WO2022111157A1 - 绝缘材料电老化测试系统 - Google Patents

绝缘材料电老化测试系统 Download PDF

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Publication number
WO2022111157A1
WO2022111157A1 PCT/CN2021/125340 CN2021125340W WO2022111157A1 WO 2022111157 A1 WO2022111157 A1 WO 2022111157A1 CN 2021125340 W CN2021125340 W CN 2021125340W WO 2022111157 A1 WO2022111157 A1 WO 2022111157A1
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Prior art keywords
temperature
aging
sample
voltage
insulating material
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PCT/CN2021/125340
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English (en)
French (fr)
Inventor
伍国兴
谢宏
陈潇
徐曙
黎小林
傅明利
侯帅
朱闻博
惠宝军
冯宾
张逸凡
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深圳供电局有限公司
南方电网科学研究院有限责任公司
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Publication of WO2022111157A1 publication Critical patent/WO2022111157A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1218—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing using optical methods; using charged particle, e.g. electron, beams or X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/32—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres
    • G01K11/3206—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres at discrete locations in the fibre, e.g. using Bragg scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation

Definitions

  • the invention relates to the technical field of high voltage, in particular to an electrical aging test system for insulating materials.
  • Power cables can provide stable and reliable power transmission and are the key channel for power supply.
  • the most widely used polymer materials for power cables are the insulating layers. Under the action of a long-term electric field, the polymer insulating materials are prone to electrical aging, which leads to the gradual degradation of the polymer materials and eventually causes the breakdown of the insulating layer. Therefore, the polymer electrical aging Behavior has an important impact on the long-term working stability of power cables, and the research and development of polymer insulating materials should also pay full attention to their electrical aging properties.
  • the evaluation of the electrical aging properties of polymer insulating materials and the prediction of the electrical aging life of insulating materials have long been the research difficulties in this field.
  • the main method of the most commonly used test technology is to first apply a fixed electric field to a certain number of insulating material samples, so that the material starts to electrically age under the electric field. There is a certain degree of decline. After different electrical aging times, turn off the high-voltage power supply, take out the samples to test the residual breakdown field strength or other electrical properties of each sample, and you can pass the residual breakdown field strength between different materials or The electrical performance comparison test is used to know the difference in the ability of materials to withstand electrical aging.
  • the key to the evaluation is to obtain the electrical aging life index of the material, which is an important basis for the estimation of the cable insulation life and the design of the thickness of the cable insulation layer.
  • the above test methods can only qualitatively compare the electrical aging performance of the material, and cannot be accurately tested through experiments.
  • the electrical aging life index of the material is estimated, so this test method is obviously imperfect.
  • the complete electrical aging behavior test of insulating materials should be the goal of obtaining the aging life index of the material.
  • the more accepted n-index test method is: under different aging field strengths, apply a constant electrical aging field strength to a large number of samples respectively, keep the field strength unchanged, obtain and record the The time required for the breakdown under the field strength, make Weibull distribution statistics for the breakdown time of multiple samples, and record the characteristic breakdown time as the working life of the material under the field strength.
  • the working life test of the material under the electric field strength can be obtained by fitting the data according to the inverse power law, and the aging life index n of the material can be obtained.
  • the above method is relatively simple in principle, but it faces many technical difficulties in the test method: if a single high-voltage power supply is used to apply an aging field strength to a single sample, although the breakdown life of the sample can be accurately measured, but The complete electrical aging life statistics requires at least testing the breakdown life of dozens of samples under a single aging field strength to ensure the reliability of the data. Under the lower aging field strength, the breakdown life of the sample is as short as a few days. As long as several months, the test cycle will be extremely prolonged, and the experimental efficiency is extremely low.
  • the purpose of the embodiments of the present invention is to provide an electrical aging test system for insulating materials, which solves the problems in the prior art that the electrical aging breakdown time of insulating materials cannot be automatically recorded, and the technical problems that the electrical aging life of insulating materials cannot be accurately tested.
  • an embodiment of the present invention provides an electrical aging test system for insulating materials, including a control device, a temperature acquisition device, and a plurality of aging sample measurement devices;
  • the aging sample measuring device is used to connect a high-voltage power supply to measure the resistance temperature corresponding to the insulating material sample in real time and send it to the temperature collecting device;
  • the temperature collection device is used to collect the temperature fed back by each of the aging sample measurement devices in real time;
  • the control device is configured to control the aging sample measurement when the temperature change value between the temperature at the current moment and the temperature at the previous moment is greater than or equal to a preset temperature change threshold of any of the aging sample measuring devices
  • the unit is disconnected from the high voltage power supply.
  • the control device includes a computer, a PLC module, an I/O module array and a high-voltage relay array, wherein the I/O module array includes a plurality of I/O modules, and the high-voltage relay array includes a plurality of high-voltage relays , the computer is connected to the temperature acquisition device, the computer is also connected to the PLC module, the PLC module is connected to the I/O module array, and the I/O module array is connected to the high-voltage relay array , the high-voltage relay array is respectively connected with a plurality of the aging sample measuring devices, and each of the I/O modules, each of the high-voltage relays, and each of the aging sample measuring devices is in one-to-one correspondence.
  • the temperature acquisition device includes a fiber grating temperature measurement and demodulator, and the fiber grating temperature measurement and demodulator is respectively connected to a plurality of the aging sample measurement devices, and the fiber grating temperature measurement and demodulator is further connected to the control device.
  • the aging sample measuring device includes a high-voltage electrode, a low-voltage electrode, and a test unit for a sudden change in the breakdown temperature of the sample.
  • the high-voltage electrode and the low-voltage electrode are used to clamp an insulating material test piece, and the sample breaks
  • the temperature abrupt change point test unit is connected to the insulating material test piece through a lead wire, and the sample breakdown temperature sudden change point test unit is respectively connected to the fiber grating temperature measurement and demodulator and is tested with the sample breakdown temperature sudden change point.
  • the high-voltage relay corresponding to the unit.
  • the sample breakdown temperature abrupt change point testing unit includes a resistor and a fiber grating installed on the resistor, the resistor is connected to the insulating material test piece through a lead wire, and the fiber grating and the fiber grating test Temperature demodulator connection.
  • the fiber grating is pasted on the resistor.
  • the fiber grating is installed at the end of the resistor.
  • the outer side of the resistor is covered with an epoxy sleeve, and the epoxy sleeve is made by pouring epoxy resin.
  • the high-voltage power sources are respectively connected to a plurality of the high-voltage relays, and the low-voltage electrodes are grounded.
  • the electrical aging test system for insulating materials provided by the embodiment of the present invention has the following effects:
  • the electrical aging test system for insulating materials includes a control device, a temperature acquisition device, and a plurality of aging sample measuring devices, and the aging sample measuring devices are used to connect a high-voltage power supply to test insulating materials in real time
  • the temperature of the corresponding resistance is sent to the temperature acquisition device;
  • the temperature acquisition device is used to collect the temperature fed back by each of the aging sample measurement devices in real time;
  • the control device is used when any one of the When the temperature change value between the temperature at the current moment and the temperature at the previous moment is greater than or equal to a preset temperature change threshold, the aging sample measuring device controls the aging sample measuring device to disconnect from the high-voltage power supply, thereby forming
  • the control device controls the aging sample measuring device to disconnect from the high-voltage power supply, thereby forming
  • the aging life test of insulating materials is more accurate and reliable; on the other hand, the insulating material aging test system provided by the embodiment of the present invention collects the temperature of the resistance corresponding to all insulating material samples through a temperature acquisition device, and automatically records each insulating material test. If the temperature change value between the temperature at the current moment and the temperature at the previous moment is greater than or equal to the time corresponding to the preset temperature change threshold, it saves the experimental space and experimental time required for high-voltage long-term testing. It reduces the difficulty of the aging test experiment of insulating materials and effectively improves the aging life test efficiency of insulating materials.
  • the insulating material electrical aging test system provided by the embodiment of the present invention adopts the principle of optical fiber temperature measurement, collects non-electrical signals through the fiber grating temperature measurement demodulator, and controls the test system through the control device, Avoid partial discharge signal interference during high voltage testing.
  • the insulating material electrical aging test system provided by the embodiment of the present invention can ensure that the breakdown current causes the temperature of the resistance to rise rapidly by covering the outer side of the resistance with an epoxy sleeve, and when a sample breaks down, the resistance is increased.
  • the response time of the fiber grating temperature measurement demodulator is shortened, and the response speed of the control loop based on temperature test is guaranteed.
  • the electrical aging test system for insulating materials provided by the embodiment of the present invention can realize the electrical aging test of a constant field intensity on batches of insulating material samples by setting a plurality of the aging sample measuring devices to be connected to the high-voltage power supply respectively. Complete the breakdown time test of each insulating material sample, realize the evaluation of the electrical aging qualitative performance of the insulating material, and also realize the test of the electrical aging life index value of the insulating material. Controllability and consistency of the cumulative electrical aging degree of insulating material samples.
  • the cut-off of the breakdown circuit is realized by the high-voltage relay.
  • the high-voltage relay does not work and is in a normally open state. After the test is started, the high-voltage relay does not work. Accept the continuous weak current control signal and switch to the closed state. If the control system is damaged due to force majeure, the high-voltage relay loses the control signal and returns to the normally open state, and the high voltage is immediately cut off. If the high-voltage relay itself fails due to long-term work, the high-voltage relay will If it automatically returns to the non-working state, the high voltage will also be cut off.
  • This test system can effectively prevent the potential safety hazards caused by the continuous conduction of the high voltage in the event of a fault.
  • FIG. 1 is a structural diagram of an embodiment of an electrical aging test system for insulating materials provided by the present invention
  • Fig. 2 is the schematic diagram of the test piece liner of insulating material aging test
  • FIG. 3 is an enlarged view of the test unit 13 of the sample breakdown temperature sudden change point in FIG. 1;
  • Fig. 4 is the heat transfer theory heat circuit model of the resistance cladding structure in an embodiment of the insulating material electrical aging test system provided by the embodiment of the present invention
  • FIG. 5 is a graph of temperature change data recorded when one of the insulation samples of the insulation material aging test system according to the embodiment of the present invention is broken down.
  • FIG. 1 is a structural diagram of an embodiment of an electrical aging test system for insulating materials provided by the present invention.
  • the electrical aging test system for insulating materials includes a control device 3, a temperature acquisition device 2, and a plurality of aging sample measurement devices 1, wherein:
  • the aging sample measuring device 1 is used to connect a high-voltage power supply to measure the temperature of the resistance corresponding to the insulating material sample in real time and send it to the temperature collecting device 2 .
  • the temperature collecting device 2 is used to collect the temperature fed back by each aging sample measuring device 1 in real time.
  • the control device 3 is configured to, when the temperature change value of the insulating material sample of any of the aging sample measurement devices 1 between the temperature at the current moment and the temperature at the previous moment is greater than or equal to a preset temperature variation threshold, The aging sample measuring device 1 is controlled to disconnect from the high-voltage power supply.
  • FIG. 2 is a schematic diagram of the test piece liner for the aging test of the insulating material.
  • control a plurality of the aging sample measuring devices 1 not to connect to the high-voltage power supply, and before starting the test, set up a plurality of sample mounting points corresponding to the samples of insulating materials on the test piece liner to form the test.
  • the array can be adjusted according to the number of samples, and the maximum number of samples that can be supported is 128.
  • a plurality of the aging sample measuring devices 1 are controlled to be connected to a voltage power supply to support the test of the breakdown life and electrical aging life index value of the insulating material under high voltage.
  • the temperature collection device 1 collects the temperature fed back by each aging sample measuring device 1 in real time.
  • the control device 3 is activated, and the connection between the aging sample measuring device 1 where the insulating material sample is located and the high-voltage power supply can be cut off, so that other insulating material samples can be tested without cutting off.
  • the automatic recording of the breakdown life of each insulating material sample is recorded, and the aging sample measuring device 1 corresponding to the insulating material sample that has broken down is controlled to cut off the voltage individually, avoiding frequent cutting off.
  • the influence of the electrical aging field strength on the electrical aging life index test results improves the reliability of the test results, enhances the convenience of operation, and improves the test efficiency.
  • the control device 3 includes a computer 33, a PLC module 34, an I/O module array 31 and a high-voltage relay array 32, wherein the I/O module array 31 includes a plurality of I/O modules, and the high-voltage relay
  • the array 32 includes a plurality of high-voltage relays 320
  • the computer 33 is connected to the temperature acquisition device 2
  • the computer 33 is also connected to the PLC module 34
  • the PLC module 34 is connected to the I/O module array 31
  • the I/O module array 31 is connected to the high-voltage relay 320 array 32
  • the high-voltage relay array 32 is respectively connected to a plurality of the aging sample measuring devices 1, and each of the I/O modules, each The high-voltage relays 320 correspond to each of the aging sample measuring devices 1 one-to-one.
  • each of the The on-off of the insulating material sample is controlled.
  • the on-off control of each high-voltage line is realized by the high-voltage relay 320, which is a low-voltage control high-voltage working mode, and the PLC module 34 is used to realize the test loop of each insulating material sample.
  • the overload is automatically cut off, and the PLC module 34 adopts the Delta ES standard host, which can support up to 256 digital ports.
  • the PLC module 34 communicates with the computer 33 through TCP/IP to obtain the position or number of the insulating material sample at the high temperature point. According to the position or number, the PLC module 34 outputs a signal to the I/O The I/O module corresponding to the position (number) of the insulating material sample in the module array 31 drives the high-voltage relay 320 corresponding to the insulating material sample to turn off.
  • the temperature acquisition device 2 includes a fiber grating temperature measurement and demodulator, and the fiber grating temperature measurement and demodulator is respectively connected to a plurality of the aging sample measurement devices 1, and the fiber grating temperature measurement demodulator The instrument is also connected to the control device 3 .
  • the fiber grating temperature measurement and demodulator is provided with a plurality of test points, thereby realizing the detection of the insulation material samples tested by the aging sample measurement device 1. temperature collection.
  • the aging sample measuring device 1 includes a high-voltage electrode 11, a low-voltage electrode 12, and a test unit 13 for a sudden change in the breakdown temperature of the sample.
  • the high-voltage electrode 11 and the low-voltage electrode 12 are used for
  • the sample breakdown temperature mutation point test unit 13 is connected to the insulating material test piece through the lead wire, and the sample breakdown temperature mutation point test unit 13 is respectively connected to the fiber grating temperature measurement A demodulator and the high-voltage relay 320 corresponding to the test unit 13 of the sample breakdown temperature abrupt change point.
  • FIG. 3 is an enlarged view of the test unit 13 of the sample breakdown temperature abrupt change point in FIG. 1 .
  • the sample breakdown temperature abrupt change point testing unit 13 includes a resistor 131 and a fiber grating 132 installed on the resistor by sticking, the resistor 131 is connected to the insulating material test piece by a lead wire, and the fiber grating 132 is connected to the fiber grating temperature measurement and demodulator.
  • the resistor 131 is used not only as a collection unit for the breakdown current of the test system, but also as a protection resistor for the high-voltage power supply and the high-voltage relay 320 to reduce the generation of excessive breakdown current to the high-voltage power supply. At the same time, the high-voltage relay 320 is protected to avoid the failure of the high-voltage relay 320 due to excessive load current.
  • the fiber grating 132 is pasted on the resistor 131 .
  • the fiber grating 132 is installed at the end of the resistor 131 .
  • the fiber grating 132 is attached to the position near the end of the resistor 131 , the heat of the resistor is preferentially transferred to the outside through the end, and the temperature of the end of the resistor rises relatively faster, compared with the installation in the middle of the resistor 131 .
  • the position of the fiber grating 132 can make the heating of the fiber grating 132 faster.
  • the outer side of the resistor 131 is covered with an epoxy sleeve 133, and the epoxy sleeve 133 is made by pouring epoxy resin.
  • the surface of the resistor 131 is pasted with the fiber grating 132. If it is exposed to the air for natural convection heat dissipation, the surface temperature measured by the fiber grating 132 will change slightly.
  • the outer side of the resistor 131 with the fiber grating 132 is encapsulated with epoxy resin to form an epoxy sleeve 133. Since the epoxy sleeve 133 has both good insulation performance and low thermal conductivity, it will not affect the normal operation of the resistor 131, and will also make the epoxy sleeve 133.
  • the enhanced thermal insulation performance of the surface of the resistor 131 can play the role of a heat collecting sleeve, and the temperature measurement sensitivity can be further improved by designing the structure of the epoxy resin wrapped heat collecting sleeve.
  • the adopted heat collecting sleeve structure design can be based on the heat transfer theory heat circuit model of the resistance cladding structure as shown in FIG.
  • FIG. 4 is an equivalent thermal circuit model of heat transfer theory in the design of the resistance wrapping structure in an embodiment of the insulation material electrical aging test system provided by the embodiment of the present invention
  • T1 in the figure is the insulation material of the resistance itself
  • Effective thermal resistance T2 is the equivalent thermal resistance of the surrounding epoxy sleeve
  • ⁇ is the external ambient temperature
  • U is the effective value of the voltage applied by the high-voltage power supply
  • the temperature measured by the fiber grating after the breakdown of the sample will rise faster, that is, the temperature test response speed will be faster. It can be seen that under the condition of constant ambient temperature, test voltage and test aging electric field, the smaller R is. The faster the temperature rises, the larger the T2, the faster the temperature rises.
  • the coating thickness of the epoxy resin can be appropriately increased to increase the thermal resistance value of T2, or the current carrying capacity of the high-voltage power supply and the high-voltage relay Appropriate reduction of the resistance value of the resistor R can improve the response speed of the temperature test.
  • a temperature rise of 20% can be set as the temperature threshold point of the breakdown pulse current.
  • the high-voltage power sources are respectively connected to a plurality of the high-voltage relays 320, and the low-voltage electrodes 12 are grounded.
  • the electrical aging test system for insulating materials controls the on-off of high-voltage lines based on temperature testing, and there is no limit to the types of test voltages.
  • the electrical aging test under high voltage is also suitable for the electrical aging test under AC high voltage, and has good aging test flexibility.
  • this embodiment adopts weak current to control the on-off of the high-voltage line, which effectively guarantees the safety of the testers.
  • FIG. 5 is a graph of temperature change data recorded when one of the insulating material samples of the insulating material aging test system according to the embodiment of the present invention breaks down. It can be seen that the insulation material sample broke down after 15 hours of the experiment, and the temperature of the breakdown point changed abruptly, and then the temperature returned to the original temperature value.
  • the PLC module applies a control signal to the high-voltage relay 320 of the test loop of the sample, switches the high-voltage relay 320 from normally closed to normally open, and records the accumulated time at this time, realizing the functions required by the system.

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  • Testing Relating To Insulation (AREA)

Abstract

一种绝缘材料电老化测试系统，包括控制装置（3）、温度采集装置（2）以及多个老化试样测量装置（1），老化试样测量装置（1），用于连接高压电源以实时测试绝缘材料试样所对应电阻的温度并发送给温度采集装置（2）；温度采集装置（2），用于实时采集每一老化试样测量装置（1）反馈的温度；控制装置（3），用于当任一老化试样测量装置（1）在当前时刻的温度与上一时刻的温度之间的温度变化值大于等于预设温度变化阈值时，控制老化试样测量装置（1）断开与高压电源的连接，由此形成多个绝缘材料试样的电老化测试回路，绝缘材料电老化测试系统能够避免电老化场强被频繁切断，使得每个绝缘材料试样的电老化性能测试结果更加精准。

Description

绝缘材料电老化测试系统 技术领域
本发明涉及高电压技术领域，尤其涉及一种绝缘材料电老化测试系统。
背景技术
电力电缆能提供稳定可靠的电能传输,是电能供应的关键渠道。电力电缆最广泛采用聚合物材料作为绝缘层,在长期电场作用下,聚合物绝缘材料中容易产生电老化,导致聚合物材料的逐步降解,并最终引发绝缘层击穿,因此,聚合物电老化行为对于电力电缆的长期工作稳定性具有重要影响,聚合物绝缘材料的研发也应该充分关注其电老化性能。然而聚合物绝缘材料电老化性能的评价以及绝缘材料电老化寿命的预测长期以来一直是该领域的研究难点。如何在实验室条件下通过对聚合物绝缘材料试样的测试,较为准确地预估绝缘材料高电场下的工作寿命,不仅对于评价聚合物材料耐电老化性能至关重要,对于电缆实际工作稳定性的预估也起到关键作用,尤其对于提高超高压电力电缆绝缘材料的研发效率有重要意义。
目前聚合物绝缘材料电老化行为测试鲜有报道出现,其原因是电老化行为测试实验周期长,实验难度大,具有较多的技术难点。现有最为常用的测试技术主要方法是先对一定数量的绝缘材料试样施加一个固定的电场,使材料在电场下开始电老化,材料发生电老化后,其击穿强度相比未老化时会有一定程度下降,在不同电老化时间后,关闭高压电源,取出试样分别测试每个试样的残余击穿场强或其它电学性能,即可通过不同材料之间的残余击穿场强或者电性能对比测试获知材料耐受电老化能力的差异。这种方法实验过程简单,但缺点十分明显：首先在经历 不同老化时间取出试样时,必须对高压电源断电,这样电老化场强会被迫中断；其次,该方法通常采用多个试样并联方式施加电压,一旦某个试样因内部存有缺陷等原因提前发生击穿,会导致高压电源启动保护并自动断电,电老化场强的频繁切断对材料的电老化行为会不可避免产生影响,若采用直流场强进行电老化测试时,电老化场强的切断甚至会导致部分试样的内部损伤甚至直接击穿；最重要的是,电老化行为测试不应仅通过性能的对比而评估,关键是获取材料的电老化寿命指数,该指数是电缆绝缘寿命预估和电缆绝缘层厚度设计的重要依据,而上述测试方法仅能对材料的电老化性能做定性对比,无法通过实验准确预估材料的电老化寿命指数,因此这种测试方法明显是不完善的，完整的绝缘材料电老化行为测试，应以获得该材料的老化寿命指数为目标。
绝缘材料的某一确定电场下的寿命符合电老化的反幂定律E nt＝C,E是电场,t是材料在该电场E下的工作寿命,C是常数,n是电老化寿命指数,n值一旦确定,只要由试验得出一个击穿点就可以确定寿命曲线。根据反幂定律,较受认可的n指数测试方法为:在不同的老化场强下,分别对大量试样施加恒定的电老化场强,维持场强不变,获得并记录每个试样在该场强下击穿所需的时间,对多个试样的击穿时间做威布尔分布统计,将特征击穿时间记为该材料在该场强下的工作寿命,如此步骤,分别完成不同场强下材料工作寿命测试,依据反幂定律进行数据拟合,即可获得材料的老化寿命指数n。以上方法在原理上较为简单,但在试验方法上却面对较多技术难题:若采用单一的高压电源对单一试样施加老化场强,虽然能准确测得该试样的击穿寿命,但完整的电老化寿命统计至少需要单一老化场强下至少测试数十个试样的击穿寿命才能保障数据可靠性,在较低的老化场强下,试样的击穿寿命短则几日,长则数月,这样测试周期将被极度延长,实验效率极其低下。因此,高电压下长期施加电老化场强,为了实现较高的测试效率,并节省实验场地空间,需采用同一个高压电源对多个试样并联施加电老化场强,由于不同试样 的击穿寿命差距较大,不同试样会在不同时间陆续击穿,在此条件下,由于高压电源均设有过流保护系统,一旦一个试样率先击穿,高压电源将立刻断电,这样电老化场强将被频繁切断,这对于测试结果将产生不可预估的严重影响。
综上,如何设计电老化实验的加压装置,实现分别获取并记录每个试样的击穿寿命(击穿时间),同时保障未击穿试样仍施加稳定的电老化场强,直至准确获得所有试样的击穿寿命,目前缺乏高效可靠的测试设备和方法。开发一种可自动且准确记录击穿时间的高压电缆绝缘材料批量电老化测试系统对绝缘材料的研发具有十分重要的意义。
发明内容
本发明实施例的目的是提供一种绝缘材料电老化测试系统，解决现有技术中无法自动记录绝缘材料电老化击穿时间的问题，以及无法准确测试绝缘材料的电老化寿命的技术问题。
为实现上述目的，本发明实施例提供了一种绝缘材料电老化测试系统，包括控制装置、温度采集装置以及多个老化试样测量装置；
所述老化试样测量装置，用于连接高压电源以实时测试绝缘材料试样所对应电阻温度并发送给所述温度采集装置；
所述温度采集装置，用于实时采集每一所述老化试样测量装置反馈的温度；
所述控制装置，用于当任一所述老化试样测量装置在当前时刻的温度与上一时刻的温度之间的温度变化值大于等于预设温度变化阈值时，控制所述老化试样测量装置断开与高压电源的连接。
优选的，所述控制装置包括计算机、PLC模块、I/O模块阵列以及高压继电器阵列，其中，所述I/O模块阵列包括多个I/O模块，所述高压继电器阵列包括多个高压继电器，所述计算机连接所述温度采集装置，所述计算机还与所述PLC 模块连接，所述PLC模块与所述I/O模块阵列连接，所述I/O模块阵列与所述高压继电器阵列连接，所述高压继电器阵列分别与多个所述老化试样测量装置连接，且每一所述I/O模块、每一所述高压继电器以及每一所述老化试样测量装置一一对应。
优选的，所述温度采集装置包括光纤光栅测温解调仪，且所述光纤光栅测温解调仪分别与多个所述老化试样测量装置连接，所述光纤光栅测温解调仪还与所述控制装置连接。
优选的，所述老化试样测量装置包括高压电极、低压电极以及试样击穿温度突变点测试单元，所述高压电极与所述低压电极用于夹持绝缘材料试片，所述试样击穿温度突变点测试单元通过引线连接所述绝缘材料试片，所述试样击穿温度突变点测试单元分别连接所述光纤光栅测温解调仪以及与所述试样击穿温度突变点测试单元对应的所述高压继电器。
优选的，所述试样击穿温度突变点测试单元包括电阻和安装在所述电阻上的光纤光栅，所述电阻通过引线连接所述绝缘材料试片，所述光纤光栅和所述光纤光栅测温解调仪连接。
优选的，所述光纤光栅粘贴在所述电阻上。
优选的，所述光纤光栅安装在所述电阻的端部。
优选的，所述电阻的外侧包覆有环氧套，所述环氧套通过环氧树脂浇筑制成。
优选的，所述高压电源分别与多个所述高压继电器连接，所述低压电极接地。
与现有技术相比，本发明实施例提供的绝缘材料电老化测试系统，具有以下效果：
(1)本发明实施例提供的绝缘材料电老化测试系统，包括控制装置、温度采集装置以及多个老化试样测量装置，所述老化试样测量装置，用于连接高压电源以实时测试绝缘材料所对应的电阻的温度并发送给所述温度采集装置；所述温 度采集装置，用于实时采集每一所述老化试样测量装置反馈的温度；所述控制装置，用于当任一所述老化试样测量装置在当前时刻的温度与上一时刻的温度之间的温度变化值大于等于预设温度变化阈值时，控制所述老化试样测量装置断开与高压电源的连接，由此形成多个绝缘材料试样的电老化测试回路，当有某一绝缘材料试样所对应的电阻的温度在当前时刻的温度与上一时刻的温度之间的温度变化值大于等于预设温度变化阈值时，所述控制装置立即控制该绝缘试样所在的所述老化试样测量装置断开与高压电源的连接，而不切断其他绝缘试样的测试回路，比之现有的通过高压电源控制所有绝缘试样的测试回路的方式，本发明实施例提供的绝缘材料老化测试系统一方面能够避免电老化场强被频繁切断，使得每个绝缘材料试样的电老化性能测试结果更加精准，进而使得绝缘材料的老化寿命测试更加精准可靠；另一方面，本发明实施例提供的绝缘材料老化测试系统通过温度采集装置采集所有绝缘材料试样所对应的电阻的温度，并自动记录每一个绝缘材料试样在当前时刻的温度与上一时刻的温度之间的温度变化值大于等于预设温度变化阈值时对应的时间，节省高电压长期测试所需的实验空间和实验时间,从时间和空间两个维度上减少绝缘材料老化测试实验的难度，有效提高绝缘材料的老化寿命测试效率。
(2)本发明实施例提供的绝缘材料电老化测试系统采用基于光纤测温原理,通过所述光纤光栅测温解调仪采集非电学信号并通过所述控制装置对所述测试系统进行控制,避免高电压测试过程中出现的局部放电信号干扰。
(3)本发明实施例提供的绝缘材料电老化测试系统通过在电阻的外侧包覆环氧套，当有一试样发生击穿时，能够保障击穿电流使电阻的温度迅速升高,提高电阻对于击穿电流的敏感性,缩减光纤光栅测温解调仪的响应时间,保障基于温度测试的控制回路的响应速度。
(4)本发明实施例提供的绝缘材料电老化测试系统通过设置多个所述老化试样测量装置分别与高压电源连接，可以对批量绝缘材料试样实现恒定场强的电 老化测试，既能完成每个绝缘材料试样的击穿时间测试，实现对绝缘材料的电老化定性性能评价，也能实现绝缘材料电老化寿命指数值的测试，测试过程不存在频繁切断的场强,保障每个绝缘材料试样累计的电老化程度的可控性和一致性。
(5)本发明实施例提供的绝缘材料电老化测试系统，击穿线路的切除由高压继电器实现，未开始电老化测试时，高压继电器不工作，并处于常开状态，开始测试后，高压继电器接受持续的弱电控制信号并切换至闭合状态，若因不可抗力导致控制系统损毁，高压继电器失去控制信号并恢复常开状态，高电压立即被切断，若高压继电器本身由于长期工作出现故障，高压继电器将自动恢复不工作状态，则高电压也将被切断，该测试系统可以有效预防出现故障时高电压持续导通所导致的安全隐患。
附图说明
图1是本发明提供的绝缘材料电老化测试系统的一个实施例的结构图；
图2是绝缘材料老化测试的试片衬板的示意图；
图3是图1中试样击穿温度突变点测试单元13的放大图；
图4是本发明实施例提供的绝缘材料电老化测试系统的一个实施例中的电阻包覆结构的热传递理论热路模型；
图5是使用本发明实施例的绝缘材料老化测试系统的其中一路绝缘试样击穿时记录的温度变化数据图。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
参见图1，图1是本发明提供的绝缘材料电老化测试系统的一个实施例的结构图。
本发明实施例提供的绝缘材料电老化测试系统，包括控制装置3、温度采集装置2以及多个老化试样测量装置1，其中：
所述老化试样测量装置1，用于连接高压电源以实时测试绝缘材料试样所对应的电阻的温度并发送给所述温度采集装置2。
所述温度采集装置2，用于实时采集每一所述老化试样测量装置1反馈的温度。
所述控制装置3，用于当任一所述老化试样测量装置1的绝缘材料试样在当前时刻的温度与上一时刻的温度之间的温度变化值大于等于预设温度变化阈值时，控制所述老化试样测量装置1断开与高压电源的连接。
本发明实施例在具体实施时，预先准备绝缘材料的老化检测所需的试片衬板，参见图2，图2是绝缘材料老化测试的试片衬板的示意图。未开始测试前，控制多个所述老化试样测量装置1均不接入高压电源，在开始测试前，在试片衬板上开设多个绝缘材料的试样对应的样片安装点,组成测试阵列,该阵列可根据试样的数量调整,最多可支持的试样片数为128片。开始测试时，控制多个所述老化试样测量装置1接入电压电源，以支持绝缘材料在高压下的击穿寿命和电老化寿命指数值的测试。在测试的过程中，所述温度采集装置1实时采集每一所述老化试样测量装置1反馈的温度，当检测到某一老化试样测量装置1在当前时刻的温度与上一时刻的温度之间的温度变化值大于等于预设温度变化阈值时，启动所述控制装置3，切断该绝缘材料试样所在的老化试样测量装置1与高压电源的连接，能够在不切断其他绝缘材料试样的老化场强的情况下,记录每个绝缘材料试样的击穿寿命的自动记录,并控制发生击穿的绝缘材料试样对应的老化试样测量装置1单独切断电压,避免了频繁切断电老化场强对于电老化寿命指数测试结果的影响,提高测试结果可靠性,增强了操作便利性,提高了测试效率。
优选的，所述控制装置3包括计算机33、PLC模块34、I/O模块阵列31以及高压继电器阵列32，其中，所述I/O模块阵列31包括多个I/O模块，所述高压继电器阵列32包括多个高压继电器320，所述计算机33连接所述温度采集装置2，所述计算机33还与所述PLC模块34连接，所述PLC模块34与所述I/O模块阵列31连接，所述I/O模块阵列31与所述高压继电器320阵列32连接，所述高压继电器阵列32分别与多个所述老化试样测量装置1连接，且每一所述I/O模块、每一所述高压继电器320以及每一所述老化试样测量装置1一一对应。
可以理解的是，在本发明实施例中，通过设置每一所述I/O模块、每一所述高压继电器320以及每一所述老化试样测量装置1一一对应，以分别对每个绝缘材料试样的通断进行控制。具体地，在本实施例中，通过高压继电器320实现对每条高压线路的通断控制,高压继电器320为低压控制高压的工作方式,采用PLC模块34实现对各个绝缘材料试样的测试回路的过载自动切断,PLC模块34采用台达ES标准主机,最多可支持256个数字端口。所述PLC模块34与所述计算机33进行TCP/I P通讯,获得温度过高点的绝缘材料试样的位置或编号,根据位置或编号，所述PLC模块34输出信号到所述I/O模块阵列31中与该绝缘材料试样位置(编号)相对应的I/O模块，并驱动该绝缘材料试样所对应的高压继电器320断开。
优选的，所述温度采集装置2包括光纤光栅测温解调仪，且所述光纤光栅测温解调仪分别与多个所述老化试样测量装置1连接，所述光纤光栅测温解调仪还与所述控制装置3连接。
可以理解的是，在本发明实施例中，所述光纤光栅测温解调仪设置有多个测试点，由此实现对多个所述老化试样测量装置1所测试的绝缘材料试样的温度采集。
作为本发明实施例的一个优选方案，所述老化试样测量装置1包括高压电极11、低压电极12以及试样击穿温度突变点测试单元13，所述高压电极11与所述 低压电极12用于夹持绝缘材料试片，所述试样击穿温度突变点测试单元13通过引线连接所述绝缘材料试片，所述试样击穿温度突变点测试单元13分别连接所述光纤光栅测温解调仪以及与所述试样击穿温度突变点测试单元13对应的所述高压继电器320。
参见图3，图3是图1中试样击穿温度突变点测试单元13的放大图。优选的，所述试样击穿温度突变点测试单元13包括电阻131和通过粘贴安装在所述电阻上的光纤光栅132，所述电阻131通过引线连接所述绝缘材料试片，所述光纤光栅132和所述光纤光栅测温解调仪连接。
可以理解的是，在本发明实施例中，所述电阻131既作为测试系统击穿电流的采集单元,也作为高压电源和高压继电器320的保护电阻,减少过大的击穿电流对高压电源产生的冲击，同时保护高压继电器320，避免高压继电器320承担过大的负载电流而出现故障。
优选的，所述光纤光栅132粘贴在所述电阻131上。
作为本发明实施例的一个具体方案，所述光纤光栅132安装在所述电阻131的端部。
可以理解的是，所述光纤光栅132贴在所述电阻131靠近端部位置，电阻的热量优先通过端部向外传递，电阻端部温度升高相对更快，相比与安装在电阻131中部的位置，能够使所述光纤光栅132升温更快。
较佳地，所述电阻131的外侧包覆有环氧套133，所述环氧套133通过环氧树脂浇筑制成。
可以理解的是，电阻131表面粘贴光纤光栅132,若暴露在空气中自然对流散热,光纤光栅132所测得的表面温度变化幅度较小,为放大光纤光栅132的温感输出幅值,在粘贴有光纤光栅132的电阻131外侧利用环氧树脂进行封装形成环氧套133,由于环氧套133兼具较好的绝缘性能和较低的导热系数,既不影响电阻131正常工作,也会使电阻131表面隔热性能增强,即可起到热量聚集套的作用， 通过设计环氧树脂包绕式热量聚集套的结构可以进一步提升温度测量灵敏度。所采用的热量聚集套结构设计可以依据如图4所示的电阻包覆结构的热传递理论热路模型，当电阻131中有电流经过,温度将会明显升高。通过控制电阻131的外包覆绝缘材料的厚度和电阻131的阻值,可以使电阻131中出现击穿电流时温升加快,提高电阻131的温度敏感性,进一步能缩减所述光纤光栅传感仪测温的响应时间。
参见图4，图4是本发明实施例提供的绝缘材料电老化测试系统的一个实施例中的电阻绕包结构设计的热传递理论等值热路模型；图中T1为电阻本身绝缘材料的等效热阻,T2为环绕的环氧套的等效热阻,θ为外界环境温度，U为高压电源所施加的电压有效值，R为电阻的电阻值，根据式T MAX＝θ+T2·U 2/(R·T1+R·T2)即可计算所述光纤光栅132表面理论上可测得的最大温度T MAX。若T MAX越大，则试样击穿后光纤光栅所测得的温度上升越快，即温度测试响应速度越快，可见在环境温度、测试电压和测试老化电场一定的情况下，R越小温度升高越快，T2越大温度升高越快，在具体实施时，可适当增大环氧树脂的包覆厚度以增大T2热阻值，也可根据高压电源承载电流能力以及高压继电器承受电流能力适当减小电阻R的阻值，即可提高温度测试的响应速度。在本发明的实施例中可设置温升20％作为击穿脉冲电流的温度阈值点,当光纤光栅132的短时温升提高20％时，即认为该绝缘材料试样的测试支路发生击穿，进而断开该绝缘材料试样对应的高压继电器320与高压电源的连接。
优选的，所述高压电源分别与多个所述高压继电器320连接，所述低压电极12接地。
需要说明的是，本发明实施例提供的绝缘材料电老化测试系统是基于温度测试的方式对高压线路通断进行控制,对于测试电压的种类没有限制,因此通过更换高压电源形式,既适用于直流高压下的电老化测试,也适用于交流高压下的电 老化测试,具有较好的老化测试灵活性。同时，本实施例采用弱电控制高压线路的通断,有效保障了测试人员的安全性。
为了更好地说明本发明实施例的作用机理，下面采用本发明实施例提供的缘材料电老化测试系统进行一次测试实验，首先搭建好测试平台，即本发明实施例提供的的缘材料老化测试系统。参见图5，图5是使用本发明实施例的绝缘材料老化测试系统的其中一路绝缘材料试样发生击穿时记录的温度变化数据图。可以看到，在实验进行到15个小时绝缘材料试样发生了击穿,击穿点温度出现突变,随后温度回到原温度值。通过PLC模块对该试样的测试回路的高压继电器320施加控制信号,将高压继电器320由常闭切换至常开,并记录此时的累计时间,实现了系统所需求的功能。
以上所述是本发明的优选实施方式，应当指出，对于本技术领域的普通技术人员来说，在不脱离本发明原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也视为本发明的保护范围。

Claims (9)

  1. 一种绝缘材料电老化测试系统，其特征在于，包括控制装置、温度采集装置以及多个老化试样测量装置；
    所述老化试样测量装置，用于连接高压电源以实时测试绝缘材料试样所对应的电阻的温度并发送给所述温度采集装置；
    所述温度采集装置，用于实时采集每一所述老化试样测量装置反馈的温度；
    所述控制装置，用于当任一所述老化试样测量装置在当前时刻的温度与上一时刻的温度之间的温度变化值大于等于预设温度变化阈值时，控制所述老化试样测量装置断开与高压电源的连接。
  2. 如权利要求1所述的绝缘材料电老化测试系统，其特征在于，所述控制装置包括计算机、PLC模块、I/O模块阵列以及高压继电器阵列，其中，所述I/O模块阵列包括多个I/O模块，所述高压继电器阵列包括多个高压继电器，所述计算机连接所述温度采集装置，所述计算机还与所述PLC模块连接，所述PLC模块与所述I/O模块阵列连接，所述I/O模块阵列与所述高压继电器阵列连接，所述高压继电器阵列分别与多个所述老化试样测量装置连接，且每一所述I/O模块、每一所述高压继电器以及每一所述老化试样测量装置一一对应。
  3. 如权利要求2所述的绝缘材料电老化测试系统，其特征在于，所述温度采集装置包括光纤光栅测温解调仪，且所述光纤光栅测温解调仪分别与多个所述老化试样测量装置连接，所述光纤光栅测温解调仪还与所述控制装置连接。
  4. 如权利要求3所述的绝缘材料电老化测试系统，其特征在于，所述老化试样测量装置包括高压电极、低压电极以及试样击穿温度突变点测试单元，所述高压电极与所述低压电极用于夹持绝缘材料试片，所述试样击穿温度突变点测试 单元通过引线连接所述绝缘材料试片，所述试样击穿温度突变点测试单元分别连接所述光纤光栅测温解调仪以及与所述试样击穿温度突变点测试单元对应的所述高压继电器。
  5. 如权利要求4所述的绝缘材料电老化测试系统，其特征在于，所述试样击穿温度突变点测试单元包括电阻和安装在所述电阻上的光纤光栅，所述电阻通过引线连接所述绝缘材料试片，所述光纤光栅和所述光纤光栅测温解调仪连接。
  6. 如权利要求5所述的绝缘材料电老化测试系统，其特征在于，所述光纤光栅粘贴在所述电阻上。
  7. 如权利要求5所述的绝缘材料电老化测试系统，其特征在于，所述光纤光栅安装在所述电阻的端部。
  8. 如权利要求5所述的绝缘材料电老化测试系统，其特征在于，所述电阻的外侧包覆有环氧套，所述环氧套通过环氧树脂浇筑制成。
  9. 如权利要求4-8任一项所述的绝缘材料电老化测试系统，其特征在于，所述高压电源分别与多个所述高压继电器连接，所述低压电极接地。
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