WO2022082985A1 - 一种多线扫描距离测量系统 - Google Patents

一种多线扫描距离测量系统 Download PDF

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Publication number
WO2022082985A1
WO2022082985A1 PCT/CN2020/138388 CN2020138388W WO2022082985A1 WO 2022082985 A1 WO2022082985 A1 WO 2022082985A1 CN 2020138388 W CN2020138388 W CN 2020138388W WO 2022082985 A1 WO2022082985 A1 WO 2022082985A1
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Prior art keywords
collector
pixels
transmitter
distance measurement
measurement system
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PCT/CN2020/138388
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English (en)
French (fr)
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刘超
闫敏
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深圳奥锐达科技有限公司
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Publication of WO2022082985A1 publication Critical patent/WO2022082985A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/484—Transmitters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/4861—Circuits for detection, sampling, integration or read-out
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/4865—Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak

Definitions

  • the invention relates to the technical field of distance measurement, in particular to a multi-line scanning distance measurement system.
  • the time of flight principle can be used to measure the distance of the target to obtain a depth image containing the depth value of the target, and the distance measurement system based on the time of flight principle has been widely used in consumer electronics, unmanned aerial vehicles, AR/VR and other fields.
  • the distance measurement system based on the time-of-flight principle usually includes an emitter and a collector. The emitter is used to emit a pulsed beam to illuminate the target field of view, and the collector is used to collect the reflected beam, and the time required for the beam to be reflected and received is calculated to calculate the distance of the object. .
  • the lidar based on the time-of-flight method is mainly divided into mechanical and non-mechanical.
  • the mechanical type realizes the distance measurement of a large 360-degree field of view by rotating the base. Its advantages are concentrated beam intensity, large measurement range and high precision.
  • Mechanical lidar can be single-line lidar and multi-line lidar. Among them, single-line lidar has only one transmitter and collector, and the scanning range is limited. Therefore, multi-line lidar is proposed, but multi-line lidar is used in the system. Strict alignment is required during assembly and adjustment, which is the main reason why the current multi-line lidar design process is difficult, expensive, and difficult to mass-produce.
  • the main purpose of the present invention is to propose a multi-line scanning distance measurement system, so as to solve the problem that the existing multi-line laser radar in the prior art needs to be strictly aligned when the system is installed and adjusted, which leads to the difficulty of the current multi-line laser radar design process and high cost. , technical problems difficult to mass production.
  • the present invention adopts the following technical solutions:
  • a multi-line scanning distance measurement system comprising: a transmitter, including a column light source composed of a plurality of light sources, for emitting pulsed beams to a target object; a collector, including a plurality of sampling areas with the same number as the light sources, each Each of the sampling regions includes a pixel array composed of a plurality of pixels and a plurality of control circuits, and the control circuits are connected to the pixels in a one-to-one correspondence to individually control the operation modes of the pixels; the plurality of sampling regions associated with the column of light sources, and only a subset of the pixels within the sampling area are activated for collecting the reflected pulsed light beam; a rotating assembly, connected to the emitter and the collector, for controlling The transmitter and the collector rotate synchronously to complete the 360-degree scanning of the target object to form a plurality of scanning lines in the target field of view; a processing circuit, connected with the transmitter and the collector, uses In order to synchronize the trigger signals of the transmitter and the collector, and process the photon signal of the
  • the column of light sources includes a plurality of the light sources arranged at intervals in the vertical direction.
  • the transmitter further includes an emission optical component for receiving and shaping the pulsed light beam emitted by the light source, and projecting the shaped light beam to the target object.
  • an emission optical component for receiving and shaping the pulsed light beam emitted by the light source, and projecting the shaped light beam to the target object.
  • the collector includes a receiving optical assembly and the receiving optical assembly and the transmitting optical assembly are configured to include the same telecentric lens.
  • the collector further includes a plurality of readout circuits connected to the plurality of sampling areas in a one-to-one correspondence, for recording the flight time of photons from emission to being collected and outputting a photon time signal, and using the photon time signal Build a histogram.
  • the readout circuit includes a TDC circuit and a histogram memory, and all pixels in the sampling area share one TDC circuit; or, the readout circuit includes a TDC circuit array and a histogram memory, the The number of TDC circuits in the TDC circuit array is the same as the number of the pixels in the sampling area, and each of the pixels is connected to the TDC circuits in a one-to-one correspondence.
  • the size of the sampling area is determined according to the offset caused by the system tolerance.
  • the position of the pixel in the active state in the sampling area is determined by means of pre-calibration.
  • the subset of pixels is configured to be a sensing area comprising at least two of said pixels.
  • the transmitter and the collector are attached to the rotating assembly, and the rotating assembly controls the transmitter and the collector to rotate synchronously in a horizontal direction around the same rotation axis.
  • the beneficial effect of the present invention is that: by designing the sampling area, it is no longer necessary to strictly align the light source and the pixel one by one during the adjustment process, and it is only necessary to determine the imaging position of the reflected light beam during the calibration process, and perform distance measurement.
  • this can greatly reduce the difficulty of using the ranging system, improve the ranging accuracy, and avoid the degradation of ranging accuracy caused by difficult alignment.
  • a subset of pixels in the active state in the sampling area is determined as the sensing area by pre-calibration.
  • the control circuit controls all pixels in the sampling area to be activated, traversing all pixels.
  • the pixels with the strongest signal strength are determined as a subset of the pixels to be activated for collecting reflected light beams in the ranging process, while the remaining pixels are in an off state, so that the ranging accuracy can be improved.
  • FIG. 1 is a system block diagram of a multi-line scanning distance measurement system according to an embodiment of the present invention
  • FIG. 2 is a system block diagram of a multi-line scanning distance measurement system according to another embodiment of the present invention.
  • FIG. 3 is a schematic block diagram of a collector according to an embodiment of the present invention.
  • first and second are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implying the number of indicated technical features. Thus, a feature defined as “first”, “second” may expressly or implicitly include one or more of that feature. In the description of the embodiments of the present invention, “plurality” means two or more, unless otherwise expressly and specifically defined.
  • FIG. 1 is a system block diagram of a multi-line scanning distance measurement system according to an embodiment of the present invention.
  • the distance measurement system 10 includes a transmitter 11 , a collector 12 , a rotating component 13 and a processing circuit 14 .
  • the transmitter 11 is used for emitting a pulsed beam to the target area, the pulsed beam is emitted into the space of the target area to illuminate the target object in the space, and the pulsed beam reflected by the target is received by the collector 12 .
  • the rotation component 13 is used to control the transmitter 11 and the collector 12 to rotate synchronously around the rotation axis y in the horizontal direction to complete a 360-degree scan of the target field of view, so as to form multiple scan lines in the target field of view.
  • the transmitter 11 and the collector 12 are attached to the rotating assembly 13, and can be arranged on the same substrate or on different substrates.
  • the processing circuit 14 is connected with the transmitter 11 and the collector 12, and is used for synchronizing the trigger signals of the transmitter 11 and the collector 12 to calculate the flight time required by the pulse beam from being transmitted to being received by the collector 12, so as to calculate the distance information of the target .
  • the distance D of the corresponding point on the target object can be calculated by the following formula (1):
  • the transmitter 11 includes a driver 111 , a light source 112 , an emission optical component 113 and the like.
  • the driver 111 is used to control the light source 112 to emit pulsed light beams at certain time intervals.
  • the light source 112 may be a single light source, or may be a one-dimensional light source array composed of multiple light sources.
  • the light source may be a light emitting diode (LED), a laser diode (LD), an edge emitting laser (EEL), a vertical cavity surface emitting laser (VCSEL), or the like.
  • the light source 112 is configured as a one-dimensional column of light sources that are arranged in a vertical direction (rotation axis y direction) by a plurality of light sources at a certain interval, and each light source emits n pulsed light beams under the control of the driver 111 As the rotating component 13 controls the transmitter 11 to rotate 360 degrees in the horizontal direction around the rotation axis y, a plurality of scanning lines are finally formed in the target field of view.
  • the number of light sources in the column light source can determine the range measurement system Resolution in the vertical direction. It will be appreciated that a part of the processing circuit 14 or a sub-circuit existing independently of the processing circuit 14 may also be utilized to control the light source 112 to emit light beams.
  • the emission optical component 113 receives the light beam emitted from the light source 112 and shapes it to project it to the target area.
  • the transmitting optical component 113 receives the pulsed light beam from the light source 112, performs optical modulation on the pulsed light beam, such as modulation of diffraction, refraction, reflection, etc., and then emits the modulated light beam into space, such as a focused beam, Flood beams, structured light beams, etc.
  • the emission optical component 113 may be one or more combinations of lenses, liquid crystal elements, diffractive optical elements, microlens arrays, metasurface optical elements, masks, mirrors, MEMS galvanometers, and the like.
  • the collector 12 includes a pixel array 122 and a receiving optical component 123, and the receiving optical component 123 is used to receive at least part of the light beam reflected back by the target and guide it to the pixel array 122 to form an imaging spot.
  • the arrangement of the pixel array 122 is associated with the light source array 112, that is, each light source corresponds to each pixel one-to-one, and the light beam emitted by the light source irradiates a certain point of the target object and is reflected back to the corresponding pixel.
  • the pixel can be a single photon sensing device such as APD (Avalanche Photodiode), SPAD (Single Photon Avalanche Diode), SiPM (Silicon Photomultiplier), and each pixel can respond to an incident single photon and output it A photon signal indicating the corresponding arrival time of the received photons at each pixel is used such as time-correlated single photon counting (TCSPC) to achieve the acquisition of weak light signals and the calculation of time-of-flight.
  • APD Anavalanche Photodiode
  • SPAD Single Photon Avalanche Diode
  • SiPM Silicon Photomultiplier
  • the receiving optical component 123 further includes an aperture set on the focal plane of the lens, which is used to limit the interference of ambient light and adjust the light intensity of the reflected pulse beam to evenly distribute on the pixels
  • the pixels may be SiPM, SiPM integrates more single-photon response elements and has a larger size.
  • an internal light-reflecting channel can be set between the small hole and the pixel, and the light beam passing through the small hole is reflected by the internal light-reflecting channel for multiple times and then exits the pixel to form a square light spot with approximately the same size as the pixel. All response elements.
  • a readout circuit 121 composed of one or more of a signal amplifier, a time-to-digital converter (TDC), a digital-to-analog converter (ADC) and other devices is also connected to the pixel array 122 . These circuits can either be integrated with the pixel or be part of the processing circuit 14 .
  • the readout circuit 121 includes a TDC circuit and a histogram memory, the TDC circuit is used to record the time of flight of photons from emission to being collected and output a photon time signal, and use the photon time signal to access the histogram memory, multiple times The measurements are input into the histogram memory to construct the histogram.
  • the processing circuit 14 synchronizes the trigger signals of the transmitter 11 and the collector 12, processes the photon signal of the pixel collected beam, and calculates the distance information of the target object based on the flight time of the reflected beam.
  • the processing circuit 14 processes the histogram using algorithms such as peak matching and filter detection to identify the time-of-flight of the reflected beam from emission to reception.
  • the processing circuit 14 may be an independent dedicated circuit, such as a dedicated SOC chip, an FPGA chip, an ASIC chip, etc., or may include a general-purpose processing circuit.
  • each light source since the arrangement of the pixel array is associated with the column light source, that is, each light source corresponds to the pixel one-to-one, during system assembly, each light source needs to be strictly aligned with the corresponding sensing area, that is, the light spot. Incident at the center of the sensing area increases the difficulty of the assembly process, and the spot shift caused by temperature and oscillation during the system ranging process reduces the ranging accuracy, which affects the service life of the ranging system.
  • the distance measurement system 20 includes a transmitter 21 , a collector 22 , a rotating component 13 and a processing circuit 14 .
  • the transmitter 21 includes a first column of light sources formed by a plurality of light sources arranged at intervals in the vertical direction, for emitting pulsed light beams toward the target object, preferably the light source is a VCSEL light source;
  • the collector 22 includes a plurality of sampling areas, Each sampling area includes a pixel array composed of a plurality of pixels and a plurality of control circuits, each control circuit is associated with a pixel and independently controls the operation mode of the corresponding pixel (activation or shutdown of the pixel); the sampling area is related to the column light source Each sampling area is associated with a corresponding light source, and only a subset of the pixels within the sampling area are activated to collect reflected pulsed beams and generate photon signals; rotating assembly 13 is used to control emitter 21 and collector 22 Rot
  • the number of light sources of the transmitter 21 determines the scanning resolution.
  • the transmitter 21 further includes a second column of light sources composed of a plurality of light sources, and the second column of light sources and the first column of light sources are staggered in the vertical direction. Further, it can also include a third column of light sources, a fourth column of light sources, etc. All the column light sources are staggered in the vertical direction to ensure that the scanning lines formed by the light beams emitted by all the light sources in the target field of view do not overlap, due to the sampling area.
  • the setting of the column light source is associated with the column light source, and the sampling area is set correspondingly according to the setting of the column light source, including adding the same number of sampling areas and staggered arrangement of the sampling areas.
  • FIG. 3 is a schematic diagram of the collector of the distance measurement system shown in FIG. 2 .
  • the collector 22 includes a plurality of sampling areas.
  • FIG. 3 only schematically shows one sampling area 221 in the collector 22 and Its readout circuit 313, the sampling area 221 includes a pixel array composed of a plurality of pixels 311 and a plurality of control circuits 312 with the same number as the pixels 311, each control circuit 312 is associated with each pixel 311, and is used to independently control and The working mode of the corresponding pixel connected to it, that is, the control pixel is in the active or off state.
  • the readout circuit 313 is associated with the sampling area 221 and is used for processing the photon signals output by the sampling area.
  • the readout circuit 313 includes a TDC circuit 314 and a histogram memory 315 .
  • the readout circuit 313 may include a TDC circuit and a histogram memory, and all the pixels in the sampling area 221 share one TDC circuit.
  • the readout circuit 313 may include a TDC circuit array and a histogram memory, wherein the number of TDC circuits is the same as the number of pixels in the sampling area 221, and each pixel is connected to the TDC circuit in a one-to-one correspondence, and each Each TDC circuit receives the photon signal from the pixel and outputs the photon time signal, and all the photon time signals are distributed in the same histogram memory.
  • the column light source includes two light sources 211 and 212. Since the sampling area is associated with the column light source, preferably, the number of light sources and the sampling area are the same and correspond one-to-one, that is, the collector includes two Sampling areas 221, 222. Based on the multi-line scanning distance measurement system involved in the prior art, it is assumed that 4 pixels are used as a sensing area for receiving the reflected light beam, and the process design of strict alignment needs to be considered, the light beam emitted by the light source 211 needs to be incident on the An imaging light spot 225 is formed in the sampling area 221 .
  • a plurality of pixels more than the sensing area are designed to form the sampling area 221 for receiving the light beams emitted by the light source 211 and reflected back by the target.
  • the size of the sampling area is determined according to the offset caused by the system tolerance. In other words, add the side length of the sensing area to the offset as the size of the sampling area. For example, as shown in Figure 2, the sensing area is 2 ⁇ 2mm, including 4 pixels, and the offset caused by the system tolerance is about 4mm. Then the size of the sampling area can be designed to be 10 ⁇ 10mm, including 100 pixels. It can be understood that the above data are only illustrative, and do not specifically limit the present invention.
  • the system no longer needs to strictly align the light source and the sensing area one by one during the installation and adjustment process. It only needs to determine the imaging position of the reflected beam during the calibration process, and only the sampling area is required for distance measurement.
  • a subset of the pixels within are activated to collect the reflected light beam and generate a photonic signal.
  • a subset of pixels in the active state in the sampling area is determined by pre-calibration as the sensing area. For example, you can select an indoor with small ambient light for calibration, and the control circuit controls all pixels in the sampling area to be activated, and traverse all the pixels.
  • the pixels with the strongest signal strength are determined as a subset of the pixels to be activated for collecting the reflected beam during ranging, while the remaining pixels are turned off.
  • the pixel position corresponding to the light spot 224 formed by the reflected light beam incident on the sampling area during the ranging process can be determined. Strict alignment can effectively reduce the design difficulty of the system.
  • the incident position of the light spot can be tracked in real time during the ranging process.
  • the position of the sensing area corresponding to the light spot is re-calibrated at regular intervals, which is beneficial to improve the accuracy of ranging.
  • the control circuit controls the pixels in the sensing area to activate and collect the reflected beam.
  • the transmitter 21 further includes a transmitting optical component
  • the collector 22 further includes a receiving optical component.
  • the transmitting optical component and the receiving optical component include the same telecentric lens.
  • the light beam emitted by the VCSEL column light source can be projected with a large field of view after passing through the telecentric lens, and the light beam projected by each light source can be collimated.
  • the receiving optical component uses the same telecentric lens to realize the conjugate relationship between the center of the transmitter and the center of the receiver, which reduces the offset error of the light spot.

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Abstract

一种多线扫描距离测量系统（10），该系统包括：发射器（11、21），包括由多个光源（112、211、212）组成的列光源，用于向目标发射脉冲光束；采集器（12、22），包括多个采样区域（221），每个采样区域（221）均包括由多个像素（311）组成的像素阵列及多个控制电路（312），控制电路（312）一一对应地连接于像素（311）以单独控制像素（311）的工作模式；多个采样区域（221）与列光源相关联，并且仅采样区域（221）内的像素（311）的子集被激活用于采集反射的脉冲光束；旋转组件（13），用于控制发射器（11、21）和采集器（12、22）同步旋转以完成对目标的360度扫描以在目标视场中形成多条扫描线；处理电路（14），与发射器（11、21）和采集器（12、22）连接，用于同步发射器（11、21）和采集器（12、22）的触发信号，并对像素（311）采集光束的光子信号进行处理，基于脉冲光束从发射到被采集器（12、22）接收的飞行时间计算出目标的距离信息。

Description

一种多线扫描距离测量系统 技术领域
本发明涉及测距技术领域，具体涉及一种多线扫描距离测量系统。
背景技术
利用飞行时间原理(TOF，Time of Flight)可以对目标进行距离测量以获取包含目标的深度值的深度图像，而基于飞行时间原理的距离测量系统已被广泛应用于消费电子、无人架驶、AR/VR等领域。基于飞行时间原理的距离测量系统通常包括发射器和采集器，利用发射器发射脉冲光束照射目标视场并利用采集器采集反射光束，计算光束由发射到反射接收所需要的时间来计算物体的距离。
目前基于飞行时间法的激光雷达主要分为机械式与非机械式，机械式通过旋转基座来实现360度大视场的距离测量，其优点是光束强度集中、测量范围大、精度高。机械式激光雷达可以是单线激光雷达和多线激光雷达，其中，单线激光雷达是只有一个发射器和采集器，扫描范围受限，由此提出了多线激光雷达，但多线激光雷达在系统装调时需要严格对准，导致目前多线激光雷达设计工艺困难、造价高昂、难以量产的主要原因。
发明内容
本发明的主要目的在于提出一种多线扫描距离测量系统，以解决现有技术所存在的多线激光雷达在系统装调时需要严格对准，导致目前多线激光雷达设计工艺困难、造价高昂、难以量产的技术问题。
为了解决上述技术问题，本发明采用以下技术方案：
一种多线扫描距离测量系统，包括：发射器，包括由多个光源组成的列光源，用于向目标物体发射脉冲光束；采集器，包括与所述光源数量相同的多个采样区域，每个所述采样区域均包括由多个像素组成的像素阵列以及多个控制电路，所述控制电路一一对应地连接于所述像素以单独控制所述像素的工作模式；所述多个采样区域与所述列光源相关联，并且仅所述采样区域内的像素的子集被激活用于采集反射的所述脉冲光束；旋转组件，与所述发射器和所述采集器连接，用于 控制所述发射器和所述采集器同步旋转以完成对所述目标物体的360度扫描以在目标视场中形成多条扫描线；处理电路，与所述发射器和所述采集器连接，用于同步所述发射器和所述采集器的触发信号，并对所述像素采集光束的光子信号进行处理，基于所述脉冲光束从发射到被所述采集器接收的飞行时间计算出所述目标物体的距离信息。
优选地，所述列光源包括多个在垂直方向上间隔排列的所述光源。
优选地，所述发射器还包括发射光学组件，用于接收所述光源发出的脉冲光束并进行整形，以及将整形后的光束投向所述目标物体。
优选地，所述采集器包括接收光学组件，所述接收光学组件和所述发射光学组件被配置为包括相同的远心透镜。
优选地，所述采集器还包括与所述多个采样区域一一对应连接的多个读出电路，用于记录光子从发射到被采集的飞行时间并输出光子时间信号，并利用光子时间信号构建直方图。
优选地，所述读出电路包括一个TDC电路和直方图存储器，所述采样区域内的全部像素共享一个所述TDC电路；或者，所述读出电路包括TDC电路阵列和直方图存储器，所述TDC电路阵列中TDC电路的数量与所述采样区域内的所述像素的数量相同，每个所述像素与所述TDC电路一一对应连接。
优选地，所述采样区域的大小根据系统公差引起的偏移量决定。
优选地，通过预先标定的方式确定所述采样区域内处于激活状态的所述像素的位置。
优选地，所述像素的子集被配置为是一个感测区域，所述感测区域包括至少两个所述像素。
优选地，所述发射器和所述采集器附接在所述旋转组件上，所述旋转组件控制所述发射器和所述采集器围绕同一旋转轴沿水平方向同步旋转。
本发明的有益效果在于：通过设计采样区域，则在装调过程中不再需要严格进行光源与像素的一一对准，只需在标定过程中确定反射光束的成像位置即可，进行距离测量时仅采样区域内的像素的子集被激活用于采集反射的光束并生成光子信号，这样可以大大降低测距系统的使用难度、提高测距精度，避免因为难以对准导致的测距精度下降的问题。另外，通过预先标定的方式确定采样区域中 处于激活状态的像素的子集作为感测区域，比如可以选择环境光较小的室内进行标定，控制电路控制采样区域内全部像素均激活，遍历全部像素确定信号强度最强的像素作为待激活的像素的子集以用于在测距过程中采集反射光束，而其余像素处于关闭状态，从而可以提高测距精度。
附图说明
图1是本发明一实施例的多线扫描距离测量系统的系统框图；
图2是本发明另一实施例的多线扫描距离测量系统的系统框图；
图3是本发明实施例的采集器的原理框图。
具体实施方式
为了使本发明实施例所要解决的技术问题、技术方案及有益效果更加清楚明白，以下结合附图及实施例，对本发明进行进一步详细说明。应当理解，此处所描述的具体实施例仅仅用以解释本发明，并不用于限定本发明。
需要说明的是术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多该特征。在本发明实施例的描述中，“多个”的含义是两个或两个以上，除非另有明确具体的限定。
图1所示为本发明一实施例的多线扫描距离测量系统的系统框图，该距离测量系统10包括发射器11、采集器12、旋转组件13以及处理电路14。其中，发射器11用于向目标区域发射脉冲光束，该脉冲光束发射至目标区域空间中以照明空间中的目标物体，而被目标所反射的脉冲光束被采集器12接收。旋转组件13用于控制发射器11和采集器12同步围绕旋转轴y沿水平方向旋转完成对目标视场的360度扫描，以在目标视场中形成多条扫描线。其中，发射器11和采集器12附接在旋转组件13上，可以设置于同一块基底上也可以设置在不同的基底上。处理电路14与发射器11以及采集器12连接，用于同步发射器11与采集器12的触发信号以计算脉冲光束从发射到被采集器12接收所需要的飞行时间，从而计算目标的距离信息。
具体而言，目标物体上对应点的距离D可由下式(1)计算出：
D＝c·t/2          (1)
其中，c为光速，t为所述飞行时间。
继续参考图1，发射器11包括驱动器111、光源112以及发射光学组件113等。其中，驱动器111用于控制光源112以一定的时间间隔向外发射脉冲光束。光源112可以是单个光源，也可以是由多个光源组成的一维光源阵列。光源可以是发光二极管(LED)、激光二极管(LD)、边发射激光器(EEL)、垂直腔面发射激光器(VCSEL)等。在一个实施例中，光源112被配置为是由多个光源以一定间隔沿垂直方向(旋转轴y方向)排列的一维列光源，在驱动器111的控制下每个光源发射包括n个脉冲光束的脉冲子集，随着旋转组件13控制发射器11绕旋转轴y进行水平方向的360度旋转，最终在目标视场中形成多条扫描线，列光源中光源的数量可决定测距系统在垂直方向上的分辨率。可以理解的是，还可以利用处理电路14中的一部分或者独立于处理电路14存在的子电路来控制光源112发射光束。
发射光学组件113接收来自光源112发射的光束并整形后投射到目标区域。在一个实施例中，发射光学组件113接收来自光源112的脉冲光束，并将脉冲光束进行光学调制，比如衍射、折射、反射等调制，随后向空间中发射被调制后的光束，比如聚焦光束、泛光光束、结构光光束等。发射光学组件113可以是透镜、液晶元件、衍射光学元件、微透镜阵列、超表面(Metasurface)光学元件、掩膜板、反射镜、MEMS振镜等形式中的一种或多种组合。
继续参考图1，采集器12包括像素阵列122和接收光学组件123，接收光学组件123用于接收由目标反射回的至少部分光束并引导到像素阵列122上形成成像光斑。像素阵列122的设置与光源阵列112相关联，即每个光源和每个像素一一对应，光源发射的光束照射到目标物体某一点后反射回对应的像素中，一般地，为了尽可能多地接收反射光束中的光信号，通常将单个光斑的大小设置成对应一个包括多个像素的感测区域，比如对应2×2＝4个像素，则每个光源与每个感测区域相关联。其中，所述像素可以是APD(雪崩式光电二极管)、SPAD(单光子雪崩二极管)、SiPM(硅光电倍增管)等单光子感测器件，每个像素可以对入射的单个光子进行响应并输出指示所接收光子在每个像素处相应到达时间的光子信号，利用诸如时间相关单光子计数法(TCSPC)实现对微弱光信号的采集 以及飞行时间的计算。
在一个实施例中，接收光学组件123还包括设置在透镜焦面上的孔径，用于限制环境光的干扰并调整反射脉冲光束的光强度均匀分布在像素上，比如所述像素可以是SiPM，SiPM集成了较多的单光子响应元件，具有较大的尺寸。更进一步的，可以在小孔与像素之间设置内反光通道，通过小孔的光束经过内反光通道的多次反射后出射到像素中可以形成一个与像素尺寸近似相同的方形光斑，充分利用发挥所有的响应元件。
一般地，与像素阵列122连接的还包括信号放大器、时数转换器(TDC)、数模转换器(ADC)等器件中的一种或多种组成的读出电路121。这些电路既可以与像素整合在一起，也可以作为处理电路14的一部分。在一个实施例中，读出电路121包括TDC电路和直方图存储器，TDC电路用于记录光子从发射到被采集的飞行时间并输出光子时间信号，并利用光子时间信号访问直方图存储器，多次测量输入到直方图存储器中构建直方图。
处理电路14同步发射器11与采集器12的触发信号，对像素采集光束的光子信号进行处理，并基于反射光束的飞行时间计算出目标物体的距离信息。在一个实施例中，处理电路14利用峰值匹配和滤波检测等算法对直方图进行处理识别出反射光束从发射到接收的飞行时间。可以理解的是，处理电路14可以是独立的专用电路，比如专用SOC芯片、FPGA芯片、ASIC芯片等等，也可以包含通用处理电路。
前述的测距系统，由于像素阵列的设置与列光源相关联，即每个光源与像素一一对应，因此在进行系统组装时，需要每个光源与对应的感测区域严格对准，即光斑入射到感测区域的中心位置处，导致装配工艺难度增加，而且在系统测距过程中由于温度、振荡等引起的光斑偏移导致测距精度降低，影响了测距系统的使用寿命。
图2所示是本发明实施例的一种多线扫描距离测量系统的系统框图，该距离测量系统20包括发射器21、采集器22、旋转组件13和处理电路14。其中，发射器21包括由多个光源在垂直方向间隔排列而成的第一列光源，用于朝向目标物体发射脉冲光束，优选地所述光源是VCSEL光源；采集器22包括多个采样区域，各采样区域均包括由多个像素组成的像素阵列以及多个控制电路，每个控 制电路与一个像素相关联并独立控制对应像素的工作模式(像素的激活或关闭)；采样区域与列光源相关联，每个采样区域关联于一个相应的光源，并且仅采样区域内的像素的子集被激活用于采集反射的脉冲光束并生成光子信号；旋转组件13用于控制发射器21和采集器22沿水平方向旋转，其作用与前述实施例的测距系统相同；处理电路14与发射器21和采集器22连接，用于计算目标的距离信息，具体的计算过程同于前述实施例的测距系统，在此不再赘述。
发射器21的光源数量决定了扫描分辨率。在一个实施例中，发射器21还包括由多个光源组成的第二列光源，且第二列光源与第一列光源在垂直方向上交错排列。更进一步的还可以包括第三列光源、第四列光源等等，全部的列光源在垂直方向上交错排列以保证全部光源发出的光束在目标视场中形成的扫描线不重合，由于采样区域的设置与列光源相关联，则采样区域根据列光源的设置做对应的设置，包括增设相同数量的采样区域并且采样区域交错排列。
如图3是图2所示的距离测量系统的采集器示意图，需要说明的是，采集器22包括多个采样区域，图3仅示意性地示出了采集器22内的一个采样区域221及其读出电路313，采样区域221包括由多个像素311组成的像素阵列以及与像素311数量相同的多个控制电路312，每个控制电路312与每个像素311相关联，并用于独立控制与之连接的对应像素的工作模式，即控制像素处于激活或者关闭状态。读出电路313与采样区域221相关联，用于对采样区域输出的光子信号进行处理，读出电路313包括TDC电路314和直方图存储器315。读出电路313可以包括一个TDC电路和一个直方图存储器，采样区域221内的全部像素共享一个TDC电路。在另一种实施例中，读出电路313可以包括TDC电路阵列和一个直方图存储器，其中TDC电路的数量与采样区域221内像素的数量相同，每个像素与TDC电路一一对应连接，每个TDC电路从像素接收光子信号并输出光子时间信号，全部的光子时间信号分配在同一个直方图存储器内。
如图2所示的实施例，假设列光源包括两个光源211、212，由于采样区域与列光源相关联，优选地，光源与采样区域的数量相同且一一对应，即采集器包括两个采样区域221、222。基于现有技术中涉及的多线扫描距离测量系统，假设采用4个像素作为一个感测区域用于接收反射光束，并需要考虑严格对准的工艺设计，则对于光源211发射的光束需要入射到采样区域221中形成成像光斑225。而在本实施例中，设计多于感测区域的多个像素构成采样区域221用于接 收光源211发射后被目标反射回的光束，采样区域的大小根据系统公差引起的偏移量决定，具体而言，将感测区域边长加上偏移量后作为采样区域的尺寸，比如图2所示，感测区域为2×2mm，包括4个像素，系统公差引起的偏移量约4mm，则可以设计采样区域的尺寸为10×10mm，包括100个像素。可以理解的是，以上数据只做示意性说明，并不对本发明做具体的限制。
通过设计采样区域，则系统在装调过程中不再需要严格进行光源和感测区域的一一对准，只需在标定过程中确定反射光束的成像位置即可，进行距离测量时仅采样区域内的像素的子集被激活用于采集反射的光束并生成光子信号。其中，通过预先标定的方式确定采样区域中处于激活状态的像素的子集作为感测区域，比如可以选择环境光较小的室内进行标定，控制电路控制采样区域内全部像素均激活，遍历全部像素确定信号强度最强的像素作为待激活的像素的子集以用于在测距过程中采集反射光束，而其余像素处于关闭状态。如图2所示，根据预先标定的结果可以确定在测距过程中反射光束入射到采样区域中形成光斑224对应的像素位置，该位置既不一定属于采样区域的中心位置也不需要和光源221进行严格对准，可以有效的降低系统的设计难度。
更进一步的，考虑到测距过程中由于器件的温度变化、机械振荡等影响因素会导致光斑发射偏移，因此在本实施例中，可以在在测距过程中实时跟踪光斑的入射位置。比如在测距过程中，每隔一段时间重新标定一次光斑对应的感测区域位置，有利于提升测距的精确度。比如，间隔一段时间后重新标定确定此时反射光束入射到采样区域形成光斑223，则将光斑223对应的像素区域作为感测区域，控制电路控制感测区域内的像素激活采集反射光束。
其中，发射器21中还包括发射光学组件、采集器22中还包括接收光学组件，优选地，设置发射光学组件和接收光学组件包括相同的远心透镜。则VCSEL列光源发射出的光束经过远心透镜后可实现大视场角的投射同时可对每个光源投射的光束进行准直。而接收光学组件采用同样的远心透镜实现了发射器中心和接收器中心的共轭关系，降低了光斑的偏移误差。
以上内容是结合具体的优选实施方式对本发明所作的进一步详细说明，不能认定本发明的具体实施只局限于这些说明。对于本发明所属技术领域的技术人员来说，在不脱离本发明构思的前提下，还可以做出若干等同替代或明显变型，而且性能或用途相同，都应当视为属于本发明的保护范围。

Claims (10)

  1. 一种多线扫描距离测量系统，其特征在于，包括：
    发射器，包括由多个光源组成的列光源，用于向目标物体发射脉冲光束；
    采集器，包括与所述光源数量相同的多个采样区域，每个所述采样区域均包括由多个像素组成的像素阵列以及多个控制电路，所述控制电路一一对应地连接于所述像素以单独控制所述像素的工作模式；所述多个采样区域与所述列光源相关联，并且仅所述采样区域内的像素的子集被激活用于采集反射的所述脉冲光束；
    旋转组件，与所述发射器和所述采集器连接，用于控制所述发射器和所述采集器同步旋转以完成对所述目标物体的360度扫描以在目标视场中形成多条扫描线；
    处理电路，与所述发射器和所述采集器连接，用于同步所述发射器和所述采集器的触发信号，并对所述像素采集光束的光子信号进行处理，基于所述脉冲光束从发射到被所述采集器接收的飞行时间计算出所述目标物体的距离信息。
  2. 如权利要求1所述的多线扫描距离测量系统，其特征在于，所述列光源包括多个在垂直方向上间隔排列的所述光源。
  3. 如权利要求1所述的多线扫描距离测量系统，其特征在于，所述发射器还包括发射光学组件，用于接收所述光源发出的脉冲光束并进行整形，以及将整形后的光束投向所述目标物体。
  4. 如权利要求3所述的多线扫描距离测量系统，其特征在于，所述采集器包括接收光学组件，所述接收光学组件和所述发射光学组件被配置为包括相同的远心透镜。
  5. 如权利要求1所述的多线扫描距离测量系统，其特征在于，所述采集器还包括与所述多个采样区域一一对应连接的多个读出电路，用于记录光子从发射到被采集的飞行时间并输出光子时间信号，并利用光子时间信号构建直方图。
  6. 如权利要求5所述的多线扫描距离测量系统，其特征在于，所述读出电路包括一个TDC电路和直方图存储器，所述采样区域内的全部像素共享一个所述TDC电路；
    或者，所述读出电路包括TDC电路阵列和直方图存储器，所述TDC电路阵列中TDC电路的数量与所述采样区域内的所述像素的数量相同，每个所述像素 与所述TDC电路一一对应连接。
  7. 如权利要求1所述的多线扫描距离测量系统，其特征在于，所述采样区域的大小根据系统公差引起的偏移量决定。
  8. 如权利要求1所述的多线扫描距离测量系统，其特征在于，通过预先标定的方式确定所述采样区域内处于激活状态的所述像素的位置。
  9. 如权利要求1所述的多线扫描距离测量系统，其特征在于，所述像素的子集被配置为是一个感测区域，所述感测区域包括至少两个所述像素。
  10. 如权利要求1所述的多线扫描距离测量系统，其特征在于，所述发射器和所述采集器附接在所述旋转组件上，所述旋转组件控制所述发射器和所述采集器围绕同一旋转轴沿水平方向同步旋转。
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