WO2022012334A1 - Bulk acoustic resonator with mass loads arranged on two sides of piezoelectric layer, filter and electronic device - Google Patents

Bulk acoustic resonator with mass loads arranged on two sides of piezoelectric layer, filter and electronic device Download PDF

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Publication number
WO2022012334A1
WO2022012334A1 PCT/CN2021/103693 CN2021103693W WO2022012334A1 WO 2022012334 A1 WO2022012334 A1 WO 2022012334A1 CN 2021103693 W CN2021103693 W CN 2021103693W WO 2022012334 A1 WO2022012334 A1 WO 2022012334A1
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Prior art keywords
array
resonator
mass
mass load
acoustic impedance
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PCT/CN2021/103693
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French (fr)
Chinese (zh)
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庞慰
杨清瑞
张孟伦
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诺思(天津)微系统有限责任公司
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02007Details of bulk acoustic wave devices
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/15Constructional features of resonators consisting of piezoelectric or electrostrictive material
    • H03H9/17Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
    • H03H9/171Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46Filters
    • H03H9/54Filters comprising resonators of piezo-electric or electrostrictive material
    • H03H9/56Monolithic crystal filters
    • H03H9/564Monolithic crystal filters implemented with thin-film techniques

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  • Embodiments of the present disclosure relate to the field of semiconductors, and in particular, to a bulk acoustic wave resonator, a filter having the resonator, and an electronic device.
  • FBAR Film Bulk Acoustic Resonator
  • BAW Bulk Acoustic Resonator
  • the structural main body of the thin film bulk acoustic wave resonator is a "sandwich" structure composed of an electrode-piezoelectric film-electrode, that is, a piezoelectric material is sandwiched between two metal electrode layers.
  • the FBAR uses the inverse piezoelectric effect to convert the input electrical signal into mechanical resonance, and then uses the piezoelectric effect to convert the mechanical resonance into an electrical signal output.
  • the thin-film bulk acoustic wave resonator mainly uses the longitudinal piezoelectric coefficient of the piezoelectric film to generate the piezoelectric effect, so its main operating mode is the longitudinal wave mode in the thickness direction, that is, the acoustic wave of the bulk acoustic wave resonator is mainly in the resonator. And the main vibration direction is in the longitudinal direction.
  • the lateral Lamb wave will leak out from the lateral direction of the piezoelectric film layer, resulting in acoustic loss, thus making the Q value of the resonator. decrease.
  • the present disclosure is made to alleviate or solve at least one aspect of the above-mentioned problems in the prior art.
  • a bulk acoustic wave resonator comprising:
  • a piezoelectric layer arranged between the bottom electrode and the top electrode
  • the upper side of the piezoelectric layer and the lower side of the piezoelectric layer are respectively provided with a first mass load array and a second mass load array.
  • Embodiments of the present disclosure also relate to a filter comprising the above-mentioned bulk acoustic wave resonator.
  • Embodiments of the present disclosure also relate to an electronic device including the above-mentioned filter or the above-mentioned resonator.
  • FIG. 1A is a schematic top view of a bulk acoustic wave resonator according to an exemplary embodiment of the present disclosure
  • FIG. 1B is a schematic cross-sectional view of a bulk acoustic wave resonator taken along line M1-M2 in FIG. 1A according to an exemplary embodiment of the present disclosure
  • FIG. 1C is a schematic cross-sectional view of a bulk acoustic wave resonator taken along line M1-M2 in FIG. 1A according to another exemplary embodiment of the present disclosure
  • Figures 2A and 2B respectively exemplarily show a diagram of setting a mass load on the top electrode, wherein Figure 2A is an arrangement in Cartesian coordinates, and Figure 2B is a diagram in polar coordinates;
  • 3A-3C are respectively schematic top views showing the composite of mass load arrays (arranged in Cartesian coordinates) provided on the upper and lower sides of the laminated structure of the resonator according to different exemplary embodiments of the present disclosure
  • FIG. 4 is a schematic top view showing a composite of mass load arrays (arranged in polar coordinates) provided on the upper and lower sides of the laminated structure of the resonator according to an exemplary embodiment of the present disclosure
  • 5A and 5B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to an exemplary embodiment of the present disclosure, and after compounding;
  • FIGS. 6A and 6B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to another exemplary embodiment of the present disclosure, and after compounding;
  • FIGS. 7A and 7B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure;
  • FIGS. 8A and 8B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to still another exemplary embodiment of the present disclosure, and after compounding;
  • FIGS. 9A and 9B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure;
  • FIGS. 10A and 10B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure;
  • FIGS. 11A and 11B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and after compounding;
  • Figures 12A and 12B illustrate a schematic top view of mass load arrays arranged on the upper and lower sides of a laminated structure of a resonator according to yet another exemplary embodiment of the present disclosure, and a composite structure;
  • FIG. 13A schematically shows impedance characteristic curves at the vicinity of the series resonance frequency (left side graph) and the parallel resonance frequency (right side graph) of a resonator in which a mass load array is provided only on one side of the resonator as a comparative example;
  • 13B and 13C schematically illustrate the locations near the series resonant frequency (left panel) and the parallel resonant frequency (right panel) of a resonator provided with mass-loaded arrays on both the upper and lower sides of the resonator, respectively, according to an embodiment of the present disclosure. impedance characteristic curve.
  • FIG. 1A is a schematic top view of a bulk acoustic wave resonator according to an exemplary embodiment of the present disclosure
  • FIG. 1B is a schematic view of the bulk acoustic wave resonator according to an exemplary embodiment of the present disclosure taken along the line M1-M2 in FIG. 1A
  • FIG. 1C is a schematic cross-sectional view of a bulk acoustic wave resonator according to another exemplary embodiment of the present disclosure, taken along the line M1-M2 in FIG. 1A .
  • Substrate, optional materials are single crystal silicon, gallium nitride, gallium arsenide, sapphire, quartz, silicon carbide, diamond, etc.
  • the first acoustic impedance layer or the first acoustic impedance layer, the material may be aluminum nitride, silicon dioxide, silicon nitride, polysilicon, or amorphous silicon.
  • the second acoustic impedance layer or the second acoustic impedance layer which also serves as a sacrificial layer.
  • the material of the second acoustic impedance layer can be silicon dioxide, doped silicon dioxide, polysilicon, amorphous silicon, etc., but it is different from the material of the first acoustic impedance layer, and the etchant of the second acoustic impedance layer is not easy to etch or The material of the first acoustic impedance layer is not etched.
  • Acoustic mirror which can be a cavity, or a Bragg reflector and other equivalent forms. Cavities are employed in the embodiments shown in this disclosure.
  • the material can be selected from molybdenum, ruthenium, gold, aluminum, magnesium, tungsten, copper, titanium, iridium, osmium, chromium or the composite of the above metals or their alloys.
  • the underside mass loading is a protrusion formed by the material of the bottom electrode itself or a depression formed on the bottom electrode.
  • the material of the underside mass loading can also be different from the bottom electrode.
  • the lower mass load is arranged on the lower side of the piezoelectric layer, which is not limited to be fabricated under the bottom electrode, but can also be fabricated between the piezoelectric layer and the bottom electrode, or fabricated in the bottom electrode.
  • Piezoelectric layer which can be a single crystal piezoelectric material, optional, such as: single crystal aluminum nitride, single crystal gallium nitride, single crystal lithium niobate, single crystal lead zirconate titanate (PZT), single crystal Potassium niobate, single crystal quartz film, or single crystal lithium tantalate and other materials can also be polycrystalline piezoelectric materials (corresponding to single crystal, non-single crystal materials), optional, such as polycrystalline aluminum nitride, Zinc oxide, PZT, etc., can also be a rare earth element doped material containing a certain atomic ratio of the above materials, for example, can be doped aluminum nitride, and doped aluminum nitride contains at least one rare earth element, such as scandium (Sc), yttrium (Y), magnesium (Mg), titanium (Ti), lanthanum (La), cerium (Ce), praseodymium (Pr), neodymium (
  • the top electrode the material of which can be the same as the bottom electrode, and the material can be selected from molybdenum, ruthenium, gold, aluminum, magnesium, tungsten, copper, titanium, iridium, osmium, chromium or a composite of the above metals or their alloys.
  • the top and bottom electrode materials are generally the same, but can also be different.
  • the upper mass load is a protrusion formed by the material of the top electrode itself or a depression formed on the top electrode, or in the case where a passivation layer or a process layer is provided on the top electrode, it can also be formed by the material of the process layer. Raised or recessed.
  • the material supported by the upper mass may also be different from the top electrode or the process layer. For example, when the process layer on the upper surface of the top electrode is aluminum nitride, the material supported by the upper mass may be silicon dioxide or metal oxide.
  • the upper mass load is arranged on the upper side of the piezoelectric layer, and is not limited to being fabricated above the top electrode, but can also be fabricated between the piezoelectric layer and the top electrode, or fabricated in the top electrode.
  • the top electrode lead-out part which can be prepared at the same time as the top electrode, and the material can be selected from molybdenum, ruthenium, gold, aluminum, magnesium, tungsten, copper, titanium, iridium, osmium, chromium or a composite of the above metals or their alloys.
  • Electrode connection part one (Bonding PAD, or bottom electrode electrical connection layer), the material can be copper, gold or a composite of above metals or alloys thereof.
  • the second electrode connection part (Bonding PAD, or top electrode electrical connection layer), the material can be copper, gold or a composite of the above metals or their alloys, etc.
  • the upper side of the top electrode 160 is provided with a mass load array 165
  • the lower side of the bottom electrode 140 is provided with a mass load array 145 .
  • mass loads are provided on both the upper and lower sides of the stacked structure composed of the top electrode, the bottom electrode and the single crystal piezoelectric layer, so as to provide flexibility for adjusting the frequency reference of the resonator by the mass load, It is beneficial to realize the convenience and precision of the frequency control of the resonator.
  • the bulk acoustic wave resonator has better spatial symmetry in the thickness direction. It can be beneficial to suppress the spurious mode generated during the operation of the resonator, and improve the Q value of the resonator.
  • an acoustic impedance structure is disposed between the piezoelectric layer 150 and the substrate 100 , and the acoustic mirror 130 is located between the acoustic impedance structures in the lateral direction of the resonator, the acoustic impedance structures including being adjacent to each other in the lateral direction
  • the first acoustic impedance layer 110 and the second acoustic impedance layer 120 are provided, and more specifically, the acoustic mirror 130 is located between the first acoustic impedance layers 110 in the lateral direction of the resonator.
  • the electrode connection end of the bottom electrode 140 is covered by a part of the first acoustic impedance layer 110 , and the non-electrode connection end of the bottom electrode 140 is spaced apart from the first acoustic impedance layer 110 in the lateral direction.
  • the acoustic impedances of the first acoustic impedance layer and the second acoustic impedance layer are different to form impedance mismatch, form continuous reflection for acoustic waves, and form a reflection structure for transverse acoustic waves, so as to prevent transverse acoustic waves from leaking, It is beneficial to lock the energy in the resonator, thereby improving the Q value.
  • the single crystal piezoelectric material is used, so that the piezoelectric loss can be lower, so as to obtain a higher Q value of the resonator, and at the same time, the electromechanical coupling coefficient and power capacity can be improved.
  • the widths A and B of the portions of the first acoustic impedance layer 110 and the second acoustic impedance layer 120 in contact with the piezoelectric layer 150 are m ⁇ 1 /4 and n ⁇ 2 /4, respectively, where m and n are odd numbers, such as 1, 3, 5, 7, etc., ⁇ 1 and ⁇ 2 are the wavelengths of acoustic waves propagating laterally at the resonance frequency of the first acoustic impedance layer and the second acoustic impedance layer, respectively.
  • the resonant frequency is a certain frequency within the resonant interval of the resonator, which can be the series resonant frequency or the parallel resonant frequency of the resonator, or a certain frequency between the series and parallel resonant frequencies, or slightly lower than the series resonant frequency or A frequency slightly higher than the parallel resonant frequency.
  • the width of the first acoustic impedance layer 110 is represented by A
  • the width of the second acoustic impedance layer 120 is represented by B. Selecting the above-mentioned width is beneficial to form an effective acoustic impedance mismatch, prevent transverse acoustic wave leakage, and further improve the Q value of the resonator.
  • m and n may be the same or different, which are all within the protection scope of the present disclosure.
  • the materials for forming the first acoustic impedance layer 110 include aluminum nitride, silicon dioxide, silicon nitride, polysilicon, and amorphous silicon
  • the materials for forming the second acoustic impedance layer 120 include silicon dioxide, doped silicon dioxide, and polysilicon. , Amorphous silicon.
  • the material of the first acoustic impedance layer 110 and the material of the second acoustic impedance layer 120 are different from each other.
  • the material for forming the first acoustic impedance layer 110 includes silicon dioxide
  • the material for forming the second acoustic impedance layer 120 includes polysilicon.
  • the first acoustic impedance layer 110 is formed of doped silicon dioxide.
  • the difference between the acoustic impedances of the two may be selected as large as possible.
  • the end face of the non-electrode connection end (the right end in FIG. 1B ) of the bottom electrode 140 is spaced apart from the first acoustic impedance layer 110 in the acoustic impedance structure in the lateral direction, so that the acoustic wave is not in the bottom electrode.
  • the lateral interface between the electrode connection end and the void also forms total reflection, thereby reducing acoustic leakage. Based on the void structure at the non-electrode connection end, transverse acoustic wave leakage can be further prevented and the Q value of the resonator can be improved.
  • the end face of the non-electrode connection end (the right end in FIG. 1B ) of the bottom electrode 140 is covered by the first acoustic impedance layer 3 , a parasitic capacitance will be formed with the part of the top electrode outside the cavity, thereby affecting the resonator The electromechanical coupling coefficient.
  • the end face of the non-electrode connecting end of the bottom electrode 140 is transversely aligned with the end face of the non-electrode connecting end of the bottom electrode 140 .
  • the distance that the acoustic impedance structures are spaced apart may be in the range of 0.5 ⁇ m-20 ⁇ m.
  • the distance may be, for example, 5 ⁇ m, 7 ⁇ m, or the like, in addition to the end value.
  • the bottom electrode 140 is surrounded by a continuous reflective layer or an acoustic impedance structure formed by the first acoustic impedance layer 110 and the second acoustic impedance layer 120 on one side of the electrode connection end. More specifically, Covered by the first acoustic impedance layer 110, on the one hand, this structure is beneficial to improve the mechanical stability of the resonator, and it is easier to conduct the heat generated during the operation of the resonator to the substrate through the electrodes and the first acoustic impedance layer 110 , thereby improving the power capacity of the resonator.
  • the energy will leak into the first acoustic impedance layer 110 from the end face of the bottom electrode, due to the existence of the reflection interface formed by the second acoustic impedance layer and the first acoustic impedance layer , therefore, it is beneficial to lock as much energy as possible inside the resonator, so that the resonator maintains a high Q value.
  • the angle ⁇ 1 formed between the surface where the outer surface of the first acoustic impedance layer 110 is located and the bottom surface of the piezoelectric layer can be selected to be in the range of 100°-160° , specifically, can be 100°, 120°, 160°, etc.
  • the space corresponding to the acoustic mirror 130 is filled with the material of the second acoustic impedance layer 120 at the beginning (the acoustic mirror 130 is formed by etching the material of the second acoustic impedance layer later), therefore, choosing this angle is beneficial for patterning the first An acoustic impedance layer 110 is then filled with a second acoustic impedance layer 120 .
  • the angle ⁇ 1 formed between the outer side of the end surface of the bottom electrode 140 and the bottom surface of the piezoelectric layer 150 may be selected to be in the range of 90°-160°. 90°, 100°, 120°, 160°, etc. Selecting this angle is favorable for filling the first acoustic impedance layer 110 and the second acoustic impedance layer 120 .
  • FIG. 1C is a schematic cross-sectional view of a bulk acoustic wave resonator similar to that taken along line M1-M2 in FIG. 1 , showing the electrode lead-out region of the bottom electrode and the top electrode, according to another exemplary embodiment of the present disclosure. and the electrode connection end of the bottom electrode is covered by a part of the first acoustic impedance layer 110 , and the non-electrode connection end of the bottom electrode is spaced apart from the first acoustic impedance layer 110 in the lateral direction.
  • FIG. 1C is a schematic cross-sectional view of a bulk acoustic wave resonator similar to that taken along line M1-M2 in FIG. 1 , showing the electrode lead-out region of the bottom electrode and the top electrode, according to another exemplary embodiment of the present disclosure. and the electrode connection end of the bottom electrode is covered by a part of the first acoustic impedance layer 110 , and the non-electrode connection end of the bottom
  • the angle ⁇ 2 formed between the surface where the outer surface of the first acoustic impedance layer 110 is located and the bottom surface of the piezoelectric layer 150 can be selected to be in the range of 20°-80° , specifically, can be 20°, 60°, 80°, etc.
  • the angle ⁇ 2 formed between the outer side of the end surface of the bottom electrode 140 and the bottom surface of the piezoelectric layer 150 can be selected to be in the range of 90°-160°, specifically, 90°, 100°, 120°, 160°, etc. Selecting this angle is favorable for filling the first acoustic impedance layer 110 and the second acoustic impedance layer 120 .
  • the first acoustic impedance layer 110 and the second acoustic impedance layer 120 may together constitute an acoustic impedance structure.
  • the present disclosure is not limited thereto, in other words, the arrangement of the acoustic impedance layers is not limited thereto. It may include a first acoustic impedance layer and a second acoustic impedance layer arranged adjacent to one another in the lateral direction, or a first acoustic impedance layer, a second acoustic impedance layer, and a first acoustic impedance layer, or a combination of the above. combination.
  • FIG. 2A and 2B exemplarily show diagrams of disposing a mass load on the top electrode, respectively, wherein FIG. 2A is an arrangement in Cartesian coordinates, and FIG. 2B is a diagram in polar coordinates.
  • FIG. 2A is an arrangement in Cartesian coordinates
  • FIG. 2B is a diagram in polar coordinates.
  • FIGS. 3A-3C are schematic top views showing the composite of mass load arrays (arranged in Cartesian coordinates) disposed on the upper and lower sides of the laminated structure of the resonator according to different exemplary embodiments of the present disclosure.
  • the second mass load array is relative to the first mass load array according to the vector ⁇ 0 for translation, and the translation here includes the lateral translation and the longitudinal translation in FIG. 3A .
  • the translation may only be a lateral translation or a longitudinal translation.
  • the size of the mass load corresponding to A1 is the same as the size of the mass load corresponding to B1 .
  • P1 and P2 are the distances between adjacent mass loads in the horizontal and vertical directions of the mass load array corresponding to A1, respectively.
  • P1 and P2 can be the same or different, and their range is from 0.1 times to 10 times the total thickness of the resonator.
  • the thicknesses of the mass-loaded arrays on the upper and lower sides of the resonator are The thickness of the upper and lower sides can be the same or different.
  • the size of the mass load refers to the radius of the cross section of the mass load; for other cross-sectional shapes, It can be determined by the equivalent radius of the cross section.
  • the length of the horizontal component of the vector ⁇ 0 is in the range of 0-P1
  • the length of the vertical component is in the range of 0-P2
  • the endpoint values such as 0, P1 or P2
  • the second mass load array is relative to the first mass load
  • the array is translated by the vector ⁇ 0 , where the translation includes the lateral translation in FIG. 3B as well as the longitudinal translation.
  • the translation may only be a lateral translation or a longitudinal translation.
  • P1 and P2 are the distances between adjacent mass loads in the horizontal and vertical directions of the mass load array corresponding to A1, respectively.
  • P1 and P2 can be the same or different, and their range is from 0.1 times to 10 times the total thickness of the resonator.
  • the mass load array corresponding to A2 can be regarded as the mass load array corresponding to A1 , which is translated according to ⁇ 1.
  • the translation here includes only the lateral translation in FIG. 3B. In an optional embodiment, the translation can also be only the longitudinal translation. , or a combination of horizontal translation and vertical translation.
  • the length of the horizontal component of the vector ⁇ 1 is within the range from the sum of the radii of the mass load cells A1 and A2 to P1, and the length of the vertical component is within the range from the sum of the radii of the mass load cells A1 and A2 to the range of P2;
  • the length of the horizontal component of the vector ⁇ 0 is in the range of 0-P1, and the length of the vertical component is in the range of 0-P2, where 0 means that the two arrays are completely coincident (that is, all the mass loads of one array are in the range of the other array. Corresponding mass load coincidence).
  • the size of the mass load corresponding to A1 and the mass load corresponding to A2 are different; the size of the mass load corresponding to B1 and the mass load corresponding to B2 are different.
  • the size of the mass load corresponding to A1 may be the same as or different from the size of the mass load corresponding to B1, and the size of the mass load corresponding to A2 may be the same or different from the size of the mass load corresponding to B2.
  • the translation here includes the lateral translation and the longitudinal translation in FIG. 3A .
  • the translation may only be a lateral translation or a longitudinal translation.
  • the size of the mass load corresponding to A1 is different from the size of the mass load corresponding to B1.
  • the simulation results are used to illustrate that, compared with the single-sided mass load, the double-sided mass load can not only have the effect of frequency adjustment, but also the effect of improving the Q value of the resonator.
  • Figure 13A shows that only a certain thickness is provided on the top electrode (such as )
  • the distribution on the upper and lower sides can achieve a larger mass load effect than the single-side distribution, that is, a larger frequency change amplitude; at the same time, the series impedance is significantly reduced (from 2.44 ⁇ is reduced to 0.84 ⁇ , the reduction range is about 60%), the corresponding Q value will be significantly improved, indicating that in this embodiment, the mass load distributed on the upper and lower sides can generate a forbidden band for shear wave propagation near the series resonance frequency, thus Concentrate more energy in the vibration mode of the series resonance, and increase the Q value of the resonator series resonance point; in addition, the parallel impedance will be slightly reduced (from 2420 ⁇ to 2300 ⁇ , the reduction range is about 5%), and the degree of deterioration is far less than the series impedance improvement.
  • the improvement (from 2420 ⁇ to 2565 ⁇ , the improvement range is about 6%), that is, compared with Figure 13B, only the Q value near the series resonance frequency is increased.
  • the embodiment shown in Figure 13C can fully Increase the Q value of the resonator in the whole frequency band (including the Q value near the series resonance frequency and the parallel resonance frequency).
  • FIG. 4 is a schematic top view showing a composite of mass load arrays (arranged in polar coordinates) disposed on the upper and lower sides of the laminated structure of the resonator according to an exemplary embodiment of the present disclosure.
  • A1 is used as the mass load in the first mass load array
  • B1 is used as the mass load in the second mass load array.
  • the mass load array corresponding to A1 has N mass load units in the circumferential direction, N is greater than or equal to 3
  • the adjacent mass loads have an included angle ⁇ 3 (its value is 360°/N)
  • the adjacent mass load units in the radial direction are The spacing between them is P3, which is in the range of 0.1 times to 10 times the total thickness of the resonator, and in an optional embodiment, from the center of the resonator to the outside, the distance P3 between adjacent mass loads of each layer can be The same can also be changed from small to large, or from large to small.
  • the second mass load array is rotated relative to the first mass load array by an angle ⁇ 0 , and its rotation direction can be clockwise or counterclockwise, and the range of the angle can be in the range of 0- ⁇ 3 , where the endpoint value is (eg 0 or ⁇ 3 ) means that the two arrays are fully coincident (ie all mass loadings of one array coincide with the corresponding mass loadings of the other array).
  • the mating of the two arrays can also be a complementary mating relationship.
  • the mass load array can be distributed on one side of the stack structure in Cartesian or polar coordinates, then the array can be divided into several areas in a certain way, and the array in a certain area can be transferred to the other side (ie, a mass load provided in a specific position on one side is not provided in a corresponding specific position on the other side), thereby forming a complementary relationship of the arrays on both sides of the stacked structure.
  • 5A and 5B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to an exemplary embodiment of the present disclosure, and composited.
  • the mass-loaded array on one side of the laminated structure has a Cartesian coordinate distribution
  • the array is divided into two parts by a pentagon boundary P1
  • the array located outside the pentagon is transferred
  • the mating relationship of the arrays on both sides of the stack as shown in FIG. 5B is finally formed.
  • the array on one side is a polygon, while the array on the other side is an annular polymorph, and the polygon fits with the inner edge of the annular polygon.
  • the shape of the array or polygon on the left side of FIG. 5B is similar to the shape of the ring-shaped polygon on the right side of FIG. 5B or the shape of the active area of the resonator.
  • a polygonal ring may also be provided in the embodiment shown in Figures 5A and 5B, similar to that shown in the subsequent Figure 7B.
  • 6A and 6B illustrate a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to another exemplary embodiment of the present disclosure, and the composite structure.
  • the array on one side of the laminated structure has a polar coordinate distribution, and the array is divided into two parts by a circular boundary C1, and the array located on the outer side of the circle is transferred to the laminated structure.
  • the mating relationship of the arrays on both sides of the laminated structure shown in FIG. 6B is finally formed.
  • FIG. 7A and 7B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure.
  • a plurality of circular boundaries may be provided, so that as shown in Figure 7A, the array distributed in polar coordinates on one side of the laminated structure is surrounded by 2 circles
  • the shape boundary C1C2 is divided into 3 parts, and the annular array in the two circular parts spaced from each other is transferred to the other side of the laminated structure to form the mating relationship in FIG. 7B .
  • the shape of the dividing boundary is not limited to closed geometric shapes such as circles, polygons, and rings, and can also be other geometric shapes, such as straight lines or geometric shapes formed by a combination of multiple straight lines.
  • 8A and 8B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to still another exemplary embodiment of the present disclosure, and composited.
  • Fig. 8A the array distributed according to Cartesian coordinates is alternately divided into several vertical strip-shaped regions by several straight lines (obviously, it can also be divided into horizontal strip-shaped regions), and these regions are alternately marked as P1, Q1..., so the All of the arrays in the Q1 (or P1 ) region can be transferred to the other side to form the mating relationship in FIG. 8B .
  • FIGS. 9A and 9B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and composited.
  • the array distributed according to Cartesian coordinates is alternately divided into several inclined strip-shaped regions by several straight lines, and these regions are alternately marked as P2, Q2..., so that all the arrays in the Q2 (or P2) region can be divided into Transfer to the other side, thereby forming the array position matching relationship in FIG. 9B.
  • FIG. 10A and 10B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and composited.
  • the lines used to divide the regions do not have to be parallel to each other.
  • the array arranged on one side of the laminated structure in polar coordinates is alternately divided into P3, Q3... regions by a set of rays emanating from a certain center. , If all the lattice units that are divided into the P3 or Q3 area are transferred to the other side of the laminated structure, the array position matching relationship shown in FIG. 10B can be obtained.
  • FIGS. 11A and 11B illustrate mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and a schematic top view after compounding.
  • the rectangular boundary P4 divides the array distributed according to Cartesian coordinates into a plurality of cells, wherein a certain cell shares three mass loads with its adjacent cells. In each cell, the central array cell of rectangular boundary Q4 is isolated. If all the array units in the P4 or Q4 area are transferred to the other side of the stacked structure, the array position matching relationship in FIG. 11B can be obtained.
  • FIG. 12A and 12B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure.
  • the lattice is divided into a checkerboard by several orthogonal straight lines, each grid contains 4 mass loads, and the grid areas P5 and Q5 are staggered in the form of illustration (for example, the "up and down" of P5 There are Q5 in the left and right, and P5 in the upper left, lower left, upper right and lower right). If all the array elements in the P5 or Q5 area are transferred to the other side of the stacked structure, the array position matching relationship in FIG. 12B can be obtained.
  • each numerical range except that it is explicitly stated that it does not include the endpoint value, may be the endpoint value, but also the middle value of each numerical range, and these are all within the protection scope of the present disclosure. .
  • upper and lower are relative to the bottom surface of the base of the resonator, and for a component, the side close to the bottom surface is the lower side, and the side away from the bottom surface is the upper side.
  • inside and outside are relative to the center of the effective area of the resonator (the overlapping area of the piezoelectric layer, the top electrode, the bottom electrode and the acoustic mirror in the thickness direction of the resonator constitutes the effective area) (ie, the center of the effective area). ) in the transverse or radial direction, the side or end of a component close to the center of the effective area is the inner or inner end, and the side or end of the component away from the center of the effective area is the outer or outer end.
  • bulk acoustic wave resonators may be used to form filters or electronic devices.
  • a bulk acoustic wave resonator comprising:
  • the piezoelectric layer is arranged between the bottom electrode and the top electrode
  • the upper side of the piezoelectric layer and the lower side of the piezoelectric layer are respectively provided with a first mass load array and a second mass load array;
  • the first mass load array includes a plurality of mass loads on the upper side of the piezoelectric layer
  • the second mass load array includes a plurality of mass loads on the lower side of the piezoelectric layer.
  • Both the first mass load array and the second load array are arranged in Cartesian coordinates.
  • the arrangement relationship between the first mass load array and the second load array is that at least a part of one array is an array in which a corresponding part of the other array is translated at least once.
  • Both the first mass load array and the second load array are arranged in polar coordinates.
  • the arrangement relationship between the first mass load array and the second load array is that at least a part of one array is an array in which a corresponding part of the other array is rotated by an angle.
  • the arrangement relationship of the first mass load array and the second load array is a complementary array.
  • the first mass load array and the second load array together form a new array
  • the first mass load array and the second mass load array form a new array.
  • One of the first mass load array and the second load array has at least one unit to be filled, and the other array has at least one filled unit.
  • the shape of the unit to be filled is one or more of a polygon, a circle, a circular ring, a polygonal ring, a straight line or a polyline, and the shape of the at least one unit to be filled is the same as the shape of the at least one unit to be filled.
  • the shape of the unit corresponds.
  • the shape of the unit to be filled is a polygon or a polygonal ring
  • the outer contour of the polygon or polygonal ring of the unit to be filled is similar to the shape of the active area of the resonator.
  • the unit to be filled includes a plurality of units to be filled in the shape of a straight line.
  • Both the first mass load array and the second load array are arranged in Cartesian coordinates, and the plurality of cells to be filled are spaced parallel to each other; or
  • Both the first mass load array and the second load array are arranged in polar coordinates, and ends of the plurality of cells to be filled in the circumferential direction are spaced apart from each other.
  • One of the first mass load array and the second mass load array includes a plurality of mass load points to be filled, and the other of the first mass load array and the second mass load array includes a plurality of mass loads associated with the plurality of mass loads. Multiple mass loads corresponding to the positions of the points to be filled.
  • Both the first mass load array and the second load array are arranged in Cartesian coordinates
  • the one of the first mass load array and the second load array has a plurality of cells to be filled, each cell to be filled includes at least one point to be filled with a mass load, and the plurality of cells to be filled constitute a first polygon shaped cell array.
  • Each unit to be filled contains a mass-loaded point to be filled.
  • Each unit to be filled contains a plurality of points to be filled with mass load
  • the other of the first mass load array and the second mass load array includes a plurality of filling cells, each filling cell includes a plurality of mass loads, and the plurality of filling cells constitute a second cell array;
  • the new array is a cell array formed by complementing the first polygonal cell array and the second polygonal cell array.
  • the geometry of the mass loads in the first array of mass loads is different from the geometry of the mass loads in the second array of mass loads.
  • An acoustic impedance structure is arranged between the piezoelectric layer and the substrate;
  • the acoustic impedance structure includes a first acoustic impedance layer and a second acoustic impedance layer arranged adjacent to each other in the lateral direction, the acoustic impedance of the first acoustic impedance layer and the second acoustic impedance layer are different, and the acoustic mirror is in the The resonator is located between the first acoustic impedance layers in the lateral direction.
  • the widths of the parts of the first acoustic impedance layer and the second acoustic impedance layer in contact with the piezoelectric layer are m ⁇ 1 /4 and n ⁇ 2 /4, respectively, where m and n are odd numbers, and ⁇ 1 and ⁇ 2 are respectively the first Wavelengths of acoustic waves propagating laterally at the resonant frequency of the acoustic impedance layer and the second acoustic impedance layer.
  • a material forming one of the first acoustic impedance layer and the second acoustic impedance layer is selected from aluminum nitride, silicon dioxide, silicon nitride, polysilicon, and amorphous silicon to form the first acoustic impedance layer and the second acoustic impedance layer
  • the material of another layer in the impedance layer is selected from silicon dioxide, doped silicon dioxide, polycrystalline silicon, and amorphous silicon, and the material forming the first acoustic impedance layer is different from the material forming the second acoustic impedance layer.
  • the acoustic mirror is an acoustic mirror cavity
  • the boundary of the acoustic mirror cavity in the lateral direction of the resonator is defined by the first acoustic impedance layer.
  • the piezoelectric layer is a single crystal piezoelectric layer.
  • a filter comprising the bulk acoustic wave resonator of any one of 1-21.
  • An electronic device comprising the filter according to 22, or the bulk acoustic wave resonator according to any one of 1-21.
  • the electronic equipment here includes but is not limited to intermediate products such as RF front-end, filter and amplifier modules, and terminal products such as mobile phones, WIFI, and drones.

Abstract

The present disclosure relates to a bulk acoustic resonator and a manufacturing method therefor. The resonator comprises: a substrate; an acoustic mirror; a bottom electrode; a top electrode; and a piezoelectric layer provided between the bottom electrode and the top electrode, wherein a first mass load array and a second mass load array are respectively provided on upper and lower sides of the piezoelectric layer. The present disclosure also relates to a filter and an electronic device.

Description

压电层双侧设置质量负载的体声波谐振器、滤波器及电子设备Bulk acoustic wave resonator, filter and electronic equipment with mass loading on both sides of piezoelectric layer 技术领域technical field
本公开的实施例涉及半导体领域,尤其涉及一种体声波谐振器、一种具有该谐振器的滤波器,以及一种电子设备。Embodiments of the present disclosure relate to the field of semiconductors, and in particular, to a bulk acoustic wave resonator, a filter having the resonator, and an electronic device.
背景技术Background technique
电子器件作为电子设备的基本元素,已经被广泛应用,其应用范围包括移动电话、汽车、家电设备等。此外,未来即将改变世界的人工智能、物联网、5G通讯等技术仍然需要依靠电子器件作为基础。As the basic elements of electronic equipment, electronic devices have been widely used, and their applications include mobile phones, automobiles, home appliances and so on. In addition, technologies such as artificial intelligence, the Internet of Things, and 5G communications that will change the world in the future still need to rely on electronic devices as their foundation.
薄膜体声波谐振器(Film Bulk Acoustic Resonator,简称FBAR,又称为体声波谐振器,也称BAW)作为压电器件的重要成员正在通信领域发挥着重要作用,特别是FBAR滤波器在射频滤波器领域市场占有份额越来越大,FBAR具有尺寸小、谐振频率高、品质因数高、功率容量大、滚降效应好等优良特性,其滤波器正在逐步取代传统的声表面波(SAW)滤波器和陶瓷滤波器,在无线通信射频领域发挥巨大作用,其高灵敏度的优势也能应用到生物、物理、医学等传感领域。Film Bulk Acoustic Resonator (FBAR, also known as Bulk Acoustic Resonator, also known as BAW) as an important member of piezoelectric devices is playing an important role in the field of communication, especially FBAR filter in radio frequency filter The market share in the field is increasing. FBAR has excellent characteristics such as small size, high resonant frequency, high quality factor, large power capacity, and good roll-off effect. Its filters are gradually replacing traditional surface acoustic wave (SAW) filters And ceramic filters, play a huge role in the field of wireless communication radio frequency, its high sensitivity advantage can also be applied to biological, physical, medical and other sensing fields.
薄膜体声波谐振器的结构主体为由电极-压电薄膜-电极组成的“三明治”结构,即两层金属电极层之间夹一层压电材料。通过在两电极间输入正弦信号,FBAR利用逆压电效应将输入电信号转换为机械谐振,并且再利用压电效应将机械谐振转换为电信号输出。The structural main body of the thin film bulk acoustic wave resonator is a "sandwich" structure composed of an electrode-piezoelectric film-electrode, that is, a piezoelectric material is sandwiched between two metal electrode layers. By inputting a sinusoidal signal between two electrodes, the FBAR uses the inverse piezoelectric effect to convert the input electrical signal into mechanical resonance, and then uses the piezoelectric effect to convert the mechanical resonance into an electrical signal output.
现有技术中,已经提出在谐振器的顶电极上设置完整的质量负载来调整谐振器的频率。这种方法对频率的调整量取决于厚度控制精度,如果需要多种频率的谐振器,则需要沉积多种厚度的质量负载层,工艺复杂,且精度不易控制。此外,也已经提出在谐振器顶电极上设置图形化的质量负载,通过调节质量负载层的图形密度来实现频率调整。但是,单一图形结构在引入质量负载的过程中,可能会导致某些频率范围内的寄生模式或者损耗增强,从而损害谐振器电学性能。In the prior art, it has been proposed to tune the frequency of the resonator by placing a complete mass load on the top electrode of the resonator. The amount of frequency adjustment in this method depends on the thickness control accuracy. If resonators with multiple frequencies are required, mass load layers with multiple thicknesses need to be deposited, the process is complicated, and the accuracy is not easy to control. In addition, it has also been proposed to provide patterned mass loading on the top electrode of the resonator to achieve frequency tuning by adjusting the pattern density of the mass loading layer. However, the introduction of mass loading by a single pattern structure may lead to increased spurious modes or losses in certain frequency ranges, thereby impairing the electrical performance of the resonator.
此外,薄膜体声波谐振器主要利用压电薄膜的纵向压电系数产生压电效应,所以其主要工作模式为厚度方向上的纵波模式,即体声波谐振器的声波主要在谐振器的薄膜体内,而且主要的振动方向在纵向。但是由于存 在边界,在边界处会存在不垂直于压电膜层的兰姆波,这时横向的兰姆波会从压电膜层的横向漏出,导致声学损失,从而使得谐振器的Q值减小。In addition, the thin-film bulk acoustic wave resonator mainly uses the longitudinal piezoelectric coefficient of the piezoelectric film to generate the piezoelectric effect, so its main operating mode is the longitudinal wave mode in the thickness direction, that is, the acoustic wave of the bulk acoustic wave resonator is mainly in the resonator. And the main vibration direction is in the longitudinal direction. However, due to the existence of a boundary, there will be Lamb waves that are not perpendicular to the piezoelectric film layer at the boundary. At this time, the lateral Lamb wave will leak out from the lateral direction of the piezoelectric film layer, resulting in acoustic loss, thus making the Q value of the resonator. decrease.
发明内容SUMMARY OF THE INVENTION
为缓解或解决现有技术中的上述问题的至少一个方面,提出本公开。The present disclosure is made to alleviate or solve at least one aspect of the above-mentioned problems in the prior art.
根据本公开的实施例的一个方面,提出了一种体声波谐振器,包括:According to an aspect of the embodiments of the present disclosure, a bulk acoustic wave resonator is proposed, comprising:
基底;base;
声学镜;acoustic mirror;
底电极;bottom electrode;
顶电极;和top electrode; and
压电层,设置在底电极与顶电极之间,a piezoelectric layer, arranged between the bottom electrode and the top electrode,
其中:in:
所述压电层的上侧与所述压电层的下侧分别设置有第一质量负载阵列和第二质量负载阵列。The upper side of the piezoelectric layer and the lower side of the piezoelectric layer are respectively provided with a first mass load array and a second mass load array.
本公开的实施例还涉及一种滤波器,包括上述的体声波谐振器。Embodiments of the present disclosure also relate to a filter comprising the above-mentioned bulk acoustic wave resonator.
本公开的实施例也涉及一种电子设备,包括上述的滤波器或者上述的谐振器。Embodiments of the present disclosure also relate to an electronic device including the above-mentioned filter or the above-mentioned resonator.
附图说明Description of drawings
以下描述与附图可以更好地帮助理解本公开所公布的各种实施例中的这些和其他特点、优点,图中相同的附图标记始终表示相同的部件,其中:These and other features and advantages of the various embodiments disclosed in this disclosure may be better understood by the following description and accompanying drawings, wherein like reference numerals refer to like parts throughout, wherein:
图1A为根据本公开的一个示例性实施例的体声波谐振器的俯视示意图;1A is a schematic top view of a bulk acoustic wave resonator according to an exemplary embodiment of the present disclosure;
图1B为根据本公开的一个示例性实施例的体声波谐振器的沿图1A中的M1-M2线截得的截面示意图;1B is a schematic cross-sectional view of a bulk acoustic wave resonator taken along line M1-M2 in FIG. 1A according to an exemplary embodiment of the present disclosure;
图1C为根据本公开的另一个示例性实施例的体声波谐振器的沿图1A中的M1-M2线截得的截面示意图;1C is a schematic cross-sectional view of a bulk acoustic wave resonator taken along line M1-M2 in FIG. 1A according to another exemplary embodiment of the present disclosure;
图2A和2B分别示例性示出了在顶电极上设置质量负载的图示,其中图2A为以笛卡尔坐标排布,图2B为以极坐标图示;Figures 2A and 2B respectively exemplarily show a diagram of setting a mass load on the top electrode, wherein Figure 2A is an arrangement in Cartesian coordinates, and Figure 2B is a diagram in polar coordinates;
图3A-3C分别为根据本公开的不同示例性实施例的示出谐振器的叠 层结构的上下两侧设置的质量负载阵列(以笛卡尔坐标排布)复合后的示意性俯视图;3A-3C are respectively schematic top views showing the composite of mass load arrays (arranged in Cartesian coordinates) provided on the upper and lower sides of the laminated structure of the resonator according to different exemplary embodiments of the present disclosure;
图4为根据本公开的一个示例性实施例的示出谐振器的叠层结构的上下两侧设置的质量负载阵列(以极坐标排布)复合后的示意性俯视图;4 is a schematic top view showing a composite of mass load arrays (arranged in polar coordinates) provided on the upper and lower sides of the laminated structure of the resonator according to an exemplary embodiment of the present disclosure;
图5A和5B示出了根据本公开的一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图;5A and 5B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to an exemplary embodiment of the present disclosure, and after compounding;
图6A和6B示出了根据本公开的另一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图;FIGS. 6A and 6B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to another exemplary embodiment of the present disclosure, and after compounding;
图7A和7B示出了根据本公开的再一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图;FIGS. 7A and 7B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure;
图8A和8B示出了根据本公开的还一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图;FIGS. 8A and 8B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to still another exemplary embodiment of the present disclosure, and after compounding;
图9A和9B示出了根据本公开的又一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图;FIGS. 9A and 9B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure;
图10A和10B示出了根据本公开的又一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图;FIGS. 10A and 10B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure;
图11A和11B示出了根据本公开的又一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图;FIGS. 11A and 11B show a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and after compounding;
图12A和12B示出了根据本公开的又一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图;Figures 12A and 12B illustrate a schematic top view of mass load arrays arranged on the upper and lower sides of a laminated structure of a resonator according to yet another exemplary embodiment of the present disclosure, and a composite structure;
图13A示意性示出了作为对比示例的仅在谐振器的单侧设置质量负载阵列的谐振器的串联谐振频率(左侧图)及并联谐振频率(右侧图)附近处的阻抗特性曲线;13A schematically shows impedance characteristic curves at the vicinity of the series resonance frequency (left side graph) and the parallel resonance frequency (right side graph) of a resonator in which a mass load array is provided only on one side of the resonator as a comparative example;
13B和13C分别示意性示出了根据本公开实施例的在谐振器的上下两侧均设置质量负载阵列的谐振器的串联谐振频率(左侧图)及并联谐振频率(右侧图)附近处的阻抗特性曲线。13B and 13C schematically illustrate the locations near the series resonant frequency (left panel) and the parallel resonant frequency (right panel) of a resonator provided with mass-loaded arrays on both the upper and lower sides of the resonator, respectively, according to an embodiment of the present disclosure. impedance characteristic curve.
具体实施方式detailed description
下面通过实施例,并结合附图,对本公开的技术方案作进一步具体的 说明。下述参照附图对本公开实施方式的说明旨在对本公开的总体公开构思进行解释,而不应当理解为对本公开的一种限制。The technical solutions of the present disclosure will be further specifically described below through the embodiments and in conjunction with the accompanying drawings. The following description of the embodiments of the present disclosure with reference to the accompanying drawings is intended to explain the general disclosed concept of the present disclosure, and should not be construed as a limitation of the present disclosure.
图1A为根据本公开的一个示例性实施例的体声波谐振器的俯视示意图,图1B为根据本公开的一个示例性实施例的体声波谐振器的沿图1A中的M1-M2线截得的截面示意图,图1C为根据本公开的另一个示例性实施例的体声波谐振器的沿图1A中的M1-M2线截得的截面示意图。1A is a schematic top view of a bulk acoustic wave resonator according to an exemplary embodiment of the present disclosure, and FIG. 1B is a schematic view of the bulk acoustic wave resonator according to an exemplary embodiment of the present disclosure taken along the line M1-M2 in FIG. 1A FIG. 1C is a schematic cross-sectional view of a bulk acoustic wave resonator according to another exemplary embodiment of the present disclosure, taken along the line M1-M2 in FIG. 1A .
本公开中的附图标记说明如下:Reference numerals in this disclosure are explained as follows:
100:基底,可选材料为单晶硅、氮化镓、砷化镓、蓝宝石、石英、碳化硅、金刚石等。100: Substrate, optional materials are single crystal silicon, gallium nitride, gallium arsenide, sapphire, quartz, silicon carbide, diamond, etc.
110:声学阻抗层一或第一声学阻抗层,材料可以为氮化铝、二氧化硅、氮化硅、多晶硅、非晶硅。110: The first acoustic impedance layer or the first acoustic impedance layer, the material may be aluminum nitride, silicon dioxide, silicon nitride, polysilicon, or amorphous silicon.
120:声学阻抗层二或第二声学阻抗层,同时也作为牺牲层。第二声阻抗层的材料可以为二氧化硅、掺杂二氧化硅、多晶硅、非晶硅等,但与第一声阻抗层材料不同,且第二声阻抗层的刻蚀剂不易刻蚀或不刻蚀第一声阻抗层材料。120: The second acoustic impedance layer or the second acoustic impedance layer, which also serves as a sacrificial layer. The material of the second acoustic impedance layer can be silicon dioxide, doped silicon dioxide, polysilicon, amorphous silicon, etc., but it is different from the material of the first acoustic impedance layer, and the etchant of the second acoustic impedance layer is not easy to etch or The material of the first acoustic impedance layer is not etched.
130:声学镜,可为空腔,也可采用布拉格反射层及其他等效形式。本公开所示的实施例中采用的是空腔。130: Acoustic mirror, which can be a cavity, or a Bragg reflector and other equivalent forms. Cavities are employed in the embodiments shown in this disclosure.
140:底电极,材料可选钼、钌、金、铝、镁、钨、铜,钛、铱、锇、铬或以上金属的复合或其合金等。140: Bottom electrode, the material can be selected from molybdenum, ruthenium, gold, aluminum, magnesium, tungsten, copper, titanium, iridium, osmium, chromium or the composite of the above metals or their alloys.
145:下侧质量负载阵列。下侧质量负载是由底电极本身材料形成的凸起或在底电极上形成的凹陷。下侧质量负载的材料也可以不同于底电极。下侧质量负载设置在压电层的下侧,其不限于制作于底电极的下方,也可以制作在压电层与底电极之间,或者制作在底电极中。145: Lower Mass Load Array. The underside mass loading is a protrusion formed by the material of the bottom electrode itself or a depression formed on the bottom electrode. The material of the underside mass loading can also be different from the bottom electrode. The lower mass load is arranged on the lower side of the piezoelectric layer, which is not limited to be fabricated under the bottom electrode, but can also be fabricated between the piezoelectric layer and the bottom electrode, or fabricated in the bottom electrode.
150:压电层,可以为单晶压电材料,可选的,如:单晶氮化铝、单晶氮化镓、单晶铌酸锂、单晶锆钛酸铅(PZT)、单晶铌酸钾、单晶石英薄膜、或者单晶钽酸锂等材料,也可以为多晶压电材料(与单晶相对应,非单晶材料),可选的,如多晶氮化铝、氧化锌、PZT等,还可是包含上述材料的一定原子比的稀土元素掺杂材料,例如可以是掺杂氮化铝,掺杂氮化铝至少含一种稀土元素,如钪(Sc)、钇(Y)、镁(Mg)、钛(Ti)、镧(La)、铈(Ce)、镨(Pr)、钕(Nd)、钷(Pm)、钐(Sm)、铕(Eu)、钆(Gd)、 铽(Tb)、镝(Dy)、钬(Ho)、铒(Er)、铥(Tm)、镱(Yb)、镥(Lu)等。150: Piezoelectric layer, which can be a single crystal piezoelectric material, optional, such as: single crystal aluminum nitride, single crystal gallium nitride, single crystal lithium niobate, single crystal lead zirconate titanate (PZT), single crystal Potassium niobate, single crystal quartz film, or single crystal lithium tantalate and other materials can also be polycrystalline piezoelectric materials (corresponding to single crystal, non-single crystal materials), optional, such as polycrystalline aluminum nitride, Zinc oxide, PZT, etc., can also be a rare earth element doped material containing a certain atomic ratio of the above materials, for example, can be doped aluminum nitride, and doped aluminum nitride contains at least one rare earth element, such as scandium (Sc), yttrium (Y), magnesium (Mg), titanium (Ti), lanthanum (La), cerium (Ce), praseodymium (Pr), neodymium (Nd), promethium (Pm), samarium (Sm), europium (Eu), gadolinium (Gd), terbium (Tb), dysprosium (Dy), holmium (Ho), erbium (Er), thulium (Tm), ytterbium (Yb), lutetium (Lu) and the like.
155:释放孔,其用于蚀刻牺牲层形成空腔。155: Release holes for etching the sacrificial layer to form a cavity.
160:顶电极,其材料可与底电极相同,材料可选钼、钌、金、铝、镁、钨、铜,钛、铱、锇、铬或以上金属的复合或其合金等。顶电极和底电极材料一般相同,但也可以不同。160: The top electrode, the material of which can be the same as the bottom electrode, and the material can be selected from molybdenum, ruthenium, gold, aluminum, magnesium, tungsten, copper, titanium, iridium, osmium, chromium or a composite of the above metals or their alloys. The top and bottom electrode materials are generally the same, but can also be different.
165:上侧质量负载阵列。上侧质量负载是由顶电极本身材料形成的凸起或在顶电极上形成的凹陷,或者在顶电极上设置有钝化层或工艺层的情况下,也可以是由工艺层的材料形成的凸起或凹陷。上侧质量负载的材料也可以不同于顶电极或工艺层,例如,在顶电极上表面的工艺层为氮化铝时,上侧质量负载的材料可以选用二氧化硅或金属氧化物等。上侧质量负载设置在压电层的上侧,其不限于制作于顶电极的上方,也可以制作在压电层与顶电极之间,或者制作在顶电极中。165: Upper Mass Load Array. The upper mass load is a protrusion formed by the material of the top electrode itself or a depression formed on the top electrode, or in the case where a passivation layer or a process layer is provided on the top electrode, it can also be formed by the material of the process layer. Raised or recessed. The material supported by the upper mass may also be different from the top electrode or the process layer. For example, when the process layer on the upper surface of the top electrode is aluminum nitride, the material supported by the upper mass may be silicon dioxide or metal oxide. The upper mass load is arranged on the upper side of the piezoelectric layer, and is not limited to being fabricated above the top electrode, but can also be fabricated between the piezoelectric layer and the top electrode, or fabricated in the top electrode.
170:顶电极引出部,其可与顶电极同时制得,材料可选钼、钌、金、铝、镁、钨、铜,钛、铱、锇、铬或以上金属的复合或其合金等。170: the top electrode lead-out part, which can be prepared at the same time as the top electrode, and the material can be selected from molybdenum, ruthenium, gold, aluminum, magnesium, tungsten, copper, titanium, iridium, osmium, chromium or a composite of the above metals or their alloys.
180:电极连接部一(Bonding PAD,或底电极电连接层),材料可为铜,金或以上金属的复合或其合金等。180: Electrode connection part one (Bonding PAD, or bottom electrode electrical connection layer), the material can be copper, gold or a composite of above metals or alloys thereof.
190:电极连接部二(Bonding PAD,或顶电极电连接层),材料可为铜,金或以上金属的复合或其合金等。190: The second electrode connection part (Bonding PAD, or top electrode electrical connection layer), the material can be copper, gold or a composite of the above metals or their alloys, etc.
如图1B所示,顶电极160的上侧设置有质量负载阵列165,底电极140的下侧设置有质量负载阵列145。As shown in FIG. 1B , the upper side of the top electrode 160 is provided with a mass load array 165 , and the lower side of the bottom electrode 140 is provided with a mass load array 145 .
在本公开中,在由顶电极、底电极和单晶压电层组成的叠层结构的上下两侧均设置有质量负载,从而为通过质量负载来调节谐振器的频率引用来了灵活性,有利于实现对谐振器频率控制的便利性和精度。In the present disclosure, mass loads are provided on both the upper and lower sides of the stacked structure composed of the top electrode, the bottom electrode and the single crystal piezoelectric layer, so as to provide flexibility for adjusting the frequency reference of the resonator by the mass load, It is beneficial to realize the convenience and precision of the frequency control of the resonator.
在本公开中,通过在叠层结构的上下两侧均设置质量负载阵列,使得体声波谐振器在厚度方向上具有更好的空间对称性,通过选择上下阵列之间的空间位置配合关系,还可以有利于抑制谐振器工作过程中产生的寄生模式,并提高谐振器的Q值。In the present disclosure, by arranging mass load arrays on both the upper and lower sides of the laminated structure, the bulk acoustic wave resonator has better spatial symmetry in the thickness direction. It can be beneficial to suppress the spurious mode generated during the operation of the resonator, and improve the Q value of the resonator.
在图1B中,压电层150与基底100之间设置有声学阻抗结构,声学镜130在谐振器的横向方向上位于声学阻抗结构之间,所述声学阻抗结构 包括在横向方向上彼此相邻设置的第一声学阻抗层110和第二声学阻抗层120,更具体的,声学镜130在谐振器的横向方向上位于第一声学阻抗层110之间。底电极140的电极连接端被第一声学阻抗层110的一部分覆盖,底电极140的非电极连接端与第一声学阻抗层110在横向方向上间隔开。In FIG. 1B , an acoustic impedance structure is disposed between the piezoelectric layer 150 and the substrate 100 , and the acoustic mirror 130 is located between the acoustic impedance structures in the lateral direction of the resonator, the acoustic impedance structures including being adjacent to each other in the lateral direction The first acoustic impedance layer 110 and the second acoustic impedance layer 120 are provided, and more specifically, the acoustic mirror 130 is located between the first acoustic impedance layers 110 in the lateral direction of the resonator. The electrode connection end of the bottom electrode 140 is covered by a part of the first acoustic impedance layer 110 , and the non-electrode connection end of the bottom electrode 140 is spaced apart from the first acoustic impedance layer 110 in the lateral direction.
在本公开中,第一声学阻抗层与第二声学阻抗层的声学阻抗不同,以形成阻抗不匹配,对声波形成连续反射,形成对横向声波的反射结构,从而用于防止横向声波泄露,有利于将能量锁定在谐振器内,从而提高Q值。In the present disclosure, the acoustic impedances of the first acoustic impedance layer and the second acoustic impedance layer are different to form impedance mismatch, form continuous reflection for acoustic waves, and form a reflection structure for transverse acoustic waves, so as to prevent transverse acoustic waves from leaking, It is beneficial to lock the energy in the resonator, thereby improving the Q value.
在本公开中,利用了单晶压电材料,可以使压电损耗更低,从而得到更高的谐振器Q值,同时可以提高机电耦合系数和功率容量。In the present disclosure, the single crystal piezoelectric material is used, so that the piezoelectric loss can be lower, so as to obtain a higher Q value of the resonator, and at the same time, the electromechanical coupling coefficient and power capacity can be improved.
在进一步的实施例中,第一声学阻抗层110与第二声学阻抗层120与压电层150接触的部分的宽度A和B分别为mλ 1/4以及nλ 2/4,其中m和n均为奇数,例如为1,3,5,7等,λ 1和λ 2分别为第一声学阻抗层和第二声学阻抗层在谐振频率处沿横向传播的声波波长。所述谐振频率是谐振器谐振区间内的某一频率,可以是谐振器的串联谐振频率或并联谐振频率,也可以是串并联谐振频率之间的某一频率,或者略低于串联谐振频率或略高于并联谐振频率的某一频率。在附图中,第一声学阻抗层110的所述宽度以A表示,而第二声学阻抗层120的所述宽度则以B表示。选取上述宽度,有利于形成有效的声学阻抗不匹配,防止横向声波泄露,进一步提高谐振器的Q值。m与n可以相同,也可以不同,均在本公开的保护范围之内。 In a further embodiment, the widths A and B of the portions of the first acoustic impedance layer 110 and the second acoustic impedance layer 120 in contact with the piezoelectric layer 150 are mλ 1 /4 and nλ 2 /4, respectively, where m and n are odd numbers, such as 1, 3, 5, 7, etc., λ 1 and λ 2 are the wavelengths of acoustic waves propagating laterally at the resonance frequency of the first acoustic impedance layer and the second acoustic impedance layer, respectively. The resonant frequency is a certain frequency within the resonant interval of the resonator, which can be the series resonant frequency or the parallel resonant frequency of the resonator, or a certain frequency between the series and parallel resonant frequencies, or slightly lower than the series resonant frequency or A frequency slightly higher than the parallel resonant frequency. In the drawings, the width of the first acoustic impedance layer 110 is represented by A, and the width of the second acoustic impedance layer 120 is represented by B. Selecting the above-mentioned width is beneficial to form an effective acoustic impedance mismatch, prevent transverse acoustic wave leakage, and further improve the Q value of the resonator. m and n may be the same or different, which are all within the protection scope of the present disclosure.
形成第一声学阻抗层110的材料包括氮化铝、二氧化硅、氮化硅、多晶硅、非晶硅,形成第二声学阻抗层120的材料包括二氧化硅、掺杂二氧化硅、多晶硅、非晶硅。第一声学阻抗层110的材料与第二声学阻抗层120的材料彼此不同。可选的,形成第一声学阻抗层110的材料包括二氧化硅,形成第二声学阻抗层120的材料包括多晶硅。或者,形成第一声学阻抗层110杂二氧化硅。在本公开中,为了提高第一声学阻抗层110与第二声学阻抗层120的相接处的声学不匹配程度,两者的声学阻抗之差可以选择的尽可能大。The materials for forming the first acoustic impedance layer 110 include aluminum nitride, silicon dioxide, silicon nitride, polysilicon, and amorphous silicon, and the materials for forming the second acoustic impedance layer 120 include silicon dioxide, doped silicon dioxide, and polysilicon. , Amorphous silicon. The material of the first acoustic impedance layer 110 and the material of the second acoustic impedance layer 120 are different from each other. Optionally, the material for forming the first acoustic impedance layer 110 includes silicon dioxide, and the material for forming the second acoustic impedance layer 120 includes polysilicon. Alternatively, the first acoustic impedance layer 110 is formed of doped silicon dioxide. In the present disclosure, in order to improve the degree of acoustic mismatch at the junction of the first acoustic impedance layer 110 and the second acoustic impedance layer 120 , the difference between the acoustic impedances of the two may be selected as large as possible.
如图1B所示,底电极140的非电极连接端(图1B中的右端)的端面在横向方向上与声学阻抗结构中的第一声学阻抗层110间隔开,使得声波在底电极的非电极连接端和空隙之间的横向界面也形成全反射,从而减少声波泄露。基于非电极连接端处的空隙结构,可以进一步防止横向声波泄露,提高谐振器的Q值。另一方面,底电极140的非电极连接端(图1B中的右端)的端面如果被第一声阻抗层3覆盖,则会与顶电极在空腔外的部分形成寄生电容,从而影响谐振器的机电耦合系数。As shown in FIG. 1B , the end face of the non-electrode connection end (the right end in FIG. 1B ) of the bottom electrode 140 is spaced apart from the first acoustic impedance layer 110 in the acoustic impedance structure in the lateral direction, so that the acoustic wave is not in the bottom electrode. The lateral interface between the electrode connection end and the void also forms total reflection, thereby reducing acoustic leakage. Based on the void structure at the non-electrode connection end, transverse acoustic wave leakage can be further prevented and the Q value of the resonator can be improved. On the other hand, if the end face of the non-electrode connection end (the right end in FIG. 1B ) of the bottom electrode 140 is covered by the first acoustic impedance layer 3 , a parasitic capacitance will be formed with the part of the top electrode outside the cavity, thereby affecting the resonator The electromechanical coupling coefficient.
在可选的实施例中,在通过底电极140的电极连接端的谐振器的一个纵截面中(例如图1B所示的截面图中),底电极140的非电极连接端的端面在横向方向上与声学阻抗结构间隔开的距离可以在0.5μm-20μm的范围内。该距离除了端值之外,还可以是例如5μm,7μm等。In an alternative embodiment, in a longitudinal section of the resonator passing through the electrode connecting end of the bottom electrode 140 (eg, the cross-sectional view shown in FIG. 1B ), the end face of the non-electrode connecting end of the bottom electrode 140 is transversely aligned with the The distance that the acoustic impedance structures are spaced apart may be in the range of 0.5 μm-20 μm. The distance may be, for example, 5 μm, 7 μm, or the like, in addition to the end value.
在图1B所示的实施例中,底电极140在电极连接端的一侧被第一声学阻抗层110和第二声学阻抗层120形成的连续反射层或者声学阻抗结构包裹住,更具体的,被第一声学阻抗层110覆盖,一方面这种结构有利于提高谐振器的机械稳定性,且更容易将谐振器工作时产生的热量通过电极和第一声学阻抗层110传导到衬底,从而提高谐振器的功率容量,另一方面,虽然能量会从底电极端面泄露到第一声学阻抗层110中,但是由于存在第二声学阻抗层与第一声学阻抗层形成的反射界面,因此,有利于使能量尽可能多的锁定在谐振器内部,使谐振器保持较高Q值。In the embodiment shown in FIG. 1B , the bottom electrode 140 is surrounded by a continuous reflective layer or an acoustic impedance structure formed by the first acoustic impedance layer 110 and the second acoustic impedance layer 120 on one side of the electrode connection end. More specifically, Covered by the first acoustic impedance layer 110, on the one hand, this structure is beneficial to improve the mechanical stability of the resonator, and it is easier to conduct the heat generated during the operation of the resonator to the substrate through the electrodes and the first acoustic impedance layer 110 , thereby improving the power capacity of the resonator. On the other hand, although the energy will leak into the first acoustic impedance layer 110 from the end face of the bottom electrode, due to the existence of the reflection interface formed by the second acoustic impedance layer and the first acoustic impedance layer , therefore, it is beneficial to lock as much energy as possible inside the resonator, so that the resonator maintains a high Q value.
在本公开的一个实施例中,如图1B所示,可以选择第一声学阻抗层110的外侧面所在面与压电层的底面之间形成的角度θ1在100°-160°的范围内,具体的,可以为100°,120°,160°等。鉴于声学镜130对应的空间开始阶段由第二声学阻抗层120的材料填充(之后通过刻蚀第二声学阻抗层的材料而形成声学镜130),因此,选取该角度有利于在图形化了第一声学阻抗层110之后填充第二声学阻抗层120。在本公开的一个实施例中,如图1B所示,可以选择底电极140的端面外侧与压电层150的底面之间形成的角度α1在90°-160°的范围内,具体的,可以为90°、100°,120°,160°等。选取该角度有利于填充第一声学阻抗层110和第二声学阻抗层120。In one embodiment of the present disclosure, as shown in FIG. 1B , the angle θ1 formed between the surface where the outer surface of the first acoustic impedance layer 110 is located and the bottom surface of the piezoelectric layer can be selected to be in the range of 100°-160° , specifically, can be 100°, 120°, 160°, etc. Considering that the space corresponding to the acoustic mirror 130 is filled with the material of the second acoustic impedance layer 120 at the beginning (the acoustic mirror 130 is formed by etching the material of the second acoustic impedance layer later), therefore, choosing this angle is beneficial for patterning the first An acoustic impedance layer 110 is then filled with a second acoustic impedance layer 120 . In an embodiment of the present disclosure, as shown in FIG. 1B , the angle α1 formed between the outer side of the end surface of the bottom electrode 140 and the bottom surface of the piezoelectric layer 150 may be selected to be in the range of 90°-160°. 90°, 100°, 120°, 160°, etc. Selecting this angle is favorable for filling the first acoustic impedance layer 110 and the second acoustic impedance layer 120 .
图1C为根据本公开的另一个示例性实施例的体声波谐振器的类似于 沿图1中的M1-M2线截得的截面示意图,其中示出了底电极的电极引出部区域以及顶电极的电极引出部区域,且底电极的电极连接端被第一声学阻抗层110的一部分覆盖,底电极的非电极连接端与第一声学阻抗层110在横向方向上间隔开。在本公开的实施例中,如图1C所示,可以选择第一声学阻抗层110的外侧面所在面与压电层150的底面之间形成的角度θ2在20°-80°的范围内,具体的,可以为20°,60°,80°等。此外,如图1C所示,可以选择底电极140的端面外侧与压电层150的底面之间形成的角度α2在90°-160°的范围内,具体的,可以为90°、100°,120°,160°等。选取该角度有利于填充第一声学阻抗层110和第二声学阻抗层120。1C is a schematic cross-sectional view of a bulk acoustic wave resonator similar to that taken along line M1-M2 in FIG. 1 , showing the electrode lead-out region of the bottom electrode and the top electrode, according to another exemplary embodiment of the present disclosure. and the electrode connection end of the bottom electrode is covered by a part of the first acoustic impedance layer 110 , and the non-electrode connection end of the bottom electrode is spaced apart from the first acoustic impedance layer 110 in the lateral direction. In the embodiment of the present disclosure, as shown in FIG. 1C , the angle θ2 formed between the surface where the outer surface of the first acoustic impedance layer 110 is located and the bottom surface of the piezoelectric layer 150 can be selected to be in the range of 20°-80° , specifically, can be 20°, 60°, 80°, etc. In addition, as shown in FIG. 1C , the angle α2 formed between the outer side of the end surface of the bottom electrode 140 and the bottom surface of the piezoelectric layer 150 can be selected to be in the range of 90°-160°, specifically, 90°, 100°, 120°, 160°, etc. Selecting this angle is favorable for filling the first acoustic impedance layer 110 and the second acoustic impedance layer 120 .
在本公开中,第一声学阻抗层110与第二声学阻抗层120可以一起构成声学阻抗结构。但是,本公开不限于此,换言之,声学阻抗层的布置方式不限于此。其可以是包括在横向方向上依次相邻布置的第一声学阻抗层和第二声学阻抗层,或第一声学阻抗层、第二声学阻抗层以及第一声学阻抗层,或以上的组合。In the present disclosure, the first acoustic impedance layer 110 and the second acoustic impedance layer 120 may together constitute an acoustic impedance structure. However, the present disclosure is not limited thereto, in other words, the arrangement of the acoustic impedance layers is not limited thereto. It may include a first acoustic impedance layer and a second acoustic impedance layer arranged adjacent to one another in the lateral direction, or a first acoustic impedance layer, a second acoustic impedance layer, and a first acoustic impedance layer, or a combination of the above. combination.
图2A和2B分别示例性示出了在顶电极上设置质量负载的图示,其中图2A为以笛卡尔坐标排布,图2B为以极坐标图示。当叠层结构一侧的质量负载排布遵循一定坐标形式时,另一侧的的质量负载排布也遵循同样的坐标形式,并在此基础上在两侧的质量负载阵列之间形成位置配合关系。2A and 2B exemplarily show diagrams of disposing a mass load on the top electrode, respectively, wherein FIG. 2A is an arrangement in Cartesian coordinates, and FIG. 2B is a diagram in polar coordinates. When the mass load arrangement on one side of the laminated structure follows a certain coordinate form, the mass load arrangement on the other side also follows the same coordinate form, and on this basis, a positional fit is formed between the mass load arrays on both sides relation.
图3A-3C分别为根据本公开的不同示例性实施例的示出谐振器的叠层结构的上下两侧设置的质量负载阵列(以笛卡尔坐标排布)复合后的示意性俯视图。FIGS. 3A-3C are schematic top views showing the composite of mass load arrays (arranged in Cartesian coordinates) disposed on the upper and lower sides of the laminated structure of the resonator according to different exemplary embodiments of the present disclosure.
如图3A所示,以A1作为第一质量负载阵列中的质量负载,B1作为第二质量负载阵列中的质量负载,可以看到,第二质量负载阵列相对于第一质量负载阵列按矢量ε 0进行平移,这里的平移包括了在图3A中的横向平移以及纵向平移。如能够理解的,在可选的实施例中,平移也可以仅仅是横向平移或者纵向平移。 As shown in FIG. 3A , taking A1 as the mass load in the first mass load array and B1 as the mass load in the second mass load array, it can be seen that the second mass load array is relative to the first mass load array according to the vector ε 0 for translation, and the translation here includes the lateral translation and the longitudinal translation in FIG. 3A . As can be understood, in an optional embodiment, the translation may only be a lateral translation or a longitudinal translation.
在图3A中,A1对应的质量负载的尺寸与B1对应的质量负载的尺寸相同。P1和P2分别是A1对应的质量负载阵列水平方向和垂直方向上相邻质量负载间的距离,P1和P2可以相同,也可以不同,其范围在谐振器 总厚度的0.1倍到10倍的范围内。在本公开中,谐振器上下两侧的质量负载阵列的厚度在
Figure PCTCN2021103693-appb-000001
的范围内,且上下两侧厚度可以相同,也可以不同。
In FIG. 3A , the size of the mass load corresponding to A1 is the same as the size of the mass load corresponding to B1 . P1 and P2 are the distances between adjacent mass loads in the horizontal and vertical directions of the mass load array corresponding to A1, respectively. P1 and P2 can be the same or different, and their range is from 0.1 times to 10 times the total thickness of the resonator. Inside. In the present disclosure, the thicknesses of the mass-loaded arrays on the upper and lower sides of the resonator are
Figure PCTCN2021103693-appb-000001
The thickness of the upper and lower sides can be the same or different.
在本公开中,在两个质量负载的尺寸进行比较的情况下,在质量负载的横截面为圆形时,质量负载的尺寸指的是质量负载的横截面的半径;对于其他横截面形状,可以用横截面的等效半径来确定。In this disclosure, where the dimensions of two mass loads are compared, when the cross section of the mass load is circular, the size of the mass load refers to the radius of the cross section of the mass load; for other cross-sectional shapes, It can be determined by the equivalent radius of the cross section.
在可选的实施例中,图3A中,矢量ε 0的水平方向分量的长度范围在0-P1内,垂直方向分量的长度范围在0-P2内,其中的端点值(如0、P1或者P2)表示两个阵列完全重合。 In an optional embodiment, in FIG. 3A , the length of the horizontal component of the vector ε 0 is in the range of 0-P1, and the length of the vertical component is in the range of 0-P2, where the endpoint values (such as 0, P1 or P2) means that the two arrays are completely coincident.
如图3B所示,以A1和A2作为第一质量负载阵列中的质量负载,B1和B2作为第二质量负载阵列中的质量负载,可以看到,第二质量负载阵列相对于第一质量负载阵列按矢量ε 0进行平移,这里的平移包括了在图3B中的横向平移以及纵向平移。如能够理解的,在可选的实施例中,平移也可以仅仅是横向平移或者纵向平移。P1和P2分别是A1对应的质量负载阵列水平方向和垂直方向上相邻质量负载间的距离,P1和P2可以相同,也可以不同,其范围在谐振器总厚度的0.1倍到10倍的范围内。A2对应的质量负载阵列可以看做是A1对应的质量负载阵列按ε 1进行平移,这里的平移包括了图3B中的仅横向平移,在可选的实施例中,平移也可以是仅纵向平移,或者是横向平移及纵向平移的综合。其中,矢量ε 1的水平方向分量的长度范围在A1和A2质量负载单元半径之和到P1的范围内,垂直方向分量的长度范围在A1和A2质量负载单元半径之和到P2的范围内;矢量ε 0的水平方向分量的长度范围在0-P1内,垂直方向分量的长度范围在0-P2内,其中的0表示两个阵列完全重合(即一个阵列的所有质量负载与另一个阵列的对应质量负载重合)。 As shown in FIG. 3B , taking A1 and A2 as the mass loads in the first mass load array, and B1 and B2 as the mass loads in the second mass load array, it can be seen that the second mass load array is relative to the first mass load The array is translated by the vector ε 0 , where the translation includes the lateral translation in FIG. 3B as well as the longitudinal translation. As can be understood, in an optional embodiment, the translation may only be a lateral translation or a longitudinal translation. P1 and P2 are the distances between adjacent mass loads in the horizontal and vertical directions of the mass load array corresponding to A1, respectively. P1 and P2 can be the same or different, and their range is from 0.1 times to 10 times the total thickness of the resonator. Inside. The mass load array corresponding to A2 can be regarded as the mass load array corresponding to A1 , which is translated according to ε 1. The translation here includes only the lateral translation in FIG. 3B. In an optional embodiment, the translation can also be only the longitudinal translation. , or a combination of horizontal translation and vertical translation. Wherein, the length of the horizontal component of the vector ε 1 is within the range from the sum of the radii of the mass load cells A1 and A2 to P1, and the length of the vertical component is within the range from the sum of the radii of the mass load cells A1 and A2 to the range of P2; The length of the horizontal component of the vector ε 0 is in the range of 0-P1, and the length of the vertical component is in the range of 0-P2, where 0 means that the two arrays are completely coincident (that is, all the mass loads of one array are in the range of the other array. Corresponding mass load coincidence).
如图3B所示,A1对应的质量负载和A2对应的质量负载的尺寸不同;B1对应的质量负载和B2对应的质量负载的尺寸不同。As shown in FIG. 3B , the size of the mass load corresponding to A1 and the mass load corresponding to A2 are different; the size of the mass load corresponding to B1 and the mass load corresponding to B2 are different.
A1对应的质量负载的尺寸可以与B1对应的质量负载的尺寸相同或者不同,A2对应的质量负载的尺寸可以与B2对应的质量负载的尺寸相同或者不同。The size of the mass load corresponding to A1 may be the same as or different from the size of the mass load corresponding to B1, and the size of the mass load corresponding to A2 may be the same or different from the size of the mass load corresponding to B2.
如图3C所示,以A1作为第一质量负载阵列中的质量负载,B1作为 第二质量负载阵列中的质量负载,类似的,第二质量负载阵列相对于第一质量负载阵列按矢量进行平移,这里的平移包括了在图3A中的横向平移以及纵向平移。如能够理解的,在可选的实施例中,平移也可以仅仅是横向平移或者纵向平移。As shown in FIG. 3C , with A1 as the mass load in the first mass load array and B1 as the mass load in the second mass load array, similarly, the second mass load array is translated by a vector relative to the first mass load array , the translation here includes the lateral translation and the longitudinal translation in FIG. 3A . As can be understood, in an optional embodiment, the translation may only be a lateral translation or a longitudinal translation.
在图3C中,A1对应的质量负载的尺寸与B1对应的质量负载的尺寸不同。In FIG. 3C, the size of the mass load corresponding to A1 is different from the size of the mass load corresponding to B1.
以下结合仿真结果示例性说明双侧质量负载相比于单侧质量负载,除了可以起到频率调整的效果,还可以起到提高谐振器Q值的效果。In the following, the simulation results are used to illustrate that, compared with the single-sided mass load, the double-sided mass load can not only have the effect of frequency adjustment, but also the effect of improving the Q value of the resonator.
图13A是仅在顶电极上设置一定厚度(如
Figure PCTCN2021103693-appb-000002
)质量负载阵列(如图3A中A1对应的质量负载阵列,且P1=P2=谐振器总厚度的2倍,质量负载单元的直径为P1的一半)的谐振器的串联谐振频率及并联谐振频率附近处的阻抗特性曲线。
Figure 13A shows that only a certain thickness is provided on the top electrode (such as
Figure PCTCN2021103693-appb-000002
) The series resonant frequency and the parallel resonant frequency of the resonator of the mass load array (the mass load array corresponding to A1 in Figure 3A, and P1=P2=2 times the total thickness of the resonator, and the diameter of the mass load unit is half of P1) Impedance characteristic curve in the vicinity.
图13B是在谐振器上下两侧均设置相同厚度(如
Figure PCTCN2021103693-appb-000003
)质量负载阵列(如图3A中A1和B1对应的质量负载阵列,且ε 0=0时)的谐振器的串联谐振频率及并联谐振频率附近处的阻抗特性曲线。可以看到,在质量负载总厚度相同的条件下,上下两侧分布相比单侧分布可以实现更大的质量负载效果,即产生更大的频率变化幅度;同时,串联阻抗显著降低(从2.44Ω降低到0.84Ω,降低幅度约60%),相应的Q值会得到显著提升,说明在本实施例中上下两侧分布的质量负载能够在串联谐振频率附近产生针对横波传播的禁带,从而使更多的能量集中在串联谐振的振动模式中,提高谐振器串联谐振点的Q值;此外,并联阻抗会略有降低(从2420Ω降低到2300Ω,降低幅度约5%),其恶化程度远小于串联阻抗改善程度。
Figure 13B shows that the same thickness is set on both the upper and lower sides of the resonator (such as
Figure PCTCN2021103693-appb-000003
) the impedance characteristic curve of the resonator at the series resonance frequency and the parallel resonance frequency of the mass load array (the mass load array corresponding to A1 and B1 in FIG. 3A , and ε 0 =0). It can be seen that under the condition that the total thickness of the mass load is the same, the distribution on the upper and lower sides can achieve a larger mass load effect than the single-side distribution, that is, a larger frequency change amplitude; at the same time, the series impedance is significantly reduced (from 2.44 Ω is reduced to 0.84Ω, the reduction range is about 60%), the corresponding Q value will be significantly improved, indicating that in this embodiment, the mass load distributed on the upper and lower sides can generate a forbidden band for shear wave propagation near the series resonance frequency, thus Concentrate more energy in the vibration mode of the series resonance, and increase the Q value of the resonator series resonance point; in addition, the parallel impedance will be slightly reduced (from 2420Ω to 2300Ω, the reduction range is about 5%), and the degree of deterioration is far less than the series impedance improvement.
图13C是在谐振器上下两侧均设置相同厚度(如
Figure PCTCN2021103693-appb-000004
)质量负载阵列但二者具有一定的横向平移关系(如图3A中A1和B1对应的质量负载阵列,且ε 0=0.5×P1时)的谐振器的串联谐振频率及并联谐振频率附近处的阻抗特性曲线。可以看到,相比于图13A所示的单侧质量负载结果,图13C所示的串联阻抗具有显著降低(从2.44Ω降低到1.07Ω,降低幅度约56%),且并联阻抗具有一定程度提升(从2420Ω提高到2565Ω,提高幅度约6%),即相比图13B只提高串联谐振频率附近的Q值,图13C所述实施例通过调整上下两侧质量负载的偏移关系,能够全面提 高谐振器全频段Q值(包括串联谐振频率和并联谐振频率附近的Q值)。
Figure 13C shows that the same thickness is set on both the upper and lower sides of the resonator (such as
Figure PCTCN2021103693-appb-000004
) mass-loaded arrays but the two have a certain lateral translation relationship (as shown in Figure 3A for the mass-loaded arrays corresponding to A1 and B1, and when ε 0 =0.5×P1) of the resonator’s series resonant frequency and parallel resonant frequency Impedance characteristic curve. It can be seen that compared to the single-sided mass load results shown in Figure 13A, the series impedance shown in Figure 13C has a significant reduction (from 2.44Ω to 1.07Ω, a reduction of about 56%), and the parallel impedance has a certain degree of reduction. The improvement (from 2420Ω to 2565Ω, the improvement range is about 6%), that is, compared with Figure 13B, only the Q value near the series resonance frequency is increased. The embodiment shown in Figure 13C can fully Increase the Q value of the resonator in the whole frequency band (including the Q value near the series resonance frequency and the parallel resonance frequency).
图4为根据本公开的一个示例性实施例的示出谐振器的叠层结构的上下两侧设置的质量负载阵列(以极坐标排布)复合后的示意性俯视图。FIG. 4 is a schematic top view showing a composite of mass load arrays (arranged in polar coordinates) disposed on the upper and lower sides of the laminated structure of the resonator according to an exemplary embodiment of the present disclosure.
如图4所示,以A1作为第一质量负载阵列中的质量负载,B1作为第二质量负载阵列中的质量负载。其中,A1对应的质量负载阵列在周向上具有N个质量负载单元,N大于等于3,相邻质量负载具有夹角α 3(其值为360°/N),在径向上相邻质量负载单元之间的间距为P3,其范围在谐振器总厚度的0.1倍到10倍的范围内,且在可选的实施例中,从谐振器中心到外侧,每层相邻质量负载间距离P3可以相同,也可以从小到大变化,或者从大到小变化。第二质量负载阵列相对于第一质量负载阵列旋转了角度α 0,其转动方向可以是顺时针,也可以是逆时针,该角度的范围可以在0-α 3的范围内,其中的端点值(如0或α 3)表示两个阵列完全重合(即一个阵列的所有质量负载与另一个阵列的对应质量负载重合)。 As shown in FIG. 4 , A1 is used as the mass load in the first mass load array, and B1 is used as the mass load in the second mass load array. Among them, the mass load array corresponding to A1 has N mass load units in the circumferential direction, N is greater than or equal to 3, the adjacent mass loads have an included angle α 3 (its value is 360°/N), and the adjacent mass load units in the radial direction are The spacing between them is P3, which is in the range of 0.1 times to 10 times the total thickness of the resonator, and in an optional embodiment, from the center of the resonator to the outside, the distance P3 between adjacent mass loads of each layer can be The same can also be changed from small to large, or from large to small. The second mass load array is rotated relative to the first mass load array by an angle α 0 , and its rotation direction can be clockwise or counterclockwise, and the range of the angle can be in the range of 0-α 3 , where the endpoint value is (eg 0 or α 3 ) means that the two arrays are fully coincident (ie all mass loadings of one array coincide with the corresponding mass loadings of the other array).
两个阵列的配合也可以是互补的配合关系。例如,可以先按笛卡尔坐标或极坐标方式将质量负载阵列分布于叠层结构的一侧上,然后按一定方式将阵列划分为若干区域,并将一定区域内的阵列转移至另一侧上(即在一侧的特定位置设置的质量负载,在另一侧的对应的特定位置并不设置),从而形成在叠层结构的两侧阵列的互补关系。The mating of the two arrays can also be a complementary mating relationship. For example, the mass load array can be distributed on one side of the stack structure in Cartesian or polar coordinates, then the array can be divided into several areas in a certain way, and the array in a certain area can be transferred to the other side (ie, a mass load provided in a specific position on one side is not provided in a corresponding specific position on the other side), thereby forming a complementary relationship of the arrays on both sides of the stacked structure.
图5A和5B示出了根据本公开的一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图。5A and 5B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to an exemplary embodiment of the present disclosure, and composited.
如图5A所示,叠层结构的一侧的质量负载阵列具有笛卡尔坐标分布,利用一个五边形边界P1将所述阵列划分为两部分,并将位于所述5边形外侧的阵列转移至叠层结构的另一侧,最终形成图5B中所示在叠层结构两侧的阵列的配合关系。其中对于落在P1边界“上”(一部分落在边界内,一部分落在边界外)的阵列单元,有若干划分原则:例如可将此类陈列单元全部认为是属于边界P1内部或外部区域,还可以根据某个陈列单元的俯视面积被边界P1所划分比例来决定,如落在P1外侧的面积多于内部面积时把该单元划入P1边界外侧,反之则划为内侧,若P1恰好平分陈列单元俯视面积则该单元划分入内外区域中任意一个。As shown in FIG. 5A, the mass-loaded array on one side of the laminated structure has a Cartesian coordinate distribution, the array is divided into two parts by a pentagon boundary P1, and the array located outside the pentagon is transferred To the other side of the stack, the mating relationship of the arrays on both sides of the stack as shown in FIG. 5B is finally formed. Among them, there are several division principles for the array cells that fall "on" the boundary of P1 (part of it falls within the boundary, and part of it falls outside the boundary). It can be determined according to the ratio of the top-view area of a certain display unit divided by the boundary P1. If the area falling on the outside of P1 is larger than the internal area, the unit will be classified outside the boundary of P1, otherwise, it will be classified as the inside. If P1 just bisects the display The unit top view area is divided into any one of the inner and outer areas.
在图5B中,可以看到,一侧的阵列为多边形,而另一侧的阵列为环 状多变形,且该多边形与环形多边形的内缘配合。在进一步的实施例中,图5B左侧的阵列或多边形的形状与图5B右侧的环状多边形的形状相似或者与谐振器的有效区域的形状相似。In Figure 5B, it can be seen that the array on one side is a polygon, while the array on the other side is an annular polymorph, and the polygon fits with the inner edge of the annular polygon. In further embodiments, the shape of the array or polygon on the left side of FIG. 5B is similar to the shape of the ring-shaped polygon on the right side of FIG. 5B or the shape of the active area of the resonator.
虽然没有示出,类似于后续的图7B所示的,可以在图5A和5B所示的实施例中也设置多边环形。Although not shown, a polygonal ring may also be provided in the embodiment shown in Figures 5A and 5B, similar to that shown in the subsequent Figure 7B.
图6A和6B示出了根据本公开的另一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图。6A and 6B illustrate a schematic top view of mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to another exemplary embodiment of the present disclosure, and the composite structure.
如图6A所示,叠层结构的一侧的阵列具有极坐标分布,利用一个圆形边界C1将所述阵列划分为两部分,并将位于所述圆形外侧的阵列转移至叠层结构的另一侧,最终形成图6B中所示的叠层结构的两侧的阵列的配合关系。As shown in FIG. 6A , the array on one side of the laminated structure has a polar coordinate distribution, and the array is divided into two parts by a circular boundary C1, and the array located on the outer side of the circle is transferred to the laminated structure. On the other side, the mating relationship of the arrays on both sides of the laminated structure shown in FIG. 6B is finally formed.
图7A和7B示出了根据本公开的再一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图。7A and 7B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure.
如图7A和7B所示,可以在图6A-6B的实施例中,设置多个圆形边界,从而如图7A所示,按极坐标分布于叠层结构的一侧的阵列被2个圆形边界C1C2划分为3部分,并将其中相互间隔的两个圆形部分内的环状阵列转移至叠层结构的另一侧从而形成图7B中的配合关系。As shown in Figures 7A and 7B, in the embodiment of Figures 6A-6B, a plurality of circular boundaries may be provided, so that as shown in Figure 7A, the array distributed in polar coordinates on one side of the laminated structure is surrounded by 2 circles The shape boundary C1C2 is divided into 3 parts, and the annular array in the two circular parts spaced from each other is transferred to the other side of the laminated structure to form the mating relationship in FIG. 7B .
划分边界的形状也不仅限于如圆形、多边形、环形等封闭几何形状,也可以是其他几何形状,如直线或由多条直线组合形成的几何形状。图8A和8B示出了根据本公开的还一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图。The shape of the dividing boundary is not limited to closed geometric shapes such as circles, polygons, and rings, and can also be other geometric shapes, such as straight lines or geometric shapes formed by a combination of multiple straight lines. 8A and 8B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to still another exemplary embodiment of the present disclosure, and composited.
在图8A中,按笛卡尔坐标分布的阵列被若干直线交替划分为若干竖直带状区域(显然,也可以划分为水平带状区域),将这些区域交替标为P1、Q1…,于是便可将其中所有Q1(或P1)区域中的阵列转移至另外一侧,从而形成图8B中的配合关系。In Fig. 8A, the array distributed according to Cartesian coordinates is alternately divided into several vertical strip-shaped regions by several straight lines (obviously, it can also be divided into horizontal strip-shaped regions), and these regions are alternately marked as P1, Q1..., so the All of the arrays in the Q1 (or P1 ) region can be transferred to the other side to form the mating relationship in FIG. 8B .
图9A和9B示出了根据本公开的又一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图。在图9A中,按笛卡尔坐标分布的阵列被若干直线交替划分为若干倾斜带状区域,将这些区域交替标为P2、Q2…,于是便可将其中所有Q2(或P2)区域中的阵列转移至另外一侧,从而形成图9B中的阵列位置配合关系。FIGS. 9A and 9B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and composited. In FIG. 9A, the array distributed according to Cartesian coordinates is alternately divided into several inclined strip-shaped regions by several straight lines, and these regions are alternately marked as P2, Q2..., so that all the arrays in the Q2 (or P2) region can be divided into Transfer to the other side, thereby forming the array position matching relationship in FIG. 9B.
图10A和10B示出了根据本公开的又一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图。用于划分区域的直线不必相互平行,例如在图10A中,按极坐标排布于叠层结构的一侧的阵列被由一组由某个中心发出的射线交替划分为P3,Q3……区域,若将其中所有划入P3或Q3区域中的点阵单元转移至叠层结构的另一侧,则可以得到图10B所示的阵列位置配合关系。10A and 10B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and composited. The lines used to divide the regions do not have to be parallel to each other. For example, in Figure 10A, the array arranged on one side of the laminated structure in polar coordinates is alternately divided into P3, Q3... regions by a set of rays emanating from a certain center. , If all the lattice units that are divided into the P3 or Q3 area are transferred to the other side of the laminated structure, the array position matching relationship shown in FIG. 10B can be obtained.
图11A和11B示出了根据本公开的又一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图。图11A所示的实施例中,矩形边界P4将按照笛卡尔坐标分布的阵列划分为多个元胞,其中某一个元胞和与其相邻的元胞共享3个质量负载。在每个元胞中,矩形边界Q4的中心阵列单元隔离。若将所有P4或Q4区域中的阵列单元转移至叠层结构的另一侧,则可以得到图11B中的阵列位置配合关系。FIGS. 11A and 11B illustrate mass load arrays arranged on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and a schematic top view after compounding. In the embodiment shown in FIG. 11A , the rectangular boundary P4 divides the array distributed according to Cartesian coordinates into a plurality of cells, wherein a certain cell shares three mass loads with its adjacent cells. In each cell, the central array cell of rectangular boundary Q4 is isolated. If all the array units in the P4 or Q4 area are transferred to the other side of the stacked structure, the array position matching relationship in FIG. 11B can be obtained.
图12A和12B示出了根据本公开的又一个示例性实施例的谐振器的叠层结构的上下两侧设置的质量负载阵列以及复合后的示意性俯视图。在图12A中,相互正交的若干直线将点阵作棋盘式划分,每个网格中包含4个质量负载,且其中网格区域P5和Q5按照图示形式交错分布(例如P5的“上下左右”存在Q5,左上,左下,右上和右下存在P5),若将所有P5或Q5区域中的阵列单元转移至叠层结构的另一侧,则可以得到图12B中的阵列位置配合关系。12A and 12B illustrate a schematic top view of mass load arrays disposed on the upper and lower sides of the laminated structure of the resonator according to yet another exemplary embodiment of the present disclosure, and the composite structure. In Fig. 12A, the lattice is divided into a checkerboard by several orthogonal straight lines, each grid contains 4 mass loads, and the grid areas P5 and Q5 are staggered in the form of illustration (for example, the "up and down" of P5 There are Q5 in the left and right, and P5 in the upper left, lower left, upper right and lower right). If all the array elements in the P5 or Q5 area are transferred to the other side of the stacked structure, the array position matching relationship in FIG. 12B can be obtained.
需要指出的是,在本公开中,各个数值范围,除了明确指出不包含端点值之外,除了可以为端点值,还可以为各个数值范围的中值,这些均在本公开的保护范围之内。It should be pointed out that, in the present disclosure, each numerical range, except that it is explicitly stated that it does not include the endpoint value, may be the endpoint value, but also the middle value of each numerical range, and these are all within the protection scope of the present disclosure. .
在本公开中,上和下是相对于谐振器的基底的底面而言的,对于一个部件,其靠近该底面的一侧为下侧,远离该底面的一侧为上侧。In the present disclosure, upper and lower are relative to the bottom surface of the base of the resonator, and for a component, the side close to the bottom surface is the lower side, and the side away from the bottom surface is the upper side.
在本公开中,内和外是相对于谐振器的有效区域(压电层、顶电极、底电极和声学镜在谐振器的厚度方向上的重叠区域构成有效区域)的中心(即有效区域中心)在横向方向或者径向方向上而言的,一个部件的靠近有效区域中心的一侧或一端为内侧或内端,而该部件的远离有效区域中心的一侧或一端为外侧或外端。对于一个参照位置而言,位于该位置的内侧 表示在横向方向或径向方向上处于该位置与有效区域中心之间,位于该位置的外侧表示在横向方向或径向方向上比该位置更远离有效区域中心。In the present disclosure, inside and outside are relative to the center of the effective area of the resonator (the overlapping area of the piezoelectric layer, the top electrode, the bottom electrode and the acoustic mirror in the thickness direction of the resonator constitutes the effective area) (ie, the center of the effective area). ) in the transverse or radial direction, the side or end of a component close to the center of the effective area is the inner or inner end, and the side or end of the component away from the center of the effective area is the outer or outer end. For a reference position, being located on the inside of the position means being between the position and the center of the effective area in the lateral or radial direction, and being located outside of the position means being further away from the position in the lateral or radial direction than the position Effective regional center.
如本领域技术人员能够理解的,根据本公开的体声波谐振器可以用于形成滤波器或电子设备。As can be appreciated by those skilled in the art, bulk acoustic wave resonators according to the present disclosure may be used to form filters or electronic devices.
基于以上实施例及其附图,本公开提出了如下技术方案:Based on the above embodiments and the accompanying drawings, the present disclosure proposes the following technical solutions:
1、一种体声波谐振器,包括:1. A bulk acoustic wave resonator, comprising:
基底;base;
声学镜;acoustic mirror;
底电极;bottom electrode;
顶电极;和top electrode; and
压电层,设置在底电极与顶电极之间,The piezoelectric layer is arranged between the bottom electrode and the top electrode,
其中:in:
所述压电层的上侧与所述压电层的下侧分别设置有第一质量负载阵列和第二质量负载阵列;The upper side of the piezoelectric layer and the lower side of the piezoelectric layer are respectively provided with a first mass load array and a second mass load array;
第一质量负载阵列包括位于压电层上侧的多个质量负载,第二质量负载阵列包括位于压电层下侧的多个质量负载。The first mass load array includes a plurality of mass loads on the upper side of the piezoelectric layer, and the second mass load array includes a plurality of mass loads on the lower side of the piezoelectric layer.
2、根据1所述的谐振器,其中:2. The resonator according to 1, wherein:
第一质量负载阵列与第二负载阵列均以笛卡尔坐标排布。Both the first mass load array and the second load array are arranged in Cartesian coordinates.
3、根据2所述的谐振器,其中:3. The resonator according to 2, wherein:
第一质量负载阵列与第二负载阵列的布置关系为一个阵列的至少一部分为另一个阵列的对应部分经至少一次平移后的阵列。The arrangement relationship between the first mass load array and the second load array is that at least a part of one array is an array in which a corresponding part of the other array is translated at least once.
4、根据1所述的谐振器,其中:4. The resonator according to 1, wherein:
第一质量负载阵列与第二负载阵列均以极坐标排布。Both the first mass load array and the second load array are arranged in polar coordinates.
5、根据4所述的谐振器,其中:5. The resonator according to 4, wherein:
第一质量负载阵列与第二负载阵列的布置关系为一个阵列的至少一部分为另一个阵列的对应部分经角度旋转后的阵列。The arrangement relationship between the first mass load array and the second load array is that at least a part of one array is an array in which a corresponding part of the other array is rotated by an angle.
6、根据1所述的谐振器,其中:6. The resonator according to 1, wherein:
第一质量负载阵列与第二负载阵列的布置关系为互补阵列,在谐振器的俯视图中,第一质量负载阵列与第二负载阵列共同形成新阵列,第一质量负载阵列与第二质量负载阵列各自组成所述新阵列的不同组成部分。The arrangement relationship of the first mass load array and the second load array is a complementary array. In the top view of the resonator, the first mass load array and the second load array together form a new array, and the first mass load array and the second mass load array form a new array. Each constitutes a different component of the new array.
7、根据6所述的谐振器,其中:7. The resonator according to 6, wherein:
第一质量负载阵列与第二负载阵列中的一个阵列具有至少一个待填充单元,另一个阵列具有至少一个填充单元。One of the first mass load array and the second load array has at least one unit to be filled, and the other array has at least one filled unit.
8、根据7所述的谐振器,其中:8. The resonator according to 7, wherein:
所述待填充单元的形状为多边形、圆形、圆环形、多边环形、直线条形或折线条形中的一种或多种,所述至少一个填充单元的形状与所述至少一个待填充单元的形状对应。The shape of the unit to be filled is one or more of a polygon, a circle, a circular ring, a polygonal ring, a straight line or a polyline, and the shape of the at least one unit to be filled is the same as the shape of the at least one unit to be filled. The shape of the unit corresponds.
9、根据8所述的谐振器,其中:9. The resonator of 8, wherein:
所述待填充单元的形状为多边形或多边环形;The shape of the unit to be filled is a polygon or a polygonal ring;
所述待填充单元的所述多边形或多边环形的外部轮廓与谐振器的有效区域的形状相似。The outer contour of the polygon or polygonal ring of the unit to be filled is similar to the shape of the active area of the resonator.
10、根据8所述的谐振器,其中:10. The resonator of 8, wherein:
所述待填充单元包括形状为直线条形的多个待填充单元。The unit to be filled includes a plurality of units to be filled in the shape of a straight line.
11、根据10所述的谐振器,其中:11. The resonator of 10, wherein:
第一质量负载阵列与第二负载阵列均以笛卡尔坐标排布,所述多个待填充单元彼此平行间隔开;或者Both the first mass load array and the second load array are arranged in Cartesian coordinates, and the plurality of cells to be filled are spaced parallel to each other; or
第一质量负载阵列与第二负载阵列均以极坐标排布,所述多个待填充单元在周向方向上的端部彼此间隔开。Both the first mass load array and the second load array are arranged in polar coordinates, and ends of the plurality of cells to be filled in the circumferential direction are spaced apart from each other.
12、根据6所述的谐振器,其中:12. The resonator according to 6, wherein:
第一质量负载阵列和第二质量负载阵列中的一个阵列包括多个质量负载待填充点,所述第一质量负载阵列和第二质量负载阵列中的另一个阵列包括与所述多个质量负载待填充点位置对应的多个质量负载。One of the first mass load array and the second mass load array includes a plurality of mass load points to be filled, and the other of the first mass load array and the second mass load array includes a plurality of mass loads associated with the plurality of mass loads. Multiple mass loads corresponding to the positions of the points to be filled.
13、根据12所述的谐振器,其中:13. The resonator of 12, wherein:
第一质量负载阵列与第二负载阵列均以笛卡尔坐标排布;Both the first mass load array and the second load array are arranged in Cartesian coordinates;
第一质量负载阵列与第二负载阵列中的所述一个阵列具有多个待填充单元,每个待填充单元包含至少一个质量负载待填充点,且所述多个待填充单元构成第一多边形单元阵列。The one of the first mass load array and the second load array has a plurality of cells to be filled, each cell to be filled includes at least one point to be filled with a mass load, and the plurality of cells to be filled constitute a first polygon shaped cell array.
14、根据13所述的谐振器,其中:14. The resonator of 13, wherein:
每个待填充单元包含一个质量负载待填充点。Each unit to be filled contains a mass-loaded point to be filled.
15、根据13所述的谐振器,其中:15. The resonator of 13, wherein:
每个待填充单元包含多个质量负载待填充点;Each unit to be filled contains a plurality of points to be filled with mass load;
所述第一质量负载阵列和第二质量负载阵列中的另一个阵列包括多个填充单元,每个填充单元包括多个质量负载,且所述多个填充单元构成第二单元阵列;The other of the first mass load array and the second mass load array includes a plurality of filling cells, each filling cell includes a plurality of mass loads, and the plurality of filling cells constitute a second cell array;
所述新阵列为由第一多边形单元阵列和第二多边形单元阵列互补而形成的单元阵列。The new array is a cell array formed by complementing the first polygonal cell array and the second polygonal cell array.
16、根据1所述的谐振器,其中:16. The resonator according to 1, wherein:
第一质量负载阵列中的质量负载的几何尺寸不同于第二质量负载阵列中的质量负载的几何尺寸。The geometry of the mass loads in the first array of mass loads is different from the geometry of the mass loads in the second array of mass loads.
17、根据1-16中任一项所述的谐振器,其中:17. The resonator of any of 1-16, wherein:
压电层与基底之间设置有声学阻抗结构;An acoustic impedance structure is arranged between the piezoelectric layer and the substrate;
所述声学阻抗结构包括在横向方向上彼此相邻设置的第一声学阻抗层和第二声学阻抗层,第一声学阻抗层与第二声学阻抗层的声学阻抗不同,所述声学镜在谐振器的横向方向上位于所述第一声学阻抗层之间。The acoustic impedance structure includes a first acoustic impedance layer and a second acoustic impedance layer arranged adjacent to each other in the lateral direction, the acoustic impedance of the first acoustic impedance layer and the second acoustic impedance layer are different, and the acoustic mirror is in the The resonator is located between the first acoustic impedance layers in the lateral direction.
18、根据17所述的谐振器,其中:18. The resonator of 17, wherein:
第一声学阻抗层与第二声学阻抗层与压电层接触的部分的宽度分别为mλ 1/4和nλ 2/4,其中m和n均为奇数,λ 1和λ 2分别为第一声学阻抗层和第二声学阻抗层在谐振频率处沿横向传播的声波波长。 The widths of the parts of the first acoustic impedance layer and the second acoustic impedance layer in contact with the piezoelectric layer are mλ 1 /4 and nλ 2 /4, respectively, where m and n are odd numbers, and λ 1 and λ 2 are respectively the first Wavelengths of acoustic waves propagating laterally at the resonant frequency of the acoustic impedance layer and the second acoustic impedance layer.
19、根据17所述的谐振器,其中:19. The resonator of 17, wherein:
形成第一声学阻抗层和第二声学阻抗层中的一层的材料选自氮化铝、二氧化硅、氮化硅、多晶硅、非晶硅,形成第一声学阻抗层和第二声学阻抗层中的另一层的材料自二氧化硅、掺杂二氧化硅、多晶硅、非晶硅,形成第一声学阻抗层的材料不同于形成第二声学阻抗层的材料。A material forming one of the first acoustic impedance layer and the second acoustic impedance layer is selected from aluminum nitride, silicon dioxide, silicon nitride, polysilicon, and amorphous silicon to form the first acoustic impedance layer and the second acoustic impedance layer The material of another layer in the impedance layer is selected from silicon dioxide, doped silicon dioxide, polycrystalline silicon, and amorphous silicon, and the material forming the first acoustic impedance layer is different from the material forming the second acoustic impedance layer.
20、根据17所述的谐振器,其中:20. The resonator of 17, wherein:
所述声学镜为声学镜空腔;The acoustic mirror is an acoustic mirror cavity;
所述声学镜空腔在谐振器的横向方向上的边界由所述第一声学阻抗层限定。The boundary of the acoustic mirror cavity in the lateral direction of the resonator is defined by the first acoustic impedance layer.
21、根据1所述的谐振器,其中:21. The resonator according to 1, wherein:
所述压电层为单晶压电层。The piezoelectric layer is a single crystal piezoelectric layer.
22、一种滤波器,包括根据1-21中任一项所述的体声波谐振器。22. A filter comprising the bulk acoustic wave resonator of any one of 1-21.
23、一种电子设备,包括根据22所述的滤波器,或者根据1-21中任一项所述的体声波谐振器。23. An electronic device comprising the filter according to 22, or the bulk acoustic wave resonator according to any one of 1-21.
需要指出的是,这里的电子设备,包括但不限于射频前端、滤波放大模块等中间产品,以及手机、WIFI、无人机等终端产品。It should be pointed out that the electronic equipment here includes but is not limited to intermediate products such as RF front-end, filter and amplifier modules, and terminal products such as mobile phones, WIFI, and drones.
尽管已经示出和描述了本公开的实施例,对于本领域的普通技术人员而言,可以理解在不脱离本公开的原理和精神的情况下可以对这些实施例进行变化,本公开的范围由所附权利要求及其等同物限定。Although embodiments of the present disclosure have been shown and described, it will be understood by those skilled in the art that changes may be made to these embodiments without departing from the principles and spirit of the present disclosure, the scope of which is determined by It is defined by the appended claims and their equivalents.

Claims (23)

  1. 一种体声波谐振器,包括:A bulk acoustic wave resonator, comprising:
    基底;base;
    声学镜;acoustic mirror;
    底电极;bottom electrode;
    顶电极;和top electrode; and
    压电层,设置在底电极与顶电极之间,a piezoelectric layer, arranged between the bottom electrode and the top electrode,
    其中:in:
    所述压电层的上侧与所述压电层的下侧分别设置有第一质量负载阵列和第二质量负载阵列;The upper side of the piezoelectric layer and the lower side of the piezoelectric layer are respectively provided with a first mass load array and a second mass load array;
    第一质量负载阵列包括位于压电层上侧的多个质量负载,第二质量负载阵列包括位于压电层下侧的多个质量负载。The first mass load array includes a plurality of mass loads on the upper side of the piezoelectric layer, and the second mass load array includes a plurality of mass loads on the lower side of the piezoelectric layer.
  2. 根据权利要求1所述的谐振器,其中:The resonator of claim 1, wherein:
    第一质量负载阵列与第二负载阵列均以笛卡尔坐标排布。Both the first mass load array and the second load array are arranged in Cartesian coordinates.
  3. 根据权利要求2所述的谐振器,其中:The resonator of claim 2, wherein:
    第一质量负载阵列与第二负载阵列的布置关系为一个阵列的至少一部分为另一个阵列的对应部分经至少一次平移后的阵列。The arrangement relationship between the first mass load array and the second load array is that at least a part of one array is an array in which the corresponding part of the other array is translated at least once.
  4. 根据权利要求1所述的谐振器,其中:The resonator of claim 1, wherein:
    第一质量负载阵列与第二负载阵列均以极坐标排布。Both the first mass load array and the second load array are arranged in polar coordinates.
  5. 根据权利要求4所述的谐振器,其中:The resonator of claim 4, wherein:
    第一质量负载阵列与第二负载阵列的布置关系为一个阵列的至少一部分为另一个阵列的对应部分经角度旋转后的阵列。The arrangement relationship between the first mass load array and the second load array is that at least a part of one array is an array in which a corresponding part of the other array is rotated by an angle.
  6. 根据权利要求1所述的谐振器,其中:The resonator of claim 1, wherein:
    第一质量负载阵列与第二负载阵列的布置关系为互补阵列,在谐振器的俯视图中,第一质量负载阵列与第二负载阵列共同形成新阵列,第一质量负载阵列与第二质量负载阵列各自组成所述新阵列的不同组成部分。The arrangement relationship of the first mass load array and the second load array is a complementary array. In the top view of the resonator, the first mass load array and the second load array together form a new array, and the first mass load array and the second mass load array form a new array. Each constitutes a different component of the new array.
  7. 根据权利要求6所述的谐振器,其中:The resonator of claim 6, wherein:
    第一质量负载阵列与第二负载阵列中的一个阵列具有至少一个待填充单元,另一个阵列具有至少一个填充单元。One of the first mass load array and the second load array has at least one unit to be filled, and the other array has at least one filled unit.
  8. 根据权利要求7所述的谐振器,其中:The resonator of claim 7, wherein:
    所述待填充单元的形状为多边形、圆形、圆环形、多边环形、直线条形或折线条形中的一种或多种,所述至少一个填充单元的形状与所述至少一个待填充单元的形状对应。The shape of the unit to be filled is one or more of a polygon, a circle, a circular ring, a polygonal ring, a straight line or a polyline, and the shape of the at least one unit to be filled is the same as the shape of the at least one unit to be filled. The shape of the unit corresponds.
  9. 根据权利要求8所述的谐振器,其中:The resonator of claim 8, wherein:
    所述待填充单元的形状为多边形或多边环形;The shape of the unit to be filled is a polygon or a polygonal ring;
    所述待填充单元的所述多边形或多边环形的外部轮廓与谐振器的有效区域的形状相似。The outer contour of the polygon or polygonal ring of the unit to be filled is similar to the shape of the active area of the resonator.
  10. 根据权利要求8所述的谐振器,其中:The resonator of claim 8, wherein:
    所述待填充单元包括形状为直线条形的多个待填充单元。The unit to be filled includes a plurality of units to be filled in the shape of a straight line.
  11. 根据权利要求10所述的谐振器,其中:The resonator of claim 10, wherein:
    第一质量负载阵列与第二负载阵列均以笛卡尔坐标排布,所述多个待填充单元彼此平行间隔开;或者Both the first mass load array and the second load array are arranged in Cartesian coordinates, and the plurality of cells to be filled are spaced parallel to each other; or
    第一质量负载阵列与第二负载阵列均以极坐标排布,所述多个待填充单元在周向方向上的端部彼此间隔开。Both the first mass load array and the second load array are arranged in polar coordinates, and ends of the plurality of cells to be filled in the circumferential direction are spaced apart from each other.
  12. 根据权利要求6所述的谐振器,其中:The resonator of claim 6, wherein:
    第一质量负载阵列和第二质量负载阵列中的一个阵列包括多个质量负载待填充点,所述第一质量负载阵列和第二质量负载阵列中的另一个阵列包括与所述多个质量负载待填充点位置对应的多个质量负载。One of the first mass load array and the second mass load array includes a plurality of mass load points to be filled, and the other of the first mass load array and the second mass load array includes a plurality of mass loads associated with the plurality of mass loads. Multiple mass loads corresponding to the positions of the points to be filled.
  13. 根据权利要求12所述的谐振器,其中:The resonator of claim 12, wherein:
    第一质量负载阵列与第二负载阵列均以笛卡尔坐标排布;Both the first mass load array and the second load array are arranged in Cartesian coordinates;
    第一质量负载阵列与第二负载阵列中的所述一个阵列具有多个待填充单元,每个待填充单元包含至少一个质量负载待填充点,且所述多个待填充单元构成第一多边形单元阵列。The one of the first mass load array and the second load array has a plurality of cells to be filled, each cell to be filled includes at least one point to be filled with a mass load, and the plurality of cells to be filled constitute a first polygon shaped cell array.
  14. 根据权利要求13所述的谐振器,其中:The resonator of claim 13, wherein:
    每个待填充单元包含一个质量负载待填充点。Each unit to be filled contains a mass-loaded point to be filled.
  15. 根据权利要求13所述的谐振器,其中:The resonator of claim 13, wherein:
    每个待填充单元包含多个质量负载待填充点;Each unit to be filled contains a plurality of points to be filled with mass load;
    所述第一质量负载阵列和第二质量负载阵列中的另一个阵列包括多个填充单元,每个填充单元包括多个质量负载,且所述多个填充单元构成 第二单元阵列;the other of the first mass load array and the second mass load array includes a plurality of filling cells, each filling cell includes a plurality of mass loads, and the plurality of filling cells constitute a second cell array;
    所述新阵列为由第一多边形单元阵列和第二多边形单元阵列互补而形成的单元阵列。The new array is a cell array formed by complementing the first polygonal cell array and the second polygonal cell array.
  16. 根据权利要求1所述的谐振器,其中:The resonator of claim 1, wherein:
    第一质量负载阵列中的质量负载的几何尺寸不同于第二质量负载阵列中的质量负载的几何尺寸。The geometry of the mass loads in the first array of mass loads is different from the geometry of the mass loads in the second array of mass loads.
  17. 根据权利要求1-16中任一项所述的谐振器,其中:The resonator of any of claims 1-16, wherein:
    压电层与基底之间设置有声学阻抗结构;An acoustic impedance structure is arranged between the piezoelectric layer and the substrate;
    所述声学阻抗结构包括在横向方向上彼此相邻设置的第一声学阻抗层和第二声学阻抗层,第一声学阻抗层与第二声学阻抗层的声学阻抗不同,所述声学镜在谐振器的横向方向上位于所述第一声学阻抗层之间。The acoustic impedance structure includes a first acoustic impedance layer and a second acoustic impedance layer arranged adjacent to each other in the lateral direction, the acoustic impedance of the first acoustic impedance layer and the second acoustic impedance layer are different, and the acoustic mirror is in the The resonator is located between the first acoustic impedance layers in the lateral direction.
  18. 根据权利要求17所述的谐振器,其中:The resonator of claim 17, wherein:
    第一声学阻抗层与第二声学阻抗层与压电层接触的部分的宽度分别为mλ 1/4和nλ 2/4,其中m和n均为奇数,λ 1和λ 2分别为第一声学阻抗层和第二声学阻抗层在谐振频率处沿横向传播的声波波长。 The widths of the parts of the first acoustic impedance layer and the second acoustic impedance layer in contact with the piezoelectric layer are mλ 1 /4 and nλ 2 /4, respectively, where m and n are odd numbers, and λ 1 and λ 2 are respectively the first Wavelengths of acoustic waves propagating laterally at the resonant frequency of the acoustic impedance layer and the second acoustic impedance layer.
  19. 根据权利要求17所述的谐振器,其中:The resonator of claim 17, wherein:
    形成第一声学阻抗层和第二声学阻抗层中的一层的材料选自氮化铝、二氧化硅、氮化硅、多晶硅、非晶硅,形成第一声学阻抗层和第二声学阻抗层中的另一层的材料自二氧化硅、掺杂二氧化硅、多晶硅、非晶硅,形成第一声学阻抗层的材料不同于形成第二声学阻抗层的材料。A material forming one of the first acoustic impedance layer and the second acoustic impedance layer is selected from aluminum nitride, silicon dioxide, silicon nitride, polysilicon, and amorphous silicon to form the first acoustic impedance layer and the second acoustic impedance layer The material of another layer in the impedance layer is selected from silicon dioxide, doped silicon dioxide, polycrystalline silicon, and amorphous silicon, and the material forming the first acoustic impedance layer is different from the material forming the second acoustic impedance layer.
  20. 根据权利要求17所述的谐振器,其中:The resonator of claim 17, wherein:
    所述声学镜为声学镜空腔;The acoustic mirror is an acoustic mirror cavity;
    所述声学镜空腔在谐振器的横向方向上的边界由所述第一声学阻抗层限定。The boundary of the acoustic mirror cavity in the lateral direction of the resonator is defined by the first acoustic impedance layer.
  21. 根据权利要求1所述的谐振器,其中:The resonator of claim 1, wherein:
    所述压电层为单晶压电层。The piezoelectric layer is a single crystal piezoelectric layer.
  22. 一种滤波器,包括根据权利要求1-21中任一项所述的体声波谐振器。A filter comprising a bulk acoustic wave resonator according to any one of claims 1-21.
  23. 一种电子设备,包括根据权利要求22所述的滤波器,或者根据权利要求1-21中任一项所述的体声波谐振器。An electronic device comprising the filter according to claim 22, or the bulk acoustic wave resonator according to any one of claims 1-21.
PCT/CN2021/103693 2020-07-13 2021-06-30 Bulk acoustic resonator with mass loads arranged on two sides of piezoelectric layer, filter and electronic device WO2022012334A1 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115276601A (en) * 2022-09-29 2022-11-01 苏州汉天下电子有限公司 Resonator for testing, preparation method and testing method of resonator

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111934643B (en) * 2020-07-13 2021-06-01 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator with mass loads arranged on two sides of piezoelectric layer, filter and electronic equipment
CN115694410A (en) * 2021-07-29 2023-02-03 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator, filter, and electronic device having a plurality of bottom electrode layers
CN115694398A (en) * 2021-07-29 2023-02-03 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator, filter, and electronic device having a plurality of bottom electrode layers
CN114826191B (en) * 2022-05-23 2023-11-07 武汉敏声新技术有限公司 Film bulk acoustic resonator

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100052476A1 (en) * 2007-11-21 2010-03-04 Panasonic Corporation Piezoelectric filter and method for manufacturing the same
WO2011105313A1 (en) * 2010-02-24 2011-09-01 太陽誘電株式会社 Acoustic wave device
US20130207515A1 (en) * 2012-02-14 2013-08-15 Taiyo Yuden Co., Ltd. Acoustic wave device
CN108173528A (en) * 2018-02-01 2018-06-15 湖北宙讯科技有限公司 Wave filter
CN111030635A (en) * 2019-12-31 2020-04-17 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator with composite array quality responsibility, filter and electronic equipment
CN111934643A (en) * 2020-07-13 2020-11-13 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator with mass loads arranged on two sides of piezoelectric layer, filter and electronic equipment

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040189424A1 (en) * 2003-03-31 2004-09-30 Hula David W. FBAR mass loading process using selective dry etching
TWI365603B (en) * 2004-10-01 2012-06-01 Avago Technologies Wireless Ip A thin film bulk acoustic resonator with a mass loaded perimeter
US7893793B2 (en) * 2006-08-25 2011-02-22 Panasonic Corporation Film bulk acoustic wave resonator and method for manufacturing the same
US20100277034A1 (en) * 2009-03-11 2010-11-04 Rajarishi Sinha Array of baw resonators with mask controlled resonant frequencies
CN102075161B (en) * 2011-01-20 2013-06-05 张�浩 Acoustic wave device and manufacturing method thereof
CN104579233B (en) * 2013-10-23 2018-12-04 中兴通讯股份有限公司 A kind of production method and device of film Resonator
US9608594B2 (en) * 2014-05-29 2017-03-28 Avago Technologies General Ip (Singapore) Pte. Ltd. Capacitive coupled resonator device with air-gap separating electrode and piezoelectric layer
JP7098453B2 (en) * 2018-07-17 2022-07-11 太陽誘電株式会社 Elastic wave resonators, filters and multiplexers
CN111010134B (en) * 2019-10-26 2021-06-01 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator, frequency adjustment method for bulk acoustic wave resonator, filter, and electronic device
CN111092605B (en) * 2019-12-31 2021-06-01 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator with acoustic interference array, bulk acoustic wave resonator group, filter and electronic equipment
CN111211757B (en) * 2020-02-05 2024-03-15 见闻录(浙江)半导体有限公司 Top electrode structure of bulk acoustic wave resonator and manufacturing process

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100052476A1 (en) * 2007-11-21 2010-03-04 Panasonic Corporation Piezoelectric filter and method for manufacturing the same
WO2011105313A1 (en) * 2010-02-24 2011-09-01 太陽誘電株式会社 Acoustic wave device
US20130207515A1 (en) * 2012-02-14 2013-08-15 Taiyo Yuden Co., Ltd. Acoustic wave device
CN108173528A (en) * 2018-02-01 2018-06-15 湖北宙讯科技有限公司 Wave filter
CN111030635A (en) * 2019-12-31 2020-04-17 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator with composite array quality responsibility, filter and electronic equipment
CN111934643A (en) * 2020-07-13 2020-11-13 诺思(天津)微系统有限责任公司 Bulk acoustic wave resonator with mass loads arranged on two sides of piezoelectric layer, filter and electronic equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115276601A (en) * 2022-09-29 2022-11-01 苏州汉天下电子有限公司 Resonator for testing, preparation method and testing method of resonator

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