WO2023118731A1 - Circuit de reference de tension - Google Patents
Circuit de reference de tension Download PDFInfo
- Publication number
- WO2023118731A1 WO2023118731A1 PCT/FR2022/052440 FR2022052440W WO2023118731A1 WO 2023118731 A1 WO2023118731 A1 WO 2023118731A1 FR 2022052440 W FR2022052440 W FR 2022052440W WO 2023118731 A1 WO2023118731 A1 WO 2023118731A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- transistor
- terminal
- qei
- quadrupole
- source
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 3
- 229910002601 GaN Inorganic materials 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000002939 deleterious effect Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 244000045947 parasite Species 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
- G05F3/242—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
Definitions
- the invention relates to the field of voltage reference circuits used in integrated circuits.
- the invention relates in particular to a voltage reference circuit having a structure making it possible to limit the energy consumption of the circuit, while providing a constant voltage reference even when the power source, the temperature or the parameters of the components vary.
- voltage reference circuits are circuits which provide a stable and constant reference voltage over time. It is also sought to obtain a reference voltage insensitive to variations in certain parameters.
- these parameters are for example the supply voltage, the temperature, the manufacturing dispersions or the aging of the components.
- transistors are often found in voltage reference circuits.
- the parameters of a given transistor can vary greatly depending on the manufacturing process they undergo.
- two transistors having undergone the same manufacturing process can be widely different depending on the positioning they have on the semiconductor wafer used for their manufacture.
- One of these parameters is the voltage threshold value from which a channel is formed between the drain and the source of a given transistor. This minimum value is that to be applied between the gate and the source, in order to conduct an electric current between the drain and the source of said given transistor. This parameter can vary up to 50% of a transistor to another, which can lead to a loss of stability of the circuit's voltage reference.
- a voltage reference circuit generally has two types of transistors: depletion transistors and enhancement transistors.
- a 2005 depletion transistor is commonly symbolized with a solid line connecting drain, source, and base.
- a 2025 enhancement transistor is commonly symbolized with a dashed line connecting the drain, source, and base.
- a voltage reference circuit 2000 generally comprises a depletion transistor 2005 whose drain is connected to a voltage source V+ and whose source is connected with eight 2025 enhancement transistors in series. Each enhancement transistor 2025 has its gate connected to its drain and the last enhancement transistor in the series has its source connected to ground. The gate of depletion transistor 2005 is also connected to ground.
- the reference voltage Vref is measured between a point between a capacitor 2015 and the source of an enhancement transistor 2055 whose gate is connected between the sixth and seventh depletion transistor in the series.
- the voltage reference circuit 2000 makes it possible to obtain low current consumption, typically less than 1 pA.
- such a circuit does not make it possible to reach high reference voltage values.
- this type of assembly is sensitive to variations in the parameters of the transistors. The reference voltage therefore presents instabilities.
- the technical problem which the invention sets out to solve is to obtain a stable voltage reference circuit, in particular with respect to variations in the manufacturing process of the transistors, while limiting the consumption of the circuit.
- depletion “tail” transistor whose source is connected to a terminal of a first dipole, and whose gate is connected to the second terminal of the first dipole
- foot enhancement transistor whose source is connected to ground and whose gate is connected to its drain, said drain being connected to a second terminal of a second dipole, whose first terminal is connected to the second terminal of the first dipole.
- the voltage reference circuit comprises exactly twice as many depletion transistors as enhancement transistors, which makes it possible to compensate for the variations of the threshold value defined previously. Indeed, for N-channel transistors, the depletion transistors have a negative threshold value, while the depletion transistors have a positive threshold value. Also, the absolute value of the threshold value of an enhancement transistor is substantially equal to twice the threshold value of a depletion transistor. Thus, an enhancement transistor makes it possible to compensate for a pair of depletion transistors. The threshold values compensate or even cancel each other, which makes it possible to limit the deleterious effects on the value of the reference voltage.
- Such a circuit has very few components compared to the prior art. It is therefore easier to integrate into integrated circuits with reduced dimensions. In addition, fewer parasites, linked to the interactions of the components between them, appear on the voltage reference signal, due to the limited number of components.
- the connecting quadrupole consists of two short-circuits respectively connecting the first and third terminals and the second and fourth terminals.
- the second dipole is then a short circuit.
- This embodiment is the simplest.
- the circuit consists of only two depletion transistors, an enhancement transistor and a dipole, or four components in total. Such a circuit is therefore particularly easy to implement and to integrate into integrated circuits of reduced dimensions.
- the link quadrupole comprises two depletion transistors: a high transistor and a low transistor, the source of the high transistor being connected to the drain of the low transistor and to the first terminal of the link quadrupole, the drain of the high transistor being connected to the second terminal of the connecting quadrupole, the gate of the low transistor being connected to the third terminal of the connecting quadrupole and the gate of the high transistor and the source of the low transistor being connected to the fourth terminal of the connecting quadrupole .
- the second dipole then comprises an enhancement transistor whose source is connected to the second terminal of the second dipole and whose gate is connected to its drain, said drain being connected to the first terminal of the second dipole.
- the circuit then comprises two enhancement transistors, the threshold values of which compensate each other with the two pairs of depletion transistors.
- the connecting quadrupole consists of n elementary quadrupoles, with n>1, each elementary quadrupole comprising two depletion transistors, namely a high transistor and a low transistor, the source of the high transistor being connected to the drain of the low transistor and to a first terminal of the elementary quadrupole, the drain of the high transistor being connected to a second terminal of the elementary quadrupole, the gate of the low transistor being connected to a third terminal of the elementary quadrupole and the gate of the high transistor and the source of the low transistor being connected to a fourth terminal of the elementary quadrupole.
- These elementary quadrupoles are connected in series, with two consecutive elementary quadrupoles linked so that the first terminal of the elementary quadrupole is linked to the third terminal of the elementary quadrupole and the second terminal of the elementary quadrupole is linked to the fourth terminal of the elementary quadrupole.
- the first and the second terminal of the elementary quadrupole form the first and the second terminal of the connecting quadrupole and the third and the fourth terminal of the elementary quadrupole form the third and the fourth terminal.
- the second dipole then comprises n enhancement transistors, each of said transistors having its gate connected to its drain, said transistors being connected in series, two consecutive transistors being connected by the source of one and the drain of the other and , the drain of the first transistor forming the first terminal of the second dipole and the source of the last transistor forming the second terminal of the second dipole.
- the number of enhancement transistors and the number of depletion transistors is chosen according to the voltage reference value that one wishes to obtain. The greater the number of enhancement transistors (and the number of depletion transistors), the more it is possible to increase the voltage value at the circuit input and the value of the reference voltage.
- the first dipole can for example be an enhancement transistor whose gate is connected to its drain.
- the transistor then behaves like a diode.
- the first dipole is a resistor, which makes it possible to better compensate for the variations within the circuit.
- the sizing of the transistor or the value of the resistor does not in principle have a significant impact on the value of the voltage reference.
- the dimensioning of these components can be adapted in order to limit the power consumption of the voltage reference circuit.
- the depletion and enhancement transistors can be GaN transistors or MOS transistors without changing the invention. DESCRIPTION OF FIGURES
- FIG 1 is an electrical diagram of a prior art voltage reference circuit
- FIG 2 is an electrical diagram of the voltage reference circuit according to a first embodiment of the invention.
- FIG 3 is an electrical diagram of the voltage reference circuit according to an alternative embodiment to the first embodiment of Figure 2,
- FIG 4 is an electrical diagram of the voltage reference circuit according to a second embodiment of the invention.
- FIG 5 is an electrical diagram of the voltage reference circuit according to a fourth embodiment of the invention.
- FIG 6 is an electrical diagram of the voltage reference circuit according to a third embodiment of the invention.
- FIG 7 is a comparative graph of the evolution of the reference voltage as a function of temperature for the circuit of the invention and for a circuit of the state of the art, and
- FIG 8 is a comparative graph of the evolution of the reference voltage as a function of the supply voltage for theoretically identical transistors but whose intrinsic parameters differ because of manufacturing tolerances, for the circuit of the invention and for the prior art circuit.
- the voltage reference circuit of the invention comprises a head transistor M1, M11, M21, M31 whose drain is connected to a voltage source Vcc.
- the voltage source Vcc preferably supplies a voltage DC between 0 and 12 V.
- this DC voltage can present variations around the target voltage.
- the voltage can vary by 0.1 to 0.5% from its target value.
- the voltage reference circuit of the invention also comprises a tail transistor M2, M14, M26, M36.
- the two head transistors M1, M11, M21, M31 and tail M2, M14, M26, M36 are connected to each other by a connecting quadripole 10, 20, 30, 40.
- the connecting quadrupole 10 corresponds to two short circuits.
- a first short-circuit connects the Q1 and Q3 terminals of the connecting quadrupole 10 and the second short-circuit connects the Q2 and Q4 terminals of the connecting quadrupole 10.
- the head transistor Ml, Mil, M21, M31 is connected, by its source, to the drain of the tail transistor M2, M14, M26, M36, via the short-circuit connecting the terminals Q2 and Q4.
- the source of the tail transistor M2, M14, M26, M36 is connected to the gate of the head transistor Ml, Mil, M21, M31 through the short circuit connecting the terminals Q1 and Q3.
- the connecting quadrupole 20 comprises the comprises two depletion transistors M12, M13 in series: a high transistor M12 and a low transistor M13.
- the source of high transistor M12 is connected to the drain of low transistor M13 and to the first terminal Q1 of connecting quadrupole 20.
- First terminal Q1 is also connected to the gate of head transistor Mil.
- the drain of high transistor M12 is connected to second terminal Q2 of connecting quadrupole 20.
- Second terminal Q2 is also connected to the source of head transistor Mil.
- the gate of the low transistor M13 being connected to the third terminal Q3 of the connecting quadrupole 20.
- the third terminal Q3 is also connected to the source of the tail transistor M14.
- the gate of high transistor M12 and the source of low transistor M13 are connected to fourth terminal Q4 of connecting quadrupole 20, the latter also being connected to the drain of tail transistor M14.
- the connecting quadrupole 30 consists of two elementary quadrupoles QEi, QEi+1 connected in series, that is to say that the third terminal QEi-3 of the first elementary quadrupole QEi is connected to the first terminal QEi+1-1 of the second elementary quadrupole QEi+1 and the fourth terminal QEi-4 of the first elementary quadrupole QEi is connected to the second terminal QEi+1-2 of the second elementary quadrupole QEi+1.
- Each elementary quadrupole QEi, QEi+1 comprises two depletion transistors M22-M26: a high transistor M22, M24 and a low transistor M23, M25.
- the source of each high transistor M22, M24 is connected to the drain of each low transistor M23, M25 and to a first terminal QEi-1, QEi+1-1 of each elementary quadrupole QEi, QEi+1.
- each high transistor M22, M24 is connected to a second terminal QEi-2, QEi+1-2 of each elementary quadrupole QEi, QEi+1, the gate of each low transistor M23, M25 is connected to a third terminal QEi -3, QEi+1-3 of each elementary quadrupole QEi, QEi+1 and the gate of each high transistor M22, M24 and the source of each low transistor M23, M25 are connected to a fourth terminal QEi-4, QEi+1 -4 of each elementary quadrupole QEi, QEi+1.
- Terminals QEi-1 and QEi-2 respectively form terminals Q1 and Q2 of connection quadrupole 30 and terminals QEi+1-3 and QEi+1-4 respectively form terminals Q3 and Q4 of connection quadripole 30.
- the link quadrupole 40 consists of n elementary quadrupoles QEl-QEn, with n>1.
- Each elementary quadrupole comprises two depletion transistors: a high transistor M32, M34 and a low transistor M33 , M35, connected in the same way as for the elementary quadrupoles QEi, QEi+1 described with reference to FIG. 5.
- the elementary quadrupoles QEl-QEn are connected in series, with two consecutive elementary quadrupoles QEi, QEi+1 connected so that the first terminal QEi+1-1 of the elementary quadrupole QEi+1 is linked to the third terminal QEi-3 of the elementary quadrupole QEi and the second terminal QEi+1-2 of the elementary quadrupole QEi+1 is linked to the fourth terminal QEi -4 of the elementary quadrupole QEi.
- the first and the second terminal QEI-1, QEI-2 of the elementary quadrupole QEI form the first and the second terminal QI, Q2 of the connecting quadrupole 40 and the third and the fourth terminal QEn-3, QEn-4 of the elementary quadrupole QEn form the third and the fourth terminal Q3, Q4 of the connecting quadrupole 40.
- the lead and tail transistors are depletion transistors. They can belong to the category of GaN transistors or MOS transistors.
- the tail transistor M2, M14, M26, M36 is connected by its source to a terminal of a first dipole.
- the gate of tail transistor M2, M14, M26, M36 is connected to the second terminal of the first dipole.
- the first dipole can for example be a resistor R1, R11, R21, R31 as shown in Figures 2 and 4-6, or even a diode.
- the first dipole is an enhancement transistor M4, mounted as a diode, i.e. its gate is connected to its drain, as shown in Figure 3.
- the second terminal of the first dipole is connected in series with a second dipole 15, 25, 35, 45.
- the second dipole 15 corresponds to a short circuit.
- the second dipole 25 comprises an enhancement transistor M1 5 whose source is connected to the second terminal of the second dipole 25 and whose gate is connected to its drain. The latter is also connected to the first terminal of the second dipole 25.
- the second dipole 35 comprises 2 enhancement transistors M27, M28.
- Each transistors M27, M28 has its gate connected to its drain.
- the transistors M27, M28 are connected in series, i.e. the source of the first transistor M27 is connected to the drain of the second transistor M28.
- the drain of the first transistor M27 then forms the first terminal DI of the second dipole 45 and the source of the second transistor M28 forms the second terminal D2 of the second dipole 45.
- the second dipole 45 comprises n enhancement transistors M37, M38.
- Each transistors M37, M38 has its gate connected to its drain.
- the transistors M37, M38 are connected in series, ie two consecutive transistors M37, M38 are connected by the source of one and the drain of the other.
- the drain of the first transistor M37 then forms the first terminal DI of the second dipole 45 and the source of the last transistor M38 forms the second terminal D2 of the second dipole 45.
- the second terminal of the second dipole 15, 25, 35, 45 is connected to a non-linear component.
- the non-linear component is a foot transistor M3, M29, M39.
- the bottom transistor M3, M29, M39 is advantageously an enhancement transistor, the gate of which is connected to its drain. Foot transistor M3, M29, M39 is connected to ground through its source.
- the voltage reference value Vref is measured at the source of the head transistor M1, M11, M21, M31.
- the upper part of the circuit behaves as a current source when a current lower than the saturation current passes through it.
- the voltage Vgs measured between the gate and the source of the depletion transistors M1, M2, M11-M14, M21-M26, M31-M36 indeed tends towards the voltage threshold value from which a channel is formed between the drain and the source of a given transistor.
- the voltage Vds measured between the drain and the source of the first depletion transistor M1, M2, M11-M14, M21-M26, M31-M36 is therefore constant and the current delivered by the current source is substantially constant.
- the circuit Since the purpose of the circuit is to obtain a voltage reference and not a current reference, this circuit is not sufficient on its own and the voltage threshold value defined previously may undergo a variation of up to 50% according to the manufacturing process of the transistors.
- the lower part of the circuit, formed by the enhancement transistors M3, M15, M16, M27, M28, M29, M37, M38, M39 effectively provides a voltage, but this is variable depending on the current flowing through it.
- depletion transistors have a negative threshold value
- depletion transistors have a positive threshold value
- the absolute value of the threshold value of an enhancement transistor is equal to twice the threshold value of a depletion transistor.
- the role of the head transistor M1 is to provide a voltage difference between the terminals connected to Vcc and Vref so that the reference voltage Vref referenced to ground is stable at the output. of the circuit.
- This head transistor M1 is in particular sized to provide a sufficient current level to a load connected to the terminal Vref while the tail transistors M2 and foot M3 are sized to fix a bias current and a gate voltage necessary to control the head transistor M1.
- a head transistor M1 will be chosen with a larger active surface than those of the tail transistors M2 and foot transistors M3, in order to reduce the total power consumption of the circuit.
- Foot transistor M3 is configured to offset the output voltage and compensate for changes due to process and/or temperature variations of depletion transistors M1 and M2. In practice, this transistor M3 will have to be large enough to compensate for these changes without bringing sensitivity to process variations.
- the voltage reference circuit obtained is therefore not very sensitive to fluctuations in the supply voltage, to the temperature and to variations in the manufacturing process of the transistors.
- Another advantageous characteristic of the circuit of the invention is that it consumes little power, typically of the order of 3 pA to 10 pA.
- the voltage reference circuit can drive loads up to 10V with a voltage variation of only 6%.
- FIG. 8 compares the variations of the reference voltage Vref for theoretically identical transistors, but whose intrinsic parameters differ because of manufacturing tolerances.
- the reference voltage Vref measured for the transistors 2001 and 2003 varies from 1.4 to 3.6V, i.e. approximately 44% variation from transistor to transistor.
- the reference voltage Vref varies between 2.8 and 3V, i.e. approximately 7% variation from one transistor to another, i.e. six times less than for the circuit of the state of the art.
- the invention effectively makes it possible to limit the variations of the reference voltage Vref as a function of the tolerances of the manufacturing methods of the transistors.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Power Engineering (AREA)
- Control Of Electrical Variables (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2024537144A JP2024547078A (ja) | 2021-12-23 | 2022-12-20 | 電圧基準回路 |
US18/717,749 US20250053184A1 (en) | 2021-12-23 | 2022-12-20 | Voltage reference circuit |
EP22847594.3A EP4453685A1 (fr) | 2021-12-23 | 2022-12-20 | Circuit de reference de tension |
KR1020247022954A KR20240126042A (ko) | 2021-12-23 | 2022-12-20 | 전압 기준 회로 |
CN202280084061.3A CN118435145A (zh) | 2021-12-23 | 2022-12-20 | 电压参考电路 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FRFR2114322 | 2021-12-23 | ||
FR2114322A FR3131481A1 (fr) | 2021-12-23 | 2021-12-23 | Circuit de reference de tension |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2023118731A1 true WO2023118731A1 (fr) | 2023-06-29 |
Family
ID=81851574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2022/052440 WO2023118731A1 (fr) | 2021-12-23 | 2022-12-20 | Circuit de reference de tension |
Country Status (8)
Country | Link |
---|---|
US (1) | US20250053184A1 (fr) |
EP (1) | EP4453685A1 (fr) |
JP (1) | JP2024547078A (fr) |
KR (1) | KR20240126042A (fr) |
CN (1) | CN118435145A (fr) |
FR (1) | FR3131481A1 (fr) |
TW (1) | TW202344949A (fr) |
WO (1) | WO2023118731A1 (fr) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5825695A (en) * | 1995-04-05 | 1998-10-20 | Seiko Instruments Inc. | Semiconductor device for reference voltage |
US6590445B2 (en) * | 2000-09-27 | 2003-07-08 | Ricoh Company, Ltd. | Reference voltage generation circuit having reduced temperature sensitivity, an output adjusting method, and an electrical power source |
US20100207686A1 (en) * | 2009-02-17 | 2010-08-19 | United Microelectronics Corp. | Voltage generating apparatus |
US9632521B2 (en) * | 2013-03-13 | 2017-04-25 | Analog Devices Global | Voltage generator, a method of generating a voltage and a power-up reset circuit |
US9647476B2 (en) | 2014-09-16 | 2017-05-09 | Navitas Semiconductor Inc. | Integrated bias supply, reference and bias current circuits for GaN devices |
US20190243406A1 (en) * | 2018-02-08 | 2019-08-08 | Ablic Inc. | Reference voltage circuit and semiconductor device |
-
2021
- 2021-12-23 FR FR2114322A patent/FR3131481A1/fr active Pending
-
2022
- 2022-12-20 JP JP2024537144A patent/JP2024547078A/ja active Pending
- 2022-12-20 WO PCT/FR2022/052440 patent/WO2023118731A1/fr active Application Filing
- 2022-12-20 CN CN202280084061.3A patent/CN118435145A/zh active Pending
- 2022-12-20 KR KR1020247022954A patent/KR20240126042A/ko active Pending
- 2022-12-20 US US18/717,749 patent/US20250053184A1/en active Pending
- 2022-12-20 EP EP22847594.3A patent/EP4453685A1/fr active Pending
- 2022-12-22 TW TW111149433A patent/TW202344949A/zh unknown
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5825695A (en) * | 1995-04-05 | 1998-10-20 | Seiko Instruments Inc. | Semiconductor device for reference voltage |
US6590445B2 (en) * | 2000-09-27 | 2003-07-08 | Ricoh Company, Ltd. | Reference voltage generation circuit having reduced temperature sensitivity, an output adjusting method, and an electrical power source |
US20100207686A1 (en) * | 2009-02-17 | 2010-08-19 | United Microelectronics Corp. | Voltage generating apparatus |
US9632521B2 (en) * | 2013-03-13 | 2017-04-25 | Analog Devices Global | Voltage generator, a method of generating a voltage and a power-up reset circuit |
US9647476B2 (en) | 2014-09-16 | 2017-05-09 | Navitas Semiconductor Inc. | Integrated bias supply, reference and bias current circuits for GaN devices |
US20190243406A1 (en) * | 2018-02-08 | 2019-08-08 | Ablic Inc. | Reference voltage circuit and semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
EP4453685A1 (fr) | 2024-10-30 |
US20250053184A1 (en) | 2025-02-13 |
TW202344949A (zh) | 2023-11-16 |
CN118435145A (zh) | 2024-08-02 |
KR20240126042A (ko) | 2024-08-20 |
JP2024547078A (ja) | 2024-12-26 |
FR3131481A1 (fr) | 2023-06-30 |
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