation. m is an integer of 1 or more. ]
  • reaction temperature conditions in step (IV) are not particularly limited, and are, for example, about 0 to 50°C.
  • the reaction time in step (IV) is not particularly limited, and is, for example, about 1 to 12 hours.
  • reaction solvent used in step (IV) examples include dichloromethane, dichloroethane, chloroform, diethyl ether, tetrahydrofuran, N,N-dimethylformamide, acetonitrile, propionitrile, N,N'-dimethylacetamide, and dimethylsulfoxide. .
  • a condensing agent is appropriately selected and used.
  • the condensing agent include dicyclohexylcarbodiimide, diisopropylcarbodiimide (DIC), 1-ethyl-3-(3-dimethylaminopropyl)carbodiimide hydrochloride, and carbonyldiimidazole (CDI).
  • a basic catalyst may be selected and used as appropriate.
  • basic catalysts include tertiary amines such as trimethylamine, triethylamine, and tributylamine, aromatic amines such as pyridine, pyrrolidinopyridine, and 4-(dimethylamino)pyridine (DMAP), and diazabicyclononene (DBN). ), diazabicycloundecene (DBU), and the like.
  • step (IV) compound (a0) in the reaction solution may be isolated and purified.
  • Conventionally known methods can be used for isolation and purification; for example, concentration, solvent extraction, distillation, crystallization, recrystallization, chromatography, etc. can be used alone or in combination of two or more of these. can.
  • the structure of the compound obtained as described above can be determined by 1 H-nuclear magnetic resonance (NMR) spectroscopy, 13 C-NMR spectroscopy, 19 F-NMR spectroscopy, infrared absorption (IR) spectroscopy, mass spectrometry ( It can be confirmed by general organic analysis methods such as MS) method, elemental analysis method, and X-ray crystal diffraction method.
  • the compound of this embodiment can be used as a raw material monomer for a polymer compound according to the fourth aspect described below.
  • a fourth aspect of the present invention is a polymer compound having a structural unit represented by the following general formula (a0-1).
  • R 01 is a divalent linking group or a single bond.
  • R 02 is an acid dissociable group.
  • Y 00 is a divalent linking group or a single bond.
  • R 00 is an aromatic hydrocarbon group which may have a substituent.
  • Y 01 is a divalent linking group or a single bond containing an oxygen atom.
  • V 01 is a single bond, an alkylene group or a fluorinated alkylene group.
  • R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group.
  • M m+ is an m-valent onium cation.
  • m is an integer of 1 or more.
  • the polymer compound according to the fourth aspect further includes a structural unit represented by the following general formula (a10-1).
  • Preferred examples include:
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • Ya x1 is a divalent linking group or a single bond.
  • Wa x1 is an aromatic hydrocarbon group which may have a substituent.
  • n ax1 is an integer of 1 or more.
  • the structural unit represented by the general formula (a0-1) is a structural unit derived from the compound represented by the general formula (a0-m1), and is the same as the structural unit (a0) described above.
  • the structural unit represented by the general formula (a10-1) is the same as the structural unit (a10) described above.
  • the polymer compound according to the fourth aspect is the same as the explanation for component (A1) above.
  • the polymer compound according to the fourth aspect that is, the polymer compound having a structural unit represented by general formula (a0-1), can be used as a base material component of the resist composition according to the first aspect. .
  • a polymer compound having a structural unit represented by the general formula (a0-1) and a structural unit represented by the general formula (a10-1) is particularly useful as a resist material for lithography that exposes EUV or EB. It is useful as a.
  • a flask was charged with 50.0 g of the following compound (a0-01-4), 173.6 g of the following compound (a0-01-7), 500.0 g of dichloromethane, and 47.9 g of diisopropylcarbodiimide (DIC), and the mixture was heated at room temperature. Stirred for 3 hours. Thereafter, after washing with hydrochloric acid, the organic layer was concentrated to obtain 157.8 g of the target compound (a0-01).
  • a flask was charged with 50.0 g of the following compound (a0-13-3), 300.0 g of tetrahydrofuran (THF), 300.0 g of water, and 7.8 g of formaldehyde, and 1,4-diazabicyclo[2. 2.2] 132.1 g of octane (DABCO) was added and stirred at 90° C. for 12 hours. After washing with ion-exchanged water, the organic layer was concentrated to obtain 50.8 g of compound (a0-13-4).
  • THF tetrahydrofuran
  • DABCO 1,4-diazabicyclo[2. 2.2] 132.1 g of octane
  • the resulting reaction solution was stirred at 85° C. for 1 hour. After this, the reaction solution was cooled to room temperature. Next, the cooled reaction solution was precipitated with 450 g of heptane, and the precipitate was washed. After washing, the obtained white solid was filtered and dried under reduced pressure overnight to obtain the desired polymer compound (A1-1).
  • the weight average molecular weight (Mw) and molecular weight dispersity (Mw/Mn) of the polymer compounds (A1-1) to (A1-14) were determined by GPC measurement (standard polystyrene conversion).
  • the copolymerization composition ratio (ratio (mole ratio) of each structural unit in the structural formula) of the polymer compounds (A1-1) to (A1-14) was determined by carbon-13 nuclear magnetic resonance spectrum (600MHz_ 13 C-NMR). I asked for it.
  • Polymer compound (A1-12): Weight average molecular weight (Mw) 8400, molecular weight dispersity (Mw/Mn) 1.75, l/m 30/70.
  • Polymer compound (A1-13): weight average molecular weight (Mw) 8100, molecular weight dispersity (Mw/Mn) 1.72, l/m 30/70.
  • Polymer compound (A1-14): Weight average molecular weight (Mw) 7800, molecular weight dispersity (Mw/Mn) 1.69, l/m/n 30/50/20.
  • (A)-1 to (A)-14 The above-mentioned polymer compounds (A1-1) to (A1-14).
  • the weight average molecular weight (Mw) is a standard polystyrene equivalent weight average molecular weight determined by GPC measurement.
  • the copolymerization composition ratio (ratio (mole ratio) of each structural unit in the structural formula) was determined by 13 C-NMR.
  • (B)-1 An acid generator consisting of the following compound (B-1).
  • (B)-2 An acid generator consisting of the following compound (B-2).
  • (D)-1 An acid diffusion control agent consisting of the following compound (D1-1).
  • (D)-2 An acid diffusion control agent consisting of the following compound (D1-2).
  • ⁇ Formation of resist pattern> Process of forming resist film: The resist composition of each example was applied using a spinner onto an 8-inch silicon substrate treated with hexamethyldisilazane (HMDS), and pre-baked (PAB) at a temperature of 110°C for 60 seconds on a hot plate. By processing and drying, a resist film with a thickness of 50 nm was formed.
  • HMDS hexamethyldisilazane
  • PAB pre-baked
  • Step of exposing resist film Next, using an electron beam lithography system JEOL-JBX-9300FS (manufactured by JEOL Ltd.), the resist film was subjected to a target size of 32 nm diameter holes at equal intervals (pitch 64 nm) at an acceleration voltage of 100 kV. Drawing (exposure) was performed to form an arranged contact hole pattern (hereinafter referred to as "CH pattern"). Thereafter, post-exposure heating (PEB) treatment was performed at 110° C. for 60 seconds.
  • PEB post-exposure heating
  • Step of developing the resist film after exposure Next, alkaline development was performed at 23° C. for 60 seconds using a 2.38% by mass tetramethylammonium hydroxide (TMAH) aqueous solution "NMD-3" (trade name, manufactured by Tokyo Ohka Kogyo Co., Ltd.). Thereafter, water rinsing was performed for 15 seconds using pure water. As a result, a CH pattern was formed in which holes with a diameter of 32 nm were arranged at equal intervals (pitch 64 nm).
  • TMAH tetramethylammonium hydroxide

Abstract

The present invention employs a resist composition that contains a resin component having a constituent unit represented by general formula (a0-1). In formula (a0-1), R01 is a divalent linking group or a single bond. R02 is an acid-dissociable group. Y00 is a divalent linking group or single bond. R00 is an aromatic hydrocarbon group that may have a substituent. Y01 is a single bond or a divalent linking group that contains an oxygen atom. V01 is a single bond, an alkylene group, or a fluorinated alkylene group. R03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. Mm+ is an m-valent onium cation. m is an integer of 1 or more. The resist composition has high sensitivity at the time of formation of a resist pattern, and has good lithographic characteristics.

Description

レジスト組成物、レジストパターン形成方法、化合物及び高分子化合物Resist composition, resist pattern forming method, compound and polymer compound
 本発明は、レジスト組成物、レジストパターン形成方法、化合物及び高分子化合物に関する。
 本願は、2022年9月8日に日本に出願された、特願2022-143204号に基づき優先権主張し、その内容をここに援用する。
The present invention relates to a resist composition, a resist pattern forming method, a compound, and a polymer compound.
This application claims priority based on Japanese Patent Application No. 2022-143204, filed in Japan on September 8, 2022, the contents of which are incorporated herein.
 近年、半導体素子や液晶表示素子の製造においては、リソグラフィー技術の進歩により急速にパターンの微細化が進んでいる。微細化の手法としては、一般に、露光光源の短波長化(高エネルギー化)が行われている。
 レジスト材料には、これらの露光光源に対する感度、微細な寸法のパターンを再現できる解像性等のリソグラフィー特性が求められる。
 このような要求を満たすレジスト材料として、従来、酸の作用により現像液に対する溶解性が変化する基材成分と、露光により酸を発生する酸発生剤成分と、を含有する化学増幅型レジスト組成物が用いられている。
In recent years, in the manufacture of semiconductor devices and liquid crystal display devices, advances in lithography technology have led to rapid miniaturization of patterns. As a technique for miniaturization, generally the wavelength of the exposure light source is shortened (higher energy).
Resist materials are required to have lithography properties such as sensitivity to these exposure light sources and resolution capable of reproducing patterns with minute dimensions.
As a resist material that satisfies these requirements, chemically amplified resist compositions have conventionally been used that contain a base component whose solubility in a developer changes due to the action of an acid, and an acid generator component that generates an acid upon exposure. is used.
 化学増幅型レジスト組成物においては、一般的に、リソグラフィー特性等の向上のために、前記基材成分として、複数の構成単位を有する樹脂が用いられている。前記酸発生剤としては、これまで多種多様なものが提案されている。例えば、ヨードニウム塩やスルホニウム塩などのオニウム塩系酸発生剤、オキシムスルホネート系酸発生剤、ジアゾメタン系酸発生剤、ニトロベンジルスルホネート系酸発生剤、イミノスルホネート系酸発生剤、ジスルホン系酸発生剤などが知られている。 In chemically amplified resist compositions, a resin having a plurality of structural units is generally used as the base component in order to improve lithography properties and the like. A wide variety of acid generators have been proposed so far. For example, onium salt acid generators such as iodonium salts and sulfonium salts, oxime sulfonate acid generators, diazomethane acid generators, nitrobenzyl sulfonate acid generators, iminosulfonate acid generators, disulfone acid generators, etc. It has been known.
 また、化学増幅型レジスト組成物においては、酸発生剤成分として、露光により酸を発生する酸発生基を含む構成単位を導入した高分子化合物が提案されている(例えば、特許文献1参照)。このような高分子化合物は、酸発生剤としての機能と、基材成分としての機能とを併せ持つ。 Furthermore, in chemically amplified resist compositions, a polymer compound into which a structural unit containing an acid generating group that generates an acid upon exposure has been introduced as an acid generator component has been proposed (see, for example, Patent Document 1). Such a polymer compound has both the function of an acid generator and the function of a base material component.
特開2014-153440号公報Japanese Patent Application Publication No. 2014-153440
 リソグラフィー技術の更なる進歩、応用分野の拡大等が進み、急速にパターンの微細化が進んでいる。これに伴い、半導体素子等を製造する際には、微細な寸法のパターンを良好な形状で形成できる技術が求められる。そのため、レジスト組成物には、よりいっそうの高感度化と、パターン寸法の均一性等のリソグラフィー特性のさらなる向上とが求められる。
 本発明は、上記事情に鑑みてなされたものであり、高感度化が図れ、かつリソグラフィー特性が良好なレジスト組成物、当該レジスト組成物を用いたレジストパターン形成方法、当該レジスト組成物に有用な高分子化合物、及び当該高分子化合物の合成に利用可能な化合物を提供することを課題とする。
With further progress in lithography technology and expansion of application fields, patterns are rapidly becoming finer. Accordingly, when manufacturing semiconductor devices and the like, there is a need for technology that can form patterns with fine dimensions and good shapes. Therefore, resist compositions are required to have even higher sensitivity and further improve lithography properties such as pattern size uniformity.
The present invention has been made in view of the above circumstances, and provides a resist composition that achieves high sensitivity and has good lithography properties, a method for forming a resist pattern using the resist composition, and a resist composition useful for the resist composition. An object of the present invention is to provide a polymer compound and a compound that can be used to synthesize the polymer compound.
 上記の課題を解決するために、本発明は以下の構成を採用した。
 すなわち、本発明の第1の態様は、露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化するレジスト組成物であって、酸の作用により現像液に対する溶解性が変化する樹脂成分(A1)を含有し、前記樹脂成分(A1)は、下記一般式(a0-1)で表される構成単位(a0)を有することを特徴とする、レジスト組成物である。
In order to solve the above problems, the present invention employs the following configuration.
That is, a first aspect of the present invention is a resist composition that generates an acid upon exposure to light and whose solubility in a developing solution changes due to the action of the acid. This is a resist composition characterized in that the resin component (A1) has a structural unit (a0) represented by the following general formula (a0-1).
Figure JPOXMLDOC01-appb-C000009
[式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
Figure JPOXMLDOC01-appb-C000009
[In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
 本発明の第2の態様は、支持体上に、前記第1の態様に係るレジスト組成物を用いてレジスト膜を形成する工程、前記レジスト膜を露光する工程、及び前記露光後のレジスト膜を現像してレジストパターンを形成する工程を有することを特徴とする、レジストパターン形成方法である。 A second aspect of the present invention includes a step of forming a resist film on a support using the resist composition according to the first aspect, a step of exposing the resist film, and a step of exposing the resist film to light after the exposure. This is a resist pattern forming method characterized by having a step of developing and forming a resist pattern.
 本発明の第3の態様は、下記一般式(a0-m1)で表されることを特徴とする、化合物である。 A third aspect of the present invention is a compound characterized by being represented by the following general formula (a0-m1).
Figure JPOXMLDOC01-appb-C000010
[式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
Figure JPOXMLDOC01-appb-C000010
[In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
 本発明の第4の態様は、下記一般式(a0-1)で表される構成単位を有することを特徴とする、高分子化合物である。 A fourth aspect of the present invention is a polymer compound characterized by having a structural unit represented by the following general formula (a0-1).
Figure JPOXMLDOC01-appb-C000011
[式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
Figure JPOXMLDOC01-appb-C000011
[In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
 本発明によれば、高感度化が図れ、かつリソグラフィー特性が良好なレジスト組成物、当該レジスト組成物を用いたレジストパターン形成方法、当該レジスト組成物に有用な高分子化合物、及び当該高分子化合物の合成に利用可能な化合物を提供することができる。 According to the present invention, a resist composition capable of achieving high sensitivity and having good lithography properties, a resist pattern forming method using the resist composition, a polymer compound useful for the resist composition, and the polymer compound can provide compounds that can be used for the synthesis of
 本明細書及び本特許請求の範囲において、「脂肪族」とは、芳香族に対する相対的な概念であって、芳香族性を持たない基、化合物等を意味するものと定義する。
 「アルキル基」は、特に断りがない限り、直鎖状、分岐鎖状及び環状の1価の飽和炭化水素基を包含するものとする。アルコキシ基中のアルキル基も同様である。
 「アルキレン基」は、特に断りがない限り、直鎖状、分岐鎖状及び環状の2価の飽和炭化水素基を包含するものとする。
 「ハロゲン原子」は、フッ素原子、塩素原子、臭素原子、ヨウ素原子が挙げられる。
 「構成単位」とは、高分子化合物(樹脂、重合体、共重合体)を構成するモノマー単位(単量体単位)を意味する。
 「置換基を有してもよい」と記載する場合、水素原子(-H)を1価の基で置換する場合と、メチレン基(-CH-)を2価の基で置換する場合との両方を含む。
 「露光」は、放射線の照射全般を含む概念とする。
In this specification and the claims, the term "aliphatic" is a relative concept to aromatic, and is defined to mean groups, compounds, etc. that do not have aromaticity.
Unless otherwise specified, "alkyl group" includes linear, branched, and cyclic monovalent saturated hydrocarbon groups. The same applies to the alkyl group in the alkoxy group.
Unless otherwise specified, the "alkylene group" includes linear, branched, and cyclic divalent saturated hydrocarbon groups.
Examples of the "halogen atom" include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
"Constituent unit" means a monomer unit (monomer unit) that constitutes a high molecular compound (resin, polymer, copolymer).
When describing "may have a substituent", there are cases in which a hydrogen atom (-H) is substituted with a monovalent group and a case in which a methylene group (-CH 2 -) is substituted with a divalent group. including both.
“Exposure” is a concept that includes radiation irradiation in general.
 「酸分解性基」は、酸の作用により、当該酸分解性基の構造中の少なくとも一部の結合が開裂し得る酸分解性を有する基である。
 酸の作用により極性が増大する酸分解性基としては、例えば、酸の作用により分解して極性基を生じる基が挙げられる。
 極性基としては、例えばカルボキシ基、水酸基、アミノ基、スルホ基(-SOH)等が挙げられる。
 酸分解性基としてより具体的には、前記極性基が酸解離性基で保護された基(例えばOH含有極性基の水素原子を、酸解離性基で保護した基)が挙げられる。
An "acid-decomposable group" is a group having acid-decomposability that allows at least a portion of the bonds in the structure of the acid-decomposable group to be cleaved by the action of an acid.
Examples of acid-decomposable groups whose polarity increases due to the action of an acid include groups that decompose under the action of an acid to produce a polar group.
Examples of the polar group include a carboxy group, a hydroxyl group, an amino group, and a sulfo group (-SO 3 H).
More specifically, the acid-decomposable group includes a group in which the polar group is protected with an acid-dissociable group (for example, a group in which the hydrogen atom of an OH-containing polar group is protected with an acid-dissociable group).
 「酸解離性基」とは、(i)酸の作用により、当該酸解離性基と該酸解離性基に隣接する原子との間の結合が開裂し得る酸解離性を有する基、又は、(ii)酸の作用により一部の結合が開裂した後、さらに脱炭酸反応が生じることにより、当該酸解離性基と該酸解離性基に隣接する原子との間の結合が開裂し得る基、の双方をいう。
 酸分解性基を構成する酸解離性基は、当該酸解離性基の解離により生成する極性基よりも極性の低い基であることが必要で、これにより、酸の作用により該酸解離性基が解離した際に、該酸解離性基よりも極性の高い極性基が生じて極性が増大する。その結果、(A1)成分全体の極性が増大する。極性が増大することにより、相対的に、現像液に対する溶解性が変化し、現像液がアルカリ現像液の場合には溶解性が増大し、現像液が有機系現像液の場合には溶解性が減少する。
"Acid-dissociable group" means (i) a group having acid-dissociable properties that allows the bond between the acid-dissociable group and an atom adjacent to the acid-dissociable group to be cleaved by the action of an acid; (ii) A group in which the bond between the acid-dissociable group and an atom adjacent to the acid-dissociable group can be cleaved by further decarboxylation reaction after some bonds are cleaved by the action of an acid. , refers to both.
The acid-dissociable group constituting the acid-dissociable group needs to be a group with lower polarity than the polar group generated by dissociation of the acid-dissociable group. When is dissociated, a polar group having higher polarity than the acid-dissociable group is generated and the polarity increases. As a result, the polarity of the entire component (A1) increases. As the polarity increases, the relative solubility in the developer changes; when the developer is an alkaline developer, the solubility increases, and when the developer is an organic developer, the solubility decreases. Decrease.
 「基材成分」とは、膜形成能を有する有機化合物である。基材成分として用いられる有機化合物は、非重合体と重合体とに大別される。非重合体としては、通常、分子量が500以上4000未満のものが用いられる(以下「低分子化合物」という)。以下「樹脂」、「高分子化合物」又は「ポリマー」という場合は、分子量が1000以上の重合体を示す。重合体の分子量としては、GPC(ゲルパーミエーションクロマトグラフィー)によるポリスチレン換算の重量平均分子量を用いるものとする。 The "base material component" is an organic compound that has film-forming ability. Organic compounds used as base material components are broadly classified into non-polymers and polymers. As the non-polymer, those having a molecular weight of 500 or more and less than 4,000 are usually used (hereinafter referred to as "low-molecular compound"). Hereinafter, "resin", "high molecular compound", or "polymer" refers to a polymer having a molecular weight of 1000 or more. As the molecular weight of the polymer, the weight average molecular weight calculated by GPC (gel permeation chromatography) in terms of polystyrene is used.
 「誘導される構成単位」とは、炭素原子間の多重結合、例えば、エチレン性二重結合が開裂して構成される構成単位を意味する。
 「アクリル酸エステル」は、α位の炭素原子に結合した水素原子が置換基で置換されていてもよい。該α位の炭素原子に結合した水素原子を置換する置換基(Rαx)は、水素原子以外の原子又は基である。また、置換基(Rαx)がエステル結合を含む置換基で置換されたイタコン酸ジエステルや、置換基(Rαx)がヒドロキシアルキル基やその水酸基を修飾した基で置換されたαヒドロキシアクリルエステルも含むものとする。なお、アクリル酸エステルのα位の炭素原子とは、特に断りがない限り、アクリル酸のカルボニル基が結合している炭素原子のことである。
 以下、α位の炭素原子に結合した水素原子が置換基で置換されたアクリル酸エステルを、α置換アクリル酸エステルということがある。
"Derived structural unit" means a structural unit formed by cleavage of multiple bonds between carbon atoms, for example, ethylenic double bonds.
In the "acrylic ester", the hydrogen atom bonded to the α-position carbon atom may be substituted with a substituent. The substituent (R αx ) that substitutes the hydrogen atom bonded to the α-position carbon atom is an atom or group other than a hydrogen atom. In addition, there are also itaconic acid diesters in which the substituent (R αx ) is substituted with a substituent containing an ester bond, and α-hydroxyacrylic esters in which the substituent (R αx ) is substituted with a hydroxyalkyl group or a group modifying the hydroxyl group. shall be included. Note that the carbon atom at the α-position of the acrylic ester is the carbon atom to which the carbonyl group of acrylic acid is bonded, unless otherwise specified.
Hereinafter, an acrylic ester in which the hydrogen atom bonded to the carbon atom at the α-position is substituted with a substituent may be referred to as an α-substituted acrylic ester.
 「誘導体」とは、対象化合物のα位の水素原子がアルキル基、ハロゲン化アルキル基等の他の置換基に置換されたもの、並びにそれらの誘導体を含む概念とする。それらの誘導体としては、α位の水素原子が置換基に置換されていてもよい対象化合物の水酸基の水素原子を有機基で置換したもの;α位の水素原子が置換基に置換されていてもよい対象化合物に、水酸基以外の置換基が結合したもの等が挙げられる。なお、α位とは、特に断りがない限り、官能基と隣接した1番目の炭素原子のことをいう。
 ヒドロキシスチレンのα位の水素原子を置換する置換基としては、Rαxと同様のものが挙げられ、例えばアルキル基、ハロゲン化アルキル基等が挙げられる。
The term "derivative" is a concept that includes target compounds in which the hydrogen atom at the α-position is substituted with other substituents such as alkyl groups and halogenated alkyl groups, as well as derivatives thereof. These derivatives include those in which the hydrogen atom of the hydroxyl group of the target compound is replaced with an organic group; the hydrogen atom at the α position may be substituted with a substituent; Good target compounds include those to which a substituent other than a hydroxyl group is bonded. Note that the α position refers to the first carbon atom adjacent to a functional group, unless otherwise specified.
Examples of the substituent for substituting the hydrogen atom at the α-position of hydroxystyrene include those similar to R αx , such as an alkyl group and a halogenated alkyl group.
 本明細書及び本特許請求の範囲において、化学式で表される構造によっては、不斉炭素が存在し、エナンチオ異性体(enantiomer)やジアステレオ異性体(diastereomer)が存在し得るものがある。その場合は一つの化学式でそれら異性体を代表して表す。それらの異性体は単独で用いてもよいし、混合物として用いてもよい。 In this specification and the claims, some structures represented by chemical formulas may contain asymmetric carbon atoms, and enantiomers or diastereomers may exist. In that case, one chemical formula represents these isomers. These isomers may be used alone or as a mixture.
(レジスト組成物)
 本実施形態のレジスト組成物は、露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化するものである。
 かかるレジスト組成物は、酸の作用により現像液に対する溶解性が変化する基材成分(A)(以下「(A)成分」ともいう)を含有する。本実施形態のレジスト組成物においては、(A)成分が、露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化する樹脂成分を含む。
(Resist composition)
The resist composition of this embodiment generates acid upon exposure, and its solubility in a developer changes due to the action of the acid.
Such a resist composition contains a base component (A) (hereinafter also referred to as "component (A)") whose solubility in a developer changes due to the action of an acid. In the resist composition of this embodiment, the component (A) includes a resin component that generates acid upon exposure and whose solubility in a developer changes due to the action of the acid.
 本実施形態のレジスト組成物を用いてレジスト膜を形成し、該レジスト膜に対して選択的露光を行うと、該レジスト膜の露光部では、(A)成分から酸が発生し、該酸の作用により、(A)成分の現像液に対する溶解性が変化する一方で、該レジスト膜の未露光部では、(A)成分の現像液に対する溶解性が変化しないため、該レジスト膜の露光部と未露光部との間で現像液に対する溶解性の差が生じる。そのため、該レジスト膜を現像すると、該レジスト組成物がポジ型の場合は、レジスト膜露光部が溶解除去されてポジ型のレジストパターンが形成され、該レジスト組成物がネガ型の場合は、レジスト膜未露光部が溶解除去されてネガ型のレジストパターンが形成される。 When a resist film is formed using the resist composition of the present embodiment and the resist film is selectively exposed to light, an acid is generated from the component (A) in the exposed portion of the resist film. As a result, the solubility of component (A) in the developing solution changes, while the solubility of component (A) in the developing solution does not change in the unexposed area of the resist film, so that the solubility of the component (A) in the developing solution does not change. There is a difference in solubility in the developing solution between the unexposed area and the unexposed area. Therefore, when the resist film is developed, if the resist composition is positive type, the exposed portion of the resist film is dissolved and removed to form a positive resist pattern, and if the resist composition is negative type, the resist pattern is The unexposed portions of the film are dissolved and removed to form a negative resist pattern.
 本実施形態のレジスト組成物は、ポジ型レジスト組成物であってもよく、ネガ型レジスト組成物であってもよい。また、本実施形態のレジスト組成物は、レジストパターン形成時の現像処理に、アルカリ現像液を用いるアルカリ現像プロセス用であってもよく、該現像処理に、有機溶剤を含む現像液(有機系現像液)を用いる溶剤現像プロセス用であってもよい。 The resist composition of this embodiment may be a positive resist composition or a negative resist composition. Further, the resist composition of the present embodiment may be used in an alkaline development process using an alkaline developer in the development process during resist pattern formation, and in the development process, a developer containing an organic solvent (organic developer) may be used. It may also be used for a solvent development process using a liquid).
<基材成分(A)>
 本実施形態のレジスト組成物において、(A)成分は、酸の作用により現像液に対する溶解性が変化する樹脂成分(A1)(以下「(A1)成分」ともいう)を含む。
 (A1)成分を用いることにより、露光前後で基材成分の極性が変化するため、アルカリ現像プロセスだけでなく、溶剤現像プロセスにおいても、良好な現像コントラストを得ることができる。
 (A)成分としては、該(A1)成分とともに、他の高分子化合物及び低分子化合物の少なくとも一方を併用してもよい。
 本実施形態のレジスト組成物において、(A)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。
<Base material component (A)>
In the resist composition of the present embodiment, component (A) includes a resin component (A1) whose solubility in a developer changes due to the action of an acid (hereinafter also referred to as "component (A1)").
By using the component (A1), the polarity of the base material component changes before and after exposure, so that good development contrast can be obtained not only in an alkaline development process but also in a solvent development process.
As component (A), at least one of another high molecular compound and a low molecular compound may be used together with the component (A1).
In the resist composition of the present embodiment, one kind of component (A) may be used alone, or two or more kinds may be used in combination.
・樹脂成分(A1)について
 (A1)成分は、酸の作用により現像液に対する溶解性が変化する樹脂成分である。(A1)成分は、後述の一般式(a0-1)で表される構成単位(a0)を有する。
 (A1)成分は、構成単位(a0)に加え、必要に応じてその他構成単位を有するものでもよい。
- Regarding the resin component (A1) The component (A1) is a resin component whose solubility in a developer changes due to the action of an acid. Component (A1) has a structural unit (a0) represented by the general formula (a0-1) described below.
In addition to the structural unit (a0), the component (A1) may have other structural units as necessary.
 ≪構成単位(a0)≫
 構成単位(a0)は、下記一般式(a0-1)で表される構成単位である。構成単位(a0)は、酸の作用により極性が増大する酸分解性基(R02-O-C(=O)-)を含んでいる。
≪Constituent unit (a0)≫
The structural unit (a0) is a structural unit represented by the following general formula (a0-1). The structural unit (a0) contains an acid-decomposable group (R 02 -O-C(=O)-) whose polarity increases by the action of an acid.
Figure JPOXMLDOC01-appb-C000012
[式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
Figure JPOXMLDOC01-appb-C000012
[In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
 前記式(a0-1)中、R01は、2価の連結基又は単結合である。
 R01における2価の連結基としては、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基が挙げられる。
In the formula (a0-1), R 01 is a divalent linking group or a single bond.
Examples of the divalent linking group for R 01 include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
 R01が置換基を有してもよい2価の炭化水素基である場合、該2価の炭化水素基としては、直鎖若しくは分岐鎖状の脂肪族炭化水素基が好ましい。該直鎖状の脂肪族炭化水素基は、炭素原子数が1~10であることが好ましく、炭素原子数1~6がより好ましく、炭素原子数1~4がさらに好ましく、炭素原子数1~3が特に好ましい。分岐鎖状の脂肪族炭化水素基は、炭素原子数が2~10であることが好ましく、炭素原子数3~6がより好ましく、炭素原子数3又は4がさらに好ましく、炭素原子数3が特に好ましい。直鎖状若しくは分岐鎖状の炭化水素基は、飽和でもよく、不飽和でもよいが、飽和が好ましい。 When R 01 is a divalent hydrocarbon group which may have a substituent, the divalent hydrocarbon group is preferably a linear or branched aliphatic hydrocarbon group. The linear aliphatic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, even more preferably 1 to 4 carbon atoms, and has 1 to 4 carbon atoms. 3 is particularly preferred. The branched aliphatic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably 3 to 6 carbon atoms, even more preferably 3 or 4 carbon atoms, particularly 3 carbon atoms. preferable. The linear or branched hydrocarbon group may be saturated or unsaturated, but saturated is preferred.
 R01がヘテロ原子を含む2価の連結基である場合、該連結基として好ましいものとしては、-O-、-C(=O)-O-、-O-C(=O)-、-C(=O)-、-O-C(=O)-O-、-C(=O)-NH-、-NH-、-NH-C(=NH)-(Hはアルキル基、アシル基等の置換基で置換されていてもよい)、-S-、-S(=O)-、-S(=O)-O-、一般式-Y21-O-Y22-、-Y21-O-、-Y21-C(=O)-O-、-C(=O)-O-Y21-、-[Y21-C(=O)-O]m”-Y22-、-Y21-O-C(=O)-Y22-または-Y21-S(=O)-O-Y22-で表される基[式中、Y21およびY22はそれぞれ独立して置換基を有してもよい2価の炭化水素基であり、Oは酸素原子であり、m”は0~3の整数である。]等が挙げられる。
 前記へテロ原子を含む2価の連結基が-C(=O)-NH-、-C(=O)-NH-C(=O)-、-NH-、-NH-C(=NH)-の場合、そのHはアルキル基、アシル基等の置換基で置換されていてもよい。該置換基(アルキル基、アシル基等)は、炭素原子数が1~10であることが好ましく、1~8であることがさらに好ましく、1~5であることが特に好ましい。
 一般式-Y21-O-Y22-、-Y21-O-、-Y21-C(=O)-O-、-C(=O)-O-Y21-、-[Y21-C(=O)-O]m”-Y22-、-Y21-O-C(=O)-Y22-または-Y21-S(=O)-O-Y22-中、Y21およびY22は、それぞれ独立して、置換基を有してもよい2価の炭化水素基である。該2価の炭化水素基としては、前記と同様のものが挙げられる。
 Y21としては、直鎖状の脂肪族炭化水素基が好ましく、直鎖状のアルキレン基がより好ましく、炭素原子数1~5の直鎖状のアルキレン基がさらに好ましく、メチレン基またはエチレン基が特に好ましい。
 Y22としては、直鎖状または分岐鎖状の脂肪族炭化水素基が好ましく、メチレン基、エチレン基またはアルキルメチレン基がより好ましい。該アルキルメチレン基におけるアルキル基は、炭素原子数1~5の直鎖状のアルキル基が好ましく、炭素原子数1~3の直鎖状のアルキル基がより好ましく、メチル基が最も好ましい。
 式-[Y21-C(=O)-O]m”-Y22-で表される基において、m”は0~3の整数であり、0~2の整数であることが好ましく、0または1がより好ましく、1が特に好ましい。つまり、式-[Y21-C(=O)-O]m”-Y22-で表される基としては、式-Y21-C(=O)-O-Y22-で表される基が特に好ましい。なかでも、式-(CHa’-C(=O)-O-(CHb’-で表される基が好ましい。該式中、a’は、1~10の整数であり、1~8の整数が好ましく、1~5の整数がより好ましく、1または2がさらに好ましく、1が最も好ましい。b’は、1~10の整数であり、1~8の整数が好ましく、1~5の整数がより好ましく、1または2がさらに好ましく、1が最も好ましい。
When R 01 is a divalent linking group containing a hetero atom, the linking group is preferably -O-, -C(=O)-O-, -O-C(=O)-, - C(=O)-, -O-C(=O)-O-, -C(=O)-NH-, -NH-, -NH-C(=NH)- (H is an alkyl group, an acyl group ), -S-, -S(=O) 2 -, -S(=O) 2 -O-, general formula -Y 21 -O-Y 22 -, - Y 21 -O-, -Y 21 -C(=O)-O-, -C(=O)-O-Y 21 -, -[Y 21 -C(=O)-O] m” -Y 22 A group represented by -, -Y 21 -O-C(=O)-Y 22 - or -Y 21 -S(=O) 2 -O-Y 22 - [wherein Y 21 and Y 22 are each It is a divalent hydrocarbon group which may independently have a substituent, O is an oxygen atom, and m'' is an integer from 0 to 3. ] etc.
The divalent linking group containing the heteroatom is -C(=O)-NH-, -C(=O)-NH-C(=O)-, -NH-, -NH-C(=NH) In the case of -, H may be substituted with a substituent such as an alkyl group or an acyl group. The substituent (alkyl group, acyl group, etc.) preferably has 1 to 10 carbon atoms, more preferably 1 to 8 carbon atoms, and particularly preferably 1 to 5 carbon atoms.
General formula -Y 21 -O-Y 22 -, -Y 21 -O-, -Y 21 -C(=O)-O-, -C(=O)-O-Y 21 -, -[Y 21 - C(=O)-O] m” -Y 22 -, -Y 21 -O-C(=O)-Y 22 - or -Y 21 -S(=O) 2 -O-Y 22 -, Y 21 and Y 22 are each independently a divalent hydrocarbon group which may have a substituent. Examples of the divalent hydrocarbon group include those mentioned above.
Y21 is preferably a linear aliphatic hydrocarbon group, more preferably a linear alkylene group, even more preferably a linear alkylene group having 1 to 5 carbon atoms, and a methylene group or an ethylene group. Particularly preferred.
Y 22 is preferably a linear or branched aliphatic hydrocarbon group, more preferably a methylene group, an ethylene group, or an alkylmethylene group. The alkyl group in the alkylmethylene group is preferably a linear alkyl group having 1 to 5 carbon atoms, more preferably a linear alkyl group having 1 to 3 carbon atoms, and most preferably a methyl group.
In the group represented by the formula -[Y 21 -C(=O)-O] m" -Y 22 -, m" is an integer of 0 to 3, preferably an integer of 0 to 2, and 0 or 1 is more preferred, and 1 is particularly preferred. In other words, the group represented by the formula -[Y 21 -C(=O)-O] m" -Y 22 - is the group represented by the formula -Y 21 -C(=O)-O-Y 22 - Groups are particularly preferred. Among these, groups represented by the formula -(CH 2 ) a' -C(=O)-O-(CH 2 ) b' - are preferred. In the formula, a' is 1 to is an integer of 10, preferably an integer of 1 to 8, more preferably an integer of 1 to 5, even more preferably 1 or 2, and most preferably 1. b' is an integer of 1 to 10, and An integer of 1 to 5 is preferred, an integer of 1 to 5 is more preferred, 1 or 2 is even more preferred, and 1 is most preferred.
 R01における2価の連結基としては、ヘテロ原子を含む2価の連結基が好ましく、(主鎖側)-C(=O)-O-Y21-がより好ましい。 The divalent linking group in R 01 is preferably a divalent linking group containing a hetero atom, and (main chain side) -C(=O)-O-Y 21 - is more preferred.
 R01としては、ヘテロ原子を含む2価の連結基、又は単結合であることが好ましい。 R 01 is preferably a divalent linking group containing a hetero atom or a single bond.
 前記式(a0-1)中、R02は、酸解離性基である。
 R02における酸解離性基としては、これまで、化学増幅型レジスト組成物用のベース樹脂の酸解離性基として提案されているものが挙げられる。
 化学増幅型レジスト組成物用のベース樹脂の酸解離性基として提案されているものとして具体的には、以下に説明する「アセタール型酸解離性基」、「第3級アルキルエステル型酸解離性基」、「第2級アルキルエステル型酸解離性基」が挙げられる。これらの酸解離性基は、構成単位(a0)中の酸分解性基(R02-O-C(=O)-)における-O-C(=O)-を保護し、酸の作用により酸分解性基から解離する。これにより、カルボキシ基(HO-C(=O)-)が生じる。
In the formula (a0-1), R 02 is an acid dissociable group.
Examples of the acid-dissociable group in R 02 include those that have been proposed as acid-dissociable groups for base resins for chemically amplified resist compositions.
Specifically, examples of acid-dissociable groups proposed as acid-dissociable groups for base resins for chemically amplified resist compositions include "acetal-type acid-dissociable groups" and "tertiary alkyl ester-type acid-dissociable groups" described below. "group" and "secondary alkyl ester type acid dissociable group". These acid-dissociable groups protect -O-C(=O)- in the acid-decomposable group (R 02 -O-C(=O)-) in the structural unit (a0), and are Dissociates from acid-decomposable groups. This produces a carboxy group (HO-C(=O)-).
 アセタール型酸解離性基:
 R02におけるアセタール型酸解離性基としては、例えば、下記一般式(a1-r-1)で表される酸解離性基が挙げられる。
Acetal type acid dissociable group:
Examples of the acetal-type acid-dissociable group in R 02 include acid-dissociable groups represented by the following general formula (a1-r-1).
Figure JPOXMLDOC01-appb-C000013
[式中、Ra’及びRa’はそれぞれ水素原子またはアルキル基である。Ra’は炭化水素基であって、Ra’は、Ra’、Ra’のいずれかと結合して環を形成してもよい。]
Figure JPOXMLDOC01-appb-C000013
[In the formula, Ra' 1 and Ra' 2 are each a hydrogen atom or an alkyl group. Ra' 3 is a hydrocarbon group, and Ra' 3 may be bonded to either Ra' 1 or Ra' 2 to form a ring. ]
 式(a1-r-1)中、Ra’及びRa’のうち、少なくとも一方が水素原子であることが好ましく、両方が水素原子であることがより好ましい。
 Ra’又はRa’がアルキル基である場合、該アルキル基としては、炭素原子数1~5のアルキル基が好ましい。具体的には、直鎖状または分岐鎖状のアルキル基が好ましく挙げられる。より具体的には、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基などが挙げられ、メチル基またはエチル基がより好ましく、メチル基が特に好ましい。
In formula (a1-r-1), at least one of Ra' 1 and Ra' 2 is preferably a hydrogen atom, and more preferably both are hydrogen atoms.
When Ra' 1 or Ra' 2 is an alkyl group, the alkyl group is preferably an alkyl group having 1 to 5 carbon atoms. Specifically, linear or branched alkyl groups are preferably mentioned. More specifically, examples include methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, isobutyl group, tert-butyl group, pentyl group, isopentyl group, neopentyl group, etc. More preferred, and methyl group is particularly preferred.
 式(a1-r-1)中、Ra’の炭化水素基としては、直鎖状もしくは分岐鎖状のアルキル基、又は環状の炭化水素基が挙げられる。
 該直鎖状のアルキル基は、炭素原子数が1~5であることが好ましく、炭素原子数が1~4がより好ましく、炭素原子数1または2がさらに好ましい。具体的には、メチル基、エチル基、n-プロピル基、n-ブチル基、n-ペンチル基等が挙げられる。これらの中でも、メチル基、エチル基またはn-ブチル基が好ましく、メチル基またはエチル基がより好ましい。
In formula (a1-r-1), the hydrocarbon group for Ra' 3 includes a linear or branched alkyl group, or a cyclic hydrocarbon group.
The linear alkyl group preferably has 1 to 5 carbon atoms, more preferably 1 to 4 carbon atoms, and even more preferably 1 or 2 carbon atoms. Specific examples include methyl group, ethyl group, n-propyl group, n-butyl group, n-pentyl group, and the like. Among these, methyl group, ethyl group or n-butyl group are preferred, and methyl group or ethyl group is more preferred.
 該分岐鎖状のアルキル基は、炭素原子数が3~10であることが好ましく、炭素原子数3~5がより好ましい。具体的には、イソプロピル基、イソブチル基、tert-ブチル基、イソペンチル基、ネオペンチル基、1,1-ジエチルプロピル基、2,2-ジメチルブチル基等が挙げられ、イソプロピル基であることが好ましい。 The branched alkyl group preferably has 3 to 10 carbon atoms, more preferably 3 to 5 carbon atoms. Specific examples include isopropyl group, isobutyl group, tert-butyl group, isopentyl group, neopentyl group, 1,1-diethylpropyl group, 2,2-dimethylbutyl group, and isopropyl group is preferred.
 Ra’が環状の炭化水素基となる場合、該炭化水素基は、脂肪族炭化水素基でも芳香族炭化水素基でもよく、また、多環式基でも単環式基でもよい。
 単環式基である脂肪族炭化水素基としては、モノシクロアルカンから1個の水素原子を除いた基が好ましい。該モノシクロアルカンとしては、炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。
 多環式基である脂肪族炭化水素基としては、ポリシクロアルカンから1個の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては、炭素原子数7~12のものが好ましく、具体的にはアダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等が挙げられる。
When Ra' 3 is a cyclic hydrocarbon group, the hydrocarbon group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group, and may be a polycyclic group or a monocyclic group.
As the aliphatic hydrocarbon group which is a monocyclic group, a group obtained by removing one hydrogen atom from a monocycloalkane is preferable. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane.
The aliphatic hydrocarbon group which is a polycyclic group is preferably a group obtained by removing one hydrogen atom from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms. Examples include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
 Ra’の環状の炭化水素基が芳香族炭化水素基となる場合、該芳香族炭化水素基は、芳香環を少なくとも1つ有する炭化水素基である。
 この芳香環は、4n+2個のπ電子をもつ環状共役系であれば特に限定されず、単環式でも多環式でもよい。芳香環の炭素原子数は5~30であることが好ましく、炭素原子数5~20がより好ましく、炭素原子数6~15がさらに好ましく、炭素原子数6~12が特に好ましい。
 芳香環として具体的には、ベンゼン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環;前記芳香族炭化水素環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環等が挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。芳香族複素環として具体的には、ピリジン環、チオフェン環等が挙げられる。
 Ra’における芳香族炭化水素基として具体的には、前記芳香族炭化水素環または芳香族複素環から水素原子を1つ除いた基(アリール基またはヘテロアリール基);2以上の芳香環を含む芳香族化合物(例えばビフェニル、フルオレン等)から水素原子を1つ除いた基;前記芳香族炭化水素環または芳香族複素環の水素原子の1つがアルキレン基で置換された基(例えば、ベンジル基、フェネチル基、1-ナフチルメチル基、2-ナフチルメチル基、1-ナフチルエチル基、2-ナフチルエチル基等のアリールアルキル基など)等が挙げられる。前記芳香族炭化水素環または芳香族複素環に結合するアルキレン基の炭素原子数は、1~4であることが好ましく、炭素原子数1~2であることがより好ましく、炭素原子数1であることが特に好ましい。
When the cyclic hydrocarbon group of Ra' 3 is an aromatic hydrocarbon group, the aromatic hydrocarbon group is a hydrocarbon group having at least one aromatic ring.
This aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and may be monocyclic or polycyclic. The aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, even more preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms.
Specific examples of the aromatic ring include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; aromatic heterocycles in which some of the carbon atoms constituting the aromatic hydrocarbon ring are substituted with heteroatoms; Can be mentioned. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom. Specific examples of the aromatic heterocycle include a pyridine ring and a thiophene ring.
Specifically, the aromatic hydrocarbon group in Ra' 3 is a group obtained by removing one hydrogen atom from the aromatic hydrocarbon ring or aromatic heterocycle (aryl group or heteroaryl group); A group in which one hydrogen atom is removed from an aromatic compound (e.g. biphenyl, fluorene, etc.); a group in which one hydrogen atom of the aromatic hydrocarbon ring or aromatic heterocycle is substituted with an alkylene group (e.g., benzyl group , phenethyl group, 1-naphthylmethyl group, 2-naphthylmethyl group, 1-naphthylethyl group, arylalkyl group such as 2-naphthylethyl group, etc.). The alkylene group bonded to the aromatic hydrocarbon ring or aromatic heterocycle preferably has 1 to 4 carbon atoms, more preferably 1 to 2 carbon atoms, and has 1 carbon atom. This is particularly preferred.
 Ra’における環状の炭化水素基は、置換基を有してもよい。この置換基としては、例えば、-RP1、-RP2-O-RP1、-RP2-CO-RP1、-RP2-CO-ORP1、-RP2-O-CO-RP1、-RP2-OH、-RP2-CN又は-RP2-COOH(以下これらの置換基をまとめて「Rax5」ともいう。)等が挙げられる。
 ここで、RP1は、炭素原子数1~10の1価の鎖状飽和炭化水素基、炭素原子数3~20の1価の脂肪族環状飽和炭化水素基、又は炭素原子数6~30の1価の芳香族炭化水素基である。また、RP2は、単結合、炭素原子数1~10の2価の鎖状飽和炭化水素基、炭素原子数3~20の2価の脂肪族環状飽和炭化水素基、又は炭素原子数6~30の2価の芳香族炭化水素基である。但し、RP1及びRP2の鎖状飽和炭化水素基、脂肪族環状飽和炭化水素基及び芳香族炭化水素基の有する水素原子の一部又は全部はフッ素原子で置換されていてもよい。上記脂肪族環状炭化水素基は、上記置換基を1種単独で1つ以上有していてもよいし、上記置換基のうち複数種を各1つ以上有していてもよい。
 炭素原子数1~10の1価の鎖状飽和炭化水素基としては、例えば、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、ヘプチル基、オクチル基、デシル基等が挙げられる。
 炭素原子数3~20の1価の脂肪族環状飽和炭化水素基としては、例えば、シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロヘプチル基、シクロオクチル基、シクロデシル基、シクロドデシル基等の単環式脂肪族飽和炭化水素基;ビシクロ[2.2.2]オクタニル基、トリシクロ[5.2.1.02,6]デカニル基、トリシクロ[3.3.1.13,7]デカニル基、テトラシクロ[6.2.1.13,6.02,7]ドデカニル基、アダマンチル基等の多環式脂肪族飽和炭化水素基が挙げられる。
 炭素原子数6~30の1価の芳香族炭化水素基としては、例えば、ベンゼン、ビフェニル、フルオレン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環から水素原子1個を除いた基が挙げられる。
The cyclic hydrocarbon group at Ra' 3 may have a substituent. Examples of this substituent include -R P1 , -R P2 -O-R P1 , -R P2 -CO-R P1 , -R P2 -CO- OR P1 , -R P2 -O-CO-R P1 , -R P2 -OH, -R P2 -CN or -R P2 -COOH (hereinafter these substituents are also collectively referred to as "Ra x5 "), and the like.
Here, R P1 is a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms, or a monovalent cyclic saturated hydrocarbon group having 6 to 30 carbon atoms. It is a monovalent aromatic hydrocarbon group. R P2 is a single bond, a divalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, a divalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms, or a group having 6 to 20 carbon atoms. 30 divalent aromatic hydrocarbon groups. However, some or all of the hydrogen atoms of the chain saturated hydrocarbon group, aliphatic cyclic saturated hydrocarbon group, and aromatic hydrocarbon group of R P1 and R P2 may be substituted with fluorine atoms. The aliphatic cyclic hydrocarbon group may have one or more of the above substituents, or may have one or more of each of the above substituents.
Examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms include methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, heptyl group, octyl group, decyl group, etc. It will be done.
Examples of the monovalent aliphatic saturated hydrocarbon group having 3 to 20 carbon atoms include cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group, cycloheptyl group, cyclooctyl group, cyclodecyl group, cyclododecyl group, etc. Monocyclic aliphatic saturated hydrocarbon group; bicyclo[2.2.2]octanyl group, tricyclo[5.2.1.02,6]decanyl group, tricyclo[3.3.1.13,7]decanyl Examples include polycyclic aliphatic saturated hydrocarbon groups such as a group, a tetracyclo[6.2.1.13,6.02,7]dodecanyl group, and an adamantyl group.
Examples of monovalent aromatic hydrocarbon groups having 6 to 30 carbon atoms include groups obtained by removing one hydrogen atom from an aromatic hydrocarbon ring such as benzene, biphenyl, fluorene, naphthalene, anthracene, and phenanthrene. .
 Ra’が、Ra’、Ra’のいずれかと結合して環を形成する場合、該環式基としては、4~7員環が好ましく、4~6員環がより好ましい。該環式基の具体例としては、テトラヒドロピラニル基、テトラヒドロフラニル基等が挙げられる。 When Ra' 3 is combined with either Ra' 1 or Ra' 2 to form a ring, the cyclic group is preferably a 4- to 7-membered ring, more preferably a 4- to 6-membered ring. Specific examples of the cyclic group include a tetrahydropyranyl group, a tetrahydrofuranyl group, and the like.
 第3級アルキルエステル型酸解離性基:
 R02における第3級アルキルエステル型酸解離性基としては、例えば、下記一般式(a1-r-2)で表される酸解離性基が挙げられる。
Tertiary alkyl ester type acid dissociable group:
Examples of the tertiary alkyl ester type acid-dissociable group in R 02 include acid-dissociable groups represented by the following general formula (a1-r-2).
Figure JPOXMLDOC01-appb-C000014
[式中、Ra’~Ra’はそれぞれ炭化水素基であって、Ra’とRa’とは互いに結合して環を形成してもよい。*は、前記一般式(a0-1)におけるR02と結合する酸素原子との結合手を表す。]
Figure JPOXMLDOC01-appb-C000014
[In the formula, Ra' 4 to Ra' 6 are each a hydrocarbon group, and Ra' 5 and Ra' 6 may be bonded to each other to form a ring. * represents a bond with the oxygen atom bonded to R 02 in the general formula (a0-1). ]
 前記式(a1-r-2)中、Ra’の炭化水素基としては、直鎖状もしくは分岐鎖状のアルキル基、鎖状もしくは環状のアルケニル基、又は、環状の炭化水素基が挙げられる。
 Ra’における直鎖状もしくは分岐鎖状のアルキル基、環状の炭化水素基(単環式基である脂肪族炭化水素基、多環式基である脂肪族炭化水素基、芳香族炭化水素基)は、前記Ra’と同様のものが挙げられる。
 Ra’における鎖状もしくは環状のアルケニル基は、炭素原子数2~10のアルケニル基が好ましい。
 Ra’、Ra’の炭化水素基としては、前記Ra’と同様のものが挙げられる。
In the above formula (a1-r-2), the hydrocarbon group for Ra' 4 includes a linear or branched alkyl group, a chain or cyclic alkenyl group, or a cyclic hydrocarbon group. .
Straight chain or branched alkyl group, cyclic hydrocarbon group (monocyclic aliphatic hydrocarbon group, polycyclic aliphatic hydrocarbon group, aromatic hydrocarbon group) in Ra' 4 ) is the same as Ra' 3 above.
The chain or cyclic alkenyl group for Ra' 4 is preferably an alkenyl group having 2 to 10 carbon atoms.
Examples of the hydrocarbon groups for Ra' 5 and Ra' 6 include the same ones as for Ra' 3 above.
 Ra’とRa’とが互いに結合して環を形成する場合、下記一般式(a1-r2-1)で表される基、下記一般式(a1-r2-2)で表される基、下記一般式(a1-r2-3)で表される基が好適に挙げられる。
 一方、Ra’~Ra’が互いに結合せず、独立した炭化水素基である場合、下記一般式(a1-r2-4)で表される基が好適に挙げられる。
When Ra' 5 and Ra' 6 combine with each other to form a ring, a group represented by the following general formula (a1-r2-1), a group represented by the following general formula (a1-r2-2) , groups represented by the following general formula (a1-r2-3) are preferably mentioned.
On the other hand, when Ra' 4 to Ra' 6 do not bond to each other and are independent hydrocarbon groups, groups represented by the following general formula (a1-r2-4) are preferred.
Figure JPOXMLDOC01-appb-C000015
[式(a1-r2-1)中、Ra’10は、一部がハロゲン原子又はヘテロ原子含有基で置換されていてもよい直鎖状又は分岐鎖状の炭素原子数1~12のアルキル基を示す。Ra’11はRa’10が結合した炭素原子と共に脂肪族環式基を形成する基を示す。
 式(a1-r2-2)中、Yaは炭素原子である。Xaは、Yaと共に環状の炭化水素基を形成する基である。この環状の炭化水素基が有する水素原子の一部又は全部は置換されていてもよい。Ra101~Ra103は、それぞれ独立して、水素原子、炭素原子数1~10の1価の鎖状飽和炭化水素基又は炭素原子数3~20の1価の脂肪族環状飽和炭化水素基である。この鎖状飽和炭化水素基及び脂肪族環状飽和炭化水素基が有する水素原子の一部又は全部は置換されていてもよい。Ra101~Ra103の2つ以上が互いに結合して環状構造を形成していてもよい。
 式(a1-r2-3)中、Yaaは炭素原子である。Xaaは、Yaaと共に脂肪族環式基を形成する基である。Ra104は、置換基を有してもよい芳香族炭化水素基である。
 式(a1-r2-4)中、Ra’12及びRa’13は、それぞれ独立に、炭素原子数1~10の1価の鎖状飽和炭化水素基である。この鎖状飽和炭化水素基が有する水素原子の一部又は全部は置換されていてもよい。Ra’14は、置換基を有してもよい炭化水素基である。*は結合手を示す(以下、同様)。]
Figure JPOXMLDOC01-appb-C000015
[In formula (a1-r2-1), Ra' 10 is a linear or branched alkyl group having 1 to 12 carbon atoms, which may be partially substituted with a halogen atom or a heteroatom-containing group; shows. Ra' 11 represents a group forming an aliphatic cyclic group together with the carbon atom to which Ra' 10 is bonded.
In formula (a1-r2-2), Ya is a carbon atom. Xa is a group that forms a cyclic hydrocarbon group together with Ya. Some or all of the hydrogen atoms possessed by this cyclic hydrocarbon group may be substituted. Ra 101 to Ra 103 are each independently a hydrogen atom, a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, or a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms; be. Some or all of the hydrogen atoms possessed by the chain saturated hydrocarbon group and aliphatic cyclic saturated hydrocarbon group may be substituted. Two or more of Ra 101 to Ra 103 may be bonded to each other to form a cyclic structure.
In formula (a1-r2-3), Yaa is a carbon atom. Xaa is a group that forms an aliphatic cyclic group together with Yaa. Ra 104 is an aromatic hydrocarbon group which may have a substituent.
In formula (a1-r2-4), Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms. Some or all of the hydrogen atoms possessed by this chain saturated hydrocarbon group may be substituted. Ra' 14 is a hydrocarbon group which may have a substituent. * indicates a bond (the same applies hereinafter). ]
 上記の式(a1-r2-1)中、Ra’10は、一部がハロゲン原子もしくはヘテロ原子含有基で置換されていてもよい直鎖状もしくは分岐鎖状の炭素原子数1~12のアルキル基である。 In the above formula (a1-r2-1), Ra' 10 is a linear or branched alkyl group having 1 to 12 carbon atoms, which may be partially substituted with a halogen atom or a heteroatom-containing group. It is the basis.
 Ra’10における、直鎖状のアルキル基としては、炭素原子数1~12であり、炭素原子数1~10が好ましく、炭素原子数1~5がより好ましく、炭素原子数1~3がさらに好ましく、メチル基又はエチル基が特に好ましい。
 Ra’10における、分岐鎖状のアルキル基としては、前記Ra’と同様のものが挙げられる。
The linear alkyl group in Ra' 10 has 1 to 12 carbon atoms, preferably 1 to 10 carbon atoms, more preferably 1 to 5 carbon atoms, and further preferably 1 to 3 carbon atoms. Preferred are methyl and ethyl groups, particularly preferred.
Examples of the branched alkyl group in Ra' 10 include the same ones as in Ra' 3 above.
 Ra’10におけるアルキル基は、一部がハロゲン原子もしくはヘテロ原子含有基で置換されていてもよい。例えば、アルキル基を構成する水素原子の一部が、ハロゲン原子又はヘテロ原子含有基で置換されていてもよい。また、アルキル基を構成する炭素原子(メチレン基など)の一部が、ヘテロ原子含有基で置換されていてもよい。
 ここでいうヘテロ原子としては、酸素原子、硫黄原子、窒素原子が挙げられる。ヘテロ原子含有基としては、(-O-)、-C(=O)-O-、-O-C(=O)-、-C(=O)-、-O-C(=O)-O-、-C(=O)-NH-、-NH-、-S-、-S(=O)-、-S(=O)-O-等が挙げられる。
The alkyl group at Ra' 10 may be partially substituted with a halogen atom or a heteroatom-containing group. For example, some of the hydrogen atoms constituting the alkyl group may be substituted with a halogen atom or a heteroatom-containing group. Moreover, some of the carbon atoms (methylene group, etc.) constituting the alkyl group may be substituted with a heteroatom-containing group.
Examples of the heteroatom here include an oxygen atom, a sulfur atom, and a nitrogen atom. Examples of heteroatom-containing groups include (-O-), -C(=O)-O-, -O-C(=O)-, -C(=O)-, -O-C(=O)- Examples include O-, -C(=O)-NH-, -NH-, -S-, -S(=O) 2 -, -S(=O) 2 -O-, and the like.
 式(a1-r2-1)中、Ra’11(Ra’10が結合した炭素原子と共に形成する脂肪族環式基)は、式(a1-r-1)におけるRa’の単環式基又は多環式基である脂肪族炭化水素基(脂環式炭化水素基)として挙げた基、が好ましい。その中でも、単環式の脂環式炭化水素基が好ましく、具体的には、シクロペンチル基、シクロヘキシル基がより好ましい。あるいは、Ra’11(Ra’10が結合した炭素原子と共に形成する脂肪族環式基)は、不飽和でもよく、具体的には、シクロペンテニル基、シクロヘキセニル基が好ましい。
 Ra’11(Ra’10が結合した炭素原子と共に形成する脂肪族環式基)は、置換基を有してもよく、この置換基としては、例えば、ヨウ素原子、臭素原子、フッ素原子、アルコキシ基(メトキシ基、エトキシ基、プロポキシ基、ブトキシ基等)等が挙げられる。
In formula (a1-r2-1), Ra' 11 (the aliphatic cyclic group formed together with the carbon atom to which Ra' 10 is bonded) is the monocyclic group of Ra' 3 in formula (a1-r-1). Or the group mentioned as an aliphatic hydrocarbon group (alicyclic hydrocarbon group) which is a polycyclic group is preferable. Among these, monocyclic alicyclic hydrocarbon groups are preferred, and specifically, cyclopentyl groups and cyclohexyl groups are more preferred. Alternatively, Ra' 11 (the aliphatic cyclic group formed together with the carbon atom to which Ra' 10 is bonded) may be unsaturated, and specifically, a cyclopentenyl group and a cyclohexenyl group are preferable.
Ra' 11 (the aliphatic cyclic group formed with the carbon atom to which Ra' 10 is bonded) may have a substituent, such as an iodine atom, a bromine atom, a fluorine atom, an alkoxy Examples include groups (methoxy group, ethoxy group, propoxy group, butoxy group, etc.).
 前記式(a1-r2-1)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by the above formula (a1-r2-1) are listed below.
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000017
Figure JPOXMLDOC01-appb-C000017
Figure JPOXMLDOC01-appb-C000018
Figure JPOXMLDOC01-appb-C000018
 式(a1-r2-2)中、XaがYaと共に形成する環状の炭化水素基としては、前記式(a1-r-1)中のRa’における環状の1価の炭化水素基(脂肪族炭化水素基)から水素原子1個以上をさらに除いた基が挙げられる。
 XaがYaと共に形成する環状の炭化水素基は、置換基を有してもよい。この置換基としては、上記Ra’における環状の炭化水素基が有していてもよい置換基と同様のものが挙げられる。
 式(a1-r2-2)中、Ra101~Ra103における、炭素原子数1~10の1価の鎖状飽和炭化水素基としては、例えば、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、ヘプチル基、オクチル基、デシル基等が挙げられる。
 Ra101~Ra103における、炭素原子数3~20の1価の脂肪族環状飽和炭化水素基としては、例えば、シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロヘプチル基、シクロオクチル基、シクロデシル基、シクロドデシル基等の単環式脂肪族飽和炭化水素基;ビシクロ[2.2.2]オクタニル基、トリシクロ[5.2.1.02,6]デカニル基、トリシクロ[3.3.1.13,7]デカニル基、テトラシクロ[6.2.1.13,6.02,7]ドデカニル基、アダマンチル基等の多環式脂肪族飽和炭化水素基等が挙げられる。
 Ra101~Ra103は、中でも、合成容易性の観点から、水素原子、炭素原子数1~10の1価の鎖状飽和炭化水素基が好ましく、その中でも、水素原子、メチル基、エチル基がより好ましく、水素原子が特に好ましい。
In formula (a1-r2-2), the cyclic hydrocarbon group formed by Xa together with Ya is a cyclic monovalent hydrocarbon group (aliphatic Examples include groups obtained by further removing one or more hydrogen atoms from a hydrocarbon group.
The cyclic hydrocarbon group formed by Xa and Ya may have a substituent. Examples of this substituent include those similar to the substituents that the cyclic hydrocarbon group in Ra' 3 above may have.
In formula (a1-r2-2), the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms in Ra 101 to Ra 103 includes, for example, a methyl group, an ethyl group, a propyl group, a butyl group, Examples include pentyl group, hexyl group, heptyl group, octyl group, and decyl group.
Examples of the monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms in Ra 101 to Ra 103 include cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group, cycloheptyl group, cyclooctyl group, Monocyclic aliphatic saturated hydrocarbon groups such as cyclodecyl group and cyclododecyl group; bicyclo[2.2.2]octanyl group, tricyclo[5.2.1.02,6]decanyl group, tricyclo[3.3. 1.13,7]decanyl group, tetracyclo[6.2.1.13,6.02,7]dodecanyl group, and polycyclic aliphatic saturated hydrocarbon groups such as adamantyl group.
From the viewpoint of ease of synthesis, Ra 101 to Ra 103 are preferably a hydrogen atom or a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, and among these, a hydrogen atom, a methyl group, or an ethyl group is preferable. More preferred is a hydrogen atom, particularly preferred.
 上記Ra101~Ra103で表される鎖状飽和炭化水素基、又は脂肪族環状飽和炭化水素基が有する置換基としては、例えば、上述のRax5と同様の基が挙げられる。 Examples of the substituent of the chain saturated hydrocarbon group or aliphatic cyclic saturated hydrocarbon group represented by Ra 101 to Ra 103 include the same groups as Ra x5 described above.
 Ra101~Ra103の2つ以上が互いに結合して環状構造を形成することにより生じる炭素-炭素二重結合を含む基としては、例えば、シクロペンテニル基、シクロヘキセニル基、メチルシクロペンテニル基、メチルシクロヘキセニル基、シクロペンチリデンエテニル基、シクロへキシリデンエテニル基等が挙げられる。これらの中でも、合成容易性の観点から、シクロペンテニル基、シクロヘキセニル基、シクロペンチリデンエテニル基が好ましい。 Groups containing a carbon-carbon double bond formed by two or more of Ra 101 to Ra 103 bonding to each other to form a cyclic structure include, for example, a cyclopentenyl group, a cyclohexenyl group, a methylcyclopentenyl group, a methyl Examples include a cyclohexenyl group, a cyclopentylideneethenyl group, and a cyclohexylideneethenyl group. Among these, a cyclopentenyl group, a cyclohexenyl group, and a cyclopentylideneethenyl group are preferred from the viewpoint of ease of synthesis.
 前記式(a1-r2-2)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by the above formula (a1-r2-2) are listed below.
Figure JPOXMLDOC01-appb-C000019
Figure JPOXMLDOC01-appb-C000019
Figure JPOXMLDOC01-appb-C000020
Figure JPOXMLDOC01-appb-C000020
Figure JPOXMLDOC01-appb-C000021
Figure JPOXMLDOC01-appb-C000021
 式(a1-r2-3)中、XaaがYaaと共に形成する脂肪族環式基は、式(a1-r-1)におけるRa’の単環式基又は多環式基である脂肪族炭化水素基として挙げた基が好ましい。
 式(a1-r2-3)中、Ra104における芳香族炭化水素基としては、炭素原子数5~30の芳香族炭化水素環から水素原子1個以上を除いた基が挙げられる。中でも、Ra104は、炭素原子数6~15の芳香族炭化水素環から水素原子1個以上を除いた基が好ましく、ベンゼン、ナフタレン、アントラセン又はフェナントレンから水素原子1個以上を除いた基がより好ましく、ベンゼン、ナフタレン又はアントラセンから水素原子1個以上を除いた基がさらに好ましく、ベンゼン又はナフタレンから水素原子1個以上を除いた基が特に好ましく、ベンゼンから水素原子1個以上を除いた基が最も好ましい。
In formula (a1-r2-3), the aliphatic cyclic group formed by Xaa together with Yaa is a carbonized aliphatic group that is a monocyclic group or polycyclic group of Ra' 3 in formula (a1-r-1). The groups listed as hydrogen groups are preferred.
In formula (a1-r2-3), the aromatic hydrocarbon group for Ra 104 includes a group obtained by removing one or more hydrogen atoms from an aromatic hydrocarbon ring having 5 to 30 carbon atoms. Among these, Ra 104 is preferably a group in which one or more hydrogen atoms are removed from an aromatic hydrocarbon ring having 6 to 15 carbon atoms, and more preferably a group in which one or more hydrogen atoms are removed from benzene, naphthalene, anthracene, or phenanthrene. Preferably, a group obtained by removing one or more hydrogen atoms from benzene, naphthalene or anthracene is more preferable, a group obtained by removing one or more hydrogen atoms from benzene or naphthalene is particularly preferable, and a group obtained by removing one or more hydrogen atoms from benzene is more preferable. Most preferred.
 式(a1-r2-3)中のRa104が有していてもよい置換基としては、例えば、メチル基、エチル基、プロピル基、ヒドロキシ基、カルボキシ基、ハロゲン原子、アルコキシ基(メトキシ基、エトキシ基、プロポキシ基、ブトキシ基等)、アルキルオキシカルボニル基等が挙げられる。 Examples of substituents that Ra 104 in formula (a1-r2-3) may have include methyl group, ethyl group, propyl group, hydroxy group, carboxy group, halogen atom, alkoxy group (methoxy group, (ethoxy group, propoxy group, butoxy group, etc.), alkyloxycarbonyl group, etc.
 前記式(a1-r2-3)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by the above formula (a1-r2-3) are listed below.
Figure JPOXMLDOC01-appb-C000022
Figure JPOXMLDOC01-appb-C000022
 式(a1-r2-4)中、Ra’12及びRa’13は、それぞれ独立に、炭素原子数1~10の1価の鎖状飽和炭化水素基である。Ra’12及びRa’13における、炭素原子数1~10の1価の鎖状飽和炭化水素基としては、上記のRa101~Ra103における、炭素原子数1~10の1価の鎖状飽和炭化水素基と同様のものが挙げられる。この鎖状飽和炭化水素基が有する水素原子の一部又は全部は置換されていてもよい。
 Ra’12及びRa’13は、中でも、炭素原子数1~5のアルキル基が好ましく、炭素原子数1~5のアルキル基がより好ましく、メチル基、エチル基がさらに好ましく、メチル基が特に好ましい。
 上記Ra’12及びRa’13で表される鎖状飽和炭化水素基が置換されている場合、その置換基としては、例えば、上述のRax5と同様の基が挙げられる。
In formula (a1-r2-4), Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms. As the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms in Ra' 12 and Ra' 13 , the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms in the above Ra 101 to Ra 103 can be used. Examples include those similar to hydrocarbon groups. Some or all of the hydrogen atoms possessed by this chain saturated hydrocarbon group may be substituted.
Among them, Ra' 12 and Ra' 13 are preferably an alkyl group having 1 to 5 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, further preferably a methyl group or an ethyl group, and particularly preferably a methyl group. .
When the chain saturated hydrocarbon group represented by Ra' 12 and Ra' 13 is substituted, examples of the substituent include the same groups as Ra x5 described above.
 式(a1-r2-4)中、Ra’14は、置換基を有してもよい炭化水素基である。Ra’14における炭化水素基としては、直鎖状もしくは分岐鎖状のアルキル基、又は環状の炭化水素基が挙げられる。 In formula (a1-r2-4), Ra' 14 is a hydrocarbon group that may have a substituent. The hydrocarbon group for Ra' 14 includes a linear or branched alkyl group, or a cyclic hydrocarbon group.
 Ra’14における直鎖状のアルキル基は、炭素原子数が1~5であることが好ましく、1~4がより好ましく、1又は2がさらに好ましい。具体的には、メチル基、エチル基、n-プロピル基、n-ブチル基、n-ペンチル基等が挙げられる。これらの中でも、メチル基、エチル基又はn-ブチル基が好ましく、メチル基又はエチル基がより好ましい。 The linear alkyl group in Ra' 14 preferably has 1 to 5 carbon atoms, more preferably 1 to 4 carbon atoms, and even more preferably 1 or 2 carbon atoms. Specific examples include methyl group, ethyl group, n-propyl group, n-butyl group, n-pentyl group, and the like. Among these, methyl group, ethyl group or n-butyl group are preferred, and methyl group or ethyl group is more preferred.
 Ra’14における分岐鎖状のアルキル基は、炭素原子数が3~10であることが好ましく、3~5がより好ましい。具体的には、イソプロピル基、イソブチル基、tert-ブチル基、イソペンチル基、ネオペンチル基、1,1-ジエチルプロピル基、2,2-ジメチルブチル基等が挙げられ、イソプロピル基であることが好ましい。 The branched alkyl group in Ra' 14 preferably has 3 to 10 carbon atoms, more preferably 3 to 5 carbon atoms. Specific examples include isopropyl group, isobutyl group, tert-butyl group, isopentyl group, neopentyl group, 1,1-diethylpropyl group, 2,2-dimethylbutyl group, and isopropyl group is preferred.
 Ra’14が環状の炭化水素基となる場合、該炭化水素基は、脂肪族炭化水素基でも芳香族炭化水素基でもよく、また、多環式基でも単環式基でもよい。
 単環式基である脂肪族炭化水素基としては、モノシクロアルカンから1個の水素原子を除いた基が好ましい。該モノシクロアルカンとしては、炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。
 多環式基である脂肪族炭化水素基としては、ポリシクロアルカンから1個の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては、炭素原子数7~12のものが好ましく、具体的にはアダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等が挙げられる。
When Ra' 14 is a cyclic hydrocarbon group, the hydrocarbon group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group, and may be a polycyclic group or a monocyclic group.
As the aliphatic hydrocarbon group which is a monocyclic group, a group obtained by removing one hydrogen atom from a monocycloalkane is preferable. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane.
The aliphatic hydrocarbon group which is a polycyclic group is preferably a group obtained by removing one hydrogen atom from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms. Examples include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
 Ra’14における芳香族炭化水素基としては、Ra104における芳香族炭化水素基と同様のものが挙げられる。中でも、Ra’14は、炭素原子数6~15の芳香族炭化水素環から水素原子1個以上を除いた基が好ましく、ベンゼン、ナフタレン、アントラセン又はフェナントレンから水素原子1個以上を除いた基がより好ましく、ベンゼン、ナフタレン又はアントラセンから水素原子1個以上を除いた基がさらに好ましく、ベンゼン又はナフタレンから水素原子1個以上を除いた基が特に好ましく、ベンゼンから水素原子1個以上を除いた基が最も好ましい。
 Ra’14が有していてもよい置換基としては、Ra104が有していてもよい置換基と同様のものが挙げられる。Ra’14が有していてもよい置換基として、好ましくは、メチル基、エチル基、プロピル基、ヨウ素原子、臭素原子、フッ素原子、アルコキシ基(メトキシ基、エトキシ基、プロポキシ基、ブトキシ基等)等が挙げられる。
Examples of the aromatic hydrocarbon group in Ra' 14 include those similar to the aromatic hydrocarbon group in Ra 104 . Among these, Ra' 14 is preferably a group obtained by removing one or more hydrogen atoms from an aromatic hydrocarbon ring having 6 to 15 carbon atoms, and a group obtained by removing one or more hydrogen atoms from benzene, naphthalene, anthracene, or phenanthrene. More preferably, a group obtained by removing one or more hydrogen atoms from benzene, naphthalene or anthracene is even more preferable, a group obtained by removing one or more hydrogen atoms from benzene or naphthalene is particularly preferable, a group obtained by removing one or more hydrogen atoms from benzene is most preferred.
Examples of the substituents that Ra' 14 may have include the same substituents as those that Ra 104 may have. The substituent that Ra' 14 may have is preferably a methyl group, ethyl group, propyl group, iodine atom, bromine atom, fluorine atom, alkoxy group (methoxy group, ethoxy group, propoxy group, butoxy group, etc.) ) etc.
 前記式(a1-r2-4)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by the above formula (a1-r2-4) are listed below.
Figure JPOXMLDOC01-appb-C000023
Figure JPOXMLDOC01-appb-C000023
 第2級アルキルエステル型酸解離性基:
 R02における第2級アルキルエステル型酸解離性基としては、例えば、下記一般式(a1-r-4)で表される酸解離性基が挙げられる。
Secondary alkyl ester type acid dissociable group:
Examples of the secondary alkyl ester type acid-dissociable group in R 02 include acid-dissociable groups represented by the following general formula (a1-r-4).
Figure JPOXMLDOC01-appb-C000024
[式中、Ra’10は、炭化水素基である。Ra’11a及びRa’11bは、それぞれ独立に、水素原子、ハロゲン原子又はアルキル基である。Ra’12は、水素原子又は炭化水素基である。Ra’10と、Ra’11a又はRa’11bとは、互いに結合して環を形成してもよい。Ra’11a又はRa’11bと、Ra’12とは、互いに結合して環を形成してもよい。*は、前記一般式(a0-1)におけるR02と結合する酸素原子との結合手を表す。]
Figure JPOXMLDOC01-appb-C000024
[In the formula, Ra' 10 is a hydrocarbon group. Ra' 11a and Ra' 11b are each independently a hydrogen atom, a halogen atom, or an alkyl group. Ra' 12 is a hydrogen atom or a hydrocarbon group. Ra' 10 and Ra' 11a or Ra' 11b may be bonded to each other to form a ring. Ra' 11a or Ra' 11b and Ra' 12 may be bonded to each other to form a ring. * represents a bond with the oxygen atom bonded to R 02 in the general formula (a0-1). ]
 前記式(a1-r-4)中、Ra’10及びRa’12における炭化水素基としては、前記Ra’と同様のものが挙げられる。
 式中、Ra’11a及びRa’11bにおけるアルキル基としては、前記Ra’におけるアルキル基と同様のものが挙げられる。該アルキル基としては、炭素原子数1~5のアルキル基が好ましい。具体的には、直鎖状または分岐鎖状のアルキル基が好ましく挙げられる。より具体的には、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基などが挙げられ、メチル基またはエチル基がより好ましく、メチル基が特に好ましい。
 式中、Ra’10及びRa’12における炭化水素基、並びに、Ra’11a及びRa’11bにおけるアルキル基は置換基を有してもよい。この置換基としては、例えば、上述したRax5等が挙げられる。
In the above formula (a1-r-4), examples of the hydrocarbon groups at Ra' 10 and Ra' 12 include those similar to those for Ra' 3 above.
In the formula, the alkyl groups for Ra' 11a and Ra' 11b include the same alkyl groups as for Ra' 1 above. The alkyl group is preferably an alkyl group having 1 to 5 carbon atoms. Specifically, linear or branched alkyl groups are preferably mentioned. More specifically, examples include methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, isobutyl group, tert-butyl group, pentyl group, isopentyl group, neopentyl group, etc. More preferred, and methyl group is particularly preferred.
In the formula, the hydrocarbon group at Ra' 10 and Ra' 12 and the alkyl group at Ra' 11a and Ra' 11b may have a substituent. Examples of this substituent include the above-mentioned Ra x5 .
 Ra’10とRa’11a又はRa’11bとは、互いに結合して環を形成してもよい。該環は、多環であっても、単環であってもよく、脂環であっても、芳香環であってもよい。
 該脂環及び芳香環は、ヘテロ原子を含むものでもよい。
Ra' 10 and Ra' 11a or Ra' 11b may be bonded to each other to form a ring. The ring may be polycyclic, monocyclic, alicyclic, or aromatic.
The alicyclic ring and aromatic ring may contain a heteroatom.
 Ra’10とRa’11a又はRa’11bとが、互いに結合して形成する環としては、上記の中でも、モノシクロアルケン、モノシクロアルケンの炭素原子の一部がヘテロ原子(酸素原子、硫黄原子等)で置換された環、モノシクロアルカジエンが好ましく、炭素原子数3~6のシクロアルケンが好ましく、シクロペンテン又はシクロヘキセンが好ましい。 The ring formed by bonding Ra' 10 and Ra' 11a or Ra' 11b to each other is a monocycloalkene, a monocycloalkene in which some of the carbon atoms are heteroatoms (oxygen atom, sulfur atom, etc.). etc.), monocycloalkadienes are preferred, cycloalkenes having 3 to 6 carbon atoms are preferred, and cyclopentene or cyclohexene is preferred.
 Ra’10とRa’11a又はRa’11bとが、互いに結合して形成する環は、縮合環であってもよい。該縮合環として、具体的には、インダン等が挙げられる。 The ring formed by bonding Ra' 10 and Ra' 11a or Ra' 11b to each other may be a fused ring. Specific examples of the condensed ring include indane and the like.
 Ra’10とRa’11a又はRa’11bとが、互いに結合して形成する環は、置換基を有してもよい。この置換基としては、例えば、上述したRax5等が挙げられる。 The ring formed by bonding Ra' 10 and Ra' 11a or Ra' 11b to each other may have a substituent. Examples of this substituent include the above-mentioned Ra x5 .
 Ra’11a又はRa’11bと、Ra’12とは、互いに結合して環を形成してもよく、該環としては、Ra’10とRa’11a又はRa’11bとが、互いに結合して形成する環と同様のものが挙げられる。 Ra' 11a or Ra' 11b and Ra' 12 may be bonded to each other to form a ring, and as the ring, Ra' 10 and Ra' 11a or Ra' 11b may be bonded to each other to form a ring. Examples include those similar to the rings that are formed.
 前記式(a1-r-4)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by the above formula (a1-r-4) are listed below.
Figure JPOXMLDOC01-appb-C000025
Figure JPOXMLDOC01-appb-C000025
 上記の中でも、R02における酸解離性基としては、第3級アルキルエステル型酸解離性基、第2級アルキルエステル型酸解離性基が好ましく、上記の一般式(a1-r2-1)で表される基、一般式(a1-r2-2)で表される基、一般式(a1-r2-4)で表される基、一般式(a1-r-4)で表される酸解離性基がより好ましく、一般式(a1-r2-1)で表される基がさらに好ましい。 Among the above, as the acid dissociable group in R 02 , a tertiary alkyl ester type acid dissociable group and a secondary alkyl ester type acid dissociable group are preferable, and the acid dissociable group in the above general formula (a1-r2-1) is preferable. group represented by general formula (a1-r2-2), group represented by general formula (a1-r2-4), acid dissociation represented by general formula (a1-r-4) A group represented by the general formula (a1-r2-1) is even more preferable.
 前記式(a0-1)中、Y00は、2価の連結基又は単結合である。
 Y00における2価の連結基としては、前記R01における2価の連結基と同様のものが挙げられる。そのなかでも、Y00における2価の連結基としては、ヘテロ原子を含む2価の連結基が好ましく、(主鎖側)-Y21-O-(R00側)がより好ましい。
 このY21としては、直鎖状の脂肪族炭化水素基が好ましく、直鎖状のアルキレン基がより好ましく、炭素原子数1~5の直鎖状のアルキレン基がさらに好ましく、メチレン基またはエチレン基が特に好ましい。
 Y00としては、2価の連結基が好ましく、ヘテロ原子を含む2価の連結基であることがより好ましい。
In the formula (a0-1), Y 00 is a divalent linking group or a single bond.
Examples of the divalent linking group in Y 00 include those similar to the divalent linking group in R 01 above. Among these, the divalent linking group in Y 00 is preferably a divalent linking group containing a hetero atom, and (main chain side) -Y 21 -O- (R 00 side) is more preferable.
This Y 21 is preferably a linear aliphatic hydrocarbon group, more preferably a linear alkylene group, even more preferably a linear alkylene group having 1 to 5 carbon atoms, and a methylene group or an ethylene group. is particularly preferred.
Y 00 is preferably a divalent linking group, more preferably a divalent linking group containing a hetero atom.
 前記式(a0-1)中、R00は、置換基を有してもよい芳香族炭化水素基である。
 R00における芳香族炭化水素基は、芳香環を少なくとも1つ有する炭化水素基である。この芳香環は、4n+2個のπ電子をもつ環状共役系であれば特に限定されず、単環式でもよいし、多環式でもよい。芳香環の炭素原子数は5~30であることが好ましく、炭素原子数5~20がより好ましく、炭素原子数6~15がさらに好ましく、炭素原子数6~12が特に好ましい。ただし、該炭素原子数には、置換基における炭素原子数を含まないものとする。
 芳香環として具体的には、ベンゼン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環が挙げられる。
In the formula (a0-1), R 00 is an aromatic hydrocarbon group which may have a substituent.
The aromatic hydrocarbon group in R 00 is a hydrocarbon group having at least one aromatic ring. This aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and may be monocyclic or polycyclic. The aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, even more preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms. However, the number of carbon atoms does not include the number of carbon atoms in the substituents.
Specific examples of the aromatic ring include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene.
 R00における芳香族炭化水素基として具体的には、芳香族炭化水素環から水素原子を2つ除いた基(アリーレン基);2以上の芳香族炭化水素環を含む芳香族化合物(例えばビフェニル、フルオレン等)から水素原子を2つ除いた基等が挙げられる。 Specifically, the aromatic hydrocarbon group in R 00 includes a group obtained by removing two hydrogen atoms from an aromatic hydrocarbon ring (arylene group); an aromatic compound containing two or more aromatic hydrocarbon rings (for example, biphenyl, Examples include groups obtained by removing two hydrogen atoms from (such as fluorene).
 前記芳香族炭化水素基は、置換基を有してもよく、置換基を有しなくてもよい。ここでの置換基は、芳香族炭化水素基が有する水素原子を置換する置換基である。例えば、前記芳香族炭化水素基中の芳香族炭化水素環に結合した水素原子が置換基で置換されていてもよい。該置換基としては、例えば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基等が挙げられる。
 前記置換基としてのアルキル基としては、炭素原子数1~5のアルキル基が好ましく、メチル基、エチル基、プロピル基、n-ブチル基、tert-ブチル基であることがより好ましい。
 前記置換基としてのアルコキシ基としては、炭素原子数1~5のアルコキシ基が好ましく、メトキシ基、エトキシ基、n-プロポキシ基、iso-プロポキシ基、n-ブトキシ基、tert-ブトキシ基がより好ましく、メトキシ基、エトキシ基がさらに好ましい。
 前記置換基としてのハロゲン原子としては、ヨウ素原子、臭素原子、フッ素原子が好ましい。
 前記置換基としてのハロゲン化アルキル基としては、前記アルキル基の水素原子の一部または全部が前記ハロゲン原子で置換された基が挙げられる。
The aromatic hydrocarbon group may or may not have a substituent. The substituent here is a substituent that substitutes a hydrogen atom possessed by an aromatic hydrocarbon group. For example, the hydrogen atom bonded to the aromatic hydrocarbon ring in the aromatic hydrocarbon group may be substituted with a substituent. Examples of the substituent include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, and a hydroxyl group.
The alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and more preferably a methyl group, ethyl group, propyl group, n-butyl group, or tert-butyl group.
The alkoxy group as the substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, ethoxy group, n-propoxy group, iso-propoxy group, n-butoxy group, or tert-butoxy group. , methoxy group, and ethoxy group are more preferred.
The halogen atom as the substituent is preferably an iodine atom, a bromine atom, or a fluorine atom.
Examples of the halogenated alkyl group as the substituent include groups in which some or all of the hydrogen atoms of the alkyl group are substituted with the halogen atoms.
 上記のなかでも、前記一般式(a0-1)におけるR00は、高感度化とリソグラフィー特性との両立の観点から、置換基を有する芳香族炭化水素基であることが好ましい。
 R00における芳香族炭化水素基が有する置換基としては、高感度化の観点から、ハロゲン原子、アルキル基及びアルコキシ基からなる群より選択される一種以上であることが好ましく、そのなかでもハロゲン原子であることがより好ましく、ヨウ素原子、臭素原子及びフッ素原子からなる群より選択される一種以上であることがさらに好ましく、ヨウ素原子であることが特に好ましい。
Among the above, R 00 in the general formula (a0-1) is preferably an aromatic hydrocarbon group having a substituent from the viewpoint of achieving both high sensitivity and lithography properties.
The substituent of the aromatic hydrocarbon group in R 00 is preferably one or more selected from the group consisting of a halogen atom, an alkyl group, and an alkoxy group, from the viewpoint of high sensitivity, and among these, a halogen atom More preferably, it is one or more selected from the group consisting of an iodine atom, a bromine atom, and a fluorine atom, and an iodine atom is particularly preferable.
 上記のなかでも、前記一般式(a0-1)におけるR00は、下記一般式(R00-1)で表される基であることが好ましい。 Among the above, R 00 in the general formula (a0-1) is preferably a group represented by the following general formula (R 00 -1).
Figure JPOXMLDOC01-appb-C000026
[式中、Ra1及びRa2は、それぞれ独立に、ハロゲン原子、アルキル基又はアルコキシ基である。m0は、0以上2以下の整数である。0≦n1≦m0×2+2である。0≦n2≦4である。0≦n1+n2≦m0×2+4である。*11及び*12のいずれか一方は、前記一般式(a0-1)におけるY00との結合手を表す。*21及び*22のいずれか一方は、前記一般式(a0-1)におけるY01との結合手を表す。]
Figure JPOXMLDOC01-appb-C000026
[In the formula, R a1 and R a2 each independently represent a halogen atom, an alkyl group, or an alkoxy group. m0 is an integer from 0 to 2. 0≦n1≦m0×2+2. 0≦n2≦4. 0≦n1+n2≦m0×2+4. Either *11 or *12 represents a bond with Y 00 in the general formula (a0-1). Either *21 or *22 represents a bond with Y 01 in the general formula (a0-1). ]
 前記式(R00-1)中、Ra1及びRa2は、それぞれ独立に、ハロゲン原子、アルキル基又はアルコキシ基である。
 Ra1及びRa2におけるハロゲン原子、アルキル基、アルコキシ基は、上述したR00における芳香族炭化水素基が有する置換基についての説明の中で例示したハロゲン原子、アルキル基、アルコキシ基と同様であり、ハロゲン原子であることが好ましい。
 前記式(R00-1)中、m0は、好ましくは0又は1であり、より好ましくは0である。
 前記式(R00-1)中、n2は、好ましくは1又は2であり、より好ましくは2である。
In the formula (R 00 -1), R a1 and R a2 each independently represent a halogen atom, an alkyl group, or an alkoxy group.
The halogen atom, alkyl group, and alkoxy group in R a1 and R a2 are the same as the halogen atom, alkyl group, and alkoxy group exemplified in the explanation of the substituent of the aromatic hydrocarbon group in R 00 mentioned above. , preferably a halogen atom.
In the formula (R 00 -1), m0 is preferably 0 or 1, more preferably 0.
In the formula (R 00 -1), n2 is preferably 1 or 2, more preferably 2.
 前記式(a0-1)中、Y01は、酸素原子を含む2価の連結基又は単結合である。
 Y01が酸素原子を含む2価の連結基である場合、Y01は、酸素原子以外の原子を含有してもよい。酸素原子以外の原子としては、例えば炭素原子、水素原子、硫黄原子、窒素原子等が挙げられる。
 酸素原子を含む2価の連結基としては、例えば、酸素原子(エーテル結合:-O-)、エステル結合(-C(=O)-O-)、オキシカルボニル基(-O-C(=O)-)、アミド結合(-C(=O)-NH-)、カルボニル基(-C(=O)-)、カーボネート結合(-O-C(=O)-O-)等の非炭化水素系の酸素原子含有連結基;該非炭化水素系の酸素原子含有連結基とアルキレン基との組み合わせ等が挙げられる。この組み合わせに、さらにスルホニル基(-SO-)が連結されていてもよい。
 かかる酸素原子を含む2価の連結基としては、例えば、下記一般式(y-al-1)~(y-al-8)でそれぞれ表される連結基が挙げられる。
 なお、下記一般式(y-al-1)~(y-al-8)において、上記式(a0-1)中のR00と結合するのは、下記一般式(y-al-1)~(y-al-8)中のV’101である。
In the formula (a0-1), Y 01 is a divalent linking group or a single bond containing an oxygen atom.
When Y 01 is a divalent linking group containing an oxygen atom, Y 01 may contain atoms other than the oxygen atom. Examples of atoms other than oxygen atoms include carbon atoms, hydrogen atoms, sulfur atoms, and nitrogen atoms.
Examples of divalent linking groups containing an oxygen atom include an oxygen atom (ether bond: -O-), an ester bond (-C(=O)-O-), and an oxycarbonyl group (-O-C(=O-). )-), amide bond (-C(=O)-NH-), carbonyl group (-C(=O)-), carbonate bond (-O-C(=O)-O-), etc. Oxygen atom-containing connecting group; a combination of the non-hydrocarbon oxygen atom-containing connecting group and an alkylene group, and the like. A sulfonyl group (-SO 2 -) may be further linked to this combination.
Examples of such divalent linking groups containing an oxygen atom include linking groups represented by the following general formulas (y-al-1) to (y-al-8), respectively.
In addition, in the following general formulas (y-al-1) to (y-al-8), the bond to R 00 in the above formula (a0-1) is the following general formula (y-al-1) to It is V' 101 in (y-al-8).
Figure JPOXMLDOC01-appb-C000027
[式中、V’101は、炭素原子数1~5のアルキレン基又は単結合であり、V’102は、炭素原子数1~30の2価の飽和炭化水素基又は単結合である。]
Figure JPOXMLDOC01-appb-C000027
[In the formula, V' 101 is an alkylene group having 1 to 5 carbon atoms or a single bond, and V' 102 is a divalent saturated hydrocarbon group having 1 to 30 carbon atoms or a single bond. ]
 V’102における2価の飽和炭化水素基は、炭素原子数1~30のアルキレン基であることが好ましく、炭素原子数1~10のアルキレン基であることがより好ましく、炭素原子数1~5のアルキレン基であることがさらに好ましい。 The divalent saturated hydrocarbon group in V' 102 is preferably an alkylene group having 1 to 30 carbon atoms, more preferably an alkylene group having 1 to 10 carbon atoms, and preferably an alkylene group having 1 to 5 carbon atoms. More preferably, it is an alkylene group.
 V’101およびV’102におけるアルキレン基としては、直鎖状のアルキレン基でもよく分岐鎖状のアルキレン基でもよく、直鎖状のアルキレン基が好ましい。
 V’101およびV’102におけるアルキレン基として、具体的には、メチレン基[-CH-];-CH(CH)-、-CH(CHCH)-、-C(CH-、-C(CH)(CHCH)-、-C(CH)(CHCHCH)-、-C(CHCH-等のアルキルメチレン基;エチレン基[-CHCH-];-CH(CH)CH-、-CH(CH)CH(CH)-、-C(CHCH-、-CH(CHCH)CH-等のアルキルエチレン基;トリメチレン基(n-プロピレン基)[-CHCHCH-];-CH(CH)CHCH-、-CHCH(CH)CH-等のアルキルトリメチレン基;テトラメチレン基[-CHCHCHCH-];-CH(CH)CHCHCH-、-CHCH(CH)CHCH-等のアルキルテトラメチレン基;ペンタメチレン基[-CHCHCHCHCH-]等が挙げられる。
 また、V’101又はV’102における前記アルキレン基における一部のメチレン基が、炭素原子数5~10の2価の脂肪族環式基で置換されていてもよい。当該脂肪族環式基は、環状の脂肪族炭化水素基(単環式の脂肪族炭化水素基、多環式の脂肪族炭化水素基)から水素原子をさらに1つ除いた2価の基が好ましく、シクロへキシレン基、1,5-アダマンチレン基または2,6-アダマンチレン基がより好ましい。
The alkylene group in V' 101 and V' 102 may be a linear alkylene group or a branched alkylene group, with a linear alkylene group being preferred.
Specifically, the alkylene group in V' 101 and V' 102 is a methylene group [-CH 2 -]; -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 -, etc. alkylmethylene groups; ethylene; Group [-CH 2 CH 2 -]; -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 ) Alkylethylene group such as CH 2 -; trimethylene group (n-propylene group) [-CH 2 CH 2 CH 2 -]; -CH (CH 3 ) CH 2 CH 2 -, -CH 2 CH (CH 3 ) Alkyltrimethylene group such as CH 2 -; tetramethylene group [-CH 2 CH 2 CH 2 CH 2 -]; -CH (CH 3 ) CH 2 CH 2 CH 2 -, -CH 2 CH (CH 3 ) CH 2 Examples include alkyltetramethylene groups such as CH 2 -; pentamethylene groups [-CH 2 CH 2 CH 2 CH 2 CH 2 -], and the like.
Further, a part of the methylene group in the alkylene group in V' 101 or V' 102 may be substituted with a divalent aliphatic cyclic group having 5 to 10 carbon atoms. The aliphatic cyclic group is a divalent group obtained by removing one hydrogen atom from a cyclic aliphatic hydrocarbon group (monocyclic aliphatic hydrocarbon group, polycyclic aliphatic hydrocarbon group). Preferably, a cyclohexylene group, a 1,5-adamantylene group, or a 2,6-adamantylene group is more preferable.
 Y01としては、エステル結合を含む2価の連結基、またはエーテル結合を含む2価の連結基が好ましく、上記式(y-al-1)~(y-al-6)でそれぞれ表される連結基がより好ましく、上記の式(y-al-1)、式(y-al-3)、式(y-al-6)でそれぞれ表される連結基がさらに好ましい。 Y 01 is preferably a divalent linking group containing an ester bond or a divalent linking group containing an ether bond, each represented by the above formulas (y-al-1) to (y-al-6). A linking group is more preferred, and a linking group represented by the above formula (y-al-1), formula (y-al-3), or formula (y-al-6) is even more preferred.
 前記式(a0-1)中、V01は、単結合、アルキレン基又はフッ素化アルキレン基である。V01におけるアルキレン基、フッ素化アルキレン基は、炭素原子数1~4であることが好ましい。V01におけるフッ素化アルキレン基としては、V01におけるアルキレン基の水素原子の一部又は全部がフッ素原子で置換された基が挙げられる。
 なかでも、V01は、炭素原子数1~4の直鎖状アルキレン基、炭素原子数1~4の直鎖状フッ素化アルキレン基又は単結合であることが好ましく、メチレン基(-CH-)、エチレン基(-CHCH-)、炭素原子数1~3の直鎖状フッ素化アルキレン基であることがより好ましい。
 但し、前記式(a0-1)中、Y01及びV01は、同時に単結合になることはない。
In the formula (a0-1), V 01 is a single bond, an alkylene group, or a fluorinated alkylene group. The alkylene group and fluorinated alkylene group in V 01 preferably have 1 to 4 carbon atoms. Examples of the fluorinated alkylene group in V 01 include groups in which some or all of the hydrogen atoms of the alkylene group in V 01 are substituted with fluorine atoms.
Among these, V 01 is preferably a linear alkylene group having 1 to 4 carbon atoms, a linear fluorinated alkylene group having 1 to 4 carbon atoms, or a single bond, and is preferably a methylene group (-CH 2 - ), an ethylene group (-CH 2 CH 2 -), and a linear fluorinated alkylene group having 1 to 3 carbon atoms are more preferable.
However, in the formula (a0-1), Y 01 and V 01 do not form a single bond at the same time.
 前記式(a0-1)中、R03は、フッ素原子又はフッ素化アルキル基であることが好ましく、フッ素原子、炭素原子数1~5のフッ素化アルキル基であることがより好ましく、フッ素原子であることがさらに好ましい。 In the formula (a0-1), R 03 is preferably a fluorine atom or a fluorinated alkyl group, more preferably a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms, and R 03 is a fluorine atom or a fluorinated alkyl group. It is even more preferable that there be.
 以下に、構成単位(a0)のアニオン部の好ましい具体例を示す。 Preferred specific examples of the anion moiety of the structural unit (a0) are shown below.
Figure JPOXMLDOC01-appb-C000028
Figure JPOXMLDOC01-appb-C000028
Figure JPOXMLDOC01-appb-C000029
Figure JPOXMLDOC01-appb-C000029
Figure JPOXMLDOC01-appb-C000030
Figure JPOXMLDOC01-appb-C000030
 構成単位(a0)のアニオン部は、前記式(a0-an-1)~(a0-an-12)のいずれかで表されるアニオンが好ましく、前記の式(a0-an-1)~(a0-an-5)、式(a0-an-9)~(a0-an-11)のいずれかで表されるアニオンがより好ましい。 The anion moiety of the structural unit (a0) is preferably an anion represented by any of the formulas (a0-an-1) to (a0-an-12), and is preferably an anion represented by any of the formulas (a0-an-1) to (a0-an-1) to (a0-an-1) to (a0-an-1). a0-an-5) and an anion represented by any one of formulas (a0-an-9) to (a0-an-11) are more preferred.
 前記式(a0-1)中、Mm+は、m価のオニウムカチオンであり、mは1以上の整数である。Mm+におけるオニウムカチオンとしては、スルホニウムカチオン、ヨードニウムカチオンが好ましい。
 好ましいカチオン部((Mm+1/m)としては、下記の一般式(ca-1)~(ca-3)でそれぞれ表されるオニウムカチオンが挙げられる。
In the formula (a0-1), M m+ is an m-valent onium cation, and m is an integer of 1 or more. The onium cation in M m+ is preferably a sulfonium cation or an iodonium cation.
Preferred cation moieties ((M m+ ) 1/m ) include onium cations represented by the following general formulas (ca-1) to (ca-3), respectively.
Figure JPOXMLDOC01-appb-C000031
[式中、R201~R207は、それぞれ独立に置換基を有してもよいアリール基、アルキル基またはアルケニル基を表す。R201~R203、R206~R207は、相互に結合して式中のイオウ原子と共に環を形成してもよい。R208~R209は、それぞれ独立に水素原子または炭素原子数1~5のアルキル基を表す。R210は、置換基を有してもよいアリール基、置換基を有してもよいアルキル基、置換基を有してもよいアルケニル基、又は置換基を有してもよい-SO-含有環式基である。L201は、-C(=O)-または-C(=O)-O-を表す。]
Figure JPOXMLDOC01-appb-C000031
[In the formula, R 201 to R 207 each independently represent an aryl group, an alkyl group, or an alkenyl group that may have a substituent. R 201 to R 203 and R 206 to R 207 may be bonded to each other to form a ring together with the sulfur atom in the formula. R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms. R 210 is an aryl group which may have a substituent, an alkyl group which may have a substituent, an alkenyl group which may have a substituent, or -SO 2 - which may have a substituent. It is a containing cyclic group. L 201 represents -C(=O)- or -C(=O)-O-. ]
 上記の一般式(ca-1)~(ca-3)中、R201~R207におけるアリール基としては、炭素原子数6~20の無置換のアリール基が挙げられ、フェニル基、ナフチル基が好ましい。
 R201~R207におけるアルキル基としては、鎖状又は環状のアルキル基であって、炭素原子数1~30のものが好ましい。
 R201~R207におけるアルケニル基としては、炭素原子数が2~10であることが好ましい。
 R201~R207、およびR210が有していてもよい置換基としては、例えば、アルキル基、ハロゲン原子、ハロゲン化アルキル基、カルボニル基、シアノ基、アミノ基、アリール基、下記の一般式(ca-r-1)~(ca-r-7)でそれぞれ表される基等が挙げられる。
In the above general formulas (ca-1) to (ca-3), examples of the aryl group in R 201 to R 207 include unsubstituted aryl groups having 6 to 20 carbon atoms, such as phenyl group and naphthyl group. preferable.
The alkyl group in R 201 to R 207 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms.
The alkenyl group in R 201 to R 207 preferably has 2 to 10 carbon atoms.
Examples of the substituent that R 201 to R 207 and R 210 may have include an alkyl group, a halogen atom, a halogenated alkyl group, a carbonyl group, a cyano group, an amino group, an aryl group, and the following general formula: Examples include groups represented by (car-r-1) to (car-r-7), respectively.
Figure JPOXMLDOC01-appb-C000032
[式中、R’201は、それぞれ独立に、水素原子、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基である。]
Figure JPOXMLDOC01-appb-C000032
[In the formula, R' 201 is each independently a hydrogen atom, a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkyl group which may have a substituent. It is a good chain alkenyl group. ]
 置換基を有してもよい環式基:
 該環式基は、環状の炭化水素基であることが好ましく、該環状の炭化水素基は、芳香族炭化水素基であってもよく、脂肪族炭化水素基であってもよい。脂肪族炭化水素基は、芳香族性を持たない炭化水素基を意味する。また、脂肪族炭化水素基は、飽和であってもよく、不飽和であってもよく、通常は飽和であることが好ましい。
Cyclic group that may have a substituent:
The cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group. Aliphatic hydrocarbon group means a hydrocarbon group without aromaticity. Further, the aliphatic hydrocarbon group may be saturated or unsaturated, and is usually preferably saturated.
 R’201における芳香族炭化水素基は、芳香環を有する炭化水素基である。該芳香族炭化水素基の炭素原子数は3~30であることが好ましく、炭素原子数5~30がより好ましく、炭素原子数5~20がさらに好ましく、炭素原子数6~15が特に好ましく、炭素原子数6~10が最も好ましい。ただし、該炭素原子数には、置換基における炭素原子数を含まないものとする。
 R’201における芳香族炭化水素基が有する芳香環として具体的には、ベンゼン、フルオレン、ナフタレン、アントラセン、フェナントレン、ビフェニル、又はこれらの芳香環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環などが挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。
 R’201における芳香族炭化水素基として具体的には、前記芳香環から水素原子を1つ除いた基(アリール基:例えばフェニル基、ナフチル基など)、前記芳香環の水素原子の1つがアルキレン基で置換された基(例えばベンジル基、フェネチル基、1-ナフチルメチル基、2-ナフチルメチル基、1-ナフチルエチル基、2-ナフチルエチル基等のアリールアルキル基など)等が挙げられる。前記アルキレン基(アリールアルキル基中のアルキル鎖)の炭素原子数は、1~4であることが好ましく、炭素原子数1~2がより好ましく、炭素原子数1が特に好ましい。
The aromatic hydrocarbon group in R' 201 is a hydrocarbon group having an aromatic ring. The aromatic hydrocarbon group preferably has 3 to 30 carbon atoms, more preferably 5 to 30 carbon atoms, even more preferably 5 to 20 carbon atoms, particularly preferably 6 to 15 carbon atoms, Most preferably 6 to 10 carbon atoms. However, the number of carbon atoms does not include the number of carbon atoms in substituents.
Specifically, the aromatic ring possessed by the aromatic hydrocarbon group in R' 201 is benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, or a ring in which some of the carbon atoms constituting these aromatic rings are substituted with heteroatoms. and aromatic heterocycles. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom.
Specifically, the aromatic hydrocarbon group in R' 201 is a group in which one hydrogen atom is removed from the aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one of the hydrogen atoms in the aromatic ring is alkylene Examples include groups substituted with groups (eg, arylalkyl groups such as benzyl group, phenethyl group, 1-naphthylmethyl group, 2-naphthylmethyl group, 1-naphthylethyl group, and 2-naphthylethyl group). The alkylene group (alkyl chain in the arylalkyl group) preferably has 1 to 4 carbon atoms, more preferably 1 to 2 carbon atoms, and particularly preferably 1 carbon atom.
 R’201における環状の脂肪族炭化水素基は、構造中に環を含む脂肪族炭化水素基が挙げられる。
 この構造中に環を含む脂肪族炭化水素基としては、脂環式炭化水素基(脂肪族炭化水素環から水素原子を1個除いた基)、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の末端に結合した基、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の途中に介在する基などが挙げられる。
 前記脂環式炭化水素基は、炭素原子数が3~20であることが好ましく、3~12であることがより好ましい。
 前記脂環式炭化水素基は、多環式基であってもよく、単環式基であってもよい。単環式の脂環式炭化水素基としては、モノシクロアルカンから1個以上の水素原子を除いた基が好ましい。該モノシクロアルカンとしては、炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。多環式の脂環式炭化水素基としては、ポリシクロアルカンから1個以上の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては、炭素原子数7~30のものが好ましい。中でも、該ポリシクロアルカンとしては、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等の架橋環系の多環式骨格を有するポリシクロアルカン;ステロイド骨格を有する環式基等の縮合環系の多環式骨格を有するポリシクロアルカンがより好ましい。
Examples of the cyclic aliphatic hydrocarbon group for R' 201 include aliphatic hydrocarbon groups containing a ring in the structure.
The aliphatic hydrocarbon group containing a ring in its structure includes an alicyclic hydrocarbon group (a group in which one hydrogen atom is removed from an aliphatic hydrocarbon ring), and an alicyclic hydrocarbon group that is linear or branched. Examples thereof include a group bonded to the end of a chain aliphatic hydrocarbon group, and a group in which an alicyclic hydrocarbon group is interposed in the middle of a linear or branched aliphatic hydrocarbon group.
The alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, more preferably 3 to 12 carbon atoms.
The alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group. As the monocyclic alicyclic hydrocarbon group, a group obtained by removing one or more hydrogen atoms from a monocycloalkane is preferable. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 30 carbon atoms. Among these, the polycycloalkanes include polycycloalkanes having polycyclic skeletons such as adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane; condensed ring systems such as cyclic groups having steroid skeletons; More preferred are polycycloalkanes having a polycyclic skeleton.
 なかでも、R’201における環状の脂肪族炭化水素基としては、モノシクロアルカンまたはポリシクロアルカンから水素原子を1つ以上除いた基が好ましく、ポリシクロアルカンから水素原子を1つ除いた基がより好ましく、アダマンチル基、ノルボルニル基が特に好ましく、アダマンチル基が最も好ましい。 Among these, as the cyclic aliphatic hydrocarbon group for R' 201 , a group obtained by removing one or more hydrogen atoms from a monocycloalkane or a polycycloalkane is preferable, and a group obtained by removing one hydrogen atom from a polycycloalkane is preferable. More preferred are adamantyl groups and norbornyl groups, and most preferred are adamantyl groups.
 脂環式炭化水素基に結合してもよい、直鎖状または分岐鎖状の脂肪族炭化水素基は、炭素原子数が1~10であることが好ましく、炭素原子数1~6がより好ましく、炭素原子数1~4がさらに好ましく、炭素原子数1~3が特に好ましい。
 直鎖状の脂肪族炭化水素基としては、直鎖状のアルキレン基が好ましく、具体的には、メチレン基[-CH-]、エチレン基[-(CH-]、トリメチレン基[-(CH-]、テトラメチレン基[-(CH-]、ペンタメチレン基[-(CH-]等が挙げられる。
 分岐鎖状の脂肪族炭化水素基としては、分岐鎖状のアルキレン基が好ましく、具体的には、-CH(CH)-、-CH(CHCH)-、-C(CH-、-C(CH)(CHCH)-、-C(CH)(CHCHCH)-、-C(CHCH-等のアルキルメチレン基;-CH(CH)CH-、-CH(CH)CH(CH)-、-C(CHCH-、-CH(CHCH)CH-、-C(CHCH-CH-等のアルキルエチレン基;-CH(CH)CHCH-、-CHCH(CH)CH-等のアルキルトリメチレン基;-CH(CH)CHCHCH-、-CHCH(CH)CHCH-等のアルキルテトラメチレン基などのアルキルアルキレン基等が挙げられる。アルキルアルキレン基におけるアルキル基としては、炭素原子数1~5の直鎖状のアルキル基が好ましい。
The linear or branched aliphatic hydrocarbon group that may be bonded to the alicyclic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms. , more preferably 1 to 4 carbon atoms, particularly preferably 1 to 3 carbon atoms.
As the linear aliphatic hydrocarbon group, a linear alkylene group is preferable, and specifically, a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [ -(CH 2 ) 3 -], tetramethylene group [-(CH 2 ) 4 -], pentamethylene group [-(CH 2 ) 5 -], and the like.
As the branched aliphatic hydrocarbon group, a branched alkylene group is preferable, and specifically, -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 - and other alkylmethylene groups; CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 Alkylethylene groups such as CH 3 ) 2 -CH 2 -; -CH(CH 3 )CH 2 CH 2 -, alkyltrimethylene groups such as -CH 2 CH(CH 3 )CH 2 -; -CH(CH 3 ) Examples include alkylalkylene groups such as alkyltetramethylene groups such as CH 2 CH 2 CH 2 -, -CH 2 CH (CH 3 )CH 2 CH 2 -, and the like. The alkyl group in the alkylalkylene group is preferably a linear alkyl group having 1 to 5 carbon atoms.
 また、R’201における環状の炭化水素基は、複素環等のようにヘテロ原子を含んでもよい。例えば、ラクトン含有環式基、-SO-含有環式基、その他下記の化学式(r-hr-1)~(r-hr-16)でそれぞれ表される複素環式基が挙げられる。 Further, the cyclic hydrocarbon group in R' 201 may contain a heteroatom such as a heterocycle. Examples include lactone-containing cyclic groups, -SO 2 --containing cyclic groups, and other heterocyclic groups represented by the following chemical formulas (r-hr-1) to (r-hr-16), respectively.
Figure JPOXMLDOC01-appb-C000033
Figure JPOXMLDOC01-appb-C000033
 R’201の環式基における置換基としては、たとえば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基等が挙げられる。
 置換基としてのアルキル基としては、炭素原子数1~5のアルキル基が好ましく、メチル基、エチル基、プロピル基、n-ブチル基、tert-ブチル基が最も好ましい。
 置換基としてのアルコキシ基としては、炭素原子数1~5のアルコキシ基が好ましく、メトキシ基、エトキシ基、n-プロポキシ基、iso-プロポキシ基、n-ブトキシ基、tert-ブトキシ基がより好ましく、メトキシ基、エトキシ基が最も好ましい。
 置換基としてのハロゲン原子としては、フッ素原子が好ましい。
 置換基としてのハロゲン化アルキル基としては、炭素原子数1~5のアルキル基、たとえばメチル基、エチル基、プロピル基、n-ブチル基、tert-ブチル基等の水素原子の一部または全部が前記ハロゲン原子で置換された基が挙げられる。
 置換基としてのカルボニル基は、環状の炭化水素基を構成するメチレン基(-CH-)を置換する基である。
Examples of the substituent in the cyclic group of R' 201 include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, and the like.
The alkyl group as a substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably a methyl group, ethyl group, propyl group, n-butyl group, or tert-butyl group.
The alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, ethoxy group, n-propoxy group, iso-propoxy group, n-butoxy group, or tert-butoxy group. Most preferred are methoxy and ethoxy groups.
As the halogen atom as a substituent, a fluorine atom is preferable.
Examples of the halogenated alkyl group as a substituent include an alkyl group having 1 to 5 carbon atoms, such as a methyl group, ethyl group, propyl group, n-butyl group, and tert-butyl group, in which some or all of the hydrogen atoms are Examples include groups substituted with the aforementioned halogen atoms.
The carbonyl group as a substituent is a group that substitutes a methylene group (-CH 2 -) constituting a cyclic hydrocarbon group.
 置換基を有してもよい鎖状のアルキル基:
 R’201の鎖状のアルキル基としては、直鎖状又は分岐鎖状のいずれでもよい。
 直鎖状のアルキル基としては、炭素原子数が1~20であることが好ましく、炭素原子数1~15であることがより好ましく、炭素原子数1~10が最も好ましい。
 分岐鎖状のアルキル基としては、炭素原子数が3~20であることが好ましく、炭素原子数3~15であることがより好ましく、炭素原子数3~10が最も好ましい。具体的には、例えば、1-メチルエチル基、1-メチルプロピル基、2-メチルプロピル基、1-メチルブチル基、2-メチルブチル基、3-メチルブチル基、1-エチルブチル基、2-エチルブチル基、1-メチルペンチル基、2-メチルペンチル基、3-メチルペンチル基、4-メチルペンチル基などが挙げられる。
Chain-like alkyl group which may have a substituent:
The chain alkyl group of R' 201 may be either linear or branched.
The linear alkyl group preferably has 1 to 20 carbon atoms, more preferably 1 to 15 carbon atoms, and most preferably 1 to 10 carbon atoms.
The branched alkyl group preferably has 3 to 20 carbon atoms, more preferably 3 to 15 carbon atoms, and most preferably 3 to 10 carbon atoms. Specifically, for example, 1-methylethyl group, 1-methylpropyl group, 2-methylpropyl group, 1-methylbutyl group, 2-methylbutyl group, 3-methylbutyl group, 1-ethylbutyl group, 2-ethylbutyl group, Examples include 1-methylpentyl group, 2-methylpentyl group, 3-methylpentyl group, and 4-methylpentyl group.
 置換基を有してもよい鎖状のアルケニル基:
 R’201の鎖状のアルケニル基としては、直鎖状又は分岐鎖状のいずれでもよく、炭素原子数が2~10であることが好ましく、炭素原子数2~5がより好ましく、炭素原子数2~4がさらに好ましく、炭素原子数3が特に好ましい。直鎖状のアルケニル基としては、例えば、ビニル基、プロペニル基(アリル基)、ブテニル基などが挙げられる。分岐鎖状のアルケニル基としては、例えば、1-メチルビニル基、2-メチルビニル基、1-メチルプロペニル基、2-メチルプロペニル基などが挙げられる。
 鎖状のアルケニル基としては、上記の中でも、直鎖状のアルケニル基が好ましく、ビニル基、プロペニル基がより好ましく、ビニル基が特に好ましい。
Chain-like alkenyl group which may have a substituent:
The chain alkenyl group for R' 201 may be either linear or branched, and preferably has 2 to 10 carbon atoms, more preferably 2 to 5 carbon atoms, and The number of carbon atoms is more preferably 2 to 4, and the number of carbon atoms is particularly preferably 3. Examples of the linear alkenyl group include a vinyl group, a propenyl group (allyl group), and a butenyl group. Examples of the branched alkenyl group include 1-methylvinyl group, 2-methylvinyl group, 1-methylpropenyl group, and 2-methylpropenyl group.
As the chain alkenyl group, among the above, a straight chain alkenyl group is preferable, a vinyl group and a propenyl group are more preferable, and a vinyl group is particularly preferable.
 R’201の鎖状のアルキル基またはアルケニル基における置換基としては、たとえば、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基、アミノ基、上記R’201における環式基等が挙げられる。 Examples of substituents on the chain alkyl group or alkenyl group of R' 201 include an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, and a cyclic group in the above R' 201 . etc.
 R’201の置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基は、上述したものの他、置換基を有してもよい環式基又は置換基を有してもよい鎖状のアルキル基として、上述の式(a1-r-2)で表される酸解離性基と同様のものも挙げられる。 The cyclic group that may have a substituent, the chain alkyl group that may have a substituent, or the chain alkenyl group that may have a substituent for R'201 is other than those mentioned above. , as a cyclic group that may have a substituent or a chain alkyl group that may have a substituent, those similar to the acid-dissociable group represented by the above formula (a1-r-2) can also be mentioned.
 なかでも、R’201は、置換基を有してもよい環式基が好ましく、置換基を有してもよい環状の炭化水素基であることがより好ましい。より具体的には、例えば、フェニル基、ナフチル基、ポリシクロアルカンから1個以上の水素原子を除いた基;ラクトン含有環式基;-SO-含有環式基などが好ましい。 Among these, R' 201 is preferably a cyclic group that may have a substituent, and more preferably a cyclic hydrocarbon group that may have a substituent. More specifically, for example, a phenyl group, a naphthyl group, a group obtained by removing one or more hydrogen atoms from a polycycloalkane; a lactone-containing cyclic group; a -SO 2 --containing cyclic group, and the like are preferable.
 上記の一般式(ca-1)~(ca-3)中、R201~R203、R206~R207は、相互に結合して式中のイオウ原子と共に環を形成する場合、硫黄原子、酸素原子、窒素原子等のヘテロ原子や、カルボニル基、-SO-、-SO-、-SO-、-COO-、-CONH-または-N(R)-(該Rは炭素原子数1~5のアルキル基である。)等の官能基を介して結合してもよい。形成される環としては、式中のイオウ原子をその環骨格に含む1つの環が、イオウ原子を含めて、3~10員環であることが好ましく、5~7員環であることが特に好ましい。形成される環の具体例としては、例えばチオフェン環、チアゾール環、ベンゾチオフェン環、ジベンゾチオフェン環、9H-チオキサンテン環、チオキサントン環、チアントレン環、フェノキサチイン環、テトラヒドロチオフェニウム環、テトラヒドロチオピラニウム環等が挙げられる。 In the above general formulas (ca-1) to (ca-3), R 201 to R 203 and R 206 to R 207 are sulfur atoms, when bonding with each other to form a ring with the sulfur atom in the formula; Heteroatoms such as oxygen atoms and nitrogen atoms, carbonyl groups, -SO-, -SO 2 -, -SO 3 -, -COO-, -CONH- or -N(R N )- (where R N is a carbon atom They may be bonded via a functional group such as an alkyl group of numbers 1 to 5.). As for the ring to be formed, one ring in the formula containing a sulfur atom in its ring skeleton is preferably a 3- to 10-membered ring, particularly a 5- to 7-membered ring. preferable. Specific examples of the ring formed include, for example, a thiophene ring, a thiazole ring, a benzothiophene ring, a dibenzothiophene ring, a 9H-thioxanthene ring, a thioxanthone ring, a thianthrene ring, a phenoxathiine ring, a tetrahydrothiophenium ring, a tetrahydrothio Examples include a pyranium ring.
 R208~R209は、それぞれ独立に、水素原子または炭素原子数1~5のアルキル基を表し、水素原子又は炭素原子数1~3のアルキル基が好ましく、アルキル基となる場合、相互に結合して環を形成してもよい。 R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, preferably a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, and when they are an alkyl group, they are bonded to each other. may be used to form a ring.
 R210は、置換基を有してもよいアリール基、置換基を有してもよいアルキル基、置換基を有してもよいアルケニル基、又は置換基を有してもよい-SO-含有環式基である。
 R210におけるアリール基としては、炭素原子数6~20の無置換のアリール基が挙げられ、フェニル基、ナフチル基が好ましい。
 R210におけるアルキル基としては、鎖状又は環状のアルキル基であって、炭素原子数1~30のものが好ましい。
 R210におけるアルケニル基としては、炭素原子数が2~10であることが好ましい。
 R210における、置換基を有してもよい-SO-含有環式基としては、「-SO-含有多環式基」が好ましい。
R 210 is an aryl group which may have a substituent, an alkyl group which may have a substituent, an alkenyl group which may have a substituent, or -SO 2 - which may have a substituent. It is a containing cyclic group.
Examples of the aryl group for R 210 include unsubstituted aryl groups having 6 to 20 carbon atoms, with phenyl and naphthyl groups being preferred.
The alkyl group for R 210 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms.
The alkenyl group for R 210 preferably has 2 to 10 carbon atoms.
The —SO 2 —-containing cyclic group which may have a substituent in R 210 is preferably a “—SO 2 —containing polycyclic group.”
 前記式(ca-1)で表される好適なカチオンとして具体的には、下記の化学式(ca-1-1)~(ca-1-75)でそれぞれ表されるカチオンが挙げられる。 Specific examples of suitable cations represented by the formula (ca-1) include cations represented by the following chemical formulas (ca-1-1) to (ca-1-75).
Figure JPOXMLDOC01-appb-C000034
Figure JPOXMLDOC01-appb-C000034
Figure JPOXMLDOC01-appb-C000035
Figure JPOXMLDOC01-appb-C000035
Figure JPOXMLDOC01-appb-C000036
[式中、g1、g2、g3は繰返し数を示し、g1は1~5の整数であり、g2は0~20の整数であり、g3は0~20の整数である。]
Figure JPOXMLDOC01-appb-C000036
[In the formula, g1, g2, and g3 indicate the number of repetitions, g1 is an integer of 1 to 5, g2 is an integer of 0 to 20, and g3 is an integer of 0 to 20. ]
Figure JPOXMLDOC01-appb-C000037
Figure JPOXMLDOC01-appb-C000037
Figure JPOXMLDOC01-appb-C000038
Figure JPOXMLDOC01-appb-C000038
Figure JPOXMLDOC01-appb-C000039
[式中、R”201は水素原子又は置換基であって、該置換基としては前記R201~R207、およびR210~R212が有していてもよい置換基として挙げたものと同様である。]
Figure JPOXMLDOC01-appb-C000039
[In the formula, R'' 201 is a hydrogen atom or a substituent, and the substituent is the same as the substituent that R 201 to R 207 and R 210 to R 212 may have. ]
 前記式(ca-2)で表される好適なカチオンとして具体的には、ジフェニルヨードニウムカチオン、ビス(4-tert-ブチルフェニル)ヨードニウムカチオン等が挙げられる。 Specific examples of suitable cations represented by formula (ca-2) include diphenyliodonium cations, bis(4-tert-butylphenyl)iodonium cations, and the like.
 前記式(ca-3)で表される好適なカチオンとして具体的には、下記式(ca-3-1)~(ca-3-6)でそれぞれ表されるカチオンが挙げられる。 Specific examples of suitable cations represented by the above formula (ca-3) include cations represented by the following formulas (ca-3-1) to (ca-3-6).
Figure JPOXMLDOC01-appb-C000040
Figure JPOXMLDOC01-appb-C000040
 上記の中でも、Mm+としては、前記式(ca-1)で表されるカチオンが好ましい。
 また、Mm+としては、高感度化の観点から、フッ素原子を有するm価のオニウムカチオンが好ましい。このMm+としては、下記式(ca-1-1)で表されるカチオンが好ましい。
Among the above, as M m+ , a cation represented by the above formula (ca-1) is preferable.
Further, as M m+ , an m-valent onium cation having a fluorine atom is preferable from the viewpoint of increasing sensitivity. This M m+ is preferably a cation represented by the following formula (ca-1-1).
Figure JPOXMLDOC01-appb-C000041
[式中、Rf201~Rf203は、それぞれ独立に、置換基を有してもよいアリール基、置換基を有してもよいアルキル基、または置換基を有してもよいアルケニル基を表す。Rf201~Rf203は、相互に結合して式中のイオウ原子と共に環を形成してもよい。ただし、Rf201~Rf203の少なくとも1つは、少なくとも1個のフッ素原子を含む。]
Figure JPOXMLDOC01-appb-C000041
[In the formula, Rf 201 to Rf 203 each independently represent an aryl group that may have a substituent, an alkyl group that may have a substituent, or an alkenyl group that may have a substituent] . Rf 201 to Rf 203 may be bonded to each other to form a ring together with the sulfur atom in the formula. However, at least one of Rf 201 to Rf 203 contains at least one fluorine atom. ]
 前記式(ca-1-1)中のRf201~Rf203は、前記式(ca-1)中のR201~R203とそれぞれ同様である。ただし、Rf201~Rf203の少なくとも1つは、少なくとも1個のフッ素原子を含む。式(ca-1-1)で表されるカチオンは、3つ以上のフッ素原子を含むことが好ましい。Rf201~Rf203のいずれか1つが3つ以上のフッ素原子を有してもよく、Rf201~Rf203が含むフッ素原子の合計が3つ以上であってもよい。 Rf 201 to Rf 203 in the formula (ca-1-1) are the same as R 201 to R 203 in the formula (ca-1), respectively. However, at least one of Rf 201 to Rf 203 contains at least one fluorine atom. The cation represented by formula (ca-1-1) preferably contains three or more fluorine atoms. Any one of Rf 201 to Rf 203 may have three or more fluorine atoms, and the total number of fluorine atoms contained in Rf 201 to Rf 203 may be three or more.
 構成単位(a0)の具体例を以下に挙げるが、これらに限定されない。 Specific examples of the structural unit (a0) are listed below, but the invention is not limited thereto.
Figure JPOXMLDOC01-appb-C000042
Figure JPOXMLDOC01-appb-C000042
Figure JPOXMLDOC01-appb-C000043
Figure JPOXMLDOC01-appb-C000043
 構成単位(a0)は、前記式(a0-1)~(a0-13)のいずれかで表される構成単位が好ましく、前記の式(a0-1)~(a0-6)、式(a0-10)~(a0-12)のいずれかで表される構成単位がより好ましい。 The structural unit (a0) is preferably a structural unit represented by any of the formulas (a0-1) to (a0-13), and is preferably a structural unit represented by any of the formulas (a0-1) to (a0-6), the formula (a0-1) to -10) to (a0-12) are more preferred.
 (A1)成分が有する構成単位(a0)は、1種でもよく2種以上でもよい。
 (A1)成分中の構成単位(a0)の割合は、(A1)成分を構成する全構成単位の合計(100モル%)に対して、5~50モル%が好ましく、10~45モル%がより好ましく、20~40モル%がさらに好ましく、25~35モル%が特に好ましい。
 構成単位(a0)の割合が、前記の好ましい範囲の下限値以上であると、感度がより向上する。構成単位(a0)の割合が、前記好ましい範囲の上限値以下であると、パターン寸法の均一性等のリソグラフィー特性がより向上する。
The number of structural units (a0) contained in the component (A1) may be one or more.
The proportion of the structural unit (a0) in the component (A1) is preferably 5 to 50 mol%, and 10 to 45 mol%, based on the total (100 mol%) of all the structural units constituting the component (A1). It is more preferably 20 to 40 mol%, even more preferably 25 to 35 mol%.
When the proportion of the structural unit (a0) is at least the lower limit of the above-mentioned preferable range, sensitivity is further improved. When the proportion of the structural unit (a0) is below the upper limit of the preferable range, lithography properties such as pattern size uniformity are further improved.
 ≪その他構成単位≫
 (A1)成分は、上述した構成単位(a0)に加え、必要に応じてその他構成単位を有してもよい。
 その他構成単位としては、例えば、酸の作用により極性が増大する酸分解性基を含む構成単位(a1)(但し、構成単位(a0)に該当するものを除く);後述の一般式(a10-1)で表される構成単位(a10);ラクトン含有環式基を含む構成単位(a2);後述の一般式(a8-1)で表される化合物から誘導される構成単位(a8)などが挙げられる。
≪Other constituent units≫
In addition to the above-mentioned structural unit (a0), the component (A1) may have other structural units as necessary.
Other structural units include, for example, the structural unit (a1) containing an acid-decomposable group whose polarity increases by the action of an acid (excluding those corresponding to the structural unit (a0)); the general formula (a10- Structural unit (a10) represented by 1); Structural unit (a2) containing a lactone-containing cyclic group; Structural unit (a8) derived from a compound represented by general formula (a8-1) described below, etc. Can be mentioned.
 構成単位(a1):
 構成単位(a1)は、酸の作用により極性が増大する酸分解性基を含む構成単位である。
 酸分解性基を構成する酸解離性基としては、これまで、化学増幅型レジスト組成物用のベース樹脂の酸解離性基として提案されているものが挙げられる。
 化学増幅型レジスト組成物用のベース樹脂の酸解離性基として提案されているものとしては、例えば「アセタール型酸解離性基」、「第3級アルキルエステル型酸解離性基」、「第3級アルキルオキシカルボニル酸解離性基」、「第2級アルキルエステル型酸解離性基」が挙げられる。
 構成単位(a1)における「アセタール型酸解離性基」、「第3級アルキルエステル型酸解離性基」、「第2級アルキルエステル型酸解離性基」については、上述した構成単位(a0)についての中で説明した「アセタール型酸解離性基」、「第3級アルキルエステル型酸解離性基」、「第2級アルキルエステル型酸解離性基」とそれぞれ同様である。
Constituent unit (a1):
The structural unit (a1) is a structural unit containing an acid-decomposable group whose polarity increases under the action of an acid.
Examples of the acid-dissociable group constituting the acid-decomposable group include those that have been proposed as acid-dissociable groups for base resins for chemically amplified resist compositions.
Examples of acid-dissociable groups proposed as acid-dissociable groups for base resins for chemically amplified resist compositions include "acetal-type acid-dissociable groups,""tertiary alkyl ester-type acid-dissociable groups," and "tertiary acid-dissociable groups." Examples include "class alkyloxycarbonyl acid dissociable group" and "secondary alkyl ester type acid dissociable group."
Regarding the "acetal type acid dissociable group", "tertiary alkyl ester type acid dissociable group", and "secondary alkyl ester type acid dissociable group" in the structural unit (a1), the above-mentioned structural unit (a0) These are the same as the "acetal type acid dissociable group", "tertiary alkyl ester type acid dissociable group", and "secondary alkyl ester type acid dissociable group" explained in .
 第3級アルキルオキシカルボニル酸解離性基:
 第3級アルキルオキシカルボニル酸解離性基としては、例えば、下記一般式(a1-r-3)で表される酸解離性基が挙げられる。
Tertiary alkyloxycarbonylic acid dissociable group:
Examples of the tertiary alkyloxycarbonyl acid dissociable group include acid dissociable groups represented by the following general formula (a1-r-3).
Figure JPOXMLDOC01-appb-C000044
[式中、Ra’~Ra’はそれぞれアルキル基である。]
Figure JPOXMLDOC01-appb-C000044
[In the formula, Ra' 7 to Ra' 9 are each an alkyl group. ]
 前記式(a1-r-3)中、Ra’~Ra’は、それぞれ、炭素原子数1~5のアルキル基が好ましく、炭素原子数1~3のアルキル基がより好ましい。
 また、各アルキル基の合計の炭素原子数は、3~7であることが好ましく、合計の炭素原子数3~5であることがより好ましく、合計の炭素原子数3~4であることが最も好ましい。
In the formula (a1-r-3), each of Ra' 7 to Ra' 9 is preferably an alkyl group having 1 to 5 carbon atoms, more preferably an alkyl group having 1 to 3 carbon atoms.
The total number of carbon atoms in each alkyl group is preferably 3 to 7, more preferably 3 to 5, and most preferably 3 to 4. preferable.
 構成単位(a1)としては、α位の炭素原子に結合した水素原子が置換基で置換されていてもよいアクリル酸エステルから誘導される構成単位、アクリルアミドから誘導される構成単位、ヒドロキシスチレン若しくはヒドロキシスチレン誘導体から誘導される構成単位の水酸基における水素原子の少なくとも一部が前記酸分解性基を含む置換基により保護された構成単位、ビニル安息香酸若しくはビニル安息香酸誘導体から誘導される構成単位の-C(=O)-OHにおける水素原子の少なくとも一部が前記酸分解性基を含む置換基により保護された構成単位等が挙げられる。 The structural unit (a1) is a structural unit derived from an acrylic ester in which the hydrogen atom bonded to the α-position carbon atom may be substituted with a substituent, a structural unit derived from acrylamide, hydroxystyrene or hydroxyl. A structural unit in which at least a portion of the hydrogen atoms in the hydroxyl group of a structural unit derived from a styrene derivative is protected by a substituent containing the acid-decomposable group, a structural unit derived from vinylbenzoic acid or a vinylbenzoic acid derivative, - Examples include structural units in which at least a portion of the hydrogen atoms in C(=O)-OH are protected by a substituent containing the acid-decomposable group.
 構成単位(a1)としては、上記のなかでも、α位の炭素原子に結合した水素原子が置換基で置換されていてもよいアクリル酸エステルから誘導される構成単位が好ましい。
 かかる構成単位(a1)の好ましい具体例としては、下記一般式(a1-1)又は(a1-2)で表される構成単位が挙げられる。
Among the above-mentioned structural units, structural units (a1) are preferably structural units derived from acrylic esters in which the hydrogen atom bonded to the α-position carbon atom may be substituted with a substituent.
Preferred specific examples of the structural unit (a1) include structural units represented by the following general formula (a1-1) or (a1-2).
Figure JPOXMLDOC01-appb-C000045
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Vaは、エーテル結合を有していてもよい2価の炭化水素基である。na1は、0~2の整数である。Raは、上記の一般式(a1-r-1)、(a1-r-2)又は(a1-r-4)で表される酸解離性基である。Waはna2+1価の炭化水素基であり、na2は1~3の整数であり、Raは上記の一般式(a1-r-1)又は(a1-r-3)で表される酸解離性基である。]
Figure JPOXMLDOC01-appb-C000045
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Va 1 is a divalent hydrocarbon group which may have an ether bond. n a1 is an integer from 0 to 2. Ra 1 is an acid-dissociable group represented by the above general formula (a1-r-1), (a1-r-2) or (a1-r-4). Wa 1 is n a2 + monovalent hydrocarbon group, n a2 is an integer of 1 to 3, and Ra 2 is represented by the above general formula (a1-r-1) or (a1-r-3). It is an acid dissociable group. ]
 前記式(a1-1)中、Rは前記と同じである。Rとしては、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のフッ素化アルキル基が好ましく、工業上の入手の容易さから、水素原子又はメチル基が特に好ましい。 In the formula (a1-1), R is the same as above. R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom or a methyl group is particularly preferred.
 前記式(a1-1)中、Vaにおける2価の炭化水素基は、脂肪族炭化水素基であってもよく、芳香族炭化水素基であってもよい。 In the formula (a1-1), the divalent hydrocarbon group in Va 1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.
 Vaにおける2価の炭化水素基としての脂肪族炭化水素基は、飽和であってもよく、不飽和であってもよく、通常は飽和であることが好ましい。
 該脂肪族炭化水素基として、より具体的には、直鎖状もしくは分岐鎖状の脂肪族炭化水素基、又は、構造中に環を含む脂肪族炭化水素基等が挙げられる。
The aliphatic hydrocarbon group as the divalent hydrocarbon group in Va 1 may be saturated or unsaturated, and is usually preferably saturated.
More specifically, the aliphatic hydrocarbon group includes a linear or branched aliphatic hydrocarbon group, an aliphatic hydrocarbon group containing a ring in its structure, and the like.
 前記直鎖状の脂肪族炭化水素基は、炭素原子数が1~10であることが好ましく、炭素原子数1~6がより好ましく、炭素原子数1~4がさらに好ましく、炭素原子数1~3が最も好ましい。
 直鎖状の脂肪族炭化水素基としては、直鎖状のアルキレン基が好ましく、具体的には、メチレン基[-CH-]、エチレン基[-(CH-]、トリメチレン基[-(CH-]、テトラメチレン基[-(CH-]、ペンタメチレン基[-(CH-]等が挙げられる。
 前記分岐鎖状の脂肪族炭化水素基は、炭素原子数が2~10であることが好ましく、炭素原子数3~6がより好ましく、炭素原子数3又は4がさらに好ましく、炭素原子数3が最も好ましい。
 分岐鎖状の脂肪族炭化水素基としては、分岐鎖状のアルキレン基が好ましく、具体的には、-CH(CH)-、-CH(CHCH)-、-C(CH-、-C(CH)(CHCH)-、-C(CH)(CHCHCH)-、-C(CHCH-等のアルキルメチレン基;-CH(CH)CH-、-CH(CH)CH(CH)-、-C(CHCH-、-CH(CHCH)CH-、-C(CHCH-CH-等のアルキルエチレン基;-CH(CH)CHCH-、-CHCH(CH)CH-等のアルキルトリメチレン基;-CH(CH)CHCHCH-、-CHCH(CH)CHCH-等のアルキルテトラメチレン基などのアルキルアルキレン基等が挙げられる。アルキルアルキレン基におけるアルキル基としては、炭素原子数1~5の直鎖状のアルキル基が好ましい。
The linear aliphatic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, even more preferably 1 to 4 carbon atoms, and has 1 to 4 carbon atoms. 3 is most preferred.
As the linear aliphatic hydrocarbon group, a linear alkylene group is preferable, and specifically, a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [ -(CH 2 ) 3 -], tetramethylene group [-(CH 2 ) 4 -], pentamethylene group [-(CH 2 ) 5 -], and the like.
The branched aliphatic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably 3 to 6 carbon atoms, even more preferably 3 or 4 carbon atoms, and has 3 carbon atoms. Most preferred.
As the branched aliphatic hydrocarbon group, a branched alkylene group is preferable, and specifically, -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 - and other alkylmethylene groups; CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 Alkylethylene groups such as CH 3 ) 2 -CH 2 -; -CH(CH 3 )CH 2 CH 2 -, alkyltrimethylene groups such as -CH 2 CH(CH 3 )CH 2 -; -CH(CH 3 ) Examples include alkylalkylene groups such as alkyltetramethylene groups such as CH 2 CH 2 CH 2 -, -CH 2 CH (CH 3 )CH 2 CH 2 -, and the like. The alkyl group in the alkylalkylene group is preferably a linear alkyl group having 1 to 5 carbon atoms.
 前記構造中に環を含む脂肪族炭化水素基としては、脂環式炭化水素基(脂肪族炭化水素環から水素原子を2個除いた基)、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の末端に結合した基、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の途中に介在する基などが挙げられる。前記直鎖状または分岐鎖状の脂肪族炭化水素基としては、前記直鎖状の脂肪族炭化水素基または前記分岐鎖状の脂肪族炭化水素基と同様のものが挙げられる。
 前記脂環式炭化水素基は、炭素原子数が3~20であることが好ましく、炭素原子数3~12であることがより好ましい。
 前記脂環式炭化水素基は、多環式であってもよく、単環式であってもよい。単環式の脂環式炭化水素基としては、モノシクロアルカンから2個の水素原子を除いた基が好ましい。該モノシクロアルカンとしては炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。多環式の脂環式炭化水素基としては、ポリシクロアルカンから2個の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては炭素原子数7~12のものが好ましく、具体的にはアダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等が挙げられる。
Examples of the aliphatic hydrocarbon group containing a ring in the structure include an alicyclic hydrocarbon group (a group obtained by removing two hydrogen atoms from an aliphatic hydrocarbon ring), and an alicyclic hydrocarbon group in which the alicyclic hydrocarbon group is linear or branched. Examples include a group bonded to the end of a chain aliphatic hydrocarbon group, and a group in which an alicyclic hydrocarbon group is interposed in the middle of a linear or branched aliphatic hydrocarbon group. Examples of the linear or branched aliphatic hydrocarbon group include those similar to the linear aliphatic hydrocarbon group or the branched aliphatic hydrocarbon group.
The alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, more preferably 3 to 12 carbon atoms.
The alicyclic hydrocarbon group may be polycyclic or monocyclic. As the monocyclic alicyclic hydrocarbon group, a group obtained by removing two hydrogen atoms from a monocycloalkane is preferable. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms. Specifically, Examples include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
 Vaにおける2価の炭化水素基としての芳香族炭化水素基は、芳香環を有する炭化水素基である。
 かかる芳香族炭化水素基は、炭素原子数が3~30であることが好ましく、5~30であることがより好ましく、5~20がさらに好ましく、6~15が特に好ましく、6~12が最も好ましい。ただし、該炭素原子数には、置換基における炭素原子数を含まないものとする。
 芳香族炭化水素基が有する芳香環として具体的には、ベンゼン、ビフェニル、フルオレン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環;前記芳香族炭化水素環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環等が挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。
 該芳香族炭化水素基として具体的には、前記芳香族炭化水素環から水素原子を2つ除いた基(アリーレン基);前記芳香族炭化水素環から水素原子を1つ除いた基(アリール基)の水素原子の1つがアルキレン基で置換された基(例えば、ベンジル基、フェネチル基、1-ナフチルメチル基、2-ナフチルメチル基、1-ナフチルエチル基、2-ナフチルエチル基等のアリールアルキル基におけるアリール基から水素原子をさらに1つ除いた基)等が挙げられる。前記アルキレン基(アリールアルキル基中のアルキル鎖)の炭素原子数は、1~4であることが好ましく、1~2であることがより好ましく、1であることが特に好ましい。
The aromatic hydrocarbon group as the divalent hydrocarbon group in Va 1 is a hydrocarbon group having an aromatic ring.
The aromatic hydrocarbon group preferably has 3 to 30 carbon atoms, more preferably 5 to 30 carbon atoms, even more preferably 5 to 20 carbon atoms, particularly preferably 6 to 15 carbon atoms, and most preferably 6 to 12 carbon atoms. preferable. However, the number of carbon atoms does not include the number of carbon atoms in the substituents.
Specifically, examples of the aromatic ring possessed by the aromatic hydrocarbon group include aromatic hydrocarbon rings such as benzene, biphenyl, fluorene, naphthalene, anthracene, and phenanthrene; Examples include aromatic heterocycles substituted with atoms. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom.
Specifically, the aromatic hydrocarbon group includes a group obtained by removing two hydrogen atoms from the aromatic hydrocarbon ring (arylene group); a group obtained by removing one hydrogen atom from the aromatic hydrocarbon ring (aryl group); ) in which one of the hydrogen atoms is substituted with an alkylene group (for example, arylalkyl such as benzyl group, phenethyl group, 1-naphthylmethyl group, 2-naphthylmethyl group, 1-naphthylethyl group, 2-naphthylethyl group) (a group obtained by removing one hydrogen atom from an aryl group in the group), and the like. The number of carbon atoms in the alkylene group (alkyl chain in the arylalkyl group) is preferably 1 to 4, more preferably 1 to 2, and particularly preferably 1.
 前記式(a1-1)中、Raは、上記一般式(a1-r-1)、(a1-r-2)又は(a1-r-4)で表される酸解離性基であり、上記一般式(a1-r-2)又は(a1-r-4)で表される酸解離性基であることが好ましい。 In the formula (a1-1), Ra 1 is an acid-dissociable group represented by the general formula (a1-r-1), (a1-r-2) or (a1-r-4), An acid dissociable group represented by the above general formula (a1-r-2) or (a1-r-4) is preferable.
 前記式(a1-2)中、Waにおけるna2+1価の炭化水素基は、脂肪族炭化水素基であってもよく、芳香族炭化水素基であってもよい。該脂肪族炭化水素基は、芳香族性を持たない炭化水素基を意味し、飽和であってもよく、不飽和であってもよく、通常は飽和であることが好ましい。前記脂肪族炭化水素基としては、直鎖状または分岐鎖状の脂肪族炭化水素基、構造中に環を含む脂肪族炭化水素基、或いは直鎖状または分岐鎖状の脂肪族炭化水素基と構造中に環を含む脂肪族炭化水素基とを組み合わせた基が挙げられる。
 前記na2+1価は、2~4価が好ましく、2又は3価がより好ましい。
In the formula (a1-2), the n a2 +1-valent hydrocarbon group in Wa 1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group. The aliphatic hydrocarbon group means a hydrocarbon group without aromaticity, and may be saturated or unsaturated, and is usually preferably saturated. The aliphatic hydrocarbon group is a linear or branched aliphatic hydrocarbon group, an aliphatic hydrocarbon group containing a ring in its structure, or a linear or branched aliphatic hydrocarbon group. Examples include groups in which a ring-containing aliphatic hydrocarbon group is combined in the structure.
The n a2 +1 valence is preferably 2 to 4, more preferably 2 or 3.
 前記式(a1-2)中、Raは、上記の一般式(a1-r-1)又は(a1-r-3)で表される酸解離性基である。 In the above formula (a1-2), Ra 2 is an acid dissociable group represented by the above general formula (a1-r-1) or (a1-r-3).
 以下に、構成単位(a1)の具体例を示す。
 以下の各式中、Rαは、水素原子、メチル基またはトリフルオロメチル基を示す。
Specific examples of the structural unit (a1) are shown below.
In each of the following formulas, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
Figure JPOXMLDOC01-appb-C000046
Figure JPOXMLDOC01-appb-C000046
Figure JPOXMLDOC01-appb-C000047
Figure JPOXMLDOC01-appb-C000047
Figure JPOXMLDOC01-appb-C000048
Figure JPOXMLDOC01-appb-C000048
Figure JPOXMLDOC01-appb-C000049
Figure JPOXMLDOC01-appb-C000049
Figure JPOXMLDOC01-appb-C000050
Figure JPOXMLDOC01-appb-C000050
Figure JPOXMLDOC01-appb-C000051
Figure JPOXMLDOC01-appb-C000051
Figure JPOXMLDOC01-appb-C000052
Figure JPOXMLDOC01-appb-C000052
Figure JPOXMLDOC01-appb-C000053
Figure JPOXMLDOC01-appb-C000053
 (A1)成分が有する構成単位(a1)は、1種でもよく2種以上でもよい。
 構成単位(a1)としては、電子線やEUVによるリソグラフィーでの特性(感度、形状等)をより高められやすいことから、前記式(a1-1)で表される構成単位がより好ましく;EB用又はEUV用において反応性を高められて好適なことから、酸解離性基が環式基であるものを選択することが好ましい。
 構成単位(a1)としては、前記式(a1-1)で表される構成単位であって、Raが上記一般式(a1-r-2)又は(a1-r-4)で表される酸解離性基であることがさらに好ましく;前記式(a1-1)で表される構成単位であって、Raが上記一般式(a1-r-2)で表される酸解離性基であることが特に好ましく、このなかでも、前記式(a1-1)で表される構成単位であって、Raが上記一般式(a1-r2-1)で表される酸解離性基であることが最も好ましい。
The number of structural units (a1) contained in the component (A1) may be one or more.
As the structural unit (a1), the structural unit represented by the above formula (a1-1) is more preferable because the characteristics (sensitivity, shape, etc.) in lithography using electron beam or EUV can be more easily improved; for EB Alternatively, it is preferable to select one in which the acid-dissociable group is a cyclic group because it is suitable for EUV use because of enhanced reactivity.
The structural unit (a1) is a structural unit represented by the above formula (a1-1), in which Ra 1 is represented by the above general formula (a1-r-2) or (a1-r-4). More preferably, it is an acid-dissociable group; a structural unit represented by the above formula (a1-1), in which Ra 1 is an acid-dissociable group represented by the above general formula (a1-r-2); Particularly preferred is a structural unit represented by the above formula (a1-1), in which Ra 1 is an acid-dissociable group represented by the above general formula (a1-r2-1). is most preferable.
 (A1)成分中の構成単位(a1)の割合は、該(A1)成分を構成する全構成単位の合計(100モル%)に対して、5~40モル%が好ましく、10~30モル%がより好ましく、15~25モル%がさらに好ましい。
 構成単位(a1)の割合を、前記の好ましい範囲の下限値以上とすることによって、感度、解像性、パターン寸法の均一性等のリソグラフィー特性が向上する。一方、前記の好ましい範囲の上限値以下であると、他の構成単位とのバランスを取ることができ、種々のリソグラフィー特性が良好となる。
The proportion of the structural unit (a1) in the component (A1) is preferably 5 to 40 mol%, and 10 to 30 mol%, based on the total (100 mol%) of all structural units constituting the component (A1). is more preferable, and even more preferably 15 to 25 mol%.
By setting the proportion of the structural unit (a1) to the lower limit of the above-mentioned preferred range or more, lithography properties such as sensitivity, resolution, and uniformity of pattern dimensions are improved. On the other hand, if it is below the upper limit of the above-mentioned preferable range, a balance with other structural units can be maintained, and various lithography properties will be improved.
 構成単位(a10):
 構成単位(a10)は、下記一般式(a10-1)で表される構成単位である。
Constituent unit (a10):
The structural unit (a10) is a structural unit represented by the following general formula (a10-1).
Figure JPOXMLDOC01-appb-C000054
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Yax1は、単結合又は2価の連結基である。Wax1は、置換基を有してもよい芳香族炭化水素基である。nax1は、1以上の整数である。]
Figure JPOXMLDOC01-appb-C000054
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Ya x1 is a single bond or a divalent linking group. Wa x1 is an aromatic hydrocarbon group which may have a substituent. n ax1 is an integer of 1 or more. ]
 前記式(a10-1)中、Rとしては、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のフッ素化アルキル基が好ましく、工業上の入手の容易さから、水素原子又はメチル基が特に好ましい。 In the formula (a10-1), R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms. Particularly preferred are atoms or methyl groups.
 前記式(a10-1)中、Yax1は、単結合又は2価の連結基である。
 Yax1における2価の連結基としては、特に限定されないが、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基等が好適なものとして挙げられる。
 Yax1としては、単結合、エステル結合[-C(=O)-O-、-O-C(=O)-]、エーテル結合(-O-)、直鎖状若しくは分岐鎖状のアルキレン基、又はこれらの組合せが好ましく、単結合、エステル結合[-C(=O)-O-、-O-C(=O)-]がより好ましい。
In the formula (a10-1), Ya x1 is a single bond or a divalent linking group.
The divalent linking group in Ya x1 is not particularly limited, but suitable examples include a divalent hydrocarbon group which may have a substituent, a divalent linking group containing a hetero atom, and the like.
Ya x1 is a single bond, an ester bond [-C(=O)-O-, -OC(=O)-], an ether bond (-O-), or a linear or branched alkylene group. , or a combination thereof is preferable, and a single bond or an ester bond [-C(=O)-O-, -OC(=O)-] is more preferable.
 前記式(a10-1)中、Wax1は、置換基を有してもよい芳香族炭化水素基である。
 Wax1における芳香族炭化水素基としては、置換基を有してもよい芳香環から(nax1+1)個の水素原子を除いた基が挙げられる。ここでの芳香環は、4n+2個のπ電子をもつ環状共役系であれば特に限定されない。芳香環の炭素原子数は5~30であることが好ましく、炭素原子数5~20がより好ましく、炭素原子数6~15がさらに好ましく、炭素原子数6~12が特に好ましい。該芳香環として具体的には、ベンゼン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環;前記芳香族炭化水素環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環等が挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。芳香族複素環として具体的には、ピリジン環、チオフェン環等が挙げられる。
 また、Wax1における芳香族炭化水素基としては、2以上の置換基を有してもよい芳香環を含む芳香族化合物(例えばビフェニル、フルオレン等)から(nax1+1)個の水素原子を除いた基も挙げられる。
 上記の中でも、Wax1としては、ベンゼン、ナフタレン、アントラセンまたはビフェニルから(nax1+1)個の水素原子を除いた基が好ましく、ベンゼン又はナフタレンから(nax1+1)個の水素原子を除いた基がより好ましく、ベンゼンから(nax1+1)個の水素原子を除いた基がさらに好ましい。
In the formula (a10-1), Wa x1 is an aromatic hydrocarbon group which may have a substituent.
Examples of the aromatic hydrocarbon group in Wa x1 include a group obtained by removing (na x1 +1) hydrogen atoms from an aromatic ring that may have a substituent. The aromatic ring here is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons. The aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, even more preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms. Specific examples of the aromatic ring include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; aromatic heterocycles in which some of the carbon atoms constituting the aromatic hydrocarbon ring are substituted with heteroatoms; can be mentioned. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom. Specific examples of the aromatic heterocycle include a pyridine ring and a thiophene ring.
In addition, the aromatic hydrocarbon group in Wa x1 is an aromatic compound containing an aromatic ring that may have two or more substituents (e.g. biphenyl, fluorene, etc.) by removing (n ax1 +1) hydrogen atoms. Other groups may also be mentioned.
Among the above, Wa x1 is preferably a group obtained by removing ( nax1 +1) hydrogen atoms from benzene, naphthalene, anthracene, or biphenyl, and a group obtained by removing ( nax1 +1) hydrogen atoms from benzene or naphthalene. is more preferred, and a group obtained by removing (n ax1 +1) hydrogen atoms from benzene is even more preferred.
 Wax1における芳香族炭化水素基は、置換基を有してもよく、有していなくてもよい。前記置換基としては、例えば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基等が挙げられる。前記置換基としてのアルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基としては、R’201の環式基における置換基として挙げたものと同様のものが挙げられる。前記置換基は、炭素原子数1~5の直鎖状若しくは分岐鎖状のアルキル基が好ましく、炭素原子数1~3の直鎖状若しくは分岐鎖状のアルキル基がより好ましく、エチル基又はメチル基がさらに好ましく、メチル基が特に好ましい。Wax1における芳香族炭化水素基は、置換基を有していないことが好ましい。 The aromatic hydrocarbon group in Wa x1 may or may not have a substituent. Examples of the substituent include an alkyl group, an alkoxy group, a halogen atom, and a halogenated alkyl group. Examples of the alkyl group, alkoxy group, halogen atom, and halogenated alkyl group as the substituent include those listed as the substituent for the cyclic group of R'201 . The substituent is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, more preferably a linear or branched alkyl group having 1 to 3 carbon atoms, and is preferably an ethyl group or a methyl group. A group is more preferred, and a methyl group is particularly preferred. The aromatic hydrocarbon group in Wa x1 preferably has no substituent.
 前記式(a10-1)中、nax1は、1以上の整数であり、1~10の整数が好ましく、1~5の整数がより好ましく、1、2又は3がさらに好ましく、1又は2が特に好ましい。 In the formula (a10-1), n ax1 is an integer of 1 or more, preferably an integer of 1 to 10, more preferably an integer of 1 to 5, even more preferably 1, 2 or 3, and 1 or 2 is Particularly preferred.
 以下に、前記式(a10-1)で表される構成単位(a10)の具体例を示す。
 以下の各式中、Rαは、水素原子、メチル基又はトリフルオロメチル基を表す。
Specific examples of the structural unit (a10) represented by the formula (a10-1) are shown below.
In each of the following formulas, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
Figure JPOXMLDOC01-appb-C000055
Figure JPOXMLDOC01-appb-C000055
Figure JPOXMLDOC01-appb-C000056
Figure JPOXMLDOC01-appb-C000056
Figure JPOXMLDOC01-appb-C000057
Figure JPOXMLDOC01-appb-C000057
 (A1)成分が有する構成単位(a10)は、1種でもよく2種以上でもよい。
 (A1)成分が構成単位(a10)を有する場合、(A1)成分中の構成単位(a10)の割合は、(A1)成分を構成する全構成単位の合計(100モル%)に対して、40~95モル%が好ましく、45~90モル%がより好ましく、50~80モル%がさらに好ましく、60~75モル%が特に好ましい。
 構成単位(a10)の割合を、前記の好ましい範囲の下限値以上とすることにより、感度がより高められやすくなる。一方、上限値以下とすることにより、他の構成単位とのバランスをとりやすくなる。
The number of structural units (a10) contained in the component (A1) may be one or more.
When the component (A1) has a structural unit (a10), the proportion of the structural unit (a10) in the component (A1) is as follows: It is preferably 40 to 95 mol%, more preferably 45 to 90 mol%, even more preferably 50 to 80 mol%, and particularly preferably 60 to 75 mol%.
By setting the proportion of the structural unit (a10) to the lower limit of the above-mentioned preferred range or more, the sensitivity can be more easily increased. On the other hand, by setting it below the upper limit, it becomes easier to maintain a balance with other structural units.
 構成単位(a2):
 (A1)成分は、ラクトン含有環式基を含む構成単位(a2)(但し、構成単位(a1)に該当するものを除く)を有してもよい。
 構成単位(a2)のラクトン含有環式基は、(A1)成分をレジスト膜の形成に用いた場合に、レジスト膜の基板への密着性を高める上で有効である。また、構成単位(a2)を有することで、例えば酸拡散長を適切に調整する、レジスト膜の基板への密着性を高める、現像時の溶解性を適切に調整する等の効果により、リソグラフィー特性等が良好となる。
Constituent unit (a2):
Component (A1) may have a structural unit (a2) containing a lactone-containing cyclic group (excluding the structural unit (a1)).
The lactone-containing cyclic group of the structural unit (a2) is effective in increasing the adhesion of the resist film to the substrate when the component (A1) is used to form the resist film. In addition, by having the structural unit (a2), for example, the acid diffusion length can be appropriately adjusted, the adhesion of the resist film to the substrate can be increased, and the solubility during development can be appropriately adjusted, so that the lithography properties can be improved. etc. will be good.
 「ラクトン含有環式基」とは、その環骨格中に-O-C(=O)-を含む環(ラクトン環)を含有する環式基を示す。ラクトン環をひとつ目の環として数え、ラクトン環のみの場合は単環式基、さらに他の環構造を有する場合は、その構造に関わらず多環式基と称する。ラクトン含有環式基は、単環式基であってもよく、多環式基であってもよい。
 構成単位(a2)におけるラクトン含有環式基としては、特に限定されることなく任意のものが使用可能である。具体的には、下記一般式(a2-r-1)~(a2-r-7)でそれぞれ表される基が挙げられる。
The term "lactone-containing cyclic group" refers to a cyclic group containing a ring containing -OC(=O)- (lactone ring) in its ring skeleton. The lactone ring is counted as the first ring, and when there is only a lactone ring, it is called a monocyclic group, and when it has other ring structures, it is called a polycyclic group regardless of the structure. The lactone-containing cyclic group may be a monocyclic group or a polycyclic group.
The lactone-containing cyclic group in the structural unit (a2) is not particularly limited and any arbitrary group can be used. Specifically, groups represented by the following general formulas (a2-r-1) to (a2-r-7) can be mentioned.
Figure JPOXMLDOC01-appb-C000058
[式中、Ra’21はそれぞれ独立に水素原子、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、-COOR”、-OC(=O)R”、ヒドロキシアルキル基またはシアノ基であり;R”は水素原子、アルキル基、又は、ラクトン含有環式基であり;A”は酸素原子(-O-)もしくは硫黄原子(-S-)を含んでいてもよい炭素原子数1~5のアルキレン基、酸素原子または硫黄原子であり、n’は0~2の整数であり、m’は0または1である。*は結合手を示す(以下、同様)。]
Figure JPOXMLDOC01-appb-C000058
[In the formula, Ra' 21 is each independently a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, -COOR", -OC(=O)R", a hydroxyalkyl group, or a cyano group. Yes; R'' is a hydrogen atom, an alkyl group, or a lactone-containing cyclic group; A'' has 1 to 1 carbon atoms, which may include an oxygen atom (-O-) or a sulfur atom (-S-); 5 alkylene group, oxygen atom or sulfur atom, n' is an integer of 0 to 2, and m' is 0 or 1. * indicates a bond (the same applies hereinafter). ]
 前記一般式(a2-r-1)~(a2-r-7)中、Ra’21におけるアルキル基としては、炭素原子数1~6のアルキル基が好ましい。該アルキル基は、直鎖状または分岐鎖状であることが好ましい。具体的には、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基、ヘキシル基等が挙げられる。これらの中でも、メチル基またはエチル基が好ましく、メチル基が特に好ましい。
 Ra’21におけるアルコキシ基としては、炭素原子数1~6のアルコキシ基が好ましい。該アルコキシ基は、直鎖状または分岐鎖状であることが好ましい。具体的には、前記Ra’21におけるアルキル基として挙げたアルキル基と酸素原子(-O-)とが連結した基が挙げられる。
 Ra’21におけるハロゲン原子としては、フッ素原子が好ましい。
 Ra’21におけるハロゲン化アルキル基としては、前記Ra’21におけるアルキル基の水素原子の一部または全部が前記ハロゲン原子で置換された基が挙げられる。該ハロゲン化アルキル基としては、フッ素化アルキル基が好ましく、特にパーフルオロアルキル基が好ましい。
In the general formulas (a2-r-1) to (a2-r-7), the alkyl group at Ra' 21 is preferably an alkyl group having 1 to 6 carbon atoms. The alkyl group is preferably linear or branched. Specific examples include methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, isobutyl group, tert-butyl group, pentyl group, isopentyl group, neopentyl group, and hexyl group. Among these, methyl group or ethyl group is preferred, and methyl group is particularly preferred.
The alkoxy group for Ra' 21 is preferably an alkoxy group having 1 to 6 carbon atoms. The alkoxy group is preferably linear or branched. Specifically, a group in which the alkyl group mentioned above as the alkyl group in Ra' 21 and an oxygen atom (-O-) are connected can be mentioned.
The halogen atom at Ra' 21 is preferably a fluorine atom.
Examples of the halogenated alkyl group at Ra' 21 include groups in which part or all of the hydrogen atoms of the alkyl group at Ra' 21 are substituted with the halogen atoms. As the halogenated alkyl group, a fluorinated alkyl group is preferable, and a perfluoroalkyl group is particularly preferable.
 Ra’21における-COOR”、-OC(=O)R”において、R”はいずれも水素原子、アルキル基、又は、ラクトン含有環式基である。
 R”におけるアルキル基としては、直鎖状、分岐鎖状、環状のいずれでもよく、炭素原子数は1~15が好ましい。
 R”が直鎖状もしくは分岐鎖状のアルキル基の場合は、炭素原子数1~10であることが好ましく、炭素原子数1~5であることがさらに好ましく、メチル基またはエチル基であることが特に好ましい。
 R”が環状のアルキル基の場合は、炭素原子数3~15であることが好ましく、炭素原子数4~12であることがさらに好ましく、炭素原子数5~10が最も好ましい。具体的には、フッ素原子またはフッ素化アルキル基で置換されていてもよいし、されていなくてもよいモノシクロアルカンから1個以上の水素原子を除いた基;ビシクロアルカン、トリシクロアルカン、テトラシクロアルカンなどのポリシクロアルカンから1個以上の水素原子を除いた基などを例示できる。より具体的には、シクロペンタン、シクロヘキサン等のモノシクロアルカンから1個以上の水素原子を除いた基;アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカンなどのポリシクロアルカンから1個以上の水素原子を除いた基などが挙げられる。
 R”におけるラクトン含有環式基としては、前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表される基と同様のものが挙げられる。
 Ra’21におけるヒドロキシアルキル基としては、炭素原子数が1~6であるものが好ましく、具体的には、前記Ra’21におけるアルキル基の水素原子の少なくとも1つが水酸基で置換された基が挙げられる。
In -COOR" and -OC(=O)R" in Ra' 21 , R" is a hydrogen atom, an alkyl group, or a lactone-containing cyclic group.
The alkyl group in R'' may be linear, branched, or cyclic, and preferably has 1 to 15 carbon atoms.
When R'' is a linear or branched alkyl group, it preferably has 1 to 10 carbon atoms, more preferably 1 to 5 carbon atoms, and is a methyl or ethyl group. is particularly preferred.
When R'' is a cyclic alkyl group, it preferably has 3 to 15 carbon atoms, more preferably 4 to 12 carbon atoms, and most preferably 5 to 10 carbon atoms.Specifically, , a group obtained by removing one or more hydrogen atoms from a monocycloalkane which may or may not be substituted with a fluorine atom or a fluorinated alkyl group; bicycloalkane, tricycloalkane, tetracycloalkane, etc. Examples include groups obtained by removing one or more hydrogen atoms from a polycycloalkane. More specifically, groups obtained by removing one or more hydrogen atoms from a monocycloalkane such as cyclopentane and cyclohexane; adamantane, norbornane, Examples include groups obtained by removing one or more hydrogen atoms from polycycloalkanes such as isobornane, tricyclodecane, and tetracyclododecane.
Examples of the lactone-containing cyclic group in R'' include the same groups as those represented by the general formulas (a2-r-1) to (a2-r-7).
The hydroxyalkyl group in Ra' 21 preferably has 1 to 6 carbon atoms, and specifically includes a group in which at least one hydrogen atom of the alkyl group in Ra' 21 is substituted with a hydroxyl group. It will be done.
 Ra’21としては、上記の中でも、それぞれ独立に水素原子又はシアノ基であることが好ましい。 Among the above, Ra' 21 is preferably each independently a hydrogen atom or a cyano group.
 前記一般式(a2-r-2)、(a2-r-3)、(a2-r-5)中、A”における炭素原子数1~5のアルキレン基としては、直鎖状または分岐鎖状のアルキレン基が好ましく、メチレン基、エチレン基、n-プロピレン基、イソプロピレン基等が挙げられる。該アルキレン基が酸素原子または硫黄原子を含む場合、その具体例としては、前記アルキレン基の末端または炭素原子間に-O-または-S-が介在する基が挙げられ、例えば、-O-CH-、-CH-O-CH-、-S-CH-、-CH-S-CH-等が挙げられる。A”としては、炭素原子数1~5のアルキレン基または-O-が好ましく、炭素原子数1~5のアルキレン基がより好ましく、メチレン基が最も好ましい。 In the general formulas (a2-r-2), (a2-r-3), and (a2-r-5), the alkylene group having 1 to 5 carbon atoms in A'' is linear or branched. Preferred are alkylene groups such as methylene group, ethylene group, n-propylene group, isopropylene group, etc. When the alkylene group contains an oxygen atom or a sulfur atom, specific examples include the terminal or sulfur atom of the alkylene group. Examples include groups in which -O- or -S- is present between carbon atoms, such as -O-CH 2 -, -CH 2 -O-CH 2 -, -S-CH 2 -, -CH 2 -S -CH 2 -, etc. A'' is preferably an alkylene group having 1 to 5 carbon atoms or -O-, more preferably an alkylene group having 1 to 5 carbon atoms, and most preferably a methylene group.
 以下に、一般式(a2-r-1)~(a2-r-7)でそれぞれ表される基の具体例を挙げる。 Specific examples of groups represented by general formulas (a2-r-1) to (a2-r-7) are listed below.
Figure JPOXMLDOC01-appb-C000059
Figure JPOXMLDOC01-appb-C000059
Figure JPOXMLDOC01-appb-C000060
Figure JPOXMLDOC01-appb-C000060
 構成単位(a2)としては、なかでも、α位の炭素原子に結合した水素原子が置換基で置換されていてもよいアクリル酸エステルから誘導される構成単位が好ましい。
 かかる構成単位(a2)は、下記一般式(a2-1)で表される構成単位であることが好ましい。
Among these, the structural unit (a2) is preferably a structural unit derived from an acrylic ester in which the hydrogen atom bonded to the α-position carbon atom may be substituted with a substituent.
The structural unit (a2) is preferably a structural unit represented by the following general formula (a2-1).
Figure JPOXMLDOC01-appb-C000061
[式中、Rは水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Ya21は単結合または2価の連結基である。La21は-O-、-COO-、-CON(R’)-、-OCO-、-CONHCO-又は-CONHCS-であり、R’は水素原子またはメチル基を示す。ただしLa21が-O-の場合、Ya21は-CO-にはならない。Ra21はラクトン含有環式基である。]
Figure JPOXMLDOC01-appb-C000061
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Ya 21 is a single bond or a divalent linking group. La 21 is -O-, -COO-, -CON(R')-, -OCO-, -CONHCO- or -CONHCS-, and R' represents a hydrogen atom or a methyl group. However, when La 21 is -O-, Ya 21 does not become -CO-. Ra 21 is a lactone-containing cyclic group. ]
 前記式(a2-1)中、Rとしては、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のフッ素化アルキル基が好ましく、工業上の入手の容易さから、水素原子又はメチル基が特に好ましい。 In the formula (a2-1), R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms. Particularly preferred are atoms or methyl groups.
 前記式(a2-1)中、Ya21における2価の連結基としては、特に限定されないが、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基等が好適に挙げられる。
 Ya21としては、単結合、エステル結合[-C(=O)-O-]、エーテル結合(-O-)、直鎖状若しくは分岐鎖状のアルキレン基、又はこれらの組合せであることが好ましい。
In the formula (a2-1), the divalent linking group for Ya 21 is not particularly limited, but includes a divalent hydrocarbon group that may have a substituent, a divalent linking group containing a hetero atom, etc. are preferably mentioned.
Ya 21 is preferably a single bond, an ester bond [-C(=O)-O-], an ether bond (-O-), a linear or branched alkylene group, or a combination thereof. .
 前記式(a2-1)中、Ya21は、単結合であり、La21は、-COO-、又は、-OCO-であることが好ましい。 In the formula (a2-1), Ya 21 is preferably a single bond, and La 21 is preferably -COO- or -OCO-.
 前記式(a2-1)中、Ra21は、ラクトン含有環式基である。
 Ra21におけるラクトン含有環式基としてはそれぞれ、前述した一般式(a2-r-1)~(a2-r-7)でそれぞれ表される基が好適に挙げられる。
In the formula (a2-1), Ra 21 is a lactone-containing cyclic group.
Preferable examples of the lactone-containing cyclic group in Ra 21 include groups represented by the aforementioned general formulas (a2-r-1) to (a2-r-7).
 (A1)成分が有する構成単位(a2)は、1種でもよく2種以上でもよい。
 (A1)成分が構成単位(a2)を有する場合、構成単位(a2)の割合は、当該(A1)成分を構成する全構成単位の合計(100モル%)に対して、1~20モル%であることが好ましく、1~15モル%であることがより好ましく、1~10モル%であることがさらに好ましい。
 構成単位(a2)の割合を、前記の好ましい範囲の下限値以上とすると、前述した効果によって、構成単位(a2)を含有させることによる効果が充分に得られ、上限値以下であると、他の構成単位とのバランスを取ることができ、種々のリソグラフィー特性が良好となる。
The number of structural units (a2) contained in the component (A1) may be one or more.
When the component (A1) has a structural unit (a2), the proportion of the structural unit (a2) is 1 to 20 mol% with respect to the total (100 mol%) of all structural units constituting the component (A1). It is preferably 1 to 15 mol%, and even more preferably 1 to 10 mol%.
When the proportion of the structural unit (a2) is at least the lower limit of the above-mentioned preferable range, the effect of containing the structural unit (a2) can be sufficiently obtained, and when it is below the upper limit, other effects can be obtained. It is possible to maintain a balance with the structural units of , and various lithography properties can be improved.
 構成単位(a8):
 構成単位(a8)は、下記一般式(a8-1)で表される化合物から誘導される構成単位である。
Constituent unit (a8):
The structural unit (a8) is a structural unit derived from a compound represented by the following general formula (a8-1).
Figure JPOXMLDOC01-appb-C000062
[式中、Wは、重合性基含有基である。Yax2は、単結合又は(nax2+1)価の連結基である。Yax2とWとは縮合環を形成していてもよい。Rは炭素原子数1~12のフッ素化アルキル基である。Rはフッ素原子を有してもよい炭素原子数1~12の有機基又は水素原子である。R及びYax2は、相互に結合して環構造を形成していてもよい。nax2は、1~3の整数である。]
Figure JPOXMLDOC01-appb-C000062
[In the formula, W 2 is a polymerizable group-containing group. Ya x2 is a single bond or a (na x2 +1)-valent linking group. Ya x2 and W 2 may form a condensed ring. R 1 is a fluorinated alkyl group having 1 to 12 carbon atoms. R 2 is an organic group having 1 to 12 carbon atoms which may have a fluorine atom, or a hydrogen atom. R 2 and Ya x2 may be bonded to each other to form a ring structure. n ax2 is an integer from 1 to 3. ]
 Wの重合性基含有基における「重合性基」とは、重合性基を有する化合物がラジカル重合等により重合することを可能とする基であり、例えばエチレン性二重結合などの炭素原子間の多重結合を含む基をいう。 The "polymerizable group" in the polymerizable group-containing group of W2 is a group that enables a compound having a polymerizable group to be polymerized by radical polymerization, etc. A group containing multiple bonds.
 重合性基含有基としては、重合性基のみから構成される基でもよいし、重合性基と該重合性基以外の他の基とから構成される基でもよい。該重合性基以外の他の基としては、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基等が挙げられる。
 重合性基含有基としては、例えば、化学式:C(RX11)(RX12)=C(RX13)-Yax0-で表される基が好適に挙げられる。
 この化学式中、RX11、RX12及びRX13は、それぞれ、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基であり、Yax0は、単結合または2価の連結基である。
The polymerizable group-containing group may be a group consisting only of a polymerizable group, or a group consisting of a polymerizable group and another group other than the polymerizable group. Examples of groups other than the polymerizable group include a divalent hydrocarbon group which may have a substituent, a divalent linking group containing a hetero atom, and the like.
Preferred examples of the polymerizable group-containing group include a group represented by the chemical formula: C(R X11 )(R X12 )=C(R X13 )-Ya x0 -.
In this chemical formula, R X11 , R X12 , and R It is a divalent linking group.
 Yax2とWとが形成する縮合環としては、W部位の重合性基とYax2とが形成する縮合環、W部位の重合性基以外の他の基とYax2とが形成する縮合環が挙げられる。
 Yax2とWとが形成する縮合環は、置換基を有してもよい。
The fused ring formed by Ya x2 and W 2 includes a fused ring formed by the polymerizable group at the W 2 site and Ya x2 , and a fused ring formed by Ya x2 and a group other than the polymerizable group at the W 2 site. Examples include fused rings.
The condensed ring formed by Ya x2 and W 2 may have a substituent.
 以下に、構成単位(a8)の具体例を示す。
 下記の式中、Rαは、水素原子、メチル基又はトリフルオロメチル基を示す。
Specific examples of the structural unit (a8) are shown below.
In the following formula, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
Figure JPOXMLDOC01-appb-C000063
Figure JPOXMLDOC01-appb-C000063
 (A1)成分が有する構成単位(a8)は、1種でもよく2種以上でもよい。
 (A1)成分が構成単位(a8)を有する場合、構成単位(a8)の割合は、当該(A1)成分を構成する全構成単位の合計(100モル%)に対して、1~20モル%であることが好ましく、1~15モル%であることがより好ましく、1~10モル%であることがさらに好ましい。
The number of structural units (a8) contained in the component (A1) may be one or more.
When the component (A1) has a structural unit (a8), the proportion of the structural unit (a8) is 1 to 20 mol% with respect to the total (100 mol%) of all the structural units constituting the component (A1). It is preferably 1 to 15 mol%, and even more preferably 1 to 10 mol%.
 レジスト組成物が含有する(A1)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。 The component (A1) contained in the resist composition may be used alone or in combination of two or more.
 本実施形態で用いる(A1)成分は、構成単位(a0)を有する高分子化合物であり、好ましくは、構成単位(a0)と構成単位(a10)との繰り返し構造を有する高分子化合物;構成単位(a0)と構成単位(a1)と構成単位(a10)との繰り返し構造を有する高分子化合物が挙げられる。 The component (A1) used in this embodiment is a polymer compound having a structural unit (a0), preferably a polymer compound having a repeating structure of a structural unit (a0) and a structural unit (a10); a structural unit Examples include polymer compounds having a repeating structure of (a0), a structural unit (a1), and a structural unit (a10).
 かかる(A1)成分は、各構成単位を誘導するモノマーを重合溶媒に溶解し、ここに、例えばアゾビスイソブチロニトリル(AIBN)、アゾビスイソ酪酸ジメチル(例えばV-601など)等のラジカル重合開始剤を加えて重合することにより製造することができる。
 例えば、かかる(A1)成分は、構成単位(a0)を誘導するモノマーと、構成単位(a10)を誘導するモノマーと、を重合溶媒に溶解し、ここに、上記のようなラジカル重合開始剤を加えて重合し、その後、脱保護反応を行うことにより製造することができる。
 なお、重合の際に、例えば、HS-CH-CH-CH-C(CF-OHのような連鎖移動剤を併用して用いることにより、末端に-C(CF-OH基を導入してもよい。このように、アルキル基の水素原子の一部がフッ素原子で置換されたヒドロキシアルキル基が導入された共重合体は、現像欠陥の低減やLER(ラインエッジラフネス:ライン側壁の不均一な凹凸)の低減に有効である。
The component (A1) is prepared by dissolving monomers for inducing each structural unit in a polymerization solvent, and then initiating radical polymerization of, for example, azobisisobutyronitrile (AIBN), dimethyl azobisisobutyrate (for example, V-601, etc.). It can be manufactured by adding an agent and polymerizing it.
For example, the component (A1) can be prepared by dissolving a monomer inducing the structural unit (a0) and a monomer inducing the structural unit (a10) in a polymerization solvent, and then adding the above-mentioned radical polymerization initiator thereto. It can be produced by additionally polymerizing and then performing a deprotection reaction.
In addition, during polymerization, for example, by using a chain transfer agent such as HS-CH 2 -CH 2 -CH 2 -C(CF 3 ) 2 -OH in combination, -C(CF 3 ) is added to the terminal. 2 -OH group may be introduced. In this way, a copolymer into which a hydroxyalkyl group is introduced in which some of the hydrogen atoms of the alkyl group are replaced with fluorine atoms can reduce development defects and reduce LER (line edge roughness: unevenness of line sidewalls). It is effective in reducing
 (A1)成分の重量平均分子量(Mw)(ゲルパーミエーションクロマトグラフィー(GPC)によるポリスチレン換算基準)は、特に限定されるものではなく、1000~40000が好ましく、2000~20000がより好ましく、5000~10000がさらに好ましい。
 (A1)成分のMwがこの範囲の好ましい上限値以下であると、レジストとして用いるのに充分なレジスト溶剤への溶解性があり、この範囲の好ましい下限値以上であると、耐ドライエッチング性やレジストパターン断面形状が良好である。
 (A1)成分の分子量分散度(Mw/Mn)は、特に限定されず、1.0~4.0が好ましく、1.0~3.0がより好ましく、1.0~2.0が特に好ましい。なお、Mnは数平均分子量を示す。
The weight average molecular weight (Mw) of the component (A1) (polystyrene conversion standard determined by gel permeation chromatography (GPC)) is not particularly limited, and is preferably from 1,000 to 40,000, more preferably from 2,000 to 20,000, and from 5,000 to 10,000 is more preferable.
When the Mw of component (A1) is below the preferable upper limit of this range, it has sufficient solubility in a resist solvent to be used as a resist, and when it is above the preferable lower limit of this range, it has good dry etching resistance. The cross-sectional shape of the resist pattern is good.
The molecular weight dispersity (Mw/Mn) of component (A1) is not particularly limited, and is preferably 1.0 to 4.0, more preferably 1.0 to 3.0, particularly 1.0 to 2.0. preferable. In addition, Mn indicates a number average molecular weight.
・(A2)成分について
 本実施形態のレジスト組成物は、(A)成分として、前記(A1)成分に該当しない、酸の作用により現像液に対する溶解性が変化する基材成分(以下「(A2)成分」という。)を併用してもよい。
 (A2)成分としては、特に限定されず、化学増幅型レジスト組成物用の基材成分として従来から知られている多数のものから任意に選択して用いればよい。
 (A2)成分は、高分子化合物又は低分子化合物の1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
・About the (A2) component The resist composition of the present embodiment contains, as the (A) component, a base material component (hereinafter referred to as "(A2) ) may be used in combination.
The component (A2) is not particularly limited, and may be arbitrarily selected from a large number of components conventionally known as base components for chemically amplified resist compositions.
As component (A2), one type of high molecular compound or low molecular compound may be used alone, or two or more types may be used in combination.
 (A)成分中の(A1)成分の割合は、(A)成分の総質量に対し、25質量%以上が好ましく、50質量%以上がより好ましく、75質量%以上がさらに好ましく、100質量%であってもよい。該割合が25質量%以上であると、高感度化や解像性、パターン寸法の均一性などの種々のリソグラフィー特性に優れたレジストパターンが形成されやすくなる。 The proportion of component (A1) in component (A) is preferably 25% by mass or more, more preferably 50% by mass or more, even more preferably 75% by mass or more, and 100% by mass, based on the total mass of component (A). It may be. When the proportion is 25% by mass or more, a resist pattern that is excellent in various lithography properties such as high sensitivity, resolution, and uniformity of pattern dimensions is easily formed.
 本実施形態のレジスト組成物中、(A)成分の含有量は、形成しようとするレジスト膜厚等に応じて調整すればよい。 In the resist composition of this embodiment, the content of component (A) may be adjusted depending on the thickness of the resist film to be formed.
<その他成分>
 本実施形態のレジスト組成物は、上述した(A)成分に加え、その他成分をさらに含有してもよい。その他成分としては、例えば以下に示す(B)成分、(D)成分、(E)成分、(F)成分、(S)成分などが挙げられる。
<Other ingredients>
The resist composition of this embodiment may further contain other components in addition to the component (A) described above. Other components include, for example, the following components (B), (D), (E), (F), and (S).
 ≪酸発生剤成分(B)≫
 本実施形態のレジスト組成物は、さらに、露光により酸を発生する酸発生剤成分(B)を含有してもよい。
 (B)成分としては、特に限定されず、これまで化学増幅型レジスト組成物用の酸発生剤として提案されているものを用いることができる。
 このような酸発生剤としては、ヨードニウム塩やスルホニウム塩などのオニウム塩系酸発生剤、オキシムスルホネート系酸発生剤;ビスアルキル又はビスアリールスルホニルジアゾメタン類、ポリ(ビススルホニル)ジアゾメタン類などのジアゾメタン系酸発生剤;ニトロベンジルスルホネート系酸発生剤、イミノスルホネート系酸発生剤、ジスルホン系酸発生剤など多種のものが挙げられる。
≪Acid generator component (B)≫
The resist composition of this embodiment may further contain an acid generator component (B) that generates acid upon exposure.
Component (B) is not particularly limited, and those that have been proposed as acid generators for chemically amplified resist compositions can be used.
Such acid generators include onium salt acid generators such as iodonium salts and sulfonium salts; oxime sulfonate acid generators; diazomethane-based acid generators such as bisalkyl or bisarylsulfonyl diazomethanes and poly(bissulfonyl)diazomethanes; Acid generators include a wide variety of acid generators such as nitrobenzylsulfonate acid generators, iminosulfonate acid generators, and disulfone acid generators.
 オニウム塩系酸発生剤としては、例えば、下記の一般式(b-1)で表される化合物(以下「(b-1)成分」ともいう)、一般式(b-2)で表される化合物(以下「(b-2)成分」ともいう)又は一般式(b-3)で表される化合物(以下「(b-3)成分」ともいう)が挙げられる。 Examples of onium salt-based acid generators include compounds represented by the following general formula (b-1) (hereinafter also referred to as "component (b-1)"), and compounds represented by the general formula (b-2). Examples include a compound (hereinafter also referred to as "component (b-2)") or a compound represented by general formula (b-3) (hereinafter also referred to as "component (b-3)").
Figure JPOXMLDOC01-appb-C000064
[式中、R101及びR104~R108は、それぞれ独立に、置換基を有していてもよい環式基、置換基を有していてもよい鎖状のアルキル基、又は置換基を有していてもよい鎖状のアルケニル基である。R104とR105とは相互に結合して環構造を形成していてもよい。R102は、炭素原子数1~5のフッ素化アルキル基又はフッ素原子である。Y101は、酸素原子を含む2価の連結基又は単結合である。V101~V103は、それぞれ独立に、単結合、アルキレン基又はフッ素化アルキレン基である。L101~L102は、それぞれ独立に、単結合又は酸素原子である。L103~L105は、それぞれ独立に、単結合、-CO-又は-SO-である。mは1以上の整数であって、M’m+はm価のオニウムカチオンである。]
Figure JPOXMLDOC01-appb-C000064
[In the formula, R 101 and R 104 to R 108 each independently represent a cyclic group that may have a substituent, a chain alkyl group that may have a substituent, or a substituent. It is a chain alkenyl group that may have. R 104 and R 105 may be bonded to each other to form a ring structure. R 102 is a fluorinated alkyl group having 1 to 5 carbon atoms or a fluorine atom. Y 101 is a divalent linking group or a single bond containing an oxygen atom. V 101 to V 103 each independently represent a single bond, an alkylene group, or a fluorinated alkylene group. L 101 to L 102 are each independently a single bond or an oxygen atom. L 103 to L 105 are each independently a single bond, -CO- or -SO 2 -. m is an integer of 1 or more, and M' m+ is an m-valent onium cation. ]
 {アニオン部}
 ・(b-1)成分におけるアニオン
 式(b-1)中、R101は、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基である。
{Anion part}
- Anion in component (b-1) In formula (b-1), R 101 is a cyclic group that may have a substituent, a chain alkyl group that may have a substituent, or a substituent It is a chain alkenyl group which may have.
 置換基を有してもよい環式基:
 該環式基は、環状の炭化水素基であることが好ましく、該環状の炭化水素基は、芳香族炭化水素基であってもよく、脂肪族炭化水素基であってもよい。脂肪族炭化水素基は、芳香族性を持たない炭化水素基を意味する。また、脂肪族炭化水素基は、飽和であることが好ましい。
Cyclic group that may have a substituent:
The cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group. Aliphatic hydrocarbon group means a hydrocarbon group without aromaticity. Moreover, it is preferable that the aliphatic hydrocarbon group is saturated.
 R101における芳香族炭化水素基は、芳香環を有する炭化水素基である。該芳香族炭化水素基の炭素原子数は3~30であることが好ましく、5~30であることがより好ましく、5~20がさらに好ましく、6~15が特に好ましく、6~10が最も好ましい。但し、該炭素原子数には、置換基における炭素原子数を含まないものとする。
 R101における芳香族炭化水素基が有する芳香環として具体的には、ベンゼン、フルオレン、ナフタレン、アントラセン、フェナントレン、ビフェニル、又はこれらの芳香環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環などが挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。
 R101における芳香族炭化水素基として具体的には、前記芳香環から水素原子を1つ除いた基(アリール基:例えば、フェニル基、ナフチル基など)、前記芳香環の水素原子の1つがアルキレン基で置換された基(例えば、ベンジル基、フェネチル基、1-ナフチルメチル基など)等が挙げられる。前記アルキレン基(アリールアルキル基中のアルキル鎖)の炭素原子数は、1~4であることが好ましく、1~2であることがより好ましく、1であることが特に好ましい。
The aromatic hydrocarbon group in R 101 is a hydrocarbon group having an aromatic ring. The number of carbon atoms in the aromatic hydrocarbon group is preferably 3 to 30, more preferably 5 to 30, even more preferably 5 to 20, particularly preferably 6 to 15, and most preferably 6 to 10. . However, the number of carbon atoms does not include the number of carbon atoms in substituents.
Specifically, the aromatic ring possessed by the aromatic hydrocarbon group in R 101 is benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, or some of the carbon atoms constituting these aromatic rings are substituted with heteroatoms. Examples include aromatic heterocycles. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom.
Specifically, the aromatic hydrocarbon group in R 101 includes a group in which one hydrogen atom is removed from the aromatic ring (aryl group: e.g., phenyl group, naphthyl group, etc.), a group in which one hydrogen atom in the aromatic ring is alkylene Examples include groups substituted with groups (eg, benzyl group, phenethyl group, 1-naphthylmethyl group, etc.). The number of carbon atoms in the alkylene group (alkyl chain in the arylalkyl group) is preferably 1 to 4, more preferably 1 to 2, and particularly preferably 1.
 R101における環状の脂肪族炭化水素基は、構造中に環を含む脂肪族炭化水素基が挙げられる。
 この構造中に環を含む脂肪族炭化水素基としては、脂環式炭化水素基(脂肪族炭化水素環から水素原子を1個除いた基)、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の末端に結合した基、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の途中に介在する基などが挙げられる。
 前記脂環式炭化水素基は、炭素原子数が3~20であることが好ましく、3~12であることがより好ましい。
 前記脂環式炭化水素基は、多環式基であってもよく、単環式基であってもよい。単環式の脂環式炭化水素基としては、モノシクロアルカンから1個以上の水素原子を除いた基が好ましい。該モノシクロアルカンとしては、炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。多環式の脂環式炭化水素基としては、ポリシクロアルカンから1個以上の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては、炭素原子数7~30のものが好ましい。中でも、該ポリシクロアルカンとしては、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等の架橋環系の多環式骨格を有するポリシクロアルカン;ステロイド骨格を有する環式基等の縮合環系の多環式骨格を有するポリシクロアルカンがより好ましい。
Examples of the cyclic aliphatic hydrocarbon group in R 101 include aliphatic hydrocarbon groups containing a ring in the structure.
The aliphatic hydrocarbon group containing a ring in its structure includes an alicyclic hydrocarbon group (a group in which one hydrogen atom is removed from an aliphatic hydrocarbon ring), and an alicyclic hydrocarbon group that is linear or branched. Examples thereof include a group bonded to the end of a chain aliphatic hydrocarbon group, and a group in which an alicyclic hydrocarbon group is interposed in the middle of a linear or branched aliphatic hydrocarbon group.
The alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, more preferably 3 to 12 carbon atoms.
The alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group. As the monocyclic alicyclic hydrocarbon group, a group obtained by removing one or more hydrogen atoms from a monocycloalkane is preferable. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 30 carbon atoms. Among these, the polycycloalkanes include polycycloalkanes having polycyclic skeletons such as adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane; condensed ring systems such as cyclic groups having steroid skeletons; More preferred are polycycloalkanes having a polycyclic skeleton.
 なかでも、R101における環状の脂肪族炭化水素基としては、モノシクロアルカンまたはポリシクロアルカンから水素原子を1つ以上除いた基が好ましく、ポリシクロアルカンから水素原子を1つ除いた基がより好ましく、アダマンチル基、ノルボルニル基がさらに好ましく、アダマンチル基が特に好ましい。 Among these, as the cyclic aliphatic hydrocarbon group for R 101 , a group obtained by removing one or more hydrogen atoms from a monocycloalkane or polycycloalkane is preferable, and a group obtained by removing one hydrogen atom from a polycycloalkane is more preferable. Preferably, an adamantyl group and a norbornyl group are more preferable, and an adamantyl group is particularly preferable.
 脂環式炭化水素基に結合してもよい、直鎖状の脂肪族炭化水素基は、炭素原子数が1~10であることが好ましく、1~6がより好ましく、1~4がさらに好ましく、1~3が最も好ましい。直鎖状の脂肪族炭化水素基としては、直鎖状のアルキレン基が好ましく、具体的には、メチレン基[-CH-]、エチレン基[-(CH-]、トリメチレン基[-(CH-]、テトラメチレン基[-(CH-]、ペンタメチレン基[-(CH-]等が挙げられる。
 脂環式炭化水素基に結合してもよい、分岐鎖状の脂肪族炭化水素基は、炭素原子数が2~10であることが好ましく、3~6がより好ましく、3又は4がさらに好ましく、3が最も好ましい。分岐鎖状の脂肪族炭化水素基としては、分岐鎖状のアルキレン基が好ましく、具体的には、-CH(CH)-、-CH(CHCH)-、-C(CH-、-C(CH)(CHCH)-、-C(CH)(CHCHCH)-、-C(CHCH-等のアルキルメチレン基;-CH(CH)CH-、-CH(CH)CH(CH)-、-C(CHCH-、-CH(CHCH)CH-、-C(CHCH-CH-等のアルキルエチレン基;-CH(CH)CHCH-、-CHCH(CH)CH-等のアルキルトリメチレン基;-CH(CH)CHCHCH-、-CHCH(CH)CHCH-等のアルキルテトラメチレン基などのアルキルアルキレン基等が挙げられる。アルキルアルキレン基におけるアルキル基としては、炭素原子数1~5の直鎖状のアルキル基が好ましい。
The linear aliphatic hydrocarbon group that may be bonded to the alicyclic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, and even more preferably 1 to 4 carbon atoms. , 1 to 3 are most preferred. As the linear aliphatic hydrocarbon group, a linear alkylene group is preferable, and specifically, a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [ -(CH 2 ) 3 -], tetramethylene group [-(CH 2 ) 4 -], pentamethylene group [-(CH 2 ) 5 -], and the like.
The branched aliphatic hydrocarbon group that may be bonded to the alicyclic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably 3 to 6 carbon atoms, and even more preferably 3 or 4 carbon atoms. , 3 are most preferred. As the branched aliphatic hydrocarbon group, a branched alkylene group is preferable, and specifically, -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 - and other alkylmethylene groups; CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 Alkylethylene groups such as CH 3 ) 2 -CH 2 -; -CH(CH 3 )CH 2 CH 2 -, alkyltrimethylene groups such as -CH 2 CH(CH 3 )CH 2 -; -CH(CH 3 ) Examples include alkylalkylene groups such as alkyltetramethylene groups such as CH 2 CH 2 CH 2 -, -CH 2 CH (CH 3 )CH 2 CH 2 -, and the like. The alkyl group in the alkylalkylene group is preferably a linear alkyl group having 1 to 5 carbon atoms.
 また、R101における環状の炭化水素基は、複素環等のようにヘテロ原子を含んでもよい。具体的には、前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基、下記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基、その他上記の化学式(r-hr-1)~(r-hr-16)でそれぞれ表される複素環式基が挙げられる。
 式中*は、式(b-1)中のY101に結合する結合手を表す。
Furthermore, the cyclic hydrocarbon group in R 101 may contain a heteroatom such as a heterocycle. Specifically, lactone-containing cyclic groups represented by the above general formulas (a2-r-1) to (a2-r-7), respectively, and the following general formulas (b5-r-1) to (b5-r- -SO 2 --containing cyclic groups represented by 4), and heterocyclic groups represented by the above chemical formulas (r-hr-1) to (r-hr-16), respectively.
In the formula, * represents a bond bonded to Y 101 in formula (b-1).
Figure JPOXMLDOC01-appb-C000065
[式中、Rb’51はそれぞれ独立に水素原子、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、-COOR”、-OC(=O)R”、ヒドロキシアルキル基またはシアノ基であり;R”は水素原子、アルキル基、ラクトン含有環式基、又は、-SO-含有環式基であり;B”は酸素原子もしくは硫黄原子を含んでいてもよい炭素原子数1~5のアルキレン基、酸素原子または硫黄原子であり、n’は0~2の整数である。*は結合手を示す。]
Figure JPOXMLDOC01-appb-C000065
[In the formula, Rb' 51 is each independently a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, -COOR", -OC(=O)R", a hydroxyalkyl group, or a cyano group Yes; R" is a hydrogen atom, an alkyl group, a lactone-containing cyclic group, or a -SO 2 --containing cyclic group; B" has 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom is an alkylene group, an oxygen atom or a sulfur atom, and n' is an integer of 0 to 2. * indicates a bond. ]
 前記一般式(b5-r-1)~(b5-r-4)中のRb’51、B”、及びn’は、上述の一般式(a0-s-1)~(a0-s-4)中のRb’51、B”、及びn’とそれぞれ同様である。 Rb' 51 , B", and n' in the general formulas (b5-r-1) to (b5-r-4) are represented by the general formulas (a0-s-1) to (a0-s-4) ), respectively, are the same as Rb' 51 , B'', and n'.
 下記に一般式(b5-r-1)~(b5-r-4)でそれぞれ表される基の具体例を挙げる。式中の「Ac」は、アセチル基を示す。 Specific examples of groups represented by general formulas (b5-r-1) to (b5-r-4) are listed below. "Ac" in the formula represents an acetyl group.
Figure JPOXMLDOC01-appb-C000066
Figure JPOXMLDOC01-appb-C000066
Figure JPOXMLDOC01-appb-C000067
Figure JPOXMLDOC01-appb-C000067
Figure JPOXMLDOC01-appb-C000068
Figure JPOXMLDOC01-appb-C000068
 R101の環式基における置換基としては、例えば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基等が挙げられる。
 置換基としてのアルキル基としては、炭素原子数1~5のアルキル基が好ましい。
 置換基としてのアルコキシ基としては、炭素原子数1~5のアルコキシ基が好ましく、メトキシ基、エトキシ基、n-プロポキシ基、iso-プロポキシ基、n-ブトキシ基、tert-ブトキシ基がより好ましく、メトキシ基、エトキシ基が最も好ましい。
 置換基としてのハロゲン原子としては、フッ素原子、臭素原子、ヨウ素原子が好ましい。
 置換基としてのハロゲン化アルキル基としては、炭素原子数1~5のアルキル基、例えばメチル基、エチル基、プロピル基、n-ブチル基、tert-ブチル基等の水素原子の一部または全部が前記ハロゲン原子で置換された基が挙げられる。
 置換基としてのカルボニル基は、環状の炭化水素基を構成するメチレン基(-CH-)を置換する基である。
Examples of the substituent in the cyclic group of R 101 include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, and the like.
The alkyl group as a substituent is preferably an alkyl group having 1 to 5 carbon atoms.
The alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, ethoxy group, n-propoxy group, iso-propoxy group, n-butoxy group, or tert-butoxy group. Most preferred are methoxy and ethoxy groups.
The halogen atom used as a substituent is preferably a fluorine atom, a bromine atom, or an iodine atom.
Examples of the halogenated alkyl group as a substituent include an alkyl group having 1 to 5 carbon atoms, such as a methyl group, an ethyl group, a propyl group, an n-butyl group, a tert-butyl group, etc., in which some or all of the hydrogen atoms are Examples include groups substituted with the aforementioned halogen atoms.
The carbonyl group as a substituent is a group that substitutes a methylene group (-CH 2 -) constituting a cyclic hydrocarbon group.
 R101における環状の炭化水素基は、脂肪族炭化水素環と芳香環とが縮合した縮合環を含む縮合環式基であってもよい。前記縮合環としては、例えば、架橋環系の多環式骨格を有するポリシクロアルカンに、1個以上の芳香環が縮合したもの等が挙げられる。前記架橋環系ポリシクロアルカンの具体例としては、ビシクロ[2.2.1]ヘプタン(ノルボルナン)、ビシクロ[2.2.2]オクタン等のビシクロアルカンが挙げられる。前記縮合環式としては、ビシクロアルカンに2個又は3個の芳香環が縮合した縮合環を含む基が好ましく、ビシクロ[2.2.2]オクタンに2個又は3個の芳香環が縮合した縮合環を含む基がより好ましい。R101における縮合環式基の具体例としては、下記式(r-br-1)~(r-br-2)で表されるが挙げられる。式中*は、式(b-1)中のY101に結合する結合手を表す。 The cyclic hydrocarbon group in R 101 may be a fused cyclic group containing a fused ring in which an aliphatic hydrocarbon ring and an aromatic ring are fused. Examples of the fused ring include one in which one or more aromatic rings are fused to a polycycloalkane having a polycyclic skeleton of a bridged ring system. Specific examples of the bridged ring polycycloalkanes include bicycloalkanes such as bicyclo[2.2.1]heptane (norbornane) and bicyclo[2.2.2]octane. The fused ring type is preferably a group containing a fused ring in which two or three aromatic rings are fused to a bicycloalkane, and a group containing a fused ring in which two or three aromatic rings are fused to a bicyclo[2.2.2]octane. More preferred are groups containing fused rings. Specific examples of the fused cyclic group for R 101 include those represented by the following formulas (r-br-1) to (r-br-2). In the formula, * represents a bond bonded to Y 101 in formula (b-1).
Figure JPOXMLDOC01-appb-C000069
Figure JPOXMLDOC01-appb-C000069
 R101における縮合環式基が有していてもよい置換基としては、例えば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基、芳香族炭化水素基、脂環式炭化水素基等が挙げられる。
 前記縮合環式基の置換基としてのアルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基は、上記R101における環式基の置換基として挙げたものと同様のものが挙げられる。
 前記縮合環式基の置換基としての芳香族炭化水素基としては、芳香環から水素原子を1つ除いた基(アリール基:例えば、フェニル基、ナフチル基など)、前記芳香環の水素原子の1つがアルキレン基で置換された基(例えば、ベンジル基、フェネチル基、1-ナフチルメチル基、2-ナフチルメチル基、1-ナフチルエチル基、2-ナフチルエチル基等のアリールアルキル基など)、上記の化学式(r-hr-1)~(r-hr-6)でそれぞれ表される複素環式基等が挙げられる。
 前記縮合環式基の置換基としての脂環式炭化水素基としては、シクロペンタン、シクロヘキサン等のモノシクロアルカンから1個の水素原子を除いた基;アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等のポリシクロアルカンから1個の水素原子を除いた基;前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基;前記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基;前記式(r-hr-7)~(r-hr-16)でそれぞれ表される複素環式基等が挙げられる。
Examples of substituents that the fused cyclic group in R 101 may have include alkyl groups, alkoxy groups, halogen atoms, halogenated alkyl groups, hydroxyl groups, carbonyl groups, nitro groups, aromatic hydrocarbon groups, and aliphatic groups. Examples include cyclic hydrocarbon groups.
Examples of the alkyl group, alkoxy group, halogen atom, and halogenated alkyl group as a substituent for the fused cyclic group include those listed as the substituent for the cyclic group in R 101 above.
Examples of the aromatic hydrocarbon group as a substituent for the fused cyclic group include a group in which one hydrogen atom is removed from the aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one hydrogen atom is removed from the aromatic ring, A group in which one of the groups is substituted with an alkylene group (for example, an arylalkyl group such as a benzyl group, a phenethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group, a 2-naphthylethyl group, etc.), the above Examples include heterocyclic groups represented by the chemical formulas (r-hr-1) to (r-hr-6), respectively.
Examples of the alicyclic hydrocarbon group as a substituent for the fused cyclic group include groups obtained by removing one hydrogen atom from a monocycloalkane such as cyclopentane and cyclohexane; adamantane, norbornane, isobornane, tricyclodecane, and tetracycloalkane; A group obtained by removing one hydrogen atom from a polycycloalkane such as cyclododecane; a lactone-containing cyclic group represented by the above general formulas (a2-r-1) to (a2-r-7); a lactone-containing cyclic group represented by the above general formula -SO 2 --containing cyclic groups represented by (b5-r-1) to (b5-r-4), respectively; represented by the formulas (r-hr-7) to (r-hr-16), respectively; Examples include heterocyclic groups such as
 置換基を有してもよい鎖状のアルキル基:
 R101の鎖状のアルキル基としては、直鎖状又は分岐鎖状のいずれでもよい。
 直鎖状のアルキル基としては、炭素原子数が1~20であることが好ましく、1~15であることがより好ましく、1~10が最も好ましい。
 分岐鎖状のアルキル基としては、炭素原子数が3~20であることが好ましく、3~15であることがより好ましく、3~10が最も好ましい。具体的には、例えば、1-メチルエチル基、1-メチルプロピル基、2-メチルプロピル基、1-メチルブチル基、2-メチルブチル基、3-メチルブチル基、1-エチルブチル基、2-エチルブチル基、1-メチルペンチル基、2-メチルペンチル基、3-メチルペンチル基、4-メチルペンチル基などが挙げられる。
Chain-like alkyl group which may have a substituent:
The chain alkyl group for R 101 may be either linear or branched.
The linear alkyl group preferably has 1 to 20 carbon atoms, more preferably 1 to 15 carbon atoms, and most preferably 1 to 10 carbon atoms.
The branched alkyl group preferably has 3 to 20 carbon atoms, more preferably 3 to 15 carbon atoms, and most preferably 3 to 10 carbon atoms. Specifically, for example, 1-methylethyl group, 1-methylpropyl group, 2-methylpropyl group, 1-methylbutyl group, 2-methylbutyl group, 3-methylbutyl group, 1-ethylbutyl group, 2-ethylbutyl group, Examples include 1-methylpentyl group, 2-methylpentyl group, 3-methylpentyl group, and 4-methylpentyl group.
 置換基を有してもよい鎖状のアルケニル基:
 R101の鎖状のアルケニル基としては、直鎖状又は分岐鎖状のいずれでもよく、炭素原子数が2~10であることが好ましく、2~5がより好ましく、2~4がさらに好ましく、3が特に好ましい。直鎖状のアルケニル基としては、例えば、ビニル基、プロペニル基(アリル基)、ブテニル基などが挙げられる。分岐鎖状のアルケニル基としては、例えば、1-メチルビニル基、2-メチルビニル基、1-メチルプロペニル基、2-メチルプロペニル基などが挙げられる。
 鎖状のアルケニル基としては、上記の中でも、直鎖状のアルケニル基が好ましく、ビニル基、プロペニル基がより好ましく、ビニル基が特に好ましい。
Chain-like alkenyl group which may have a substituent:
The chain alkenyl group for R 101 may be linear or branched, and preferably has 2 to 10 carbon atoms, more preferably 2 to 5, and even more preferably 2 to 4 carbon atoms. 3 is particularly preferred. Examples of the linear alkenyl group include a vinyl group, a propenyl group (allyl group), and a butenyl group. Examples of the branched alkenyl group include 1-methylvinyl group, 2-methylvinyl group, 1-methylpropenyl group, and 2-methylpropenyl group.
As the chain alkenyl group, among the above, a straight chain alkenyl group is preferable, a vinyl group and a propenyl group are more preferable, and a vinyl group is particularly preferable.
 R101の鎖状のアルキル基またはアルケニル基における置換基としては、例えば、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基、アミノ基、上記R101における環式基等が挙げられる。 Examples of the substituent in the chain alkyl group or alkenyl group of R 101 include an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, and the cyclic group in R 101 above. Can be mentioned.
 上記の中でも、R101は、置換基を有してもよい環式基が好ましく、置換基を有してもよい環状の炭化水素基であることがより好ましい。
 環状の炭化水素基として、より具体的には、フェニル基、ナフチル基、ポリシクロアルカンから1個以上の水素原子を除いた基;前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基;前記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基が好ましく、ポリシクロアルカンから1個以上の水素原子を除いた基がより好ましく、アダマンチル基がさらに好ましい。
Among the above, R 101 is preferably a cyclic group that may have a substituent, and more preferably a cyclic hydrocarbon group that may have a substituent.
More specifically, the cyclic hydrocarbon group includes a phenyl group, a naphthyl group, a group obtained by removing one or more hydrogen atoms from a polycycloalkane; the general formulas (a2-r-1) to (a2-r- 7) Lactone-containing cyclic groups represented by formulas (b5-r-1) to (b5-r- 4 ) are preferred, and polycycloalkane-containing cyclic groups are preferred. A group obtained by removing one or more hydrogen atoms from is more preferable, and an adamantyl group is even more preferable.
 式(b-1)中、Y101は、単結合または酸素原子を含む2価の連結基である。
 Y101が酸素原子を含む2価の連結基である場合、該Y101は、酸素原子以外の原子を含有してもよい。酸素原子以外の原子としては、例えば炭素原子、水素原子、硫黄原子、窒素原子等が挙げられる。
 酸素原子を含む2価の連結基としては、例えば、上記の一般式(y-al-1)~(y-al-8)でそれぞれ表される連結基が挙げられる。なお、一般式(y-al-1)~(y-al-8)において、上記式(b-1)中のR101と結合するのが、一般式(y-al-1)~(y-al-8)中のV’101である。
In formula (b-1), Y 101 is a single bond or a divalent linking group containing an oxygen atom.
When Y 101 is a divalent linking group containing an oxygen atom, Y 101 may contain atoms other than the oxygen atom. Examples of atoms other than oxygen atoms include carbon atoms, hydrogen atoms, sulfur atoms, and nitrogen atoms.
Examples of the divalent linking group containing an oxygen atom include linking groups represented by the above general formulas (y-al-1) to (y-al-8), respectively. In addition, in the general formulas (y-al-1) to (y-al-8), the bond to R 101 in the above formula (b-1) is the general formula (y-al-1) to (y-al-1) to (y-al-8). -al-8) is V' 101 .
 Y101としては、エステル結合を含む2価の連結基、またはエーテル結合を含む2価の連結基が好ましく、上記式(y-al-1)~(y-al-6)でそれぞれ表される連結基がより好ましい。 Y 101 is preferably a divalent linking group containing an ester bond or a divalent linking group containing an ether bond, each represented by the above formulas (y-al-1) to (y-al-6). A linking group is more preferred.
 式(b-1)中、V101は、単結合、アルキレン基又はフッ素化アルキレン基である。V101におけるアルキレン基、フッ素化アルキレン基は、炭素原子数1~4であることが好ましい。なかでも、V101は、単結合、又は炭素原子数1~4の直鎖状のアルキレン基であることが好ましい。
 ただし、式(b-1)中のY101及びV101は、同時に単結合になることはない。
In formula (b-1), V 101 is a single bond, an alkylene group, or a fluorinated alkylene group. The alkylene group and fluorinated alkylene group in V 101 preferably have 1 to 4 carbon atoms. Among these, V 101 is preferably a single bond or a linear alkylene group having 1 to 4 carbon atoms.
However, Y 101 and V 101 in formula (b-1) do not simultaneously become a single bond.
 式(b-1)中、R102は、フッ素原子又は炭素原子数1~5のフッ素化アルキル基である。R102は、フッ素原子または炭素原子数1~5のパーフルオロアルキル基であることが好ましく、フッ素原子であることがより好ましい。 In formula (b-1), R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. R 102 is preferably a fluorine atom or a perfluoroalkyl group having 1 to 5 carbon atoms, and more preferably a fluorine atom.
 前記式(b-1)で表されるアニオン部の具体例としては、例えば、Y101が単結合となる場合、トリフルオロメタンスルホネートアニオンやパーフルオロブタンスルホネートアニオン等のフッ素化アルキルスルホネートアニオンが挙げられ;Y101が酸素原子を含む2価の連結基である場合、下記式(an-1)~(an-3)のいずれかで表されるアニオンが挙げられる。 Specific examples of the anion moiety represented by the formula (b-1) include, for example, when Y 101 is a single bond, fluorinated alkyl sulfonate anions such as trifluoromethanesulfonate anions and perfluorobutanesulfonate anions. ; When Y 101 is a divalent linking group containing an oxygen atom, examples thereof include anions represented by any of the following formulas (an-1) to (an-3).
Figure JPOXMLDOC01-appb-C000070
[式中、R”101は、置換基を有してもよい脂肪族環式基、上記の化学式(r-hr-1)~(r-hr-6)でそれぞれ表される1価の複素環式基、前記式(r-br-1)若しくは(r-br-2)で表される縮合環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい芳香族環式基である。R”102は、置換基を有してもよい脂肪族環式基、前記式(r-br-1)又(r-br-2)で表される縮合環式基、前記一般式(a2-r-1)、(a2-r-3)~(a2-r-7)でそれぞれ表されるラクトン含有環式基、又は前記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基である。R”103は、置換基を有してもよい芳香族環式基、置換基を有してもよい脂肪族環式基、又は置換基を有してもよい鎖状のアルケニル基である。V”101は、単結合、炭素原子数1~4のアルキレン基、又は炭素原子数1~4のフッ素化アルキレン基である。R102は、フッ素原子又は炭素原子数1~5のフッ素化アルキル基である。v”はそれぞれ独立に0~3の整数であり、q”はそれぞれ独立に0~20の整数であり、n”は0または1である。]
Figure JPOXMLDOC01-appb-C000070
[In the formula, R''101 is an aliphatic cyclic group which may have a substituent, a monovalent heterocyclic group represented by the above chemical formulas (r-hr-1) to (r-hr-6), respectively. A cyclic group, a fused cyclic group represented by the above formula (r-br-1) or (r-br-2), a chain alkyl group that may have a substituent, or a chain alkyl group that has a substituent. R''102 is an aliphatic cyclic group which may have a substituent, and is represented by the above formula (r-br-1) or (r-br-2). a fused cyclic group represented by the general formula (a2-r-1), (a2-r-3) to (a2-r-7), or a lactone-containing cyclic group represented by the general formula (b5- -SO 2 --containing cyclic groups represented by r-1) to (b5-r-4), respectively. R''103 is an aromatic cyclic group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain alkenyl group which may have a substituent. V" 101 is a single bond, an alkylene group having 1 to 4 carbon atoms, or a fluorinated alkylene group having 1 to 4 carbon atoms. R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. v'' are each independently an integer from 0 to 3, q'' are each independently an integer from 0 to 20, and n'' is 0 or 1.]
 R”101、R”102およびR”103の置換基を有してもよい脂肪族環式基は、前記式(b-1)中のR101における環状の脂肪族炭化水素基として例示した基であることが好ましい。前記置換基としては、前記式(b-1)中のR101における環状の脂肪族炭化水素基を置換してもよい置換基と同様のものが挙げられる。 The aliphatic cyclic group which may have a substituent for R'' 101 , R'' 102 and R'' 103 is the group exemplified as the cyclic aliphatic hydrocarbon group for R 101 in formula (b-1) above. It is preferable that the substituent is the same as the substituent that may substitute the cyclic aliphatic hydrocarbon group in R 101 in the formula (b-1).
 R”101及びR”103における置換基を有してもよい芳香族環式基は、前記式(b-1)中のR101における環状の炭化水素基における芳香族炭化水素基として例示した基であることが好ましい。前記置換基としては、前記式(b-1)中のR101における該芳香族炭化水素基を置換してもよい置換基と同様のものが挙げられる。 The aromatic cyclic group which may have a substituent in R" 101 and R" 103 is the group exemplified as the aromatic hydrocarbon group in the cyclic hydrocarbon group in R 101 in formula (b-1) above. It is preferable that Examples of the substituent include the same substituents that may substitute the aromatic hydrocarbon group in R 101 in formula (b-1).
 R”101における置換基を有してもよい鎖状のアルキル基は、前記式(b-1)中のR101における鎖状のアルキル基として例示した基であることが好ましい。
 R”103における置換基を有してもよい鎖状のアルケニル基は、前記式(b-1)中のR101における鎖状のアルケニル基として例示した基であることが好ましい。
The chain alkyl group which may have a substituent in R'' 101 is preferably the group exemplified as the chain alkyl group in R 101 in formula (b-1) above.
The chain alkenyl group which may have a substituent in R'' 103 is preferably the group exemplified as the chain alkenyl group in R 101 in formula (b-1) above.
 V”101におけるアルキレン基及びフッ素化アルキレン基は、炭素原子数1~3が好ましく、炭素原子数1又は2がより好ましい。V”101の具体例としては、例えば、-CH-、-(CH-、-CFH-、-CHCFH-、-CH(CF)-等が挙げられる。 The alkylene group and fluorinated alkylene group in V" 101 preferably have 1 to 3 carbon atoms, more preferably 1 or 2 carbon atoms. Specific examples of V" 101 include -CH 2 -, -( Examples include CH 2 ) 2 -, -CFH-, -CH 2 CFH-, -CH(CF 3 )-, and the like.
 前記式(b-1)で表されるアニオン部としては、前記式(an-1)で表されるアニオン部が好ましい。中でも、前記(an-1)中のR”101が、置換基を有してもよい芳香族環式基であるものが好ましく、置換基を有してもよいフェニル基であるものがより好ましい。前記置換基としては、例えば、ヒドロキシ基、アルキル基、又はハロゲン原子が挙げられる。前記ハロゲン原子としては、臭素原子、又はヨウ素原子が好ましく、ヨウ素原子がより好ましい。 The anion moiety represented by the formula (b-1) is preferably an anion moiety represented by the formula (an-1). Among these, those in which R''101 in (an-1) is an aromatic cyclic group which may have a substituent are preferable, and those which are a phenyl group which may have a substituent are more preferable. Examples of the substituent include a hydroxy group, an alkyl group, or a halogen atom.The halogen atom is preferably a bromine atom or an iodine atom, and more preferably an iodine atom.
 ・(b-2)成分におけるアニオン
 式(b-2)中、R104、R105は、それぞれ独立に、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、または置換基を有してもよい鎖状のアルケニル基であり、それぞれ、式(b-1)中のR101と同様のものが挙げられる。ただし、R104、R105は、相互に結合して環を形成していてもよい。
 R104、R105は、置換基を有してもよい鎖状のアルキル基が好ましく、直鎖状若しくは分岐鎖状のアルキル基、又は直鎖状若しくは分岐鎖状のフッ素化アルキル基であることがより好ましい。
 該鎖状のアルキル基の炭素原子数は、1~10であることが好ましく、より好ましくは炭素原子数1~7、さらに好ましくは炭素原子数1~3である。R104、R105の鎖状のアルキル基の炭素原子数は、上記炭素原子数の範囲内において、レジスト用溶剤への溶解性も良好である等の理由により、小さいほど好ましい。また、R104、R105の鎖状のアルキル基においては、フッ素原子で置換されている水素原子の数が多いほど、酸の強度が強くなり、また、250nm以下の高エネルギー光や電子線に対する透明性が向上するため好ましい。前記鎖状のアルキル基中のフッ素原子の割合、すなわちフッ素化率は、好ましくは70~100%、さらに好ましくは90~100%であり、最も好ましくは、全ての水素原子がフッ素原子で置換されたパーフルオロアルキル基である。
 式(b-2)中、V102、V103は、それぞれ独立に、単結合、アルキレン基、またはフッ素化アルキレン基であり、それぞれ、式(b-1)中のV101と同様のものが挙げられる。
 式(b-2)中、L101、L102は、それぞれ独立に単結合又は酸素原子である。
・Anion in component (b-2) In formula (b-2), R 104 and R 105 each independently represent a cyclic group that may have a substituent, or a chain group that may have a substituent. is an alkyl group or a chain alkenyl group which may have a substituent, and examples thereof include those similar to R 101 in formula (b-1). However, R 104 and R 105 may be bonded to each other to form a ring.
R 104 and R 105 are preferably a chain alkyl group that may have a substituent, and are a linear or branched alkyl group or a linear or branched fluorinated alkyl group. is more preferable.
The chain alkyl group preferably has 1 to 10 carbon atoms, more preferably 1 to 7 carbon atoms, and even more preferably 1 to 3 carbon atoms. The number of carbon atoms in the chain alkyl group of R 104 and R 105 is preferably as small as possible within the range of the number of carbon atoms mentioned above, for reasons such as good solubility in a resist solvent. In addition, in the chain alkyl groups of R 104 and R 105 , the greater the number of hydrogen atoms substituted with fluorine atoms, the stronger the acid strength, and the higher the resistance to high energy light and electron beams of 250 nm or less. This is preferable because it improves transparency. The proportion of fluorine atoms in the chain alkyl group, that is, the fluorination rate, is preferably 70 to 100%, more preferably 90 to 100%, and most preferably all hydrogen atoms are substituted with fluorine atoms. It is a perfluoroalkyl group.
In formula (b-2), V 102 and V 103 are each independently a single bond, an alkylene group, or a fluorinated alkylene group, and each of them is the same as V 101 in formula (b-1). Can be mentioned.
In formula (b-2), L 101 and L 102 are each independently a single bond or an oxygen atom.
 ・(b-3)成分におけるアニオン
 式(b-3)中、R106~R108は、それぞれ独立に、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、それぞれ、式(b-1)中のR101と同様のものが挙げられる。
 式(b-3)中、L103~L105は、それぞれ独立に、単結合、-CO-又は-SO-である。
・Anion in component (b-3) In formula (b-3), R 106 to R 108 each independently represent a cyclic group that may have a substituent, or a chain that may have a substituent. is an alkyl group or a chain alkenyl group which may have a substituent, and examples thereof include those similar to R 101 in formula (b-1).
In formula (b-3), L 103 to L 105 are each independently a single bond, -CO- or -SO 2 -.
 {カチオン部}
 前記の式(b-1)、式(b-2)、式(b-3)中、M’m+は、m価のオニウムカチオンを表す。この中でも、スルホニウムカチオン、ヨードニウムカチオンが好ましい。
 mは、1以上の整数である。
{Cation part}
In the above formulas (b-1), (b-2), and formula (b-3), M' m+ represents an m-valent onium cation. Among these, sulfonium cations and iodonium cations are preferred.
m is an integer of 1 or more.
 好ましいカチオン部((M’m+1/m)としては、上記一般式(ca-1)~(ca-3)でそれぞれ表されるオニウムカチオンが挙げられる。カチオン部としては、前記一般式(ca-1)で表されるカチオンがより好ましく、前記式(ca-1-1)~(ca-1-75)でそれぞれ表されるカチオンがさらに好ましい。 Preferred cation moieties ((M' m+ ) 1/m ) include onium cations represented by the above general formulas (ca-1) to (ca-3), respectively. As the cation moiety, cations represented by the general formula (ca-1) are more preferred, and cations represented by the formulas (ca-1-1) to (ca-1-75) are even more preferred.
 本実施形態のレジスト組成物において、(B)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。本実施形態のレジスト組成物においては、上記(A1)成分が構成単位(a0)を有するため、(B)成分を含有しなくてもよい。
 上記の中でも、(B)成分としては、(b-1)成分が好ましい。
In the resist composition of the present embodiment, the component (B) may be used alone or in combination of two or more. In the resist composition of this embodiment, since the component (A1) has the structural unit (a0), it is not necessary to contain the component (B).
Among the above, component (b-1) is preferred as component (B).
 レジスト組成物における(B)成分の含有量は、(A1)成分100質量部に対して、0~30質量部が好ましく、0~20質量部がより好ましく、0~10質量部がさらに好ましい。
 (B)成分の含有量を、前記の好ましい範囲とすることで、レジスト組成物の各成分を有機溶剤に溶解した際、均一な溶液が得られやすく、レジスト組成物としての保存安定性が良好となるため好ましい。
The content of component (B) in the resist composition is preferably 0 to 30 parts by weight, more preferably 0 to 20 parts by weight, and even more preferably 0 to 10 parts by weight, based on 100 parts by weight of component (A1).
By setting the content of component (B) within the above-mentioned preferred range, a uniform solution is easily obtained when each component of the resist composition is dissolved in an organic solvent, and the resist composition has good storage stability. This is preferable.
 ≪塩基成分(D)≫
 本実施形態のレジスト組成物は、(A)成分に加えて、さらに、露光により発生する酸をトラップ(すなわち、酸の拡散を制御)する塩基成分(以下「(D)成分」ともいう)を含有することが好ましい。(D)成分は、レジスト組成物において露光により発生する酸をトラップするクエンチャー(酸拡散制御剤)として作用するものである。
 (D)成分としては、例えば、露光により分解して酸拡散制御性を失う光崩壊性塩基(D1)(以下「(D1)成分」という。)、該(D1)成分に該当しない含窒素有機化合物(D2)(以下「(D2)成分」という。)等が挙げられる。これらの中でも、パターン寸法の均一性、ラフネス低減性を高められやすいことから、光崩壊性塩基((D1)成分)が好ましい。また、(D1)成分を含有させることで、高感度化、塗布欠陥の発生の抑制の特性をいずれも高めやすくなる。後述の(D1)成分として例示される化合物は、他の化合物との組み合わせによっては、上述の酸発生剤成分((B)成分)として用いられる場合がある。
<<Base component (D)>>
In addition to component (A), the resist composition of this embodiment further contains a base component (hereinafter also referred to as "component (D)") that traps the acid generated by exposure (that is, controls the diffusion of acid). It is preferable to contain. Component (D) acts as a quencher (acid diffusion control agent) that traps acid generated by exposure in the resist composition.
Component (D) includes, for example, a photodegradable base (D1) that decomposes upon exposure and loses acid diffusion controllability (hereinafter referred to as "component (D1)"), and a nitrogen-containing organic compound that does not fall under the component (D1). Compound (D2) (hereinafter referred to as "component (D2)") and the like can be mentioned. Among these, a photodegradable base (component (D1)) is preferred because it can easily improve the uniformity of pattern dimensions and the ability to reduce roughness. Furthermore, by containing the component (D1), it becomes easier to improve both the characteristics of increasing sensitivity and suppressing the occurrence of coating defects. The compound exemplified as component (D1) described below may be used as the above-mentioned acid generator component (component (B)) depending on the combination with other compounds.
 ・(D1)成分について
 (D1)成分を含有するレジスト組成物とすることで、レジストパターンを形成する際に、レジスト膜の露光部と未露光部とのコントラストをより向上させることができる。
 (D1)成分としては、露光により分解して酸拡散制御性を失うものであれば特に限定されず、下記一般式(d1-1)で表される化合物(以下「(d1-1)成分」という。)、下記一般式(d1-2)で表される化合物(以下「(d1-2)成分」という。)及び下記一般式(d1-3)で表される化合物(以下「(d1-3)成分」という。)からなる群より選ばれる1種以上の化合物が好ましい。
 (d1-1)~(d1-3)成分は、レジスト膜の露光部においては分解して酸拡散制御性(塩基性)を失うためクエンチャーとして作用せず、レジスト膜の未露光部においてクエンチャーとして作用する。
- Regarding component (D1) By using a resist composition containing component (D1), when forming a resist pattern, the contrast between exposed areas and unexposed areas of the resist film can be further improved.
Component (D1) is not particularly limited as long as it decomposes upon exposure and loses acid diffusion control properties, and may be a compound represented by the following general formula (d1-1) (hereinafter referred to as "component (d1-1)"). ), a compound represented by the following general formula (d1-2) (hereinafter referred to as "(d1-2) component"), and a compound represented by the following general formula (d1-3) (hereinafter referred to as "(d1-2) component"). 3) One or more compounds selected from the group consisting of "components" are preferred.
Components (d1-1) to (d1-3) do not act as quenchers because they decompose in the exposed areas of the resist film and lose their acid diffusion control properties (basicity), but they do not act as quenchers in the unexposed areas of the resist film. Acts as a char.
Figure JPOXMLDOC01-appb-C000071
[式中、Rd~Rdは置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基である。但し、式(d1-2)中のRdにおける、S原子に隣接する炭素原子にはフッ素原子は結合していないものとする。Ydは単結合又は2価の連結基である。mは1以上の整数であって、Mm+はそれぞれ独立にm価のオニウムカチオンである。]
Figure JPOXMLDOC01-appb-C000071
[In the formula, Rd 1 to Rd 4 are a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent. It is. However, it is assumed that no fluorine atom is bonded to the carbon atom adjacent to the S atom in Rd 2 in formula (d1-2). Yd 1 is a single bond or a divalent linking group. m is an integer of 1 or more, and M m+ are each independently an m-valent onium cation. ]
 {(d1-1)成分}
 ・・アニオン部
 式(d1-1)中、Rdは、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、それぞれ前記R’201と同様のものが挙げられる。
 これらのなかでも、Rdとしては、置換基を有してもよい芳香族炭化水素基、置換基を有してもよい脂肪族環式基、又は置換基を有してもよい鎖状のアルキル基が好ましい。これらの基が有していてもよい置換基としては、水酸基、オキソ基、アルキル基、アリール基、フッ素原子、フッ素化アルキル基、上記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基、エーテル結合、エステル結合、またはこれらの組み合わせが挙げられる。エーテル結合やエステル結合を置換基として含む場合、アルキレン基を介していてもよく、この場合の置換基としては、上記式(y-al-1)~(y-al-6)でそれぞれ表される連結基が好ましい。なお、Rdにおける芳香族炭化水素基、脂肪族環式基、又は鎖状のアルキル基が、置換基として、上記一般式(y-al-1)~(y-al-8)でそれぞれ表される連結基を有する場合、上記一般式(y-al-1)~(y-al-8)において、式(d3-1)中のRdにおける芳香族炭化水素基、脂肪族環式基、又は鎖状のアルキル基を構成する炭素原子に結合するのが、上記一般式(y-al-1)~(y-al-8)中のV’101である。
 前記芳香族炭化水素基としては、フェニル基、ナフチル基、ビシクロオクタン骨格を含む多環構造(ビシクロオクタン骨格とこれ以外の環構造とからなる多環構造)が好適に挙げられる。
 前記脂肪族環式基としては、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等のポリシクロアルカンから1個以上の水素原子を除いた基であることがより好ましい。
 前記鎖状のアルキル基としては、炭素原子数が1~10であることが好ましく、具体的には、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、ヘプチル基、オクチル基、ノニル基、デシル基等の直鎖状のアルキル基;1-メチルエチル基、1-メチルプロピル基、2-メチルプロピル基、1-メチルブチル基、2-メチルブチル基、3-メチルブチル基、1-エチルブチル基、2-エチルブチル基、1-メチルペンチル基、2-メチルペンチル基、3-メチルペンチル基、4-メチルペンチル基等の分岐鎖状のアルキル基が挙げられる。
{(d1-1) component}
...Anion moiety In formula (d1-1), Rd 1 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkyl group which may have a substituent. It is a good chain alkenyl group, and the same groups as R' 201 above can be mentioned.
Among these, Rd 1 is an aromatic hydrocarbon group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain type which may have a substituent. Alkyl groups are preferred. Examples of substituents that these groups may have include a hydroxyl group, an oxo group, an alkyl group, an aryl group, a fluorine atom, a fluorinated alkyl group, and the above general formulas (a2-r-1) to (a2-r- Examples include a lactone-containing cyclic group represented by 7), an ether bond, an ester bond, or a combination thereof. When an ether bond or an ester bond is included as a substituent, it may be via an alkylene group, and in this case, the substituent is represented by the above formulas (y-al-1) to (y-al-6), respectively. A linking group is preferred. In addition, an aromatic hydrocarbon group, an aliphatic cyclic group, or a chain alkyl group in Rd 1 is represented by the above general formulas (y-al-1) to (y-al-8), respectively, as a substituent. In the above general formulas (y-al-1) to (y-al-8), an aromatic hydrocarbon group or an aliphatic cyclic group in Rd 1 in formula (d3-1) V′ 101 in the above general formulas (y-al-1) to (y-al-8) is bonded to the carbon atom constituting the , or chain alkyl group.
Preferred examples of the aromatic hydrocarbon group include a phenyl group, a naphthyl group, and a polycyclic structure containing a bicyclooctane skeleton (a polycyclic structure consisting of a bicyclooctane skeleton and other ring structures).
The aliphatic cyclic group is more preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane such as adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
The chain alkyl group preferably has 1 to 10 carbon atoms, and specifically includes a methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, heptyl group, and octyl group. , nonyl group, decyl group, etc.; 1-methylethyl group, 1-methylpropyl group, 2-methylpropyl group, 1-methylbutyl group, 2-methylbutyl group, 3-methylbutyl group, 1- Examples include branched alkyl groups such as ethylbutyl group, 2-ethylbutyl group, 1-methylpentyl group, 2-methylpentyl group, 3-methylpentyl group, and 4-methylpentyl group.
 前記鎖状のアルキル基が置換基としてフッ素原子又はフッ素化アルキル基を有するフッ素化アルキル基である場合、フッ素化アルキル基の炭素原子数は、1~11が好ましく、1~8がより好ましく、1~4がさらに好ましい。該フッ素化アルキル基は、フッ素原子以外の原子を含有してもよい。フッ素原子以外の原子としては、例えば酸素原子、硫黄原子、窒素原子等が挙げられる。 When the chain alkyl group is a fluorinated alkyl group having a fluorine atom or a fluorinated alkyl group as a substituent, the number of carbon atoms in the fluorinated alkyl group is preferably 1 to 11, more preferably 1 to 8. 1 to 4 are more preferred. The fluorinated alkyl group may contain atoms other than fluorine atoms. Examples of atoms other than fluorine atoms include oxygen atoms, sulfur atoms, and nitrogen atoms.
 以下に(d1-1)成分のアニオン部の好ましい具体例を示す。 Preferred specific examples of the anion moiety of component (d1-1) are shown below.
Figure JPOXMLDOC01-appb-C000072
Figure JPOXMLDOC01-appb-C000072
 ・・カチオン部
 式(d1-1)中、Mm+は、m価のオニウムカチオンである。
 Mm+のオニウムカチオンとしては、前記一般式(ca-1)~(ca-3)でそれぞれ表されるカチオンと同様のものが好適に挙げられ、前記一般式(ca-1)で表されるカチオンがより好ましく、前記式(ca-1-1)~(ca-1-75)でそれぞれ表されるカチオンがさらに好ましい。
 (d1-1)成分は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
...Cation part In formula (d1-1), M m+ is an m-valent onium cation.
As the onium cation of M m+ , the same cations as the cations represented by the above general formulas (ca-1) to (ca-3) are preferably mentioned, and the onium cations represented by the above general formula (ca-1) are preferably mentioned. Cations are more preferred, and cations represented by the formulas (ca-1-1) to (ca-1-75) are even more preferred.
Component (d1-1) may be used alone or in combination of two or more.
 {(d1-2)成分}
 ・・アニオン部
 式(d1-2)中、Rdは、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、前記R’201と同様のものが挙げられる。
 但し、Rdにおける、S原子に隣接する炭素原子にはフッ素原子は結合していない(フッ素置換されていない)ものとする。これにより、(d1-2)成分のアニオンが適度な弱酸アニオンとなり、(D)成分としてのクエンチング能が向上する。
 Rdとしては、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい脂肪族環式基であることが好ましく、置換基を有してもよい脂肪族環式基であることがより好ましい。
{(d1-2) component}
...Anion moiety In formula (d1-2), Rd 2 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkyl group which may have a substituent. It is a good chain alkenyl group, and examples include those similar to R' 201 above.
However, it is assumed that no fluorine atom is bonded to the carbon atom adjacent to the S atom in Rd 2 (not substituted with fluorine). As a result, the anion of the component (d1-2) becomes an appropriately weak acid anion, and the quenching ability of the component (D) is improved.
Rd 2 is preferably a chain alkyl group that may have a substituent or an aliphatic cyclic group that may have a substituent; More preferably, it is a formula group.
 該鎖状のアルキル基としては、炭素原子数1~10であることが好ましく、3~10であることがより好ましい。
 該脂肪族環式基としては、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等から1個以上の水素原子を除いた基(置換基を有してもよい);カンファーから1個以上の水素原子を除いた基であることがより好ましい。
The chain alkyl group preferably has 1 to 10 carbon atoms, more preferably 3 to 10 carbon atoms.
The aliphatic cyclic group includes a group obtained by removing one or more hydrogen atoms from adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc. (which may have a substituent); one or more camphor More preferably, it is a group from which a hydrogen atom is removed.
 Rdの炭化水素基は、置換基を有していてもよく、該置換基としては、前記式(d1-1)のRdにおける炭化水素基(芳香族炭化水素基、脂肪族環式基、鎖状のアルキル基)が有していてもよい置換基と同様のものが挙げられる。 The hydrocarbon group of Rd 2 may have a substituent, and examples of the substituent include the hydrocarbon group (aromatic hydrocarbon group, aliphatic cyclic group) of Rd 1 of the above formula (d1-1). , chain alkyl group) may be included.
 以下に(d1-2)成分のアニオン部の好ましい具体例を示す。 Preferred specific examples of the anion moiety of component (d1-2) are shown below.
Figure JPOXMLDOC01-appb-C000073
Figure JPOXMLDOC01-appb-C000073
 ・・カチオン部
 式(d1-2)中、Mm+は、m価のオニウムカチオンであり、前記式(d1-1)中のMm+と同様である。
 (d1-2)成分は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
...Cation moiety In the formula (d1-2), M m+ is an m-valent onium cation, and is the same as M m+ in the above formula (d1-1).
Component (d1-2) may be used alone or in combination of two or more.
 {(d1-3)成分}
 ・・アニオン部
 式(d1-3)中、Rdは置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、前記R’201と同様のものが挙げられ、フッ素原子を含む環式基、鎖状のアルキル基、又は鎖状のアルケニル基であることが好ましい。中でも、フッ素化アルキル基が好ましく、前記Rdのフッ素化アルキル基と同様のものがより好ましい。
{(d1-3) component}
...Anion moiety In formula (d1-3), Rd 3 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a substituent. It is a chain alkenyl group, and examples thereof include those similar to R' 201 above, and it is preferably a cyclic group containing a fluorine atom, a chain alkyl group, or a chain alkenyl group. Among these, a fluorinated alkyl group is preferred, and the same fluorinated alkyl group as Rd 1 above is more preferred.
 式(d1-3)中、Rdは、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、前記R’201と同様のものが挙げられる。
 なかでも、置換基を有してもよいアルキル基、アルコキシ基、アルケニル基、環式基であることが好ましい。
 Rdにおけるアルキル基は、炭素原子数1~5の直鎖状又は分岐鎖状のアルキル基が好ましく、具体的には、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基等が挙げられる。Rdのアルキル基の水素原子の一部が水酸基、シアノ基等で置換されていてもよい。
 Rdにおけるアルコキシ基は、炭素原子数1~5のアルコキシ基が好ましく、炭素原子数1~5のアルコキシ基として具体的には、メトキシ基、エトキシ基、n-プロポキシ基、iso-プロポキシ基、n-ブトキシ基、tert-ブトキシ基が挙げられる。なかでも、メトキシ基、エトキシ基が好ましい。
In formula (d1-3), Rd 4 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkyl group which may have a substituent. It is an alkenyl group, and the same groups as R' 201 above can be mentioned.
Among these, preferred are alkyl groups, alkoxy groups, alkenyl groups, and cyclic groups that may have substituents.
The alkyl group in Rd 4 is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, and specifically, methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, isobutyl group. group, tert-butyl group, pentyl group, isopentyl group, neopentyl group, etc. A portion of the hydrogen atoms of the alkyl group of Rd 4 may be substituted with a hydroxyl group, a cyano group, or the like.
The alkoxy group in Rd 4 is preferably an alkoxy group having 1 to 5 carbon atoms, and specific examples of the alkoxy group having 1 to 5 carbon atoms include methoxy group, ethoxy group, n-propoxy group, iso-propoxy group, Examples include n-butoxy group and tert-butoxy group. Among them, methoxy group and ethoxy group are preferred.
 Rdにおけるアルケニル基は、前記R’201におけるアルケニル基と同様のものが挙げられ、ビニル基、プロペニル基(アリル基)、1-メチルプロペニル基、2-メチルプロペニル基が好ましい。これらの基はさらに置換基として、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基を有していてもよい。 Examples of the alkenyl group for Rd 4 include the same alkenyl groups as for R' 201 above, and vinyl group, propenyl group (allyl group), 1-methylpropenyl group, and 2-methylpropenyl group are preferable. These groups may further have an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms as a substituent.
 Rdにおける環式基は、前記R’201における環式基と同様のものが挙げられ、シクロペンタン、シクロヘキサン、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等のシクロアルカンから1個以上の水素原子を除いた脂環式基、又は、フェニル基、ナフチル基等の芳香族基が好ましい。Rdが脂環式基である場合、レジスト組成物が有機溶剤に良好に溶解することにより、リソグラフィー特性が良好となる。また、Rdが芳香族基である場合、EUV等を露光光源とするリソグラフィーにおいて、該レジスト組成物が光吸収効率に優れ、感度やリソグラフィー特性が良好となる。 Examples of the cyclic group in Rd 4 include the same cyclic groups as in R' 201 above, including one or more cycloalkanes such as cyclopentane, cyclohexane, adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane. An alicyclic group from which a hydrogen atom has been removed, or an aromatic group such as a phenyl group or a naphthyl group is preferable. When Rd 4 is an alicyclic group, the resist composition dissolves well in an organic solvent, resulting in good lithography properties. Further, when Rd 4 is an aromatic group, the resist composition has excellent light absorption efficiency and good sensitivity and lithography properties in lithography using EUV or the like as an exposure light source.
 式(d1-3)中、Ydは、単結合または2価の連結基である。
 Ydにおける2価の連結基としては、特に限定されないが、置換基を有してもよい2価の炭化水素基(脂肪族炭化水素基、芳香族炭化水素基)、ヘテロ原子を含む2価の連結基等が挙げられる。これらはそれぞれ、上記式(a0-1)中のR01における2価の連結基についての説明のなかで挙げた、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基と同様のものが挙げられる。
 Ydとしては、カルボニル基、エステル結合、アミド結合、アルキレン基又はこれらの組み合わせであることが好ましい。アルキレン基としては、直鎖状又は分岐鎖状のアルキレン基であることがより好ましく、メチレン基又はエチレン基であることがさらに好ましい。
In formula (d1-3), Yd 1 is a single bond or a divalent linking group.
The divalent linking group in Yd 1 is not particularly limited, but includes divalent hydrocarbon groups that may have substituents (aliphatic hydrocarbon groups, aromatic hydrocarbon groups), divalent hydrocarbon groups containing heteroatoms, etc. Examples include linking groups such as These are the divalent hydrocarbon group which may have a substituent, the divalent linking group for R 01 in formula (a0-1) above, and the divalent linking group containing a hetero atom, respectively. Examples include those similar to the valent linking group.
Yd 1 is preferably a carbonyl group, an ester bond, an amide bond, an alkylene group, or a combination thereof. The alkylene group is more preferably a linear or branched alkylene group, and even more preferably a methylene group or an ethylene group.
 以下に(d1-3)成分のアニオン部の好ましい具体例を示す。 Preferred specific examples of the anion moiety of component (d1-3) are shown below.
Figure JPOXMLDOC01-appb-C000074
Figure JPOXMLDOC01-appb-C000074
Figure JPOXMLDOC01-appb-C000075
Figure JPOXMLDOC01-appb-C000075
 ・・カチオン部
 式(d1-3)中、Mm+は、m価のオニウムカチオンであり、前記式(d1-1)中のMm+と同様である。
 (d1-3)成分は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
...Cation moiety In formula (d1-3), M m+ is an m-valent onium cation, and is the same as M m+ in formula (d1-1) above.
Component (d1-3) may be used alone or in combination of two or more.
 (D1)成分は、上記(d1-1)~(d1-3)成分のいずれか1種のみを用いてもよく、2種以上を組み合わせて用いてもよい。
 本実施形態のレジスト組成物において、(D1)成分は、上記(d1-1)成分を含むことが好ましい。
 レジスト組成物が(D1)成分を含有する場合、レジスト組成物中の(D1)成分の含有量は、(A1)成分100質量部に対して、0.5~15質量部が好ましく、1~10質量部がより好ましく、2~9質量部がさらに好ましい。
 (D1)成分の含有量が好ましい下限値以上であると、特に良好なリソグラフィー特性及びレジストパターン形状が得られやすい。一方、上限値以下であると、感度を良好に維持でき、スループットにも優れる。
As the component (D1), any one of the components (d1-1) to (d1-3) above may be used alone, or two or more thereof may be used in combination.
In the resist composition of the present embodiment, the component (D1) preferably contains the component (d1-1) described above.
When the resist composition contains component (D1), the content of component (D1) in the resist composition is preferably 0.5 to 15 parts by mass, and 1 to 15 parts by mass, based on 100 parts by mass of component (A1). It is more preferably 10 parts by weight, and even more preferably 2 to 9 parts by weight.
When the content of component (D1) is at least the preferable lower limit, particularly good lithography properties and resist pattern shape are likely to be obtained. On the other hand, when it is below the upper limit, sensitivity can be maintained well and throughput is also excellent.
 本実施形態のレジスト組成物が含有する(D)成分全体のうち、(d1-1)成分の含有量は、50質量%以上であることが好ましく、70質量%以上であることがより好ましく、90質量%以上であることがさらに好ましく、(D)成分は化合物(d1-1)成分のみからなるものであってもよい。 Of the entire component (D) contained in the resist composition of the present embodiment, the content of component (d1-1) is preferably 50% by mass or more, more preferably 70% by mass or more, It is more preferably 90% by mass or more, and component (D) may consist only of compound (d1-1) component.
 (D1)成分の製造方法:
 前記の(d1-1)成分、(d1-2)成分の製造方法は、特に限定されず、公知の方法により製造することができる。
 また、(d1-3)成分の製造方法は、特に限定されず、例えば、US2012-0149916号公報に記載の方法と同様にして製造される。
(D1) Method for producing component:
The method for producing the components (d1-1) and (d1-2) is not particularly limited, and they can be produced by known methods.
Furthermore, the method for producing component (d1-3) is not particularly limited, and is produced, for example, in the same manner as the method described in US2012-0149916.
 ・(D2)成分について
 (D)成分としては、上記の(D1)成分に該当しない含窒素有機化合物成分(以下「(D2)成分」という。)を含有してもよい。
 (D2)成分としては、酸拡散制御剤として作用するもので、かつ、(D1)成分に該当しないものであれば特に限定されず、公知のものから任意に用いればよい。なかでも、脂肪族アミンが好ましく、この中でも特に第2級脂肪族アミンや第3級脂肪族アミンがより好ましい。
 脂肪族アミンとは、1つ以上の脂肪族基を有するアミンであり、該脂肪族基は炭素原子数が1~12であることが好ましい。
 脂肪族アミンとしては、アンモニアNHの水素原子の少なくとも1つを、炭素原子数12以下のアルキル基もしくはヒドロキシアルキル基で置換したアミン(アルキルアミンもしくはアルキルアルコールアミン)又は環式アミンが挙げられる。
 アルキルアミンおよびアルキルアルコールアミンの具体例としては、n-ヘキシルアミン、n-ヘプチルアミン、n-オクチルアミン、n-ノニルアミン、n-デシルアミン等のモノアルキルアミン;ジエチルアミン、ジ-n-プロピルアミン、ジ-n-ヘプチルアミン、ジ-n-オクチルアミン、ジシクロヘキシルアミン等のジアルキルアミン;トリメチルアミン、トリエチルアミン、トリ-n-プロピルアミン、トリ-n-ブチルアミン、トリ-n-ペンチルアミン、トリ-n-ヘキシルアミン、トリ-n-ヘプチルアミン、トリ-n-オクチルアミン、トリ-n-ノニルアミン、トリ-n-デシルアミン、トリ-n-ドデシルアミン等のトリアルキルアミン;ジエタノールアミン、トリエタノールアミン、ジイソプロパノールアミン、トリイソプロパノールアミン、ジ-n-オクタノールアミン、トリ-n-オクタノールアミン等のアルキルアルコールアミンが挙げられる。これらの中でも、炭素原子数6~30のトリアルキルアミンがさらに好ましく、トリ-n-ペンチルアミン又はトリ-n-オクチルアミンが特に好ましい。
- Regarding component (D2) Component (D) may contain a nitrogen-containing organic compound component (hereinafter referred to as "component (D2)") that does not correspond to component (D1) above.
The component (D2) is not particularly limited as long as it acts as an acid diffusion control agent and does not fall under the component (D1), and any known components may be used. Among these, aliphatic amines are preferred, and among these, secondary aliphatic amines and tertiary aliphatic amines are particularly preferred.
Aliphatic amines are amines having one or more aliphatic groups, and the aliphatic groups preferably have 1 to 12 carbon atoms.
Examples of aliphatic amines include amines (alkyl amines or alkyl alcohol amines) or cyclic amines in which at least one hydrogen atom of ammonia NH 3 is substituted with an alkyl group or hydroxyalkyl group having 12 or less carbon atoms.
Specific examples of alkyl amines and alkyl alcohol amines include monoalkylamines such as n-hexylamine, n-heptylamine, n-octylamine, n-nonylamine, and n-decylamine; diethylamine, di-n-propylamine, di- -Dialkylamines such as n-heptylamine, di-n-octylamine, dicyclohexylamine; trimethylamine, triethylamine, tri-n-propylamine, tri-n-butylamine, tri-n-pentylamine, tri-n-hexylamine , tri-n-heptylamine, tri-n-octylamine, tri-n-nonylamine, tri-n-decylamine, tri-n-dodecylamine; diethanolamine, triethanolamine, diisopropanolamine, tri- Examples include alkyl alcohol amines such as isopropanolamine, di-n-octanolamine, and tri-n-octanolamine. Among these, trialkylamines having 6 to 30 carbon atoms are more preferred, and tri-n-pentylamine or tri-n-octylamine is particularly preferred.
 環式アミンとしては、例えば、ヘテロ原子として窒素原子を含む複素環化合物が挙げられる。該複素環化合物としては、単環式のもの(脂肪族単環式アミン)であっても多環式のもの(脂肪族多環式アミン)であってもよい。
 脂肪族単環式アミンとして、具体的には、ピペリジン、ピペラジン等が挙げられる。
 脂肪族多環式アミンとしては、炭素原子数が6~10のものが好ましく、具体的には、1,5-ジアザビシクロ[4.3.0]-5-ノネン、1,8-ジアザビシクロ[5.4.0]-7-ウンデセン、ヘキサメチレンテトラミン、1,4-ジアザビシクロ[2.2.2]オクタン等が挙げられる。
Examples of the cyclic amine include heterocyclic compounds containing a nitrogen atom as a heteroatom. The heterocyclic compound may be monocyclic (aliphatic monocyclic amine) or polycyclic (aliphatic polycyclic amine).
Specific examples of the aliphatic monocyclic amine include piperidine and piperazine.
The aliphatic polycyclic amine preferably has 6 to 10 carbon atoms, specifically, 1,5-diazabicyclo[4.3.0]-5-nonene, 1,8-diazabicyclo[5 .4.0]-7-undecene, hexamethylenetetramine, 1,4-diazabicyclo[2.2.2]octane, and the like.
 その他の脂肪族アミンとしては、トリス(2-メトキシメトキシエチル)アミン、トリス{2-(2-メトキシエトキシ)エチル}アミン、トリス{2-(2-メトキシエトキシメトキシ)エチル}アミン、トリス{2-(1-メトキシエトキシ)エチル}アミン、トリス{2-(1-エトキシエトキシ)エチル}アミン、トリス{2-(1-エトキシプロポキシ)エチル}アミン、トリス[2-{2-(2-ヒドロキシエトキシ)エトキシ}エチル]アミン、トリエタノールアミントリアセテート等が挙げられ、トリエタノールアミントリアセテートが好ましい。 Other aliphatic amines include tris(2-methoxymethoxyethyl)amine, tris{2-(2-methoxyethoxy)ethyl}amine, tris{2-(2-methoxyethoxymethoxy)ethyl}amine, tris{2 -(1-methoxyethoxy)ethyl}amine, tris{2-(1-ethoxyethoxy)ethyl}amine, tris{2-(1-ethoxypropoxy)ethyl}amine, tris[2-{2-(2-hydroxy) Examples include ethoxy)ethoxy}ethyl]amine, triethanolamine triacetate, and triethanolamine triacetate is preferred.
 また、(D2)成分としては、芳香族アミンを用いてもよい。
 芳香族アミンとしては、4-ジメチルアミノピリジン、ピロール、インドール、ピラゾール、イミダゾールまたはこれらの誘導体、トリベンジルアミン、2,6-ジイソプロピルアニリン、N-tert-ブトキシカルボニルピロリジン、2,6-ジ-tert-ブチルピリジン、2,6-ジ-tert-ブチルピリジン等が挙げられる。
Further, as the component (D2), an aromatic amine may be used.
Examples of aromatic amines include 4-dimethylaminopyridine, pyrrole, indole, pyrazole, imidazole or derivatives thereof, tribenzylamine, 2,6-diisopropylaniline, N-tert-butoxycarbonylpyrrolidine, 2,6-di-tert -butylpyridine, 2,6-di-tert-butylpyridine and the like.
 上記の中でも、(D2)成分は、アルキルアミンであることが好ましく、炭素原子数5~10のトリアルキルアミンがより好ましい。 Among the above, component (D2) is preferably an alkylamine, more preferably a trialkylamine having 5 to 10 carbon atoms.
 (D2)成分は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
 レジスト組成物が(D2)成分を含有する場合、レジスト組成物中、(D2)成分の含有量は、(A1)成分100質量部に対して、0.01~5質量部が好ましく、0.1~5質量部がより好ましく、0.5~5質量部がさらに好ましい。
 (D2)成分の含有量が好ましい下限値以上であると、特に良好なリソグラフィー特性及びレジストパターン形状が得られやすい。一方、上限値以下であると、感度を良好に維持でき、スループットにも優れる。
Component (D2) may be used alone or in combination of two or more.
When the resist composition contains component (D2), the content of component (D2) in the resist composition is preferably 0.01 to 5 parts by mass, and 0.01 to 5 parts by mass, based on 100 parts by mass of component (A1). It is more preferably 1 to 5 parts by weight, and even more preferably 0.5 to 5 parts by weight.
When the content of the component (D2) is at least the preferable lower limit, particularly good lithography properties and resist pattern shape are likely to be obtained. On the other hand, when it is below the upper limit, sensitivity can be maintained well and throughput is also excellent.
 ≪有機カルボン酸、並びにリンのオキソ酸及びその誘導体からなる群より選択される少なくとも1種の化合物(E)≫
 本実施形態のレジスト組成物には、感度劣化の防止や、レジストパターン形状、引き置き経時安定性等の向上の目的で、任意の成分として、有機カルボン酸、並びにリンのオキソ酸及びその誘導体からなる群より選択される少なくとも1種の化合物(E)(以下「(E)成分」という)を含有させることができる。
 有機カルボン酸として、具体的には、酢酸、マロン酸、クエン酸、リンゴ酸、コハク酸、安息香酸、サリチル酸等が挙げられ、その中でも、サリチル酸が好ましい。
 リンのオキソ酸としては、リン酸、ホスホン酸、ホスフィン酸等が挙げられ、これらの中でも特にホスホン酸が好ましい。
<<At least one compound (E) selected from the group consisting of organic carboxylic acids, phosphorus oxoacids and derivatives thereof>>
The resist composition of this embodiment contains organic carboxylic acids, phosphorus oxoacids, and derivatives thereof as optional components for the purpose of preventing sensitivity deterioration, improving resist pattern shape, storage stability over time, etc. At least one compound (E) selected from the group consisting of (hereinafter referred to as "component (E)") can be contained.
Specific examples of the organic carboxylic acid include acetic acid, malonic acid, citric acid, malic acid, succinic acid, benzoic acid, and salicylic acid, among which salicylic acid is preferred.
Examples of the phosphorus oxoacid include phosphoric acid, phosphonic acid, and phosphinic acid, and among these, phosphonic acid is particularly preferred.
 本実施形態のレジスト組成物において、(E)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。
 レジスト組成物が(E)成分を含有する場合、(E)成分の含有量は、(A1)成分100質量部に対して、0.01~5質量部が好ましく、0.05~3質量部がより好ましい。上記範囲とすることにより、リソグラフィー特性がより向上する。
In the resist composition of the present embodiment, one kind of component (E) may be used alone, or two or more kinds may be used in combination.
When the resist composition contains component (E), the content of component (E) is preferably 0.01 to 5 parts by mass, and 0.05 to 3 parts by mass, based on 100 parts by mass of component (A1). is more preferable. By setting it within the above range, the lithography characteristics are further improved.
 ≪フッ素添加剤成分(F)≫
 本実施形態のレジスト組成物は、疎水性樹脂としてフッ素添加剤成分(以下「(F)成分」という)を含有してもよい。(F)成分は、レジスト膜に撥水性を付与するために使用され、(A1)成分とは別の樹脂として用いられることで、リソグラフィー特性を向上させることができる。
 (F)成分としては、例えば、特開2010-002870号公報、特開2010-032994号公報、特開2010-277043号公報、特開2011-13569号公報、特開2011-128226号公報に記載の含フッ素高分子化合物を用いることができる。
 (F)成分としてより具体的には、下記一般式(f1-1)で表される構成単位(f1)を有する重合体が挙げられる。この重合体としては、下記式(f1-1)で表される構成単位(f1)のみからなる重合体(ホモポリマー);該構成単位(f1)と前記構成単位(a1)との共重合体;該構成単位(f1)とアクリル酸又はメタクリル酸から誘導される構成単位と前記構成単位(a1)との共重合体であることが好ましく、該構成単位(f1)と前記構成単位(a1)との共重合体であることがより好ましい。ここで、該構成単位(f1)と共重合される前記構成単位(a1)としては、1-エチル-1-シクロオクチル(メタ)アクリレートから誘導される構成単位、1-メチル-1-アダマンチル(メタ)アクリレートから誘導される構成単位が好ましく、1-エチル-1-シクロオクチル(メタ)アクリレートから誘導される構成単位がより好ましい。
≪Fluorine additive component (F)≫
The resist composition of this embodiment may contain a fluorine additive component (hereinafter referred to as "component (F)") as a hydrophobic resin. The component (F) is used to impart water repellency to the resist film, and by being used as a resin separate from the component (A1), the lithography properties can be improved.
The component (F) is described, for example, in JP-A No. 2010-002870, JP-A No. 2010-032994, JP-A No. 2010-277043, JP-A No. 2011-13569, and JP-A No. 2011-128226. The following fluorine-containing polymer compounds can be used.
More specifically, component (F) includes a polymer having a structural unit (f1) represented by the following general formula (f1-1). This polymer includes a polymer (homopolymer) consisting only of the structural unit (f1) represented by the following formula (f1-1); a copolymer of the structural unit (f1) and the above structural unit (a1); ; It is preferable that it is a copolymer of the structural unit (f1), a structural unit derived from acrylic acid or methacrylic acid, and the structural unit (a1), and the structural unit (f1) and the structural unit (a1) More preferably, it is a copolymer with. Here, the structural unit (a1) copolymerized with the structural unit (f1) is a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate, 1-methyl-1-adamantyl ( A structural unit derived from meth)acrylate is preferred, and a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate is more preferred.
Figure JPOXMLDOC01-appb-C000076
[式中、Rは前記と同様であり、Rf102およびRf103はそれぞれ独立して水素原子、ハロゲン原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基を表し、Rf102およびRf103は同じであっても異なっていてもよい。nfは0~5の整数であり、Rf101はフッ素原子を含む有機基である。]
Figure JPOXMLDOC01-appb-C000076
[In the formula, R is the same as above, and Rf 102 and Rf 103 each independently represent a hydrogen atom, a halogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Rf 102 and Rf 103 may be the same or different. nf 1 is an integer from 0 to 5, and Rf 101 is an organic group containing a fluorine atom. ]
 式(f1-1)中、α位の炭素原子に結合したRは、前記と同様である。Rとしては、水素原子またはメチル基が好ましい。
 式(f1-1)中、Rf102およびRf103のハロゲン原子としては、フッ素原子が好ましい。Rf102およびRf103の炭素原子数1~5のアルキル基としては、上記Rの炭素原子数1~5のアルキル基と同様のものが挙げられ、メチル基またはエチル基が好ましい。Rf102およびRf103の炭素原子数1~5のハロゲン化アルキル基として、具体的には、炭素原子数1~5のアルキル基の水素原子の一部または全部が、ハロゲン原子で置換された基が挙げられる。該ハロゲン原子としては、フッ素原子が好ましい。なかでもRf102およびRf103としては、水素原子、フッ素原子、又は炭素原子数1~5のアルキル基が好ましく、水素原子、フッ素原子、メチル基、またはエチル基がより好ましく、水素原子がさらに好ましい。
 式(f1-1)中、nfは0~5の整数であり、0~3の整数が好ましく、1又は2であることがより好ましい。
In formula (f1-1), R bonded to the carbon atom at the α position is the same as described above. As R, a hydrogen atom or a methyl group is preferable.
In formula (f1-1), the halogen atoms of Rf 102 and Rf 103 are preferably fluorine atoms. Examples of the alkyl group having 1 to 5 carbon atoms for Rf 102 and Rf 103 include those similar to the alkyl group having 1 to 5 carbon atoms for R above, and methyl group or ethyl group is preferable. Specifically, the halogenated alkyl group having 1 to 5 carbon atoms in Rf 102 and Rf 103 includes a group in which some or all of the hydrogen atoms of the alkyl group having 1 to 5 carbon atoms are substituted with a halogen atom. can be mentioned. The halogen atom is preferably a fluorine atom. Among these, Rf 102 and Rf 103 are preferably a hydrogen atom, a fluorine atom, or an alkyl group having 1 to 5 carbon atoms, more preferably a hydrogen atom, a fluorine atom, a methyl group, or an ethyl group, and even more preferably a hydrogen atom. .
In formula (f1-1), nf 1 is an integer of 0 to 5, preferably 0 to 3, and more preferably 1 or 2.
 式(f1-1)中、Rf101は、フッ素原子を含む有機基であり、フッ素原子を含む炭化水素基であることが好ましい。
 フッ素原子を含む炭化水素基としては、直鎖状、分岐鎖状または環状のいずれであってもよく、炭素原子数は1~20であることが好ましく、炭素原子数1~15であることがより好ましく、炭素原子数1~10が特に好ましい。
 また、フッ素原子を含む炭化水素基は、当該炭化水素基における水素原子の25%以上がフッ素化されていることが好ましく、50%以上がフッ素化されていることがより好ましく、60%以上がフッ素化されていることが、浸漬露光時のレジスト膜の疎水性が高まることから特に好ましい。
 なかでも、Rf101としては、炭素原子数1~6のフッ素化炭化水素基がより好ましく、トリフルオロメチル基、-CH-CF、-CH-CF-CF、-CH(CF、-CH-CH-CF、-CH-CH-CF-CF-CF-CFが特に好ましい。
In formula (f1-1), Rf 101 is an organic group containing a fluorine atom, and preferably a hydrocarbon group containing a fluorine atom.
The hydrocarbon group containing a fluorine atom may be linear, branched or cyclic, and preferably has 1 to 20 carbon atoms, preferably 1 to 15 carbon atoms. More preferably, the number of carbon atoms is 1 to 10, particularly preferred.
Further, in the hydrocarbon group containing a fluorine atom, it is preferable that 25% or more of the hydrogen atoms in the hydrocarbon group are fluorinated, more preferably 50% or more are fluorinated, and 60% or more are fluorinated. It is particularly preferable that the resist be fluorinated because it increases the hydrophobicity of the resist film during immersion exposure.
Among these, Rf 101 is more preferably a fluorinated hydrocarbon group having 1 to 6 carbon atoms, such as trifluoromethyl group, -CH 2 -CF 3 , -CH 2 -CF 2 -CF 3 , -CH(CF 3 ) 2 , -CH 2 -CH 2 -CF 3 and -CH 2 -CH 2 -CF 2 -CF 2 -CF 2 -CF 3 are particularly preferred.
 (F)成分の重量平均分子量(Mw)(ゲルパーミエーションクロマトグラフィーによるポリスチレン換算基準)は、1000~50000が好ましく、5000~40000がより好ましく、10000~30000が最も好ましい。この範囲の上限値以下であると、レジストとして用いるのにレジスト用溶剤への充分な溶解性があり、この範囲の下限値以上であると、レジスト膜の撥水性が良好である。
 (F)成分の分子量分散度(Mw/Mn)は、1.0~5.0が好ましく、1.0~3.0がより好ましく、1.0~2.5が最も好ましい。
The weight average molecular weight (Mw) of the component (F) (based on polystyrene standards determined by gel permeation chromatography) is preferably from 1,000 to 50,000, more preferably from 5,000 to 40,000, and most preferably from 10,000 to 30,000. When it is below the upper limit of this range, there is sufficient solubility in a resist solvent for use as a resist, and when it is above the lower limit of this range, the water repellency of the resist film is good.
The molecular weight dispersity (Mw/Mn) of component (F) is preferably 1.0 to 5.0, more preferably 1.0 to 3.0, and most preferably 1.0 to 2.5.
 本実施形態のレジスト組成物において、(F)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。
 レジスト組成物が(F)成分を含有する場合、(F)成分の含有量は、(A1)成分100質量部に対して、0.5~10質量部であることが好ましく、1~10質量部であることがより好ましい。
In the resist composition of the present embodiment, one kind of component (F) may be used alone, or two or more kinds may be used in combination.
When the resist composition contains component (F), the content of component (F) is preferably 0.5 to 10 parts by mass, and preferably 1 to 10 parts by mass, based on 100 parts by mass of component (A1). It is more preferable that it is part.
 ≪有機溶剤成分(S)≫
 本実施形態のレジスト組成物は、レジスト材料を有機溶剤成分(以下「(S)成分」という)に溶解させて製造することができる。
 本実施形態のレジスト組成物において、(S)成分は、1種単独で用いてもよく、2種以上の混合溶剤として用いてもよい。なかでも、PGMEA、PGME、γ-ブチロラクトン、EL、シクロヘキサノンが好ましい。
≪Organic solvent component (S)≫
The resist composition of this embodiment can be manufactured by dissolving a resist material in an organic solvent component (hereinafter referred to as "component (S)").
In the resist composition of this embodiment, the (S) component may be used alone or as a mixed solvent of two or more. Among these, PGMEA, PGME, γ-butyrolactone, EL, and cyclohexanone are preferred.
 また、(S)成分としては、PGMEAと極性溶剤とを混合した混合溶剤も好ましい。その配合比(質量比)は、PGMEAと極性溶剤との相溶性等を考慮して適宜決定すればよい。
 (S)成分としては、PGMEA及びELの中から選ばれる少なくとも1種とγ-ブチロラクトンとの混合溶剤も好ましい。この場合、混合割合としては、前者と後者との質量比が、好ましくは70:30~95:5とされる。
 (S)成分の使用量は、特に限定されず、基板等に塗布可能な濃度で、塗布膜厚に応じて適宜設定される。一般的にはレジスト組成物の固形分濃度が0.1~20質量%、好ましくは0.2~15質量%の範囲内となるように(S)成分は用いられる。
Further, as the component (S), a mixed solvent of PGMEA and a polar solvent is also preferable. The blending ratio (mass ratio) may be appropriately determined in consideration of the compatibility between PGMEA and the polar solvent.
As component (S), a mixed solvent of at least one selected from PGMEA and EL and γ-butyrolactone is also preferred. In this case, the mass ratio of the former to the latter is preferably 70:30 to 95:5.
The amount of component (S) to be used is not particularly limited, and is appropriately set at a concentration that allows coating on a substrate, etc., depending on the thickness of the coating film. Generally, component (S) is used so that the solid content concentration of the resist composition is in the range of 0.1 to 20% by weight, preferably 0.2 to 15% by weight.
 本実施形態のレジスト組成物は、上記レジスト材料を(S)成分に溶解させた後、ポリイミド多孔質膜、ポリアミドイミド多孔質膜等を用いて、不純物等の除去を行ってもよい。例えば、ポリイミド多孔質膜からなるフィルター、ポリアミドイミド多孔質膜からなるフィルター、ポリイミド多孔質膜及びポリアミドイミド多孔質膜からなるフィルター等を用いて、レジスト組成物の濾過を行ってもよい。前記ポリイミド多孔質膜及び前記ポリアミドイミド多孔質膜としては、例えば、特開2016-155121号公報に記載のもの等が例示される。 In the resist composition of this embodiment, after the resist material is dissolved in the component (S), impurities and the like may be removed using a porous polyimide membrane, a porous polyamide-imide membrane, or the like. For example, the resist composition may be filtered using a filter made of a porous polyimide membrane, a filter made of a porous polyamide-imide membrane, a filter made of a porous polyimide membrane and a porous polyamide-imide membrane, or the like. Examples of the polyimide porous membrane and the polyamideimide porous membrane include those described in JP-A No. 2016-155121.
 以上説明した本実施形態のレジスト組成物は、一般式(a0-1)で表される構成単位(a0)を有する樹脂成分(A1)を含有する。これにより、高感度化が図れ、かつパターン寸法の均一性等のリソグラフィー特性のさらなる向上を図ることができる。このような効果を奏する理由としては、以下のように推測される。
 構成単位(a0)は、側鎖の一方に、置換基を有してもよい芳香族炭化水素基(R00)を介して、露光により酸を発生する酸発生基を有し、側鎖の他方に、酸分解性部位を有している。
 このように、構成単位(a0)には、酸発生基であるアニオン部が樹脂成分(A1)に組み込まれている。また、このことにより、前記酸発生基がレジスト膜全体に均一に分布するため、露光により発生する酸がレジスト膜中で一様に酸分解性部位に作用する。
 加えて、構成単位(a0)は、主鎖と酸発生基との間の連結部に、置換基を有してもよい芳香族炭化水素基(R00)を有するため、レジスト膜未露光部の溶解抑止効果が高められる。
 上述の各作用が相乗的に働くことで、高感度化と、パターン寸法の均一性等のリソグラフィー特性のさらなる向上と、が図られると推測される。
The resist composition of the present embodiment described above contains a resin component (A1) having a structural unit (a0) represented by the general formula (a0-1). This makes it possible to achieve higher sensitivity and further improve lithography characteristics such as uniformity of pattern dimensions. The reason for this effect is presumed to be as follows.
The structural unit (a0) has an acid generating group that generates an acid upon exposure to light via an aromatic hydrocarbon group (R 00 ) which may have a substituent on one side chain, and On the other hand, it has an acid-decomposable site.
Thus, in the structural unit (a0), an anion moiety which is an acid generating group is incorporated into the resin component (A1). Furthermore, since the acid-generating groups are uniformly distributed throughout the resist film, the acid generated by exposure uniformly acts on acid-decomposable sites in the resist film.
In addition, since the structural unit (a0) has an aromatic hydrocarbon group (R 00 ) which may have a substituent at the link between the main chain and the acid generating group, the unexposed part of the resist film The effect of inhibiting dissolution is enhanced.
It is presumed that the above-mentioned effects work synergistically to achieve higher sensitivity and further improvement of lithography characteristics such as uniformity of pattern dimensions.
(レジストパターン形成方法)
 本発明の第2の態様に係るレジストパターン形成方法は、支持体上に、上述した本発明の第1の態様に係るレジスト組成物を用いてレジスト膜を形成する工程、前記レジスト膜を露光する工程、及び前記露光後のレジスト膜を現像してレジストパターンを形成する工程を有する方法である。
 かかるレジストパターン形成方法の一実施形態としては、例えば以下のようにして行うレジストパターン形成方法が挙げられる。
(Resist pattern formation method)
The resist pattern forming method according to the second aspect of the present invention includes a step of forming a resist film on a support using the resist composition according to the first aspect of the present invention, and exposing the resist film to light. This method includes a step of developing the exposed resist film to form a resist pattern.
One embodiment of such a resist pattern forming method includes, for example, a resist pattern forming method performed as follows.
 まず、上述した実施形態のレジスト組成物を、支持体上にスピンナー等で塗布し、ベーク(ポストアプライベーク(PAB))処理を、例えば80~150℃の温度条件にて40~120秒間、好ましくは60~90秒間施してレジスト膜を形成する。
 次に、該レジスト膜に対し、例えば電子線描画装置、EUV露光装置等の露光装置を用いて、所定のパターンが形成されたマスク(マスクパターン)を介した露光またはマスクパターンを介さない電子線の直接照射による描画等による選択的露光を行う。
 その後、ベーク(ポストエクスポージャーベーク(PEB))処理を、例えば80~150℃の温度条件にて40~120秒間、好ましくは60~90秒間施す。
 次に、前記レジスト膜を現像処理する。現像処理は、アルカリ現像プロセスの場合は、アルカリ現像液を用い、溶剤現像プロセスの場合は、有機溶剤を含有する現像液(有機系現像液)を用いて行う。
First, the resist composition of the above-described embodiment is applied onto a support using a spinner or the like, and a bake (post-apply bake (PAB)) treatment is performed, preferably for 40 to 120 seconds at a temperature of 80 to 150°C. is applied for 60 to 90 seconds to form a resist film.
Next, the resist film is exposed to light through a mask (mask pattern) on which a predetermined pattern is formed, or with an electron beam without passing through the mask pattern, using an exposure device such as an electron beam lithography device or an EUV exposure device. Selective exposure is performed by drawing by direct irradiation.
Thereafter, a bake (post-exposure bake (PEB)) treatment is performed, for example, at a temperature of 80 to 150° C. for 40 to 120 seconds, preferably 60 to 90 seconds.
Next, the resist film is developed. The development process is performed using an alkaline developer in the case of an alkaline development process, and is performed using a developer containing an organic solvent (organic developer) in the case of a solvent development process.
 現像処理後、好ましくはリンス処理を行う。リンス処理は、アルカリ現像プロセスの場合は、純水を用いた水リンスが好ましく、溶剤現像プロセスの場合は、有機溶剤を含有するリンス液を用いることが好ましい。
 溶剤現像プロセスの場合、前記現像処理またはリンス処理の後に、パターン上に付着している現像液またはリンス液を、超臨界流体により除去する処理を行ってもよい。
 現像処理後またはリンス処理後、乾燥を行う。また、場合によっては、上記現像処理後にベーク処理(ポストベーク)を行ってもよい。
After the development process, preferably a rinsing process is performed. For the rinsing treatment, in the case of an alkaline development process, water rinsing using pure water is preferable, and in the case of a solvent development process, it is preferable to use a rinsing liquid containing an organic solvent.
In the case of a solvent development process, after the development treatment or rinsing treatment, a treatment may be performed to remove the developer or rinse agent adhering to the pattern using a supercritical fluid.
After development or rinsing, drying is performed. In some cases, a bake process (post-bake) may be performed after the development process.
 支持体としては、特に限定されず、従来公知のものを用いることができ、例えば、電子部品用の基板や、これに所定の配線パターンが形成されたもの等が挙げられる。より具体的には、シリコンウェーハ、銅、クロム、鉄、アルミニウム等の金属製の基板や、ガラス基板等が挙げられる。配線パターンの材料としては、例えば銅、アルミニウム、ニッケル、金等が使用可能である。 The support is not particularly limited, and conventionally known supports can be used, such as substrates for electronic components and substrates on which predetermined wiring patterns are formed. More specifically, examples include silicon wafers, metal substrates such as copper, chromium, iron, and aluminum, and glass substrates. As the material for the wiring pattern, for example, copper, aluminum, nickel, gold, etc. can be used.
 露光に用いる波長は、特に限定されず、ArFエキシマレーザー、KrFエキシマレーザー、Fエキシマレーザー、EUV(極端紫外線)、VUV(真空紫外線)、EB(電子線)、X線、軟X線等の放射線を用いて行うことができる。
 本実施形態のレジストパターン形成方法は、前記のレジスト膜を露光する工程において、前記レジスト膜に、EUV(極端紫外線)又はEB(電子線)を露光する形態に有用な方法である。
The wavelength used for exposure is not particularly limited, and may include ArF excimer laser, KrF excimer laser, F2 excimer laser, EUV (extreme ultraviolet), VUV (vacuum ultraviolet), EB (electron beam), X-ray, soft X-ray, etc. It can be done using radiation.
The resist pattern forming method of this embodiment is a method useful in a case where the resist film is exposed to EUV (extreme ultraviolet rays) or EB (electron beam) in the step of exposing the resist film.
 レジスト膜の露光方法は、空気や窒素等の不活性ガス中で行う通常の露光(ドライ露光)であってもよく、液浸露光(Liquid Immersion Lithography)であってもよい。
 液浸露光は、予めレジスト膜と露光装置の最下位置のレンズ間を、空気の屈折率よりも大きい屈折率を有する溶媒(液浸媒体)で満たし、その状態で露光(浸漬露光)を行う露光方法である。
 液浸媒体としては、空気の屈折率よりも大きく、かつ、露光されるレジスト膜の屈折率よりも小さい屈折率を有する溶媒が好ましく、例えば、水、フッ素系不活性液体、シリコン系溶剤、炭化水素系溶剤等が挙げられる。
 液浸媒体としては、水が好ましく用いられる。
The method of exposing the resist film may be normal exposure (dry exposure) performed in an inert gas such as air or nitrogen, or liquid immersion lithography.
In immersion exposure, the space between the resist film and the lowest lens of the exposure device is filled in advance with a solvent (immersion medium) that has a refractive index greater than that of air, and exposure (immersion exposure) is performed in that state. This is an exposure method.
The immersion medium is preferably a solvent having a refractive index greater than that of air and less than the refractive index of the resist film to be exposed, such as water, fluorine-based inert liquid, silicone-based solvent, carbonized Examples include hydrogen-based solvents.
Water is preferably used as the immersion medium.
 アルカリ現像プロセスで現像処理に用いるアルカリ現像液としては、例えば0.1~10質量%テトラメチルアンモニウムヒドロキシド(TMAH)水溶液が挙げられる。
 溶剤現像プロセスで現像処理に用いる有機系現像液が含有する有機溶剤としては、(A1)成分(露光前の(A1)成分)を溶解し得るものであればよく、公知の有機溶剤の中から適宜選択できる。具体的には、ケトン系溶剤、エステル系溶剤、アルコール系溶剤、ニトリル系溶剤、アミド系溶剤、エーテル系溶剤等の極性溶剤、炭化水素系溶剤等が挙げられる。
Examples of the alkaline developer used in the alkaline development process include a 0.1 to 10% by mass tetramethylammonium hydroxide (TMAH) aqueous solution.
The organic solvent contained in the organic developer used for development in the solvent development process may be any organic solvent as long as it can dissolve component (A1) (component (A1) before exposure), and may be selected from known organic solvents. You can choose as appropriate. Specific examples include polar solvents such as ketone solvents, ester solvents, alcohol solvents, nitrile solvents, amide solvents, and ether solvents, hydrocarbon solvents, and the like.
 エステル系溶剤としては、例えば、酢酸メチル、酢酸ブチル、酢酸エチル、酢酸イソプロピル、酢酸ペンチル、酢酸イソペンチル、酢酸アミル、プロピレングリコールモノメチルエーテルアセテート、エチレングリコールモノエチルエーテルアセテート、ジエチレングリコールモノブチルエーテルアセテート、ジエチレングリコールモノエチルエーテルアセテート、エチル-3-エトキシプロピオネート、3-メトキシブチルアセテート、3-メチル-3-メトキシブチルアセテート、蟻酸メチル、蟻酸エチル、蟻酸ブチル、蟻酸プロピル、乳酸エチル、乳酸ブチル、乳酸プロピル、ブタン酸ブチル、2-ヒドロキシイソ酪酸メチル、酢酸イソアミル、イソ酪酸イソブチル、及び、プロピオン酸ブチルが挙げられる。 Examples of ester solvents include methyl acetate, butyl acetate, ethyl acetate, isopropyl acetate, pentyl acetate, isopentyl acetate, amyl acetate, propylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl Ether acetate, ethyl-3-ethoxypropionate, 3-methoxybutyl acetate, 3-methyl-3-methoxybutyl acetate, methyl formate, ethyl formate, butyl formate, propyl formate, ethyl lactate, butyl lactate, propyl lactate, butane Examples include butyl acid, methyl 2-hydroxyisobutyrate, isoamyl acetate, isobutyl isobutyrate, and butyl propionate.
 ニトリル系溶剤としては、例えば、アセトニトリル、プロピオニトリル、バレロニトリル、ブチロニトリル等が挙げられる。 Examples of nitrile solvents include acetonitrile, propionitrile, valeronitrile, butyronitrile, and the like.
 有機系現像液には、必要に応じて公知の添加剤を配合できる。該添加剤としては、例えば界面活性剤が挙げられる。界面活性剤としては、特に限定されないが、例えばイオン性や非イオン性のフッ素系及び/又はシリコン系界面活性剤等を用いることができる。 Known additives can be added to the organic developer as necessary. Examples of such additives include surfactants. Although the surfactant is not particularly limited, for example, ionic or nonionic fluorine-based and/or silicon-based surfactants can be used.
 現像処理は、公知の現像方法により実施することが可能であり、例えば現像液中に支持体を一定時間浸漬する方法(ディップ法)、支持体表面に現像液を表面張力によって盛り上げて一定時間静止する方法(パドル法)、支持体表面に現像液を噴霧する方法(スプレー法)、一定速度で回転している支持体上に一定速度で現像液塗出ノズルをスキャンしながら現像液を塗出し続ける方法(ダイナミックディスペンス法)等が挙げられる。 The development process can be carried out by a known development method, such as a method in which the support is immersed in a developer for a certain period of time (dipping method), a method in which the support is heaped up on the surface of the support by surface tension, and then left for a certain period of time. (paddle method), spraying the developer onto the surface of the support (spray method), and applying the developer onto the rotating support while scanning the developer application nozzle at a constant speed. Examples include a method of continuous dispensing (dynamic dispensing method), etc.
 溶剤現像プロセスで現像処理後のリンス処理に用いるリンス液が含有する有機溶剤としては、例えば前記有機系現像液に用いる有機溶剤として挙げた有機溶剤のうち、レジストパターンを溶解しにくいものを適宜選択して使用できる。通常、炭化水素系溶剤、ケトン系溶剤、エステル系溶剤、アルコール系溶剤、アミド系溶剤およびエーテル系溶剤から選択される少なくとも1種類の溶剤を使用する。
 これらの有機溶剤は、いずれか1種を単独で用いてもよく、2種以上を併用してもよい。また、上記以外の有機溶剤や水と混合して用いてもよい。
As the organic solvent contained in the rinsing liquid used for rinsing after development in the solvent development process, for example, among the organic solvents listed as organic solvents used in the organic developer, those that do not easily dissolve the resist pattern are appropriately selected. It can be used as Generally, at least one solvent selected from hydrocarbon solvents, ketone solvents, ester solvents, alcohol solvents, amide solvents, and ether solvents is used.
Any one type of these organic solvents may be used alone, or two or more types may be used in combination. Further, it may be used in combination with an organic solvent other than those mentioned above or water.
 リンス液を用いたリンス処理(洗浄処理)は、公知のリンス方法により実施できる。該リンス処理の方法としては、例えば一定速度で回転している支持体上にリンス液を塗出し続ける方法(回転塗布法)、リンス液中に支持体を一定時間浸漬する方法(ディップ法)、支持体表面にリンス液を噴霧する方法(スプレー法)等が挙げられる。 The rinsing process (cleaning process) using a rinsing liquid can be performed by a known rinsing method. Examples of the rinsing method include a method of continuously applying a rinsing liquid onto a support rotating at a constant speed (rotary coating method), a method of immersing the support in a rinsing liquid for a certain period of time (dipping method), Examples include a method of spraying a rinsing liquid onto the surface of the support (spray method).
 以上説明した本実施形態のレジストパターン形成方法によれば、上述したレジスト組成物が用いられているため、高感度化が図れ、パターン寸法の均一性等のリソグラフィー特性が良好なレジストパターンを形成することができる。 According to the resist pattern forming method of the present embodiment described above, since the above-described resist composition is used, it is possible to achieve high sensitivity and form a resist pattern with good lithography characteristics such as uniformity of pattern dimensions. be able to.
 上述した実施形態のレジスト組成物、及び、上述した実施形態のパターン形成方法において使用される各種材料(例えば、レジスト溶剤、現像液、リンス液、反射防止膜形成用組成物、トップコート形成用組成物など)は、金属、ハロゲンを含む金属塩、酸、アルカリ、硫黄原子又はリン原子を含む成分等の不純物を含まないことが好ましい。ここで、金属原子を含む不純物としては、Na、K、Ca、Fe、Cu、Mn、Mg、Al、Cr、Ni、Zn、Ag、Sn、Pb、Li、またはこれらの塩などを挙げることができる。これら材料に含まれる不純物の含有量としては、200ppb以下が好ましく、1ppb以下がより好ましく、100ppt(parts per trillion)以下がさらに好ましく、10ppt以下が特に好ましく、実質的に含まないこと(測定装置の検出限界以下であること)が最も好ましい。 The resist composition of the embodiment described above, and various materials used in the pattern forming method of the embodiment described above (e.g., resist solvent, developer, rinse solution, composition for forming an antireflective film, composition for forming a top coat) It is preferable that the material does not contain impurities such as metals, metal salts containing halogens, acids, alkalis, components containing sulfur atoms, or phosphorus atoms. Here, examples of impurities containing metal atoms include Na, K, Ca, Fe, Cu, Mn, Mg, Al, Cr, Ni, Zn, Ag, Sn, Pb, Li, or salts thereof. can. The content of impurities contained in these materials is preferably 200 ppb or less, more preferably 1 ppb or less, even more preferably 100 ppt (parts per trillion) or less, particularly preferably 10 ppt or less, and substantially free of impurities (parts per trillion). most preferably below the detection limit).
(化合物)
 本発明の第3の態様に係る化合物は、下記一般式(a0-m1)で表される化合物(以下「化合物(a0)」ともいう)である。
(Compound)
The compound according to the third aspect of the present invention is a compound represented by the following general formula (a0-m1) (hereinafter also referred to as "compound (a0)").
Figure JPOXMLDOC01-appb-C000077
[式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
Figure JPOXMLDOC01-appb-C000077
[In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
 前記式(a0-m1)中、R01、R02、Y00、R00、Y01、V01、R03、Mm+及びmは、上述の一般式(a0-1)中のR01、R02、Y00、R00、Y01、V01、R03、Mm+及びmとそれぞれ同じである。 In the above formula (a0-m1), R 01 , R 02 , Y 00 , R 00 , Y 01 , V 01 , R 03 , M m+ and m are R 01 in the above general formula (a0-1), The same as R 02 , Y 00 , R 00 , Y 01 , V 01 , R 03 , M m+ and m, respectively.
 前記化合物(a0)としては、前記式(a0-m1)中のR02が、上述の一般式(a1-r-2)で表される酸解離性基である化合物、が好適に挙げられる。
 あるいは、前記化合物(a0)としては、前記式(a0-m1)中のR02が、上述の一般式(a1-r-4)で表される酸解離性基である化合物、が好適に挙げられる。
 あるいは、前記化合物(a0)としては、前記式(a0-m1)中のR00が、置換基を有する芳香族炭化水素基であり、前記置換基は、ハロゲン原子、アルキル基及びアルコキシ基からなる群より選択される一種以上である化合物、が好適に挙げられる。
 あるいは、前記化合物(a0)としては、前記式(a0-m1)中のR00が、上述の一般式(R00-1)で表される基である化合物、が好適に挙げられる。
Suitable examples of the compound (a0) include compounds in which R 02 in the formula (a0-m1) is an acid-dissociable group represented by the above-mentioned general formula (a1-r-2).
Alternatively, as the compound (a0), a compound in which R 02 in the formula (a0-m1) is an acid-dissociable group represented by the above-mentioned general formula (a1-r-4) is preferably mentioned. It will be done.
Alternatively, in the compound (a0), R 00 in the formula (a0-m1) is an aromatic hydrocarbon group having a substituent, and the substituent is composed of a halogen atom, an alkyl group, and an alkoxy group. Preferred examples include one or more compounds selected from the group.
Alternatively, suitable examples of the compound (a0) include compounds in which R 00 in the formula (a0-m1) is a group represented by the above-mentioned general formula (R 00 -1).
 以下に、化合物(a0)の具体例を挙げるが、これらに限定されない。
 Mm+は、m価のオニウムカチオンであり、好ましくは上述の一般式(ca-1)で表されるカチオンである。
Specific examples of the compound (a0) are listed below, but the invention is not limited thereto.
M m+ is an m-valent onium cation, preferably a cation represented by the above general formula (ca-1).
Figure JPOXMLDOC01-appb-C000078
Figure JPOXMLDOC01-appb-C000078
Figure JPOXMLDOC01-appb-C000079
Figure JPOXMLDOC01-appb-C000079
[化合物(a0)の製造方法]
 本実施形態の化合物(a0)は、公知の方法を組み合わせて製造することができる。
 化合物(a0)の製造方法の一実施形態としては、下記の工程(I)~(IV)を含む製造方法が挙げられる。
[Method for producing compound (a0)]
Compound (a0) of this embodiment can be produced by combining known methods.
One embodiment of the method for producing compound (a0) includes a production method including the following steps (I) to (IV).
 工程(I): 
 工程(I)では、下記一般式(a0-m0-1)で表される化合物と、下記一般式(a0-m0-2)で表される化合物と、の反応により、下記一般式(a0-m0-3)で表される化合物を得る。
Step (I):
In step (I), the following general formula (a0- A compound represented by m0-3) is obtained.
Figure JPOXMLDOC01-appb-C000080
[式中、Xhは、ハロゲン原子である。R01は、2価の連結基又は単結合である。R02は、酸解離性基である。]
Figure JPOXMLDOC01-appb-C000080
[In the formula, Xh is a halogen atom. R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. ]
 前記の反応式中のR01及びR02は、上述したR01及びR02についての説明と同様である。Xhは、ハロゲン原子であり、塩素原子が好ましい。
 工程(I)の反応温度条件は、特に限定されず、例えば0~120℃程度である。
 工程(I)の反応時間は、特に限定されず、例えば1~12時間程度である。
R 01 and R 02 in the above reaction formula are the same as the explanations for R 01 and R 02 described above. Xh is a halogen atom, preferably a chlorine atom.
The reaction temperature conditions in step (I) are not particularly limited, and are, for example, about 0 to 120°C.
The reaction time of step (I) is not particularly limited, and is, for example, about 1 to 12 hours.
 工程(I)で用いる反応溶媒としては、例えば、ジクロロメタン(CHCl)、ジクロロエタン、クロロホルム、テトラヒドロフラン(THF)、N,N-ジメチルホルムアミド、アセトニトリル、プロピオニトリル、N,N’-ジメチルアセトアミド、ジメチルスルホキシド等が挙げられる。 Examples of the reaction solvent used in step (I) include dichloromethane (CH 2 Cl 2 ), dichloroethane, chloroform, tetrahydrofuran (THF), N,N-dimethylformamide, acetonitrile, propionitrile, N,N'-dimethylacetamide. , dimethyl sulfoxide and the like.
 工程(I)の反応では、塩基性触媒を適宜選択して用いてもよい。塩基性触媒としては、例えば、トリメチルアミン、トリエチルアミン、トリブチルアミンなどの三級アミン類;ピリジン、ジメチルアミノピリジン、ピロリジノピリジンなどの芳香族アミン類;ジアザビシクロノネン(DBN)、ジアザビシクロウンデセン(DBU)等が挙げられる。 In the reaction of step (I), a basic catalyst may be selected and used as appropriate. Examples of basic catalysts include tertiary amines such as trimethylamine, triethylamine, and tributylamine; aromatic amines such as pyridine, dimethylaminopyridine, and pyrrolidinopyridine; diazabicyclononene (DBN), and diazabicycloundecene. (DBU), etc.
 工程(I)の反応が終了した後、反応液中の化合物を単離、精製してもよい。単離、精製には、従来公知の方法が利用できる。 After the reaction in step (I) is completed, the compound in the reaction solution may be isolated and purified. Conventionally known methods can be used for isolation and purification.
 工程(II):
 工程(II)では、下記一般式(a0-m0-3)で表される化合物と、アルデヒドと、の反応により、下記一般式(a0-m0-4)で表される化合物を得る。
Step (II):
In step (II), a compound represented by the following general formula (a0-m0-4) is obtained by reacting the compound represented by the following general formula (a0-m0-3) with an aldehyde.
Figure JPOXMLDOC01-appb-C000081
[式中、R02は、酸解離性基である。R01は、2価の連結基又は単結合である。Y00aは、アルデヒド由来の基である。]
Figure JPOXMLDOC01-appb-C000081
[In the formula, R 02 is an acid dissociable group. R 01 is a divalent linking group or a single bond. Y 00a is a group derived from aldehyde. ]
 前記の反応式中のR01及びR02は、上述したR01及びR02についての説明と同様である。Y00aは、アルデヒド由来の基であり、例えばホルムアルデヒド由来の基(-CH-OH)が挙げられる。
 工程(II)の反応温度条件は、特に限定されず、例えば0~120℃程度である。
 工程(II)の反応時間は、特に限定されず、例えば1~24時間程度である。
R 01 and R 02 in the above reaction formula are the same as the explanations for R 01 and R 02 described above. Y 00a is a group derived from aldehyde, such as a group derived from formaldehyde (-CH 2 -OH).
The reaction temperature conditions in step (II) are not particularly limited, and are, for example, about 0 to 120°C.
The reaction time of step (II) is not particularly limited, and is, for example, about 1 to 24 hours.
 工程(II)で用いる反応溶媒としては、例えば、トルエン、ジクロロメタン(CHCl)、ジクロロエタン、クロロホルム、テトラヒドロフラン(THF)、N,N-ジメチルホルムアミド、アセトニトリル、プロピオニトリル、N,N’-ジメチルアセトアミド、ジメチルスルホキシド等が挙げられる。 Examples of the reaction solvent used in step (II) include toluene, dichloromethane (CH 2 Cl 2 ), dichloroethane, chloroform, tetrahydrofuran (THF), N,N-dimethylformamide, acetonitrile, propionitrile, N,N'- Examples include dimethylacetamide, dimethylsulfoxide, and the like.
 工程(II)の反応では、塩基性触媒を適宜選択して用いてもよい。塩基性触媒としては、例えば、カリウムtert-ブトキシド、トリメチルアミン、トリエチルアミン、トリブチルアミンなどの三級アミン類;ピリジン、ジメチルアミノピリジン、ピロリジノピリジンなどの芳香族アミン類;ジアザビシクロオクタン(DABCO)、ジアザビシクロノネン(DBN)、ジアザビシクロウンデセン(DBU)等が挙げられる。 In the reaction of step (II), a basic catalyst may be selected and used as appropriate. Examples of the basic catalyst include tertiary amines such as potassium tert-butoxide, trimethylamine, triethylamine, and tributylamine; aromatic amines such as pyridine, dimethylaminopyridine, and pyrrolidinopyridine; diazabicyclooctane (DABCO), Examples include diazabicyclononene (DBN) and diazabicycloundecene (DBU).
 工程(II)の反応が終了した後、反応液中の化合物を単離、精製してもよい。単離、精製には、従来公知の方法が利用できる。 After the reaction in step (II) is completed, the compound in the reaction solution may be isolated and purified. Conventionally known methods can be used for isolation and purification.
 工程(III):
 工程(III)では、下記一般式(a0-m0-5)で表される化合物と、下記一般式(a0-m0-6)で表される化合物と、の反応により、下記一般式(a0-m0-7)で表される化合物を得る。
Step (III):
In step (III), the following general formula (a0- A compound represented by m0-7) is obtained.
Figure JPOXMLDOC01-appb-C000082
[式中、V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01aとY01bとは、工程(III)における反応後に、Y01を形成する基である。Y01は、酸素原子を含む2価の連結基又は単結合である。Y01及びV01は、同時に単結合になることはない。Y00bは、Y00aと縮合して、Y00を形成する基である。Y00は、2価の連結基又は単結合である。]
Figure JPOXMLDOC01-appb-C000082
[Wherein, V 01 is a single bond, an alkylene group, or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01a and Y 01b are groups that form Y 01 after the reaction in step (III). Y 01 is a divalent linking group or a single bond containing an oxygen atom. Y 01 and V 01 never become a single bond at the same time. Y 00b is a group that is condensed with Y 00a to form Y 00 . Y 00 is a divalent linking group or a single bond. ]
 前記の反応式中のV01、R03、Mm+、m、R00、Y01及びY00は、上述したV01、R03、Mm+、m、R00、Y01及びY00についての説明と同様である。
 Y01aとY01bとは、工程(III)における反応後に、Y01を形成する基である。例えば、Y01aがヒドロキシ基(-OH)であり、Y01bがカルボキシ基(-C(=O)-OH)であり、Y01がエステル結合(-C(=O)-O-)を形成する場合が挙げられる。
 Y00bは、Y00aと縮合して、Y00を形成する基である。例えば、Y00bがヒドロキシ基(-OH)であり、Y00aがホルムアルデヒド由来の基(-CH-OH)であり、Y00が-CH-O-を形成する場合が挙げられる。
 工程(III)の反応温度条件は、特に限定されず、例えば0~50℃程度である。
 工程(III)の反応時間は、特に限定されず、例えば1~12時間程度である。
V 01 , R 03 , M m+ , m, R 00 , Y 01 and Y 00 in the above reaction formula are the same as for V 01 , R 03 , M m+ , m, R 00 , Y 01 and Y 00 described above. Same as description.
Y 01a and Y 01b are groups that form Y 01 after the reaction in step (III). For example, Y 01a is a hydroxy group (-OH), Y 01b is a carboxy group (-C(=O)-OH), and Y 01 forms an ester bond (-C(=O)-O-). There are cases where this is the case.
Y 00b is a group that is condensed with Y 00a to form Y 00 . For example, Y 00b is a hydroxy group (-OH), Y 00a is a formaldehyde-derived group (-CH 2 -OH), and Y 00 forms -CH 2 -O-.
The reaction temperature conditions in step (III) are not particularly limited, and are, for example, about 0 to 50°C.
The reaction time of step (III) is not particularly limited, and is, for example, about 1 to 12 hours.
 工程(III)で用いる反応溶媒としては、例えば、ジクロロメタン、ジクロロエタン、クロロホルム、ジエチルエーテル、テトラヒドロフラン、N,N-ジメチルホルムアミド、アセトニトリル、プロピオニトリル、N,N’-ジメチルアセトアミド、ジメチルスルホキシドが挙げられる。 Examples of the reaction solvent used in step (III) include dichloromethane, dichloroethane, chloroform, diethyl ether, tetrahydrofuran, N,N-dimethylformamide, acetonitrile, propionitrile, N,N'-dimethylacetamide, and dimethylsulfoxide. .
 工程(III)の反応では、縮合剤が適宜選択して用いられる。縮合剤としては、例えば、ジシクロヘキシルカルボジイミド、ジイソプロピルカルボジイミド(DIC)、1-エチル-3-(3-ジメチルアミノプロピル)カルボジイミド塩酸塩、カルボニルジイミダゾール(CDI)等が挙げられる。 In the reaction of step (III), a condensing agent is appropriately selected and used. Examples of the condensing agent include dicyclohexylcarbodiimide, diisopropylcarbodiimide (DIC), 1-ethyl-3-(3-dimethylaminopropyl)carbodiimide hydrochloride, and carbonyldiimidazole (CDI).
 工程(III)の反応では、塩基性触媒を適宜選択して用いてもよい。塩基性触媒としては、例えば、トリメチルアミン、トリエチルアミン、トリブチルアミンなどの三級アミン類、ピリジン、ピロリジノピリジン、4-(ジメチルアミノ)ピリジン(DMAP)などの芳香族アミン類、ジアザビシクロノネン(DBN)、ジアザビシクロウンデセン(DBU)等が挙げられる。 In the reaction of step (III), a basic catalyst may be selected and used as appropriate. Examples of basic catalysts include tertiary amines such as trimethylamine, triethylamine, and tributylamine, aromatic amines such as pyridine, pyrrolidinopyridine, and 4-(dimethylamino)pyridine (DMAP), and diazabicyclononene (DBN). ), diazabicycloundecene (DBU), and the like.
 工程(III)の反応が終了した後、反応液中の化合物を単離、精製してもよい。単離、精製には、従来公知の方法が利用できる。 After the reaction in step (III) is completed, the compound in the reaction solution may be isolated and purified. Conventionally known methods can be used for isolation and purification.
 工程(IV):
 工程(IV)では、下記一般式(a0-m0-4)で表される化合物と、下記一般式(a0-m0-7)で表される化合物と、の反応により、目的の下記一般式(a0-m1)で表される化合物を得る。
Process (IV):
In step (IV), a compound represented by the following general formula (a0-m0-4) and a compound represented by the following general formula (a0-m0-7) are reacted to form the desired general formula ( A compound represented by a0-m1) is obtained.
Figure JPOXMLDOC01-appb-C000083
[式中、R02は、酸解離性基である。R01は、2価の連結基又は単結合である。Y00aは、アルデヒド由来の基である。Y00bは、Y00aと縮合して、Y00を形成する基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。Y01及びV01は、同時に単結合になることはない。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。]
Figure JPOXMLDOC01-appb-C000083
[In the formula, R 02 is an acid dissociable group. R 01 is a divalent linking group or a single bond. Y 00a is a group derived from aldehyde. Y 00b is a group that is condensed with Y 00a to form Y 00 . Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. Y 01 and V 01 never become a single bond at the same time. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. ]
 前記の反応式中のR02、R01、Y00a、Y00b、Y00、R00、Y01、V01、R03、Mm+及びmは、上述の説明と同様である。
 工程(IV)の反応温度条件は、特に限定されず、例えば0~50℃程度である。
 工程(IV)の反応時間は、特に限定されず、例えば1~12時間程度である。
R 02 , R 01 , Y 00a , Y 00b , Y 00 , R 00 , Y 01 , V 01 , R 03 , M m+ and m in the above reaction formula are the same as described above.
The reaction temperature conditions in step (IV) are not particularly limited, and are, for example, about 0 to 50°C.
The reaction time in step (IV) is not particularly limited, and is, for example, about 1 to 12 hours.
 工程(IV)で用いる反応溶媒としては、例えば、ジクロロメタン、ジクロロエタン、クロロホルム、ジエチルエーテル、テトラヒドロフラン、N,N-ジメチルホルムアミド、アセトニトリル、プロピオニトリル、N,N’-ジメチルアセトアミド、ジメチルスルホキシドが挙げられる。 Examples of the reaction solvent used in step (IV) include dichloromethane, dichloroethane, chloroform, diethyl ether, tetrahydrofuran, N,N-dimethylformamide, acetonitrile, propionitrile, N,N'-dimethylacetamide, and dimethylsulfoxide. .
 工程(IV)の反応では、縮合剤が適宜選択して用いられる。縮合剤としては、例えば、ジシクロヘキシルカルボジイミド、ジイソプロピルカルボジイミド(DIC)、1-エチル-3-(3-ジメチルアミノプロピル)カルボジイミド塩酸塩、カルボニルジイミダゾール(CDI)等が挙げられる。 In the reaction of step (IV), a condensing agent is appropriately selected and used. Examples of the condensing agent include dicyclohexylcarbodiimide, diisopropylcarbodiimide (DIC), 1-ethyl-3-(3-dimethylaminopropyl)carbodiimide hydrochloride, and carbonyldiimidazole (CDI).
 工程(IV)の反応では、塩基性触媒を適宜選択して用いてもよい。塩基性触媒としては、例えば、トリメチルアミン、トリエチルアミン、トリブチルアミンなどの三級アミン類、ピリジン、ピロリジノピリジン、4-(ジメチルアミノ)ピリジン(DMAP)などの芳香族アミン類、ジアザビシクロノネン(DBN)、ジアザビシクロウンデセン(DBU)等が挙げられる。 In the reaction of step (IV), a basic catalyst may be selected and used as appropriate. Examples of basic catalysts include tertiary amines such as trimethylamine, triethylamine, and tributylamine, aromatic amines such as pyridine, pyrrolidinopyridine, and 4-(dimethylamino)pyridine (DMAP), and diazabicyclononene (DBN). ), diazabicycloundecene (DBU), and the like.
 工程(IV)の終了後、反応液中の化合物(a0)を単離、精製してもよい。
 単離、精製には、従来公知の方法が利用でき、例えば濃縮、溶媒抽出、蒸留、結晶化、再結晶、クロマトグラフィー等をいずれか単独で、又はこれらの2種以上を組み合わせて用いることができる。
 上記のようにして得られた化合物の構造は、H-核磁気共鳴(NMR)スペクトル法、13C-NMRスペクトル法、19F-NMRスペクトル法、赤外線吸収(IR)スペクトル法、質量分析(MS)法、元素分析法、X線結晶回折法等の一般的な有機分析法により確認できる。
After completion of step (IV), compound (a0) in the reaction solution may be isolated and purified.
Conventionally known methods can be used for isolation and purification; for example, concentration, solvent extraction, distillation, crystallization, recrystallization, chromatography, etc. can be used alone or in combination of two or more of these. can.
The structure of the compound obtained as described above can be determined by 1 H-nuclear magnetic resonance (NMR) spectroscopy, 13 C-NMR spectroscopy, 19 F-NMR spectroscopy, infrared absorption (IR) spectroscopy, mass spectrometry ( It can be confirmed by general organic analysis methods such as MS) method, elemental analysis method, and X-ray crystal diffraction method.
 本実施形態の化合物は、後述する第4の態様に係る高分子化合物の原料モノマーとして利用可能である。 The compound of this embodiment can be used as a raw material monomer for a polymer compound according to the fourth aspect described below.
(高分子化合物)
 本発明の第4の態様は、下記一般式(a0-1)で表される構成単位を有する、高分子化合物である。
(polymer compound)
A fourth aspect of the present invention is a polymer compound having a structural unit represented by the following general formula (a0-1).
Figure JPOXMLDOC01-appb-C000084
[式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
Figure JPOXMLDOC01-appb-C000084
[In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
 前記第4の態様に係る高分子化合物としては、前記一般式(a0-1)で表される構成単位に加え、さらに、下記一般式(a10-1)で表される構成単位を有するものが好適に挙げられる。 In addition to the structural unit represented by the general formula (a0-1), the polymer compound according to the fourth aspect further includes a structural unit represented by the following general formula (a10-1). Preferred examples include:
Figure JPOXMLDOC01-appb-C000085
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Yax1は、2価の連結基又は単結合である。Wax1は、置換基を有してもよい芳香族炭化水素基である。nax1は、1以上の整数である。]
Figure JPOXMLDOC01-appb-C000085
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Ya x1 is a divalent linking group or a single bond. Wa x1 is an aromatic hydrocarbon group which may have a substituent. n ax1 is an integer of 1 or more. ]
 前記一般式(a0-1)で表される構成単位は、上記一般式(a0-m1)で表される化合物から誘導される構成単位であり、上述した構成単位(a0)と同じである。
 前記一般式(a10-1)で表される構成単位は、上述した構成単位(a10)と同じである。
 第4の態様に係る高分子化合物については、上述した(A1)成分についての説明と同様である。
 第4の態様に係る高分子化合物、すなわち、一般式(a0-1)で表される構成単位を有する高分子化合物は、第1の態様に係るレジスト組成物の基材成分として利用可能である。また、一般式(a0-1)で表される構成単位と、一般式(a10-1)で表される構成単位とを有する高分子化合物は、特にEUV又はEBを露光するリソグラフィー用のレジスト材料として有用なものである。
The structural unit represented by the general formula (a0-1) is a structural unit derived from the compound represented by the general formula (a0-m1), and is the same as the structural unit (a0) described above.
The structural unit represented by the general formula (a10-1) is the same as the structural unit (a10) described above.
The polymer compound according to the fourth aspect is the same as the explanation for component (A1) above.
The polymer compound according to the fourth aspect, that is, the polymer compound having a structural unit represented by general formula (a0-1), can be used as a base material component of the resist composition according to the first aspect. . In addition, a polymer compound having a structural unit represented by the general formula (a0-1) and a structural unit represented by the general formula (a10-1) is particularly useful as a resist material for lithography that exposes EUV or EB. It is useful as a.
 以下、実施例により本発明をさらに詳細に説明するが、本発明はこれらの例によって限定されるものではない。 Hereinafter, the present invention will be explained in more detail with reference to Examples, but the present invention is not limited to these Examples.
<化合物の合成例>
 [合成例1:化合物(a0-01)の合成]
 下記化合物(a0-01-2)50.0gと、ジクロロメタン500.0gと、トリエチルアミン75.8gと、4-ジメチルアミノピリジン6.1gとをフラスコに仕込み、その溶液に下記化合物(a0-01-1)58.7gを滴下し、室温で3時間撹拌した。その後、塩化アンモニウム水溶液で洗浄した後、有機層を濃縮して化合物(a0-01-3)65.4gを得た。
<Synthesis example of compound>
[Synthesis Example 1: Synthesis of compound (a0-01)]
50.0 g of the following compound (a0-01-2), 500.0 g of dichloromethane, 75.8 g of triethylamine, and 6.1 g of 4-dimethylaminopyridine were charged into a flask, and the following compound (a0-01- 1) 58.7 g was added dropwise and stirred at room temperature for 3 hours. After washing with an aqueous ammonium chloride solution, the organic layer was concentrated to obtain 65.4 g of compound (a0-01-3).
Figure JPOXMLDOC01-appb-C000086
Figure JPOXMLDOC01-appb-C000086
 下記化合物(a0-01-3)50.0gと、テトラヒドロフラン(THF)300.0gと、水300.0gと、ホルムアルデヒド10.7gとをフラスコに仕込み、その溶液に1,4-ジアザビシクロ[2.2.2]オクタン(DABCO)181.9gを添加し、90℃で12時間撹拌した。その後、イオン交換水で洗浄した後、有機層を濃縮して化合物(a0-01-4)52.6gを得た。 A flask was charged with 50.0 g of the following compound (a0-01-3), 300.0 g of tetrahydrofuran (THF), 300.0 g of water, and 10.7 g of formaldehyde, and 1,4-diazabicyclo[2. 2.2] 181.9 g of octane (DABCO) was added and stirred at 90° C. for 12 hours. After washing with ion-exchanged water, the organic layer was concentrated to obtain 52.6 g of compound (a0-01-4).
Figure JPOXMLDOC01-appb-C000087
Figure JPOXMLDOC01-appb-C000087
 下記化合物(a0-01-5)50.0gと、下記化合物(a0-01-6)55.1gと、ジクロロメタン500.0gと、1,1’-カルボニルジイミダゾール(CDI)26.7gとをフラスコに仕込み、室温で3時間撹拌した。その後、イオン交換で洗浄した後、有機層を濃縮して化合物(a0-01-7)65.7gを得た。 50.0 g of the following compound (a0-01-5), 55.1 g of the following compound (a0-01-6), 500.0 g of dichloromethane, and 26.7 g of 1,1'-carbonyldiimidazole (CDI). The mixture was charged into a flask and stirred at room temperature for 3 hours. After washing with ion exchange, the organic layer was concentrated to obtain 65.7 g of compound (a0-01-7).
Figure JPOXMLDOC01-appb-C000088
Figure JPOXMLDOC01-appb-C000088
 下記化合物(a0-01-4)50.0gと、下記化合物(a0-01-7)173.6gと、ジクロロメタン500.0gと、ジイソプロピルカルボジイミド(DIC)47.9gとをフラスコに仕込み、室温で3時間撹拌した。その後、塩酸で洗浄した後、有機層を濃縮して、目的の化合物(a0-01)157.8gを得た。 A flask was charged with 50.0 g of the following compound (a0-01-4), 173.6 g of the following compound (a0-01-7), 500.0 g of dichloromethane, and 47.9 g of diisopropylcarbodiimide (DIC), and the mixture was heated at room temperature. Stirred for 3 hours. Thereafter, after washing with hydrochloric acid, the organic layer was concentrated to obtain 157.8 g of the target compound (a0-01).
Figure JPOXMLDOC01-appb-C000089
Figure JPOXMLDOC01-appb-C000089
 得られた化合物(a0-01)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.39(3H,s),1.69(8H,m),4.61(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),7.36(15H,m),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-01) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.39 (3H, s), 1.69 (8H, m), 4.61 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 7.36 (15H, m), 8.10 (1H, d), 8.21 (1H, d)
 [合成例2:化合物(a0-02)の合成]
 化合物(a0-01-6)に代えて、下記化合物(a0-02-6)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-02)を得た。
[Synthesis Example 2: Synthesis of compound (a0-02)]
The target compound (a0-02) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-02-6) was used instead of compound (a0-01-6).
Figure JPOXMLDOC01-appb-C000090
               
Figure JPOXMLDOC01-appb-C000090
               
 得られた化合物(a0-02)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.39(3H,s),1.69(8H,m),4.61(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),7.36(15H,m),8.21(2H,s)
The obtained compound (a0-02) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.39 (3H, s), 1.69 (8H, m), 4.61 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 7.36 (15H, m), 8.21 (2H, s)
 [合成例3:化合物(a0-03)の合成]
 化合物(a0-01-2)に代えて、下記化合物(a0-03-2)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-03)を得た。
[Synthesis Example 3: Synthesis of compound (a0-03)]
The target compound (a0-03) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-03-2) was used instead of compound (a0-01-2).
Figure JPOXMLDOC01-appb-C000091
Figure JPOXMLDOC01-appb-C000091
 得られた化合物(a0-03)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.76(8H,m),4.61(2H,s),5.13(2H,t),5.28(2H,m),5.89(1H,m),6.02(1H,m),6.59(1H,m),7.36(15H,m),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-03) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.76 (8H, m), 4.61 (2H, s), 5.13 (2H, t), 5.28 (2H, m), 5.89 (1H, m), 6.02 (1H, m), 6.59 (1H, m), 7.36 (15H, m), 8.10 (1H, d), 8. 21 (1H, d)
 [合成例4:化合物(a0-04)の合成]
 化合物(a0-01-2)に代えて、下記化合物(a0-04-2)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-04)を得た。
[Synthesis Example 4: Synthesis of compound (a0-04)]
The target compound (a0-04) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-04-2) was used instead of compound (a0-01-2).
Figure JPOXMLDOC01-appb-C000092
               
Figure JPOXMLDOC01-appb-C000092
               
 得られた化合物(a0-04)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.54(6H,s),4.61(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),7.13(1H,m),7.30(2H,m),7.54(2H,m),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-04) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.54 (6H, s), 4.61 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 7.13 (1H, m), 7.30 (2H, m), 7.54 (2H, m), 8.10 (1H, d), 8. 21 (1H, d)
 [合成例5:化合物(a0-05)の合成]
 化合物(a0-01-5)に代えて、下記化合物(a0-05-5)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-05)を得た。
[Synthesis Example 5: Synthesis of compound (a0-05)]
The target compound (a0-05) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-05-5) was used instead of compound (a0-01-5).
Figure JPOXMLDOC01-appb-C000093
Figure JPOXMLDOC01-appb-C000093
 得られた化合物(a0-05)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.39(3H,s),1.69(8H,m),4.61(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),6.78(6H,m),7.36(15H,m),7.65(5H,m),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-05) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.39 (3H, s), 1.69 (8H, m), 4.61 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 6.78 (6H, m), 7.36 (15H, m), 7.65 (5H, m), 8. 10 (1H, d), 8.21 (1H, d)
 [合成例6:化合物(a0-06)の合成]
 化合物(a0-01-5)に代えて、下記化合物(a0-06-5)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-06)を得た。
[Synthesis Example 6: Synthesis of compound (a0-06)]
The target compound (a0-06) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-06-5) was used instead of compound (a0-01-5).
Figure JPOXMLDOC01-appb-C000094
Figure JPOXMLDOC01-appb-C000094
 得られた化合物(a0-06)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.39(3H,s),1.69(8H,m),1.89(2H,m),4.23(2H,t),4.60(1H,m),4.61(2H,s),6.02(1H,m),6.59(1H,m),7.36(15H,m),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-06) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.39 (3H, s), 1.69 (8H, m), 1.89 (2H, m), 4.23 (2H, t), 4.60 (1H, m), 4.61 (2H, s), 6.02 (1H, m), 6.59 (1H, m), 7.36 (15H, m), 8. 10 (1H, d), 8.21 (1H, d)
 [合成例7:化合物(a0-07)の合成]
 化合物(a0-01-6)に代えて、下記化合物(a0-07-6)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-07)を得た。
[Synthesis Example 7: Synthesis of compound (a0-07)]
The target compound (a0-07) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-07-6) was used instead of compound (a0-01-6).
Figure JPOXMLDOC01-appb-C000095
Figure JPOXMLDOC01-appb-C000095
 得られた化合物(a0-07)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.39(3H,s),1.69(8H,m),4.61(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),7.11(1H,m),7.36(15H,m),7.42(2H,m),7.95(1H,m)
The obtained compound (a0-07) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.39 (3H, s), 1.69 (8H, m), 4.61 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 7.11 (1H, m), 7.36 (15H, m), 7.42 (2H, m), 7. 95 (1H, m)
 [合成例8:化合物(a0-08)の合成]
 化合物(a0-01-6)に代えて、下記化合物(a0-08-6)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-08)を得た。
[Synthesis Example 8: Synthesis of compound (a0-08)]
The target compound (a0-08) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-08-6) was used instead of compound (a0-01-6).
Figure JPOXMLDOC01-appb-C000096
Figure JPOXMLDOC01-appb-C000096
 得られた化合物(a0-08)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.39(3H,s),1.69(8H,m),4.61(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),6.76(1H,d),7.27(1H,d),7.36(15H,m)
The obtained compound (a0-08) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.39 (3H, s), 1.69 (8H, m), 4.61 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 6.76 (1H, d), 7.27 (1H, d), 7.36 (15H, m)
 [合成例9:化合物(a0-09)の合成]
 化合物(a0-01-6)に代えて、下記化合物(a0-09-6)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-09)を得た。
[Synthesis Example 9: Synthesis of compound (a0-09)]
The target compound (a0-09) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-09-6) was used instead of compound (a0-01-6).
Figure JPOXMLDOC01-appb-C000097
Figure JPOXMLDOC01-appb-C000097
 得られた化合物(a0-09)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.39(3H,s),1.69(8H,m),4.61(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),7.36(15H,m),7.73(1H,d),8.03(1H,d)
The obtained compound (a0-09) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.39 (3H, s), 1.69 (8H, m), 4.61 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 7.36 (15H, m), 7.73 (1H, d), 8.03 (1H, d)
 [合成例10:化合物(a0-10)の合成]
 化合物(a0-01-2)に代えて、下記化合物(a0-10-2)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-10)を得た。
[Synthesis Example 10: Synthesis of compound (a0-10)]
The target compound (a0-10) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-10-2) was used instead of compound (a0-01-2).
Figure JPOXMLDOC01-appb-C000098
Figure JPOXMLDOC01-appb-C000098
 得られた化合物(a0-10)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.65(3H,s),1.65(2H,m),1.88(2H,m),1.94(2H,m),4.61(2H,s),5.13(3H,m),5.37(1H,m),6.02(1H,m),6.59(1H,m),7.36(15H,m),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-10) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.65 (3H, s), 1.65 (2H, m), 1.88 (2H, m), 1.94 (2H, m), 4.61 (2H, s), 5.13 (3H, m), 5.37 (1H, m), 6.02 (1H, m), 6.59 (1H, m), 7. 36 (15H, m), 8.10 (1H, d), 8.21 (1H, d)
 [合成例11:化合物(a0-11)の合成]
 化合物(a0-01-2)に代えて、下記化合物(a0-11-2)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-11)を得た。
[Synthesis Example 11: Synthesis of compound (a0-11)]
The target compound (a0-11) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-11-2) was used instead of compound (a0-01-2).
Figure JPOXMLDOC01-appb-C000099
Figure JPOXMLDOC01-appb-C000099
 得られた化合物(a0-11)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.24(3H,s),1.65(2H,m),1.84(2H,m),1.96(2H,m),4.61(2H,s),5.13(3H,m),6.02(1H,m),6.59(1H,m),7.36(15H,m),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-11) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.24 (3H, s), 1.65 (2H, m), 1.84 (2H, m), 1.96 (2H, m), 4.61 (2H, s), 5.13 (3H, m), 6.02 (1H, m), 6.59 (1H, m), 7.36 (15H, m), 8. 10 (1H, d), 8.21 (1H, d)
 [合成例12:化合物(a0-12)の合成]
 化合物(a0-01-2)に代えて、下記化合物(a0-12-2)を用いたこと以外は、前記合成例1と同様の方法で、目的の化合物(a0-12)を得た。
[Synthesis Example 12: Synthesis of compound (a0-12)]
The target compound (a0-12) was obtained in the same manner as in Synthesis Example 1, except that the following compound (a0-12-2) was used instead of compound (a0-01-2).
Figure JPOXMLDOC01-appb-C000100
Figure JPOXMLDOC01-appb-C000100
 得られた化合物(a0-12)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.54(6H,s),4.61(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),7.05(2H,d),7.36(15H,m),7.60(2H,d),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-12) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.54 (6H, s), 4.61 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 7.05 (2H, d), 7.36 (15H, m), 7.60 (2H, d), 8.10 (1H, d), 8. 21 (1H, d)
 [合成例13:化合物(a0-13)の合成]
 下記化合物(a0-13-2)50.0gと、ジクロロメタン500.0gと、トリエチルアミン75.8gと、4-ジメチルアミノピリジン6.1gとをフラスコに仕込み、その溶液に下記化合物(a0-13-1)90.5gを滴下し、室温で3時間撹拌した。その後、塩化アンモニウム水溶液で洗浄した後、有機層を濃縮して化合物(a0-13-3)86.9gを得た。
[Synthesis Example 13: Synthesis of compound (a0-13)]
50.0 g of the following compound (a0-13-2), 500.0 g of dichloromethane, 75.8 g of triethylamine, and 6.1 g of 4-dimethylaminopyridine were charged into a flask, and the following compound (a0-13- 1) 90.5 g was added dropwise and stirred at room temperature for 3 hours. Thereafter, after washing with an aqueous ammonium chloride solution, the organic layer was concentrated to obtain 86.9 g of compound (a0-13-3).
Figure JPOXMLDOC01-appb-C000101
Figure JPOXMLDOC01-appb-C000101
 下記化合物(a0-13-3)50.0gと、テトラヒドロフラン(THF)300.0gと、水300.0gと、ホルムアルデヒド7.8gとをフラスコに仕込み、その溶液に1,4-ジアザビシクロ[2.2.2]オクタン(DABCO)132.1gを添加し、90℃で12時間撹拌した。その後、イオン交換水で洗浄した後、有機層を濃縮して化合物(a0-13-4)50.8gを得た。 A flask was charged with 50.0 g of the following compound (a0-13-3), 300.0 g of tetrahydrofuran (THF), 300.0 g of water, and 7.8 g of formaldehyde, and 1,4-diazabicyclo[2. 2.2] 132.1 g of octane (DABCO) was added and stirred at 90° C. for 12 hours. After washing with ion-exchanged water, the organic layer was concentrated to obtain 50.8 g of compound (a0-13-4).
Figure JPOXMLDOC01-appb-C000102
Figure JPOXMLDOC01-appb-C000102
 下記化合物(a0-13-4)50.0gと、下記化合物(a0-13-5)132.0gと、ジクロロメタン500.0gと、ジイソプロピルカルボジイミド(DIC)36.5gとをフラスコに仕込み、室温で3時間撹拌した。その後、塩酸で洗浄した後、有機層を濃縮して、目的の化合物(a0-13)147.4gを得た。
 なお、化合物(a0-13-5)は、上記化合物(a0-01-7)と同一である。
A flask was charged with 50.0 g of the following compound (a0-13-4), 132.0 g of the following compound (a0-13-5), 500.0 g of dichloromethane, and 36.5 g of diisopropylcarbodiimide (DIC), and the mixture was heated at room temperature. Stirred for 3 hours. After washing with hydrochloric acid, the organic layer was concentrated to obtain 147.4 g of the target compound (a0-13).
Note that compound (a0-13-5) is the same as the above compound (a0-01-7).
Figure JPOXMLDOC01-appb-C000103
Figure JPOXMLDOC01-appb-C000103
 得られた化合物(a0-13)について、NMR測定を行い、以下の結果よりその構造を同定した。
 H-NMR(DMSO-d6,400MHz):δ(ppm)=1.39(3H,s),1.69(8H,m),4.61(2H,s),5.11(2H,s),5.13(2H,t),6.02(1H,m),6.59(1H,m),7.36(15H,m),8.10(1H,d),8.21(1H,d)
The obtained compound (a0-13) was subjected to NMR measurement, and its structure was identified from the following results.
1 H-NMR (DMSO-d6, 400 MHz): δ (ppm) = 1.39 (3H, s), 1.69 (8H, m), 4.61 (2H, s), 5.11 (2H, s), 5.13 (2H, t), 6.02 (1H, m), 6.59 (1H, m), 7.36 (15H, m), 8.10 (1H, d), 8. 21 (1H, d)
<高分子化合物の合成例>
 [高分子化合物(A1-1)の合成]
 下記化合物(a0-01)45.0gと、下記化合物(m-a10-1pre)21.0gと、重合開始剤としてアゾビス(イソ酪酸)ジメチル(V-601)1.1gとを、メチルエチルケトン(MEK)90.0gに溶解させた滴下溶液を調製した。
 温度計、還流管及び窒素導入管を繋いだ三口フラスコに、90.0gのMEKを加え、窒素雰囲気下で85℃に加熱し、前記滴下溶液を4時間かけて滴下することにより反応液を得た。
 滴下終了後、得られた反応液を85℃にて1時間撹拌した。この後、反応液を室温まで冷却した。
 次いで、冷却した反応液をヘプタン450gで沈殿させて、その沈殿物を洗浄した。
 洗浄後、得られた白色固形物をろ過し、一晩減圧乾燥して、目的の高分子化合物(A1-1)を得た。
<Example of synthesis of polymer compounds>
[Synthesis of polymer compound (A1-1)]
45.0 g of the following compound (a0-01), 21.0 g of the following compound (m-a10-1pre), and 1.1 g of azobis(isobutyric acid) dimethyl (V-601) as a polymerization initiator were added to methyl ethyl ketone (MEK). ) A dropping solution was prepared by dissolving 90.0 g.
A reaction solution was obtained by adding 90.0 g of MEK to a three-neck flask connected to a thermometer, a reflux tube, and a nitrogen inlet tube, heating it to 85 ° C. under a nitrogen atmosphere, and adding the solution dropwise over 4 hours. Ta.
After the dropwise addition was completed, the resulting reaction solution was stirred at 85° C. for 1 hour. After this, the reaction solution was cooled to room temperature.
Next, the cooled reaction solution was precipitated with 450 g of heptane, and the precipitate was washed.
After washing, the obtained white solid was filtered and dried under reduced pressure overnight to obtain the desired polymer compound (A1-1).
Figure JPOXMLDOC01-appb-C000104
Figure JPOXMLDOC01-appb-C000104
 [高分子化合物(A1-2)~(A1-14)の合成]
 使用するモノマー及びその使用量を変更したこと以外は、前記高分子化合物(A1-1)の合成と同様の方法で、高分子化合物(A1-2)~(A1-14)を合成した。
 構成単位(a0)を誘導するモノマーとして、前記の化合物(a0-02)~(a0-13)を用いた。
[Synthesis of polymer compounds (A1-2) to (A1-14)]
Polymer compounds (A1-2) to (A1-14) were synthesized in the same manner as in the synthesis of polymer compound (A1-1), except that the monomers used and the amounts thereof were changed.
The aforementioned compounds (a0-02) to (a0-13) were used as monomers for inducing the structural unit (a0).
 合成した高分子化合物(A1-1)~(A1-14)の構造を以下に示した。 The structures of the synthesized polymer compounds (A1-1) to (A1-14) are shown below.
Figure JPOXMLDOC01-appb-C000105
Figure JPOXMLDOC01-appb-C000105
Figure JPOXMLDOC01-appb-C000106
Figure JPOXMLDOC01-appb-C000106
Figure JPOXMLDOC01-appb-C000107
Figure JPOXMLDOC01-appb-C000107
Figure JPOXMLDOC01-appb-C000108
Figure JPOXMLDOC01-appb-C000108
 高分子化合物(A1-1)~(A1-14)の重量平均分子量(Mw)及び分子量分散度(Mw/Mn)を、GPC測定(標準ポリスチレン換算)により求めた。
 高分子化合物(A1-1)~(A1-14)の共重合組成比(構造式中の各構成単位の割合(モル比))を、カーボン13核磁気共鳴スペクトル(600MHz_13C-NMR)により求めた。
The weight average molecular weight (Mw) and molecular weight dispersity (Mw/Mn) of the polymer compounds (A1-1) to (A1-14) were determined by GPC measurement (standard polystyrene conversion).
The copolymerization composition ratio (ratio (mole ratio) of each structural unit in the structural formula) of the polymer compounds (A1-1) to (A1-14) was determined by carbon-13 nuclear magnetic resonance spectrum (600MHz_ 13 C-NMR). I asked for it.
 高分子化合物(A1-1):重量平均分子量(Mw)8000、分子量分散度(Mw/Mn)1.67、l/m=30/70。
 高分子化合物(A1-2):重量平均分子量(Mw)8200、分子量分散度(Mw/Mn)1.72、l/m=30/70。
 高分子化合物(A1-3):重量平均分子量(Mw)8300、分子量分散度(Mw/Mn)1.82、l/m=30/70。
 高分子化合物(A1-4):重量平均分子量(Mw)7800、分子量分散度(Mw/Mn)1.69、l/m=30/70。
 高分子化合物(A1-5):重量平均分子量(Mw)8100、分子量分散度(Mw/Mn)1.73、l/m=30/70。
 高分子化合物(A1-6):重量平均分子量(Mw)8200、分子量分散度(Mw/Mn)1.77、l/m=30/70。
 高分子化合物(A1-7):重量平均分子量(Mw)8000、分子量分散度(Mw/Mn)1.80、l/m=30/70。
 高分子化合物(A1-8):重量平均分子量(Mw)7800、分子量分散度(Mw/Mn)1.69、l/m=30/70。
 高分子化合物(A1-9):重量平均分子量(Mw)7700、分子量分散度(Mw/Mn)1.68、l/m=30/70。
 高分子化合物(A1-10):重量平均分子量(Mw)8300、分子量分散度(Mw/Mn)1.74、l/m=30/70。
 高分子化合物(A1-11):重量平均分子量(Mw)8200、分子量分散度(Mw/Mn)1.73、l/m=30/70。
 高分子化合物(A1-12):重量平均分子量(Mw)8400、分子量分散度(Mw/Mn)1.75、l/m=30/70。
 高分子化合物(A1-13):重量平均分子量(Mw)8100、分子量分散度(Mw/Mn)1.72、l/m=30/70。
 高分子化合物(A1-14):重量平均分子量(Mw)7800、分子量分散度(Mw/Mn)1.69、l/m/n=30/50/20。
Polymer compound (A1-1): weight average molecular weight (Mw) 8000, molecular weight dispersity (Mw/Mn) 1.67, l/m=30/70.
Polymer compound (A1-2): weight average molecular weight (Mw) 8200, molecular weight dispersity (Mw/Mn) 1.72, l/m=30/70.
Polymer compound (A1-3): weight average molecular weight (Mw) 8300, molecular weight dispersity (Mw/Mn) 1.82, l/m=30/70.
Polymer compound (A1-4): Weight average molecular weight (Mw) 7800, molecular weight dispersity (Mw/Mn) 1.69, l/m = 30/70.
Polymer compound (A1-5): weight average molecular weight (Mw) 8100, molecular weight dispersity (Mw/Mn) 1.73, l/m=30/70.
Polymer compound (A1-6): weight average molecular weight (Mw) 8200, molecular weight dispersity (Mw/Mn) 1.77, l/m=30/70.
Polymer compound (A1-7): weight average molecular weight (Mw) 8000, molecular weight dispersity (Mw/Mn) 1.80, l/m=30/70.
Polymer compound (A1-8): weight average molecular weight (Mw) 7800, molecular weight dispersity (Mw/Mn) 1.69, l/m=30/70.
Polymer compound (A1-9): weight average molecular weight (Mw) 7700, molecular weight dispersity (Mw/Mn) 1.68, l/m=30/70.
Polymer compound (A1-10): Weight average molecular weight (Mw) 8300, molecular weight dispersity (Mw/Mn) 1.74, l/m = 30/70.
Polymer compound (A1-11): Weight average molecular weight (Mw) 8200, molecular weight dispersity (Mw/Mn) 1.73, l/m = 30/70.
Polymer compound (A1-12): Weight average molecular weight (Mw) 8400, molecular weight dispersity (Mw/Mn) 1.75, l/m = 30/70.
Polymer compound (A1-13): weight average molecular weight (Mw) 8100, molecular weight dispersity (Mw/Mn) 1.72, l/m=30/70.
Polymer compound (A1-14): Weight average molecular weight (Mw) 7800, molecular weight dispersity (Mw/Mn) 1.69, l/m/n = 30/50/20.
<レジスト組成物の調製>
(実施例1~17、比較例1~3)
 表1に示す各成分を混合して溶解し、各例のレジスト組成物をそれぞれ調製した。
<Preparation of resist composition>
(Examples 1 to 17, Comparative Examples 1 to 3)
Each component shown in Table 1 was mixed and dissolved to prepare a resist composition for each example.
Figure JPOXMLDOC01-appb-T000109
Figure JPOXMLDOC01-appb-T000109
 表1中、各略号はそれぞれ以下の意味を有する。[ ]内の数値は配合量(質量部;固形分換算)である。 In Table 1, each abbreviation has the following meaning. The numerical value in [ ] is the blending amount (parts by mass; solid content equivalent).
 (A)-1~(A)-14:前記の高分子化合物(A1-1)~(A1-14)。 (A)-1 to (A)-14: The above-mentioned polymer compounds (A1-1) to (A1-14).
 (A)-15:下記高分子化合物(A2-1)。重量平均分子量(Mw)8400、分子量分散度(Mw/Mn)1.84、l/m=30/70。
 (A)-16:下記高分子化合物(A2-2)。重量平均分子量(Mw)7900、分子量分散度(Mw/Mn)1.69、l/m=30/70。
 (A)-17:下記高分子化合物(A2-3)。重量平均分子量(Mw)8300、分子量分散度(Mw/Mn)1.84、l/m=70/30。
 重量平均分子量(Mw)は、GPC測定により求めた標準ポリスチレン換算の重量平均分子量である。共重合組成比(構造式中の各構成単位の割合(モル比))は、13C-NMRにより求めた。
(A)-15: The following polymer compound (A2-1). Weight average molecular weight (Mw) 8400, molecular weight dispersity (Mw/Mn) 1.84, l/m=30/70.
(A)-16: The following polymer compound (A2-2). Weight average molecular weight (Mw) 7900, molecular weight dispersity (Mw/Mn) 1.69, l/m=30/70.
(A)-17: The following polymer compound (A2-3). Weight average molecular weight (Mw) 8300, molecular weight dispersity (Mw/Mn) 1.84, l/m=70/30.
The weight average molecular weight (Mw) is a standard polystyrene equivalent weight average molecular weight determined by GPC measurement. The copolymerization composition ratio (ratio (mole ratio) of each structural unit in the structural formula) was determined by 13 C-NMR.
Figure JPOXMLDOC01-appb-C000110
Figure JPOXMLDOC01-appb-C000110
 (B)-1:下記の化合物(B-1)からなる酸発生剤。
 (B)-2:下記の化合物(B-2)からなる酸発生剤。
(B)-1: An acid generator consisting of the following compound (B-1).
(B)-2: An acid generator consisting of the following compound (B-2).
Figure JPOXMLDOC01-appb-C000111
Figure JPOXMLDOC01-appb-C000111
 (D)-1:下記の化合物(D1-1)からなる酸拡散制御剤。
 (D)-2:下記の化合物(D1-2)からなる酸拡散制御剤。
(D)-1: An acid diffusion control agent consisting of the following compound (D1-1).
(D)-2: An acid diffusion control agent consisting of the following compound (D1-2).
Figure JPOXMLDOC01-appb-C000112
Figure JPOXMLDOC01-appb-C000112
 (S)-1:プロピレングリコールモノメチルエーテルアセテート/プロピレングリコールモノメチルエーテル=60/40(質量比)の混合溶剤。 (S)-1: mixed solvent of propylene glycol monomethyl ether acetate/propylene glycol monomethyl ether = 60/40 (mass ratio).
<レジストパターンの形成>
 レジスト膜を形成する工程:
 ヘキサメチルジシラザン(HMDS)処理を施した8インチシリコン基板上に、各例のレジスト組成物をそれぞれ、スピンナーを用いて塗布し、ホットプレート上で、温度110℃で60秒間のプレベーク(PAB)処理を行い、乾燥することにより、膜厚50nmのレジスト膜を形成した。
<Formation of resist pattern>
Process of forming resist film:
The resist composition of each example was applied using a spinner onto an 8-inch silicon substrate treated with hexamethyldisilazane (HMDS), and pre-baked (PAB) at a temperature of 110°C for 60 seconds on a hot plate. By processing and drying, a resist film with a thickness of 50 nm was formed.
 レジスト膜を露光する工程:
 次に、前記レジスト膜に対し、電子線描画装置JEOL-JBX-9300FS(日本電子株式会社製)を用い、加速電圧100kVにて、ターゲットサイズを、直径32nmのホールが等間隔(ピッチ64nm)に配置されたコンタクトホールパターン(以下「CHパターン」という。)とする描画(露光)を行った。
 その後、110℃で60秒間の露光後加熱(PEB)処理を行った。
Step of exposing resist film:
Next, using an electron beam lithography system JEOL-JBX-9300FS (manufactured by JEOL Ltd.), the resist film was subjected to a target size of 32 nm diameter holes at equal intervals (pitch 64 nm) at an acceleration voltage of 100 kV. Drawing (exposure) was performed to form an arranged contact hole pattern (hereinafter referred to as "CH pattern").
Thereafter, post-exposure heating (PEB) treatment was performed at 110° C. for 60 seconds.
 露光後のレジスト膜を現像する工程:
 次いで、23℃にて、2.38質量%テトラメチルアンモニウムヒドロキシド(TMAH)水溶液「NMD-3」(商品名、東京応化工業株式会社製)を用いて、60秒間のアルカリ現像を行った。
 その後、純水を用いて15秒間水リンスを行った。
 その結果、直径32nmのホールが等間隔(ピッチ64nm)に配置されたCHパターンが形成された。
Step of developing the resist film after exposure:
Next, alkaline development was performed at 23° C. for 60 seconds using a 2.38% by mass tetramethylammonium hydroxide (TMAH) aqueous solution "NMD-3" (trade name, manufactured by Tokyo Ohka Kogyo Co., Ltd.).
Thereafter, water rinsing was performed for 15 seconds using pure water.
As a result, a CH pattern was formed in which holes with a diameter of 32 nm were arranged at equal intervals (pitch 64 nm).
 [最適露光量(Eop)の評価]
 前記の<レジストパターンの形成>によってターゲットサイズのCHパターンが形成される最適露光量Eop(μC/cm)を求めた。その結果を「Eop(μC/cm)」として表2に示した。
[Evaluation of optimal exposure amount (Eop)]
The optimal exposure amount Eop (μC/cm 2 ) at which a CH pattern of the target size is formed by the above <Formation of resist pattern> was determined. The results are shown in Table 2 as "Eop (μC/cm 2 )".
 [パターン寸法の面内均一性(CDU)の評価]
 前記の<レジストパターンの形成>によって形成されたCHパターンについて、測長SEM(走査型電子顕微鏡、加速電圧500V、商品名:CG5000、日立ハイテクノロジーズ社製)により、CHパターン上空から観察し、各ホールのホール直径(nm)を測定した。そして、その測定結果から算出した標準偏差(σ)の3倍値(3σ)を求めた。その結果を「CDU(nm)」として表2に示した。
 このようにして求められる3σは、その値が小さいほど、該レジスト膜に形成された複数のホールの寸法(CD)均一性が高いことを意味する。
[Evaluation of in-plane uniformity (CDU) of pattern dimensions]
The CH pattern formed in the above <Formation of resist pattern> was observed from above the CH pattern using a length measurement SEM (scanning electron microscope, acceleration voltage 500V, product name: CG5000, manufactured by Hitachi High-Technologies). The hole diameter (nm) of the hole was measured. Then, the triple value (3σ) of the standard deviation (σ) calculated from the measurement results was determined. The results are shown in Table 2 as "CDU (nm)".
The smaller the 3σ value obtained in this way, the higher the uniformity of the dimensions (CD) of the plurality of holes formed in the resist film.
Figure JPOXMLDOC01-appb-T000113
Figure JPOXMLDOC01-appb-T000113
 表2に示す結果から、実施例1~17のレジスト組成物は、比較例1~3のレジスト組成物と比較して、感度が高められ、かつCDUが良好であることが確認できる。 From the results shown in Table 2, it can be confirmed that the resist compositions of Examples 1 to 17 have increased sensitivity and better CDU than the resist compositions of Comparative Examples 1 to 3.
 以上、本発明の好ましい実施例を説明したが、本発明はこれら実施例に限定されることはない。本発明の趣旨を逸脱しない範囲で、構成の付加、省略、置換、およびその他の変更が可能である。本発明は前述した説明によって限定されることはなく、添付の請求の範囲によってのみ限定される。 Although preferred embodiments of the present invention have been described above, the present invention is not limited to these embodiments. Additions, omissions, substitutions, and other changes to the configuration are possible without departing from the spirit of the invention. The invention is not limited by the foregoing description, but only by the scope of the claims appended hereto.

Claims (12)

  1.  露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化するレジスト組成物であって、
     酸の作用により現像液に対する溶解性が変化する樹脂成分(A1)を含有し、
     前記樹脂成分(A1)は、下記一般式(a0-1)で表される構成単位(a0)を有する、レジスト組成物。
    Figure JPOXMLDOC01-appb-C000001
    [式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
    A resist composition that generates acid upon exposure and whose solubility in a developer changes due to the action of the acid,
    Contains a resin component (A1) whose solubility in a developer changes due to the action of an acid,
    The resin component (A1) is a resist composition having a structural unit (a0) represented by the following general formula (a0-1).
    Figure JPOXMLDOC01-appb-C000001
    [In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
  2.  前記一般式(a0-1)におけるR02は、下記一般式(a1-r-2)で表される酸解離性基である、請求項1に記載のレジスト組成物。
    Figure JPOXMLDOC01-appb-C000002
    [式中、Ra’~Ra’はそれぞれ炭化水素基であって、Ra’とRa’とは互いに結合して環を形成してもよい。*は、前記一般式(a0-1)におけるR02と結合する酸素原子との結合手を表す。]
    The resist composition according to claim 1, wherein R 02 in the general formula (a0-1) is an acid-dissociable group represented by the following general formula (a1-r-2).
    Figure JPOXMLDOC01-appb-C000002
    [In the formula, Ra' 4 to Ra' 6 are each a hydrocarbon group, and Ra' 5 and Ra' 6 may be bonded to each other to form a ring. * represents a bond with the oxygen atom bonded to R 02 in the general formula (a0-1). ]
  3.  前記一般式(a0-1)におけるR02は、下記一般式(a1-r-4)で表される酸解離性基である、請求項1に記載のレジスト組成物。
    Figure JPOXMLDOC01-appb-C000003
    [式中、Ra’10は、炭化水素基である。Ra’11a及びRa’11bは、それぞれ独立に、水素原子、ハロゲン原子又はアルキル基である。Ra’12は、水素原子又は炭化水素基である。Ra’10と、Ra’11a又はRa’11bとは、互いに結合して環を形成してもよい。Ra’11a又はRa’11bと、Ra’12とは、互いに結合して環を形成してもよい。*は、前記一般式(a0-1)におけるR02と結合する酸素原子との結合手を表す。]
    The resist composition according to claim 1, wherein R 02 in the general formula (a0-1) is an acid-dissociable group represented by the following general formula (a1-r-4).
    Figure JPOXMLDOC01-appb-C000003
    [In the formula, Ra' 10 is a hydrocarbon group. Ra' 11a and Ra' 11b are each independently a hydrogen atom, a halogen atom, or an alkyl group. Ra' 12 is a hydrogen atom or a hydrocarbon group. Ra' 10 and Ra' 11a or Ra' 11b may be bonded to each other to form a ring. Ra' 11a or Ra' 11b and Ra' 12 may be bonded to each other to form a ring. * represents a bond with the oxygen atom bonded to R 02 in the general formula (a0-1). ]
  4.  前記一般式(a0-1)におけるR00は、置換基を有する芳香族炭化水素基であり、前記置換基は、ハロゲン原子、アルキル基及びアルコキシ基からなる群より選択される一種以上である、請求項1に記載のレジスト組成物。 R 00 in the general formula (a0-1) is an aromatic hydrocarbon group having a substituent, and the substituent is one or more types selected from the group consisting of a halogen atom, an alkyl group, and an alkoxy group. The resist composition according to claim 1.
  5.  前記一般式(a0-1)におけるR00は、下記一般式(R00-1)で表される基である、請求項1に記載のレジスト組成物。
    Figure JPOXMLDOC01-appb-C000004
    [式中、Ra1及びRa2は、それぞれ独立に、ハロゲン原子、アルキル基又はアルコキシ基である。m0は、0以上2以下の整数である。0≦n1≦m0×2+2である。0≦n2≦4である。0≦n1+n2≦m0×2+4である。*11及び*12のいずれか一方は、前記一般式(a0-1)におけるY00との結合手を表す。*21及び*22のいずれか一方は、前記一般式(a0-1)におけるY01との結合手を表す。]
    The resist composition according to claim 1, wherein R 00 in the general formula (a0-1) is a group represented by the following general formula (R 00 -1).
    Figure JPOXMLDOC01-appb-C000004
    [In the formula, R a1 and R a2 each independently represent a halogen atom, an alkyl group, or an alkoxy group. m0 is an integer from 0 to 2. 0≦n1≦m0×2+2. 0≦n2≦4. 0≦n1+n2≦m0×2+4. Either *11 or *12 represents a bond with Y 00 in the general formula (a0-1). Either *21 or *22 represents a bond with Y 01 in the general formula (a0-1). ]
  6.  前記樹脂成分(A1)は、さらに、下記一般式(a10-1)で表される構成単位(a10)を有する、請求項1に記載のレジスト組成物。
    Figure JPOXMLDOC01-appb-C000005
    [式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Yax1は、2価の連結基又は単結合である。Wax1は、置換基を有してもよい芳香族炭化水素基である。nax1は、1以上の整数である。]
    The resist composition according to claim 1, wherein the resin component (A1) further has a structural unit (a10) represented by the following general formula (a10-1).
    Figure JPOXMLDOC01-appb-C000005
    [In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Ya x1 is a divalent linking group or a single bond. Wa x1 is an aromatic hydrocarbon group which may have a substituent. n ax1 is an integer of 1 or more. ]
  7.  さらに、露光により酸を発生する酸発生剤成分(B)を含有する、請求項1に記載のレジスト組成物。 The resist composition according to claim 1, further comprising an acid generator component (B) that generates acid upon exposure.
  8.  支持体上に、請求項1~7のいずれか一項に記載のレジスト組成物を用いてレジスト膜を形成する工程、前記レジスト膜を露光する工程、及び前記露光後のレジスト膜を現像してレジストパターンを形成する工程を有する、レジストパターン形成方法。 A step of forming a resist film on a support using the resist composition according to any one of claims 1 to 7, a step of exposing the resist film, and a step of developing the resist film after the exposure. A resist pattern forming method comprising a step of forming a resist pattern.
  9.  前記のレジスト膜を露光する工程において、前記レジスト膜に、EUV(極端紫外線)又はEB(電子線)を露光する、請求項8に記載のレジストパターン形成方法。 The resist pattern forming method according to claim 8, wherein in the step of exposing the resist film, the resist film is exposed to EUV (extreme ultraviolet light) or EB (electron beam).
  10.  下記一般式(a0-m1)で表される化合物。
    Figure JPOXMLDOC01-appb-C000006
    [式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
    A compound represented by the following general formula (a0-m1).
    Figure JPOXMLDOC01-appb-C000006
    [In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
  11.  下記一般式(a0-1)で表される構成単位を有する、高分子化合物。
    Figure JPOXMLDOC01-appb-C000007
    [式中、R01は、2価の連結基又は単結合である。R02は、酸解離性基である。Y00は、2価の連結基又は単結合である。R00は、置換基を有してもよい芳香族炭化水素基である。Y01は、酸素原子を含む2価の連結基又は単結合である。V01は、単結合、アルキレン基又はフッ素化アルキレン基である。R03は、水素原子、フッ素原子又はフッ素化アルキル基である。Mm+は、m価のオニウムカチオンである。mは1以上の整数である。Y01及びV01は、同時に単結合になることはない。]
    A polymer compound having a structural unit represented by the following general formula (a0-1).
    Figure JPOXMLDOC01-appb-C000007
    [In the formula, R 01 is a divalent linking group or a single bond. R 02 is an acid dissociable group. Y 00 is a divalent linking group or a single bond. R 00 is an aromatic hydrocarbon group which may have a substituent. Y 01 is a divalent linking group or a single bond containing an oxygen atom. V 01 is a single bond, an alkylene group or a fluorinated alkylene group. R 03 is a hydrogen atom, a fluorine atom, or a fluorinated alkyl group. M m+ is an m-valent onium cation. m is an integer of 1 or more. Y 01 and V 01 never become a single bond at the same time. ]
  12.  さらに、下記一般式(a10-1)で表される構成単位を有する、請求項11に記載の高分子化合物。
    Figure JPOXMLDOC01-appb-C000008
    [式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Yax1は、2価の連結基又は単結合である。Wax1は、置換基を有してもよい芳香族炭化水素基である。nax1は、1以上の整数である。]
    The polymer compound according to claim 11, further comprising a structural unit represented by the following general formula (a10-1).
    Figure JPOXMLDOC01-appb-C000008
    [In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Ya x1 is a divalent linking group or a single bond. Wa x1 is an aromatic hydrocarbon group which may have a substituent. n ax1 is an integer of 1 or more. ]
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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012224586A (en) * 2011-04-20 2012-11-15 Tokyo Ohka Kogyo Co Ltd Compound, polymer compound, acid generator, resist composition, and method for forming resist pattern
JP2013067777A (en) * 2011-09-08 2013-04-18 Central Glass Co Ltd Fluorine-containing sulfonates, fluorine-containing sulfonate resin, resist composition, and pattern formation method using the same
JP2014058511A (en) * 2012-08-22 2014-04-03 Sumitomo Chemical Co Ltd Method for producing salt, resist composition and resist pattern
JP2014153440A (en) * 2013-02-05 2014-08-25 Tokyo Ohka Kogyo Co Ltd Resist composition, polymeric compound, compound and method for forming resist pattern
JP2014152122A (en) * 2013-02-05 2014-08-25 Tokyo Ohka Kogyo Co Ltd Compound, polymeric compound, resist composition and method for forming resist pattern
JP2018115157A (en) * 2017-01-19 2018-07-26 住友化学株式会社 Salt, acid generator, resist composition, and method for producing resist pattern
JP2022032972A (en) * 2020-08-13 2022-02-25 信越化学工業株式会社 Positive resist material and pattern forming method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012224586A (en) * 2011-04-20 2012-11-15 Tokyo Ohka Kogyo Co Ltd Compound, polymer compound, acid generator, resist composition, and method for forming resist pattern
JP2013067777A (en) * 2011-09-08 2013-04-18 Central Glass Co Ltd Fluorine-containing sulfonates, fluorine-containing sulfonate resin, resist composition, and pattern formation method using the same
JP2014058511A (en) * 2012-08-22 2014-04-03 Sumitomo Chemical Co Ltd Method for producing salt, resist composition and resist pattern
JP2014153440A (en) * 2013-02-05 2014-08-25 Tokyo Ohka Kogyo Co Ltd Resist composition, polymeric compound, compound and method for forming resist pattern
JP2014152122A (en) * 2013-02-05 2014-08-25 Tokyo Ohka Kogyo Co Ltd Compound, polymeric compound, resist composition and method for forming resist pattern
JP2018115157A (en) * 2017-01-19 2018-07-26 住友化学株式会社 Salt, acid generator, resist composition, and method for producing resist pattern
JP2022032972A (en) * 2020-08-13 2022-02-25 信越化学工業株式会社 Positive resist material and pattern forming method

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