WO2022141797A1 - 电压校准电路和方法 - Google Patents

电压校准电路和方法 Download PDF

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Publication number
WO2022141797A1
WO2022141797A1 PCT/CN2021/079683 CN2021079683W WO2022141797A1 WO 2022141797 A1 WO2022141797 A1 WO 2022141797A1 CN 2021079683 W CN2021079683 W CN 2021079683W WO 2022141797 A1 WO2022141797 A1 WO 2022141797A1
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Prior art keywords
voltage
calibration
reference voltage
signal
comparator
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PCT/CN2021/079683
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English (en)
French (fr)
Inventor
陈伟盛
温长清
梁爱梅
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深圳市紫光同创电子有限公司
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Priority to JP2023527405A priority Critical patent/JP2023548703A/ja
Publication of WO2022141797A1 publication Critical patent/WO2022141797A1/zh

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/468—Regulating voltage or current wherein the variable actually regulated by the final control device is dc characterised by reference voltage circuitry, e.g. soft start, remote shutdown
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/461—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using an operational amplifier as final control device

Definitions

  • the embodiments of the present application relate to the field of integrated circuit design, in particular, but not limited to, a voltage calibration circuit and method.
  • LDO Low Dropout Regulator, low dropout linear regulator
  • LDO is a linear DC (Direct Current) voltage regulator
  • LDO is a linear step-down power management chip
  • LDO has low cost, low noise and low quiescent current. Etc. Therefore, how to simply and effectively calibrate the voltage of the LDO circuit system is an urgent problem to be solved.
  • the voltage calibration circuit and method provided by the embodiments of the present application mainly solve the technical problem of how to simplify the process of voltage self-calibration.
  • an embodiment of the present application provides a voltage calibration circuit
  • the voltage calibration circuit includes: a reference voltage generation module, the reference voltage generation module is configured to obtain a reference voltage and send the reference voltage to a comparator, so The reference voltage is obtained by the reference voltage generation module according to the temperature data; a comparator, the comparator includes a first voltage receiving end and a second voltage receiving end, and the comparator communicates with the first voltage receiving end through the first voltage receiving end.
  • the reference voltage generation module is connected, the comparator receives the voltage to be calibrated through the second voltage receiving terminal, and the comparator is used to compare the reference voltage with the voltage to be calibrated to obtain a voltage comparison result; calibration control
  • the calibration controller is connected to the result output end of the comparator, and the calibration controller is configured to calibrate the voltage to be calibrated according to the comparison result transmitted by the comparator to obtain a target voltage.
  • the voltage calibration circuit includes a main body circuit, the main body circuit is connected to the comparator, and the main body circuit is configured to acquire the voltage to be calibrated and send the reference voltage to be calibrated to the comparator.
  • the voltage calibration circuit further includes a counter; a first connection end of the counter is connected to the calibration controller, a second connection end of the counter is connected to the main body circuit, and the counter is used for receiving
  • the calibration controller sends the lift control signal, and obtains the count value according to the lift control signal.
  • the main circuit includes a calibration judging module, an error amplifier and a driving module; the calibration judging module is connected to the counter, and the calibration judging module is used to receive the count value sent by the counter, and according to The count value determines whether to end the calibration operation; the error amplifier is connected to the calibration judgment module, and the error amplifier is used to stabilize the target voltage at a fixed value when the calibration judgment module determines that the calibration operation ends voltage range; the driving module is connected to the error amplifier, and the driving module is used to generate the current required for the main circuit to work.
  • the reference voltage generation module includes a temperature sensor, an analog-to-digital converter, and a reference voltage acquisition unit; the temperature sensor is connected to the analog-to-digital converter, and the temperature sensor is used for collecting temperature data and converting all the temperature data.
  • the temperature data is transmitted to the analog-to-digital converter; the first connection end of the analog-to-digital converter is connected to the temperature sensor, and the second connection end of the analog-to-digital converter is connected to the reference voltage acquisition unit,
  • the analog-to-digital converter is used to convert the temperature data into a temperature digital signal, and transmit the temperature digital signal to the reference voltage acquisition unit;
  • the first connection end of the reference voltage acquisition unit is connected to the analog-to-digital signal a converter is connected, a second connection end of the reference voltage obtaining unit is connected to the comparator, the reference voltage obtaining unit is used for obtaining a voltage corresponding to the temperature digital signal, and transmitting the voltage as a reference voltage to the comparator.
  • the voltage calibration circuit includes a calibration signal generation module, the calibration signal generation module is connected to the calibration controller, the calibration signal generation module is used to generate a calibration signal, and the calibration signal is used to trigger the calibration signal.
  • the calibration controller performs voltage calibration operations.
  • the calibration signal generating module includes a first signal generating module, the calibration controller is connected to the first signal generating module through a first signal receiving end, and the first signal receiving end is used to receive the The first signal generates a first signal sent by the module, where the first signal is a calibration signal input by a user.
  • the calibration signal generating module includes a second signal generating module, the calibration controller is connected to the second signal generating module through a second signal receiving end, and the second signal receiving end is used for The second signal sent by the second signal generating module is received when the reference voltage changes.
  • the calibration signal generating module includes a third signal generating module, the calibration controller is connected to the third signal generating module through a third signal receiving end, and the third signal receiving end is used to receive the The third signal generates a third signal sent by the module, and the third signal is a clock signal.
  • an embodiment of the present application further provides a voltage calibration method, which is applied to the voltage calibration circuit of the first aspect.
  • the method includes: acquiring a voltage to be calibrated and a reference voltage, where the reference voltage is the reference voltage
  • the generating module obtains according to the temperature data; compares the voltage to be calibrated with the reference voltage to obtain a voltage comparison result; calibrates the voltage to be calibrated according to the voltage comparison result.
  • the voltage calibration circuit includes a reference voltage generation module, a comparator, and a calibration controller, wherein the reference voltage generation module is used to obtain a reference voltage, and send the reference voltage to the to a comparator, where the reference voltage is obtained by the reference voltage generating module according to temperature data, the comparator includes a first voltage receiving end and a second voltage receiving end, and the comparator passes the first voltage receiving end is connected to the reference voltage generating module, the comparator receives the voltage to be calibrated through the second voltage receiving terminal, and the comparator is used for comparing the reference voltage with the voltage to be calibrated to obtain a voltage comparison result,
  • the calibration controller is connected to the result output end of the comparator, and the calibration controller is configured to calibrate the voltage to be calibrated according to the comparison result transmitted by the comparator to obtain a target voltage.
  • the self-calibration of the voltage can be realized more simply and effectively by combining the reference voltage generating module, the comparator and the calibration controller.
  • FIG. 1 is a schematic structural diagram of a voltage calibration circuit according to an embodiment of the present application
  • FIG. 2 is a schematic structural diagram of a calibration controller in a voltage calibration circuit provided by an embodiment of the present application
  • FIG. 3 is a schematic structural diagram of a voltage calibration circuit provided by another embodiment of the present application.
  • FIG. 4 is a schematic structural diagram of a main circuit in a voltage calibration circuit provided by another embodiment of the present application.
  • FIG. 5 is a schematic structural diagram of a specific voltage calibration circuit provided by another embodiment of the present application.
  • FIG. 6 is a schematic diagram of acquiring different signals in a specific voltage calibration circuit provided by another embodiment of the present application.
  • FIG. 7 is a schematic structural diagram of a specific voltage calibration circuit provided by another embodiment of the present application.
  • FIG. 8 is a method flowchart of a voltage calibration method provided by an embodiment of the present application.
  • the inventor proposes the voltage calibration circuit and method provided by the embodiments of the present application.
  • the embodiments of the present application can simplify the implementation conditions of voltage self-calibration through the reference voltage generation module, the comparator and the calibration controller. Reduced voltage self-calibration requirement.
  • the voltage calibration circuit 100 may include a reference voltage generating module 110 , a comparator 120 and a calibration controller 130 .
  • the reference voltage generation module 110 is used to obtain a reference voltage and send the reference voltage to the comparator 120, and the reference voltage is obtained by the reference voltage generation module 110 according to temperature data.
  • the voltage calibration circuit 100 may be a linear low dropout regulator (LDO).
  • the comparator 120 may include a first voltage receiving end 121 and a second voltage receiving end 122 , the comparator 120 may be connected to the reference voltage generating module 110 through the first voltage receiving end 121 , and at the same time The comparator 120 may receive the voltage to be calibrated through the second voltage receiving terminal 122, and the comparator 120 is configured to compare the reference voltage with the voltage to be calibrated to obtain a voltage comparison result, and the to-be-calibrated voltage is obtained.
  • the voltage can also be referred to as the LDO actual voltage.
  • the comparator 120 when the comparator 120 receives the reference voltage and the voltage to be calibrated sent by the first voltage receiving end 121 and the second voltage receiving end 122, it can compare the reference voltage and the voltage to be calibrated to obtain the voltage Comparing results. Specifically, the comparator 120 may determine whether the voltage to be calibrated is greater than the reference voltage, and when it is determined that the voltage to be calibrated is greater than the reference voltage, the voltage comparison result output by the comparator 120 is 1, and the embodiment of the present invention may The voltage comparison result 1 is sent to the calibration controller 130 as a lift control signal to instruct the calibration controller 130 to reduce the voltage to be calibrated.
  • the calibration controller 130 may calibrate according to the preset voltage. For example, when it is determined that the to-be-calibrated voltage V out is smaller than the reference voltage V ref , the calibration controller 130 may increase the to-be-calibrated voltage V out by a preset voltage value O each time during calibration, and the value of the to-be-calibrated voltage V out will be increased by 0 every time the calibration is performed once.
  • the calibrated voltage the voltage to be calibrated V out +O.
  • the voltage calibration circuit may stop performing the calibration operation on the voltage.
  • the preset voltage value can remain unchanged, that is, the voltage value that is increased or decreased is the same for each calibration.
  • the preset voltage value O can be 0.2, that is, when the voltage to be calibrated is calibrated, the voltage to be calibrated V out is increased by 0.2V each time, and the During the process, the preset voltage value O remains unchanged, and the calibration voltages V out obtained at this time are 3.2V, 3.4V, 3.6V, 3.8V and 4.0V.
  • the preset voltage value may also vary, that is, when performing voltage calibration, the preset voltage value may be decremented.
  • the preset voltage value O may be 0.5V
  • the preset voltage value O may become 0.4V
  • the preset voltage value O can become 0.3V etc.
  • the maximum preset voltage value O may be used to calibrate the voltage to be calibrated at the beginning of the calibration.
  • the preset voltage value can be reduced.
  • the voltage to be calibrated V out is 3V
  • the reference voltage V ref is 4V
  • the maximum preset voltage value O can be 0.4V, because the voltage to be calibrated V out is less than the reference voltage V ref , at this time, it can be increased to be calibrated
  • the voltage V out , the voltage V out to be calibrated obtained at this time is 3.4V and 3.8V respectively.
  • the calibration controller 130 is connected to the result output end 123 of the comparator 120 , and the calibration controller 130 is configured to perform the calibration on the to-be-calibrated according to the comparison result transmitted by the comparator 120 .
  • the voltage is calibrated to get the target voltage.
  • the embodiment of the present invention provides a schematic structural diagram as shown in FIG. 2 .
  • the voltage calibration circuit 100 may include a reference voltage in addition to a reference voltage.
  • the generation module 110 , the comparator 120 and the calibration controller 130 it may also include a calibration signal generation module 140 , the calibration signal generation module is connected to the calibration controller 130 , and the calibration signal generation module 140 is used for generating calibration signal, the calibration signal is used to trigger the calibration controller 130 to perform a voltage calibration operation.
  • the calibration signal generating module 140 may include a first signal generating module 141, and the calibration controller 130 is connected to the first signal generating module 141 through a first signal receiving end, the first signal receiving end It is used to receive the first signal sent by the first signal generating module 141, where the first signal is a calibration signal input by the user, and the first signal may also be called a forced calibration signal.
  • the first signal may be a forced calibration command sent by the chip, and the first signal is not constrained by the voltage calibration circuit, that is, the first signal generating module 141 may belong to the voltage calibration circuit 100, or may be independent of the voltage calibration circuit 100. Chip outside the voltage calibration circuit 100 .
  • the calibration signal generation module 140 may further include a second signal generation module 142, the calibration controller 130 is connected to the second signal generation module 142 through a second signal receiving end, the second signal generation module 142
  • the signal receiving end is used to receive the second signal sent by the second signal generating module 142 when the reference voltage changes
  • the second signal may also be called a state change signal, and the state change signal mainly refers to Reference voltage change signal.
  • the second signal is set to 1 and transmitted to the calibration controller 130 to instruct the calibration controller 130 to perform a voltage calibration operation.
  • the reference voltage usually changes due to changes in temperature, that is, when the temperature changes, the second signal generating module 142 generates a second signal and transmits the second signal to the calibration controller 130 , to instruct the calibration controller 130 to calibrate the output voltage of the output voltage calibration circuit 100 according to the latest reference voltage.
  • the second signal may be based on the calibration controller 130 monitoring the variation of the reference voltage, and when the reference voltage varies, the second signal will be enabled to make the calibration controller 130 perform the calibration operation.
  • the calibration signal generating module 140 may further include a third signal generating module 143, the calibration controller 130 is connected to the third signal generating module 143 through a third signal receiving end, the first The three-signal receiving end is configured to receive a third signal sent by the third signal generating module 143, where the third signal is a clock signal.
  • the recalibration command is automatically sent after an interval of M+1 clock cycles, that is, the third signal generation module 143 may send a third signal every M+1 clock cycles , to instruct the calibration controller to perform a voltage calibration operation through the third signal.
  • the calibration controller 130 will perform a voltage calibration operation, that is, after a certain clock cycle, or externally forcibly inject a calibration command , or the calibration reference condition changes, the calibration controller 130 will perform a voltage calibration operation.
  • the calibration reference condition may be whether the reference voltage changes, whether the comparison condition changes, or whether the current environment changes. From FIG. 2 , the logical relationship of “OR” satisfied among the first signal, the second signal and the third signal can be clearly known.
  • the reference voltage in the embodiment of the present invention may be fixed or constantly changing, that is, when the ambient temperature where the voltage calibration circuit is located changes, the reference voltage will also change correspondingly .
  • the reference voltage may be obtained by continuous calibration according to the actual output reference voltage and the actual output reference voltage, that is, the reference voltage may also be obtained by continuous calibration, and the calibration process of the reference voltage is similar to the calibration process of the voltage to be calibrated. Repeatedly describe them one by one.
  • a voltage calibration circuit provided by an embodiment of the present application includes a reference voltage generation module, a comparator, and a calibration controller, wherein the reference voltage generation module is used to obtain a reference voltage and send the reference voltage to a comparison
  • the reference voltage is obtained by the reference voltage generating module according to temperature data
  • the comparator includes a first voltage receiving end and a second voltage receiving end, and the comparator communicates with the first voltage receiving end through the first voltage receiving end.
  • the reference voltage generation module is connected, the comparator receives the voltage to be calibrated through the second voltage receiving terminal, and the comparator is used to compare the reference voltage with the voltage to be calibrated to obtain a voltage comparison result, the
  • the calibration controller is connected to the result output end of the comparator, and the calibration controller is used for calibrating the voltage to be calibrated according to the comparison result transmitted by the comparator to obtain a target voltage.
  • the voltage self-calibration can be realized more simply and effectively by combining the reference voltage generating module, the comparator and the calibration controller.
  • the calibration controller in the embodiment of the present application can receive multiple signals, which can not only facilitate the background calibration of the LDO system to a certain extent, but also perform foreground calibration through different control commands (signals), which can be more simple and effective
  • the calibration control of the logic clock resources through the FPGA can receive multiple signals, which can not only facilitate the background calibration of the LDO system to a certain extent, but also perform foreground calibration through different control commands (signals), which can be more simple and effective.
  • the voltage calibration circuit 200 may include a reference voltage generation module 210 , a main circuit 220 , a comparator 230 and a calibration controller 240 .
  • the main body circuit 220 may be connected to the comparator 230, and the main body circuit 220 is configured to acquire the voltage to be calibrated and send the reference voltage to be calibrated to the comparator 230.
  • the main body circuit 220 may be called an LDO main body circuit, and the main body circuit 220 is mainly used to complete some basic work of the voltage calibration circuit, such as voltage regulation and driving operations.
  • the main circuit 220 may include a calibration judgment module 221, an error amplifier 222 and a driving module 223, and the relationship among the calibration judgment module 221, the error amplifier 222 and the driving module 223 may be as shown in FIG. 4 .
  • the calibration judging module 221 is connected with the counter 250, and the calibration judging module 221 is used to receive the count value sent by the counter 250, and determine whether to end the calibration operation according to the count value .
  • the error amplifier 222 is connected to the calibration judgment module 221, and the error amplifier 222 is used for stabilizing the target voltage within a fixed voltage range when the calibration judgment module 221 determines that the calibration operation ends.
  • the driving module 223 is connected to the error amplifier 222 , and the driving module 223 is used to generate the current required for the main circuit 220 to operate.
  • the reference voltage generating module 210 may be provided outside the main circuit 220 or directly in the main circuit, or the voltage calibration circuit 200 may not be provided with the reference voltage generating module 210.
  • the calibration The controller 340 can reuse the reference voltage generation module 310. If the reference voltage code value needs to be injected externally, a test vector is usually written externally, the code value is traversed, and an appropriate reference voltage code value is selected for storage.
  • the calibration controller 340 may be used to directly receive the reference voltage, that is, the reference voltage may be directly injected by the user through the interface, and then the calibration controller 340 may receive the to-be-calibrated voltage and the reference voltage. Perform operations such as comparison and calibration, which simplifies the design of test vectors and reduces test costs to a certain extent.
  • the reference voltage generation module 210 is mainly used to generate a reference voltage, which is the LDO reference voltage value required under the current environment.
  • the reference value needs to be injected externally and stored in the circuit, even if the chip The reference voltage is still stored in the circuit when the power is turned off.
  • the sensor monitoring module inside the voltage calibration circuit can monitor the current environment, and feed back the monitored information to the reference voltage generation module 210, and then sample and adjust the corresponding LDO reference voltage value as the LDO in the current environment.
  • a reference quantity for calibration, the current environment may include the physical environment and the specific application of the chip.
  • the reference voltage generating module may be provided in the main body circuit 220, or may be provided independently from the main body circuit.
  • the main circuit 220 may also be separately provided with a voltage trimming unit, and the voltage trimming unit is implemented by the tester through the voltage trimming unit before the product corresponding to the voltage calibration circuit 200 is completed. Voltage adjustment. That is, the voltage trimming unit is mainly a circuit for calibrating the voltage to be calibrated in the testing stage, and the calibration controller is a circuit for calibrating the voltage to be calibrated after the product corresponding to the voltage calibration circuit 200 is completed.
  • the voltage calibration circuit 200 may further include a counter 250, the first connection end 251 of the counter 250 is connected to the calibration controller 240, and the second connection end 252 of the counter 250 is connected to the main body
  • the circuit 220 is connected, and the counter 250 is configured to receive a lift control signal sent by the calibration controller 240, and obtain a count value according to the lift control signal.
  • the counter 250 can be connected to the calibration judging module 221 of the main circuit 220. After the counter 250 obtains the count value, it can send the count value to the calibration judging module 221 and indicate the The calibration determination module 221 determines whether to stop the voltage calibration operation according to the count value.
  • the embodiment of the present invention provides a structural block diagram as shown in FIG. 5 .
  • the voltage calibration circuit 200 may not include the reference voltage generating module 210.
  • the embodiment of the present invention may directly use the first voltage receiving end of the comparator 230 to receive the injection from the outside
  • the calibration controller 240 can calibrate the reference voltage, and when the selection switch 260 is connected to the second voltage receiving end, the calibration controller 240 can realize the Calibration of the calibration voltage.
  • the embodiment of the present invention can realize not only the calibration of the reference voltage to be calibrated, but also the calibration of the reference voltage.
  • the calibration controller 240 may receive a clock signal and an external control signal, the clock signal may be clock 1, and the external control signal may be the first signal, the second signal and the at least one of the third signals.
  • the calibration controller 240 can obtain the up-down control signal when calibrating the voltage according to the voltage comparison result output by the comparator 230 , and then it can send the up-down control signal to the counter 250 . At the same time, it can also transmit a pause/start count signal, a reset signal, and an injection signal to the counter 250, and the relationship of these signals can be shown in FIG. 6 .
  • the counter when the voltage to be calibrated is higher than the reference voltage, the output of the comparator 230 is 1, and the up-down control signal is 1, at this time, the counter can be controlled to count down in order to reduce the reference voltage to be referenced; When the voltage to be calibrated is lower than the reference voltage, the output of the comparator 230 is 0, and the rise and fall control signal is 0. At this time, the counter can be controlled to count up in an ascending sequence, thereby increasing the voltage to be referenced. For example, when the voltage to be calibrated V out is 3V, the reference voltage V ref is 4V, and the preset voltage value O is 0.2, the voltage to be calibrated needs to be calibrated five times, and the values of the counters are 1, 2, and 3 during the calibration process.
  • the counter is incremented.
  • the counter may receive an initial count value when counting, and the initial count value may be preset or input by the user according to actual conditions. For example, if the initial count value input by the user is 7, the count values obtained at this time are 7, 8, 9, 10, 11 and 12 respectively.
  • the output of the comparator 230 is almost a square wave of 01 with the same frequency as the clock 1. At this time, the comparator 230 appears at least N or N+1 consecutively.
  • the second 01 changes, such a change triggers the calibration completion signal, and after the calibration is completed, the embodiment of the present invention can make the voltage to be calibrated slightly higher than the reference voltage.
  • the counter 250 stops counting and retains the current count value, and then calibrates the voltage to be calibrated according to the count value.
  • the reset signal 1 can be released, and the reset signal 2 can perform a reset operation.
  • the calibration controller 240 can automatically pull down the calibration signal. , does not interfere with the calibration process.
  • the reset signal 1 performs the reset operation
  • the automatic calibration operation ends, the reset signal 2 is released, and the circuit begins to prepare M+1 clock cycles to generate the automatic calibration command, so that the automatic calibration cycle can be realized.
  • a voltage calibration circuit provided by an embodiment of the present application includes a reference voltage generation module, a comparator, and a calibration controller, wherein the reference voltage generation module is used to obtain a reference voltage and send the reference voltage to a comparison
  • the reference voltage is obtained by the reference voltage generating module according to temperature data
  • the comparator includes a first voltage receiving end and a second voltage receiving end, and the comparator communicates with the first voltage receiving end through the first voltage receiving end.
  • the reference voltage generation module is connected, the comparator receives the voltage to be calibrated through the second voltage receiving terminal, and the comparator is used to compare the reference voltage with the voltage to be calibrated to obtain a voltage comparison result, the
  • the calibration controller is connected to the result output end of the comparator, and the calibration controller is used for calibrating the voltage to be calibrated according to the comparison result transmitted by the comparator to obtain a target voltage.
  • the voltage self-calibration can be realized more simply and effectively by combining the reference voltage generating module, the comparator and the calibration controller.
  • the embodiment of the present application can provide a voltage to be calibrated for the voltage calibration circuit by introducing a main circuit, and introduce a counter, which not only simplifies the voltage calibration circuit, but also avoids timing confusion and relaxes the clock frequency limit.
  • a voltage calibration circuit 300 may include a reference voltage generation module 310 , a main circuit 320 , a comparator 330 , a calibration controller 340 and a counter 350 .
  • the reference voltage generating module 310 includes a temperature sensor 311 , an analog-to-digital converter 312 and a reference voltage obtaining unit 313 .
  • the temperature sensor 311 is connected to the analog-to-digital converter 312 , and the temperature sensor 311 is used to collect temperature data and transmit the temperature data to the analog-to-digital converter 312 .
  • the first connection terminal 3121 of the analog-to-digital converter 312 can be connected to the temperature sensor 311
  • the second connection terminal 3122 of the analog-to-digital converter 312 can be connected to the reference voltage obtaining unit 313, and the The analog-to-digital converter 312 is used to convert the temperature data into a temperature digital signal, and transmit the temperature digital signal to the reference voltage obtaining unit 313 .
  • a temperature sensor 311 and an analog-to-digital converter 312 (Analog-to-digital converter, ADC) inside the FPGA can be used to obtain a digital code value representing the current chip temperature, and the code value can be used as a pointer to a non-volatile memory , according to the storage location pointed to by the pointer, write in the control code value corresponding to the required LDO voltage at the temperature.
  • ADC Analog-to-digital converter
  • the reference voltage generating module 310 can use the temperature sensor 311 and the analog-to-digital converter 312 to generate a digital code representing the current temperature, and then the reference voltage obtaining unit 313 can use the obtained temperature digital code for addressing, and obtain the corresponding reference voltage The digital code value of , and the voltage corresponding to the digital code value is used as the reference voltage.
  • the first connection terminal 3131 of the reference voltage acquisition unit 313 is connected to the analog-to-digital converter
  • the second connection terminal 3132 of the reference voltage acquisition unit 313 is connected to the comparator 330
  • the The reference voltage obtaining unit 313 is configured to obtain a voltage corresponding to the temperature digital signal, and transmit the voltage to the comparator 330 as a reference voltage.
  • the comparator 350 can compare the voltage to be calibrated and the reference voltage, and when the voltage to be calibrated is greater than the reference voltage, the calibration controller 340 can follow the steps The voltage to be calibrated is further lowered, and then it is compared again whether the lowered voltage to be calibrated is greater than the calibration reference voltage, and if it is greater than the voltage to be calibrated continues to be lowered step by step. In addition, when the voltage to be calibrated is lower than the reference voltage, the calibration controller 340 may increase the voltage to be calibrated.
  • the voltage to be calibrated when the voltage to be calibrated is calibrated, once the voltage to be calibrated increases and decreases simultaneously in successive adjustment steps, it means that the current calibration has reached the situation closest to the reference voltage, and at this time, the current cycle can be determined. The voltage calibration operation is completed. In this way, the background calibration of the LDO system can be realized, and the foreground calibration can also be performed through control commands. The foreground calibration can be easily controlled by the abundant logic clock resources of the FPGA.
  • a voltage calibration circuit provided by an embodiment of the present application includes a reference voltage generation module, a comparator, and a calibration controller, wherein the reference voltage generation module is used to obtain a reference voltage and send the reference voltage to a comparison
  • the reference voltage is obtained by the reference voltage generating module according to temperature data
  • the comparator includes a first voltage receiving end and a second voltage receiving end, and the comparator communicates with the first voltage receiving end through the first voltage receiving end.
  • the reference voltage generation module is connected, the comparator receives the voltage to be calibrated through the second voltage receiving terminal, and the comparator is used to compare the reference voltage with the voltage to be calibrated to obtain a voltage comparison result, the
  • the calibration controller is connected to the result output end of the comparator, and the calibration controller is used for calibrating the voltage to be calibrated according to the comparison result transmitted by the comparator to obtain a target voltage.
  • the voltage self-calibration can be realized more simply and effectively by combining the reference voltage generating module, the comparator and the calibration controller.
  • the voltage to be calibrated can be flexibly calibrated through the abundant logic clock resources of the FPGA, and the hardware cost can be reduced to a certain extent.
  • FIG. 8 is a method flowchart of a voltage calibration method provided by an embodiment of the present application.
  • the flowchart is applied to the above-mentioned voltage calibration circuit. It can be seen from FIG. 8 that the method may include steps S410 to S430 .
  • Step S410 Obtain a voltage to be calibrated and a reference voltage, where the reference voltage is obtained by the reference voltage generating module according to temperature data.
  • Step S420 Compare the voltage to be calibrated with the reference voltage to obtain a voltage comparison result.
  • Step S430 calibrating the voltage to be calibrated according to the voltage comparison result.
  • the embodiments of the present invention do not need to rely too much on the temperature characteristic curve of the reference voltage itself when performing voltage calibration, which liberates the design margin to a certain extent.
  • this solution can be used in various applications that need to change the LDO voltage according to the environmental settings, and can achieve relatively accurate control of the LDO voltage during the background and foreground voltage calibration, which can not only reduce the LDO voltage overshoot, but also improve the voltage recovery speed and optimize Load Regulation.
  • the voltage calibration circuit does not require excessive hardware design costs, and provides feasibility for the built-in self-testing (BIST) of the chip.
  • a voltage calibration circuit and method are provided in the embodiments of the present application.
  • the method can realize voltage calibration more simply and efficiently by using the voltage calibration circuit, wherein the voltage calibration circuit includes a reference voltage generation module and a comparator. and a calibration controller, wherein the reference voltage generation module is used to obtain a reference voltage and send the reference voltage to a comparator, where the reference voltage is obtained by the reference voltage generation module according to temperature data, and the comparator includes a first voltage receiving end and a second voltage receiving end, the comparator is connected to the reference voltage generating module through the first voltage receiving end, the comparator receives the voltage to be calibrated through the second voltage receiving end, The comparator is used for comparing the reference voltage and the voltage to be calibrated to obtain a voltage comparison result, the calibration controller is connected to the result output end of the comparator, and the calibration controller is used for according to the comparison The voltage to be calibrated is calibrated according to the comparison result transmitted by the controller to obtain a target voltage.
  • the self-calibration of the voltage can be realized more simply and effectively by combining the reference voltage generating module, the comparator and the calibration controller.
  • the reference voltage generating module can be multiplexed, and only the reference voltage needs to be externally connected, so that the flexibility of voltage calibration can be improved.
  • communication media typically embodies computer readable instructions, data structures, computer program modules, or other data injected into a modulated data signal such as a carrier wave or other transport mechanism, and can include any information delivery, as is well known to those of ordinary skill in the art medium. Therefore, the present invention is not limited to any particular combination of hardware and software.

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Abstract

本申请实施例提供的一种电压校准电路和方法，该电压校准电路包括参考电压产生模块、比较器和校准控制器，参考电压产生模块用于获取参考电压，并将参考电压发送至比较器，参考电压是参考电压产生模块根据温度数据获取的，比较器包括第一电压接收端和第二电压接收端，比较器与参考电压产生模块连接，比较器通过第二电压接收端接收待校准电压，比较器用于将参考电压和待校准电压进行比较，得到电压比较结果，校准控制器与比较器的结果输出端连接，校准控制器用于根据比较器传输的比较结果对待校准电压进行校准，得到目标电压。本申请通过结合参考电压产生模块、比较器和校准控制器在尽可能减少额外硬件功耗的同时可以实现电压的自校准。

Description

电压校准电路和方法
交叉引用
本申请要求2020年12月31日递交的发明名称为“电压校准电路和方法”的申请号2020116275438的在先申请优先权，上述在先申请的内容以引入的方式并入本文本中。
技术领域
本申请实施例涉及集成电路设计领域，具体而言，涉及但不限于一种电压校准电路和方法。
背景技术
LDO(Low Dropout Regulator，低压差线性稳压器)是线性DC(Direct Current)电压调节器，即LDO是一种线性的降压型的电源管理芯片，LDO具有成本低、噪音低以及静态电流小等优点。因此，如何简单有效的对LDO电路系统的电压进行校准是亟待解决的问题。
发明内容
本申请实施例提供的一种电压校准电路和方法，主要解决的技术问题如何简化电压自校准的过程。
第一方面，本申请实施例提供一种电压校准电路，该电压校准电路包括：参考电压产生模块，所述参考电压产生模块用于获取参考电压，并将所述参考电压发送至比较器，所述参考电压是所述参考电压产生模块根据温度数据获取的；比较器，所述比较器包括第一电压接收端和第二电压接收端，所述比较器通过所述第一电压接收端与所述参考电压产生模块连接，所述比较器通过所述第二电压接收端接收待校准电压，所述比较器用于将所述参考电压和所述待校准电压进行比较，得到电压比较结果；校准控制器，所述校准控制器与所述比较器的结果输出端连接，所述校准控制器用于根据所述比较器传输的所述比较结果对所述待校准电压进行校准，得到目标电压。
可选的，所述电压校准电路包括主体电路，所述主体电路与所述比较器连接，所述主体电路用于获取待校准电压，并将所述待校准参考电压发送给所述比较器。
可选的，所述电压校准电路还包括计数器；所述计数器的第一连接端与所述校准控制器连接，所述计数器的第二连接端与所述主体电路连接，所述计数器用于接收所述校准控制器发送的升降控制信号，并根据所述升降控制信号得到计数值。
可选的，所述主体电路包括校准判断模块、误差放大器和驱动模块；所述校准判断模块与所述计数器连接，所述校准判断模块用于接收所述计数器发送的所述计数值，并根据所述计数值确定是否结束校准操作；所述误差放大器与所述校准判断模块连接，所述误差放大器用于在所述校准判断模块确定所述校准操作结束时，将所述目标电压稳定在固定电压范围；所述驱动模块与所述误差放大器连接，所述驱动模块用于产生所述主体电路工作所需的电流。
可选的，所述参考电压产生模块包括温度传感器、模数转换器和参考电压获取单元；所述温度传感器与所述模数转换器连接，所述温度传感器用于采集温度数据，并将所述温度数据传输给所述模数转换器；所述模数转换器的第一连接端与所述温度传感器连接，所述模数转换器的第二连接端与所述参考电压获取单元连接，所述模数转换器用于将所述温度数据转换为温度数字信号，并将所述温度数字信号传输给所述参考电压获取单元；所述参考电压获取单元的第一连接端与所述模数转换器连接，所述参考电压获取单元的第二连接端与所述比较器连接，所述参考电压获取单元用于获取与所述温度数字信号对应的电压，并将该电压作为参考电压传输给所述比较器。
可选的，所述电压校准电路包括校准信号产生模块，所述校准信号产生模块与所述校准控制器连接，所述校准信号产生模块用于产生校准信号，所述校准信号用于触发所述校准控制器执行电压校准操作。
可选的，所述校准信号产生模块包括第一信号产生模块，所述校准控制器通过第一信号接收端与所述第一信号产生模块连接，所述第一信号接收端用于接收所述第一信号产生模块发送的第一信号，所述第一信号是用户输入的校准信号。
可选的，所述校准信号产生模块包括第二信号产生模块，所述校准控制器通过第二信号接收端与所述第二信号产生模块连接，所述第二信号接收端用于在所述参考电压发生变化时接收所述第二信号产生模块发送的第二信号。
可选的，所述校准信号产生模块包括第三信号产生模块，所述校准控制器通过第三 信号接收端与所述第三信号产生模块连接，所述第三信号接收端用于接收所述第三信号产生模块发送的第三信号，所述第三信号是时钟信号。
第二方面，本申请实施例还提供一种电压校准方法，该方法应用于第一方面的电压校准电路，所述方法包括：获取待校准电压和参考电压，所述参考电压是所述参考电压产生模块根据温度数据获取的；将所述待校准电压和所述参考电压进行比较，得到电压比较结果；根据所述电压比较结果对所述待校准电压进行校准。
本申请实施例提供的一种电压校准电路和方法，该电压校准电路包括参考电压产生模块、比较器以及校准控制器，其中，参考电压产生模块用于获取参考电压，并将所述参考电压发送至比较器，所述参考电压是所述参考电压产生模块根据温度数据获取的，所述比较器包括第一电压接收端和第二电压接收端，所述比较器通过所述第一电压接收端与所述参考电压产生模块连接，所述比较器通过所述第二电压接收端接收待校准电压，所述比较器用于将所述参考电压和所述待校准电压进行比较，得到电压比较结果，所述校准控制器与所述比较器的结果输出端连接，所述校准控制器用于根据所述比较器传输的所述比较结果对所述待校准电压进行校准，得到目标电压。本申请通过结合参考电压产生模块、比较器以及校准控制器可以更加简单有效的实现对电压的自校准。
本发明其他特征和相应的有益效果在说明书的后面部分进行阐述说明，且应当理解，至少部分有益效果从本发明说明书中的记载变的显而易见。
附图说明
图1为本申请一实施例提供的一种电压校准电路的结构示意图；
图2为本申请一实施例提供的一种电压校准电路中校准控制器的结构示意图；
图3为本申请另一实施例提供的一种电压校准电路的结构示意图；
图4本申请另一实施例提供的一种电压校准电路中主体电路的结构示意图；
图5为本申请另一实施例提供的一种具体电压校准电路结构示意图；
图6为本申请另一实施例提供的一种具体电压校准电路中不同信号获取示意图；
图7为本申请又一实施例提供的一种具体电压校准电路结构示意图；
图8为本申请一实施例提供的一种电压校准方法的方法流程图。
具体实施方式
为了更清楚地说明本申请实施例中的技术方案，下面将对实施例描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
目前FPGA(Field Programmable Gate Array，现场可编程逻辑门阵列)中，对电压的调整方案比较多，现有的电压修调方式在进行校准时通常需要根据测试结果输入固定的修调信息，然后根据可修调的位数来实现对电压的修调。然而，这些修调方式通常会使测试向量变得很复杂，在一定程度上增加了测试所需的成本。换句话说，现有的电压修调方式需要根据温度等环境因素对应进行不同的修调，当需要更为精准的调控时，通常会受到电路工艺的影响，即现有的电压修调方式在设计上存在局限性，无法更好的实现自校准。
针对上述问题，发明人提出了本申请实施例提供的电压校准电路和方法，本申请实施例通过参考电压产生模块、比较器以及校准控制器可简化电压自校准的实现条件，在一定程度上可以降低电压自校准的要求。
请参阅图1，为本申请一实施例提供的一种电压校准电路，该电压校准电路100可以包括参考电压产生模块110、比较器120以及校准控制器130。
在一些实施方式中，参考电压产生模块110的用于获取参考电压，并将所述参考电压发送至比较器120，所述参考电压是所述参考电压产生模块110根据温度数据获取的，本发明实施例中电压校准电路100可以是线性低压差稳压器(LDO)。
作为一种方式，比较器120可以包括第一电压接收端121和第二电压接收端122，所述比较器120可以通过所述第一电压接收端121与所述参考电压产生模块110连接，同时所述比较器120可以通过所述第二电压接收端122接收待校准电压，所述比较器120用于将所述参考电压和所述待校准电压进行比较，得到电压比较结果，所述待校准电压也可以称为LDO实际电压。
在一些实施方式中，比较器120在接收到第一电压接收端121和第二电压接收端122发送的参考电压和待校准电压时，其可以对参考电压和待校准电压进行比较，以获得电 压比较结果。具体的，比较器120可以判断待校准电压是否大于所述参考电压，当确定所述待校准电压大于所述参考电压时，所述比较器120输出的电压比较结果是1，本发明实施例可以将所述电压比较结果1作为升降控制信号发送给校准控制器130，以指示校准控制器130降低所述待校准电压。
作为另一种方式，当确定待校准电压小于参考电压时，所述比较器120输出的电压比较结果是0，本发明实施例可以将所述电压比较结果0作为升降控制信号发送给校准控制器130，以指示校准控制器130升高所述待校准电压。校准控制器130在对待校准电压进行校准时可以按照预设电压进行校准。例如，在确定待校准电压V out小于参考电压V ref时，校准控制器130在进行校准时可以对待校准电压V out每次增大预设电压值O，校准一次则待校准电压V out的值变大一次，每校准一次，校准后的电压＝待校准电压V out+O。另外，当确定待校准电压等于参考电压时，所述电压校准电路则可以停止执行对电压的校准操作。
在进行校准时，预设电压值可以保持不变，即每次校准时，增大或者减小的电压值是相同的。例如，待校准电压V out为3V，而参考电压V ref为4V时，预设电压值O可以为0.2，即在对待校准电压进行校准时每次为待校准电压V out增加0.2V，在校准过程中该预设电压值O是保持不变的，此时获取的校准电压V out有3.2V、3.4V、3.6V、3.8V以及4.0V。
在另一些实施方式中，预设电压值也可以是变化的，即在进行电压校准时，所述预设电压值可以是递减的。例如，在第一次校准时，预设电压值O可以是0.5V，在第二次校准时所述预设电压值O可以变成0.4V，在第三次校准时所述预设电压值O可以变成0.3V等。
另外，本发明实施例在对待校准电压进行校准时，也可以在校准开始时用最大预设电压值O对待校准电压进行校准，当待校准电压和参考电压之间的关系不符合预设关系时，则可以减小预设电压值。例如，待校准电压V out为3V，而参考电压V ref则为4V，最大预设电压值O可以为0.4V，因为待校准电压V out小于参考电压V ref，此时则可以增大待校准电压V out，此时获取的待校准电压V out分别是3.4V和3.8V，在第三次校准时3.8V+0.4＝4.2，明显大于4V，此时则可以不利用最大预设电压值进行校准，即减小最大预设电压值。例如，可以将最大预设电压值O减小一半，得到0.2V，此时再利用最新的待校准电压加上预设电压值，得到的值刚好是4V。通过该方法校准控制器130可以加快 电压校准速度。
作为另一种方式，所述校准控制器130与所述比较器120的结果输出端123连接，所述校准控制器130用于根据所述比较器120传输的所述比较结果对所述待校准电压进行校准，得到目标电压。
在另一些实施方式中，为了更清楚的理解校准控制器130的结构，本发明实施例给出了如图2所示的结构示意图，通过图2可以看出电压校准电路100除了可以包括参考电压产生模块110、比较器120以及校准控制器130以外，其还可以包括校准信号产生模块140，所述校准信号产生模块与所述校准控制器130连接，所述校准信号产生模块140用于产生校准信号，所述校准信号用于触发所述校准控制器130执行电压校准操作。
在一些实施方式中，校准信号产生模块140可以包括第一信号产生模块141，所述校准控制器130通过第一信号接收端与所述第一信号产生模块141连接，所述第一信号接收端用于接收所述第一信号产生模块141发送的第一信号，所述第一信号是用户输入的校准信号，所述第一信号也可以称为强制校准信号。另外，第一信号可以是芯片发送的强制校准命令，所述第一信号不受电压校准电路的约束，即第一信号产生模块141可以属于所述电压校准电路100，也可以是独立于所述电压校准电路100之外芯片。
作为另一种方式，所述校准信号产生模块140还可以包括第二信号产生模块142，所述校准控制器130通过第二信号接收端与所述第二信号产生模块142连接，所述第二信号接收端用于在所述参考电压发生变化时接收所述第二信号产生模块142发送的第二信号，所述第二信号也可以称为状态变化信号，所述状态变换信号主指的是参考电压变化信号。换句话说，当参考电压信号发生改变时，所述第二信号被置为1并传输给校准控制器130，以指示所述校准控制器130执行电压校准操作。
另外，所述参考电压通常会因为温度的变化而发生改变，即当温度发生改变时所述第二信号产生模块142便会产生第二信号，并将所述第二信号传输给校准控制器130，以指示校准控制器130根据最新的参考电压对输出电压校准电路100的输出电压进行校准。换句话说，第二信号可以是根据校准控制器130对参考电压变化的监控，当参考电压变化时，将使第二信号有效，令所述校准控制器130执行校准操作。
在另一些实施方式中，所述校准信号产生模块140还可以包括第三信号产生模块143，所述校准控制器130通过第三信号接收端与所述第三信号产生模块143连接，所述第三信号接收端用于接收所述第三信号产生模块143发送的第三信号，所述第三信号 是时钟信号。本发明实施例在所述电压校准电路校准完成后，间隔M+1个时钟周期后，自动发送重新校准命令，即第三信号产生模块143可以每隔M+1个时钟周期发送一个第三信号，以通过所述第三信号指示校准控制器执行电压校准操作。
在一些实施方式中，校准控制器130只要接收到第一信号、第二信号以及第三信号中的任一信号均会执行电压校准操作，即经过一定的时钟周期，或者是外部强行注入校准命令，或者是校准参考条件发生改变，校准控制器130就会执行电压校准操作，所述校准参考条件可以是参考电压是否改变，或者是比较条件是否改变，或者是当前环境是否改变等。通过图2可以清楚的知道第一信号、第二信号以及第三信号之间满足的“或”的逻辑关系。
需要说明的是，本发明实施例中的参考电压可以是固定不变的也可以是不断发生变化的，即当电压校准电路所处的环境温度发生改变时，所述参考电压也会对应发生改变。另外，所述参考电压可以是根据实际输出参考电压和实际输出参考电压不断校准获取的，即参考电压也可以是通过不断校准获取的，参考电压的校准过程与待校准电压的校准过程类似这里不进行一一赘述了。
本申请实施例提供的一种电压校准电路，该电压校准电路包括参考电压产生模块、比较器以及校准控制器，其中，参考电压产生模块用于获取参考电压，并将所述参考电压发送至比较器，所述参考电压是所述参考电压产生模块根据温度数据获取的，所述比较器包括第一电压接收端和第二电压接收端，所述比较器通过所述第一电压接收端与所述参考电压产生模块连接，所述比较器通过所述第二电压接收端接收待校准电压，所述比较器用于将所述参考电压和所述待校准电压进行比较，得到电压比较结果，所述校准控制器与所述比较器的结果输出端连接，所述校准控制器用于根据所述比较器传输的所述比较结果对所述待校准电压进行校准，得到目标电压。本申请通过结合参考电压产生模块、比较器以及校准控制器可以更加简单有效的实现对电压的自校准。另外，本申请实施例中的校准控制器可以接收多个信号，其在一定程度上不仅可以方便LDO系统的后台校准，而且可以通过不同的控制命令(信号)进行前台校准，如此可以更加简单有效的通过FPGA对逻辑时钟资源进行校准控制。
请参阅图3，为本申请另一实施例提供的一种电压校准电路，该电压校准电路200可以包括参考电压产生模块210、主体电路220、比较器230以及校准控制器240。
在一些实施方式中，主体电路220可以与比较器230连接，所述主体电路220用于 获取待校准电压，并将所述待校准参考电压发送给所述比较器230。本发明实施例中主体电路220可以称为LDO主体电路，所述主体度220主要用于完成所述电压校准电路的一些基础工作，如稳压以及驱动等操作。
在另一些实施方式中，所述主体电路220可以包括校准判断模块221、误差放大器222和驱动模块223，校准判断模块221、误差放大器222和驱动模块223这三者的关系可以如图4所示，从图4看出所述校准判断模块221与所述计数器250连接，所述校准判断模块221用于接收所述计数器250发送的所述计数值，并根据所述计数值确定是否结束校准操作。
可选地，所述误差放大器222与所述校准判断模块221连接，所述误差放大器222用于在所述校准判断模块221确定所述校准操作结束时，将所述目标电压稳定在固定电压范围。另外，所述驱动模块223与所述误差放大器222连接，所述驱动模块223用于产生所述主体电路220工作所需的电流。
需要说明的是，参考电压产生模块210可以设置在主体电路220之外，也可以直接设置在主体电路内，或者所述电压校准电路200可以不设置有参考电压产生模块210，此时所述校准控制器340可以复用所述参考电压产生模块310，如果单纯需要外部注入参考电压码值，通常是在外部写好测试向量，将码值进行遍历，挑选出合适的参考电压码值进行存储。换句话说，本发明实施例可以直接利用校准控制器340接收参考电压，即所述参考电压可以是用户直接通过接口注入的，而后校准控制器340便可以对其接收的待校准电压和参考电压执行比较以及校准等操作，如此可以简化测试向量的设计，并且在一定程度上可以降低测试成本。
通过上述介绍可以知道，参考电压产生模块210主要用于产生参考电压，所述参考电压是在当前环境下，所要求的LDO参考电压值，该参考值需要外部注入并存储于电路中，即使芯片掉电该参考电压依然被保存在电路中。在不同环境下，电压校准电路内部的传感监测模块能够监控当前环境，并将其监测的信息反馈给参考电压产生模块210，然后将对应的LDO参考电压值进行采样抽调，作为当前环境下LDO校准的一个参考量，所述当前环境可以包括物理环境以及芯片的具体应用等。
另外，本发明实施例中参考电压产生模块可以设置与所述主体电路220中，也可以与所主体电路独立设置。可选地，所述主体电路220也可以单独设置有电压修调单元，所述电压修调单元是在所述电压校准电路200对应的产品完成之前，测试人员通过所述 电压修调单元实现的电压的修调。即电压修调单元的主要是在测试阶段对待校准电压进行校准的电路，而校准控制器则可是电压校准电路200对应的产品在完成之后对待校准电压进行校准的到电路。
在另一些实施方式中，电压校准电路200还可以包括计数器250，所述计数器250的第一连接端251与所述校准控制器240连接，所述计数器250的第二连接端252与所述主体电路220连接，所述计数器250用于接收所述校准控制器240发送的升降控制信号，并根据所述升降控制信号得到计数值。另外，所述计数器250可以与所述主体电路220的校准判断模块221连接，当所述计数器250获取到计数值之后其可以将所述计数值发送给所述校准判断模块221，并指示所述校准判断模块221根据所述计数值确定是否停止电压的校准操作。
为了更清楚的理解参考电压产生模块210、主体电路220、比较器230、校准控制器240以及计数器250之间的关系，本发明实施例给出了如图5所示的结构框图，从图5可以看出电压校准电路200可以不包括所述参考电压产生模块210，当不包括所述参考电压产生模块210时，本发明实施例可以直接利用比较器230的第一电压接收端接收从外部注入的参考电压，当选择开关260与第一电压接收端连接时，校准控制器240可以对参考电压进行校准，而当选择开关260与第二电压接收端连接时，校准控制器240则可以实现对待校准电压的校准。
可选地，选择开关260接收到的阶段控制信号为1时，则可以对待校准电压进行校准，而当阶段控制信号为0时则可以对参考电压进行校准，所述阶段控制信号可以是用户输入的，也可以是所述电压校准电路根据实际情况输出的，具体如何触发所述阶段控制信号这里不进行明确限制，可以根据实际情况进行选择。因此，本发明实施例既可以实现对待校准参考电压的校准，也可以实现对参考电压的校准。
在另一些实施方式中，校准控制器240可以接收时钟信号以及外部控制信号，所述时钟信号可以为时钟1，所述外部控制信号可以是上述实施例提到的第一信号、第二信号以及第三信号中的至少一个信号。校准控制器240在根据比较器230输出的电压比较结果对电压进行校准时可以得到升降控制信号，而后其可以发送所述升降控制信号至计数器250。同时，其也可以传输暂停/开始计数信号、复位信号以及注入信号等至计数器250，这些信号的关系可以如图6所示。
在一个具体的实施方式中，当待校准电压高于参考电压时，所述比较器230的输出 为1，升降控制信号则为1，此时可以控制计数器降序计数，以此降低待参考电压；当待校准电压低于参考电压时，所述比较器230的输出为0，升降控制信号则为0，此时可以控制计数器升序计数，以此提高待参考电压。例如，待校准电压V out为3V，参考电压V ref则为4V，预设电压值O为0.2时，需要对待校准电压进行五次校准，在校准过程中计数器的值分别是1，2，3，4，5和6，可以看出计数器是递增的。需要说明的是所述计数器在计数时其可以接收一个初始计数值，该初始计数值可以是预设的也可以是用户根据实际情况输入的。例如，用户输入的初始计数值为7，此时获取的计数值则分别为7，8，9，10，11和12。
在一些实施方式中，当待校准电压被调整至参考电压附近时，比较器230的输出几乎是与时钟1同频的01变化方波，此时比较器230至少连续出现N个或者N+1次01变化，如此变化触发校准完成信号，且在校准完成之后，本发明实施例可以使待校准电压略高于参考电压。
在另一些实施方式中，校准操作结束之后，计数器250终止计数并保留当前计数值，然后根据该计数值实现对待校准电压的校准。另外，如图2所示，校准控制器240在进行校准时，复位信号1可以被释放，复位信号2则可以执行复位操作，在执行校准操作时，校准控制器240可以自动将校准信号拉低，不干扰校准过程。校准完成后，复位信号1执行复位操作，自动校准操作结束，复位信号2被释放，电路开始准备M+1个时钟周期，产生自动校准命令，如此便可以实现自动校准的循环。
本申请实施例提供的一种电压校准电路，该电压校准电路包括参考电压产生模块、比较器以及校准控制器，其中，参考电压产生模块用于获取参考电压，并将所述参考电压发送至比较器，所述参考电压是所述参考电压产生模块根据温度数据获取的，所述比较器包括第一电压接收端和第二电压接收端，所述比较器通过所述第一电压接收端与所述参考电压产生模块连接，所述比较器通过所述第二电压接收端接收待校准电压，所述比较器用于将所述参考电压和所述待校准电压进行比较，得到电压比较结果，所述校准控制器与所述比较器的结果输出端连接，所述校准控制器用于根据所述比较器传输的所述比较结果对所述待校准电压进行校准，得到目标电压。本申请通过结合参考电压产生模块、比较器以及校准控制器可以更加简单有效的实现对电压的自校准。另外，本申请实施例通过引入主体电路可以为电压校准电路提供待校准电压，以及引入计数器其不仅可以简化电压校准电路，同时可以避免时序上的混乱，放宽时钟频率的限制。
请参阅图7，为本申请又一实施例提供的一种电压校准电路，该电压校准电路300可以包括参考电压产生模块310、主体电路320、比较器330、校准控制器340以及计数器350。其中，参考电压产生模块310包括温度传感器311、模数转换器312和参考电压获取单元313。
在一些实施方式中，所述温度传感器311与所述模数转换器312连接，所述温度传感器311用于采集温度数据，并将所述温度数据传输给所述模数转换器312。另外，所述模数转换器312的第一连接端3121可以与所述温度传感器311连接，所述模数转换器312的第二连接端3122可以与所述参考电压获取单元313连接，所述模数转换器312用于将所述温度数据转换为温度数字信号，并将所述温度数字信号传输给所述参考电压获取单元313。
本发明实施例可以利用FPGA内部的温度传感器311以及模数转换器312(Analog-to-digital converter，ADC)获取代表当前芯片温度的数字码值，该码值可以作为非易失性存储器的指针，依据指针指向的存储位置，经该温度下要求的LDO电压对应的控制码值写入。在对待校准电压进行校准时可以调出不同温度下的LDO标准参考电压，并将当前温度对应的LDO标准参考电压作为参考电压。换句话说，参考电压产生模块310可以利用温度传感器311以及模数转换器312产生代表当前温度的数字码，而后参考电压获取单元313可以利用获取的温度数字码进行寻址，获取到参考电压对应的数字码值，并将该数字码值对应的电压作为参考电压。
作为一种方式，所述参考电压获取单元313的第一连接端3131与所述模数转换器连接，所述参考电压获取单元313的第二连接端3132与所述比较器330连接，所述参考电压获取单元313用于获取与所述温度数字信号对应的电压，并将该电压作为参考电压传输给所述比较器330。
通过上述介绍可以知道，比较器350在获取到待校准电压和参考电压后，其可以对所述待校准电压和参考电压进行比较，当待校准电压大于参考电压时，校准控制器340可以按照步进下调所述待校准电压，而后再次比较下调后的待校准电压是否大于校准参考电压，如果大于则继续按照步进对待校准电压进行下调。另外，当待校准电压低于参考电压时，校准控制器340则可以上调所述待校准电压。
需要说明的是，在对待校准电压进行校准时一旦在连续的调整步进中同时出现待校准电压的上调和下调，则表示当前校准已经达到最接近参考电压的情况，此时则可以确 定当前轮的电压校准操作完成。如此便可以实现LDO系统的后台校准，同时也可以通过控制命令进行前台校准，前台校准可以轻易的通过FPGA丰富的逻辑时钟资源进行控制。
本申请实施例提供的一种电压校准电路，该电压校准电路包括参考电压产生模块、比较器以及校准控制器，其中，参考电压产生模块用于获取参考电压，并将所述参考电压发送至比较器，所述参考电压是所述参考电压产生模块根据温度数据获取的，所述比较器包括第一电压接收端和第二电压接收端，所述比较器通过所述第一电压接收端与所述参考电压产生模块连接，所述比较器通过所述第二电压接收端接收待校准电压，所述比较器用于将所述参考电压和所述待校准电压进行比较，得到电压比较结果，所述校准控制器与所述比较器的结果输出端连接，所述校准控制器用于根据所述比较器传输的所述比较结果对所述待校准电压进行校准，得到目标电压。本申请通过结合参考电压产生模块、比较器以及校准控制器可以更加简单有效的实现对电压的自校准。另外，本发明实施可以通过FPGA丰富的逻辑时钟资源对待校准电压进行灵活的校准，且其在一定程度上可以降低硬件成本。
请参阅图8，为本申请实施例提供的一种电压校准方法的方法流程图，该流程图应用于上述电压校准电路，通过图8可知该方法可以包括步骤S410至步骤S430。
步骤S410：获取待校准电压和参考电压，所述参考电压是所述参考电压产生模块根据温度数据获取的。
步骤S420：将所述待校准电压和所述参考电压进行比较，得到电压比较结果。
步骤S430：根据所述电压比较结果对所述待校准电压进行校准。
本发明实施例在进行电压校准时不需要过分依赖基准电压自身的温度特性曲线，在一定程度上解放了设计裕度。并且，本方案可用于各类需要根据环境设置改变LDO电压的运用，在进行后台前台电压校准时可实现LDO电压相对精确的控制，不仅可以削弱LDO电压过冲，而且可以改善电压恢复速度，优化负载调整率。基于FPGA的应用，电压校准电路不需要过多的硬件设计代价，同时为芯片内建自测试(Built in Self Testing，BIST)提供了可行性。
综上所述，本申请实施例提供的一种电压校准电路和方法，该方法通过利用电压校准电路可以更加简单高效的实现对电压的校准，其中，电压校准电路包括参考电压产生模块、比较器以及校准控制器，其中，参考电压产生模块用于获取参考电压，并将所述参考电压发送至比较器，所述参考电压是所述参考电压产生模块根据温度数据获取的， 所述比较器包括第一电压接收端和第二电压接收端，所述比较器通过所述第一电压接收端与所述参考电压产生模块连接，所述比较器通过所述第二电压接收端接收待校准电压，所述比较器用于将所述参考电压和所述待校准电压进行比较，得到电压比较结果，所述校准控制器与所述比较器的结果输出端连接，所述校准控制器用于根据所述比较器传输的所述比较结果对所述待校准电压进行校准，得到目标电压。本申请通过结合参考电压产生模块、比较器以及校准控制器可以更加简单有效的实现对电压的自校准。另外，本申请实施例可以复用参考电压产生模块，只需要外部接入参考电压即可，如此可以提高电压校准的灵活性。
可见，本领域的技术人员应该明白，上文中所公开方法中的全部或某些步骤、系统、系统中的功能模块/单元可以被实施为软件(可以用计算系统可执行的计算机程序代码来实现)、固件、硬件及其适当的组合。在硬件实施方式中，在以上描述中提及的功能模块/单元之间的划分不一定对应于物理组件的划分；例如，一个物理组件可以具有多个功能，或者一个功能或步骤可以由若干物理组件合作执行。某些物理组件或所有物理组件可以被实施为由处理器，如中央处理器、数字信号处理器或微处理器执行的软件，或者被实施为硬件，或者被实施为集成电路，如专用集成电路。
此外，本领域普通技术人员公知的是，通信介质通常包含计算机可读指令、数据结构、计算机程序模块或者注入载波或其他传输机制之类的调制数据信号中的其他数据，并且可包括任何信息递送介质。所以，本发明不限制于任何特定的硬件和软件结合。
以上内容是结合具体的实施方式对本发明实施例所作的进一步详细说明，不能认定本发明的具体实施只局限于这些说明。对于本发明所属技术领域的普通技术人员来说，在不脱离本发明构思的前提下，还可以做出若干简单推演或替换，都应当视为属于本发明的保护范围。

Claims (10)

  1. 一种电压校准电路，其特征在于，所述电压校准电路包括：
    参考电压产生模块，所述参考电压产生模块用于获取参考电压，并将所述参考电压发送至比较器，所述参考电压是所述参考电压产生模块根据温度数据获取的；
    比较器，所述比较器包括第一电压接收端和第二电压接收端，所述比较器通过所述第一电压接收端与所述参考电压产生模块连接，所述比较器通过所述第二电压接收端接收待校准电压，所述比较器用于将所述参考电压和所述待校准电压进行比较，得到电压比较结果；
    校准控制器，所述校准控制器与所述比较器的结果输出端连接，所述校准控制器用于根据所述比较器传输的所述比较结果对所述待校准电压进行校准，得到目标电压。
  2. 根据权利要求1所述的电压校准电路，其特征在于，所述电压校准电路包括主体电路，所述主体电路与所述比较器连接，所述主体电路用于获取待校准电压，并将所述待校准参考电压发送给所述比较器。
  3. 根据权利要求2所述的电压校准电路，其特征在于，所述电压校准电路还包括计数器；
    所述计数器的第一连接端与所述校准控制器连接，所述计数器的第二连接端与所述主体电路连接，所述计数器用于接收所述校准控制器发送的升降控制信号，并根据所述升降控制信号得到计数值。
  4. 根据权利要求3所述的电压校准电路，其特征在于，所述主体电路包括校准判断模块、误差放大器和驱动模块；
    所述校准判断模块与所述计数器连接，所述校准判断模块用于接收所述计数器发送的所述计数值，并根据所述计数值确定是否结束校准操作；
    所述误差放大器与所述校准判断模块连接，所述误差放大器用于在所述校准判断模块确定所述校准操作结束时，将所述目标电压稳定在固定电压范围；
    所述驱动模块与所述误差放大器连接，所述驱动模块用于产生所述主体电路工作所需的电流。
  5. 根据权利要求1所述的电压校准电路，其特征在于，所述参考电压产生模块包括温度传感器、模数转换器和参考电压获取单元；
    所述温度传感器与所述模数转换器连接，所述温度传感器用于采集温度数据，并将 所述温度数据传输给所述模数转换器；
    所述模数转换器的第一连接端与所述温度传感器连接，所述模数转换器的第二连接端与所述参考电压获取单元连接，所述模数转换器用于将所述温度数据转换为温度数字信号，并将所述温度数字信号传输给所述参考电压获取单元；
    所述参考电压获取单元的第一连接端与所述模数转换器连接，所述参考电压获取单元的第二连接端与所述比较器连接，所述参考电压获取单元用于获取与所述温度数字信号对应的电压，并将该电压作为参考电压传输给所述比较器。
  6. 根据权利要求1所述的电压校准电路，其特征在于，所述电压校准电路包括校准信号产生模块，所述校准信号产生模块与所述校准控制器连接，所述校准信号产生模块用于产生校准信号，所述校准信号用于触发所述校准控制器执行电压校准操作。
  7. 根据权利要求6所述的电压校准电路，其特征在于，所述校准信号产生模块包括第一信号产生模块，所述校准控制器通过第一信号接收端与所述第一信号产生模块连接，所述第一信号接收端用于接收所述第一信号产生模块发送的第一信号，所述第一信号是用户输入的校准信号。
  8. 根据权利要求6所述的电压校准电路，其特征在于，所述校准信号产生模块包括第二信号产生模块，所述校准控制器通过第二信号接收端与所述第二信号产生模块连接，所述第二信号接收端用于在所述参考电压发生变化时接收所述第二信号产生模块发送的第二信号。
  9. 根据权利要求6所述电压校准电路，其特征在于，所述校准信号产生模块包括第三信号产生模块，所述校准控制器通过第三信号接收端与所述第三信号产生模块连接，所述第三信号接收端用于接收所述第三信号产生模块发送的第三信号，所述第三信号是时钟信号。
  10. 一种电压校准方法，其特征在于，应用于权利要求1至9任一所述的电压校准电路，所述方法包括：
    获取待校准电压和参考电压，所述参考电压是所述参考电压产生模块根据温度数据获取的；
    将所述待校准电压和所述参考电压进行比较，得到电压比较结果；
    根据所述电压比较结果对所述待校准电压进行校准。
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