WO2023082396A1

WO2023082396A1 - In-situ transmission infrared reaction cell under effect of jet plasma and test method

Info

Publication number: WO2023082396A1
Application number: PCT/CN2021/137689
Authority: WO
Inventors: 刘璐; 糜建立; 袁寿其
Original assignee: 江苏大学
Priority date: 2021-11-12
Filing date: 2021-12-14
Publication date: 2023-05-19
Also published as: CN114199774A

Abstract

An in-situ transmission infrared reaction cell under the effect of a jet plasma and a test method, relating to an infrared spectral analysis test system. The in-situ transmission infrared reaction cell comprises: a cell body (1), a base (3) being provided inside the cell body (1), a sample holder being provided on the base (3), and the sample holder being used for placing a sample (10); and a jet plasma generating device (2) comprising a high-voltage electrode (14), a grounding electrode (15), a wire (16), and an insulating layer (17), wherein the high-voltage electrode (14) and the grounding electrode (15) are provided on the cell body (1) and are insulated from the cell body (1), a potential difference is formed between the high-voltage electrode (14) and the grounding electrode (15), a gas is converted into plasma between the high-voltage electrode (14) and the ground electrode (15), and the plasma gas acts on the sample (10). Jet plasma is used as a plasma source which is placed in the in-situ transmission infrared reaction cell and acts on the sample (10) in real time during an infrared spectroscopy process. The present invention has the characteristics of stable discharge, no contact with a catalyst sample, and a compact and simple structure.

Description

An in-situ transmission infrared reaction cell under the action of jet plasma and its testing method

technical field

The invention relates to an infrared spectrum analysis test system, in particular to an in-situ transmission infrared reaction cell and a test method in which jet plasma can act on a sample in real time.

Background technique

Low-temperature plasma synergistic catalysis technology is an important technology with broad application prospects in the fields of fuel conversion and pollutant removal. It has significant advantages in reducing energy consumption and reducing by-products, so it has attracted increasing attention. In the low-temperature plasma synergistic catalysis technology, the catalyst is placed inside or behind the plasma generation area to generate a synergistic effect between the plasma and the catalyst, thereby reducing the reaction temperature and improving energy utilization and degradation efficiency. The energy efficiency of the catalytic degradation of VOCs is higher than the sum of the individual systems, which is strong evidence for synergistic effects, indicating that the low-temperature plasma synergistic catalytic process is quite different from the thermal catalytic process. However, the physical and chemical interaction process between plasma and catalyst is still unclear, and the means and methods for in situ detection of this process are lacking.

Contents of the invention

Aiming at the deficiencies in the prior art, the present invention provides an in-situ transmission infrared reaction cell in which jet plasma can act on samples in real time. By using jet plasma as a plasma source, it is placed in the in-situ transmission infrared reaction cell, In the process of infrared spectrum detection, it acts on the sample in real time. It has the characteristics of stable discharge, no contact with catalyst samples, compact and simple structure, etc.

The present invention achieves the above-mentioned technical purpose through the following technical means.

An in-situ transmission infrared reaction cell under the action of jet plasma, comprising a cell body and a jet plasma generating device;

A cell body, a base is arranged in the cell body, and a sample holder is arranged on the base, and the sample holder is used to place samples;

A jet plasma generating device, the jet plasma generating device includes a high-voltage electrode, a ground electrode, a wire and an insulating layer; the high-voltage electrode and the ground electrode are arranged on the cell body and are insulated from the cell body, between the high-voltage electrode and the ground electrode A potential difference is formed; the gas is plasmaized between the high voltage electrode and the ground electrode, and the plasmaized gas acts on the sample.

Further, the sample holder includes a sealed sample holder and an open sample holder; wherein, the sealed sample holder is sealed and connected with the jet plasma generating device, so as to ensure that the plasmaized gas entering the sealed sample holder can only out through the gas outlet.

Further, the airtight sample holder includes a first sample outer frame, and there are two first sample outer frames; a window is provided on one side of the first sample outer frame, and a sample slot is opened on the other side A or sample groove B, the sample groove A is a groove, the sample groove B is a protrusion, and a sample is placed between the sample groove A and the sample groove B, wherein the size of the sample is not greater than the size of the groove; The fastening holes opened on one sample frame connect the two sample frames and gaskets together.

Further, the protrusion is matched with the groove; the window material is ZnSe, KBr, CaF ₂ infrared window material, which is used to transmit infrared rays.

Further, the outer frame of the first sample is provided with a jet plasma inlet and a gas outlet.

Further, the open sample holder includes a second sample outer frame and a matching frame, wherein one end of the matching frame is placed in the second sample outer frame, a sample groove C is opened in the second sample outer frame, and the matching The frame is provided with a sample slot D, the sample is set in the sample slot C, and the sample slot D cooperates with the sample slot C to fix the sample.

Further, the outer frame of the second sample and one side of the matching frame are both provided with a quadrangular column frame structure, and the middle of the quadrangular column frame structure is hollowed out for infrared rays to pass through.

Test method for in-situ transmission infrared reaction cell under the action of jet plasma,

Step 1: Put the sample in the sample tank A, set the gasket between the sealing structures, align the sample tank A with the sample tank B, make the sample tank B correspond to the sample tank A, and the sample is in the sample tank A and sample tank B Between, connect the two first sample holders and gaskets through the fastening holes with fastening bolts;

Step 2: Put the connected airtight sample holder on the base in the cell body, adjust the position of the base and place the sample on the infrared light path;

Step 3: Closely connect the sealing structure of the jet plasma generator with the seal structure provided on the airtight sample holder through the gasket, and tightly connect the airtight sample holder and the jet plasma generator through the fastening holes with fastening bolts;

Step 4: Check the air tightness index;

Step 5: The plasma generating gas is introduced into the gas inlet, the gas flows through the channel of the jet plasma generating device, enters the airtight chamber formed by the airtight sample holder through the jet plasma outlet, and flows out through the gas outlet;

Step 6: In the case of not turning on the high-voltage power supply, pass in the infrared light, and measure the infrared spectrum test spectrum of the sample before the jet plasma action, which is convenient for intuitive comparison with the later stage;

Step 7: After turning on the high-voltage power supply, a potential difference is generated between the high-voltage electrode and the ground electrode, and a discharge is generated to form a low-temperature plasma. The plasma enters the airtight cavity formed by the airtight sample holder under the action of the air flow to form a plasma torch;

Step 8: Measure the infrared spectrum of the sample under the action of jet plasma;

Step 9: Disconnect the high-voltage power supply, the test is over, and clean the device.

The test method of the in-situ transmission infrared reaction cell under the action of jet plasma comprises the following steps:

Step 1: Put the sample in the sample tank C, put one end of the sample tank D in the sample tank C;

Step 2: Put the connected open sample holder into the cell body, and place the sample on the infrared light path;

Step 3: connecting the jet plasma generating device with the open sample holder;

Step 4: The plasma generating gas is introduced into the gas inlet, the gas flows through the channel of the jet plasma generator, enters the open sample holder through the jet plasma outlet, and flows out through the gas outlet;

Step 5: In the case of not turning on the high-voltage power supply, the infrared light is passed through, and the infrared spectrum test spectrum of the sample before the action of the jet plasma is measured, which is convenient for intuitive comparison with the later stage;

Step 6: After turning on the high-voltage power supply, a potential difference is generated between the high-voltage electrode and the ground electrode to generate a discharge and form a low-temperature plasma. The plasma enters the open sample holder under the action of the airflow to form a plasma torch;

Step 7: Measure the infrared spectrum of the sample under the action of jet plasma;

Step 8: Disconnect the high-voltage power supply, the test is over, and clean the device.

Beneficial effects of the present invention:

1) The present invention introduces jet plasma into the in-situ transmission infrared spectrum reaction cell, and when infrared detection is realized, the plasma acts on the sample in real time.

2) The present invention uses jet plasma as the plasma source, the electrodes are not in contact with the sample, and a stable plasma torch can be formed, which is dispersed on both sides of the sample to form a plasma layer, and the jet plasma generator is placed on the side of the sample, without affecting Infrared light path.

3) The sealed sample holder and jet plasma generating device of the present invention can form a closed cavity, so that the sample is completely in the plasma environment, avoiding the interference of external gas, reducing the outward diffusion of plasma, and improving the efficiency of plasma. density.

4) The sample holder of the present invention is only in contact with the upper and lower ends of the sample, and leaves a space for the plasma to interact with the sample, so that the jet plasma can flow through the surface of the sample without hindrance, maximizing the contact between the plasma and the sample.

Description of drawings

1 is a schematic cross-sectional view of an in-situ transmission infrared reaction cell in which the jet plasma can act on the sample in real time according to Embodiment 1 of the present invention;

Fig. 2 is a schematic cross-sectional view of a closed sample holder structure;

Fig. 3 is the right view of the outer frame of the first sample on the left side of Fig. 2;

Fig. 4 is the left view of the outer frame of the first sample on the right side of Fig. 2;

Fig. 5 is the front view of the base of the sealed sample holder;

Fig. 6 is a right side sectional view of Fig. 5;

Fig. 7 is a schematic structural diagram of the gasket between the outer frames of the first sample.

8 is a schematic cross-sectional view of the in-situ transmission infrared reaction cell in the top view direction of the jet plasma that can act on the sample in real time according to Embodiment 2 of the present invention;

Fig. 9 is a cross-sectional view of an open sample holder structure;

Fig. 10 is the right side view of the outer frame of the second sample in Fig. 9;

Fig. 11 is a left view of the matching frame in Fig. 9;

FIG. 12 is a front view of the jet plasma generator 2;

Fig. 13 is a front view sectional view of Fig. 11;

Reference signs:

1-cell body, 2-jet plasma generator, 3-base, 4-base groove, 5-first sample holder, 6-sample tank A, 7-window, 8-sealing structure, 9-fastening Hole, 10-sample, 11-gasket, 12-sample tank B, 13-column, 14-high voltage electrode, 15-ground electrode, 16-wire, 17-insulation layer, 18-gas inlet, 19-jet plasma Outlet, 20-gas outlet, 21-sample tank C, 22-sample tank D.

Detailed ways

Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

In describing the present invention, it is to be understood that the terms "central", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "axial", The orientation or positional relationship indicated by "radial", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description , rather than indicating or implying that the device or element referred to must have a particular orientation, be constructed and operate in a particular orientation, and thus should not be construed as limiting the invention. In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature defined as "first" and "second" may explicitly or implicitly include one or more of these features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrally connected; it may be mechanically connected or electrically connected; it may be directly connected or indirectly connected through an intermediary, and it may be the internal communication of two components. Those of ordinary skill in the art can understand the specific meanings of the above terms in the present invention according to specific situations.

Example 1

In conjunction with accompanying drawings 1-7, an in-situ transmission infrared reaction cell under the action of jet plasma includes a cell body 1 and a jet plasma generating device 2;

Wherein, the cell body 1 is provided with a base 3, and the base 3 is provided with an airtight sample holder;

The base 3 is L-shaped, and a base groove 4 is provided at the middle position for placing and supporting a closed sample holder;

The airtight sample holder is sealed and connected with the jet plasma generator, so as to ensure that the plasma gas entering the airtight sample holder can only flow out through the gas outlet. The airtight sample holder is used to place the sample, and the sealed sample holder is used for the sample In the case of being affected by the jet plasma, in the case of not being interfered by the external air flow.

The airtight sample holder includes two first sample holders 5, one side of the first sample holder 5 is provided with a window 7, and the other side is provided with a sample groove A6 or a sample groove B12, and the sample groove A6 is a groove, and the sample The groove B12 is a protrusion, and a sample 10 is placed between the sample groove A6 and the sample groove B12, wherein the size of the sample 10 is not larger than the size of the groove; the two first sample frames 5 are connected on three sides by the outer sealing structure 8, There are gaskets 11 between the connected parts, and the two first sample outer frames 5 and the gaskets 11 are connected together by bolts passing through the fastening holes 9 provided on the first sample outer frame 5 .

The sample groove A6 has a groove for placing the sample. The groove is determined according to the shape of the sample. Generally, the sample is circular and the groove is semicircular. The upper and lower sides of the sample can be placed in the groove, and the middle of the sample does not touch any object. . The upper and lower sides are supported by the side, and the side has a window 7, and the window is built with ZnSe glass for passing infrared rays. There is a sealing structure 8 outside the outer frame 5 of the first sample, and a fastening hole 9 is also opened on the sealing structure 8,

The two sides of the jet plasma outlet 19 are provided with a sealing structure 8, and the sealing structure 8 is also provided at the contact between the airtight sample holder and the jet plasma generator 2, and the sealing structure 8 of the jet plasma generator 2 is connected to the sealing structure 8 through the gasket 11. The sealing structure 8 arranged on the sample holder is in close contact, and the sealing sample holder and the jet plasma generating device 2 are tightly connected through the fastening holes 9 with fastening bolts.

The sample slot B12 can just be placed in the groove of the sample slot A6, but there is a certain gap for placing the sample. During measurement, the two first sample outer frames 5 are combined to place the sample, and the gasket 11 is arranged between the sealing structures 8 of the two first sample outer frames 5 and connected by fastening bolts. The combined airtight sample holder is embedded in the groove 4 of the base and fixed longitudinally.

Sealed sample holders are used when the sample is only affected by the jet plasma.

The test steps are as follows:

Step 1: Place the sample 10 in the sample tank A6, set the gasket 11 between the sealing structures 8, and align the sample tank A6 with the sample tank B12, so that the sample tank B12 corresponds to the sample tank A6, and the sample 10 is in the sample tank A6 Between the sample tank B12, the two first sample holders 5 are connected to the pads 11 through the fastening holes 9 with fastening bolts;

Step 2: Put the connected airtight sample holder on the base 3 in the cell body 1, and place the sample 10 on the infrared light path by adjusting the position of the base;

Step 3: The sealing structure of the jet plasma generator 2 is closely connected with the sealing structure 8 provided on the airtight sample holder through the gasket, and the airtight sample holder and the jet plasma generator are connected by fastening bolts through the fastening holes 9. tight connection;

Step 4: Check the air tightness index;

Step 5: Plasma generating gas is introduced into the gas inlet 18, the gas flows through the channel of the jet plasma generator, enters the airtight cavity formed by the airtight sample holder through the jet plasma outlet 19, and flows out through the gas outlet 20;

Step 7: After turning on the high-voltage power supply, a potential difference is generated between the high-voltage electrode 14 and the ground electrode 15 to generate a discharge and form a low-temperature plasma. The plasma enters the airtight cavity formed by the airtight sample holder under the action of the air flow to form a plasma torch;

Step 8: Measure the infrared spectrum of the sample 10 under the action of jet plasma;

The composition of the active particles in the plasma can be adjusted and changed by changing the gas composition, and the infrared spectrum under different plasma effects can be measured.

Referring to accompanying

drawings

1, 8, 12, and 13, the jet plasma generator 2 includes a high-voltage electrode 14, a ground electrode 15, a wire 16, and an insulating layer 17. The high voltage electrode 14 and the ground electrode 15 are made of conductive metal and placed in parallel. The high-voltage electrode 14 is connected to the high-voltage power supply through a wire, and the ground electrode 15 is grounded through a wire.

The insulating layer 17 is placed on the side and outside of the high-voltage electrode and the ground electrode plate, that is, except for the opposite faces of the two electrodes, an insulating layer is provided to form a tubular space for gas circulation. Except for openings on both sides, the rest are airtight connections. The high-voltage electrode, the ground electrode and the wire are insulated from the shell of the reaction cell, the sample holder and the base through an insulating layer. The jet plasma generating device is fixed on the side wall of the reaction pool through an insulating layer, the side with the electrodes is placed inside the pool body, and the end of the wire is placed outside for easy connection.

The outer side of the insulating layer of the jet plasma generator can be provided with a sealing structure, which is closely connected with the sealed sample holder to form a closed cavity.

Example 2

The open sample holder is used for common scene measurement, and the sample is affected by the gas introduced into the sample cell, or by the ambient gas.

In conjunction with accompanying drawings 8-11, an in-situ transmission infrared reaction cell under the action of jet plasma, including a cell body 1 and a jet plasma generating device 2;

The cell body includes a base 3 and an open sample holder;

The base 3 is used to adjust the height and position of the sample, and is a cube.

The open sample holder includes a second sample outer frame and a matching frame, the second sample outer frame is provided with a sample groove C21, the second sample outer frame is C-shaped, placed on a cubic base 3, and the second sample outer frame There is a sample groove C21 in the middle of the upper and lower sides of the frame. The sample groove C21 has a groove for placing samples. The groove is determined according to the shape of the sample. Generally, the sample is circular, and the groove is semicircular. In the tank, the middle of the sample is not in contact with any object, and the upper and lower sides are supported by columns 13, and the middle of the columns 13 is hollowed out for passing infrared rays. The matching frame is also C-shaped. One end of the matching frame can be placed in the outer frame of the second sample, but there is a certain gap for placing samples. The sample slot C21 and sample slot 22D are placed on the opposite side of the column and fixed on the upper and lower sides. inside. During measurement, the matching part of the second sample outer frame and the matching frame is used to place the sample.

The test steps are as follows:

Step 1: Put the sample 10 in the sample tank C21, put one end of the sample tank D22 in the sample tank C21;

Step 2: Put the connected open sample holder on the base 3 in the cell body 1, and place the sample 10 on the infrared light path;

Step 4: Inject plasma generating gas into the gas inlet 18, the gas flows through the channel of the jet plasma generator, enters the open sample holder through the jet plasma outlet 19, and flows out through the gas outlet 20;

Step 6: After turning on the high-voltage power supply, a potential difference is generated between the high-voltage electrode 14 and the ground electrode 15 to generate a discharge to form a low-temperature plasma, and the plasma enters the open sample holder under the action of the air flow to form a plasma torch;

Step 7: Measure the infrared spectrum of the sample 10 under the action of jet plasma;

In the description of this specification, descriptions referring to the terms "one embodiment", "some embodiments", "example", "specific examples", or "some examples" mean that specific features described in connection with the embodiment or example , structure, material or characteristic is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

Although the embodiments of the present invention have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be construed as limitations to the present invention. Variations, modifications, substitutions, and modifications to the above-described embodiments are possible within the scope of the present invention.

Claims

An in-situ transmission infrared reaction cell under the action of jet plasma, characterized in that it includes a cell body (1) and a jet plasma generating device;

The cell body (1), the cell body (1) is provided with a base (3), the base (3) is provided with a sample holder, and the sample holder is used to place samples;

The jet plasma generating device, the jet plasma generating device comprises a high voltage electrode (14), a ground electrode (15), a wire (16) and an insulating layer (17); the high voltage electrode (14) and the ground electrode (15) are arranged on On the cell body (1), and insulated from the cell body (1), a potential difference is formed between the high voltage electrode (14) and the ground electrode (15); the gas is plasma between the high voltage electrode (14) and the ground electrode (15) Bulkization, plasma gas acts on the sample.
The in-situ transmission infrared reaction cell under the action of jet plasma according to claim 1, wherein the sample holder comprises a sealed sample holder and an open sample holder; wherein, the sealed sample holder and the jet plasma The gas generating device is hermetically connected, so as to ensure that the plasmaized gas entering the airtight sample holder can only flow out through the gas outlet (20).
The in-situ transmission infrared reaction cell under the action of jet plasma according to claim 2, wherein the sealed sample holder comprises a first sample frame (5), and the first sample frame ( 5) There are two; the first sample outer frame (5) is provided with a window (7) on one side, and a sample slot A (6) or a sample slot B (12) is provided at the through hole on the other side, and the sample slot A (6) is a groove, the sample groove B (12) is a protrusion, and a sample (10) is placed between the sample groove A (6) and the sample groove B (12), wherein the size of the sample (10) is not larger than the concave Groove size, the two first sample frames (5) pass through the fastening holes (9) provided on the first sample frame (5) by bolts and connect the two first sample frames (5) Connect together with spacer(11).
The in-situ transmission infrared reaction cell under the action of jet plasma according to claim 3, characterized in that, the protrusion matches the groove; the window (7) material is ZnSe or KBr or CaF 2 infrared material , for infrared transmission.
The in-situ transmission infrared reaction cell under the action of jet plasma according to any one of claim 3 or 4, characterized in that, the first sample outer frame (5) is provided with a jet plasma inlet (19) and Gas outlet (20).
The in-situ transmission infrared reaction cell under the action of jet plasma according to claim 2, wherein the open sample holder comprises a second sample outer frame and a matching frame, wherein one end of the matching frame is placed on the second sample In the outer frame, a sample groove C (21) is provided in the second sample outer frame, a sample groove D (22) is arranged in the said matching frame, and the sample (10) is arranged in the sample groove C (21), and the sample Groove D (22) cooperates with sample groove C (21) to fix the sample.
The in-situ transmission infrared reaction cell under the action of jet plasma according to claim 6, characterized in that, the outer frame of the second sample and one side of the matching frame are both provided with a quadrangular column frame structure, and the middle of the quadrangular column frame structure Cutouts are used to pass infrared rays.
The test method of the in-situ transmission infrared reaction cell under the jet plasma effect according to claim 3, is characterized in that,

Step 1: Place the sample (10) in the sample tank A (6), set the gasket (11) between the sealing layers (8), and align the sample tank A (6) with the sample tank B (12) so that The sample tank B (12) corresponds to the sample tank A (6), and the sample (10) is between the sample tank A (6) and the sample tank B (12). The first sample support (5) is connected to the gasket (11);

Step 2: Put the connected airtight sample holder on the base in the cell body (1), adjust the position of the base and place the sample (10) on the infrared light path;

Step 3: The sealing layer of the jet plasma generating device is closely connected with the sealing layer (8) provided on the airtight sample holder through the gasket, and the airtight sample holder and the jet plasma are connected through the fastening holes (9) with fastening bolts. The body generating device is tightly connected;

Step 4: Check the air tightness index;

Step 5: Pass into the plasma generating gas at the gas inlet (18), the gas flows through the channel of the jet plasma generator, enters the airtight cavity formed by the airtight sample holder through the jet plasma outlet (19), and passes through the gas outlet (20 ) flow out;

Step 6: In the case of not turning on the high-voltage power supply, pass in the infrared light, and measure the infrared spectrum test spectrum of the sample before the jet plasma action, which is convenient for intuitive comparison with the later stage;

Step 7: After turning on the high-voltage power supply, a potential difference is generated between the high-voltage electrode (14) and the ground electrode (15), generating a discharge and forming a low-temperature plasma. plasma torch;

Step 8: Measure the infrared spectrum of the sample (10) under the action of jet plasma;

Step 9: Disconnect the high-voltage power supply, the test is over, and clean the device.
The test method of the in-situ transmission infrared reaction cell under the action of jet plasma according to claim 6, is characterized in that, comprises the steps:

Step 1: Put the sample (10) in the sample tank C (21), and place one end of the sample tank D (22) in the sample tank C (21);

Step 2: Put the connected open sample holder into the cell body (1), and place the sample (10) on the infrared light path;

Step 3: connecting the jet plasma generating device with the open sample holder;

Step 4: Inject plasma generating gas into the gas inlet (18), the gas flows through the channel of the jet plasma generator, enters the open sample holder through the jet plasma outlet (19), and flows out through the gas outlet (20);

Step 5: In the case of not turning on the high-voltage power supply, the infrared light is passed through, and the infrared spectrum test spectrum of the sample before the action of the jet plasma is measured, which is convenient for intuitive comparison with the later stage;

Step 6: After turning on the high-voltage power supply, a potential difference is generated between the high-voltage electrode (14) and the ground electrode (15), generating a discharge to form a low-temperature plasma, and the plasma enters the open sample holder under the action of the air flow to form a plasma torch;

Step 7: Measure the infrared spectrum of the sample (10) under the action of jet plasma;

Step 8: Disconnect the high-voltage power supply, the test is over, and clean the device.