WO2022267302A1 - Silicon material feeding method - Google Patents
Silicon material feeding method Download PDFInfo
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- WO2022267302A1 WO2022267302A1 PCT/CN2021/129494 CN2021129494W WO2022267302A1 WO 2022267302 A1 WO2022267302 A1 WO 2022267302A1 CN 2021129494 W CN2021129494 W CN 2021129494W WO 2022267302 A1 WO2022267302 A1 WO 2022267302A1
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- silicon material
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- feeding
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- silicon
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- 239000002210 silicon-based material Substances 0.000 title claims abstract description 271
- 238000000034 method Methods 0.000 title claims abstract description 85
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 110
- 239000010453 quartz Substances 0.000 claims description 106
- 238000002347 injection Methods 0.000 claims description 25
- 239000007924 injection Substances 0.000 claims description 25
- 239000002184 metal Substances 0.000 claims description 18
- 239000000203 mixture Substances 0.000 claims description 3
- 230000008569 process Effects 0.000 abstract description 51
- 229910021421 monocrystalline silicon Inorganic materials 0.000 abstract description 23
- 239000011800 void material Substances 0.000 abstract 1
- 239000013078 crystal Substances 0.000 description 24
- 239000000463 material Substances 0.000 description 20
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- 230000001050 lubricating effect Effects 0.000 description 8
- 239000007788 liquid Substances 0.000 description 5
- 230000002411 adverse Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000001125 extrusion Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 239000002699 waste material Substances 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000002893 slag Substances 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001311 chemical methods and process Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
Definitions
- the invention relates to the technical field of Czochralski single crystal silicon technology, in particular to a method for feeding silicon material.
- the Czochralski monocrystalline silicon process is a commonly used process in single crystal growth, and it is widely used in semiconductor integrated circuits, diodes, solar photovoltaics and other fields.
- the process of the Czochralski monocrystalline silicon process usually includes the initial installation of the crucible, re-injection and rod pulling, and after the initial installation of the crucible, the processes of re-injection and rod pulling will be repeated alternately for many times. It can be seen that the efficiency of the re-investment process can have a direct impact on the output efficiency of the Czochralski monocrystalline silicon process.
- a re-injection process usually includes multiple alternate charging steps and feeding steps, that is, firstly load the bulk silicon material into the charging space of the re-injection device, fill the charging space, and then place the massive silicon material When the material is put into the crucible to meet the feeding demand of a single single crystal silicon rod, a re-dosing process is completed.
- the un fallen silicon material needs to be taken out and re-cleaned before it can be used again. It can be seen that the material jam phenomenon will adversely affect the output efficiency of the Czochralski monocrystalline silicon process.
- quartz slag will be produced between the block silicon material and the re-introduction device, such as the block silicon material and the quartz cylinder, due to extrusion, and the quartz slag will increase the oxygen content in the silicon liquid after falling into the silicon liquid , affecting the quality of the silicon rods pulled out, in addition, it will also have a relatively large adverse effect on the service life of the re-throwing device.
- a method for feeding silicon material which is used for feeding a re-injection device to a crucible, the re-injection device includes a charging space, and the method for feeding silicon material comprises the steps of:
- the feeding method of the above-mentioned silicon material firstly, select the first type of silicon material and the second type of silicon material with different sizes for charging, and the second type of silicon material at least partially occupies the second type of silicon material.
- the gap between the first type of silicon materials increases the charging volume of the charging space, that is, increases the amount of silicon materials that are put into the crucible at a time, thereby reducing the number of times of feeding required to meet the feeding requirements, and improving the Czochralski unit. Yield efficiency of crystalline silicon process.
- the silicon material whose size is within the second preset range and has a smooth surface is selected as the second type of silicon material, so that the second type of silicon material is filled in the gap between the first type of silicon material
- it can also play a lubricating role in favor of the sliding of the first type of silicon material when feeding into the crucible in the charging space, reducing the possibility of the first type of silicon material jamming performance, further improving the output efficiency of the Czochralski monocrystalline silicon process.
- step S1 includes: selecting spherical or ellipsoidal silicon material as the second type of silicon material.
- step S1 includes:
- step S101 includes:
- the mass ratio of the first type of silicon material to the second type of silicon material in step S1 is 15:11-15:7.
- step S2 includes:
- step S2 includes: S204, step S202 and step S203 are alternately performed until the preset loading requirement of the loading space is met, and step S2 is ended.
- step S2 includes: S201, loading the second type of silicon material into the charging space, and laying it in an area of the charging space close to the feeding outlet.
- step S2 includes:
- step S202 Load the mixed silicon material in step S201 into the charging space.
- the re-introduction device includes a quartz cylinder with openings at both ends, a quartz thin tube fixed to the quartz cylinder and arranged coaxially with the quartz cylinder, located in the quartz thin tube A metal connecting rod inside and protruding from the opening at one end of the quartz cylinder, and a quartz cone head fixed to the metal connecting rod and positioned below the opening at the other end of the quartz cylinder; the metal The connecting rod can drive the quartz cone to move relative to the opening at the other end of the quartz cylinder;
- Step S2 includes: when the quartz cone abuts against the opening at the other end of the quartz cylinder, the surface of the quartz cone close to the quartz cylinder, the inner wall of the quartz cylinder, and the quartz capillary The outer wall of the tank forms a charging space;
- Step S3 includes: when the quartz conical head breaks away from the opening at the other end of the quartz cylinder and a gap appears, the first type of silicon material and the second type of silicon material in the charging space are separated by the Put the gap into the crucible.
- Fig. 1 is a schematic structural view of a re-throwing device and a single crystal furnace in an embodiment of the present invention
- Fig. 2 is a partial enlarged schematic diagram when the quartz cylinder falls on the upper surface of the quartz cone in an embodiment of the present invention
- Fig. 3 is a partial enlarged schematic diagram of position A (silicon material falling into the crucible) in Fig. 1;
- Fig. 4 is a partial enlarged schematic diagram when silicon material is housed in the charging space (the second type of silicon material is spherical silicon material) in an embodiment of the present invention
- Fig. 5 is a partially enlarged view of silicon material (the second type of silicon material includes spherical silicon material and ellipsoidal silicon material) in the charging space according to an embodiment of the present invention.
- Silicon liquid 100. Crucible; 200. Re-injection device; 210. Quartz cylinder; 220. Metal connecting rod; 230. Quartz cone head; 240. Quartz thin tube; Crystal furnace auxiliary room; 500, seed crystal weight; 20, first-class silicon material; 30, second-class silicon material.
- a crucible 100 usually needs to be used for about 300 hours, and the process of re-injection and rod pulling will be repeated about 10 times alternately, and then about 10 monocrystalline silicon rods will be produced.
- Each re-injection process usually includes multiple alternate charging steps and feeding steps. When the feeding requirements of a single single crystal silicon rod are met, a re-injection process is completed and the ingot pulling process is performed. After the rod pulling process of a single single crystal silicon rod is completed, the above-mentioned re-throwing process is repeated.
- the reinvestment device 200 adopted in the reinvestment process includes a quartz cylinder 210, a metal connecting rod 220 and a quartz cone 230, wherein the quartz cylinder 210 is a cylinder with openings at both ends, and the inner cavity of the quartz cylinder 210 A metal connecting rod 220 is arranged in the axial direction.
- One end of the metal connecting rod 220 protrudes from the upper opening of the quartz cylinder 210 and can be connected with the seed crystal weight 500, and the other end of the metal connecting rod 220 is connected to the quartz cone 230, which is located at the lower end of the quartz cylinder 210 below the opening.
- a quartz thin tube 240 is arranged inside the quartz cylinder 210 , and the metal connecting rod 220 is located inside the quartz thin tube 240 .
- the quartz cylinder 210 falls on the upper surface of the quartz cone 230 to support the quartz cylinder 210, the upper surface of the quartz cone 230, the inner wall of the quartz cylinder 210, and the quartz fine
- the outer wall of the tube 240 constitutes a space for containing the silicon material, and the silicon material is loaded into the above-mentioned space.
- move the re-injection device 200 to the lower end of the auxiliary chamber 400 of the single crystal furnace then lower the seed crystal weight 500 and connect the metal connecting rod 220 so that the seed crystal weight 500 is suspended by the metal connecting rod 220 for re-injection
- the device 200 rises and slowly lifts into the sub-chamber 400 of the single crystal furnace.
- the sub-chamber 400 of the single crystal furnace is turned back to the top of the main room 300 of the single crystal furnace, and the sub-chamber 400 of the single crystal furnace is lowered to connect with the main room 300 of the single crystal furnace.
- the throwing device 200 slowly enters the main chamber 300 of the single crystal furnace.
- the quartz cylinder 210 When the single crystal furnace supports the quartz cylinder 210, the quartz cylinder 210 will stop falling, and the metal connecting rod 220 and the quartz cone 230 will continue to descend under the drive of the seed crystal weight 500, and the upper surface of the quartz cone 230 will break away from the quartz
- the lower end of the cylinder 210 is open, and the silicon material leaks from the quartz cylinder 210 through the gap between the upper surface of the quartz cone 230 and the lower end of the quartz cylinder 210 , and falls into the crucible 100 .
- the re-injection device 200 After the silicon material is completely removed, the re-injection device 200 is lifted into the sub-chamber 400 of the single crystal furnace, and the re-injection device 200 is taken out to complete the single-cylinder feeding process.
- Each re-injection requires multiple single-cylinder charging and single-cylinder feeding, namely Carry out the above operation steps several times until the feeding weight reaches the feeding requirement for re-dosing.
- the silicon material used for single crystal re-investment comes from dense rod-shaped material and single crystal circulating material. Since the diameter of the above two silicon materials is more than 150mm, the inner wall radius of the quartz cylinder 210 is usually about 110mm, so the dense Both rod-shaped material and single crystal recycled material need to be crushed before they can be used as silicon materials for re-use. Due to the high hardness of silicon, it is more difficult to crush dense rod-shaped materials and single crystal recycled materials. The smaller the crushing size, the higher the man-hours and energy consumption required, and the more easily the silicon materials are polluted by the environment and crushing tools.
- the size of the silicon material used for single crystal re-use is usually limited to 50mm.
- the amount of material loaded in a single cylinder is small and the number of cylinders is large during each re-injection, resulting in a long process time and affecting production efficiency.
- the silicon material collides and squeezes in the quartz cylinder, it will cause some of the silicon material to scratch the quartz cylinder 210 at a sharp angle, causing the inner surface of the quartz cylinder 210 to The quartz falls off and falls into the silicon liquid 10 in the crucible 100 as the silicon material falls, resulting in an increase in the oxygen content in the silicon liquid 10 , which affects subsequent crystal pulling and also affects the service life of the quartz cylinder 210 .
- the feeding method of silicon material provided by an embodiment of the present invention is used for feeding the crucible from the re-feeding device, and the re-feeding device includes a charging space, including steps:
- a silicon material whose size is within a second preset range and has a smooth surface is selected as the second type of silicon material 30 , wherein the minimum value of the first preset range is greater than the maximum value of the second preset range.
- the second-type silicon material 30 at least partially occupies the space between the first-type silicon materials 20 .
- the feeding method of the above-mentioned silicon material in order to improve the output efficiency of the Czochralski monocrystalline silicon process, one, select the first type silicon material 20 and the second type silicon material 30 with different sizes for charging, and the second type silicon material 30 Occupying at least part of the space between the first type of silicon materials 20 increases the amount of material in the charging space, that is, increases the amount of silicon material that is put into the crucible at a time, thereby reducing the number of times of feeding required to meet the feeding requirements.
- the output efficiency of the Czochralski monocrystalline silicon process is improved.
- the silicon material with a size within the second preset range and with a smooth surface is selected as the second type silicon material 30, so that the second type silicon material 30 is filled between the first type silicon materials 20.
- the way of the gap in addition to the effect of increasing the charging amount of the charging space, can also play a lubricating role in favor of the sliding of the first type of silicon material 20 when the charging space feeds the crucible, reducing the amount of the first type of silicon.
- the probability of collision and extrusion between the materials 20 reduces the possibility of the first type of silicon material 20 jamming, and further improves the output efficiency of the Czochralski monocrystalline silicon process.
- the Czochralski monocrystalline silicon process includes alternate re-injection processes and rod-drawing processes, wherein the re-injection process includes the above-mentioned feeding method of silicon material, and the rod-drawing process includes: when the input in step S4 meets the preset feeding requirements of the crucible, Stop feeding, pull rods, and produce monocrystalline silicon rods. After the rod pulling process is completed, the above steps S1-S4 are repeated.
- the charging space includes a space formed by the upper surface of the quartz cone 230 , the inner wall of the quartz cylinder 210 , and the outer wall of the quartz thin tube 240 .
- the silicon material whose size is within the first predetermined range is selected as the first type of silicon material 20
- the silicon material whose size is within the second predetermined range is selected as the second type of silicon material
- the specific manner of 30 may be to use screens of different meshes to screen the silicon material.
- the sieve corresponding to the maximum value of the first/second preset interval to screen the silicon material select the silicon material that can pass through the sieve, and use the sieve corresponding to the minimum value of the first/second preset interval
- the silicon material is screened, and the silicon material that cannot pass through the sieve is selected.
- the first preset interval range is 40mm-50mm, that is, the silicon material with a size larger than 40mm and smaller than 50mm is selected as the first type of silicon material 20, and the silicon material is screened with a screen with an aperture of 50mm.
- the silicon material of the screen Further use a sieve with an aperture of 40mm to screen the silicon material, and select the silicon material that cannot pass through the sieve.
- the first preset range can also be set in other ways according to requirements.
- the preset feeding demand of the crucible can satisfy the feeding amount (weight) of a single single crystal silicon rod or rod, or other settings as required.
- step S1 includes: selecting a spherical or ellipsoidal silicon material as the second type of silicon material 30 .
- the size ratio between the first type of silicon material 20 and the second type of silicon material 30 in the figure is only for illustration, and the size of the second type of silicon material 30 actually used is much smaller than that of the first type of silicon material 20 .
- the second type of silicon material 30 can be granular silicon material with a size within 4 mm and an average particle size of about 2 mm.
- the granular silicon material is usually spherical or ellipsoidal, and has a smooth surface.
- the material when the material is fed into the crucible in the charging space, it can lubricate the first type of silicon material 20 to slide down.
- the metal connecting rod 220 and the quartz cone 230 continue to descend under the drive of the seed crystal weight 500, and the upper surface of the quartz cone 230 is separated from the lower opening of the quartz cylinder 210, the first type The silicon material 20 and the second type silicon material 30 leak from the quartz cylinder 210 through the gap between the upper surface of the quartz cone 230 and the lower opening of the quartz cylinder 210.
- the second type of silicon material 30 is relatively small to the first type of silicon.
- the lubricating effect of the material 20 is particularly critical, which is conducive to the smooth input of the first type silicon material 20 at the bottom into the crucible.
- the second type of silicon material 30 all has a certain lubricating effect on the first type of silicon material 20.
- the second type of silicon material 30 can be between the first type of silicon material 20, between the first type of silicon material 20 and the re-injection device 200, especially between the first type of silicon material 20 and the cone surface on the top of the quartz cone head 230 Play a lubricating role, reduce the possibility of 20 jams of the first type of silicon material, and improve the output efficiency of the Czochralski monocrystalline silicon process.
- step S1 includes:
- step S101 determines the maximum value of the first preset interval according to the size of the feeding inlet of the charging space.
- step S101 includes: controlling the maximum value of the selected first preset interval to be less than or equal to half of the feeding inlet size of the charging space.
- the size of the feeding inlet refers to the minimum cross-sectional size of the feeding inlet, and re-feeding devices 200 of different sizes have different feeding inlet sizes.
- the size of the feeding inlet is the radius of the space enclosed by the inner wall of the quartz cylinder.
- the size of the feeding inlet is the radius of the inner wall of the quartz cylinder 210 The difference from the outer wall radius of the quartz thin tube 240.
- the feeding inlet size of the charging space is 110mm-10mm
- the maximum value of the first preset interval is less than or It is equal to 50mm, that is, the size of the first type silicon material 20 is controlled below half of the size of the feeding inlet of the charging space, so that two pieces of the first type silicon material 20 can freely fall in the quartz cylinder, thereby reducing the size to a certain extent.
- the possibility of material jam phenomenon is small.
- the specific determination method in step S101 can also be selected according to needs.
- step S102 determines the second preset interval according to the maximum value of the first preset interval the maximum value. Taking the maximum value of the first preset interval as 50 mm as an example, determine the maximum value of the second preset interval to control the average particle size of the second type of silicon material 30 within the selected second preset interval is 2mm. In this way, the second type of silicon material 30 can easily enter the gap between the first type of silicon material 20 .
- the mass ratio of the first type silicon material 20 to the second type silicon material 30 in step S1 is 15:11-15:7.
- the feeding method of the above-mentioned silicon material can increase the charging amount of the charging space to a large extent.
- the feeding method of silicon material includes: S1, selecting a block silicon material with a size within 50mm (that is, the maximum value of the first preset range is 50mm) as the first type of silicon material 20, selecting a size within 4mm, And the granular silicon material with an average particle size of 2mm is used as the second type silicon material 30; when the mass ratio of the first type silicon material 20 and the second type silicon material 30 is loaded in the mode of 15:7, the inner wall radius is 110mm,
- the first type of silicon material 20 in the quartz cylinder 210 with a height of 185 cm can be loaded with 75 kg
- the second type of silicon material 30 can be loaded with 35 kg, that is, a single cylinder can be loaded with 110 kg.
- the mass ratio of the first type of silicon material 20 to the second type of silicon material 30 is 15:11
- the first type of silicon material 20 in the quartz cylinder 210 with an inner wall radius of 110 mm and a height of 185 cm can hold 75 kilograms
- the second type of silicon material 30 can be loaded into 55 kilograms, that is, 130 kilograms in a single cylinder.
- the above method is more conducive to reducing space waste, that is, increasing the amount of silicon material input at a time, reducing the need to meet The number of feeds required by the feeding requirements, thereby improving the output efficiency of the Czochralski monocrystalline silicon process.
- step S2 includes:
- step S2 includes: S204, step S202 and step S203 are alternately performed until the preset loading requirement of the loading space is met, and step S2 is ended.
- step S2 further includes: dividing the first type of silicon material 20 selected in step S1 into at least two parts according to size, and performing step S202 and step S203 alternately, The first type of silicon material 20 with smaller size is given priority.
- the block silicon material of 30mm-50mm selected in step S1 as an example, it can be divided into four parts of 30mm-35mm, 35mm-40mm, 40mm-45mm, and 45mm-50mm, and the block silicon material of 30mm-35mm is given priority. Finally, put in 45mm-50mm block silicon material.
- the first type of silicon material with a smaller size can be loaded at the bottom within a relatively small opening.
- the silicon material 20 mixed with the second type of silicon material 30 enters the crucible, which makes feeding more smoothly, further reduces the possibility of material jam, and improves the efficiency of feeding.
- step S2 includes: S201, loading the second type of silicon material 30 into the charging space, and laying it in the area of the charging space near the feeding outlet.
- the feeding method of the above-mentioned silicon material is to facilitate the sliding of the first-type silicon material 20 at the bottom of the charging space, and further reduce the possibility of material jamming.
- the second type of silicon material 30 is loaded into the charging space to form the first type of silicon material layer laid at the bottom of the charging space.
- Lubricate the first type silicon material 20 at the bottom It should be noted that the laying area of the second type of silicon material 30 can be selected according to the feeding outlet form of the charging space.
- step S2 includes:
- step S202 Load the mixed silicon material in step S201 into the charging space.
- the feeding method of the above-mentioned silicon material is to first mix the first type silicon material 20 and the second type silicon material 30 and then load them into the charging space together.
- the way of the second type of silicon material 30, the mixing of two kinds of silicon materials of different sizes is more uniform in this way, on the one hand, further increases the charging capacity of the charging space, on the other hand, the second type of silicon material 30 in the second One type of silicon material 20 can play a better lubricating effect.
- first and second are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features.
- the features defined as “first” and “second” may explicitly or implicitly include at least one of these features.
- “plurality” means at least two, such as two, three, etc., unless otherwise specifically defined.
- the first feature may be in direct contact with the first feature or the first and second feature may be in direct contact with the second feature through an intermediary. touch.
- “above”, “above” and “above” the first feature on the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature.
- “Below”, “beneath” and “beneath” the first feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is less horizontally than the second feature.
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Abstract
A method for feeding a silicon material, comprising: S1, selecting silicon material having a size within a first preset range as a first type of silicon material, and selecting silicon material having a size within a second preset range and having a smooth surface as a second type of silicon material, a minimum value of the first preset range being greater than a maximum value of the second preset range; S2, loading the first type of silicon material and the second type of silicon material into a loading space, the second type of silicon material at least partially occupying a void between the first type of silicon material; S3, feeding the first type of silicon material and the second type of silicon material from the charging space into a crucible; S4, if the feeding does not meet a preset feeding requirement of the crucible, repeating steps S2 and S3 until the feeding requirement is met, and then stopping feeding. The described feeding method improves the output efficiency of a Czochralski monocrystalline silicon process.
Description
本发明涉及直拉单晶硅工艺技术领域,特别是涉及一种硅料的投料方法。The invention relates to the technical field of Czochralski single crystal silicon technology, in particular to a method for feeding silicon material.
直拉单晶硅工艺是单晶生长中较为常用的一种工艺,其广泛应用于半导体集成电路、二极管、太阳能光伏等领域。直拉单晶硅工艺的工序通常包括坩埚初装、复投及拉棒,并且在完成坩埚初装后,复投与拉棒的工序会交替重复多次。由此可见,复投工序的效率能够对直拉单晶硅工艺的产出效率产生直接的影响。The Czochralski monocrystalline silicon process is a commonly used process in single crystal growth, and it is widely used in semiconductor integrated circuits, diodes, solar photovoltaics and other fields. The process of the Czochralski monocrystalline silicon process usually includes the initial installation of the crucible, re-injection and rod pulling, and after the initial installation of the crucible, the processes of re-injection and rod pulling will be repeated alternately for many times. It can be seen that the efficiency of the re-investment process can have a direct impact on the output efficiency of the Czochralski monocrystalline silicon process.
目前,一次复投工序通常包括多次交替进行的装料步骤及投料步骤,即先向复投装置的装料空间内部装入块状硅料,将装料空间装满后再将块状硅料投入坩埚内,满足单根单晶硅棒的投料需求时,即完成了一次复投工序。At present, a re-injection process usually includes multiple alternate charging steps and feeding steps, that is, firstly load the bulk silicon material into the charging space of the re-injection device, fill the charging space, and then place the massive silicon material When the material is put into the crucible to meet the feeding demand of a single single crystal silicon rod, a re-dosing process is completed.
然而,上述的复投工序中,装料空间内部装入块状硅料,块状硅料之间存在较大的空隙,造成了较大的空间浪费,单次投入的硅料数量较少,复投工序的效率降低,复投次数增多,进而降低了直拉单晶硅工艺的产出效率。另一方面,块状硅料在投料步骤中容易出现卡料现象,即硅料未能下落至坩埚内,需要将复投装置提出后重新装料,进行复投工序。而未能下落的硅料需要取出后重新清洗后才能再次使用,可见卡料现象会对直拉单晶硅工艺的产出效率造成不利影响。另外,在投料步骤中,块状硅料与复投装置,例如块状硅料与石英筒,之间会因挤压产生石英渣,石英渣掉入硅液后会增加硅液中的氧含量,影响所拉出的硅棒的品质,另外,还会对复投装置的使用寿命产生较大的不利影 响。However, in the above-mentioned re-introduction process, bulk silicon materials are loaded into the charging space, and there are large gaps between the bulk silicon materials, resulting in a large waste of space, and the amount of silicon materials injected at a time is small. The efficiency of the re-investment process is reduced, and the number of re-investments is increased, which in turn reduces the output efficiency of the Czochralski monocrystalline silicon process. On the other hand, bulk silicon material is prone to material jamming during the feeding step, that is, the silicon material fails to fall into the crucible, and the re-injection device needs to be lifted out and reloaded to carry out the re-injection process. The unfallen silicon material needs to be taken out and re-cleaned before it can be used again. It can be seen that the material jam phenomenon will adversely affect the output efficiency of the Czochralski monocrystalline silicon process. In addition, in the feeding step, quartz slag will be produced between the block silicon material and the re-introduction device, such as the block silicon material and the quartz cylinder, due to extrusion, and the quartz slag will increase the oxygen content in the silicon liquid after falling into the silicon liquid , affecting the quality of the silicon rods pulled out, in addition, it will also have a relatively large adverse effect on the service life of the re-throwing device.
发明内容Contents of the invention
基于此,有必要针对直拉单晶硅工艺中单次投料量低以及卡料造成的产出效率较低,对复投装置的使用寿命产生较大的不利影响的问题,提供一种硅料的投料方法。Based on this, it is necessary to provide a silicon material for the problems of low single feeding amount and low output efficiency caused by material jams in the Czochralski monocrystalline silicon process, which have a relatively large adverse effect on the service life of the re-injection device. feeding method.
一种硅料的投料方法,用于复投装置向坩埚的投料,所述复投装置包括装料空间,所述硅料的投料方法包括步骤:A method for feeding silicon material, which is used for feeding a re-injection device to a crucible, the re-injection device includes a charging space, and the method for feeding silicon material comprises the steps of:
S1、选择尺寸在第一预设区间范围内的硅料作为第一类硅料,S1. Select the silicon material whose size is within the first preset range as the first type of silicon material,
选择尺寸在第二预设区间范围内、且具有圆滑表面的硅料作为第二类硅料,其中所述第一预设区间范围的最小值大于所述第二预设区间范围的最大值;Selecting a silicon material with a size within a second preset range and having a smooth surface as the second type of silicon material, wherein the minimum value of the first preset range is greater than the maximum value of the second preset range;
S2、将所述第一类硅料及所述第二类硅料装入装料空间,所述第二类硅料至少部分占据所述第一类硅料之间的空隙;S2. Loading the first-type silicon material and the second-type silicon material into the charging space, the second-type silicon material at least partially occupying the space between the first-type silicon materials;
S3、将所述装料空间内的所述第一类硅料及所述第二类硅料投入坩埚;S3. Putting the first type of silicon material and the second type of silicon material in the charging space into the crucible;
S4、若投入不满足所述坩埚预设的投料需求,重复步骤S2、步骤S3,直至满足所述投料需求停止投料。S4. If the feeding does not meet the preset feeding requirements of the crucible, repeat steps S2 and S3 until the feeding requirements are met and stop feeding.
上述硅料的投料方法,为了提高直拉单晶硅工艺的产出效率,其一,选择尺寸不同的第一类硅料及第二类硅料进行装料,第二类硅料至少部分占据第一类硅料之间的空隙,增大了装料空间的装料量,即增多了单次投入坩埚的硅料量,进而减少了为满足投料需求所需要的投料次数,提高了直拉单晶硅工艺的产出效率。其二,选择尺寸在第二预设区间范围内、且具有圆滑表面的硅料作为第二类硅料,也就使得将第二类硅料填充在第一类硅料之间的空隙的方式除了起到增大装料空间的装料量的作用以外,还能够在装料空间向坩埚投料时, 起到利于第一类硅料滑落的润滑作用,降低第一类硅料卡料的可能性,进一步提高了直拉单晶硅工艺的产出效率。In order to improve the output efficiency of the Czochralski monocrystalline silicon process, the feeding method of the above-mentioned silicon material, firstly, select the first type of silicon material and the second type of silicon material with different sizes for charging, and the second type of silicon material at least partially occupies the second type of silicon material. The gap between the first type of silicon materials increases the charging volume of the charging space, that is, increases the amount of silicon materials that are put into the crucible at a time, thereby reducing the number of times of feeding required to meet the feeding requirements, and improving the Czochralski unit. Yield efficiency of crystalline silicon process. Second, the silicon material whose size is within the second preset range and has a smooth surface is selected as the second type of silicon material, so that the second type of silicon material is filled in the gap between the first type of silicon material In addition to increasing the charging capacity of the charging space, it can also play a lubricating role in favor of the sliding of the first type of silicon material when feeding into the crucible in the charging space, reducing the possibility of the first type of silicon material jamming performance, further improving the output efficiency of the Czochralski monocrystalline silicon process.
下面对本申请的技术方案作进一步说明:The technical scheme of the present application is described further below:
在其中一个实施例中,步骤S1包括:选择球状或椭球状的硅料作为所述第二类硅料。In one embodiment, step S1 includes: selecting spherical or ellipsoidal silicon material as the second type of silicon material.
在其中一个实施例中,步骤S1包括:In one of the embodiments, step S1 includes:
S101、根据所述装料空间的投料入口尺寸确定第一预设区间范围的最大值;S101. Determine the maximum value of the first preset interval according to the size of the feeding inlet of the charging space;
S102、根据第一预设区间范围的最大值确定所述第二预设区间范围的最大值。S102. Determine the maximum value of the second preset interval range according to the maximum value of the first preset interval range.
在其中一个实施例中,步骤S101包括:In one of the embodiments, step S101 includes:
控制所选择的所述第一预设区间范围的最大值小于或等于二分之一的所述装料空间的投料入口尺寸。Controlling the size of the feeding inlet of the charging space where the maximum value of the selected first preset range is less than or equal to half.
在其中一个实施例中,步骤S1中第一类硅料与第二类硅料的质量比为15:11-15:7。In one embodiment, the mass ratio of the first type of silicon material to the second type of silicon material in step S1 is 15:11-15:7.
在其中一个实施例中,步骤S2包括:In one of the embodiments, step S2 includes:
S202、将所述第一类硅料装入所述装料空间,并使在所述第一类硅料之间形成空隙;S202. Load the first type of silicon material into the charging space, and form gaps between the first type of silicon materials;
S203、将所述第二类硅料装入所述装料空间,以使所述第二类硅料至少部分下落/下滑至所述第一类硅料之间的空隙内。S203. Load the second type of silicon material into the charging space, so that the second type of silicon material at least partially falls/slides into the gap between the first type of silicon materials.
在其中一个实施例中,步骤S2包括:S204、交替进行步骤S202及步骤S203,直至满足所述装料空间预设的装料需求,结束步骤S2。In one embodiment, step S2 includes: S204, step S202 and step S203 are alternately performed until the preset loading requirement of the loading space is met, and step S2 is ended.
在其中一个实施例中,步骤S2包括:S201、将所述第二类硅料装入所述装料空间,且铺设于所述装料空间的靠近投料出口的区域。In one embodiment, step S2 includes: S201, loading the second type of silicon material into the charging space, and laying it in an area of the charging space close to the feeding outlet.
在其中一个实施例中,步骤S2包括:In one of the embodiments, step S2 includes:
S201、将所述第一类硅料与所述第二类硅料混合得到混合硅料;S201. Mix the first type of silicon material with the second type of silicon material to obtain a mixed silicon material;
S202、将步骤S201中的所述混合硅料装入所述装料空间。S202. Load the mixed silicon material in step S201 into the charging space.
在其中一个实施例中,所述复投装置包括两端开口的石英筒体,固定于所述石英筒体、且与所述石英筒体同轴设置的石英细管,位于所述石英细管内部、且从所述石英筒体的一端的开口伸出的金属连杆,及固定于所述金属连杆、且位于所述石英筒体的另一端的开口下方的石英锥头;所述金属连杆能够带动所述石英锥头相对于所述石英筒体的另一端的开口移动;In one of the embodiments, the re-introduction device includes a quartz cylinder with openings at both ends, a quartz thin tube fixed to the quartz cylinder and arranged coaxially with the quartz cylinder, located in the quartz thin tube A metal connecting rod inside and protruding from the opening at one end of the quartz cylinder, and a quartz cone head fixed to the metal connecting rod and positioned below the opening at the other end of the quartz cylinder; the metal The connecting rod can drive the quartz cone to move relative to the opening at the other end of the quartz cylinder;
步骤S2包括:当所述石英锥头抵接于所述石英筒体的另一端的开口时,所述石英锥头的靠近所述石英筒体的表面、石英筒体的内壁、及石英细管的外壁形成装料空间;Step S2 includes: when the quartz cone abuts against the opening at the other end of the quartz cylinder, the surface of the quartz cone close to the quartz cylinder, the inner wall of the quartz cylinder, and the quartz capillary The outer wall of the tank forms a charging space;
步骤S3包括:当所述石英锥头脱离所述石英筒体的另一端的开口、且出现间隙后,所述装料空间内的所述第一类硅料及所述第二类硅料由所述间隙投入坩埚。Step S3 includes: when the quartz conical head breaks away from the opening at the other end of the quartz cylinder and a gap appears, the first type of silicon material and the second type of silicon material in the charging space are separated by the Put the gap into the crucible.
图1为本发明一实施例中复投装置与单晶炉的结构示意图;Fig. 1 is a schematic structural view of a re-throwing device and a single crystal furnace in an embodiment of the present invention;
图2为本发明一实施例中石英筒体落在石英锥头的上表面时的局部放大示意图;Fig. 2 is a partial enlarged schematic diagram when the quartz cylinder falls on the upper surface of the quartz cone in an embodiment of the present invention;
图3为图1中A位置(硅料落入坩埚)的局部放大示意图;Fig. 3 is a partial enlarged schematic diagram of position A (silicon material falling into the crucible) in Fig. 1;
图4为本发明一实施例中装料空间中装有硅料时(第二类硅料为球状硅料)的局部放大示意图;Fig. 4 is a partial enlarged schematic diagram when silicon material is housed in the charging space (the second type of silicon material is spherical silicon material) in an embodiment of the present invention;
图5为本发明一实施例中装料空间中装有硅料时(第二类硅料包括球状硅 料及椭球状硅料)的局部放大图。Fig. 5 is a partially enlarged view of silicon material (the second type of silicon material includes spherical silicon material and ellipsoidal silicon material) in the charging space according to an embodiment of the present invention.
附图标记:Reference signs:
10、硅液;100、坩埚;200、复投装置;210、石英筒体;220、金属连杆;230、石英锥头;240、石英细管;300、单晶炉主室;400、单晶炉副室;500、籽晶重锤;20、第一类硅料;30、第二类硅料。10. Silicon liquid; 100. Crucible; 200. Re-injection device; 210. Quartz cylinder; 220. Metal connecting rod; 230. Quartz cone head; 240. Quartz thin tube; Crystal furnace auxiliary room; 500, seed crystal weight; 20, first-class silicon material; 30, second-class silicon material.
为使本发明的上述目的、特征和优点能够更加明显易懂,下面结合附图对本发明的具体实施方式做详细的说明。在下面的描述中阐述了很多具体细节以便于充分理解本发明。但是本发明能够以很多不同于在此描述的其它方式来实施,本领域技术人员可以在不违背本发明内涵的情况下做类似改进,因此本发明不受下面公开的具体实施例的限制。In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.
目前的直拉单晶硅工艺中,一个坩埚100通常需要使用300小时左右,复投与拉棒的工序会交替重复10次左右,进而会产出10根左右的单晶硅棒。每次复投工序通常包括多次交替进行的装料步骤及投料步骤,当满足单根单晶硅棒的投料需求时,完成一次复投工序,进行拉棒工序。当完成单根单晶硅棒的拉棒工序后,重复上述复投工序。In the current Czochralski monocrystalline silicon process, a crucible 100 usually needs to be used for about 300 hours, and the process of re-injection and rod pulling will be repeated about 10 times alternately, and then about 10 monocrystalline silicon rods will be produced. Each re-injection process usually includes multiple alternate charging steps and feeding steps. When the feeding requirements of a single single crystal silicon rod are met, a re-injection process is completed and the ingot pulling process is performed. After the rod pulling process of a single single crystal silicon rod is completed, the above-mentioned re-throwing process is repeated.
参见图1,复投工序所采用的复投装置200包括石英筒体210、金属连杆220及石英锥头230,其中石英筒体210为两端开口的筒体,石英筒体210的内腔沿轴向设置有金属连杆220。金属连杆220的一端从石英筒体210上端的开口伸出、并能够与籽晶重锤500连接,金属连杆220的另一端连接石英锥头230,石英锥头230位于石英筒体210下端开口的下方。另外,为了避免金属连杆220与硅料接触,在石英筒体210内部设置有石英细管240,金属连杆220位于石英细管 240内部。Referring to Fig. 1, the reinvestment device 200 adopted in the reinvestment process includes a quartz cylinder 210, a metal connecting rod 220 and a quartz cone 230, wherein the quartz cylinder 210 is a cylinder with openings at both ends, and the inner cavity of the quartz cylinder 210 A metal connecting rod 220 is arranged in the axial direction. One end of the metal connecting rod 220 protrudes from the upper opening of the quartz cylinder 210 and can be connected with the seed crystal weight 500, and the other end of the metal connecting rod 220 is connected to the quartz cone 230, which is located at the lower end of the quartz cylinder 210 below the opening. In addition, in order to avoid contact between the metal connecting rod 220 and the silicon material, a quartz thin tube 240 is arranged inside the quartz cylinder 210 , and the metal connecting rod 220 is located inside the quartz thin tube 240 .
使用时,参见图1-图3,石英筒体210落在石英锥头230的上表面,对石英筒体210进行支撑,石英锥头230的上表面、石英筒体210的内壁、及石英细管240的外壁组成了用于盛放硅料的空间,将硅料装入上述空间内。装料结束后,将复投装置200移至单晶炉副室400下端,然后,下降籽晶重锤500并连接金属连杆220,使得籽晶重锤500通过金属连杆220吊着复投装置200上升,缓慢提升至单晶炉副室400中。然后单晶炉副室400旋回单晶炉主室300上方,下降单晶炉副室400与单晶炉主室300连接,单晶炉副室400抽空净化后,下降籽晶重锤500,复投装置200缓慢进入单晶炉主室300。当单晶炉对石英筒体210起到支撑作用时,石英筒体210会停止下降,籽晶重锤500带动下金属连杆220和石英锥头230继续下降,石英锥头230上表面脱离石英筒体210的下端开口,硅料从石英筒体210内通过石英锥头230上表面与石英筒体210的下端之间的间隙漏出,下落至坩埚100内。待硅料落净,将复投装置200提升至单晶炉副室400内,取出复投装置200,完成单筒投料过程,每次复投需要进行多次单筒装料及单筒投料,即多次进行上述操作步骤,直至加料重量达到复投的投料需求为止。During use, referring to Fig. 1-Fig. 3, the quartz cylinder 210 falls on the upper surface of the quartz cone 230 to support the quartz cylinder 210, the upper surface of the quartz cone 230, the inner wall of the quartz cylinder 210, and the quartz fine The outer wall of the tube 240 constitutes a space for containing the silicon material, and the silicon material is loaded into the above-mentioned space. After charging, move the re-injection device 200 to the lower end of the auxiliary chamber 400 of the single crystal furnace, then lower the seed crystal weight 500 and connect the metal connecting rod 220 so that the seed crystal weight 500 is suspended by the metal connecting rod 220 for re-injection The device 200 rises and slowly lifts into the sub-chamber 400 of the single crystal furnace. Then the sub-chamber 400 of the single crystal furnace is turned back to the top of the main room 300 of the single crystal furnace, and the sub-chamber 400 of the single crystal furnace is lowered to connect with the main room 300 of the single crystal furnace. The throwing device 200 slowly enters the main chamber 300 of the single crystal furnace. When the single crystal furnace supports the quartz cylinder 210, the quartz cylinder 210 will stop falling, and the metal connecting rod 220 and the quartz cone 230 will continue to descend under the drive of the seed crystal weight 500, and the upper surface of the quartz cone 230 will break away from the quartz The lower end of the cylinder 210 is open, and the silicon material leaks from the quartz cylinder 210 through the gap between the upper surface of the quartz cone 230 and the lower end of the quartz cylinder 210 , and falls into the crucible 100 . After the silicon material is completely removed, the re-injection device 200 is lifted into the sub-chamber 400 of the single crystal furnace, and the re-injection device 200 is taken out to complete the single-cylinder feeding process. Each re-injection requires multiple single-cylinder charging and single-cylinder feeding, namely Carry out the above operation steps several times until the feeding weight reaches the feeding requirement for re-dosing.
传统工艺中,单晶复投用硅料90%以上来自致密棒状料和单晶循环料,由于以上两种硅料直径都在150mm以上,通常石英筒体210的内壁半径约110mm左右,所以致密棒状料和单晶循环料都需要破碎后才能作为复投用硅料使用。因硅的硬度较大,破碎致密棒状料和单晶循环料的难度较大,破碎尺寸越小则需要的工时及能耗越高,硅料也越容易受到环境及破碎工具的污染。相反地,破碎尺寸过大,石英筒体210内硅料因相互挤压而无法下落导致卡料的可能性又大大提高。因此,为了兼顾硅料破碎的成本及发生卡料事故的可能性,通常将 单晶复投用硅料的尺寸上限定在50mm。In the traditional process, more than 90% of the silicon material used for single crystal re-investment comes from dense rod-shaped material and single crystal circulating material. Since the diameter of the above two silicon materials is more than 150mm, the inner wall radius of the quartz cylinder 210 is usually about 110mm, so the dense Both rod-shaped material and single crystal recycled material need to be crushed before they can be used as silicon materials for re-use. Due to the high hardness of silicon, it is more difficult to crush dense rod-shaped materials and single crystal recycled materials. The smaller the crushing size, the higher the man-hours and energy consumption required, and the more easily the silicon materials are polluted by the environment and crushing tools. On the contrary, if the crushing size is too large, the silicon material in the quartz cylinder 210 cannot fall down due to mutual extrusion, which greatly increases the possibility of material jamming. Therefore, in order to take into account the cost of crushing the silicon material and the possibility of a material jam accident, the size of the silicon material used for single crystal re-use is usually limited to 50mm.
具体来说,以内壁半径为110mm、高度为185cm的石英筒体210为例,因石英细管240的尺寸相对石英筒体210很小,当忽略石英细管240对装料空间的影响,则石英筒体210的装料空间约为11*11*3.14*185=70288.9cm
3,固体硅密度按2.329g/cm3计算,则理论上装料空间可以装入硅料重量为70288.9*2.329/1000=160kg。而在实际生产上,只能装下70-75公斤尺寸上限定在50mm的块状硅料,装料空间中硅料之间的空隙占装料空间体积的50%以上,存在较大的空间浪费。以30寸大小坩埚100为例,每次需要复投约300公斤的硅料,而每筒只能装约70公斤硅料,即每次复投工序需要装5筒硅料。单筒硅料的加入需要30-40分钟的工艺时间,每次复投5筒硅料就需要大于2小时的工艺时间。可见每次复投时单筒装料量少,筒数多,导致工艺时间长,影响生产效率。另外,在装料过程和硅料落入坩埚100的过程中,因为硅料在石英筒内存在碰撞挤压,会导致部分硅料尖锐角划伤石英筒体210,导致石英筒体210内表面的石英脱落,并随着硅料掉落至坩埚100中的硅液10内,导致硅液10中的氧含量增加,对后续拉晶造成影响,同时也影响石英筒体210的使用寿命。
Specifically, taking the quartz cylinder 210 with an inner wall radius of 110mm and a height of 185cm as an example, because the size of the quartz thin tube 240 is relatively small compared to the quartz cylinder 210, when the influence of the quartz thin tube 240 on the charging space is ignored, then The loading space of the quartz cylinder 210 is about 11*11*3.14*185=70288.9cm 3 , and the density of solid silicon is calculated as 2.329g/cm3, then the theoretical loading space can be loaded with a silicon material weight of 70288.9*2.329/1000= 160kg. However, in actual production, only 70-75 kg of bulk silicon material with a size of 50 mm can be loaded, and the gap between silicon materials in the loading space accounts for more than 50% of the volume of the loading space, so there is a large space waste. Taking the 30-inch crucible 100 as an example, about 300 kg of silicon material needs to be re-introduced each time, and each cylinder can only hold about 70 kg of silicon material, that is, 5 cylinders of silicon material are required for each re-injection process. It takes 30-40 minutes of process time to add a single cylinder of silicon material, and it takes more than 2 hours of process time to add 5 cylinders of silicon material each time. It can be seen that the amount of material loaded in a single cylinder is small and the number of cylinders is large during each re-injection, resulting in a long process time and affecting production efficiency. In addition, during the charging process and the process of the silicon material falling into the crucible 100, because the silicon material collides and squeezes in the quartz cylinder, it will cause some of the silicon material to scratch the quartz cylinder 210 at a sharp angle, causing the inner surface of the quartz cylinder 210 to The quartz falls off and falls into the silicon liquid 10 in the crucible 100 as the silicon material falls, resulting in an increase in the oxygen content in the silicon liquid 10 , which affects subsequent crystal pulling and also affects the service life of the quartz cylinder 210 .
参见图1-图3,本发明一实施例提供的硅料的投料方法,用于复投装置向坩埚的投料,所述复投装置包括装料空间,包括步骤:Referring to Fig. 1-Fig. 3, the feeding method of silicon material provided by an embodiment of the present invention is used for feeding the crucible from the re-feeding device, and the re-feeding device includes a charging space, including steps:
S1、选择尺寸在第一预设区间范围内的硅料作为第一类硅料20,S1. Select a silicon material with a size within the first preset range as the first type of silicon material 20,
选择尺寸在第二预设区间范围内、且具有圆滑表面的硅料作为第二类硅料30,其中第一预设区间范围的最小值大于第二预设区间范围的最大值。A silicon material whose size is within a second preset range and has a smooth surface is selected as the second type of silicon material 30 , wherein the minimum value of the first preset range is greater than the maximum value of the second preset range.
S2、将第一类硅料20及第二类硅料30装入装料空间,第二类硅料30至少部分占据第一类硅料20之间的空隙。S2. Loading the first-type silicon material 20 and the second-type silicon material 30 into the charging space, the second-type silicon material 30 at least partially occupies the space between the first-type silicon materials 20 .
S3、将装料空间内的第一类硅料20及第二类硅料30投入坩埚。S3. Put the first-type silicon material 20 and the second-type silicon material 30 in the charging space into the crucible.
S4、若投入不满足坩埚预设的投料需求,重复步骤S2、步骤S3,直至满足投料需求停止投料。S4. If the input does not meet the preset feeding requirements of the crucible, repeat steps S2 and S3 until the feeding requirements are met and stop feeding.
上述硅料的投料方法,为了提高直拉单晶硅工艺的产出效率,其一,选择尺寸不同的第一类硅料20及第二类硅料30进行装料,第二类硅料30至少部分占据第一类硅料20之间的空隙,增大了装料空间的装料量,即增多了单次投入坩埚的硅料量,进而减少了为满足投料需求所需要的投料次数,提高了直拉单晶硅工艺的产出效率。其二,选择尺寸在第二预设区间范围内、且具有圆滑表面的硅料作为第二类硅料30,也就使得将第二类硅料30填充在第一类硅料20之间的空隙的方式,除了起到增大装料空间的装料量的作用以外,还能够在装料空间向坩埚投料时,起到利于第一类硅料20滑落的润滑作用,减少第一类硅料20之间碰撞、挤压的机率,降低第一类硅料20卡料的可能性,进一步提高了直拉单晶硅工艺的产出效率。另外,不同尺寸范围内的两类硅料混合装料,进而混合加入坩埚100内,避免了较小尺寸的硅料在坩埚100内堆积成一团,有利于硅料的快速熔化,缩短化料工艺时间,同时也有利于硅料内部的热量传递,减小因温度不均匀导致发生氢跳的可能性。The feeding method of the above-mentioned silicon material, in order to improve the output efficiency of the Czochralski monocrystalline silicon process, one, select the first type silicon material 20 and the second type silicon material 30 with different sizes for charging, and the second type silicon material 30 Occupying at least part of the space between the first type of silicon materials 20 increases the amount of material in the charging space, that is, increases the amount of silicon material that is put into the crucible at a time, thereby reducing the number of times of feeding required to meet the feeding requirements. The output efficiency of the Czochralski monocrystalline silicon process is improved. Second, the silicon material with a size within the second preset range and with a smooth surface is selected as the second type silicon material 30, so that the second type silicon material 30 is filled between the first type silicon materials 20. The way of the gap, in addition to the effect of increasing the charging amount of the charging space, can also play a lubricating role in favor of the sliding of the first type of silicon material 20 when the charging space feeds the crucible, reducing the amount of the first type of silicon. The probability of collision and extrusion between the materials 20 reduces the possibility of the first type of silicon material 20 jamming, and further improves the output efficiency of the Czochralski monocrystalline silicon process. In addition, two types of silicon materials in different size ranges are mixed and charged, and then mixed and added into the crucible 100, which avoids the accumulation of smaller-sized silicon materials in the crucible 100, which is conducive to the rapid melting of silicon materials and shortens the chemical process. At the same time, it is also conducive to the heat transfer inside the silicon material, reducing the possibility of hydrogen jump due to uneven temperature.
直拉单晶硅工艺包括交替进行的复投工序及拉棒工序,其中复投工序包括上述的硅料的投料方法,而拉棒工序包括:当步骤S4中投入满足坩埚预设的投料需求,停止投料,进行拉棒,产出单晶硅棒。完成拉棒工序后,重复上述的步骤S1-S4。The Czochralski monocrystalline silicon process includes alternate re-injection processes and rod-drawing processes, wherein the re-injection process includes the above-mentioned feeding method of silicon material, and the rod-drawing process includes: when the input in step S4 meets the preset feeding requirements of the crucible, Stop feeding, pull rods, and produce monocrystalline silicon rods. After the rod pulling process is completed, the above steps S1-S4 are repeated.
需要说明的是,参见图1,在一实施例中,装料空间包括石英锥头230的上表面、石英筒体210的内壁、及石英细管240的外壁形成的空间。在一实施例中,步骤S1中选择尺寸在第一预设区间范围内的硅料作为第一类硅料20,及选择尺寸在第二预设区间范围内的硅料作为第二类硅料30的具体方式可以是利用 不同目数的筛网对硅料进行筛选。即采用第一/第二预设区间范围的最大值对应的筛网对硅料进行筛选,选取能够经过筛网的硅料,采用第一/第二预设区间范围的最小值对应的筛网对硅料进行筛选,选取无法经过筛网的硅料。例如,第一预设区间范围为40mm-50mm,即选择尺寸大于40mm,且尺寸小于50mm的硅料作为第一类硅料20,使用孔径为50mm的筛网对硅料进行筛选,选取能够经过筛网的硅料。进一步使用孔径为40mm的筛网对硅料进行筛选,选取不能经过筛网的硅料。需要说明的是,第一预设区间范围也可以根据需求进行其他设定。It should be noted that, referring to FIG. 1 , in one embodiment, the charging space includes a space formed by the upper surface of the quartz cone 230 , the inner wall of the quartz cylinder 210 , and the outer wall of the quartz thin tube 240 . In one embodiment, in step S1, the silicon material whose size is within the first predetermined range is selected as the first type of silicon material 20, and the silicon material whose size is within the second predetermined range is selected as the second type of silicon material The specific manner of 30 may be to use screens of different meshes to screen the silicon material. That is, use the sieve corresponding to the maximum value of the first/second preset interval to screen the silicon material, select the silicon material that can pass through the sieve, and use the sieve corresponding to the minimum value of the first/second preset interval The silicon material is screened, and the silicon material that cannot pass through the sieve is selected. For example, the first preset interval range is 40mm-50mm, that is, the silicon material with a size larger than 40mm and smaller than 50mm is selected as the first type of silicon material 20, and the silicon material is screened with a screen with an aperture of 50mm. The silicon material of the screen. Further use a sieve with an aperture of 40mm to screen the silicon material, and select the silicon material that cannot pass through the sieve. It should be noted that the first preset range can also be set in other ways according to requirements.
另外,坩埚预设的投料需求可以是满足单根单晶硅棒拉棒的投料量(重量),亦或者根据需要进行的其他设置。In addition, the preset feeding demand of the crucible can satisfy the feeding amount (weight) of a single single crystal silicon rod or rod, or other settings as required.
参见图4及图5,在一实施例中,步骤S1包括:选择球状或椭球状的硅料作为第二类硅料30。需要说明的是,图中的第一类硅料20与第二类硅料30之间尺寸比例仅为示意,实际所采用的第二类硅料30的尺寸远小于第一类硅料20。例如,第二类硅料30可以选取尺寸在4mm以内,且平均粒径为2mm左右的颗粒硅料。颗粒硅料通常为球状或椭球状,其具有圆滑表面,如此,在装料空间向坩埚投料时,起到利于第一类硅料20滑落的润滑作用。具体地,继续参见图1及图2,当籽晶重锤500带动下金属连杆220和石英锥头230继续下降,石英锥头230上表面脱离石英筒体210的下端开口时,第一类硅料20及第二类硅料30从石英筒体210内通过石英锥头230上表面与石英筒体210的下端开口之间的间隙漏出,在投料过程中,石英锥头230上表面与石英筒体210的下端开口之间的间隙不断增大,即在石英锥头230上表面脱离石英筒体210的下端开口的初始阶段,由于间隙较小,第二类硅料30对第一类硅料20的润滑作用尤为关键,其有利于最底部的第一类硅料20顺畅投入坩埚。当然投料的全过程中,第 二类硅料30对第一类硅料20均存在一定的润滑作用。第二类硅料30能够在第一类硅料20之间、第一类硅料20与复投装置200之间,特别是第一类硅料20与石英锥头230上部的锥面之间起到润滑作用,降低第一类硅料20卡料的可能性,提高了直拉单晶硅工艺的产出效率。Referring to FIG. 4 and FIG. 5 , in an embodiment, step S1 includes: selecting a spherical or ellipsoidal silicon material as the second type of silicon material 30 . It should be noted that the size ratio between the first type of silicon material 20 and the second type of silicon material 30 in the figure is only for illustration, and the size of the second type of silicon material 30 actually used is much smaller than that of the first type of silicon material 20 . For example, the second type of silicon material 30 can be granular silicon material with a size within 4 mm and an average particle size of about 2 mm. The granular silicon material is usually spherical or ellipsoidal, and has a smooth surface. In this way, when the material is fed into the crucible in the charging space, it can lubricate the first type of silicon material 20 to slide down. Specifically, referring to Fig. 1 and Fig. 2, when the metal connecting rod 220 and the quartz cone 230 continue to descend under the drive of the seed crystal weight 500, and the upper surface of the quartz cone 230 is separated from the lower opening of the quartz cylinder 210, the first type The silicon material 20 and the second type silicon material 30 leak from the quartz cylinder 210 through the gap between the upper surface of the quartz cone 230 and the lower opening of the quartz cylinder 210. During the feeding process, the upper surface of the quartz cone 230 and the quartz The gap between the lower openings of the cylinder body 210 is constantly increasing, that is, in the initial stage when the upper surface of the quartz cone 230 is separated from the lower opening of the quartz cylinder body 210, due to the small gap, the second type of silicon material 30 is relatively small to the first type of silicon. The lubricating effect of the material 20 is particularly critical, which is conducive to the smooth input of the first type silicon material 20 at the bottom into the crucible. Certainly in the whole process of feeding intake, the second type of silicon material 30 all has a certain lubricating effect on the first type of silicon material 20. The second type of silicon material 30 can be between the first type of silicon material 20, between the first type of silicon material 20 and the re-injection device 200, especially between the first type of silicon material 20 and the cone surface on the top of the quartz cone head 230 Play a lubricating role, reduce the possibility of 20 jams of the first type of silicon material, and improve the output efficiency of the Czochralski monocrystalline silicon process.
在一实施例中,步骤S1包括:In one embodiment, step S1 includes:
S101、根据装料空间的投料入口尺寸确定第一预设区间范围的最大值;S101. Determine the maximum value of the first preset interval according to the size of the feeding inlet of the charging space;
S102、根据第一预设区间范围的最大值确定第二预设区间范围的最大值。S102. Determine the maximum value of the second preset interval range according to the maximum value of the first preset interval range.
上述硅料的投料方法,为了减小第一类硅料20出现卡料的可能性,步骤S101根据装料空间的投料入口尺寸确定第一预设区间范围的最大值。较佳地,在一实施例中,步骤S101包括:控制所选择的第一预设区间范围的最大值小于或等于二分之一的装料空间的投料入口尺寸。需要说明的是,投料入口尺寸指投料入口的最小横截尺寸,不同尺寸的复投装置200具有不同的投料入口尺寸。具体地,在一实施例中,当装料空间为石英筒体的内壁围成的空间时,投料入口尺寸为石英筒体的内壁围成的空间的半径。另一实施例中,当装料空间包括石英锥头230的上表面、石英筒体210的内壁、及石英细管240的外壁围成的空间时,投料入口尺寸为石英筒体210的内壁半径与石英细管240的外壁半径之差。以石英筒体210的内壁半径为110mm、石英细管240的外壁半径为10mm为例,即装料空间的投料入口尺寸为110mm-10mm,则可确定第一预设区间范围的最大值小于或等于50mm,即将第一类硅料20尺寸控制在装料空间的投料入口尺寸的二分之一以下,这样使得两块第一类硅料20在石英筒内能够自由下降,从而一定程度上减小发生卡料现象的可能性。当然除上述确定方式,步骤S101中具体的确定方法还可根据需要进行选择。另外,为了在减小第一类硅料20出现卡料的可能性的同时,增大装料空间的装料量,步骤S102根据第一预设区间范 围的最大值确定第二预设区间范围的最大值。以第一预设区间范围的最大值取50mm为例,确定第二预设区间范围的最大值,以控制所选择的所述第二预设区间范围内的第二类硅料30的平均粒度为2mm。如此,第二类硅料30能够较容易进入第一类硅料20之间的空隙。In the feeding method of the above-mentioned silicon material, in order to reduce the possibility of jamming of the first type of silicon material 20, step S101 determines the maximum value of the first preset interval according to the size of the feeding inlet of the charging space. Preferably, in an embodiment, step S101 includes: controlling the maximum value of the selected first preset interval to be less than or equal to half of the feeding inlet size of the charging space. It should be noted that the size of the feeding inlet refers to the minimum cross-sectional size of the feeding inlet, and re-feeding devices 200 of different sizes have different feeding inlet sizes. Specifically, in one embodiment, when the charging space is the space enclosed by the inner wall of the quartz cylinder, the size of the feeding inlet is the radius of the space enclosed by the inner wall of the quartz cylinder. In another embodiment, when the charging space includes the space surrounded by the upper surface of the quartz cone head 230, the inner wall of the quartz cylinder 210, and the outer wall of the quartz thin tube 240, the size of the feeding inlet is the radius of the inner wall of the quartz cylinder 210 The difference from the outer wall radius of the quartz thin tube 240. Taking the inner wall radius of the quartz cylinder 210 as 110mm and the outer wall radius of the quartz thin tube 240 as 10mm as an example, that is, the feeding inlet size of the charging space is 110mm-10mm, then it can be determined that the maximum value of the first preset interval is less than or It is equal to 50mm, that is, the size of the first type silicon material 20 is controlled below half of the size of the feeding inlet of the charging space, so that two pieces of the first type silicon material 20 can freely fall in the quartz cylinder, thereby reducing the size to a certain extent. The possibility of material jam phenomenon is small. Of course, in addition to the above determination methods, the specific determination method in step S101 can also be selected according to needs. In addition, in order to reduce the possibility of jamming of the first type of silicon material 20 and at the same time increase the loading capacity of the loading space, step S102 determines the second preset interval according to the maximum value of the first preset interval the maximum value. Taking the maximum value of the first preset interval as 50 mm as an example, determine the maximum value of the second preset interval to control the average particle size of the second type of silicon material 30 within the selected second preset interval is 2mm. In this way, the second type of silicon material 30 can easily enter the gap between the first type of silicon material 20 .
在一实施例中,步骤S1中第一类硅料20与第二类硅料30的质量比为15:11-15:7。上述硅料的投料方法可较大程度地增大装料空间的装料量。例如,硅料的投料方法,包括:S1、选择尺寸在50mm以内(即第一预设区间范围的最大值为50mm)的块状硅料作为第一类硅料20,选择尺寸在4mm以内、且平均粒度为2mm的颗粒硅料作为第二类硅料30;当以第一类硅料20与第二类硅料30的质量比为15:7的方式装入时,内壁半径为110mm、高度为185cm的石英筒体210中第一类硅料20可装入75公斤,第二类硅料30可装入35公斤,即单筒装入110公斤。当以第一类硅料20与第二类硅料30的质量比为15:11的方式装入时,内壁半径为110mm、高度为185cm的石英筒体210中第一类硅料20可装入75公斤,第二类硅料30可装入55公斤,即单筒装入130公斤。相较于传统工艺中只能装下70-75公斤尺寸上限定在50mm的块状硅料,上述方法更有利于减小空间浪费,即增多了单次投入的硅料量,减少了为满足投料需求所需要的投料次数,进而提高直拉单晶硅工艺的产出效率。In one embodiment, the mass ratio of the first type silicon material 20 to the second type silicon material 30 in step S1 is 15:11-15:7. The feeding method of the above-mentioned silicon material can increase the charging amount of the charging space to a large extent. For example, the feeding method of silicon material includes: S1, selecting a block silicon material with a size within 50mm (that is, the maximum value of the first preset range is 50mm) as the first type of silicon material 20, selecting a size within 4mm, And the granular silicon material with an average particle size of 2mm is used as the second type silicon material 30; when the mass ratio of the first type silicon material 20 and the second type silicon material 30 is loaded in the mode of 15:7, the inner wall radius is 110mm, The first type of silicon material 20 in the quartz cylinder 210 with a height of 185 cm can be loaded with 75 kg, and the second type of silicon material 30 can be loaded with 35 kg, that is, a single cylinder can be loaded with 110 kg. When the mass ratio of the first type of silicon material 20 to the second type of silicon material 30 is 15:11, the first type of silicon material 20 in the quartz cylinder 210 with an inner wall radius of 110 mm and a height of 185 cm can hold 75 kilograms, the second type of silicon material 30 can be loaded into 55 kilograms, that is, 130 kilograms in a single cylinder. Compared with the traditional process, which can only hold 70-75 kg of bulk silicon material with a size limited to 50mm, the above method is more conducive to reducing space waste, that is, increasing the amount of silicon material input at a time, reducing the need to meet The number of feeds required by the feeding requirements, thereby improving the output efficiency of the Czochralski monocrystalline silicon process.
在一实施例中,步骤S2包括:In one embodiment, step S2 includes:
S202、将第一类硅料20装入装料空间,并使在第一类硅料20之间形成空隙;S202, loading the first type silicon material 20 into the charging space, and forming gaps between the first type silicon material 20;
S203、将第二类硅料30装入装料空间,以使第二类硅料30至少部分下落/下滑至第一类硅料20之间的空隙内。S203 , loading the second-type silicon material 30 into the charging space, so that the second-type silicon material 30 at least partially falls/slides into the gap between the first-type silicon materials 20 .
上述硅料的投料方法,先装入第一类硅料20,第一类硅料20之间形成空隙 后,装入第二类硅料30,以使第二类硅料30至少部分下落/下滑至第一类硅料20之间的空隙内。一方面,增大了装料空间的装料量,另一方面,第二类硅料30在第一类硅料20之间起到一定润滑作用;进而从两个方面提高直拉单晶硅工艺的产出效率。较佳地,在一实施例中,步骤S2包括:S204、交替进行步骤S202及步骤S203,直至满足装料空间预设的装料需求,结束步骤S2。上述硅料的投料方法有利于第一类硅料20与第二类硅料30之间地混合。在上述硅料的投料方法中,在一实施例中,步骤S2还包括:将步骤S1中选取的第一类硅料20按照尺寸划分为至少两部分,交替进行步骤S202及步骤S203过程中,优先投入尺寸较小的第一类硅料20。以步骤S1中选取30mm-50mm的块状硅料为例,可将其划分为30mm-35mm、35mm-40mm、40mm-45mm、45mm-50mm四部分,优先投入30mm-35mm的块状硅料,最后投入45mm-50mm的块状硅料。考虑到投料出口的开度随时间逐渐增大,在第二类硅料30起到润滑作用的基础上,能够在开度相对较小的时间内,底部装入的尺寸较小的第一类硅料20混合第二类硅料30进入坩埚,使得投料更加顺畅,进一步减小卡料的可能性,提高了投料的效率。The feeding method of the above-mentioned silicon material is to first load the first type silicon material 20, after the gap is formed between the first type silicon material 20, the second type silicon material 30 is loaded, so that the second type silicon material 30 at least partly falls/ Slide down into the gap between the first type silicon materials 20 . On the one hand, the loading capacity of the loading space is increased; on the other hand, the second type of silicon material 30 plays a certain lubricating effect between the first type of silicon material 20; The productivity of the process. Preferably, in an embodiment, step S2 includes: S204, step S202 and step S203 are alternately performed until the preset loading requirement of the loading space is met, and step S2 is ended. The feeding method of the above-mentioned silicon material is beneficial to the mixing between the first type silicon material 20 and the second type silicon material 30 . In the above method of feeding silicon material, in one embodiment, step S2 further includes: dividing the first type of silicon material 20 selected in step S1 into at least two parts according to size, and performing step S202 and step S203 alternately, The first type of silicon material 20 with smaller size is given priority. Taking the block silicon material of 30mm-50mm selected in step S1 as an example, it can be divided into four parts of 30mm-35mm, 35mm-40mm, 40mm-45mm, and 45mm-50mm, and the block silicon material of 30mm-35mm is given priority. Finally, put in 45mm-50mm block silicon material. Considering that the opening of the feeding outlet gradually increases with time, on the basis that the second type of silicon material 30 plays a lubricating role, the first type of silicon material with a smaller size can be loaded at the bottom within a relatively small opening. The silicon material 20 mixed with the second type of silicon material 30 enters the crucible, which makes feeding more smoothly, further reduces the possibility of material jam, and improves the efficiency of feeding.
进一步地,在一实施例中,步骤S2包括:S201、将第二类硅料30装入装料空间,且铺设于装料空间的靠近投料出口的区域。上述硅料的投料方法,为了利于装料空间最底部的第一类硅料20的滑落,进一步减小卡料可能性。在将第一类硅料20装入装料空间之间,将第二类硅料30装入装料空间,形成铺设于装料空间最底部的第一类硅料层,在投料过程中,对底部的第一类硅料20进行润滑。需要说明的是,第二类硅料30的铺设区域根据装料空间的投料出口形式进行选择即可。Further, in one embodiment, step S2 includes: S201, loading the second type of silicon material 30 into the charging space, and laying it in the area of the charging space near the feeding outlet. The feeding method of the above-mentioned silicon material is to facilitate the sliding of the first-type silicon material 20 at the bottom of the charging space, and further reduce the possibility of material jamming. Between loading the first type of silicon material 20 into the charging space, the second type of silicon material 30 is loaded into the charging space to form the first type of silicon material layer laid at the bottom of the charging space. During the feeding process, Lubricate the first type silicon material 20 at the bottom. It should be noted that the laying area of the second type of silicon material 30 can be selected according to the feeding outlet form of the charging space.
在另一实施例中,步骤S2包括:In another embodiment, step S2 includes:
S201、将第一类硅料20与第二类硅料30混合得到混合硅料;S201, mixing the first type silicon material 20 with the second type silicon material 30 to obtain a mixed silicon material;
S202、将步骤S201中的混合硅料装入装料空间。S202. Load the mixed silicon material in step S201 into the charging space.
上述硅料的投料方法,先将第一类硅料20与第二类硅料30混合后一起装入装料空间,相较于先装入第一类硅料20,形成空隙后装入第二类硅料30的方式,此种方式两种不同尺寸的硅料混合更为均匀,一方面,进一步增大了装料空间的装料量,另一方面,第二类硅料30在第一类硅料20之间可以起到更好的润滑作用。The feeding method of the above-mentioned silicon material is to first mix the first type silicon material 20 and the second type silicon material 30 and then load them into the charging space together. The way of the second type of silicon material 30, the mixing of two kinds of silicon materials of different sizes is more uniform in this way, on the one hand, further increases the charging capacity of the charging space, on the other hand, the second type of silicon material 30 in the second One type of silicon material 20 can play a better lubricating effect.
在本发明的描述中,需要理解的是,术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“顺时针”、“逆时针”、“轴向”、“径向”、“周向”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本发明和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本发明的限制。In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", " Back", "Left", "Right", "Vertical", "Horizontal", "Top", "Bottom", "Inner", "Outer", "Clockwise", "Counterclockwise", "Axial" , "radial", "circumferential" and other indicated orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, which are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the referred device or Elements must have certain orientations, be constructed and operate in certain orientations, and therefore should not be construed as limitations on the invention.
此外,术语“第一”、“第二”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。在本发明的描述中,“多个”的含义是至少两个,例如两个,三个等,除非另有明确具体的限定。In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include at least one of these features. In the description of the present invention, "plurality" means at least two, such as two, three, etc., unless otherwise specifically defined.
在本发明中,除非另有明确的规定和限定,术语“安装”、“相连”、“连接”、“固定”等术语应做广义理解,例如,可以是固定连接,也可以是可拆卸连接,或成一体;可以是机械连接,也可以是电连接;可以是直接相连,也可以通过中间媒介间接相连,可以是两个元件内部的连通或两个元件的相互作用关系,除非另有明确的限定。对于本领域的普通技术人员而言,可以根据具体情况理解上述术语在本发明中的具体含义。In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrated; it may be mechanically connected or electrically connected; it may be directly connected or indirectly connected through an intermediary, and it may be the internal communication of two components or the interaction relationship between two components, unless otherwise specified limit. Those of ordinary skill in the art can understand the specific meanings of the above terms in the present invention according to specific situations.
在本发明中,除非另有明确的规定和限定,第一特征在第二特征“上”或 “下”可以是第一和第二特征直接接触,或第一和第二特征通过中间媒介间接接触。而且,第一特征在第二特征“之上”、“上方”和“上面”可是第一特征在第二特征正上方或斜上方,或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”可以是第一特征在第二特征正下方或斜下方,或仅仅表示第一特征水平高度小于第二特征。In the present invention, unless otherwise clearly specified and limited, the first feature may be in direct contact with the first feature or the first and second feature may be in direct contact with the second feature through an intermediary. touch. Moreover, "above", "above" and "above" the first feature on the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. "Below", "beneath" and "beneath" the first feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is less horizontally than the second feature.
需要说明的是,当元件被称为“固定于”或“设置于”另一个元件,它可以直接在另一个元件上或者也可以存在居中的元件。当一个元件被认为是“连接”另一个元件,它可以是直接连接到另一个元件或者可能同时存在居中元件。本文所使用的术语“垂直的”、“水平的”、“上”、“下”、“左”、“右”以及类似的表述只是为了说明的目的,并不表示是唯一的实施方式。It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or there may be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present. As used herein, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions are for the purpose of illustration only and are not intended to represent the only embodiment.
以上所述实施例的各技术特征可以进行任意的组合,为使描述简洁,未对上述实施例中的各个技术特征所有可能的组合都进行描述,然而,只要这些技术特征的组合不存在矛盾,都应当认为是本说明书记载的范围。The technical features of the above-mentioned embodiments can be combined arbitrarily. To make the description concise, all possible combinations of the technical features in the above-mentioned embodiments are not described. However, as long as there is no contradiction in the combination of these technical features, should be considered as within the scope of this specification.
以上所述实施例仅表达了本发明的几种实施方式,其描述较为具体和详细,但并不能因此而理解为对发明专利范围的限制。应当指出的是,对于本领域的普通技术人员来说,在不脱离本发明构思的前提下,还可以做出若干变形和改进,这些都属于本发明的保护范围。因此,本发明专利的保护范围应以所附权利要求为准。The above-mentioned embodiments only express several implementation modes of the present invention, and the descriptions thereof are relatively specific and detailed, but should not be construed as limiting the patent scope of the invention. It should be pointed out that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent for the present invention should be based on the appended claims.
Claims (10)
- 一种硅料的投料方法,用于复投装置向坩埚的投料,所述复投装置包括装料空间,其特征在于,所述硅料的投料方法包括步骤:A method for feeding silicon material, which is used for feeding a re-injection device to a crucible, the re-injection device includes a charging space, and is characterized in that the method for feeding silicon material comprises the steps of:S1、选择尺寸在第一预设区间范围内的硅料作为第一类硅料,S1. Select the silicon material whose size is within the first preset range as the first type of silicon material,选择尺寸在第二预设区间范围内、且具有圆滑表面的硅料作为第二类硅料,其中所述第一预设区间范围的最小值大于所述第二预设区间范围的最大值;Selecting a silicon material with a size within a second preset range and having a smooth surface as the second type of silicon material, wherein the minimum value of the first preset range is greater than the maximum value of the second preset range;S2、将所述第一类硅料及所述第二类硅料装入装料空间,所述第二类硅料至少部分占据所述第一类硅料之间的空隙;S2. Loading the first-type silicon material and the second-type silicon material into the charging space, the second-type silicon material at least partially occupying the space between the first-type silicon materials;S3、将所述装料空间内的所述第一类硅料及所述第二类硅料投入坩埚;S3. Putting the first type of silicon material and the second type of silicon material in the charging space into the crucible;S4、若投入不满足所述坩埚预设的投料需求,重复步骤S2、步骤S3,直至满足所述投料需求停止投料。S4. If the feeding does not meet the preset feeding requirements of the crucible, repeat steps S2 and S3 until the feeding requirements are met and stop feeding.
- 根据权利要求1所述的硅料的投料方法,其特征在于,步骤S1包括:选择球状或椭球状的硅料作为所述第二类硅料。The feeding method of silicon material according to claim 1, characterized in that step S1 comprises: selecting spherical or ellipsoidal silicon material as the second type of silicon material.
- 根据权利要求1所述的硅料的投料方法,其特征在于,步骤S1包括:The feeding method of silicon material according to claim 1, characterized in that step S1 comprises:S101、根据所述装料空间的投料入口尺寸确定所述第一预设区间范围的最大值;S101. Determine the maximum value of the first preset interval according to the size of the feeding inlet of the charging space;S102、根据第一预设区间范围的最大值确定所述第二预设区间范围的最大值。S102. Determine the maximum value of the second preset interval range according to the maximum value of the first preset interval range.
- 根据权利要求3所述的硅料的投料方法,其特征在于,步骤S101包括:The feeding method of silicon material according to claim 3, characterized in that step S101 comprises:控制所选择的所述第一预设区间范围的最大值小于或等于二分之一的所述装料空间的投料入口尺寸。Controlling the size of the feeding inlet of the charging space where the maximum value of the selected first preset range is less than or equal to half.
- 根据权利要求1-4中任一项所述的硅料的投料方法,其特征在于,步骤S1中第一类硅料与第二类硅料的质量比为15:11-15:7。The feeding method of silicon material according to any one of claims 1-4, characterized in that the mass ratio of the first type of silicon material to the second type of silicon material in step S1 is 15:11-15:7.
- 根据权利要求1-4中任一项所述的硅料的投料方法,其特征在于,步骤 S2包括:The feeding method of silicon material according to any one of claims 1-4, is characterized in that, step S2 comprises:S202、将所述第一类硅料装入所述装料空间,并使在所述第一类硅料之间形成空隙;S202. Load the first type of silicon material into the charging space, and form gaps between the first type of silicon materials;S203、将所述第二类硅料装入所述装料空间,以使所述第二类硅料至少部分下落/下滑至所述第一类硅料之间的空隙内。S203. Load the second type of silicon material into the charging space, so that the second type of silicon material at least partially falls/slides into the gap between the first type of silicon materials.
- 根据权利要求6所述的硅料的投料方法,其特征在于,步骤S2包括:S204、交替进行步骤S202及步骤S203,直至满足所述装料空间预设的装料需求,结束步骤S2。The method for feeding silicon material according to claim 6, characterized in that step S2 comprises: S204, alternately performing step S202 and step S203 until the preset charging requirement of the charging space is satisfied, and step S2 is ended.
- 根据权利要求7所述的硅料的投料方法,其特征在于,步骤S2包括:S201、将所述第二类硅料装入所述装料空间,且铺设于所述装料空间的靠近投料出口的区域。The feeding method of silicon material according to claim 7, characterized in that step S2 includes: S201, loading the second type of silicon material into the charging space, and laying it in the charging space near the charging space. export area.
- 根据权利要求1-4中任一项所述的硅料的投料方法,其特征在于,步骤S2包括:The feeding method of silicon material according to any one of claims 1-4, characterized in that step S2 comprises:S201、将所述第一类硅料与所述第二类硅料混合得到混合硅料;S201. Mix the first type of silicon material with the second type of silicon material to obtain a mixed silicon material;S202、将步骤S201中的所述混合硅料装入所述装料空间。S202. Load the mixed silicon material in step S201 into the charging space.
- 根据权利要求1-4中任一项所述的硅料的投料方法,所述复投装置包括两端开口的石英筒体,固定于所述石英筒体、且与所述石英筒体同轴设置的石英细管,位于所述石英细管内部、且从所述石英筒体的一端的开口伸出的金属连杆,及固定于所述金属连杆、且位于所述石英筒体的另一端的开口下方的石英锥头;所述金属连杆能够带动所述石英锥头相对于所述石英筒体的另一端的开口移动;其特征在于,According to the feeding method of silicon material according to any one of claims 1-4, the re-introduction device comprises a quartz cylinder with openings at both ends, fixed to the quartz cylinder and coaxial with the quartz cylinder The set quartz thin tube, the metal connecting rod that is located inside the quartz thin tube and protrudes from the opening at one end of the quartz cylinder, and the other metal connecting rod that is fixed on the metal connecting rod and is located in the quartz cylinder. A quartz cone head below the opening at one end; the metal connecting rod can drive the quartz cone head to move relative to the opening at the other end of the quartz cylinder; it is characterized in that,步骤S2包括:当所述石英锥头抵接于所述石英筒体的另一端的开口时,所述石英锥头的靠近所述石英筒体的表面、石英筒体的内壁、及石英细管的外壁 形成装料空间;Step S2 includes: when the quartz cone abuts against the opening at the other end of the quartz cylinder, the surface of the quartz cone close to the quartz cylinder, the inner wall of the quartz cylinder, and the quartz capillary The outer wall of the tank forms a charging space;步骤S3包括:当所述石英锥头脱离所述石英筒体的另一端的开口、且出现间隙后,所述装料空间内的所述第一类硅料及所述第二类硅料由所述间隙投入坩埚。Step S3 includes: when the quartz conical head breaks away from the opening at the other end of the quartz cylinder and a gap appears, the first type of silicon material and the second type of silicon material in the charging space are separated by the Put the gap into the crucible.
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