WO2022262513A1

WO2022262513A1 - Method and apparatus for detecting influence of input signal on output signal, device and medium

Info

Publication number: WO2022262513A1
Application number: PCT/CN2022/093742
Authority: WO
Inventors: 瞿世尊
Original assignee: 中兴通讯股份有限公司
Priority date: 2021-06-15
Filing date: 2022-05-19
Publication date: 2022-12-22
Also published as: CN115483993A

Abstract

Embodiments of the present disclosure provide a method for detecting the influence of an input signal on output signal, comprising: gradually adjusting feature parameters of an input signal of a system to be tested, and for each adjustment, inputting the adjusted input signal to the system, and detecting and recording jitter parameters of an output signal of the system; and determining a tolerance range of the feature parameters of the input signal according to the jitter parameters of the output signal corresponding to each adjustment. Embodiments of the present disclosure further provide a detection apparatus, a computer device and a readable medium.

Description

Method, device, device and medium for detecting the influence of an input signal on an output signal

Cross References to Related Applications

This disclosure claims the priority of the Chinese patent application submitted to the State Intellectual Property Office on June 15, 2021, with the application number 202110659976.X, and the title of the invention is "Method, device, device and medium for detecting the influence of input signal on output signal" , the entire content of which application is incorporated by reference in this disclosure.

technical field

Embodiments of the present disclosure relate to but are not limited to the technical field of communications, and in particular, relate to a method, device, computer device and readable medium for detecting the influence of an input signal on an output signal.

Background technique

If a communication system or a circuit board is compared to a black box system, the black box can be regarded as a response system that responds to various input factors and outputs signals. For example, a communication circuit board outputs the required output signal after processing the input power supply, clock and signal quantity, and the quality of the output signal depends on the quality of the input signal. Usually, when there are many input signals, when the output signal of the system is degraded, it is difficult to analyze the input signal that causes the degradation, which poses a great obstacle to solving the problem. In a communication system, as the communication rate becomes higher and the capacity becomes larger, the requirements for the jitter index of the output signal become more and more stringent. The jitter caused by the degradation of the output signal will affect the bit error rate if it is light, and it will not be able to connect with other communication equipment if it is serious.

Therefore, there is an urgent need for a system output performance analysis solution to solve the above problems.

Contents of the invention

Embodiments of the present disclosure provide a method, an apparatus, a computer device, and a readable medium for detecting the influence of an input signal on an output signal.

In the first aspect, an embodiment of the present disclosure provides a method for detecting the influence of an input signal on an output signal, including: successively adjusting the characteristic parameters of the input signal of the system under test, and inputting the adjusted input signal to the system under test for each adjustment. The system detects and records the jitter parameter of the output signal of the system under test; and determines the tolerance range of the characteristic parameter of the input signal according to the jitter parameter of the output signal corresponding to each adjustment.

In some embodiments, the input signal includes a power signal, the characteristic parameter of the power signal includes noise of the power signal, and the adjusting the characteristic parameter of the input signal of the system under test includes: adjusting the amplitude of the thermal noise of the power signal, At least one of the frequency of the switching noise of the power signal and the magnitude of the switching noise of the power signal.

In some embodiments, adjusting the amplitude of the switching noise of the power signal includes: respectively adjusting the amplitude of the switching noise of the power signal for different frequency points of the power signal.

In some embodiments, the input signal includes a clock signal, the characteristic parameter of the clock signal includes the jitter of the clock signal, and the adjusting the characteristic parameter of the input signal of the system under test includes: adjusting the amplitude of the random jitter of the clock signal, At least one of the frequency of the deterministic jitter of the clock signal and the amplitude of the deterministic jitter of the clock signal.

In some embodiments, adjusting the characteristic parameters of the input signal of the system under test successively includes: after completing the adjustment of the characteristic parameters of the input signal of the system under test this time, according to the historical sample data and the obtained characteristic parameters of the input signal Based on the historical sample data of the jitter parameters of the output signal, a convergence algorithm is used to determine the characteristic parameters of the input signal for next adjustment.

In some embodiments, the convergence algorithm includes a maximum likelihood estimation algorithm, and according to the historical sample data of the characteristic parameters of the input signal and the historical sample data of the jitter parameters of the output signal, the convergence algorithm is used to determine the The characteristic parameters of the input signal for next adjustment include: according to the historical sample data of the characteristic parameters of the input signal and the historical sample data of the jitter parameters of the output signal, fitting and generating an adjustment function; according to the maximum likelihood estimation algorithm and the adjustment function determine the characteristic parameters of the input signal for the next adjustment. In some embodiments, the adjusting the characteristic parameter of the input signal of the system under test includes: adjusting the characteristic parameter of the input signal of the system under test according to a preset step value.

In some embodiments, said successively adjusting the characteristic parameter of the input signal of the system under test includes: increasing the value of the characteristic parameter of the input signal of the system under test successively.

In some embodiments, the jitter parameters include phase noise or a peak value of jitter.

In yet another aspect, an embodiment of the present disclosure also provides a detection device, including an adjustment module, a detection module, and a processing module, wherein the adjustment module is configured to adjust the characteristic parameters of the input signal of the system under test, and for each adjustment , input the adjusted input signal to the system under test; the detection module is configured to detect and record the jitter parameters of the output signal of the system under test; the processing module is configured to control the adjustment module to Adjusting the characteristic parameter of the input signal of the system under test, and determining the tolerance range of the characteristic parameter of the input signal according to the jitter parameter of the output signal corresponding to each adjustment.

In yet another aspect, an embodiment of the present disclosure further provides a computer device, including: one or more processors; a storage device, on which one or more programs are stored; when the one or more programs are stored by the one or more When multiple processors execute, the one or more processors implement the method for detecting the influence of an input signal on an output signal as described above.

In yet another aspect, an embodiment of the present disclosure further provides a computer-readable medium on which a computer program is stored, wherein when the program is executed, the method for detecting the influence of an input signal on an output signal as described above is implemented.

The method for detecting the influence of the input signal on the output signal provided by the embodiments of the present disclosure adjusts the characteristic parameters of the input signal of the system under test successively, and for each adjustment, inputs the adjusted input signal to the system under test, detects and records the system under test The jitter parameter of the output signal of the system is adjusted according to the jitter parameter of the corresponding output signal each time to determine the tolerance range of the characteristic parameter of the input signal. According to the embodiment of the present disclosure, based on the change of the characteristics of the input signal, the change of the jitter of the output signal is obtained, thereby determining the influence degree of the characteristic parameter of the input signal on the output signal of the system under test, so as to guide the design of the system under test. When the system under test fails, the failure can also be reproduced to determine the root cause of the failure.

Description of drawings

FIG. 1 is a schematic diagram of a system architecture provided by an embodiment of the present disclosure;

Fig. 2 is a schematic flowchart of a method for detecting the influence of an input signal on an output signal provided by an embodiment of the present disclosure;

FIG. 3 is a schematic diagram of power supply noise and spectrum characteristics provided by an embodiment of the present disclosure;

FIG. 4 is a schematic diagram of a frequency spectrum of random jitter provided by an embodiment of the present disclosure;

FIG. 5 is a schematic diagram of a frequency spectrum after random jitter and deterministic jitter are superimposed according to an embodiment of the present disclosure;

FIG. 6 is a schematic flow diagram of the characteristic parameters of the input signal used for the next adjustment determined by using the maximum likelihood estimation algorithm provided by an embodiment of the present disclosure;

FIG. 7 is a schematic diagram of phase noise detected by an embodiment of the present disclosure; and

FIG. 8 is a schematic structural diagram of a detection device provided by an embodiment of the present disclosure.

detailed description

Example embodiments will be described more fully hereinafter with reference to the accompanying drawings, but may be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

The terminology used herein is for describing particular embodiments only and is not intended to limit the present disclosure. As used herein, the singular forms "a" and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It will also be understood that when the terms "comprising" and/or "consisting of" are used in this specification, the stated features, integers, steps, operations, elements and/or components are specified to be present but not excluded to be present or Add one or more other features, integers, steps, operations, elements, components and/or groups thereof.

Embodiments described herein may be described with reference to plan views and/or cross-sectional views by way of idealized schematic illustrations of the present disclosure. Accordingly, the example illustrations may be modified according to manufacturing techniques and/or tolerances. Therefore, the embodiments are not limited to the ones shown in the drawings but include modifications of configurations formed based on manufacturing processes. Accordingly, the regions illustrated in the figures have schematic properties, and the shapes of the regions shown in the figures illustrate the specific shapes of the regions of the elements, but are not intended to be limiting.

Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art. It will also be understood that terms such as those defined in commonly used dictionaries should be interpreted as having meanings consistent with their meanings in the context of the relevant art and the present disclosure, and will not be interpreted as having idealized or excessive formal meanings, Unless expressly so limited herein.

The main factors affecting the jitter of the system output signal are the noise of the system power supply and the clock jitter performance of the equipment system. As the input signals of the system, the influence of these input signals on the output performance of the system is difficult to analyze. The embodiments of the present disclosure provide a solution for detecting the influence of input signals on output signals. By successively and quantitatively modifying the characteristic parameters of various input signals and detecting the performance changes of output signals, the influence of characteristic parameters of input signals on system output can be analyzed and judged. The degree of influence, so as to solve the problem of system output performance degradation.

Noise is present in any electrical system. When the noise is large enough, the signal itself will be overwhelmed. The sources of noise in the circuit system include: noise caused by power supply, ground noise, temperature noise, external noise, noise caused by improper layout, etc. Circuit systems respond differently to noise of different natures. In other words, noise sources of different nature have different influences on the system output signal. An embodiment of the present disclosure provides a method for detecting the influence of an input signal on an output signal. By changing the power supply characteristics and/or clock characteristics in the input signal, the change in the performance of the output signal is tested, and the degree of influence of the change in the characteristics of the input signal on the output signal is analyzed. Guide the system design, and can also reproduce the fault and locate the root cause of the fault.

An embodiment of the present disclosure provides a method for detecting the influence of an input signal on an output signal, and the method is applied to the system shown in FIG. 1 . The system includes a detection device 1 and a system to be tested 2, the detection device 1 is respectively connected to the input end and the output end of the system to be tested 2, and is used to provide an input signal to the system to be tested 2, and to detect the output of the system to be tested 2 Signal. The input quantities of the detection device 1 are power supply noise and clock jitter. The detection device 1 outputs two types of signals. One type of signal is one or more power supply signals, capable of supplying power to the main power supply of the single board in the system under test 2 . The output voltage value of each power supply can be adjusted, and can supply power to power supplies with different voltages on the 2 circuit boards of the system under test. Another type of signal is one or more clock signals. These two types of signals are used as input signals of the system under test 2 . The detection device 1 can provide multiple power sources. The detection device 1 detects the jitter change of the output signal of the system under test 2. When the output signal is degraded, the specific cause of the output signal degradation is analyzed by changing the power supply noise and clock jitter.

As shown in FIG. 1 and FIG. 2 , the method for detecting the influence of an input signal on an output signal provided by an embodiment of the present disclosure includes the following steps:

Step 11, adjust the characteristic parameters of the input signal of the system under test successively, input the adjusted input signal to the system under test for each adjustment, detect and record the jitter parameters of the output signal of the system under test.

In some embodiments, the input signal may be a power signal and/or a clock signal. Usually, the system under test 2 has multiple power supplies and multiple clocks. Therefore, the detection device 1 can send multiple power supply signals and/or multiple clock signals to the system under test 2 .

In this step, adjust the value of its characteristic parameter for one type of input signal, detect the jitter parameter of the output signal generated by the system under test 2 based on the adjusted input signal, and record it; then adjust the jitter parameter of the input signal again For the value of the characteristic parameter, the jitter parameter of the output signal generated by the system under test 2 based on the adjusted input signal is detected again, and the jitter parameter is recorded. By analogy, the jitter parameters of multiple output signals can be obtained.

Step 12: Determine the tolerance range of the characteristic parameter of the input signal according to the jitter parameter of the output signal corresponding to each adjustment.

The process of determining the tolerance range of the characteristic parameter of the input signal is the process of locating the critical value of the characteristic parameter of the input signal that causes the degradation of the output signal. The tolerance range of the characteristic parameter is used to indicate the tolerance degree of the output signal to the characteristic parameter of the input signal. The tolerance range of the characteristic parameter can directly reflect the sensitivity of the input signal of the system under test 2. The larger the tolerance range, the lower the sensitivity.

In this step, for example, the characteristic parameters of the input signal and the jitter parameters of the output signal adjusted each time may be summarized and formed into a table, so as to determine the tolerance range of the characteristic parameters of the input signal. It is also possible to input the characteristic parameters of the input signal adjusted each time into a detection device (such as a phase noise meter or an oscilloscope, etc.), observe the change of the jitter parameter of the output signal of the detection device, and then analyze the influence of the system under test 2 on the characteristic parameters of the input signal. tolerance level.

According to the method for detecting the influence of the input signal on the output signal provided by the embodiments of the present disclosure, the characteristic parameters of the input signal of the system under test are adjusted successively, and for each adjustment, the adjusted input signal is input to the system under test, and the system to be tested is detected and recorded. Measure the jitter parameters of the output signal of the system; according to each adjustment of the jitter parameters of the corresponding output signal, determine the tolerance range of the characteristic parameters of the input signal. According to the embodiment of the present disclosure, based on the change of the characteristics of the input signal, the change of the jitter of the output signal is obtained, thereby determining the influence degree of the characteristic parameter of the input signal on the output signal of the system under test, so as to guide the design of the system under test. When the system under test fails, the failure can also be reproduced to determine the root cause of the failure.

In some embodiments, when the input signal is a power signal, the characteristic parameter of the power signal may be noise of the power signal. The noise of the power signal mainly includes thermal noise and switching noise. There are two aspects to considering noise on a power supply signal, the magnitude and frequency of the noise. Thermal noise, also known as white noise, is caused by the thermal vibration of electrons in a conductor, and has a wide spectrum range. The characteristic of switching noise is that the noise spectrum is concentrated on one or several frequencies, and its frequency is related to the switching frequency of the DC-DC converter, generally from tens of kilohertz to several megahertz. This fixed-frequency switching noise has a relatively large impact on the jitter of the circuit.

The adjusting the characteristic parameters of the input signal of the system under test (that is, step 11) includes: adjusting at least one of the amplitude of thermal noise of the power signal, the frequency of switching noise of the power signal, and the amplitude of switching noise of the power signal. The noise adjustment for the power signal can be realized by injecting noise. The amplitude and frequency of the switching noise can be adjusted arbitrarily, and switching noise of one or more frequency points can be output. The frequency of the thermal noise of the power supply is basically unchanged, so the adjustment of the thermal noise of the power supply can be realized by adjusting the amplitude of the thermal noise.

Figure 3 is a schematic diagram of 3.3V power supply noise and spectrum characteristics. As shown in Figure 3, the upper part of Figure 3 is the time-domain waveform of 3.3V power supply noise; the lower part of Figure 3 is the 3.3V power supply noise obtained by FFT (fast Fourier transform) analysis of the time-domain waveform Spectrogram. In the embodiment of the present disclosure, the time-domain waveform and spectrum of the power supply noise are measured and calculated using an oscilloscope, and of course other instruments can also be used for measurement, and examples are not given here.

It can be seen from the frequency spectrum in Figure 3 that there is noise at a fixed frequency in the power supply noise. Therefore, in order to improve the detection accuracy, in some embodiments, adjusting the amplitude of the switching noise of the power signal includes: respectively adjusting the amplitude of the switching noise of the power signal for different frequency points of the power signal. That is to say, adjust the amplitude of switching noise for a certain frequency point of the power signal, and then adjust the amplitude of switching noise for other frequency points of the power signal. In this way, it can be determined which frequency points of the switching noise the output signal is sensitive to.

In some embodiments, when the input signal is a clock signal, the characteristic parameter of the clock signal can be the jitter of the clock signal, and the adjustment of the characteristic parameter of the input signal of the system under test (ie step 11) includes: adjusting the random jitter of the clock signal At least one of the magnitude of the clock signal deterministic jitter, the frequency of the deterministic jitter of the clock signal, and the magnitude of the deterministic jitter of the clock signal. That is to say, for the clock signal output by each clock source, the clock frequency and clock amplitude can be adjusted, deterministic jitter at multiple frequency points can be output, and random jitter and deterministic jitter with different amplitudes can be superimposed on the clock. . Specifically, the clock signal output by the detection device 1 can be connected to the input clock of the circuit in the system under test 2, or connected to the input clock pin of the chip in the system under test 2, so as to apply different degrees of jitter.

The jitter of the clock signal includes random jitter (Random Jitter) and deterministic jitter (Deterministic Jitter). Random jitter is caused by thermal noise etc. As shown in Figure 4, random jitter exhibits a Gaussian distribution. Deterministic jitter is caused by power switching noise, on-chip oscillators, data buses, etc. Deterministic jitter is periodically distributed. Figure 5 shows the superimposed waveform of random jitter and deterministic jitter. As shown in FIG. 5 , there are two peaks in the figure, that is to say, there are two frequency points of deterministic jitter.

For the system under test with multi-signal input, the characteristics of each input signal (ie characteristic parameters) have a certain influence on the output characteristics. It is a time-consuming task to detect the influence of the characteristic parameters of each input signal on the output. The workload depends on the number of input signals and the number of adjustments of the characteristic parameters of each input signal. As the input signal increases, the test effort can increase exponentially. Assume a simpler situation: there are two input signals, and each input signal is adjusted 5 times, then 10 adjustments are required; all adjustments can be traversed to obtain the influence of the two input signals on the output signal. And if there are three input signals, the number of tests increases to 15 times. However, in practice, the input signal may vary a lot, and the number of tests will be massive. Therefore, it is necessary to find a fast, efficient, and automatic method to quickly find the critical value of the influence of the input signal on the output signal.

In some embodiments, adjusting the characteristic parameters of the input signal of the system under test (i.e. step 11) successively includes the following steps: after completing this adjustment of the characteristic parameters of the input signal of the system under test, according to the characteristic parameters of the input signal For the historical sample data and the historical sample data of the jitter parameters of the output signal, a convergence algorithm is used to determine the characteristic parameters of the input signal for next adjustment.

According to the embodiments of the present disclosure, by studying the records of the system under test that have been debugged, and adopting the method of probability statistics, the degree of influence of adjusting the characteristic parameters of each input signal on the output signal is studied; using the fast convergence algorithm, the statistical law is found, Apply these rules to the system under test. In this way, some characteristic parameters that need to be traversed can be skipped, and the critical value of the characteristic parameter of the input signal corresponding to the output signal degradation can be quickly obtained (that is, the output signal is finally degraded to a working value that cannot meet the normal operation of the system).

In some embodiments, the convergence algorithm includes a maximum likelihood estimation algorithm. Correspondingly, as shown in FIG. 6, according to the historical sample data of the characteristic parameters of the input signal and the historical sample data of the jitter parameters of the output signal, a convergence algorithm is used to determine the characteristic parameters of the input signal for the next adjustment, including The following steps:

Step 21, according to the historical sample data of the characteristic parameter of the input signal and the historical sample data of the jitter parameter of the output signal, an adjustment function is generated by fitting.

Step 22, according to the maximum likelihood estimation algorithm and the adjustment function, determine the characteristic parameters of the input signal for the next adjustment.

Fast convergence can be achieved by using the maximum likelihood estimation algorithm. The maximum likelihood estimation algorithm is a statistical method. Different types of veneers have their own statistical rules. In the embodiments of the present disclosure, the existing test results of the previously tested veneers are used as samples. The adjustment function is generated according to the statistical law of the single board. Based on the adjustment function, the critical value of the characteristic parameter of the input signal can be quickly determined according to the maximum likelihood estimation algorithm, so as to quickly determine the tolerance range of the characteristic parameter of the input signal, greatly Reduce test workload and shorten test time.

In the embodiments of the present disclosure, each input power signal or clock signal is adjusted separately and step by step, and the jitter parameter of the output signal is detected. There are two aspects to noise regulation of a power supply signal: the magnitude and frequency of the noise. There are also two aspects to jitter adjustment of clock signals: random jitter and deterministic jitter. For each adjustment aspect, each aspect of each adjustment amount is adjusted in turn, and the value of each characteristic parameter is gradually increased. But such a detection process takes a long time.

In order to realize automated testing and shorten the time-consuming detection, in some embodiments, the adjustment of the characteristic parameters of the input signal of the system under test (that is, step 11) includes: adjusting the input signal of the system under test according to a preset step value The characteristic parameters of . By writing scripts, set the adjustment step value of the characteristic parameters of the power supply and clock, and adjust the value of each characteristic parameter in turn according to the step value, and record the jitter parameters by reading the test instrument used to detect the output signal for each adjustment , so as to realize the automatic adjustment of the characteristic parameters of the power supply and the characteristic parameters of the clock, and realize the automatic recording of the characteristic parameters of the input signal and the change data of the output signal. The test process does not require human participation, and can work day and night, which improves test efficiency and shortens test time to a certain extent. It should be noted that this solution of adjusting the characteristic parameters of the input signal according to the preset step value improves the testing efficiency compared with the manual testing solution. However, since it needs to be adjusted one by one according to the step value, the test time is still relatively long. If the test time needs to be further shortened, then it is necessary to adopt a scheme of adjusting the characteristic parameters of the input signal according to the maximum likelihood estimation algorithm.

In some embodiments, the successively adjusting the characteristic parameters of the input signal of the system under test includes: increasing the value of the characteristic parameter of the input signal of the system under test step by step. That is to say, in order to quickly determine the tolerance range of the characteristic parameters of the input signal, the values of the characteristic parameters of the input signal are adjusted in ascending order.

In some embodiments, the jitter parameters may include phase noise or a peak value of jitter. In the embodiments of the present disclosure, the jitter parameter is phase noise as an example for illustration. The phase noise reflects information such as jitter magnitude and jitter frequency components of the output signal, which are closely related to the noise of the input power supply and the jitter of the clock signal. As shown in Figure 7, the phase noise curve is obtained by using the phase noise meter to detect the output signal. Higher phase noise appears at 100kHz. The characteristic parameters of the power supply and clock can be adjusted successively according to the phase noise, so as to determine the characteristic parameters of the power supply and clock. tolerance range.

It should be noted that the embodiments of the present disclosure may also be used to reproduce system failures. For example, when there is a problem with the output signal of the circuit system, the root cause of the fault can be located by degrading a certain input signal and detecting the input signal with a relatively large response of the system under test to characteristic parameters. Specifically, the values of the characteristic parameters of an input signal are degraded successively, and the jitter parameters of the output signals are respectively recorded. By analyzing the change of the jitter parameter, the value (or value range) of the characteristic parameter of the input signal that has the greatest influence on the output signal is determined, and the characteristic parameter of the input signal is the root cause of the fault.

The method for detecting the influence of an input signal on an output signal provided by the present disclosure is used for detecting the influence of a circuit system input clock and/or power characteristic change on an output. Determine how power supply noise and clock jitter in communication equipment affect electronic circuit boards by analyzing the extent to which the output signal is affected by adding common noise to the input power supply of a circuit system and/or adding common jitter to the input clock. When the circuit board fails, the present disclosure can also reproduce the failure phenomenon by simulating the degradation degree of the power supply and the clock, so as to deeply study the root cause of the failure. The disclosed method for detecting the influence of an input signal on an output signal has high versatility, has the advantages of quantitative analysis and automatic demarcation of parameter critical values, and is used to solve the conduction problems of power supply noise and clock jitter in communication chips and communication systems. The disclosure can analyze the anti-interference ability of the chip clock system, and is used to guide the design of the circuit board and improve the stability of the system.

Based on the same technical concept, an embodiment of the present disclosure also provides a detection device. As shown in FIG. 8 , the detection device includes an adjustment module 101 , a detection module 102 and a processing module 103 .

The adjustment module 101 is configured to adjust the characteristic parameters of the input signal of the system under test, and for each adjustment, input the adjusted input signal to the system under test.

The detection module 102 is configured to detect and record the jitter parameters of the output signal of the system under test.

The processing module 103 is configured to control the adjustment module to adjust the characteristic parameters of the input signal of the system under test successively, and determine the tolerance of the characteristic parameters of the input signal according to the jitter parameters of the output signal corresponding to each adjustment scope.

In some embodiments, the input signal includes a power signal, and the characteristic parameter of the power signal includes noise of the power signal. The adjustment module 101 is configured to adjust at least one of the magnitude of thermal noise of the power signal, the frequency of switching noise of the power signal, and the magnitude of switching noise of the power signal.

In some embodiments, the adjustment module is configured to adjust the amplitudes of the switching noise of the power signal respectively for different frequency points of the power signal.

In some embodiments, the input signal includes a clock signal, and the characteristic parameter of the clock signal includes jitter of the clock signal. The adjustment module 101 is configured to adjust at least one of the amplitude of the random jitter of the clock signal, the frequency of the deterministic jitter of the clock signal, and the amplitude of the deterministic jitter of the clock signal.

In some embodiments, the processing module 103 is configured to, after adjusting the characteristic parameters of the input signal of the system under test this time, according to the historical sample data of the characteristic parameters of the input signal and the jitter parameter of the output signal For historical sample data, a convergence algorithm is used to determine the characteristic parameters of the input signal for the next adjustment.

In some embodiments, the convergence algorithm includes a maximum likelihood estimation algorithm. The processing module 103 is configured to, according to the historical sample data of the characteristic parameter of the input signal and the historical sample data of the jitter parameter of the output signal, fit and generate an adjustment function; determine according to the maximum likelihood estimation algorithm and the adjustment function Characteristic parameters of the input signal used for the next adjustment.

In some embodiments, the adjustment module 101 is configured to adjust the characteristic parameters of the input signal of the system under test according to a preset step value.

In some embodiments, the processing module 103 is configured to successively increase the value of the characteristic parameter of the input signal of the system under test.

An embodiment of the present disclosure also provides a computer device, the computer device includes: one or more processors and a storage device; wherein, one or more programs are stored on the storage device, when the one or more programs are executed by the one or more When executed by one or more processors, the above one or more processors implement the aforementioned method for detecting the influence of an input signal on an output signal.

An embodiment of the present disclosure also provides a computer-readable medium on which a computer program is stored, wherein, when the computer program is executed, the method for detecting the influence of an input signal on an output signal as provided in the foregoing embodiments is implemented.

Those skilled in the art can understand that all or some of the steps in the method disclosed above and the functional modules/units in the device can be implemented as software, firmware, hardware and an appropriate combination thereof. In a hardware implementation, the division between functional modules/units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component may have multiple functions, or one function or step may be composed of several physical components. Components cooperate to execute. Some or all of the physical components may be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit . Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). As known to those of ordinary skill in the art, the term computer storage media includes both volatile and nonvolatile media implemented in any method or technology for storage of information, such as computer readable instructions, data structures, program modules, or other data. permanent, removable and non-removable media. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disk (DVD) or other optical disk storage, magnetic cartridges, tape, magnetic disk storage or other magnetic storage devices, or can Any other medium used to store desired information and which can be accessed by a computer. In addition, as is well known to those of ordinary skill in the art, communication media typically embodies computer readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transport mechanism, and may include any information delivery media .

Example embodiments have been disclosed herein, and while specific terms have been employed, they are used and should be construed in a generic descriptive sense only and not for purposes of limitation. In some instances, it will be apparent to those skilled in the art that features, characteristics and/or elements described in connection with a particular embodiment may be used alone, or may be described in combination with other embodiments, unless explicitly stated otherwise. Combinations of features and/or elements. Accordingly, it will be understood by those of ordinary skill in the art that various changes in form and details may be made without departing from the scope of the present invention as set forth in the appended claims.

Claims

A method of detecting the influence of an input signal on an output signal, wherein the method comprises:

Adjusting the characteristic parameters of the input signal of the system under test one by one, inputting the adjusted input signal into the system under test for each adjustment, detecting and recording the jitter parameters of the output signal of the system under test;

The tolerance range of the characteristic parameter of the input signal is determined according to the jitter parameter of the output signal corresponding to each adjustment.
The method of claim 1, wherein,

The input signal includes a power signal,

The characteristic parameters of the power signal include noise of the power signal,

The adjusting the characteristic parameters of the input signal of the system under test includes: adjusting at least one of the amplitude of the thermal noise of the power signal, the frequency of the switching noise of the power signal, and the amplitude of the switching noise of the power signal.
The method according to claim 2, wherein adjusting the amplitude of the switching noise of the power signal comprises: respectively adjusting the amplitude of the switching noise of the power signal for different frequency points of the power signal.
The method of claim 1 or 2, wherein,

the input signal includes a clock signal,

The characteristic parameter of the clock signal includes the jitter of the clock signal,

The adjusting the characteristic parameters of the input signal of the system under test includes: adjusting at least one of the amplitude of the random jitter of the clock signal, the frequency of the deterministic jitter of the clock signal, and the amplitude of the deterministic jitter of the clock signal.
The method according to claim 1, wherein adjusting the characteristic parameters of the input signal of the system under test successively comprises:

After completing the adjustment of the characteristic parameters of the input signal of the system under test this time, according to the historical sample data of the characteristic parameters of the input signal and the historical sample data of the jitter parameters of the output signal, a convergence algorithm is used to determine the next Adjust the characteristic parameters of the input signal.
The method of claim 5, wherein,

The convergence algorithm comprises a maximum likelihood estimation algorithm,

According to the historical sample data of the characteristic parameters of the input signal and the historical sample data of the jitter parameters of the output signal, using a convergence algorithm to determine the characteristic parameters of the input signal for next adjustment includes:

Fitting and generating an adjustment function according to historical sample data of characteristic parameters of the input signal and historical sample data of jitter parameters of the output signal;

The characteristic parameters of the input signal used for the next adjustment are determined according to the maximum likelihood estimation algorithm and the adjustment function.
The method according to claim 1, wherein said adjusting the characteristic parameters of the input signal of the system under test comprises: adjusting the characteristic parameters of the input signal of the system under test according to a preset step value.
The method according to claim 1, wherein said successively adjusting the characteristic parameters of the input signal of the system under test comprises: successively increasing the value of the characteristic parameter of the input signal of the system under test.
The method according to any one of claims 1-3 and 5-8, wherein the jitter parameters include phase noise or a peak value of jitter.
A detection device, including an adjustment module, a detection module and a processing module, wherein

The adjustment module is configured to adjust the characteristic parameters of the input signal of the system under test, and for each adjustment, input the adjusted input signal to the system under test;

The detection module is configured to detect and record the jitter parameters of the output signal of the system under test;

The processing module is configured to control the adjustment module to adjust the characteristic parameters of the input signal of the system under test successively, and determine the tolerance of the characteristic parameter of the input signal according to the jitter parameters of the output signal corresponding to each adjustment. limited range.
A computer device comprising:

one or more processors;

a storage device having one or more programs stored thereon;

When the one or more programs are executed by the one or more processors, the one or more processors are made to realize the detection of the influence of the input signal on the output signal according to any one of claims 1-9 method.
A computer-readable medium, on which a computer program is stored, wherein, when the program is executed, the method for detecting the influence of an input signal on an output signal according to any one of claims 1-9 is implemented.