WO2022069191A1 - Connexion pour une combinaison de sondes de champ - Google Patents

Connexion pour une combinaison de sondes de champ Download PDF

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Publication number
WO2022069191A1
WO2022069191A1 PCT/EP2021/075039 EP2021075039W WO2022069191A1 WO 2022069191 A1 WO2022069191 A1 WO 2022069191A1 EP 2021075039 W EP2021075039 W EP 2021075039W WO 2022069191 A1 WO2022069191 A1 WO 2022069191A1
Authority
WO
WIPO (PCT)
Prior art keywords
coupling element
field probe
contact elements
probe combination
connection element
Prior art date
Application number
PCT/EP2021/075039
Other languages
German (de)
English (en)
Inventor
Thomas Hild
Stefan Kern
Original Assignee
Siemens Aktiengesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Aktiengesellschaft filed Critical Siemens Aktiengesellschaft
Priority to EP21777976.8A priority Critical patent/EP4204822A1/fr
Priority to CN202180065922.9A priority patent/CN116209903A/zh
Publication of WO2022069191A1 publication Critical patent/WO2022069191A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/66—Structural association with built-in electrical component
    • H01R13/665—Structural association with built-in electrical component with built-in electronic circuit
    • H01R13/6683—Structural association with built-in electrical component with built-in electronic circuit with built-in sensor

Definitions

  • the invention relates to a connection element for a field probe combination, a field probe combination with such a connection element, a corresponding connection element, a plug-socket system, a manufacturing method for the connection element and the field probe combination with connection element and the use of the plug-socket system.
  • One of the tasks to be solved is therefore to increase the measurement accuracy and to always measure sufficiently error-free with fluctuating temperature and humidity, i.e. to demonstrate sufficient measurement accuracy.
  • a compact design is also essential, which is another task to be solved, since compact dimensions - dimensions - represent a clear competitive advantage. Along with this, another task is to provide connections for the field probes that are sufficiently voltage-resistant, compact, stable and reliable.
  • a first exemplary embodiment relates to a connection element for a field probe combination for use with medium and high voltages, the connection element
  • the first coupling element is arranged on the coupling element carrier, in particular mechanically fixed on the coupling element carrier,
  • the first coupling element has contact elements that are designed to be electrically conductive
  • the contact elements are connected and/or can be connected to at least one contact-making means
  • the contact elements are each designed to be connectable to further contact elements of a second coupling element
  • the temperature measuring resistor is arranged on the coupling element carrier in such a way that the temperature of the field probe combination can be determined with the temperature measuring resistor, the coupling element carrier also having connecting elements which can be connected to electrically conductive connecting points of the field probe combination.
  • the electrically conductive connection points of the field probe combination are preferably first contacting means and second contacting means, the first contacting means being electrically conductively connected to a first conductive field probe layer and the second contacting means being electrically conductively connected to a second conductive field probe layer.
  • the connecting elements of the coupling element carrier are electrically conductively connected and/or connectable to at least two, preferably four, contact-making means.
  • connection element is designed to be embedded in the field probe combination or in a casing of the field probe combination.
  • being embedded is to be understood in particular as meaning that the connection element can be cast in a polymer, in particular a casting resin.
  • anchor elements are preferably arranged on the connection element, which ensure a firm seat after the encapsulation.
  • the temperature measuring resistor is preferably a PT100 or PT1000, particularly preferably a PT100, temperature measuring resistor.
  • the coupling element carrier is designed as a PCB.
  • the coupling element carrier is designed as a PCB that is already part of the field probe combination or can be connected to a PCB of the field probe combination by prefabricated plugs and sockets.
  • the PCB of the coupling element carrier and/or the PCB of the field probe combination is preferably formed with an FR4 or PI, polyimide, with the conductor tracks being formed with copper. It is also preferred that the contact elements are arranged in such a way that there is a sufficient distance between the contact elements for a capacitive voltage tap and the contact elements for a ground signal.
  • contact elements for a connection to the temperature measuring resistor are present, i.e. arranged, between or offset in parallel between at least one or two of the contact elements for the capacitive voltage tap and at least one or two of the contact elements for the ground signal.
  • the temperature measuring resistor is arranged on the side of the coupling element carrier opposite the first coupling element.
  • the temperature measuring resistor is arranged on the coupling element carrier.
  • the temperature measurement resistor is arranged on the coupling element carrier at a distance of 0.2 mm to 20.0 mm, preferably 0.5 mm to 1.2 mm, from the coupling element carrier.
  • connection element is formed with an IX industrial socket.
  • a second exemplary embodiment relates to a field probe combination for use with, i.e. for, medium and high voltages with a connection element according to one or more of the above versions, the field probe combination being partially or completely surrounded by a cast resin and the connection element being embedded in the cast resin is cast that only the first coupling element of the connection element is accessible from outside the casting resin, in particular can be coupled to a second coupling element from outside the casting resin.
  • a first field probe and a second field probe of the field probe combination are electrically conductively connected to the connecting elements of the coupling element carrier.
  • a field probe combination for use with medium and high voltages is preferred, with a first field probe and a second field probe, the first field probe and the second field probe being connected by a first conductive field probe layer applied to an insulator for the first field probe and by a second conductive field probe layer applied to the insulator conductive field probe layer is formed for the second field probe, the insulator being in the form of a hollow cylinder or a hollow cylinder slotted parallel to an axis of symmetry of the field probe combination, the insulator having an insulator thickness perpendicular to the axis of symmetry, i.e.
  • the first conductive field probe layer being arranged on a first side of the insulator pointing radially into the interior of the hollow cylinder and the second conductive field probe layer being arranged radially on a side on the hollow cylinder is arranged on the outward-facing second side of the insulator, the first conductive field probe layer having first contacting means and the second conductive field probe layer having second contacting means.
  • the wording hollow cylinder or hollow cylindrical shape or hollow cylindrical should always include the shape of the slotted hollow cylinder, in particular also a completely slotted hollow cylinder, i.e. a hollow cylinder in which a continuous section of the lateral surface is parallel to the axis of symmetry the field probe combination is missing .
  • the term conductive refers to electrically conductive and the term insulating, insulated or insulator refers to electrically insulating.
  • the combination of an isolator, in particular a flexible isolator, with two field probes enables precise positioning and alignment, with a fixed isolation distance between the field probes. It is also advantageous that with this design only one component, the field probe combination, has to be cast or overmoulded, which reduces the production costs for bushings with such a field probe combination.
  • the casting resin forms a sealing surface, in particular a flat sealing surface, around the first coupling element.
  • the flat sealing surface is formed in a depression in the cast resin, in particular by shaping in a cast resin tool, ie a part of the cast resin mold, or by machining carried out after casting, in particular machining or thermal machining.
  • a third exemplary embodiment relates to a corresponding connection element for producing a large number of electrically conductive connections with a connection element according to one or more of the above statements, the corresponding connection element having a second coupling element,
  • the second coupling element is arranged on a coupling element carrier
  • the second coupling element has further contact elements that are designed to be electrically conductive
  • the further contact elements are electrically conductively connected or can be connected to further contact-making means
  • the second coupling element has an assembly element which can be electrically connected to corresponding contact elements by means of further contact elements, and the assembly element has a capacitance acting as a secondary capacitance
  • the corresponding connection element has a housing, the housing having an opening with the opening arranged in the opening second coupling element and through a further opening in the housing electrical lines iso- are routed into the housing and connected to the other contact elements.
  • the housing is made of a metal or another conductive material. This configuration allows shielding against EMC interference and preferably serves at the same time as strain relief.
  • the secondary capacitance of the placement element preferably consists of one, two or more individual SMD capacitances.
  • a gas discharge tube is provided on the component element, which discharges overvoltages or transients that may be present, in particular via a field probe combination according to one or more of the above statements for the second exemplary embodiment, to ground and thus an air flashover and/or Component damage prevented .
  • connection element is formed by an IX-Industrial plug, which has a PCB (Printed Circuit Board) as assembly elements, in particular a PCB with SMD capacitances and/or a gas discharge tube, in particular an SMD gas discharge tube.
  • PCB Printed Circuit Board
  • a fourth exemplary embodiment relates to a plug-socket system with a connection element according to one or more of the above statements relating to the first exemplary embodiment and a corresponding connection element according to the third exemplary embodiment.
  • the plug-socket system of the fourth exemplary embodiment with a field probe combination according to one or more versions of the second exemplary embodiment, the field probe combination being partially or completely surrounded by a cast resin and the connection selement is cast in the casting resin in such a way that only the first coupling element, the connecting element is accessible from outside the casting resin, in particular can be coupled to a second coupling element from outside the casting resin.
  • the casting resin forms a sealing surface, in particular a flat sealing surface, around the first coupling element and that the second coupling element has a flexible sleeve, in particular a plastic sleeve or rubber sleeve, and the flexible sleeve when the first coupling element and the second coupling element are connected to one another are, acts on the sealing surface in such a way that the sealing surface and flexible sleeve prevent contamination, in particular moisture and/or dust, from penetrating into the first coupling element and the second coupling element.
  • connecting element is formed with an IX Industrial socket and the corresponding connecting element is formed with an IX Industrial plug.
  • the IX-Industrial plug and the IX-Industrial socket are B-coded.
  • connection element and the corresponding connection element are in accordance with the specifications for USB-C or for RJ45 or for M8 round plugs or for M12 Circular connectors are designed.
  • a fifth exemplary embodiment relates to a manufacturing method for a connection element according to one or more versions of the first exemplary embodiment, a first coupling element being arranged and fastened on a coupling element carrier in such a way that contact elements make contact with at least one contact-making means of the coupling element carrier are electrically conductively connected and a temperature measuring resistor is arranged and fixed on or on the coupling element carrier, that the temperature measuring resistor is electrically conductively connected to at least two contact elements via at least one contact-making means each.
  • a sixth exemplary embodiment relates to a manufacturing method for a field probe combination according to one or more versions of the second exemplary embodiment, wherein the field probe combination is partially or completely surrounded by a cast resin and the connection element is cast in the cast resin in such a way that only the first coupling element of the Connection element accessible from outside the cast resin - in particular with a second coupling element from outside the cast resin can be coupled.
  • a seventh exemplary embodiment relates to the use of a plug-and-socket system according to one or more versions of the third exemplary embodiment with a field probe combination, the field probe combination having a first field probe for capacitive voltage measurement and a temperature sensor that is embedded in a cast resin around the field probe combination is cast has, and the temperature sensor is used to correct the measured capacitive voltages by means of a predetermined epsilon r / temperature reference characteristic in order to achieve increased measurement accuracy.
  • a temperature reference characteristic curve is used which makes compensation for air humidity fluctuations unnecessary within the scope of measurement accuracy.
  • the field probe combination with the plug-socket system and in combination with a medium- or high-voltage primary conductor of a switchgear bushing is used in such a way that a capacitive zitive voltage divider is formed, so that a harmless and measurable voltage is applied to people by grounding a first contacting means to a second contacting means.
  • FIG. 1 Schematic sectional representation of a bushing with a field probe combination
  • FIG. 2 Schematic sectional representation through a field probe combination
  • FIG. 3 Schematic representation of an elevation of a connection element which is coupled to a corresponding connection element
  • FIG. 4 Schematic representation of the connection element according to the invention with a coupling element carrier and a first coupling element
  • FIG. 5 Schematic representation of an exemplary assignment of a first switching element
  • FIG. 6 Schematic representation of an exemplary assignment of a second switching element
  • FIG. 1 shows an exemplary, schematic sectional illustration of a feedthrough 500 with a cast-in field probe combination 510 .
  • the bushing 500 has a primary conductor 600 in the middle, the voltage applied to which can be capacitively determined via the encapsulated field probe combination 510 .
  • the encapsulated field probe combination 510 is encapsulated with a polymer 520, preferably a cast resin 520, in order to enable gas-tight installation in a gas-insulated switchgear.
  • An encapsulated connection element 530 with a first coupling element 20 and a coupling element carrier 30 is provided for electrical contacting of the encapsulated field probe combination 510 .
  • the encapsulated connection element 530 is connected directly to the field probe combination 510 or to it via a PCB tab (not shown) or connection lines (not shown).
  • FIG. 2 shows a schematic sectional representation of a field probe combination 1 encapsulated with a polymer 520 , preferably a casting resin.
  • the field probe combination 1 has a first conductive field probe layer 610 and a second conductive field probe layer 620 .
  • the first conductive field probe layer 610 can be electrically contacted via a first contacting means 640
  • the second conductive field probe layer 620 can be electrically contacted via a second contacting means 650 .
  • a temperature measuring resistor 50 is also shown, which is preferably arranged on a coupling element carrier 30, not shown here, in such a way that the temperature measuring resistor 50 can determine the temperature of the encapsulated field probe combination 1 and derive or estimate the temperature of the polymer 520 between the encapsulated field probe combination 1 and the primary conductor can .
  • FIG. 3 shows a schematic representation of an elevation of a connection element 10 which is coupled to a corresponding connection element 15 .
  • the connection element 10 has a coupling element carrier 30 and a coupling element 20 .
  • the coupling element carrier 30 also has a temperature measurement resistor 50 which, for the sake of clarity, is arranged on the side of the coupling element carrier 30 which faces the coupling element 20 .
  • the temperature measuring resistor 50 is arranged on the side of the coupling element carrier 30 facing away from the coupling element 20 and is thus arranged spatially closer to the field probe combination 1 .
  • the polymer 520 of the feedthrough 500 has a sealing surface 5 here.
  • connection element 15 has a second coupling element 40 which is arranged in a housing 16, preferably a metallic housing 16 for electromagnetic shielding.
  • a flexible sleeve 28 is arranged over the housing 16 and, together with the sealing surface 5, seals the connection element 10 and the corresponding connection element 15 against environmental influences, such as in particular humidity and dust.
  • Further contact-making means 411 to 416 are also shown, the electrical supply lines, of which only two designed as cables can be seen here.
  • a placement element 420 with a secondary capacitance 422 which is necessary for the capacitive voltage measurement.
  • FIG. 4 shows a schematic representation of connection element 10 according to the invention with a coupling element carrier 30 and a first coupling element 20 .
  • the coupling element carrier 30 is designed here as a PCB and the contact-making means 211 to 216 of the first coupling element 20 are designed as conductor tracks with soldering pads.
  • the temperature measurement resistor 50 is also arranged here on soldering pads.
  • FIG. 5 shows a schematic representation of an exemplary allocation of a first coupling element 20 with the contact elements 201 to 210.
  • the assignment of an IX-Industrial socket is shown here as an example, with the ground being connected to the contact elements 206, 207, for example, the first field probe for capacitive voltage measurement is connected to the contact elements 209 , 210 and the temperature measuring resistor is connected to the contact elements 203 , 204 .
  • FIG. 6 shows a schematic representation of an exemplary assignment of a second coupling element 40 with the contact elements 401 to 410.
  • IX-Industrial connector is shown as an example, whereby, for example, the ground is contacted with the contact elements 406, 407, the first field probe for capacitive voltage measurement is contacted with the contact elements 409, 410 and the temperature measurement resistor is contacted with the contact elements 403, 404 .
  • connection element for a field probe combination 1
  • connection element 15 corresponding connection element
  • connection element 15

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

L'invention concerne un élément de connexion pour une combinaison de sondes de champ, une combinaison de sondes de champ comportant un tel élément de connexion, un élément de connexion correspondant, un système de prise femelle, un procédé de fabrication de l'élément de connexion et de la combinaison de sondes de champ équipée d'un élément de connexion, ainsi que l'utilisation du système de prise femelle. L'élément de connexion comporte un capteur de température pour déterminer la température d'une combinaison de sondes de champ.
PCT/EP2021/075039 2020-09-30 2021-09-13 Connexion pour une combinaison de sondes de champ WO2022069191A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP21777976.8A EP4204822A1 (fr) 2020-09-30 2021-09-13 Connexion pour une combinaison de sondes de champ
CN202180065922.9A CN116209903A (zh) 2020-09-30 2021-09-13 用于场探头组合的接头

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102020212375.6 2020-09-30
DE102020212375.6A DE102020212375A1 (de) 2020-09-30 2020-09-30 Anschluss für eine Feldsondenkombination

Publications (1)

Publication Number Publication Date
WO2022069191A1 true WO2022069191A1 (fr) 2022-04-07

Family

ID=77924350

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2021/075039 WO2022069191A1 (fr) 2020-09-30 2021-09-13 Connexion pour une combinaison de sondes de champ

Country Status (4)

Country Link
EP (1) EP4204822A1 (fr)
CN (1) CN116209903A (fr)
DE (1) DE102020212375A1 (fr)
WO (1) WO2022069191A1 (fr)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2409595A1 (de) 1974-02-25 1975-08-28 Siemens Ag Spannungswandler fuer eine vollisolierte, metallgekapselte hochspannungsschaltanlage
DE4114921A1 (de) * 1991-05-07 1992-11-12 Ahlborn Mess Und Regelungstech Elektrische steckverbindung
EP1345033A1 (fr) * 2002-02-15 2003-09-17 Esdras Automatica Transformateurs pour mesurer la tension et le courant électrique basés sur les ondes électromagnétiques du diélectrique
US20080079437A1 (en) * 2006-09-28 2008-04-03 General Electric Company Current Sensing Module and Assembly Method Thereof
ES2505328A1 (es) * 2012-02-03 2014-10-09 Inael Electrical Sytems, S.A. Conector sensorizado integrado y procedimiento de medida y corrección con el mismo
WO2016187090A1 (fr) * 2015-05-18 2016-11-24 3M Innovative Properties Company Capteur de tension
WO2018108828A1 (fr) * 2016-12-16 2018-06-21 Eaton Industries (Netherlands) B.V. Combinaison d'un élément conducteur d'électricité, de type manchon, et d'un câble connecteur

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3325983B1 (fr) 2015-07-20 2019-06-05 Eaton Intelligent Power Limited Système pour mesurer la tension d'un conducteur
US20180100878A1 (en) 2016-10-07 2018-04-12 Cooper Technologies Company Sensing device for an electrical system
DE102018206148B4 (de) 2018-04-20 2023-05-17 Siemens Aktiengesellschaft Steuerelektrode und Durchführung für Mittelspannungsanlagen und Hochspannungsanlagen

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2409595A1 (de) 1974-02-25 1975-08-28 Siemens Ag Spannungswandler fuer eine vollisolierte, metallgekapselte hochspannungsschaltanlage
DE4114921A1 (de) * 1991-05-07 1992-11-12 Ahlborn Mess Und Regelungstech Elektrische steckverbindung
EP1345033A1 (fr) * 2002-02-15 2003-09-17 Esdras Automatica Transformateurs pour mesurer la tension et le courant électrique basés sur les ondes électromagnétiques du diélectrique
US20080079437A1 (en) * 2006-09-28 2008-04-03 General Electric Company Current Sensing Module and Assembly Method Thereof
ES2505328A1 (es) * 2012-02-03 2014-10-09 Inael Electrical Sytems, S.A. Conector sensorizado integrado y procedimiento de medida y corrección con el mismo
WO2016187090A1 (fr) * 2015-05-18 2016-11-24 3M Innovative Properties Company Capteur de tension
WO2018108828A1 (fr) * 2016-12-16 2018-06-21 Eaton Industries (Netherlands) B.V. Combinaison d'un élément conducteur d'électricité, de type manchon, et d'un câble connecteur

Also Published As

Publication number Publication date
DE102020212375A1 (de) 2022-03-31
EP4204822A1 (fr) 2023-07-05
CN116209903A (zh) 2023-06-02

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