WO2022172404A1 - 差動増幅回路 - Google Patents
差動増幅回路 Download PDFInfo
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- WO2022172404A1 WO2022172404A1 PCT/JP2021/005282 JP2021005282W WO2022172404A1 WO 2022172404 A1 WO2022172404 A1 WO 2022172404A1 JP 2021005282 W JP2021005282 W JP 2021005282W WO 2022172404 A1 WO2022172404 A1 WO 2022172404A1
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- amplifier circuit
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- 230000003321 amplification Effects 0.000 title claims abstract 5
- 238000003199 nucleic acid amplification method Methods 0.000 title claims abstract 5
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- 238000010586 diagram Methods 0.000 description 21
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
- H03F3/45183—Long tailed pairs
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
- H03F1/301—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters in MOSFET amplifiers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/56—Modifications of input or output impedances, not otherwise provided for
- H03F1/565—Modifications of input or output impedances, not otherwise provided for using inductive elements
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/60—Amplifiers in which coupling networks have distributed constants, e.g. with waveguide resonators
- H03F3/602—Combinations of several amplifiers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/318—A matching circuit being used as coupling element between two amplifying stages
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/405—Indexing scheme relating to amplifiers the output amplifying stage of an amplifier comprising more than three power stages
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/451—Indexing scheme relating to amplifiers the amplifier being a radio frequency amplifier
Definitions
- the present invention relates to circuits that handle high-frequency electrical signals, and more particularly to differential amplifier circuits.
- differential amplifier circuits are known to have various beneficial properties due to their ability to amplify only differential signals and eliminate common-mode signals.
- a differential amplifier circuit removes common-mode components to generate only complete differential signals.
- this differential signal as the LO signal of the differential mixer, it is possible to eliminate LO leakage, which often causes problems in the mixer (Non-Patent Document 1).
- FIG. 14 shows the configuration of a typical differential amplifier circuit.
- a differential signal V IN is input to a differential pair of differential input ports INP and INN consisting of two transistors Q1 and Q2 forming a source-grounded amplifier, and an amplified signal V OUT is output from differential output ports OUTP and OUTN.
- a current source transistor Q3 tail current source
- Q3 tail current source
- bias V GG1 is set to a bias voltage such that transistor Q3 operates in the saturation region. Since the output impedance of the transistor Q3 in the saturation region takes a very high value, the impedance when the ground potential is viewed from the point X becomes a very high value. This high impedance is equivalent to opening the source terminals of the transistors Q1 and Q2 for the common-mode signals input to the transistors Q1 and Q2. Therefore, the gain (common-mode gain) of the differential amplifier circuit for the common-mode signal becomes very small.
- the differential amplifier circuit of FIG. 14 has gain selectivity with respect to the input signal mode (common-mode or differential). That is, even if a mixed signal of a common mode signal and a differential signal is input to the differential input ports INP and INN, only the differential signal is selectively amplified by the differential amplifier circuit, resulting in the differential output port OUTP. , OUTN output the differential signal V OUT .
- This gain selectivity is an important characteristic of a differential amplifier circuit.
- CMRR common mode rejection ratio
- a problem with the configuration of FIG. 14 is power consumption.
- the power supply voltage V DD increases due to the bias voltage V GG1 for operating the transistor Q3 as a current source, that is, the power consumption increases. That is, the power supply voltage V DD needs to be set to a voltage sufficient to bias two transistors in the saturation region, so the power consumption is approximately double that of a normal single-ended amplifier circuit.
- the power consumption of the amplifier circuit disclosed in Non-Patent Document 2 is 2 W even with a single-ended design.
- inductor L1 is a tail current circuit as shown in FIG. 15 is known.
- the voltage consumed by the tail current circuit becomes 0, and the power supply voltage V DD becomes the voltage of one transistor, so that the power consumption is smaller than in the configuration of FIG.
- Non-Patent Document 3 it can be seen that the upper limit frequency of inductors that can be realized in an integrated circuit process is significantly lower than 300 GHz. Also, even if the inductor could be realized in an integrated circuit process, the layout of the wire-wound inductor would be asymmetrical. In a differential amplifier circuit in which layout symmetry is important, it is difficult to adopt a wire-wound inductor with an asymmetrical layout.
- the present invention has been made to solve the above problems, and an object of the present invention is to provide a differential amplifier circuit that can ensure a large CMRR while maintaining low power consumption.
- a differential amplifier circuit of the present invention includes an amplifier section including a differential pair of transistors to which a differential signal is input, and a tail current circuit comprising a short stub provided between a ground terminal of the amplifier section and the ground. It is characterized by having In one configuration example of the differential amplifier circuit of the present invention, the electrical length of the short stub is shorter than a quarter wavelength of the operating frequency of the differential amplifier circuit.
- a configuration example of the differential amplifier circuit of the present invention is characterized by further comprising a capacitor provided in parallel with the short stub between the ground terminal of the amplifier section and the ground.
- a configuration example of the differential amplifier circuit of the present invention is characterized by further comprising a resistor inserted in series with the capacitor between the ground terminal of the amplifier section and the ground.
- one configuration example of the differential amplifier circuit of the present invention further includes an open stub with one end connected to the ground terminal of the amplifier section and the other end open, wherein the electrical length of the open stub is is shorter than a quarter wavelength of the operating frequency of
- a configuration example of the differential amplifier circuit of the present invention is characterized by further comprising a resistor inserted in series between the ground terminal of the amplifier section and the open stub.
- the amplifier section includes a source-grounded amplifier circuit including the differential pair of transistors, an emitter-grounded amplifier circuit including the differential pair of transistors, and the differential pair of transistors.
- a cascode amplifier circuit including a pair of transistors cascode-connected to the differential pair of transistors.
- CMRR complementary metal-oxide-semiconductor
- FIG. 1 is a diagram showing the configuration of a differential amplifier circuit according to the present invention.
- FIG. 2 is a diagram showing a multi-stage configuration of the differential amplifier circuit according to the present invention.
- 3 is a diagram showing the gain of the differential amplifier circuit of FIG. 2.
- FIG. 4 is a diagram showing the configuration of a differential amplifier circuit using a short stub shorter than a quarter wavelength as a tail current circuit.
- FIG. 5 is a diagram showing changes in common-mode gain when the length of the short stub is changed in the differential amplifier circuit of FIG.
- FIG. 6 is a diagram showing the configuration of the differential amplifier circuit according to the first embodiment of the present invention.
- FIG. 7 is a diagram showing the differential gain and common-mode gain of the differential amplifier circuit according to the first example of the present invention.
- FIG. 8 is a diagram showing the configuration of a differential amplifier circuit according to the second embodiment of the present invention.
- FIG. 9 is a diagram showing the differential gain and common-mode gain of the differential amplifier circuit according to the second embodiment of the invention.
- FIG. 10 is a diagram showing the configuration of a differential amplifier circuit according to the third embodiment of the invention.
- FIG. 11 is a diagram showing the configuration of a differential amplifier circuit according to the fourth embodiment of the invention.
- FIG. 12 is a diagram showing another configuration of the differential amplifier circuit according to the fourth embodiment of the invention.
- FIG. 13 is a diagram showing the configuration of a cascode-type differential amplifier circuit.
- FIG. 14 is a diagram showing the configuration of a conventional differential amplifier circuit.
- FIG. 15 is a diagram showing another configuration of a conventional differential amplifier circuit.
- FIG. 1 is a diagram showing the configuration of a differential amplifier circuit according to the present invention.
- the differential amplifier circuit includes a transistor Q1 whose gate terminal is connected to the input port INP and whose drain terminal is connected to the output port OUTN, and a transistor Q1 whose gate terminal is connected to the input port INN and whose drain terminal is connected to the output port OUTP.
- a transistor Q2 a bias circuit 1 which supplies a bias voltage VGG2 to the gate terminals of the transistors Q1 and Q2, a bias circuit 2 which supplies a power supply voltage V DD to the drain terminals of the transistors Q1 and Q2, and one end of which is connected to the transistors Q1 and Q2. and a short stub S1 which is connected to the source terminal of and the other end of which is grounded.
- the differential pair of transistors Q1 and Q2 constitutes an amplifier section 5. Also, the transistors Q1 and Q2 each constitute a source-grounded amplifier circuit. The gate terminals of the transistors Q1 and Q2 are the input terminals of the amplifier section 5, the drain terminals thereof are the output terminals of the amplifier section 5, and the source terminals thereof are the ground terminals of the amplifier section 5. FIG.
- the bias circuit 1 comprises, for example, a resistor for applying a bias voltage V GG2 to the gate terminal of the transistor Q1 and a resistor for applying the bias voltage V GG2 to the gate terminal of the transistor Q2.
- the bias circuit 2 is composed of, for example, a resistor for applying the power supply voltage VDD to the drain terminal of the transistor Q1 and a resistor for applying the power supply voltage VDD to the drain terminal of the transistor Q2.
- a short stub S1 made of a transmission line is used as the tail current circuit of the differential amplifier circuit as shown in FIG.
- the impedance when the short stub S1 is viewed from the point X becomes a very high value. This is equivalent to opening the source terminals of the transistors Q1 and Q2, and the differential amplifier circuit of FIG. 1 operates in the same manner as the configuration of FIG.
- the present invention does not require a current source transistor, it is possible to solve the problem of increased power consumption, which is a problem of conventional differential amplifier circuits. Moreover, in the present invention, by using the short stub S1 capable of realizing a symmetrical structure, it is possible to solve layout problems caused by using an asymmetrical inductor.
- FIG. 1 poses a serious problem in terms of integrated circuit layout when applied to a multistage amplifier circuit in a frequency band of 300 GHz or higher. This issue is discussed below.
- the length of a quarter-wave line in the 300 GHz band takes values of approximately 100 to 200 ⁇ m. This value is unacceptably large when considering multi-stage differential amplifier circuits.
- Non-Patent Document 2 an amplifier circuit having a significant gain is first constructed by using transistors in multiple stages. can do. In such a multistage amplifier circuit, minimizing the loss of the interstage matching circuit connecting the amplifier circuits is a very important design factor for securing the gain of the multistage amplifier circuit. In order to reduce the loss of the interstage matching circuit, it is important to shorten the physical length of the interstage matching circuit as much as possible, as described in Non-Patent Document 2.
- FIG. 2 shows a configuration in which the differential amplifier circuit in FIG. 1 is multistaged.
- the differential amplifier circuit in FIG. 1 is multistaged.
- five stages of differential amplifier circuits are connected in series.
- the short stub S1 of each stage has one end connected to the source terminals of the transistors Q1 and Q2 and the other end connected to the ground.
- the first-stage inter-stage matching circuits 3, 4 are inserted between the input ports INP, INN and the gate terminals of the first-stage transistors Q1, Q2.
- the first-stage inter-stage matching circuit 3 matches the impedance of the input port INP with the impedance of the gate terminal of the first-stage transistor Q1 viewed from the input port INP.
- the first-stage inter-stage matching circuit 4 matches the impedance of the input port INN with the impedance of the gate terminal of the first-stage transistor Q2 viewed from the input port INN.
- the input terminal of the inter-stage matching circuit 3 other than the first stage is connected to the drain terminal of the transistor Q1 in the previous stage, and the output terminal is connected to the gate terminal of the transistor Q1 in the subsequent stage.
- the input terminal of the interstage matching circuit 4 other than the first stage is connected to the drain terminal of the transistor Q2 in the previous stage, and the output terminal is connected to the gate terminal of the transistor Q2 in the subsequent stage.
- the inter-stage matching circuits 3 other than the first stage match the impedance of the drain terminal of the transistor Q1 in the previous stage with the impedance of the gate terminal of the transistor Q1 in the subsequent stage as seen from the drain terminal.
- the inter-stage matching circuits 4 other than the first stage match the impedance of the drain terminal of the transistor Q2 in the previous stage with the impedance of the gate terminal of the transistor Q2 in the subsequent stage as seen from the drain terminal.
- the drain terminals of the final-stage transistors Q1 and Q2 are connected to the output ports OUTN and OUTP.
- a bias circuit 1 that supplies a bias voltage V GG2 to the gate terminals of the transistors Q1 and Q2 in each stage and the transistors Q1 and Q2 in each stage are connected.
- a bias circuit 2 for supplying the power supply voltage V DD to the drain terminal.
- each of the interstage matching circuits 3 and 4 cannot be set to a quarter wavelength or less of the operating frequency of the differential amplifier circuit. Therefore, a loss (approximately 1.5 dB) corresponding to a quarter wavelength line is given between the stages of the amplifier circuit, making it impossible to form a high-gain multistage amplifier circuit.
- FIG. 3 shows the gain of the dynamic amplifier circuit.
- Reference numeral 30 in FIG. 3 indicates the gain when the inter-stage matching circuits 3 and 4 are matching circuits having an appropriate physical length (approximately 20 to 40 ⁇ m) as used in Non-Patent Document 2.
- FIG. 3 it is practically impossible to arrange the interstage matching circuits 3 and 4 of this length in the layout of FIG.
- 31 in FIG. 3 indicates the gain in the case of a realistically realizable layout in which the length of the interstage matching circuits 3 and 4 is 140 ⁇ m.
- the gain is significantly reduced due to the loss of the quarter-wave line.
- the gain is 7.5 dB lower than when the lengths of the interstage matching circuits 3 and 4 are set to appropriate physical lengths.
- a loss increase of 1.5 dB which is the loss of the quarter-wave line, occurs per stage.
- the transmission line loss increases as the frequency increases, the gain difference between the cases 30 and 31 in FIG. 3 increases as the frequency increases.
- the length of the short stub S1 shorter than a quarter wavelength of the operating frequency of the differential amplifier circuit. Therefore, a configuration as shown in FIG. 4 is considered.
- the source terminals of the transistors Q1 and Q2 are not completely open, and it is equivalent to a configuration in which an inductance is inserted between the source terminals of the transistors Q1 and Q2 and the ground. This inductance has the effect of degenerating the gain of the common source amplifier circuit.
- FIG. 5 shows changes in the common-mode gain of the differential amplifier circuit when the length Ltail of the short stub S1 in FIG. 4 is changed from 0 to 140 ⁇ m.
- the length of the interstage matching circuits 3 and 4 is set to 140 ⁇ m.
- Ltail to 140 ⁇ m, which corresponds to the quarter wavelength of the 300 GHz band, it can be seen that the gain is greatly reduced in the range of 200 to 300 GHz.
- the gain is reduced due to the gain degeneracy effect even when the short stub S1 shorter than a quarter wavelength is used.
- the gain degeneration effect of making the short stub S1 shorter than a quarter wavelength is very small at low frequencies.
- the common mode gain can be reduced to 0 dB or less. Therefore, if the circuit in FIG. 4 is multi-staged, a differential amplifier circuit with a large CMRR can be realized even with a stub length of 80 ⁇ m.
- the present invention uses a short stub made up of a transmission line as the tail current circuit of the differential amplifier circuit.
- a short stub length shorter than 1/4 wavelength is used, and the short stub is equivalent to the gain degeneration effect. Acting as an inductor is used to reduce common mode gain.
- FIG. 6 is a diagram showing the configuration of the differential amplifier circuit according to the first embodiment of the present invention.
- This embodiment is a specific example of the configuration described in the principle of the invention.
- the short stub S1a and the inter-stage matching circuits 3a and 4a have the same length, which is shorter than the quarter wavelength of the operating frequency of the differential amplifier circuit.
- five stages of differential amplifier circuits are connected in series as in FIG.
- a bias circuit 1 that supplies a bias voltage V GG2 to the gate terminals of the transistors Q1 and Q2 in each stage, and a power supply voltage V DD to the drain terminals of the transistors Q1 and Q2 in each stage.
- a bias circuit 2 for supplying .
- FIG. 7 shows the calculation results of the differential gain and common-mode gain of the differential amplifier circuit when the length of the short stub S1a and the interstage matching circuits 3a and 4a is 80 ⁇ m in this embodiment.
- 70 in FIG. 7 indicates the differential gain and 71 indicates the common mode gain.
- the differential gain is larger than in the case of 31 in FIG. 3 due to the shortening of the inter-stage matching circuits 3a and 4a.
- the common-mode gain is suppressed to 0 dB or less.
- a CMRR of 15 dB at 300 GHz which is defined as the ratio of differential gain to common-mode gain, can be secured.
- FIG. 8 is a diagram showing the configuration of a differential amplifier circuit according to a second embodiment of the present invention.
- a capacitor C is added in parallel with the short stub S1a between the source terminals of the transistors Q1 and Q2 and the ground in order to obtain a higher common mode rejection ratio than in the first embodiment.
- FIG. 9 shows the calculation results of the differential gain and common-mode gain of the differential amplifier circuit of this embodiment.
- the length of the short stub S1a and the inter-stage matching circuits 3a and 4a is 80 ⁇ m.
- the value of capacitance C is 4 fF.
- 90 in FIG. 9 indicates the differential gain and 91 indicates the common mode gain.
- this embodiment can reduce the common-mode gain by 2 dB or more at 300 GHz. This improves the CMRR of the differential amplifier circuit by 2 dB or more.
- a further effect of this embodiment is that the short stub S1a can be shortened. That is, if the short stub S1a is shortened within the range where the value of the equation (1) becomes the same resonance frequency F, and instead the capacitance C is increased, the same CMRR improvement effect as when the short stub S1a is long can be obtained.
- the short stub S1a arranged between the inter-stage matching circuits 3a and 4a should be shortened. In other words, it is possible to deal with this by reducing the inductance L in the equation (1) and increasing the capacitance C.
- the width of the inductance L (the length of the short stub S1a) and the capacitance C that can be realized by layout is determined. Therefore, it is only necessary to find the length of the short stub S1a that can be laid out and the value of the capacitance C within the range that satisfies the expression (1).
- the degree of freedom in layout of the differential amplifier circuit can be improved.
- FIG. 10 is a diagram showing the configuration of a differential amplifier circuit according to the third embodiment of the present invention.
- an open stub S2 which is a transmission line with one end connected to the source terminals of the transistors Q1 and Q2 and the other end open, is provided.
- This embodiment provides a configuration that can be implemented when it is necessary to use a small capacity in the second embodiment.
- a capacitance as small as several fF has a large fringe effect, making it difficult to estimate an accurate value during layout. Therefore, as shown in FIG. 10, it is conceivable to replace the capacitance C with an open stub S2.
- the open stub S2 which is sufficiently shorter than the quarter wavelength of the operating frequency of the differential amplifier circuit, equivalently functions as a parallel capacitance of the short stub S1a as in the configuration of FIG. Therefore, this embodiment has a common-mode rejection effect similar to that of the second embodiment.
- FIG. 11 is a diagram showing the configuration of a differential amplifier circuit according to the fourth embodiment of the present invention.
- a resistor R is inserted in series with the capacitance C between the source terminals of the transistors Q1 and Q2 and the ground in the second embodiment.
- the Q value of resonance determined by Equation (1) can be reduced, and the common-mode rejection effect can be exhibited over a wider band.
- resistor R As shown in FIG. 12, it is also possible to apply the resistor R to the third embodiment.
- a resistor R is inserted between the source terminals of the transistors Q1 and Q2 and the open stub S2.
- FIG. 13 is a diagram showing the configuration of a cascode differential amplifier circuit.
- the cascode differential amplifier circuit includes a transistor Q1 whose gate terminal is connected to the output terminal of the interstage matching circuit 3a and whose drain terminal is connected to the output port OUTN, and whose gate terminal is connected to the output terminal of the interstage matching circuit 4a.
- a transistor Q2 having a drain terminal connected to the output port OUTP, a transistor Q3 having a gate terminal applied with a bias voltage V GG3 and a source terminal connected to the drain terminal of the transistor Q1, and a gate terminal having a bias voltage V GG3 . It consists of a transistor Q4 to which GG3 is applied and whose source terminal is connected to the drain terminal of the transistor Q2, and a short stub S1a whose one end is connected to the source terminals of the transistors Q1 and Q2 and whose other end is grounded. .
- the transistors Q1 and Q2 and the transistors Q3 and Q4 cascode-connected to the transistors Q1 and Q2 form an amplifying section 5a (cascode amplifying circuit).
- the bias voltage V GG2 is supplied from the bias circuit 1 to the gate terminals of the transistors Q1 and Q2 in each stage. Further, the bias voltage VGG3 is supplied from the bias circuit 6 to the gate terminals of the transistors Q3 and Q4 in each stage, and the power supply voltage V DD is supplied from the bias circuit 2 to the drain terminals of the transistors Q3 and Q4 in each stage.
- the input terminal of the inter-stage matching circuit 3a other than the first stage is connected to the drain terminal of the transistor Q1 and the source terminal of the transistor Q3 in the preceding stage, and the inter-stage matching circuit 3a
- the output terminal may be connected to the gate terminal of the subsequent transistor Q1.
- the input terminal of the interstage matching circuit 4a other than the first stage is connected to the drain terminal of the transistor Q2 and the source terminal of the transistor Q4 in the previous stage, and the output terminal of the interstage matching circuit 4a is connected to the gate terminal of the transistor Q2 in the subsequent stage. Just do it.
- the drain terminal of the final-stage transistor Q1 and the source terminal of the transistor Q3 are connected to the output port OUTN.
- the drain terminal of the final-stage transistor Q2 and the source terminal of the transistor Q4 are connected to the output port OUTP.
- 1, 2, 4, 6, 8, and 10 to 13 show examples in which field effect transistors are used as the transistors Q1 to Q4, but bipolar transistors may also be used.
- the gate terminal should be replaced with the base terminal, the drain terminal with the collector terminal, and the source terminal with the emitter terminal (ground terminal).
- 1, 2, 4, 6, 8, and 10 to 12 when bipolar transistors are used, it goes without saying that the transistors Q1 and Q2 form a grounded-emitter amplifier circuit.
- the present invention can be applied to differential amplifier circuits.
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Abstract
Description
しかしながら、300GHzを超えるような周波数帯では、巻き線等でインダクタL1を実現したとしても、インダクタンスL1の自己共振周波数が300GHzよりも一般には低くなるため、インダクタL1そのものを集積回路プロセスで実現することが困難となる。
また、本発明の差動増幅回路の1構成例において、前記ショートスタブの電気長は、差動増幅回路の動作周波数の四分の一波長よりも短いことを特徴とするものである。
また、本発明の差動増幅回路の1構成例は、前記増幅部の接地端子とグラウンドとの間に前記ショートスタブと並列に設けられた容量をさらに備えることを特徴とするものである。
また、本発明の差動増幅回路の1構成例は、前記増幅部の接地端子とグラウンドとの間に、前記容量と直列に挿入された抵抗をさらに備えることを特徴とするものである。
また、本発明の差動増幅回路の1構成例は、前記増幅部の接地端子と前記オープンスタブとの間に直列に挿入された抵抗をさらに備えることを特徴とするものである。
また、本発明の差動増幅回路の1構成例において、前記増幅部は、前記差動対トランジスタを含むソース接地増幅回路、前記差動対トランジスタを含むエミッタ接地増幅回路、前記差動対トランジスタとこの差動対トランジスタにカスコード接続された1対のトランジスタとを含むカスコード増幅回路のいずれかである。
本発明では、差動増幅回路のテール電流源回路に伝送線路をベースとした回路を適用することにより、前述の課題を解決する。図1は本発明に係る差動増幅回路の構成を示す図である。差動増幅回路は、ゲート端子が入力ポートINPに接続され、ドレイン端子が出力ポートOUTNに接続されたトランジスタQ1と、ゲート端子が入力ポートINNに接続され、ドレイン端子が出力ポートOUTPに接続されたトランジスタQ2と、トランジスタQ1,Q2のゲート端子にバイアス電圧VGG2を供給するバイアス回路1と、トランジスタQ1,Q2のドレイン端子に電源電圧VDDを供給するバイアス回路2と、一端がトランジスタQ1,Q2のソース端子に接続され、他端がグラウンドに接続されたショートスタブS1とから構成される。
図2の例では、バイアス回路の具体的な結線について記載していないが、各段のトランジスタQ1,Q2のゲート端子にバイアス電圧VGG2を供給するバイアス回路1と、各段のトランジスタQ1,Q2のドレイン端子に電源電圧VDDを供給するバイアス回路2とを設けるようにすればよい。
一方、図3の31は、段間整合回路3,4の長さを140μmとした、現実的に実現可能なレイアウトの場合を利得を示している。
以下、本発明の実施例について図面を参照して説明する。図6は本発明の第1の実施例に係る差動増幅回路の構成を示す図である。本実施例は、発明の原理で述べた構成の具体例である。本実施例では、ショートスタブS1aと段間整合回路3a,4aを同じ長さとし、差動増幅回路の動作周波数の四分の一波長よりも短くした。図6の例では、図2と同様に差動増幅回路を5段直列に接続している。
次に、本発明の第2の実施例について説明する。図8は本発明の第2の実施例に係る差動増幅回路の構成を示す図である。本実施例では、第1の実施例において更に大きな同相除去比を得るために、トランジスタQ1,Q2のソース端子とグラウンドとの間に、ショートスタブS1aと並列に容量Cを追加している。
F=1/(2π√LC) ・・・(1)
次に、本発明の第3の実施例について説明する。図10は本発明の第3の実施例に係る差動増幅回路の構成を示す図である。本実施例では、第2の実施例において容量Cの代わりに、一端がトランジスタQ1,Q2のソース端子に接続され、他端が開放された伝送線路であるオープンスタブS2を設けている。本実施例は、第2の実施例において小さい容量を使う必要がある場合に実現可能な構成を提供するものである。
次に、本発明の第4の実施例について説明する。図11は本発明の第4の実施例に係る差動増幅回路の構成を示す図である。本実施例では、第2の実施例においてトランジスタQ1,Q2のソース端子とグラウンドとの間に、容量Cと直列に抵抗Rを挿入している。
Claims (7)
- 差動信号が入力される差動対トランジスタを含む増幅部と、
前記増幅部の接地端子とグラウンドとの間に設けられたショートスタブからなるテール電流回路とを備えることを特徴とする差動増幅回路。 - 請求項1記載の差動増幅回路において、
前記ショートスタブの電気長は、差動増幅回路の動作周波数の四分の一波長よりも短いことを特徴とする差動増幅回路。 - 請求項1または2記載の差動増幅回路において、
前記増幅部の接地端子とグラウンドとの間に前記ショートスタブと並列に設けられた容量をさらに備えることを特徴とする差動増幅回路。 - 請求項3記載の差動増幅回路において、
前記増幅部の接地端子とグラウンドとの間に、前記容量と直列に挿入された抵抗をさらに備えることを特徴とする差動増幅回路。 - 請求項1または2記載の差動増幅回路において、
一端が前記増幅部の接地端子に接続され、他端が開放されたオープンスタブをさらに備え、
前記オープンスタブの電気長が差動増幅回路の動作周波数の四分の一波長よりも短いことを特徴とする差動増幅回路。 - 請求項5記載の差動増幅回路において、
前記増幅部の接地端子と前記オープンスタブとの間に直列に挿入された抵抗をさらに備えることを特徴とする差動増幅回路。 - 請求項1乃至6のいずれか1項に記載の差動増幅回路において、
前記増幅部は、前記差動対トランジスタを含むソース接地増幅回路、前記差動対トランジスタを含むエミッタ接地増幅回路、前記差動対トランジスタとこの差動対トランジスタにカスコード接続された1対のトランジスタとを含むカスコード増幅回路のいずれかであることを特徴とする差動増幅回路。
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