WO2022088042A1 - 测量非线性器件的非线性相关参数的方法、装置和系统 - Google Patents

测量非线性器件的非线性相关参数的方法、装置和系统 Download PDF

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Publication number
WO2022088042A1
WO2022088042A1 PCT/CN2020/125268 CN2020125268W WO2022088042A1 WO 2022088042 A1 WO2022088042 A1 WO 2022088042A1 CN 2020125268 W CN2020125268 W CN 2020125268W WO 2022088042 A1 WO2022088042 A1 WO 2022088042A1
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Prior art keywords
signal
frequency
notch
nonlinear
frequency interval
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PCT/CN2020/125268
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English (en)
French (fr)
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叶彤
陶振宁
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富士通株式会社
叶彤
陶振宁
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Application filed by 富士通株式会社, 叶彤, 陶振宁 filed Critical 富士通株式会社
Priority to JP2023524786A priority Critical patent/JP2023547409A/ja
Priority to CN202080106607.1A priority patent/CN116458095A/zh
Priority to PCT/CN2020/125268 priority patent/WO2022088042A1/zh
Publication of WO2022088042A1 publication Critical patent/WO2022088042A1/zh
Priority to US18/138,368 priority patent/US20230266370A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/20—Measurement of non-linear distortion
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/101—Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof
    • H04B17/104—Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof of other parameters, e.g. DC offset, delay or propagation times
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/165—Spectrum analysis; Fourier analysis using filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H04B17/309—Measuring or estimating channel quality parameters

Definitions

  • the present application relates to the field of communication technology.
  • TDD total harmonic distortion
  • Another existing method is to filter the signal under test to form a signal with a band trap (ie, a band trap signal), and the band trap signal is passed through a nonlinear device to obtain an output signal, and the band trap in the output signal is measured.
  • the power of the position is regarded as nonlinear noise, and the nonlinear noise reflects the nonlinear degree of the nonlinear device when transmitting the signal to be measured.
  • This method is called the traditional Power Noise Ratio (PNR) test method.
  • PNR Power Noise Ratio
  • THD or PNR can be referred to as a nonlinear related parameter of a nonlinear device.
  • FIG. 1 is a schematic diagram of a traditional PNR test method.
  • a signal to be tested 100 is subjected to band-stop filtering processing 101 to form a band-notch signal 102, and the band-notch signal 102 is input to a nonlinear device 103, and the nonlinear device 103
  • the output signal of 104 is 104 .
  • the PNR of the output signal 104 is calculated as a nonlinear correlation parameter when the nonlinear device 103 transmits the signal under test 100 .
  • the inventors of the present application found that when using the traditional PNR test method, sometimes the measured nonlinear noise is not accurate.
  • the inventor further studied and found that the magnitude of the nonlinear noise is related to the probability distribution function (PDF) of the signal.
  • PDF probability distribution function
  • the signal probability distribution has changed, so the nonlinear noise calculated based on the notch signal will change relative to the nonlinear noise actually generated when the signal under test passes through the nonlinear device.
  • the signal probability distribution of the notch signal changes more than the signal probability distribution of the signal to be tested, so the calculated deviation of nonlinear noise is also bigger.
  • the signal probability distribution refers to the probability distribution of the amplitude of the real signal
  • the rate distribution of the signal refers to the probability distribution of the modulus of the complex signal.
  • the embodiment of the present application proposes a method, device and system for measuring nonlinear related parameters of a nonlinear device, generating a band-notch signal with the same signal probability distribution as the signal to be measured, and calculating the nonlinear device based on the band-notch signal
  • Non-linear correlation parameters eg, non-linear noise power
  • the non-linear correlation parameters can be accurately calculated for the signal under test with any signal probability distribution, and in addition, the use of expensive high-frequency waveform analysis equipment.
  • an apparatus for measuring nonlinear related parameters of a nonlinear device including:
  • a first signal generating unit which generates a first signal according to the signal to be tested, the first signal and the signal to be tested have the same signal probability distribution, and the first signal has at least one band-notch frequency;
  • a processing unit which calculates the nonlinear related parameters of the nonlinear device when transmitting the signal to be measured according to the output signal of the nonlinear device when the first signal is input to the nonlinear device.
  • a method for measuring nonlinear related parameters of a nonlinear device including:
  • the nonlinear related parameters of the nonlinear device when transmitting the signal to be measured are calculated according to the output signal of the nonlinear device when the first signal is input to the nonlinear device.
  • a system for measuring filter characteristics includes a nonlinear device and the apparatus for measuring nonlinear-related parameters of the nonlinear device according to the aforementioned first aspect.
  • the beneficial effects of the embodiments of the present application are: generating a band-notch signal with the same signal probability distribution as the signal to be measured, and calculating the nonlinear related parameters of the nonlinear device when transmitting the signal to be measured based on the band-notch signal, thereby , the nonlinear correlation parameters can be accurately calculated for the signal under test with any signal probability distribution, and the use of expensive high-frequency waveform analysis equipment can be avoided.
  • Fig. 1 is a schematic diagram of traditional PNR test method
  • FIG. 2 is a flowchart of the method for measuring the nonlinear related parameters of the nonlinear device according to Embodiment 1 of the present application;
  • Fig. 3 is the schematic diagram of an example of the method shown in Fig. 2;
  • FIG. 4 is a schematic diagram of a method of generating a first signal
  • 5 is a schematic diagram of operation 401
  • FIG. 6 is a schematic diagram of one embodiment of operation 402
  • Fig. 8 is a schematic diagram of the signal probability distribution of the band-notch signal and the signal to be tested this time;
  • FIG. 9 is another schematic diagram of a method of generating a first signal
  • FIG. 10 is a schematic diagram of the effect of the method for measuring nonlinear related parameters of a nonlinear device according to Embodiment 1 of the present application;
  • FIG. 11 is a schematic diagram of an apparatus for measuring nonlinear related parameters of a nonlinear device in Embodiment 2 of the present application;
  • FIG. 12 is a schematic diagram of one embodiment of a first signal generating unit
  • Figure 13 is a schematic diagram of another embodiment of the first signal generating unit
  • FIG. 14 is a schematic diagram of a system configuration for measuring nonlinear related parameters of a nonlinear device according to an embodiment of the present application
  • FIG. 15 is a schematic structural diagram of an electronic device according to Embodiment 3 of the present application.
  • the terms “first”, “second”, etc. are used to distinguish different elements in terms of numelation, but do not indicate the spatial arrangement or temporal order of these elements, and these elements should not be referred to by these terms restricted.
  • the term “and/or” includes any and all combinations of one or at least two of the associated listed items.
  • the terms “comprising”, “including”, “having”, etc. refer to the presence of stated features, elements, elements or components, but do not preclude the presence or addition of one or at least two other features, elements, elements or components.
  • Embodiment 1 of the present application provides a method for measuring nonlinear related parameters of a nonlinear device
  • FIG. 2 is a flowchart of the method. As shown in Figure 2, the method includes:
  • the first signal with a notch frequency and the signal to be tested have the same signal probability distribution, therefore, based on the first signal
  • the calculated nonlinear noise can accurately reflect the nonlinear noise actually generated when the signal to be measured passes through the nonlinear device, that is, the method according to Embodiment 1 can accurately calculate the nonlinear noise of the nonlinear device when the signal to be measured is transmitted.
  • Nonlinear correlation parameters
  • the nonlinear related parameter is a parameter that can measure the nonlinear effect of the nonlinear device
  • the nonlinear related parameter may be, for example, a power noise ratio (Power Noise Ratio, PNR) of an output signal of the nonlinear device.
  • PNR Power Noise Ratio
  • this embodiment may not be limited thereto, and the nonlinear related parameters may also be other parameters calculated based on the output signal of the nonlinear device.
  • the signal probability distribution refers to the probability distribution of the amplitude of the real signal in the time domain
  • the rate distribution of the signal refers to the probability distribution of the modulus of the complex signal in the time domain
  • the nonlinear related parameters of the nonlinear device when transmitting the signal to be measured usually also change. Therefore, through the embodiment Method 1 can accurately measure the nonlinear related parameters of the nonlinear device when transmitting different signals to be measured, so as to form the corresponding relationship between the signal to be measured, the nonlinear device and the nonlinear related parameters, and the corresponding relationship can be used for Optimal design of nonlinear devices, prediction of nonlinear degradation effects, and correct selection of nonlinear devices.
  • FIG. 3 is a schematic diagram of an example of the method shown in FIG. 2 .
  • the operation 201 of FIG. 2 forms a first signal 301 according to the signal to be measured 300 and the initial signal 300 a, and the first signal 301 is input to the nonlinear device 302 , the output signal of the nonlinear device 302 is 303 , the PNR of the output signal 303 is calculated in the calculation process 304 , and the calculated PNR is used as the nonlinear correlation parameter of the nonlinear device 302 when transmitting the signal to be measured 300 .
  • the dashed box 31 in FIG. 3 represents steps corresponding to operation 202 of FIG. 2 .
  • the signal power pn at the notch frequency of the output signal 303 can be regarded as the power of the nonlinear noise
  • the signal power pt at the frequency other than the notch frequency of the output signal 303 can be regarded as the nonlinear noise.
  • other methods may also be used to calculate the nonlinear correlation parameters.
  • the first signal 301 may have two sets of band-notch frequencies f1 and f2, and f1 and f2 are symmetrical.
  • f1 and f2 may also be asymmetrical, or the first signal is only There is 1 notch frequency f1a (eg, as shown by the first signal 301a in FIG. 3 ), or the first signal has more than 3 notch frequencies.
  • the one or more band-notch frequencies of the first signal may be distributed symmetrically or asymmetrically. Wherein, as shown in FIG. 3 , when the first signal is 301a, the output signal of the nonlinear device 302 is 303a.
  • the signal to be tested 300 and the first signal 301 ( 301 a ) may both be real signals, or both the signal to be tested 300 and the first signal 301 ( 301 a ) may be complex signals.
  • the total power of the first signal is the same as the total power of other frequency parts in the signal to be tested except for the frequency with the notch.
  • “same” means that the absolute value of the difference between the two is not greater than a predetermined value.
  • the predetermined threshold T1 may be, for example, 0.05%.
  • the total power of the first signal 302 shown in FIG. 3 is p1 (not shown)
  • the total power of the other frequency parts of the signal to be tested 300 except f1 and f2 is p2 (not shown),
  • FIG. 4 is a schematic diagram of a method of generating a first signal for implementing operation 201 of FIG. 2 .
  • the method for generating the first signal may further include:
  • the current band-notch signal generated in operation 403 When it is determined in operation 404 that the current band-notch signal generated in operation 403 satisfies the preset condition, the current band-notch signal is used as the first signal, and operation 201 is completed. In addition, when it is determined in operation 404 that the current band notch signal generated in operation 403 does not meet the preset condition, the current band notch signal is regarded as the existing band notch signal in operation 401, and operation 401 is performed again , the processing of operation 402 and operation 403 .
  • operation 401 changes the spectrum (ie, power) of the original signal or the existing notch signal
  • operation 402 changes the signal probability distribution of the first intermediate signal
  • operation 403 changes both the frequency spectrum of the signal and the Signal probability distribution. Therefore, by performing judgment in operation 404, and performing loop iteration according to the judgment result, both the frequency spectrum and the signal probability distribution of the notch signal can satisfy the conditions.
  • FIG. 5 is a schematic diagram of operation 401 . As shown in FIG. 5, operation 401 includes the following operations:
  • the signal to be tested may be, for example, a PAM8 signal.
  • the initial signal may be, for example, a signal having 2048 single tones with equal amplitude and random phase, wherein the 2048 single tones are equally spaced, and their frequencies are uniformly distributed in the entire spectrum range of the signal to be tested.
  • the signal to be tested and the initial signal may also be other types of signals, for example, the signal to be tested is a PAM signal, and the initial signal may be a single-carrier Gaussian signal or a PAM signal, or a random white noise signal.
  • Non-Patent Document 1 N., B.C., et al., Multisine signals for wireless system test and design. IEEE Microwave Magazine, 2008.9(3):p.122 -138)
  • FIG. 6 is a schematic diagram of one embodiment of operation 402 . As shown in FIG. 6, operation 402 includes the following operations:
  • N is a natural number
  • each frequency interval may include at least one tone frequency in the original signal.
  • this embodiment may not be limited thereto, for example, the entire frequency range of the first intermediate signal may be divided into a plurality of frequency intervals evenly or unequally.
  • the maximum value of the signal in one frequency interval refers to the maximum value of the signal power in the frequency interval on the spectrum of the first intermediate signal.
  • the Nth maximum value can be: the maximum value of the signal in all frequency intervals (for example, there are 100 frequency intervals, each frequency interval has 1 maximum value, then all frequency intervals have at least 100 maximum values) Sorting from largest to smallest, the largest value of the 15th percentile is taken as the Nth largest value, where 15% is only an example, and other values may also be used.
  • FIG. 7 is a schematic diagram of another embodiment of operation 402 . As shown in FIG. 7, operation 402 includes the following operations:
  • each frequency interval randomly change the signal of at least one point to obtain a random assignment signal
  • Operation 701 is the same as operation 601 .
  • randomly changing the signal of at least one point means: for each frequency interval on the frequency spectrum of the first intermediate signal, randomly changing the power of at least one frequency point in the frequency interval, Thereby a random assignment signal is obtained. Therefore, the correlation of the power of each frequency point in the frequency interval can be destroyed, so that the power of the signal and the probability distribution of the signal can be adjusted respectively, so as to realize the convergence of the loop iteration, where the convergence of the loop iteration refers to: After several times of operations 401 to 403, it is determined in operation 404 that the current band-notch signal satisfies the preset condition.
  • the maximum value (eg, the maximum value of power) of the signal in the frequency interval may be determined, and the value obtained by multiplying the maximum value by the coefficient is assigned to the frequency
  • the processing object of operation 703 is different from that of operation 603, that is, operation 703 is to process the random assignment signal, while operation 603 is to process the maximum value assignment signal.
  • the specific operation manner of operation 703 is the same as that of operation 603 .
  • the implementation of operation 402 may not be limited to the implementation shown in FIG. 6 or FIG. 7 , and may also be other implementations.
  • At least the signal at the notch frequency position of the second intermediate signal may be set to a fixed value or multiplied by a positive number less than 1, so as to generate the notch signal this time.
  • the power corresponding to at least one frequency point of the second intermediate signal is assigned a fixed value such as 0, or the power corresponding to at least one frequency point of the second intermediate signal is multiplied by a positive number less than 1, so that the spectrum is in The at least one frequency point forms a depression.
  • the at least one frequency point corresponds to the band-notch frequency of the first signal.
  • the current band-notch signal generated in operation 403 satisfies a preset condition.
  • the preset condition may be, for example, that the difference between the signal probability distributions of the signal with the notch and the signal to be tested this time is less than a predetermined value.
  • FIG. 8 is a schematic diagram of the signal probability distribution of the notched signal and the signal to be tested this time.
  • both the signal with a notch and the signal to be tested are real signals.
  • the probability distribution of the amplitude of the signal with a notch this time is shown as a curve 801
  • the probability distribution of the amplitude of the signal to be measured is shown as a curve 802
  • the curve 801 The non-overlapping area between the covered area and the area covered by the curve 802 is 803, and half of the area of the area 803 is used as the signal probability distribution difference (PDF difference) between the band-notch signal and the signal to be tested this time.
  • PDF difference signal probability distribution difference
  • the horizontal axis represents the amplitude (Amplitude) of the signal, and the vertical axis represents the probability (Probability).
  • P 1 (i) represents the probability that the amplitude of the signal with the notch is i
  • P 2 (i) represents the probability that the amplitude of the signal to be measured is i.
  • the value of the PDF difference is between 0 and 1.
  • the PDF difference is 0.
  • P 1 and P 2 are completely different Equivalent time, the PDF difference is 1.
  • operation 404 determines that the current band-notch signal generated in operation 403 satisfies the preset condition, and thus, the current band-notch signal is used as the first signal.
  • FIG. 4 an embodiment of generating the first signal has been described by taking FIG. 4 as an example.
  • the present application is not limited to this, and other manners may also be used to generate the first signal, that is, to implement operation 201 in FIG. 2 .
  • FIG. 9 is another schematic diagram of a method of generating a first signal, which can also be used to implement operation 201 of FIG. 2 .
  • the method includes:
  • band-stop filtering may be performed on the signal to be tested to form a signal having a band-notch frequency, and the signal having a band-notch frequency includes at least one band-notch frequency.
  • rejection sampling is performed sequentially in the time domain for the signal with the notch frequency generated in operation 901, that is, the sampling points on the signal with the notch frequency are rejected with a certain probability, so that the sampling point after the sampling is rejected
  • the signal probability distribution is equal to the signal probability distribution (amplitude probability distribution or modulo probability distribution) of the signal to be tested.
  • the signal probability distribution after rejection sampling is equal to the signal probability distribution of the signal to be tested may, for example, mean that the difference between the signal probability distribution after rejection sampling and the signal probability distribution of the signal to be tested is less than a predetermined value.
  • the first signal can also be generated, thereby realizing operation 201 of FIG. 2 .
  • a band-notch signal having the same signal probability distribution as the signal to be tested is generated, and based on the band-notch signal, nonlinear related parameters of the nonlinear device when transmitting the signal to be measured (for example, non-linear Linear noise power), thus, the nonlinear correlation parameters can be accurately calculated for the signal under test with any signal probability distribution, and in addition, the use of expensive high-frequency waveform analysis equipment can be avoided.
  • nonlinear related parameters of the nonlinear device when transmitting the signal to be measured for example, non-linear Linear noise power
  • FIG. 10 is a schematic diagram of the effect of the method for measuring nonlinear related parameters of a nonlinear device according to Embodiment 1 of the present application.
  • the broken line 1001 represents the error between the PNR and the actual PNR at different frequencies (ie, the PNR estimation error) obtained by using the traditional PNR test method of FIG.
  • the horizontal axis represents frequency in GHz, and the vertical axis represents PNR estimation error in dB.
  • the PNR estimation error is significantly smaller than the PNR estimation error obtained by the traditional PNR testing method.
  • the second embodiment also provides an apparatus for measuring nonlinear related parameters of a nonlinear device. Since the principle of the device for solving the problem is similar to that of the method in Embodiment 1, the specific implementation can refer to the implementation of the method in Embodiment 1, and the same content will not be repeated.
  • FIG. 11 is a schematic diagram of an apparatus for measuring nonlinear related parameters of a nonlinear device in this embodiment.
  • the apparatus 1100 for measuring nonlinear related parameters of a nonlinear device includes:
  • a first signal generating unit 1101 which generates a first signal according to the signal to be tested, the first signal and the signal to be tested have the same signal probability distribution, and the first signal has at least one band-notch frequency;
  • the processing unit 1102 which calculates the nonlinear related parameters of the nonlinear device when transmitting the signal to be measured according to the output signal of the nonlinear device when the first signal is input to the nonlinear device.
  • the total power of the first signal is the same as the total power of other frequency parts in the signal to be measured except the band-notch frequency.
  • FIG. 12 is a schematic diagram of an embodiment of the first signal generating unit. As shown in FIG. 12 , the first signal generating unit 1101 includes:
  • a first intermediate signal generating unit 1201 which generates a first intermediate signal having the same signal probability distribution as the signal to be tested based on an initial signal or an existing signal with a notch;
  • the second intermediate signal generating unit 1202 which adjusts the signals in each frequency interval of the first intermediate signal to generate a second intermediate signal, the signal power in each frequency interval of the second intermediate signal is the same as the signal power in each frequency interval of the second intermediate signal. the signal powers in the corresponding frequency bins of the signals are the same;
  • the current band-notch signal generating unit 1203 sets at least the signal at the band-notch frequency position of the second intermediate signal to a fixed value or multiplied by a positive number less than 1, thereby generating the current band-notch signal .
  • the first signal generating unit 1101 may use the current band-notch signal as the first signal.
  • the first signal generating unit 1101 uses the current band-notch signal as the existing band-notch signal, and generates the first signal, the second signal and the current band-notch signal again. processing of notched signals.
  • the second intermediate signal generating unit 1202 may be configured to:
  • the power of signals in each frequency interval in the maximum value assignment signal is adjusted so that the total power of the signal in the frequency interval is the same as the total power of the signal in the frequency interval corresponding to the signal to be measured, so as to generate a second intermediate signal.
  • the second intermediate signal generating unit 1202 may be configured to:
  • the signal of at least one point is randomly changed to obtain a randomly assigned signal
  • the power of the signal in each frequency interval is adjusted so that the total power of the signal in the frequency interval is equal to the total power of the signal in the frequency interval corresponding to the signal to be measured, so as to generate the second intermediate signal.
  • randomly changing the signal of at least one point includes: assigning a value obtained by multiplying the maximum value of the signal in the frequency interval by a coefficient to the signal of a predetermined frequency point in the frequency interval.
  • FIG. 13 is a schematic diagram of another embodiment of the first signal generating unit. As shown in FIG. 13 , the first signal generating unit 1101 includes:
  • Filtering unit 1301 which filters the signal to be tested to form a signal with a notch frequency
  • the rejection sampling unit 1302 based on the signal probability distribution of the signal to be tested, sequentially performs rejection sampling on the signal with the notch frequency in the time domain to generate the first signal.
  • a band-notch signal having the same signal probability distribution as the signal to be measured is generated, and based on the band-notch signal, nonlinear related parameters of the nonlinear device when transmitting the signal to be measured (for example, non-linear parameters) are calculated.
  • Linear noise power thus, the nonlinear correlation parameters can be accurately calculated for the signal under test with any signal probability distribution, and in addition, the use of expensive high-frequency waveform analysis equipment can be avoided.
  • Embodiments of the present application also provide a system for measuring nonlinear related parameters of a nonlinear device, including a nonlinear device and the apparatus for measuring nonlinear related parameters of a nonlinear device as described in Embodiment 2, the contents of which are incorporated herein .
  • the nonlinear device can be an electrical input and electrical output device, such as a radio frequency amplifier; it can also be an optical input electrical output device, such as an optical coherent receiver with a transimpedance amplifier, the input is an optical signal, and the output is an electrical signal; but this The application embodiment is not limited to this.
  • FIG. 14 is a schematic diagram of a system configuration for measuring nonlinear related parameters of a nonlinear device according to an embodiment of the present application.
  • the system for measuring the nonlinear related parameters of a nonlinear device includes: a nonlinear device 1401 and an apparatus 1100 for measuring the nonlinear related parameters of the nonlinear device, the apparatus 1100 for measuring the nonlinear related parameters of the nonlinear device It includes a first signal generating unit 1101 and a processing unit 1102, and the specific implementation thereof may refer to Embodiment 2, which will not be repeated here.
  • FIG. 15 is a schematic diagram of a structure of an electronic device.
  • the electronic device 1500 includes a processor (eg, a digital signal processor DSP) 1510 and a memory 1520 ; the memory 1520 is coupled to the processor 1510 .
  • the memory 1520 can store various data; in addition, it also stores information processing programs, and executes the programs under the control of the processor 1510 .
  • the electronic device 1500 further includes a signal transmitter 1530 .
  • the electronic device 1500 may implement the function of the apparatus 1100 for measuring nonlinear related parameters of a nonlinear device.
  • the functionality of the apparatus 1100 for measuring nonlinear-related parameters of nonlinear devices may be integrated into the processor 1510 .
  • the processor 1510 may be configured to implement the method for measuring nonlinear related parameters of a nonlinear device as described in Embodiment 1.
  • the apparatus 1100 for measuring nonlinear related parameters of a nonlinear device may be configured separately from the processor 1510 , for example, the apparatus 1100 for measuring nonlinear related parameters of a nonlinear device may be configured as a connection to the processor 1510 The chip, through the control of the processor 1510, realizes the function of the apparatus 1100 for measuring the nonlinear related parameters of the nonlinear device.
  • the electronic device 1500 does not necessarily include all the components shown in FIG. 15 ; in addition, the electronic device 1500 may also include components not shown in FIG. 15 , and reference may be made to the prior art.
  • a band-notch signal having the same signal probability distribution as the signal to be measured is generated, and based on the band-notch signal, nonlinear related parameters (for example, nonlinear noise) of the nonlinear device when transmitting the signal to be measured are calculated. power), thus, the nonlinear correlation parameters can be accurately calculated for the signal under test with any signal probability distribution format, and in addition, the use of expensive high-frequency waveform analysis equipment can be avoided.
  • nonlinear related parameters for example, nonlinear noise
  • the embodiments of the present application also provide a computer-readable program, wherein when the program is executed in an apparatus for measuring nonlinear-related parameters of nonlinear devices, the program enables a computer to execute the program in the apparatus for measuring nonlinear-related parameters of nonlinear devices
  • the method for measuring the nonlinear related parameters of the nonlinear device as described in the above embodiment 1 is performed in .
  • the embodiment of the present application also provides a storage medium storing a computer-readable program, wherein the computer-readable program causes a computer to perform the measurement of a nonlinear device in the above embodiment 1 in an apparatus for measuring a nonlinear related parameter of a nonlinear device method of nonlinear correlation parameters.
  • the method for measuring the filtering characteristic in the apparatus for measuring the filtering characteristic described in conjunction with the embodiments of the present application may be directly embodied in hardware, a software module executed by a processor, or a combination of the two.
  • one or more of the functional block diagrams and/or one or more combinations of the functional block diagrams in the drawings may correspond to either software modules or hardware modules of the computer program flow.
  • These software modules may respectively correspond to the various steps shown in the accompanying drawings.
  • These hardware modules can be implemented by, for example, solidifying these software modules using a Field Programmable Gate Array (FPGA).
  • FPGA Field Programmable Gate Array
  • a software module may reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the art.
  • a storage medium can be coupled to the processor, such that the processor can read information from, and write information to, the storage medium; or the storage medium can be an integral part of the processor.
  • the processor and storage medium may reside in an ASIC.
  • the software module can be stored in the memory of the device for measuring filter characteristics or in a memory card that can be inserted into the device for measuring filter characteristics.
  • One or more of the functional block diagrams and/or one or more combinations of the functional block diagrams for the figures may be implemented as a general purpose processor, a digital signal processor (DSP), an application specific integrated processor for performing the functions described herein Circuits (ASICs), Field Programmable Gate Arrays (FPGAs) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or any suitable combination thereof.
  • DSP digital signal processor
  • ASICs application specific integrated processor for performing the functions described herein Circuits
  • FPGAs Field Programmable Gate Arrays
  • it can also be implemented as a combination of computing devices, for example, a combination of a DSP and a microprocessor, a plurality of microprocessors, a combination of communication with a DSP one or more microprocessors or any other such configuration.
  • An electronic device comprising a processor and a memory, the memory storing a computer-readable program, the processor implementing a method of measuring nonlinear-related parameters of a nonlinear device when the computer-readable program is executed method, the method includes:
  • the nonlinear related parameters of the nonlinear device when transmitting the signal to be measured are calculated according to the output signal of the nonlinear device when the first signal is input to the nonlinear device.
  • the total power of the first signal is the same as the total power of other frequency parts of the signal to be tested except the band-notch frequency.
  • the current band-notch signal When the current band-notch signal satisfies a preset condition, the current band-notch signal is used as the first signal.
  • the process of generating the first signal, the second signal, and the current notch signal is performed again.
  • the signal of at least one point is randomly changed to obtain a randomly assigned signal
  • the power of the signal in each frequency interval is adjusted so that the total power of the signal in the frequency interval is equal to the total power of the signal in the frequency interval corresponding to the signal to be measured, so as to generate the second intermediate signal.
  • the value obtained by multiplying the maximum value of the signal in the frequency interval by the coefficient is assigned to the signal of the predetermined frequency point in the frequency interval.
  • reject sampling is performed sequentially on the signal with the notch frequency in the time domain to generate the first signal.
  • a storage medium storing a computer-readable program, the computer-readable program causing a computer to implement a method for measuring a nonlinear related parameter of a nonlinear device, the method comprising:
  • the nonlinear related parameters of the nonlinear device when transmitting the signal to be measured are calculated according to the output signal of the nonlinear device when the first signal is input to the nonlinear device.
  • the total power of the first signal is the same as the total power of other frequency parts of the signal to be tested except the band-notch frequency.
  • the current band-notch signal When the current band-notch signal satisfies a preset condition, the current band-notch signal is used as the first signal.
  • the process of generating the first signal, the second signal, and the current notch signal is performed again.
  • the signal of at least one point is randomly changed to obtain a randomly assigned signal
  • the power of the signal in each frequency interval is adjusted so that the total power of the signal in the frequency interval is equal to the total power of the signal in the frequency interval corresponding to the signal to be measured, so as to generate the second intermediate signal.
  • the value obtained by multiplying the maximum value of the signal in the frequency interval by the coefficient is assigned to the signal of the predetermined frequency point in the frequency interval.
  • reject sampling is performed sequentially on the signal with the notch frequency in the time domain to generate the first signal.

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  • Nonlinear Science (AREA)
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Abstract

本申请实施例提供一种测量非线性器件的非线性相关参数的方法、装置和系统，其中，该装置包括：第一信号生成单元，其根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及处理单元，其根据将所述第一信号输入非线性器件的情况下所述非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。

Description

测量非线性器件的非线性相关参数的方法、装置和系统 技术领域
本申请涉及通信技术领域。
背景技术
在射频微波领域，通信领域，以及光通信领域，为了实现更大带宽，更多频段的信号传输，越来越多的高频器件投入了应用，比如40GHz带宽射频放大器，宽带相干光接收机(带有跨阻放大器)等。然而，高频器件往往带有一些性能的不理想，例如，宽带射频放大器可能具有非线性效应，而这种非线性效应会使高频器件的信号传输性能劣化。因此研究人员提出了一些指标和测量方法来衡量器件中非线性效应的大小，用于器件的优化设计、非线性劣化影响的预测以及器件的正确选型等。
衡量非线性效应最常用的指标是总谐波失真(total harmonic distortion，THD)，即，通过观测单一频率的输入信号在待测系统输出端产生的谐波大小估计非线性程度。然而这种方法非常不准确，尤其是在更大带宽的应用中，高频和低频处的非线性大小相距甚远。
另一种现有的方法是，使待测信号通过带阻滤波，形成具有带陷的信号(即，带陷信号)，带陷信号通过非线性器件后得到输出信号，测量输出信号中带陷位置的功率作为非线性噪声，该非线性噪声反映了该非线性器件在传输该待测信号时的非线性程度，这种方法称为传统的功率噪声比(Power Noise Ratio，PNR)测试方法。
上述的THD或PNR可以被称为非线性器件的非线性相关参数。
图1是传统的PNR测试方法的一个示意图，如图1所示，待测信号100经过带阻滤波处理101，形成带陷信号102，带陷信号102被输入非线性器件103，非线性器件103的输出信号为104，在计算步骤105中计算输出信号104的PNR，作为非线性器件103在传输待测信号100时的非线性相关参数。
应该注意，上面对技术背景的介绍只是为了方便对本申请的技术方案进行清楚、完整的说明，并方便本领域技术人员的理解而阐述的。不能仅仅因为这些方案在本申请的背景技术部分进行了阐述而认为上述技术方案为本领域技术人员所公知。
发明内容
本申请的发明人发现，在使用传统的PNR测试方法时，有时测量出的非线性噪声并不准确。发明人进一步研究发现，非线性噪声的大小与信号概率分布(Probability distribution function，PDF)有关，而待测信号在经过带阻滤波之后，形成的带陷信号的信号概率分布相对于待测信号的信号概率分布发生了变化，因此，基于带陷信号计算得到的非线性噪声相对于待测信号经过非线性器件时实际产生的非线性噪声会发生变化。尤其是对于非高斯分布的待测信号，在经过带阻滤波之后，带陷信号的信号概率分布相比于待测信号的信号概率分布的变化更大，因而计算出的非线性噪声的偏差也更大。其中，对于实信号，信号概率分布指实信号的幅度的概率分布，对于复数信号，信号的率分布指复数信号的模的概率分布。
本申请实施例提出了一种测量非线性器件的非线性相关参数的方法、装置和系统，生成与待测信号具有相同的信号概率分布的带陷信号，并基于该带陷信号计算非线性器件在传输该待测信号时的非线性相关参数(例如，非线性噪声功率)，由此，针对具有任何信号概率分布的待测信号都能够准确地计算非线性相关参数，此外，能够避免使用昂贵的高频波形分析设备。
根据本申请实施例的第一个方面，提供了一种测量非线性器件的非线性相关参数的装置，包括：
第一信号生成单元，其根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及
处理单元，其根据将所述第一信号输入非线性器件的情况下所述非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。
根据本申请实施例的第二个方面，提供了一种测量非线性器件的非线性相关参数的方法，包括：
根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及
根据将所述第一信号输入非线性器件的情况下所述非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。
根据本申请实施例的第三个方面，提供了一种测量滤波特性的系统，其中，该系统包括非线性器件以及前述第一方面的测量非线性器件的非线性相关参数的装置。
本申请实施例的有益效果在于：生成与待测信号具有相同的信号概率分布的带陷信号，并基于该带陷信号计算非线性器件在传输该待测信号时的非线性相关参数，由此，针对具有任何信号概率分布的待测信号都能够准确地计算非线性相关参数，此外，能够避免使用昂贵的高频波形分析设备。
参照后文的说明和附图，详细公开了本申请的特定实施方式，指明了本申请的原理可以被采用的方式。应该理解，本申请的实施方式在范围上并不因而受到限制。在所附权利要求的精神和条款的范围内，本申请的实施方式包括许多改变、修改和等同。
针对一种实施方式描述和/或示出的特征可以以相同或类似的方式在一个或更多个其它实施方式中使用，与其它实施方式中的特征相组合，或替代其它实施方式中的特征。
应该强调，术语“包括/包含”在本文使用时指特征、整件、步骤或组件的存在，但并不排除一个或更多个其它特征、整件、步骤或组件的存在或附加。
附图说明
参照以下的附图可以更好地理解本申请的很多方面。附图中的部件不是成比例绘制的，而只是为了示出本申请的原理。为了便于示出和描述本申请的一些部分，附图中对应部分可能被放大或缩小。在本申请的一个附图或一种实施方式中描述的元素和特征可以与一个或更多个其它附图或实施方式中示出的元素和特征相结合。此外，在附图中，类似的标号表示几个附图中对应的部件，并可用于指示多于一种实施方式中使用的对应部件。
在附图中：
图1是传统的PNR测试方法的一个示意图；
图2是本申请实施例1的测量非线性器件的非线性相关参数的方法的一个流程图；
图3是图2所示方法的一个实例的示意图；
图4是生成第一信号的方法的一个示意图；
图5是操作401的一个示意图；
图6是操作402的一个实施方式的示意图；
图7是操作402的另一个实施方式的示意图；
图8是本次的带陷信号与待测信号的信号概率分布的一个示意图；
图9是生成第一信号的方法的另一个示意图；
图10是本申请实施例1的测量非线性器件的非线性相关参数的方法的效果的一个示意图；
图11是本申请实施例2中测量非线性器件的非线性相关参数的装置的一个示意图；
图12是第一信号生成单元的一个实施方式的示意图；
图13是第一信号生成单元的另一个实施方式的示意图；
图14是本申请实施例的测量非线性器件的非线性相关参数的系统构成的一示意图；
图15是本申请实施例3的电子设备的一构成示意图。
具体实施方式
参照附图，通过下面的说明书，本申请实施例的前述以及其它特征将变得明显。这些实施方式只是示例性的，不是对本申请的限制。为了使本领域的技术人员能够容易地理解本申请的原理和实施方式，本申请实施例以图像压缩处理的重建图像为例进行说明，但可以理解，本申请实施例并不限于此，基于其他图像处理的重建图像也在本申请的包含范围内。
在本申请实施例中，术语“第一”、“第二”等用于对不同元素从称谓上进行区分，但并不表示这些元素的空间排列或时间顺序等，这些元素不应被这些术语所限制。术语“和/或”包括相关联列出的术语的一种或至少两个中的任何一个和所有组合。术语“包含”、“包括”、“具有”等是指所陈述的特征、元素、元件或组件的存在，但并不排除存在或添加一个或至少两个其他特征、元素、元件或组件。
在本申请实施例中，单数形式“一”、“该”等包括复数形式，应广义地理解为“一种”或“一类”而并不是限定为“一个”的含义；此外术语“所述”应理解为既包括单数形式也包括复数形式，除非上下文另外明确指出。此外术语“根据”应理解为“至少部分根据……”，术语“基于”应理解为“至少部分基于……”，除非上下文另外明确指出。
下面参照附图对本申请的具体实施方式进行说明。
实施例1
本申请实施例1提供一种测量非线性器件的非线性相关参数的方法，图2是该方法的一个流程图。如图2所示，该方法包括：
201、根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及
202、根据将第一信号输入非线性器件的情况下该非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。
由于非线性噪声的大小与信号概率分布(Probability distribution function，PDF)有关，在实施例1中，具有带陷频率的第一信号与待测信号具有相同的信号概率分布，因此，基于第一信号计算得到的非线性噪声能够准确地反映该待测信号经过非线性器件时实际产生的非线性噪声，即，根据实施例1的方法能够准确地计算该非线性器件在传输该待测信号时的非线性相关参数。
在本实施例中，非线性相关参数是能够衡量该非线性器件的非线性效应的参数，非线性相关参数例如可以是非线性器件的输出信号的功率噪声比(Power Noise Ratio，PNR)。此外，本实施例可以不限于此，非线性相关参数也可以是基于非线性器件的输出信号计算出的其它参数。
在本实施例中，对于实信号，信号概率分布指该实信号在时域上的幅度的概率分布，对于复数信号，信号的率分布指该复数信号在时域上的模的概率分布。
待测信号发生变化(例如，待测信号的频率、功率、信号概率分布等发生变化)，非线性器件在传输该待测信号时的非线性相关参数通常也会发生变化，因此，通过实施例1的方法，可以准确测量出该非线性器件在传输不同的待测信号时的非线性相关参数，从而形成待测信号、非线性器件以及非线性相关参数的对应关系，该对应关系能够用于非线性器件的优化设计、非线性劣化影响的预测以及非线性器件的正确选型等。
图3是图2所示方法的一个实例的示意图。如图3所示，在测量非线性器件的非线性相关参数的方法中，图2的操作201根据待测信号300和初始信号300a形成第一信号301，第一信号301被输入非线性器件302，非线性器件302的输出信号为303，在计算处理304中计算输出信号303的PNR，将计算出的该PNR作为非线性器件302在传输待测信号300时的非线性相关参数。
图3中的虚线框31表示对应于图2的操作202的步骤。其中，在计算处理304 中，可以将输出信号303的带陷频率处的信号功率pn作为非线性噪声的功率，将输出信号303的带陷频率之外的其它频率处的信号功率pt作为非线性噪声的功率与有效信号功率pe之和，由此，pe＝pt-pn，PNR＝(pt-pn)/pn，PNR可以被作为非线性相关参数。此外，在计算处理304中，也可以采用其它方法来计算非线性相关参数。
如图3所示，第一信号301可以具有两组带陷频率f1和f2，并且，f1和f2对称，此外，在其它的实例中，f1和f2也可以不对称，或者，第一信号仅具有1个带陷频率f1a(例如，图3中的第一信号301a所示)，或者，第一信号具有3个以上的带陷频率。此外，该第一信号的该1个以上的带陷频率可以对称分布或者非对称分布。其中，如图3所示，在第一信号是301a的情况下，非线性器件302的输出信号为303a。
在本实施例中，待测信号300和第一信号301(301a)可以都是实信号，或者，待测信号300和第一信号301(301a)可以都是复数信号。
在本实施例中，第一信号的总功率与待测信号中除了带陷频率之外的其它频率部分的总功率相同，这里，“相同”的含义是二者之差的绝对值不大于预定的阈值T1，该预定的阈值T1例如可以是0.05％。例如，图3所示的第一信号302的总功率为p1(未图示)，待测信号300的除了f1、f2之外的其它频率部分的总功率是p2(未图示)，|p1-p2|≤T1。由此，能够消除信号功率的变化对非线性相关参数的影响。
图4是生成第一信号的方法的一个示意图，用于实现图2的操作201。
401、基于初始信号或已有的带陷信号生成与待测信号具有相同的信号概率分布的第一中间信号；
402、对第一中间信号的各频率区间的信号进行调整，生成第二中间信号，该第二中间信号的各频率区间中的信号功率与待测信号的对应频率区间中的信号功率相同；以及
403、将第二中间信号的至少带陷频率位置的信号设定为固定值或乘以小于1的正数，从而生成本次的带陷信号。
如图4所示，生成第一信号的方法还可以包括：
404、判断本次的带陷信号是否满足预设条件。
当在操作404中判断为操作403生成的本次的带陷信号满足预设条件时，将该本次的带陷信号作为第一信号，完成操作201。此外，当在操作404中判断为操作403生成的本次的带陷信号不满足该预设条件时，将该本次的带陷信号作为操作401中已 有的带陷信号，再次进行操作401、操作402和操作403的处理。
在本实施例中，操作401会改变初始信号或已有的带陷信号的频谱(即，功率)，操作402会改变第一中间信号的信号概率分布，操作403既改变信号的频谱，又改变信号概率分布。因此，通过操作404进行判断，并根据判断的结果进行循环迭代，能够使带陷信号的频谱和信号概率分布都满足条件。
下面，对操作401～404分别进行说明。
图5是操作401的一个示意图。如图5所示，操作401包括如下操作：
501、将待测信号和初始信号(或已有的带陷信号)分别按照时域上的信号大小的降序或升序排列，并记录初始信号(或已有的带陷信号)在降序或升序排列前的时间序列；
502、将待测信号的信号大小按照排序顺序分别赋值给对应的初始信号(或已有的带陷信号)的信号大小，形成幅度赋值信号；以及
503、按照在操作501中记录的初始信号(或已有的带陷信号)在降序或升序排列前的时间序列，将幅度赋值信号中排列的各信号大小在时间序列上的排列顺序进行还原，得到第一中间信号。
在操作501中，待测信号例如可以是PAM8信号。初始信号例如可以是具有2048个幅度相等、相位随机的单音的信号，其中，该2048个单音信号间隔相等，其频率均匀分布在待测信号的整个频谱范围内。此外，待测信号和初始信号也可以是其它类型的信号，例如，待测信号为PAM信号，初始信号可以是单载波高斯信号或PAM信号，或者是随机白噪声信号。
在操作501～503中：当待测信号和初始信号(或已有的带陷信号)是实信号时，信号大小指信号的幅度；当待测信号和初始信号(或已有的带陷信号)是复数信号时，信号大小指信号的模。
通过操作501～503，第一中间信号与待测信号的信号概率分布相同。
关于操作501～503的详细说明，可以参考相关技术，例如非专利文件1(N.,B.C.,et al.,Multisine signals for wireless system test and design.IEEE Microwave Magazine,2008.9(3):p.122-138)
图6是操作402的一个实施方式的示意图。如图6所示，操作402包括如下操作：
601、将第一中间信号的整个频率范围分为多个频率区间；
602、确定每一个频率区间中的信号的最大值，并针对所有频率区间中的信号的最大值进行排序，将第N个最大值赋值给每一个频率区间的信号的最大值，形成最大值赋值信号，N为自然数；
603、调整最大值赋值信号中每一个频率区间内信号的功率，使该频率区间内信号的总功率与待测信号对应频率区间内的信号的总功率相等。
如果初始信号包括多个单音频率，在操作601中，可以使每一个频率区间至少包括一个初始信号中的单音频率。此外，本实施例可以不限于此，例如，可以将第一中间信号的整个频率范围平均或非平均地分为多个频率区间。
在操作602中，一个频率区间中的信号的最大值，是指第一中间信号的频谱上该频率区间的信号功率的最大值。第N个最大值例如可以是：将所有频率区间中的信号的最大值(例如，有100个频率区间，每个频率区间有1个最大值，则所有频率区间共有至少100个最大值)进行从大到小排序，将排序为第15％的最大值作为该第N个最大值，其中，15％只是举例，也可以是其它的数值。
在操作603中，例如，对于最大值赋值信号中频率为f3～f4的频率区间，调整该频率区间内信号的功率，使该频率区间内信号的总功率与待测信号中频率为f3～f4的频率区间内的信号的总功率相同。在操作603中，“相同”的含义是二者之差的绝对值不大于预定的阈值T2，该预定的阈值T2例如可以是5％等。
图7是操作402的另一个实施方式的示意图。如图7所示，操作402包括如下操作：
701、将第一中间信号的整个频率范围分为多个频率区间；
702、在每一个频率区间中，随机地改变至少一个点的信号，得到随机赋值信号；
703、调整随机赋值信号中每一个频率区间内信号的功率，使该频率区间内信号的总功率与待测信号对应频率区间内的信号的总功率相等。
操作701与操作601相同。
在操作702中，在每一个频率区间中，随机地改变至少一个点的信号是指：针对第一中间信号的频谱上的各频率区间，随机地改变该频率区间中至少一个频率点的功率，从而得到随机赋值信号。由此，能够破坏该频率区间中各频率点的功率的相关性，从而便于对信号的功率和信号概率分布分别进行调整，以实现循环迭代的收敛，其中，循环迭代的收敛是指：在经过若干次操作401～操作403的处理后，在操作404中判 断为本次的带陷信号满足预设条件。
在操作702的一种实施方式中，针对某一个频率区间，可以确定该频率区间中的信号的最大值(例如，功率的最大值)，将该最大值乘以系数后的值赋值给该频率区间中预定的频率点的信号，其中，该预定的频率点，例如是该最大值对应的频率点的下一个或下几个频率点，该系数例如是小于1的数(例如0.05)或者随机数。
操作703与操作603的处理对象不同，即，操作703是对随机赋值信号进行处理，而操作603是对最大值赋值信号进行处理。操作703的具体操作方式与操作603相同。
在本实施例中，操作402的实施方式可以不限于图6或图7所示的实施方式，也可以是其它的实施方式。
在图4所示的操作403中，可以将第二中间信号的至少带陷频率位置的信号设定为固定值或乘以小于1的正数，从而生成本次的带陷信号。例如，将第二中间信号的至少一个频率点对应的功率赋值为0等固定值，或者，将第二中间信号的至少一个频率点对应的功率乘以小于1的正数，由此，频谱在该至少一个频率点形成凹陷。其中，该至少一个频率点对应于该第一信号的带陷频率。
在图4所示的操作404中，判断操作403生成的本次的带陷信号是否满足预设条件。该预设条件例如可以是：本次的带陷信号与待测信号的信号概率分布之差小于预定值。
图8是本次的带陷信号与待测信号的信号概率分布的一个示意图。如图8所示，本次的带陷信号与待测信号都是实信号，本次的带陷信号的幅度概率分布表示为曲线801，待测信号的幅度概率分布表示为曲线802，曲线801所覆盖的区域与曲线802所覆盖的区域之间非重叠的区域为803，区域803的面积的一半作为本次的带陷信号与待测信号的信号概率分布差(PDF difference)。
如图8所示，横轴表示信号的幅度(Amplitude)，纵轴表示概率(Probability)。
其中，PDF difference可以被表示为下面的式(1)：
Figure PCTCN2020125268-appb-000001
式(1)中，P 1(i)表示本次的带陷信号中幅度为i的概率，P 2(i)表示待测信号中幅度为i的概率。PDF difference的值在0到1之间，当本次的带陷信号的幅度概率分布P 1与待测信号的幅度概率分布P 2相等时，PDF difference为0，当P 1与P 2完全不等时，PDF difference为1。
在一个具体实施例中，在PDF difference≤0.01时，操作404判断为操作403生成的本次的带陷信号满足预设条件，由此，将本次的带陷信号作为第一信号。
以上，以图4为例，说明了生成第一信号的一种实施方式。本申请并不限于此，也可以采用其它的方式来生成第一信号，即，实现图2的操作201。
图9是生成第一信号的方法的另一个示意图，也能用于实现图2的操作201。
如图9所示，该方法包括：
901、对待测信号进行滤波处理，形成具有带陷频率的信号；
902、基于待测信号的信号概率分布，将具有带陷频率的信号依次在时域上进行拒绝采样，以生成所述第一信号。
操作901中，例如可以对待测信号进行带阻滤波，形成具有带陷频率的信号，该具有带陷频率的信号中包括有至少一个带陷频率。
在操作902中，针对操作901中生成的具有带陷频率的信号依次在时域上进行拒绝采样，即，以一定的概率拒绝该具有带陷频率的信号上的采样点，使得拒绝采样之后的信号概率分布(幅度概率分布或模概率分布)与待测信号的信号概率分布(幅度概率分布或模概率分布)相等。其中，拒绝采样之后的信号概率分布与待测信号的信号概率分布相等，例如可以是指：拒绝采样之后的信号与待测信号的信号概率分布之差小于预定值。
通过图9所示的实施方式，也能生成第一信号，从而实现图2的操作201。
根据本申请的实施例1，生成与待测信号具有相同的信号概率分布的带陷信号，并基于该带陷信号计算非线性器件在传输该待测信号时的非线性相关参数(例如，非线性噪声功率)，由此，针对具有任何信号概率分布的待测信号都能够准确地计算非线性相关参数，此外，能够避免使用昂贵的高频波形分析设备。
图10是本申请实施例1的测量非线性器件的非线性相关参数的方法的效果的一个示意图。如图10所示，折线1001表示使用图1的传统的PNR测试方法得到不同频率下的PNR与实际PNR的误差(即，PNR估计误差)，虚线圈1002中的点表示使用图2的方法得到的不同频率下的PNR估计误差。横轴表示频率，单位是GHz，纵轴表示PNR估计误差，单位是dB。
如图10所示，在使用本申请计算PNR的情况下，PNR估计误差明显小于传统的PNR测试方法得到的PNR估计误差。
实施例2
本实施例2还提供一种测量非线性器件的非线性相关参数的装置。由于该装置解决问题的原理与实施例1的方法类似，因此其具体的实施可以参考实施例1的方法的实施，内容相同之处不再重复说明。
图11是本实施例中测量非线性器件的非线性相关参数的装置的一个示意图，如图11所示，该测量非线性器件的非线性相关参数的装置1100包括：
第一信号生成单元1101，其根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及
处理单元1102，其根据将第一信号输入非线性器件的情况下所述非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。
在本实施例中，第一信号生成单元1101和处理单元1102的实施方式可以参考实施例1中的操作201、操作202，此处不再赘述。
在本实施例中个，第一信号的总功率与待测信号中除了所述带陷频率之外的其它频率部分的总功率相同。
图12是第一信号生成单元的一个实施方式的示意图，如图12所示，第一信号生成单元1101包括：
第一中间信号生成单元1201，其基于初始信号或已有的带陷信号生成与所述待测信号具有相同的信号概率分布的第一中间信号；
第二中间信号生成单元1202，其对所述第一中间信号的各频率区间的信号进行调整，生成第二中间信号，所述第二中间信号的各频率区间中的信号功率与所述待测信号的对应频率区间中的信号功率相同；以及
本次的带陷信号生成单元1203，其将所述第二中间信号的至少所述带陷频率位置的信号设定为固定值或乘以小于1的正数，从而生成本次的带陷信号。
在本实施例中，当本次的带陷信号满足预设条件时，第一信号生成单元1101可以将本次的带陷信号作为第一信号。此外，当本次的带陷信号不满足预设条件时，第一信号生成单元1101将本次的带陷信号作为已有的带陷信号，再次进行生成第一信号、第二信号和本次的带陷信号的处理。
在一种实施方式中，第二中间信号生成单元1202可以被配置为：
将第一中间信号整个频率范围分为多个频率区间；
确定每一个频率区间中的信号的最大值，并针对所有频率区间中的信号的最大值进行排序，将第N个最大值赋值给每一个频率区间中的信号的最大值，形成最大值赋值信号，N为自然数；以及
调整所述最大值赋值信号中各频率区间内信号的功率，使该频率区间内信号的总功率与所述待测信号对应频率区间内的信号的总功率相同，以生成第二中间信号。
在另一种实施方式中，第二中间信号生成单元1202可以被配置为：
将第一中间信号的整个频率范围分为多个频率区间；
在每一个频率区间中，随机地改变至少一个点的信号，得到随机赋值信号；以及
调整每一个频率区间内信号的功率，使该频率区间内信号的总功率与所述待测信号对应频率区间内的信号的总功率相等，以生成第二中间信号。
其中，在每一个频率区间中，随机地改变至少一个点的信号，包括：将该频率区间中信号的最大值乘以系数后的值赋值给该频率区间中预定的频率点的信号。
图13是第一信号生成单元的另一个实施方式的示意图，如图13所示，第一信号生成单元1101包括：
滤波单元1301，其对待测信号进行滤波处理，形成具有带陷频率的信号；
拒绝采样单元1302，其基于待测信号的信号概率分布，将所述具有带陷频率的信号依次在时域上进行拒绝采样，以生成所述第一信号。
在本实施例中，关于各单元的具体说明可以参考实施例1中对于对应操作的说明，此处不再赘述。
根据本申请的实施例2，生成与待测信号具有相同的信号概率分布的带陷信号，并基于该带陷信号计算非线性器件在传输该待测信号时的非线性相关参数(例如，非线性噪声功率)，由此，针对具有任何信号概率分布的待测信号都能够准确地计算非线性相关参数，此外，能够避免使用昂贵的高频波形分析设备。
实施例3
本申请实施例还提供一种测量非线性器件的非线性相关参数的系统，包括非线性器件以及如实施例2所述的测量非线性器件的非线性相关参数的装置，其内容被合并 于此。该非线性器件可以是电输入电输出器件，例如射频放大器；也可以是光输入电输出器件，例如带有跨阻放大器的光相干接收机，其输入为光信号，输出为电信号；但本申请实施例不限于此。
图14是本申请实施例的测量非线性器件的非线性相关参数的系统构成的一示意图。如图14所示，测量非线性器件的非线性相关参数的系统包括：非线性器件1401以及测量非线性器件的非线性相关参数的装置1100，该测量非线性器件的非线性相关参数的装置1100包括第一信号生成单元1101以及处理单元1102，其具体实施方式可以参考实施例2，此处不再赘述。
图15是电子设备的一构成示意图。如图15所示，该电子设备1500包括处理器(例如数字信号处理器DSP)1510和存储器1520；存储器1520耦合到处理器1510。其中该存储器1520可存储各种数据；此外还存储信息处理的程序，并且在处理器1510的控制下执行该程序，另外，该电子设备1500还包括信号发射器1530。电子设备1500可以实现测量非线性器件的非线性相关参数的装置1100的功能。
在一个实施方式中，测量非线性器件的非线性相关参数的装置1100的功能可以被集成到处理器1510中。其中，处理器1510可以被配置为实现如实施例1所述的测量非线性器件的非线性相关参数的方法。
在另一个实施方式中，测量非线性器件的非线性相关参数的装置1100可以与处理器1510分开配置，例如可以将测量非线性器件的非线性相关参数的装置1100配置为与处理器1510连接的芯片，通过处理器1510的控制来实现测量非线性器件的非线性相关参数的装置1100的功能。
值得注意的是，电子设备1500也并不是必须要包括图15中所示的所有部件；此外，电子设备1500还可以包括图15中没有示出的部件，可以参考现有技术。
通过本申请实施例，生成与待测信号具有相同的信号概率分布的带陷信号，并基于该带陷信号计算非线性器件在传输该待测信号时的非线性相关参数(例如，非线性噪声功率)，由此，针对具有任何信号概率分布格式的待测信号都能够准确地计算非线性相关参数，此外，能够避免使用昂贵的高频波形分析设备。
本申请实施例还提供一种计算机可读程序，其中当在测量非线性器件的非线性相关参数的装置中执行该程序时，该程序使得计算机在该测量非线性器件的非线性相关参数的装置中执行如上面实施例1所述的测量非线性器件的非线性相关参数的方法。
本申请实施例还提供一种存储有计算机可读程序的存储介质，其中该计算机可读程序使得计算机在测量非线性器件的非线性相关参数的装置中执行上面实施例1中的测量非线性器件的非线性相关参数的方法。
结合本申请实施例描述的在测量滤波特性的装置中测量滤波特性的方法可直接体现为硬件、由处理器执行的软件模块或二者组合。例如，附图中功能框图中的一个或多个和/或功能框图的一个或多个组合，既可以对应于计算机程序流程的各个软件模块，亦可以对应于各个硬件模块。这些软件模块，可以分别对应于附图所示的各个步骤。这些硬件模块例如可利用现场可编程门阵列(FPGA)将这些软件模块固化而实现。
软件模块可以位于RAM存储器、闪存、ROM存储器、EPROM存储器、EEPROM存储器、寄存器、硬盘、移动磁盘、CD-ROM或者本领域已知的任何其它形式的存储介质。可以将一种存储介质耦接至处理器，从而使处理器能够从该存储介质读取信息，且可向该存储介质写入信息；或者该存储介质可以是处理器的组成部分。处理器和存储介质可以位于ASIC中。该软件模块可以存储在测量滤波特性的装置的存储器中，也可以存储在可插入测量滤波特性的装置的存储卡中。
针对附图的功能框图中的一个或多个和/或功能框图的一个或多个组合，可以实现为用于执行本申请所描述功能的通用处理器、数字信号处理器(DSP)、专用集成电路(ASIC)、现场可编程门阵列(FPGA)或其它可编程逻辑器件、分立门或晶体管逻辑器件、分立硬件组件、或者其任意适当组合。针对功能框图中的一个或多个和/或功能框图的一个或多个组合，还可以实现为计算设备的组合，例如，DSP和微处理器的组合、多个微处理器、与DSP通信结合的一个或多个微处理器或者任何其它这种配置。
以上结合具体的实施方式对本申请进行了描述，但本领域技术人员应该清楚，这些描述都是示例性的，并不是对本申请保护范围的限制。本领域技术人员可以根据本申请的精神和原理对本申请做出各种变型和修改，这些变型和修改也在本申请的范围内。
关于包括以上多个实施例的实施方式，还公开下述的附记。
1.一种电子设备，所述电子设备包括处理器和存储器，所述存储器存储计算机可 读程序，所述处理器在执行所述计算机可读程序时实现测量非线性器件的非线性相关参数的方法，所述方法包括：
根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及
根据将所述第一信号输入非线性器件的情况下所述非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。
2.如附记1所述的电子设备，其中，
所述第一信号的总功率与所述待测信号中除了所述带陷频率之外的其它频率部分的总功率相同。
3.如附记1所述的电子设备，其中，生成所述第一信号的方法包括：
基于初始信号或已有的带陷信号生成与所述待测信号具有相同的信号概率分布的第一中间信号；
对所述第一中间信号的各频率区间的信号进行调整，生成第二中间信号，所述第二中间信号的各频率区间中的信号功率与所述待测信号的对应频率区间中的信号功率相同；以及
将所述第二中间信号的至少所述带陷频率位置的信号设定为固定值或乘以小于1的正数，从而生成本次的带陷信号，
当所述本次的带陷信号满足预设条件时，将所述本次的带陷信号作为所述第一信号。
4.如附记3所述的电子设备，其中，
当所述本次的带陷信号不满足所述预设条件时，
将所述本次的带陷信号作为所述已有的带陷信号，再次进行生成第一信号、第二信号和本次的带陷信号的处理。
5.如附记3所述的电子设备，其中，生成所述第二中间信号的方法包括：
将所述第一中间信号整个频率范围分为多个频率区间；
确定每一个频率区间中的信号的最大值，并针对所有频率区间中的信号的最大值进行排序，将第N个最大值赋值给每一个频率区间中的信号的最大值，形成最大值赋值信号，N为自然数；以及
调整所述最大值赋值信号中各频率区间内信号的功率，使该频率区间内信号的总 功率与所述待测信号对应频率区间内的信号的总功率相同，以生成所述第二中间信号。
6.如附记3所述的电子设备，其中，生成所述第二中间信号的方法包括：
将所述第一中间信号的整个频率范围分为多个频率区间；
在每一个频率区间中，随机地改变至少一个点的信号，得到随机赋值信号；以及
调整每一个频率区间内信号的功率，使该频率区间内信号的总功率与所述待测信号对应频率区间内的信号的总功率相等，以生成所述第二中间信号。
7.如附记6所述的电子设备，其中，在每一个频率区间中，随机地改变至少一个点的信号，包括：
将该频率区间中信号的最大值乘以系数后的值赋值给该频率区间中预定的频率点的信号。
8.如附记1所述的电子设备，其中，生成所述第一信号的方法包括：
对待测信号进行滤波处理，形成具有带陷频率的信号；以及
基于待测信号的信号概率分布，将所述具有带陷频率的信号依次在时域上进行拒绝采样，以生成所述第一信号。
9.一种存储介质，所述存储介质存储计算机可读程序，所述计算机可读程序使得计算机实现测量非线性器件的非线性相关参数的方法，所述方法包括：
根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及
根据将所述第一信号输入非线性器件的情况下所述非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。
10.如附记9所述的存储介质，其中，
所述第一信号的总功率与所述待测信号中除了所述带陷频率之外的其它频率部分的总功率相同。
11.如附记9所述的存储介质，其中，生成所述第一信号的方法包括：
基于初始信号或已有的带陷信号生成与所述待测信号具有相同的信号概率分布的第一中间信号；
对所述第一中间信号的各频率区间的信号进行调整，生成第二中间信号，所述第二中间信号的各频率区间中的信号功率与所述待测信号的对应频率区间中的信号功 率相同；以及
将所述第二中间信号的至少所述带陷频率位置的信号设定为固定值或乘以小于1的正数，从而生成本次的带陷信号，
当所述本次的带陷信号满足预设条件时，将所述本次的带陷信号作为所述第一信号。
12.如附记11所述的存储介质，其中，
当所述本次的带陷信号不满足所述预设条件时，
将所述本次的带陷信号作为所述已有的带陷信号，再次进行生成第一信号、第二信号和本次的带陷信号的处理。
13.如附记11所述的存储介质，其中，生成所述第二中间信号的方法包括：
将所述第一中间信号整个频率范围分为多个频率区间；
确定每一个频率区间中的信号的最大值，并针对所有频率区间中的信号的最大值进行排序，将第N个最大值赋值给每一个频率区间中的信号的最大值，形成最大值赋值信号，N为自然数；以及
调整所述最大值赋值信号中各频率区间内信号的功率，使该频率区间内信号的总功率与所述待测信号对应频率区间内的信号的总功率相同，以生成所述第二中间信号。
14.如附记11所述的存储介质，其中，生成所述第二中间信号的方法包括：
将所述第一中间信号的整个频率范围分为多个频率区间；
在每一个频率区间中，随机地改变至少一个点的信号，得到随机赋值信号；以及
调整每一个频率区间内信号的功率，使该频率区间内信号的总功率与所述待测信号对应频率区间内的信号的总功率相等，以生成所述第二中间信号。
15.如附记14所述的存储介质，其中，在每一个频率区间中，随机地改变至少一个点的信号，包括：
将该频率区间中信号的最大值乘以系数后的值赋值给该频率区间中预定的频率点的信号。
16.如附记9所述的存储介质，其中，生成所述第一信号的方法包括：
对待测信号进行滤波处理，形成具有带陷频率的信号；以及
基于待测信号的信号概率分布，将所述具有带陷频率的信号依次在时域上进行拒绝采样，以生成所述第一信号。

Claims (17)

  1. 一种测量非线性器件的非线性相关参数的装置，包括：
    第一信号生成单元，其根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及
    处理单元，其根据将所述第一信号输入非线性器件的情况下所述非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。
  2. 如权利要求1所述的装置，其中，
    所述第一信号的总功率与所述待测信号中除了所述带陷频率之外的其它频率部分的总功率相同。
  3. 如权利要求1所述的装置，其中，所述第一信号生成单元包括：
    第一中间信号生成单元，其基于初始信号或已有的带陷信号生成与所述待测信号具有相同的信号概率分布的第一中间信号；
    第二中间信号生成单元，其对所述第一中间信号的各频率区间的信号进行调整，生成第二中间信号，所述第二中间信号的各频率区间中的信号功率与所述待测信号的对应频率区间中的信号功率相同；以及
    本次的带陷信号生成单元，其将所述第二中间信号的至少所述带陷频率位置的信号设定为固定值或乘以小于1的正数，从而生成本次的带陷信号，
    当所述本次的带陷信号满足预设条件时，将所述本次的带陷信号作为所述第一信号。
  4. 如权利要求3所述的装置，其中，
    当所述本次的带陷信号不满足所述预设条件时，
    所述第一信号生成单元将所述本次的带陷信号作为所述已有的带陷信号，再次进行生成第一信号、第二信号和本次的带陷信号的处理。
  5. 如权利要求3所述的装置，其中，所述第二中间信号生成单元被配置为：
    将所述第一中间信号整个频率范围分为多个频率区间；
    确定每一个频率区间中的信号的最大值，并针对所有频率区间中的信号的最大值进行排序，将第N个最大值赋值给每一个频率区间中的信号的最大值，形成最大值赋值信号，N为自然数；以及
    调整所述最大值赋值信号中各频率区间内信号的功率，使该频率区间内信号的总 功率与所述待测信号对应频率区间内的信号的总功率相同，以生成所述第二中间信号。
  6. 如权利要求3所述的装置，其中，所述第二中间信号生成单元被配置为：
    将所述第一中间信号的整个频率范围分为多个频率区间；
    在每一个频率区间中，随机地改变至少一个点的信号，得到随机赋值信号；
    调整每一个频率区间内信号的功率，使该频率区间内信号的总功率与所述待测信号对应频率区间内的信号的总功率相等，以生成所述第二中间信号。
  7. 如权利要求6所述的装置，其中，在每一个频率区间中，随机地改变至少一个点的信号，包括：
    将该频率区间中信号的最大值乘以系数后的值赋值给该频率区间中预定的频率点的信号。
  8. 如权利要求1所述的装置，其中，所述第一信号生成单元包括：
    滤波单元，其对待测信号进行滤波处理，形成具有带陷频率的信号；
    拒绝采样单元，其基于待测信号的信号概率分布，将所述具有带陷频率的信号依次在时域上进行拒绝采样，以生成所述第一信号。
  9. 一种测量非线性器件的非线性相关参数的系统，包括权利要求1所述的测量非线性器件的非线性相关参数的装置，以及非线性器件。
  10. 一种测量非线性器件的非线性相关参数的方法，包括：
    根据待测信号生成第一信号，所述第一信号与所述待测信号具有相同的信号概率分布，并且，所述第一信号具有至少一个带陷频率；以及
    根据将所述第一信号输入非线性器件的情况下所述非线性器件的输出信号计算所述非线性器件在传输所述待测信号时的非线性相关参数。
  11. 如权利要求10所述的方法，其中，
    所述第一信号的总功率与所述待测信号中除了所述带陷频率之外的其它频率部分的总功率相同。
  12. 如权利要求10所述的方法，其中，生成所述第一信号的方法包括：
    基于初始信号或已有的带陷信号生成与所述待测信号具有相同的信号概率分布的第一中间信号；
    对所述第一中间信号的各频率区间的信号进行调整，生成第二中间信号，所述第二中间信号的各频率区间中的信号功率与所述待测信号的对应频率区间中的信号功 率相同；以及
    将所述第二中间信号的至少所述带陷频率位置的信号设定为固定值或乘以小于1的正数，从而生成本次的带陷信号，
    当所述本次的带陷信号满足预设条件时，将所述本次的带陷信号作为所述第一信号。
  13. 如权利要求12所述的方法，其中，
    当所述本次的带陷信号不满足所述预设条件时，
    将所述本次的带陷信号作为所述已有的带陷信号，再次进行生成第一信号、第二信号和本次的带陷信号的处理。
  14. 如权利要求12所述的方法，其中，生成所述第二中间信号的方法包括：
    将所述第一中间信号整个频率范围分为多个频率区间；
    确定每一个频率区间中的信号的最大值，并针对所有频率区间中的信号的最大值进行排序，将第N个最大值赋值给每一个频率区间中的信号的最大值，形成最大值赋值信号，N为自然数；以及
    调整所述最大值赋值信号中各频率区间内信号的功率，使该频率区间内信号的总功率与所述待测信号对应频率区间内的信号的总功率相同，以生成所述第二中间信号。
  15. 如权利要求12所述的方法，其中，生成所述第二中间信号的方法包括：
    将所述第一中间信号的整个频率范围分为多个频率区间；
    在每一个频率区间中，随机地改变至少一个点的信号，得到随机赋值信号；以及
    调整每一个频率区间内信号的功率，使该频率区间内信号的总功率与所述待测信号对应频率区间内的信号的总功率相等，以生成所述第二中间信号。
  16. 如权利要求15所述的方法，其中，在每一个频率区间中，随机地改变至少一个点的信号，包括：
    将该频率区间中信号的最大值乘以系数后的值赋值给该频率区间中预定的频率点的信号。
  17. 如权利要求10所述的方法，其中，生成所述第一信号的方法包括：
    对待测信号进行滤波处理，形成具有带陷频率的信号；以及
    基于待测信号的信号概率分布，将所述具有带陷频率的信号依次在时域上进行拒绝采样，以生成所述第一信号。
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