WO2023207972A1 - Package structure, electronic device, and packaging method - Google Patents

Package structure, electronic device, and packaging method Download PDF

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Publication number
WO2023207972A1
WO2023207972A1 PCT/CN2023/090576 CN2023090576W WO2023207972A1 WO 2023207972 A1 WO2023207972 A1 WO 2023207972A1 CN 2023090576 W CN2023090576 W CN 2023090576W WO 2023207972 A1 WO2023207972 A1 WO 2023207972A1
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WO
WIPO (PCT)
Prior art keywords
packaging structure
carrier board
packages
packaging
package
Prior art date
Application number
PCT/CN2023/090576
Other languages
French (fr)
Chinese (zh)
Inventor
杨望来
Original Assignee
维沃移动通信有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 维沃移动通信有限公司 filed Critical 维沃移动通信有限公司
Publication of WO2023207972A1 publication Critical patent/WO2023207972A1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/49Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions wire-like arrangements or pins or rods
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/60Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32135Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/32145Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48145Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19107Disposition of discrete passive components off-chip wires

Definitions

  • the present application belongs to the technical field of electronic equipment, and specifically relates to a packaging structure, electronic equipment and packaging method.
  • This application aims to provide a packaging structure, electronic equipment and packaging method, which at least solves the problem of limited number of chips and single function in the package.
  • an electronic device including: a housing; a packaging structure
  • the packaging structure is the packaging structure as described above, and the packaging structure is arranged in the housing.
  • an embodiment of the present application proposes a packaging method, which includes: stacking multiple packages on the first surface of the carrier board; electrically connecting each of the packages to the first surface of the carrier board through wires ; Package the carrier board, the package body and the wires into a whole.
  • the packaging structure of this application realizes the integration of multiple packages into a whole by stacking multiple packages in sequence, using wires to electrically connect each package with the carrier board, and then packaging them into a whole, so that the packaging structure can be integrated
  • Multiple chips have multiple functions, such as data storage and calculation, as well as video transcoding, audio transcoding, etc.
  • FIG. 2 is the second schematic diagram of the fan-out packaging structure provided by this application.
  • Figure 4 is the second structural schematic diagram of the package shown in Figure 1;
  • Figure 5 is a third structural schematic diagram of the package shown in Figure 1;
  • Figure 6 is the fourth structural schematic diagram of the package shown in Figure 1;
  • 100 Carrier board; 200: Package; 201: Substrate; 202: Chip; 203: Second packaging layer; 204: Conductor; 205: Insulating layer; 206: Rewiring layer; 210: First slot; 220: Second through groove; 300: wire; 400: first packaging layer; 2041: first bonding wire; 2042: second bonding wire; 2043: metal bump.
  • first and second features in the description and claims of this application may include one or more of these features, either explicitly or implicitly.
  • plural means two or more.
  • and/or in the description and claims indicates at least one of the connected objects, and the character “/” generally indicates that the related objects are in an “or” relationship.
  • the packaging structure includes: a carrier board 100 , a plurality of packaging bodies 200 , wires 300 and a first packaging layer 400 .
  • a plurality of packages 200 are stacked on the first surface of the carrier board 100.
  • Each package 200 is electrically connected to the first surface of the carrier board 100 through wires 300.
  • the first package layer 400 covers the carrier board 100 and a plurality of Package 200.
  • the carrier board 100 is a conductor.
  • the first package body 200 is first placed on the carrier board 100, and then the second package body 200 is stacked on the package body 200.
  • the second package body 200 can be connected with the first package body 200.
  • the packages 200 are arranged in alignment or offset.
  • Each package 200 is electrically connected to the first surface of the carrier board 100 through wires 300 .
  • multiple packages 200 can be stacked in sequence. After each package body 200 is electrically connected to the first surface of the carrier board 100, the carrier board 100, the plurality of packages 200 and the wires 300 can be packaged into a whole through the first packaging layer 400, and the package body 200 can be and wires 300 are located within the first packaging layer 400 .
  • each package is a small package structure, which has a substrate 201. Multiple grooves are opened on the substrate 201, and multiple chips are stacked in each groove. 202.
  • a conductor 204 is provided on each chip 202, and the packaging material is filled in the groove to form a second packaging layer 203.
  • An insulating layer 205 is provided on the second packaging layer 203, and a rewiring layer 206 is provided in the insulating layer 205.
  • the chip 202 is electrically connected to the rewiring layer 206 through the conductor 204 to form a small package structure.
  • the bottom of the groove is ground away after the package 200 is formed, so that the groove becomes the first through groove 210.
  • the first encapsulation layer 400 may be glue or plastic sealing material.
  • the packaging structure of this application realizes the integration of multiple packages into a whole by stacking multiple packages in sequence, using wires to electrically connect each package with the carrier board, and then packaging them into a whole, so that the packaging structure can be integrated
  • Multiple chips have multiple functions, such as data storage and calculation, as well as video transcoding, audio transcoding, etc.
  • multiple packages 200 are stacked and offset in sequence.
  • the second package 200 can be offset relative to the first package 200 along the length direction or width direction of the first package 200, so that part of the surface of the first package 200 is exposed.
  • the exposed surface is used for disposing wires 300 , and each package 200 is electrically connected to the first surface of the carrier board 100 through the wires 300 .
  • the number of wires 300 is multiple, and the first surface of the carrier board 100 and the multiple packages 200 are connected in series through the multiple wires 300 .
  • the first ends of the plurality of wires 300 are electrically connected to the first surface of the carrier board 100
  • the second ends of the plurality of wires 300 are electrically connected to the plurality of packages 200 one-to-one. connect.
  • the fan-out package structure also includes a plurality of solder pads 501 and a plurality of solder balls 502 .
  • the second surface of the carrier board 100 is provided with a plurality of solder pads 501, and each solder pad 501 is provided with a solder ball 502, wherein the second surface is opposite to the first surface.
  • each package 200 includes: a substrate 201 , a chip 202 , a second packaging layer 203 , a conductor, an insulating layer 205 and a rewiring layer 206 .
  • the substrate 201 is provided with at least one first through groove 210, and at least one chip 202 is disposed in the at least one first through groove 210.
  • the conductor is electrically connected to the chip 202 .
  • the second packaging layer 203 covers the conductor and at least one chip 202,
  • the insulating layer 205 is provided on the second packaging layer 203.
  • a plurality of second through-slots are provided on the insulating layer 205.
  • a rewiring layer 206 is provided in each second through-slot, wherein the rewiring layer 206 is electrically connected to the conductor 300. connect.
  • each package 200 includes the following steps:
  • Step 101 Create multiple grooves on the silicon substrate, place the non-functional surface of the chip 202 toward the bottom of the grooves, and use adhesive glue to fix the non-functional surface of the chip 202 to the bottom of the grooves.
  • Step 102 A second chip 202 is stacked on the chip 202.
  • the second chip 202 and the first chip 202 form a certain offset in the length direction or width direction, and the non-functional surface of the second chip 202 faces
  • the first chip 202 is installed, and the two chips 202 are fixed with adhesive glue. In this way, multiple chips 202 can be stacked.
  • Step 103 Set a conductor 204 on each chip 202 and lead out the input/output interface of each chip 202.
  • Step 104 Fill the grooves of the silicon substrate with glue or plastic sealing material to form the second encapsulation layer 203. After solidification, grind the thickness of the silicon substrate to expose the conductor.
  • Step 105 Set an insulating layer 205 on the surface of the second encapsulation layer 203, open a plurality of second through-slots 220 on the insulating layer 205, set a rewiring layer 206 in each second through-slot 220, and conduct the conductor 204 and The rewiring layer 206 is connected to realize the electrical connection and relocation of each input/output interface.
  • Step 106 Process the bottom of the groove of the silicon substrate to make the groove become the first through groove 210, thereby reducing the thickness of the package 200. Further, the wire 300 is electrically connected to a rewiring layer 206 .
  • a groove is created inside the silicon substrate, and after the chip and conductor are packaged, the bottom of the groove of the silicon substrate is processed away, thereby thinning the thickness of the entire package and effectively reducing the package thickness.
  • Using a silicon substrate can enhance the strength of the package, and the thermal expansion coefficients of the silicon substrate and the internal chip are similar, which can further reduce warpage during packaging.
  • the multiple chips 202 are sequentially offset and stacked in at least one first through groove 210 .
  • the conductor 204 includes a plurality of conductive elements, a plurality of One end of the conductive member is connected to the plurality of chips 202 in a one-to-one correspondence, and the other end of the plurality of conductive members is connected to the rewiring layer 206 .
  • the plurality of conductive members include at least one of a first bonding wire 2041 and a metal bump 2043 .
  • multiple first bonding wires 2041 can be provided on the uppermost chip 202, and one first bonding wire 2041 can be provided on the exposed surfaces of the other layers of chips 202.
  • Each first bonding wire 2041 The first end is electrically connected to the chip 202, and the second end is electrically connected to a rewiring layer 206.
  • metal bumps 2043 may also be provided on the chip 202 adjacent to the insulating layer 205.
  • the metal bumps 2043 may be provided separately or may be integrally formed with the chip 202. In this embodiment, to facilitate installation, the chip 202 and the metal bumps 2043 are integrally formed.
  • the first bonding wire 2041 is a vertical bonding wire.
  • the wire arc length is shortened, the electrical connection path is relatively short, and the thickness of the package can be further reduced.
  • the electrical connection path of the first bonding wire or metal bump is shorter, which can improve product performance.
  • the number of chips 202 is multiple.
  • the multiple chips 202 are sequentially offset and stacked in at least one first through slot 210 .
  • the conductor 204 includes a first conductor. and a second conductive member, multiple chips 202 are connected in series through the first conductive member, and a chip 202 close to the rewiring layer 206 is electrically connected to the rewiring layer 206 through the second conductive member.
  • the first conductive component is the second bonding wire 2042
  • the second conductive component is the first bonding wire 2041 or the metal bump 2043.
  • the chip 202 adjacent to the insulating layer 205 is electrically connected to the rewiring layer 206 through the first bonding wire 2041 or the metal bump 2043, and the chip 202 far away from the insulating layer 205 is electrically connected to the rewiring layer 206 through the second bonding wire 2041 or the metal bump 2043.
  • the wire 2042 is electrically connected to the upper chip 202.
  • the second bonding wire 2042 is a curved bonding wire.
  • first bonding wires or metal bumps are provided on the chip adjacent to the insulating layer, and the chip far away from the insulating layer is connected to the chip located on it through the second bonding wire. This shortens the arc length and the electrical connection path is relatively opposite. Shorter, the thickness of the package can be further reduced. At the same time, the electrical connection path of the first bonding wire or metal bump is shorter, which can improve product performance.
  • a plurality of first through grooves 210 can be opened on the silicon substrate, and the rewiring layer 206 corresponding to each first through groove 210 is integrally provided.
  • the arrangement of the conductors in each first through slot 210 may be the same or different.
  • the conductors 204 in each first through groove 210 are first bonding wires 2041; or the conductors 204 in one first through groove 210 are first bonding wires 2041, and the conductors 204 in another first through groove 210 are first bonding wires 2041.
  • the conductor 204 is a metal bump 2043 and a first bonding wire 2041; or as shown in FIG. 6, the conductor 204 in one first through groove 210 is a metal bump 2043 and the first bonding wire 2041, and the other conductor 204 is a metal bump 2043 and a first bonding wire 2041.
  • the conductor 204 in a through groove 210 is a first bonding wire 2041 and a second bonding wire 2042.
  • an insulating layer 205 can be provided on all the second encapsulation layers 203.
  • a second through groove 220 is opened in the insulating layer 205, and the rewiring layer 206 is disposed in the second through groove 220 , and the conductor 204 in each first through groove 210 is electrically connected to the rewiring layer 206 to reduce the manufacturing process of the package 200 .
  • each chip can be used according to the specific situation.
  • a plurality of chips 202 are disposed in the first through groove 210, and a plurality of first through grooves 210 are opened on the silicon substrate.
  • each chip 202 is away from the bottom of the first through groove 210 .
  • This application also provides an electronic device, including a casing and a packaging structure, and the packaging structure is arranged in the casing.
  • the electronic device may be a mobile phone, a tablet, a computer, etc.
  • the electronic equipment provided by this application effectively reduces the packaging thickness of the packaging structure, reserves more space for the electronic equipment to install other components, and improves the functionality of the electronic equipment.
  • This application also provides a packaging method, which specifically includes the following steps:
  • Step 201 Stack a plurality of packages 200 on the first surface of the carrier 100;
  • Step 202 electrically connect each package 200 to the first surface of the carrier board 11 through the wire 300 connect;
  • the first package 200 is first placed on the carrier 100, and then the second package 200 is stacked on the package 200.
  • the second package 200 can be aligned with the first package 200. , can also be set as an offset.
  • Each package 200 is electrically connected to the first surface of the carrier board 100 through wires 300 .
  • multiple packages 200 can be stacked in sequence. After each package body 200 is electrically connected to the first surface of the carrier board 100, the carrier board 100, the plurality of packages 200 and the wires 300 can be packaged into a whole through the first packaging layer 400, and the package body 200 can be and wires 300 are located within the first packaging layer 400 .
  • the packaging method of this application realizes the integration of multiple packages into a whole by stacking multiple packages in sequence, using wires to electrically connect each package with the carrier board, and then packaging them into a whole, so that the packaging structure can be integrated
  • Multiple chips have multiple functions, such as data storage and calculation, as well as video transcoding, audio transcoding, etc.

Abstract

The present application discloses a package structure, an electronic device, and a packaging method. The package structure comprises: a carrier plate; multiple package bodies, the multiple package bodies being successively stacked on a first surface of the carrier plate; wires, each of the package bodies being electrically connected to the first surface of the carrier plate by means of the wire; and a first package layer, the first package layer covering the carrier plate and the multiple package bodies.

Description

封装结构、电子设备及封装方法Packaging structure, electronic equipment and packaging method
相关申请的交叉引用Cross-references to related applications
本申请要求于2022年4月28日提交的申请号为202210471504.6,发明名称为“封装结构、电子设备及封装方法”的中国专利申请的优先权,其通过引用方式全部并入本申请。This application claims priority to the Chinese patent application with application number 202210471504.6 and the invention title "Packaging Structure, Electronic Device and Packaging Method" submitted on April 28, 2022, which is fully incorporated into this application by reference.
技术领域Technical field
本申请属于电子设备技术领域,具体涉及一种封装结构、电子设备及封装方法。The present application belongs to the technical field of electronic equipment, and specifically relates to a packaging structure, electronic equipment and packaging method.
背景技术Background technique
随着移动终端和可穿戴电子产品的发展,对电子产品的主板布局带来了越来越多的挑战。为了解决这个问题,将各种不同的芯片集成到一个封装模板中的应用越来越广泛。现有的封装结构多采用在基板上封装多个芯片,成为一个封装体,由于封装体内芯片数量有限,功能较为单一。With the development of mobile terminals and wearable electronic products, more and more challenges have been brought to the motherboard layout of electronic products. In order to solve this problem, the application of integrating various different chips into a package template is becoming more and more widespread. Existing packaging structures mostly use multiple chips to be packaged on a substrate to form a package. Since the number of chips in the package is limited, the function is relatively single.
发明内容Contents of the invention
本申请旨在提供一种封装结构、电子设备及封装方法,至少解决封装体内芯片数量有限,功能单一的问题。This application aims to provide a packaging structure, electronic equipment and packaging method, which at least solves the problem of limited number of chips and single function in the package.
为了解决上述技术问题,本申请是这样实现的:In order to solve the above technical problems, this application is implemented as follows:
第一方面,本申请实施例提出了一种封装结构,包括:载板;多个封装体,多个所述封装体依次层叠设置在所述载板的第一表面;导线,每个所述封装体均通过所述导线与所述载板的第一表面电性连接;第一封装层,所述第一封装层包覆所述载板和所述多个封装体。In a first aspect, an embodiment of the present application proposes a packaging structure, including: a carrier board; a plurality of packages, each of which is stacked in sequence on the first surface of the carrier board; a wire, each of the packages The packages are all electrically connected to the first surface of the carrier board through the wires; a first encapsulation layer covers the carrier board and the plurality of packages.
第二方面,本申请实施例提出了一种电子设备,包括:壳体;封装结 构,所述封装结构为如上所述的封装结构,所述封装结构设置在所述壳体内。In the second aspect, embodiments of the present application provide an electronic device, including: a housing; a packaging structure The packaging structure is the packaging structure as described above, and the packaging structure is arranged in the housing.
第三方面,本申请实施例提出了一种封装方法,包括:在载板的第一表面层叠设置多个封装体;将每个所述封装体通过导线与载板的第一表面电性连接;将所述载板、所述封装体和所述导线封装成整体。In a third aspect, an embodiment of the present application proposes a packaging method, which includes: stacking multiple packages on the first surface of the carrier board; electrically connecting each of the packages to the first surface of the carrier board through wires ; Package the carrier board, the package body and the wires into a whole.
本申请的封装结构,通过将多个封装体依次层叠设置,采用导线将各个封装体与载板电性连接后再封装成整体,实现了将多个封装体集成一个整体,使封装结构可集成多个芯片,具有多种功能,如数据存储和运算,以及视频变码、音频变码等。The packaging structure of this application realizes the integration of multiple packages into a whole by stacking multiple packages in sequence, using wires to electrically connect each package with the carrier board, and then packaging them into a whole, so that the packaging structure can be integrated Multiple chips have multiple functions, such as data storage and calculation, as well as video transcoding, audio transcoding, etc.
本申请的附加方面和优点将在下面的描述中部分给出,部分将从下面的描述中变得明显,或通过本申请的实践了解到。Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application.
附图说明Description of drawings
本申请的上述和/或附加的方面和优点从结合下面附图对实施例的描述中将变得明显和容易理解,其中:The above and/or additional aspects and advantages of the present application will become apparent and readily understood from the description of the embodiments in conjunction with the following drawings, in which:
图1是本申请提供的扇出型封装结构的示意图之一;Figure 1 is one of the schematic diagrams of the fan-out packaging structure provided by this application;
图2是本申请提供的扇出型封装结构的示意图之二;Figure 2 is the second schematic diagram of the fan-out packaging structure provided by this application;
图3是图1中示出的封装体的结构示意图之一;Figure 3 is one of the structural schematic diagrams of the package shown in Figure 1;
图4是图1中示出的封装体的结构示意图之二;Figure 4 is the second structural schematic diagram of the package shown in Figure 1;
图5是图1中示出的封装体的结构示意图之三;Figure 5 is a third structural schematic diagram of the package shown in Figure 1;
图6是图1中示出的封装体的结构示意图之四;Figure 6 is the fourth structural schematic diagram of the package shown in Figure 1;
附图标记:Reference signs:
100:载板;200:封装体;201:基板;202:芯片;203:第二封装层;204:导电体;205:绝缘层;206:重新布线层;210:第一通槽;220:第二通槽;300:导线;400:第一封装层;2041:第一键合线;2042:第二键合线;2043:金属凸块。 100: Carrier board; 200: Package; 201: Substrate; 202: Chip; 203: Second packaging layer; 204: Conductor; 205: Insulating layer; 206: Rewiring layer; 210: First slot; 220: Second through groove; 300: wire; 400: first packaging layer; 2041: first bonding wire; 2042: second bonding wire; 2043: metal bump.
具体实施方式Detailed ways
下面将详细描述本申请的实施例,所述实施例的示例在附图中示出,其中自始至终相同或类似的标号表示相同或类似的元件或具有相同或类似功能的元件。下面通过参考附图描述的实施例是示例性的,仅用于解释本申请,而不能理解为对本申请的限制。基于本申请中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。Embodiments of the present application will be described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. The embodiments described below with reference to the drawings are exemplary and are only used to explain the present application and cannot be understood as limiting the present application. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of this application.
本申请的说明书和权利要求书中的术语“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个该特征。在本申请的描述中,除非另有说明,“多个”的含义是两个或两个以上。此外,说明书以及权利要求中“和/或”表示所连接对象的至少其中之一,字符“/”,一般表示前后关联对象是一种“或”的关系。The terms "first" and "second" features in the description and claims of this application may include one or more of these features, either explicitly or implicitly. In the description of this application, unless otherwise stated, "plurality" means two or more. In addition, "and/or" in the description and claims indicates at least one of the connected objects, and the character "/" generally indicates that the related objects are in an "or" relationship.
下面结合图1-图6,描述本申请实施例的封装结构、电子设备及封装方法。The following describes the packaging structure, electronic device and packaging method of the embodiment of the present application with reference to Figures 1-6.
如图1所示,在本申请的实施例中,封装结构包括:载板100、多个封装体200、导线300和第一封装层400。多个封装体200层叠设置在载板100的第一表面,每个封装体200均通过导线300与载板100的第一表面电性连接,第一封装层400包覆载板100和多个封装体200。As shown in FIG. 1 , in the embodiment of the present application, the packaging structure includes: a carrier board 100 , a plurality of packaging bodies 200 , wires 300 and a first packaging layer 400 . A plurality of packages 200 are stacked on the first surface of the carrier board 100. Each package 200 is electrically connected to the first surface of the carrier board 100 through wires 300. The first package layer 400 covers the carrier board 100 and a plurality of Package 200.
具体来说,载板100为导体,在载板100上先设置第一个封装体200,然后再在封装体200上层叠设置第二个封装体200,第二个封装体200可与第一个封装体200对齐设置,也可偏移设置。每个封装体200通过导线300与载板100的第一表面电性连接。依照此设置方法可依次叠设多个封装体200。再将每个封装体200与载板100的第一表面电性连接后,可通过第一封装层400将载板100、多个封装体200以及导线300封装成一个整体,并使封装体200和导线300均位于第一封装层400内。Specifically, the carrier board 100 is a conductor. The first package body 200 is first placed on the carrier board 100, and then the second package body 200 is stacked on the package body 200. The second package body 200 can be connected with the first package body 200. The packages 200 are arranged in alignment or offset. Each package 200 is electrically connected to the first surface of the carrier board 100 through wires 300 . According to this arrangement method, multiple packages 200 can be stacked in sequence. After each package body 200 is electrically connected to the first surface of the carrier board 100, the carrier board 100, the plurality of packages 200 and the wires 300 can be packaged into a whole through the first packaging layer 400, and the package body 200 can be and wires 300 are located within the first packaging layer 400 .
进一步地,在本实施例中,每个封装体为一个小的封装结构,其具有基板201,基板201上开设有多个凹槽,每个凹槽内层叠设置有多个芯片 202,每个芯片202上设置有导电体204,封装材料填充在凹槽内形成第二封装层203,第二封装层203上设置有绝缘层205,绝缘层205内设置有重新布线层206,芯片202通过导电体204与重新布线层206电性连接,形成一个小的封装结构。进一步地,在本实施例中,为了减小封装体200的厚度,在封装体200成型后将凹槽的槽底研磨掉,使凹槽成为第一通槽210。Further, in this embodiment, each package is a small package structure, which has a substrate 201. Multiple grooves are opened on the substrate 201, and multiple chips are stacked in each groove. 202. A conductor 204 is provided on each chip 202, and the packaging material is filled in the groove to form a second packaging layer 203. An insulating layer 205 is provided on the second packaging layer 203, and a rewiring layer 206 is provided in the insulating layer 205. The chip 202 is electrically connected to the rewiring layer 206 through the conductor 204 to form a small package structure. Furthermore, in this embodiment, in order to reduce the thickness of the package 200, the bottom of the groove is ground away after the package 200 is formed, so that the groove becomes the first through groove 210.
可选地,第一封装层400可以为胶或者塑封材料。Optionally, the first encapsulation layer 400 may be glue or plastic sealing material.
本申请的封装结构,通过将多个封装体依次层叠设置,采用导线将各个封装体与载板电性连接后再封装成整体,实现了将多个封装体集成一个整体,使封装结构可集成多个芯片,具有多种功能,如数据存储和运算,以及视频变码、音频变码等。The packaging structure of this application realizes the integration of multiple packages into a whole by stacking multiple packages in sequence, using wires to electrically connect each package with the carrier board, and then packaging them into a whole, so that the packaging structure can be integrated Multiple chips have multiple functions, such as data storage and calculation, as well as video transcoding, audio transcoding, etc.
进一步地,在本发明的一个实施例中,多个封装体200依次偏移层叠设置。具体来说,第二个封装体200可相对于第一个封装体200沿第一个封装体200的长度方向或宽度方向发生偏移,使第一个封装体200的部分表面裸露出来,裸露出的表面用于设置导线300,每个封装体200通过导线300与载板100的第一表面电性连接。Further, in one embodiment of the present invention, multiple packages 200 are stacked and offset in sequence. Specifically, the second package 200 can be offset relative to the first package 200 along the length direction or width direction of the first package 200, so that part of the surface of the first package 200 is exposed. The exposed surface is used for disposing wires 300 , and each package 200 is electrically connected to the first surface of the carrier board 100 through the wires 300 .
可选地,如图1所示,导线300的数量为多根,载板100的第一表面与多个封装体200通过多根导线300串联。Optionally, as shown in FIG. 1 , the number of wires 300 is multiple, and the first surface of the carrier board 100 and the multiple packages 200 are connected in series through the multiple wires 300 .
可选地,如图2所示,多根导线300的第一端均与载板100的第一表面电性连接,多根导线300的第二端与多个封装体200一一对应电性连接。Optionally, as shown in FIG. 2 , the first ends of the plurality of wires 300 are electrically connected to the first surface of the carrier board 100 , and the second ends of the plurality of wires 300 are electrically connected to the plurality of packages 200 one-to-one. connect.
如图2所示,扇出型封装结构还包括多个焊盘501和多个焊球502。载板100的第二表面设有多个焊盘501,每个焊盘501上设置有一个焊球502,其中,第二表面与第一表面相对。As shown in FIG. 2 , the fan-out package structure also includes a plurality of solder pads 501 and a plurality of solder balls 502 . The second surface of the carrier board 100 is provided with a plurality of solder pads 501, and each solder pad 501 is provided with a solder ball 502, wherein the second surface is opposite to the first surface.
如图3所示,每个封装体200包括:基板201、芯片202、第二封装层203、导电体、绝缘层205和重新布线层206。基板201上设有至少一个第一通槽210,至少一个第一通槽210内设置有至少一个芯片202。导电体与芯片202电性连接。第二封装层203包覆导电体和至少一个芯片202, 绝缘层205设置在第二封装层203上,绝缘层205上设置有多个第二通槽,每个第二通槽内设置有重新布线层206,其中,重新布线层206与导线300电性连接。As shown in FIG. 3 , each package 200 includes: a substrate 201 , a chip 202 , a second packaging layer 203 , a conductor, an insulating layer 205 and a rewiring layer 206 . The substrate 201 is provided with at least one first through groove 210, and at least one chip 202 is disposed in the at least one first through groove 210. The conductor is electrically connected to the chip 202 . The second packaging layer 203 covers the conductor and at least one chip 202, The insulating layer 205 is provided on the second packaging layer 203. A plurality of second through-slots are provided on the insulating layer 205. A rewiring layer 206 is provided in each second through-slot, wherein the rewiring layer 206 is electrically connected to the conductor 300. connect.
具体来说,每个封装体200的封装工艺具体包括如下步骤:Specifically, the packaging process of each package 200 includes the following steps:
步骤101:在硅基板上开设多个凹槽,将芯片202的非功能面朝向凹槽的槽底设置,并采用粘附胶将芯片202的非功能面与凹槽的槽底固定。Step 101: Create multiple grooves on the silicon substrate, place the non-functional surface of the chip 202 toward the bottom of the grooves, and use adhesive glue to fix the non-functional surface of the chip 202 to the bottom of the grooves.
步骤102:在该芯片202上层叠设置第二个芯片202,第二个芯片202与第一个芯片202在长度方向或宽度方向形成一定的偏移量,第二个芯片202的非功能面朝向第一个芯片202设置,两个芯片202之间采用粘附胶固定,依此方法可层叠设置多个芯片202。Step 102: A second chip 202 is stacked on the chip 202. The second chip 202 and the first chip 202 form a certain offset in the length direction or width direction, and the non-functional surface of the second chip 202 faces The first chip 202 is installed, and the two chips 202 are fixed with adhesive glue. In this way, multiple chips 202 can be stacked.
步骤103:在每个芯片202上设置导电体204,将每个芯片202的输入/输出接口引出。Step 103: Set a conductor 204 on each chip 202 and lead out the input/output interface of each chip 202.
步骤104:在硅基板的凹槽内填充胶或塑封材料,形成第二封装层203,固化后通过研磨硅基板的厚度将导电体露出。Step 104: Fill the grooves of the silicon substrate with glue or plastic sealing material to form the second encapsulation layer 203. After solidification, grind the thickness of the silicon substrate to expose the conductor.
步骤105:在第二封装层203的表面上设置绝缘层205,在绝缘层205上开设多个第二通槽220,在每个第二通槽220内设置重新布线层206,导电体204与重新布线层206连接,实现各输入/输出接口的电性连接,以及重新位置布置。Step 105: Set an insulating layer 205 on the surface of the second encapsulation layer 203, open a plurality of second through-slots 220 on the insulating layer 205, set a rewiring layer 206 in each second through-slot 220, and conduct the conductor 204 and The rewiring layer 206 is connected to realize the electrical connection and relocation of each input/output interface.
步骤106:将硅基板凹槽的槽底加工掉,使该凹槽成为第一通槽210,以此可减薄封装体200的厚度。进一步地,导线300与一个重新布线层206电性连接。Step 106: Process the bottom of the groove of the silicon substrate to make the groove become the first through groove 210, thereby reducing the thickness of the package 200. Further, the wire 300 is electrically connected to a rewiring layer 206 .
本申请通过将硅基板内部开设凹槽,在芯片和导电体封装好后,将硅基板凹槽的槽底加工掉,可以减薄整个封装体的厚度,有效降低封装厚度。采用硅基板可以增强封装体的强度,且硅基板与内部的芯片的热膨胀系数相近,可进一步降低封装时的翘曲。In this application, a groove is created inside the silicon substrate, and after the chip and conductor are packaged, the bottom of the groove of the silicon substrate is processed away, thereby thinning the thickness of the entire package and effectively reducing the package thickness. Using a silicon substrate can enhance the strength of the package, and the thermal expansion coefficients of the silicon substrate and the internal chip are similar, which can further reduce warpage during packaging.
在本申请的一个实施例中,芯片202为多个,多个芯片202依次偏移层叠设置在至少一个第一通槽210内。导电体204包括多个导电件,多个 导电件的一端与多个芯片202一一对应连接,多个导电件的另一端与重新布线层206连接。In one embodiment of the present application, there are multiple chips 202 , and the multiple chips 202 are sequentially offset and stacked in at least one first through groove 210 . The conductor 204 includes a plurality of conductive elements, a plurality of One end of the conductive member is connected to the plurality of chips 202 in a one-to-one correspondence, and the other end of the plurality of conductive members is connected to the rewiring layer 206 .
可选地,如图3和图4所示,多个导电件包括第一键合线2041和金属凸块2043中的至少一者。具体来说,可在最上层的芯片202上设置多个第一键合线2041,在其他各层芯片202露出的表面上设置一个第一键合线2041,每个第一键合线2041的第一端与芯片202电性连接,第二端与一个重新布线层206电性连接。可选地,邻近绝缘层205的芯片202上也可设置金属凸块2043,金属凸块2043可以为单独设置,也可以为与芯片202一体成型。在本实施例中,为便于安装,采用芯片202与金属凸块2043一体成型。进一步地,在本实施例中,第一键合线2041为垂直键合线。Optionally, as shown in FIGS. 3 and 4 , the plurality of conductive members include at least one of a first bonding wire 2041 and a metal bump 2043 . Specifically, multiple first bonding wires 2041 can be provided on the uppermost chip 202, and one first bonding wire 2041 can be provided on the exposed surfaces of the other layers of chips 202. Each first bonding wire 2041 The first end is electrically connected to the chip 202, and the second end is electrically connected to a rewiring layer 206. Optionally, metal bumps 2043 may also be provided on the chip 202 adjacent to the insulating layer 205. The metal bumps 2043 may be provided separately or may be integrally formed with the chip 202. In this embodiment, to facilitate installation, the chip 202 and the metal bumps 2043 are integrally formed. Further, in this embodiment, the first bonding wire 2041 is a vertical bonding wire.
本申请通过设置第一键合线或金属凸块,缩短了线弧长度,电连接路径相对较短,可以进一步降低封装体的厚度。同时,第一键合线或金属凸块电连接路径较短,可以提升产品性能。In this application, by arranging the first bonding wire or metal bump, the wire arc length is shortened, the electrical connection path is relatively short, and the thickness of the package can be further reduced. At the same time, the electrical connection path of the first bonding wire or metal bump is shorter, which can improve product performance.
如图5所示,在本申请的又一个实施例中,芯片202的数量为多个,多个芯片202依次偏移层叠设置在至少一个第一通槽210内,导电体204包括第一导电件和第二导电件,多个芯片202通过第一导电件串联,靠近重新布线层206的一个芯片202通过第二导电件与重新布线层206电性连接。在本实施例中,第一导电件为第二键合线2042,第二导电件为第一键合线2041或金属凸块2043。As shown in FIG. 5 , in another embodiment of the present application, the number of chips 202 is multiple. The multiple chips 202 are sequentially offset and stacked in at least one first through slot 210 . The conductor 204 includes a first conductor. and a second conductive member, multiple chips 202 are connected in series through the first conductive member, and a chip 202 close to the rewiring layer 206 is electrically connected to the rewiring layer 206 through the second conductive member. In this embodiment, the first conductive component is the second bonding wire 2042, and the second conductive component is the first bonding wire 2041 or the metal bump 2043.
具体来说,在本实施例中,邻近绝缘层205的芯片202通过第一键合线2041或金属凸块2043与重新布线层206电性连接,远离绝缘层205的芯片202通过第二键合线2042与上层的芯片202电性连接,在本实施例中,第二键合线2042为弯曲键合线。Specifically, in this embodiment, the chip 202 adjacent to the insulating layer 205 is electrically connected to the rewiring layer 206 through the first bonding wire 2041 or the metal bump 2043, and the chip 202 far away from the insulating layer 205 is electrically connected to the rewiring layer 206 through the second bonding wire 2041 or the metal bump 2043. The wire 2042 is electrically connected to the upper chip 202. In this embodiment, the second bonding wire 2042 is a curved bonding wire.
本申请通过在邻接绝缘层的芯片上设置第一键合线或金属凸块,远离绝缘层的芯片与位于其上的芯片通过第二键合线连接,缩短了线弧长度,电连接路径相对较短,可以进一步降低封装体的厚度。同时,第一键合线或金属凸块电连接路径较短,可以提升产品性能。 In this application, first bonding wires or metal bumps are provided on the chip adjacent to the insulating layer, and the chip far away from the insulating layer is connected to the chip located on it through the second bonding wire. This shortens the arc length and the electrical connection path is relatively opposite. Shorter, the thickness of the package can be further reduced. At the same time, the electrical connection path of the first bonding wire or metal bump is shorter, which can improve product performance.
如图6所示,在本申请的再一个实施例中,硅基板上可开设多个第一通槽210,每个第一通槽210对应的重新布线层206一体设置。As shown in FIG. 6 , in another embodiment of the present application, a plurality of first through grooves 210 can be opened on the silicon substrate, and the rewiring layer 206 corresponding to each first through groove 210 is integrally provided.
具体来说,在本实施例中,每个第一通槽210内的导电体的设置方式可以相同,也可以不同。如每个第一通槽210内导电体204均为第一键合线2041;或者一个第一通槽210内的导电体204为第一键合线2041,另一个第一通槽210内的导电体204为金属凸块2043和第一键合线2041;或者如图6所示,一个第一通槽210内的导电体204为金属凸块2043和第一键合线2041,另一个第一通槽210内的导电体204为第一键合线2041和第二键合线2042。Specifically, in this embodiment, the arrangement of the conductors in each first through slot 210 may be the same or different. For example, the conductors 204 in each first through groove 210 are first bonding wires 2041; or the conductors 204 in one first through groove 210 are first bonding wires 2041, and the conductors 204 in another first through groove 210 are first bonding wires 2041. The conductor 204 is a metal bump 2043 and a first bonding wire 2041; or as shown in FIG. 6, the conductor 204 in one first through groove 210 is a metal bump 2043 and the first bonding wire 2041, and the other conductor 204 is a metal bump 2043 and a first bonding wire 2041. The conductor 204 in a through groove 210 is a first bonding wire 2041 and a second bonding wire 2042.
在每个第一通槽210内形成第二封装层203后,可在所有的第二封装层203上设置一个绝缘层205,该绝缘层205内开设有一个第二通槽220,重新布线层206设置在该第二通槽内220,每个第一通槽210内的导电体204均与该重新布线层206电性连接,以降低封装体200的制造工艺。After the second encapsulation layer 203 is formed in each first through groove 210, an insulating layer 205 can be provided on all the second encapsulation layers 203. A second through groove 220 is opened in the insulating layer 205, and the rewiring layer 206 is disposed in the second through groove 220 , and the conductor 204 in each first through groove 210 is electrically connected to the rewiring layer 206 to reduce the manufacturing process of the package 200 .
需要说明的是:以上所述的实施例中,仅以附图中示出的两个芯片202或两个第一通槽210为例进行说明,在实际使用中,可根据具体情况在每个第一通槽210内设置多个芯片202,以及在硅基板上开设多个第一通槽210。It should be noted that in the above-mentioned embodiments, only the two chips 202 or the two first through slots 210 shown in the drawings are used as examples for explanation. In actual use, each chip can be used according to the specific situation. A plurality of chips 202 are disposed in the first through groove 210, and a plurality of first through grooves 210 are opened on the silicon substrate.
进一步地,在以上所述的实施例中,每个芯片202的功能面均背离第一通槽210的底部。Furthermore, in the above-described embodiment, the functional surface of each chip 202 is away from the bottom of the first through groove 210 .
本申请还提供了一种电子设备,包括壳体和封装结构,封装结构设置在壳体内。This application also provides an electronic device, including a casing and a packaging structure, and the packaging structure is arranged in the casing.
具体来说,在本实施例中,电子设备可以为手机、平板、电脑等。Specifically, in this embodiment, the electronic device may be a mobile phone, a tablet, a computer, etc.
本申请提供的电子设备,有效降低了封装结构的封装厚度,为电子设备预留出更多的空间安装其他元件,提高了电子设备的功能。The electronic equipment provided by this application effectively reduces the packaging thickness of the packaging structure, reserves more space for the electronic equipment to install other components, and improves the functionality of the electronic equipment.
本申请还提供了一种封装方法,具体包括以下步骤:This application also provides a packaging method, which specifically includes the following steps:
步骤201:在载:100的第一表面层叠设置多个封装体200;Step 201: Stack a plurality of packages 200 on the first surface of the carrier 100;
步骤202:将每个封装体200通过导线300与载板11的第一表面电性 连接;Step 202: electrically connect each package 200 to the first surface of the carrier board 11 through the wire 300 connect;
步骤203:将载板100、封装体200和导线300封装成整体。Step 203: Package the carrier board 100, the package body 200 and the wires 300 into a whole.
具体来说,在载板100上先设置第一个封装体200,然后再在封装体200上层叠设置第二个封装体200,第二个封装体200可与第一个封装体200对齐设置,也可偏移设置。每个封装体200通过导线300与载板100的第一表面电性连接。依照此设置方法可依次叠设多个封装体200。再将每个封装体200与载板100的第一表面电性连接后,可通过第一封装层400将载板100、多个封装体200以及导线300封装成一个整体,并使封装体200和导线300均位于第一封装层400内。Specifically, the first package 200 is first placed on the carrier 100, and then the second package 200 is stacked on the package 200. The second package 200 can be aligned with the first package 200. , can also be set as an offset. Each package 200 is electrically connected to the first surface of the carrier board 100 through wires 300 . According to this arrangement method, multiple packages 200 can be stacked in sequence. After each package body 200 is electrically connected to the first surface of the carrier board 100, the carrier board 100, the plurality of packages 200 and the wires 300 can be packaged into a whole through the first packaging layer 400, and the package body 200 can be and wires 300 are located within the first packaging layer 400 .
本申请的封装方法,通过将多个封装体依次层叠设置,采用导线将各个封装体与载板电性连接后再封装成整体,实现了将多个封装体集成一个整体,使封装结构可集成多个芯片,具有多种功能,如数据存储和运算,以及视频变码、音频变码等。The packaging method of this application realizes the integration of multiple packages into a whole by stacking multiple packages in sequence, using wires to electrically connect each package with the carrier board, and then packaging them into a whole, so that the packaging structure can be integrated Multiple chips have multiple functions, such as data storage and calculation, as well as video transcoding, audio transcoding, etc.
在本说明书的描述中,参考术语“一个实施例”、“一些实施例”、“示意性实施例”、“示例”、“具体示例”、或“一些示例”等的描述意指结合该实施例或示例描述的具体特征、结构、材料或者特点包含于本申请的至少一个实施例或示例中。在本说明书中,对上述术语的示意性表述不一定指的是相同的实施例或示例。而且,描述的具体特征、结构、材料或者特点可以在任何的一个或多个实施例或示例中以合适的方式结合。In the description of this specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" or the like is intended to be incorporated into the description of the implementation. An example or example describes a specific feature, structure, material, or characteristic that is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
尽管已经示出和描述了本申请的实施例,本领域的普通技术人员可以理解:在不脱离本申请的原理和宗旨的情况下可以对这些实施例进行多种变化、修改、替换和变型,本申请的范围由权利要求及其等同物限定。 Although the embodiments of the present application have been shown and described, those of ordinary skill in the art will understand that various changes, modifications, substitutions and modifications can be made to these embodiments without departing from the principles and purposes of the present application. The scope of the application is defined by the claims and their equivalents.

Claims (13)

  1. 一种封装结构,包括:A packaging structure including:
    载板;carrier board;
    多个封装体,多个所述封装体层叠设置在所述载板的第一表面;A plurality of packages, a plurality of packages stacked on the first surface of the carrier board;
    导线,每个所述封装体均通过所述导线与所述载板的第一表面电性连接;Wires, each of the packages is electrically connected to the first surface of the carrier board through the wires;
    第一封装层,所述第一封装层包覆所述载板和所述多个封装体。A first packaging layer covers the carrier board and the plurality of packages.
  2. 根据权利要求1所述的封装结构,其中,所述导线为多根,多根所述导线的第一端均与所述载板的第一表面电性连接,多根所述导线的第二端与多个所述封装体一一对应电性连接。The packaging structure of claim 1, wherein there are a plurality of conductors, first ends of the plurality of conductors are electrically connected to the first surface of the carrier board, and second ends of the plurality of conductors are electrically connected to the first surface of the carrier board. The terminals are electrically connected to a plurality of the packages in a one-to-one correspondence.
  3. 根据权利要求1所述的封装结构,其中,所述导线为多根,所述载板的第一表面与多个所述封装体通过多根所述导线电性连接。The packaging structure according to claim 1, wherein there are a plurality of wires, and the first surface of the carrier board and the plurality of packages are electrically connected through a plurality of the wires.
  4. 根据权利要求1所述的封装结构,其中,多个所述封装体依次偏移层叠设置在所述载板的第一表面。The packaging structure according to claim 1, wherein a plurality of the packages are sequentially offset and stacked on the first surface of the carrier board.
  5. 根据权利要求1所述的封装结构,其中,所述封装结构还包括多个焊球,所述载板具有与所述第一表面相背的第二表面,所述第二表面设有多个焊盘,多个所述焊球与多个所述焊盘一一对应连接。The packaging structure according to claim 1, wherein the packaging structure further includes a plurality of solder balls, the carrier board has a second surface opposite to the first surface, and the second surface is provided with a plurality of solder balls. A plurality of solder balls are connected to a plurality of solder pads in a one-to-one correspondence.
  6. 根据权利要求1至5中任一项所述的封装结构,其中,至少一个所述封装体包括:The packaging structure according to any one of claims 1 to 5, wherein at least one of the packaging bodies includes:
    基板,所述基板上设有至少一个第一通槽,所述至少一个第一通槽内设置有至少一个芯片;A substrate, at least one first through-slot is provided on the substrate, and at least one chip is disposed in the at least one first through-slot;
    导电体,所述至少一个芯片与所述导电体电性连接;A conductor, the at least one chip is electrically connected to the conductor;
    第二封装层,所述第二封装层包覆所述导电体和所述至少一个芯片;a second encapsulation layer, the second encapsulation layer covering the conductor and the at least one chip;
    绝缘层,所述绝缘层设置在所述第二封装层上;An insulating layer, the insulating layer is provided on the second packaging layer;
    重新布线层,所述绝缘层上设置有第二通槽,所述重新布线层设置于所述第二通槽内,所述重新布线层与所述导线电性连接。 A rewiring layer, a second through slot is provided on the insulating layer, the rewiring layer is disposed in the second through slot, and the rewiring layer is electrically connected to the conductor.
  7. 根据权利要求6所述的封装结构,其中,所述芯片为多个,多个所述芯片依次偏移层叠设置在所述至少一个第一通槽内;The packaging structure according to claim 6, wherein there are a plurality of said chips, and a plurality of said chips are sequentially offset and stacked in the at least one first through groove;
    所述导电体包括多个导电件,多个所述导电件的一端与多个所述芯片一一对应连接,多个所述导电件的另一端均与所述重新布线层连接。The conductor includes a plurality of conductive elements, one end of the plurality of conductive elements is connected to a plurality of the chips in a one-to-one correspondence, and the other ends of the plurality of conductive elements are connected to the rewiring layer.
  8. 根据权利要求7所述的封装结构,其中,多个导电件包括第一键合线和金属凸块中的至少一者。The package structure of claim 7, wherein the plurality of conductive members includes at least one of a first bonding wire and a metal bump.
  9. 根据权利要求8所述的封装结构,其中,多个所述导电件包括金属凸块,所述芯片与所述金属凸块一体连接。The packaging structure according to claim 8, wherein a plurality of the conductive members include metal bumps, and the chip is integrally connected to the metal bumps.
  10. 根据权利要求6所述的封装结构,其中,所述芯片为多个,多个所述芯片依次偏移层叠设置在所述至少一个第一通槽内;The packaging structure according to claim 6, wherein there are a plurality of said chips, and a plurality of said chips are sequentially offset and stacked in the at least one first through groove;
    所述导电体包括第一导电件和第二导电件,多个所述芯片通过所述第一导电件串联,靠近所述重新布线层的一个所述芯片通过所述第二导电件与所述重新布线层连接。The conductor includes a first conductive member and a second conductive member. A plurality of the chips are connected in series through the first conductive member. One of the chips close to the rewiring layer is connected to the second conductive member through the second conductive member. Reroute layer connections.
  11. 根据权利要求10所述的封装结构,其中,所述第一导电件为第二键合线,所述第二导电件为第一键合线或金属凸块。The packaging structure according to claim 10, wherein the first conductive member is a second bonding wire, and the second conductive member is a first bonding wire or a metal bump.
  12. 一种电子设备,包括:An electronic device including:
    壳体;case;
    封装结构,所述封装结构为根据权利要求1至11中任一项所述的封装结构,所述封装结构设置在所述壳体内。A packaging structure, the packaging structure is the packaging structure according to any one of claims 1 to 11, and the packaging structure is arranged in the housing.
  13. 一种封装方法,包括:A packaging method including:
    在载板的第一表面层叠设置多个封装体;Multiple packages are stacked on the first surface of the carrier board;
    将每个所述封装体通过导线与载板的第一表面电性连接;electrically connecting each of the packages to the first surface of the carrier board through wires;
    将所述载板、所述封装体和所述导线封装成整体。 The carrier board, the package body and the wires are packaged as a whole.
PCT/CN2023/090576 2022-04-28 2023-04-25 Package structure, electronic device, and packaging method WO2023207972A1 (en)

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