WO2024045649A1 - Near-field air interface rapid measurement system and method for pattern of active array antenna - Google Patents

Near-field air interface rapid measurement system and method for pattern of active array antenna Download PDF

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Publication number
WO2024045649A1
WO2024045649A1 PCT/CN2023/089963 CN2023089963W WO2024045649A1 WO 2024045649 A1 WO2024045649 A1 WO 2024045649A1 CN 2023089963 W CN2023089963 W CN 2023089963W WO 2024045649 A1 WO2024045649 A1 WO 2024045649A1
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WIPO (PCT)
Prior art keywords
antenna
amplitude
active array
probe
phase
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PCT/CN2023/089963
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French (fr)
Chinese (zh)
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周健义
朱立宇
于志强
洪伟
黄曜明
姬天相
曹天洋
周双波
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东南大学
中国移动通信集团设计院有限公司
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Publication of WO2024045649A1 publication Critical patent/WO2024045649A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of antennas
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals

Definitions

  • the invention belongs to the field of antenna measurement technology, and relates to a near-field air interface rapid measurement system and method for an active array antenna pattern, which can be used to quickly measure the patterns of different beams in the near field of the array.
  • Active array antennas especially millimeter-wave active array antennas, have a large number of units and small unit sizes. At the same time, they are often integrated with the transceiver system. In the design, there is usually no connector between the transceiver system and the antenna. interface, so it is difficult to directly apply conduction testing.
  • the purpose of this invention is to propose a near-field air interface rapid measurement system and method for active array antenna pattern.
  • the far-field pattern can also be characterized by performing corresponding calculations based on the test results of the near-field air interface amplitude and phase test. Test results, thereby reducing the requirements for the test environment, reducing test costs and reducing test time.
  • the present invention is a near-field air interface rapid measurement system for active array antenna pattern, which is characterized by: including a probe antenna, a mechanical adjustment device, an amplitude and phase test subsystem and a control subsystem, wherein:
  • the probe antenna is any antenna with known pattern characteristics. In order to improve the signal-to-noise ratio during the test, a high-gain antenna is used;
  • the mechanical adjustment device includes a probe position adjustment device and an active array antenna position adjustment device, which is used to adjust the height, distance, pitch angle, azimuth angle, and relative position of the probe antenna and the active array antenna under test, thereby achieving Align the center of the probe antenna with the center of the active array antenna under test, align the normal direction of the probe antenna with the normal direction of the active array antenna under test, and calibrate the distance;
  • the amplitude and phase test subsystem includes a probe antenna, an amplitude and phase test instrument for performing amplitude and phase tests, a first radio frequency cable for connecting the amplitude and phase test instrument and the probe antenna, and a first radio frequency cable for connecting the amplitude and phase test instrument and the measured object. a second RF cable for the active array antenna;
  • the control subsystem includes a control platform that implements control and operation, a first data line used to connect the control platform and the amplitude and phase test instrument, a second data line used to connect the control platform and the active array antenna under test, and a corresponding The control part; among which, the control part includes pre-grouping the units on the active array antenna under test, selecting and designing the beam to be tested, generating the amplitude and phase state table of the antenna group under test according to the beam to be tested, and pre-grouping the active array under test Antenna control, amplitude and phase test instrument control and data reading, data processing and pattern drawing;
  • the specific connection relationship is as follows: the probe antenna is fixed on the probe position adjustment device, the active array antenna under test is fixed on the active array antenna position adjustment device, the probe antenna and the amplitude and phase testing instrument are connected through the first radio frequency cable.
  • the active array antenna and the amplitude and phase test instrument are connected through a second RF cable, the amplitude and phase test instrument and the control platform are connected through a first data line, and the active array antenna under test and the control platform are connected through a second data line. connect.
  • the high-gain antenna of the probe antenna adopts a pyramidal horn antenna.
  • the method for quickly measuring the near-field air interface of the active array antenna pattern of the present invention is: in the near field of the active array antenna under test, adjust the position of the active array antenna position adjustment device and fix it, and then measure the air interface amplitude and phase. According to The measurement results run the control platform in the control subsystem to obtain the far-field pattern of the active array beam to be measured.
  • the rapid measurement method includes the following steps:
  • Step 1 Determine the relative positions of the active array antenna under test and the probe antenna according to the parameters and operating frequency of the active array antenna under test, and use the active array antenna position adjustment device to make the center of the active array antenna under test face the center of the probe antenna. And the distance from the center of the probe antenna to the center of the active array antenna under test is required to meet the near-field range requirements of the active array, and at the same time meet the far-field range requirements of a unit in the array and the far-field range requirements of the probe antenna;
  • Step 3 Select the beam group to be tested based on the parameters of the active array antenna under test and the antenna group division form determined in step 2, and establish the amplitude and phase state table of the antenna group to be measured;
  • Step 4 Fine-tune the beam group to be measured and further add repeated states in the amplitude and phase state table of the antenna group to be measured;
  • Step 5 Merge the repeated states in the amplitude and phase state table of the antenna group to be measured
  • Step 6 According to the combined amplitude and phase state table to be measured, excite one antenna group at a time, use the amplitude and phase testing instrument (5) to perform amplitude and phase testing, and obtain the actual measured amplitude and phase excitation table;
  • Step 7 According to the simulated or measured antenna group pattern G mf in step 2, calculate the normalized amplitude and phase excitation table of the antenna group from the measured amplitude and phase excitation table.
  • the calculation process can be expressed as:
  • m represents the number of the antenna group
  • a gm M represents the measured amplitude and phase excitation of the antenna group m
  • l gm is the distance from the center of the antenna group m to the probe antenna
  • ⁇ gm represents the normalized amplitude and phase excitation of the antenna group m
  • G gmf is the far field pattern of antenna group m, and is the pitch angle and azimuth angle of the center of the antenna group m relative to the probe antenna
  • G pf is the far-field pattern of the probe antenna
  • Step 8 Calculate the far-field pattern of the measured beam of the active array antenna under test through the simulated and measured antenna group pattern and the normalized amplitude and phase excitation table of the antenna group. For any two-dimensional U ⁇ V unit Active antenna array, the calculation process is expressed as:
  • u 1,2...U
  • u is the row number of the antenna unit
  • U is the total number of antenna unit rows
  • v 1,2...V
  • v is the column number of the antenna unit
  • V is the total number of antenna unit columns
  • ⁇ uv is the normalized amplitude complex excitation of the antenna unit (u, v)
  • l uv is the distance from the center of the antenna unit (u, v) to the ideal far-field observation point ( ⁇ , ⁇ ).
  • G uvf is the far-field pattern of the antenna unit (u, v)
  • P array ( ⁇ , ⁇ ) is the far-field pattern of the measured beam of the active array antenna under test.
  • the near field refers to the distance (D) from the center of the probe antenna to the center of the active array, which meets the near field range requirements of the active antenna array under test, but is still required to meet the far field range requirements of a unit in the array.
  • d E represents the maximum size of the unit antenna
  • d A represents the maximum size of the active array antenna under test.
  • the fixed mechanical adjustment device is only intended to achieve the alignment of the probe antenna center and the center of the active antenna array under test, the normal direction of the probe antenna and the normal direction of the active antenna array under test, and ensure that the probe antenna is aligned through the mechanical adjustment device.
  • the distance requirement from the center to the center of the active antenna array under test meets and calibrate the distance. During the actual measurement process, the machine The mechanical adjustment device does not work.
  • the fixed position means that after the mechanical position adjustment process is carried out in advance, the position of each subsystem and equipment does not change during the measurement process.
  • the probe antenna is located on the probe position adjustment device, and the active array antenna under test is fixed on the active array. Antenna position adjustment device.
  • the measurement of the amplitude and phase of the air interface means that the active array antenna under test and the probe antenna are not directly connected with a cable, but the amplitude and phase measurement instruments or equipment are used to directly measure the probe antenna in different states at the air interface. Measure the amplitude and phase characteristics of active array antennas.
  • the horizontal plane pattern of the array represents for
  • i 1,2...I
  • i is the column number of the antenna group
  • I is the total number of antenna group columns
  • G givH is the horizontal direction pattern of the antenna group (i, v)
  • ⁇ giv is the antenna group (i, v)
  • the normalized amplitude complex excitation of , l iv is the distance from the center of the antenna group (i, v) to the observation point.
  • the present invention provides a near-field air interface fast measurement system and method for active array antenna patterns. Its advantages are:
  • the entire test process can be completed in the near field of the array, so the demand for the size of the darkroom space or the size of the open space is greatly reduced.
  • the required array area is The probe distance is 8.67m, and using the test method in the present invention, the required distance from the array to the probe is 0.7m, which is only 8.1% of the traditional far-field test method.
  • step 4 fine-tuning the beam group to be measured and further adding repeated states in the amplitude and phase state table of the established antenna group to be measured, the required measurement method can be further reduced to 37 times, which is only traditional 4.4% for far field test methods.
  • Figure 1 is a schematic diagram of the overall structure of a near-field air interface rapid measurement system for active array antenna patterns proposed by the present invention.
  • FIG. 2 is a flow chart for implementing the method for fast near-field air interface measurement of active array antenna pattern proposed by the present invention.
  • Figure 3 is a photo of the antenna side of the device under test in the measurement example provided by the present invention.
  • FIG. 4 is a schematic diagram of the antenna grouping mentioned in the present invention.
  • Figure 5 is a comparison of the patterns under different beams measured by the near-field air interface rapid measurement system and method of the active array antenna pattern proposed by the present invention and the traditional far-field pattern testing method, wherein (a) measured The pointing direction of the beam is 0°, and the array is in the transmitting state; (b) the measured beam pointing direction is 0°, and the array is in the receiving state; (c) the measured beam pointing direction is 15°, and the array is in the transmitting state; (d) The pointing direction of the measured beam is -15°, and the array is in the receiving state; (e) the pointing direction of the measured beam is 30°, and the array is in the transmitting state; (f) the pointing direction of the measured beam is -30°, and the array is in the receiving state; ( g) The measured beam's pointing direction is 45°, and the array is in the transmitting state; (h) The measured beam's pointing direction is -45°, and the array is in the receiving state.
  • probe antenna 1 active array antenna under test 2
  • probe position adjustment device 3 active array antenna position adjustment device 4
  • amplitude and phase test instrument 5 control platform 6, first radio frequency cable 7, second radio frequency Cable 8, first data line 9, second data line 10.
  • a near-field air interface rapid measurement system for active array antenna pattern includes: probe antenna, mechanical adjustment device, amplitude and phase test subsystem and control and algorithm subsystem, including:
  • the probe antenna is any antenna with known pattern characteristics. Usually, in order to improve the signal-to-noise ratio during the test process, a high-gain antenna is used. In this example, a pyramidal horn antenna is used as the probe antenna.
  • the mechanical adjustment device including the probe position adjustment device 3 and the array position adjustment device 4, is used to adjust the height, distance D, pitch angle, azimuth angle, and relative position of the probe and the array, thereby achieving alignment of the probe center and the array center. Align and calibrate the distance between the probe normal and the array normal.
  • the amplitude and phase test subsystem includes an amplitude and phase test instrument 5 for performing amplitude and phase testing, and a first radio frequency cable 7 and a second radio frequency cable for connecting the amplitude and phase test instrument to the probe antenna and the active array antenna under test. Cable 8.
  • the control subsystem includes an implementation control platform 6 and corresponding software parts.
  • the software part includes pre-grouping of units on the active array, selecting and designing the beam to be tested, generating the amplitude and phase state table of the antenna group to be tested based on the beam to be tested, controlling the active array, and controlling the amplitude and phase test instruments. Control and data reading, data processing and pattern drawing.
  • the present invention uses an 8 ⁇ 8 unit active antenna array as an example, where each unit is a 2 ⁇ 1 probe-fed binary patch antenna array, and the test frequency band is 26GHz.
  • the antenna units are arranged at half wavelength in the horizontal direction and at the full wavelength in the vertical direction. In this measurement system example, the distance from the center of the probe antenna to the center of the active array is 0.7m, which meets the near field range of the active array. requirements and far-field range requirements of an element in the array;
  • ⁇ n and ⁇ n are the azimuth and elevation angles of the far-field observation point relative to the antenna unit n
  • h n is the spatial response from the far-field observation point to the antenna unit n
  • ⁇ n is the amplitude-phase complex excitation of the antenna unit n .
  • the spatial response h n can be decomposed into an amplitude response (path loss) ⁇ /(4 ⁇ l n ) and a phase response 2 ⁇ r n / ⁇ , where l n is the distance from the observation point to the antenna unit n. Therefore, for a two-dimensional U ⁇ V unit active antenna array, its normalized pattern can be expressed as
  • u 1,2...U
  • u is the row number of the antenna unit
  • U is the total number of antenna unit rows
  • v 1,2...V
  • v is the column number of the antenna unit
  • V is the total number of antenna unit columns
  • ⁇ uv is the normalized amplitude complex excitation of the antenna unit (u, v).
  • the antenna units in each column can be divided into several antenna groups. It is only necessary to consider the horizontal plane pattern of the antenna group and the equivalent amplitude phase complex excitation of the antenna group. At this time, the horizontal plane pattern of the array can be expressed as
  • i 1,2...I
  • i is the column number of the antenna group
  • I is the total number of antenna group columns
  • G givH is the horizontal aspect of the antenna group (i, v)
  • ⁇ giv is the normalized amplitude complex excitation of the antenna group (i, v)
  • l iv is the distance from the center of the antenna group (i, v) to the observation point.
  • the 8 ⁇ 8 unit active array illustrated in the present invention can be grouped with reference to Figure 4, and each column of antenna units constitutes an antenna group.
  • the measurement system selects 7 beams of the measured array in the horizontal plane, and their beam directions are -45°, -30°, -15°, 0°, 15°, 30° and 45°, where The amplitude state of each antenna group is maintained at the maximum value, and the phase state of the antenna group is shown in Table 1 below:
  • Antenna group to be tested phase status table of the beam group to be tested
  • the gray marked are repeated states, and there are 11 repeated states among the 56 phase states.
  • step (4) Degenerate the repeated states in the amplitude and phase state table of the antenna group to be measured, and only 45 tests are needed in total. If step (4) is adopted, only 37 tests are needed in total;
  • m is the number of the antenna group, which can also be expressed as (i, v) by the row and column number of the antenna group
  • l gm is the distance from the center of the antenna group m to the probe antenna, and is the pitch angle and azimuth angle of the center of the antenna group m relative to the probe antenna
  • G pf is the far-field pattern of the probe antenna.
  • G givH is the horizontal plane pattern of the antenna group (i, v)
  • ⁇ giv is the normalized amplitude and phase excitation ⁇ gm of the antenna group corresponding to a certain beam obtained in step (7)
  • dx is the level of the antenna unit direction spacing.
  • the measurement system and method proposed by the present invention are then used to conduct pattern testing on the array under test in Figure 3. Later, envoy It was tested using traditional far-field testing methods, and Figure 5 provides the test comparison results.
  • the near-field air interface rapid measurement system and method of the active array antenna pattern proposed by the present invention performs corresponding calculations through the test results of the near-field air interface amplitude and phase test, thereby characterizing the far-field pattern test results.
  • the probe antenna is required to The array distance is only 8.1% of the traditional far-field test method, and the required number of tests is only 4.4% of the traditional far-field test method, which greatly reduces the cost of active array antenna pattern testing, improves test efficiency, and has a systematic It has the advantages of low complexity and no need for a turntable.

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  • General Physics & Mathematics (AREA)
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Abstract

A near-field air interface rapid measurement system and method for a pattern of an active array antenna, which is used for increasing the measurement speed of the pattern of the active array antenna, can shorten the measurement distance, and can complete measurement of the pattern of the active array antenna when no turntable is required and the position of a probe is fixed. The measurement system comprises a mechanical adjustment device, an amplitude-phase measurement subsystem, a control subsystem, and a probe antenna (1). The measurement method comprises: determining the placement position of the probe antenna (1) according to array plane parameters; dividing unit antennas in an array into a certain number of antenna groups according to the array plane parameters and the position of a probe; establishing an amplitude-phase state table to be measured for the antenna groups according to a beam group to be measured, and merging repeated states; performing measurement to obtain an actually measured amplitude-phase excitation table; according to simulated and actually measured patterns of the antenna groups, calculating a normalized amplitude-phase excitation table of the antenna groups from the actually measured amplitude-phase excitation table; and calculating a pattern of a beam to be measured of the array according to the simulated and actually measured patterns of the antenna groups and the normalized amplitude-phase excitation table of the antenna groups.

Description

一种有源阵列天线方向图的近场空口快速测量系统及方法A near-field air interface rapid measurement system and method for active array antenna pattern 技术领域Technical field
本发明属于天线测量技术领域,涉及一种有源阵列天线方向图的近场空口快速测量系统及方法,可用于在阵列近场对不同波束的方向图进行快速测量。The invention belongs to the field of antenna measurement technology, and relates to a near-field air interface rapid measurement system and method for an active array antenna pattern, which can be used to quickly measure the patterns of different beams in the near field of the array.
背景技术Background technique
在无线通信技术的不断演进过程中,增加系统的频谱带宽和频谱效率是实现无线通信系统需求的关键。目前的无线通信技术已经非常接近信道容量的香农极限,因此,对于新一代移动通信系统而言,采用更高频段的频谱资源(包括Sub-6GHz频段和毫米波频段)来提高通信系统所需的信号带宽、利用动态波束赋形技术和多通道输入输出(MIMO)技术来实现空分复用,从而显著提升频谱资源利用率已经成为5G无线通信基站的主流技术。在毫米波硬件系统架构上,采用有源天线阵列来实现动态波束赋形已经成为目前5G毫米波通信收发系统的主流架构。In the continuous evolution of wireless communication technology, increasing the spectrum bandwidth and spectrum efficiency of the system is the key to realizing the needs of wireless communication systems. The current wireless communication technology is very close to the Shannon limit of channel capacity. Therefore, for the new generation of mobile communication systems, higher frequency spectrum resources (including Sub-6GHz frequency band and millimeter wave frequency band) are used to improve the communication system required. Signal bandwidth, the use of dynamic beamforming technology and multi-channel input and output (MIMO) technology to achieve spatial division multiplexing, thereby significantly improving spectrum resource utilization has become the mainstream technology for 5G wireless communication base stations. In terms of millimeter wave hardware system architecture, the use of active antenna arrays to achieve dynamic beamforming has become the mainstream architecture of the current 5G millimeter wave communication transceiver system.
近几年来,随着5G相关产业逐渐步入技术商用化和实际部署阶段,对于有源阵列天线的测试技术也显得愈发重要。目前来说,传统低频段系统的传导测试方法应用在有源阵列天线上主要存在以下几个问题:In recent years, as 5G-related industries have gradually entered the stage of technology commercialization and actual deployment, the testing technology of active array antennas has become increasingly important. Currently, the application of traditional conduction test methods for low-frequency systems to active array antennas mainly has the following problems:
1、有源阵列天线,尤其是毫米波有源阵列天线单元数量规模大、单元尺寸小,同时多与收发系统实现一体化集成,在设计时通常不会预留收发系统至天线间的连接器接口,因此很难直接运用传导测试。1. Active array antennas, especially millimeter-wave active array antennas, have a large number of units and small unit sizes. At the same time, they are often integrated with the transceiver system. In the design, there is usually no connector between the transceiver system and the antenna. interface, so it is difficult to directly apply conduction testing.
2、在较高的频段,尤其是毫米波频段,采用传导测试对测试电缆的损耗、一致性和可重复性提出了极高的要求,导致传导测试不切实际。2. In higher frequency bands, especially millimeter wave bands, the use of conductive testing places extremely high requirements on the loss, consistency and repeatability of test cables, making conductive testing impractical.
3、较大规模有源阵列的辐射场特性对于实现系统应用至关重要,而通过传导测试难以准确评估阵面级系统的辐射特性。3. The radiation field characteristics of larger-scale active arrays are crucial to realizing system applications, but it is difficult to accurately evaluate the radiation characteristics of array-level systems through conduction testing.
因此,传统统低频段系统的传导测试方法对于较大规模、较高频率的有源阵列天线将不再具有可行性,尤其是对于毫米波频段,根据3GPP标准规定,毫米波有源阵列天线的测试都须在空口下进行。Therefore, the traditional conduction test method of low-frequency band systems will no longer be feasible for larger-scale, higher-frequency active array antennas, especially for millimeter-wave frequency bands. According to the 3GPP standards, millimeter-wave active array antennas All tests must be conducted under the air interface.
严格的讲,只有远场或者等效远场(例如紧缩场)的测试结果才能代表指标最终测试结果,但通常对测试环境和测试时间提出了较高的要求。Strictly speaking, only far field or equivalent far field (such as compact field) test results can represent the final test results of the indicator, but this usually imposes higher requirements on the test environment and test time.
发明内容Contents of the invention
技术问题:本发明的目的是提出一种有源阵列天线方向图的近场空口快速测量系统及方法,通过近场空口幅相测试的测试结果进行相应的计算也能表征出远场的方向图测试结果,从而降低对测试环境的要求,降低测试成本,减少测试时间。 Technical problem: The purpose of this invention is to propose a near-field air interface rapid measurement system and method for active array antenna pattern. The far-field pattern can also be characterized by performing corresponding calculations based on the test results of the near-field air interface amplitude and phase test. Test results, thereby reducing the requirements for the test environment, reducing test costs and reducing test time.
技术方案:为达到上述目的,本发明技术方案是这样实现的:Technical solution: In order to achieve the above objects, the technical solution of the present invention is implemented as follows:
本发明的一种有源阵列天线方向图的近场空口快速测量系统,其特征在于:包括探头天线,机械调整装置,幅度相位测试子系统和控制子系统,其中:The present invention is a near-field air interface rapid measurement system for active array antenna pattern, which is characterized by: including a probe antenna, a mechanical adjustment device, an amplitude and phase test subsystem and a control subsystem, wherein:
所述探头天线,是任意一个已知方向图特性的天线,为了提高测试过程中的信噪比,采用高增益天线;The probe antenna is any antenna with known pattern characteristics. In order to improve the signal-to-noise ratio during the test, a high-gain antenna is used;
所述机械调整装置,包括探头位置调整装置和有源阵列天线位置调整装置,用于对探头天线和被测有源阵列天线的高度、距离、俯仰角、方位角、相对位置进行调整,从而实现探头天线中心和被测有源阵列天线中心的对齐、探头天线法向和被测有源阵列天线法向的对齐,并标定距离;The mechanical adjustment device includes a probe position adjustment device and an active array antenna position adjustment device, which is used to adjust the height, distance, pitch angle, azimuth angle, and relative position of the probe antenna and the active array antenna under test, thereby achieving Align the center of the probe antenna with the center of the active array antenna under test, align the normal direction of the probe antenna with the normal direction of the active array antenna under test, and calibrate the distance;
所述幅度相位测试子系统,包括探头天线、用于进行幅度相位测试的幅相测试仪器、用于连接幅相测试仪器与探头天线的第一射频电缆、用于连接幅相测试仪器与被测有源阵列天线的第二射频电缆;The amplitude and phase test subsystem includes a probe antenna, an amplitude and phase test instrument for performing amplitude and phase tests, a first radio frequency cable for connecting the amplitude and phase test instrument and the probe antenna, and a first radio frequency cable for connecting the amplitude and phase test instrument and the measured object. a second RF cable for the active array antenna;
所述控制子系统,包括实现控制和运行的控制平台、用于连接控制平台和幅相测试仪器的第一数据线、用于连接控制平台和被测有源阵列天线的第二数据线和相应的控制部分;其中,控制部分包括对被测有源阵列天线上单元的预分组、选取并设计待测波束、根据待测波束生成待测天线组的幅度相位状态表、对被测有源阵列天线的控制、对幅相测试仪器的控制与数据读取、数据处理和方向图绘制;The control subsystem includes a control platform that implements control and operation, a first data line used to connect the control platform and the amplitude and phase test instrument, a second data line used to connect the control platform and the active array antenna under test, and a corresponding The control part; among which, the control part includes pre-grouping the units on the active array antenna under test, selecting and designing the beam to be tested, generating the amplitude and phase state table of the antenna group under test according to the beam to be tested, and pre-grouping the active array under test Antenna control, amplitude and phase test instrument control and data reading, data processing and pattern drawing;
具体连接关系如下:探头天线固定在探头位置调整装置上,被测有源阵列天线固定在有源阵列天线位置调整装置上,探头天线和幅相测试仪器之间通过第一射频电缆连接,被测有源阵列天线和幅相测试仪器之间通过第二射频电缆连接,幅相测试仪器和控制平台之间通过第一数据线连接,被测有源阵列天线和控制平台之间通过第二数据线连接。The specific connection relationship is as follows: the probe antenna is fixed on the probe position adjustment device, the active array antenna under test is fixed on the active array antenna position adjustment device, the probe antenna and the amplitude and phase testing instrument are connected through the first radio frequency cable. The active array antenna and the amplitude and phase test instrument are connected through a second RF cable, the amplitude and phase test instrument and the control platform are connected through a first data line, and the active array antenna under test and the control platform are connected through a second data line. connect.
所述探头天线的高增益天线采用角锥喇叭天线。The high-gain antenna of the probe antenna adopts a pyramidal horn antenna.
本发明的有源阵列天线方向图的近场空口快速测量方法为:在被测有源阵列天线的近场,调整有源阵列天线位置调整装置的位置并固定后进行空口幅度相位的测量,根据测量结果运行控制子系统中的控制平台,从而得到有源阵列待测波束的远场方向图,该快速测量方法包括如下步骤:The method for quickly measuring the near-field air interface of the active array antenna pattern of the present invention is: in the near field of the active array antenna under test, adjust the position of the active array antenna position adjustment device and fix it, and then measure the air interface amplitude and phase. According to The measurement results run the control platform in the control subsystem to obtain the far-field pattern of the active array beam to be measured. The rapid measurement method includes the following steps:
步骤1,根据被测有源阵列天线参数及工作频率确定被测有源阵列天线和探头天线的相对位置,通过有源阵列天线位置调整装置使被测有源阵列天线中心正对探头天线中心,并且要求探头天线中心至被测有源阵列天线中心的距离满足有源阵列的近场范围要求,并同时满足阵列中一个单元的远场范围要求和探头天线的远场范围要求;Step 1: Determine the relative positions of the active array antenna under test and the probe antenna according to the parameters and operating frequency of the active array antenna under test, and use the active array antenna position adjustment device to make the center of the active array antenna under test face the center of the probe antenna. And the distance from the center of the probe antenna to the center of the active array antenna under test is required to meet the near-field range requirements of the active array, and at the same time meet the far-field range requirements of a unit in the array and the far-field range requirements of the probe antenna;
步骤2,根据被测有源阵列天线的参数、单元天线方向图及探头天线位置将被测有源阵 列天线中单元天线划分为多个天线组,并通过仿真或实测得到天线组的远场复方向图Gmf,m=1,2…M;m为天线组编号,M为天线组总数;Step 2: According to the parameters of the active array antenna under test, the unit antenna pattern and the position of the probe antenna, the active array under test is The unit antenna in the column antenna is divided into multiple antenna groups, and the far-field complex pattern G mf of the antenna group is obtained through simulation or actual measurement, m=1,2...M; m is the antenna group number, and M is the total number of antenna groups;
步骤3,根据被测有源阵列天线的参数和步骤2中确定的天线组划分形式选取待测波束组,建立天线组的待测幅相状态表;Step 3: Select the beam group to be tested based on the parameters of the active array antenna under test and the antenna group division form determined in step 2, and establish the amplitude and phase state table of the antenna group to be measured;
步骤4,对待测波束组进行微调,进一步增加建立的天线组待测幅相状态表中的重复状态;Step 4: Fine-tune the beam group to be measured and further add repeated states in the amplitude and phase state table of the antenna group to be measured;
步骤5,对天线组待测幅相状态表中的重复状态进行合并;Step 5: Merge the repeated states in the amplitude and phase state table of the antenna group to be measured;
步骤6,按照合并后的待测幅相状态表,每次激励一个天线组,使用幅相测试仪器(5)进行幅相测试,得到实测幅相激励表;Step 6: According to the combined amplitude and phase state table to be measured, excite one antenna group at a time, use the amplitude and phase testing instrument (5) to perform amplitude and phase testing, and obtain the actual measured amplitude and phase excitation table;
步骤7,根据步骤2中仿真或实测的天线组方向图Gmf,由实测幅相激励表计算天线组的归一化幅相激励表,计算过程可以表示为:
Step 7: According to the simulated or measured antenna group pattern G mf in step 2, calculate the normalized amplitude and phase excitation table of the antenna group from the measured amplitude and phase excitation table. The calculation process can be expressed as:
其中,m表示天线组的编号,Agm M表示天线组m的实测幅相激励,lgm是天线组m中心至探头天线的距离,σgm表示天线组m的归一化幅相激励,Ggmf是天线组m的远场方向图,是天线组m中心相对于探头天线的俯仰角和方位角,Gpf是探头天线的远场方向图;Among them, m represents the number of the antenna group, A gm M represents the measured amplitude and phase excitation of the antenna group m, l gm is the distance from the center of the antenna group m to the probe antenna, σ gm represents the normalized amplitude and phase excitation of the antenna group m, G gmf is the far field pattern of antenna group m, and is the pitch angle and azimuth angle of the center of the antenna group m relative to the probe antenna, G pf is the far-field pattern of the probe antenna;
步骤8,通过仿真和实测的天线组方向图、天线组的归一化幅相激励表,计算被测有源阵列天线待测波束的远场方向图,对于任意一个二维U×V单元的有源天线阵列,计算过程表示为:
Step 8: Calculate the far-field pattern of the measured beam of the active array antenna under test through the simulated and measured antenna group pattern and the normalized amplitude and phase excitation table of the antenna group. For any two-dimensional U×V unit Active antenna array, the calculation process is expressed as:
其中,u=1,2…U,u为天线单元的行编号,U为天线单元行总数,v=1,2…V,v为天线单元的列编号,V为天线单元列总数,σuv是天线单元(u,v)的归一化幅相复激励,luv是天线单元(u,v)中心至理想远场观测点(θ,φ)的距离。Guvf是天线单元(u,v)的远场方向图,Parray(θ,φ)是被测有源阵列天线待测波束的远场方向图。Among them, u=1,2...U, u is the row number of the antenna unit, U is the total number of antenna unit rows, v=1,2...V, v is the column number of the antenna unit, V is the total number of antenna unit columns, σ uv is the normalized amplitude complex excitation of the antenna unit (u, v), l uv is the distance from the center of the antenna unit (u, v) to the ideal far-field observation point (θ, φ). G uvf is the far-field pattern of the antenna unit (u, v), and P array (θ, φ) is the far-field pattern of the measured beam of the active array antenna under test.
所述的近场是指探头天线中心至有源阵列中心的距离(D),满足被测有源天线阵列的近场范围要求,但仍要求该距离满足阵列中一个单元的远场范围要求,即其中,dE表示单元天线的最大尺寸,dA表示被测有源阵列天线的最大尺寸。The near field refers to the distance (D) from the center of the probe antenna to the center of the active array, which meets the near field range requirements of the active antenna array under test, but is still required to meet the far field range requirements of a unit in the array. Right now Among them, d E represents the maximum size of the unit antenna, and d A represents the maximum size of the active array antenna under test.
所述的固定机械调整装置,仅旨在通过机械调整装置实现探头天线中心和被测有源天线阵列中心的对齐、探头天线法向和被测有源天线阵列法向的对齐,并保证探头天线中心至被测有源天线阵列中心的距离要求满足并标定该距离,在实际测量过程中,机 械调整装置不进行工作。The fixed mechanical adjustment device is only intended to achieve the alignment of the probe antenna center and the center of the active antenna array under test, the normal direction of the probe antenna and the normal direction of the active antenna array under test, and ensure that the probe antenna is aligned through the mechanical adjustment device. The distance requirement from the center to the center of the active antenna array under test meets and calibrate the distance. During the actual measurement process, the machine The mechanical adjustment device does not work.
所述的固定位置是指在预先进行的调整机械位置过程后,测量过程中各子系统和设备位置不发生变化,探头天线位于探头位置调整装置上,被测有源阵列天线固定在有源阵列天线位置调整装置上。The fixed position means that after the mechanical position adjustment process is carried out in advance, the position of each subsystem and equipment does not change during the measurement process. The probe antenna is located on the probe position adjustment device, and the active array antenna under test is fixed on the active array. Antenna position adjustment device.
所述的空口幅度相位的测量,是指被测有源阵列天线和探头天线之间不使用线缆直接连接,而是在空口通过幅相测量仪器或设备直接测量探头天线在不同状态下的被测有源阵列天线的幅度相位特性。The measurement of the amplitude and phase of the air interface means that the active array antenna under test and the probe antenna are not directly connected with a cable, but the amplitude and phase measurement instruments or equipment are used to directly measure the probe antenna in different states at the air interface. Measure the amplitude and phase characteristics of active array antennas.
所述的将被测有源阵列天线中单元天线划分为多个天线组,只需要考虑天线组的水平面方向图和等效的天线组幅相复激励即可,此时阵列的水平面方向图表示为
To divide the unit antenna in the active array antenna under test into multiple antenna groups, it is only necessary to consider the horizontal plane pattern of the antenna group and the equivalent amplitude phase complex excitation of the antenna group. At this time, the horizontal plane pattern of the array represents for
其中,i=1,2…I,i为天线组的列编号,I为天线组列总数,GgivH是天线组(i,v)的水平面方向图,σgiv是天线组(i,v)的归一化幅相复激励,liv是天线组(i,v)中心至观测点的距离。Among them, i=1,2...I, i is the column number of the antenna group, I is the total number of antenna group columns, G givH is the horizontal direction pattern of the antenna group (i, v), σ giv is the antenna group (i, v) The normalized amplitude complex excitation of , l iv is the distance from the center of the antenna group (i, v) to the observation point.
所述的划分为多个天线组过程中,需要保证任意天线组至探头天线的幅相测试结果记为Agiv M能够接近天线组的远场幅相测试结果记为AgivIn the process of dividing into multiple antenna groups, it is necessary to ensure that the amplitude and phase test results from any antenna group to the probe antenna are recorded as Agiv and that the far-field amplitude and phase test results of M that can be close to the antenna group are recorded as Agiv .
有益效果:与现有技术相比,本发明提供了一种有源阵列天线方向图的近场空口快速测量系统及方法,其优势在于:Beneficial effects: Compared with the existing technology, the present invention provides a near-field air interface fast measurement system and method for active array antenna patterns. Its advantages are:
(1)整个测试过程在阵列近场即可完成,因此对于暗室空间大小或开放空间大小的需求大大降低,对于本发明中示例的被测件,对于传统远场测试,所需要的阵面至探头距离为8.67m,而使用本发明中的测试方法,所需要的阵面至探头距离为0.7m,仅为传统远场测试方法的8.1%。(1) The entire test process can be completed in the near field of the array, so the demand for the size of the darkroom space or the size of the open space is greatly reduced. For the tested device illustrated in the present invention, for traditional far-field testing, the required array area is The probe distance is 8.67m, and using the test method in the present invention, the required distance from the array to the probe is 0.7m, which is only 8.1% of the traditional far-field test method.
(2)整个测试过程在预先调整机械位置后无需位移,因此相对传统远场测试方法,无需转台,从而进一步节省成本和测试系统复杂度。(2) The entire testing process does not require displacement after pre-adjusting the mechanical position. Therefore, compared with traditional far-field testing methods, no turntable is required, thus further saving costs and complexity of the testing system.
(3)整个测试过程只需要针对天线组进行幅度相位测试,相对于传统远场测试方法,测试次数大大减小,以微调后水平面的7个波束为例,传统远场测试方法若采用1度1测,对于-60°至60°范围的方向图,共需进行7×121=847次幅相测量,而本方法只需进行45次测量,仅为传统远场测试方法的5.3%,若采用测量方法中的可选步骤4,对待测波束组进行微调,进一步增加建立的天线组待测幅相状态表中的重复状态,则所需的测量方法可进一步减少至37次,仅为传统远场测试方法的4.4%。(3) The entire test process only requires amplitude and phase tests for the antenna group. Compared with the traditional far-field test method, the number of tests is greatly reduced. Taking the 7 beams on the horizontal plane after fine-tuning as an example, if the traditional far-field test method uses 1 degree 1 measurement, for the pattern in the range of -60° to 60°, a total of 7×121=847 amplitude and phase measurements are required, while this method only requires 45 measurements, which is only 5.3% of the traditional far-field test method. If Using optional step 4 in the measurement method, fine-tuning the beam group to be measured and further adding repeated states in the amplitude and phase state table of the established antenna group to be measured, the required measurement method can be further reduced to 37 times, which is only traditional 4.4% for far field test methods.
附图说明Description of drawings
图1为本发明提出的有源阵列天线方向图的近场空口快速测量系统的整体结构示意图。 Figure 1 is a schematic diagram of the overall structure of a near-field air interface rapid measurement system for active array antenna patterns proposed by the present invention.
图2为本发明提出的有源阵列天线方向图的近场空口快速测量方法的实现流程图。FIG. 2 is a flow chart for implementing the method for fast near-field air interface measurement of active array antenna pattern proposed by the present invention.
图3为本发明所提供测量示例中的被测件天线侧照片。Figure 3 is a photo of the antenna side of the device under test in the measurement example provided by the present invention.
图4为本发明中提到的天线分组示意图。Figure 4 is a schematic diagram of the antenna grouping mentioned in the present invention.
图5为本发明提出的有源阵列天线方向图的近场空口快速测量系统及方法所测得的不同波束下方向图和采用传统远场方向图测试方法的对比,其中,(a)所测波束的指向为0°,阵列处于发射状态;(b)所测波束的指向为0°,阵列处于接收状态;(c)所测波束的指向为15°,阵列处于发射状态;(d)所测波束的指向为-15°,阵列处于接收状态;(e)所测波束的指向为30°,阵列处于发射状态;(f)所测波束的指向为-30°,阵列处于接收状态;(g)所测波束的指向为45°,阵列处于发射状态;(h)所测波束的指向为-45°,阵列处于接收状态。Figure 5 is a comparison of the patterns under different beams measured by the near-field air interface rapid measurement system and method of the active array antenna pattern proposed by the present invention and the traditional far-field pattern testing method, wherein (a) measured The pointing direction of the beam is 0°, and the array is in the transmitting state; (b) the measured beam pointing direction is 0°, and the array is in the receiving state; (c) the measured beam pointing direction is 15°, and the array is in the transmitting state; (d) The pointing direction of the measured beam is -15°, and the array is in the receiving state; (e) the pointing direction of the measured beam is 30°, and the array is in the transmitting state; (f) the pointing direction of the measured beam is -30°, and the array is in the receiving state; ( g) The measured beam's pointing direction is 45°, and the array is in the transmitting state; (h) The measured beam's pointing direction is -45°, and the array is in the receiving state.
图中有:探头天线1、被测有源阵列天线2、探头位置调整装置3、有源阵列天线位置调整装置4、幅相测试仪器5、控制平台6、第一射频电缆7、第二射频电缆8、第一数据线9、第二数据线10。The figure shows: probe antenna 1, active array antenna under test 2, probe position adjustment device 3, active array antenna position adjustment device 4, amplitude and phase test instrument 5, control platform 6, first radio frequency cable 7, second radio frequency Cable 8, first data line 9, second data line 10.
具体实施方式Detailed ways
下面结合附图对本发明作更进一步的说明。The present invention will be further described below in conjunction with the accompanying drawings.
参照图1,一种有源阵列天线方向图的近场空口快速测量系统,包括:探头天线,机械调整装置,幅度相位测试子系统和控制与算法子系统,其中:Referring to Figure 1, a near-field air interface rapid measurement system for active array antenna pattern includes: probe antenna, mechanical adjustment device, amplitude and phase test subsystem and control and algorithm subsystem, including:
所述探头天线,是任意一个已知方向图特性的天线,通常为了提高测试过程中的信噪比,采用高增益的天线,在本示例中采用了角锥喇叭天线作为探头天线。The probe antenna is any antenna with known pattern characteristics. Usually, in order to improve the signal-to-noise ratio during the test process, a high-gain antenna is used. In this example, a pyramidal horn antenna is used as the probe antenna.
机械调整装置,包括探头位置调整装置3和阵列位置调整装置4,用于对探头和阵列的高度、距离D、俯仰角、方位角、相对位置进行调整,从而实现探头中心和阵列中心的对齐、探头法向和阵列法向的对齐并标定距离。The mechanical adjustment device, including the probe position adjustment device 3 and the array position adjustment device 4, is used to adjust the height, distance D, pitch angle, azimuth angle, and relative position of the probe and the array, thereby achieving alignment of the probe center and the array center. Align and calibrate the distance between the probe normal and the array normal.
所述幅度相位测试子系统,包括用于进行幅度相位测试的幅相测试仪器5,和用于连接幅相测试仪器与探头天线、被测有源阵列天线的第一射频电缆7、第二射频电缆8。The amplitude and phase test subsystem includes an amplitude and phase test instrument 5 for performing amplitude and phase testing, and a first radio frequency cable 7 and a second radio frequency cable for connecting the amplitude and phase test instrument to the probe antenna and the active array antenna under test. Cable 8.
所述控制子系统,包括实现控制平台6,和相应的软件部分。其中,软件部分包括对有源阵列上单元的预分组、选取并设计待测波束、根据待测波束生成待测天线组的幅度相位状态表、对有源阵列的控制、对幅相测试仪器的控制与数据读取、数据处理与方向图绘制。The control subsystem includes an implementation control platform 6 and corresponding software parts. Among them, the software part includes pre-grouping of units on the active array, selecting and designing the beam to be tested, generating the amplitude and phase state table of the antenna group to be tested based on the beam to be tested, controlling the active array, and controlling the amplitude and phase test instruments. Control and data reading, data processing and pattern drawing.
参照图2,一种有源阵列天线方向图的近场空口快速测量方法,下面结合如图3所示的被测有源阵列天线作为示例,对本发明所提出的有源阵列天线方向图的近场空口快速测量方法进行清楚、完整地描述,其步骤如下:Referring to Figure 2, a method for quickly measuring the near-field air interface of the active array antenna pattern. The following is a close-range measurement of the active array antenna pattern proposed by the present invention, taking the measured active array antenna as shown in Figure 3 as an example. The rapid measurement method of field air interface is clearly and completely described. The steps are as follows:
(1)根据阵面参数及工作频率确定有源阵列和探头的相对位置,通过机械调整装置使有 源阵列中心正对探头中心,并且要求探头天线中心至有源阵列中心的距离满足有源阵列的近场范围要求,并同时满足阵列中一个单元的远场范围要求。如图3所示,本发明中使用了一个8×8单元的有源天线阵列作为示例,其中每个单元是一个2×1的探针馈电二元贴片天线阵,测试频段为26GHz,天线单元在水平方向上以半波长进行排列,在竖直方向上以整个波长进行排列,本测量系统示例中探头天线中心至有源阵列中心的距离为0.7m,满足有源阵列的近场范围要求和阵列中一个单元的远场范围要求;(1) Determine the relative position of the active array and the probe according to the array parameters and operating frequency, and adjust the active array through the mechanical adjustment device. The center of the source array is facing the center of the probe, and the distance from the center of the probe antenna to the center of the active array is required to meet the near-field range requirements of the active array and at the same time meet the far-field range requirements of a unit in the array. As shown in Figure 3, the present invention uses an 8×8 unit active antenna array as an example, where each unit is a 2×1 probe-fed binary patch antenna array, and the test frequency band is 26GHz. The antenna units are arranged at half wavelength in the horizontal direction and at the full wavelength in the vertical direction. In this measurement system example, the distance from the center of the probe antenna to the center of the active array is 0.7m, which meets the near field range of the active array. requirements and far-field range requirements of an element in the array;
(2)根据阵面参数及探头位置将阵列中单元天线划分为一定数量的天线组,并通过仿真或实测得到天线组的远场复方向图Ggmf,m=1,2…M,m为天线组的编号,M为天线组总数。(2) Divide the unit antennas in the array into a certain number of antenna groups according to the array parameters and probe positions, and obtain the far-field complex pattern G gmf of the antenna group through simulation or actual measurement, m=1,2...M, m is The number of the antenna group, M is the total number of antenna groups.
对于一个N单元的有源阵列天线,根据电磁场叠加定理,它的理想远场电场分布可以表示为
For an N-unit active array antenna, according to the electromagnetic field superposition theorem, its ideal far-field electric field distribution can be expressed as
其中,(l,θ,φ)是任意一个远场观测点的极坐标,n=1,2…N;n为天线单元编号,N为天线单元总数,Gnf是天线单元n的远场方向图,θn和φn是远场观测点相对于天线单元n的方位角和俯仰角,hn是远场观测点至天线单元n的空间响应,ξn是天线单元n的幅相复激励。Among them, (l, θ, φ) are the polar coordinates of any far-field observation point, n = 1, 2...N; n is the antenna unit number, N is the total number of antenna units, G nf is the far-field direction of antenna unit n In the figure, θ n and φ n are the azimuth and elevation angles of the far-field observation point relative to the antenna unit n, h n is the spatial response from the far-field observation point to the antenna unit n, ξ n is the amplitude-phase complex excitation of the antenna unit n .
在远场条件下,空间响应hn可以分解为幅度响应(路径损耗)λ/(4πln)和相位响应2πrn/λ,其中ln是观测点至天线单元n的距离。因此,对于二维U×V单元的有源天线阵列,其归一化方向图可以表示为
Under far-field conditions, the spatial response h n can be decomposed into an amplitude response (path loss) λ/(4πl n ) and a phase response 2πr n /λ, where l n is the distance from the observation point to the antenna unit n. Therefore, for a two-dimensional U×V unit active antenna array, its normalized pattern can be expressed as
其中,u=1,2…U,u为天线单元的行编号,U为天线单元行总数,v=1,2…V,v为天线单元的列编号,V为天线单元列总数,σuv是天线单元(u,v)的归一化幅相复激励。Among them, u=1,2...U, u is the row number of the antenna unit, U is the total number of antenna unit rows, v=1,2...V, v is the column number of the antenna unit, V is the total number of antenna unit columns, σ uv is the normalized amplitude complex excitation of the antenna unit (u, v).
在评估有源阵列天线的波束成形性能时,通常只需要测量其水平面和竖直面的波束即可,以水平面波束为例,在二维阵列形成水平面波束时,需要保证其每一列在竖直面形成法向波束,也就是说,在形成不同的水平面波束时,阵列中每一列的单元之间的相位关系保持不变。因此,可以将每一列的天线单元划分为若干个天线组,只需要考虑天线组的水平面方向图和等效的天线组幅相复激励即可,此时阵列的水平面方向图可以表示为
When evaluating the beamforming performance of an active array antenna, it is usually only necessary to measure the beams in the horizontal and vertical planes. Taking the horizontal plane beam as an example, when a two-dimensional array forms a horizontal plane beam, it is necessary to ensure that each column is in the vertical plane. The normal beam is formed in the horizontal plane, that is to say, the phase relationship between the units in each column of the array remains unchanged when forming different horizontal plane beams. Therefore, the antenna units in each column can be divided into several antenna groups. It is only necessary to consider the horizontal plane pattern of the antenna group and the equivalent amplitude phase complex excitation of the antenna group. At this time, the horizontal plane pattern of the array can be expressed as
其中,i=1,2…I,i为天线组的列编号,I为天线组列总数,GgivH是天线组(i,v)的水平面方 向图,σgiv是天线组(i,v)的归一化幅相复激励,liv是天线组(i,v)中心至观测点的距离。Among them, i=1,2...I, i is the column number of the antenna group, I is the total number of antenna group columns, G givH is the horizontal aspect of the antenna group (i, v) In the diagram, σ giv is the normalized amplitude complex excitation of the antenna group (i, v), and l iv is the distance from the center of the antenna group (i, v) to the observation point.
在分组过程中,需要保证任意天线组至探头天线的幅相测试结果(记为Agiv M)能够接近天线组的远场幅相测试结果(记为Agiv),由于测试过程是在阵列的近场范围内,因此,当天线组中单元数量过多时,探头天线也有可能在天线组的近场范围内。但考虑到σgiv是天线组(i,v)的归一化幅相复激励,只有不同天线组的Agiv M-Agiv存在较大误差时,才会对σgiv的计算产生影响,可以通过减小天线组中天线单元的数量来避免该误差。对于本发明中示例的8×8单元有源阵列,可以参照图4进行分组,每列天线单元构成一个天线组。During the grouping process, it is necessary to ensure that the amplitude and phase test results from any antenna group to the probe antenna (denoted as A giv M ) can be close to the far-field amplitude and phase test results of the antenna group (denoted as A giv ). Since the test process is in the array Within the near field range, therefore, when there are too many elements in the antenna group, the probe antenna may also be within the near field range of the antenna group. However, considering that σ giv is the normalized amplitude complex excitation of the antenna group (i, v), only when there is a large error in A giv M -A giv of different antenna groups, it will have an impact on the calculation of σ giv . You can This error is avoided by reducing the number of antenna elements in the antenna group. The 8×8 unit active array illustrated in the present invention can be grouped with reference to Figure 4, and each column of antenna units constitutes an antenna group.
(3)根据阵面参数和天线组选取待测波束组,建立天线组的待测幅相状态表。本发明中作为示例的测量系统选取了被测阵列在水平面的7个波束,其波束指向分别为-45°,-30°,-15°,0°,15°,30°和45°,其中每个天线组的幅度状态均保持为最大值,天线组的相位状态如下表1所示:(3) Select the beam group to be measured based on the array parameters and antenna group, and establish the amplitude and phase state table of the antenna group to be measured. The measurement system as an example in the present invention selects 7 beams of the measured array in the horizontal plane, and their beam directions are -45°, -30°, -15°, 0°, 15°, 30° and 45°, where The amplitude state of each antenna group is maintained at the maximum value, and the phase state of the antenna group is shown in Table 1 below:
表1Table 1
待测波束组的天线组待测相位状态表
Antenna group to be tested phase status table of the beam group to be tested
其中,标灰色为重复状态,在56个相位状态中共有11个重复状态。Among them, the gray marked are repeated states, and there are 11 repeated states among the 56 phase states.
(4)(可选)对待测波束组进行微调,进一步增加建立的天线组待测幅相状态表中的重复状态,从而减小测试次数,对于如表1所示的待测波束组和天线组待测相位状态表,可以微调为如下表2所示,其中,标灰色为重复状态,在56个相位状态中共有18个重复状态,且每个天线组的幅度状态仍保持为最大值。 (4) (Optional) Fine-tune the beam group to be tested and further increase the repeated states in the amplitude and phase state table of the established antenna group to be measured, thereby reducing the number of tests. For the beam group and antenna to be tested as shown in Table 1 The phase state table of the group to be tested can be fine-tuned as shown in Table 2 below, where the gray marks are repeating states. There are 18 repeating states among the 56 phase states, and the amplitude state of each antenna group remains at the maximum value.
表2Table 2
微调后待测波束组的天线组待测相位状态表
Phase status table of the antenna group to be tested for the beam group to be tested after fine-tuning
(5)对天线组待测幅相状态表中的重复状态进行简并,共只需进行45次测试,若采用步骤(4),则共只需进行37次测试;(5) Degenerate the repeated states in the amplitude and phase state table of the antenna group to be measured, and only 45 tests are needed in total. If step (4) is adopted, only 37 tests are needed in total;
(6)按照简并后的待测幅相状态表,每次激励一个天线组,使用幅相测试仪器或设备进行幅相测试,得到实测幅相激励表,即Agiv M(6) According to the degenerated amplitude and phase state table to be measured, excite one antenna group at a time, use amplitude and phase testing instruments or equipment to perform amplitude and phase tests, and obtain the actual measured amplitude and phase excitation table, namely Agiv M ;
(7)根据(2)中仿真或实测的天线组方向图Ggmf,由实测幅相激励表计算天线组的归一化幅相激励表σgm,计算过程可以表示为:
(7) According to the simulated or measured antenna group pattern G gmf in (2), calculate the normalized amplitude and phase excitation table σ gm of the antenna group from the measured amplitude and phase excitation table. The calculation process can be expressed as:
其中,m是天线组的编号,也可以用天线组的行列编号表示为(i,v),lgm是天线组m中心至探头天线的距离,是天线组m中心相对于探头天线的俯仰角和方位角,Gpf是探头天线的远场方向图。Among them, m is the number of the antenna group, which can also be expressed as (i, v) by the row and column number of the antenna group, l gm is the distance from the center of the antenna group m to the probe antenna, and is the pitch angle and azimuth angle of the center of the antenna group m relative to the probe antenna, and G pf is the far-field pattern of the probe antenna.
(8)通过仿真和实测的天线组方向图、天线组的归一化幅相激励表,计算阵列的待测波束方向图。计算过程可以表示为:
(8) Calculate the beam pattern of the array to be measured through the simulated and measured antenna group patterns and the normalized amplitude and phase excitation table of the antenna group. The calculation process can be expressed as:
其中,GgivH是天线组(i,v)的水平面方向图,σgiv即为步骤(7)中所求得某个波束对应的天线组归一化幅相激励σgm,dx是天线单元水平方向的间距。Among them, G givH is the horizontal plane pattern of the antenna group (i, v), σ giv is the normalized amplitude and phase excitation σ gm of the antenna group corresponding to a certain beam obtained in step (7), and dx is the level of the antenna unit direction spacing.
为了验证本发明提出的有源阵列天线方向图的近场空口快速测量系统及方法地真实性和可靠性,再应用本发明提出的测量系统及方法对图3中的被测阵列进行方向图测试后,特使 用传统远场测试方法对其进行了测试,图5提供了测试对比结果。In order to verify the authenticity and reliability of the near-field air interface fast measurement system and method of the active array antenna pattern proposed by the present invention, the measurement system and method proposed by the present invention are then used to conduct pattern testing on the array under test in Figure 3. Later, envoy It was tested using traditional far-field testing methods, and Figure 5 provides the test comparison results.
以上实施例仅为说明本发明的技术思想,不能以此限定本发明的保护范围,凡是按照本发明提出的技术思想,在技术方案基础上所做的任何改动,均落入本发明保护范围之内。The above embodiments are only for illustrating the technical ideas of the present invention and cannot limit the protection scope of the present invention. Any changes made based on the technical solutions based on the technical ideas proposed by the present invention will fall within the protection scope of the present invention. Inside.
本发明提出的有源阵列天线方向图的近场空口快速测量系统及方法,通过近场空口幅相测试的测试结果进行相应的计算,从而表征出远场的方向图测试结果,要求探头天线至阵面距离仅为传统远场测试方法的8.1%,要求测试次数仅为传统远场测试方法的4.4%,极大地降低了有源阵列天线方向图测试的成本,提高了测试效率,且具有系统复杂度低、无需转台等优点。 The near-field air interface rapid measurement system and method of the active array antenna pattern proposed by the present invention performs corresponding calculations through the test results of the near-field air interface amplitude and phase test, thereby characterizing the far-field pattern test results. The probe antenna is required to The array distance is only 8.1% of the traditional far-field test method, and the required number of tests is only 4.4% of the traditional far-field test method, which greatly reduces the cost of active array antenna pattern testing, improves test efficiency, and has a systematic It has the advantages of low complexity and no need for a turntable.

Claims (9)

  1. 一种有源阵列天线方向图的近场空口快速测量系统,其特征在于:包括探头天线,机械调整装置,幅度相位测试子系统和控制子系统,其中:A near-field air interface rapid measurement system for active array antenna pattern, which is characterized by: including a probe antenna, a mechanical adjustment device, an amplitude and phase test subsystem and a control subsystem, wherein:
    所述探头天线(1),是任意一个已知方向图特性的天线,为了提高测试过程中的信噪比,采用高增益天线;The probe antenna (1) is any antenna with known pattern characteristics. In order to improve the signal-to-noise ratio during the test, a high-gain antenna is used;
    所述机械调整装置,包括探头位置调整装置(3)和有源阵列天线位置调整装置(4),用于对探头天线(1)和被测有源阵列天线(2)的高度、距离(D)、俯仰角、方位角、相对位置进行调整,从而实现探头天线(1)中心和被测有源阵列天线(2)中心的对齐、探头天线(1)法向和被测有源阵列天线(2)法向的对齐,并标定距离;The mechanical adjustment device includes a probe position adjustment device (3) and an active array antenna position adjustment device (4), which are used to adjust the height and distance (D) of the probe antenna (1) and the active array antenna under test (2). ), pitch angle, azimuth angle, and relative position are adjusted to achieve alignment between the center of the probe antenna (1) and the center of the active array antenna under test (2), and the normal direction of the probe antenna (1) and the center of the active array antenna under test (2). 2) Normal alignment and distance calibration;
    所述幅度相位测试子系统,包括探头天线(1)、用于进行幅度相位测试的幅相测试仪器(5)、用于连接幅相测试仪器(5)与探头天线(1)的第一射频电缆(7)、用于连接幅相测试仪器(5)与被测有源阵列天线(2)的第二射频电缆(8);The amplitude and phase test subsystem includes a probe antenna (1), an amplitude and phase testing instrument (5) for performing amplitude and phase testing, and a first radio frequency for connecting the amplitude and phase testing instrument (5) and the probe antenna (1). Cable (7), a second radio frequency cable (8) used to connect the amplitude and phase test instrument (5) and the active array antenna under test (2);
    所述控制子系统,包括实现控制和运行的控制平台(6)、用于连接控制平台(6)和幅相测试仪器(5)的第一数据线(9)、用于连接控制平台(6)和被测有源阵列天线(2)的第二数据线(10)和相应的控制部分;其中,控制部分包括对被测有源阵列天线(2)上单元的预分组、选取并设计待测波束、根据待测波束生成待测天线组的幅度相位状态表、对被测有源阵列天线(2)的控制、对幅相测试仪器(5)的控制与数据读取、数据处理和方向图绘制;The control subsystem includes a control platform (6) for realizing control and operation, a first data line (9) for connecting the control platform (6) and the amplitude and phase test instrument (5), and a first data line (9) for connecting the control platform (6). ) and the second data line (10) of the active array antenna (2) under test and the corresponding control part; wherein, the control part includes pre-grouping, selection and design of the units on the active array antenna (2) under test. Testing the beam, generating the amplitude and phase state table of the antenna group to be tested based on the beam to be tested, controlling the active array antenna under test (2), controlling the amplitude and phase test instrument (5) and reading data, data processing and direction graph drawing;
    具体连接关系如下:探头天线(1)固定在探头位置调整装置(3)上,被测有源阵列天线(2)固定在有源阵列天线位置调整装置(4)上,探头天线(1)和幅相测试仪器(5)之间通过第一射频电缆(7)连接,被测有源阵列天线(2)和幅相测试仪器(5)之间通过第二射频电缆(8)连接,幅相测试仪器(5)和控制平台(6)之间通过第一数据线(9)连接,被测有源阵列天线(2)和控制平台(6)之间通过第二数据线(10)连接。The specific connection relationship is as follows: the probe antenna (1) is fixed on the probe position adjustment device (3), the active array antenna under test (2) is fixed on the active array antenna position adjustment device (4), the probe antenna (1) and The amplitude and phase testing instruments (5) are connected through a first radio frequency cable (7), and the tested active array antenna (2) and the amplitude and phase testing instruments (5) are connected through a second radio frequency cable (8). The test instrument (5) and the control platform (6) are connected through a first data line (9), and the active array antenna under test (2) and the control platform (6) are connected through a second data line (10).
  2. 根据权利要求1所述的一种有源阵列天线方向图的近场空口快速测量系统,其特征在于,所述探头天线(1)的高增益天线采用角锥喇叭天线。A near-field air interface rapid measurement system for active array antenna pattern according to claim 1, characterized in that the high-gain antenna of the probe antenna (1) adopts a pyramid horn antenna.
  3. 一种如权利要求1或2所述系统的有源阵列天线方向图的近场空口快速测量方法,其特征在于,在被测有源阵列天线(2)的近场,调整有源阵列天线位置调整装置(4)的位置并固定后进行空口幅度相位的测量,根据测量结果运行控制子系统中的控制平台(6),从而得到有源阵列待测波束的远场方向图,该快速测量方法包括如下步骤:A method for fast near-field air interface measurement of the active array antenna pattern of the system according to claim 1 or 2, characterized in that, in the near field of the active array antenna (2) under test, the position of the active array antenna is adjusted. After adjusting the position of the device (4) and fixing it, measure the air interface amplitude and phase, and run the control platform (6) in the control subsystem according to the measurement results to obtain the far-field pattern of the active array beam to be measured. This rapid measurement method Includes the following steps:
    步骤1,根据被测有源阵列天线(2)参数及工作频率确定被测有源阵列天线(2)和探头天线(1)的相对位置,通过有源阵列天线位置调整装置(4)使被测有源阵列天线(2)中心正对探头天线(1)中心,并且要求探头天线(1)中心至被测有源阵列天线(2)中心的距离满足有源阵列的近场范围要求,并同时满足阵列中一个单元的远场范围要求和探头天线的 远场范围要求;Step 1: Determine the relative positions of the active array antenna under test (2) and the probe antenna (1) according to the parameters and operating frequency of the active array antenna under test (2), and use the active array antenna position adjustment device (4) to adjust the position of the active array antenna under test (2). The center of the active array antenna (2) under test is facing the center of the probe antenna (1), and the distance from the center of the probe antenna (1) to the center of the active array antenna (2) under test is required to meet the near-field range requirements of the active array, and At the same time, it meets the far-field range requirements of an element in the array and the requirements of the probe antenna. Far field range requirements;
    步骤2,根据被测有源阵列天线(2)的参数、单元天线方向图及探头天线(1)位置将被测有源阵列天线(2)中单元天线划分为多个天线组,并通过仿真或实测得到天线组的远场复方向图Gmf,m=1,2…M;m为天线组编号,M为天线组总数;Step 2: Divide the unit antenna in the active array antenna under test (2) into multiple antenna groups according to the parameters of the active array antenna under test (2), the unit antenna pattern and the position of the probe antenna (1), and simulate Or the far-field complex pattern G mf of the antenna group is measured, m=1,2...M; m is the antenna group number, M is the total number of antenna groups;
    步骤3,根据被测有源阵列天线(2)的参数和步骤2中确定的天线组划分形式选取待测波束组,建立天线组的待测幅相状态表;Step 3: Select the beam group to be tested based on the parameters of the active array antenna (2) under test and the antenna group division form determined in step 2, and establish the amplitude and phase state table of the antenna group to be measured;
    步骤4,对待测波束组进行微调,进一步增加建立的天线组待测幅相状态表中的重复状态;Step 4: Fine-tune the beam group to be measured and further add repeated states in the amplitude and phase state table of the antenna group to be measured;
    步骤5,对天线组待测幅相状态表中的重复状态进行合并;Step 5: Merge the repeated states in the amplitude and phase state table of the antenna group to be measured;
    步骤6,按照合并后的待测幅相状态表,每次激励一个天线组,使用幅相测试仪器(5)进行幅相测试,得到实测幅相激励表;Step 6: According to the combined amplitude and phase state table to be measured, excite one antenna group at a time, use the amplitude and phase testing instrument (5) to perform amplitude and phase testing, and obtain the actual measured amplitude and phase excitation table;
    步骤7,根据步骤2中仿真或实测的天线组方向图Gmf,由实测幅相激励表计算天线组的归一化幅相激励表,计算过程可以表示为:
    Step 7: According to the simulated or measured antenna group pattern G mf in step 2, calculate the normalized amplitude and phase excitation table of the antenna group from the measured amplitude and phase excitation table. The calculation process can be expressed as:
    其中,m表示天线组的编号,Agm M表示天线组m的实测幅相激励,lgm是天线组m中心至探头天线的距离,σgm表示天线组m的归一化幅相激励,Ggmf是天线组m的远场方向图,是天线组m中心相对于探头天线的俯仰角和方位角,Gpf是探头天线的远场方向图;Among them, m represents the number of the antenna group, A gm M represents the measured amplitude and phase excitation of the antenna group m, l gm is the distance from the center of the antenna group m to the probe antenna, σ gm represents the normalized amplitude and phase excitation of the antenna group m, G gmf is the far field pattern of antenna group m, and is the pitch angle and azimuth angle of the center of the antenna group m relative to the probe antenna, G pf is the far-field pattern of the probe antenna;
    步骤8,通过仿真和实测的天线组方向图、天线组的归一化幅相激励表,计算被测有源阵列天线待测波束的远场方向图,对于任意一个二维U×V单元的有源天线阵列,计算过程表示为:
    Step 8: Calculate the far-field pattern of the measured beam of the active array antenna under test through the simulated and measured antenna group pattern and the normalized amplitude and phase excitation table of the antenna group. For any two-dimensional U×V unit Active antenna array, the calculation process is expressed as:
    其中,u=1,2…U,u为天线单元的行编号,U为天线单元行总数,v=1,2…V,v为天线单元的列编号,V为天线单元列总数,σuv是天线单元(u,v)的归一化幅相复激励,luv是天线单元(u,v)中心至理想远场观测点(θ,φ)的距离。Guvf是天线单元(u,v)的远场方向图,Parray(θ,φ)是被测有源阵列天线待测波束的远场方向图。Among them, u=1,2...U, u is the row number of the antenna unit, U is the total number of antenna unit rows, v=1,2...V, v is the column number of the antenna unit, V is the total number of antenna unit columns, σ uv is the normalized amplitude complex excitation of the antenna unit (u, v), l uv is the distance from the center of the antenna unit (u, v) to the ideal far-field observation point (θ, φ). G uvf is the far-field pattern of the antenna unit (u, v), and P array (θ, φ) is the far-field pattern of the measured beam of the active array antenna under test.
  4. 根据权利要求3所述的有源阵列天线方向图的近场空口快速测量方法,其特征在于,所述的近场是指探头天线中心至有源阵列中心的距离(D),满足被测有源天线阵列的近场范围要求,但仍要求该距离满足阵列中一个单元的远场范围要求,即其中,dE表示单元天线的最大尺寸,dA表示被测有源阵列天线的最大尺寸。 The near-field air interface quick measurement method of active array antenna pattern according to claim 3, characterized in that the near field refers to the distance (D) from the center of the probe antenna to the center of the active array, which satisfies the requirement of the measured The near field range requirements of the source antenna array, but the distance is still required to meet the far field range requirements of a unit in the array, that is Among them, d E represents the maximum size of the unit antenna, and d A represents the maximum size of the active array antenna under test.
  5. 根据权利要求3所述的有源阵列天线方向图的近场空口快速测量方法,其特征在于,所述的固定机械调整装置,仅旨在通过机械调整装置实现探头天线(1)中心和被测有源天线阵列(2)中心的对齐、探头天线(1)法向和被测有源天线阵列(2)法向的对齐,并保证探头天线中心至被测有源天线阵列中心的距离要求满足并标定该距离,在实际测量过程中,机械调整装置不进行工作。The near-field air interface quick measurement method of active array antenna pattern according to claim 3, characterized in that the fixed mechanical adjustment device is only intended to realize the center of the probe antenna (1) and the measured position through the mechanical adjustment device. Align the center of the active antenna array (2), the normal direction of the probe antenna (1) and the normal direction of the active antenna array under test (2), and ensure that the distance requirements from the center of the probe antenna to the center of the active antenna array under test meet the requirements And calibrate the distance. During the actual measurement process, the mechanical adjustment device does not work.
  6. 根据权利要求3所述的有源阵列天线方向图的近场空口快速测量方法,其特征在于,所述的固定位置是指在预先进行的调整机械位置过程后,测量过程中各子系统和设备位置不发生变化,探头天线(1)位于探头位置调整装置(3)上,被测有源阵列天线(2)固定在有源阵列天线位置调整装置(4)上。The near-field air interface quick measurement method of active array antenna pattern according to claim 3, characterized in that the fixed position refers to each subsystem and equipment during the measurement process after the mechanical position adjustment process is performed in advance. The position does not change, the probe antenna (1) is located on the probe position adjustment device (3), and the active array antenna (2) under test is fixed on the active array antenna position adjustment device (4).
  7. 根据权利要求3所述的有源阵列天线方向图的近场空口快速测量方法,其特征在于,所述的空口幅度相位的测量,是指被测有源阵列天线(2)和探头天线(1)之间不使用线缆直接连接,而是在空口通过幅相测量仪器或设备直接测量探头天线(1)在不同状态下的被测有源阵列天线(2)的幅度相位特性。The near-field air interface quick measurement method of active array antenna pattern according to claim 3, characterized in that the measurement of the air interface amplitude and phase refers to the measured active array antenna (2) and the probe antenna (1 ) are not directly connected with cables, but directly measure the amplitude and phase characteristics of the probe antenna (1) in different states of the active array antenna (2) under test through the air interface through amplitude and phase measuring instruments or equipment.
  8. 根据权利要求3所述的有源阵列天线方向图的近场空口快速测量方法,其特征在于,所述的将被测有源阵列天线(2)中单元天线划分为多个天线组,只需要考虑天线组的水平面方向图和等效的天线组幅相复激励即可,此时阵列的水平面方向图表示为
    The near-field air interface quick measurement method of the active array antenna pattern according to claim 3, characterized in that the unit antenna in the active array antenna (2) under test is divided into multiple antenna groups. Just consider the horizontal plane pattern of the antenna group and the equivalent amplitude phase complex excitation of the antenna group. At this time, the horizontal plane pattern of the array is expressed as
    其中,i=1,2…I,i为天线组的列编号,I为天线组列总数,GgivH是天线组(i,v)的水平面方向图,σgiv是天线组(i,v)的归一化幅相复激励,liv是天线组(i,v)中心至观测点的距离。Among them, i=1,2...I, i is the column number of the antenna group, I is the total number of antenna group columns, G givH is the horizontal direction pattern of the antenna group (i, v), σ giv is the antenna group (i, v) The normalized amplitude complex excitation of , l iv is the distance from the center of the antenna group (i, v) to the observation point.
  9. 根据权利要求8所述的有源阵列天线方向图的近场空口快速测量方法,其特征在于,所述的划分为多个天线组过程中,需要保证任意天线组至探头天线的幅相测试结果Agiv M能够接近天线组的远场幅相测试结果AgivThe near-field air interface quick measurement method of active array antenna pattern according to claim 8, characterized in that during the process of dividing into multiple antenna groups, it is necessary to ensure the amplitude and phase test results from any antenna group to the probe antenna A giv M can be close to the far-field amplitude and phase test results A giv of the antenna group.
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