WO2023040720A1 - 投影装置及照明光检测、辅助对焦和环境光检测方法 - Google Patents
投影装置及照明光检测、辅助对焦和环境光检测方法 Download PDFInfo
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- WO2023040720A1 WO2023040720A1 PCT/CN2022/117527 CN2022117527W WO2023040720A1 WO 2023040720 A1 WO2023040720 A1 WO 2023040720A1 CN 2022117527 W CN2022117527 W CN 2022117527W WO 2023040720 A1 WO2023040720 A1 WO 2023040720A1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B21/00—Projectors or projection-type viewers; Accessories therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B21/00—Projectors or projection-type viewers; Accessories therefor
- G03B21/14—Details
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B21/00—Projectors or projection-type viewers; Accessories therefor
- G03B21/14—Details
- G03B21/20—Lamp housings
Definitions
- the present application belongs to the technical field of projection equipment, and more specifically, relates to a projection device and illumination light detection, auxiliary focusing and ambient light detection methods.
- the projector uses a lens module to amplify the image generated by the spatial light modulator and then projects it out, thereby realizing a large-format display.
- Common spatial light modulators include LCD, LCoS (Liquid Crystal on Silicon, liquid crystal on silicon) and DMD. .
- the purpose of the present application includes, for example, to provide a projection device and methods for detecting illumination light, assisting focusing and detecting ambient light, so as to improve the above-mentioned problems.
- a multiplexed lens projection device based on liquid crystal on silicon including a lens module, a liquid crystal on silicon element, a polarization splitting element, and an image sensor.
- the liquid crystal on silicon element is arranged behind the lens module, and the polarization splitting element is located between the lens module and the liquid crystal on silicon element, so that the liquid crystal on silicon element is located in the lens module.
- the first back focus position of the group; the image sensor is located at the second back focus position of the lens module under the action of the polarization beam splitting element, and is used to assist in detecting the illumination light incident on the liquid crystal on silicon element distributed.
- the image sensor and the liquid crystal on silicon element are conjugated with respect to the polarization beam splitting element, so that the image sensor and the liquid crystal on silicon element respectively have the same focus on the lens module.
- the illumination light incident on the polarization beam splitting element includes a first beam and a second beam
- the first beam is reflected by the polarization beam splitting element, and exits to the liquid crystal on silicon element, and the second beam and output to the image sensor through the polarization splitting element.
- the image sensor corrects the transmittance to obtain the illumination light distribution on the liquid crystal on silicon element.
- the first light beam includes an S-state polarized light beam
- the second light beam includes a P-state polarized light beam
- a method for detecting illumination light including: at least a part of the light beam formed by the illumination light incident on the polarization beam splitting element is emitted to the image sensor.
- the transmittance of the polarization splitting element is corrected to obtain the illumination light information of the liquid crystal on silicon element.
- the at least part of the light beam formed by the illumination light incident on the polarization beam splitting element and emitted to the image sensor includes: deflecting the polarization of the illumination light of the S-state polarized light beam by a preset angle, so that part of the light beam is transformed into a P state polarized light beam; the P-state polarized light beam passes through the polarization beam splitting element and exits to the image sensor.
- the image sensor before at least a part of the light beam formed by the illumination light incident on the polarization beam splitting element is emitted to the image sensor, it also includes: adjusting the reflectivity of the image sensor to be less than or equal to a threshold, so as to reduce the image Reflected beam of the sensor.
- an auxiliary focusing method including: judging whether the light emitted by a point on the projection plane of the lens module can be focused on the image sensor, when the light emitted by a point on the projection plane is in focus on the image
- the image formed by the image points on the liquid crystal on silicon element can be imaged on the projection plane, and when the light emitted by a point on the projection plane cannot be in focus on the image sensor, The image formed by the image points on the liquid crystal on silicon element cannot be imaged on the projection plane; when the light emitted by a point on the projection plane of the lens module does not focus on the image sensor, Adjust the lens module to focus.
- the adjusting the focus of the lens module includes: obtaining the depth information of the projection plane through the phase focusing point of the image sensor; adjusting the position of the lens module according to the depth information to realize the focus of the lens module.
- an ambient light detection method comprising: the image sensor captures the projection screen of the lens module, acquires the brightness distribution of the corresponding area of the silicon-based liquid crystal element; and detects the environment based on the brightness distribution .
- the multiplexing lens projection device also includes a color wheel with spokes, and full-color display is realized through the rotation of the color wheel;
- the image sensor capturing the projection picture of the lens module includes: During the spoke time, turn off the illumination light and turn on the image sensor at the same time, so that the image sensor can obtain the brightness distribution of the ambient light.
- the image sensor capturing the projected picture of the lens module includes: the image sensor acquiring a captured image formed by superimposing ambient light and an image projected and imaged from the lens module; acquiring images from the lens module Projecting an imaged original image; comparing the captured image with the original image to obtain a brightness distribution of ambient light.
- a polarization beam splitting element is arranged behind the lens module, and the polarization beam splitting element is used to make the lens module have a symmetrical first back focus position and a second back focus position.
- FIG. 1 is a schematic structural view of a liquid crystal-on-silicon-based multiplex lens projection device provided in an embodiment of the present application;
- FIG. 2 is a schematic flowchart of an illumination light detection method for an image sensor in a multiplexed lens projection device based on a liquid crystal on silicon substrate provided by an embodiment of the present application;
- Fig. 3 is a detailed flow diagram of step S210 in the illumination light detection method provided by the embodiment of the present application.
- FIG. 4 is another schematic flowchart of the illumination light detection method provided in the embodiment of the present application.
- FIG. 5 is a schematic diagram of the illumination light detection structure of the image sensor in the multiplexed lens projection device based on liquid crystal on silicon provided by the embodiment of the present application;
- FIG. 6 is a schematic flowchart of an auxiliary focusing method for an image sensor in a multiplexed lens projection device based on liquid crystal on silicon provided by an embodiment of the present application;
- FIG. 7 is a schematic structural diagram of the auxiliary focusing of the image sensor in the multiplexed lens projection device based on liquid crystal on silicon provided by the embodiment of the present application;
- FIG. 8 is a detailed flowchart of step S330 in the method for assisting focus provided by the embodiment of the present application.
- FIG. 9 is a schematic diagram of phase focusing
- FIG. 10 is a schematic flowchart of an ambient light detection method for an image sensor in a multiplexed lens projection device based on liquid crystal on silicon provided by an embodiment of the present application;
- FIG. 11 is a schematic diagram of the ambient light detection structure of the image sensor in the multiplexed lens projection device based on liquid crystal on silicon provided by the embodiment of the present application;
- FIG. 12 is a schematic flowchart of step S410 in the ambient light detection method provided by the embodiment of the present application.
- Icons 100-multiplexing lens projection device; 110-lens module; 112-first back focus position; 114-second back focus position; 120-silicon-based liquid crystal element; 130-polarization beam splitting element; 150-initial beam; 160-projection plane; 162-ambient light.
- the projector uses a lens module to amplify the image generated by the spatial light modulator and then projects it out, thereby realizing a large-format display.
- Common spatial light modulators include LCD, LCoS (Liquid Crystal on Silicon, liquid crystal on silicon) and DMD.
- An embodiment of the present application provides a multiplexing lens projection device, by combining a PBS (polarized beam splitter, polarization beam splitter) with an LCoS.
- PBS polarized beam splitter, polarization beam splitter
- the lens module has two back focus positions. And one of the back focal plane positions is coplanar with the plane where the LCoS is located, and the other back focal plane position is coplanar with the plane where the CMOS (Complementary Metal-Oxide-Semiconductor, image sensor) is located.
- CMOS Complementary Metal-Oxide-Semiconductor
- the liquid crystal on silicon based multiplexed lens projection device 100 may include a lens module 110 , a liquid crystal on silicon element 120 , a polarization splitting element 130 and an image sensor 140 .
- the liquid crystal on silicon element 120 is arranged behind the lens module 110 , and the liquid crystal on silicon element 120 is located at the first back focus position 112 of the lens module 110 .
- the polarization beam splitting element 130 is located between the lens module 110 and the liquid crystal on silicon element 120, the second back focus position 114 of the lens module 110 is formed by the polarization beam splitting element 130, and the second back focus position 114 is connected to the first back focus position 112 Not located on the same plane, the image sensor 140 is located at the second back focus position 114 formed by the lens module 110 under the action of the polarization beam splitting element 130 , and the image sensor 140 is used to assist in adjusting the illumination light distribution incident on the liquid crystal on silicon element 120 .
- the lens module 110 By setting the polarization beam splitting element 130 behind the lens module 110, and the polarization beam splitting element 130 is located between the lens module 110 and the first back focus position 112 of the lens module 110, under the action of the polarization beam splitting element 130, the lens module
- the second back focus position 114 formed by 110 has characteristics symmetrical to the first back focus position 112 .
- the image sensor 140 is added, and the liquid crystal on silicon element 120 is arranged at the first back focus position 112 of the lens module 110, and the image sensor 140 is arranged at the second back focus of the lens module 110. position 114.
- the projection device can also be applied to fields such as illumination light detection, auxiliary focusing, and ambient light 162 detection, which is conducive to improving users' good experience of using the projection device.
- the image sensor 140 and the liquid crystal on silicon element 120 are conjugated with respect to the polarization splitting element 130 , so that the image sensor 140 and the liquid crystal on silicon element 120 respectively have the same focus on the lens module 110 .
- the illumination light illuminates the polarization beam splitting element 130 from the left side of the polarization beam splitting element 130 , and the initial light beam 150 passes through the polarization beam splitting element 130 and is reflected to the plane where the liquid crystal on silicon element 120 is located.
- the image light passing through the liquid crystal on silicon element 120 passes through the polarization splitting element 130 and exits from the lens module 110 . Since the image sensor 140 is arranged at the second back focus position 114 of the lens module 110, the image sensor 140 is used for sensing and imaging, and the distance between the image sensor 140 and the polarization beam splitting element 130 is the same as that between the liquid crystal on silicon element 120 and the polarization The distances between the light splitting elements 130 are the same.
- the liquid crystal on silicon element 120 and the image sensor 140 are strictly arranged at two rear focus positions of the lens module 110 , and the S-polarized light beam in the ambient light 162 can be reflected to the plane of the image sensor 140 through the polarization splitting element 130 . It is beneficial to conveniently read the image information of the ambient light 162 in the image sensor 140 .
- the illumination light adopts strict S-polarized light beams
- the S-polarized light beams incident on the polarization beam splitting element 130 will not exit on the image sensor 140 .
- the illumination light can be sensed and imaged by the image sensor 140 by slightly rotating the polarization direction of the illumination light so that it has an S-polarized light beam and some P-polarized light components.
- the initial light beam 150 of the illumination light is incident into the polarization beam splitting element 130 , and the first light beam and the second light beam will be formed by the polarization beam splitting element 130 .
- the first light beam is reflected by the polarization splitting element 130 , exits to the liquid crystal on silicon element 120 , and then is reflected by the liquid crystal on silicon element 120 to the lens module 110 for imaging.
- the second light beam can pass through the polarization beam splitting element 130 and directly output to the image sensor 140 , so that the image information of the ambient light 162 can be read out in the image sensor 140 .
- the first light beam may be an S-state polarized light beam
- the second light beam may be a P-state polarized light beam
- the liquid crystal on silicon-based multiplexed lens projection device 100 provided in the embodiment of the present application can also be used to realize illumination light detection, increase the focusing speed of the projector, and enhance the ability of projection when there is ambient light 162 . It can effectively improve the use experience of the projector in focusing, HDR and ambient light 162, and can be applied to high-performance projectors or ordinary household micro-projection products to improve product performance.
- the image sensor 140 in the liquid crystal on silicon based multiplex lens projection device 100 can also be used to detect the illumination light irradiated on the liquid crystal on silicon element 120 .
- the method of illumination light detection is as follows:
- FIG. 2 shows a frame diagram of the illumination light detection method.
- Step S210 at least part of the light beam formed by the illumination light incident on the polarization beam splitting element 130 is emitted to the image sensor 140 .
- the illumination light is emitted to the polarization beam splitting element 130 , and most of the light beam is reflected by the polarization beam splitting element 130 and then emitted to the liquid crystal on silicon element 120 .
- a small amount of light beams pass through the polarization splitting element 130 and enter the image sensor 140 .
- step S220 the transmittance of the polarization splitting element 130 is corrected to obtain illumination light information of the liquid crystal on silicon element 120 .
- the illumination light distribution on the liquid crystal on silicon element 120 can be obtained.
- At least part of the light beam formed by the illumination light incident on the polarization splitting element 130 and emitted to the image sensor 140 may include:
- Step S212 deflecting the polarization of the illumination light of the S-state polarized light beam by a predetermined angle, so that part of the light beam is transformed into a P-state polarized light beam.
- Step S214 the P-state polarized light beam passes through the polarization beam splitting element 130 and exits to the image sensor 140 .
- the polarization of the initial beam 150 emitted by the illumination light can be directly made into an inaccurate S-polarized beam, that is, the initial beam 150 is deflected by a preset angle, so that part of the initial beam 150 of the illumination light is converted into a P-state polarized beam, so that the image
- the sensor 140 can detect the P-state polarized light beam.
- the following method can also be used: theoretically speaking, when the initial beam 150 of the illuminating light is a perfect S-polarized parallel light source, the perfect polarization splitting The element 130 will completely reflect the S-polarized light beam to the liquid crystal on silicon element 120 , in this case, the image sensor 140 cannot detect and obtain the distribution information of the illumination light.
- the polarization splitting element 130 is not perfect.
- a part of the initial light beam 150 passes through the polarization beam splitting element 130 and exits onto the image sensor 140 , and after the transmittance is corrected by the polarization beam splitting element 130 , the illumination light distribution information on the liquid crystal on silicon element 120 can be obtained.
- step S210 it may also include:
- Step S230 adjusting the reflectivity of the image sensor 140 to be less than or equal to a threshold, so as to reduce the reflected beam of the image sensor 140 .
- the threshold is determined according to actual needs, and is not limited here, as long as the reflectivity of the image sensor 140 is adjusted to be low enough to minimize the reflected light beams on the surface of the image sensor 140 . Otherwise, when the reflectivity of the image sensor 140 is greater than the threshold, part of the reflected light beam of the image sensor 140 will leak out from the lens module 110 , which will affect the projected image, resulting in image quality degradation such as decreased contrast.
- the detection of illumination light using the multiplexed lens projection device 100 can be applied to a system that requires high picture quality. It is beneficial to detect the uniformity of illumination light and other qualities, and to correct the image in real time.
- the illumination light detection of the multiplex lens projection device 100 can also be applied to a projection system with a Local Dimming light source.
- the image sensor 140 can be used to directly detect the illumination light on the liquid crystal on silicon element 120, and then calculate the modulation that needs to match the output on the liquid crystal on silicon element 120, and realize The final picture.
- the illumination light passes through the polarization splitting element 130 and can be emitted to the positions of the liquid crystal on silicon element 120 and the image sensor 140 respectively.
- the reflection and transmission characteristics of the light beam emitted to the liquid crystal on silicon element 120 and the light beam emitted to the image sensor 140 on the polarization splitting element 130 are different.
- the illumination light distribution at the liquid crystal on silicon element 120 can be predicted from the brightness distribution sensed at the image sensor 140, thereby realizing HDR projection display.
- the transmittance and reflectance of the polarization beam splitting element 130 to the light beam in the P polarization state and the light beam in the S polarization state are different.
- there are many technical principles for realizing polarization splitting but none of them can achieve perfect polarization characteristics. That is, only the P-polarized light beam is transmitted, and only the S-polarized light beam is reflected.
- the polarization splitting element 130 has a certain transmittance and reflectivity for both the P-polarized light beam and the S-polarized light beam.
- the primary light beam 150 emitted by the illumination light is modulated into an S-polarized light beam by the polarization beam splitting element 130 .
- the reflectance and transmittance of the polarization beam splitting element 130 to the light beam in the S polarization state as Rs and Ts respectively, and the light intensity detected by the plane where the image sensor 140 is located is respectively: f(x, y), then there is the liquid crystal on silicon element 120
- the corresponding illumination light intensity above is: f(x, y)/Ts ⁇ Rs.
- the illumination light distribution of the initial light beam 150 emitted by the illumination light at the position of the liquid crystal on silicon element 120 and the position of the image sensor 140 is completely consistent.
- the illumination distribution on the liquid crystal on silicon element 120 can be directly detected. That is, the image sensor 140 in the multiplex lens projection device 100 can be used to judge whether the illumination beam on the liquid crystal on silicon element 120 is uniform. If the illuminating beam on the liquid crystal on silicon element 120 is not uniform, it can be corrected for the nonuniformity.
- the brightness distribution of the illumination light can be directly obtained, and then the intensity modulation that the liquid crystal on silicon element 120 needs to cooperate with can be calculated to realize HDR with better real-time effect Projection display system.
- the embodiment of the present application also provides an auxiliary focusing method for the image sensor 140 in the multiplexed lens projection device 100 based on liquid crystal on silicon.
- the auxiliary focusing method may include:
- Step S310 determining whether the light emitted by a point on the projection plane 160 of the lens module 110 can be in focus on the image sensor 140 .
- the image formed by the image points on the liquid crystal on silicon element 120 can be formed on the projection plane 160.
- the image formed by the image points on the liquid crystal on silicon element 120 cannot be formed on the projection plane 160 .
- the focus detection of the image sensor 140 can be used to help determine whether the lens module 110 of the liquid crystal on silicon element 120 is in focus.
- the image sensor 140 can be used to determine whether the light emitted by a point on the projection plane 160 of the lens module 110 can be in focus on the image sensor 140 .
- light emitted from a point on the projection plane 160 passes through the lens module 110 and the polarization splitting element 130 , and then exits into the image sensor 140 .
- the light emitted by this point cannot be focused on the image sensor 140 (as shown in the optical path diagram on the left side of Figure 7)
- the light emitted by the liquid crystal on silicon element 120 passes through the polarization beam splitting element 130 and exits through the lens module 110 Light rays cannot be imaged on the projection plane 160 either.
- the light emitted by this point can just focus on the image sensor 140 (as shown in the optical path diagram on the right side of Figure 7), the light emitted by the liquid crystal on silicon element 120 passes through the polarization beam splitting element 130 and then passes through the lens module.
- the rays emitted by the group 110 can also be imaged precisely on the projection plane 160 .
- Step S320 when the light emitted from a point on the projection plane 160 of the lens module is not in focus on the image sensor 140 , adjust the lens module 110 to focus.
- the lens module 110 needs to be adjusted so that the adjusted light beam can be focused on the image sensor 140 .
- the light emitted from the liquid crystal on silicon element 120 can also be imaged on the projection plane 160 .
- step S330 may include:
- step S331 the depth information on the projection plane 160 is obtained through the phase focusing point of the image sensor 140 .
- Step S333 adjusting the position of the lens module 110 according to the depth information, so as to realize the focusing of the lens module 110 .
- the focus detection of the image sensor 140 needs to be assisted by a mature technology, such as a phase focus point, etc., and the image sensor 140 with phase focus is used.
- a mature technology such as a phase focus point, etc.
- the image formed by the image points on the liquid crystal on silicon element 120 will not be on the projection plane 160. . Only when the image sensor 140 can accurately image a point on the projection plane 160 , can the image generated by the liquid crystal on silicon element 120 be accurately imaged on the projection plane 160 .
- the depth information can be quickly obtained through the phase focus point, and the obtained depth information is beneficial to accurately adjust the lens module 110 to make it focus accurately.
- the projected image of the liquid crystal on silicon element 120 is just in focus.
- the liquid crystal on silicon based multiplexed lens projection device 100 assisted focusing method provided by the embodiment of the present application can improve the focusing experience of the projector through the fast focusing capability of the phase-focused image sensor 140 .
- the image sensor 140 can continuously work to detect whether the focus is always accurate.
- fine-tuning of the lens module 110 can be performed to correct the focus of the image.
- the x-axis is the plane position of the image sensor 140
- the y-axis corresponds to the luminous flux intensity of the light spot.
- some phase-focused pixels are distributed in the image sensor 140 , and these special phase-focused pixels are shielded at the microlens layer, so that when the light beam is not well focused on the image sensor 140 , the position of the light spot will shift. Only when the center is well in focus can the parts on both sides coincide in the same position. When the focus is poor, the distance from accurate focus can be accurately judged by the position difference of the parts on both sides, and then the lens module 110 can be directly focused accurately through one adjustment.
- the phase-assisted focusing method provided by the embodiment of the present application can directly measure the accurate focusing position, which is beneficial to adjust the lens module 110, has a fast focusing response, and improves user experience.
- the picture observed by the human eye can be understood as the superposition of the ambient light 162 and the projected image light.
- the ambient light 162 will not only reduce the contrast of the projected image, but also cause various changes in color and uniformity of the projected picture.
- the liquid crystal on silicon based multiplex lens projection device 100 provided in the embodiment of the present application may be applied to detect ambient light 162 .
- the projected picture can be corrected according to the detected ambient light 162 to achieve a better display effect.
- the embodiment of the present application also provides a method for detecting ambient light 162, please refer to FIG. 10, the method for detecting ambient light 162 may include:
- Step S410 the image sensor 140 captures the projected image of the lens module 110 , and acquires the brightness distribution of the corresponding area of the liquid crystal on silicon element 120 .
- the image sensor 140 and the liquid crystal on silicon element 120 are in symmetrical positions with respect to the polarization splitting element 130, the angle of view captured by the image sensor 140 is completely consistent with the angle of view of the screen of the projection device, and the corresponding area of the liquid crystal on silicon element 120 can be obtained directly. Brightness distribution. This method does not need to consider various deformations caused by the parallax in the transmitted images of the image sensor 140 and the liquid crystal on silicon element 120 , especially when the projection plane 160 is not a plane but a curved surface or has undulations.
- Step S420 Detect the environment based on the brightness distribution.
- the multiplex lens projection device 100 may also include a color wheel with spokes, and a full-color display may be realized through the rotation of the color wheel.
- the image sensor 140 is turned on while the illumination light is turned off during the spoke time of the color wheel, so that the image sensor 140 acquires the brightness distribution of the ambient light 162 .
- the projection device of the single-chip liquid crystal on silicon element 120 realizes full-color display through the illumination rotation of the polarization beam splitting element 130 .
- step S410 may also include:
- Step S412 The image sensor 140 acquires a captured image formed by superimposing the ambient light 162 and the image projected from the lens module 110 .
- Step S414 Obtain the original image projected from the lens module 110 .
- Step S416 Comparing the captured image with the original image to obtain the brightness distribution of the ambient light 162 .
- the beneficial effects of the multiplexing lens projection device 100 provided in the embodiment of the present application may include:
- the projection lens module 110 is reused, and only one additional image sensor 140 needs to be added when realizing illumination light detection, and no additional lens module 110 devices need to be added, and the structure is simple.
- the image sensor 140 can assist the lens module 110 in focusing, so as to realize a faster projection focusing function. Through the detection of the illuminating light by the image sensor 140, it is possible to correct the projected image targeted for the illuminating light, or measure the illumination distribution of the light source with the Local Dimming function, and then obtain the matching image that the silicon-on-liquid crystal element 120 needs to produce to realize HDR display.
- the image sensor 140 detects the ambient light 162 to obtain information about the projection plane of the projection device, and uses the detected information to make targeted adjustments to the projection screen to achieve a projection effect with more accurate colors and better display effects, which is conducive to achieving a better projection effect.
- High performance projection system detects the ambient light 162 to obtain information about the projection plane of the projection device, and uses the detected information to make targeted adjustments to the projection screen to achieve a projection effect with more accurate colors and better display effects, which is conducive to achieving a better projection effect.
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Abstract
一种投影装置及照明光检测、辅助对焦和环境光检测方法,涉及投影设备技术领域。复用镜头投影装置包括镜头模组(110)、硅基液晶元件(120)、偏振分光元件(130)以及图像传感器(140)。硅基液晶元件(120)设置于镜头模组(110)的后方,偏振分光元件(130)位于镜头模组(110)和硅基液晶元件(120)之间,且使得硅基液晶元件(120)位于镜头模组(110)的第一后焦位置(112)。图像传感器(140)位于镜头模组(110)在偏振分光元件(130)作用下的第二后焦位置(114),且用于辅助调整入射在硅基液晶元件(120)上的照明光分布。有利于提升投影系统的投影图像性能,还可以应用于照明光检测、辅助对焦及环境光检测,提升用户的良好使用体验。
Description
本申请属于投影设备技术领域,更具体地,涉及一种投影装置及照明光检测、辅助对焦和环境光检测方法。
投影机是使用镜头模组将空间光调制器产生的图像进行放大然后投影出射,从而实现大画幅的显示。
常见的空间光调制器包括LCD、LCoS(Liquid Crystal on Silicon,硅基液晶)和DMD三种类型。。
如何将空间光调制器与图像传感器结合,以提升投影系统的投影性能。
发明内容
本申请的目的包括,例如,提供了一种投影装置及照明光检测、辅助对焦和环境光检测方法,以改善上述的问题。
本申请的实施例可以这样实现:
第一方面,提供一种基于硅基液晶的复用镜头投影装置,包括镜头模组、硅基液晶元件、偏振分光元件以及图像传感器。所述硅基液晶元件设置于所述镜头模组的后方,所述偏振分光元件位于所述镜头模组和所述硅基液晶元件之间,且使得所述硅基液晶元件位于所述镜头模组的第一后焦位置;所述图像传感器位于所述镜头模组在所述偏振分光元件作用下的第二后焦位置,且用于辅助检测入射在所述硅基液晶元件上的照明光分布。
进一步地,所述图像传感器和所述硅基液晶元件相对于所述偏振分光元件共轭,以使所述图像传感器和所述硅基液晶元件分别对所述镜头模组合焦相同。
进一步地,入射至所述偏振分光元件的照明光包括第一光束和第二光束,所述第一光束经所述偏振分光元件的反射,出射至所述硅基液晶元件,所述第二光束透过所述偏振分光元件出射至所述图像传感器。所述图像传感器通过修正透过率,以获得所述硅基液晶元件上的照明光分布。
进一步地,所述第一光束包括S态偏振光束,所述第二光束包括P态偏振光束。
第二方面,提供一种照明光检测方法,包括:入射至所述偏振分光元件的照明光形成的至少部分光束出射至所述图像传感器。修正所述偏振分光元件的透过率,获取所述硅基液晶元件的照明光信息。
进一步地,所述入射至所述偏振分光元件的照明光形成的至少部分光束出射至所述图像传感器包括:将S态偏振光束的照明光的偏振偏转预设角度,以使部分光束转变为P态偏振光束;所述P态偏振光束透过所述偏振分光元件,出射至所述图像传感器。
进一步地,在所述入射至所述偏振分光元件的照明光形成的至少部分光束出射至所述图像传感器之前,还包括:调节所述图像传感器的反射率小于或等于阈值,以减少所述图像传感器的反射光束。
第二方面,提供一种辅助对焦方法,包括:判断镜头模组的投影平面上的一点发出的光能否在所述图像传感器上合焦,当投影平面上的一点发出的光在所述图像传感器上合焦时,所述硅基液晶元件上的图像像点所成的像能在所述投影平面上成像,当投影平面上的一点发出的光不能在所述图像传感器上合焦时,所述硅基液晶元件上的图像像点所成的像不能在所述投影平面上成像;当所述镜头模组的投影平面上的一点发出的光没有在所述图像传感器上合焦时,调整镜头模组进行对焦。
进一步地,所述调整镜头模组进行对焦包括:通过所述图像传感器的相位对焦点获得投影平面的深度信息;根据所述深度信息调节所述镜头模组位置,实现镜头模组对焦。
第三方面,提供一种环境光检测方法,包括:所述图像传感器拍摄所述镜头模组的投影画面,获取所述硅基液晶元件对应区域的亮度分布;基 于所述亮度分布对环境进行检测。
进一步地,所述复用镜头投影装置还包括具有轮辐的色轮,通过所述色轮的转动实现全彩显示;所述图像传感器拍摄所述镜头模组的投影画面包括:在所述色轮的轮辐时间内,关闭照明光的同时开启所述图像传感器,以使所述图像传感器获取环境光的亮度分布。
进一步地,所述图像传感器拍摄所述镜头模组的投影画面包括:所述图像传感器获取由环境光和从所述镜头模组投影成像的图像叠加形成的拍摄图像;获取从所述镜头模组投影成像的原始图像;对比所述拍摄图像和所述原始图像,获得环境光的亮度分布。
本申请实施例提供的复用镜头投影装置,通过在镜头模组后方设置偏振分光元件,通过偏振分光元件以使镜头模组具有对称的第一后焦位置和第二后焦位置。通过将硅基液晶元件和图像传感器设置于两个后焦位置处,可以提升投影系统的投影图像性能,还可以将投影装置应用于照明光检测、辅助对焦及环境光检测等领域,有利于提升用户对该投影装置的良好使用体验。
为了更清楚地说明本申请实施例的技术方案,下面将对实施例中所需要使用的附图作简单地介绍,应当理解,以下附图仅示出了本申请的某些实施例,因此不应被看作是对范围的限定,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他相关的附图。
图1为本申请实施例提供的基于硅基液晶的复用镜头投影装置的结构示意图;
图2为本申请实施例提供的基于硅基液晶的复用镜头投影装置中图像传感器的照明光检测方法的流程示意图;
图3为本申请实施例提供的照明光检测方法中步骤S210的详细流程示意图;
图4为本申请实施例提供的照明光检测方法中的另一流程示意图;
图5为本申请实施例提供的基于硅基液晶的复用镜头投影装置中图像传感器的照明光检测结构示意图;
图6为本申请实施例提供的基于硅基液晶的复用镜头投影装置中图像传感器的辅助对焦方法的流程示意图;
图7为本申请实施例提供的基于硅基液晶的复用镜头投影装置中图像传感器的辅助对焦的结构示意图;
图8为本申请实施例提供的辅助对焦方法中步骤S330的详细流程示意图;
图9为相位对焦示意图;
图10为本申请实施例提供的基于硅基液晶的复用镜头投影装置中图像传感器的环境光检测方法的流程示意图;
图11为本申请实施例提供的基于硅基液晶的复用镜头投影装置中图像传感器的环境光检测结构示意图;
图12为本申请实施例提供的环境光检测方法中步骤S410的详细流程示意图。
图标:100-复用镜头投影装置;110-镜头模组;112-第一后焦位置;114-第二后焦位置;120-硅基液晶元件;130-偏振分光元件;140-图像传感器;150-初始光束;160-投影平面;162-环境光。
为使本申请实施例的目的、技术方案和优点更加清楚,下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本申请一部分实施例,而不是全部的实施例。通常在此处附图中描述和示出的本申请实施例的组件可以以各种不同的配置来布置和设计。
需要说明的是,在不冲突的情况下,本申请的实施例中的特征可以相互结合。
投影机是使用镜头模组将空间光调制器产生的图像进行放大然后投影 出射,从而实现大画幅的显示。常见的空间光调制器包括LCD、LCoS(Liquid Crystal on Silicon,硅基液晶)和DMD三种类型。
本申请实施例提供了一种复用镜头投影装置,通过将PBS(polarized beam splitter,偏振分光元件)与LCoS配合。以使投影装置的镜头模组在工作时,在PBS的作用下,镜头模组具有两个后焦位置。且其中一个后焦面位置与LCoS所在的平面共面,另外一个后焦面位置与CMOS(Complementary Metal-Oxide-Semiconductor,图像传感器)所在平面共面。
请参照图1,本申请实施例提供的基于硅基液晶的复用镜头投影装置100可以包括镜头模组110、硅基液晶元件120、偏振分光元件130及图像传感器140。
其中,硅基液晶元件120设置于镜头模组110的后方,且硅基液晶元件120位于镜头模组110的第一后焦位置112。偏振分光元件130位于镜头模组110和硅基液晶元件120之间,通过偏振分光元件130形成镜头模组110的第二后焦位置114,且第二后焦位置114与第一后焦位置112不位于同一平面,图像传感器140位于镜头模组110在偏振分光元件130作用下形成的第二后焦位置114上,图像传感器140用于辅助调整入射在硅基液晶元件120上的照明光分布。
通过在镜头模组110后方设置偏振分光元件130,且偏振分光元件130位于镜头模组110和镜头模组110的第一后焦位置112之间,在偏振分光元件130的作用下,镜头模组110形成的第二后焦位置114具有与第一后焦位置112对称的特性。
该复用镜头投影装置100中通过增加图像传感器140,且将硅基液晶元件120设置于镜头模组110的第一后焦位置112,将图像传感器140设置于镜头模组110的第二后焦位置114。不仅可以提升投影系统的投影图像性能,还可以将投影装置应用于照明光检测、辅助对焦及环境光162检测等领域,有利于提升用户对该投影装置的良好使用体验。
换句话说,图像传感器140和硅基液晶元件120相对于偏振分光元件130共轭,以使图像传感器140和硅基液晶元件120分别对镜头模组110的 合焦相同。
具体地,请继续参照图1,照明光从偏振分光元件130的左侧向偏振分光元件130照明,初始光束150经过偏振分光元件130后反射至硅基液晶元件120所在的平面。经过硅基液晶元件120的图像光透过偏振分光元件130后,从镜头模组110出射。由于在镜头模组110的第二后焦位置114设置有图像传感器140,图像传感器140用于传感和成像,且图像传感器140与偏振分光元件130之间的距离与硅基液晶元件120与偏振分光元件130之间距离相同。即硅基液晶元件120与图像传感器140严格的设置于镜头模组110的两个后焦位置处,环境光162中的S偏振态光束可以经过偏振分光元件130反射至图像传感器140的平面上。有利于方便的在图像传感器140中读取环境光162的图像信息。
可以理解的是,当照明光采用严格的S偏振态光束,则入射到偏振分光元件130上的S偏振态光束不会出射到图像传感器140上。这种情况下,可以通过略微旋转照明光的偏振方向,使其具有S偏振态光束的同时,也具有一些P偏振态的光分量,从而实现图像传感器140对照明光的传感和成像。
可选地,照明光的初始光束150入射至偏振分光元件130中,通过偏振分光元件130会形成第一光束和第二光束。第一光束经偏振分光元件130的反射,出射至硅基液晶元件120,然后经硅基液晶元件120反射至镜头模组110中进行成像。第二光束可以透过偏振分光元件130直接出射至图像传感器140中,从而可以在图像传感器140中读取出环境光162的图像信息。
可选地,第一光束可以为S态偏振光束,第二光束可以为P态偏振光束。
本申请实施例提供的基于硅基液晶的复用镜头投影装置100,还可以用于实现照明光检测、提高投影机的对焦速度和有环境光162时投影增强的能力。可以有效的提高投影机在对焦、HDR和有环境光162下的使用体验,可以应用在高性能投影机或普通家用微投产品之中,提高产品的性能。
下面分别对这三种功能进行描述:
基于硅基液晶的复用镜头投影装置100中的图像传感器140还可以用于检测照射在硅基液晶元件120上的照明光。照明光检测的方法如下:
请参照图2,所示为该照明光检测方法的框架图。
步骤S210,入射至偏振分光元件130的照明光形成的至少部分光束出射至图像传感器140。
照明光出射至偏振分光元件130上,大部分光束通过偏振分光元件130的反射,出射至硅基液晶元件120。少量的光束透过偏振分光元件130,入射至图像传感器140。
步骤S220,修正偏振分光元件130的透过率,获取硅基液晶元件120的照明光信息。
当少量光束入射至图像传感器140中时,通过对偏振分光元件130的透过率进行修正之后,可以获取到硅基液晶元件120上的照明光分布。
可选地,如图3,在上述步骤S210中,入射至偏振分光元件130的照明光形成的至少部分光束出射至图像传感器140可以包括:
步骤S212,将S态偏振光束的照明光的偏振偏转预设角度,以使部分光束转变为P态偏振光束。
步骤S214,P态偏振光束透过偏振分光元件130,出射至图像传感器140。
可以直接将照明光出射的初始光束150的偏振做成不准确的S偏振态光束,即将初始光束150偏转预设的角度,使得部分照明光的初始光束150转变为P态偏振光束,以使图像传感器140可以检测到P态偏振光束。
可以理解的是,除了上述的偏转预设角度的方法外,还可以采用下述方法:从理论上来讲,当照明光出射的初始光束150是完美的S偏振态平行光源时,完美的偏振分光元件130会将S偏振态光束完全反射至硅基液晶元件120上,在这种情况下,图像传感器140是无法检测获取到照明光的分布信息。然而,在实际使用过程中,一方面,由于照明光出射的初始 光束150存在一定的锥角;另一方面,偏振分光元件130也不是完美的。则会有一部分初始光束150透过偏振分光元件130出射到图像传感器140上,再经过偏振分光元件130对透过率的修正之后,就可以获得硅基液晶元件120上的照明光分布信息。
可选地,如图4,在上述步骤S210之前,还可以包括:
步骤S230,调节图像传感器140的反射率小于或等于阈值,以减少图像传感器140的反射光束。
值得注意的是,这里的阈值根据实际需求而定,此处不做限定,只要保证图像传感器140的反射率调节到足够低,尽量减少图像传感器140表面的反射光束。否则,当图像传感器140的反射率大于阈值时,图像传感器140的反射光束会有一部分从镜头模组110泄露出去,对投影画面产生影响,导致对比度下降等一些图像质量的劣化现象。
使用该复用镜头投影装置100的照明光检测可以应用于对画面图像质量要求较高的系统中。有利于检测照明光的均匀度等质量,并对图像进行实时的修正。
可选地,该复用镜头投影装置100的照明光检测还可以应用于具有Local Dimming光源的投影系统。
通过对Local Dimming投影技术的研究中心发现,由于制造光源时总存在一些不可控的装配误差等原因,使得Local Dimming在点亮部分或全部独立分区光源时,产生的照明光场与理论会存在一定的误差,这些误差会最终在画面上呈现出一些显示缺陷。
使用本申请提供的复用镜头投影装置100的照明光检测,可以使用图像传感器140直接检测到硅基液晶元件120上的照明光,进而计算出硅基液晶元件120上需要配合输出的调制,实现最终的画面。
例如,请参照图5,采用具有Local Dimming功能的照明光,照明光通过偏振分光元件130,可以分别出射至硅基液晶元件120和图像传感器140的位置上。且出射至硅基液晶元件120上的光束和出射至图像传感器140上的光束在偏振分光元件130上的反射和透射特性不同。经过修正之 后,就可以从图像传感器140处感应到的亮度分布来预测硅基液晶元件120处的照明光分布,从而实现HDR投影显示。
由于偏振分光元件130对P偏振态光束和S偏振态光束的透过率与反射率不同。目前,实现偏振分光的技术原理较多,但都不能实现完美的偏振特性。即只让P偏振态光束透射通过,只反射S偏振态光束,偏振分光元件130对P偏振态光束和S偏振态光束都有一定的透过率和反射率。
照明光出射的初始光束150,通过偏振分光元件130被调制为S偏振态光束。定义偏振分光元件130对S偏振态光束的反射率和透过率分别是Rs和Ts,图像传感器140所在平面探测到的光强分别为:f(x,y),则有硅基液晶元件120上对应的照明光强度为:f(x,y)/Ts×Rs。
在修正了偏振分光元件130的透过率之后,照明光出射的初始光束150在硅基液晶元件120位置处和图像传感器140位置处的照明光分布也完全一致。
因此,通过图像传感器140检测,可以直接检测到硅基液晶元件120上的照明分布。即可以用该复用镜头投影装置100中的图像传感器140判断硅基液晶元件120上的照明光束是否均匀。如果硅基液晶元件120上的照明光束不均匀,则可以针对不均匀处进行修正。或者,在采用了Local Dimming照明系统的硅基液晶元件120的投影中,可以直接获得照明光的亮度分布,进而计算出硅基液晶元件120需要配合实现的强度调制,实现实时效果更好的HDR投影显示系统。
往往在使用投影机的时候,投影机的良好对焦是保证用户良好观看体验的前提。然而,市场上许多投影机会存在对焦速度慢,对焦不准确的问题,甚至在使用一段时间后,存在热失焦的现象,影响投影的使用体验。
如图6,本申请实施例还提供了一种基于硅基液晶的复用镜头投影装置100中图像传感器140的辅助对焦方法,该辅助对焦方法可以包括:
步骤S310,判断镜头模组110的投影平面160上的一点发出的光能否在图像传感器140上合焦。
当投影平面160上的一点发出的光在图像传感器140上合焦时,硅基 液晶元件120上的图像像点所成的像能在投影平面160上成像。当投影平面160上的一点发出的光不能在图像传感器140上合焦时,硅基液晶元件120上的图像像点所成的像不能在投影平面160上成像。
由于图像传感器140和硅基液晶元件120相对于偏振分光元件130处于对称的位置,因此图像传感器140与硅基液晶元件120相对于镜头模组110而言,合焦性能完全一致。故可以通过图像传感器140的聚焦检测来辅助判断硅基液晶元件120的镜头模组110是否聚焦良好。换句话说,可以通过图像传感器140来判断镜头模组110的投影平面160上的一点所发出的光线,是否能够在图像传感器140上合焦。
请参照图7,投影平面160上的一点发出的光经过镜头模组110和偏振分光元件130后,出射至图像传感器140中。当该点发出的光不能在图像传感器140上合焦时(如图7左侧的光路图),则由硅基液晶元件120出射的光线透过偏振分光元件130后经镜头模组110出射的光线也不能在投影平面160上成像。相反地,当该点发出的光正好可以在图像传感器140上合焦时(如图7右侧的光路图),则由硅基液晶元件120出射的光线透过偏振分光元件130后经镜头模组110出射的光线也正好可以在投影平面160上成像。
步骤S320,当镜头模组的投影平面160上的一点发出的光没有在图像传感器140上合焦时,调整镜头模组110进行对焦。
当投影平面160上的一点发出的光不能在图像传感器140上合焦时,需要调节镜头模组110,以使调节后的光束可以在图像传感器140上合焦。同时,当调节后的光束可以在图像传感器140上合焦时,则硅基液晶元件120出射的光线也可以在投影平面160上成像。
进一步地,如图8,上述步骤S330可以包括:
步骤S331,通过图像传感器140的相位对焦点获得投影平面160上的深度信息。
步骤S333,根据深度信息调节镜头模组110位置,实现镜头模组110对焦。
图像传感器140的聚焦检测是需要采用成熟的技术进行辅助,例如相位对焦点等,采用具有相位对焦的图像传感器140。如前所述,由于图像传感器140和硅基液晶元件120相对于镜头模组110而言均处于镜头模组110的后焦位置,即等效处于同一个位置上。
在实际使用过程中,假设投影平面160上的一点发出的光无法在图像传感器140所在平面上合焦时,硅基液晶元件120上的图像像点所成的像也不会在投影平面160上。只有当图像传感器140能够准确的对投影平面160上一点成像时,硅基液晶元件120产生的图像才恰好准确的成像在投影平面160上。
使用具有相位对焦的图像传感器140,可以快速的通过相位对焦点得到深度信息,根据获得的深度信息有利于准确的调整镜头模组110,使其对焦准确。此时,硅基液晶元件120的投影画面也恰好合焦。
本申请实施例提供的基于硅基液晶的复用镜头投影装置100辅助对焦方法,通过相位对焦的图像传感器140的快速对焦能力,可以提升投影机的对焦体验。另外,投影机在工作过程中,图像传感器140可以通过持续的工作来检测是否始终对焦准确。当出现热失焦现象时,可以进行镜头模组110的微调,以修正画面的对焦情况。
如图9,x轴为图像传感器140平面位置,y轴对应光斑的光通量强度。可选地,在图像传感器140中分布一些相位对焦像素,这些特殊的相位对焦像素在微透镜层做了一定的遮挡,使得光束没有良好聚焦在图像传感器140上时,光斑的位置会发生位移。只有在中间良好合焦的地方,两侧部分才能重合在同一个位置上。而在对焦不良时,就能通过两侧部分位置的位置差大小,准确的判断出离准确对焦的差距,进而通过一次调节直接将镜头模组110对焦准确。
本申请实施例提供的相位辅助对焦方式,可以直接测量出准确对焦的位置,有利于调节镜头模组110,具有快速的对焦响应,提高了用户的使用体验。
由于外界环境光162会影响投影装置的使用效果,人眼观察到的画面 可以理解为环境光162与投影图像光的叠加。环境光162不仅会降低投影图像的对比度,还会使得投影画面出现颜色和均匀性的各种变化。
本申请实施例提供的基于硅基液晶的复用镜头投影装置100可以应用于对环境光162进行检测。可以根据检测出来的环境光162情况,对投影画面进行修正,以实现更佳的显示效果。
本申请实施例还提供了一种环境光162检测方法,请参照图10,该环境光162检测方法可以包括:
步骤S410:图像传感器140拍摄镜头模组110的投影画面,获取硅基液晶元件120对应区域的亮度分布。
由于图像传感器140和硅基液晶元件120相对于偏振分光元件130处于对称的位置,因此,图像传感器140所拍摄的视角与投影装置画面的视角完全一致,能够直接得到硅基液晶元件120对应区域的亮度分布。该方法不用考虑图像传感器140和硅基液晶元件120透射画面存在视差时导致的各种变形,尤其当投影平面160不是一个平面,而是曲面或者存在起伏的情况。
步骤S420:基于亮度分布对环境进行检测。
进一步地,该复用镜头投影装置100还可以包括具有轮辐的色轮,通过色轮的转动实现全彩显示。
请参照图11,环境光162检测方法中,在色轮的轮辐时间内,关闭照明光的同时,开启图像传感器140,以使图像传感器140获取环境光162的亮度分布。单片硅基液晶元件120的投影装置是通过偏振分光元件130照明轮转实现全彩显示。在色轮转的间隙存在小的轮辐,可以在轮辐关闭光源时,开启图像传感器140进行拍照,就可以仅捕获到环境光162的亮度分布。
可选地,请参照图12,步骤S410还可以包括:
步骤S412:图像传感器140获取由环境光162和从镜头模组110投影成像的图像叠加形成的拍摄图像。
步骤S414:获取从镜头模组110投影成像的原始图像。
步骤S416:对比拍摄图像和原始图像,获得环境光162的亮度分布。
获取原始画面的信息,通过图像传感器140拍摄获取环境光162与原始图像叠加之后的照片,通过图像传感器140拍摄最终的呈现画面效果之后,就可以通过原始画面与拍摄画面的差别得到环境光162的情况,进而实现画面修正。
本申请实施例提供的复用镜头投影装置100的有益效果可以包括:
复用了投影镜头模组110,在实现照明光检测时,仅需要增加一个额外的图像传感器140,不需要增加其他额外的镜头模组110装置,结构简单。
通过图像传感器140可以辅助镜头模组110对焦,实现更快速的投影调焦功能。通过图像传感器140对照明光的检测,可以针对照明光进行针对性的投影画面修正,或者测量具有Local Dimming功能光源的照明分布,进而得到硅基液晶元件120需要产生的配合图像,实现HDR显示。
通过图像传感器140检测环境光162,可以获得投影装置的投射平面的信息,利用检测到的信息对投影画面进行针对性的调整,实现色彩更准确,显示效果更佳的投影效果,有利于实现更高性能的投影系统。
最后应说明的是:以上实施例仅用以说明本申请的技术方案,而非对其限制;尽管参照前述实施例对本申请进行了详细的说明,本领域的普通技术人员当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不驱使相应技术方案的本质脱离本申请各实施例技术方案的精神和范围。
Claims (12)
- 一种基于硅基液晶的复用镜头投影装置,其特征在于,包括:镜头模组;硅基液晶元件,所述硅基液晶元件设置于所述镜头模组的后方;偏振分光元件,所述偏振分光元件位于所述镜头模组和所述硅基液晶元件之间,且使得所述硅基液晶元件位于所述镜头模组的第一后焦位置;以及图像传感器,所述图像传感器位于所述镜头模组在所述偏振分光元件作用下的第二后焦位置,且用于辅助调整入射在所述硅基液晶元件上的照明光分布。
- 根据权利要求1所述的基于硅基液晶的复用镜头投影装置,其特征在于,所述图像传感器和所述硅基液晶元件相对于所述偏振分光元件共轭,以使所述图像传感器和所述硅基液晶元件分别对所述镜头模组合焦相同。
- 根据权利要求1所述的基于硅基液晶的复用镜头投影装置,其特征在于,入射至所述偏振分光元件的照明光包括第一光束和第二光束,所述第一光束经所述偏振分光元件的反射,出射至所述硅基液晶元件,所述第二光束透过所述偏振分光元件出射至所述图像传感器;所述图像传感器通过修正透过率,以获得所述硅基液晶元件上的照明光分布。
- 根据权利要求3所述的基于硅基液晶的复用镜头投影装置,其特征在于,所述第一光束包括S态偏振光束,所述第二光束包括P态偏振光束。
- 一种采用权利要求1-4任一项所述的基于硅基液晶的复用镜头投影装置的照明光检测方法,其特征在于,包括:入射至所述偏振分光元件的照明光形成的至少部分光束出射至所述图像传感器;修正所述偏振分光元件的透过率,获取所述硅基液晶元件的照明光信息。
- 根据权利要求5所述的照明光检测方法,其特征在于,所述入射至所述偏振分光元件的照明光形成的至少部分光束出射至所述图像传感器包括:将S态偏振光束的照明光的偏振偏转预设角度,以使部分光束转变为P态偏振光束;所述P态偏振光束透过所述偏振分光元件,出射至所述图像传感器。
- 根据权利要求5所述的照明光检测方法,其特征在于,在所述入射至所述偏振分光元件的照明光形成的至少部分光束出射至所述图像传感器之前,还包括:调节所述图像传感器的反射率小于或等于阈值,以减少所述图像传感器的反射光束。
- 一种采用权利要求1-4任一项所述的基于硅基液晶的复用镜头投影装置的辅助对焦方法,其特征在于,包括:判断镜头模组的投影平面上的一点发出的光能否在所述图像传感器上合焦,当投影平面上的一点发出的光在所述图像传感器上合焦时,所述硅基液晶元件上的图像像点所成的像能在所述投影平面上成像,当投影平面上的一点发出的光不能在所述图像传感器上合焦时,所述硅基液晶元件上的图像像点所成的像不能在所述投影平面上成像;当所述镜头模组的投影平面上的一点发出的光没有在所述图像传感器上合焦时,调整镜头模组进行对焦。
- 根据权利要求8所述的辅助对焦方法,其特征在于,所述调整镜头模组进行对焦包括:通过所述图像传感器的相位对焦点获得投影平面的深度信息;根据所述深度信息调节所述镜头模组位置,实现镜头模组对焦。
- 一种采用权利要求1-4任一项所述的基于硅基液晶的复用镜头投影装置的环境光检测方法,其特征在于,包括:所述图像传感器拍摄所述镜头模组的投影画面,获取所述硅基液晶元件对应区域的亮度分布;基于所述亮度分布对环境进行检测。
- 根据权利要求10所述的环境光检测方法,其特征在于,所述复用镜头投影装置还包括具有轮辐的色轮,通过所述色轮的转动实现全彩显示;所述图像传感器拍摄所述镜头模组的投影画面包括:在所述色轮的轮辐时间内,关闭照明光的同时开启所述图像传感器,以使所述图像传感器获取环境光的亮度分布。
- 根据权利要求10所述的环境光检测方法,其特征在于,所述图像传感器拍摄所述镜头模组的投影画面包括:所述图像传感器获取由环境光和从所述镜头模组投影成像的图像叠加形成的拍摄图像;获取从所述镜头模组投影成像的原始图像;对比所述拍摄图像和所述原始图像,获得环境光的亮度分布。
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