WO2023243174A1

WO2023243174A1 - Substrate inspection device, film forming device, substrate inspection method, and film forming method

Info

Publication number: WO2023243174A1
Application number: PCT/JP2023/011332
Authority: WO
Inventors: 和憲谷
Original assignee: キヤノントッキ株式会社
Priority date: 2022-06-16
Filing date: 2023-03-22
Publication date: 2023-12-21
Also published as: JP2023183676A

Abstract

Used is a substrate inspection device characterized by comprising: a support means for supporting a substrate; a photographing means for photographing the substrate supported by the support means; and a determination means for determining whether a crack has occurred in the substrate on the basis of the photographing result of the photographing means. The substrate inspection device is characterized in that the determination means determines whether the crack has occurred in the substrate on the basis of a distance calculated between a first reference point and a second reference point on the basis of the photographing result.

Description

Substrate inspection equipment, film deposition equipment, substrate inspection method, and film deposition method

The present invention relates to a substrate inspection apparatus, a film deposition apparatus including the substrate inspection apparatus, a substrate inspection method using the substrate inspection apparatus, and a film deposition method including the substrate inspection method.

An organic EL display device is known as a flat panel display device. An organic EL element that constitutes an organic EL display device has a basic structure in which a functional layer having a light-emitting layer, which is an organic layer that causes light emission, is formed between two opposing electrodes (a cathode electrode and an anode electrode). The functional layer and electrode layer of an organic EL element are formed by depositing the materials constituting each layer on a substrate such as glass through a mask in a film deposition apparatus.

When a film forming apparatus performs film formation, an image obtained by photographing a substrate using an imaging device may be used for alignment, inspection, etc. of the substrate. Patent Document 1 discloses a method of irradiating the surface of a substrate with a line-shaped light that straddles the width direction perpendicular to the conveyance direction of the substrate, taking images while conveying the substrate, and connecting multiple images to obtain an image of the entire substrate. Discloses a technology for detecting cracks in the substrate by acquiring an image of the substrate and detecting the edges of the substrate from the image.

JP 2017-150937 Publication

However, in the above configuration in which images are taken continuously while the substrate is being transported, if the substrate is not sufficiently held by the transport means and moves during transport, an appropriate image cannot be obtained and cracks in the board cannot be detected. . Therefore, a transport means is required that can sufficiently hold the substrate and transport it with high precision without interfering with imaging, which increases the equipment cost.

The present invention has been made in view of the above problems, and aims to provide a technique for detecting cracks in a substrate with a simple configuration at low cost.

The board inspection device of the present invention includes:
support means for supporting the substrate;
Photographing means for photographing the substrate supported by the supporting means;
determining means for determining whether a crack has occurred in the substrate based on the photographic result of the photographing means;
Equipped with
The determining means is characterized in that it determines whether a crack has occurred in the substrate based on a distance between a first reference point and a second reference point calculated based on the photographic result.
Further, the substrate inspection method of the present invention includes:
A board inspection method using a board inspection apparatus comprising a support means for supporting a board, and a photographing means for photographing the board supported by the support means, the method comprising:
performing a determination step of determining whether a crack has occurred in the substrate based on the photographing result of the photographing means;
The determination step is characterized in that it is determined whether a crack has occurred in the substrate based on a distance between a first reference point and a second reference point calculated based on the photographic results.

According to the present invention, it is possible to provide a technique for detecting cracks in a substrate with a low cost and simple configuration.

FIG. 1 is a schematic configuration diagram of a film forming apparatus. FIG. 2 is a schematic configuration diagram of a substrate lifting device provided in a carrier delivery chamber. FIG. 3 is a diagram illustrating a state in which a substrate carrier is carried into a carrier delivery chamber. FIG. 3 is a diagram illustrating a state in which a substrate is being carried into a carrier delivery chamber. FIG. 3 is a diagram showing how a substrate is supported by a substrate lifting device in a carrier delivery chamber. FIG. 3 is a diagram illustrating a state in which a substrate is held by a substrate carrier in a carrier delivery chamber. FIG. 2 is a plan view illustrating the configuration of a substrate and a substrate carrier. FIG. 3 is a cross-sectional view of the suction pad and clamp of the substrate carrier. FIG. 3 is a diagram showing a peeling method for peeling a substrate from a substrate carrier. It is a figure which shows the photographed image and edge image of a board|substrate and a board|substrate carrier. FIG. 3 is a diagram showing diagonal dimensions of a substrate obtained in a substrate crack inspection. FIG. 3 is a flow diagram of a crack inspection of a board. It is a schematic block diagram of a film-forming chamber. FIG. 2 is a diagram illustrating the configuration of an electronic device.

EMBODIMENT OF THE INVENTION Below, with reference to drawings, the form for carrying out this invention is illustratively described in detail based on an Example. However, the dimensions, materials, shapes, and relative arrangement of the components described in this embodiment should be changed as appropriate depending on the configuration of the device to which the invention is applied and various conditions. That is, the scope of the present invention is not intended to be limited to the following embodiments.

The present invention can be applied, for example, to a film forming apparatus that forms a thin film of a film forming material on the surface of an object to be film-formed, such as a substrate, by vapor deposition or sputtering while conveying the film-forming object, such as a substrate, and forms a thin film with a desired pattern by vacuum evaporation. It can be desirably applied to an apparatus for forming (a material film). Any material such as glass, a film of a polymeric material, a silicon wafer, or metal can be selected as the material of the substrate, and the substrate may be, for example, a substrate in which a film of polyimide or the like is deposited on a glass substrate. . Further, as the vapor deposition material, any material such as an organic material or a metallic material (metal, metal oxide, etc.) may be selected. In addition to the vacuum deposition apparatus described in the following description, the present invention can also be applied to film forming apparatuses including sputtering apparatuses and CVD (Chemical Vapor Deposition) apparatuses. Specifically, the technology of the present invention is applicable to manufacturing equipment for organic electronic devices (eg, organic light emitting elements, thin film solar cells), optical members, and the like. Among these, an organic light emitting device manufacturing apparatus that forms an organic light emitting device by evaporating a deposition material and depositing it on a substrate through a mask is one of the preferred application examples of the present invention. Hereinafter, a case where the present invention is applied to an electronic device manufacturing apparatus will be described as an example, but the substrate inspection apparatus of the present invention is not limited to this, and can be applied to the various manufacturing apparatuses described above.

(Example)
<Film forming equipment>
FIG. 1 is a plan view showing a schematic configuration of a film forming apparatus according to an embodiment of the present invention. Here, a film forming apparatus used in an organic EL display production line will be described. When manufacturing an organic EL display, a substrate of a predetermined size is carried into a film forming apparatus, and organic EL and metal layers are formed. The substrate after film formation is carried out to a post-process and undergoes post-processing such as cutting the substrate.

In this embodiment, a film forming apparatus called an in-line type will be described as an example. In an in-line type film forming apparatus, a plurality of chambers are arranged side by side, and a substrate, a substrate carrier, and a mask are sequentially transported into each chamber, and various processes are performed in each chamber. To transport the substrate, etc., a transport roller or a linear motor is used as a transport means. A plurality of conveyance rollers are arranged along the conveyance direction on both sides of the conveyance path, and are rotated by the driving force of an AC servo motor (not shown) to convey the substrate carrier 100 and the mask M into and out of each room. do. Each chamber is configured so that a vacuum atmosphere or an inert gas atmosphere can be created for each chamber or for each of a plurality of adjacent chambers. In order to maintain the vacuum state inside the vacuum container, the film forming apparatus is equipped with a vacuum pump (not shown).

Note that the film forming apparatus to which the substrate inspection apparatus of the present invention is applied is not limited to an in-line type, but may be a cluster type film forming apparatus. In a cluster type film forming apparatus, a film is formed on a substrate while being transported between a plurality of chambers arranged around a transport robot.

In FIG. 1, among the plurality of chambers, only the chamber that performs typical processing is shown with the symbol R, and the other chambers are omitted with black dots. Further, in FIG. 1, a thin solid line arrow indicates a transport route of the substrate carrier 100, a thin broken line arrow indicates a transport route of the substrate 200, and a thick solid line arrow indicates a transport route of the mask M. The operation of the devices provided in each room is controlled by a control unit C such as a computer. The control section C can be provided individually for each device, or a common control section C can be provided for a plurality of devices. Generally, it is a well-known technology that various operations are controlled by a control unit. As the control unit C, for example, an information processing device or a processing circuit equipped with computational resources such as a processor and a memory can be used.

First, the substrate carrier 100 and the substrate 200 are sent to the substrate placement chamber R1, and the substrate 200 is held above the substrate carrier 100 in the substrate placement chamber R1. In the substrate mounting chamber R1, the substrate carrier 100 is arranged with the substrate holding surface facing upward in the vertical direction. The substrate 200 carried into the substrate mounting chamber R1 is placed on the holding surface of the substrate carrier 100 so that the surface to be film-formed faces upward in the vertical direction. During this placement, the film forming apparatus images the substrate 200 to obtain position information, and performs position adjustment (first alignment) so that the substrate 200 is at a predetermined position on the substrate carrier 100. The substrate carrier 100 and the substrate 200 held by the substrate carrier 100 are transported to the reversing chamber R2.

A reversing mechanism for reversing the orientation of the substrate holding surface of the substrate carrier 100 from vertically upward to vertically downward is arranged in the reversing chamber R2. In the reversing chamber R2, the substrate carrier 100 is rotated 180 degrees upside down together with the substrate 200 so that the substrate 200 is held below the substrate carrier 100.

Further, the mask M is transported to the reversing chamber R2 from a route different from the transport route of the substrate carrier 100. In the reversing chamber R2, the substrate carrier 100 holding the substrate 200 on the lower side is placed on the mask M. The substrate 200 held by the substrate carrier 100 is then transported to the film forming chamber R3 together with the mask M sent to the reversing chamber R2. Note that the rotation of the substrate carrier 100, the joining with the mask M, and the mounting on the mask M may be performed in separate chambers.

An alignment device that aligns the substrate carrier 100 (and the substrate 200 held therein) and the mask M is arranged in the reversing chamber R2. The alignment device places the substrate carrier 100 on the mask M in a state where the substrate 200 and the mask M have a predetermined positional relationship in the in-plane direction of the film-forming surface of the substrate 200. When placing the substrate carrier 100 on the mask M in the reversing chamber R2, the film forming apparatus images the substrate 200 and the mask M to acquire positional information, and adjusts the position of the substrate 200 and the mask M in the in-plane direction. 2 alignment).

Subsequently, in the film forming chamber R3, a thin film is formed on the surface of the substrate 200 through a mask M having an opening at a desired film forming position, and then the substrate carrier 100 and the like are transported to the mask unloading chamber R4. Ru. Note that, generally, a plurality of film forming chambers R3 are provided as shown in FIG. 1 so that thin films can be formed using different materials. Therefore, normally, by transporting the substrate 200 once, a film forming process is performed in one specific film forming chamber R3.

After film formation, the substrate 200 held by the substrate carrier 100 is lifted from the mask M in the mask unloading chamber R4. The mask M that has been used a predetermined number of times is carried out from the mask carrying-out chamber R4 to the outside of the apparatus. The substrate 200 held by the substrate carrier 100 and the mask M to be used again are transported from the mask unloading room R4 to the relay room R5. The mask M in the relay room R5 is transported toward the reversal room R2. A mask stocker may be arranged on the production line to store a plurality of masks M and take them out as needed. The substrate carrier 100 and the substrate 200 in the relay room R5 are inverted in an inversion chamber (not shown) so that the film-forming surface of the substrate 200 and the substrate holding surface of the substrate carrier 100 face upward in the vertical direction, and then transferred to the substrate separation chamber. It is transported to R6.

Then, the substrate 200 is separated from the substrate carrier 100 in the substrate separation chamber R6. After that, the substrate carrier 100 is carried out to the outside of the film forming apparatus or transported to the substrate mounting chamber R1 again. Further, the substrate 200 peeled off from the substrate carrier 100 is taken out to the outside. Note that the present invention is not limited to the deposit-up configuration as shown in FIG. 1, but may also take a deposit-down configuration or a side deposit configuration. In this embodiment, after the substrate 200 is separated from the substrate carrier 100 in the substrate separation chamber R6, the substrate 200 is inspected for cracks. Details of the crack inspection method for the substrate 200 will be described later.

<Substrate lifting device>
The configuration of the substrate lifting device arranged in the substrate mounting chamber R1 will be described with reference to FIG. 2. The substrate lifting device includes a carrier delivery chamber 300, a lifting mechanism 400, and a clamp rotation mechanism 500 as a clamp driving means. Note that a plurality of lifting mechanisms 400 having a similar configuration may be arranged.

FIG. 2 is a diagram showing a schematic configuration of the carrier delivery chamber 300 and the substrate lifting device according to this embodiment. The carrier delivery chamber 300 includes an opening 311 through which the substrate carrier 100 passes, a carrier gate valve 312 that can open and close this opening 311, an opening 321 through which the substrate 200 passes, and a gate valve 312 for substrates that can open and close this opening 321. A gate valve 322 is provided. Note that the opening 311 and the carrier gate valve 312 are provided on the back side and the front side of the plane of FIG. 2, respectively. As a result, the substrate carrier 100 enters the carrier delivery chamber 300 from the back side of the page and is carried out to the outside of the carrier delivery chamber 300 toward the front side of the page. Although not shown, the opening 311 and the carrier gate valve 312 are also provided on the right side of the carrier delivery chamber 300.

Further, the carrier delivery chamber 300 is provided with a carrier support member 330 that supports the substrate carrier 100 when the substrate 200 is placed on the substrate carrier 100. This carrier support member 330 supports the outer periphery of the substrate carrier 100 so as not to interfere with the operation of support pins provided in the elevating mechanism. Alternatively, the carrier support member 330 may be provided with an opening in a region through which the support pin passes. Moreover, a conveyance roller for conveying the substrate carrier 100 may be provided in the substrate mounting chamber R1 (carrier delivery chamber 300). In this case, when the substrate 200 is placed on the substrate carrier 100, the transport roller can support the substrate carrier 100.

Further, the carrier delivery room 300 is provided with an imaging means 350 (photographing means). Although only one imaging means 350 is shown in each figure, generally a plurality of imaging means 350 are provided. The control unit C can perform positional adjustment (alignment) of the substrate carrier 100 and the substrate 200 by acquiring position information from an image of the substrate carrier 100 and the substrate 200 taken by the imaging means 350. A wide-angle imaging means 350 that can image the entire board may be provided, or a plurality of imaging means 350 that have a field of view that can image a part of the substrate 200 may be provided. When performing alignment based on the edge image of the substrate 200, the imaging means 350 is arranged so that the viewing angle includes at least part of the sides and ends of the substrate 200.

Furthermore, the imaging means 350 can also have a role as a determining means for determining the type of the substrate carrier 100 or the type of the substrate 200. For example, various marks are attached depending on the type of the substrate carrier 100, and the type of the substrate carrier 100 can be determined based on the marks imaged by the imaging means 350. The imaging means 350 used for alignment and the imaging means 350 as a discrimination means may be provided separately, or one of the plurality of imaging means 350 generally provided for alignment may also be used as a discrimination means. You can also do it.

In this embodiment, only the support pin 411 of the lifting mechanism 400 is inserted into the carrier delivery chamber 300, and only the push pin 511 of the clamp rotation mechanism 500 is inserted into the carrier delivery chamber 300. There is. Thereby, lubricant, abrasion powder, and the like can be prevented from entering the carrier delivery chamber 300. Note that the entire substrate lifting device may be disposed in the substrate placement chamber R1, or the carrier transfer chamber 300 may correspond to the substrate placement chamber R1. In the latter case, most of the structure of the lifting mechanism (other than the support pin 411) and most of the structure of the clamp rotation mechanism 500 (other than the push-in pin 511) are arranged outside the substrate mounting chamber R1. will be done.

The elevating mechanism 400 includes a plurality of support pins 411, a first plate 410 that supports the plurality of support pins 411, and a ball screw mechanism 420 as a first elevating means for elevating the first plate 410. The ball screw mechanism 420 includes a motor 421, a screw shaft 422 rotated by the motor 421, a nut portion 423 that moves up and down along the screw shaft 422 as the screw shaft 422 rotates, and a nut portion fixed to the nut portion 423. A column 424 that moves up and down together with 423 is provided. A plurality of balls are configured to circulate endlessly between the inner circumferential surface of the nut portion 423 and the outer circumferential surface of the screw shaft 422. The first plate 410 is supported by a column 424, and the support pin 411 moves up and down together with the first plate 410 as the screw shaft 422 rotates. The plurality of support pins 411 serving as support means for supporting the substrate 200 are configured to be able to abut against the substrate 200 from below in the vertical direction, and as the support pins 411 move up and down within the carrier delivery chamber 300, the substrate 200 is supported. 200 goes up and down.

In this embodiment, a ball screw mechanism is employed as the elevating means for elevating and lowering the plate, but other known techniques such as a rack and pinion system may also be employed as the elevating means.

The substrate lifting device also includes an alignment mechanism 430 as alignment means that adjusts the position of the substrate 200 with respect to the substrate carrier 100 by moving the plurality of support pins 411 in a direction perpendicular to the lifting direction of the substrate 200. There is. Note that in this embodiment, the direction in which the substrate 200 is raised and lowered is the vertical direction. Therefore, the alignment mechanism 430 is configured to be able to move the plurality of support pins 411 in the horizontal direction. Specifically, the alignment mechanism 430 has a first rail 431 extending in the left-right direction (hereinafter referred to as the "X-axis direction") in FIG. ”). Note that both the X-axis direction and the Y-axis direction are perpendicular to the vertical direction. The second rail 432 is configured to be able to reciprocate along the first rail 431.

The alignment mechanism 430 includes a pedestal 433 on which the elevating mechanism 400 is placed. This pedestal 433 is configured to be able to reciprocate along the second rail 432. The alignment mechanism 430 also includes a first shaft portion 434 fixed to the pedestal 433 and extending in the X-axis direction, and a second shaft portion 436 fixed to the pedestal 433 and extending in the Y-axis direction. Further, the alignment mechanism 430 includes a moving mechanism 435 that moves the first shaft portion 434 in the X-axis direction, and a moving mechanism (not shown) that moves the second shaft portion 436 in the Y-axis direction. For these moving mechanisms, various known techniques such as a ball screw mechanism or a rack and pinion type mechanism can be adopted.

With the alignment mechanism 430 configured as described above, by moving the elevating mechanism 400 together with the pedestal 433 in the X-axis direction and the Y-axis direction, the plurality of support pins 411 can be moved in the horizontal direction. Thereby, the substrate 200 placed on the plurality of support pins 411 can be moved and adjusted in the horizontal direction, and the position of the substrate 200 with respect to the substrate carrier 100 can be adjusted.

The clamp rotation mechanism 500 includes a plurality of push pins 511, a clamp plate 510 that supports the plurality of push pins 511, and a ball screw mechanism 520 that moves the clamp plate 510 up and down. The ball screw mechanism 520 includes a motor 521, a screw shaft 522 rotated by the motor 521, a nut portion 523 that moves up and down along the screw shaft 522 as the screw shaft 522 rotates, and a nut portion fixed to the nut portion 523. A support column 524 that moves up and down together with 523 is provided. A plurality of balls are configured to endlessly circulate between the inner circumferential surface of the nut portion 523 and the outer circumferential surface of the screw shaft 522. Further, the clamping plate 510 is supported by a support 524, and the push pin 511 moves up and down together with the clamping plate 510 as the screw shaft 522 rotates. Although a case is shown in which a ball screw mechanism is employed as the elevating means for elevating and lowering the clamp plate 510, other known techniques such as a rack and pinion system may also be employed as the elevating means.

<Operation of placing the board on the board carrier>
The operation of holding the substrate 200 on the substrate carrier 100 inside the carrier transfer chamber 300 using the substrate lifting device configured as described above will be described with reference to FIGS. 3 to 6. FIG. 3 is a diagram showing how the substrate carrier 100 is carried into the carrier delivery chamber 300. FIG. 4 is a diagram showing a state in which the substrate 200 is being carried into the carrier delivery chamber 300. FIG. 5 is a diagram showing how the substrate 200 is supported by the support pins 411. FIG. 6 is a diagram showing how the substrate 200 is held by the substrate carrier 100.

First, the opening 311 is opened by the operation of the carrier gate valve 312, and the substrate carrier 100 is carried into the carrier delivery chamber 300. The substrate carrier 100 carried into the carrier delivery chamber 300 is supported by a carrier support member 330 (see FIG. 3). Note that in order to make the configuration of each part easier to understand, illustration of the opening 311 and the carrier gate valve 312 is omitted in the drawings from FIG. 3 onwards.

The substrate carrier 100 is provided with a plurality of clamps 110 for holding the substrate 200 on the substrate carrier 100. The clamp 110 is rotatably provided on the substrate carrier 100 in a state where it is biased in a first rotational direction, which is a direction in which the substrate 200 held by the substrate carrier 100 is clamped. In addition, in FIG. 3, the clamp 110 on the left side is rotatably provided on the substrate carrier 100 in a state in which it is biased clockwise, and the clamp 110 on the right side is in a state in which it is biased in a counterclockwise direction. is rotatably provided on the substrate carrier 100.

After the substrate carrier 100 is supported by the carrier support member 330, the opening 321 is opened by the operation of the substrate gate valve 322, and the substrate 200 is carried into the carrier delivery chamber 300 (see FIG. 4). The substrate 200 is carried into the carrier delivery chamber 300 by a transfer robot. In addition, in FIG. 4, only a part of the hand part 250 which supports the board|substrate 200 in a transfer robot is shown. This hand portion 250 is generally provided in a comb-like shape so as not to interfere with the operation of the support pin 411 and the like.

Furthermore, when the substrate 200 is carried in, the plurality of support pins 411 are raised to a predetermined position together with the first plate 410 by the lifting mechanism 400. Note that the plurality of support pins 411 are provided so as to be able to pass through the plurality of through holes provided in the substrate carrier 100, and the tips of the plurality of support pins 411 are above the upper surface of the substrate carrier 100 and are carried in. It moves to a position below the bottom surface of the substrate 200.

Furthermore, the plurality of push pins 511 are raised together with the clamp plate 510 by the clamp rotation mechanism 500, and the tips of the respective push pins 511 push in the corresponding clamps 110, respectively. As a result, the clamp 110 rotates in the second rotation direction opposite to the first rotation direction, and the substrate 200 can be placed on the substrate carrier 100 from above (see FIG. 4).

Note that the order of carrying the substrate 200 into the carrier delivery chamber 300, lifting the first plate 410 by the elevating mechanism 400, and lifting the clamp plate 510 by the clamp rotation mechanism 500 is not particularly limited, and they may be performed simultaneously. I don't mind.

After the substrate 200 is placed on the tips of the plurality of support pins 411 and the hand section 250 of the transfer robot is retracted, the first plate 410 is lowered to a predetermined position by the lifting mechanism 400. This brings the substrate 200 sufficiently close to the substrate carrier 100 (see FIG. 5).

In this state, the alignment mechanism 430 adjusts the movement of the substrate 200 in the X-axis direction and the Y-axis direction, and adjusts the position of the substrate 200 with respect to the substrate carrier 100. Thereafter, the first plate 410 is further lowered by the lifting mechanism 400, and the tips of the plurality of support pins 411 move below the lower surface of the substrate carrier 100. During this process, the substrate 200 is placed on the substrate carrier 100. Note that the substrate carrier 100 is provided with a plurality of suction pads 130 (see FIG. 8), and the substrate 200 is in a state of being suctioned by the plurality of suction pads 130. Note that simply placing the substrate 200 on the substrate carrier 100 may result in insufficient suction by the suction pad 130, so by pressing the substrate 200 downward, the suction by the suction pad 130 can be made more reliable. It is also preferable to go through a process.

After the substrate 200 is placed on the substrate carrier 100, the clamp plate 510 is lowered by the clamp rotation mechanism 500. As a result, the push pin 511 separates from the clamp 110, and the clamp 110 rotates in the first rotation direction to sandwich the substrate 200 between the substrate carriers 100. Thereby, the substrate 200 is held by the substrate carrier 100 (see FIG. 6). The substrate 200 held as described above is taken out from the carrier delivery chamber 300 together with the substrate carrier 100 and transported to the reversing chamber R2.

<Substrate and substrate carrier>
Next, with reference to FIGS. 7 and 8, the substrate 200 and substrate carrier 100 used in the film forming apparatus according to this embodiment will be described.

FIG. 7(a) is a top view of the substrate 200. The substrate 200 has a substantially rectangular shape, and is cut in a post-process along cutting

lines

211 and 212 shown by dashed lines in FIG. When used for a display, the inner part surrounded by dotted lines in the figure becomes an image display section and corresponds to the display element area.

FIG. 7(b) is a top view of the substrate carrier 100. The substrate carrier 100 is provided with a plurality of clamps 110. The number and arrangement of the clamps 110 may be appropriately set depending on the size and weight of the substrate carrier and the substrate 200. The substrate carrier 100 has a plurality of through holes 121 provided in a predetermined central area (in the area surrounded by a broken line in FIG. 7(b)) and a plurality of through holes provided along the outer periphery of the substrate carrier 100. 122. When the substrate 200 is held by the substrate carrier 100, the plurality of through holes 121 are provided along the cutting

lines

211 and 212 in the substrate 200, and are located outside the area surrounded by the dotted line in FIG. 7(a). It is set up to be located. Further, when the substrate 200 is held by the substrate carrier 100, the plurality of through holes 122 are provided along the outer periphery of the substrate 200 and are located outside the area surrounded by the dotted line in FIG. 7(a). It is set up like this.

The plurality of through

holes

121 and 122 are used for the purpose of passing the support pin 411 through and for the purpose of attaching the suction pad 130. The arrangement of the through-holes through which the support pins 411 pass and the through-holes through which the suction pads 130 are attached can be set as appropriate, such as alternately providing them. The hole diameter of the through hole used for the support pin 411 to pass through and the hole diameter of the through hole used for the suction pad 130 to be attached may be set to be the same, or may be set to be different. Good too.

With reference to FIG. 8, the substrate carrier 100 will be described in more detail. FIG. 8 is a sectional view taken along line AA in FIG. 7(b). As shown in FIG. 8, the diameter of the through hole 121 through which the support pin 411 passes is set to be larger than the outer diameter of the support pin 411. This allows the support pin 411 to pass through the through hole, and also allows the support pin 411 to move horizontally with respect to the substrate carrier 100 during alignment. Note that a displacement prevention member 411a made of an elastic material such as rubber is provided at the tip of the support pin 411 to suppress displacement of the substrate 200.

Furthermore, the suction pad 130 is attached to the substrate carrier 100 while being inserted into the through hole for the suction pad 130. The suction pad 130 includes a metal pad body 131 having a flange portion 131a, an adhesive member 132 provided at the tip of the pad body 131 via an adhesive layer (not shown), and an adhesive member 132 for fixing the pad body 131 to a through hole. A fixing member 133 is provided. Note that the flange portion 131a and the fixing member 133 are integrated by a known method. Further, the fixing member 133 and the substrate carrier 100 can be fixed using known techniques such as bolts. As the material for the adhesive member 132, it is preferable to use fluororubber that does not contain siloxane bonds in order to suppress the generation of outgas that adversely affects the manufacturing process under vacuum. Furthermore, as for the material constituting the adhesive layer, it is desirable to use a known adhesive or double-sided tape that does not emit outgas components. This adhesive member 132 is configured to be adjustable in the vertical direction in the figure within a certain range using a spacer or the like (not shown) so that the amount of protrusion from the surface of the substrate carrier 100 can be controlled. The above amount of protrusion is less than the thickness of the substrate 200, although it depends on the size of the members constituting the suction pad 130 and the compression characteristics of the adhesive member 132. The hole diameter of the through hole for the suction pad 130 is larger than the outer diameter of the portion of the pad body 131 inserted into the through hole, and the pad body 131 is allowed to swing up and down to a certain extent in addition to vertical movement.

The clamp 110 is provided on the substrate carrier 100 so as to be rotatable around the shaft portion 110a. Further, the clamp 110 is biased in the first rotation direction by a spring 110b serving as a biasing member. As described above, when pushed in by the push-in pin 511, the clamp 110 rotates in the second rotational direction against the biasing force of the spring 110b, and when the push-in pin 511 is released, it rotates in the first rotational direction due to the biasing force of the spring 110b. do. In addition, in FIG. 8, the state of the clamp 110 rotated in the second rotation direction by the push pin 511 is shown by a solid line, and the state of the clamp 110 when the push pin 511 is separated and rotated in the first rotation direction is shown by a dotted line. . The clamp 110 rotates around a shaft portion 110a along the film-forming surface of the substrate 200. Therefore, when the clamp 110 is pushed in by the push pin 511, the clamp 110 can be retracted from above the substrate holding area of the substrate carrier 100. In this way, a path for placing the substrate 200 on the substrate carrier 100 can be secured with a simple configuration.

<Substrate peeling operation from substrate carrier>
The substrate lifting device configured as described above is also provided in the substrate peeling room R6, and the substrate 200 can be peeled from the substrate carrier 100 by performing the procedure for placing the substrate 200 on the substrate carrier 100 in the reverse order. can. The operation of peeling the substrate 200 from the substrate carrier 100 will be described below with reference to FIG. FIG. 9A is a diagram showing how the substrate 200 is held by the substrate carrier 100 in the substrate separation chamber R6. FIG. 9(b) is a diagram showing a state in which the push pin 511 is raised and the clamp 110 is rotated in the second rotation direction. FIG. 9C is a diagram showing how the support pins 411 are raised and the substrate 200 is peeled off from the substrate carrier 100.

First, the substrate carrier 100 holding the substrate 200 is carried into the carrier delivery chamber 300 with the first plate 410 and the clamping plate 510 waiting below, and these are supported by the carrier support member 330 (see FIG. 9). a)).

Thereafter, the clamp rotation mechanism 500 raises the plurality of push pins 511 together with the clamp plate 510, and the tip of each push pin 511 pushes the corresponding clamp 110. As a result, the clamp 110 rotates in the second rotation direction opposite to the first rotation direction, and becomes in a state where the substrate 200 can be separated from the substrate carrier 100 (see FIG. 9(b)). Then, the plurality of support pins 411 are raised together with the first plate 410 to a predetermined position by the lifting mechanism 400. In this process, the substrate 200 is pushed in by the plurality of support pins 411, peeled off from the substrate carrier 100, and raised to a predetermined position (see FIG. 9(c)).

Thereafter, the substrate 200 is carried out from the carrier delivery chamber 300 by the transfer robot. Further, after the plurality of support pins 411 are lowered together with the first plate 410, the substrate carrier 100 is carried out from the carrier delivery chamber 300 and is carried out to the outside of the film forming apparatus, or transported again to the substrate mounting chamber R1. be done.

<Crack inspection of board>
As described above, a peeling operation for peeling the substrate 200 from the substrate carrier 100 is performed in the substrate peeling chamber R6. However, since the substrate 200 is bonded to the substrate carrier 100 by the suction pad 130, cracks may occur in the substrate 200 during the peeling process. Even if a crack occurs in the substrate 200 in a vacuum device such as the substrate separation chamber R6, the operator cannot visually detect it, and if broken pieces remain in the vacuum device, it may lead to equipment failure. . Therefore, the film forming apparatus according to this embodiment is configured to perform a crack inspection to detect the presence or absence of cracks in the substrate 200 in the substrate peeling chamber R6 after the peeling operation. In the crack inspection, the control unit C calculates the distance between the reference points of the substrate 200 based on the photographic result of the imaging means 350, and determines whether a crack has occurred in the substrate 200 based on the distance. Hereinafter, the details of the substrate inspection apparatus and inspection method in the substrate separation chamber R6 according to this embodiment will be explained.

The crack inspection is started with the substrate 200 supported by the support pins 411 (the state shown in FIG. 9(c)) after the support pins 411 are lifted and the substrate 200 is peeled off from the substrate carrier 100. In the crack inspection, first, an image is taken by the imaging means 350 from the film-forming surface side of the substrate 200 so as to include the edge portions near the four corners of the substrate 200. Specifically, the imaging means 350 is configured so that four images are obtained by the imaging means 350 and the four corners of the substrate 200 are included in the viewing angle of the imaging means 350 in each image. In this embodiment, the imaging means 350 includes four cameras, each of which images each of the four corners of the substrate 200. That is, although not shown, cameras are provided at positions corresponding to each of the four corners of the board 200. Note that the board inspection apparatus only needs to be provided with imaging means 350 that can take images of at least the peripheral areas of each of the four corners of the board 200, and may be provided with a wide-angle imaging means 350 that can take images of the entire board. .

In this embodiment, as the imaging means 350, an optical imaging device is used in which the control unit C can control the amount of illumination light from the light source, the shutter speed, the gain value, etc. The control unit C can adjust the obtained image by controlling at least one of the light amount, shutter speed, and gain value. Then, the control unit C of this embodiment analyzes the image taken by the imaging means 350 and recognizes the sides forming the surface of the substrate 200 as edges. Therefore, even if, for example, the board 200 is cracked and supported at an angle by the support pins 411, and the vertical position of the board 200 changes compared to when no crack has occurred, it is possible to adjust each parameter. It is possible to obtain an image with recognizable edges.

FIG. 10(a) is a diagram showing the positional relationship between the viewing angles of the substrate 200 and the imaging means 350, and four viewing angles 351 to 354 are indicated by two-dot chain lines. FIG. 10B is a diagram showing an image taken by the imaging means 350, and shows the inside of the viewing angle 351. FIG. 10(c) is a diagram showing an image taken by the imaging means 350, and shows the inside of the viewing angle 352. At the time of photographing the substrate 200, since the substrate 200 is supported by the support pins 411 above the substrate carrier 100 in the vertical direction, a portion of the substrate carrier 100 is seen from the imaging means 350 disposed above the substrate separation chamber R6. The substrate 200 is in an overlapping state.

As described above, in this embodiment, the imaging means 350 performs imaging so that the four corners of the substantially rectangular substrate 200 are included in each captured image. The range of the viewing angle 351 that includes the first corner of the substrate 200 in the imaging range includes the edge 210A of the substrate 200 and the edge 210C orthogonal to the edge 210A. Further, the substrate 200 of this embodiment has chamfered corners and has a corner edge 210B. Note that a carrier mark may be formed on a part of the substrate carrier 100 for alignment.

The control unit C can recognize the edges of the substrate 200 from the image taken by the imaging means 350 and obtain the coordinates of the intersections of the edges. At the viewing angle 351, the coordinates of the intersection 220A of the edge 210A and the edge 210C are obtained, and positional information around the first corner of the substrate 200 is obtained.

Similarly, the range of the viewing angle 352 for imaging a second corner diagonally to the first corner of the substrate 200 includes an edge 210D parallel to the edge 210A of the substrate 200 and an edge perpendicular to the edge 210D. 210F and a corner edge 210E. Then, the control unit C obtains position information of the intersection 220B as the intersection coordinates of the edge 210A and the edge 210C. When the positional information of the intersection 220A and the intersection 220B located at diagonal positions is obtained from the first image including the intersection 220A and the second image including the intersection 220B, the control unit C calculates the distance L1 between the intersection 220A and the intersection 220B. Calculate.

In addition, in this embodiment, the viewing angle 353 for imaging the third corner and the viewing angle 354 for imaging the fourth corner, and the distance L2 between the intersections of edges included in each are also calculated by the control unit C. Ru. That is, in this embodiment, the imaging means 350 and the control unit C acquire positional information of the intersection of two sides as a reference point provided at the position closest to each of the first corner to the fourth corner, and We can obtain two diagonal distances.

FIG. 11(a) is a diagram showing the top and front sides of the substrate 200 with no cracks. FIG. 11(b) is a diagram showing the top and front sides of the substrate 200 where cracks have occurred. If there is a crack in the board 200, the board 200 may be tilted and supported by the support pins 411, or the position may shift due to the impact when the board 200 is cracked. There is a difference in distance L1b when there is a difference. Therefore, in this embodiment, the distances L1 and L2 between the reference points located at diagonal positions of the substrate 200 are calculated, and if either of the distances L1 or L2 deviates from a predetermined theoretical value range, , the control unit C as a determining means determines that the substrate 200 has a crack. Note that in this embodiment, two distances between reference points on the board are acquired and used for detecting cracks in the board, but it is also possible to use only one piece of distance information for detecting cracks in the board. A configuration may also be adopted in which distances other than diagonal distances are also acquired and more distance information is used.

<Crack inspection processing flow>
Referring to FIG. 12, a processing flow for inspecting cracks in the substrate 200 of this embodiment will be described. When the film formation process is completed and the mask M is removed from the substrate 200, the substrate 200 and the substrate carrier 100 are carried into the substrate separation chamber R6. At this time, the board 200 is carried in such that the edge thereof is roughly included in the viewing angle 351 to viewing angle 354 of the imaging means 350. Then, when the substrate 200 is separated from the substrate carrier 100 and is supported only by the support pins 411, a crack inspection of the substrate 200 is started (S100).

First, in step S101, the imaging means 350 images four locations around the corners of the substrate 200. The control unit C stores the photographed image in a memory and performs image processing such as filter processing on the photographed image to create an edge image.

In step S102, the control unit C determines whether an edge can be detected from the edge image. In other words, the control unit C of this embodiment also functions as a determination unit that determines whether a problem occurs in photographing an edge image. The detection method is arbitrary; for example, at the viewing angle 351, it may be determined whether line segments corresponding to the

edges

210A, 210B, and 210C can be extracted from the edge image. For example, the determination may be made by comparing the acquired edge image with an image pattern of an assumed edge image. Here, if the edge cannot be detected, the process proceeds to step S103, the user is notified of the error occurrence and the error type, and the crack inspection ends (S108).

If an edge is detected in step S102, the process proceeds to step S104, and the control unit C acquires the intersection coordinates from the edge. In this embodiment, the intersection point 220A (first reference point) between edge 210A and edge 210C included in viewing angle 351, and the intersection point 220B (second reference point) between edge 210D and edge 210F included in viewing angle 352. Coordinates are acquired as location information. Similarly, the coordinates of the intersection of edges included in viewing angle 353 (third reference point) and the intersection of edges included in viewing angle 354 (fourth reference point) are also acquired as position information.

Then, the process proceeds to step S105, where the control unit C calculates a diagonal distance as the distance between intersection points located at diagonal positions on the substrate 200. In this embodiment, the distance between the intersection point 220A in the viewing angle 351 and the intersection point 220B in the viewing angle 352, and the distance between the intersection point in the viewing angle 353 and the intersection point in the viewing angle 354 are the diagonal distances. Calculated.

In step S106, the control unit C checks whether the calculated diagonal distance is within the theoretical value range and determines whether the substrate 200 is cracked. In this embodiment, the theoretical value range is set to the design value ±3 mm in consideration of manufacturing errors, measurement errors, and the like. Note that the theoretical value range is not limited to this value, and can be determined as appropriate depending on the configuration of the substrate and the device. If the diagonal distance is within the theoretical value range, the control unit C determines that there is no crack in the substrate 200, and after the crack inspection is completed (S108), the substrate 200 and the substrate carrier 100 are automatically transferred to the substrate separation chamber. It is carried out from R6.

On the other hand, if it is confirmed in step S106 that the diagonal distance is not within the theoretical value range, the control unit C determines that a crack has occurred in the board 200, and in step S107, an alarm indicates that a crack has been detected. The user is notified and the crack inspection ends (S108). When the user learns that the controller C has determined that the substrate 200 is cracked due to the alarm, the user manually removes the substrate 200 from the substrate separation chamber R6. Note that the method of notifying the user is not limited to an alarm, and may be a method using other notification means such as notification on a display screen.

As described above, according to this embodiment, a part of the board can be photographed while the board is stationary, and cracks in the board can be detected within the vacuum apparatus from the photographed results. As a result, there is no need for highly accurate conveyance means as in the prior art, and equipment costs can be suppressed. In addition, since there is no need to image the entire board, even if the board is large, there is no need to increase the number of imaging means to expand the imaging range, and the simple configuration reduces equipment costs such as imaging means. It is possible to inspect the board for cracks while suppressing it.

In recent years, as substrates have become thinner and larger, they are more likely to crack. Furthermore, if a configuration is adopted in which the entire area of the board is photographed in order to detect cracks in the board, a photographing means capable of photographing a wider area is required, which tends to increase the equipment cost. However, according to the present invention, there is no need to make the photographing range excessively wide regardless of the size of the substrate, so the cost of equipment such as photographing means can be suppressed. Furthermore, since it is not necessary to project light onto the entire board to sharpen the edges, the cost of equipment for illumination light for image capture can also be reduced.

Note that the configuration of the present invention is not limited to the above configuration, and various changes can be made without losing the sameness as the invention embodied in the above embodiments. For example, in the above embodiment, a crack in the board was detected based on the diagonal distance of the board, but instead of the diagonal distance, it may be determined whether a crack has occurred in the board based on another distance between intersection points. It's okay. Specifically, we check whether the distances between the four intersection points along the four sides of a roughly rectangular board are within the theoretical value range, and if any of them is outside the theoretical distance range, cracks have occurred in the board. It may be configured to determine that. In addition, in the above embodiment, the intersection of the edges was used as the reference point of the board, but it is also possible to provide a board mark in a part other than the image display area on the board and use other things such as the board mark as the reference point. Also good.

Further, in the above embodiment, the structure is such that the crack inspection of the substrate is performed in the substrate peeling chamber, but a structure may be adopted in which the crack test of the substrate is performed in a chamber other than the substrate peeling chamber. For example, in the board loading room, the board inspection device according to the present invention may be used to inspect the board for cracks before the board is held on the board carrier, and the device and order for testing the board for cracks may be as described above. This is not limited to examples.

<Film forming chamber>
With reference to FIG. 13, the film forming process in the film forming chamber R3 will be described in more detail. An evaporation source 600 as a film forming source is provided in the film forming chamber R3. The substrate 200 held by the substrate carrier 100 is positioned and supported within the film forming chamber R3 so that it faces downward. Further, a mask M is also arranged below the substrate 200 in a state in which it is positioned with respect to the substrate 200. The mask M is provided with an opening at a position corresponding to a position where a thin film is to be formed on the substrate 200. Thereby, film formation is performed on the substrate 200 held by the substrate carrier 100 via the mask M.

In this example, film formation (vapor deposition) is performed by vacuum evaporation. Specifically, the film-forming material is evaporated or sublimated from the evaporation source 600, and the film-forming material is vapor-deposited onto the substrate 200 to form a thin film on the substrate 200. Since the evaporation source 600 is a known technique, detailed explanation thereof will be omitted. For example, the evaporation source 600 can be configured with a container such as a crucible that contains a film forming material, a heating device that heats the container, and the like. Note that the film forming source is not limited to the evaporation source 600, and may be a sputtering cathode for forming a film by sputtering.

<Method for manufacturing electronic devices>
Next, an example of a method for manufacturing an electronic device using the film forming apparatus according to this embodiment will be described. Hereinafter, the configuration of an organic EL display device will be shown as an example of an electronic device, and a method for manufacturing the organic EL display device will be illustrated.

First, the organic EL display device to be manufactured will be explained. FIG. 14(a) is an overall view of the organic EL display device 700, and FIG. 14(b) is a cross-sectional view of one pixel.

As shown in FIG. 14(a), in the display area 701 of the organic EL display device 700, a plurality of pixels 702 each including a plurality of light emitting elements are arranged in a matrix. Although details will be explained later, each light emitting element has a structure including an organic layer sandwiched between a pair of electrodes. Note that the pixel herein refers to the smallest unit that can display a desired color in the display area 701. In the case of the organic EL display device according to this embodiment, a pixel 702 is configured by a combination of a first light emitting element 702R, a second light emitting element 702G, and a third light emitting element 702B, which emit light different from each other. The pixel 702 is often composed of a combination of a red light-emitting element, a green light-emitting element, and a blue light-emitting element, but it may also be a combination of a yellow light-emitting element, a cyan light-emitting element, and a white light-emitting element. There are no restrictions.

FIG. 14(b) is a schematic partial cross-sectional view taken along line BB in FIG. 14(a). The pixel 702 consists of a plurality of light emitting elements, and each light emitting element has a first electrode (anode) 704, a hole transport layer 705, one of the

light emitting layers

706R, 706G, and 706B, and an electron transport layer on a substrate 703. It has a layer 707 and a second electrode (cathode) 708. Among these, the hole transport layer 705, the

light emitting layers

706R, 706G, and 706B, and the electron transport layer 707 correspond to organic layers. Further, in this embodiment, the light-emitting layer 706R is an organic EL layer that emits red, the light-emitting layer 706G is an organic EL layer that emits green, and the light-emitting layer 706B is an organic EL layer that emits blue. The light-emitting

layers

706R, 706G, and 706B are formed in patterns corresponding to light-emitting elements (sometimes referred to as organic EL elements) that emit red, green, and blue, respectively.

Furthermore, the first electrode 704 is formed separately for each light emitting element. The hole transport layer 705, the electron transport layer 707, and the second electrode 708 may be formed in common for the plurality of

light emitting elements

702R, 702G, and 702B, or may be formed for each light emitting element. Note that an insulating layer 709 is provided between the first electrodes 704 in order to prevent the first electrodes 704 and the second electrodes 708 from shorting due to foreign matter. Furthermore, since the organic EL layer deteriorates due to moisture and oxygen, a protective layer 710 is provided to protect the organic EL element from moisture and oxygen.

Although the hole transport layer 705 and electron transport layer 707 are shown as one layer in FIG. 14(b), depending on the structure of the organic EL display element, they may be formed as multiple layers including a hole blocking layer and an electron blocking layer. may be formed. Further, between the first electrode 704 and the hole transport layer 705, a positive hole having an energy band structure that allows holes to be smoothly injected from the first electrode 704 to the hole transport layer 705 is provided. A hole injection layer can also be formed. Similarly, an electron injection layer can also be formed between the second electrode 708 and the electron transport layer 707.

Next, an example of a method for manufacturing an organic EL display device will be specifically described.

First, a substrate (mother glass) 703 on which a circuit (not shown) for driving an organic EL display device and a first electrode 704 are formed is prepared.

Acrylic resin is formed by spin coating on the substrate 703 on which the first electrode 704 is formed, and the acrylic resin is patterned by lithography so that an opening is formed in the part where the first electrode 704 is formed, and an insulating layer is formed. Form 709. This opening corresponds to the light emitting region where the light emitting element actually emits light.

A substrate 703 with a patterned insulating layer 709 is placed on a substrate carrier on which an adhesive member is arranged. The substrate 703 is held by the adhesive member. After being carried into a first organic material film forming apparatus and inverted, a hole transport layer 705 is formed as a common layer on the first electrode 704 in the display area. The hole transport layer 705 is formed by vacuum deposition. In reality, the hole transport layer 705 is formed to have a larger size than the display area 701, so a high-definition mask is not required.

Next, the substrate 703 on which up to the hole transport layer 705 has been formed is carried into a second organic material film forming apparatus. The substrate and the mask are aligned, the substrate is placed on the mask, and a light-emitting layer 706R that emits red light is formed on a portion of the substrate 703 where an element that emits red light is to be arranged.

Similar to the formation of the light-emitting layer 706R, a light-emitting layer 706G that emits green light is formed by a third organic material film-forming device, and a light-emitting layer 706B that emits blue light is further formed by a fourth organic material film-forming device. . After the formation of the

light emitting layers

706R, 706G, and 706B is completed, the electron transport layer 707 is formed over the entire display area 701 using a fifth film formation apparatus. The electron transport layer 707 is formed as a layer common to the three color

light emitting layers

706R, 706G, and 706B.

A second electrode 708 is formed by moving the substrate on which the electron transport layer 707 has been formed using a metal vapor deposition material film forming apparatus.

Thereafter, the film is moved to a plasma CVD apparatus and a protective layer 710 is formed, thereby completing the film forming process on the substrate 703. After inversion, the adhesive member is peeled off from the substrate 703 to separate the substrate 703 from the substrate carrier. Thereafter, the organic EL display device 700 is completed through cutting.

If the substrate 703 on which the insulating layer 709 has been patterned is exposed to an atmosphere containing moisture or oxygen from the time the substrate 703 on which the insulating layer 709 has been patterned is carried into the film forming apparatus until the film forming of the protective layer 710 is completed, the light emitting layer made of the organic EL material may There is a risk of deterioration due to moisture and oxygen. Therefore, in this embodiment, substrates are carried in and out between film forming apparatuses under a vacuum atmosphere or an inert gas atmosphere.

200... Board, 220A... Intersection (first reference point), 220B... Intersection (second reference point), 350... Imaging means (photographing means), 411... Support pin (support means), C... Control unit (judgment) means), L1...distance

Claims

support means for supporting the substrate;
Photographing means for photographing the substrate supported by the supporting means;
determining means for determining whether a crack has occurred in the substrate based on the photographic result of the photographing means;
Equipped with
The board characterized in that the determining means determines whether a crack has occurred in the board based on a distance between a first reference point and a second reference point calculated based on the photographing result. Inspection equipment.
The board inspection apparatus according to claim 1, wherein the determining means determines that a crack has occurred in the board when the distance is outside a preset theoretical value range.
2. The determining means acquires positional information of the first reference point and the second reference point from the photographic result, and calculates the distance based on the positional information. board inspection equipment.
The substrate is approximately rectangular,
The first reference point is provided at a position closest to a first corner of the four corners of the surface of the substrate,
2. The board inspection apparatus according to claim 1, wherein the second reference point is provided at a position closest to a second corner different from the first corner among the four corners.
5. The board inspection apparatus according to claim 4, wherein the first corner is located diagonally to the second corner.
The photographing result includes a first image including the first corner and the first reference point, and a second image including the second corner and the second reference point. The board inspection apparatus according to claim 4.
The first reference point is an intersection of two sides forming the first corner,
5. The board inspection apparatus according to claim 4, wherein the second reference point is an intersection of two sides forming the second corner.
The board inspection apparatus according to claim 1, wherein the first reference point and the second reference point are marks provided on the board.
The substrate has a third reference point provided at a position closest to the third corner among the four corners, and a fourth reference point located diagonally to the third corner among the four corners. a fourth reference point provided at a position closest to the corner of the
The determining means determines whether there is a crack in the substrate based on the distance between the first reference point and the second reference point and the distance between the third reference point and the fourth reference point. 6. The board inspection apparatus according to claim 5, further comprising a step of determining whether or not a problem has occurred.
2. The board inspection apparatus according to claim 1, wherein the support means is a plurality of pins that contact the board from below in the vertical direction.
The board inspection apparatus according to claim 1, further comprising notification means for notifying an operator when the determination means determines that a crack has occurred in the board.
The board inspection apparatus according to claim 11, wherein the notification means is an alarm.
a vacuum container in which the supporting means and the photographing means are provided;
Conveying means for conveying the substrate into and out of the vacuum container;
The board inspection apparatus according to any one of claims 1 to 12, further comprising:
a deposition source that forms a thin film on the substrate held by a substrate carrier;
A board inspection device according to any one of claims 1 to 12,
A film forming apparatus comprising:
A board inspection method using a board inspection apparatus comprising a support means for supporting a board, and a photographing means for photographing the board supported by the support means, the method comprising:
performing a determination step of determining whether a crack has occurred in the substrate based on the photographing result of the photographing means;
The substrate characterized in that the determination step includes determining whether a crack has occurred in the substrate based on a distance between a first reference point and a second reference point calculated based on the photographic result. Inspection method.
A film forming method comprising performing a film forming step of forming a thin film on the substrate inspected by the substrate inspection method according to claim 15 and held by a substrate carrier.