WO2024085181A1 - Resist composition, resist pattern formation method, and compound - Google Patents

Resist composition, resist pattern formation method, and compound Download PDF

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Publication number
WO2024085181A1
WO2024085181A1 PCT/JP2023/037680 JP2023037680W WO2024085181A1 WO 2024085181 A1 WO2024085181 A1 WO 2024085181A1 JP 2023037680 W JP2023037680 W JP 2023037680W WO 2024085181 A1 WO2024085181 A1 WO 2024085181A1
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group
carbon atoms
acid
substituent
formula
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PCT/JP2023/037680
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French (fr)
Japanese (ja)
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行志 大西
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東京応化工業株式会社
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F12/00Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring
    • C08F12/02Monomers containing only one unsaturated aliphatic radical
    • C08F12/04Monomers containing only one unsaturated aliphatic radical containing one ring
    • C08F12/14Monomers containing only one unsaturated aliphatic radical containing one ring substituted by hetero atoms or groups containing heteroatoms
    • C08F12/22Oxygen
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor

Definitions

  • the present invention relates to a resist composition, a method of forming a resist pattern, and a compound.
  • a common method of miniaturization is to shorten the wavelength (increase the energy) of the exposure light source.
  • Resist materials are required to have lithography properties such as sensitivity to these exposure light sources and resolution capable of reproducing patterns with fine dimensions.
  • lithography properties such as sensitivity to these exposure light sources and resolution capable of reproducing patterns with fine dimensions.
  • a chemically amplified resist composition that contains a base component whose solubility in a developer changes due to the action of acid, and an acid generator component that generates acid upon exposure, has been used so far.
  • Patent Document 1 discloses a resist composition that contains a resin component having a styrene carboxylic acid skeleton and a structural unit in which an acid-dissociable group is bonded to the end of the side chain. It is disclosed that this resist composition can achieve high sensitivity and improve lithography properties such as resolution and LWR.
  • Resist compositions are required to improve lithography properties such as sensitivity and roughness without making a trade-off between them. Furthermore, etching resistance is also required due to the thinner resist film that accompanies fine patterns.
  • the present invention has been made in consideration of the above circumstances, and aims to provide a resist composition that provides high sensitivity when forming a resist pattern, has good lithography properties, and has good etching resistance, a method for forming a resist pattern using the resist composition, and a compound that is useful as a raw material for the base component used in the resist composition.
  • a first aspect of the present invention is a resist composition that generates acid upon exposure, and whose solubility in a developer changes due to the action of the acid, the resist composition containing a resin component (A1) whose solubility in a developer changes due to the action of an acid, the resin component (A1) having a structural unit (a0) derived from a compound represented by the following general formula (a0-1):
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms;
  • Ar is an aromatic ring;
  • Ra 01 is an acid dissociable group;
  • m1 is an integer of 1 or more as long as the valence allows;
  • Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent;
  • m2 is an integer of 1 or more as long as the valence allows;
  • Ra 03 is a substituent other than COORa 01 and Ra 02 ; and
  • m3 is an integer of 0 or more as long as the valence allows.
  • the second aspect of the present invention is a method for forming a resist pattern, comprising the steps of forming a resist film on a support using the resist composition according to the first aspect, exposing the resist film to light, and developing the exposed resist film to form a resist pattern.
  • the third aspect of the present invention is a compound represented by the following general formula (a0-11):
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms;
  • Ar is an aromatic ring;
  • Ra 011 is an acid dissociable group containing a ring structure;
  • m1 is an integer of 1 or more as long as the valence allows;
  • Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent;
  • m2 is an integer of 1 or more as long as the valence allows;
  • Ra 03 is a substituent other than COORa 01 and Ra 02 ; and
  • m3 is an integer of 0 or more as long as the valence allows.
  • the present invention provides a resist composition that provides high sensitivity when forming a resist pattern, has good lithography properties, and has good etching resistance, a method for forming a resist pattern using the resist composition, and a compound that is useful as a raw material for the base component used in the resist composition.
  • alkyl group includes linear, branched and cyclic monovalent saturated hydrocarbon groups. The same applies to the alkyl group in an alkoxy group.
  • alkylene group includes linear, branched and cyclic divalent saturated hydrocarbon groups.
  • halogen atom includes a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
  • structural unit refers to a monomer unit that constitutes a polymeric compound (resin, polymer, copolymer).
  • the phrase "may have a substituent” includes both the case where a hydrogen atom (--H) is replaced with a monovalent group and the case where a methylene group (--CH 2 -) is replaced with a divalent group.
  • exposure is intended to include the general concept of irradiation with radiation.
  • acid-decomposable group refers to a group having acid decomposability in which at least a part of the bonds in the structure of the acid-decomposable group can be cleaved by the action of an acid.
  • acid-decomposable groups whose polarity increases under the action of an acid include groups that are decomposed by the action of an acid to generate a polar group.
  • the polar group include a carboxy group, a hydroxyl group, an amino group, and a sulfo group (-SO 3 H).
  • the acid-decomposable group include groups in which the polar group is protected with an acid-dissociable group (for example, a group in which the hydrogen atom of an OH-containing polar group is protected with an acid-dissociable group).
  • acid dissociable group refers to both (i) a group having acid dissociability in which the bond between the acid dissociable group and an atom adjacent to the acid dissociable group can be cleaved by the action of an acid, and (ii) a group in which a part of the bond is cleaved by the action of an acid and then a decarboxylation reaction occurs, thereby cleaving the bond between the acid dissociable group and an atom adjacent to the acid dissociable group.
  • the acid dissociable group constituting the acid decomposable group must be a group with lower polarity than the polar group generated by dissociation of the acid dissociable group, and thus, when the acid dissociable group is dissociated by the action of acid, a polar group with higher polarity than the acid dissociable group is generated, and the polarity increases.As a result, the polarity of the entire (A1) component increases.By increasing the polarity, the solubility in the developer changes relatively, and when the developer is an alkaline developer, the solubility increases, and when the developer is an organic developer, the solubility decreases.
  • the “base material component” is an organic compound that has film-forming ability.
  • Organic compounds used as base material components are broadly divided into non-polymers and polymers.
  • Non-polymers usually have a molecular weight of 500 or more and less than 4000 (hereinafter referred to as “low molecular weight compounds”).
  • “resin,” “polymeric compound,” or “polymer” refers to a polymer with a molecular weight of 1000 or more. The molecular weight of the polymer is determined by the weight average molecular weight calculated in terms of polystyrene by GPC (gel permeation chromatography).
  • derived structural unit refers to a structural unit formed by cleavage of a multiple bond between carbon atoms, for example, an ethylenic double bond.
  • the hydrogen atom bonded to the carbon atom at the ⁇ -position may be substituted with a substituent.
  • the substituent (R ⁇ x ) substituting the hydrogen atom bonded to the carbon atom at the ⁇ -position is an atom or group other than a hydrogen atom.
  • an itaconic acid diester in which the substituent (R ⁇ x ) is substituted with a substituent containing an ester bond
  • an ⁇ -hydroxyacrylic ester in which the substituent (R ⁇ x ) is substituted with a hydroxyalkyl group or a group in which the hydroxyl group is modified.
  • the carbon atom at the ⁇ -position of an acrylic acid ester refers to the carbon atom to which the carbonyl group of acrylic acid is bonded, unless otherwise specified.
  • an acrylic ester in which the hydrogen atom bonded to the carbon atom at the ⁇ -position is substituted with a substituent will sometimes be referred to as an ⁇ -substituted acrylic ester.
  • derivative refers to a concept that includes compounds in which the hydrogen atom at the ⁇ -position of the target compound is replaced with other substituents such as an alkyl group or a halogenated alkyl group, as well as derivatives thereof.
  • examples of such derivatives include compounds in which the hydrogen atom of the hydroxyl group of a target compound, which may have the hydrogen atom at the ⁇ -position replaced with a substituent, is replaced with an organic group; compounds in which the hydrogen atom at the ⁇ -position of the target compound, which may have the hydrogen atom at the ⁇ -position replaced with a substituent, is bonded to a substituent other than a hydroxyl group, and the like.
  • the ⁇ -position refers to the first carbon atom adjacent to the functional group, unless otherwise specified.
  • Examples of the substituent that substitutes the hydrogen atom at the ⁇ -position of the hydroxystyrene include the same as those for R ⁇ x .
  • the resist composition of this embodiment generates an acid upon exposure, and the solubility of the resist composition in a developer changes due to the action of the acid.
  • the resist composition contains a base component (A) (hereinafter also referred to as "component (A)”) whose solubility in a developer changes under the action of an acid.
  • the component (A1) has a structural unit (a0) derived from a compound represented by general formula (a0) described below.
  • the resist composition of this embodiment may further contain other components in addition to the component (A). Examples of other components include the below-described component (B), component (D), component (E), component (F), and component (S).
  • the component (A) may generate an acid upon exposure, or an additive component that is formulated separately from the component (A) may generate an acid upon exposure.
  • the resist composition of this embodiment may be one that further contains (1) an acid generator component (B) that generates an acid upon exposure (hereinafter referred to as “component (B)”); (2) the component (A) may be a component that generates an acid upon exposure; or (3) the component (A) is a component that generates an acid upon exposure, and further contains component (B). That is, in the above cases of (2) and (3), the component (A) is a "base component that generates an acid upon exposure and changes its solubility in a developer by the action of the acid".
  • the component (A) is a base component that generates an acid upon exposure and changes its solubility in a developer by the action of the acid
  • the component (A1) described below is preferably a resin that generates an acid upon exposure and changes its solubility in a developer by the action of the acid.
  • a resin a polymer compound having a structural unit that generates an acid upon exposure can be used.
  • the structural unit that generates an acid upon exposure a known one can be used.
  • the resist composition of this embodiment is preferably the above-mentioned case (1).
  • the resist composition of this embodiment preferably contains component (A) and component (B).
  • a resist film is formed using the resist composition of this embodiment and selectively exposed to light
  • an acid is generated from component (B) in the exposed parts of the resist film, and the solubility of component (A) in the developer changes due to the action of the acid, whereas the solubility of component (A) in the developer does not change in the unexposed parts of the resist film, resulting in a difference in solubility in the developer between the exposed and unexposed parts. Therefore, when the resist film is developed, if the resist composition is a positive type, the exposed parts of the resist film are dissolved and removed to form a positive type resist pattern, and if the resist composition is a negative type, the unexposed parts of the resist film are dissolved and removed to form a negative type resist pattern.
  • the resist composition of this embodiment may be a positive resist composition or a negative resist composition.
  • the resist composition of this embodiment may be for an alkaline development process in which an alkaline developer is used in the development treatment during resist pattern formation, or may be for a solvent development process in which a developer containing an organic solvent (organic developer) is used in the development treatment.
  • the component (A) contains a resin component (A1) (hereinafter also referred to as “component (A1)”) whose solubility in a developer changes under the action of an acid.
  • component (A1) a resin component (hereinafter also referred to as “component (A1)”
  • the polarity of the base component changes between before and after exposure, making it possible to obtain good development contrast not only in an alkali development process but also in a solvent development process.
  • component (A) other polymeric compounds and/or low molecular weight compounds may be used in combination with the component (A1).
  • the component (A) may be a "base component that generates an acid upon exposure and changes its solubility in a developer by the action of the acid".
  • the component (A) is a base component that generates an acid upon exposure and changes its solubility in a developer by the action of the acid
  • the component (A1) is preferably a resin that generates an acid upon exposure and changes its solubility in a developer by the action of the acid.
  • a resin a polymer compound having a structural unit that generates an acid upon exposure can be used.
  • the structural unit that generates an acid upon exposure a known one can be used.
  • the component (A) may be used alone or in combination of two or more types.
  • the component (A1) is a resin component whose solubility in a developer changes due to the action of an acid.
  • the component (A1) has a structural unit (a0) derived from a compound represented by general formula (a0-1) shown below.
  • the component (A1) may contain other structural units, in addition to the structural unit (a0), as necessary.
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms;
  • Ar is an aromatic ring;
  • Ra 01 is an acid dissociable group;
  • m1 is an integer of 1 or more as long as the valence allows;
  • Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent;
  • m2 is an integer of 1 or more as long as the valence allows;
  • Ra 03 is a substituent other than COORa 01 and Ra 02 ; and
  • m3 is an integer of 0 or more as long as the valence allows.
  • R represents a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom, a methyl group, or a trifluoromethyl group is more preferable, a hydrogen atom or a methyl group is still more preferable, and a hydrogen atom is particularly preferable.
  • L 01 is a single bond or —C( ⁇ O)—O—, and is preferably a single bond.
  • Ra 01 represents an acid dissociable group.
  • the acid-dissociable group include those that have been proposed as acid-dissociable groups in base resins for chemically amplified resist compositions.
  • Specific examples of the acid dissociable group that have been proposed for the base resin of the chemically amplified resist composition include the "acetal type acid dissociable group,”"tertiary alkyl ester type acid dissociable group,””tertiary alkyloxycarbonyl acid dissociable group,” and “secondary alkyl ester type acid dissociable group,” which are explained below.
  • Acetal-type acid-dissociable group Among the polar groups, examples of the acid dissociable group protecting a carboxy group or a hydroxyl group include an acid dissociable group represented by the following general formula (a1-r-1) (hereinafter sometimes referred to as an “acetal-type acid dissociable group”).
  • Ra' 1 and Ra' 2 are a hydrogen atom or an alkyl group.
  • Ra' 3 is a hydrocarbon group, and Ra' 3 may be bonded to either Ra' 1 or Ra' 2 to form a ring.
  • At least one of Ra'1 and Ra'2 is preferably a hydrogen atom, and more preferably both are hydrogen atoms.
  • Ra'1 or Ra'2 is an alkyl group
  • examples of the alkyl group include the same alkyl groups as those exemplified as the substituent that may be bonded to the carbon atom at the ⁇ -position in the description of the above ⁇ -substituted acrylic acid ester, and an alkyl group having 1 to 5 carbon atoms is preferred.
  • preferred examples are linear or branched alkyl groups.
  • More specific examples include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, and a neopentyl group, and the like.
  • a methyl group or an ethyl group is more preferred, and a methyl group is particularly preferred.
  • the hydrocarbon group for Ra'3 includes a linear or branched alkyl group, or a cyclic hydrocarbon group.
  • the linear alkyl group preferably has 1 to 5 carbon atoms, more preferably 1 to 4 carbon atoms, and even more preferably 1 or 2 carbon atoms.
  • Specific examples include a methyl group, an ethyl group, an n-propyl group, an n-butyl group, and an n-pentyl group. Of these, a methyl group, an ethyl group, or an n-butyl group is preferred, and a methyl group or an ethyl group is more preferred.
  • the branched alkyl group preferably has 3 to 10 carbon atoms, and more preferably has 3 to 5 carbon atoms. Specific examples include isopropyl, isobutyl, tert-butyl, isopentyl, neopentyl, 1,1-diethylpropyl, and 2,2-dimethylbutyl groups, with isopropyl being preferred.
  • the hydrocarbon group may be an alicyclic hydrocarbon group or an aromatic hydrocarbon group, and may be a polycyclic group or a monocyclic group.
  • the monocyclic alicyclic hydrocarbon group is preferably a group in which one hydrogen atom has been removed from a monocycloalkane.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane.
  • the alicyclic hydrocarbon group that is a polycyclic group is preferably a group in which one hydrogen atom has been removed from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms, and specific examples thereof include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
  • the aromatic hydrocarbon group of Ra'3 is an aromatic hydrocarbon group
  • the aromatic hydrocarbon group is a hydrocarbon group having at least one aromatic ring.
  • the aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 ⁇ electrons, and may be monocyclic or polycyclic.
  • the aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, further preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms.
  • aromatic ring examples include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; and aromatic heterocycles in which a part of the carbon atoms constituting the aromatic hydrocarbon ring is replaced with a heteroatom.
  • heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • aromatic heterocycle include a pyridine ring and a thiophene ring.
  • aromatic hydrocarbon group in Ra'3 include a group in which one hydrogen atom has been removed from the aromatic hydrocarbon ring or aromatic heterocycle (aryl group or heteroaryl group); a group in which one hydrogen atom has been removed from an aromatic compound containing two or more aromatic rings (e.g., biphenyl, fluorene, etc.); and a group in which one hydrogen atom of the aromatic hydrocarbon ring or aromatic heterocycle has been substituted with an alkylene group (e.g., arylalkyl groups such as benzyl group, phenethyl group, 1-naphthylmethyl group, 2-naphthylmethyl group, 1-naphthylethyl group, 2-naphthylethyl group, etc.).
  • the alkylene group bonded to the aromatic hydrocarbon ring or aromatic heterocycle preferably has 1 to 4 carbon atoms, more preferably has 1 to 2 carbon atoms, and particularly preferably has 1 carbon atom.
  • the cyclic hydrocarbon group for Ra'3 may have a substituent.
  • substituents include -R P1 , -R P2 -O-R P1 , -R P2 -CO-R P1 , -R P2 -CO-OR P1 , -R P2 -O-CO- R P1 , -R P2 -OH, -R P2 -CN or -R P2 -COOH (hereinafter these substituents are collectively referred to as "Ra x5 ").
  • R P1 is a monovalent linear saturated hydrocarbon group having 1 to 10 carbon atoms, a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms, or a monovalent aromatic hydrocarbon group having 6 to 30 carbon atoms.
  • R P2 is a single bond, a divalent linear saturated hydrocarbon group having 1 to 10 carbon atoms, a divalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms, or a divalent aromatic hydrocarbon group having 6 to 30 carbon atoms.
  • the hydrogen atoms of the linear saturated hydrocarbon group, the aliphatic cyclic saturated hydrocarbon group, and the aromatic hydrocarbon group of R P1 and R P2 may be substituted with fluorine atoms.
  • the aliphatic cyclic hydrocarbon group may have one or more of the above-mentioned substituents alone, or may have one or more of each of the above-mentioned substituents.
  • Examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, and a decyl group.
  • Examples of the monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms include monocyclic aliphatic saturated hydrocarbon groups such as a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, a cyclodecyl group, and a cyclododecyl group; and polycyclic aliphatic saturated hydrocarbon groups such as a bicyclo[2.2.2]octanyl group, a tricyclo[5.2.1.02,6]decanyl group, a tricyclo[3.3.1.13,7]decanyl group, a tetracyclo[6.2.1.13,6.02,7]dodecanyl group, and an adamantyl group.
  • monocyclic aliphatic saturated hydrocarbon groups such as a cyclopropyl group,
  • Examples of the monovalent aromatic hydrocarbon group having 6 to 30 carbon atoms include groups in which one hydrogen atom has been removed from an aromatic hydrocarbon ring such as benzene, biphenyl, fluorene, naphthalene, anthracene, and phenanthrene.
  • the cyclic group is preferably a 4- to 7-membered ring, more preferably a 4- to 6-membered ring.
  • Specific examples of the cyclic group include a tetrahydropyranyl group and a tetrahydrofuranyl group.
  • Tertiary alkyl ester type acid-dissociable group examples of the acid-dissociable group that protects the carboxy group include acid-dissociable groups represented by the following general formula (a1-r-2).
  • acid-dissociable groups represented by the following formula (a1-r-2) those constituted by an alkyl group may be referred to as "tertiary alkyl ester-type acid-dissociable groups" hereinafter for the sake of convenience.
  • Ra' 4 to Ra' 6 are each a hydrocarbon group, and Ra' 5 and Ra' 6 may be bonded to each other to form a ring.
  • Examples of the hydrocarbon group for Ra'4 include a linear or branched alkyl group, a linear or cyclic alkenyl group, a linear alkynyl group, or a cyclic hydrocarbon group.
  • Examples of the linear or branched alkyl group and cyclic hydrocarbon group (monocyclic alicyclic hydrocarbon group, polycyclic alicyclic hydrocarbon group, and aromatic hydrocarbon group) in Ra'4 are the same as those for Ra'3 .
  • the chain or cyclic alkenyl group for Ra'4 is preferably an alkenyl group having 2 to 10 carbon atoms.
  • Examples of the hydrocarbon group for Ra' 5 and Ra' 6 include the same as those for Ra' 3 above.
  • Ra'5 and Ra'6 are bonded to each other to form a ring
  • suitable examples of such a ring include a group represented by the following general formula (a1-r2-1), a group represented by the following general formula (a1-r2-2), and a group represented by the following general formula (a1-r2-3).
  • suitable examples include groups represented by the following general formula (a1-r2-4).
  • Ra' 10 represents a linear or branched alkyl group having 1 to 12 carbon atoms, some of which may be substituted with a halogen atom or a heteroatom-containing group.
  • Ra' 11 represents a group which forms an aliphatic cyclic group which may have a substituent together with the carbon atom to which Ra' 10 is bonded.
  • Ya represents a carbon atom.
  • Xa represents a group which forms a cyclic hydrocarbon group together with Ya. Some or all of the hydrogen atoms in this cyclic hydrocarbon group may be substituted.
  • Ra 101 to Ra 103 are each independently a hydrogen atom, a monovalent linear saturated hydrocarbon group having 1 to 10 carbon atoms, or a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms. Some or all of the hydrogen atoms in this linear saturated hydrocarbon group and aliphatic cyclic saturated hydrocarbon group may be substituted. Two or more of Ra 101 to Ra 103 may be bonded to each other to form a cyclic structure.
  • Yaa is a carbon atom.
  • Xaa is a group which, together with Yaa, forms an aliphatic cyclic group which may have a substituent.
  • Ra 104 is an aromatic hydrocarbon group which may have a substituent.
  • Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms. Some or all of the hydrogen atoms in this chain saturated hydrocarbon group may be substituted.
  • Ra' 14 is a hydrocarbon group which may have a substituent. * indicates a bond (the same applies below).]
  • Ra' 10 is a straight-chain or branched-chain alkyl group having 1 to 12 carbon atoms which may be partially substituted with a halogen atom or a heteroatom-containing group.
  • the linear alkyl group for Ra' 10 has 1 to 12 carbon atoms, preferably 1 to 10 carbon atoms, and particularly preferably 1 to 5 carbon atoms.
  • Examples of the branched alkyl group in Ra'10 include the same as those in Ra'3 .
  • the alkyl group in Ra' 10 may be partially substituted with a halogen atom or a heteroatom-containing group.
  • some of the hydrogen atoms constituting the alkyl group may be substituted with a halogen atom or a heteroatom-containing group.
  • some of the carbon atoms (e.g., methylene groups) constituting the alkyl group may be substituted with a heteroatom-containing group.
  • the heteroatom include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • Ra' 11 (the alicyclic group formed together with the carbon atom to which Ra' 10 is bonded) is preferably the group exemplified as the monocyclic or polycyclic alicyclic hydrocarbon group (alicyclic hydrocarbon group) for Ra' 3 in formula (a1-r-1).
  • a monocyclic alicyclic hydrocarbon group is preferred, and specifically, a cyclopentyl group or a cyclohexyl group is more preferred.
  • the aliphatic cyclic group formed by Ra'11 together with the carbon atom to which Ra'10 is bonded may have a substituent.
  • substituents include an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carbonyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, and an alkyloxycarbonyl group having 1 to 5 carbon atoms.
  • the aliphatic cyclic group formed by Xaa together with Yaa may be a cyclic group in which some of the carbon atoms constituting the ring structure are substituted with a substituent that is an electron-withdrawing group.
  • examples of the cyclic hydrocarbon group formed by Xa together with Ya include groups in which one or more hydrogen atoms have been further removed from the cyclic monovalent hydrocarbon group (alicyclic hydrocarbon group) in Ra'3 in formula (a1-r-1).
  • the cyclic hydrocarbon group formed by Xa together with Ya may have a substituent. Examples of the substituent include the same substituents as those which the cyclic hydrocarbon group in Ra'3 may have.
  • examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms for Ra 101 to Ra 103 include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, and a decyl group.
  • Examples of the monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms in Ra 101 to Ra 103 include monocyclic aliphatic saturated hydrocarbon groups such as a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, a cyclodecyl group, and a cyclododecyl group; and polycyclic aliphatic saturated hydrocarbon groups such as a bicyclo[2.2.2]octanyl group, a tricyclo[5.2.1.02,6]decanyl group, a tricyclo[3.3.1.13,7]decanyl group, a tetracyclo[6.2.1.13,6.02,7]dodecanyl group, and an adamantyl group.
  • monocyclic aliphatic saturated hydrocarbon groups such as a cycl
  • Ra 101 to Ra 103 are preferably a hydrogen atom or a monovalent linear saturated hydrocarbon group having 1 to 10 carbon atoms, more preferably a hydrogen atom, a methyl group, or an ethyl group, and particularly preferably a hydrogen atom.
  • Examples of the substituent that the chain saturated hydrocarbon group or the alicyclic saturated hydrocarbon group represented by the above Ra 101 to Ra 103 may have include the same groups as those for the above Ra x5 .
  • Examples of groups containing a carbon-carbon double bond formed by two or more of Ra 101 to Ra 103 bonding to each other to form a cyclic structure include a cyclopentenyl group, a cyclohexenyl group, a methylcyclopentenyl group, a methylcyclohexenyl group, a cyclopentylidene-ethenyl group, a cyclohexylidene-ethenyl group, etc.
  • a cyclopentenyl group, a cyclohexenyl group, and a cyclopentylidene-ethenyl group are preferred.
  • the aliphatic cyclic group formed by Xaa together with Yaa is preferably the same as the groups exemplified as the monocyclic or polycyclic alicyclic hydrocarbon group for Ra'3 in formula (a1-r-1).
  • the aliphatic cyclic group formed by Xaa together with Yaa may have a substituent, for example, an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carbonyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkyloxycarbonyl group having 1 to 5 carbon atoms, etc.
  • the aliphatic cyclic group formed by Xaa together with Yaa may be a cyclic group in which some of the carbon atoms constituting the ring structure are substituted with a substituent that is an electron-withdrawing group.
  • examples of the aromatic hydrocarbon group for Ra 104 include groups in which one or more hydrogen atoms have been removed from an aromatic hydrocarbon ring having 5 to 30 carbon atoms or a heterocycle having 5 to 15 carbon atoms.
  • Ra 104 is preferably a group in which one or more hydrogen atoms have been removed from an aromatic hydrocarbon ring having 6 to 15 carbon atoms, more preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene, anthracene, phenanthrene, pyridine or thiophene, even more preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene, anthracene, pyridine or thiophene, particularly preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene or thiophene, and most preferably a group in which one or more hydrogen atoms have been removed from benzene or thiophene.
  • Examples of the substituent that Ra 104 in formula (a1-r2-3) may have include a methyl group, an ethyl group, a propyl group, a hydroxyl group, a carboxyl group, a halogen atom, an alkoxy group (such as a methoxy group, an ethoxy group, a propoxy group, or a butoxy group), an alkyloxycarbonyl group, and the like.
  • Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms.
  • Examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms in Ra' 12 and Ra' 13 include the same monovalent chain saturated hydrocarbon groups having 1 to 10 carbon atoms in the above Ra 101 to Ra 103.
  • Some or all of the hydrogen atoms in this chain saturated hydrocarbon group may be substituted.
  • Ra' 12 and Ra' 13 are preferably an alkyl group having 1 to 5 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, further preferably a methyl group or an ethyl group, and particularly preferably a methyl group.
  • examples of the substituent include the same groups as those for the above Ra -x5 .
  • Ra' 14 is a hydrocarbon group which may have a substituent.
  • Examples of the hydrocarbon group in Ra' 14 include a linear or branched alkyl group, and a cyclic hydrocarbon group.
  • the linear alkyl group for Ra' 14 preferably has 1 to 5 carbon atoms, more preferably 1 to 4 carbon atoms, and even more preferably 1 or 2.
  • Specific examples include a methyl group, an ethyl group, an n-propyl group, an n-butyl group, and an n-pentyl group. Of these, a methyl group, an ethyl group, or an n-butyl group is preferable, and a methyl group or an ethyl group is more preferable.
  • the branched alkyl group for Ra' 14 preferably has 3 to 10 carbon atoms, and more preferably has 3 to 5 carbon atoms. Specific examples include an isopropyl group, an isobutyl group, a tert-butyl group, an isopentyl group, a neopentyl group, a 1,1-diethylpropyl group, and a 2,2-dimethylbutyl group, and is preferably an isopropyl group.
  • the hydrocarbon group may be an alicyclic hydrocarbon group or an aromatic hydrocarbon group, and may be a polycyclic group or a monocyclic group.
  • the monocyclic alicyclic hydrocarbon group is preferably a group in which one hydrogen atom has been removed from a monocycloalkane.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane.
  • the alicyclic hydrocarbon group that is a polycyclic group is preferably a group in which one hydrogen atom has been removed from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms, and specific examples thereof include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
  • Ra' 14 examples include the same as the aromatic hydrocarbon group for Ra 104.
  • Ra' 14 is preferably a group in which one or more hydrogen atoms have been removed from an aromatic hydrocarbon ring having 6 to 15 carbon atoms, more preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene, anthracene or phenanthrene, still more preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene or anthracene, particularly preferably a group in which one or more hydrogen atoms have been removed from naphthalene or anthracene, and most preferably a group in which one or more hydrogen atoms have been removed from naphthalene.
  • substituent which Ra' 14 may have include the same substituents as those which Ra 104 may have.
  • Ra' 14 in formula (a1-r2-4) is a naphthyl group
  • the position at which it bonds to the tertiary carbon atom in formula (a1-r2-4) may be either the 1st or 2nd position of the naphthyl group.
  • Ra' 14 in formula (a1-r2-4) is an anthryl group
  • the position at which it bonds to the tertiary carbon atom in formula (a1-r2-4) may be any one of the 1-position, 2-position or 9-position of the anthryl group.
  • Tertiary alkyloxycarbonyl acid dissociating group Among the polar groups, examples of the acid dissociable group that protects the hydroxyl group include acid dissociable groups represented by the following general formula (a1-r-3) (hereinafter, for convenience, may be referred to as “tertiary alkyloxycarbonyl acid dissociable group”).
  • Ra' 7 to Ra' 9 each represent an alkyl group.
  • Ra' 7 to Ra' 9 are each preferably an alkyl group having 1 to 5 carbon atoms, and more preferably an alkyl group having 1 to 3 carbon atoms.
  • the total number of carbon atoms in each alkyl group is preferably 3 to 7, more preferably 3 to 5, and most preferably 3 or 4.
  • Secondary alkyl ester type acid-dissociable group Among the above polar groups, examples of the acid-dissociable group that protects the carboxy group include acid-dissociable groups represented by the following general formula (a1-r-4).
  • Ra'10 is a hydrocarbon group.
  • Ra'11a and Ra'11b are each independently a hydrogen atom, a halogen atom or an alkyl group.
  • Ra'12 is a hydrogen atom or a hydrocarbon group.
  • Ra'10 and Ra'11a or Ra'11b may be bonded to each other to form a ring.
  • Ra'11a or Ra'11b and Ra'12 may be bonded to each other to form a ring.
  • examples of the hydrocarbon group in Ra'10 and Ra'12 include the same as those in Ra'3 above.
  • examples of the alkyl group in Ra'11a and Ra'11b include the same as the alkyl group in Ra'1 .
  • the hydrocarbon groups in Ra'10 and Ra'12 and the alkyl groups in Ra'11a and Ra'11b may have a substituent. Examples of the substituent include the above-mentioned Rax5 .
  • Ra'10 and Ra'11a or Ra'11b may be bonded to each other to form a ring.
  • the ring may be a polycyclic or monocyclic ring, an alicyclic or aromatic ring.
  • the alicyclic and aromatic rings may contain heteroatoms.
  • the ring formed by Ra'10 and Ra'11a or Ra'11b bonding to each other is preferably a monocycloalkene, a ring in which a part of the carbon atoms of a monocycloalkene is substituted with a heteroatom (oxygen atom, sulfur atom, etc.), or a monocycloalkadiene, more preferably a cycloalkene having 3 to 6 carbon atoms, and more preferably cyclopentene or cyclohexene.
  • the ring formed by bonding Ra'10 and Ra'11a or Ra'11b together may be a condensed ring.
  • Specific examples of the condensed ring include indan.
  • the ring formed by bonding Ra'10 and Ra'11a or Ra'11b together may have a substituent.
  • substituents include the above-mentioned Rax5 .
  • Ra'11a or Ra'11b and Ra'12 may be bonded to each other to form a ring, and examples of such a ring include the same as the ring formed by Ra'10 and Ra'11a or Ra'11b being bonded to each other.
  • Ra 01 is preferably an acid-dissociable group having a ring structure from the viewpoints of increasing sensitivity, improving lithography properties such as LWR, and improving etching resistance. From the viewpoint of improving the film rigidity by interaction with the aromatic ring-containing acid non-dissociable group in Ra 02 , Ra 01 is preferably an aromatic ring-containing acid dissociable group.
  • m1 is an integer of 1 or more, as long as the atomic valence allows, preferably an integer of 1 to 3, more preferably 1 or 2, and even more preferably 1.
  • Ra 02 represents an acid non-dissociable group containing an aromatic ring.
  • the acid non-dissociable group for Ra 02 is not particularly limited as long as it is an organic group that does not fall under the category of the above-mentioned acid dissociable groups.
  • the aromatic ring contained in the acid non-dissociable group in Ra 02 is not particularly limited as long as it is a cyclic conjugated system having 4n+2 ⁇ electrons, and may be monocyclic or polycyclic.
  • the aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, further preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms.
  • aromatic ring examples include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; and aromatic heterocycles in which a part of the carbon atoms constituting the aromatic hydrocarbon ring is replaced with a heteroatom.
  • heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • aromatic heterocycle include a pyridine ring and a thiophene ring.
  • the aromatic ring contained in the acid non-dissociable group in Ra 02 may have a substituent.
  • substituents include an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkyloxycarbonyl group having 1 to 5 carbon atoms, a cyano group, -O-Ra 0211 , -S-Ra 0211 , -S( ⁇ O) 2 -Ra 0211 , and -C( ⁇ O)-O-Ra 0211 .
  • Ra 0211 is a linear or branched alkylene group having 1 to 5 carbon atoms.
  • Ra 02 is preferably a group represented by the following general formula (a0-r-1).
  • L 02 represents a single bond or a divalent linking group.
  • the divalent linking group in L 02 is not particularly limited, but suitable examples include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
  • R L is a linear or branched alkylene group having 1 to 5 carbon atoms, preferably a linear or branched alkylene group having 1 to 3 carbon atoms, more preferably a linear or branched alkylene group having 1 or 2 carbon atoms, and even more preferably a methylene group.
  • Ar 01 is an aromatic ring, and is the same as the aromatic ring contained in the acid non-dissociable group in Ra 02 in the formula (a0-1).
  • Ar 01 is preferably an aromatic hydrocarbon ring such as benzene, naphthalene, anthracene, or phenanthrene, more preferably a benzene ring or a naphthalene ring, and even more preferably a benzene ring.
  • Ra 021 is a substituent.
  • substituents include an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkyloxycarbonyl group having 1 to 5 carbon atoms, a cyano group, -O-Ra 0211 , -S-Ra 0211 , -S( ⁇ O) 2 -Ra 0211 , and -C( ⁇ O)-O-Ra 0211 .
  • Ra 0211 is a linear or branched alkylene group having 1 to 5 carbon atoms.
  • Ra 021 is preferably a halogen atom or a halogenated alkyl group having 1 to 5 carbon atoms, and more preferably a fluorine atom, an iodine atom or a fluorinated alkyl group having 1 to 5 carbon atoms.
  • m21 is an integer of 0 or more, as long as the atomic valence allows, preferably an integer of 0 to 3, more preferably an integer of 0 to 2, and even more preferably 0 or 1.
  • m2 is an integer of 1 or more, as long as the atomic valence allows, preferably an integer of 1 to 3, more preferably 1 or 2, and even more preferably 1.
  • Ra 03 is a substituent other than COORa 01 and Ra 02.
  • substituent in Ra 03 include an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, and an alkyloxycarbonyl group having 1 to 5 carbon atoms.
  • m3 is an integer of 0 or more, as long as the atomic valence allows, preferably an integer of 0 to 2, more preferably 0 or 1, and even more preferably 0.
  • R ⁇ represents a hydrogen atom, a methyl group, or a trifluoromethyl group
  • Ra 01 and Ra 02 are the same as Ra 01 and Ra 02 in the general formula (a0-1), respectively.
  • the structural unit (a0) contained in the component (A1) may be of one type, or may be of two or more types.
  • the proportion of the structural unit (a0) in the component (A1) is preferably 20 to 80 mol%, more preferably 25 to 75 mol%, even more preferably 30 to 70 mol%, and particularly preferably 35 to 65 mol%, based on the total (100 mol%) of all structural units constituting the component (A1).
  • the component (A1) may contain other structural units, in addition to the structural unit (a0) described above, as necessary.
  • Examples of other structural units include the structural unit (a1) containing an acid-decomposable group whose polarity increases by the action of acid (excluding those corresponding to the structural unit (a0)); the structural unit (a10) represented by general formula (a10-1) described below; the structural unit (a2) containing a lactone-containing cyclic group; and the structural unit (a8) derived from a compound represented by general formula (a8-1) described below.
  • the structural unit (a1) is a structural unit that contains an acid-decomposable group whose polarity increases when acted upon by an acid, with the proviso that structural units that fall under the category of the structural unit (a0) are excluded from the structural unit (a1).
  • Examples of the acid-dissociable group include those that have been proposed as acid-dissociable groups in base resins for chemically amplified resist compositions.
  • Specific examples of the acid-dissociable group proposed for the base resin of the chemically amplified resist composition include the same as the acid-dissociable group for Ra 01 in the general formula (a0-1) above.
  • the structural unit (a1) is preferably a structural unit derived from an acrylate ester in which the hydrogen atom bonded to the carbon atom at the ⁇ -position may be substituted with a substituent.
  • Preferred specific examples of the structural unit (a1) include structural units represented by general formula (a1-1) or (a1-2) shown below.
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • Va 1 is a divalent hydrocarbon group which may have an ether bond.
  • n a1 is an integer of 0 to 2.
  • Ra 1 is an acid dissociable group represented by the above general formula (a1-r-1) or (a1-r-2).
  • Wa 1 is n a2 +1 valent hydrocarbon group
  • n a2 is an integer of 1 to 3
  • Ra 2 is an acid dissociable group represented by the above general formula (a1-r-1) or (a1-r-3).
  • the alkyl group having 1 to 5 carbon atoms represented by R is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, and specific examples thereof include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, and a neopentyl group.
  • the halogenated alkyl group having 1 to 5 carbon atoms is a group in which some or all of the hydrogen atoms of the alkyl group having 1 to 5 carbon atoms are substituted with halogen atoms.
  • a fluorine atom is particularly preferable.
  • R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom or a methyl group is most preferred.
  • the divalent hydrocarbon group for Va1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.
  • the aliphatic hydrocarbon group as the divalent hydrocarbon group in Va1 may be saturated or unsaturated, and is usually preferably saturated. More specifically, the aliphatic hydrocarbon group may be a straight-chain or branched-chain aliphatic hydrocarbon group, or an aliphatic hydrocarbon group containing a ring in the structure.
  • the linear aliphatic hydrocarbon group preferably contains 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, even more preferably 1 to 4 carbon atoms, and most preferably 1 to 3 carbon atoms.
  • a straight-chain alkylene group is preferable, and specific examples thereof include a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [-(CH 2 ) 3 -], a tetramethylene group [-(CH 2 ) 4 -], a pentamethylene group [-(CH 2 ) 5 -], etc.
  • the branched aliphatic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably has 3 to 6 carbon atoms, even more preferably has 3 or 4 carbon atoms, and most preferably has 3 carbon atoms.
  • the branched aliphatic hydrocarbon group is preferably a branched alkylene group, and specific examples thereof include alkylmethylene groups such as -CH( CH3 )-, -CH( CH2CH3 )-, -C( CH3 ) 2- , -C(CH3)(CH2CH3)-, -C(CH3)(CH2CH2CH3)-, and -C(CH2CH3 ) 2- ; alkylethylene groups such as -CH ( CH3 ) CH2- , -CH( CH3 )CH( CH3 ) - , -C( CH3 ) 2CH2- , -CH ( CH2CH3 ) CH2- , and -C( CH2CH3 ) 2 - CH2- ;
  • Examples of the aliphatic hydrocarbon group containing a ring in the structure include an alicyclic hydrocarbon group (a group in which two hydrogen atoms have been removed from an aliphatic hydrocarbon ring), a group in which an alicyclic hydrocarbon group is bonded to the end of a linear or branched aliphatic hydrocarbon group, a group in which an alicyclic hydrocarbon group is interposed in the middle of a linear or branched aliphatic hydrocarbon group, etc.
  • Examples of the linear or branched aliphatic hydrocarbon group include the same as the linear aliphatic hydrocarbon group or the branched aliphatic hydrocarbon group.
  • the alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, and more preferably has 3 to 12 carbon atoms.
  • the alicyclic hydrocarbon group may be polycyclic or monocyclic.
  • the monocyclic alicyclic hydrocarbon group is preferably a group in which two hydrogen atoms have been removed from a monocycloalkane.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane.
  • the polycyclic alicyclic hydrocarbon group is preferably a group in which two hydrogen atoms have been removed from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms, and specific examples thereof include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
  • the aromatic hydrocarbon group as the divalent hydrocarbon group in Va1 is a hydrocarbon group having an aromatic ring.
  • the aromatic hydrocarbon group preferably has 3 to 30 carbon atoms, more preferably 5 to 30, even more preferably 5 to 20, particularly preferably 6 to 15, and most preferably 6 to 12. However, this number of carbon atoms does not include the number of carbon atoms in the substituents.
  • Specific examples of the aromatic ring contained in the aromatic hydrocarbon group include aromatic hydrocarbon rings such as benzene, biphenyl, fluorene, naphthalene, anthracene, and phenanthrene; aromatic heterocycles in which a part of the carbon atoms constituting the aromatic hydrocarbon ring is substituted with a heteroatom, etc.
  • heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • aromatic hydrocarbon group examples include a group in which two hydrogen atoms have been removed from the aromatic hydrocarbon ring (arylene group); a group in which one hydrogen atom of a group in which one hydrogen atom has been removed from the aromatic hydrocarbon ring (aryl group) has been substituted with an alkylene group (for example, a group in which one hydrogen atom has been further removed from the aryl group in an arylalkyl group such as a benzyl group, a phenethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group, or a 2-naphthylethyl group).
  • the number of carbon atoms in the alkylene group is preferably 1 to 4, more preferably 1
  • Ra 1 is an acid-dissociable group represented by the formula (a1-r-1) or (a1-r-2).
  • the n a2 +1 valent hydrocarbon group in Wa 1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.
  • the aliphatic hydrocarbon group means a hydrocarbon group that does not have aromaticity, and may be saturated or unsaturated, and is usually preferably saturated.
  • Examples of the aliphatic hydrocarbon group include linear or branched aliphatic hydrocarbon groups, aliphatic hydrocarbon groups containing a ring in the structure, and groups that combine linear or branched aliphatic hydrocarbon groups with aliphatic hydrocarbon groups containing a ring in the structure.
  • the n a2 +1 valency is preferably divalent to tetravalent, and more preferably divalent or trivalent.
  • Ra2 is an acid-dissociable group represented by the above general formula (a1-r-1) or (a1-r-3).
  • R ⁇ represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
  • the structural unit (a1) contained in the component (A1) may be of one type, or two or more types.
  • a structural unit represented by the above formula (a1-1) is more preferable, since it is easier to improve properties (CDU, etc.) in electron beam or EUV lithography.
  • Ra 1 ′′ is an acid-dissociable group represented by general formula (a1-r2-1), (a1-r2-3) or (a1-r2-4). * represents a bond.
  • R, Va1 and n a1 are the same as R, Va1 and n a1 in the formula (a1-1).
  • the acid dissociable group represented by formula (a1-r2-1), (a1-r2-3) or (a1-r2-4) is as described above. Among them, it is preferable to select an acid dissociable group that is a cyclic group, since it is suitable for use with EB or EUV and can enhance reactivity, and an acid dissociable group represented by formula (a1-r2-1) is more preferable.
  • the proportion of the structural unit (a1) in the component (A1) is preferably 5 to 95 mol %, more preferably 10 to 90 mol %, even more preferably 30 to 70 mol %, and particularly preferably 40 to 60 mol %, based on the total (100 mol %) of all structural units constituting the component (A1).
  • the proportion of the structural unit (a1) is at least as large as the lower limit of the aforementioned preferred range, lithography properties such as sensitivity, CDU, resolution, and roughness can be improved.
  • the proportion is at most the upper limit of the aforementioned preferred range, a balance with other structural units can be achieved, resulting in various favorable lithography properties.
  • the structural unit (a10) is a structural unit represented by general formula (a10-1) shown below (however, this does not include those that correspond to the structural unit (a1)).
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • Ya x1 is a single bond or a divalent linking group.
  • Wa x1 is an aromatic hydrocarbon group which may have a substituent.
  • n ax1 is an integer of 1 or more.
  • R represents a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom, a methyl group, or a trifluoromethyl group is more preferable, a hydrogen atom or a methyl group is still more preferable, and a hydrogen atom is particularly preferable.
  • Ya x1 represents a single bond or a divalent linking group.
  • the divalent linking group for Ya x1 is not particularly limited, but suitable examples include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
  • Wa x1 represents an aromatic hydrocarbon group which may have a substituent.
  • the aromatic hydrocarbon group in Wa x1 may be a group in which (n ax1 +1) hydrogen atoms have been removed from an aromatic ring which may have a substituent.
  • the aromatic ring here is not particularly limited as long as it is a cyclic conjugated system having 4n+2 ⁇ electrons.
  • the aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, even more preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms.
  • aromatic ring examples include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; and aromatic heterocycles in which a part of the carbon atoms constituting the aromatic hydrocarbon ring is substituted with a heteroatom.
  • heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • aromatic heterocycle include a pyridine ring and a thiophene ring.
  • examples of the aromatic hydrocarbon group in Wa x1 include groups in which (n ax1 +1) hydrogen atoms have been removed from an aromatic compound containing an aromatic ring which may have two or more substituents (e.g., biphenyl, fluorene, etc.).
  • Wa x1 is preferably a group in which (n ax1 +1) hydrogen atoms have been removed from benzene, naphthalene, anthracene or biphenyl, more preferably a group in which (n ax1 +1) hydrogen atoms have been removed from benzene or naphthalene, and even more preferably a group in which (n ax1 +1) hydrogen atoms have been removed from benzene.
  • the aromatic hydrocarbon group in Wa x1 may or may not have a substituent.
  • substituents include an alkyl group, an alkoxy group, a halogen atom, and a halogenated alkyl group.
  • alkyl group, alkoxy group, halogen atom, and halogenated alkyl group as the substituent include the same as those exemplified as the substituent of the cyclic alicyclic hydrocarbon group in Ya x1 .
  • the substituent is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, more preferably a linear or branched alkyl group having 1 to 3 carbon atoms, further preferably an ethyl group or a methyl group, and particularly preferably a methyl group. It is preferable that the aromatic hydrocarbon group in Wa x1 does not have a substituent.
  • n ax1 represents an integer of 1 or more, preferably an integer of 1 to 10, more preferably an integer of 1 to 5, still more preferably 1, 2 or 3, and particularly preferably 1 or 2.
  • R ⁇ represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
  • the structural unit (a10) contained in the component (A1) may be of one type, or two or more types.
  • the proportion of the structural unit (a10) in the component (A1) is preferably 20 to 60 mol %, more preferably 25 to 55 mol %, even more preferably 30 to 50 mol %, and particularly preferably 35 to 45 mol %, based on the total (100 mol %) of all structural units constituting the component (A1).
  • the component (A1) may further include a structural unit (a2) that contains a lactone-containing cyclic group (provided that this does not correspond to the structural unit (a1)).
  • the lactone-containing cyclic group of the structural unit (a2) is effective in improving the adhesion of the resist film to the substrate when the component (A1) is used to form a resist film.
  • the structural unit (a2) has the effects of, for example, appropriately adjusting the acid diffusion length, improving the adhesion of the resist film to the substrate, and appropriately adjusting the solubility during development, thereby improving the lithography properties, etc.
  • the lactone ring is counted as the first ring, and when there is only a lactone ring, it is called a monocyclic group, and when there is further contained another ring structure, it is called a polycyclic group regardless of the structure.
  • the lactone-containing cyclic group may be a monocyclic group or a polycyclic group.
  • the lactone-containing cyclic group in the structural unit (a2) is not particularly limited and any suitable group can be used. Specific examples include the groups represented by the following general formulae (a2-r-1) to (a2-r-7).
  • R" is a hydrogen atom, an alkyl group or a lactone-containing cyclic group;
  • A" is an alkylene group having 1 to 5 carbon atoms which may contain an oxygen atom (-O-) or a sulfur atom (-S-), an oxygen atom or a sulfur atom, n' is an integer of 0 to 2, and m' is 0 or 1.
  • * represents a bond (the same applies hereinafter).
  • the alkyl group in Ra'21 is preferably an alkyl group having 1 to 6 carbon atoms.
  • the alkyl group is preferably linear or branched. Specific examples include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, a neopentyl group, and a hexyl group. Of these, a methyl group or an ethyl group is preferred, and a methyl group is particularly preferred.
  • the alkoxy group in Ra' 21 is preferably an alkoxy group having 1 to 6 carbon atoms.
  • the alkoxy group is preferably linear or branched. Specific examples include groups in which the alkyl groups listed above as the alkyl groups in Ra' 21 are linked to an oxygen atom (-O-).
  • the halogen atom in Ra'21 is preferably a fluorine atom.
  • the halogenated alkyl group in Ra' 21 may be a group in which some or all of the hydrogen atoms in the alkyl group in Ra' 21 have been substituted with the halogen atoms.
  • a fluorinated alkyl group is preferable, and a perfluoroalkyl group is particularly preferable.
  • R" is both a hydrogen atom, an alkyl group, or a lactone-containing cyclic group.
  • the alkyl group for R′′ may be linear, branched, or cyclic, and preferably has 1 to 15 carbon atoms.
  • R′′ is a linear or branched alkyl group, it preferably has 1 to 10 carbon atoms, more preferably 1 to 5 carbon atoms, and is particularly preferably a methyl group or an ethyl group.
  • R" is a cyclic alkyl group, it preferably has 3 to 15 carbon atoms, more preferably 4 to 12 carbon atoms, and most preferably 5 to 10 carbon atoms.
  • Specific examples include groups in which one or more hydrogen atoms have been removed from a monocycloalkane which may or may not be substituted with a fluorine atom or a fluorinated alkyl group; and groups in which one or more hydrogen atoms have been removed from a polycycloalkane such as a bicycloalkane, tricycloalkane, or tetracycloalkane.
  • More specific examples include groups in which one or more hydrogen atoms have been removed from a monocycloalkane such as cyclopentane or cyclohexane; and groups in which one or more hydrogen atoms have been removed from a polycycloalkane such as adamantane, norbornane, isobornane, tricyclodecane, or tetracyclododecane.
  • Examples of the lactone-containing cyclic group for R′′ include the same groups as those represented by the general formulae (a2-r-1) to (a2-r-7).
  • the hydroxyalkyl group in Ra' 21 preferably has 1 to 6 carbon atoms, and specific examples include the alkyl group in Ra' 21 in which at least one hydrogen atom has been substituted with a hydroxyl group.
  • Ra'21 each independently represents a hydrogen atom or a cyano group.
  • the alkylene group having 1 to 5 carbon atoms in A" is preferably a straight-chain or branched-chain alkylene group, such as a methylene group, an ethylene group, an n-propylene group or an isopropylene group.
  • the alkylene group contains an oxygen atom or a sulfur atom
  • specific examples thereof include groups in which -O- or -S- is present at the terminal or between the carbon atoms of the alkylene group, such as -O-CH 2 -, -CH 2 -O-CH 2 -, -S-CH 2 - and -CH 2 -S-CH 2 -.
  • A" is preferably an alkylene group having 1 to 5 carbon atoms or -O-, more preferably an alkylene group having 1 to 5 carbon atoms, and most preferably a methylene group.
  • the structural unit (a2) is preferably a structural unit derived from an acrylate ester in which the hydrogen atom bonded to the carbon atom at the ⁇ -position may be substituted with a substituent.
  • the structural unit (a2) is preferably a structural unit represented by general formula (a2-1) shown below.
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
  • Ya 21 is a single bond or a divalent linking group.
  • La 21 is -O-, -COO-, -CON(R')-, -OCO-, -CONHCO-, or -CONHCS-, and R' represents a hydrogen atom or a methyl group.
  • Ra 21 is a lactone-containing cyclic group.
  • R is the same as above.
  • R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom or a methyl group is particularly preferred.
  • the divalent linking group for Ya 21 is not particularly limited, but suitable examples include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
  • Ya 21 is preferably a single bond, an ester bond [--C(.dbd.O)--O--], an ether bond (--O--), a linear or branched alkylene group, or a combination thereof.
  • Ya 21 is a single bond, and La 21 is --COO-- or --OCO--.
  • Ra 21 represents a lactone-containing cyclic group.
  • Suitable examples of the lactone-containing cyclic group for Ra 21 include the groups represented by the above-mentioned general formulae (a2-r-1) to (a2-r-7), respectively.
  • the structural unit (a2) contained in the component (A1) may be of one type, or two or more types.
  • the proportion of the structural unit (a2) is preferably 1 to 20 mol %, more preferably 1 to 15 mol %, and even more preferably 1 to 10 mol %, based on the total (100 mol %) of all structural units constituting the component (A1).
  • the proportion of the structural unit (a2) is at least as large as the preferable lower limit, the effects achieved by including the structural unit (a2) can be fully obtained due to the effects described above.
  • the proportion of the structural unit (a2) is no more than the upper limit, a balance with other structural units can be achieved, and various lithography properties become favorable.
  • the structural unit (a8) is a structural unit derived from a compound represented by general formula (a8-1) shown below. However, those corresponding to the structural unit (a0) are excluded.
  • W2 is a polymerizable group-containing group.
  • Yax2 is a single bond or a (n ax2 +1)-valent linking group.
  • Yax2 and W2 may form a condensed ring.
  • R1 is a fluorinated alkyl group having 1 to 12 carbon atoms.
  • R2 is an organic group having 1 to 12 carbon atoms which may have a fluorine atom or a hydrogen atom.
  • R2 and Yax2 may be bonded to each other to form a ring structure.
  • n ax2 is an integer of 1 to 3.
  • the "polymerizable group" in the polymerizable group-containing group of W2 is a group that enables a compound having a polymerizable group to be polymerized by radical polymerization or the like, and is, for example, a group that contains a multiple bond between carbon atoms, such as an ethylenic double bond.
  • the polymerizable group-containing group may be a group composed only of a polymerizable group, or may be a group composed of a polymerizable group and a group other than the polymerizable group.
  • the group other than the polymerizable group include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
  • R X11 , R X12 and R X13 each represent a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms, and Ya x0 represents a single bond or a divalent linking group.
  • Examples of the fused ring formed by Ya x2 and W2 include a fused ring formed by the polymerizable group at the W2 site and Ya x2 , and a fused ring formed by Ya x2 and a group other than the polymerizable group at the W2 site.
  • the fused ring formed by Ya x2 and W 2 may have a substituent.
  • R ⁇ represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
  • the structural unit (a8) is preferably at least one selected from the group consisting of structural units represented by the chemical formulas (a8-1-01) to (a8-1-04), (a8-1-06), (a8-1-08), (a8-1-09), and (a8-1-10), and more preferably at least one selected from the group consisting of structural units represented by the chemical formulas (a8-1-01) to (a8-1-04), and (a8-1-09).
  • the structural unit (a8) contained in the component (A1) may be of one type, or two or more types.
  • the amount of the structural unit (a8) in the component (A1) relative to the total amount (100 mol %) of all structural units constituting the component (A1), is preferably no more than 50 mol %, and more preferably from 0 to 30 mol %.
  • the component (A1) contained in the resist composition may use either a single type of compound, or a combination of two or more types of compounds.
  • the component (A1) can be a polymeric compound that has a repeating structure of the structural unit (a0).
  • suitable examples of the component (A1) include polymeric compounds that include a repeating structure of the structural unit (a0) and the structural unit (a10), polymeric compounds that include a repeating structure of the structural unit (a0), the structural unit (a10), and the structural unit (a1), and polymeric compounds that include a repeating structure of the structural unit (a0), the structural unit (a10), and the structural unit (a2).
  • the proportion of the structural unit (a0) relative to the total amount (100 mol%) of all structural units constituting the polymeric compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
  • the proportion of the structural unit (a10) in the polymer compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%, based on the total (100 mol%) of all structural units constituting the polymer compound.
  • the proportion of the structural unit (a0) relative to the total amount (100 mol%) of all structural units constituting the polymeric compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
  • the proportion of the structural unit (a10) in the polymer compound, relative to the total (100 mol%) of all structural units constituting the polymer compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
  • the proportion of the structural unit (a1) in the polymer compound is preferably from 1 to 25 mol%, more preferably from 2 to 20 mol%, even more preferably from 3 to 15 mol%, and particularly preferably from 5 to 12 mol%, based on the total (100 mol%) of all structural units constituting the polymer compound.
  • the proportion of the structural unit (a0) relative to the total amount (100 mol%) of all structural units constituting the polymeric compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
  • the proportion of the structural unit (a10) in the polymer compound, relative to the total (100 mol%) of all structural units constituting the polymer compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
  • the proportion of the structural unit (a2) in the polymer compound is preferably from 1 to 25 mol%, more preferably from 2 to 20 mol%, even more preferably from 3 to 15 mol%, and particularly preferably from 5 to 12 mol%, based on the total (100 mol%) of all structural units constituting the polymer compound.
  • the component (A1) can be produced by dissolving monomers from which each structural unit is derived in a polymerization solvent, and then adding a radical polymerization initiator such as azobisisobutyronitrile (AIBN) or dimethyl azobisisobutyrate (e.g., V-601), and polymerizing the resulting mixture.
  • a radical polymerization initiator such as azobisisobutyronitrile (AIBN) or dimethyl azobisisobutyrate (e.g., V-601)
  • the component (A1) can be produced by dissolving a monomer that derives the structural unit (a0) and, if necessary, a monomer that derives a structural unit other than the structural unit (a0) (for example, the structural unit (a10)) in a polymerization solvent, adding the above-mentioned radical polymerization initiator to the resulting solution to polymerize, and then carrying out a deprotection reaction.
  • a chain transfer agent such as HS-CH 2 -CH 2 -CH 2 -C(CF 3 ) 2 -OH may be used in combination to introduce a -C(CF 3 ) 2 -OH group to the end.
  • a copolymer having a hydroxyalkyl group in which some of the hydrogen atoms of the alkyl group are substituted with fluorine atoms in this way is effective in reducing development defects and LER (line edge roughness: non-uniform unevenness of the line sidewalls).
  • the weight average molecular weight (Mw) of the component (A1) (based on polystyrene equivalent by gel permeation chromatography (GPC)) is not particularly limited, but is preferably 1,000 to 50,000, more preferably 2,000 to 30,000, and even more preferably 3,000 to 20,000.
  • Mw of the component (A1) is no more than the preferred upper limit of this range, the compound has sufficient solubility in a resist solvent for use as a resist, and when it is no less than the preferred lower limit of this range, the compound has good dry etching resistance and good cross-sectional shape of the resist pattern.
  • the dispersity (Mw/Mn) of the component (A1) is not particularly limited, but is preferably from 1.0 to 4.0, more preferably from 1.0 to 3.0, and particularly preferably from 1.0 to 2.0, where Mn represents the number average molecular weight.
  • the resist composition of this embodiment may use, as the component (A), a base component (A2) (hereafter referred to as the component (A2)) that does not fall under the category of the component (A1) above and whose solubility in a developer changes under the action of an acid.
  • a base component (A2) hereafter referred to as the component (A2)
  • the component (A2) may be a polymeric compound or a low molecular weight compound, and may be a combination of two or more of these.
  • the proportion of component (A1) in component (A) is preferably 25% by mass or more, more preferably 50% by mass or more, even more preferably 75% by mass or more, and may be 100% by mass, based on the total mass of component (A). If the proportion is 25% by mass or more, a resist pattern that is excellent in various lithography properties such as high sensitivity, resolution, and improved roughness is easily formed.
  • the content of component (A) in the resist composition of this embodiment may be adjusted according to the thickness of the resist film to be formed, etc.
  • the resist composition of this embodiment may further contain other components in addition to the above-mentioned components (A) and (B).
  • the other components include the following components (B), (D), (E), (F), and (S).
  • the resist composition of this embodiment preferably further contains an acid generator component (B) that generates an acid upon exposure.
  • an acid generator component (B) that generates an acid upon exposure.
  • Such acid generators include onium salt-based acid generators such as iodonium salts and sulfonium salts, oxime sulfonate-based acid generators, diazomethane-based acid generators such as bisalkyl- or bisarylsulfonyl diazomethanes and poly(bissulfonyl) diazomethanes, nitrobenzylsulfonate-based acid generators, iminosulfonate-based acid generators, and disulfone-based acid generators.
  • onium salt-based acid generators such as iodonium salts and sulfonium salts
  • oxime sulfonate-based acid generators such as bisalkyl- or bisarylsulfonyl diazomethanes and poly(bissulfonyl) diazomethanes
  • nitrobenzylsulfonate-based acid generators iminosulfonate-based acid generators
  • onium salt acid generators examples include a compound represented by the following general formula (b-1) (hereinafter also referred to as “component (b-1)”), a compound represented by general formula (b-2) (hereinafter also referred to as “component (b-2)”), or a compound represented by general formula (b-3) (hereinafter also referred to as “component (b-3)”).
  • onium salt acid generators examples include a compound represented by the following general formula (b-1) (hereinafter also referred to as “component (b-1)”), a compound represented by general formula (b-2) (hereinafter also referred to as “component (b-2)”), or a compound represented by general formula (b-3) (hereinafter also referred to as “component (b-3)”).
  • R 101 and R 104 to R 108 are each independently a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent.
  • R 104 and R 105 may be bonded to each other to form a ring structure.
  • R 102 is a fluorinated alkyl group having 1 to 5 carbon atoms or a fluorine atom.
  • Y 101 is a divalent linking group containing an oxygen atom or a single bond.
  • V 101 to V 103 are each independently a single bond, an alkylene group, or a fluorinated alkylene group.
  • L 101 to L 102 are each independently a single bond or an oxygen atom.
  • L 103 to L 105 are each independently a single bond, -CO-, or -SO 2 -.
  • m is an integer of 1 or more, and M' m+ is an m-valent onium cation
  • R 101 represents a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent.
  • the cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group.
  • An aliphatic hydrocarbon group means a hydrocarbon group that does not have aromaticity.
  • the aliphatic hydrocarbon group is preferably saturated.
  • the aromatic hydrocarbon group for R 101 is a hydrocarbon group having an aromatic ring.
  • the number of carbon atoms in the aromatic hydrocarbon group is preferably 3 to 30, more preferably 5 to 30, even more preferably 5 to 20, particularly preferably 6 to 15, and most preferably 6 to 10. However, this number of carbon atoms does not include the number of carbon atoms in the substituent.
  • Specific examples of the aromatic ring contained in the aromatic hydrocarbon group in R 101 include benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, and aromatic heterocycles in which a part of the carbon atoms constituting these aromatic rings are substituted with heteroatoms, etc.
  • heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • Specific examples of the aromatic hydrocarbon group for R 101 include a group in which one hydrogen atom has been removed from the aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one hydrogen atom of the aromatic ring has been substituted with an alkylene group (for example, a benzyl group, a phenethyl group, a 1-naphthylmethyl group, etc.), etc.
  • the number of carbon atoms in the alkylene group is preferably 1 to 4, more preferably 1 to 2, and particularly preferably 1.
  • the cyclic aliphatic hydrocarbon group for R 101 includes an aliphatic hydrocarbon group containing a ring in the structure.
  • Examples of the aliphatic hydrocarbon group that contains a ring in its structure include alicyclic hydrocarbon groups (groups in which one hydrogen atom has been removed from an aliphatic hydrocarbon ring), groups in which an alicyclic hydrocarbon group is bonded to the end of a straight-chain or branched-chain aliphatic hydrocarbon group, and groups in which an alicyclic hydrocarbon group is present in the middle of a straight-chain or branched-chain aliphatic hydrocarbon group.
  • the alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, and more preferably has 3 to 12 carbon atoms.
  • the alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group.
  • the monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a monocycloalkane.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane.
  • the polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 30 carbon atoms.
  • the polycycloalkane is more preferably a polycycloalkane having a polycyclic skeleton of a bridged ring system such as adamantane, norbornane, isobornane, tricyclodecane, or tetracyclododecane; or a polycycloalkane having a polycyclic skeleton of a condensed ring system such as a cyclic group having a steroid skeleton.
  • the cyclic aliphatic hydrocarbon group for R 101 is preferably a group in which one or more hydrogen atoms have been removed from a monocycloalkane or polycycloalkane, more preferably a group in which one hydrogen atom has been removed from a polycycloalkane, further preferably an adamantyl group or a norbornyl group, and particularly preferably an adamantyl group.
  • the linear aliphatic hydrocarbon group which may be bonded to the alicyclic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6, even more preferably 1 to 4, and most preferably 1 to 3.
  • linear alkylene groups are preferred, and specific examples thereof include a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [-(CH 2 ) 3 -], a tetramethylene group [-(CH 2 ) 4 -], a pentamethylene group [-(CH 2 ) 5 -], and the like.
  • the branched aliphatic hydrocarbon group which may be bonded to the alicyclic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably 3 to 6 carbon atoms, even more preferably 3 or 4 carbon atoms, and most preferably 3 carbon atoms.
  • the branched aliphatic hydrocarbon group is preferably a branched alkylene group, and specific examples thereof include alkylmethylene groups such as -CH( CH3 )-, -CH( CH2CH3 )-, -C( CH3 ) 2- , -C(CH3)(CH2CH3)-, -C(CH3)(CH2CH2CH3)-, and -C(CH2CH3 ) 2- ; alkylethylene groups such as -CH ( CH3 ) CH2- , -CH( CH3 )CH( CH3 ) - , -C( CH3 ) 2CH2- , -CH ( CH2CH3 ) CH2- , and -C( CH2CH3 ) 2 - CH2- ; and alkyl alkylene groups such as alkyl trimethylene groups such as -CH (CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -, etc.
  • the cyclic hydrocarbon group in R 101 may contain a heteroatom, such as a heterocycle.
  • a heteroatom such as a heterocycle.
  • Specific examples include the lactone-containing cyclic groups represented by the above general formulae (a2-r-1) to (a2-r-7), the -SO 2 -containing cyclic groups represented by the following general formulae (b5-r-1) to (b5-r-4), and other heterocyclic groups represented by the following chemical formulae (r-hr-1) to (r-hr-16).
  • * represents a bond bonded to Y 101 in formula (b-1).
  • R is a hydrogen atom, an alkyl group, a lactone-containing cyclic group or an -SO 2 - containing cyclic group;
  • B" is an alkylene group having 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom, an oxygen atom or a sulfur atom, and n' is an integer of 0 to 2. * represents a bond.
  • B" represents an alkylene group having 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom, an oxygen atom, or a sulfur atom.
  • B" is preferably an alkylene group having 1 to 5 carbon atoms or --O--, more preferably an alkylene group having 1 to 5 carbon atoms, and even more preferably a methylene group.
  • Examples of the substituent in the cyclic group of R 101 include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, and a nitro group.
  • the alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms.
  • the alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group, or a tert-butoxy group, and most preferably a methoxy group or an ethoxy group.
  • halogen atom as a substituent, a fluorine atom, a bromine atom or an iodine atom is preferred.
  • halogenated alkyl group as a substituent include alkyl groups having 1 to 5 carbon atoms, such as methyl, ethyl, propyl, n-butyl, and tert-butyl groups, in which some or all of the hydrogen atoms have been substituted with the above-mentioned halogen atoms.
  • the carbonyl group as a substituent is a group that substitutes a methylene group (-CH 2 -) that constitutes a cyclic hydrocarbon group.
  • the cyclic hydrocarbon group in R 101 may be a fused ring group containing a fused ring in which an aliphatic hydrocarbon ring and an aromatic ring are fused.
  • the fused ring include a polycycloalkane having a polycyclic skeleton of a bridged ring system to which one or more aromatic rings are fused.
  • Specific examples of the bridged ring polycycloalkane include bicycloalkanes such as bicyclo[2.2.1]heptane (norbornane) and bicyclo[2.2.2]octane.
  • the fused ring group is preferably a group containing a fused ring in which two or three aromatic rings are fused to a bicycloalkane, and more preferably a group containing a fused ring in which two or three aromatic rings are fused to a bicyclo[2.2.2]octane.
  • Specific examples of the fused ring group in R 101 include those represented by the following formulae (r-br-1) to (r-br-2). In the formulae, * represents a bond bonded to Y 101 in formula (b-1).
  • Examples of the substituent that the fused cyclic group for R 101 may have include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an aromatic hydrocarbon group, and an alicyclic hydrocarbon group.
  • Examples of the alkyl group, alkoxy group, halogen atom and halogenated alkyl group as the substituent of the condensed cyclic group include the same as those exemplified as the substituent of the cyclic group in R 101 above.
  • aromatic hydrocarbon group as the substituent of the fused ring group
  • aryl group for example, a phenyl group, a naphthyl group, etc.
  • an alkylene group for example, an arylalkyl group such as a benzyl group, a phenethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group, a 2-naphthylethyl group, etc.
  • heterocyclic groups represented by the above formulas (r-hr-1) to (r-hr-6), respectively.
  • Examples of the alicyclic hydrocarbon group as a substituent of the fused cyclic group include groups in which one hydrogen atom has been removed from a monocycloalkane, such as cyclopentane or cyclohexane; groups in which one hydrogen atom has been removed from a polycycloalkane, such as adamantane, norbornane, isobornane, tricyclodecane or tetracyclododecane; lactone-containing cyclic groups represented by each of the general formulae (a2-r-1) to (a2-r-7); —SO 2 -containing cyclic groups represented by each of the general formulae (b5-r-1) to (b5-r-4); and heterocyclic groups represented by each of the formulae (r-hr-7) to (r-hr-16).
  • a monocycloalkane such as cyclopentane or cyclohexane
  • a chain alkyl group which may have a substituent may be either a straight chain or a branched chain.
  • the linear alkyl group preferably has 1 to 20 carbon atoms, more preferably 1 to 15 carbon atoms, and most preferably 1 to 10 carbon atoms.
  • the branched alkyl group preferably has 3 to 20 carbon atoms, more preferably 3 to 15 carbon atoms, and most preferably 3 to 10 carbon atoms.
  • Specific examples include a 1-methylethyl group, a 1-methylpropyl group, a 2-methylpropyl group, a 1-methylbutyl group, a 2-methylbutyl group, a 3-methylbutyl group, a 1-ethylbutyl group, a 2-ethylbutyl group, a 1-methylpentyl group, a 2-methylpentyl group, a 3-methylpentyl group, and a 4-methylpentyl group.
  • a chain alkenyl group which may have a substituent may be either linear or branched, and preferably has 2 to 10 carbon atoms, more preferably 2 to 5, even more preferably 2 to 4, and particularly preferably 3.
  • Examples of linear alkenyl groups include vinyl groups, propenyl groups (allyl groups), and butenyl groups.
  • Examples of branched alkenyl groups include 1-methylvinyl groups, 2-methylvinyl groups, 1-methylpropenyl groups, and 2-methylpropenyl groups. Of the above chain alkenyl groups, linear alkenyl groups are preferred, vinyl groups and propenyl groups are more preferred, and vinyl groups are particularly preferred.
  • Examples of the substituent in the chain alkyl or alkenyl group of R 101 include an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, and the cyclic groups in R 101 above.
  • Y 101 is a single bond or a divalent linking group containing an oxygen atom.
  • Y 101 may contain an atom other than an oxygen atom.
  • the atom other than an oxygen atom include a carbon atom, a hydrogen atom, a sulfur atom, and a nitrogen atom.
  • the divalent linking group containing an oxygen atom include linking groups represented by the following general formulae (y-al-1) to (y-al-7), respectively.
  • general formulae (y-al-1) to (y-al-7) what is bonded to R 101 in the above formula (b-1) is V' 101 in the following general formulae (y-al-1) to (y-al-7).
  • V' 101 is a single bond or an alkylene group having 1 to 5 carbon atoms
  • V' 102 is a divalent saturated hydrocarbon group having 1 to 30 carbon atoms.
  • the divalent saturated hydrocarbon group for V' 102 is preferably an alkylene group having 1 to 30 carbon atoms, more preferably an alkylene group having 1 to 10 carbon atoms, and even more preferably an alkylene group having 1 to 5 carbon atoms.
  • the alkylene group in V'101 and V'102 may be a straight-chain alkylene group or a branched-chain alkylene group, with a straight-chain alkylene group being preferred.
  • Specific examples of the alkylene group in V' 101 and V' 102 include a methylene group [-CH 2 -]; alkylmethylene groups such as -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, and -C(CH 2 CH 3 ) 2 -; an ethylene group [-CH 2 CH 2 -]; alkylethylene groups such as -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, and -CH(CH 2 CH 3 )CH 2
  • some of the methylene groups in the alkylene group in V'101 or V'102 may be substituted with a divalent aliphatic cyclic group having 5 to 10 carbon atoms.
  • the aliphatic cyclic group is preferably a divalent group obtained by further removing one hydrogen atom from the cyclic aliphatic hydrocarbon group (monocyclic aliphatic hydrocarbon group, polycyclic aliphatic hydrocarbon group) of Ra'3 in formula (a1-r-1), and more preferably a cyclohexylene group, a 1,5-adamantylene group or a 2,6-adamantylene group.
  • V 101 is a single bond, an alkylene group or a fluorinated alkylene group. Of these, V 101 is preferably a single bond or a linear fluorinated alkylene group having 1 to 4 carbon atoms.
  • R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms.
  • R 102 is preferably a fluorine atom or a perfluoroalkyl group having 1 to 5 carbon atoms, and more preferably a fluorine atom.
  • anion moiety represented by formula (b-1) include, for example, when Y 101 is a single bond, fluorinated alkylsulfonate anions such as trifluoromethanesulfonate anion and perfluorobutanesulfonate anion; and, when Y 101 is a divalent linking group containing an oxygen atom, anions represented by any of the following formulas (an-1) to (an-3) are included.
  • R" 101 is an aliphatic cyclic group which may have a substituent, a monovalent heterocyclic group represented by each of the above chemical formulas (r-hr-1) to (r-hr-6), a fused cyclic group represented by the above formula (r-br-1) or (r-br-2), a chain-like alkyl group which may have a substituent, or an aromatic cyclic group which may have a substituent.
  • R" 102 is an aliphatic cyclic group which may have a substituent, a fused cyclic group represented by the above formula (r-br-1) or (r-br-2), a lactone-containing cyclic group represented by each of the above general formulas (a2-r-1), (a2-r-3) to (a2-r-7), or an -SO 2 - containing cyclic group represented by each of the above general formulas (b5-r-1) to (b5-r-4).
  • R" 103 is an aromatic cyclic group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain-like alkenyl group which may have a substituent.
  • V" 101 is a single bond, an alkylene group having 1 to 4 carbon atoms, or a fluorinated alkylene group having 1 to 4 carbon atoms.
  • R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms.
  • Each v" is independently an integer of 0 to 3
  • each q" is independently an integer of 0 to 20, and n" is 0 or 1.
  • the aliphatic cyclic groups which may have a substituent of R" 101 , R" 102 and R" 103 are preferably the groups exemplified as the cyclic aliphatic hydrocarbon group in R 101 in formula (b-1) above.
  • substituents include the same as the substituents which may substitute the cyclic aliphatic hydrocarbon group in R 101 in formula (b-1) above.
  • the aromatic cyclic group which may have a substituent in R" 101 and R" 103 is preferably a group exemplified as the aromatic hydrocarbon group in the cyclic hydrocarbon group in R101 in the above formula (b-1).
  • substituents include the same as the substituent which may substitute the aromatic hydrocarbon group in R101 in the above formula (b-1).
  • the chain alkyl group which may have a substituent in R′′ 101 is preferably a group exemplified as the chain alkyl group in R 101 in the above formula (b-1).
  • the chain alkenyl group which may have a substituent in R′′ 103 is preferably a group exemplified as the chain alkenyl group in R 101 in the above formula (b-1).
  • R 104 and R 105 each independently represent a cyclic group which may have a substituent, a chain-like alkyl group which may have a substituent, or a chain-like alkenyl group which may have a substituent, and examples of these include the same as R 101 in formula (b-1). However, R 104 and R 105 may be bonded to each other to form a ring. R 104 and R 105 are preferably a chain alkyl group which may have a substituent, and more preferably a linear or branched alkyl group, or a linear or branched fluorinated alkyl group.
  • the number of carbon atoms in the chain-like alkyl group is preferably 1 to 10, more preferably 1 to 7, and even more preferably 1 to 3.
  • the number of carbon atoms in the chain-like alkyl group of R 104 and R 105 is preferably as small as possible within the above range of the number of carbon atoms, for reasons such as good solubility in a resist solvent.
  • the more hydrogen atoms substituted with fluorine atoms the stronger the acid strength becomes, and the more the transparency to high-energy light and electron beams of 250 nm or less is improved, which is preferable.
  • the ratio of fluorine atoms in the chain-like alkyl group i.e., the fluorination rate, is preferably 70 to 100%, more preferably 90 to 100%, and most preferably a perfluoroalkyl group in which all hydrogen atoms are substituted with fluorine atoms.
  • V 102 and V 103 each independently represent a single bond, an alkylene group, or a fluorinated alkylene group, and examples of V 101 in formula (b-1) include the same as those described above.
  • L 101 and L 102 each independently represent a single bond or an oxygen atom.
  • R to R each independently represent a cyclic group which may have a substituent, a chain-like alkyl group which may have a substituent, or a chain-like alkenyl group which may have a substituent, and examples of these include the same as R 101 in formula (b-1).
  • L 103 to L 105 each independently represent a single bond, —CO— or —SO 2 —.
  • the anion in component (b-1) is preferred as the anion portion of component (B).
  • M'm+ represents an m-valent onium cation, of which sulfonium cation and iodonium cation are preferred.
  • m is an integer of 1 or more.
  • Preferred cationic moieties include organic cations represented by the following general formulas (ca-1) to (ca-3).
  • R 201 to R 207 each independently represent an aryl group, an alkyl group or an alkenyl group which may have a substituent.
  • R 201 to R 203 and R 206 to R 207 may be bonded to each other to form a ring together with the sulfur atom in the formula.
  • R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms.
  • R 210 is an aryl group which may have a substituent, an alkyl group which may have a substituent, an alkenyl group which may have a substituent, or an -SO 2 - containing cyclic group which may have a substituent.
  • the aryl group for R 201 to R 207 can be an unsubstituted aryl group having 6 to 20 carbon atoms, and a phenyl group or a naphthyl group is preferable.
  • the alkyl group for R 201 to R 207 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms.
  • the alkenyl group for R 201 to R 207 preferably has 2 to 10 carbon atoms.
  • R 201 to R 207 and R 210 may have include an alkyl group, a halogen atom, a halogenated alkyl group, a carbonyl group, a cyano group, an amino group, an aryl group, and groups represented by the following general formulas (ca-r-1) to (ca-r-7), respectively.
  • R'201 each independently represents a hydrogen atom, a cyclic group which may have a substituent, a chain-like alkyl group which may have a substituent, or a chain-like alkenyl group which may have a substituent.
  • the cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group.
  • the aliphatic hydrocarbon group means a hydrocarbon group that does not have aromaticity.
  • the aliphatic hydrocarbon group may be saturated or unsaturated, and is usually preferably saturated.
  • the aromatic hydrocarbon group in R'201 is a hydrocarbon group having an aromatic ring.
  • the aromatic hydrocarbon group preferably has 3 to 30 carbon atoms, more preferably 5 to 30 carbon atoms, even more preferably 5 to 20 carbon atoms, particularly preferably 6 to 15 carbon atoms, and most preferably 6 to 10 carbon atoms. However, this number of carbon atoms does not include the number of carbon atoms in the substituent.
  • Specific examples of the aromatic ring contained in the aromatic hydrocarbon group in R'201 include benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, and aromatic heterocycles in which some of the carbon atoms constituting these aromatic rings are substituted with heteroatoms.
  • heteroatom in the aromatic heterocycle examples include an oxygen atom, a sulfur atom, and a nitrogen atom.
  • Specific examples of the aromatic hydrocarbon group for R'201 include a group in which one hydrogen atom has been removed from the aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one hydrogen atom of the aromatic ring has been substituted with an alkylene group (for example, an arylalkyl group such as a benzyl group, a phenethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group, a 2-naphthylethyl group, etc.).
  • the alkylene group (the alkyl chain in the arylalkyl group) preferably has 1 to 4 carbon atoms, more preferably 1 to 2 carbon atoms, and particularly preferably 1 carbon
  • the cyclic aliphatic hydrocarbon group for R'201 includes an aliphatic hydrocarbon group containing a ring in the structure.
  • Examples of the aliphatic hydrocarbon group that contains a ring in its structure include alicyclic hydrocarbon groups (groups in which one hydrogen atom has been removed from an aliphatic hydrocarbon ring), groups in which an alicyclic hydrocarbon group is bonded to the end of a straight-chain or branched-chain aliphatic hydrocarbon group, and groups in which an alicyclic hydrocarbon group is present in the middle of a straight-chain or branched-chain aliphatic hydrocarbon group.
  • the alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, and more preferably has 3 to 12 carbon atoms.
  • the alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group.
  • the monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a monocycloalkane.
  • the monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane.
  • the polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 30 carbon atoms.
  • the polycycloalkane is more preferably a polycycloalkane having a polycyclic skeleton of a bridged ring system such as adamantane, norbornane, isobornane, tricyclodecane, or tetracyclododecane; or a polycycloalkane having a polycyclic skeleton of a condensed ring system such as a cyclic group having a steroid skeleton.
  • the cyclic aliphatic hydrocarbon group for R'201 is preferably a group in which one or more hydrogen atoms have been removed from a monocycloalkane or polycycloalkane, more preferably a group in which one hydrogen atom has been removed from a polycycloalkane, particularly preferably an adamantyl group or a norbornyl group, and most preferably an adamantyl group.
  • the linear or branched aliphatic hydrocarbon group which may be bonded to the alicyclic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, still more preferably 1 to 4 carbon atoms, and particularly preferably 1 to 3 carbon atoms.
  • a straight-chain alkylene group is preferable, and specific examples thereof include a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [-(CH 2 ) 3 -], a tetramethylene group [-(CH 2 ) 4 -], a pentamethylene group [-(CH 2 ) 5 -], etc.
  • the branched aliphatic hydrocarbon group is preferably a branched alkylene group, and specific examples thereof include alkylmethylene groups such as -CH( CH3 )-, -CH( CH2CH3 )-, -C( CH3 ) 2- , -C(CH3)(CH2CH3)-, -C(CH3)(CH2CH2CH3)-, and -C(CH2CH3 ) 2- ; alkylethylene groups such as -CH ( CH3 ) CH2- , -CH( CH3 )CH( CH3 ) - , -C( CH3 ) 2CH2- , -CH ( CH2CH3 ) CH2- , and -C( CH2CH3 ) 2 - CH2- ; and alkyl alkylene groups such as alkyl trimethylene groups such as -CH (CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -, etc.
  • the cyclic hydrocarbon group in R'201 may contain a heteroatom, such as a heterocycle.
  • a heteroatom such as a heterocycle.
  • Specific examples include the lactone-containing cyclic groups represented by the general formulae (a2-r-1) to (a2-r-7) above, the -SO 2 -containing cyclic groups represented by the general formulae (b5-r-1) to (b5-r-4) above, and the heterocyclic groups represented by the chemical formulae (r-hr-1) to (r-hr-16) above.
  • Examples of the substituent in the cyclic group of R'201 include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, and a nitro group.
  • the alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably a methyl group, an ethyl group, a propyl group, an n-butyl group or a tert-butyl group.
  • the alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group, or a tert-butoxy group, and most preferably a methoxy group or an ethoxy group.
  • a fluorine atom is preferred.
  • halogenated alkyl group as a substituent examples include alkyl groups having 1 to 5 carbon atoms, such as methyl, ethyl, propyl, n-butyl, and tert-butyl groups, in which some or all of the hydrogen atoms have been substituted with the above-mentioned halogen atoms.
  • the carbonyl group as a substituent is a group that substitutes a methylene group (-CH 2 -) that constitutes a cyclic hydrocarbon group.
  • a chain alkyl group which may have a substituent may be either linear or branched.
  • the linear alkyl group preferably has 1 to 20 carbon atoms, more preferably has 1 to 15 carbon atoms, and most preferably has 1 to 10 carbon atoms.
  • the branched alkyl group preferably has 3 to 20 carbon atoms, more preferably has 3 to 15 carbon atoms, and most preferably has 3 to 10 carbon atoms.
  • Specific examples include a 1-methylethyl group, a 1-methylpropyl group, a 2-methylpropyl group, a 1-methylbutyl group, a 2-methylbutyl group, a 3-methylbutyl group, a 1-ethylbutyl group, a 2-ethylbutyl group, a 1-methylpentyl group, a 2-methylpentyl group, a 3-methylpentyl group, and a 4-methylpentyl group.
  • a chain alkenyl group which may have a substituent may be either linear or branched, and preferably has 2 to 10 carbon atoms, more preferably 2 to 5 carbon atoms, even more preferably 2 to 4 carbon atoms, and particularly preferably 3 carbon atoms.
  • Examples of linear alkenyl groups include vinyl groups, propenyl groups (allyl groups), and butynyl groups.
  • Examples of branched alkenyl groups include 1-methylvinyl groups, 2-methylvinyl groups, 1-methylpropenyl groups, and 2-methylpropenyl groups. Of the above chain alkenyl groups, linear alkenyl groups are preferred, vinyl groups and propenyl groups are more preferred, and vinyl groups are particularly preferred.
  • Examples of the substituent in the chain alkyl or alkenyl group of R'201 include an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, and the cyclic groups in R'201 described above.
  • the optionally substituted cyclic group, optionally substituted chain alkyl group, or optionally substituted chain alkenyl group for R'201 is as described above, and examples of the optionally substituted cyclic group or optionally substituted chain alkyl group include the same as the acid dissociable group represented by formula (a1-r-2) above.
  • R'201 is preferably a cyclic group which may have a substituent, and more preferably a cyclic hydrocarbon group which may have a substituent. More specifically, for example, a phenyl group, a naphthyl group, a group in which one or more hydrogen atoms have been removed from a polycycloalkane, a lactone-containing cyclic group represented by each of the general formulae (a2-r-1) to (a2-r-7), an -SO 2 -- containing cyclic group represented by each of the general formulae (b5-r-1) to (b5-r-4), etc. are preferred.
  • R 201 to R 203 and R 206 to R 207 when bonded to each other to form a ring together with the sulfur atom in the formula, they may be bonded via a heteroatom such as a sulfur atom, an oxygen atom or a nitrogen atom, or a functional group such as a carbonyl group, -SO-, -SO 2 -, -SO 3 -, -COO-, -CONH- or -N(R N )- (wherein R N is an alkyl group having 1 to 5 carbon atoms).
  • a heteroatom such as a sulfur atom, an oxygen atom or a nitrogen atom
  • a functional group such as a carbonyl group, -SO-, -SO 2 -, -SO 3 -, -COO-, -CONH- or -N(R N )- (wherein R N is an alkyl group having 1 to 5 carbon atoms).
  • one ring containing the sulfur atom in the ring skeleton in the formula is preferably a 3- to 10-membered ring including the sulfur atom, and particularly preferably a 5- to 7-membered ring.
  • the ring formed include a thiophene ring, a thiazole ring, a benzothiophene ring, a dibenzothiophene ring, a 9H-thioxanthene ring, a thioxanthone ring, a thianthrene ring, a phenoxathiin ring, a tetrahydrothiophenium ring, and a tetrahydrothiopyranium ring.
  • R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, preferably a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, and when they represent an alkyl group, they may be bonded to each other to form a ring.
  • R 210 is an aryl group which may have a substituent, an alkyl group which may have a substituent, an alkenyl group which may have a substituent, or an --SO 2 -- containing cyclic group which may have a substituent.
  • the aryl group for R 210 includes unsubstituted aryl groups having 6 to 20 carbon atoms, and is preferably a phenyl group or a naphthyl group.
  • the alkyl group for R 210 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms.
  • the alkenyl group for R 210 preferably has 2 to 10 carbon atoms.
  • a "-SO 2 -containing polycyclic group” is preferable, and a group represented by the above general formula (b5-r-1) is more preferable.
  • Suitable cations represented by the formula (ca-1) include the cations represented by the following chemical formulas.
  • g1, g2, and g3 each represent a repeating number, where g1 is an integer of 1 to 5, g2 is an integer of 0 to 20, and g3 is an integer of 0 to 20.
  • R′′ 201 is a hydrogen atom or a substituent, and the substituent is the same as those exemplified as the substituents that may be possessed by R 201 to R 207 and R 210 to R 212. ]
  • Suitable cations represented by the formula (ca-2) include diphenyliodonium cation, bis(4-tert-butylphenyl)iodonium cation, etc.
  • Suitable cations represented by the formula (ca-3) include the cations represented by the following formulas (ca-3-1) to (ca-3-6).
  • the component (B) may use either a single type, or a combination of two or more types.
  • the amount of the component (B) in the resist composition is preferably less than 70 parts by mass, more preferably 10 to 60 parts by mass, and even more preferably 20 to 50 parts by mass, relative to 100 parts by mass of the component (A).
  • the resist composition of this embodiment may further contain, in addition to the component (A), a base component (component (D)) that traps acid generated upon exposure (i.e., controls the diffusion of acid).
  • the component (D) acts as a quencher (acid diffusion controller) that traps acid generated in the resist composition upon exposure.
  • Examples of the component (D) include a photodegradable base (D1) (hereinafter referred to as "component (D1)”) that decomposes upon exposure to light and loses its acid diffusion controllability, and a nitrogen-containing organic compound (D2) (hereinafter referred to as "component (D2)”) that does not fall under the category of component (D1).
  • the photodegradable base (component (D1)) is preferred because it is likely to enhance all of the properties of increasing sensitivity, reducing roughness, and suppressing the occurrence of coating defects.
  • the component (D1) is not particularly limited as long as it decomposes upon exposure to light and loses its acid diffusion controllability, and is preferably one or more compounds selected from the group consisting of a compound represented by the following general formula (d1-1) (hereinafter referred to as "component (d1-1)”), a compound represented by the following general formula (d1-2) (hereinafter referred to as “component (d1-2)”), and a compound represented by the following general formula (d1-3) (hereinafter referred to as "component (d1-3)”):
  • component (d1-1) to (d1-3) do not act as quenchers in the exposed areas of the resist film because they decompose and lose their acid diffusion control ability (basicity), but act as quenchers in the unexposed areas of the resist film.
  • Rd 1 to Rd 4 are a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent.
  • Rd 2 in formula (d1-2) a fluorine atom is not bonded to the carbon atom adjacent to the S atom.
  • Yd 1 is a single bond or a divalent linking group.
  • m is an integer of 1 or more, and each M m+ is independently an m-valent organic cation.
  • Rd 1 represents a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent, and examples of these groups include the same as those for R' 201 described above.
  • Rd 1 is preferably an aromatic hydrocarbon group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain-like alkyl group which may have a substituent.
  • substituents which these groups may have include a hydroxyl group, an oxo group, an alkyl group, an aryl group, a halogen atom, a fluorinated alkyl group, a lactone-containing cyclic group represented by each of the above general formulas (a2-r-1) to (a2-r-7), an ether bond, an ester bond, or a combination thereof.
  • an ether bond or an ester bond is contained as a substituent, it may be via an alkylene group, and in this case, the substituent is preferably a linking group represented by each of the above formulas (y-al-1) to (y-al-5).
  • Suitable examples of the aromatic hydrocarbon group include a phenyl group, a naphthyl group, and a polycyclic structure containing a bicyclooctane skeleton (a polycyclic structure consisting of a bicyclooctane skeleton and another ring structure).
  • the aliphatic cyclic group is more preferably a group in which one or more hydrogen atoms have been removed from a polycycloalkane such as adamantane, norbornane, isobornane, tricyclodecane, or tetracyclododecane.
  • the chain alkyl group preferably has 1 to 10 carbon atoms.
  • chain alkyl group examples include linear alkyl groups such as a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, a nonyl group, and a decyl group; and branched alkyl groups such as a 1-methylethyl group, a 1-methylpropyl group, a 2-methylpropyl group, a 1-methylbutyl group, a 2-methylbutyl group, a 3-methylbutyl group, a 1-ethylbutyl group, a 2-ethylbutyl group, a 1-methylpentyl group, a 2-methylpentyl group, a 3-methylpentyl group, and a 4-methylpentyl group.
  • linear alkyl groups such as a methyl group, an ethyl group, a propyl group,
  • the chain-like alkyl group is a fluorinated alkyl group having a fluorine atom or a fluorinated alkyl group as a substituent
  • the number of carbon atoms in the fluorinated alkyl group is preferably 1 to 11, more preferably 1 to 8, and even more preferably 1 to 4.
  • the fluorinated alkyl group may contain atoms other than fluorine atoms. Examples of atoms other than fluorine atoms include oxygen atoms, sulfur atoms, and nitrogen atoms.
  • M m+ represents an m-valent organic cation.
  • Suitable examples of the organic cation of M m+ include the same cations as those represented by the general formulas (ca-1) to (ca-5), more preferably the cation represented by the general formula (ca-1), and even more preferably the cations represented by the general formulas (ca-1-1) to (ca-1-70).
  • the component (d1-1) may be used alone or in combination of two or more.
  • Rd2 represents a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent
  • examples of R'201 include the same as those described above for R'201 .
  • the carbon atom adjacent to the S atom does not have a fluorine atom bonded thereto (is not substituted with fluorine), whereby the anion of the component (d1-2) becomes an appropriately weak acid anion, and the quenching ability of the component (D) is improved.
  • Rd2 is preferably a chain alkyl group which may have a substituent, or an aliphatic cyclic group which may have a substituent.
  • the chain alkyl group preferably has 1 to 10 carbon atoms, and more preferably has 3 to 10 carbon atoms.
  • the aliphatic cyclic group is more preferably a group (which may have a substituent) in which one or more hydrogen atoms have been removed from adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, or the like; or a group in which one or more hydrogen atoms have been removed from camphor, or the like.
  • the hydrocarbon group of Rd2 may have a substituent, and examples of the substituent include the same as the substituents that may be possessed by the hydrocarbon group (aromatic hydrocarbon group, aliphatic cyclic group, chain alkyl group) in Rd1 of the above formula (d1-1).
  • M m+ represents an m-valent organic cation and is the same as M m+ in formula (d1-1).
  • the component (d1-2) may be used alone or in combination of two or more.
  • Rd 3 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent, and examples thereof include the same as those of R' 201 , and is preferably a cyclic group, chain alkyl group, or chain alkenyl group containing a fluorine atom.
  • a fluorinated alkyl group is preferable, and the same as the fluorinated alkyl group of Rd 1 is more preferable.
  • Rd4 represents a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent
  • examples of R'201 include the same as those described above.
  • an alkyl group, an alkoxy group, an alkenyl group, or a cyclic group, which may have a substituent is preferable.
  • the alkyl group in Rd 4 is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, and specific examples thereof include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, a neopentyl group, etc.
  • a portion of the hydrogen atoms of the alkyl group in Rd 4 may be substituted with a hydroxyl group, a cyano group, etc.
  • the alkoxy group in Rd 4 is preferably an alkoxy group having 1 to 5 carbon atoms, and specific examples of the alkoxy group having 1 to 5 carbon atoms include a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group, and a tert-butoxy group. Of these, a methoxy group and an ethoxy group are preferred.
  • the alkenyl group in Rd4 may be the same as the alkenyl group in R'201 , and preferably a vinyl group, a propenyl group (allyl group), a 1-methylpropenyl group, or a 2-methylpropenyl group. These groups may further have an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms as a substituent.
  • the cyclic group in Rd 4 may be the same as the cyclic group in R' 201 , and is preferably an alicyclic group in which one or more hydrogen atoms have been removed from a cycloalkane such as cyclopentane, cyclohexane, adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc., or an aromatic group such as a phenyl group, naphthyl group, etc.
  • a cycloalkane such as cyclopentane, cyclohexane, adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc.
  • Rd 4 is an alicyclic group or an aromatic group, the resist composition dissolves well in an organic solvent, and the lithography properties become good.
  • Yd1 represents a single bond or a divalent linking group.
  • the divalent linking group in Yd 1 is not particularly limited, and examples thereof include a divalent hydrocarbon group which may have a substituent (an aliphatic hydrocarbon group, an aromatic hydrocarbon group), a divalent linking group containing a hetero atom, etc. These include the same as the divalent hydrocarbon group which may have a substituent and the divalent linking group containing a hetero atom mentioned in the description of the divalent linking group in Ya 21 in the above formula (a2-1).
  • Yd 1 is preferably a carbonyl group, an ester bond, an amide bond, an alkylene group, or a combination thereof.
  • the alkylene group is more preferably a linear or branched alkylene group, and further preferably a methylene group or an ethylene group.
  • M m+ represents an m-valent organic cation and is the same as M m+ in formula (d1-1).
  • the component (d1-3) may be used alone or in combination of two or more.
  • the component (D1) may be any one of the above components (d1-1) to (d1-3), or a combination of two or more of them.
  • the amount of the component (D1) in the resist composition is preferably 0.5 to 20 parts by mass, more preferably 1 to 15 parts by mass, and even more preferably 2 to 8 parts by mass, relative to 100 parts by mass of the component (A1).
  • the amount of the component (D1) is at least as large as the preferred lower limit, particularly good lithography properties and resist pattern shape are likely to be obtained, while when the amount is no more than the upper limit, good sensitivity can be maintained and excellent throughput is also achieved.
  • Production method of component (D1) The method for producing the components (d1-1) and (d1-2) is not particularly limited, and they can be produced by known methods.
  • the method for producing the component (d1-3) is not particularly limited, and it can be produced, for example, in the same manner as the method described in US 2012-0149916.
  • the component (D) may contain a nitrogen-containing organic compound component (hereinafter referred to as “component (D2)”) that does not fall under the category of the above-mentioned component (D1).
  • component (D2) is not particularly limited as long as it acts as an acid diffusion controller and does not fall under the category of component (D1), and any known component may be used.
  • aliphatic amines are preferred, and among these, secondary aliphatic amines and tertiary aliphatic amines are more preferred.
  • Aliphatic amines are amines that have one or more aliphatic groups, preferably having from 1 to 12 carbon atoms.
  • aliphatic amines include amines in which at least one of the hydrogen atoms of ammonia NH3 is substituted with an alkyl group or hydroxyalkyl group having 12 or less carbon atoms (alkylamines or alkyl alcohol amines), or cyclic amines.
  • alkylamines and alkyl alcohol amines include monoalkylamines such as n-hexylamine, n-heptylamine, n-octylamine, n-nonylamine, and n-decylamine; dialkylamines such as diethylamine, di-n-propylamine, di-n-heptylamine, di-n-octylamine, and dicyclohexylamine; trialkylamines such as trimethylamine, triethylamine, tri-n-propylamine, tri-n-butylamine, tri-n-pentylamine, tri-n-hexylamine, tri-n-heptylamine, tri-n-octylamine, tri-n-nonylamine, tri-n-decylamine, and tri-n-dodecylamine; and alkyl alcohol amines such as diethanolamine, triethanolamine, diis
  • cyclic amines include heterocyclic compounds containing a nitrogen atom as a heteroatom.
  • the heterocyclic compounds may be monocyclic (aliphatic monocyclic amines) or polycyclic (aliphatic polycyclic amines). Specific examples of the aliphatic monocyclic amine include piperidine and piperazine.
  • the aliphatic polycyclic amine is preferably one having 6 to 10 carbon atoms, and specific examples thereof include 1,5-diazabicyclo[4.3.0]-5-nonene, 1,8-diazabicyclo[5.4.0]-7-undecene, hexamethylenetetramine, and 1,4-diazabicyclo[2.2.2]octane.
  • aliphatic amines include tris(2-methoxymethoxyethyl)amine, tris ⁇ 2-(2-methoxyethoxy)ethyl ⁇ amine, tris ⁇ 2-(2-methoxyethoxymethoxy)ethyl ⁇ amine, tris ⁇ 2-(1-methoxyethoxy)ethyl ⁇ amine, tris ⁇ 2-(1-ethoxyethoxy)ethyl ⁇ amine, tris ⁇ 2-(1-ethoxypropoxy)ethyl ⁇ amine, tris[2- ⁇ 2-(2-hydroxyethoxy)ethoxy ⁇ ethyl]amine, triethanolamine triacetate, etc., with triethanolamine triacetate being preferred.
  • aromatic amine may be used as the component (D2).
  • aromatic amines include 4-dimethylaminopyridine, pyrrole, indole, pyrazole, imidazole or derivatives thereof, tribenzylamine, 2,6-diisopropylaniline, N-tert-butoxycarbonylpyrrolidine, and 2,6-di-tert-butylpyridine.
  • the component (D2) may be used alone or in combination of two or more types.
  • the amount of the component (D2) in the resist composition is typically within a range from 0.01 to 5 parts by mass relative to 100 parts by mass of the component (A1). By ensuring that the amount is within this range, the resist pattern shape and the storage stability over time are improved.
  • the resist composition of this embodiment may contain, as an optional component, at least one compound (E) selected from the group consisting of organic carboxylic acids, and phosphorus oxoacids and derivatives thereof (hereafter referred to as "component (E)").
  • component (E) phosphorus oxoacids and derivatives thereof
  • the organic carboxylic acid include acetic acid, malonic acid, citric acid, malic acid, succinic acid, benzoic acid, and salicylic acid, and among these, salicylic acid is preferred.
  • Examples of phosphorus oxoacids include phosphoric acid, phosphonic acid, and phosphinic acid, with phosphonic acid being particularly preferred.
  • Examples of the derivatives of phosphorus oxoacids include esters in which the hydrogen atoms of the above oxoacids are substituted with hydrocarbon groups.
  • Examples of the hydrocarbon groups include alkyl groups having 1 to 5 carbon atoms and aryl groups having 6 to 15 carbon atoms.
  • Examples of the derivatives of phosphoric acid include phosphoric acid esters such as di-n-butyl phosphoric acid ester and diphenyl phosphoric acid ester.
  • the derivatives of phosphonic acid include phosphonic acid esters such as dimethyl phosphonate, di-n-butyl phosphonate, phenylphosphonic acid, diphenyl phosphonate, and dibenzyl phosphonate.
  • Derivatives of phosphinic acid include phosphinic acid esters and phenylphosphinic acid.
  • the component (E) may use either a single type, or a combination of two or more types.
  • the content of the component (E) is preferably from 0.01 to 5 parts by mass, and more preferably from 0.05 to 3 parts by mass, relative to 100 parts by mass of the component (A). By ensuring that the content is within this range, the sensitivity and lithography properties, etc. are improved.
  • the resist composition of this embodiment may contain a fluorine additive component (hereafter referred to as "component (F)") as a hydrophobic resin.
  • component (F) is used to impart water repellency to the resist film, and when used as a resin separate from the component (A), it can improve lithography properties.
  • component (F) for example, the fluorine-containing polymeric compounds described in JP-A-2010-002870, JP-A-2010-032994, JP-A-2010-277043, JP-A-2011-13569, and JP-A-2011-128226 can be used.
  • the component (F) may be a polymer having a structural unit (f1) represented by the following general formula (f1-1).
  • the polymer is preferably a polymer (homopolymer) consisting only of the structural unit (f1) represented by the following formula (f1-1); a copolymer of the structural unit (f1) and the structural unit (a1); or a copolymer of the structural unit (f1), a structural unit derived from acrylic acid or methacrylic acid, and the structural unit (a1), and more preferably a copolymer of the structural unit (f1) and the structural unit (a1).
  • the structural unit (a1) copolymerized with the structural unit (f1) is preferably a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate or a structural unit derived from 1-methyl-1-adamantyl (meth)acrylate, and more preferably a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate.
  • R is the same as above, Rf 102 and Rf 103 each independently represent a hydrogen atom, a halogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms, and Rf 102 and Rf 103 may be the same or different.
  • nf 1 is an integer of 0 to 5
  • Rf 101 is an organic group containing a fluorine atom.
  • R bonded to the carbon atom at the ⁇ -position is the same as defined above.
  • R is preferably a hydrogen atom or a methyl group.
  • the halogen atom of Rf 102 and Rf 103 is preferably a fluorine atom.
  • the alkyl group having 1 to 5 carbon atoms of Rf 102 and Rf 103 may be the same as the alkyl group having 1 to 5 carbon atoms of R, and preferably a methyl group or an ethyl group.
  • halogenated alkyl group having 1 to 5 carbon atoms of Rf 102 and Rf 103 include groups in which part or all of the hydrogen atoms of an alkyl group having 1 to 5 carbon atoms are substituted with halogen atoms.
  • the halogen atom is preferably a fluorine atom.
  • Rf 102 and Rf 103 are preferably a hydrogen atom, a fluorine atom, or an alkyl group having 1 to 5 carbon atoms, more preferably a hydrogen atom, a fluorine atom, a methyl group, or an ethyl group, and even more preferably a hydrogen atom.
  • nf 1 represents an integer of 0 to 5, preferably an integer of 0 to 3, and more preferably 1 or 2.
  • Rf 101 is an organic group containing a fluorine atom, and is preferably a hydrocarbon group containing a fluorine atom.
  • the fluorine atom-containing hydrocarbon group may be linear, branched, or cyclic and preferably has 1 to 20 carbon atoms, more preferably has 1 to 15 carbon atoms, and particularly preferably has 1 to 10 carbon atoms.
  • preferably 25% or more of the hydrogen atoms in the hydrocarbon group are fluorinated, more preferably 50% or more, and particularly preferably 60% or more are fluorinated, as this enhances the hydrophobicity of the resist film during immersion exposure.
  • Rf 101 is more preferably a fluorinated hydrocarbon group having 1 to 6 carbon atoms, with a trifluoromethyl group, -CH 2 -CF 3 , -CH 2 -CF 2 -CF 3 , -CH(CF 3 ) 2 , -CH 2 -CH 2 -CF 3 , and -CH 2 -CH 2 -CF 2 -CF 2 -CF 3 being particularly preferred.
  • the weight average molecular weight (Mw) of component (F) (based on polystyrene equivalent measured by gel permeation chromatography) is preferably from 1,000 to 50,000, more preferably from 5,000 to 40,000, and most preferably from 10,000 to 30,000. When it is below the upper limit of this range, the compound has sufficient solubility in a resist solvent for use as a resist, and when it is above the lower limit of this range, the resist film has good water repellency.
  • the dispersity (Mw/Mn) of the component (F) is preferably from 1.0 to 5.0, more preferably from 1.0 to 3.0, and most preferably from 1.0 to 2.5.
  • the component (F) may use either a single type, or a combination of two or more types.
  • the amount of the component (F) per 100 parts by mass of the component (A) is preferably 0.5 to 10 parts by mass, and more preferably 1 to 10 parts by mass.
  • the resist composition of this embodiment can be produced by dissolving the resist materials in an organic solvent component (hereafter referred to as “component (S)”).
  • component (S) can be any solvent that is capable of dissolving the individual components used and forming a homogeneous solution, and any solvent can be appropriately selected from those known in the art as a solvent for chemically amplified resist compositions.
  • the component (S) may be used alone or as a mixed solvent of two or more different types. Of these, PGMEA, PGME, ⁇ -butyrolactone, EL, and cyclohexanone are preferred.
  • a mixed solvent of PGMEA and a polar solvent is also preferred.
  • the blending ratio (mass ratio) may be appropriately determined taking into consideration the compatibility between PGMEA and the polar solvent, etc.
  • a mixed solvent of at least one selected from PGMEA and EL with ⁇ -butyrolactone is also preferred.
  • the mixing ratio of the former to the latter is preferably 70:30 to 95:5 by mass.
  • the amount of the component (S) used is used so that the solids concentration of the resist composition falls within the range of 0.1 to 20 mass %, and preferably 0.2 to 15 mass %.
  • the resist composition of this embodiment may further contain compatible additives, such as additional resins to improve the performance of the resist film, dissolution inhibitors, plasticizers, stabilizers, colorants, antihalation agents, dyes, etc., as desired.
  • compatible additives such as additional resins to improve the performance of the resist film, dissolution inhibitors, plasticizers, stabilizers, colorants, antihalation agents, dyes, etc., as desired.
  • the resist composition of this embodiment after dissolving the resist material in the (S) component, impurities and the like may be removed using a polyimide porous film, a polyamideimide porous film, or the like.
  • the resist composition may be filtered using a filter made of a polyimide porous film, a filter made of a polyamideimide porous film, or a filter made of a polyimide porous film and a polyamideimide porous film.
  • the polyimide porous film and the polyamideimide porous film include those described in JP 2016-155121 A.
  • the resist composition of the present embodiment described above contains a resin component (A1) that has a structural unit (a0) derived from a compound represented by general formula (a0-1).
  • a resin component (A1) that has a structural unit (a0) derived from a compound represented by general formula (a0-1).
  • an acid non-dissociable group Ra 02 which includes an aromatic ring which may have a substituent
  • the structural unit (a0) particularly when Ra 02 contains an oxygen atom, the proton affinity of Ra 02 increases and protons tend to collect, which is presumably why the acid-dissociable group Ra 01 has an increased ability to be released from the acid in the exposed areas of the resist film, thereby improving sensitivity. It is also presumed that in the unexposed areas of the resist film, film rigidity is improved due to interaction between the aromatic ring-containing acid non-dissociable groups Ra 02 or between the aromatic ring-containing acid non-dissociable group Ra 02 and the acid dissociable group Ra 01 . Furthermore, since the structural unit (a0) contains Ra 02 which has a bulky structure, it is presumed that it exerts the effect of suppressing acid diffusion and reduces roughness.
  • the structural unit (a0) contains an aromatic ring-containing acid non-dissociable group Ra 02 , it is presumed that volatilization during etching is suppressed and etching resistance is improved. It is presumed that due to the combination of the above effects, the resist composition of this embodiment has high sensitivity, good lithography properties, and good etching resistance.
  • a method for forming a resist pattern according to the second aspect of the present invention is a method comprising the steps of forming a resist film on a support using the resist composition according to the first aspect of the present invention, exposing the resist film to light, and developing the exposed resist film to form a resist pattern.
  • One embodiment of the resist pattern forming method is, for example, a resist pattern forming method carried out as follows.
  • the resist composition of the above-described embodiment is applied onto a support using a spinner or the like, and then baked (post-applied bake (PAB)) at a temperature of, for example, 80 to 150° C. for 40 to 120 seconds, preferably 60 to 90 seconds, to form a resist film.
  • PAB post-applied bake
  • the resist film is selectively exposed using an exposure device such as an electron beam lithography device or an ArF lithography device, either through a mask (mask pattern) on which a predetermined pattern has been formed, or by lithography using direct irradiation with an electron beam without using a mask pattern, and then baked (post-exposure bake (PEB)) for 40 to 120 seconds, preferably 60 to 90 seconds, at a temperature of, for example, 80 to 150° C.
  • PEB post-exposure bake
  • the resist film is developed using an alkaline developer in the case of an alkaline development process, or a developer containing an organic solvent (organic developer) in the case of a solvent development process.
  • a rinse process is preferably carried out.
  • the rinse process is preferably a water rinse using pure water, and in the case of a solvent development process, a rinse liquid containing an organic solvent is preferably used.
  • a treatment may be carried out in which the developer or rinsing liquid adhering to the pattern is removed by using a supercritical fluid. After the development treatment or rinsing treatment, drying is performed. In some cases, a baking treatment (post-baking) may be performed after the development treatment.
  • the support is not particularly limited, and conventionally known materials can be used, such as substrates for electronic components and substrates on which a predetermined wiring pattern is formed. More specifically, examples include silicon wafers, substrates made of metals such as copper, chromium, iron, and aluminum, and glass substrates. Materials that can be used for the wiring pattern include, for example, copper, aluminum, nickel, and gold.
  • the wavelength used for exposure is not particularly limited, and radiation such as ArF excimer laser, KrF excimer laser, F2 excimer laser, EUV (extreme ultraviolet), VUV (vacuum ultraviolet), EB (electron beam), X-rays, and soft X-rays can be used.
  • radiation such as ArF excimer laser, KrF excimer laser, F2 excimer laser, EUV (extreme ultraviolet), VUV (vacuum ultraviolet), EB (electron beam), X-rays, and soft X-rays can be used.
  • the exposure method for the resist film may be a normal exposure method (dry exposure) performed in air or an inert gas such as nitrogen, or may be liquid immersion exposure (liquid immersion lithography).
  • Immersion exposure is an exposure method in which the space between the resist film and the lowest lens of the exposure tool is filled with a solvent (immersion medium) that has a refractive index greater than that of air, and exposure (immersion exposure) is then performed in that state.
  • the immersion medium is preferably a solvent having a refractive index greater than that of air and less than that of the resist film to be exposed, and examples of such a solvent include water, a fluorine-based inert liquid, a silicon-based solvent, and a hydrocarbon-based solvent.
  • water is preferably used as the liquid immersion medium.
  • the alkaline developer used in the development treatment in the alkaline development process may be, for example, a 0.1 to 10% by weight aqueous solution of tetramethylammonium hydroxide (TMAH).
  • TMAH tetramethylammonium hydroxide
  • the organic solvent contained in the organic developer used in the development treatment in the solvent development process may be any organic solvent capable of dissolving the component (A) (the component (A) before exposure), and may be appropriately selected from known organic solvents.
  • Specific examples of the organic solvent include polar solvents such as ketone solvents, ester solvents, alcohol solvents, nitrile solvents, amide solvents, and ether solvents, and hydrocarbon solvents.
  • Ester solvents include, for example, methyl acetate, butyl acetate, ethyl acetate, isopropyl acetate, pentyl acetate, isopentyl acetate, amyl acetate, propylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, ethyl-3-ethoxypropionate, 3-methoxybutyl acetate, 3-methyl-3-methoxybutyl acetate, methyl formate, ethyl formate, butyl formate, propyl formate, ethyl lactate, butyl lactate, propyl lactate, butyl butanoate, methyl 2-hydroxyisobutyrate, isoamyl acetate, isobutyl isobutyrate, and butyl propionate.
  • nitrile solvents examples include acetonitrile, propionitrile, valeronitrile, butyronitrile, etc.
  • additives can be added to the organic developer as necessary.
  • additives include surfactants.
  • the development process can be carried out by a known development method, such as a method of immersing the support in a developer for a certain period of time (dip method), a method of piling up the developer on the surface of the support by surface tension and leaving it still for a certain period of time (paddle method), a method of spraying the developer on the surface of the support (spray method), or a method of continuously applying developer while scanning a developer application nozzle at a constant speed onto a support rotating at a constant speed (dynamic dispense method).
  • a known development method such as a method of immersing the support in a developer for a certain period of time (dip method), a method of piling up the developer on the surface of the support by surface tension and leaving it still for a certain period of time (paddle method), a method of spraying the developer on the surface of the support (spray method), or a method of continuously applying developer while scanning a developer application nozzle at a constant speed onto a support rotating at a constant speed (dynamic
  • the organic solvent contained in the rinse solution used in the rinsing treatment after the development treatment in the solvent development process can be appropriately selected from the organic solvents listed above as the organic solvents used in the organic developer, which do not easily dissolve the resist pattern.
  • at least one solvent selected from the group consisting of hydrocarbon solvents, ketone solvents, ester solvents, alcohol solvents, amide solvents, and ether solvents is used. These organic solvents may be used alone or in combination of two or more thereof, and may be used in combination with other organic solvents or water.
  • the rinse treatment (cleaning treatment) using a rinse solution can be carried out by a known rinse method.
  • the rinse treatment method include a method in which the rinse solution is continuously applied onto a support rotating at a constant speed (spin coating method), a method in which the support is immersed in the rinse solution for a certain period of time (dip method), and a method in which the rinse solution is sprayed onto the surface of the support (spray method).
  • the resist composition of the above-mentioned embodiment and the various materials used in the method of forming a resist pattern of the above-mentioned embodiment preferably do not contain impurities such as metals, metal salts containing halogens, acids, alkalis, and components containing sulfur atoms or phosphorus atoms.
  • impurities containing metal atoms include Na, K, Ca, Fe, Cu, Mn, Mg, Al, Cr, Ni, Zn, Ag, Sn, Pb, Li, or salts thereof.
  • the content of impurities contained in these materials is preferably 200 ppb or less, more preferably 1 ppb or less, even more preferably 100 ppt (parts per trillion) or less, particularly preferably 10 ppt or less, and most preferably substantially free of impurities (below the detection limit of the measuring device).
  • the resist pattern forming method of this embodiment described above uses the resist composition described above, which allows for high sensitivity and the formation of a resist pattern with good CDU.
  • R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms;
  • Ar is an aromatic ring;
  • Ra 011 is an acid dissociable group containing a ring structure;
  • m1 is an integer of 1 or more as long as the valence allows;
  • Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent;
  • m2 is an integer of 1 or more as long as the valence allows;
  • Ra 03 is a substituent other than COORa 01 and Ra 02 ; and
  • m3 is an integer of 0 or more as long as the valence allows.
  • the compound of this embodiment is similar to the compound that derives the structural unit (a0) that is contained in the component (A1) of the resist composition related to the first aspect, except that Ra 011 in formula (a0-11) is an acid-dissociable group containing a ring structure.
  • the acid-dissociable group having a ring structure for Ra 011 is the same as the acid-dissociable group having a ring structure for Ra 01 in the formula (a0-1).
  • the method for producing the compound of the present embodiment is not particularly limited, and the compound can be produced by appropriately combining known methods.
  • the compound represented by the formula (Ra2-01) can be produced, for example, by benzyl protection in which a phenol derivative having a polymerizable group and a tertiary alkyl ester group is reacted with benzyl bromide, as shown in [Synthesis Example 1: Synthesis of Monomer (m01)] described below.
  • the compound represented by (Ra2-20) above can be produced, for example, by an esterification reaction in which a phenol derivative having a polymerizable group and a tertiary alkyl ester group is reacted with benzoic acid, as shown in [Synthesis Example 14: Synthesis of Monomer (m014)].
  • the compound represented by (Ra2-17) above can be produced, for example, by reacting a phenol derivative having a polymerizable group and a tertiary alkyl ester group with diphenyliodonium fluorinated alkylsulfonic acid, as shown in [Synthesis Example 19: Synthesis of Monomer (m019)].
  • the compound (a0-m) in the reaction mixture may be isolated and purified.
  • a conventionally known method can be used, for example, concentration, solvent extraction, distillation, crystallization, recrystallization, chromatography, etc., which can be used alone or in combination of two or more of these.
  • the structure of the compound obtained as described above can be confirmed by general organic analysis methods such as 1H -nuclear magnetic resonance (NMR) spectroscopy, 13C -NMR spectroscopy, 19F -NMR spectroscopy, infrared absorption (IR) spectroscopy, mass spectrometry (MS), elemental analysis, and X-ray crystal diffraction.
  • NMR nuclear magnetic resonance
  • IR infrared absorption
  • MS mass spectrometry
  • the compound of this embodiment is useful for producing a polymeric compound having the structural unit (a0) (resin component (A1) in the first embodiment).
  • the polymer compound of this embodiment has a structural unit (a0) derived from a compound represented by formula (a0-11). That is, the polymer compound of this embodiment is the same as the resin component (A1) in the first aspect, except that Ra 011 in formula (a0-11) is an acid-dissociable group containing a ring structure.
  • the obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
  • the obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
  • the obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
  • the obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
  • the obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
  • the obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
  • the polymer compounds (A0-1) to (A0-26) and (A1-1) to (A1-3) used in this example were obtained by radical polymerization of monomers that derive the structural units constituting each polymer compound in a predetermined molar ratio, followed by a deprotection reaction as necessary.
  • the weight average molecular weight (Mw) and the molecular weight dispersity (Mw/Mn) of each of the obtained polymer compounds were determined by GPC measurement (converted into standard polystyrene). The results are shown in Table 1.
  • copolymer composition ratio (the ratio (molar ratio) of each structural unit in the structural formula) of each of the obtained polymer compounds was determined by carbon-13 nuclear magnetic resonance spectroscopy (600 MHz, 13 C-NMR). The results are shown in Table 1.
  • polymer compounds (A0-1) to (A0-26) and (A1-1) to (A1-3) are shown below.
  • (A0)-1 to (A0)-26 the polymer compounds (A0-1) to (A0-26).
  • (A1)-1 to (A1)-3 the polymer compounds (A1-1) to (A1-3).
  • (B)-1 An acid generator comprising the following compound (B1-1).
  • (B)-2 An acid generator comprising the following compound (B1-2).
  • (B)-3 An acid generator comprising the following compound (B1-3).
  • (B)-4 An acid generator comprising the following compound (B1-4).
  • (B)-7 An acid generator consisting of the following compound (B1-7).
  • (B)-8 An acid generator consisting of the following compound (B1-8).
  • (D)-1 An acid diffusion controller consisting of the following compound (D1-1).
  • (D)-2 An acid diffusion controller consisting of the following compound (D1-2).
  • (D)-3 An acid diffusion controller consisting of the following compound (D1-3).
  • ⁇ Formation of Resist Pattern> Each resist composition of each example was applied to a silicon substrate treated with hexamethyldisilazane (HMDS) using a spinner, and pre-baked (PAB) on a hot plate at a temperature of 110° C. for 60 seconds, followed by drying to form a resist film with a thickness of 50 nm.
  • the resist film was subjected to drawing (exposure) at an acceleration voltage of 100 kV using an electron beam lithography apparatus JEOL JBX-9300FS (manufactured by JEOL Ltd.) with a target size of a 1:1 line and space pattern (hereinafter referred to as "LS pattern") with a line width of 35 nm.
  • a post-exposure bake (PEB) treatment was performed at 80° C. for 60 seconds.
  • PEB post-exposure bake
  • an alkali development was performed for 60 seconds using a 2.38 mass% tetramethylammonium hydroxide (TMAH) aqueous solution "NMD-3" (trade name, manufactured by Tokyo Ohka Kogyo Co., Ltd.).
  • TMAH tetramethylammonium hydroxide
  • NMD-3 aqueous solution

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Abstract

This resist composition contains a resin component (A1) having a structural unit (a0) derived from a compound represented by general formula (a0-1) (In the formula, R is a hydrogen atom, a C1-5 alkyl group, or a C1-5 alkyl halide group; La01 is a single bond or -C(=O)-O-; Ar is an aromatic ring; Ra01 is an acid dissociable group; Ra02 is an acid non-dissociable group including an aromatic ring; m1 and m2 are each an integer of 1 or greater; Ra03 is a substituent other than COORa01 and -Ra02; and m3 is an integer of 0 or greater.).

Description

レジスト組成物、レジストパターン形成方法、及び化合物Resist composition, method for forming resist pattern, and compound
 本発明は、レジスト組成物、レジストパターン形成方法、及び化合物に関する。
 本願は、2022年10月18日に日本に出願された、特願2022-166978号に基づき優先権主張し、その内容をここに援用する。
The present invention relates to a resist composition, a method of forming a resist pattern, and a compound.
This application claims priority based on Japanese Patent Application No. 2022-166978, filed in Japan on October 18, 2022, the contents of which are incorporated herein by reference.
 近年、半導体素子や液晶表示素子の製造においては、リソグラフィー技術の進歩により急速にパターンの微細化が進んでいる。微細化の手法としては、一般に、露光光源の短波長化(高エネルギー化)が行われている。 In recent years, advances in lithography technology have led to rapid progress in miniaturizing patterns in the manufacture of semiconductor elements and liquid crystal display elements. A common method of miniaturization is to shorten the wavelength (increase the energy) of the exposure light source.
 レジスト材料には、これらの露光光源に対する感度、微細な寸法のパターンを再現できる解像性等のリソグラフィー特性が求められる。
 このような要求を満たすレジスト材料として、従来、酸の作用により現像液に対する溶解性が変化する基材成分と、露光により酸を発生する酸発生剤成分と、を含有する化学増幅型レジスト組成物が用いられている。
Resist materials are required to have lithography properties such as sensitivity to these exposure light sources and resolution capable of reproducing patterns with fine dimensions.
As a resist material that satisfies such requirements, a chemically amplified resist composition that contains a base component whose solubility in a developer changes due to the action of acid, and an acid generator component that generates acid upon exposure, has been used so far.
 例えば、特許文献1には、スチレンカルボン酸骨格を有し、側鎖末端に酸解離性基が結合した構成単位を有する樹脂成分を含有するレジスト組成物が開示されている。このレジスト組成物によれば、高感度化が図れ、解像性及びLWR等のリソグラフィー特性が向上することが開示されている。 For example, Patent Document 1 discloses a resist composition that contains a resin component having a styrene carboxylic acid skeleton and a structural unit in which an acid-dissociable group is bonded to the end of the side chain. It is disclosed that this resist composition can achieve high sensitivity and improve lithography properties such as resolution and LWR.
特開2019-219469号公報JP 2019-219469 A
 リソグラフィー技術のさらなる進歩、応用分野の拡大等が進み、急速にパターンの微細化が進んでいる。そして、これに伴い、半導体素子等を製造する際には、微細なパターンを良好な形状で形成できる技術が求められる。例えば、EUVやEBによるリソグラフィーでは、数十nmの微細なパターン形成が目標とされる。 As lithography technology continues to advance and its application fields expand, patterns are becoming increasingly fine. As a result, there is a demand for technology that can form fine patterns with good shapes when manufacturing semiconductor devices, etc. For example, the goal of EUV and EB lithography is to form fine patterns of several tens of nanometers.
 レジスト組成物には感度、ラフネス等のリソグラフィ特性を各々トレードオフすることなく、改善することが求められている。さらに、微細パターンに伴うレジスト膜の薄膜化により、エッチング耐性も求められている。 Resist compositions are required to improve lithography properties such as sensitivity and roughness without making a trade-off between them. Furthermore, etching resistance is also required due to the thinner resist film that accompanies fine patterns.
 本発明は、上記事情に鑑みてなされたものであって、レジストパターンを形成する際に高感度化が図れ、且つリソグラフィー特性が良好で、エッチング耐性も良好なレジスト組成物、当該レジスト組成物を用いたレジストパターン形成方法、当該レジスト組成物に用いる基材成分の原料として有用な化合物を提供することを課題とする。 The present invention has been made in consideration of the above circumstances, and aims to provide a resist composition that provides high sensitivity when forming a resist pattern, has good lithography properties, and has good etching resistance, a method for forming a resist pattern using the resist composition, and a compound that is useful as a raw material for the base component used in the resist composition.
 上記の課題を解決するために、本発明は以下の構成を採用した。
 すなわち、本発明の第1の態様は、露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化するレジスト組成物であって、酸の作用により現像液に対する溶解性が変化する樹脂成分(A1)を含有し、前記樹脂成分(A1)は、下記一般式(a0-1)で表される化合物から誘導される構成単位(a0)を有する、レジスト組成物である。
In order to solve the above problems, the present invention employs the following configuration.
That is, a first aspect of the present invention is a resist composition that generates acid upon exposure, and whose solubility in a developer changes due to the action of the acid, the resist composition containing a resin component (A1) whose solubility in a developer changes due to the action of an acid, the resin component (A1) having a structural unit (a0) derived from a compound represented by the following general formula (a0-1):
Figure JPOXMLDOC01-appb-C000005
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基であり;La01は、単結合又は-C(=O)-O-であり;Arは、芳香環であり;Ra01は、酸解離性基であり;m1は、原子価が許容する限り、1以上の整数であり;Ra02は、置換基を有してもよい芳香環を含む酸非解離性基であり;m2は、原子価が許容する限り、1以上の整数であり;Ra03は、COORa01及びRa02以外の置換基であり;m3は、原子価が許容する限り、0以上の整数である。]
Figure JPOXMLDOC01-appb-C000005
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms; La 01 is a single bond or -C(=O)-O-; Ar is an aromatic ring; Ra 01 is an acid dissociable group; m1 is an integer of 1 or more as long as the valence allows; Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent; m2 is an integer of 1 or more as long as the valence allows; Ra 03 is a substituent other than COORa 01 and Ra 02 ; and m3 is an integer of 0 or more as long as the valence allows.]
 本発明の第2の態様は、支持体上に、前記第1の態様に係るレジスト組成物を用いてレジスト膜を形成する工程、前記レジスト膜を露光する工程、及び前記露光後のレジスト膜を現像してレジストパターンを形成する工程を有するレジストパターン形成方法である。 The second aspect of the present invention is a method for forming a resist pattern, comprising the steps of forming a resist film on a support using the resist composition according to the first aspect, exposing the resist film to light, and developing the exposed resist film to form a resist pattern.
 本発明の第3の態様は、下記一般式(a0-11)で表される化合物である。 The third aspect of the present invention is a compound represented by the following general formula (a0-11):
Figure JPOXMLDOC01-appb-C000006
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基であり;La01は、単結合又は-C(=O)-O-であり;Arは、芳香環であり;Ra011は、環構造を含む酸解離性基であり;m1は、原子価が許容する限り、1以上の整数であり;Ra02は、置換基を有してもよい芳香環を含む酸非解離性基であり;m2は、原子価が許容する限り、1以上の整数であり;Ra03は、COORa01及びRa02以外の置換基であり;m3は、原子価が許容する限り、0以上の整数である。]
Figure JPOXMLDOC01-appb-C000006
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms; La 01 is a single bond or -C(=O)-O-; Ar is an aromatic ring; Ra 011 is an acid dissociable group containing a ring structure; m1 is an integer of 1 or more as long as the valence allows; Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent; m2 is an integer of 1 or more as long as the valence allows; Ra 03 is a substituent other than COORa 01 and Ra 02 ; and m3 is an integer of 0 or more as long as the valence allows.]
 本発明によれば、レジストパターンを形成する際に高感度化が図れ、且つリソグラフィー特性が良好で、エッチング耐性も良好なレジスト組成物、当該レジスト組成物を用いたレジストパターン形成方法、当該レジスト組成物に用いる基材成分の原料として有用な化合物を提供することができる。 The present invention provides a resist composition that provides high sensitivity when forming a resist pattern, has good lithography properties, and has good etching resistance, a method for forming a resist pattern using the resist composition, and a compound that is useful as a raw material for the base component used in the resist composition.
 本明細書及び本特許請求の範囲において、「脂肪族」とは、芳香族に対する相対的な概念であって、芳香族性を持たない基、化合物等を意味するものと定義する。
 「アルキル基」は、特に断りがない限り、直鎖状、分岐鎖状及び環状の1価の飽和炭化水素基を包含するものとする。アルコキシ基中のアルキル基も同様である。
 「アルキレン基」は、特に断りがない限り、直鎖状、分岐鎖状及び環状の2価の飽和炭化水素基を包含するものとする。
 「ハロゲン原子」は、フッ素原子、塩素原子、臭素原子、ヨウ素原子が挙げられる。
 「構成単位」とは、高分子化合物(樹脂、重合体、共重合体)を構成するモノマー単位(単量体単位)を意味する。
 「置換基を有してもよい」と記載する場合、水素原子(-H)を1価の基で置換する場合と、メチレン基(-CH-)を2価の基で置換する場合との両方を含む。
 「露光」は、放射線の照射全般を含む概念とする。
In this specification and claims, the term "aliphatic" is a relative concept to aromaticity and is defined as meaning a group, compound, etc. that does not have aromaticity.
Unless otherwise specified, the term "alkyl group" includes linear, branched and cyclic monovalent saturated hydrocarbon groups. The same applies to the alkyl group in an alkoxy group.
Unless otherwise specified, the term "alkylene group" includes linear, branched and cyclic divalent saturated hydrocarbon groups.
The "halogen atom" includes a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
The term "structural unit" refers to a monomer unit that constitutes a polymeric compound (resin, polymer, copolymer).
The phrase "may have a substituent" includes both the case where a hydrogen atom (--H) is replaced with a monovalent group and the case where a methylene group (--CH 2 -) is replaced with a divalent group.
The term "exposure" is intended to include the general concept of irradiation with radiation.
 「酸分解性基」は、酸の作用により、当該酸分解性基の構造中の少なくとも一部の結合が開裂し得る酸分解性を有する基である。
 酸の作用により極性が増大する酸分解性基としては、例えば、酸の作用により分解して極性基を生じる基が挙げられる。
 極性基としては、例えばカルボキシ基、水酸基、アミノ基、スルホ基(-SOH)等が挙げられる。
 酸分解性基としてより具体的には、前記極性基が酸解離性基で保護された基(例えばOH含有極性基の水素原子を、酸解離性基で保護した基)が挙げられる。
The term "acid-decomposable group" refers to a group having acid decomposability in which at least a part of the bonds in the structure of the acid-decomposable group can be cleaved by the action of an acid.
Examples of acid-decomposable groups whose polarity increases under the action of an acid include groups that are decomposed by the action of an acid to generate a polar group.
Examples of the polar group include a carboxy group, a hydroxyl group, an amino group, and a sulfo group (-SO 3 H).
More specific examples of the acid-decomposable group include groups in which the polar group is protected with an acid-dissociable group (for example, a group in which the hydrogen atom of an OH-containing polar group is protected with an acid-dissociable group).
 「酸解離性基」とは、(i)酸の作用により、当該酸解離性基と該酸解離性基に隣接する原子との間の結合が開裂し得る酸解離性を有する基、又は、(ii)酸の作用により一部の結合が開裂した後、さらに脱炭酸反応が生じることにより、当該酸解離性基と該酸解離性基に隣接する原子との間の結合が開裂し得る基、の双方をいう。
 酸分解性基を構成する酸解離性基は、当該酸解離性基の解離により生成する極性基よりも極性の低い基であることが必要で、これにより、酸の作用により該酸解離性基が解離した際に、該酸解離性基よりも極性の高い極性基が生じて極性が増大する。その結果、(A1)成分全体の極性が増大する。極性が増大することにより、相対的に、現像液に対する溶解性が変化し、現像液がアルカリ現像液の場合には溶解性が増大し、現像液が有機系現像液の場合には溶解性が減少する。
The term "acid dissociable group" refers to both (i) a group having acid dissociability in which the bond between the acid dissociable group and an atom adjacent to the acid dissociable group can be cleaved by the action of an acid, and (ii) a group in which a part of the bond is cleaved by the action of an acid and then a decarboxylation reaction occurs, thereby cleaving the bond between the acid dissociable group and an atom adjacent to the acid dissociable group.
The acid dissociable group constituting the acid decomposable group must be a group with lower polarity than the polar group generated by dissociation of the acid dissociable group, and thus, when the acid dissociable group is dissociated by the action of acid, a polar group with higher polarity than the acid dissociable group is generated, and the polarity increases.As a result, the polarity of the entire (A1) component increases.By increasing the polarity, the solubility in the developer changes relatively, and when the developer is an alkaline developer, the solubility increases, and when the developer is an organic developer, the solubility decreases.
 「基材成分」とは、膜形成能を有する有機化合物である。基材成分として用いられる有機化合物は、非重合体と重合体とに大別される。非重合体としては、通常、分子量が500以上4000未満のものが用いられる(以下「低分子化合物」という)。以下「樹脂」、「高分子化合物」又は「ポリマー」という場合は、分子量が1000以上の重合体を示す。重合体の分子量としては、GPC(ゲルパーミエーションクロマトグラフィー)によるポリスチレン換算の重量平均分子量を用いるものとする。 The "base material component" is an organic compound that has film-forming ability. Organic compounds used as base material components are broadly divided into non-polymers and polymers. Non-polymers usually have a molecular weight of 500 or more and less than 4000 (hereinafter referred to as "low molecular weight compounds"). Hereinafter, "resin," "polymeric compound," or "polymer" refers to a polymer with a molecular weight of 1000 or more. The molecular weight of the polymer is determined by the weight average molecular weight calculated in terms of polystyrene by GPC (gel permeation chromatography).
 「誘導される構成単位」とは、炭素原子間の多重結合、例えば、エチレン性二重結合が開裂して構成される構成単位を意味する。
 「アクリル酸エステル」は、α位の炭素原子に結合した水素原子が置換基で置換されていてもよい。該α位の炭素原子に結合した水素原子を置換する置換基(Rαx)は、水素原子以外の原子又は基である。また、置換基(Rαx)がエステル結合を含む置換基で置換されたイタコン酸ジエステルや、置換基(Rαx)がヒドロキシアルキル基やその水酸基を修飾した基で置換されたαヒドロキシアクリルエステルも含むものとする。なお、アクリル酸エステルのα位の炭素原子とは、特に断りがない限り、アクリル酸のカルボニル基が結合している炭素原子のことである。
 以下、α位の炭素原子に結合した水素原子が置換基で置換されたアクリル酸エステルを、α置換アクリル酸エステルということがある。
The term "derived structural unit" refers to a structural unit formed by cleavage of a multiple bond between carbon atoms, for example, an ethylenic double bond.
In the "acrylic acid ester", the hydrogen atom bonded to the carbon atom at the α-position may be substituted with a substituent. The substituent (R αx ) substituting the hydrogen atom bonded to the carbon atom at the α-position is an atom or group other than a hydrogen atom. It also includes an itaconic acid diester in which the substituent (R αx ) is substituted with a substituent containing an ester bond, and an α-hydroxyacrylic ester in which the substituent (R αx ) is substituted with a hydroxyalkyl group or a group in which the hydroxyl group is modified. The carbon atom at the α-position of an acrylic acid ester refers to the carbon atom to which the carbonyl group of acrylic acid is bonded, unless otherwise specified.
Hereinafter, an acrylic ester in which the hydrogen atom bonded to the carbon atom at the α-position is substituted with a substituent will sometimes be referred to as an α-substituted acrylic ester.
 「誘導体」とは、対象化合物のα位の水素原子がアルキル基、ハロゲン化アルキル基等の他の置換基に置換されたもの、並びにそれらの誘導体を含む概念とする。それらの誘導体としては、α位の水素原子が置換基に置換されていてもよい対象化合物の水酸基の水素原子を有機基で置換したもの;α位の水素原子が置換基に置換されていてもよい対象化合物に、水酸基以外の置換基が結合したもの等が挙げられる。なお、α位とは、特に断りがない限り、官能基と隣接した1番目の炭素原子のことをいう。
 ヒドロキシスチレンのα位の水素原子を置換する置換基としては、Rαxと同様のものが挙げられる。
The term "derivative" refers to a concept that includes compounds in which the hydrogen atom at the α-position of the target compound is replaced with other substituents such as an alkyl group or a halogenated alkyl group, as well as derivatives thereof. Examples of such derivatives include compounds in which the hydrogen atom of the hydroxyl group of a target compound, which may have the hydrogen atom at the α-position replaced with a substituent, is replaced with an organic group; compounds in which the hydrogen atom at the α-position of the target compound, which may have the hydrogen atom at the α-position replaced with a substituent, is bonded to a substituent other than a hydroxyl group, and the like. The α-position refers to the first carbon atom adjacent to the functional group, unless otherwise specified.
Examples of the substituent that substitutes the hydrogen atom at the α-position of the hydroxystyrene include the same as those for R αx .
 本明細書及び本特許請求の範囲において、化学式で表される構造によっては、不斉炭素が存在し、エナンチオ異性体(enantiomer)やジアステレオ異性体(diastereomer)が存在し得るものがある。その場合は一つの化学式でそれら異性体を代表して表す。それらの異性体は単独で用いてもよいし、混合物として用いてもよい。 In this specification and claims, some structures represented by chemical formulas may have asymmetric carbons, and enantiomers or diastereoisomers may exist. In such cases, a single chemical formula is used to represent all of the isomers. These isomers may be used alone or as a mixture.
 (レジスト組成物)
 本実施形態のレジスト組成物は、露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化するものである。
 かかるレジスト組成物は、酸の作用により現像液に対する溶解性が変化する基材成分(A)(以下「(A)成分」ともいう)を含有する。(A1)成分は、後述する一般式(a0)で表される化合物から誘導される構成単位(a0)を有する。
 また、本実施形態のレジスト組成物は、(A)成分に加え、その他成分をさらに含有してもよい。その他成分としては、後述する(B)成分、(D)成分、(E)成分、(F)成分、(S)成分などが挙げられる。
(Resist Composition)
The resist composition of this embodiment generates an acid upon exposure, and the solubility of the resist composition in a developer changes due to the action of the acid.
The resist composition contains a base component (A) (hereinafter also referred to as "component (A)") whose solubility in a developer changes under the action of an acid. The component (A1) has a structural unit (a0) derived from a compound represented by general formula (a0) described below.
Furthermore, the resist composition of this embodiment may further contain other components in addition to the component (A). Examples of other components include the below-described component (B), component (D), component (E), component (F), and component (S).
 本実施形態のレジスト組成物においては、(A)成分が露光により酸を発生してもよいし、(A)成分とは別に配合された添加剤成分が露光により酸を発生してもよい。
 本実施形態のレジスト組成物は、具体的には、(1)露光により酸を発生する酸発生剤成分(B)(以下「(B)成分」という)をさらに含有するものであってもよく;(2)(A)成分が露光により酸を発生する成分であってもよく;(3)(A)成分が露光により酸を発生する成分であり、かつ、さらに(B)成分を含有するものであってもよい。
 すなわち、上記(2)及び(3)の場合、(A)成分は、「露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化する基材成分」となる。(A)成分が露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化する基材成分である場合、後述する(A1)成分が、露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化する樹脂であることが好ましい。このような樹脂としては、露光により酸を発生する構成単位を有する高分子化合物を用いることができる。露光により酸を発生する構成単位としては、公知のものを用いることができる。
In the resist composition of this embodiment, the component (A) may generate an acid upon exposure, or an additive component that is formulated separately from the component (A) may generate an acid upon exposure.
Specifically, the resist composition of this embodiment may be one that further contains (1) an acid generator component (B) that generates an acid upon exposure (hereinafter referred to as “component (B)”); (2) the component (A) may be a component that generates an acid upon exposure; or (3) the component (A) is a component that generates an acid upon exposure, and further contains component (B).
That is, in the above cases of (2) and (3), the component (A) is a "base component that generates an acid upon exposure and changes its solubility in a developer by the action of the acid". When the component (A) is a base component that generates an acid upon exposure and changes its solubility in a developer by the action of the acid, the component (A1) described below is preferably a resin that generates an acid upon exposure and changes its solubility in a developer by the action of the acid. As such a resin, a polymer compound having a structural unit that generates an acid upon exposure can be used. As the structural unit that generates an acid upon exposure, a known one can be used.
 本実施形態のレジスト組成物は、上記の中でも、上記(1)の場合であるものが好ましい。すなわち、本実施形態のレジスト組成物は、(A)成分と、(B)成分とを含有するものであることが好ましい。 The resist composition of this embodiment is preferably the above-mentioned case (1). In other words, the resist composition of this embodiment preferably contains component (A) and component (B).
 本実施形態のレジスト組成物を用いてレジスト膜を形成し、該レジスト膜に対して選択的露光を行うと、該レジスト膜の露光部では、例えば、(B)成分から酸が発生し、該酸の作用により(A)成分の現像液に対する溶解性が変化する一方で、該レジスト膜の未露光部では(A)成分の現像液に対する溶解性が変化しないため、露光部と未露光部との間で現像液に対する溶解性の差が生じる。そのため、該レジスト膜を現像すると、該レジスト組成物がポジ型の場合はレジスト膜露光部が溶解除去されてポジ型のレジストパターンが形成され、該レジスト組成物がネガ型の場合はレジスト膜未露光部が溶解除去されてネガ型のレジストパターンが形成される。 When a resist film is formed using the resist composition of this embodiment and selectively exposed to light, for example, an acid is generated from component (B) in the exposed parts of the resist film, and the solubility of component (A) in the developer changes due to the action of the acid, whereas the solubility of component (A) in the developer does not change in the unexposed parts of the resist film, resulting in a difference in solubility in the developer between the exposed and unexposed parts. Therefore, when the resist film is developed, if the resist composition is a positive type, the exposed parts of the resist film are dissolved and removed to form a positive type resist pattern, and if the resist composition is a negative type, the unexposed parts of the resist film are dissolved and removed to form a negative type resist pattern.
 本実施形態のレジスト組成物は、ポジ型レジスト組成物であってもよく、ネガ型レジスト組成物であってもよい。また、本実施形態のレジスト組成物は、レジストパターン形成時の現像処理にアルカリ現像液を用いるアルカリ現像プロセス用であってもよく、該現像処理に有機溶剤を含む現像液(有機系現像液)を用いる溶剤現像プロセス用であってもよい。 The resist composition of this embodiment may be a positive resist composition or a negative resist composition. The resist composition of this embodiment may be for an alkaline development process in which an alkaline developer is used in the development treatment during resist pattern formation, or may be for a solvent development process in which a developer containing an organic solvent (organic developer) is used in the development treatment.
 <(A)成分>
 本実施形態のレジスト組成物において、(A)成分は、酸の作用により現像液に対する溶解性が変化する樹脂成分(A1)(以下「(A1)成分」ともいう)を含む。
 (A1)成分を用いることにより、露光前後で基材成分の極性が変化するため、アルカリ現像プロセスだけでなく、溶剤現像プロセスにおいても、良好な現像コントラストを得ることができる。
 (A)成分としては、該(A1)成分とともに他の高分子化合物及び/又は低分子化合物を併用してもよい。
 (A)成分は、「露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化する基材成分」であってもよい。(A)成分が露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化する基材成分である場合、(A1)成分が、露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化する樹脂であることが好ましい。このような樹脂としては、露光により酸を発生する構成単位を有する高分子化合物を用いることができる。露光により酸を発生する構成単位としては、公知のものを用いることができる。
<Component (A)>
In the resist composition of this embodiment, the component (A) contains a resin component (A1) (hereinafter also referred to as “component (A1)”) whose solubility in a developer changes under the action of an acid.
By using the component (A1), the polarity of the base component changes between before and after exposure, making it possible to obtain good development contrast not only in an alkali development process but also in a solvent development process.
As the component (A), other polymeric compounds and/or low molecular weight compounds may be used in combination with the component (A1).
The component (A) may be a "base component that generates an acid upon exposure and changes its solubility in a developer by the action of the acid". When the component (A) is a base component that generates an acid upon exposure and changes its solubility in a developer by the action of the acid, the component (A1) is preferably a resin that generates an acid upon exposure and changes its solubility in a developer by the action of the acid. As such a resin, a polymer compound having a structural unit that generates an acid upon exposure can be used. As the structural unit that generates an acid upon exposure, a known one can be used.
 本実施形態のレジスト組成物において、(A)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。 In the resist composition of this embodiment, the component (A) may be used alone or in combination of two or more types.
 ・(A1)成分について
 (A1)成分は、酸の作用により現像液に対する溶解性が変化する樹脂成分である。
 (A1)成分は、下記一般式(a0-1)で表される化合物から誘導される構成単位(a0)を有する。
 (A1)成分は、構成単位(a0)に加え、必要に応じてその他構成単位を有するものでもよい。
Regarding the Component (A1) The component (A1) is a resin component whose solubility in a developer changes due to the action of an acid.
The component (A1) has a structural unit (a0) derived from a compound represented by general formula (a0-1) shown below.
The component (A1) may contain other structural units, in addition to the structural unit (a0), as necessary.
Figure JPOXMLDOC01-appb-C000007
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基であり;La01は、単結合又は-C(=O)-O-であり;Arは、芳香環であり;Ra01は、酸解離性基であり;m1は、原子価が許容する限り、1以上の整数であり;Ra02は、置換基を有してもよい芳香環を含む酸非解離性基であり;m2は、原子価が許容する限り、1以上の整数であり;Ra03は、COORa01及びRa02以外の置換基であり;m3は、原子価が許容する限り、0以上の整数である。]
Figure JPOXMLDOC01-appb-C000007
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms; La 01 is a single bond or -C(=O)-O-; Ar is an aromatic ring; Ra 01 is an acid dissociable group; m1 is an integer of 1 or more as long as the valence allows; Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent; m2 is an integer of 1 or more as long as the valence allows; Ra 03 is a substituent other than COORa 01 and Ra 02 ; and m3 is an integer of 0 or more as long as the valence allows.]
 前記式(a0-1)中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。
 Rとしては、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のフッ素化アルキル基が好ましく、工業上の入手の容易さから、水素原子、メチル基又はトリフルオロメチル基がより好ましく、水素原子又はメチル基がさらに好ましく、水素原子が特に好ましい。
In the above formula (a0-1), R represents a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom, a methyl group, or a trifluoromethyl group is more preferable, a hydrogen atom or a methyl group is still more preferable, and a hydrogen atom is particularly preferable.
 前記式(a0-1)中、L01は、単結合又は-C(=O)-O-であり、好ましくは単結合である。 In the above formula (a0-1), L 01 is a single bond or —C(═O)—O—, and is preferably a single bond.
 前記式(a0-1)中、Ra01は、酸解離性基である。
 酸解離性基としては、これまで、化学増幅型レジスト組成物用のベース樹脂の酸解離性基として提案されているものが挙げられる。
 化学増幅型レジスト組成物用のベース樹脂の酸解離性基として提案されているものとして具体的には、以下に説明する「アセタール型酸解離性基」、「第3級アルキルエステル型酸解離性基」、「第3級アルキルオキシカルボニル酸解離性基」、「第2級アルキルエステル型酸解離性基」等が挙げられる。
In the above formula (a0-1), Ra 01 represents an acid dissociable group.
Examples of the acid-dissociable group include those that have been proposed as acid-dissociable groups in base resins for chemically amplified resist compositions.
Specific examples of the acid dissociable group that have been proposed for the base resin of the chemically amplified resist composition include the "acetal type acid dissociable group,""tertiary alkyl ester type acid dissociable group,""tertiary alkyloxycarbonyl acid dissociable group," and "secondary alkyl ester type acid dissociable group," which are explained below.
 アセタール型酸解離性基:
 前記極性基のうちカルボキシ基または水酸基を保護する酸解離性基としては、例えば、下記一般式(a1-r-1)で表される酸解離性基(以下「アセタール型酸解離性基」ということがある。)が挙げられる。
Acetal-type acid-dissociable group:
Among the polar groups, examples of the acid dissociable group protecting a carboxy group or a hydroxyl group include an acid dissociable group represented by the following general formula (a1-r-1) (hereinafter sometimes referred to as an “acetal-type acid dissociable group”).
Figure JPOXMLDOC01-appb-C000008
[式中、Ra’、Ra’は水素原子またはアルキル基である。Ra’は炭化水素基であって、Ra’は、Ra’、Ra’のいずれかと結合して環を形成してもよい。]
Figure JPOXMLDOC01-appb-C000008
[In the formula, Ra' 1 and Ra' 2 are a hydrogen atom or an alkyl group. Ra' 3 is a hydrocarbon group, and Ra' 3 may be bonded to either Ra' 1 or Ra' 2 to form a ring.]
 式(a1-r-1)中、Ra’及びRa’のうち、少なくとも一方が水素原子であることが好ましく、両方が水素原子であることがより好ましい。
 Ra’又はRa’がアルキル基である場合、該アルキル基としては、上記α置換アクリル酸エステルについての説明で、α位の炭素原子に結合してもよい置換基として挙げたアルキル基と同様のものが挙げられ、炭素原子数1~5のアルキル基が好ましい。具体的には、直鎖状または分岐鎖状のアルキル基が好ましく挙げられる。より具体的には、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基などが挙げられ、メチル基またはエチル基がより好ましく、メチル基が特に好ましい。
In formula (a1-r-1), at least one of Ra'1 and Ra'2 is preferably a hydrogen atom, and more preferably both are hydrogen atoms.
When Ra'1 or Ra'2 is an alkyl group, examples of the alkyl group include the same alkyl groups as those exemplified as the substituent that may be bonded to the carbon atom at the α-position in the description of the above α-substituted acrylic acid ester, and an alkyl group having 1 to 5 carbon atoms is preferred. Specifically, preferred examples are linear or branched alkyl groups. More specific examples include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, and a neopentyl group, and the like. A methyl group or an ethyl group is more preferred, and a methyl group is particularly preferred.
 式(a1-r-1)中、Ra’の炭化水素基としては、直鎖状もしくは分岐鎖状のアルキル基、又は環状の炭化水素基が挙げられる。
 該直鎖状のアルキル基は、炭素原子数が1~5であることが好ましく、炭素原子数が1~4がより好ましく、炭素原子数1または2がさらに好ましい。具体的には、メチル基、エチル基、n-プロピル基、n-ブチル基、n-ペンチル基等が挙げられる。これらの中でも、メチル基、エチル基またはn-ブチル基が好ましく、メチル基またはエチル基がより好ましい。
In formula (a1-r-1), the hydrocarbon group for Ra'3 includes a linear or branched alkyl group, or a cyclic hydrocarbon group.
The linear alkyl group preferably has 1 to 5 carbon atoms, more preferably 1 to 4 carbon atoms, and even more preferably 1 or 2 carbon atoms. Specific examples include a methyl group, an ethyl group, an n-propyl group, an n-butyl group, and an n-pentyl group. Of these, a methyl group, an ethyl group, or an n-butyl group is preferred, and a methyl group or an ethyl group is more preferred.
 該分岐鎖状のアルキル基は、炭素原子数が3~10であることが好ましく、炭素原子数3~5がより好ましい。具体的には、イソプロピル基、イソブチル基、tert-ブチル基、イソペンチル基、ネオペンチル基、1,1-ジエチルプロピル基、2,2-ジメチルブチル基等が挙げられ、イソプロピル基であることが好ましい。 The branched alkyl group preferably has 3 to 10 carbon atoms, and more preferably has 3 to 5 carbon atoms. Specific examples include isopropyl, isobutyl, tert-butyl, isopentyl, neopentyl, 1,1-diethylpropyl, and 2,2-dimethylbutyl groups, with isopropyl being preferred.
 Ra’が環状の炭化水素基となる場合、該炭化水素基は、脂環式炭化水素基でも芳香族炭化水素基でもよく、また、多環式基でも単環式基でもよい。
 単環式基である脂環式炭化水素基としては、モノシクロアルカンから1個の水素原子を除いた基が好ましい。該モノシクロアルカンとしては、炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。
 多環式基である脂環式炭化水素基としては、ポリシクロアルカンから1個の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては、炭素原子数7~12のものが好ましく、具体的にはアダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等が挙げられる。
When Ra'3 is a cyclic hydrocarbon group, the hydrocarbon group may be an alicyclic hydrocarbon group or an aromatic hydrocarbon group, and may be a polycyclic group or a monocyclic group.
The monocyclic alicyclic hydrocarbon group is preferably a group in which one hydrogen atom has been removed from a monocycloalkane. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane.
The alicyclic hydrocarbon group that is a polycyclic group is preferably a group in which one hydrogen atom has been removed from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms, and specific examples thereof include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
 Ra’の環状の炭化水素基が芳香族炭化水素基となる場合、該芳香族炭化水素基は、芳香環を少なくとも1つ有する炭化水素基である。
 この芳香環は、4n+2個のπ電子をもつ環状共役系であれば特に限定されず、単環式でも多環式でもよい。芳香環の炭素原子数は5~30であることが好ましく、炭素原子数5~20がより好ましく、炭素原子数6~15がさらに好ましく、炭素原子数6~12が特に好ましい。
 芳香環として具体的には、ベンゼン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環;前記芳香族炭化水素環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環等が挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。芳香族複素環として具体的には、ピリジン環、チオフェン環等が挙げられる。
 Ra’における芳香族炭化水素基として具体的には、前記芳香族炭化水素環または芳香族複素環から水素原子を1つ除いた基(アリール基またはヘテロアリール基);2以上の芳香環を含む芳香族化合物(例えばビフェニル、フルオレン等)から水素原子を1つ除いた基;前記芳香族炭化水素環または芳香族複素環の水素原子の1つがアルキレン基で置換された基(例えば、ベンジル基、フェネチル基、1-ナフチルメチル基、2-ナフチルメチル基、1-ナフチルエチル基、2-ナフチルエチル基等のアリールアルキル基など)等が挙げられる。前記芳香族炭化水素環または芳香族複素環に結合するアルキレン基の炭素原子数は、1~4であることが好ましく、炭素原子数1~2であることがより好ましく、炭素原子数1であることが特に好ましい。
When the cyclic hydrocarbon group of Ra'3 is an aromatic hydrocarbon group, the aromatic hydrocarbon group is a hydrocarbon group having at least one aromatic ring.
The aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and may be monocyclic or polycyclic. The aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, further preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms.
Specific examples of the aromatic ring include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; and aromatic heterocycles in which a part of the carbon atoms constituting the aromatic hydrocarbon ring is replaced with a heteroatom. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom. Specific examples of the aromatic heterocycle include a pyridine ring and a thiophene ring.
Specific examples of the aromatic hydrocarbon group in Ra'3 include a group in which one hydrogen atom has been removed from the aromatic hydrocarbon ring or aromatic heterocycle (aryl group or heteroaryl group); a group in which one hydrogen atom has been removed from an aromatic compound containing two or more aromatic rings (e.g., biphenyl, fluorene, etc.); and a group in which one hydrogen atom of the aromatic hydrocarbon ring or aromatic heterocycle has been substituted with an alkylene group (e.g., arylalkyl groups such as benzyl group, phenethyl group, 1-naphthylmethyl group, 2-naphthylmethyl group, 1-naphthylethyl group, 2-naphthylethyl group, etc.). The alkylene group bonded to the aromatic hydrocarbon ring or aromatic heterocycle preferably has 1 to 4 carbon atoms, more preferably has 1 to 2 carbon atoms, and particularly preferably has 1 carbon atom.
 Ra’における環状の炭化水素基は、置換基を有してもよい。この置換基としては、例えば、-RP1、-RP2-O-RP1、-RP2-CO-RP1、-RP2-CO-ORP1、-RP2-O-CO-RP1、-RP2-OH、-RP2-CN又は-RP2-COOH(以下これらの置換基をまとめて「Rax5」ともいう。)等が挙げられる。
 ここで、RP1は、炭素原子数1~10の1価の鎖状飽和炭化水素基、炭素原子数3~20の1価の脂肪族環状飽和炭化水素基又は炭素原子数6~30の1価の芳香族炭化水素基である。また、RP2は、単結合、炭素原子数1~10の2価の鎖状飽和炭化水素基、炭素原子数3~20の2価の脂肪族環状飽和炭化水素基又は炭素原子数6~30の2価の芳香族炭化水素基である。但し、RP1及びRP2の鎖状飽和炭化水素基、脂肪族環状飽和炭化水素基及び芳香族炭化水素基の有する水素原子の一部又は全部はフッ素原子で置換されていてもよい。上記脂肪族環状炭化水素基は、上記置換基を1種単独で1つ以上有していてもよいし、上記置換基のうち複数種を各1つ以上有していてもよい。
 炭素原子数1~10の1価の鎖状飽和炭化水素基としては、例えば、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、ヘプチル基、オクチル基、デシル基等が挙げられる。
 炭素原子数3~20の1価の脂肪族環状飽和炭化水素基としては、例えば、シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロヘプチル基、シクロオクチル基、シクロデシル基、シクロドデシル基等の単環式脂肪族飽和炭化水素基;ビシクロ[2.2.2]オクタニル基、トリシクロ[5.2.1.02,6]デカニル基、トリシクロ[3.3.1.13,7]デカニル基、テトラシクロ[6.2.1.13,6.02,7]ドデカニル基、アダマンチル基等の多環式脂肪族飽和炭化水素基が挙げられる。
 炭素原子数6~30の1価の芳香族炭化水素基としては、例えば、ベンゼン、ビフェニル、フルオレン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環から水素原子1個を除いた基が挙げられる。
The cyclic hydrocarbon group for Ra'3 may have a substituent. Examples of the substituent include -R P1 , -R P2 -O-R P1 , -R P2 -CO-R P1 , -R P2 -CO-OR P1 , -R P2 -O-CO- R P1 , -R P2 -OH, -R P2 -CN or -R P2 -COOH (hereinafter these substituents are collectively referred to as "Ra x5 ").
Here, R P1 is a monovalent linear saturated hydrocarbon group having 1 to 10 carbon atoms, a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms, or a monovalent aromatic hydrocarbon group having 6 to 30 carbon atoms. R P2 is a single bond, a divalent linear saturated hydrocarbon group having 1 to 10 carbon atoms, a divalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms, or a divalent aromatic hydrocarbon group having 6 to 30 carbon atoms. However, some or all of the hydrogen atoms of the linear saturated hydrocarbon group, the aliphatic cyclic saturated hydrocarbon group, and the aromatic hydrocarbon group of R P1 and R P2 may be substituted with fluorine atoms. The aliphatic cyclic hydrocarbon group may have one or more of the above-mentioned substituents alone, or may have one or more of each of the above-mentioned substituents.
Examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, and a decyl group.
Examples of the monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms include monocyclic aliphatic saturated hydrocarbon groups such as a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, a cyclodecyl group, and a cyclododecyl group; and polycyclic aliphatic saturated hydrocarbon groups such as a bicyclo[2.2.2]octanyl group, a tricyclo[5.2.1.02,6]decanyl group, a tricyclo[3.3.1.13,7]decanyl group, a tetracyclo[6.2.1.13,6.02,7]dodecanyl group, and an adamantyl group.
Examples of the monovalent aromatic hydrocarbon group having 6 to 30 carbon atoms include groups in which one hydrogen atom has been removed from an aromatic hydrocarbon ring such as benzene, biphenyl, fluorene, naphthalene, anthracene, and phenanthrene.
 Ra’が、Ra’、Ra’のいずれかと結合して環を形成する場合、該環式基としては、4~7員環が好ましく、4~6員環がより好ましい。該環式基の具体例としては、テトラヒドロピラニル基、テトラヒドロフラニル基等が挙げられる。 When Ra'3 is bonded to either Ra'1 or Ra'2 to form a ring, the cyclic group is preferably a 4- to 7-membered ring, more preferably a 4- to 6-membered ring. Specific examples of the cyclic group include a tetrahydropyranyl group and a tetrahydrofuranyl group.
 第3級アルキルエステル型酸解離性基:
 上記極性基のうち、カルボキシ基を保護する酸解離性基としては、例えば、下記一般式(a1-r-2)で表される酸解離性基が挙げられる。
 なお、下記式(a1-r-2)で表される酸解離性基のうち、アルキル基により構成されるものを、以下、便宜上「第3級アルキルエステル型酸解離性基」ということがある。
Tertiary alkyl ester type acid-dissociable group:
Among the above polar groups, examples of the acid-dissociable group that protects the carboxy group include acid-dissociable groups represented by the following general formula (a1-r-2).
Among the acid-dissociable groups represented by the following formula (a1-r-2), those constituted by an alkyl group may be referred to as "tertiary alkyl ester-type acid-dissociable groups" hereinafter for the sake of convenience.
Figure JPOXMLDOC01-appb-C000009
[式中、Ra’~Ra’はそれぞれ炭化水素基であって、Ra’、Ra’は互いに結合して環を形成してもよい。]
Figure JPOXMLDOC01-appb-C000009
[In the formula, Ra' 4 to Ra' 6 are each a hydrocarbon group, and Ra' 5 and Ra' 6 may be bonded to each other to form a ring.]
 Ra’の炭化水素基としては、直鎖状もしくは分岐鎖状のアルキル基、鎖状もしくは環状のアルケニル基、鎖状のアルキニル基、又は、環状の炭化水素基が挙げられる。
 Ra’における直鎖状もしくは分岐鎖状のアルキル基、環状の炭化水素基(単環式基である脂環式炭化水素基、多環式基である脂環式炭化水素基、芳香族炭化水素基)は、前記Ra’と同様のものが挙げられる。
 Ra’における鎖状もしくは環状のアルケニル基は、炭素原子数2~10のアルケニル基が好ましい。
 Ra’、Ra’の炭化水素基としては、前記Ra’と同様のものが挙げられる。
Examples of the hydrocarbon group for Ra'4 include a linear or branched alkyl group, a linear or cyclic alkenyl group, a linear alkynyl group, or a cyclic hydrocarbon group.
Examples of the linear or branched alkyl group and cyclic hydrocarbon group (monocyclic alicyclic hydrocarbon group, polycyclic alicyclic hydrocarbon group, and aromatic hydrocarbon group) in Ra'4 are the same as those for Ra'3 .
The chain or cyclic alkenyl group for Ra'4 is preferably an alkenyl group having 2 to 10 carbon atoms.
Examples of the hydrocarbon group for Ra' 5 and Ra' 6 include the same as those for Ra' 3 above.
 Ra’とRa’とが互いに結合して環を形成する場合、下記一般式(a1-r2-1)で表される基、下記一般式(a1-r2-2)で表される基、下記一般式(a1-r2-3)で表される基が好適に挙げられる。
 一方、Ra’~Ra’が互いに結合せず、独立した炭化水素基である場合、下記一般式(a1-r2-4)で表される基が好適に挙げられる。
When Ra'5 and Ra'6 are bonded to each other to form a ring, suitable examples of such a ring include a group represented by the following general formula (a1-r2-1), a group represented by the following general formula (a1-r2-2), and a group represented by the following general formula (a1-r2-3).
On the other hand, when Ra' 4 to Ra' 6 are not bonded to one another and are independent hydrocarbon groups, suitable examples include groups represented by the following general formula (a1-r2-4).
Figure JPOXMLDOC01-appb-C000010
[式(a1-r2-1)中、Ra’10は、一部がハロゲン原子又はヘテロ原子含有基で置換されていてもよい直鎖状又は分岐鎖状の炭素原子数1~12のアルキル基を示す。Ra’11はRa’10が結合した炭素原子と共に置換基を有してもよい脂肪族環式基を形成する基を示す。式(a1-r2-2)中、Yaは炭素原子である。Xaは、Yaと共に環状の炭化水素基を形成する基である。この環状の炭化水素基が有する水素原子の一部又は全部は置換されていてもよい。Ra101~Ra103は、それぞれ独立して、水素原子、炭素原子数1~10の1価の鎖状飽和炭化水素基又は炭素原子数3~20の1価の脂肪族環状飽和炭化水素基である。この鎖状飽和炭化水素基及び脂肪族環状飽和炭化水素基が有する水素原子の一部又は全部は置換されていてもよい。Ra101~Ra103の2つ以上が互いに結合して環状構造を形成していてもよい。式(a1-r2-3)中、Yaaは炭素原子である。Xaaは、Yaaと共に置換基を有してもよい脂肪族環式基を形成する基である。Ra104は、置換基を有してもよい芳香族炭化水素基である。式(a1-r2-4)中、Ra’12及びRa’13は、それぞれ独立に、炭素原子数1~10の1価の鎖状飽和炭化水素基である。この鎖状飽和炭化水素基が有する水素原子の一部又は全部は置換されていてもよい。Ra’14は、置換基を有してもよい炭化水素基である。*は結合手を示す(以下、同様)。]
Figure JPOXMLDOC01-appb-C000010
[In formula (a1-r2-1), Ra' 10 represents a linear or branched alkyl group having 1 to 12 carbon atoms, some of which may be substituted with a halogen atom or a heteroatom-containing group. Ra' 11 represents a group which forms an aliphatic cyclic group which may have a substituent together with the carbon atom to which Ra' 10 is bonded. In formula (a1-r2-2), Ya represents a carbon atom. Xa represents a group which forms a cyclic hydrocarbon group together with Ya. Some or all of the hydrogen atoms in this cyclic hydrocarbon group may be substituted. Ra 101 to Ra 103 are each independently a hydrogen atom, a monovalent linear saturated hydrocarbon group having 1 to 10 carbon atoms, or a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms. Some or all of the hydrogen atoms in this linear saturated hydrocarbon group and aliphatic cyclic saturated hydrocarbon group may be substituted. Two or more of Ra 101 to Ra 103 may be bonded to each other to form a cyclic structure. In formula (a1-r2-3), Yaa is a carbon atom. Xaa is a group which, together with Yaa, forms an aliphatic cyclic group which may have a substituent. Ra 104 is an aromatic hydrocarbon group which may have a substituent. In formula (a1-r2-4), Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms. Some or all of the hydrogen atoms in this chain saturated hydrocarbon group may be substituted. Ra' 14 is a hydrocarbon group which may have a substituent. * indicates a bond (the same applies below).]
 上記の式(a1-r2-1)中、Ra’10は、一部がハロゲン原子もしくはヘテロ原子含有基で置換されていてもよい直鎖状もしくは分岐鎖状の炭素原子数1~12のアルキル基である。 In the above formula (a1-r2-1), Ra' 10 is a straight-chain or branched-chain alkyl group having 1 to 12 carbon atoms which may be partially substituted with a halogen atom or a heteroatom-containing group.
 Ra’10における、直鎖状のアルキル基としては、炭素原子数1~12であり、炭素原子数1~10が好ましく、炭素原子数1~5が特に好ましい。
 Ra’10における、分岐鎖状のアルキル基としては、前記Ra’と同様のものが挙げられる。
The linear alkyl group for Ra' 10 has 1 to 12 carbon atoms, preferably 1 to 10 carbon atoms, and particularly preferably 1 to 5 carbon atoms.
Examples of the branched alkyl group in Ra'10 include the same as those in Ra'3 .
 Ra’10におけるアルキル基は、一部がハロゲン原子もしくはヘテロ原子含有基で置換されていてもよい。例えば、アルキル基を構成する水素原子の一部が、ハロゲン原子又はヘテロ原子含有基で置換されていてもよい。また、アルキル基を構成する炭素原子(メチレン基など)の一部が、ヘテロ原子含有基で置換されていてもよい。
 ここでいうヘテロ原子としては、酸素原子、硫黄原子、窒素原子が挙げられる。ヘテロ原子含有基としては、(-O-)、-C(=O)-O-、-O-C(=O)-、-C(=O)-、-O-C(=O)-O-、-C(=O)-NH-、-NH-、-S-、-S(=O)-、-S(=O)-O-等が挙げられる。
The alkyl group in Ra' 10 may be partially substituted with a halogen atom or a heteroatom-containing group. For example, some of the hydrogen atoms constituting the alkyl group may be substituted with a halogen atom or a heteroatom-containing group. In addition, some of the carbon atoms (e.g., methylene groups) constituting the alkyl group may be substituted with a heteroatom-containing group.
Examples of the heteroatom include an oxygen atom, a sulfur atom, and a nitrogen atom. Examples of the heteroatom-containing group include (-O-), -C(=O)-O-, -O-C(=O)-, -C(=O)-, -O-C(=O)-O-, -C(=O)-NH-, -NH-, -S-, -S(=O) 2 -, and -S(=O) 2 -O-.
 式(a1-r2-1)中、Ra’11(Ra’10が結合した炭素原子と共に形成する脂肪族環式基)は、式(a1-r-1)におけるRa’の単環式基又は多環式基である脂環式炭化水素基(脂環式炭化水素基)として挙げた基が好ましい。その中でも、単環式の脂環式炭化水素基が好ましく、具体的には、シクロペンチル基、シクロヘキシル基がより好ましい。 In formula (a1-r2-1), Ra' 11 (the alicyclic group formed together with the carbon atom to which Ra' 10 is bonded) is preferably the group exemplified as the monocyclic or polycyclic alicyclic hydrocarbon group (alicyclic hydrocarbon group) for Ra' 3 in formula (a1-r-1). Among these, a monocyclic alicyclic hydrocarbon group is preferred, and specifically, a cyclopentyl group or a cyclohexyl group is more preferred.
 Ra’11はRa’10が結合した炭素原子と共に形成する脂肪族環式基は、置換基を有してもよい。該置換基としては、例えば、炭素数1~5のアルキル基、ヒドロキシル基、カルボニル基、カルボキシル基、ハロゲン原子、炭素数1~5のハロゲン化アルキル基、炭素数1~5のアルコキシ基、炭素数1~5のアルキルオキシカルボニル基等が挙げられる。
 また、XaaがYaaと共に形成する脂肪族環式基の環構造を構成する炭素原子の一部が、電子吸引性基である置換基で置換された環式基であってもよい。
 電子吸引性基である置換基としては、例えば-O-、-C(=O)-O-、>C(=O)、-S-、-S(=O)-、-S(=O)-O-が挙げられ、-O-、>C(=O)、-S(=O)-が好ましい。
The aliphatic cyclic group formed by Ra'11 together with the carbon atom to which Ra'10 is bonded may have a substituent. Examples of the substituent include an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carbonyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, and an alkyloxycarbonyl group having 1 to 5 carbon atoms.
In addition, the aliphatic cyclic group formed by Xaa together with Yaa may be a cyclic group in which some of the carbon atoms constituting the ring structure are substituted with a substituent that is an electron-withdrawing group.
Examples of the substituent which is an electron-withdrawing group include -O-, -C(=O)-O-, >C(=O), -S-, -S(=O) 2 - and -S(=O) 2 -O-, with -O-, >C(=O) and -S(=O) 2 - being preferred.
 式(a1-r2-2)中、XaがYaと共に形成する環状の炭化水素基としては、前記式(a1-r-1)中のRa’における環状の1価の炭化水素基(脂環式炭化水素基)から水素原子1個以上をさらに除いた基が挙げられる。
 XaがYaと共に形成する環状の炭化水素基は、置換基を有してもよい。この置換基としては、上記Ra’における環状の炭化水素基が有していてもよい置換基と同様のものが挙げられる。
 式(a1-r2-2)中、Ra101~Ra103における、炭素原子数1~10の1価の鎖状飽和炭化水素基としては、例えば、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、ヘプチル基、オクチル基、デシル基等が挙げられる。
 Ra101~Ra103における、炭素原子数3~20の1価の脂肪族環状飽和炭化水素基としては、例えば、シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロヘプチル基、シクロオクチル基、シクロデシル基、シクロドデシル基等の単環式脂肪族飽和炭化水素基;ビシクロ[2.2.2]オクタニル基、トリシクロ[5.2.1.02,6]デカニル基、トリシクロ[3.3.1.13,7]デカニル基、テトラシクロ[6.2.1.13,6.02,7]ドデカニル基、アダマンチル基等の多環式脂肪族飽和炭化水素基等が挙げられる。
 Ra101~Ra103は、中でも、合成容易性の観点から、水素原子、炭素原子数1~10の1価の鎖状飽和炭化水素基が好ましく、その中でも、水素原子、メチル基、エチル基がより好ましく、水素原子が特に好ましい。
In formula (a1-r2-2), examples of the cyclic hydrocarbon group formed by Xa together with Ya include groups in which one or more hydrogen atoms have been further removed from the cyclic monovalent hydrocarbon group (alicyclic hydrocarbon group) in Ra'3 in formula (a1-r-1).
The cyclic hydrocarbon group formed by Xa together with Ya may have a substituent. Examples of the substituent include the same substituents as those which the cyclic hydrocarbon group in Ra'3 may have.
In formula (a1-r2-2), examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms for Ra 101 to Ra 103 include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, and a decyl group.
Examples of the monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbon atoms in Ra 101 to Ra 103 include monocyclic aliphatic saturated hydrocarbon groups such as a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, a cyclodecyl group, and a cyclododecyl group; and polycyclic aliphatic saturated hydrocarbon groups such as a bicyclo[2.2.2]octanyl group, a tricyclo[5.2.1.02,6]decanyl group, a tricyclo[3.3.1.13,7]decanyl group, a tetracyclo[6.2.1.13,6.02,7]dodecanyl group, and an adamantyl group.
From the viewpoint of ease of synthesis, Ra 101 to Ra 103 are preferably a hydrogen atom or a monovalent linear saturated hydrocarbon group having 1 to 10 carbon atoms, more preferably a hydrogen atom, a methyl group, or an ethyl group, and particularly preferably a hydrogen atom.
 上記Ra101~Ra103で表される鎖状飽和炭化水素基、又は脂肪族環状飽和炭化水素基が有する置換基としては、例えば、上述のRax5と同様の基が挙げられる。 Examples of the substituent that the chain saturated hydrocarbon group or the alicyclic saturated hydrocarbon group represented by the above Ra 101 to Ra 103 may have include the same groups as those for the above Ra x5 .
 Ra101~Ra103の2つ以上が互いに結合して環状構造を形成することにより生じる炭素-炭素二重結合を含む基としては、例えば、シクロペンテニル基、シクロヘキセニル基、メチルシクロペンテニル基、メチルシクロヘキセニル基、シクロペンチリデンエテニル基、シクロへキシリデンエテニル基等が挙げられる。これらの中でも、合成容易性の観点から、シクロペンテニル基、シクロヘキセニル基、シクロペンチリデンエテニル基が好ましい。 Examples of groups containing a carbon-carbon double bond formed by two or more of Ra 101 to Ra 103 bonding to each other to form a cyclic structure include a cyclopentenyl group, a cyclohexenyl group, a methylcyclopentenyl group, a methylcyclohexenyl group, a cyclopentylidene-ethenyl group, a cyclohexylidene-ethenyl group, etc. Among these, from the viewpoint of ease of synthesis, a cyclopentenyl group, a cyclohexenyl group, and a cyclopentylidene-ethenyl group are preferred.
 式(a1-r2-3)中、XaaがYaaと共に形成する脂肪族環式基は、式(a1-r-1)におけるRa’の単環式基又は多環式基である脂環式炭化水素基として挙げた基が好ましい。
 XaaがYaaと共に形成する脂肪族環式基は、置換基を有してもよい。該置換基としては、例えば、炭素数1~5のアルキル基、ヒドロキシル基、カルボニル基、カルボキシル基、ハロゲン原子、炭素数1~5のハロゲン化アルキル基、炭素数1~5のアルコキシ基、炭素数1~5のアルキルオキシカルボニル基等が挙げられる。
 また、XaaがYaaと共に形成する脂肪族環式基の環構造を構成する炭素原子の一部が、電子吸引性基である置換基で置換された環式基であってもよい。
 電子吸引性基である置換基としては、例えば-O-、-C(=O)-O-、>C(=O)、-S-、-S(=O)-、-S(=O)-O-が挙げられ、-O-、>C(=O)、-S(=O)-が好ましい。
In formula (a1-r2-3), the aliphatic cyclic group formed by Xaa together with Yaa is preferably the same as the groups exemplified as the monocyclic or polycyclic alicyclic hydrocarbon group for Ra'3 in formula (a1-r-1).
The aliphatic cyclic group formed by Xaa together with Yaa may have a substituent, for example, an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carbonyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkyloxycarbonyl group having 1 to 5 carbon atoms, etc.
In addition, the aliphatic cyclic group formed by Xaa together with Yaa may be a cyclic group in which some of the carbon atoms constituting the ring structure are substituted with a substituent that is an electron-withdrawing group.
Examples of the substituent which is an electron-withdrawing group include -O-, -C(=O)-O-, >C(=O), -S-, -S(=O) 2 - and -S(=O) 2 -O-, with -O-, >C(=O) and -S(=O) 2 - being preferred.
 式(a1-r2-3)中、Ra104における芳香族炭化水素基としては、炭素原子数5~30の芳香族炭化水素環又は炭素原子数5~15の複素環から水素原子1個以上を除いた基が挙げられる。中でも、Ra104は、炭素原子数6~15の芳香族炭化水素環から水素原子1個以上を除いた基が好ましく、ベンゼン、ナフタレン、アントラセン、フェナントレン、ピリジン又はチオフェンから水素原子1個以上を除いた基がより好ましく、ベンゼン、ナフタレン、アントラセン、ピリジン又はチオフェンから水素原子1個以上を除いた基がさらに好ましく、ベンゼン、ナフタレン又はチオフェンから水素原子1個以上を除いた基が特に好ましく、ベンゼン又はチオフェンから水素原子1個以上を除いた基が最も好ましい。 In formula (a1-r2-3), examples of the aromatic hydrocarbon group for Ra 104 include groups in which one or more hydrogen atoms have been removed from an aromatic hydrocarbon ring having 5 to 30 carbon atoms or a heterocycle having 5 to 15 carbon atoms. Among these, Ra 104 is preferably a group in which one or more hydrogen atoms have been removed from an aromatic hydrocarbon ring having 6 to 15 carbon atoms, more preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene, anthracene, phenanthrene, pyridine or thiophene, even more preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene, anthracene, pyridine or thiophene, particularly preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene or thiophene, and most preferably a group in which one or more hydrogen atoms have been removed from benzene or thiophene.
 式(a1-r2-3)中のRa104が有していてもよい置換基としては、例えば、メチル基、エチル基、プロピル基、ヒドロキシル基、カルボキシル基、ハロゲン原子、アルコキシ基(メトキシ基、エトキシ基、プロポキシ基、ブトキシ基等)、アルキルオキシカルボニル基等が挙げられる。 Examples of the substituent that Ra 104 in formula (a1-r2-3) may have include a methyl group, an ethyl group, a propyl group, a hydroxyl group, a carboxyl group, a halogen atom, an alkoxy group (such as a methoxy group, an ethoxy group, a propoxy group, or a butoxy group), an alkyloxycarbonyl group, and the like.
 式(a1-r2-4)中、Ra’12及びRa’13は、それぞれ独立に、炭素原子数1~10の1価の鎖状飽和炭化水素基である。Ra’12及びRa’13における、炭素原子数1~10の1価の鎖状飽和炭化水素基としては、上記のRa101~Ra103における、炭素原子数1~10の1価の鎖状飽和炭化水素基と同様のものが挙げられる。この鎖状飽和炭化水素基が有する水素原子の一部又は全部は置換されていてもよい。
 Ra’12及びRa’13は、中でも、炭素原子数1~5のアルキル基が好ましく、炭素原子数1~5のアルキル基がより好ましく、メチル基、エチル基がさらに好ましく、メチル基が特に好ましい。
 上記Ra’12及びRa’13で表される鎖状飽和炭化水素基が置換されている場合、その置換基としては、例えば、上述のRax5と同様の基が挙げられる。
In formula (a1-r2-4), Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms. Examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms in Ra' 12 and Ra' 13 include the same monovalent chain saturated hydrocarbon groups having 1 to 10 carbon atoms in the above Ra 101 to Ra 103. Some or all of the hydrogen atoms in this chain saturated hydrocarbon group may be substituted.
Among them, Ra' 12 and Ra' 13 are preferably an alkyl group having 1 to 5 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, further preferably a methyl group or an ethyl group, and particularly preferably a methyl group.
When the chain saturated hydrocarbon groups represented by the above Ra'- 12 and Ra'- 13 are substituted, examples of the substituent include the same groups as those for the above Ra -x5 .
 式(a1-r2-4)中、Ra’14は、置換基を有してもよい炭化水素基である。Ra’14における炭化水素基としては、直鎖状もしくは分岐鎖状のアルキル基、又は環状の炭化水素基が挙げられる。 In formula (a1-r2-4), Ra' 14 is a hydrocarbon group which may have a substituent. Examples of the hydrocarbon group in Ra' 14 include a linear or branched alkyl group, and a cyclic hydrocarbon group.
 Ra’14における直鎖状のアルキル基は、炭素原子数が1~5であることが好ましく、1~4がより好ましく、1又は2がさらに好ましい。具体的には、メチル基、エチル基、n-プロピル基、n-ブチル基、n-ペンチル基等が挙げられる。これらの中でも、メチル基、エチル基又はn-ブチル基が好ましく、メチル基又はエチル基がより好ましい。 The linear alkyl group for Ra' 14 preferably has 1 to 5 carbon atoms, more preferably 1 to 4 carbon atoms, and even more preferably 1 or 2. Specific examples include a methyl group, an ethyl group, an n-propyl group, an n-butyl group, and an n-pentyl group. Of these, a methyl group, an ethyl group, or an n-butyl group is preferable, and a methyl group or an ethyl group is more preferable.
 Ra’14における分岐鎖状のアルキル基は、炭素原子数が3~10であることが好ましく、3~5がより好ましい。具体的には、イソプロピル基、イソブチル基、tert-ブチル基、イソペンチル基、ネオペンチル基、1,1-ジエチルプロピル基、2,2-ジメチルブチル基等が挙げられ、イソプロピル基であることが好ましい。 The branched alkyl group for Ra' 14 preferably has 3 to 10 carbon atoms, and more preferably has 3 to 5 carbon atoms. Specific examples include an isopropyl group, an isobutyl group, a tert-butyl group, an isopentyl group, a neopentyl group, a 1,1-diethylpropyl group, and a 2,2-dimethylbutyl group, and is preferably an isopropyl group.
 Ra’14が環状の炭化水素基となる場合、該炭化水素基は、脂環式炭化水素基でも芳香族炭化水素基でもよく、また、多環式基でも単環式基でもよい。
単環式基である脂環式炭化水素基としては、モノシクロアルカンから1個の水素原子を除いた基が好ましい。該モノシクロアルカンとしては、炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。
多環式基である脂環式炭化水素基としては、ポリシクロアルカンから1個の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては、炭素原子数7~12のものが好ましく、具体的にはアダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等が挙げられる。
When Ra' 14 is a cyclic hydrocarbon group, the hydrocarbon group may be an alicyclic hydrocarbon group or an aromatic hydrocarbon group, and may be a polycyclic group or a monocyclic group.
The monocyclic alicyclic hydrocarbon group is preferably a group in which one hydrogen atom has been removed from a monocycloalkane. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane.
The alicyclic hydrocarbon group that is a polycyclic group is preferably a group in which one hydrogen atom has been removed from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms, and specific examples thereof include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
 Ra’14における芳香族炭化水素基としては、Ra104における芳香族炭化水素基と同様のものが挙げられる。中でも、Ra’14は、炭素原子数6~15の芳香族炭化水素環から水素原子1個以上を除いた基が好ましく、ベンゼン、ナフタレン、アントラセン又はフェナントレンから水素原子1個以上を除いた基がより好ましく、ベンゼン、ナフタレン又はアントラセンから水素原子1個以上を除いた基がさらに好ましく、ナフタレン又はアントラセンから水素原子1個以上を除いた基が特に好ましく、ナフタレンから水素原子1個以上を除いた基が最も好ましい。
 Ra’14が有していてもよい置換基としては、Ra104が有していてもよい置換基と同様のものが挙げられる。
Examples of the aromatic hydrocarbon group for Ra' 14 include the same as the aromatic hydrocarbon group for Ra 104. Among them, Ra' 14 is preferably a group in which one or more hydrogen atoms have been removed from an aromatic hydrocarbon ring having 6 to 15 carbon atoms, more preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene, anthracene or phenanthrene, still more preferably a group in which one or more hydrogen atoms have been removed from benzene, naphthalene or anthracene, particularly preferably a group in which one or more hydrogen atoms have been removed from naphthalene or anthracene, and most preferably a group in which one or more hydrogen atoms have been removed from naphthalene.
Examples of the substituent which Ra' 14 may have include the same substituents as those which Ra 104 may have.
 式(a1-r2-4)中のRa’14がナフチル基である場合、前記式(a1-r2-4)における第3級炭素原子と結合する位置は、ナフチル基の1位又は2位のいずれであってもよい。
 式(a1-r2-4)中のRa’14がアントリル基である場合、前記式(a1-r2-4)における第3級炭素原子と結合する位置は、アントリル基の1位、2位又は9位のいずれであってもよい。
When Ra' 14 in formula (a1-r2-4) is a naphthyl group, the position at which it bonds to the tertiary carbon atom in formula (a1-r2-4) may be either the 1st or 2nd position of the naphthyl group.
When Ra' 14 in formula (a1-r2-4) is an anthryl group, the position at which it bonds to the tertiary carbon atom in formula (a1-r2-4) may be any one of the 1-position, 2-position or 9-position of the anthryl group.
 前記式(a1-r2-1)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by formula (a1-r2-1) are given below.
Figure JPOXMLDOC01-appb-C000011
Figure JPOXMLDOC01-appb-C000011
Figure JPOXMLDOC01-appb-C000012
Figure JPOXMLDOC01-appb-C000012
Figure JPOXMLDOC01-appb-C000013
Figure JPOXMLDOC01-appb-C000013
 前記式(a1-r2-2)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by formula (a1-r2-2) are given below.
Figure JPOXMLDOC01-appb-C000014
Figure JPOXMLDOC01-appb-C000014
Figure JPOXMLDOC01-appb-C000015
Figure JPOXMLDOC01-appb-C000015
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000016
 前記式(a1-r2-3)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by the formula (a1-r2-3) are given below.
Figure JPOXMLDOC01-appb-C000017
Figure JPOXMLDOC01-appb-C000017
Figure JPOXMLDOC01-appb-C000018
Figure JPOXMLDOC01-appb-C000018
 前記式(a1-r2-4)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by formula (a1-r2-4) are given below.
Figure JPOXMLDOC01-appb-C000019
Figure JPOXMLDOC01-appb-C000019
 第3級アルキルオキシカルボニル酸解離性基:
 前記極性基のうち水酸基を保護する酸解離性基としては、例えば、下記一般式(a1-r-3)で表される酸解離性基(以下便宜上「第3級アルキルオキシカルボニル酸解離性基」ということがある)が挙げられる。
Tertiary alkyloxycarbonyl acid dissociating group:
Among the polar groups, examples of the acid dissociable group that protects the hydroxyl group include acid dissociable groups represented by the following general formula (a1-r-3) (hereinafter, for convenience, may be referred to as “tertiary alkyloxycarbonyl acid dissociable group”).
Figure JPOXMLDOC01-appb-C000020
[式中、Ra’~Ra’はそれぞれアルキル基である。]
Figure JPOXMLDOC01-appb-C000020
[In the formula, Ra' 7 to Ra' 9 each represent an alkyl group.]
 式(a1-r-3)中、Ra’~Ra’は、それぞれ炭素原子数1~5のアルキル基が好ましく、炭素原子数1~3のアルキル基がより好ましい。
 また、各アルキル基の合計の炭素原子数は、3~7であることが好ましく、炭素原子数3~5であることがより好ましく、炭素原子数3~4であることが最も好ましい。
In formula (a1-r-3), Ra' 7 to Ra' 9 are each preferably an alkyl group having 1 to 5 carbon atoms, and more preferably an alkyl group having 1 to 3 carbon atoms.
The total number of carbon atoms in each alkyl group is preferably 3 to 7, more preferably 3 to 5, and most preferably 3 or 4.
 第2級アルキルエステル型酸解離性基:
 上記極性基のうち、カルボキシ基を保護する酸解離性基としては、例えば、下記一般式(a1-r-4)で表される酸解離性基が挙げられる。
Secondary alkyl ester type acid-dissociable group:
Among the above polar groups, examples of the acid-dissociable group that protects the carboxy group include acid-dissociable groups represented by the following general formula (a1-r-4).
Figure JPOXMLDOC01-appb-C000021
[式中、Ra’10は、炭化水素基である。Ra’11a及びRa’11bは、それぞれ独立に、水素原子、ハロゲン原子又はアルキル基である。Ra’12は、水素原子又は炭化水素基である。Ra’10とRa’11a又はRa’11bとは、互いに結合して環を形成してもよい。Ra’11a又はRa’11bと、Ra’12とは、互いに結合して環を形成してもよい。]
Figure JPOXMLDOC01-appb-C000021
[In the formula, Ra'10 is a hydrocarbon group. Ra'11a and Ra'11b are each independently a hydrogen atom, a halogen atom or an alkyl group. Ra'12 is a hydrogen atom or a hydrocarbon group. Ra'10 and Ra'11a or Ra'11b may be bonded to each other to form a ring. Ra'11a or Ra'11b and Ra'12 may be bonded to each other to form a ring.]
 式中、Ra’10及びRa’12における炭化水素基としては、前記Ra’と同様のものが挙げられる。
 式中、Ra’11a及びRa’11bにおけるアルキル基としては、前記Ra’におけるアルキル基と同様のものが挙げられる。
 式中、Ra’10及びRa’12における炭化水素基、並びに、Ra’11a及びRa’11bにおけるアルキル基は置換基を有してもよい。この置換基としては、例えば、上述したRax5等が挙げられる。
In the formula, examples of the hydrocarbon group in Ra'10 and Ra'12 include the same as those in Ra'3 above.
In the formula, examples of the alkyl group in Ra'11a and Ra'11b include the same as the alkyl group in Ra'1 .
In the formula, the hydrocarbon groups in Ra'10 and Ra'12 and the alkyl groups in Ra'11a and Ra'11b may have a substituent. Examples of the substituent include the above-mentioned Rax5 .
 Ra’10とRa’11a又はRa’11bとは、互いに結合して環を形成してもよい。該環は、多環であっても、単環であってもよく、脂環であっても、芳香環であってもよい。
 該脂環及び芳香環は、ヘテロ原子を含むものでもよい。
Ra'10 and Ra'11a or Ra'11b may be bonded to each other to form a ring. The ring may be a polycyclic or monocyclic ring, an alicyclic or aromatic ring.
The alicyclic and aromatic rings may contain heteroatoms.
 Ra’10とRa’11a又はRa’11bとが、互いに結合して形成する環としては、上記の中でも、モノシクロアルケン、モノシクロアルケンの炭素原子の一部がヘテロ原子(酸素原子、硫黄原子等)で置換された環、モノシクロアルカジエンが好ましく、炭素数3~6のシクロアルケンが好ましく、シクロペンテン又はシクロヘキセンが好ましい。 The ring formed by Ra'10 and Ra'11a or Ra'11b bonding to each other is preferably a monocycloalkene, a ring in which a part of the carbon atoms of a monocycloalkene is substituted with a heteroatom (oxygen atom, sulfur atom, etc.), or a monocycloalkadiene, more preferably a cycloalkene having 3 to 6 carbon atoms, and more preferably cyclopentene or cyclohexene.
 Ra’10とRa’11a又はRa’11bとが、互いに結合して形成する環は、縮合環であってもよい。該縮合環として、具体的には、インダン等が挙げられる。 The ring formed by bonding Ra'10 and Ra'11a or Ra'11b together may be a condensed ring. Specific examples of the condensed ring include indan.
 Ra’10とRa’11a又はRa’11bとが、互いに結合して形成する環は、置換基を有してもよい。この置換基としては、例えば、上述したRax5等が挙げられる。 The ring formed by bonding Ra'10 and Ra'11a or Ra'11b together may have a substituent. Examples of the substituent include the above-mentioned Rax5 .
 Ra’11a又はRa’11bと、Ra’12とは、互いに結合して環を形成してもよく、該環としては、Ra’10とRa’11a又はRa’11bとが、互いに結合して形成する環と同様のものが挙げられる。 Ra'11a or Ra'11b and Ra'12 may be bonded to each other to form a ring, and examples of such a ring include the same as the ring formed by Ra'10 and Ra'11a or Ra'11b being bonded to each other.
 前記式(a1-r-4)で表される基の具体例を以下に挙げる。 Specific examples of the group represented by formula (a1-r-4) are given below.
Figure JPOXMLDOC01-appb-C000022
Figure JPOXMLDOC01-appb-C000022
 上記のなかでも、Ra01としては、高感度化、LWR等のリソグラフィー特性向上、及びエッチング耐性向上の観点から、環構造を含む酸解離性基が好ましい。
 また、Ra02における芳香環を含む酸非解離性基との相互作用による膜剛性向上の観点から、Ra01としては、芳香環を含む酸解離性基が好ましい。
Among the above, Ra 01 is preferably an acid-dissociable group having a ring structure from the viewpoints of increasing sensitivity, improving lithography properties such as LWR, and improving etching resistance.
From the viewpoint of improving the film rigidity by interaction with the aromatic ring-containing acid non-dissociable group in Ra 02 , Ra 01 is preferably an aromatic ring-containing acid dissociable group.
 前記式(a0-1)中、m1は、原子価が許容する限り、1以上の整数であり、好ましくは1~3の整数であり、より好ましくは1又は2であり、更に好ましくは1である。 In the formula (a0-1), m1 is an integer of 1 or more, as long as the atomic valence allows, preferably an integer of 1 to 3, more preferably 1 or 2, and even more preferably 1.
 前記式(a0-1)中、Ra02は、芳香環を含む酸非解離性基である。
 Ra02における酸非解離性基としては、前記酸解離性基に該当しない有機基であれば特に限定されない。
 Ra02における酸非解離性基に含まれる芳香環としては、4n+2個のπ電子をもつ環状共役系であれば特に限定されず、単環式でも多環式でもよい。芳香環の炭素原子数は5~30であることが好ましく、炭素原子数5~20がより好ましく、炭素原子数6~15がさらに好ましく、炭素原子数6~12が特に好ましい。
 芳香環として具体的には、ベンゼン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環;前記芳香族炭化水素環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環等が挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。芳香族複素環として具体的には、ピリジン環、チオフェン環等が挙げられる。
In the above formula (a0-1), Ra 02 represents an acid non-dissociable group containing an aromatic ring.
The acid non-dissociable group for Ra 02 is not particularly limited as long as it is an organic group that does not fall under the category of the above-mentioned acid dissociable groups.
The aromatic ring contained in the acid non-dissociable group in Ra 02 is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and may be monocyclic or polycyclic. The aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, further preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms.
Specific examples of the aromatic ring include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; and aromatic heterocycles in which a part of the carbon atoms constituting the aromatic hydrocarbon ring is replaced with a heteroatom. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom. Specific examples of the aromatic heterocycle include a pyridine ring and a thiophene ring.
 Ra02における酸非解離性基に含まれる芳香環は、置換基を有してもよい。該置換基としては、例えば、炭素数1~5のアルキル基、ヒドロキシル基、カルボキシル基、ハロゲン原子、炭素数1~5のハロゲン化アルキル基、炭素数1~5のアルコキシ基、炭素数1~5のアルキルオキシカルボニル基、シアノ基、-O-Ra0211、-S-Ra0211、-S(=O)-Ra0211、-C(=O)-O-Ra0211等が挙げられる。式中、Ra0211は、炭素数1~5の直鎖状又は分岐鎖状のアルキレン基である。 The aromatic ring contained in the acid non-dissociable group in Ra 02 may have a substituent. Examples of the substituent include an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkyloxycarbonyl group having 1 to 5 carbon atoms, a cyano group, -O-Ra 0211 , -S-Ra 0211 , -S(═O) 2 -Ra 0211 , and -C(═O)-O-Ra 0211 . In the formula, Ra 0211 is a linear or branched alkylene group having 1 to 5 carbon atoms.
 前記一般式(a0-1)中、Ra02は、下記一般式(a0-r-1)で表される基であることが好ましい。 In general formula (a0-1), Ra 02 is preferably a group represented by the following general formula (a0-r-1).
Figure JPOXMLDOC01-appb-C000023
[式中、*はArと結合する結合手であり;La02は、単結合又は2価の連結基であり;Ar01は芳香環であり;Ra021は、置換基であり;m21は、原子価が許容する限り、0以上の整数である。]
Figure JPOXMLDOC01-appb-C000023
[In the formula, * represents a bond bonded to Ar; La 02 represents a single bond or a divalent linking group; Ar 01 represents an aromatic ring; Ra 021 represents a substituent; and m21 represents an integer of 0 or more as long as the valence allows.]
 前記式(a0-r-1)中、L02は、単結合又は2価の連結基である。
 前記の化学式中、L02における2価の連結基としては、特に限定されないが、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基等が好適なものとして挙げられる。
In the above formula (a0-r-1), L 02 represents a single bond or a divalent linking group.
In the above chemical formula, the divalent linking group in L 02 is not particularly limited, but suitable examples include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
 L02としては、単結合、エステル結合[-C(=O)-O-、-O-C(=O)-]、エーテル結合(-O-)、直鎖状若しくは分岐鎖状のアルキレン基、又はこれらの組合せであることが好ましく、単結合、エーテル結合(-O-)、-O-R-(式中、Rは炭素数1~5の直鎖状又は分岐鎖状のアルキレン基である)、エステル結合[-C(=O)-O-、-O-C(=O)-]がより好ましく、-O-R-が更に好ましい。
 Rは炭素数1~5の直鎖状又は分岐鎖状のアルキレン基であり、好ましくは炭素数1~3の直鎖状又は分岐鎖状のアルキレン基であり、より好ましくは炭素数1又は2の直鎖状又は分岐鎖状のアルキレン基であり、更に好ましくはメチレン基である。
L 02 is preferably a single bond, an ester bond [-C(=O)-O-, -O-C(=O)-], an ether bond (-O-), a linear or branched alkylene group, or a combination thereof, more preferably a single bond, an ether bond (-O-), -O-R L - (wherein R L is a linear or branched alkylene group having 1 to 5 carbon atoms) or an ester bond [-C(=O)-O-, -O-C(=O)-], and even more preferably -O-R L -.
R L is a linear or branched alkylene group having 1 to 5 carbon atoms, preferably a linear or branched alkylene group having 1 to 3 carbon atoms, more preferably a linear or branched alkylene group having 1 or 2 carbon atoms, and even more preferably a methylene group.
 前記式(a0-r-1)中、Ar01は芳香環であり、前記式(a0-1)中のRa02における酸非解離性基に含まれる芳香環と同様である。なかでも、Ar01としては、ベンゼン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環が好ましく、ベンゼン環又はナフタレン環がより好ましく、ベンゼン環が更に好ましい。 In the formula (a0-r-1), Ar 01 is an aromatic ring, and is the same as the aromatic ring contained in the acid non-dissociable group in Ra 02 in the formula (a0-1). Among them, Ar 01 is preferably an aromatic hydrocarbon ring such as benzene, naphthalene, anthracene, or phenanthrene, more preferably a benzene ring or a naphthalene ring, and even more preferably a benzene ring.
 前記式(a0-r-1)中、Ra021は、置換基である。該置換基としては、例えば、炭素数1~5のアルキル基、ヒドロキシル基、カルボキシル基、ハロゲン原子、炭素数1~5のハロゲン化アルキル基、炭素数1~5のアルコキシ基、炭素数1~5のアルキルオキシカルボニル基、シアノ基、-O-Ra0211、-S-Ra0211、-S(=O)-Ra0211、-C(=O)-O-Ra0211等が挙げられる。式中、Ra0211は、炭素数1~5の直鎖状又は分岐鎖状のアルキレン基である。
 なかでも、Ra021としては、ハロゲン原子又は炭素数1~5のハロゲン化アルキル基が好ましく、フッ素原子、ヨウ素原子又は炭素数1~5のフッ素化アルキル基がより好ましい。
In the formula (a0-r-1), Ra 021 is a substituent. Examples of the substituent include an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkyloxycarbonyl group having 1 to 5 carbon atoms, a cyano group, -O-Ra 0211 , -S-Ra 0211 , -S(═O) 2 -Ra 0211 , and -C(═O)-O-Ra 0211 . In the formula, Ra 0211 is a linear or branched alkylene group having 1 to 5 carbon atoms.
Among these, Ra 021 is preferably a halogen atom or a halogenated alkyl group having 1 to 5 carbon atoms, and more preferably a fluorine atom, an iodine atom or a fluorinated alkyl group having 1 to 5 carbon atoms.
 前記式(a0-r-1)中、m21は、原子価が許容する限り、0以上の整数であり、好ましくは0~3の整数であり、より好ましくは0~2であり、更に好ましくは0又は1である。 In the formula (a0-r-1), m21 is an integer of 0 or more, as long as the atomic valence allows, preferably an integer of 0 to 3, more preferably an integer of 0 to 2, and even more preferably 0 or 1.
 前記式(a0-1)中、m2は、原子価が許容する限り、1以上の整数であり、好ましくは1~3の整数であり、より好ましくは1又は2であり、更に好ましくは1である。 In the formula (a0-1), m2 is an integer of 1 or more, as long as the atomic valence allows, preferably an integer of 1 to 3, more preferably 1 or 2, and even more preferably 1.
 前記式(a0-1)中、Ra03は、COORa01及びRa02以外の置換基である。Ra03における置換基としては、例えば、炭素数1~5のアルキル基、ヒドロキシル基、カルボキシル基、ハロゲン原子、炭素数1~5のハロゲン化アルキル基、炭素数1~5のアルコキシ基、炭素数1~5のアルキルオキシカルボニル基等が挙げられる。 In the formula (a0-1), Ra 03 is a substituent other than COORa 01 and Ra 02. Examples of the substituent in Ra 03 include an alkyl group having 1 to 5 carbon atoms, a hydroxyl group, a carboxyl group, a halogen atom, a halogenated alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, and an alkyloxycarbonyl group having 1 to 5 carbon atoms.
 前記式(a0-1)中、m3は、原子価が許容する限り、0以上の整数であり、好ましくは0~2の整数であり、より好ましくは0又は1であり、更に好ましくは0である。 In the formula (a0-1), m3 is an integer of 0 or more, as long as the atomic valence allows, preferably an integer of 0 to 2, more preferably 0 or 1, and even more preferably 0.
 以下、前記一般式(a0-1)で表される化合物の具体体を示すが、本実施形態において該化合物はこれらに限定されない。以下の各式中、Rαは、水素原子、メチル基又はトリフルオロメチル基を示し、Ra01及びRa02は、前記式(a0-1)中のRa01及びRa02とそれぞれ同様である。 Specific examples of the compound represented by the general formula (a0-1) are shown below, but the compound is not limited to these in this embodiment. In each of the following formulas, Rα represents a hydrogen atom, a methyl group, or a trifluoromethyl group, and Ra 01 and Ra 02 are the same as Ra 01 and Ra 02 in the general formula (a0-1), respectively.
Figure JPOXMLDOC01-appb-C000024
Figure JPOXMLDOC01-appb-C000024
Figure JPOXMLDOC01-appb-C000025
Figure JPOXMLDOC01-appb-C000025
Figure JPOXMLDOC01-appb-C000026
Figure JPOXMLDOC01-appb-C000026
Figure JPOXMLDOC01-appb-C000027
Figure JPOXMLDOC01-appb-C000027
Figure JPOXMLDOC01-appb-C000028
Figure JPOXMLDOC01-appb-C000028
 (A1)成分が有する構成単位(a0)は、1種でもよく2種以上でもよい。
 (A1)成分中の構成単位(a0)の割合は、(A1)成分を構成する全構成単位の合計(100モル%)に対して、20~80モル%が好ましく、25~75モル%がより好ましく、30~70モル%が更に好ましく、35~65モル%が特に好ましい。
 構成単位(a0)の含有量を上記の好ましい範囲内とすることで、他の構成単位とのバランスを取りやすく、感度、LWR等のリソグラフィー特性が良好となりやすく、エッチング耐性も向上しやすい。
The structural unit (a0) contained in the component (A1) may be of one type, or may be of two or more types.
The proportion of the structural unit (a0) in the component (A1) is preferably 20 to 80 mol%, more preferably 25 to 75 mol%, even more preferably 30 to 70 mol%, and particularly preferably 35 to 65 mol%, based on the total (100 mol%) of all structural units constituting the component (A1).
By ensuring that the content of the structural unit (a0) is within the above preferred range, it is easy to achieve a good balance with other structural units, lithography properties such as sensitivity and LWR are likely to be improved, and etching resistance is also likely to be improved.
 ≪その他構成単位≫
 (A1)成分は、上述した構成単位(a0)に加え、必要に応じてその他構成単位を有するものでもよい。
 その他構成単位としては、例えば、酸の作用により極性が増大する酸分解性基を含む構成単位(a1)(ただし、構成単位(a0)に該当するものを除く);後述の一般式(a10-1)で表される構成単位(a10);ラクトン含有環式基を含む構成単位(a2);後述の一般式(a8-1)で表される化合物から誘導される構成単位(a8)などが挙げられる。
Other structural units
The component (A1) may contain other structural units, in addition to the structural unit (a0) described above, as necessary.
Examples of other structural units include the structural unit (a1) containing an acid-decomposable group whose polarity increases by the action of acid (excluding those corresponding to the structural unit (a0)); the structural unit (a10) represented by general formula (a10-1) described below; the structural unit (a2) containing a lactone-containing cyclic group; and the structural unit (a8) derived from a compound represented by general formula (a8-1) described below.
 構成単位(a1)について:
 構成単位(a1)は、酸の作用により極性が増大する酸分解性基を含む構成単位である。ただし、構成単位(a0)に該当する構成単位は、構成単位(a1)から除かれる。
Regarding the structural unit (a1):
The structural unit (a1) is a structural unit that contains an acid-decomposable group whose polarity increases when acted upon by an acid, with the proviso that structural units that fall under the category of the structural unit (a0) are excluded from the structural unit (a1).
 酸解離性基としては、これまで、化学増幅型レジスト組成物用のベース樹脂の酸解離性基として提案されているものが挙げられる。
 化学増幅型レジスト組成物用のベース樹脂の酸解離性基として提案されているものとして具体的には、前記一般式(a0-1)中のRa01における酸解離性基と同様のものが挙げられる。
Examples of the acid-dissociable group include those that have been proposed as acid-dissociable groups in base resins for chemically amplified resist compositions.
Specific examples of the acid-dissociable group proposed for the base resin of the chemically amplified resist composition include the same as the acid-dissociable group for Ra 01 in the general formula (a0-1) above.
 構成単位(a1)としては、α位の炭素原子に結合した水素原子が置換基で置換されていてもよいアクリル酸エステルから誘導される構成単位、アクリルアミドから誘導される構成単位、ヒドロキシスチレン若しくはヒドロキシスチレン誘導体から誘導される構成単位の水酸基における水素原子の少なくとも一部が前記酸分解性基を含む置換基により保護された構成単位、ビニル安息香酸若しくはビニル安息香酸誘導体から誘導される構成単位の-C(=O)-OHにおける水素原子の少なくとも一部が前記酸分解性基を含む置換基により保護された構成単位等が挙げられる。 Examples of the structural unit (a1) include structural units derived from acrylic esters in which the hydrogen atom bonded to the carbon atom at the α-position may be substituted with a substituent, structural units derived from acrylamide, structural units in which at least some of the hydrogen atoms in the hydroxyl groups of a structural unit derived from hydroxystyrene or a hydroxystyrene derivative are protected with a substituent containing the acid-decomposable group, and structural units in which at least some of the hydrogen atoms in -C(=O)-OH of a structural unit derived from vinylbenzoic acid or a vinylbenzoic acid derivative are protected with a substituent containing the acid-decomposable group.
 構成単位(a1)としては、上記のなかでも、α位の炭素原子に結合した水素原子が置換基で置換されていてもよいアクリル酸エステルから誘導される構成単位が好ましい。
 かかる構成単位(a1)の好ましい具体例としては、下記一般式(a1-1)又は(a1-2)で表される構成単位が挙げられる。
Of the above, the structural unit (a1) is preferably a structural unit derived from an acrylate ester in which the hydrogen atom bonded to the carbon atom at the α-position may be substituted with a substituent.
Preferred specific examples of the structural unit (a1) include structural units represented by general formula (a1-1) or (a1-2) shown below.
Figure JPOXMLDOC01-appb-C000029
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Vaは、エーテル結合を有していてもよい2価の炭化水素基である。na1は、0~2の整数である。Raは、上記の一般式(a1-r-1)又は(a1-r-2)で表される酸解離性基である。Waはna2+1価の炭化水素基であり、na2は1~3の整数であり、Raは上記の一般式(a1-r-1)又は(a1-r-3)で表される酸解離性基である。]
Figure JPOXMLDOC01-appb-C000029
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Va 1 is a divalent hydrocarbon group which may have an ether bond. n a1 is an integer of 0 to 2. Ra 1 is an acid dissociable group represented by the above general formula (a1-r-1) or (a1-r-2). Wa 1 is n a2 +1 valent hydrocarbon group, n a2 is an integer of 1 to 3, and Ra 2 is an acid dissociable group represented by the above general formula (a1-r-1) or (a1-r-3).]
 前記式(a1-1)中、Rの炭素原子数1~5のアルキル基は、炭素原子数1~5の直鎖状または分岐鎖状のアルキル基が好ましく、具体的には、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基等が挙げられる。炭素原子数1~5のハロゲン化アルキル基は、前記炭素原子数1~5のアルキル基の水素原子の一部または全部がハロゲン原子で置換された基である。該ハロゲン原子としては、特にフッ素原子が好ましい。
 Rとしては、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のフッ素化アルキル基が好ましく、工業上の入手の容易さから、水素原子又はメチル基が最も好ましい。
In the formula (a1-1), the alkyl group having 1 to 5 carbon atoms represented by R is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, and specific examples thereof include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, and a neopentyl group. The halogenated alkyl group having 1 to 5 carbon atoms is a group in which some or all of the hydrogen atoms of the alkyl group having 1 to 5 carbon atoms are substituted with halogen atoms. As the halogen atom, a fluorine atom is particularly preferable.
R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom or a methyl group is most preferred.
 前記式(a1-1)中、Vaにおける2価の炭化水素基は、脂肪族炭化水素基であってもよく、芳香族炭化水素基であってもよい。 In the above formula (a1-1), the divalent hydrocarbon group for Va1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.
 Vaにおける2価の炭化水素基としての脂肪族炭化水素基は、飽和であってもよく、不飽和であってもよく、通常は飽和であることが好ましい。
 該脂肪族炭化水素基として、より具体的には、直鎖状もしくは分岐鎖状の脂肪族炭化水素基、又は、構造中に環を含む脂肪族炭化水素基等が挙げられる。
The aliphatic hydrocarbon group as the divalent hydrocarbon group in Va1 may be saturated or unsaturated, and is usually preferably saturated.
More specifically, the aliphatic hydrocarbon group may be a straight-chain or branched-chain aliphatic hydrocarbon group, or an aliphatic hydrocarbon group containing a ring in the structure.
 前記直鎖状の脂肪族炭化水素基は、炭素原子数が1~10であることが好ましく、炭素原子数1~6がより好ましく、炭素原子数1~4がさらに好ましく、炭素原子数1~3が最も好ましい。
 直鎖状の脂肪族炭化水素基としては、直鎖状のアルキレン基が好ましく、具体的には、メチレン基[-CH-]、エチレン基[-(CH-]、トリメチレン基[-(CH-]、テトラメチレン基[-(CH-]、ペンタメチレン基[-(CH-]等が挙げられる。
 前記分岐鎖状の脂肪族炭化水素基は、炭素原子数が2~10であることが好ましく、炭素原子数3~6がより好ましく、炭素原子数3又は4がさらに好ましく、炭素原子数3が最も好ましい。
 分岐鎖状の脂肪族炭化水素基としては、分岐鎖状のアルキレン基が好ましく、具体的には、-CH(CH)-、-CH(CHCH)-、-C(CH-、-C(CH)(CHCH)-、-C(CH)(CHCHCH)-、-C(CHCH-等のアルキルメチレン基;-CH(CH)CH-、-CH(CH)CH(CH)-、-C(CHCH-、-CH(CHCH)CH-、-C(CHCH-CH-等のアルキルエチレン基;-CH(CH)CHCH-、-CHCH(CH)CH-等のアルキルトリメチレン基;-CH(CH)CHCHCH-、-CHCH(CH)CHCH-等のアルキルテトラメチレン基などのアルキルアルキレン基等が挙げられる。アルキルアルキレン基におけるアルキル基としては、炭素原子数1~5の直鎖状のアルキル基が好ましい。
The linear aliphatic hydrocarbon group preferably contains 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, even more preferably 1 to 4 carbon atoms, and most preferably 1 to 3 carbon atoms.
As the straight-chain aliphatic hydrocarbon group, a straight-chain alkylene group is preferable, and specific examples thereof include a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [-(CH 2 ) 3 -], a tetramethylene group [-(CH 2 ) 4 -], a pentamethylene group [-(CH 2 ) 5 -], etc.
The branched aliphatic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably has 3 to 6 carbon atoms, even more preferably has 3 or 4 carbon atoms, and most preferably has 3 carbon atoms.
The branched aliphatic hydrocarbon group is preferably a branched alkylene group, and specific examples thereof include alkylmethylene groups such as -CH( CH3 )-, -CH( CH2CH3 )-, -C( CH3 ) 2- , -C(CH3)(CH2CH3)-, -C(CH3)(CH2CH2CH3)-, and -C(CH2CH3 ) 2- ; alkylethylene groups such as -CH ( CH3 ) CH2- , -CH( CH3 )CH( CH3 ) - , -C( CH3 ) 2CH2- , -CH ( CH2CH3 ) CH2- , and -C( CH2CH3 ) 2 - CH2- ; and alkyl alkylene groups such as alkyl trimethylene groups such as -CH (CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -, etc. The alkyl group in the alkyl alkylene group is preferably a linear alkyl group having 1 to 5 carbon atoms.
 前記構造中に環を含む脂肪族炭化水素基としては、脂環式炭化水素基(脂肪族炭化水素環から水素原子を2個除いた基)、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の末端に結合した基、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の途中に介在する基などが挙げられる。前記直鎖状または分岐鎖状の脂肪族炭化水素基としては、前記直鎖状の脂肪族炭化水素基または前記分岐鎖状の脂肪族炭化水素基と同様のものが挙げられる。
 前記脂環式炭化水素基は、炭素原子数が3~20であることが好ましく、炭素原子数3~12であることがより好ましい。
 前記脂環式炭化水素基は、多環式であってもよく、単環式であってもよい。単環式の脂環式炭化水素基としては、モノシクロアルカンから2個の水素原子を除いた基が好ましい。該モノシクロアルカンとしては炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。多環式の脂環式炭化水素基としては、ポリシクロアルカンから2個の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては炭素原子数7~12のものが好ましく、具体的にはアダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等が挙げられる。
Examples of the aliphatic hydrocarbon group containing a ring in the structure include an alicyclic hydrocarbon group (a group in which two hydrogen atoms have been removed from an aliphatic hydrocarbon ring), a group in which an alicyclic hydrocarbon group is bonded to the end of a linear or branched aliphatic hydrocarbon group, a group in which an alicyclic hydrocarbon group is interposed in the middle of a linear or branched aliphatic hydrocarbon group, etc. Examples of the linear or branched aliphatic hydrocarbon group include the same as the linear aliphatic hydrocarbon group or the branched aliphatic hydrocarbon group.
The alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, and more preferably has 3 to 12 carbon atoms.
The alicyclic hydrocarbon group may be polycyclic or monocyclic. The monocyclic alicyclic hydrocarbon group is preferably a group in which two hydrogen atoms have been removed from a monocycloalkane. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group in which two hydrogen atoms have been removed from a polycycloalkane, and the polycycloalkane preferably has 7 to 12 carbon atoms, and specific examples thereof include adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane.
 Vaにおける2価の炭化水素基としての芳香族炭化水素基は、芳香環を有する炭化水素基である。
 かかる芳香族炭化水素基は、炭素原子数が3~30であることが好ましく、5~30であることがより好ましく、5~20がさらに好ましく、6~15が特に好ましく、6~12が最も好ましい。ただし、該炭素原子数には、置換基における炭素原子数を含まないものとする。
 芳香族炭化水素基が有する芳香環として具体的には、ベンゼン、ビフェニル、フルオレン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環;前記芳香族炭化水素環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環等が挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。
 該芳香族炭化水素基として具体的には、前記芳香族炭化水素環から水素原子を2つ除いた基(アリーレン基);前記芳香族炭化水素環から水素原子を1つ除いた基(アリール基)の水素原子の1つがアルキレン基で置換された基(例えば、ベンジル基、フェネチル基、1-ナフチルメチル基、2-ナフチルメチル基、1-ナフチルエチル基、2-ナフチルエチル基等のアリールアルキル基におけるアリール基から水素原子をさらに1つ除いた基)等が挙げられる。前記アルキレン基(アリールアルキル基中のアルキル鎖)の炭素原子数は、1~4であることが好ましく、1~2であることがより好ましく、1であることが特に好ましい。
The aromatic hydrocarbon group as the divalent hydrocarbon group in Va1 is a hydrocarbon group having an aromatic ring.
The aromatic hydrocarbon group preferably has 3 to 30 carbon atoms, more preferably 5 to 30, even more preferably 5 to 20, particularly preferably 6 to 15, and most preferably 6 to 12. However, this number of carbon atoms does not include the number of carbon atoms in the substituents.
Specific examples of the aromatic ring contained in the aromatic hydrocarbon group include aromatic hydrocarbon rings such as benzene, biphenyl, fluorene, naphthalene, anthracene, and phenanthrene; aromatic heterocycles in which a part of the carbon atoms constituting the aromatic hydrocarbon ring is substituted with a heteroatom, etc. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom.
Specific examples of the aromatic hydrocarbon group include a group in which two hydrogen atoms have been removed from the aromatic hydrocarbon ring (arylene group); a group in which one hydrogen atom of a group in which one hydrogen atom has been removed from the aromatic hydrocarbon ring (aryl group) has been substituted with an alkylene group (for example, a group in which one hydrogen atom has been further removed from the aryl group in an arylalkyl group such as a benzyl group, a phenethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group, or a 2-naphthylethyl group). The number of carbon atoms in the alkylene group (the alkyl chain in the arylalkyl group) is preferably 1 to 4, more preferably 1 to 2, and particularly preferably 1.
 前記式(a1-1)中、Raは、上記式(a1-r-1)又は(a1-r-2)で表される酸解離性基である。 In the formula (a1-1), Ra 1 is an acid-dissociable group represented by the formula (a1-r-1) or (a1-r-2).
 前記式(a1-2)中、Waにおけるna2+1価の炭化水素基は、脂肪族炭化水素基であってもよく、芳香族炭化水素基であってもよい。該脂肪族炭化水素基は、芳香族性を持たない炭化水素基を意味し、飽和であってもよく、不飽和であってもよく、通常は飽和であることが好ましい。前記脂肪族炭化水素基としては、直鎖状または分岐鎖状の脂肪族炭化水素基、構造中に環を含む脂肪族炭化水素基、或いは直鎖状または分岐鎖状の脂肪族炭化水素基と構造中に環を含む脂肪族炭化水素基とを組み合わせた基が挙げられる。
 前記na2+1価は、2~4価が好ましく、2又は3価がより好ましい。
In the formula (a1-2), the n a2 +1 valent hydrocarbon group in Wa 1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group. The aliphatic hydrocarbon group means a hydrocarbon group that does not have aromaticity, and may be saturated or unsaturated, and is usually preferably saturated. Examples of the aliphatic hydrocarbon group include linear or branched aliphatic hydrocarbon groups, aliphatic hydrocarbon groups containing a ring in the structure, and groups that combine linear or branched aliphatic hydrocarbon groups with aliphatic hydrocarbon groups containing a ring in the structure.
The n a2 +1 valency is preferably divalent to tetravalent, and more preferably divalent or trivalent.
 前記式(a1-2)中、Raは、上記の一般式(a1-r-1)又は(a1-r-3)で表される酸解離性基である。 In the formula (a1-2), Ra2 is an acid-dissociable group represented by the above general formula (a1-r-1) or (a1-r-3).
 以下に構成単位(a1)の具体例を示す。以下の各式中、Rαは、水素原子、メチル基またはトリフルオロメチル基を示す。 Specific examples of the structural unit (a1) are shown below: In each of the following formulas, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
Figure JPOXMLDOC01-appb-C000030
Figure JPOXMLDOC01-appb-C000030
Figure JPOXMLDOC01-appb-C000031
Figure JPOXMLDOC01-appb-C000031
Figure JPOXMLDOC01-appb-C000032
Figure JPOXMLDOC01-appb-C000032
Figure JPOXMLDOC01-appb-C000033
Figure JPOXMLDOC01-appb-C000033
Figure JPOXMLDOC01-appb-C000034
Figure JPOXMLDOC01-appb-C000034
Figure JPOXMLDOC01-appb-C000035
Figure JPOXMLDOC01-appb-C000035
Figure JPOXMLDOC01-appb-C000036
Figure JPOXMLDOC01-appb-C000036
Figure JPOXMLDOC01-appb-C000037
Figure JPOXMLDOC01-appb-C000037
 (A1)成分が有する構成単位(a1)は、1種でもよく2種以上でもよい。
 構成単位(a1)としては、電子線やEUVによるリソグラフィーでの特性(CDU等)をより高められやすいことから、前記式(a1-1)で表される構成単位がより好ましい。
The structural unit (a1) contained in the component (A1) may be of one type, or two or more types.
As the structural unit (a1), a structural unit represented by the above formula (a1-1) is more preferable, since it is easier to improve properties (CDU, etc.) in electron beam or EUV lithography.
Figure JPOXMLDOC01-appb-C000038
[式中、Ra”は、一般式(a1-r2-1)、(a1-r2-3)又は(a1-r2-4)で表される酸解離性基である。*は結合手を示す。]
Figure JPOXMLDOC01-appb-C000038
[In the formula, Ra 1 ″ is an acid-dissociable group represented by general formula (a1-r2-1), (a1-r2-3) or (a1-r2-4). * represents a bond.]
 前記式(a1-1-1)中、R、Va及びna1は、前記式(a1-1)中のR、Va及びna1と同様である。
 一般式(a1-r2-1)、(a1-r2-3)又は(a1-r2-4)で表される酸解離性基についての説明は、上述の通りである。中でも、EB用又はEUV用において反応性を高められて好適なことから、酸解離性基が環式基であるものを選択することが好ましく、一般式(a1-r2-1)で表される酸解離性基がより好ましい。
In the formula (a1-1-1), R, Va1 and n a1 are the same as R, Va1 and n a1 in the formula (a1-1).
The acid dissociable group represented by formula (a1-r2-1), (a1-r2-3) or (a1-r2-4) is as described above. Among them, it is preferable to select an acid dissociable group that is a cyclic group, since it is suitable for use with EB or EUV and can enhance reactivity, and an acid dissociable group represented by formula (a1-r2-1) is more preferable.
 (A1)成分が構成単位(a1)を含有する場合、(A1)成分中の構成単位(a1)の割合は、該(A1)成分を構成する全構成単位の合計(100モル%)に対して、5~95モル%が好ましく、10~90モル%がより好ましく、30~70モル%がさらに好ましく、40~60モル%が特に好ましい。
 構成単位(a1)の割合を、前記の好ましい範囲の下限値以上とすることによって、感度、CDU、解像性、ラフネス改善等のリソグラフィー特性が向上する。一方、前記の好ましい範囲の上限値以下であると、他の構成単位とのバランスを取ることができ、種々のリソグラフィー特性が良好となる。
When the component (A1) contains the structural unit (a1), the proportion of the structural unit (a1) in the component (A1) is preferably 5 to 95 mol %, more preferably 10 to 90 mol %, even more preferably 30 to 70 mol %, and particularly preferably 40 to 60 mol %, based on the total (100 mol %) of all structural units constituting the component (A1).
By ensuring that the proportion of the structural unit (a1) is at least as large as the lower limit of the aforementioned preferred range, lithography properties such as sensitivity, CDU, resolution, and roughness can be improved. On the other hand, when the proportion is at most the upper limit of the aforementioned preferred range, a balance with other structural units can be achieved, resulting in various favorable lithography properties.
 構成単位(a10)について:
 構成単位(a10)は、下記一般式(a10-1)で表される構成単位(但し、構成単位(a1)に該当するものを除く)である。
Regarding the structural unit (a10):
The structural unit (a10) is a structural unit represented by general formula (a10-1) shown below (however, this does not include those that correspond to the structural unit (a1)).
Figure JPOXMLDOC01-appb-C000039
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Yax1は、単結合又は2価の連結基である。Wax1は、置換基を有してもよい芳香族炭化水素基である。nax1は、1以上の整数である。]
Figure JPOXMLDOC01-appb-C000039
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Ya x1 is a single bond or a divalent linking group. Wa x1 is an aromatic hydrocarbon group which may have a substituent. n ax1 is an integer of 1 or more.]
 前記式(a10-1)中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。
 Rとしては、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のフッ素化アルキル基が好ましく、工業上の入手の容易さから、水素原子、メチル基又はトリフルオロメチル基がより好ましく、水素原子又はメチル基がさらに好ましく、水素原子が特に好ましい。
In the above formula (a10-1), R represents a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.
R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom, a methyl group, or a trifluoromethyl group is more preferable, a hydrogen atom or a methyl group is still more preferable, and a hydrogen atom is particularly preferable.
 前記式(a10-1)中、Yax1は、単結合又は2価の連結基である。
 前記の化学式中、Yax1における2価の連結基としては、特に限定されないが、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基等が好適なものとして挙げられる。
In the above formula (a10-1), Ya x1 represents a single bond or a divalent linking group.
In the above chemical formula, the divalent linking group for Ya x1 is not particularly limited, but suitable examples include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
 Yax1としては、単結合、エステル結合[-C(=O)-O-、-O-C(=O)-]、エーテル結合(-O-)、直鎖状若しくは分岐鎖状のアルキレン基、又はこれらの組合せであることが好ましく、単結合、エステル結合[-C(=O)-O-、-O-C(=O)-]がより好ましい。 Ya x1 is preferably a single bond, an ester bond [-C(=O)-O-, -O-C(=O)-], an ether bond (-O-), a linear or branched alkylene group, or a combination thereof, and more preferably a single bond or an ester bond [-C(=O)-O-, -O-C(=O)-].
 前記式(a10-1)中、Wax1は、置換基を有してもよい芳香族炭化水素基である。
 Wax1における芳香族炭化水素基としては、置換基を有してもよい芳香環から(nax1+1)個の水素原子を除いた基が挙げられる。ここでの芳香環は、4n+2個のπ電子をもつ環状共役系であれば特に限定されない。芳香環の炭素原子数は5~30であることが好ましく、炭素原子数5~20がより好ましく、炭素原子数6~15がさらに好ましく、炭素原子数6~12が特に好ましい。該芳香環として具体的には、ベンゼン、ナフタレン、アントラセン、フェナントレン等の芳香族炭化水素環;前記芳香族炭化水素環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環等が挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。芳香族複素環として具体的には、ピリジン環、チオフェン環等が挙げられる。
 また、Wax1における芳香族炭化水素基としては、2以上の置換基を有してもよい芳香環を含む芳香族化合物(例えばビフェニル、フルオレン等)から(nax1+1)個の水素原子を除いた基も挙げられる。
 上記の中でも、Wax1としては、ベンゼン、ナフタレン、アントラセンまたはビフェニルから(nax1+1)個の水素原子を除いた基が好ましく、ベンゼン又はナフタレンから(nax1+1)個の水素原子を除いた基がより好ましく、ベンゼンから(nax1+1)個の水素原子を除いた基がさらに好ましい。
In the above formula (a10-1), Wa x1 represents an aromatic hydrocarbon group which may have a substituent.
The aromatic hydrocarbon group in Wa x1 may be a group in which (n ax1 +1) hydrogen atoms have been removed from an aromatic ring which may have a substituent. The aromatic ring here is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons. The aromatic ring preferably has 5 to 30 carbon atoms, more preferably 5 to 20 carbon atoms, even more preferably 6 to 15 carbon atoms, and particularly preferably 6 to 12 carbon atoms. Specific examples of the aromatic ring include aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, and phenanthrene; and aromatic heterocycles in which a part of the carbon atoms constituting the aromatic hydrocarbon ring is substituted with a heteroatom. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom. Specific examples of the aromatic heterocycle include a pyridine ring and a thiophene ring.
Further, examples of the aromatic hydrocarbon group in Wa x1 include groups in which (n ax1 +1) hydrogen atoms have been removed from an aromatic compound containing an aromatic ring which may have two or more substituents (e.g., biphenyl, fluorene, etc.).
Among the above, Wa x1 is preferably a group in which (n ax1 +1) hydrogen atoms have been removed from benzene, naphthalene, anthracene or biphenyl, more preferably a group in which (n ax1 +1) hydrogen atoms have been removed from benzene or naphthalene, and even more preferably a group in which (n ax1 +1) hydrogen atoms have been removed from benzene.
 Wax1における芳香族炭化水素基は、置換基を有してもよく、有していなくてもよい。前記置換基としては、例えば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基等が挙げられる。前記置換基としてのアルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基としては、Yax1における環状の脂環式炭化水素基の置換基として挙げたものと同様のものが挙げられる。前記置換基は、炭素原子数1~5の直鎖状若しくは分岐鎖状のアルキル基が好ましく、炭素原子数1~3の直鎖状若しくは分岐鎖状のアルキル基がより好ましく、エチル基又はメチル基がさらに好ましく、メチル基が特に好ましい。Wax1における芳香族炭化水素基は、置換基を有していないことが好ましい。 The aromatic hydrocarbon group in Wa x1 may or may not have a substituent. Examples of the substituent include an alkyl group, an alkoxy group, a halogen atom, and a halogenated alkyl group. Examples of the alkyl group, alkoxy group, halogen atom, and halogenated alkyl group as the substituent include the same as those exemplified as the substituent of the cyclic alicyclic hydrocarbon group in Ya x1 . The substituent is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, more preferably a linear or branched alkyl group having 1 to 3 carbon atoms, further preferably an ethyl group or a methyl group, and particularly preferably a methyl group. It is preferable that the aromatic hydrocarbon group in Wa x1 does not have a substituent.
 前記式(a10-1)中、nax1は、1以上の整数であり、1~10の整数が好ましく、1~5の整数がより好ましく、1、2又は3がさらに好ましく、1又は2が特に好ましい。 In the formula (a10-1), n ax1 represents an integer of 1 or more, preferably an integer of 1 to 10, more preferably an integer of 1 to 5, still more preferably 1, 2 or 3, and particularly preferably 1 or 2.
 以下に、前記式(a10-1)で表される構成単位(a10)の具体例を示す。
 以下の各式中、Rαは、水素原子、メチル基又はトリフルオロメチル基を示す。
Specific examples of the structural unit (a10) represented by the aforementioned formula (a10-1) are shown below.
In each of the following formulas, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
Figure JPOXMLDOC01-appb-C000040
Figure JPOXMLDOC01-appb-C000040
Figure JPOXMLDOC01-appb-C000041
Figure JPOXMLDOC01-appb-C000041
Figure JPOXMLDOC01-appb-C000042
Figure JPOXMLDOC01-appb-C000042
 (A1)成分が有する構成単位(a10)は、1種でもよく2種以上でもよい。
 (A1)成分が構成単位(a10)を有する場合、(A1)成分中の構成単位(a10)の割合は、(A1)成分を構成する全構成単位の合計(100モル%)に対して、20~60モル%が好ましく、25~55モル%がより好ましく、30~50モル%がさらに好ましく、35~45モル%が特に好ましい。
 構成単位(a10)の割合を下限値以上とすることにより、感度がより高められやすくなる。一方、上限値以下とすることにより、他の構成単位とのバランスをとりやすくなる。
The structural unit (a10) contained in the component (A1) may be of one type, or two or more types.
When the component (A1) contains the structural unit (a10), the proportion of the structural unit (a10) in the component (A1) is preferably 20 to 60 mol %, more preferably 25 to 55 mol %, even more preferably 30 to 50 mol %, and particularly preferably 35 to 45 mol %, based on the total (100 mol %) of all structural units constituting the component (A1).
By ensuring that the proportion of the structural unit (a10) is at least as large as the lower limit of the above range, sensitivity can be further improved, while by ensuring that the proportion is at most the upper limit of the above range, it is easier to achieve a balance with other structural units.
 構成単位(a2)について:
 (A1)成分は、さらに、ラクトン含有環式基を含む構成単位(a2)(但し、構成単位(a1)に該当するものを除く)を有するものでもよい。
 構成単位(a2)のラクトン含有環式基は、(A1)成分をレジスト膜の形成に用いた場合に、レジスト膜の基板への密着性を高める上で有効なものである。また、構成単位(a2)を有することで、例えば酸拡散長を適切に調整する、レジスト膜の基板への密着性を高める、現像時の溶解性を適切に調整する等の効果により、リソグラフィー特性等が良好となる。
Regarding the structural unit (a2):
The component (A1) may further include a structural unit (a2) that contains a lactone-containing cyclic group (provided that this does not correspond to the structural unit (a1)).
The lactone-containing cyclic group of the structural unit (a2) is effective in improving the adhesion of the resist film to the substrate when the component (A1) is used to form a resist film. In addition, the structural unit (a2) has the effects of, for example, appropriately adjusting the acid diffusion length, improving the adhesion of the resist film to the substrate, and appropriately adjusting the solubility during development, thereby improving the lithography properties, etc.
 「ラクトン含有環式基」とは、その環骨格中に-O-C(=O)-を含む環(ラクトン環)を含有する環式基を示す。ラクトン環をひとつ目の環として数え、ラクトン環のみの場合は単環式基、さらに他の環構造を有する場合は、その構造に関わらず多環式基と称する。ラクトン含有環式基は、単環式基であってもよく、多環式基であってもよい。
 構成単位(a2)におけるラクトン含有環式基としては、特に限定されることなく任意のものが使用可能である。具体的には、下記一般式(a2-r-1)~(a2-r-7)でそれぞれ表される基が挙げられる。
A "lactone-containing cyclic group" refers to a cyclic group that contains a ring (lactone ring) that contains --O--C(=O)-- in its ring skeleton. The lactone ring is counted as the first ring, and when there is only a lactone ring, it is called a monocyclic group, and when there is further contained another ring structure, it is called a polycyclic group regardless of the structure. The lactone-containing cyclic group may be a monocyclic group or a polycyclic group.
The lactone-containing cyclic group in the structural unit (a2) is not particularly limited and any suitable group can be used. Specific examples include the groups represented by the following general formulae (a2-r-1) to (a2-r-7).
Figure JPOXMLDOC01-appb-C000043
[式中、Ra’21はそれぞれ独立に水素原子、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、-COOR”、-OC(=O)R”、ヒドロキシアルキル基またはシアノ基であり;R”は水素原子、アルキル基、又は、ラクトン含有環式基であり;A”は酸素原子(-O-)もしくは硫黄原子(-S-)を含んでいてもよい炭素原子数1~5のアルキレン基、酸素原子または硫黄原子であり、n’は0~2の整数であり、m’は0または1である。*は結合手を示す(以下、同様)。]
Figure JPOXMLDOC01-appb-C000043
[In the formula, Ra' 21 are each independently a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, -COOR", -OC(=O)R", a hydroxyalkyl group or a cyano group; R" is a hydrogen atom, an alkyl group or a lactone-containing cyclic group; A" is an alkylene group having 1 to 5 carbon atoms which may contain an oxygen atom (-O-) or a sulfur atom (-S-), an oxygen atom or a sulfur atom, n' is an integer of 0 to 2, and m' is 0 or 1. * represents a bond (the same applies hereinafter).]
 前記一般式(a2-r-1)~(a2-r-7)中、Ra’21におけるアルキル基としては、炭素原子数1~6のアルキル基が好ましい。該アルキル基は、直鎖状または分岐鎖状であることが好ましい。具体的には、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基、ヘキシル基等が挙げられる。これらの中でも、メチル基またはエチル基が好ましく、メチル基が特に好ましい。
 Ra’21におけるアルコキシ基としては、炭素原子数1~6のアルコキシ基が好ましい。該アルコキシ基は、直鎖状または分岐鎖状であることが好ましい。具体的には、前記Ra’21におけるアルキル基として挙げたアルキル基と酸素原子(-O-)とが連結した基が挙げられる。
 Ra’21におけるハロゲン原子としては、フッ素原子が好ましい。
 Ra’21におけるハロゲン化アルキル基としては、前記Ra’21におけるアルキル基の水素原子の一部または全部が前記ハロゲン原子で置換された基が挙げられる。該ハロゲン化アルキル基としては、フッ素化アルキル基が好ましく、特にパーフルオロアルキル基が好ましい。
In the general formulae (a2-r-1) to (a2-r-7), the alkyl group in Ra'21 is preferably an alkyl group having 1 to 6 carbon atoms. The alkyl group is preferably linear or branched. Specific examples include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, a neopentyl group, and a hexyl group. Of these, a methyl group or an ethyl group is preferred, and a methyl group is particularly preferred.
The alkoxy group in Ra' 21 is preferably an alkoxy group having 1 to 6 carbon atoms. The alkoxy group is preferably linear or branched. Specific examples include groups in which the alkyl groups listed above as the alkyl groups in Ra' 21 are linked to an oxygen atom (-O-).
The halogen atom in Ra'21 is preferably a fluorine atom.
The halogenated alkyl group in Ra' 21 may be a group in which some or all of the hydrogen atoms in the alkyl group in Ra' 21 have been substituted with the halogen atoms. As the halogenated alkyl group, a fluorinated alkyl group is preferable, and a perfluoroalkyl group is particularly preferable.
 Ra’21における-COOR”、-OC(=O)R”において、R”はいずれも水素原子、アルキル基、又は、ラクトン含有環式基である。
 R”におけるアルキル基としては、直鎖状、分岐鎖状、環状のいずれでもよく、炭素原子数は1~15が好ましい。
 R”が直鎖状もしくは分岐鎖状のアルキル基の場合は、炭素原子数1~10であることが好ましく、炭素原子数1~5であることがさらに好ましく、メチル基またはエチル基であることが特に好ましい。
 R”が環状のアルキル基の場合は、炭素原子数3~15であることが好ましく、炭素原子数4~12であることがさらに好ましく、炭素原子数5~10が最も好ましい。具体的には、フッ素原子またはフッ素化アルキル基で置換されていてもよいし、されていなくてもよいモノシクロアルカンから1個以上の水素原子を除いた基;ビシクロアルカン、トリシクロアルカン、テトラシクロアルカンなどのポリシクロアルカンから1個以上の水素原子を除いた基などを例示できる。より具体的には、シクロペンタン、シクロヘキサン等のモノシクロアルカンから1個以上の水素原子を除いた基;アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカンなどのポリシクロアルカンから1個以上の水素原子を除いた基などが挙げられる。
 R”におけるラクトン含有環式基としては、前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表される基と同様のものが挙げられる。
 Ra’21におけるヒドロキシアルキル基としては、炭素原子数が1~6であるものが好ましく、具体的には、前記Ra’21におけるアルキル基の水素原子の少なくとも1つが水酸基で置換された基が挙げられる。
In --COOR" and --OC(.dbd.O)R" in Ra' 21 , R" is both a hydrogen atom, an alkyl group, or a lactone-containing cyclic group.
The alkyl group for R″ may be linear, branched, or cyclic, and preferably has 1 to 15 carbon atoms.
When R″ is a linear or branched alkyl group, it preferably has 1 to 10 carbon atoms, more preferably 1 to 5 carbon atoms, and is particularly preferably a methyl group or an ethyl group.
When R" is a cyclic alkyl group, it preferably has 3 to 15 carbon atoms, more preferably 4 to 12 carbon atoms, and most preferably 5 to 10 carbon atoms. Specific examples include groups in which one or more hydrogen atoms have been removed from a monocycloalkane which may or may not be substituted with a fluorine atom or a fluorinated alkyl group; and groups in which one or more hydrogen atoms have been removed from a polycycloalkane such as a bicycloalkane, tricycloalkane, or tetracycloalkane. More specific examples include groups in which one or more hydrogen atoms have been removed from a monocycloalkane such as cyclopentane or cyclohexane; and groups in which one or more hydrogen atoms have been removed from a polycycloalkane such as adamantane, norbornane, isobornane, tricyclodecane, or tetracyclododecane.
Examples of the lactone-containing cyclic group for R″ include the same groups as those represented by the general formulae (a2-r-1) to (a2-r-7).
The hydroxyalkyl group in Ra' 21 preferably has 1 to 6 carbon atoms, and specific examples include the alkyl group in Ra' 21 in which at least one hydrogen atom has been substituted with a hydroxyl group.
 Ra’21としては、上記の中でも、それぞれ独立に水素原子又はシアノ基であることが好ましい。 Among the above, it is preferable that Ra'21 each independently represents a hydrogen atom or a cyano group.
 前記一般式(a2-r-2)、(a2-r-3)、(a2-r-5)中、A”における炭素原子数1~5のアルキレン基としては、直鎖状または分岐鎖状のアルキレン基が好ましく、メチレン基、エチレン基、n-プロピレン基、イソプロピレン基等が挙げられる。該アルキレン基が酸素原子または硫黄原子を含む場合、その具体例としては、前記アルキレン基の末端または炭素原子間に-O-または-S-が介在する基が挙げられ、例えば、-O-CH-、-CH-O-CH-、-S-CH-、-CH-S-CH-等が挙げられる。A”としては、炭素原子数1~5のアルキレン基または-O-が好ましく、炭素原子数1~5のアルキレン基がより好ましく、メチレン基が最も好ましい。 In the general formulae (a2-r-2), (a2-r-3) and (a2-r-5), the alkylene group having 1 to 5 carbon atoms in A" is preferably a straight-chain or branched-chain alkylene group, such as a methylene group, an ethylene group, an n-propylene group or an isopropylene group. When the alkylene group contains an oxygen atom or a sulfur atom, specific examples thereof include groups in which -O- or -S- is present at the terminal or between the carbon atoms of the alkylene group, such as -O-CH 2 -, -CH 2 -O-CH 2 -, -S-CH 2 - and -CH 2 -S-CH 2 -. A" is preferably an alkylene group having 1 to 5 carbon atoms or -O-, more preferably an alkylene group having 1 to 5 carbon atoms, and most preferably a methylene group.
 下記に一般式(a2-r-1)~(a2-r-7)でそれぞれ表される基の具体例を挙げる。 Specific examples of the groups represented by general formulas (a2-r-1) to (a2-r-7) are listed below.
Figure JPOXMLDOC01-appb-C000044
Figure JPOXMLDOC01-appb-C000044
Figure JPOXMLDOC01-appb-C000045
Figure JPOXMLDOC01-appb-C000045
 構成単位(a2)としては、なかでも、α位の炭素原子に結合した水素原子が置換基で置換されていてもよいアクリル酸エステルから誘導される構成単位が好ましい。
 かかる構成単位(a2)は、下記一般式(a2-1)で表される構成単位であることが好ましい。
Of the various possibilities, the structural unit (a2) is preferably a structural unit derived from an acrylate ester in which the hydrogen atom bonded to the carbon atom at the α-position may be substituted with a substituent.
The structural unit (a2) is preferably a structural unit represented by general formula (a2-1) shown below.
Figure JPOXMLDOC01-appb-C000046
[式中、Rは水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基である。Ya21は単結合または2価の連結基である。La21は-O-、-COO-、-CON(R’)-、-OCO-、-CONHCO-又は-CONHCS-であり、R’は水素原子またはメチル基を示す。ただしLa21が-O-の場合、Ya21は-CO-にはならない。Ra21はラクトン含有環式基である。]
Figure JPOXMLDOC01-appb-C000046
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. Ya 21 is a single bond or a divalent linking group. La 21 is -O-, -COO-, -CON(R')-, -OCO-, -CONHCO-, or -CONHCS-, and R' represents a hydrogen atom or a methyl group. However, when La 21 is -O-, Ya 21 does not become -CO-. Ra 21 is a lactone-containing cyclic group.]
 前記式(a2-1)中、Rは前記と同じである。Rとしては、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のフッ素化アルキル基が好ましく、工業上の入手の容易さから、水素原子又はメチル基が特に好ましい。 In the formula (a2-1), R is the same as above. R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms, and from the viewpoint of industrial availability, a hydrogen atom or a methyl group is particularly preferred.
 前記式(a2-1)中、Ya21における2価の連結基としては、特に限定されないが、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基等が好適に挙げられる。 In the formula (a2-1), the divalent linking group for Ya 21 is not particularly limited, but suitable examples include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
 Ya21としては、単結合、エステル結合[-C(=O)-O-]、エーテル結合(-O-)、直鎖状若しくは分岐鎖状のアルキレン基、又はこれらの組合せであることが好ましい。 Ya 21 is preferably a single bond, an ester bond [--C(.dbd.O)--O--], an ether bond (--O--), a linear or branched alkylene group, or a combination thereof.
 前記式(a2-1)中、Ya21は、単結合であり、La21は、-COO-、又は、-OCO-、であることが好ましい。 In the formula (a2-1), it is preferable that Ya 21 is a single bond, and La 21 is --COO-- or --OCO--.
 前記式(a2-1)中、Ra21はラクトン含有環式基である。
 Ra21におけるラクトン含有環式基としてはそれぞれ、前述した一般式(a2-r-1)~(a2-r-7)でそれぞれ表される基が好適に挙げられる。
In the above formula (a2-1), Ra 21 represents a lactone-containing cyclic group.
Suitable examples of the lactone-containing cyclic group for Ra 21 include the groups represented by the above-mentioned general formulae (a2-r-1) to (a2-r-7), respectively.
 (A1)成分が有する構成単位(a2)は、1種でもよく2種以上でもよい。
 (A1)成分が構成単位(a2)を有する場合、構成単位(a2)の割合は、当該(A1)成分を構成する全構成単位の合計(100モル%)に対して、1~20モル%であることが好ましく、1~15モル%であることがより好ましく、1~10モル%であることがさらに好ましい。
 構成単位(a2)の割合を好ましい下限値以上とすると、前述した効果によって、構成単位(a2)を含有させることによる効果が充分に得られ、上限値以下であると、他の構成単位とのバランスを取ることができ、種々のリソグラフィー特性が良好となる。
The structural unit (a2) contained in the component (A1) may be of one type, or two or more types.
When the component (A1) contains the structural unit (a2), the proportion of the structural unit (a2) is preferably 1 to 20 mol %, more preferably 1 to 15 mol %, and even more preferably 1 to 10 mol %, based on the total (100 mol %) of all structural units constituting the component (A1).
When the proportion of the structural unit (a2) is at least as large as the preferable lower limit, the effects achieved by including the structural unit (a2) can be fully obtained due to the effects described above. When the proportion of the structural unit (a2) is no more than the upper limit, a balance with other structural units can be achieved, and various lithography properties become favorable.
 構成単位(a8)について:
 構成単位(a8)は、下記一般式(a8-1)で表される化合物から誘導される構成単位である。
 但し、構成単位(a0)に該当するものは除かれる。
Regarding the structural unit (a8):
The structural unit (a8) is a structural unit derived from a compound represented by general formula (a8-1) shown below.
However, those corresponding to the structural unit (a0) are excluded.
Figure JPOXMLDOC01-appb-C000047
[式中、Wは、重合性基含有基である。Yax2は、単結合又は(nax2+1)価の連結基である。Yax2とWとは縮合環を形成していてもよい。Rは炭素数1~12のフッ素化アルキル基である。Rはフッ素原子を有してもよい炭素数1~12の有機基又は水素原子である。R及びYax2は、相互に結合して相互に結合して環構造を形成していてもよい。nax2は、1~3の整数である。]
Figure JPOXMLDOC01-appb-C000047
[Wherein, W2 is a polymerizable group-containing group. Yax2 is a single bond or a (n ax2 +1)-valent linking group. Yax2 and W2 may form a condensed ring. R1 is a fluorinated alkyl group having 1 to 12 carbon atoms. R2 is an organic group having 1 to 12 carbon atoms which may have a fluorine atom or a hydrogen atom. R2 and Yax2 may be bonded to each other to form a ring structure. n ax2 is an integer of 1 to 3.]
 Wの重合性基含有基における「重合性基」とは、重合性基を有する化合物がラジカル重合等により重合することを可能とする基であり、例えばエチレン性二重結合などの炭素原子間の多重結合を含む基をいう。 The "polymerizable group" in the polymerizable group-containing group of W2 is a group that enables a compound having a polymerizable group to be polymerized by radical polymerization or the like, and is, for example, a group that contains a multiple bond between carbon atoms, such as an ethylenic double bond.
 重合性基含有基としては、重合性基のみから構成される基でもよいし、重合性基と該重合性基以外の他の基とから構成される基でもよい。該重合性基以外の他の基としては、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基等が挙げられる。
 重合性基含有基としては、例えば、化学式:C(RX11)(RX12)=C(RX13)-Yax0-で表される基が好適に挙げられる。
 この化学式中、RX11、RX12及びRX13は、それぞれ、水素原子、炭素数1~5のアルキル基又は炭素数1~5のハロゲン化アルキル基であり、Yax0は、単結合または2価の連結基である。
The polymerizable group-containing group may be a group composed only of a polymerizable group, or may be a group composed of a polymerizable group and a group other than the polymerizable group. Examples of the group other than the polymerizable group include a divalent hydrocarbon group which may have a substituent, and a divalent linking group containing a hetero atom.
A suitable example of the polymerizable group-containing group is a group represented by the chemical formula: C(R x11 )(R x12 )=C(R x13 )-Ya x0 -.
In this chemical formula, R X11 , R X12 and R X13 each represent a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms, and Ya x0 represents a single bond or a divalent linking group.
 Yax2とWとが形成する縮合環としては、W部位の重合性基とYax2とが形成する縮合環、W部位の重合性基以外の他の基とYax2とが形成する縮合環が挙げられる。
 Yax2とWとが形成する縮合環は、置換基を有してもよい。
Examples of the fused ring formed by Ya x2 and W2 include a fused ring formed by the polymerizable group at the W2 site and Ya x2 , and a fused ring formed by Ya x2 and a group other than the polymerizable group at the W2 site.
The fused ring formed by Ya x2 and W 2 may have a substituent.
 以下に、構成単位(a8)の具体例を示す。
 下記の式中、Rαは、水素原子、メチル基又はトリフルオロメチル基を示す。
Specific examples of the structural unit (a8) are shown below.
In the following formula, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group.
Figure JPOXMLDOC01-appb-C000048
Figure JPOXMLDOC01-appb-C000048
 上記例示の中でも、構成単位(a8)は、化学式(a8-1-01)~(a8-1-04)、(a8-1-06)、(a8-1-08)、(a8-1-09)、及び、(a8-1-10)でそれぞれ表される構成単位からなる群より選択される少なくとも1種が好ましく、化学式(a8-1-01)~(a8-1-04)、(a8-1-09)でそれぞれ表される構成単位からなる群より選択される少なくとも1種がより好ましい。 Among the above examples, the structural unit (a8) is preferably at least one selected from the group consisting of structural units represented by the chemical formulas (a8-1-01) to (a8-1-04), (a8-1-06), (a8-1-08), (a8-1-09), and (a8-1-10), and more preferably at least one selected from the group consisting of structural units represented by the chemical formulas (a8-1-01) to (a8-1-04), and (a8-1-09).
 (A1)成分が有する構成単位(a8)は、1種でもよく2種以上でもよい。
 (A1)成分における構成単位(a8)の割合は、当該(A1)成分を構成する全構成単位の合計(100モル%)に対して、50モル%以下であることが好ましく、0~30モル%であることがより好ましい。
The structural unit (a8) contained in the component (A1) may be of one type, or two or more types.
The amount of the structural unit (a8) in the component (A1) relative to the total amount (100 mol %) of all structural units constituting the component (A1), is preferably no more than 50 mol %, and more preferably from 0 to 30 mol %.
 レジスト組成物が含有する(A1)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。
 本実施形態のレジスト組成物において、(A1)成分は、構成単位(a0)の繰り返し構造を有する高分子化合物が挙げられる。
 (A1)成分としては、上記の中でも、構成単位(a0)と構成単位(a10)との繰り返し構造を含む高分子化合物、構成単位(a0)と構成単位(a10)と構成単位(a1)の繰り返し構造を含む高分子化合物、構成単位(a0)と構成単位(a10)と構成単位(a2)の繰り返し構造を含む高分子化合物が好適に挙げられる。
The component (A1) contained in the resist composition may use either a single type of compound, or a combination of two or more types of compounds.
In the resist composition of this embodiment, the component (A1) can be a polymeric compound that has a repeating structure of the structural unit (a0).
Among the above, suitable examples of the component (A1) include polymeric compounds that include a repeating structure of the structural unit (a0) and the structural unit (a10), polymeric compounds that include a repeating structure of the structural unit (a0), the structural unit (a10), and the structural unit (a1), and polymeric compounds that include a repeating structure of the structural unit (a0), the structural unit (a10), and the structural unit (a2).
 構成単位(a0)と構成単位(a10)との繰り返し構造を有する高分子化合物において、構成単位(a0)の割合は、該高分子化合物を構成する全構成単位の合計(100モル%)に対して、20~80モル%が好ましく、25~75モル%がより好ましく、30~70モル%が更に好ましく、35~65モル%が特に好ましい。
 また、該高分子化合物中の構成単位(a10)の割合は、該高分子化合物を構成する全構成単位の合計(100モル%)に対して、20~80モル%が好ましく、25~75モル%がより好ましく、30~70モル%が更に好ましく、35~65モル%が特に好ましい。
In polymeric compounds having a repeating structure of the structural unit (a0) and the structural unit (a10), the proportion of the structural unit (a0) relative to the total amount (100 mol%) of all structural units constituting the polymeric compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
Furthermore, the proportion of the structural unit (a10) in the polymer compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%, based on the total (100 mol%) of all structural units constituting the polymer compound.
 構成単位(a0)と構成単位(a10)と構成単位(a1)との繰り返し構造を有する高分子化合物において、構成単位(a0)の割合は、該高分子化合物を構成する全構成単位の合計(100モル%)に対して、20~80モル%が好ましく、25~75モル%がより好ましく、30~70モル%が更に好ましく、35~65モル%が特に好ましい。
 また、該高分子化合物中の構成単位(a10)の割合は、該高分子化合物を構成する全構成単位の合計(100モル%)に対して、20~80モル%が好ましく、25~75モル%がより好ましく、30~70モル%が更に好ましく、35~65モル%が特に好ましい。
 また、該高分子化合物中の構成単位(a1)の割合は、該高分子化合物を構成する全構成単位の合計(100モル%)に対して、1~25モル%が好ましく、2~20モル%がより好ましく、3~15モル%が更に好ましく、5~12モル%が特に好ましい。
In polymeric compounds having a repeating structure of the structural unit (a0), the structural unit (a10), and the structural unit (a1), the proportion of the structural unit (a0) relative to the total amount (100 mol%) of all structural units constituting the polymeric compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
Furthermore, the proportion of the structural unit (a10) in the polymer compound, relative to the total (100 mol%) of all structural units constituting the polymer compound, is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
Furthermore, the proportion of the structural unit (a1) in the polymer compound is preferably from 1 to 25 mol%, more preferably from 2 to 20 mol%, even more preferably from 3 to 15 mol%, and particularly preferably from 5 to 12 mol%, based on the total (100 mol%) of all structural units constituting the polymer compound.
 構成単位(a0)と構成単位(a10)と構成単位(a2)との繰り返し構造を有する高分子化合物において、構成単位(a0)の割合は、該高分子化合物を構成する全構成単位の合計(100モル%)に対して、20~80モル%が好ましく、25~75モル%がより好ましく、30~70モル%が更に好ましく、35~65モル%が特に好ましい。
 また、該高分子化合物中の構成単位(a10)の割合は、該高分子化合物を構成する全構成単位の合計(100モル%)に対して、20~80モル%が好ましく、25~75モル%がより好ましく、30~70モル%が更に好ましく、35~65モル%が特に好ましい。
 また、該高分子化合物中の構成単位(a2)の割合は、該高分子化合物を構成する全構成単位の合計(100モル%)に対して、1~25モル%が好ましく、2~20モル%がより好ましく、3~15モル%が更に好ましく、5~12モル%が特に好ましい。
In polymeric compounds having a repeating structure of the structural unit (a0), the structural unit (a10), and the structural unit (a2), the proportion of the structural unit (a0) relative to the total amount (100 mol%) of all structural units constituting the polymeric compound is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
Furthermore, the proportion of the structural unit (a10) in the polymer compound, relative to the total (100 mol%) of all structural units constituting the polymer compound, is preferably from 20 to 80 mol%, more preferably from 25 to 75 mol%, even more preferably from 30 to 70 mol%, and particularly preferably from 35 to 65 mol%.
Furthermore, the proportion of the structural unit (a2) in the polymer compound is preferably from 1 to 25 mol%, more preferably from 2 to 20 mol%, even more preferably from 3 to 15 mol%, and particularly preferably from 5 to 12 mol%, based on the total (100 mol%) of all structural units constituting the polymer compound.
 かかる(A1)成分は、各構成単位を誘導するモノマーを重合溶媒に溶解し、ここに、例えばアゾビスイソブチロニトリル(AIBN)、アゾビスイソ酪酸ジメチル(例えばV-601など)等のラジカル重合開始剤を加えて重合することにより製造することができる。
 あるいは、かかる(A1)成分は、構成単位(a0)を誘導するモノマーと、必要に応じて構成単位(a0)以外の構成単位(例えば、構成単位(a10))を誘導するモノマーと、を重合溶媒に溶解し、ここに、上記のようなラジカル重合開始剤を加えて重合し、その後、脱保護反応を行うことにより製造することができる。
 なお、重合の際に、例えば、HS-CH-CH-CH-C(CF-OHのような連鎖移動剤を併用して用いることにより、末端に-C(CF-OH基を導入してもよい。このように、アルキル基の水素原子の一部がフッ素原子で置換されたヒドロキシアルキル基が導入された共重合体は、現像欠陥の低減やLER(ラインエッジラフネス:ライン側壁の不均一な凹凸)の低減に有効である。
The component (A1) can be produced by dissolving monomers from which each structural unit is derived in a polymerization solvent, and then adding a radical polymerization initiator such as azobisisobutyronitrile (AIBN) or dimethyl azobisisobutyrate (e.g., V-601), and polymerizing the resulting mixture.
Alternatively, the component (A1) can be produced by dissolving a monomer that derives the structural unit (a0) and, if necessary, a monomer that derives a structural unit other than the structural unit (a0) (for example, the structural unit (a10)) in a polymerization solvent, adding the above-mentioned radical polymerization initiator to the resulting solution to polymerize, and then carrying out a deprotection reaction.
During polymerization, a chain transfer agent such as HS-CH 2 -CH 2 -CH 2 -C(CF 3 ) 2 -OH may be used in combination to introduce a -C(CF 3 ) 2 -OH group to the end. A copolymer having a hydroxyalkyl group in which some of the hydrogen atoms of the alkyl group are substituted with fluorine atoms in this way is effective in reducing development defects and LER (line edge roughness: non-uniform unevenness of the line sidewalls).
 (A1)成分の重量平均分子量(Mw)(ゲルパーミエーションクロマトグラフィー(GPC)によるポリスチレン換算基準)は、特に限定されるものではなく、1000~50000が好ましく、2000~30000がより好ましく、3000~20000がさらに好ましい。
 (A1)成分のMwがこの範囲の好ましい上限値以下であると、レジストとして用いるのに充分なレジスト溶剤への溶解性があり、この範囲の好ましい下限値以上であると、耐ドライエッチング性やレジストパターン断面形状が良好である。
 (A1)成分の分散度(Mw/Mn)は、特に限定されず、1.0~4.0が好ましく、1.0~3.0がより好ましく、1.0~2.0が特に好ましい。なお、Mnは数平均分子量を示す。
The weight average molecular weight (Mw) of the component (A1) (based on polystyrene equivalent by gel permeation chromatography (GPC)) is not particularly limited, but is preferably 1,000 to 50,000, more preferably 2,000 to 30,000, and even more preferably 3,000 to 20,000.
When the Mw of the component (A1) is no more than the preferred upper limit of this range, the compound has sufficient solubility in a resist solvent for use as a resist, and when it is no less than the preferred lower limit of this range, the compound has good dry etching resistance and good cross-sectional shape of the resist pattern.
The dispersity (Mw/Mn) of the component (A1) is not particularly limited, but is preferably from 1.0 to 4.0, more preferably from 1.0 to 3.0, and particularly preferably from 1.0 to 2.0, where Mn represents the number average molecular weight.
 ・(A2)成分について
 本実施形態のレジスト組成物は、(A)成分として、前記(A1)成分に該当しない、酸の作用により現像液に対する溶解性が変化する基材成分(以下「(A2)成分」という。)を併用してもよい。
 (A2)成分としては、特に限定されず、化学増幅型レジスト組成物用の基材成分として従来から知られている多数のものから任意に選択して用いればよい。
 (A2)成分は、高分子化合物又は低分子化合物の1種を単独で用いてもよく2種以上を組み合わせて用いてもよい。
Regarding the Component (A2) The resist composition of this embodiment may use, as the component (A), a base component (A2) (hereafter referred to as the component (A2)) that does not fall under the category of the component (A1) above and whose solubility in a developer changes under the action of an acid.
There are no particular restrictions on the component (A2), and any of the many compounds conventionally known as base components for chemically amplified resist compositions can be used.
The component (A2) may be a polymeric compound or a low molecular weight compound, and may be a combination of two or more of these.
 (A)成分中の(A1)成分の割合は、(A)成分の総質量に対し、25質量%以上が好ましく、50質量%以上がより好ましく、75質量%以上がさらに好ましく、100質量%であってもよい。該割合が25質量%以上であると、高感度化や解像性、ラフネス改善などの種々のリソグラフィー特性に優れたレジストパターンが形成されやすくなる。 The proportion of component (A1) in component (A) is preferably 25% by mass or more, more preferably 50% by mass or more, even more preferably 75% by mass or more, and may be 100% by mass, based on the total mass of component (A). If the proportion is 25% by mass or more, a resist pattern that is excellent in various lithography properties such as high sensitivity, resolution, and improved roughness is easily formed.
 本実施形態のレジスト組成物中、(A)成分の含有量は、形成しようとするレジスト膜厚等に応じて調整すればよい。 The content of component (A) in the resist composition of this embodiment may be adjusted according to the thickness of the resist film to be formed, etc.
 <その他成分>
 本実施形態のレジスト組成物は、上述した(A)成分及び(B)成分に加え、その他成分をさらに含有してもよい。その他成分としては、例えば以下に示す(B)成分、(D)成分、(E)成分、(F)成分、(S)成分などが挙げられる。
<Other ingredients>
The resist composition of this embodiment may further contain other components in addition to the above-mentioned components (A) and (B). Examples of the other components include the following components (B), (D), (E), (F), and (S).
 ≪酸発生剤成分(B)≫
 本実施形態のレジスト組成物は、さらに、露光により酸を発生する酸発生剤成分(B)を含有することが好ましい。
 (B)成分としては、特に限定されず、これまで化学増幅型レジスト組成物用の酸発生剤として提案されているものを用いることができる。
 このような酸発生剤としては、ヨードニウム塩やスルホニウム塩などのオニウム塩系酸発生剤、オキシムスルホネート系酸発生剤;ビスアルキル又はビスアリールスルホニルジアゾメタン類、ポリ(ビススルホニル)ジアゾメタン類などのジアゾメタン系酸発生剤;ニトロベンジルスルホネート系酸発生剤、イミノスルホネート系酸発生剤、ジスルホン系酸発生剤など多種のものが挙げられる。
<Acid generator component (B)>
The resist composition of this embodiment preferably further contains an acid generator component (B) that generates an acid upon exposure.
There are no particular limitations on the component (B), and any of the acid generators that have been proposed so far for use in chemically amplified resist compositions can be used.
Examples of such acid generators include onium salt-based acid generators such as iodonium salts and sulfonium salts, oxime sulfonate-based acid generators, diazomethane-based acid generators such as bisalkyl- or bisarylsulfonyl diazomethanes and poly(bissulfonyl) diazomethanes, nitrobenzylsulfonate-based acid generators, iminosulfonate-based acid generators, and disulfone-based acid generators.
 オニウム塩系酸発生剤としては、例えば、下記の一般式(b-1)で表される化合物(以下「(b-1)成分」ともいう)、一般式(b-2)で表される化合物(以下「(b-2)成分」ともいう)又は一般式(b-3)で表される化合物(以下「(b-3)成分」ともいう)が挙げられる。 Examples of onium salt acid generators include a compound represented by the following general formula (b-1) (hereinafter also referred to as "component (b-1)"), a compound represented by general formula (b-2) (hereinafter also referred to as "component (b-2)"), or a compound represented by general formula (b-3) (hereinafter also referred to as "component (b-3)").
 オニウム塩系酸発生剤としては、例えば、下記の一般式(b-1)で表される化合物(以下「(b-1)成分」ともいう)、一般式(b-2)で表される化合物(以下「(b-2)成分」ともいう)又は一般式(b-3)で表される化合物(以下「(b-3)成分」ともいう)が挙げられる。 Examples of onium salt acid generators include a compound represented by the following general formula (b-1) (hereinafter also referred to as "component (b-1)"), a compound represented by general formula (b-2) (hereinafter also referred to as "component (b-2)"), or a compound represented by general formula (b-3) (hereinafter also referred to as "component (b-3)").
Figure JPOXMLDOC01-appb-C000049
[式中、R101及びR104~R108は、それぞれ独立に、置換基を有していてもよい環式基、置換基を有していてもよい鎖状のアルキル基、又は置換基を有していてもよい鎖状のアルケニル基である。R104とR105とは相互に結合して環構造を形成していてもよい。R102は、炭素数1~5のフッ素化アルキル基又はフッ素原子である。Y101は、酸素原子を含む2価の連結基又は単結合である。V101~V103は、それぞれ独立に、単結合、アルキレン基又はフッ素化アルキレン基である。L101~L102は、それぞれ独立に、単結合又は酸素原子である。L103~L105は、それぞれ独立に、単結合、-CO-又は-SO-である。mは1以上の整数であって、M’m+はm価のオニウムカチオンである。]
Figure JPOXMLDOC01-appb-C000049
[In the formula, R 101 and R 104 to R 108 are each independently a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent. R 104 and R 105 may be bonded to each other to form a ring structure. R 102 is a fluorinated alkyl group having 1 to 5 carbon atoms or a fluorine atom. Y 101 is a divalent linking group containing an oxygen atom or a single bond. V 101 to V 103 are each independently a single bond, an alkylene group, or a fluorinated alkylene group. L 101 to L 102 are each independently a single bond or an oxygen atom. L 103 to L 105 are each independently a single bond, -CO-, or -SO 2 -. m is an integer of 1 or more, and M' m+ is an m-valent onium cation.]
 {アニオン部}
 ・(b-1)成分におけるアニオン
 式(b-1)中、R101は、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基である。
{anion portion}
Anion in Component (b-1) In formula (b-1), R 101 represents a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent.
 置換基を有してもよい環式基:
 該環式基は、環状の炭化水素基であることが好ましく、該環状の炭化水素基は、芳香族炭化水素基であってもよく、脂肪族炭化水素基であってもよい。脂肪族炭化水素基は、芳香族性を持たない炭化水素基を意味する。また、脂肪族炭化水素基は、飽和であることが好ましい。
Optionally substituted cyclic group:
The cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group. An aliphatic hydrocarbon group means a hydrocarbon group that does not have aromaticity. In addition, the aliphatic hydrocarbon group is preferably saturated.
 R101における芳香族炭化水素基は、芳香環を有する炭化水素基である。該芳香族炭化水素基の炭素原子数は3~30であることが好ましく、5~30であることがより好ましく、5~20がさらに好ましく、6~15が特に好ましく、6~10が最も好ましい。但し、該炭素原子数には、置換基における炭素原子数を含まないものとする。
 R101における芳香族炭化水素基が有する芳香環として具体的には、ベンゼン、フルオレン、ナフタレン、アントラセン、フェナントレン、ビフェニル、又はこれらの芳香環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環などが挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。
 R101における芳香族炭化水素基として具体的には、前記芳香環から水素原子を1つ除いた基(アリール基:例えば、フェニル基、ナフチル基など)、前記芳香環の水素原子の1つがアルキレン基で置換された基(例えば、ベンジル基、フェネチル基、1-ナフチルメチル基など)等が挙げられる。前記アルキレン基(アリールアルキル基中のアルキル鎖)の炭素原子数は、1~4であることが好ましく、1~2であることがより好ましく、1であることが特に好ましい。
The aromatic hydrocarbon group for R 101 is a hydrocarbon group having an aromatic ring. The number of carbon atoms in the aromatic hydrocarbon group is preferably 3 to 30, more preferably 5 to 30, even more preferably 5 to 20, particularly preferably 6 to 15, and most preferably 6 to 10. However, this number of carbon atoms does not include the number of carbon atoms in the substituent.
Specific examples of the aromatic ring contained in the aromatic hydrocarbon group in R 101 include benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, and aromatic heterocycles in which a part of the carbon atoms constituting these aromatic rings are substituted with heteroatoms, etc. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom.
Specific examples of the aromatic hydrocarbon group for R 101 include a group in which one hydrogen atom has been removed from the aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one hydrogen atom of the aromatic ring has been substituted with an alkylene group (for example, a benzyl group, a phenethyl group, a 1-naphthylmethyl group, etc.), etc. The number of carbon atoms in the alkylene group (the alkyl chain in the arylalkyl group) is preferably 1 to 4, more preferably 1 to 2, and particularly preferably 1.
 R101における環状の脂肪族炭化水素基は、構造中に環を含む脂肪族炭化水素基が挙げられる。
 この構造中に環を含む脂肪族炭化水素基としては、脂環式炭化水素基(脂肪族炭化水素環から水素原子を1個除いた基)、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の末端に結合した基、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の途中に介在する基などが挙げられる。
 前記脂環式炭化水素基は、炭素原子数が3~20であることが好ましく、3~12であることがより好ましい。
 前記脂環式炭化水素基は、多環式基であってもよく、単環式基であってもよい。単環式の脂環式炭化水素基としては、モノシクロアルカンから1個以上の水素原子を除いた基が好ましい。該モノシクロアルカンとしては、炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。多環式の脂環式炭化水素基としては、ポリシクロアルカンから1個以上の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては、炭素原子数7~30のものが好ましい。中でも、該ポリシクロアルカンとしては、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等の架橋環系の多環式骨格を有するポリシクロアルカン;ステロイド骨格を有する環式基等の縮合環系の多環式骨格を有するポリシクロアルカンがより好ましい。
The cyclic aliphatic hydrocarbon group for R 101 includes an aliphatic hydrocarbon group containing a ring in the structure.
Examples of the aliphatic hydrocarbon group that contains a ring in its structure include alicyclic hydrocarbon groups (groups in which one hydrogen atom has been removed from an aliphatic hydrocarbon ring), groups in which an alicyclic hydrocarbon group is bonded to the end of a straight-chain or branched-chain aliphatic hydrocarbon group, and groups in which an alicyclic hydrocarbon group is present in the middle of a straight-chain or branched-chain aliphatic hydrocarbon group.
The alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, and more preferably has 3 to 12 carbon atoms.
The alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group. The monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a monocycloalkane. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 30 carbon atoms. Among them, the polycycloalkane is more preferably a polycycloalkane having a polycyclic skeleton of a bridged ring system such as adamantane, norbornane, isobornane, tricyclodecane, or tetracyclododecane; or a polycycloalkane having a polycyclic skeleton of a condensed ring system such as a cyclic group having a steroid skeleton.
 なかでも、R101における環状の脂肪族炭化水素基としては、モノシクロアルカンまたはポリシクロアルカンから水素原子を1つ以上除いた基が好ましく、ポリシクロアルカンから水素原子を1つ除いた基がより好ましく、アダマンチル基、ノルボルニル基がさらに好ましく、アダマンチル基が特に好ましい。 Among these, the cyclic aliphatic hydrocarbon group for R 101 is preferably a group in which one or more hydrogen atoms have been removed from a monocycloalkane or polycycloalkane, more preferably a group in which one hydrogen atom has been removed from a polycycloalkane, further preferably an adamantyl group or a norbornyl group, and particularly preferably an adamantyl group.
 脂環式炭化水素基に結合してもよい、直鎖状の脂肪族炭化水素基は、炭素原子数が1~10であることが好ましく、1~6がより好ましく、1~4がさらに好ましく、1~3が最も好ましい。直鎖状の脂肪族炭化水素基としては、直鎖状のアルキレン基が好ましく、具体的には、メチレン基[-CH-]、エチレン基[-(CH-]、トリメチレン基[-(CH-]、テトラメチレン基[-(CH-]、ペンタメチレン基[-(CH-]等が挙げられる。
 脂環式炭化水素基に結合してもよい、分岐鎖状の脂肪族炭化水素基は、炭素原子数が2~10であることが好ましく、3~6がより好ましく、3又は4がさらに好ましく、3が最も好ましい。分岐鎖状の脂肪族炭化水素基としては、分岐鎖状のアルキレン基が好ましく、具体的には、-CH(CH)-、-CH(CHCH)-、-C(CH-、-C(CH)(CHCH)-、-C(CH)(CHCHCH)-、-C(CHCH-等のアルキルメチレン基;-CH(CH)CH-、-CH(CH)CH(CH)-、-C(CHCH-、-CH(CHCH)CH-、-C(CHCH-CH-等のアルキルエチレン基;-CH(CH)CHCH-、-CHCH(CH)CH-等のアルキルトリメチレン基;-CH(CH)CHCHCH-、-CHCH(CH)CHCH-等のアルキルテトラメチレン基などのアルキルアルキレン基等が挙げられる。アルキルアルキレン基におけるアルキル基としては、炭素原子数1~5の直鎖状のアルキル基が好ましい。
The linear aliphatic hydrocarbon group which may be bonded to the alicyclic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6, even more preferably 1 to 4, and most preferably 1 to 3. As the linear aliphatic hydrocarbon group, linear alkylene groups are preferred, and specific examples thereof include a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [-(CH 2 ) 3 -], a tetramethylene group [-(CH 2 ) 4 -], a pentamethylene group [-(CH 2 ) 5 -], and the like.
The branched aliphatic hydrocarbon group which may be bonded to the alicyclic hydrocarbon group preferably has 2 to 10 carbon atoms, more preferably 3 to 6 carbon atoms, even more preferably 3 or 4 carbon atoms, and most preferably 3 carbon atoms. The branched aliphatic hydrocarbon group is preferably a branched alkylene group, and specific examples thereof include alkylmethylene groups such as -CH( CH3 )-, -CH( CH2CH3 )-, -C( CH3 ) 2- , -C(CH3)(CH2CH3)-, -C(CH3)(CH2CH2CH3)-, and -C(CH2CH3 ) 2- ; alkylethylene groups such as -CH ( CH3 ) CH2- , -CH( CH3 )CH( CH3 ) - , -C( CH3 ) 2CH2- , -CH ( CH2CH3 ) CH2- , and -C( CH2CH3 ) 2 - CH2- ; and alkyl alkylene groups such as alkyl trimethylene groups such as -CH (CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -, etc. The alkyl group in the alkyl alkylene group is preferably a linear alkyl group having 1 to 5 carbon atoms.
 また、R101における環状の炭化水素基は、複素環等のようにヘテロ原子を含んでもよい。具体的には、前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基、下記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基、その他下記化学式(r-hr-1)~(r-hr-16)でそれぞれ表される複素環式基が挙げられる。式中*は、式(b-1)中のY101に結合する結合手を表す。 Furthermore, the cyclic hydrocarbon group in R 101 may contain a heteroatom, such as a heterocycle. Specific examples include the lactone-containing cyclic groups represented by the above general formulae (a2-r-1) to (a2-r-7), the -SO 2 -containing cyclic groups represented by the following general formulae (b5-r-1) to (b5-r-4), and other heterocyclic groups represented by the following chemical formulae (r-hr-1) to (r-hr-16). In the formulae, * represents a bond bonded to Y 101 in formula (b-1).
Figure JPOXMLDOC01-appb-C000050
[式中、Rb’51はそれぞれ独立に水素原子、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、-COOR”、-OC(=O)R”、ヒドロキシアルキル基またはシアノ基であり;R”は水素原子、アルキル基、ラクトン含有環式基、又は、-SO-含有環式基であり;B”は酸素原子もしくは硫黄原子を含んでいてもよい炭素原子数1~5のアルキレン基、酸素原子または硫黄原子であり、n’は0~2の整数である。*は結合手を示す。]
Figure JPOXMLDOC01-appb-C000050
[In the formula, Rb' 51 are each independently a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, -COOR", -OC(=O)R", a hydroxyalkyl group or a cyano group; R" is a hydrogen atom, an alkyl group, a lactone-containing cyclic group or an -SO 2 - containing cyclic group; B" is an alkylene group having 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom, an oxygen atom or a sulfur atom, and n' is an integer of 0 to 2. * represents a bond.]
 前記一般式(b5-r-1)~(b5-r-2)中、B”は、酸素原子もしくは硫黄原子を含んでいてもよい炭素原子数1~5のアルキレン基、酸素原子または硫黄原子である。
B”としては、炭素原子数1~5のアルキレン基または-O-が好ましく、炭素原子数1~5のアルキレン基がより好ましく、メチレン基がさらに好ましい。
In the general formulae (b5-r-1) and (b5-r-2), B" represents an alkylene group having 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom, an oxygen atom, or a sulfur atom.
B" is preferably an alkylene group having 1 to 5 carbon atoms or --O--, more preferably an alkylene group having 1 to 5 carbon atoms, and even more preferably a methylene group.
 前記一般式(b5-r-1)~(b5-r-4)中、Rb’51はそれぞれ独立に水素原子、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、-COOR”、-OC(=O)R”、ヒドロキシアルキル基またはシアノ基であり、その中でも、それぞれ独立に水素原子又はシアノ基であることが好ましい。 In the general formulae (b5-r-1) to (b5-r-4), Rb'51 each independently represents a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, -COOR", -OC(=O)R", a hydroxyalkyl group or a cyano group, and among these, it is preferable that they each independently represent a hydrogen atom or a cyano group.
 下記に一般式(b5-r-1)~(b5-r-4)でそれぞれ表される基の具体例を挙げる。式中の「Ac」は、アセチル基を示す。 Specific examples of groups represented by general formulas (b5-r-1) to (b5-r-4) are listed below. "Ac" in the formulas represents an acetyl group.
Figure JPOXMLDOC01-appb-C000051
Figure JPOXMLDOC01-appb-C000051
Figure JPOXMLDOC01-appb-C000052
Figure JPOXMLDOC01-appb-C000052
Figure JPOXMLDOC01-appb-C000053
Figure JPOXMLDOC01-appb-C000053
Figure JPOXMLDOC01-appb-C000054
Figure JPOXMLDOC01-appb-C000054
 R101の環式基における置換基としては、例えば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基等が挙げられる。
 置換基としてのアルキル基としては、炭素原子数1~5のアルキル基が好ましい。
 置換基としてのアルコキシ基としては、炭素原子数1~5のアルコキシ基が好ましく、メトキシ基、エトキシ基、n-プロポキシ基、iso-プロポキシ基、n-ブトキシ基、tert-ブトキシ基がより好ましく、メトキシ基、エトキシ基が最も好ましい。
 置換基としてのハロゲン原子としては、フッ素原子、臭素原子、ヨウ素原子が好ましい。
 置換基としてのハロゲン化アルキル基としては、炭素原子数1~5のアルキル基、例えばメチル基、エチル基、プロピル基、n-ブチル基、tert-ブチル基等の水素原子の一部または全部が前記ハロゲン原子で置換された基が挙げられる。
 置換基としてのカルボニル基は、環状の炭化水素基を構成するメチレン基(-CH-)を置換する基である。
Examples of the substituent in the cyclic group of R 101 include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, and a nitro group.
The alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms.
The alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group, or a tert-butoxy group, and most preferably a methoxy group or an ethoxy group.
As the halogen atom as a substituent, a fluorine atom, a bromine atom or an iodine atom is preferred.
Examples of the halogenated alkyl group as a substituent include alkyl groups having 1 to 5 carbon atoms, such as methyl, ethyl, propyl, n-butyl, and tert-butyl groups, in which some or all of the hydrogen atoms have been substituted with the above-mentioned halogen atoms.
The carbonyl group as a substituent is a group that substitutes a methylene group (-CH 2 -) that constitutes a cyclic hydrocarbon group.
 R101における環状の炭化水素基は、脂肪族炭化水素環と芳香環とが縮合した縮合環を含む縮合環式基であってもよい。前記縮合環としては、例えば、架橋環系の多環式骨格を有するポリシクロアルカンに、1個以上の芳香環が縮合したもの等が挙げられる。前記架橋環系ポリシクロアルカンの具体例としては、ビシクロ[2.2.1]ヘプタン(ノルボルナン)、ビシクロ[2.2.2]オクタン等のビシクロアルカンが挙げられる。前記縮合環式としては、ビシクロアルカンに2個又は3個の芳香環が縮合した縮合環を含む基が好ましく、ビシクロ[2.2.2]オクタンに2個又は3個の芳香環が縮合した縮合環を含む基がより好ましい。R101における縮合環式基の具体例としては、下記式(r-br-1)~(r-br-2)で表されるが挙げられる。式中*は、式(b-1)中のY101に結合する結合手を表す。 The cyclic hydrocarbon group in R 101 may be a fused ring group containing a fused ring in which an aliphatic hydrocarbon ring and an aromatic ring are fused. Examples of the fused ring include a polycycloalkane having a polycyclic skeleton of a bridged ring system to which one or more aromatic rings are fused. Specific examples of the bridged ring polycycloalkane include bicycloalkanes such as bicyclo[2.2.1]heptane (norbornane) and bicyclo[2.2.2]octane. The fused ring group is preferably a group containing a fused ring in which two or three aromatic rings are fused to a bicycloalkane, and more preferably a group containing a fused ring in which two or three aromatic rings are fused to a bicyclo[2.2.2]octane. Specific examples of the fused ring group in R 101 include those represented by the following formulae (r-br-1) to (r-br-2). In the formulae, * represents a bond bonded to Y 101 in formula (b-1).
Figure JPOXMLDOC01-appb-C000055
Figure JPOXMLDOC01-appb-C000055
 R101における縮合環式基が有していてもよい置換基としては、例えば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基、芳香族炭化水素基、脂環式炭化水素基等が挙げられる。
 前記縮合環式基の置換基としてのアルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基は、上記R101における環式基の置換基として挙げたものと同様のものが挙げられる。
 前記縮合環式基の置換基としての芳香族炭化水素基としては、芳香環から水素原子を1つ除いた基(アリール基:例えば、フェニル基、ナフチル基など)、前記芳香環の水素原子の1つがアルキレン基で置換された基(例えば、ベンジル基、フェネチル基、1-ナフチルメチル基、2-ナフチルメチル基、1-ナフチルエチル基、2-ナフチルエチル基等のアリールアルキル基など)、上記式(r-hr-1)~(r-hr-6)でそれぞれ表される複素環式基等が挙げられる。
 前記縮合環式基の置換基としての脂環式炭化水素基としては、シクロペンタン、シクロヘキサン等のモノシクロアルカンから1個の水素原子を除いた基;アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等のポリシクロアルカンから1個の水素原子を除いた基;前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基;前記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基;前記式(r-hr-7)~(r-hr-16)でそれぞれ表される複素環式基等が挙げられる。
Examples of the substituent that the fused cyclic group for R 101 may have include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an aromatic hydrocarbon group, and an alicyclic hydrocarbon group.
Examples of the alkyl group, alkoxy group, halogen atom and halogenated alkyl group as the substituent of the condensed cyclic group include the same as those exemplified as the substituent of the cyclic group in R 101 above.
Examples of the aromatic hydrocarbon group as the substituent of the fused ring group include a group in which one hydrogen atom has been removed from an aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one hydrogen atom of the aromatic ring has been substituted with an alkylene group (for example, an arylalkyl group such as a benzyl group, a phenethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group, a 2-naphthylethyl group, etc.), and the heterocyclic groups represented by the above formulas (r-hr-1) to (r-hr-6), respectively.
Examples of the alicyclic hydrocarbon group as a substituent of the fused cyclic group include groups in which one hydrogen atom has been removed from a monocycloalkane, such as cyclopentane or cyclohexane; groups in which one hydrogen atom has been removed from a polycycloalkane, such as adamantane, norbornane, isobornane, tricyclodecane or tetracyclododecane; lactone-containing cyclic groups represented by each of the general formulae (a2-r-1) to (a2-r-7); —SO 2 -containing cyclic groups represented by each of the general formulae (b5-r-1) to (b5-r-4); and heterocyclic groups represented by each of the formulae (r-hr-7) to (r-hr-16).
 置換基を有してもよい鎖状のアルキル基:
 R101の鎖状のアルキル基としては、直鎖状又は分岐鎖状のいずれでもよい。
直鎖状のアルキル基としては、炭素原子数が1~20であることが好ましく、1~15であることがより好ましく、1~10が最も好ましい。
 分岐鎖状のアルキル基としては、炭素原子数が3~20であることが好ましく、3~15であることがより好ましく、3~10が最も好ましい。具体的には、例えば、1-メチルエチル基、1-メチルプロピル基、2-メチルプロピル基、1-メチルブチル基、2-メチルブチル基、3-メチルブチル基、1-エチルブチル基、2-エチルブチル基、1-メチルペンチル基、2-メチルペンチル基、3-メチルペンチル基、4-メチルペンチル基などが挙げられる。
A chain alkyl group which may have a substituent:
The chain alkyl group for R 101 may be either a straight chain or a branched chain.
The linear alkyl group preferably has 1 to 20 carbon atoms, more preferably 1 to 15 carbon atoms, and most preferably 1 to 10 carbon atoms.
The branched alkyl group preferably has 3 to 20 carbon atoms, more preferably 3 to 15 carbon atoms, and most preferably 3 to 10 carbon atoms. Specific examples include a 1-methylethyl group, a 1-methylpropyl group, a 2-methylpropyl group, a 1-methylbutyl group, a 2-methylbutyl group, a 3-methylbutyl group, a 1-ethylbutyl group, a 2-ethylbutyl group, a 1-methylpentyl group, a 2-methylpentyl group, a 3-methylpentyl group, and a 4-methylpentyl group.
 置換基を有してもよい鎖状のアルケニル基:
 R101の鎖状のアルケニル基としては、直鎖状又は分岐鎖状のいずれでもよく、炭素原子数が2~10であることが好ましく、2~5がより好ましく、2~4がさらに好ましく、3が特に好ましい。直鎖状のアルケニル基としては、例えば、ビニル基、プロペニル基(アリル基)、ブテニル基などが挙げられる。分岐鎖状のアルケニル基としては、例えば、1-メチルビニル基、2-メチルビニル基、1-メチルプロペニル基、2-メチルプロペニル基などが挙げられる。
 鎖状のアルケニル基としては、上記の中でも、直鎖状のアルケニル基が好ましく、ビニル基、プロペニル基がより好ましく、ビニル基が特に好ましい。
A chain alkenyl group which may have a substituent:
The chain alkenyl group for R 101 may be either linear or branched, and preferably has 2 to 10 carbon atoms, more preferably 2 to 5, even more preferably 2 to 4, and particularly preferably 3. Examples of linear alkenyl groups include vinyl groups, propenyl groups (allyl groups), and butenyl groups. Examples of branched alkenyl groups include 1-methylvinyl groups, 2-methylvinyl groups, 1-methylpropenyl groups, and 2-methylpropenyl groups.
Of the above chain alkenyl groups, linear alkenyl groups are preferred, vinyl groups and propenyl groups are more preferred, and vinyl groups are particularly preferred.
 R101の鎖状のアルキル基またはアルケニル基における置換基としては、例えば、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基、アミノ基、上記R101における環式基等が挙げられる。 Examples of the substituent in the chain alkyl or alkenyl group of R 101 include an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, and the cyclic groups in R 101 above.
 式(b-1)中、Y101は、単結合または酸素原子を含む2価の連結基である。
 Y101が酸素原子を含む2価の連結基である場合、該Y101は、酸素原子以外の原子を含有してもよい。酸素原子以外の原子としては、例えば炭素原子、水素原子、硫黄原子、窒素原子等が挙げられる。
 酸素原子を含む2価の連結基としては、例えば下記一般式(y-al-1)~(y-al-7)でそれぞれ表される連結基が挙げられる。なお、下記一般式(y-al-1)~(y-al-7)において、上記式(b-1)中のR101と結合するのが、下記一般式(y-al-1)~(y-al-7)中のV’101である。
In formula (b-1), Y 101 is a single bond or a divalent linking group containing an oxygen atom.
When Y 101 is a divalent linking group containing an oxygen atom, Y 101 may contain an atom other than an oxygen atom. Examples of the atom other than an oxygen atom include a carbon atom, a hydrogen atom, a sulfur atom, and a nitrogen atom.
Examples of the divalent linking group containing an oxygen atom include linking groups represented by the following general formulae (y-al-1) to (y-al-7), respectively. In the following general formulae (y-al-1) to (y-al-7), what is bonded to R 101 in the above formula (b-1) is V' 101 in the following general formulae (y-al-1) to (y-al-7).
Figure JPOXMLDOC01-appb-C000056
[式中、V’101は単結合または炭素原子数1~5のアルキレン基であり、V’102は炭素原子数1~30の2価の飽和炭化水素基である。]
Figure JPOXMLDOC01-appb-C000056
[In the formula, V' 101 is a single bond or an alkylene group having 1 to 5 carbon atoms, and V' 102 is a divalent saturated hydrocarbon group having 1 to 30 carbon atoms.]
 V’102における2価の飽和炭化水素基は、炭素原子数1~30のアルキレン基であることが好ましく、炭素原子数1~10のアルキレン基であることがより好ましく、炭素原子数1~5のアルキレン基であることがさらに好ましい。 The divalent saturated hydrocarbon group for V' 102 is preferably an alkylene group having 1 to 30 carbon atoms, more preferably an alkylene group having 1 to 10 carbon atoms, and even more preferably an alkylene group having 1 to 5 carbon atoms.
 V’101およびV’102におけるアルキレン基としては、直鎖状のアルキレン基でもよく分岐鎖状のアルキレン基でもよく、直鎖状のアルキレン基が好ましい。
 V’101およびV’102におけるアルキレン基として、具体的には、メチレン基[-CH-];-CH(CH)-、-CH(CHCH)-、-C(CH-、-C(CH)(CHCH)-、-C(CH)(CHCHCH)-、-C(CHCH-等のアルキルメチレン基;エチレン基[-CHCH-];-CH(CH)CH-、-CH(CH)CH(CH)-、-C(CHCH-、-CH(CHCH)CH-等のアルキルエチレン基;トリメチレン基(n-プロピレン基)[-CHCHCH-];-CH(CH)CHCH-、-CHCH(CH)CH-等のアルキルトリメチレン基;テトラメチレン基[-CHCHCHCH-];-CH(CH)CHCHCH-、-CHCH(CH)CHCH-等のアルキルテトラメチレン基;ペンタメチレン基[-CHCHCHCHCH-]等が挙げられる。
 また、V’101又はV’102における前記アルキレン基における一部のメチレン基が、炭素原子数5~10の2価の脂肪族環式基で置換されていてもよい。当該脂肪族環式基は、前記式(a1-r-1)中のRa’の環状の脂肪族炭化水素基(単環式の脂肪族炭化水素基、多環式の脂肪族炭化水素基)から水素原子をさらに1つ除いた2価の基が好ましく、シクロへキシレン基、1,5-アダマンチレン基または2,6-アダマンチレン基がより好ましい。
The alkylene group in V'101 and V'102 may be a straight-chain alkylene group or a branched-chain alkylene group, with a straight-chain alkylene group being preferred.
Specific examples of the alkylene group in V' 101 and V' 102 include a methylene group [-CH 2 -]; alkylmethylene groups such as -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, and -C(CH 2 CH 3 ) 2 -; an ethylene group [-CH 2 CH 2 -]; alkylethylene groups such as -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, and -CH(CH 2 CH 3 )CH 2 -; a trimethylene group (n-propylene group) [-CH 2 CH 2 CH 2- ] ; alkyl trimethylene groups such as -CH( CH3 ) CH2CH2- and -CH2CH ( CH3 ) CH2- ; tetramethylene group [ -CH2CH2CH2CH2- ]; alkyl tetramethylene groups such as -CH ( CH3 ) CH2CH2CH2- and -CH2CH ( CH3 ) CH2CH2- ; pentamethylene group [ -CH2CH2CH2CH2CH2CH2- ].
In addition, some of the methylene groups in the alkylene group in V'101 or V'102 may be substituted with a divalent aliphatic cyclic group having 5 to 10 carbon atoms. The aliphatic cyclic group is preferably a divalent group obtained by further removing one hydrogen atom from the cyclic aliphatic hydrocarbon group (monocyclic aliphatic hydrocarbon group, polycyclic aliphatic hydrocarbon group) of Ra'3 in formula (a1-r-1), and more preferably a cyclohexylene group, a 1,5-adamantylene group or a 2,6-adamantylene group.
 式(b-1)中、V101は、単結合、アルキレン基又はフッ素化アルキレン基である。なかでも、V101は、単結合、又は炭素原子数1~4の直鎖状のフッ素化アルキレン基であることが好ましい。 In formula (b-1), V 101 is a single bond, an alkylene group or a fluorinated alkylene group. Of these, V 101 is preferably a single bond or a linear fluorinated alkylene group having 1 to 4 carbon atoms.
 式(b-1)中、R102は、フッ素原子又は炭素原子数1~5のフッ素化アルキル基である。R102は、フッ素原子または炭素原子数1~5のパーフルオロアルキル基であることが好ましく、フッ素原子であることがより好ましい。 In formula (b-1), R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. R 102 is preferably a fluorine atom or a perfluoroalkyl group having 1 to 5 carbon atoms, and more preferably a fluorine atom.
 前記式(b-1)で表されるアニオン部の具体例としては、例えば、Y101が単結合となる場合、トリフルオロメタンスルホネートアニオンやパーフルオロブタンスルホネートアニオン等のフッ素化アルキルスルホネートアニオンが挙げられ;Y101が酸素原子を含む2価の連結基である場合、下記式(an-1)~(an-3)のいずれかで表されるアニオンが挙げられる。 Specific examples of the anion moiety represented by formula (b-1) include, for example, when Y 101 is a single bond, fluorinated alkylsulfonate anions such as trifluoromethanesulfonate anion and perfluorobutanesulfonate anion; and, when Y 101 is a divalent linking group containing an oxygen atom, anions represented by any of the following formulas (an-1) to (an-3) are included.
Figure JPOXMLDOC01-appb-C000057
[式中、R”101は、置換基を有してもよい脂肪族環式基、上記の化学式(r-hr-1)~(r-hr-6)でそれぞれ表される1価の複素環式基、前記式(r-br-1)又(r-br-2)で表される縮合環式基、置換基を有してもよい鎖状のアルキル基又は置換基を有してもよい芳香族環式基である。R”102は、置換基を有してもよい脂肪族環式基、前記式(r-br-1)又(r-br-2)で表される縮合環式基、前記一般式(a2-r-1)、(a2-r-3)~(a2-r-7)でそれぞれ表されるラクトン含有環式基、又は前記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基である。R”103は、置換基を有してもよい芳香族環式基、置換基を有してもよい脂肪族環式基、又は置換基を有してもよい鎖状のアルケニル基である。V”101は、単結合、炭素原子数1~4のアルキレン基、又は炭素原子数1~4のフッ素化アルキレン基である。R102は、フッ素原子又は炭素原子数1~5のフッ素化アルキル基である。v”はそれぞれ独立に0~3の整数であり、q”はそれぞれ独立に0~20の整数であり、n”は0または1である。]
Figure JPOXMLDOC01-appb-C000057
[In the formula, R" 101 is an aliphatic cyclic group which may have a substituent, a monovalent heterocyclic group represented by each of the above chemical formulas (r-hr-1) to (r-hr-6), a fused cyclic group represented by the above formula (r-br-1) or (r-br-2), a chain-like alkyl group which may have a substituent, or an aromatic cyclic group which may have a substituent. R" 102 is an aliphatic cyclic group which may have a substituent, a fused cyclic group represented by the above formula (r-br-1) or (r-br-2), a lactone-containing cyclic group represented by each of the above general formulas (a2-r-1), (a2-r-3) to (a2-r-7), or an -SO 2 - containing cyclic group represented by each of the above general formulas (b5-r-1) to (b5-r-4). R" 103 is an aromatic cyclic group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain-like alkenyl group which may have a substituent. V" 101 is a single bond, an alkylene group having 1 to 4 carbon atoms, or a fluorinated alkylene group having 1 to 4 carbon atoms. R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. Each v" is independently an integer of 0 to 3, each q" is independently an integer of 0 to 20, and n" is 0 or 1.
 R”101、R”102およびR”103の置換基を有してもよい脂肪族環式基は、前記式(b-1)中のR101における環状の脂肪族炭化水素基として例示した基であることが好ましい。前記置換基としては、前記式(b-1)中のR101における環状の脂肪族炭化水素基を置換してもよい置換基と同様のものが挙げられる。 The aliphatic cyclic groups which may have a substituent of R" 101 , R" 102 and R" 103 are preferably the groups exemplified as the cyclic aliphatic hydrocarbon group in R 101 in formula (b-1) above. Examples of the substituent include the same as the substituents which may substitute the cyclic aliphatic hydrocarbon group in R 101 in formula (b-1) above.
 R”101およびR”103における置換基を有してもよい芳香族環式基は、前記式(b-1)中のR101における環状の炭化水素基における芳香族炭化水素基として例示した基であることが好ましい。前記置換基としては、前記式(b-1)中のR101における該芳香族炭化水素基を置換してもよい置換基と同様のものが挙げられる。 The aromatic cyclic group which may have a substituent in R" 101 and R" 103 is preferably a group exemplified as the aromatic hydrocarbon group in the cyclic hydrocarbon group in R101 in the above formula (b-1). Examples of the substituent include the same as the substituent which may substitute the aromatic hydrocarbon group in R101 in the above formula (b-1).
 R”101における置換基を有してもよい鎖状のアルキル基は、前記式(b-1)中のR101における鎖状のアルキル基として例示した基であることが好ましい。
 R”103における置換基を有してもよい鎖状のアルケニル基は、前記式(b-1)中のR101における鎖状のアルケニル基として例示した基であることが好ましい。
The chain alkyl group which may have a substituent in R″ 101 is preferably a group exemplified as the chain alkyl group in R 101 in the above formula (b-1).
The chain alkenyl group which may have a substituent in R″ 103 is preferably a group exemplified as the chain alkenyl group in R 101 in the above formula (b-1).
 ・(b-2)成分におけるアニオン
 式(b-2)中、R104、R105は、それぞれ独立に、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、または置換基を有してもよい鎖状のアルケニル基であり、それぞれ、式(b-1)中のR101と同様のものが挙げられる。ただし、R104、R105は、相互に結合して環を形成していてもよい。
 R104、R105は、置換基を有してもよい鎖状のアルキル基が好ましく、直鎖状若しくは分岐鎖状のアルキル基、又は直鎖状若しくは分岐鎖状のフッ素化アルキル基であることがより好ましい。
 該鎖状のアルキル基の炭素原子数は、1~10であることが好ましく、より好ましくは炭素原子数1~7、さらに好ましくは炭素原子数1~3である。R104、R105の鎖状のアルキル基の炭素原子数は、上記炭素原子数の範囲内において、レジスト用溶剤への溶解性も良好である等の理由により、小さいほど好ましい。また、R104、R105の鎖状のアルキル基においては、フッ素原子で置換されている水素原子の数が多いほど、酸の強度が強くなり、また、250nm以下の高エネルギー光や電子線に対する透明性が向上するため好ましい。前記鎖状のアルキル基中のフッ素原子の割合、すなわちフッ素化率は、好ましくは70~100%、さらに好ましくは90~100%であり、最も好ましくは、全ての水素原子がフッ素原子で置換されたパーフルオロアルキル基である。
 式(b-2)中、V102、V103は、それぞれ独立に、単結合、アルキレン基、またはフッ素化アルキレン基であり、それぞれ、式(b-1)中のV101と同様のものが挙げられる。
 式(b-2)中、L101、L102は、それぞれ独立に単結合又は酸素原子である。
Anion in Component (b-2) In formula (b-2), R 104 and R 105 each independently represent a cyclic group which may have a substituent, a chain-like alkyl group which may have a substituent, or a chain-like alkenyl group which may have a substituent, and examples of these include the same as R 101 in formula (b-1). However, R 104 and R 105 may be bonded to each other to form a ring.
R 104 and R 105 are preferably a chain alkyl group which may have a substituent, and more preferably a linear or branched alkyl group, or a linear or branched fluorinated alkyl group.
The number of carbon atoms in the chain-like alkyl group is preferably 1 to 10, more preferably 1 to 7, and even more preferably 1 to 3. The number of carbon atoms in the chain-like alkyl group of R 104 and R 105 is preferably as small as possible within the above range of the number of carbon atoms, for reasons such as good solubility in a resist solvent. In addition, in the chain-like alkyl group of R 104 and R 105 , the more hydrogen atoms substituted with fluorine atoms, the stronger the acid strength becomes, and the more the transparency to high-energy light and electron beams of 250 nm or less is improved, which is preferable. The ratio of fluorine atoms in the chain-like alkyl group, i.e., the fluorination rate, is preferably 70 to 100%, more preferably 90 to 100%, and most preferably a perfluoroalkyl group in which all hydrogen atoms are substituted with fluorine atoms.
In formula (b-2), V 102 and V 103 each independently represent a single bond, an alkylene group, or a fluorinated alkylene group, and examples of V 101 in formula (b-1) include the same as those described above.
In formula (b-2), L 101 and L 102 each independently represent a single bond or an oxygen atom.
 ・(b-3)成分におけるアニオン
 式(b-3)中、R106~R108は、それぞれ独立に、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、それぞれ、式(b-1)中のR101と同様のものが挙げられる。
 式(b-3)中、L103~L105は、それぞれ独立に、単結合、-CO-又は-SO-である。
Anion in Component (b-3) In formula (b- 3 ), R to R each independently represent a cyclic group which may have a substituent, a chain-like alkyl group which may have a substituent, or a chain-like alkenyl group which may have a substituent, and examples of these include the same as R 101 in formula (b-1).
In formula (b-3), L 103 to L 105 each independently represent a single bond, —CO— or —SO 2 —.
 上記の中でも、(B)成分のアニオン部としては、(b-1)成分におけるアニオンが好ましい。 Among the above, the anion in component (b-1) is preferred as the anion portion of component (B).
 {カチオン部}
 前記の式(b-1)、式(b-2)、式(b-3)中、M’m+は、m価のオニウムカチオンを表す。この中でも、スルホニウムカチオン、ヨードニウムカチオンが好ましい。
 mは、1以上の整数である。
{Cation part}
In the above formulae (b-1), (b-2) and (b-3), M'm+ represents an m-valent onium cation, of which sulfonium cation and iodonium cation are preferred.
m is an integer of 1 or more.
 好ましいカチオン部((M’m+1/m)としては、下記の一般式(ca-1)~(ca-3)でそれぞれ表される有機カチオンが挙げられる。 Preferred cationic moieties ((M'm + ) 1/m ) include organic cations represented by the following general formulas (ca-1) to (ca-3).
Figure JPOXMLDOC01-appb-C000058
[式中、R201~R207は、それぞれ独立に置換基を有してもよいアリール基、アルキル基またはアルケニル基を表す。R201~R203、R206~R207は、相互に結合して式中のイオウ原子と共に環を形成してもよい。R208~R209は、それぞれ独立に水素原子または炭素原子数1~5のアルキル基を表す。R210は、置換基を有してもよいアリール基、置換基を有してもよいアルキル基、置換基を有してもよいアルケニル基、又は置換基を有してもよい-SO-含有環式基である。L201は、-C(=O)-または-C(=O)-O-を表す。]
Figure JPOXMLDOC01-appb-C000058
[In the formula, R 201 to R 207 each independently represent an aryl group, an alkyl group or an alkenyl group which may have a substituent. R 201 to R 203 and R 206 to R 207 may be bonded to each other to form a ring together with the sulfur atom in the formula. R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms. R 210 is an aryl group which may have a substituent, an alkyl group which may have a substituent, an alkenyl group which may have a substituent, or an -SO 2 - containing cyclic group which may have a substituent. L 201 represents -C(=O)- or -C(=O)-O-.]
 上記の一般式(ca-1)~(ca-3)中、R201~R207におけるアリール基としては、炭素原子数6~20の無置換のアリール基が挙げられ、フェニル基、ナフチル基が好ましい。
 R201~R207におけるアルキル基としては、鎖状又は環状のアルキル基であって、炭素原子数1~30のものが好ましい。
 R201~R207におけるアルケニル基としては、炭素原子数が2~10であることが好ましい。
 R201~R207、およびR210が有していてもよい置換基としては、例えば、アルキル基、ハロゲン原子、ハロゲン化アルキル基、カルボニル基、シアノ基、アミノ基、アリール基、下記の一般式(ca-r-1)~(ca-r-7)でそれぞれ表される基等が挙げられる。
In the above general formulae (ca-1) to (ca-3), the aryl group for R 201 to R 207 can be an unsubstituted aryl group having 6 to 20 carbon atoms, and a phenyl group or a naphthyl group is preferable.
The alkyl group for R 201 to R 207 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms.
The alkenyl group for R 201 to R 207 preferably has 2 to 10 carbon atoms.
Examples of the substituent that R 201 to R 207 and R 210 may have include an alkyl group, a halogen atom, a halogenated alkyl group, a carbonyl group, a cyano group, an amino group, an aryl group, and groups represented by the following general formulas (ca-r-1) to (ca-r-7), respectively.
Figure JPOXMLDOC01-appb-C000059
[式中、R’201は、それぞれ独立に、水素原子、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基である。]
Figure JPOXMLDOC01-appb-C000059
[In the formula, R'201 each independently represents a hydrogen atom, a cyclic group which may have a substituent, a chain-like alkyl group which may have a substituent, or a chain-like alkenyl group which may have a substituent.]
 置換基を有してもよい環式基:
 該環式基は、環状の炭化水素基であることが好ましく、該環状の炭化水素基は、芳香族炭化水素基であってもよく、脂肪族炭化水素基であってもよい。脂肪族炭化水素基は、芳香族性を持たない炭化水素基を意味する。また、脂肪族炭化水素基は、飽和であってもよく、不飽和であってもよく、通常は飽和であることが好ましい。
Optionally substituted cyclic group:
The cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group. The aliphatic hydrocarbon group means a hydrocarbon group that does not have aromaticity. The aliphatic hydrocarbon group may be saturated or unsaturated, and is usually preferably saturated.
 R’201における芳香族炭化水素基は、芳香環を有する炭化水素基である。該芳香族炭化水素基の炭素原子数は3~30であることが好ましく、炭素原子数5~30がより好ましく、炭素原子数5~20がさらに好ましく、炭素原子数6~15が特に好ましく、炭素原子数6~10が最も好ましい。ただし、該炭素原子数には、置換基における炭素原子数を含まないものとする。
 R’201における芳香族炭化水素基が有する芳香環として具体的には、ベンゼン、フルオレン、ナフタレン、アントラセン、フェナントレン、ビフェニル、又はこれらの芳香環を構成する炭素原子の一部がヘテロ原子で置換された芳香族複素環などが挙げられる。芳香族複素環におけるヘテロ原子としては、酸素原子、硫黄原子、窒素原子等が挙げられる。
 R’201における芳香族炭化水素基として具体的には、前記芳香環から水素原子を1つ除いた基(アリール基:例えばフェニル基、ナフチル基など)、前記芳香環の水素原子の1つがアルキレン基で置換された基(例えばベンジル基、フェネチル基、1-ナフチルメチル基、2-ナフチルメチル基、1-ナフチルエチル基、2-ナフチルエチル基等のアリールアルキル基など)等が挙げられる。前記アルキレン基(アリールアルキル基中のアルキル鎖)の炭素原子数は、1~4であることが好ましく、炭素原子数1~2がより好ましく、炭素原子数1が特に好ましい。
The aromatic hydrocarbon group in R'201 is a hydrocarbon group having an aromatic ring. The aromatic hydrocarbon group preferably has 3 to 30 carbon atoms, more preferably 5 to 30 carbon atoms, even more preferably 5 to 20 carbon atoms, particularly preferably 6 to 15 carbon atoms, and most preferably 6 to 10 carbon atoms. However, this number of carbon atoms does not include the number of carbon atoms in the substituent.
Specific examples of the aromatic ring contained in the aromatic hydrocarbon group in R'201 include benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, and aromatic heterocycles in which some of the carbon atoms constituting these aromatic rings are substituted with heteroatoms. Examples of the heteroatom in the aromatic heterocycle include an oxygen atom, a sulfur atom, and a nitrogen atom.
Specific examples of the aromatic hydrocarbon group for R'201 include a group in which one hydrogen atom has been removed from the aromatic ring (aryl group: for example, a phenyl group, a naphthyl group, etc.), a group in which one hydrogen atom of the aromatic ring has been substituted with an alkylene group (for example, an arylalkyl group such as a benzyl group, a phenethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group, a 2-naphthylethyl group, etc.). The alkylene group (the alkyl chain in the arylalkyl group) preferably has 1 to 4 carbon atoms, more preferably 1 to 2 carbon atoms, and particularly preferably 1 carbon atom.
 R’201における環状の脂肪族炭化水素基は、構造中に環を含む脂肪族炭化水素基が挙げられる。
 この構造中に環を含む脂肪族炭化水素基としては、脂環式炭化水素基(脂肪族炭化水素環から水素原子を1個除いた基)、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の末端に結合した基、脂環式炭化水素基が直鎖状または分岐鎖状の脂肪族炭化水素基の途中に介在する基などが挙げられる。
 前記脂環式炭化水素基は、炭素原子数が3~20であることが好ましく、3~12であることがより好ましい。
 前記脂環式炭化水素基は、多環式基であってもよく、単環式基であってもよい。単環式の脂環式炭化水素基としては、モノシクロアルカンから1個以上の水素原子を除いた基が好ましい。該モノシクロアルカンとしては、炭素原子数3~6のものが好ましく、具体的にはシクロペンタン、シクロヘキサン等が挙げられる。多環式の脂環式炭化水素基としては、ポリシクロアルカンから1個以上の水素原子を除いた基が好ましく、該ポリシクロアルカンとしては、炭素原子数7~30のものが好ましい。中でも、該ポリシクロアルカンとしては、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等の架橋環系の多環式骨格を有するポリシクロアルカン;ステロイド骨格を有する環式基等の縮合環系の多環式骨格を有するポリシクロアルカンがより好ましい。
The cyclic aliphatic hydrocarbon group for R'201 includes an aliphatic hydrocarbon group containing a ring in the structure.
Examples of the aliphatic hydrocarbon group that contains a ring in its structure include alicyclic hydrocarbon groups (groups in which one hydrogen atom has been removed from an aliphatic hydrocarbon ring), groups in which an alicyclic hydrocarbon group is bonded to the end of a straight-chain or branched-chain aliphatic hydrocarbon group, and groups in which an alicyclic hydrocarbon group is present in the middle of a straight-chain or branched-chain aliphatic hydrocarbon group.
The alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, and more preferably has 3 to 12 carbon atoms.
The alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group. The monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a monocycloalkane. The monocycloalkane preferably has 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycycloalkane, and the polycycloalkane preferably has 7 to 30 carbon atoms. Among them, the polycycloalkane is more preferably a polycycloalkane having a polycyclic skeleton of a bridged ring system such as adamantane, norbornane, isobornane, tricyclodecane, or tetracyclododecane; or a polycycloalkane having a polycyclic skeleton of a condensed ring system such as a cyclic group having a steroid skeleton.
 なかでも、R’201における環状の脂肪族炭化水素基としては、モノシクロアルカンまたはポリシクロアルカンから水素原子を1つ以上除いた基が好ましく、ポリシクロアルカンから水素原子を1つ除いた基がより好ましく、アダマンチル基、ノルボルニル基が特に好ましく、アダマンチル基が最も好ましい。 Among these, the cyclic aliphatic hydrocarbon group for R'201 is preferably a group in which one or more hydrogen atoms have been removed from a monocycloalkane or polycycloalkane, more preferably a group in which one hydrogen atom has been removed from a polycycloalkane, particularly preferably an adamantyl group or a norbornyl group, and most preferably an adamantyl group.
 脂環式炭化水素基に結合してもよい、直鎖状または分岐鎖状の脂肪族炭化水素基は、炭素原子数が1~10であることが好ましく、炭素原子数1~6がより好ましく、炭素原子数1~4がさらに好ましく、炭素原子数1~3が特に好ましい。
 直鎖状の脂肪族炭化水素基としては、直鎖状のアルキレン基が好ましく、具体的には、メチレン基[-CH-]、エチレン基[-(CH-]、トリメチレン基[-(CH-]、テトラメチレン基[-(CH-]、ペンタメチレン基[-(CH-]等が挙げられる。
 分岐鎖状の脂肪族炭化水素基としては、分岐鎖状のアルキレン基が好ましく、具体的には、-CH(CH)-、-CH(CHCH)-、-C(CH-、-C(CH)(CHCH)-、-C(CH)(CHCHCH)-、-C(CHCH-等のアルキルメチレン基;-CH(CH)CH-、-CH(CH)CH(CH)-、-C(CHCH-、-CH(CHCH)CH-、-C(CHCH-CH-等のアルキルエチレン基;-CH(CH)CHCH-、-CHCH(CH)CH-等のアルキルトリメチレン基;-CH(CH)CHCHCH-、-CHCH(CH)CHCH-等のアルキルテトラメチレン基などのアルキルアルキレン基等が挙げられる。アルキルアルキレン基におけるアルキル基としては、炭素原子数1~5の直鎖状のアルキル基が好ましい。
The linear or branched aliphatic hydrocarbon group which may be bonded to the alicyclic hydrocarbon group preferably has 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms, still more preferably 1 to 4 carbon atoms, and particularly preferably 1 to 3 carbon atoms.
As the straight-chain aliphatic hydrocarbon group, a straight-chain alkylene group is preferable, and specific examples thereof include a methylene group [-CH 2 -], an ethylene group [-(CH 2 ) 2 -], a trimethylene group [-(CH 2 ) 3 -], a tetramethylene group [-(CH 2 ) 4 -], a pentamethylene group [-(CH 2 ) 5 -], etc.
The branched aliphatic hydrocarbon group is preferably a branched alkylene group, and specific examples thereof include alkylmethylene groups such as -CH( CH3 )-, -CH( CH2CH3 )-, -C( CH3 ) 2- , -C(CH3)(CH2CH3)-, -C(CH3)(CH2CH2CH3)-, and -C(CH2CH3 ) 2- ; alkylethylene groups such as -CH ( CH3 ) CH2- , -CH( CH3 )CH( CH3 ) - , -C( CH3 ) 2CH2- , -CH ( CH2CH3 ) CH2- , and -C( CH2CH3 ) 2 - CH2- ; and alkyl alkylene groups such as alkyl trimethylene groups such as -CH (CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -, etc. The alkyl group in the alkyl alkylene group is preferably a linear alkyl group having 1 to 5 carbon atoms.
 また、R’201における環状の炭化水素基は、複素環等のようにヘテロ原子を含んでもよい。具体的には、前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基、前記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基、その他上記の化学式(r-hr-1)~(r-hr-16)でそれぞれ表される複素環式基が挙げられる。 Furthermore, the cyclic hydrocarbon group in R'201 may contain a heteroatom, such as a heterocycle. Specific examples include the lactone-containing cyclic groups represented by the general formulae (a2-r-1) to (a2-r-7) above, the -SO 2 -containing cyclic groups represented by the general formulae (b5-r-1) to (b5-r-4) above, and the heterocyclic groups represented by the chemical formulae (r-hr-1) to (r-hr-16) above.
 R’201の環式基における置換基としては、たとえば、アルキル基、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基等が挙げられる。
 置換基としてのアルキル基としては、炭素原子数1~5のアルキル基が好ましく、メチル基、エチル基、プロピル基、n-ブチル基、tert-ブチル基が最も好ましい。
 置換基としてのアルコキシ基としては、炭素原子数1~5のアルコキシ基が好ましく、メトキシ基、エトキシ基、n-プロポキシ基、iso-プロポキシ基、n-ブトキシ基、tert-ブトキシ基がより好ましく、メトキシ基、エトキシ基が最も好ましい。
 置換基としてのハロゲン原子としては、フッ素原子が好ましい。
 置換基としてのハロゲン化アルキル基としては、炭素原子数1~5のアルキル基、たとえばメチル基、エチル基、プロピル基、n-ブチル基、tert-ブチル基等の水素原子の一部または全部が前記ハロゲン原子で置換された基が挙げられる。
 置換基としてのカルボニル基は、環状の炭化水素基を構成するメチレン基(-CH-)を置換する基である。
Examples of the substituent in the cyclic group of R'201 include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, and a nitro group.
The alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably a methyl group, an ethyl group, a propyl group, an n-butyl group or a tert-butyl group.
The alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, more preferably a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group, or a tert-butoxy group, and most preferably a methoxy group or an ethoxy group.
As the halogen atom as a substituent, a fluorine atom is preferred.
Examples of the halogenated alkyl group as a substituent include alkyl groups having 1 to 5 carbon atoms, such as methyl, ethyl, propyl, n-butyl, and tert-butyl groups, in which some or all of the hydrogen atoms have been substituted with the above-mentioned halogen atoms.
The carbonyl group as a substituent is a group that substitutes a methylene group (-CH 2 -) that constitutes a cyclic hydrocarbon group.
 置換基を有してもよい鎖状のアルキル基:
 R’201の鎖状のアルキル基としては、直鎖状又は分岐鎖状のいずれでもよい。
 直鎖状のアルキル基としては、炭素原子数が1~20であることが好ましく、炭素原子数1~15であることがより好ましく、炭素原子数1~10が最も好ましい。
 分岐鎖状のアルキル基としては、炭素原子数が3~20であることが好ましく、炭素原子数3~15であることがより好ましく、炭素原子数3~10が最も好ましい。具体的には、例えば、1-メチルエチル基、1-メチルプロピル基、2-メチルプロピル基、1-メチルブチル基、2-メチルブチル基、3-メチルブチル基、1-エチルブチル基、2-エチルブチル基、1-メチルペンチル基、2-メチルペンチル基、3-メチルペンチル基、4-メチルペンチル基などが挙げられる。
A chain alkyl group which may have a substituent:
The chain alkyl group of R'201 may be either linear or branched.
The linear alkyl group preferably has 1 to 20 carbon atoms, more preferably has 1 to 15 carbon atoms, and most preferably has 1 to 10 carbon atoms.
The branched alkyl group preferably has 3 to 20 carbon atoms, more preferably has 3 to 15 carbon atoms, and most preferably has 3 to 10 carbon atoms. Specific examples include a 1-methylethyl group, a 1-methylpropyl group, a 2-methylpropyl group, a 1-methylbutyl group, a 2-methylbutyl group, a 3-methylbutyl group, a 1-ethylbutyl group, a 2-ethylbutyl group, a 1-methylpentyl group, a 2-methylpentyl group, a 3-methylpentyl group, and a 4-methylpentyl group.
 置換基を有してもよい鎖状のアルケニル基:
 R’201の鎖状のアルケニル基としては、直鎖状又は分岐鎖状のいずれでもよく、炭素原子数が2~10であることが好ましく、炭素原子数2~5がより好ましく、炭素原子数2~4がさらに好ましく、炭素原子数3が特に好ましい。直鎖状のアルケニル基としては、例えば、ビニル基、プロペニル基(アリル基)、ブチニル基などが挙げられる。分岐鎖状のアルケニル基としては、例えば、1-メチルビニル基、2-メチルビニル基、1-メチルプロペニル基、2-メチルプロペニル基などが挙げられる。
 鎖状のアルケニル基としては、上記の中でも、直鎖状のアルケニル基が好ましく、ビニル基、プロペニル基がより好ましく、ビニル基が特に好ましい。
A chain alkenyl group which may have a substituent:
The chain alkenyl group of R'201 may be either linear or branched, and preferably has 2 to 10 carbon atoms, more preferably 2 to 5 carbon atoms, even more preferably 2 to 4 carbon atoms, and particularly preferably 3 carbon atoms. Examples of linear alkenyl groups include vinyl groups, propenyl groups (allyl groups), and butynyl groups. Examples of branched alkenyl groups include 1-methylvinyl groups, 2-methylvinyl groups, 1-methylpropenyl groups, and 2-methylpropenyl groups.
Of the above chain alkenyl groups, linear alkenyl groups are preferred, vinyl groups and propenyl groups are more preferred, and vinyl groups are particularly preferred.
 R’201の鎖状のアルキル基またはアルケニル基における置換基としては、たとえば、アルコキシ基、ハロゲン原子、ハロゲン化アルキル基、水酸基、カルボニル基、ニトロ基、アミノ基、上記R’201における環式基等が挙げられる。 Examples of the substituent in the chain alkyl or alkenyl group of R'201 include an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, and the cyclic groups in R'201 described above.
 R’201の置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基は、上述したものの他、置換基を有してもよい環式基又は置換基を有してもよい鎖状のアルキル基として、上述の式(a1-r-2)で表される酸解離性基と同様のものも挙げられる。 The optionally substituted cyclic group, optionally substituted chain alkyl group, or optionally substituted chain alkenyl group for R'201 is as described above, and examples of the optionally substituted cyclic group or optionally substituted chain alkyl group include the same as the acid dissociable group represented by formula (a1-r-2) above.
 なかでも、R’201は、置換基を有してもよい環式基が好ましく、置換基を有してもよい環状の炭化水素基であることがより好ましい。より具体的には、例えば、フェニル基、ナフチル基、ポリシクロアルカンから1個以上の水素原子を除いた基;前記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基;前記一般式(b5-r-1)~(b5-r-4)でそれぞれ表される-SO-含有環式基などが好ましい。 Among these, R'201 is preferably a cyclic group which may have a substituent, and more preferably a cyclic hydrocarbon group which may have a substituent. More specifically, for example, a phenyl group, a naphthyl group, a group in which one or more hydrogen atoms have been removed from a polycycloalkane, a lactone-containing cyclic group represented by each of the general formulae (a2-r-1) to (a2-r-7), an -SO 2 -- containing cyclic group represented by each of the general formulae (b5-r-1) to (b5-r-4), etc. are preferred.
 上記の一般式(ca-1)~(ca-3)中、R201~R203、R206~R207は、相互に結合して式中のイオウ原子と共に環を形成する場合、硫黄原子、酸素原子、窒素原子等のヘテロ原子や、カルボニル基、-SO-、-SO-、-SO-、-COO-、-CONH-または-N(R)-(該Rは炭素原子数1~5のアルキル基である。)等の官能基を介して結合してもよい。形成される環としては、式中のイオウ原子をその環骨格に含む1つの環が、イオウ原子を含めて、3~10員環であることが好ましく、5~7員環であることが特に好ましい。形成される環の具体例としては、例えばチオフェン環、チアゾール環、ベンゾチオフェン環、ジベンゾチオフェン環、9H-チオキサンテン環、チオキサントン環、チアントレン環、フェノキサチイン環、テトラヒドロチオフェニウム環、テトラヒドロチオピラニウム環等が挙げられる。 In the above general formulae (ca-1) to (ca-3), when R 201 to R 203 and R 206 to R 207 are bonded to each other to form a ring together with the sulfur atom in the formula, they may be bonded via a heteroatom such as a sulfur atom, an oxygen atom or a nitrogen atom, or a functional group such as a carbonyl group, -SO-, -SO 2 -, -SO 3 -, -COO-, -CONH- or -N(R N )- (wherein R N is an alkyl group having 1 to 5 carbon atoms). As for the ring formed, one ring containing the sulfur atom in the ring skeleton in the formula is preferably a 3- to 10-membered ring including the sulfur atom, and particularly preferably a 5- to 7-membered ring. Specific examples of the ring formed include a thiophene ring, a thiazole ring, a benzothiophene ring, a dibenzothiophene ring, a 9H-thioxanthene ring, a thioxanthone ring, a thianthrene ring, a phenoxathiin ring, a tetrahydrothiophenium ring, and a tetrahydrothiopyranium ring.
 R208~R209は、それぞれ独立に、水素原子または炭素原子数1~5のアルキル基を表し、水素原子又は炭素原子数1~3のアルキル基が好ましく、アルキル基となる場合、相互に結合して環を形成してもよい。 R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, preferably a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, and when they represent an alkyl group, they may be bonded to each other to form a ring.
 R210は、置換基を有してもよいアリール基、置換基を有してもよいアルキル基、置換基を有してもよいアルケニル基、又は置換基を有してもよい-SO-含有環式基である。
 R210におけるアリール基としては、炭素原子数6~20の無置換のアリール基が挙げられ、フェニル基、ナフチル基が好ましい。
 R210におけるアルキル基としては、鎖状又は環状のアルキル基であって、炭素原子数1~30のものが好ましい。
 R210におけるアルケニル基としては、炭素原子数が2~10であることが好ましい。
 R210における、置換基を有してもよい-SO-含有環式基としては、「-SO-含有多環式基」が好ましく、上記一般式(b5-r-1)で表される基がより好ましい。
R 210 is an aryl group which may have a substituent, an alkyl group which may have a substituent, an alkenyl group which may have a substituent, or an --SO 2 -- containing cyclic group which may have a substituent.
The aryl group for R 210 includes unsubstituted aryl groups having 6 to 20 carbon atoms, and is preferably a phenyl group or a naphthyl group.
The alkyl group for R 210 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms.
The alkenyl group for R 210 preferably has 2 to 10 carbon atoms.
As the -SO 2 -containing cyclic group for R 210 which may have a substituent, a "-SO 2 -containing polycyclic group" is preferable, and a group represented by the above general formula (b5-r-1) is more preferable.
 前記式(ca-1)で表されるカチオンの具体例を以下に示す。 Specific examples of the cations represented by formula (ca-1) are shown below.
 前記式(ca-1)で表される好適なカチオンとして具体的には、下記の化学式でそれぞれ表されるカチオンが挙げられる。 Specific examples of suitable cations represented by the formula (ca-1) include the cations represented by the following chemical formulas.
Figure JPOXMLDOC01-appb-C000060
Figure JPOXMLDOC01-appb-C000060
Figure JPOXMLDOC01-appb-C000061
Figure JPOXMLDOC01-appb-C000061
Figure JPOXMLDOC01-appb-C000062
[式中、g1、g2、g3は繰返し数を示し、g1は1~5の整数であり、g2は0~20の整数であり、g3は0~20の整数である。]
Figure JPOXMLDOC01-appb-C000062
[In the formula, g1, g2, and g3 each represent a repeating number, where g1 is an integer of 1 to 5, g2 is an integer of 0 to 20, and g3 is an integer of 0 to 20.]
Figure JPOXMLDOC01-appb-C000063
Figure JPOXMLDOC01-appb-C000063
Figure JPOXMLDOC01-appb-C000064
Figure JPOXMLDOC01-appb-C000064
Figure JPOXMLDOC01-appb-C000065
[式中、R”201は水素原子又は置換基であって、該置換基としては前記R201~R207、およびR210~R212が有していてもよい置換基として挙げたものと同様である。]
Figure JPOXMLDOC01-appb-C000065
[In the formula, R″ 201 is a hydrogen atom or a substituent, and the substituent is the same as those exemplified as the substituents that may be possessed by R 201 to R 207 and R 210 to R 212. ]
Figure JPOXMLDOC01-appb-C000066
Figure JPOXMLDOC01-appb-C000066
 前記式(ca-2)で表される好適なカチオンとして具体的には、ジフェニルヨードニウムカチオン、ビス(4-tert-ブチルフェニル)ヨードニウムカチオン等が挙げられる。 Specific examples of suitable cations represented by the formula (ca-2) include diphenyliodonium cation, bis(4-tert-butylphenyl)iodonium cation, etc.
 前記式(ca-3)で表される好適なカチオンとして具体的には、下記式(ca-3-1)~(ca-3-6)でそれぞれ表されるカチオンが挙げられる。 Specific examples of suitable cations represented by the formula (ca-3) include the cations represented by the following formulas (ca-3-1) to (ca-3-6).
Figure JPOXMLDOC01-appb-C000067
Figure JPOXMLDOC01-appb-C000067
 本実施形態のレジスト組成物において、(B)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。
 レジスト組成物が(B)成分を含有する場合、レジスト組成物中、(B)成分の含有量は、(A)成分100質量部に対して、70質量部未満が好ましく、10~60質量部がより好ましく、20~50質量部が更に好ましい。
 (B)成分の含有量を、前記の好ましい範囲とすることで、パターン形成が十分に行われる。また、レジスト組成物の各成分を有機溶剤に溶解した際、均一な溶液が得られやすく、レジスト組成物としての保存安定性が良好となるため好ましい。
In the resist composition of this embodiment, the component (B) may use either a single type, or a combination of two or more types.
When the resist composition contains the component (B), the amount of the component (B) in the resist composition is preferably less than 70 parts by mass, more preferably 10 to 60 parts by mass, and even more preferably 20 to 50 parts by mass, relative to 100 parts by mass of the component (A).
By setting the content of the component (B) within the above-mentioned preferred range, sufficient pattern formation can be achieved. Furthermore, when the components of the resist composition are dissolved in an organic solvent, a homogeneous solution is easily obtained, and the storage stability of the resist composition is also favorable.
 ≪塩基成分(D)≫
 本実施形態のレジスト組成物は、(A)成分に加えて、さらに、露光により発生する酸をトラップ(すなわち、酸の拡散を制御)する塩基成分((D)成分)を含有してもよい。(D)成分は、レジスト組成物において露光により発生する酸をトラップするクエンチャー(酸拡散制御剤)として作用するものである。
 (D)成分としては、例えば、露光により分解して酸拡散制御性を失う光崩壊性塩基(D1)(以下「(D1)成分」という。)、該(D1)成分に該当しない含窒素有機化合物(D2)(以下「(D2)成分」という。)等が挙げられる。これらの中でも、高感度化、ラフネス低減、塗布欠陥の発生の抑制の特性をいずれも高められやすいことから、光崩壊性塩基((D1)成分)が好ましい。
<<Base component (D)>>
The resist composition of this embodiment may further contain, in addition to the component (A), a base component (component (D)) that traps acid generated upon exposure (i.e., controls the diffusion of acid). The component (D) acts as a quencher (acid diffusion controller) that traps acid generated in the resist composition upon exposure.
Examples of the component (D) include a photodegradable base (D1) (hereinafter referred to as "component (D1)") that decomposes upon exposure to light and loses its acid diffusion controllability, and a nitrogen-containing organic compound (D2) (hereinafter referred to as "component (D2)") that does not fall under the category of component (D1). Among these, the photodegradable base (component (D1)) is preferred because it is likely to enhance all of the properties of increasing sensitivity, reducing roughness, and suppressing the occurrence of coating defects.
 ・(D1)成分について
 (D1)成分を含有するレジスト組成物とすることで、レジストパターンを形成する際に、レジスト膜の露光部と未露光部とのコントラストをより向上させることができる。
 (D1)成分としては、露光により分解して酸拡散制御性を失うものであれば特に限定されず、下記一般式(d1-1)で表される化合物(以下「(d1-1)成分」という。)、下記一般式(d1-2)で表される化合物(以下「(d1-2)成分」という。)及び下記一般式(d1-3)で表される化合物(以下「(d1-3)成分」という。)からなる群より選ばれる1種以上の化合物が好ましい。
 (d1-1)~(d1-3)成分は、レジスト膜の露光部においては分解して酸拡散制御性(塩基性)を失うためクエンチャーとして作用せず、レジスト膜の未露光部においてクエンチャーとして作用する。
- Component (D1) By using a resist composition that contains the component (D1), the contrast between exposed and unexposed areas of the resist film can be further improved when forming a resist pattern.
The component (D1) is not particularly limited as long as it decomposes upon exposure to light and loses its acid diffusion controllability, and is preferably one or more compounds selected from the group consisting of a compound represented by the following general formula (d1-1) (hereinafter referred to as "component (d1-1)"), a compound represented by the following general formula (d1-2) (hereinafter referred to as "component (d1-2)"), and a compound represented by the following general formula (d1-3) (hereinafter referred to as "component (d1-3)"):
The components (d1-1) to (d1-3) do not act as quenchers in the exposed areas of the resist film because they decompose and lose their acid diffusion control ability (basicity), but act as quenchers in the unexposed areas of the resist film.
Figure JPOXMLDOC01-appb-C000068
[式中、Rd~Rdは置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基である。但し、式(d1-2)中のRdにおける、S原子に隣接する炭素原子にはフッ素原子は結合していないものとする。Ydは単結合又は2価の連結基である。mは1以上の整数であって、Mm+はそれぞれ独立にm価の有機カチオンである。]
Figure JPOXMLDOC01-appb-C000068
[In the formula, Rd 1 to Rd 4 are a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent. However, in Rd 2 in formula (d1-2), a fluorine atom is not bonded to the carbon atom adjacent to the S atom. Yd 1 is a single bond or a divalent linking group. m is an integer of 1 or more, and each M m+ is independently an m-valent organic cation.]
 {(d1-1)成分}
 ・・アニオン部
 式(d1-1)中、Rdは、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、それぞれ前記R’201と同様のものが挙げられる。
 これらのなかでも、Rdとしては、置換基を有してもよい芳香族炭化水素基、置換基を有してもよい脂肪族環式基、又は置換基を有してもよい鎖状のアルキル基が好ましい。これらの基が有していてもよい置換基としては、水酸基、オキソ基、アルキル基、アリール基、ハロゲン原子、フッ素化アルキル基、上記一般式(a2-r-1)~(a2-r-7)でそれぞれ表されるラクトン含有環式基、エーテル結合、エステル結合、またはこれらの組み合わせが挙げられる。エーテル結合やエステル結合を置換基として含む場合、アルキレン基を介していてもよく、この場合の置換基としては、上記式(y-al-1)~(y-al-5)でそれぞれ表される連結基が好ましい。なお、Rdにおける芳香族炭化水素基、脂肪族環式基、又は鎖状のアルキル基が、置換基として、上記一般式(y-al-1)~(y-al-7)でそれぞれ表される連結基を有する場合、上記一般式(y-al-1)~(y-al-7)において、式(d3-1)中のRdにおける芳香族炭化水素基、脂肪族環式基、又は鎖状のアルキル基を構成する炭素原子に結合するのが、上記一般式(y-al-1)~(y-al-7)中のV’101である。
 前記芳香族炭化水素基としては、フェニル基、ナフチル基、ビシクロオクタン骨格を含む多環構造(ビシクロオクタン骨格とこれ以外の環構造とからなる多環構造)が好適に挙げられる。
 前記脂肪族環式基としては、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等のポリシクロアルカンから1個以上の水素原子を除いた基であることがより好ましい。
 前記鎖状のアルキル基としては、炭素原子数が1~10であることが好ましく、具体的には、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、ヘプチル基、オクチル基、ノニル基、デシル基等の直鎖状のアルキル基;1-メチルエチル基、1-メチルプロピル基、2-メチルプロピル基、1-メチルブチル基、2-メチルブチル基、3-メチルブチル基、1-エチルブチル基、2-エチルブチル基、1-メチルペンチル基、2-メチルペンチル基、3-メチルペンチル基、4-メチルペンチル基等の分岐鎖状のアルキル基が挙げられる。
{(d1-1) component}
In formula (d1-1), Rd 1 represents a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent, and examples of these groups include the same as those for R' 201 described above.
Among these, Rd 1 is preferably an aromatic hydrocarbon group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain-like alkyl group which may have a substituent. Examples of the substituent which these groups may have include a hydroxyl group, an oxo group, an alkyl group, an aryl group, a halogen atom, a fluorinated alkyl group, a lactone-containing cyclic group represented by each of the above general formulas (a2-r-1) to (a2-r-7), an ether bond, an ester bond, or a combination thereof. When an ether bond or an ester bond is contained as a substituent, it may be via an alkylene group, and in this case, the substituent is preferably a linking group represented by each of the above formulas (y-al-1) to (y-al-5). When the aromatic hydrocarbon group, aliphatic cyclic group, or chain alkyl group in Rd 1 has a linking group represented by each of the general formulae (y-al-1) to (y-al-7) as a substituent, in the above general formulae (y-al-1) to (y-al-7), V' 101 in the above general formulae (y-al-1) to (y-al-7) bonds to a carbon atom constituting the aromatic hydrocarbon group, aliphatic cyclic group, or chain alkyl group in Rd 1 in formula (d3-1).
Suitable examples of the aromatic hydrocarbon group include a phenyl group, a naphthyl group, and a polycyclic structure containing a bicyclooctane skeleton (a polycyclic structure consisting of a bicyclooctane skeleton and another ring structure).
The aliphatic cyclic group is more preferably a group in which one or more hydrogen atoms have been removed from a polycycloalkane such as adamantane, norbornane, isobornane, tricyclodecane, or tetracyclododecane.
The chain alkyl group preferably has 1 to 10 carbon atoms. Specific examples of the chain alkyl group include linear alkyl groups such as a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, a nonyl group, and a decyl group; and branched alkyl groups such as a 1-methylethyl group, a 1-methylpropyl group, a 2-methylpropyl group, a 1-methylbutyl group, a 2-methylbutyl group, a 3-methylbutyl group, a 1-ethylbutyl group, a 2-ethylbutyl group, a 1-methylpentyl group, a 2-methylpentyl group, a 3-methylpentyl group, and a 4-methylpentyl group.
 前記鎖状のアルキル基が置換基としてフッ素原子又はフッ素化アルキル基を有するフッ素化アルキル基である場合、フッ素化アルキル基の炭素原子数は、1~11が好ましく、1~8がより好ましく、1~4がさらに好ましい。該フッ素化アルキル基は、フッ素原子以外の原子を含有してもよい。フッ素原子以外の原子としては、例えば酸素原子、硫黄原子、窒素原子等が挙げられる。 When the chain-like alkyl group is a fluorinated alkyl group having a fluorine atom or a fluorinated alkyl group as a substituent, the number of carbon atoms in the fluorinated alkyl group is preferably 1 to 11, more preferably 1 to 8, and even more preferably 1 to 4. The fluorinated alkyl group may contain atoms other than fluorine atoms. Examples of atoms other than fluorine atoms include oxygen atoms, sulfur atoms, and nitrogen atoms.
 以下に(d1-1)成分のアニオン部の好ましい具体例を示す。 The following are preferred examples of the anion portion of component (d1-1):
Figure JPOXMLDOC01-appb-C000069
Figure JPOXMLDOC01-appb-C000069
 ・・カチオン部
 式(d1-1)中、Mm+は、m価の有機カチオンである。
 Mm+の有機カチオンとしては、前記一般式(ca-1)~(ca-5)でそれぞれ表されるカチオンと同様のものが好適に挙げられ、前記一般式(ca-1)で表されるカチオンがより好ましく、前記式(ca-1-1)~(ca-1-70)でそれぞれ表されるカチオンがさらに好ましい。
 (d1-1)成分は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
In formula (d1-1), M m+ represents an m-valent organic cation.
Suitable examples of the organic cation of M m+ include the same cations as those represented by the general formulas (ca-1) to (ca-5), more preferably the cation represented by the general formula (ca-1), and even more preferably the cations represented by the general formulas (ca-1-1) to (ca-1-70).
The component (d1-1) may be used alone or in combination of two or more.
 {(d1-2)成分}
 ・・アニオン部
 式(d1-2)中、Rdは、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、前記R’201と同様のものが挙げられる。
 但し、Rdにおける、S原子に隣接する炭素原子にはフッ素原子は結合していない(フッ素置換されていない)ものとする。これにより、(d1-2)成分のアニオンが適度な弱酸アニオンとなり、(D)成分としてのクエンチング能が向上する。
 Rdとしては、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい脂肪族環式基であることが好ましい。鎖状のアルキル基としては、炭素原子数1~10であることが好ましく、3~10であることがより好ましい。脂肪族環式基としては、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等から1個以上の水素原子を除いた基(置換基を有してもよい);カンファー等から1個以上の水素原子を除いた基であることがより好ましい。
 Rdの炭化水素基は、置換基を有していてもよく、該置換基としては、前記式(d1-1)のRdにおける炭化水素基(芳香族炭化水素基、脂肪族環式基、鎖状のアルキル基)が有していてもよい置換基と同様のものが挙げられる。
{(d1-2) component}
In formula (d1-2), Rd2 represents a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent, and examples of R'201 include the same as those described above for R'201 .
However, in Rd2 , the carbon atom adjacent to the S atom does not have a fluorine atom bonded thereto (is not substituted with fluorine), whereby the anion of the component (d1-2) becomes an appropriately weak acid anion, and the quenching ability of the component (D) is improved.
Rd2 is preferably a chain alkyl group which may have a substituent, or an aliphatic cyclic group which may have a substituent. The chain alkyl group preferably has 1 to 10 carbon atoms, and more preferably has 3 to 10 carbon atoms. The aliphatic cyclic group is more preferably a group (which may have a substituent) in which one or more hydrogen atoms have been removed from adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, or the like; or a group in which one or more hydrogen atoms have been removed from camphor, or the like.
The hydrocarbon group of Rd2 may have a substituent, and examples of the substituent include the same as the substituents that may be possessed by the hydrocarbon group (aromatic hydrocarbon group, aliphatic cyclic group, chain alkyl group) in Rd1 of the above formula (d1-1).
 以下に(d1-2)成分のアニオン部の好ましい具体例を示す。 The following are preferred examples of the anion portion of component (d1-2):
Figure JPOXMLDOC01-appb-C000070
Figure JPOXMLDOC01-appb-C000070
 ・・カチオン部
 式(d1-2)中、Mm+は、m価の有機カチオンであり、前記式(d1-1)中のMm+と同様である。
 (d1-2)成分は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
Cation Moiety In formula (d1-2), M m+ represents an m-valent organic cation and is the same as M m+ in formula (d1-1).
The component (d1-2) may be used alone or in combination of two or more.
 {(d1-3)成分}
 ・・アニオン部
 式(d1-3)中、Rdは置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、前記R’201と同様のものが挙げられ、フッ素原子を含む環式基、鎖状のアルキル基、又は鎖状のアルケニル基であることが好ましい。中でも、フッ素化アルキル基が好ましく、前記Rdのフッ素化アルキル基と同様のものがより好ましい。
{(d1-3) component}
In formula (d1-3), Rd 3 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent, and examples thereof include the same as those of R' 201 , and is preferably a cyclic group, chain alkyl group, or chain alkenyl group containing a fluorine atom. Among these, a fluorinated alkyl group is preferable, and the same as the fluorinated alkyl group of Rd 1 is more preferable.
 式(d1-3)中、Rdは、置換基を有してもよい環式基、置換基を有してもよい鎖状のアルキル基、又は置換基を有してもよい鎖状のアルケニル基であり、前記R’201と同様のものが挙げられる。
 なかでも、置換基を有してもよいアルキル基、アルコキシ基、アルケニル基、環式基であることが好ましい。
 Rdにおけるアルキル基は、炭素原子数1~5の直鎖状又は分岐鎖状のアルキル基が好ましく、具体的には、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基等が挙げられる。Rdのアルキル基の水素原子の一部が水酸基、シアノ基等で置換されていてもよい。
 Rdにおけるアルコキシ基は、炭素原子数1~5のアルコキシ基が好ましく、炭素原子数1~5のアルコキシ基として具体的には、メトキシ基、エトキシ基、n-プロポキシ基、iso-プロポキシ基、n-ブトキシ基、tert-ブトキシ基が挙げられる。なかでも、メトキシ基、エトキシ基が好ましい。
In formula (d1-3), Rd4 represents a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent, and examples of R'201 include the same as those described above.
Among these, an alkyl group, an alkoxy group, an alkenyl group, or a cyclic group, which may have a substituent, is preferable.
The alkyl group in Rd 4 is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, and specific examples thereof include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, a neopentyl group, etc. A portion of the hydrogen atoms of the alkyl group in Rd 4 may be substituted with a hydroxyl group, a cyano group, etc.
The alkoxy group in Rd 4 is preferably an alkoxy group having 1 to 5 carbon atoms, and specific examples of the alkoxy group having 1 to 5 carbon atoms include a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group, and a tert-butoxy group. Of these, a methoxy group and an ethoxy group are preferred.
 Rdにおけるアルケニル基は、前記R’201におけるアルケニル基と同様のものが挙げられ、ビニル基、プロペニル基(アリル基)、1-メチルプロペニル基、2-メチルプロペニル基が好ましい。これらの基はさらに置換基として、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基を有していてもよい。 The alkenyl group in Rd4 may be the same as the alkenyl group in R'201 , and preferably a vinyl group, a propenyl group (allyl group), a 1-methylpropenyl group, or a 2-methylpropenyl group. These groups may further have an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms as a substituent.
 Rdにおける環式基は、前記R’201における環式基と同様のものが挙げられ、シクロペンタン、シクロヘキサン、アダマンタン、ノルボルナン、イソボルナン、トリシクロデカン、テトラシクロドデカン等のシクロアルカンから1個以上の水素原子を除いた脂環式基、又は、フェニル基、ナフチル基等の芳香族基が好ましい。Rdが脂環式基又は芳香族基である場合、レジスト組成物が有機溶剤に良好に溶解することにより、リソグラフィー特性が良好となる。 The cyclic group in Rd 4 may be the same as the cyclic group in R' 201 , and is preferably an alicyclic group in which one or more hydrogen atoms have been removed from a cycloalkane such as cyclopentane, cyclohexane, adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc., or an aromatic group such as a phenyl group, naphthyl group, etc. When Rd 4 is an alicyclic group or an aromatic group, the resist composition dissolves well in an organic solvent, and the lithography properties become good.
 式(d1-3)中、Ydは、単結合または2価の連結基である。
 Ydにおける2価の連結基としては、特に限定されないが、置換基を有してもよい2価の炭化水素基(脂肪族炭化水素基、芳香族炭化水素基)、ヘテロ原子を含む2価の連結基等が挙げられる。これらはそれぞれ、上記式(a2-1)中のYa21における2価の連結基についての説明のなかで挙げた、置換基を有してもよい2価の炭化水素基、ヘテロ原子を含む2価の連結基と同様のものが挙げられる。
 Ydとしては、カルボニル基、エステル結合、アミド結合、アルキレン基又はこれらの組み合わせであることが好ましい。アルキレン基としては、直鎖状又は分岐鎖状のアルキレン基であることがより好ましく、メチレン基又はエチレン基であることがさらに好ましい。
In formula (d1-3), Yd1 represents a single bond or a divalent linking group.
The divalent linking group in Yd 1 is not particularly limited, and examples thereof include a divalent hydrocarbon group which may have a substituent (an aliphatic hydrocarbon group, an aromatic hydrocarbon group), a divalent linking group containing a hetero atom, etc. These include the same as the divalent hydrocarbon group which may have a substituent and the divalent linking group containing a hetero atom mentioned in the description of the divalent linking group in Ya 21 in the above formula (a2-1).
Yd 1 is preferably a carbonyl group, an ester bond, an amide bond, an alkylene group, or a combination thereof. The alkylene group is more preferably a linear or branched alkylene group, and further preferably a methylene group or an ethylene group.
 以下に(d1-3)成分のアニオン部の好ましい具体例を示す。 The following are preferred examples of the anion portion of component (d1-3):
Figure JPOXMLDOC01-appb-C000071
Figure JPOXMLDOC01-appb-C000071
Figure JPOXMLDOC01-appb-C000072
Figure JPOXMLDOC01-appb-C000072
 ・・カチオン部
 式(d1-3)中、Mm+は、m価の有機カチオンであり、前記式(d1-1)中のMm+と同様である。
 (d1-3)成分は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
Cation Moiety In formula (d1-3), M m+ represents an m-valent organic cation and is the same as M m+ in formula (d1-1).
The component (d1-3) may be used alone or in combination of two or more.
 (D1)成分は、上記(d1-1)~(d1-3)成分のいずれか1種のみを用いてもよく、2種以上を組み合わせて用いてもよい。
 レジスト組成物が(D1)成分を含有する場合、レジスト組成物中、(D1)成分の含有量は、(A1)成分100質量部に対して、0.5~20質量部が好ましく、1~15質量部がより好ましく、2~8質量部がさらに好ましい。
 (D1)成分の含有量が好ましい下限値以上であると、特に良好なリソグラフィー特性及びレジストパターン形状が得られやすい。一方、上限値以下であると、感度を良好に維持でき、スループットにも優れる。
The component (D1) may be any one of the above components (d1-1) to (d1-3), or a combination of two or more of them.
When the resist composition contains the component (D1), the amount of the component (D1) in the resist composition is preferably 0.5 to 20 parts by mass, more preferably 1 to 15 parts by mass, and even more preferably 2 to 8 parts by mass, relative to 100 parts by mass of the component (A1).
When the amount of the component (D1) is at least as large as the preferred lower limit, particularly good lithography properties and resist pattern shape are likely to be obtained, while when the amount is no more than the upper limit, good sensitivity can be maintained and excellent throughput is also achieved.
 (D1)成分の製造方法:
 前記の(d1-1)成分、(d1-2)成分の製造方法は、特に限定されず、公知の方法により製造することができる。
 また、(d1-3)成分の製造方法は、特に限定されず、例えば、US2012-0149916号公報に記載の方法と同様にして製造される。
Production method of component (D1):
The method for producing the components (d1-1) and (d1-2) is not particularly limited, and they can be produced by known methods.
The method for producing the component (d1-3) is not particularly limited, and it can be produced, for example, in the same manner as the method described in US 2012-0149916.
 ・(D2)成分について
 (D)成分としては、上記の(D1)成分に該当しない含窒素有機化合物成分(以下「(D2)成分」という。)を含有してもよい。
 (D2)成分としては、酸拡散制御剤として作用するもので、かつ、(D1)成分に該当しないものであれば特に限定されず、公知のものから任意に用いればよい。なかでも、脂肪族アミンが好ましく、この中でも特に第2級脂肪族アミンや第3級脂肪族アミンがより好ましい。
 脂肪族アミンとは、1つ以上の脂肪族基を有するアミンであり、該脂肪族基は炭素原子数が1~12であることが好ましい。
 脂肪族アミンとしては、アンモニアNHの水素原子の少なくとも1つを、炭素原子数12以下のアルキル基もしくはヒドロキシアルキル基で置換したアミン(アルキルアミンもしくはアルキルアルコールアミン)又は環式アミンが挙げられる。
 アルキルアミンおよびアルキルアルコールアミンの具体例としては、n-ヘキシルアミン、n-ヘプチルアミン、n-オクチルアミン、n-ノニルアミン、n-デシルアミン等のモノアルキルアミン;ジエチルアミン、ジ-n-プロピルアミン、ジ-n-ヘプチルアミン、ジ-n-オクチルアミン、ジシクロヘキシルアミン等のジアルキルアミン;トリメチルアミン、トリエチルアミン、トリ-n-プロピルアミン、トリ-n-ブチルアミン、トリ-n-ペンチルアミン、トリ-n-ヘキシルアミン、トリ-n-ヘプチルアミン、トリ-n-オクチルアミン、トリ-n-ノニルアミン、トリ-n-デシルアミン、トリ-n-ドデシルアミン等のトリアルキルアミン;ジエタノールアミン、トリエタノールアミン、ジイソプロパノールアミン、トリイソプロパノールアミン、ジ-n-オクタノールアミン、トリ-n-オクタノールアミン等のアルキルアルコールアミンが挙げられる。これらの中でも、炭素原子数5~10のトリアルキルアミンがさらに好ましく、トリ-n-ペンチルアミン又はトリ-n-オクチルアミンが特に好ましい。
Regarding Component (D2) The component (D) may contain a nitrogen-containing organic compound component (hereinafter referred to as “component (D2)”) that does not fall under the category of the above-mentioned component (D1).
The component (D2) is not particularly limited as long as it acts as an acid diffusion controller and does not fall under the category of component (D1), and any known component may be used. Among these, aliphatic amines are preferred, and among these, secondary aliphatic amines and tertiary aliphatic amines are more preferred.
Aliphatic amines are amines that have one or more aliphatic groups, preferably having from 1 to 12 carbon atoms.
Examples of aliphatic amines include amines in which at least one of the hydrogen atoms of ammonia NH3 is substituted with an alkyl group or hydroxyalkyl group having 12 or less carbon atoms (alkylamines or alkyl alcohol amines), or cyclic amines.
Specific examples of alkylamines and alkyl alcohol amines include monoalkylamines such as n-hexylamine, n-heptylamine, n-octylamine, n-nonylamine, and n-decylamine; dialkylamines such as diethylamine, di-n-propylamine, di-n-heptylamine, di-n-octylamine, and dicyclohexylamine; trialkylamines such as trimethylamine, triethylamine, tri-n-propylamine, tri-n-butylamine, tri-n-pentylamine, tri-n-hexylamine, tri-n-heptylamine, tri-n-octylamine, tri-n-nonylamine, tri-n-decylamine, and tri-n-dodecylamine; and alkyl alcohol amines such as diethanolamine, triethanolamine, diisopropanolamine, triisopropanolamine, di-n-octanolamine, and tri-n-octanolamine. Among these, trialkylamines having 5 to 10 carbon atoms are more preferred, and tri-n-pentylamine or tri-n-octylamine is particularly preferred.
 環式アミンとしては、例えば、ヘテロ原子として窒素原子を含む複素環化合物が挙げられる。該複素環化合物としては、単環式のもの(脂肪族単環式アミン)であっても多環式のもの(脂肪族多環式アミン)であってもよい。
 脂肪族単環式アミンとして、具体的には、ピペリジン、ピペラジン等が挙げられる。
 脂肪族多環式アミンとしては、炭素原子数が6~10のものが好ましく、具体的には、1,5-ジアザビシクロ[4.3.0]-5-ノネン、1,8-ジアザビシクロ[5.4.0]-7-ウンデセン、ヘキサメチレンテトラミン、1,4-ジアザビシクロ[2.2.2]オクタン等が挙げられる。
Examples of cyclic amines include heterocyclic compounds containing a nitrogen atom as a heteroatom. The heterocyclic compounds may be monocyclic (aliphatic monocyclic amines) or polycyclic (aliphatic polycyclic amines).
Specific examples of the aliphatic monocyclic amine include piperidine and piperazine.
The aliphatic polycyclic amine is preferably one having 6 to 10 carbon atoms, and specific examples thereof include 1,5-diazabicyclo[4.3.0]-5-nonene, 1,8-diazabicyclo[5.4.0]-7-undecene, hexamethylenetetramine, and 1,4-diazabicyclo[2.2.2]octane.
 その他の脂肪族アミンとしては、トリス(2-メトキシメトキシエチル)アミン、トリス{2-(2-メトキシエトキシ)エチル}アミン、トリス{2-(2-メトキシエトキシメトキシ)エチル}アミン、トリス{2-(1-メトキシエトキシ)エチル}アミン、トリス{2-(1-エトキシエトキシ)エチル}アミン、トリス{2-(1-エトキシプロポキシ)エチル}アミン、トリス[2-{2-(2-ヒドロキシエトキシ)エトキシ}エチル]アミン、トリエタノールアミントリアセテート等が挙げられ、トリエタノールアミントリアセテートが好ましい。 Other aliphatic amines include tris(2-methoxymethoxyethyl)amine, tris{2-(2-methoxyethoxy)ethyl}amine, tris{2-(2-methoxyethoxymethoxy)ethyl}amine, tris{2-(1-methoxyethoxy)ethyl}amine, tris{2-(1-ethoxyethoxy)ethyl}amine, tris{2-(1-ethoxypropoxy)ethyl}amine, tris[2-{2-(2-hydroxyethoxy)ethoxy}ethyl]amine, triethanolamine triacetate, etc., with triethanolamine triacetate being preferred.
 また、(D2)成分としては、芳香族アミンを用いてもよい。
 芳香族アミンとしては、4-ジメチルアミノピリジン、ピロール、インドール、ピラゾール、イミダゾールまたはこれらの誘導体、トリベンジルアミン、2,6-ジイソプロピルアニリン、N-tert-ブトキシカルボニルピロリジン、2,6-ジ-tert-ブチルピリジン等が挙げられる。
Furthermore, an aromatic amine may be used as the component (D2).
Examples of aromatic amines include 4-dimethylaminopyridine, pyrrole, indole, pyrazole, imidazole or derivatives thereof, tribenzylamine, 2,6-diisopropylaniline, N-tert-butoxycarbonylpyrrolidine, and 2,6-di-tert-butylpyridine.
 (D2)成分は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。
 レジスト組成物が(D2)成分を含有する場合、レジスト組成物中、(D2)成分の含有量は、(A1)成分100質量部に対して、通常、0.01~5質量部の範囲で用いられる。上記範囲とすることにより、レジストパターン形状、引き置き経時安定性等が向上する。
The component (D2) may be used alone or in combination of two or more types.
When the resist composition contains the component (D2), the amount of the component (D2) in the resist composition is typically within a range from 0.01 to 5 parts by mass relative to 100 parts by mass of the component (A1). By ensuring that the amount is within this range, the resist pattern shape and the storage stability over time are improved.
 ≪有機カルボン酸、並びにリンのオキソ酸及びその誘導体からなる群より選択される少なくとも1種の化合物(E)≫
 本実施形態のレジスト組成物には、感度劣化の防止や、レジストパターン形状、引き置き経時安定性等の向上の目的で、任意の成分として、有機カルボン酸、並びにリンのオキソ酸及びその誘導体からなる群より選択される少なくとも1種の化合物(E)(以下「(E)成分」という)を含有させることができる。
 有機カルボン酸として、具体的には、酢酸、マロン酸、クエン酸、リンゴ酸、コハク酸、安息香酸、サリチル酸等が挙げられ、その中でも、サリチル酸が好ましい。
 リンのオキソ酸としては、リン酸、ホスホン酸、ホスフィン酸等が挙げられ、これらの中でも特にホスホン酸が好ましい。
 リンのオキソ酸の誘導体としては、例えば、上記オキソ酸の水素原子を炭化水素基で置換したエステル等が挙げられ、前記炭化水素基としては、炭素原子数1~5のアルキル基、炭素原子数6~15のアリール基等が挙げられる。
 リン酸の誘導体としては、リン酸ジ-n-ブチルエステル、リン酸ジフェニルエステル等のリン酸エステルなどが挙げられる。
 ホスホン酸の誘導体としては、ホスホン酸ジメチルエステル、ホスホン酸-ジ-n-ブチルエステル、フェニルホスホン酸、ホスホン酸ジフェニルエステル、ホスホン酸ジベンジルエステル等のホスホン酸エステルなどが挙げられる。
 ホスフィン酸の誘導体としては、ホスフィン酸エステルやフェニルホスフィン酸などが挙げられる。
 本実施形態のレジスト組成物において、(E)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。
 レジスト組成物が(E)成分を含有する場合、(E)成分の含有量は、(A)成分100質量部に対して、0.01~5質量部が好ましく、0.05~3質量部がより好ましい。上記範囲とすることにより、感度及びリソグラフィー特性等が向上する。
<At least one compound (E) selected from the group consisting of organic carboxylic acids, phosphorus oxoacids and derivatives thereof>
For the purposes of preventing deterioration of sensitivity and improving the resist pattern shape and storage stability, etc., the resist composition of this embodiment may contain, as an optional component, at least one compound (E) selected from the group consisting of organic carboxylic acids, and phosphorus oxoacids and derivatives thereof (hereafter referred to as "component (E)").
Specific examples of the organic carboxylic acid include acetic acid, malonic acid, citric acid, malic acid, succinic acid, benzoic acid, and salicylic acid, and among these, salicylic acid is preferred.
Examples of phosphorus oxoacids include phosphoric acid, phosphonic acid, and phosphinic acid, with phosphonic acid being particularly preferred.
Examples of the derivatives of phosphorus oxoacids include esters in which the hydrogen atoms of the above oxoacids are substituted with hydrocarbon groups. Examples of the hydrocarbon groups include alkyl groups having 1 to 5 carbon atoms and aryl groups having 6 to 15 carbon atoms.
Examples of the derivatives of phosphoric acid include phosphoric acid esters such as di-n-butyl phosphoric acid ester and diphenyl phosphoric acid ester.
Examples of the derivatives of phosphonic acid include phosphonic acid esters such as dimethyl phosphonate, di-n-butyl phosphonate, phenylphosphonic acid, diphenyl phosphonate, and dibenzyl phosphonate.
Derivatives of phosphinic acid include phosphinic acid esters and phenylphosphinic acid.
In the resist composition of this embodiment, the component (E) may use either a single type, or a combination of two or more types.
When the resist composition contains the component (E), the content of the component (E) is preferably from 0.01 to 5 parts by mass, and more preferably from 0.05 to 3 parts by mass, relative to 100 parts by mass of the component (A). By ensuring that the content is within this range, the sensitivity and lithography properties, etc. are improved.
 ≪フッ素添加剤成分(F)≫
 本実施形態のレジスト組成物は、疎水性樹脂としてフッ素添加剤成分(以下「(F)成分」という)を含有してもよい。(F)成分は、レジスト膜に撥水性を付与するために使用され、(A)成分とは別の樹脂として用いられることでリソグラフィー特性を向上させることができる。
 (F)成分としては、例えば、特開2010-002870号公報、特開2010-032994号公報、特開2010-277043号公報、特開2011-13569号公報、特開2011-128226号公報に記載の含フッ素高分子化合物を用いることができる。
 (F)成分としてより具体的には、下記一般式(f1-1)で表される構成単位(f1)を有する重合体が挙げられる。この重合体としては、下記式(f1-1)で表される構成単位(f1)のみからなる重合体(ホモポリマー);該構成単位(f1)と前記構成単位(a1)との共重合体;該構成単位(f1)とアクリル酸又はメタクリル酸から誘導される構成単位と前記構成単位(a1)との共重合体であることが好ましく、該構成単位(f1)と前記構成単位(a1)との共重合体であることがより好ましい。ここで、該構成単位(f1)と共重合される前記構成単位(a1)としては、1-エチル-1-シクロオクチル(メタ)アクリレートから誘導される構成単位、1-メチル-1-アダマンチル(メタ)アクリレートから誘導される構成単位が好ましく、1-エチル-1-シクロオクチル(メタ)アクリレートから誘導される構成単位がより好ましい。
<Fluorine additive component (F)>
The resist composition of this embodiment may contain a fluorine additive component (hereafter referred to as "component (F)") as a hydrophobic resin. The component (F) is used to impart water repellency to the resist film, and when used as a resin separate from the component (A), it can improve lithography properties.
As the component (F), for example, the fluorine-containing polymeric compounds described in JP-A-2010-002870, JP-A-2010-032994, JP-A-2010-277043, JP-A-2011-13569, and JP-A-2011-128226 can be used.
More specifically, the component (F) may be a polymer having a structural unit (f1) represented by the following general formula (f1-1). The polymer is preferably a polymer (homopolymer) consisting only of the structural unit (f1) represented by the following formula (f1-1); a copolymer of the structural unit (f1) and the structural unit (a1); or a copolymer of the structural unit (f1), a structural unit derived from acrylic acid or methacrylic acid, and the structural unit (a1), and more preferably a copolymer of the structural unit (f1) and the structural unit (a1). Here, the structural unit (a1) copolymerized with the structural unit (f1) is preferably a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate or a structural unit derived from 1-methyl-1-adamantyl (meth)acrylate, and more preferably a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate.
Figure JPOXMLDOC01-appb-C000073
[式中、Rは前記と同様であり、Rf102およびRf103はそれぞれ独立して水素原子、ハロゲン原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基を表し、Rf102およびRf103は同じであっても異なっていてもよい。nfは0~5の整数であり、Rf101はフッ素原子を含む有機基である。]
Figure JPOXMLDOC01-appb-C000073
[In the formula, R is the same as above, Rf 102 and Rf 103 each independently represent a hydrogen atom, a halogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms, and Rf 102 and Rf 103 may be the same or different. nf 1 is an integer of 0 to 5, and Rf 101 is an organic group containing a fluorine atom.]
 式(f1-1)中、α位の炭素原子に結合したRは、前記と同様である。Rとしては、水素原子またはメチル基が好ましい。
 式(f1-1)中、Rf102およびRf103のハロゲン原子としては、フッ素原子が好ましい。Rf102およびRf103の炭素原子数1~5のアルキル基としては、上記Rの炭素原子数1~5のアルキル基と同様のものが挙げられ、メチル基またはエチル基が好ましい。Rf102およびRf103の炭素原子数1~5のハロゲン化アルキル基として、具体的には、炭素原子数1~5のアルキル基の水素原子の一部または全部が、ハロゲン原子で置換された基が挙げられる。該ハロゲン原子としては、フッ素原子が好ましい。なかでもRf102およびRf103としては、水素原子、フッ素原子、又は炭素原子数1~5のアルキル基が好ましく、水素原子、フッ素原子、メチル基、またはエチル基がより好ましく、水素原子がさらに好ましい。
 式(f1-1)中、nfは0~5の整数であり、0~3の整数が好ましく、1又は2であることがより好ましい。
In formula (f1-1), R bonded to the carbon atom at the α-position is the same as defined above. R is preferably a hydrogen atom or a methyl group.
In formula (f1-1), the halogen atom of Rf 102 and Rf 103 is preferably a fluorine atom. The alkyl group having 1 to 5 carbon atoms of Rf 102 and Rf 103 may be the same as the alkyl group having 1 to 5 carbon atoms of R, and preferably a methyl group or an ethyl group. Specific examples of the halogenated alkyl group having 1 to 5 carbon atoms of Rf 102 and Rf 103 include groups in which part or all of the hydrogen atoms of an alkyl group having 1 to 5 carbon atoms are substituted with halogen atoms. The halogen atom is preferably a fluorine atom. Among them, Rf 102 and Rf 103 are preferably a hydrogen atom, a fluorine atom, or an alkyl group having 1 to 5 carbon atoms, more preferably a hydrogen atom, a fluorine atom, a methyl group, or an ethyl group, and even more preferably a hydrogen atom.
In formula (f1-1), nf 1 represents an integer of 0 to 5, preferably an integer of 0 to 3, and more preferably 1 or 2.
 式(f1-1)中、Rf101は、フッ素原子を含む有機基であり、フッ素原子を含む炭化水素基であることが好ましい。
 フッ素原子を含む炭化水素基としては、直鎖状、分岐鎖状または環状のいずれであってもよく、炭素原子数は1~20であることが好ましく、炭素原子数1~15であることがより好ましく、炭素原子数1~10が特に好ましい。
 また、フッ素原子を含む炭化水素基は、当該炭化水素基における水素原子の25%以上がフッ素化されていることが好ましく、50%以上がフッ素化されていることがより好ましく、60%以上がフッ素化されていることが、浸漬露光時のレジスト膜の疎水性が高まることから特に好ましい。
 なかでも、Rf101としては、炭素原子数1~6のフッ素化炭化水素基がより好ましく、トリフルオロメチル基、-CH-CF、-CH-CF-CF、-CH(CF、-CH-CH-CF、-CH-CH-CF-CF-CF-CFが特に好ましい。
In formula (f1-1), Rf 101 is an organic group containing a fluorine atom, and is preferably a hydrocarbon group containing a fluorine atom.
The fluorine atom-containing hydrocarbon group may be linear, branched, or cyclic and preferably has 1 to 20 carbon atoms, more preferably has 1 to 15 carbon atoms, and particularly preferably has 1 to 10 carbon atoms.
In addition, in the hydrocarbon group containing fluorine atoms, preferably 25% or more of the hydrogen atoms in the hydrocarbon group are fluorinated, more preferably 50% or more, and particularly preferably 60% or more are fluorinated, as this enhances the hydrophobicity of the resist film during immersion exposure.
Of these, Rf 101 is more preferably a fluorinated hydrocarbon group having 1 to 6 carbon atoms, with a trifluoromethyl group, -CH 2 -CF 3 , -CH 2 -CF 2 -CF 3 , -CH(CF 3 ) 2 , -CH 2 -CH 2 -CF 3 , and -CH 2 -CH 2 -CF 2 -CF 2 -CF 2 -CF 3 being particularly preferred.
 (F)成分の重量平均分子量(Mw)(ゲルパーミエーションクロマトグラフィーによるポリスチレン換算基準)は、1000~50000が好ましく、5000~40000がより好ましく、10000~30000が最も好ましい。この範囲の上限値以下であると、レジストとして用いるのにレジスト用溶剤への充分な溶解性があり、この範囲の下限値以上であると、レジスト膜の撥水性が良好である。
 (F)成分の分散度(Mw/Mn)は、1.0~5.0が好ましく、1.0~3.0がより好ましく、1.0~2.5が最も好ましい。
The weight average molecular weight (Mw) of component (F) (based on polystyrene equivalent measured by gel permeation chromatography) is preferably from 1,000 to 50,000, more preferably from 5,000 to 40,000, and most preferably from 10,000 to 30,000. When it is below the upper limit of this range, the compound has sufficient solubility in a resist solvent for use as a resist, and when it is above the lower limit of this range, the resist film has good water repellency.
The dispersity (Mw/Mn) of the component (F) is preferably from 1.0 to 5.0, more preferably from 1.0 to 3.0, and most preferably from 1.0 to 2.5.
 本実施形態のレジスト組成物において、(F)成分は、1種を単独で用いてもよく、2種以上を併用してもよい。
 レジスト組成物が(F)成分を含有する場合、(F)成分の含有量は、(A)成分100質量部に対して、0.5~10質量部であることが好ましく、1~10質量部であることがより好ましい。
In the resist composition of this embodiment, the component (F) may use either a single type, or a combination of two or more types.
When the resist composition contains the component (F), the amount of the component (F) per 100 parts by mass of the component (A) is preferably 0.5 to 10 parts by mass, and more preferably 1 to 10 parts by mass.
 ≪有機溶剤成分(S)≫
 本実施形態のレジスト組成物は、レジスト材料を有機溶剤成分(以下「(S)成分」という)に溶解させて製造することができる。
 (S)成分としては、使用する各成分を溶解し、均一な溶液とすることができるものであればよく、従来、化学増幅型レジスト組成物の溶剤として公知のものの中から任意のものを適宜選択して用いることができる。
 本実施形態のレジスト組成物において、(S)成分は、1種単独で用いてもよく、2種以上の混合溶剤として用いてもよい。なかでも、PGMEA、PGME、γ-ブチロラクトン、EL、シクロヘキサノンが好ましい。
<Organic solvent component (S)>
The resist composition of this embodiment can be produced by dissolving the resist materials in an organic solvent component (hereafter referred to as “component (S)”).
The component (S) can be any solvent that is capable of dissolving the individual components used and forming a homogeneous solution, and any solvent can be appropriately selected from those known in the art as a solvent for chemically amplified resist compositions.
In the resist composition of this embodiment, the component (S) may be used alone or as a mixed solvent of two or more different types. Of these, PGMEA, PGME, γ-butyrolactone, EL, and cyclohexanone are preferred.
 また、(S)成分としては、PGMEAと極性溶剤とを混合した混合溶剤も好ましい。その配合比(質量比)は、PGMEAと極性溶剤との相溶性等を考慮して適宜決定すればよい。
 また、(S)成分として、その他には、PGMEA及びELの中から選ばれる少なくとも1種とγ-ブチロラクトンとの混合溶剤も好ましい。この場合、混合割合としては、前者と後者との質量比が、好ましくは70:30~95:5とされる。
 (S)成分の使用量は、特に限定されず、基板等に塗布可能な濃度で、塗布膜厚に応じて適宜設定される。一般的にはレジスト組成物の固形分濃度が0.1~20質量%、好ましくは0.2~15質量%の範囲内となるように(S)成分は用いられる。
As the component (S), a mixed solvent of PGMEA and a polar solvent is also preferred. The blending ratio (mass ratio) may be appropriately determined taking into consideration the compatibility between PGMEA and the polar solvent, etc.
As the component (S), a mixed solvent of at least one selected from PGMEA and EL with γ-butyrolactone is also preferred. In this case, the mixing ratio of the former to the latter is preferably 70:30 to 95:5 by mass.
There are no particular limitations on the amount of the component (S) used, and it is set appropriately depending on the coating film thickness so as to provide a concentration that allows application to a substrate, etc. In general, the component (S) is used so that the solids concentration of the resist composition falls within the range of 0.1 to 20 mass %, and preferably 0.2 to 15 mass %.
 本実施形態のレジスト組成物には、さらに所望により混和性のある添加剤、例えばレジスト膜の性能を改良するための付加的樹脂、溶解抑制剤、可塑剤、安定剤、着色剤、ハレーション防止剤、染料などを適宜、添加含有させることができる。 The resist composition of this embodiment may further contain compatible additives, such as additional resins to improve the performance of the resist film, dissolution inhibitors, plasticizers, stabilizers, colorants, antihalation agents, dyes, etc., as desired.
 本実施形態のレジスト組成物は、上記レジスト材料を(S)成分に溶解させた後、ポリイミド多孔質膜、ポリアミドイミド多孔質膜等を用いて、不純物等の除去を行ってもよい。例えば、ポリイミド多孔質膜からなるフィルター、ポリアミドイミド多孔質膜からなるフィルター、ポリイミド多孔質膜及びポリアミドイミド多孔質膜からなるフィルター等を用いて、レジスト組成物の濾過を行ってもよい。前記ポリイミド多孔質膜及び前記ポリアミドイミド多孔質膜としては、例えば、特開2016-155121号公報に記載のもの等が例示される。 In the resist composition of this embodiment, after dissolving the resist material in the (S) component, impurities and the like may be removed using a polyimide porous film, a polyamideimide porous film, or the like. For example, the resist composition may be filtered using a filter made of a polyimide porous film, a filter made of a polyamideimide porous film, or a filter made of a polyimide porous film and a polyamideimide porous film. Examples of the polyimide porous film and the polyamideimide porous film include those described in JP 2016-155121 A.
 以上説明した本実施形態のレジスト組成物は、一般式(a0-1)で表される化合物から誘導される構成単位(a0)を有する樹脂成分(A1)を含む。
 構成単位(a0)は、式(a0-1)中のカルボニルオキシ基(-C(=O)-O-)に結合した酸解離性基Ra01と、置換基を有してもよい芳香環を含む酸非解離性基Ra02とが芳香環Arに結合している。
 構成単位(a0)は、特にRa02が酸素原子を含む場合、Ra02のプロトン親和性が高まり、プロトンが集まりやすくなる。そのため、レジスト膜の露光部において、酸解離性基Ra01の酸脱離性が高まり、高感度化が図れると推測される。
 また、レジスト膜の未露光部において、芳香環を含む酸非解離性基Ra02同士、又は芳香環を含む酸非解離性基Ra02と酸解離性基Ra01との相互作用により、膜剛性が向上していると推測される。
 また、構成単位(a0)は、嵩高い構造のRa02を含むため、酸拡散抑制の効果を発揮し、ラフネスが低減されると推測される。
 また、構成単位(a0)は、芳香環を含む酸非解離性基Ra02を含むため、エッチング時の揮発が抑制され、エッチング耐性が高められると推測される。
 上記の効果が相まって、本実施形態のレジスト組成物は、高感度化が図れ、且つリソグラフィー特性が良好で、エッチング耐性も良好であると推測される。
The resist composition of the present embodiment described above contains a resin component (A1) that has a structural unit (a0) derived from a compound represented by general formula (a0-1).
In the structural unit (a0), an acid dissociable group Ra 01 which is bonded to a carbonyloxy group (-C(=O)-O-) in formula (a0-1), and an acid non-dissociable group Ra 02 which includes an aromatic ring which may have a substituent, are bonded to the aromatic ring Ar.
In the structural unit (a0), particularly when Ra 02 contains an oxygen atom, the proton affinity of Ra 02 increases and protons tend to collect, which is presumably why the acid-dissociable group Ra 01 has an increased ability to be released from the acid in the exposed areas of the resist film, thereby improving sensitivity.
It is also presumed that in the unexposed areas of the resist film, film rigidity is improved due to interaction between the aromatic ring-containing acid non-dissociable groups Ra 02 or between the aromatic ring-containing acid non-dissociable group Ra 02 and the acid dissociable group Ra 01 .
Furthermore, since the structural unit (a0) contains Ra 02 which has a bulky structure, it is presumed that it exerts the effect of suppressing acid diffusion and reduces roughness.
Furthermore, since the structural unit (a0) contains an aromatic ring-containing acid non-dissociable group Ra 02 , it is presumed that volatilization during etching is suppressed and etching resistance is improved.
It is presumed that due to the combination of the above effects, the resist composition of this embodiment has high sensitivity, good lithography properties, and good etching resistance.
 (レジストパターン形成方法)
 本発明の第2の態様に係るレジストパターン形成方法は、支持体上に、上述した本発明の第1の態様に係るレジスト組成物を用いてレジスト膜を形成する工程、前記レジスト膜を露光する工程、及び前記露光後のレジスト膜を現像してレジストパターンを形成する工程を有する方法である。
 かかるレジストパターン形成方法の一実施形態としては、例えば以下のようにして行うレジストパターン形成方法が挙げられる。
(Method of forming a resist pattern)
A method for forming a resist pattern according to the second aspect of the present invention is a method comprising the steps of forming a resist film on a support using the resist composition according to the first aspect of the present invention, exposing the resist film to light, and developing the exposed resist film to form a resist pattern.
One embodiment of the resist pattern forming method is, for example, a resist pattern forming method carried out as follows.
 まず、上述した実施形態のレジスト組成物を、支持体上にスピンナー等で塗布し、ベーク(ポストアプライベーク(PAB))処理を、例えば80~150℃の温度条件にて40~120秒間、好ましくは60~90秒間施してレジスト膜を形成する。
 次に、該レジスト膜に対し、例えば電子線描画装置、ArF露光装置等の露光装置を用いて、所定のパターンが形成されたマスク(マスクパターン)を介した露光またはマスクパターンを介さない電子線の直接照射による描画等による選択的露光を行った後、ベーク(ポストエクスポージャーベーク(PEB))処理を、例えば80~150℃の温度条件にて40~120秒間、好ましくは60~90秒間施す。
 次に、前記レジスト膜を現像処理する。現像処理は、アルカリ現像プロセスの場合は、アルカリ現像液を用い、溶剤現像プロセスの場合は、有機溶剤を含有する現像液(有機系現像液)を用いて行う。
First, the resist composition of the above-described embodiment is applied onto a support using a spinner or the like, and then baked (post-applied bake (PAB)) at a temperature of, for example, 80 to 150° C. for 40 to 120 seconds, preferably 60 to 90 seconds, to form a resist film.
Next, the resist film is selectively exposed using an exposure device such as an electron beam lithography device or an ArF lithography device, either through a mask (mask pattern) on which a predetermined pattern has been formed, or by lithography using direct irradiation with an electron beam without using a mask pattern, and then baked (post-exposure bake (PEB)) for 40 to 120 seconds, preferably 60 to 90 seconds, at a temperature of, for example, 80 to 150° C.
Next, the resist film is developed using an alkaline developer in the case of an alkaline development process, or a developer containing an organic solvent (organic developer) in the case of a solvent development process.
 現像処理後、好ましくはリンス処理を行う。リンス処理は、アルカリ現像プロセスの場合は、純水を用いた水リンスが好ましく、溶剤現像プロセスの場合は、有機溶剤を含有するリンス液を用いることが好ましい。
 溶剤現像プロセスの場合、前記現像処理またはリンス処理の後に、パターン上に付着している現像液またはリンス液を、超臨界流体により除去する処理を行ってもよい。
 現像処理後またはリンス処理後、乾燥を行う。また、場合によっては、上記現像処理後にベーク処理(ポストベーク)を行ってもよい。
After the development process, a rinse process is preferably carried out. In the case of an alkaline development process, the rinse process is preferably a water rinse using pure water, and in the case of a solvent development process, a rinse liquid containing an organic solvent is preferably used.
In the case of a solvent development process, after the development treatment or rinsing treatment, a treatment may be carried out in which the developer or rinsing liquid adhering to the pattern is removed by using a supercritical fluid.
After the development treatment or rinsing treatment, drying is performed. In some cases, a baking treatment (post-baking) may be performed after the development treatment.
 支持体としては、特に限定されず、従来公知のものを用いることができ、例えば、電子部品用の基板や、これに所定の配線パターンが形成されたもの等が挙げられる。より具体的には、シリコンウェーハ、銅、クロム、鉄、アルミニウム等の金属製の基板や、ガラス基板等が挙げられる。配線パターンの材料としては、例えば銅、アルミニウム、ニッケル、金等が使用可能である。 The support is not particularly limited, and conventionally known materials can be used, such as substrates for electronic components and substrates on which a predetermined wiring pattern is formed. More specifically, examples include silicon wafers, substrates made of metals such as copper, chromium, iron, and aluminum, and glass substrates. Materials that can be used for the wiring pattern include, for example, copper, aluminum, nickel, and gold.
 露光に用いる波長は、特に限定されず、ArFエキシマレーザー、KrFエキシマレーザー、Fエキシマレーザー、EUV(極端紫外線)、VUV(真空紫外線)、EB(電子線)、X線、軟X線等の放射線を用いて行うことができる。 The wavelength used for exposure is not particularly limited, and radiation such as ArF excimer laser, KrF excimer laser, F2 excimer laser, EUV (extreme ultraviolet), VUV (vacuum ultraviolet), EB (electron beam), X-rays, and soft X-rays can be used.
 レジスト膜の露光方法は、空気や窒素等の不活性ガス中で行う通常の露光(ドライ露光)であってもよく、液浸露光(Liquid Immersion Lithography)であってもよい。
 液浸露光は、予めレジスト膜と露光装置の最下位置のレンズ間を、空気の屈折率よりも大きい屈折率を有する溶媒(液浸媒体)で満たし、その状態で露光(浸漬露光)を行う露光方法である。
 液浸媒体としては、空気の屈折率よりも大きく、かつ、露光されるレジスト膜の屈折率よりも小さい屈折率を有する溶媒が好ましく、例えば、水、フッ素系不活性液体、シリコン系溶剤、炭化水素系溶剤等が挙げられる。
 液浸媒体としては、水が好ましく用いられる。
The exposure method for the resist film may be a normal exposure method (dry exposure) performed in air or an inert gas such as nitrogen, or may be liquid immersion exposure (liquid immersion lithography).
Immersion exposure is an exposure method in which the space between the resist film and the lowest lens of the exposure tool is filled with a solvent (immersion medium) that has a refractive index greater than that of air, and exposure (immersion exposure) is then performed in that state.
The immersion medium is preferably a solvent having a refractive index greater than that of air and less than that of the resist film to be exposed, and examples of such a solvent include water, a fluorine-based inert liquid, a silicon-based solvent, and a hydrocarbon-based solvent.
As the liquid immersion medium, water is preferably used.
 アルカリ現像プロセスで現像処理に用いるアルカリ現像液としては、例えば0.1~10質量%テトラメチルアンモニウムヒドロキシド(TMAH)水溶液が挙げられる。
 溶剤現像プロセスで現像処理に用いる有機系現像液が含有する有機溶剤としては、(A)成分(露光前の(A)成分)を溶解し得るものであればよく、公知の有機溶剤の中から適宜選択できる。具体的には、ケトン系溶剤、エステル系溶剤、アルコール系溶剤、ニトリル系溶剤、アミド系溶剤、エーテル系溶剤等の極性溶剤、炭化水素系溶剤等が挙げられる。
The alkaline developer used in the development treatment in the alkaline development process may be, for example, a 0.1 to 10% by weight aqueous solution of tetramethylammonium hydroxide (TMAH).
The organic solvent contained in the organic developer used in the development treatment in the solvent development process may be any organic solvent capable of dissolving the component (A) (the component (A) before exposure), and may be appropriately selected from known organic solvents. Specific examples of the organic solvent include polar solvents such as ketone solvents, ester solvents, alcohol solvents, nitrile solvents, amide solvents, and ether solvents, and hydrocarbon solvents.
 エステル系溶剤としては、例えば、酢酸メチル、酢酸ブチル、酢酸エチル、酢酸イソプロピル、酢酸ペンチル、酢酸イソペンチル、酢酸アミル、プロピレングリコールモノメチルエーテルアセテート、エチレングリコールモノエチルエーテルアセテート、ジエチレングリコールモノブチルエーテルアセテート、ジエチレングリコールモノエチルエーテルアセテート、エチル―3-エトキシプロピオネート、3-メトキシブチルアセテート、3-メチル-3-メトキシブチルアセテート、蟻酸メチル、蟻酸エチル、蟻酸ブチル、蟻酸プロピル、乳酸エチル、乳酸ブチル、乳酸プロピル、ブタン酸ブチル、2-ヒドロキシイソ酪酸メチル、酢酸イソアミル、イソ酪酸イソブチル、及び、プロピオン酸ブチルが挙げられる。 Ester solvents include, for example, methyl acetate, butyl acetate, ethyl acetate, isopropyl acetate, pentyl acetate, isopentyl acetate, amyl acetate, propylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, ethyl-3-ethoxypropionate, 3-methoxybutyl acetate, 3-methyl-3-methoxybutyl acetate, methyl formate, ethyl formate, butyl formate, propyl formate, ethyl lactate, butyl lactate, propyl lactate, butyl butanoate, methyl 2-hydroxyisobutyrate, isoamyl acetate, isobutyl isobutyrate, and butyl propionate.
 ニトリル系溶剤としては、例えば、アセトニトリル、プロピオニトリル、バレロニトリル、ブチロニトリル等が挙げられる。 Examples of nitrile solvents include acetonitrile, propionitrile, valeronitrile, butyronitrile, etc.
 有機系現像液には、必要に応じて公知の添加剤を配合できる。該添加剤としては、例えば界面活性剤が挙げられる。  Known additives can be added to the organic developer as necessary. Examples of such additives include surfactants.
 現像処理は、公知の現像方法により実施することが可能であり、例えば現像液中に支持体を一定時間浸漬する方法(ディップ法)、支持体表面に現像液を表面張力によって盛り上げて一定時間静止する方法(パドル法)、支持体表面に現像液を噴霧する方法(スプレー法)、一定速度で回転している支持体上に一定速度で現像液塗出ノズルをスキャンしながら現像液を塗出し続ける方法(ダイナミックディスペンス法)等が挙げられる。 The development process can be carried out by a known development method, such as a method of immersing the support in a developer for a certain period of time (dip method), a method of piling up the developer on the surface of the support by surface tension and leaving it still for a certain period of time (paddle method), a method of spraying the developer on the surface of the support (spray method), or a method of continuously applying developer while scanning a developer application nozzle at a constant speed onto a support rotating at a constant speed (dynamic dispense method).
 溶剤現像プロセスで現像処理後のリンス処理に用いるリンス液が含有する有機溶剤としては、例えば前記有機系現像液に用いる有機溶剤として挙げた有機溶剤のうち、レジストパターンを溶解しにくいものを適宜選択して使用できる。通常、炭化水素系溶剤、ケトン系溶剤、エステル系溶剤、アルコール系溶剤、アミド系溶剤およびエーテル系溶剤から選択される少なくとも1種類の溶剤を使用する。
 これらの有機溶剤は、いずれか1種を単独で用いてもよく、2種以上を併用してもよい。また、上記以外の有機溶剤や水と混合して用いてもよい。
The organic solvent contained in the rinse solution used in the rinsing treatment after the development treatment in the solvent development process can be appropriately selected from the organic solvents listed above as the organic solvents used in the organic developer, which do not easily dissolve the resist pattern. Usually, at least one solvent selected from the group consisting of hydrocarbon solvents, ketone solvents, ester solvents, alcohol solvents, amide solvents, and ether solvents is used.
These organic solvents may be used alone or in combination of two or more thereof, and may be used in combination with other organic solvents or water.
 リンス液を用いたリンス処理(洗浄処理)は、公知のリンス方法により実施できる。該リンス処理の方法としては、例えば一定速度で回転している支持体上にリンス液を塗出し続ける方法(回転塗布法)、リンス液中に支持体を一定時間浸漬する方法(ディップ法)、支持体表面にリンス液を噴霧する方法(スプレー法)等が挙げられる。 The rinse treatment (cleaning treatment) using a rinse solution can be carried out by a known rinse method. Examples of the rinse treatment method include a method in which the rinse solution is continuously applied onto a support rotating at a constant speed (spin coating method), a method in which the support is immersed in the rinse solution for a certain period of time (dip method), and a method in which the rinse solution is sprayed onto the surface of the support (spray method).
 上述した実施形態のレジスト組成物、及び、上述した実施形態のレジストパターン形成方法において使用される各種材料(例えば、レジスト溶剤、現像液、リンス液、反射防止膜形成用組成物、トップコート形成用組成物など)は、金属、ハロゲンを含む金属塩、酸、アルカリ、硫黄原子又はリン原子を含む成分等の不純物を含まないことが好ましい。
 ここで、金属原子を含む不純物としては、Na、K、Ca、Fe、Cu、Mn、Mg、Al、Cr、Ni、Zn、Ag、Sn、Pb、Li、またはこれらの塩などを挙げることができる。これら材料に含まれる不純物の含有量としては、200ppb以下が好ましく、1ppb以下がより好ましく、100ppt(parts per trillion)以下がさらに好ましく、10ppt以下が特に好ましく、実質的に含まないこと(測定装置の検出限界以下であること)が最も好ましい。
The resist composition of the above-mentioned embodiment and the various materials used in the method of forming a resist pattern of the above-mentioned embodiment (e.g., a resist solvent, a developer, a rinse solution, a composition for forming an antireflective film, a composition for forming a top coat, etc.) preferably do not contain impurities such as metals, metal salts containing halogens, acids, alkalis, and components containing sulfur atoms or phosphorus atoms.
Here, examples of impurities containing metal atoms include Na, K, Ca, Fe, Cu, Mn, Mg, Al, Cr, Ni, Zn, Ag, Sn, Pb, Li, or salts thereof. The content of impurities contained in these materials is preferably 200 ppb or less, more preferably 1 ppb or less, even more preferably 100 ppt (parts per trillion) or less, particularly preferably 10 ppt or less, and most preferably substantially free of impurities (below the detection limit of the measuring device).
 以上説明した本実施形態のレジストパターン形成方法によれば、上述したレジスト組成物が用いられているため、高感度化が図られ、かつ、CDUが良好なレジストパターンを形成することができる。 The resist pattern forming method of this embodiment described above uses the resist composition described above, which allows for high sensitivity and the formation of a resist pattern with good CDU.
(化合物)
 本実施形態の化合物は、下記一般式(a0-11)で表される。
(Compound)
The compound of this embodiment is represented by the following general formula (a0-11).
Figure JPOXMLDOC01-appb-C000074
[式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基であり;La01は、単結合又は-C(=O)-O-であり;Arは、芳香環であり;Ra011は、環構造を含む酸解離性基であり;m1は、原子価が許容する限り、1以上の整数であり;Ra02は、置換基を有してもよい芳香環を含む酸非解離性基であり;m2は、原子価が許容する限り、1以上の整数であり;Ra03は、COORa01及びRa02以外の置換基であり;m3は、原子価が許容する限り、0以上の整数である。]
Figure JPOXMLDOC01-appb-C000074
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms; La 01 is a single bond or -C(=O)-O-; Ar is an aromatic ring; Ra 011 is an acid dissociable group containing a ring structure; m1 is an integer of 1 or more as long as the valence allows; Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent; m2 is an integer of 1 or more as long as the valence allows; Ra 03 is a substituent other than COORa 01 and Ra 02 ; and m3 is an integer of 0 or more as long as the valence allows.]
 本実施形態の化合物は、前記式(a0-11)中のRa011が環構造を含む酸解離性基であること以外は、前記第1の態様に係るレジスト組成物の(A1)成分が有する構成単位(a0)を誘導する化合物と同様である。 The compound of this embodiment is similar to the compound that derives the structural unit (a0) that is contained in the component (A1) of the resist composition related to the first aspect, except that Ra 011 in formula (a0-11) is an acid-dissociable group containing a ring structure.
 前記式(a0-11)中、Ra011における環構造を含む酸解離性基は、前記式(a0-1)中のRa01における酸解離性基のうち、環構造を有するものと同様である。 In the formula (a0-11), the acid-dissociable group having a ring structure for Ra 011 is the same as the acid-dissociable group having a ring structure for Ra 01 in the formula (a0-1).
(化合物の製造方法)
 本実施形態の化合物の製造方法は特に限定されず、公知の方法を適宜組み合わせることにより製造することができる。
(Method of producing the compound)
The method for producing the compound of the present embodiment is not particularly limited, and the compound can be produced by appropriately combining known methods.
 前記式(Ra2-01)で表される化合物は、後述の[合成例1:モノマー(m01)の合成]で示すように、例えば、重合性基及び第三級アルキルエステル基を有するフェノール誘導体と、ベンジルブロミドとを反応させるベンジル保護により製造できる。 The compound represented by the formula (Ra2-01) can be produced, for example, by benzyl protection in which a phenol derivative having a polymerizable group and a tertiary alkyl ester group is reacted with benzyl bromide, as shown in [Synthesis Example 1: Synthesis of Monomer (m01)] described below.
 前記(Ra2-20)で表される化合物は、[合成例14:モノマー(m014)の合成]で示すように、例えば、重合性基及び第三級アルキルエステル基を有するフェノール誘導体と、安息香酸とを反応させるエステル化反応により製造できる。 The compound represented by (Ra2-20) above can be produced, for example, by an esterification reaction in which a phenol derivative having a polymerizable group and a tertiary alkyl ester group is reacted with benzoic acid, as shown in [Synthesis Example 14: Synthesis of Monomer (m014)].
 前記(Ra2-17)で表される化合物は、[合成例19:モノマー(m019)の合成]で示すように、例えば、重合性基及び第三級アルキルエステル基を有するフェノール誘導体と、ジフェニルヨードニウムフッ素化アルキルスルホン酸とを反応させて製造できる。 The compound represented by (Ra2-17) above can be produced, for example, by reacting a phenol derivative having a polymerizable group and a tertiary alkyl ester group with diphenyliodonium fluorinated alkylsulfonic acid, as shown in [Synthesis Example 19: Synthesis of Monomer (m019)].
 各反応の終了後、反応液中の化合物(a0-m)を単離、精製してもよい。
 単離、精製には、従来公知の方法が利用でき、例えば濃縮、溶媒抽出、蒸留、結晶化、再結晶、クロマトグラフィー等をいずれか単独で、又はこれらの2種以上を組み合わせて用いることができる。
 上記のようにして得られた化合物の構造は、H-核磁気共鳴(NMR)スペクトル法、13C-NMRスペクトル法、19F-NMRスペクトル法、赤外線吸収(IR)スペクトル法、質量分析(MS)法、元素分析法、X線結晶回折法等の一般的な有機分析法により確認できる。
After completion of each reaction, the compound (a0-m) in the reaction mixture may be isolated and purified.
For isolation and purification, a conventionally known method can be used, for example, concentration, solvent extraction, distillation, crystallization, recrystallization, chromatography, etc., which can be used alone or in combination of two or more of these.
The structure of the compound obtained as described above can be confirmed by general organic analysis methods such as 1H -nuclear magnetic resonance (NMR) spectroscopy, 13C -NMR spectroscopy, 19F -NMR spectroscopy, infrared absorption (IR) spectroscopy, mass spectrometry (MS), elemental analysis, and X-ray crystal diffraction.
 本実施形態の化合物は、前記構成単位(a0)を有する高分子化合物(前記第1の態様における樹脂成分(A1))を製造するために有用である。 The compound of this embodiment is useful for producing a polymeric compound having the structural unit (a0) (resin component (A1) in the first embodiment).
<高分子化合物>
 本実施形態の高分子化合物は、前記式(a0-11)で表される化合物から誘導される構成単位(a0)を有する。すなわち、本実施形態の高分子化合物は、前記式(a0-11)中のRa011が環構造を含む酸解離性基であること以外は、前記第1の態様における樹脂成分(A1)と同様である。
<Polymer Compound>
The polymer compound of this embodiment has a structural unit (a0) derived from a compound represented by formula (a0-11). That is, the polymer compound of this embodiment is the same as the resin component (A1) in the first aspect, except that Ra 011 in formula (a0-11) is an acid-dissociable group containing a ring structure.
 以下、実施例により本発明をさらに詳細に説明するが、本発明はこれらの例によって限定されるものではない。 The present invention will be explained in more detail below with reference to examples, but the present invention is not limited to these examples.
<化合物の合成>
[合成例1:モノマー(m01)の合成]
 化合物(m01-pre)4.9gをジメチルホルムアミド(DMF)10gに溶解し、その溶液に炭酸カリウム4.1gを添加し、続いて、ベンジルブロミド(Bn-Br)5.1gのDMF10g溶液を滴下して添加した。室温で16時間撹拌した後、メチルtert-ブチルエーテル(TBME)80gを加え、水80gで洗浄した。溶媒を留去後、カラムクロマトグラフィーで精製を行うことでモノマー(m01)を得た(6.0g、収率=90%)。
<Synthesis of Compounds>
[Synthesis Example 1: Synthesis of Monomer (m01)]
4.9 g of compound (m01-pre) was dissolved in 10 g of dimethylformamide (DMF), 4.1 g of potassium carbonate was added to the solution, and then 10 g of a solution of 5.1 g of benzyl bromide (Bn-Br) in DMF was added dropwise. After stirring at room temperature for 16 hours, 80 g of methyl tert-butyl ether (TBME) was added and washed with 80 g of water. After distilling off the solvent, the monomer (m01) was obtained by purifying it by column chromatography (6.0 g, yield=90%).
Figure JPOXMLDOC01-appb-C000075
Figure JPOXMLDOC01-appb-C000075
 得られた化合物はNMR測定を行い、以下の結果よりその構造を同定した。 The obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
(モノマー(m01))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.6(s,-CH,3H)
(Monomer (m01))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, -CH3 , 3H).
[合成例2~13:モノマー(m02)~(m013)の合成]
 原料を変更した以外は合成例1と同様にしてモノマー(m02)~(m013)を得た。
[Synthesis Examples 2 to 13: Synthesis of Monomers (m02) to (m013)]
Monomers (m02) to (m013) were obtained in the same manner as in Synthesis Example 1, except that the raw materials were changed.
 得られた化合物はNMR測定を行い、以下の結果よりその構造を同定した。 The obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
(モノマー(m02))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.0(s,-CH,9H)
(Monomer (m02))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.0 (s, -CH3 , 9H).
Figure JPOXMLDOC01-appb-C000076
Figure JPOXMLDOC01-appb-C000076
(モノマー(m03))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),6.2(m,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),5.1(m,-CH=CH,2H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H)
(Monomer (m03))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 6.2 (m, -CH= CH2 , 1H), 5.7 (d, -CH=CH2, 1H ), 5.2 (d, -CH= CH2 , 1H), 5.1 (m, -CH= CH2 , 2H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H).
Figure JPOXMLDOC01-appb-C000077
Figure JPOXMLDOC01-appb-C000077
(モノマー(m04))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.2-7.4(m,-Ph,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.3(m,シクロヘキシル,2H),1.2-1.7(m,シクロヘキシル,8H)
(Monomer (m04))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.2-7.4 (m, -Ph, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.3 (m, cyclohexyl, 2H), 1.2-1.7 (m, cyclohexyl, 8H).
Figure JPOXMLDOC01-appb-C000078
Figure JPOXMLDOC01-appb-C000078
(モノマー(m05))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.4(m,-Ad,2H),2.1(m,-Ad,2H),1.7-2.0(m,-Ad,8H),1.7(s,-CH,3H),1.6(m,-Ad,2H)
(Monomer (m05))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.4 (m, -Ad, 2H), 2.1 (m, -Ad, 2H), 1.7-2.0 (m, -Ad, 8H), 1.7 (s, -CH3 , 3H), 1.6 (m, -Ad, 2H).
Figure JPOXMLDOC01-appb-C000079
Figure JPOXMLDOC01-appb-C000079
(モノマー(m06))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-チオフェン,-Ar6H),7.1(m,-Ar,1H),7.1(m,-チオフェン,1H),7.0(m,-チオフェン,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),4.3(d,-エーテル環,1H),4.1(d,-エーテル環,1H),3.9(m,-エーテル環,2H),2.7(m,-エーテル環,1H),2.5(m,-エーテル環,1H)
(Monomer (m06))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -thiophene, -Ar6H), 7.1 (m, -Ar, 1H), 7.1 (m, -thiophene, 1H), 7.0 (m, -thiophene, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 4.3 (d, -ether ring, 1H), 4.1 (d, -ether ring, 1H), 3.9 (m, -ether ring, 2H), 2.7 (m, -ether ring, 1H), 2.5 (m, -ether ring, 1H).
Figure JPOXMLDOC01-appb-C000080
Figure JPOXMLDOC01-appb-C000080
(モノマー(m07))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),6.0(m,-CH=CH-,1H),5.8(m,-CH=CH-,1H),5.7(d,-CH=CH,1H),5.5(m,-O-CH-,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),1.6-2.2(m,シクロヘキセン環,6H)
(Monomer (m07))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 6.0 (m, -CH=CH-, 1H), 5.8 (m, -CH=CH-, 1H), 5.7 (d, -CH= CH2 , 1H), 5.5 (m, -O-CH-, 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 1.6-2.2 (m, cyclohexene ring, 6H)
Figure JPOXMLDOC01-appb-C000081
Figure JPOXMLDOC01-appb-C000081
(モノマー(m08))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.5(m,-CH=CH-,1H),5.2(m,-O-CH-,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),1.6-2.1(m,シクロヘキセン環,6H),1.7(s,-CH,3H)
(Monomer (m08))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.5 (m, -CH=CH-, 1H), 5.2 (m, -O-CH-, 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 1.6-2.1 (m, cyclohexene ring, 6H), 1.7 (s, -CH3 , 3H).
Figure JPOXMLDOC01-appb-C000082
Figure JPOXMLDOC01-appb-C000082
(モノマー(m09))
 H-NMR(dmso-d6、400MHz):δ(ppm)=6.7-7.6(m,芳香環,12H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.5(m,-O-CH-,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-Ar,2H),4.2(m,-CH-(クロマノール環),2H),1.9-2.1(m,-CH-(クロマノール環),2H)
(Monomer (m09))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 6.7-7.6 (m, aromatic ring, 12H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.5 (m, -O-CH-, 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2 - Ar, 2H), 4.2 (m, -CH2- (chromanol ring), 2H), 1.9-2.1 (m, -CH2- (chromanol ring ) , 2H).
Figure JPOXMLDOC01-appb-C000083
Figure JPOXMLDOC01-appb-C000083
(モノマー(m010))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.3(d,-Ar,2H),7.1(m,-Ar,1H),6.9(d,-Ar,2H),6.7(dd,-CH=CH,1H),5.8(m,-OCH-,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),3.7(s,-OCH,3H),1.5(s,-CH,3H)
(Monomer (m010))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.3 (d, -Ar, 2H), 7.1 (m, -Ar, 1H), 6.9 (d, -Ar, 2H), 6.7 (dd, -CH= CH2 , 1H), 5.8 (m, -OCH-, 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 3.7 (s, -OCH3 , 3H), 1.5 (s, -CH3 , 3H).
Figure JPOXMLDOC01-appb-C000084
Figure JPOXMLDOC01-appb-C000084
(モノマー(m011))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.9(d,-Ar,2H),7.7(d,-Ar,2H),7.6(m,-Ar,2H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.6(s,-CH,3H)
(Monomer (m011))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.9 (d, -Ar, 2H), 7.7 (d, -Ar, 2H), 7.6 (m, -Ar, 2H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, -CH3 , 3H).
Figure JPOXMLDOC01-appb-C000085
Figure JPOXMLDOC01-appb-C000085
(モノマー(m012))
 H-NMR(dmso-d6、400MHz):δ(ppm)=8.0(d,-Ar,2H),7.8(d,-Ar,2H),7.6(m,-Ar,2H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.6(s,-CH,3H)
(Monomer (m012))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 8.0 (d, -Ar, 2H), 7.8 (d, -Ar, 2H), 7.6 (m, -Ar, 2H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, -CH3 , 3H).
Figure JPOXMLDOC01-appb-C000086
Figure JPOXMLDOC01-appb-C000086
(モノマー(m013))
 H-NMR(dmso-d6、400MHz):δ(ppm)=8.0(d,-Ar,2H),7.7(d,-Ar,2H),7.6(m,-Ar,2H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.6(s,-CH,3H)
(Monomer (m013))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 8.0 (d, -Ar, 2H), 7.7 (d, -Ar, 2H), 7.6 (m, -Ar, 2H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, -CH3 , 3H).
Figure JPOXMLDOC01-appb-C000087
Figure JPOXMLDOC01-appb-C000087
[合成例14:モノマー(m014)の合成]
 化合物(m01-pre)4.9g、安息香酸2.7g、ジメチルアミノピリジン(DMAP)0.2gをジクロロメタン40gに溶解し、その溶液にジイソプロピルカルボジイミド(DIC)3.0gを添加した。室温で16時間撹拌した後、ろ過により不溶物を除去した。溶媒を留去後、カラムクロマトグラフィーで精製を行うことでモノマー(m014)を得た(5.6g、収率=80%)。
[Synthesis Example 14: Synthesis of Monomer (m014)]
4.9 g of compound (m01-pre), 2.7 g of benzoic acid, and 0.2 g of dimethylaminopyridine (DMAP) were dissolved in 40 g of dichloromethane, and 3.0 g of diisopropylcarbodiimide (DIC) was added to the solution. After stirring at room temperature for 16 hours, insoluble matters were removed by filtration. After distilling off the solvent, the monomer (m014) was obtained by purifying it by column chromatography (5.6 g, yield=80%).
Figure JPOXMLDOC01-appb-C000088
Figure JPOXMLDOC01-appb-C000088
 得られた化合物はNMR測定を行い、以下の結果よりその構造を同定した。 The obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
(モノマー(m014))
 H-NMR(dmso-d6、400MHz):δ(ppm)=8.0(m,-Ar,2H),7.4-7.6(m,-Ar,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.6(s,-CH,3H)
(Monomer (m014))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 8.0 (m, -Ar, 2H), 7.4-7.6 (m, -Ar, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH=CH2, 1H ), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, -CH3 , 3H).
[合成例15~18:モノマー(m015)~(m018)の合成]
 原料を変更した以外は合成例1と同様にしてモノマー(m015)~(m018)を得た。
[Synthesis Examples 15 to 18: Synthesis of Monomers (m015) to (m018)]
Monomers (m015) to (m018) were obtained in the same manner as in Synthesis Example 1, except that the raw materials were changed.
 得られた化合物はNMR測定を行い、以下の結果よりその構造を同定した。 The obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
(モノマー(m015))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.5-7.6(m,-Ar,6H),7.3(m,-Ar,1H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.6(s,-CH,3H)
(Monomer (m015))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.5-7.6 (m, -Ar, 6H), 7.3 (m, -Ar, 1H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, -CH3 , 3H).
Figure JPOXMLDOC01-appb-C000089
Figure JPOXMLDOC01-appb-C000089
(モノマー(m016))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,1H),7.5(m,-Ar,5H),7.1-7.2(m,-Ar,2H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.6(s,-CH,3H)
(Monomer (m016))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 1H), 7.5 (m, -Ar, 5H), 7.1-7.2 (m, -Ar, 2H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, -CH3 , 3H).
Figure JPOXMLDOC01-appb-C000090
Figure JPOXMLDOC01-appb-C000090
(モノマー(m017))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.5(m,-Ar,10H),6.8(s,-Ar,2H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,4H),2.2(m,シクロペンチル,2H),1.6-1.8(m,シクロペンチル,6H),1.6(s,-CH,6H)
(Monomer (m017))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.5 (m, -Ar, 10H), 6.8 (s, -Ar, 2H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 4H), 2.2 (m, cyclopentyl, 2H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, -CH3 , 6H).
Figure JPOXMLDOC01-appb-C000091
Figure JPOXMLDOC01-appb-C000091
(モノマー(m018))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.4-7.6(m,-Ar,7H),7.1(m,-Ar,1H),6.0(d,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),2.2(m,シクロペンチル,2H),1.9(s,-CH,3H),1.6-1.8(m,シクロペンチル,6H),1.6(s,CH,3H)
(Monomer (m018))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.4-7.6 (m, -Ar, 7H), 7.1 (m, -Ar, 1H), 6.0 (d, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 2.2 (m, cyclopentyl, 2H), 1.9 (s, -CH3 , 3H), 1.6-1.8 (m, cyclopentyl, 6H), 1.6 (s, CH3 , 3H).
Figure JPOXMLDOC01-appb-C000092
Figure JPOXMLDOC01-appb-C000092
[合成例19:モノマー(m019)の合成]
 化合物(m01-pre)4.9gをDMF10gに溶解し、その溶液に炭酸カリウム4.1gを添加し、続いて、ジフェニルヨードニウムトリフルオロメタンスルホン酸8.6gのジメチルホルムアミド(DMF)20g溶液を滴下して添加した。60℃で6時間撹拌した後、メチルtert-ブチルエーテル(TBME)80gを加え、水80gで洗浄した。溶媒を留去後、カラムクロマトグラフィーで精製を行うことでモノマー(m019)を得た(5.5g、収率=86%)。
[Synthesis Example 19: Synthesis of Monomer (m019)]
4.9 g of compound (m01-pre) was dissolved in 10 g of DMF, and 4.1 g of potassium carbonate was added to the solution, followed by dropwise addition of a solution of 8.6 g of diphenyliodonium trifluoromethanesulfonate in 20 g of dimethylformamide (DMF). After stirring at 60° C. for 6 hours, 80 g of methyl tert-butyl ether (TBME) was added and washed with 80 g of water. After distilling off the solvent, the monomer (m019) was obtained by purifying it by column chromatography (5.5 g, yield=86%).
Figure JPOXMLDOC01-appb-C000093
Figure JPOXMLDOC01-appb-C000093
 得られた化合物はNMR測定を行い、以下の結果よりその構造を同定した。 The obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
(モノマー(m019))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.7-7.8(m,-Ar,2H),7.3-7.4(m,-Ar,2H),7.0-7.1(m,-Ar,2H),6.9(m,-Ar,2H),6.8(dd,-CH=CH,1H),5.8(d,-CH=CH,1H),5.3(d,-CH=CH,1H),2.0(m,シクロペンチル,2H),1.4-1.6(m,シクロペンチル,6H),1.5(s,-CH,3H)
(Monomer (m019))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.7-7.8 (m, -Ar, 2H), 7.3-7.4 (m, -Ar, 2H), 7.0-7.1 (m, -Ar, 2H), 6.9 (m, -Ar, 2H), 6.8 (dd, -CH= CH2 , 1H), 5.8 (d, -CH= CH2 , 1H), 5.3 (d, -CH= CH2 , 1H), 2.0 (m, cyclopentyl, 2H), 1.4-1.6 (m, cyclopentyl, 6H), 1.5 (s, -CH3 , 3H).
[合成例20:モノマー(m020)の合成]
 原料を変更した以外は合成例1と同様にしてモノマー(m020)を得た。
[Synthesis Example 20: Synthesis of Monomer (m020)]
Monomer (m020) was obtained in the same manner as in Synthesis Example 1, except that the raw materials were changed.
 得られた化合物はNMR測定を行い、以下の結果よりその構造を同定した。 The obtained compound was subjected to NMR measurement, and its structure was identified from the following results.
(モノマー(m020))
 H-NMR(dmso-d6、400MHz):δ(ppm)=7.6(m,-Ar,2H),7.5(m,-Ar,5H),7.1(m,-Ar,1H),6.7(dd,-CH=CH,1H),5.7(d,-CH=CH,1H),5.2(d,-CH=CH,1H),4.6(s,-CH-,2H),1.5(s,-CH,9H)
(Monomer (m020))
1H -NMR (dmso-d6, 400MHz): δ(ppm) = 7.6 (m, -Ar, 2H), 7.5 (m, -Ar, 5H), 7.1 (m, -Ar, 1H), 6.7 (dd, -CH= CH2 , 1H), 5.7 (d, -CH= CH2 , 1H), 5.2 (d, -CH= CH2 , 1H), 4.6 (s, -CH2- , 2H), 1.5 (s, -CH3 , 9H).
Figure JPOXMLDOC01-appb-C000094
Figure JPOXMLDOC01-appb-C000094
<高分子化合物の製造>
 本実施例で用いた高分子化合物(A0-1)~(A0-26)及び(A1-1)~(A1-3)は、それぞれ、各高分子化合物を構成する構成単位を誘導するモノマーを、所定のモル比で用いて、ラジカル重合し、その後、必要に応じて脱保護反応を行うことにより得た。
 得られた各高分子化合物について、それぞれ、重量平均分子量(Mw)及び分子量分散度(Mw/Mn)を、GPC測定(標準ポリスチレン換算)により求めた。結果を表1に示す。
 また、得られた各高分子化合物について、共重合組成比(構造式中の各構成単位の割合(モル比))を、カーボン13核磁気共鳴スペクトル(600MHz、13C-NMR)により求めた。結果を表1に示す。
<Production of Polymer Compounds>
The polymer compounds (A0-1) to (A0-26) and (A1-1) to (A1-3) used in this example were obtained by radical polymerization of monomers that derive the structural units constituting each polymer compound in a predetermined molar ratio, followed by a deprotection reaction as necessary.
The weight average molecular weight (Mw) and the molecular weight dispersity (Mw/Mn) of each of the obtained polymer compounds were determined by GPC measurement (converted into standard polystyrene). The results are shown in Table 1.
Furthermore, the copolymer composition ratio (the ratio (molar ratio) of each structural unit in the structural formula) of each of the obtained polymer compounds was determined by carbon-13 nuclear magnetic resonance spectroscopy (600 MHz, 13 C-NMR). The results are shown in Table 1.
Figure JPOXMLDOC01-appb-C000095
Figure JPOXMLDOC01-appb-C000095
Figure JPOXMLDOC01-appb-C000096
Figure JPOXMLDOC01-appb-C000096
Figure JPOXMLDOC01-appb-C000097
Figure JPOXMLDOC01-appb-C000097
Figure JPOXMLDOC01-appb-T000098
Figure JPOXMLDOC01-appb-T000098
 高分子化合物(A0-1)~(A0-26)及び(A1-1)~(A1-3)の構造を以下に示す。 The structures of polymer compounds (A0-1) to (A0-26) and (A1-1) to (A1-3) are shown below.
Figure JPOXMLDOC01-appb-C000099
Figure JPOXMLDOC01-appb-C000099
Figure JPOXMLDOC01-appb-C000100
Figure JPOXMLDOC01-appb-C000100
Figure JPOXMLDOC01-appb-C000101
Figure JPOXMLDOC01-appb-C000101
Figure JPOXMLDOC01-appb-C000102
Figure JPOXMLDOC01-appb-C000102
Figure JPOXMLDOC01-appb-C000103
Figure JPOXMLDOC01-appb-C000103
 <レジスト組成物の調製>
(実施例1~35、比較例1~3)
 表2及び3に示す各成分を混合して溶解し、各例のレジスト組成物をそれぞれ調製した。
<Preparation of Resist Composition>
(Examples 1 to 35, Comparative Examples 1 to 3)
The components shown in Tables 2 and 3 were mixed and dissolved to prepare resist compositions of each example.
Figure JPOXMLDOC01-appb-T000104
Figure JPOXMLDOC01-appb-T000104
Figure JPOXMLDOC01-appb-T000105
Figure JPOXMLDOC01-appb-T000105
 表2~3中、各略号はそれぞれ以下の意味を有する。[ ]内の数値は配合量(質量部)である。 In Tables 2 and 3, the abbreviations have the following meanings. The numbers in brackets [ ] are the amounts used (parts by mass).
 (A0)-1~(A0)-26:前記高分子化合物(A0-1)~(A0-26)。
 (A1)-1~(A1)-3:前記高分子化合物(A1-1)~(A1-3)。
(A0)-1 to (A0)-26: the polymer compounds (A0-1) to (A0-26).
(A1)-1 to (A1)-3: the polymer compounds (A1-1) to (A1-3).
 (B)-1:下記の化合物(B1-1)からなる酸発生剤。
 (B)-2:下記の化合物(B1-2)からなる酸発生剤。
 (B)-3:下記の化合物(B1-3)からなる酸発生剤。
 (B)-4:下記の化合物(B1-4)からなる酸発生剤。
 (B)-5:下記の化合物(B1-5)からなる酸発生剤。
 (B)-6:下記の化合物(B1-6)からなる酸発生剤。
 (B)-7:下記の化合物(B1-7)からなる酸発生剤。
 (B)-8:下記の化合物(B1-8)からなる酸発生剤。
(B)-1: An acid generator comprising the following compound (B1-1).
(B)-2: An acid generator comprising the following compound (B1-2).
(B)-3: An acid generator comprising the following compound (B1-3).
(B)-4: An acid generator comprising the following compound (B1-4).
(B)-5: An acid generator consisting of the following compound (B1-5).
(B)-6: An acid generator consisting of the following compound (B1-6).
(B)-7: An acid generator consisting of the following compound (B1-7).
(B)-8: An acid generator consisting of the following compound (B1-8).
Figure JPOXMLDOC01-appb-C000106
Figure JPOXMLDOC01-appb-C000106
 (D)-1:下記の化合物(D1-1)からなる酸拡散制御剤。
 (D)-2:下記の化合物(D1-2)からなる酸拡散制御剤。
 (D)-3:下記の化合物(D1-3)からなる酸拡散制御剤。
(D)-1: An acid diffusion controller consisting of the following compound (D1-1).
(D)-2: An acid diffusion controller consisting of the following compound (D1-2).
(D)-3: An acid diffusion controller consisting of the following compound (D1-3).
Figure JPOXMLDOC01-appb-C000107
Figure JPOXMLDOC01-appb-C000107
 (S)-1:プロピレングリコールモノメチルエーテルアセテート/プロピレングリコールモノメチルエーテル=60/40(質量比)の混合溶剤。 (S)-1: A mixed solvent of propylene glycol monomethyl ether acetate/propylene glycol monomethyl ether = 60/40 (mass ratio).
 <レジストパターンの形成>
 ヘキサメチルジシラザン(HMDS)処理を施したシリコン基板上に、各例のレジスト組成物をそれぞれ、スピンナーを用いて塗布し、ホットプレート上で、温度110℃で60秒間のプレベーク(PAB)処理を行い、乾燥することにより、膜厚50nmのレジスト膜を形成した。次に、前記レジスト膜に対し、電子線描画装置JEOL JBX-9300FS(日本電子株式会社製)を用い、加速電圧100kVにて、ターゲットサイズをライン幅35nmの1:1ラインアンドスペースパターン(以下「LSパターン」)とする描画(露光)を行った。その後、80℃で60秒間の露光後加熱(PEB)処理を行った。次いで、23℃にて、2.38質量%テトラメチルアンモニウムヒドロキシド(TMAH)水溶液「NMD-3」(商品名、東京応化工業株式会社製)を用いて、60秒間のアルカリ現像を行った。その後、純水を用いて15秒間水リンスを行った。その結果、ライン幅35nmの1:1のLSパターンが形成された。
<Formation of Resist Pattern>
Each resist composition of each example was applied to a silicon substrate treated with hexamethyldisilazane (HMDS) using a spinner, and pre-baked (PAB) on a hot plate at a temperature of 110° C. for 60 seconds, followed by drying to form a resist film with a thickness of 50 nm. Next, the resist film was subjected to drawing (exposure) at an acceleration voltage of 100 kV using an electron beam lithography apparatus JEOL JBX-9300FS (manufactured by JEOL Ltd.) with a target size of a 1:1 line and space pattern (hereinafter referred to as "LS pattern") with a line width of 35 nm. Thereafter, a post-exposure bake (PEB) treatment was performed at 80° C. for 60 seconds. Next, at 23° C., an alkali development was performed for 60 seconds using a 2.38 mass% tetramethylammonium hydroxide (TMAH) aqueous solution "NMD-3" (trade name, manufactured by Tokyo Ohka Kogyo Co., Ltd.). Then, a water rinse was performed using pure water for 15 seconds. As a result, a 1:1 LS pattern with a line width of 35 nm was formed.
[最適露光量(Eop)の評価]
 前記のレジストパターンの形成方法によってターゲットサイズのLSパターンが形成される最適露光量Eop(μC/cm)を求めた。その結果を「Eop(μC/cm)」として表4~5に示す。
[Evaluation of Optimal Exposure (Eop)]
The optimum exposure dose Eop (μC/cm 2 ) for forming an LS pattern of the target size by the above-mentioned resist pattern forming method was determined. The results are shown in Tables 4 and 5 as "Eop (μC/cm 2 )."
[LWRの評価]
 上記<レジストパターンの形成>で形成したLSパターンについて、LWRを示す尺度である3σを求めた。これを「LWR(nm)」として示した。「3σ」は、走査型電子顕微鏡(加速電圧800V、商品名:S-9380、日立ハイテクノロジーズ社製)により、ラインの長手方向にラインポジションを400箇所測定し、その測定結果から求めた標準偏差(σ)の3倍値(3σ)(単位:nm)を求めた。その結果を「LWR(nm)」として表4~5に示す。
 該3σの値が小さいほど、ライン側壁のラフネスが小さく、より均一な幅のLSパターンが得られたことを意味する。
[Evaluation of LWR]
For the LS pattern formed in the above <Formation of Resist Pattern>, 3σ, which is a scale indicating LWR, was obtained. This was shown as "LWR (nm)". "3σ" was obtained by measuring 400 line positions in the longitudinal direction of the line using a scanning electron microscope (accelerating voltage 800V, product name: S-9380, manufactured by Hitachi High-Technologies Corporation), and calculating three times the standard deviation (σ) (unit: nm) obtained from the measurement results. The results are shown in Tables 4 and 5 as "LWR (nm)".
The smaller the 3σ value, the less rough the line sidewall is, meaning that an LS pattern with a more uniform width is obtained.
[エッチング耐性の評価]
 上記評価条件で作製した露光前(PAB後)の各レジスト膜に対し、ドライエッチング装置TCA-3822(商品名、東京応化工業株式会社製)を用い、CFガスで60秒間のドライエッチング処理を行った。ドライエッチング処理前後のレジスト膜の膜厚を求め、エッチング残膜率(%)=[(エッチング処理後膜厚(nm))/(エッチング処理前膜厚(nm))]×100で求めた。その結果を「エッチング残膜率(%)」表4~5に示す。
[Evaluation of Etching Resistance]
Each resist film before exposure (after PAB) prepared under the above evaluation conditions was subjected to dry etching treatment for 60 seconds with CF4 gas using a dry etching apparatus TCA-3822 (product name, manufactured by Tokyo Ohka Kogyo Co., Ltd.). The film thickness of the resist film before and after the dry etching treatment was determined, and the etching remaining film rate (%) was calculated as [(film thickness after etching treatment (nm))/(film thickness before etching treatment (nm))]×100. The results are shown in Tables 4 and 5 as "etching remaining film rate (%)".
Figure JPOXMLDOC01-appb-T000108
Figure JPOXMLDOC01-appb-T000108
Figure JPOXMLDOC01-appb-T000109
Figure JPOXMLDOC01-appb-T000109
 表4~5に示す結果から、実施例1~35のレジスト組成物は、比較例1~3のレジスト組成物と比べて、レジストパターンの形成において、高感度化が図れ、LWR及びエッチング耐性が良好であることが確認できた。 The results shown in Tables 4 to 5 confirm that the resist compositions of Examples 1 to 35 provide higher sensitivity in resist pattern formation and better LWR and etching resistance than the resist compositions of Comparative Examples 1 to 3.
 以上、本発明の好ましい実施例を説明したが、本発明はこれら実施例に限定されることはない。本発明の趣旨を逸脱しない範囲で、構成の付加、省略、置換、およびその他の変更が可能である。本発明は前述した説明によって限定されることはなく、添付のクレームの範囲によってのみ限定される。 The above describes preferred embodiments of the present invention, but the present invention is not limited to these embodiments. Addition, omission, substitution, and other modifications of the configuration are possible without departing from the spirit of the present invention. The present invention is not limited by the above description, but is limited only by the scope of the attached claims.

Claims (7)

  1.  露光により酸を発生し、かつ、酸の作用により現像液に対する溶解性が変化するレジスト組成物であって、
     酸の作用により現像液に対する溶解性が変化する樹脂成分(A1)を含有し、
     前記樹脂成分(A1)は、下記一般式(a0-1)で表される化合物から誘導される構成単位(a0)を有する、レジスト組成物。
    Figure JPOXMLDOC01-appb-C000001
    [式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基であり;La01は、単結合又は-C(=O)-O-であり;Arは、芳香環であり;Ra01は、酸解離性基であり;m1は、原子価が許容する限り、1以上の整数であり;Ra02は、置換基を有してもよい芳香環を含む酸非解離性基であり;m2は、原子価が許容する限り、1以上の整数であり;Ra03は、COORa01及びRa02以外の置換基であり;m3は、原子価が許容する限り、0以上の整数である。]
    A resist composition which generates an acid upon exposure and changes its solubility in a developer by the action of the acid,
    Contains a resin component (A1) whose solubility in a developer changes under the action of an acid,
    The resist composition, wherein the resin component (A1) has a structural unit (a0) derived from a compound represented by the following general formula (a0-1):
    Figure JPOXMLDOC01-appb-C000001
    [In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms; La 01 is a single bond or -C(=O)-O-; Ar is an aromatic ring; Ra 01 is an acid dissociable group; m1 is an integer of 1 or more as long as the valence allows; Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent; m2 is an integer of 1 or more as long as the valence allows; Ra 03 is a substituent other than COORa 01 and Ra 02 ; and m3 is an integer of 0 or more as long as the valence allows.]
  2.  前記一般式(a0-1)中、Ra01は、環構造を含む酸解離性基である、請求項1に記載のレジスト組成物。 2. The resist composition according to claim 1, wherein, in general formula (a0-1), Ra 01 represents an acid dissociable group containing a ring structure.
  3.  前記一般式(a0-1)中、Ra02は、下記一般式(a0-r-1)で表される基である、請求項1又は2に記載のレジスト組成物。
    Figure JPOXMLDOC01-appb-C000002
    [式中、*はArと結合する結合手であり;La02は、単結合又は2価の連結基であり;Ar01は芳香環であり;Ra021は、置換基であり;m21は、原子価が許容する限り、0以上の整数である。]
    3. The resist composition according to claim 1, wherein, in general formula (a0-1), Ra 02 is a group represented by the following general formula (a0-r-1):
    Figure JPOXMLDOC01-appb-C000002
    [In the formula, * represents a bond bonded to Ar; La 02 represents a single bond or a divalent linking group; Ar 01 represents an aromatic ring; Ra 021 represents a substituent; and m21 represents an integer of 0 or more as long as the valence allows.]
  4.  支持体上に、請求項1に記載のレジスト組成物を用いてレジスト膜を形成する工程、前記レジスト膜を露光する工程、及び前記露光後のレジスト膜を現像してレジストパターンを形成する工程を有する、レジストパターン形成方法。 A method for forming a resist pattern, comprising the steps of forming a resist film on a support using the resist composition according to claim 1, exposing the resist film to light, and developing the exposed resist film to form a resist pattern.
  5.  前記のレジスト膜を露光する工程において、前記レジスト膜に、EUV(極端紫外線)又はEB(電子線)を露光する、請求項4に記載のレジストパターン形成方法。 The method for forming a resist pattern according to claim 4, wherein in the step of exposing the resist film, the resist film is exposed to EUV (extreme ultraviolet) or EB (electron beam).
  6.  下記一般式(a0-11)で表される化合物。
    Figure JPOXMLDOC01-appb-C000003
    [式中、Rは、水素原子、炭素原子数1~5のアルキル基又は炭素原子数1~5のハロゲン化アルキル基であり;La01は、単結合又は-C(=O)-O-であり;Arは、芳香環であり;Ra011は、環構造を含む酸解離性基であり;m1は、原子価が許容する限り、1以上の整数であり;Ra02は、置換基を有してもよい芳香環を含む酸非解離性基であり;m2は、原子価が許容する限り、1以上の整数であり;Ra03は、COORa01及びRa02以外の置換基であり;m3は、原子価が許容する限り、0以上の整数である。]
    A compound represented by the following general formula (a0-11):
    Figure JPOXMLDOC01-appb-C000003
    [In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms; La 01 is a single bond or -C(=O)-O-; Ar is an aromatic ring; Ra 011 is an acid dissociable group containing a ring structure; m1 is an integer of 1 or more as long as the valence allows; Ra 02 is an acid non-dissociable group containing an aromatic ring which may have a substituent; m2 is an integer of 1 or more as long as the valence allows; Ra 03 is a substituent other than COORa 01 and Ra 02 ; and m3 is an integer of 0 or more as long as the valence allows.]
  7.  前記一般式(a0-11)中、Ra02は、下記一般式(a0-r-1)で表される基である、請求項6に記載の化合物。
    Figure JPOXMLDOC01-appb-C000004
    [式中、*はArと結合する結合手であり;La02は、単結合又は2価の連結基であり;Ar01は芳香環であり;Ra021は、置換基であり;m21は、原子価が許容する限り、0以上の整数である。]
    The compound according to claim 6, wherein, in the general formula (a0-11), Ra 02 is a group represented by the following general formula (a0-r-1):
    Figure JPOXMLDOC01-appb-C000004
    [In the formula, * represents a bond bonded to Ar; La 02 represents a single bond or a divalent linking group; Ar 01 represents an aromatic ring; Ra 021 represents a substituent; and m21 represents an integer of 0 or more as long as the valence allows.]
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Publication number Priority date Publication date Assignee Title
JP2022007909A (en) * 2020-03-11 2022-01-13 Jsr株式会社 Radiation-sensitive resin composition, patterning method and method for producing monomer compound
JP2023108593A (en) * 2022-01-25 2023-08-04 Jsr株式会社 Radiation-sensitive resin composition, resist pattern forming method, and compound

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022007909A (en) * 2020-03-11 2022-01-13 Jsr株式会社 Radiation-sensitive resin composition, patterning method and method for producing monomer compound
JP2023108593A (en) * 2022-01-25 2023-08-04 Jsr株式会社 Radiation-sensitive resin composition, resist pattern forming method, and compound

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