WO2022006927A1 - Cvd reaction module of silicon carbide epitaxy apparatus - Google Patents

Cvd reaction module of silicon carbide epitaxy apparatus Download PDF

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WO2022006927A1
WO2022006927A1 PCT/CN2020/101899 CN2020101899W WO2022006927A1 WO 2022006927 A1 WO2022006927 A1 WO 2022006927A1 CN 2020101899 W CN2020101899 W CN 2020101899W WO 2022006927 A1 WO2022006927 A1 WO 2022006927A1
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Prior art keywords
tray
heating layer
silicon carbide
reaction module
cvd reaction
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PCT/CN2020/101899
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French (fr)
Chinese (zh)
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刘子优
肖蕴章
钟国仿
陈炳安
张灿
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深圳市纳设智能装备有限公司
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Publication of WO2022006927A1 publication Critical patent/WO2022006927A1/en

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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/36Carbides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/32Carbides
    • C23C16/325Silicon carbide
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45561Gas plumbing upstream of the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4584Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally the substrate being rotated
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/46Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/10Heating of the reaction chamber or the substrate
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/12Substrate holders or susceptors
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/14Feed and outlet means for the gases; Modifying the flow of the reactive gases

Definitions

  • the invention relates to the technical field of CVD reaction, in particular to a CVD reaction module of a silicon carbide epitaxy equipment.
  • Silicon carbide (SiC) material is the third-generation wide-bandgap semiconductor material following the first-generation semiconductor material silicon (Si) and the second-generation semiconductor (gallium arsenide, GaAs).
  • the crystal structure of silicon carbide has the characteristics of homogeneity and polytype, and its basic structure is the tetrahedral structure of Si-C, which belongs to the close-packed structure. Its performance has superior performances such as higher forbidden band width, high critical breakdown electric field, high thermal conductivity, high carrier saturation drift speed, etc. It is used in semiconductor lighting, power electronic devices, lasers, detectors and other fields. Huge prospects.
  • the present invention provides a CVD reaction module of a silicon carbide epitaxy equipment, which can improve the stability of the CVD process and prolong the maintenance period of the equipment.
  • a CVD reaction module of a silicon carbide epitaxy equipment comprising a quartz shell with openings at both ends, wherein the openings at both ends of the quartz shell are sealed with air inlet flanges and The rear end flange, the quartz shell, the inlet flange and the rear end flange are enclosed into a vacuum chamber, the chamber is provided with a heating layer and a thermal insulation layer covering the heating layer, the heating layer
  • the cross section of the heating layer is in the shape of an oblong hole, the heating layer is provided with a hollow working cavity and both ends are open, the opening of the working cavity is opposite to the opening of the quartz shell, and the heating layer has a plurality of replacement parts , the radian of the inner top surface of each replacement part is different, an air intake guide is arranged between the air inlet flange and the opening of the heating layer, and a tray for holding wafers is also arranged in the working chamber, so A lining is also arranged around the corresponding tray
  • the tray can be lifted and lowered by the drive of the lifting rod, when the wafer needs to be taken, the tray can be raised to the predetermined transfer position, the external manipulator can more conveniently catch the tray, and the tray is on the top. After the tray is lowered, it is separated from the top tray. The robot takes out the tray and the wafer from the tail flange, and the same is true for placing the wafer.
  • process parameters can be calculated according to the accumulated thickness of by-products on the surface of the lining for a long time. , so that the tray exceeds the height of the by-products on the surface of the inner village, so as to ensure that the CVD process can continue, and finally achieve the purpose of prolonging the service life of the inner lining.
  • a set of mixed gas inlets and a set of protective gas inlets are provided on the intake flange, and a mixed gas channel and a protective gas channel are provided on the intake guide corresponding to the intake flange.
  • the mixed gas channel is divided into independent channels with the same number of mixed gas inlets by a partition plate, and a diversion ramp is arranged above the mixed gas channel, and the diversion ramp is inclined toward the direction of the tray.
  • the independent channel makes the mixed gas entering the working chamber more uniform, which ensures better effect of the CVD process.
  • the protective gas passage includes a plurality of ventilation holes, and the ventilation holes are arranged around the edge of the air intake guide.
  • the inner liner includes an intake end liner and an exhaust end liner that are butted together, the intake end liner and the exhaust end liner are close to the inner wall of the heating layer, and the intake end liner
  • the docking position with the exhaust end liner is the center line of the tray, and the positions of the intake end liner and the exhaust end liner corresponding to the tray are provided with arc gaps.
  • the inner lining of the intake end and the inner lining of the exhaust end that are butted together are easier to be removed from the heating layer for replacement, and the arc notch set just encloses the tray after the docking, so as to avoid a large gap between the lining and the tray.
  • the rotating assembly includes an air channel arranged in the lift rod and the top plate, an arc-shaped air guide groove is arranged at the bottom of the tray, and the tray rotates under the driving of the gas introduced by the lift rod.
  • the rotating tray enables a more uniform deposition layer to be formed on the wafer.
  • the bottom of the tray is provided with a boss extending downward
  • the edge of the top plate is provided with an enclosure matching the boss
  • the boss is located in the enclosure. The enclosure can prevent the tray from being disengaged from the top tray when rotated.
  • the bottom of the lift rod is also provided with an observation window, and the bottom of the tray is provided with a straight groove at the position facing the central air channel.
  • the rotating assembly includes a first motor disposed at the lower end of the lift rod, and the output shaft of the first motor is perpendicular to the plane where the top plate is located and is fastened to the top plate through the lift rod.
  • the manufacturing material of the heating layer is graphite or silicon carbide, and an induction coil for providing heating energy is wound around the quartz shell.
  • the lifting rod includes a heat insulation section close to the heating layer and an overhanging section extending outward, and a bellows for dynamic sealing is further arranged between the outer end of the overhanging section and the quartz shell.
  • the quartz shell is provided with a bracket at a position corresponding to the bottom of the thermal insulation layer.
  • FIG. 1 is a schematic structural diagram of an embodiment of the present invention
  • FIG. 3 is a cross-sectional view of an embodiment of the present invention.
  • FIG. 4 is a schematic structural diagram of an air intake guide in an embodiment of the present invention.
  • FIG. 5 is a schematic structural diagram of a tray and a top tray in an embodiment of the present invention.
  • Fig. 6 is a replacement part of the heating layer in the embodiment of the present invention.
  • Fig. 7 is another replacement part of the heating layer in the embodiment of the present invention.
  • FIG. 8 is a schematic structural diagram of a rotating assembly in Embodiment 2 of the present invention.
  • quartz shell 100 induction coil 110, inlet flange 120, mixed gas inlet 121, protective gas inlet 122, tail flange 130, insulation layer 200, heating layer 300, inlet lining 310, Exhaust end liner 320, intake guide 400, mixed gas channel 410, ventilation hole 420, guide ramp 430, tray 500, boss 510, air guide groove 511, straight groove 512, top plate 600, The enclosure 610 , the heat insulation section 620 , the overhang section 630 , the bellows 640 , the air channel 650 , the elevator 700 , the driving rod 710 , the installation platform 711 , the rack 720 , the gear 730 , the first motor 800 , and the lifting rod 810 .
  • this embodiment provides a CVD reaction module of a silicon carbide epitaxy device, CVD is vapor deposition, and the reaction module includes a quartz shell 100 with open ends at both ends.
  • the cross section of the quartz shell 100 In the shape of an oblong hole, the openings at both ends of the quartz shell 100 are sealed with an inlet flange 120 and a rear end flange 130 respectively.
  • a vacuum chamber is enclosed, and the chamber is provided with a heating layer 300 and an insulating layer 200 wrapped around the heating layer 300 .
  • the cross section of the heating layer 300 is also in the shape of an oblong hole.
  • the heating layer 300 is provided with a hollow working cavity with open ends at both ends, and the opening of the working cavity is opposite to the opening of the quartz shell 100 .
  • the oblong hole type heating layer is closer to the shape of the wafer cross section, and has more advantages in temperature uniformity than the round heating layer and the square heating layer.
  • the heating layer 300 can adjust the temperature of the wafer according to the different process results. If the central film thickness of the wafer is more different than the edge film thickness, it means that the temperature field in the working chamber is not uniform.
  • the heating layers on the top surface of different radians can adjust the temperature field in the working chamber, so that the temperature in the working chamber is more uniform, thereby making the thickness of the film formed on the wafer more uniform.
  • An air inlet guide 400 is provided between the ports, and the mixed gas for CVD reaction is connected by the air inlet flange 120 and enters the working chamber along the air inlet guide 400.
  • the mixed gas forms a target precipitation layer on the wafers in the tray 500 after entering the working chamber, and an exhaust pipe is also connected to the tail flange 130 to ensure that the mixed gas can flow continuously in the working chamber .
  • the heating layer 300 is also provided with a lining around the corresponding tray 500 for catching the mixed gas deposits falling outside the wafer and keeping the heating layer 300 clean.
  • the air intake guide 400 is located in the lining.
  • the bottom of the tray 500 is provided with a top plate 600 for supporting the tray 500, and the bottom of the top plate 600 extends outward with a lifting rod, and the lifting rod passes through the heating layer 300, the thermal insulation layer 200 and the quartz in turn.
  • the casing 100 extends outward, the top plate 600 and the lifting rod are also provided with a rotating assembly for driving the tray 500 to rotate, and the quartz casing 100 is also provided with a lifting assembly for driving the lifting rod to move up and down.
  • the quartz shell 100 is provided with a bracket at a position corresponding to the bottom of the thermal insulation layer 200 . It is ensured that the thermal insulation layer 200 and the heating layer 300 can be fixed in the quartz case 100 .
  • the tray 500 can be raised and lowered under the drive of the lift rod. When the wafer needs to be taken out, the tray 500 can be raised to a predetermined transfer position. The external robot can more easily catch the tray 500. After the top tray 600 is lowered, the tray 500 To achieve separation from the top plate 600, the robot takes out the tray 500 and the wafer from the tail flange 130, and the same is true for placing the wafer. Closable switch. With the function of lifting the tray 500, the process parameters have more location options, which can be calculated according to the accumulated thickness of the by-products on the lining surface for a long time. It is raised slightly so that the tray 500 exceeds the height of the by-products on the surface of the inner village, so as to ensure that the CVD process can continue, and finally achieve the purpose of prolonging the service life of the inner lining.
  • a set of mixed gas inlets 121 and a set of protective gas inlets 122 are provided on the intake flange 120 , and the intake guide 400 is provided corresponding to the intake flange 120 There are mixed gas passages 410 and protective gas passages. The shielding gas blown into the working chamber prevents premature precipitation of the reaction source at the inlet of the liner.
  • the mixed gas channel 410 is divided into independent channels with the same number as the mixed gas inlets 121 by the partition plate.
  • a guide ramp 430 is provided above the mixed gas channel 410 , and the guide ramp 430 faces the tray 500 . inclined direction.
  • the independent channel makes the mixed gas entering the working chamber more uniform, which ensures better effect of the CVD process.
  • the protective gas channel includes a plurality of ventilation holes 420 , and the ventilation holes 420 are arranged around the edge of the air intake guide 400 .
  • the inner liner is set as the intake end liner 310 and the exhaust end liner 320 that are butted together, and the intake end liner 310 and the exhaust end liner 320 are close to the heating layer
  • the butting position of the intake end liner 310 and the exhaust end liner 320 is the center line of the tray 500, and the positions of the intake end liner 310 and the exhaust end liner 320 corresponding to the tray 500 are both.
  • a circular arc gap is provided.
  • the air intake end liner 310 and the exhaust end liner 320 that are butted together are easier to be removed from the heating layer 300 for replacement, and the arc gap is set to enclose the tray 500 after the butt joint to avoid the occurrence of the lining and the tray 500 larger gap.
  • the rotating assembly includes an air channel 650 disposed in the lift rod and the top plate 600, and an arc-shaped air guide groove 511 is disposed at the bottom of the tray 500.
  • the air introduced by the tray 500 in the lift rod driven by the rotation.
  • the rotating tray 500 can form a more uniform deposition layer on the wafer.
  • the lift rod includes a thermal insulation section 620 close to the heating layer 300 and an overhanging section 630 extending outward, and a bellows 640 for dynamic sealing is further provided between the outer end of the overhanging section 630 and the quartz shell 100 .
  • the bottom of the tray 500 is provided with a boss 510 extending downward
  • the edge of the top plate 600 is provided with an enclosure 610 matching the boss 510 , and the boss 510 is located in the enclosure. Block 610.
  • the enclosure 610 can prevent the tray 500 from disengaging from the top tray 600 during rotation.
  • the bottom of the lift rod is also provided with an observation window
  • the bottom of the tray 500 is provided with a straight groove 512 at the position where the bottom of the tray 500 is facing the air channel 650 .
  • An optical detection device is provided at the observation window of the lift rod. The optical detection device can determine the rotation speed of the tray 500 through the identification of the straight groove 512 by the observation window. The optical detection device can also detect the temperature of the tray 500, which is convenient for subsequent process adjustment. Provide parameters.
  • the heating layer 300 is made of graphite or silicon carbide, and the thermal insulation layer 200 is made of carbon felt.
  • An induction coil 110 for providing heating energy is wound around the quartz shell 100 . After the induction coil 110 is energized, a magnetic field can be generated, and the heating layer 300 placed in the magnetic field will generate heat and heat up due to the eddy current effect.
  • the lift assembly includes a lifter 700, and a vertical drive rod 710 is movably arranged in the lifter 700.
  • the part of the drive rod 710 extending out of the lifter 700 is fastened to the lifter rod.
  • the lifter 700 is provided with a second The motor, the second motor is arranged horizontally, the output shaft of the second motor is drivingly connected with the drive rod 710 through a rack and pinion, the rack 720 is arranged along the length direction of the drive rod 710, the gear 730 meshes with the rack 720 and is connected with the second motor.
  • the output shaft of the motor is fastened coaxially.
  • the rotating assembly includes a first motor disposed at the lower end of the lifting rod 810 . 800, the first motor 800 is fixedly arranged on the driving rod 710 of the elevator 700, the driving rod 710 is provided with a mounting platform 711 for installing the first motor 800, and the output shaft of the first motor 800 is perpendicular to the ceiling.
  • the plane on which the disk is located is fastened to the top disk 600 through the lifting rod 810 .
  • the rotation speed of the tray can be obtained by the rotation speed of the first motor 800 .
  • connection should be understood in a broad sense, for example, it may be a fixed connection, a detachable connection, or an integrated ; It can be an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between the two elements.
  • connection may be a fixed connection, a detachable connection, or an integrated ; It can be an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between the two elements.

Abstract

A CVD reaction module of a silicon carbide epitaxy apparatus, comprising a quartz housing (100), a gas inlet flange (120), and a tail end flange (130). A heating layer (300) and a thermally-insulating layer (200) are provided within the quartz housing (100). The heating layer (300) is provided with multiple replaceable elements. The replaceable elements are different in the arc of the inner top surface. A tray (500) used for placing a wafer is provided in an operation chamber. A lining (310/320) is provided in the heating layer (300) at the periphery corresponding to the tray (500). A top plate (600) used for supporting the tray (500) is provided below the tray (500). A lifting/lowering rod (810) extends outward from the bottom of the top plate (600). The beneficial effects are: when the thickness of the lining (310/320) is increased to an extent that prevents the tray (500) from performing normally a CVD process, the position of the tray (500) is slightly raised to ensure that the CVD process can continue, and to ultimately achieve the goal of extending the service life of the lining (310/320), and by replacing the heating layer (300) with one having a differently arced top surface, the temperature field of the operation chamber can be adjusted, thus increasing the uniformity of the temperature in the operation chamber, and increasing the uniformity of the thickness of a film formed on the wafer.

Description

一种碳化硅外延设备的CVD反应模块A CVD reaction module of a silicon carbide epitaxy equipment 技术领域technical field
本发明涉及CVD反应技术领域,具体涉及一种碳化硅外延设备的CVD反应模块。The invention relates to the technical field of CVD reaction, in particular to a CVD reaction module of a silicon carbide epitaxy equipment.
背景技术Background technique
碳化硅(SiC)材料是继第一代半导体材料硅(Si)和第二代半导体(砷化镓GaAs)后的第三代宽禁带半导体材料。碳化硅晶体结构具有同质多型的特点,其基本结构是Si-C的四面体结构,属于密堆积结构。其性能具有更高的禁带宽度、高临界击穿电场、高导热率、高载流子饱和漂移速度等优越的性能,在半导体照明、电力电子器件、激光器、探测器等领域应用中蕴含着巨大的前景。Silicon carbide (SiC) material is the third-generation wide-bandgap semiconductor material following the first-generation semiconductor material silicon (Si) and the second-generation semiconductor (gallium arsenide, GaAs). The crystal structure of silicon carbide has the characteristics of homogeneity and polytype, and its basic structure is the tetrahedral structure of Si-C, which belongs to the close-packed structure. Its performance has superior performances such as higher forbidden band width, high critical breakdown electric field, high thermal conductivity, high carrier saturation drift speed, etc. It is used in semiconductor lighting, power electronic devices, lasers, detectors and other fields. Huge prospects.
在CVD设备中,温度均匀性是保证工艺质量的重要参数之一,随着对产品质量的需求、晶圆尺寸增加,对均匀性的要求更加严格。同时,在进行CVD工艺时,反应源会大量的沉积在晶圆以外的区域,当副产物的堆积超过一定程度时,便需对设备进行维护,是影响设备连续生产的主要因素之一。由于第三代半导体碳化硅的特殊性质,碳化硅副产物不易于清除,导致零件的更换频率增加,连续生产时长降低,成本上升。所以,在第三代半导体领域的竞争中,延长设备的连续使用时间和成本控制至关重要。In CVD equipment, temperature uniformity is one of the important parameters to ensure process quality. With the demand for product quality and the increase in wafer size, the requirements for uniformity are more stringent. At the same time, during the CVD process, a large number of reaction sources will be deposited outside the wafer. When the accumulation of by-products exceeds a certain level, the equipment needs to be maintained, which is one of the main factors affecting the continuous production of the equipment. Due to the special properties of the third-generation semiconductor silicon carbide, silicon carbide by-products are not easy to remove, resulting in increased replacement frequency of parts, reduced continuous production time, and increased costs. Therefore, in the competition in the third-generation semiconductor field, extending the continuous use time of equipment and cost control are crucial.
发明内容SUMMARY OF THE INVENTION
针对现有技术中的缺陷,本发明提供一种碳化硅外延设备的CVD反应模块,能够提高CVD工艺的稳定性,且能够延长设备的维护周期。In view of the defects in the prior art, the present invention provides a CVD reaction module of a silicon carbide epitaxy equipment, which can improve the stability of the CVD process and prolong the maintenance period of the equipment.
本发明提供一种的技术方案是:一种碳化硅外延设备的CVD反应模块,包括两端敞口的石英壳体,所述石英壳体两端的敞口处分别密封设置有进气法兰和尾端法兰,所述石英壳体与进气法兰和尾端法兰围合成真空的腔室,所述腔室内设置有加热层和包覆在加热层外的保温层,所述加热层的横截面为长圆孔形,所述加热层内设有中空的作业腔且两端敞口,所述作业腔的敞口与石英壳体的敞口相对,所述加热层具有多个替换件,每个替换件内部顶面的弧度不同,所述进气法兰与加热层的敞口之间设置有进气引导件,所述作业腔内还设置有用于盛放晶圆的托盘,所述加热层内对应托盘的周围还设置有内衬,所述进气引导件位于所述内衬的内部,所述托盘下方设置有用于支撑托盘的顶盘,所述顶盘的底部向外延伸伸展有升降杆,所述升降杆依次穿过加热层、保温层和石英壳体向外延伸,所述顶盘和升降杆上还设置有驱动所述托盘转动的转动组件,所述石英壳体外还设置有驱动所述升降杆升降运动的升降组件。The present invention provides a technical solution as follows: a CVD reaction module of a silicon carbide epitaxy equipment, comprising a quartz shell with openings at both ends, wherein the openings at both ends of the quartz shell are sealed with air inlet flanges and The rear end flange, the quartz shell, the inlet flange and the rear end flange are enclosed into a vacuum chamber, the chamber is provided with a heating layer and a thermal insulation layer covering the heating layer, the heating layer The cross section of the heating layer is in the shape of an oblong hole, the heating layer is provided with a hollow working cavity and both ends are open, the opening of the working cavity is opposite to the opening of the quartz shell, and the heating layer has a plurality of replacement parts , the radian of the inner top surface of each replacement part is different, an air intake guide is arranged between the air inlet flange and the opening of the heating layer, and a tray for holding wafers is also arranged in the working chamber, so A lining is also arranged around the corresponding tray in the heating layer, the air intake guide is located inside the lining, a top tray is provided below the tray for supporting the tray, and the bottom of the top tray extends outwards A lifting rod is extended, and the lifting rod extends outward through the heating layer, the thermal insulation layer and the quartz shell in turn. The top plate and the lifting rod are also provided with a rotating assembly for driving the rotation of the tray. A lift assembly for driving the lift rod to move up and down is also provided.
上述技术方案的有益效果为:托盘能够在升降杆的驱动下升降,在需要取晶圆时,可将托盘升至预定的传片位置,外部的机械手能够更方便的接住托盘,托盘在顶盘下降后与顶盘实现分离,机械手将托盘及晶圆由尾端法兰取出,放置晶圆也是一样。有了升降托盘的功能,工艺参数多了位置的选择,可根据内衬表面长时间副产物的累计厚度推算,在内衬的厚度增加至托盘无法正常进行CVD工艺时,将托盘位置略微升高,使得托盘超出内村表面副产物的高度,从而保证能够继续进行CVD工艺,最终达到延长内衬使用寿命的目的。The beneficial effects of the above technical solutions are: the tray can be lifted and lowered by the drive of the lifting rod, when the wafer needs to be taken, the tray can be raised to the predetermined transfer position, the external manipulator can more conveniently catch the tray, and the tray is on the top. After the tray is lowered, it is separated from the top tray. The robot takes out the tray and the wafer from the tail flange, and the same is true for placing the wafer. With the function of raising and lowering the tray, there are more position options for process parameters, which can be calculated according to the accumulated thickness of by-products on the surface of the lining for a long time. , so that the tray exceeds the height of the by-products on the surface of the inner village, so as to ensure that the CVD process can continue, and finally achieve the purpose of prolonging the service life of the inner lining.
进一步,所述进气法兰上设置有一组混合气入口以及一组保护气入口,所述进气引导件对应进气法兰设置有混合气通道和保护气通道。Further, a set of mixed gas inlets and a set of protective gas inlets are provided on the intake flange, and a mixed gas channel and a protective gas channel are provided on the intake guide corresponding to the intake flange.
进一步,所述混合气通道通过隔板分隔为与混合气入口数量一致的独立通道,所述混合气通道的上方设置有导流坡道,所述导流坡道朝所述托盘的方向倾斜。独立通道使得进入作业腔的混合气体能够更加均匀,保证CVD工艺的效果更好。Further, the mixed gas channel is divided into independent channels with the same number of mixed gas inlets by a partition plate, and a diversion ramp is arranged above the mixed gas channel, and the diversion ramp is inclined toward the direction of the tray. The independent channel makes the mixed gas entering the working chamber more uniform, which ensures better effect of the CVD process.
进一步,所述保护气通道包括多个通气小孔,所述通气小孔环绕所述进气 引导件的边缘设置。Further, the protective gas passage includes a plurality of ventilation holes, and the ventilation holes are arranged around the edge of the air intake guide.
进一步,所述内衬包括对接在一起的进气端内衬和排气端内衬,所述进气端内衬和排气端内衬紧贴加热层的内壁,所述进气端内衬和排气端内衬的对接位置为托盘的中心线,所述进气端内衬和排气端内衬对应托盘的位置均设置有圆弧缺口。对接在一起的进气端内衬和排气端内衬更加容易从加热层内取下进行更换,设置的圆弧缺口在对接后正好围合托盘,避免内衬与托盘产生较大的间隙。Further, the inner liner includes an intake end liner and an exhaust end liner that are butted together, the intake end liner and the exhaust end liner are close to the inner wall of the heating layer, and the intake end liner The docking position with the exhaust end liner is the center line of the tray, and the positions of the intake end liner and the exhaust end liner corresponding to the tray are provided with arc gaps. The inner lining of the intake end and the inner lining of the exhaust end that are butted together are easier to be removed from the heating layer for replacement, and the arc notch set just encloses the tray after the docking, so as to avoid a large gap between the lining and the tray.
进一步,所述转动组件包括设置在所述升降杆和顶盘内的中空气道,所述托盘的底部设置有弧形的导气槽,所述托盘在升降杆引入的气体的驱动下转动。在进行CVD工艺时,转动的托盘能够使晶圆上形成更加均匀的沉淀层。Further, the rotating assembly includes an air channel arranged in the lift rod and the top plate, an arc-shaped air guide groove is arranged at the bottom of the tray, and the tray rotates under the driving of the gas introduced by the lift rod. During the CVD process, the rotating tray enables a more uniform deposition layer to be formed on the wafer.
进一步,所述托盘的底部向下延伸设置有凸台,所述顶盘的边缘设置有与所述凸台相匹配的围挡,所述凸台位于所述围挡内。所述围挡能够避免托盘在旋转时脱离顶盘。Further, the bottom of the tray is provided with a boss extending downward, the edge of the top plate is provided with an enclosure matching the boss, and the boss is located in the enclosure. The enclosure can prevent the tray from being disengaged from the top tray when rotated.
进一步,所述升降杆的底部还设置有观察窗,所述托盘底部正对中空气道的位置设置有直沟槽。Further, the bottom of the lift rod is also provided with an observation window, and the bottom of the tray is provided with a straight groove at the position facing the central air channel.
进一步,所述转动组件包括设置于升降杆下端的第一电机,所述第一电机的输出轴垂直于顶盘所在的平面且通过升降杆与顶盘紧固连接。Further, the rotating assembly includes a first motor disposed at the lower end of the lift rod, and the output shaft of the first motor is perpendicular to the plane where the top plate is located and is fastened to the top plate through the lift rod.
进一步,所述加热层的制作材料为石墨或碳化硅,所述石英壳体外绕设有用于提供加热能量的感应线圈。Further, the manufacturing material of the heating layer is graphite or silicon carbide, and an induction coil for providing heating energy is wound around the quartz shell.
进一步,所述升降杆包括靠近加热层的隔热段以及向外延伸的外伸段,所述外伸段的外端与石英壳体之间还设置有用于动态密封的波纹管。Further, the lifting rod includes a heat insulation section close to the heating layer and an overhanging section extending outward, and a bellows for dynamic sealing is further arranged between the outer end of the overhanging section and the quartz shell.
进一步,所述石英壳体对应保温层底部的位置设置有托架。Further, the quartz shell is provided with a bracket at a position corresponding to the bottom of the thermal insulation layer.
附图说明Description of drawings
为了更清楚地说明本发明具体实施方式或现有技术中的技术方案,下面将 对具体实施方式或现有技术描述中所需要使用的附图作简单地介绍。在所有附图中,类似的元件或部分一般由类似的附图标记标识。附图中,各元件或部分并不一定按照实际的比例绘制。In order to illustrate the specific embodiments of the present invention or the technical solutions in the prior art more clearly, the following briefly introduces the accompanying drawings that are required in the description of the specific embodiments or the prior art. Similar elements or parts are generally identified by similar reference numerals throughout the drawings. In the drawings, each element or section is not necessarily drawn to actual scale.
图1为本发明实施例的结构示意图;1 is a schematic structural diagram of an embodiment of the present invention;
图2为本发明实施例的爆炸图;2 is an exploded view of an embodiment of the present invention;
图3为本发明实施例的剖视图;3 is a cross-sectional view of an embodiment of the present invention;
图4为本发明实施例中进气引导件的结构示意图;4 is a schematic structural diagram of an air intake guide in an embodiment of the present invention;
图5为本发明实施例中托盘和顶盘的结构示意图;5 is a schematic structural diagram of a tray and a top tray in an embodiment of the present invention;
图6为本发明实施例中加热层的一替换件;Fig. 6 is a replacement part of the heating layer in the embodiment of the present invention;
图7为本发明实施例中加热层的另一替换件;Fig. 7 is another replacement part of the heating layer in the embodiment of the present invention;
图8为本发明实施例2中转动组件的结构示意图。FIG. 8 is a schematic structural diagram of a rotating assembly in Embodiment 2 of the present invention.
附图标记:石英壳体100、感应线圈110、进气法兰120、混合气入口121、保护气入口122、尾端法兰130、保温层200、加热层300、进气端内衬310、排气端内衬320、进气引导件400、混合气通道410、通气小孔420、导流坡道430、托盘500、凸台510、导气槽511、直沟槽512、顶盘600、围挡610、隔热段620、外伸段630、波纹管640、中空气道650、升降机700、驱动杆710、安装平台711、齿条720、齿轮730、第一电机800、升降杆810。Reference numerals: quartz shell 100, induction coil 110, inlet flange 120, mixed gas inlet 121, protective gas inlet 122, tail flange 130, insulation layer 200, heating layer 300, inlet lining 310, Exhaust end liner 320, intake guide 400, mixed gas channel 410, ventilation hole 420, guide ramp 430, tray 500, boss 510, air guide groove 511, straight groove 512, top plate 600, The enclosure 610 , the heat insulation section 620 , the overhang section 630 , the bellows 640 , the air channel 650 , the elevator 700 , the driving rod 710 , the installation platform 711 , the rack 720 , the gear 730 , the first motor 800 , and the lifting rod 810 .
具体实施方式detailed description
下面将结合附图对本发明技术方案的实施例进行详细的描述。以下实施例仅用于更加清楚地说明本发明的技术方案,因此只作为示例,而不能以此来限制本发明的保护范围。Embodiments of the technical solutions of the present invention will be described in detail below with reference to the accompanying drawings. The following examples are only used to more clearly illustrate the technical solutions of the present invention, and are therefore only used as examples, and cannot be used to limit the protection scope of the present invention.
需要注意的是,除非另有说明,本申请使用的技术术语或者科学术语应当为本发明所属领域技术人员所理解的通常意义。It should be noted that, unless otherwise specified, the technical or scientific terms used in this application should have the usual meanings understood by those skilled in the art to which the present invention belongs.
实施例1Example 1
如图1-5所示,本实施例提供一种碳化硅外延设备的CVD反应模块,CVD即为气相沉淀,该反应模块包括两端敞口的石英壳体100,石英壳体100的横截面为长圆孔形,所述石英壳体100两端的敞口处分别密封设置有进气法兰120和尾端法兰130,所述石英壳体100与进气法兰120和尾端法兰130围合成真空的腔室,所述腔室内设置有加热层300和包覆在加热层300外的保温层200,加热层300和保温层200的截面形状与石英壳体100的截面形状一致,即是加热层300的横截面也为长圆孔形,所述加热层300内设有中空的作业腔且两端敞口,所述作业腔的敞口与石英壳体100的敞口相对。长圆孔型加热层更趋近于晶圆截面的形状,较正圆形加热层和方形加热层在温度均匀性上相比更具优势。As shown in FIGS. 1-5 , this embodiment provides a CVD reaction module of a silicon carbide epitaxy device, CVD is vapor deposition, and the reaction module includes a quartz shell 100 with open ends at both ends. The cross section of the quartz shell 100 In the shape of an oblong hole, the openings at both ends of the quartz shell 100 are sealed with an inlet flange 120 and a rear end flange 130 respectively. A vacuum chamber is enclosed, and the chamber is provided with a heating layer 300 and an insulating layer 200 wrapped around the heating layer 300 . The cross section of the heating layer 300 is also in the shape of an oblong hole. The heating layer 300 is provided with a hollow working cavity with open ends at both ends, and the opening of the working cavity is opposite to the opening of the quartz shell 100 . The oblong hole type heating layer is closer to the shape of the wafer cross section, and has more advantages in temperature uniformity than the round heating layer and the square heating layer.
为了更好的调整作业腔内的温度场,为加热层300准备有多个替换件,每个替换件内部顶面的弧度不同,多个替换件的顶面包含向下凸出和向内凹陷的情况,具体的,加热层可根据工艺结果的不同来调整晶圆的温度,若晶圆的中心膜厚比边缘膜厚相差较多,说明作业腔内的温度场不均匀,可通过替换具有不同弧度顶面的加热层来调整作业腔内的温度场,使得作业腔内的温度更加均匀,进而使得晶圆上形成膜的厚度更加均匀,所述进气法兰120与加热层300的敞口之间设置有进气引导件400,CVD反应用的混合气体由进气法兰120接入并沿着进气引导件400进入作业腔内,所述作业腔内还设置有用于盛放晶圆的托盘500,混合气在进入作业腔后在托盘500内的晶圆上形成目标沉淀层,尾端法兰130上还连接有排气管道,用于保证混合气能够在作业腔内持续流动。In order to better adjust the temperature field in the working chamber, a plurality of replacement parts are prepared for the heating layer 300, and the inner top surface of each replacement part has a different curvature, and the top surfaces of the multiple replacement parts include downward protrusions and inward depressions Specifically, the heating layer can adjust the temperature of the wafer according to the different process results. If the central film thickness of the wafer is more different than the edge film thickness, it means that the temperature field in the working chamber is not uniform. The heating layers on the top surface of different radians can adjust the temperature field in the working chamber, so that the temperature in the working chamber is more uniform, thereby making the thickness of the film formed on the wafer more uniform. An air inlet guide 400 is provided between the ports, and the mixed gas for CVD reaction is connected by the air inlet flange 120 and enters the working chamber along the air inlet guide 400. For the round tray 500, the mixed gas forms a target precipitation layer on the wafers in the tray 500 after entering the working chamber, and an exhaust pipe is also connected to the tail flange 130 to ensure that the mixed gas can flow continuously in the working chamber .
加热层300内对应托盘500的周围还设置有内衬,用于接住落在晶圆外的混合气沉淀物,保持加热层300的洁净状态,所述进气引导件400位于所述内衬的内部,所述托盘500下方设置有用于支撑托盘500的顶盘600,所述顶盘600的底部向外延伸伸展有升降杆,所述升降杆依次穿过加热层300、保温层200和石英壳体100向外延伸,所述顶盘600和升降杆上还设置有驱动所述托 盘500转动的转动组件,所述石英壳体100外还设置有驱动所述升降杆升降运动的升降组件。所述石英壳体100对应保温层200底部的位置设置有托架。保证保温层200和加热层300能够被固定在石英壳体100内。The heating layer 300 is also provided with a lining around the corresponding tray 500 for catching the mixed gas deposits falling outside the wafer and keeping the heating layer 300 clean. The air intake guide 400 is located in the lining. The bottom of the tray 500 is provided with a top plate 600 for supporting the tray 500, and the bottom of the top plate 600 extends outward with a lifting rod, and the lifting rod passes through the heating layer 300, the thermal insulation layer 200 and the quartz in turn. The casing 100 extends outward, the top plate 600 and the lifting rod are also provided with a rotating assembly for driving the tray 500 to rotate, and the quartz casing 100 is also provided with a lifting assembly for driving the lifting rod to move up and down. The quartz shell 100 is provided with a bracket at a position corresponding to the bottom of the thermal insulation layer 200 . It is ensured that the thermal insulation layer 200 and the heating layer 300 can be fixed in the quartz case 100 .
托盘500能够在升降杆的驱动下升降,在需要取晶圆时,可将托盘500升至预定的传片位置,外部的机械手能够更方便的接住托盘500,托盘500在顶盘600下降后与顶盘600实现分离,机械手将托盘500及晶圆由尾端法兰130取出,放置晶圆也是一样,尾端法兰130设置有用于取放晶圆的取放口,取放口上设置有可封闭的开关件。有了升降托盘500的功能,工艺参数多了位置的选择,可根据内衬表面长时间副产物的累计厚度推算,在内衬的厚度增加至托盘500无法正常进行CVD工艺时,将托盘500位置略微升高,使得托盘500超出内村表面副产物的高度,从而保证能够继续进行CVD工艺,最终达到延长内衬使用寿命的目的。The tray 500 can be raised and lowered under the drive of the lift rod. When the wafer needs to be taken out, the tray 500 can be raised to a predetermined transfer position. The external robot can more easily catch the tray 500. After the top tray 600 is lowered, the tray 500 To achieve separation from the top plate 600, the robot takes out the tray 500 and the wafer from the tail flange 130, and the same is true for placing the wafer. Closable switch. With the function of lifting the tray 500, the process parameters have more location options, which can be calculated according to the accumulated thickness of the by-products on the lining surface for a long time. It is raised slightly so that the tray 500 exceeds the height of the by-products on the surface of the inner village, so as to ensure that the CVD process can continue, and finally achieve the purpose of prolonging the service life of the inner lining.
为了使进入作业腔内的混合气能够更加的均匀,在进气法兰120上设置有一组混合气入口121以及一组保护气入口122,所述进气引导件400对应进气法兰120设置有混合气通道410和保护气通道。吹入作业腔的保护气能够避免反应源过早的沉淀在内衬的入口处。In order to make the mixed gas entering the working chamber more uniform, a set of mixed gas inlets 121 and a set of protective gas inlets 122 are provided on the intake flange 120 , and the intake guide 400 is provided corresponding to the intake flange 120 There are mixed gas passages 410 and protective gas passages. The shielding gas blown into the working chamber prevents premature precipitation of the reaction source at the inlet of the liner.
所述混合气通道410通过隔板分隔为与混合气入口121数量一致的独立通道,所述混合气通道410的上方设置有导流坡道430,所述导流坡道430朝所述托盘500的方向倾斜。独立通道使得进入作业腔的混合气体能够更加均匀,保证CVD工艺的效果更好。保护气通道包括多个通气小孔420,所述通气小孔420环绕所述进气引导件400的边缘设置。The mixed gas channel 410 is divided into independent channels with the same number as the mixed gas inlets 121 by the partition plate. A guide ramp 430 is provided above the mixed gas channel 410 , and the guide ramp 430 faces the tray 500 . inclined direction. The independent channel makes the mixed gas entering the working chamber more uniform, which ensures better effect of the CVD process. The protective gas channel includes a plurality of ventilation holes 420 , and the ventilation holes 420 are arranged around the edge of the air intake guide 400 .
为了更加方便的更换内衬,将内衬设置为对接在一起的进气端内衬310和排气端内衬320,所述进气端内衬310和排气端内衬320紧贴加热层300的内壁,所述进气端内衬310和排气端内衬320的对接位置为托盘500的中心线,所述进气端内衬310和排气端内衬320对应托盘500的位置均设置有圆弧缺口。对接在一起的进气端内衬310和排气端内衬320更加容易从加热层300 内取下进行更换,设置的圆弧缺口在对接后正好围合托盘500,避免内衬与托盘500产生较大的间隙。In order to replace the inner liner more conveniently, the inner liner is set as the intake end liner 310 and the exhaust end liner 320 that are butted together, and the intake end liner 310 and the exhaust end liner 320 are close to the heating layer On the inner wall of 300, the butting position of the intake end liner 310 and the exhaust end liner 320 is the center line of the tray 500, and the positions of the intake end liner 310 and the exhaust end liner 320 corresponding to the tray 500 are both. A circular arc gap is provided. The air intake end liner 310 and the exhaust end liner 320 that are butted together are easier to be removed from the heating layer 300 for replacement, and the arc gap is set to enclose the tray 500 after the butt joint to avoid the occurrence of the lining and the tray 500 larger gap.
更进一步的,转动组件包括设置在所述升降杆和顶盘600内的中空气道650,所述托盘500的底部设置有弧形的导气槽511,所述托盘500在升降杆引入的气体的驱动下转动。在进行CVD工艺时,转动的托盘500能够使晶圆上形成更加均匀的沉淀层。所述升降杆包括靠近加热层300的隔热段620以及向外延伸的外伸段630,所述外伸段630的外端与石英壳体100之间还设置有用于动态密封的波纹管640。Further, the rotating assembly includes an air channel 650 disposed in the lift rod and the top plate 600, and an arc-shaped air guide groove 511 is disposed at the bottom of the tray 500. The air introduced by the tray 500 in the lift rod driven by the rotation. During the CVD process, the rotating tray 500 can form a more uniform deposition layer on the wafer. The lift rod includes a thermal insulation section 620 close to the heating layer 300 and an overhanging section 630 extending outward, and a bellows 640 for dynamic sealing is further provided between the outer end of the overhanging section 630 and the quartz shell 100 .
更进一步的,所述托盘500的底部向下延伸设置有凸台510,所述顶盘600的边缘设置有与所述凸台510相匹配的围挡610,所述凸台510位于所述围挡610内。所述围挡610能够避免托盘500在旋转时脱离顶盘600。Further, the bottom of the tray 500 is provided with a boss 510 extending downward, and the edge of the top plate 600 is provided with an enclosure 610 matching the boss 510 , and the boss 510 is located in the enclosure. Block 610. The enclosure 610 can prevent the tray 500 from disengaging from the top tray 600 during rotation.
更进一步的,所述升降杆的底部还设置有观察窗,所述托盘500底部正对中空气道650的位置设置有直沟槽512。在升降杆的观察窗处设置光学检测装置,光学检测装置通过观察窗对直沟槽512的识别能够确定托盘500的转动速度,光学检测装置还能够检测托盘500的温度,方便为后面的工艺调整提供参数。Furthermore, the bottom of the lift rod is also provided with an observation window, and the bottom of the tray 500 is provided with a straight groove 512 at the position where the bottom of the tray 500 is facing the air channel 650 . An optical detection device is provided at the observation window of the lift rod. The optical detection device can determine the rotation speed of the tray 500 through the identification of the straight groove 512 by the observation window. The optical detection device can also detect the temperature of the tray 500, which is convenient for subsequent process adjustment. Provide parameters.
更进一步的,所述加热层300的制作材料为石墨或碳化硅,保温层200采用碳毡材料制成。所述石英壳体100外绕设有用于提供加热能量的感应线圈110。感应线圈110通电后能够产生磁场,置于磁场中的加热层300会因涡流效应产热升温。Further, the heating layer 300 is made of graphite or silicon carbide, and the thermal insulation layer 200 is made of carbon felt. An induction coil 110 for providing heating energy is wound around the quartz shell 100 . After the induction coil 110 is energized, a magnetic field can be generated, and the heating layer 300 placed in the magnetic field will generate heat and heat up due to the eddy current effect.
所述升降组件包括升降机700,所述升降机700内活动设置有竖直的驱动杆710,所述驱动杆710伸出升降机700的部分与升降杆紧固连接,所述升降机700内设置有第二电机,所述第二电机水平布置,第二电机的输出轴通过齿轮齿条与驱动杆710传动连接,齿条720沿驱动杆710的长度方向布置,齿轮730与齿条720啮合且与第二电机的输出轴同轴紧固连接。The lift assembly includes a lifter 700, and a vertical drive rod 710 is movably arranged in the lifter 700. The part of the drive rod 710 extending out of the lifter 700 is fastened to the lifter rod. The lifter 700 is provided with a second The motor, the second motor is arranged horizontally, the output shaft of the second motor is drivingly connected with the drive rod 710 through a rack and pinion, the rack 720 is arranged along the length direction of the drive rod 710, the gear 730 meshes with the rack 720 and is connected with the second motor. The output shaft of the motor is fastened coaxially.
实施例2Example 2
本实施例的主要结构同实施例1,与实施例1不同的是,本实施例对转动组件提出了新的实施方式,具体是,所述转动组件包括设置于升降杆810下端的第一电机800,所述第一电机800固定设置于升降机700的驱动杆710上,所述驱动杆710上设置有用于安装第一电机800的安装平台711,所述第一电机800的输出轴垂直于顶盘所在的平面且通过升降杆810与顶盘600紧固连接。通过第一电机800的转动速度即可得到托盘的转动速度。The main structure of this embodiment is the same as that of Embodiment 1. The difference from Embodiment 1 is that this embodiment proposes a new implementation for the rotating assembly. Specifically, the rotating assembly includes a first motor disposed at the lower end of the lifting rod 810 . 800, the first motor 800 is fixedly arranged on the driving rod 710 of the elevator 700, the driving rod 710 is provided with a mounting platform 711 for installing the first motor 800, and the output shaft of the first motor 800 is perpendicular to the ceiling. The plane on which the disk is located is fastened to the top disk 600 through the lifting rod 810 . The rotation speed of the tray can be obtained by the rotation speed of the first motor 800 .
在本申请的描述中,需要理解的是,本申请中的术语仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。在本发明的描述中,“多个”的含义是两个以上,除非另有明确具体的限定。In the description of the present application, it should be understood that the terms in the present application are only used for the purpose of description, and should not be construed as indicating or implying relative importance or implicitly indicating the number of indicated technical features. In the description of the present invention, "plurality" means two or more, unless otherwise expressly and specifically defined.
在本申请中,除非另有明确的规定和限定,术语“相连”、“连接”、“固定”等术语应做广义理解,例如,可以是固定连接,也可以是可拆卸连接,或成一体;可以是电连接;可以是直接相连,也可以通过中间媒介间接相连,可以是两个元件内部的连通或两个元件的相互作用关系。对于本领域的普通技术人员而言,可以根据具体情况理解上述术语在本发明中的具体含义。In this application, unless otherwise expressly specified and limited, the terms "connected", "connected", "fixed" and other terms should be understood in a broad sense, for example, it may be a fixed connection, a detachable connection, or an integrated ; It can be an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between the two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.
本发明的说明书中,说明了大量具体细节。然而,能够理解,本发明的实施例可以在没有这些具体细节的情况下实践。在一些实例中,并未详细示出公知的方法、系统和技术,以便不模糊对本说明书的理解。In the description of the present invention, numerous specific details are set forth. It will be understood, however, that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, systems and techniques have not been shown in detail in order not to obscure an understanding of this description.
最后应说明的是:以上各实施例仅用以说明本发明的技术方案,而非对其限制;尽管参照前述各实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分或者全部技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的范围,其均应涵盖在本发明的权利要求和说明书的范围当中。Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, but not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: The technical solutions described in the foregoing embodiments can still be modified, or some or all of the technical features thereof can be equivalently replaced; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the technical solutions of the embodiments of the present invention. The scope of the invention should be included in the scope of the claims and description of the present invention.

Claims (12)

  1. 一种碳化硅外延设备的CVD反应模块,其特征在于,包括两端敞口的石英壳体,所述石英壳体两端的敞口处分别密封设置有进气法兰和尾端法兰,所述石英壳体与进气法兰和尾端法兰围合成真空的腔室,所述腔室内设置有加热层和包覆在加热层外的保温层,所述加热层的横截面为长圆孔形,所述加热层内设有中空的作业腔且两端敞口,所述作业腔的敞口与石英壳体的敞口相对,所述加热层具有多个替换件,每个替换件内部顶面的弧度不同,所述进气法兰与加热层的敞口之间设置有进气引导件,所述作业腔内还设置有用于盛放晶圆的托盘,所述加热层内对应托盘的周围还设置有内衬,所述进气引导件位于所述内衬的内部,所述托盘下方设置有用于支撑托盘的顶盘,所述顶盘的底部向外延伸伸展有升降杆,所述升降杆依次穿过加热层、保温层和石英壳体向外延伸,所述顶盘和升降杆上还设置有驱动所述托盘转动的转动组件,所述石英壳体外还设置有驱动所述升降杆升降运动的升降组件。A CVD reaction module of a silicon carbide epitaxy equipment is characterized in that it comprises a quartz shell with openings at both ends, and the openings at both ends of the quartz shell are respectively sealed with an inlet flange and a tail flange, so The quartz shell, the inlet flange and the tail flange are enclosed into a vacuum chamber, the chamber is provided with a heating layer and a thermal insulation layer wrapped outside the heating layer, and the cross section of the heating layer is an oblong hole The heating layer is provided with a hollow working cavity with open ends at both ends, the opening of the working cavity is opposite to the opening of the quartz shell, the heating layer has a plurality of replacement parts, and each replacement part has an interior The curvature of the top surface is different, an air intake guide is arranged between the air inlet flange and the opening of the heating layer, and a tray for holding wafers is also arranged in the working chamber, and the heating layer corresponds to the tray A lining is also arranged around the lining, the air intake guide is located inside the lining, a top plate for supporting the tray is arranged below the tray, and a lifting rod extends outward from the bottom of the top plate, so The lifting rods extend outward through the heating layer, the thermal insulation layer and the quartz shell in turn. The top plate and the lifting rods are also provided with rotating components for driving the rotation of the trays. Lifting components for the lifting movement of the lifting rod.
  2. 根据权利要求1所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述进气法兰上设置有一组混合气入口以及一组保护气入口,所述进气引导件对应进气法兰设置有混合气通道和保护气通道。The CVD reaction module of a silicon carbide epitaxy equipment according to claim 1, wherein a set of mixed gas inlets and a set of protective gas inlets are arranged on the inlet flange, and the inlet guides correspond to the inlets. The gas flange is provided with a mixed gas channel and a protective gas channel.
  3. 根据权利要求2所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述混合气通道通过隔板分隔为与混合气入口数量一致的独立通道,所述混合气通道的上方设置有导流坡道,所述导流坡道朝所述托盘的方向倾斜。The CVD reaction module of a silicon carbide epitaxial equipment according to claim 2, wherein the mixed gas channel is divided into independent channels with the same number of mixed gas inlets by a partition, and the mixed gas channel is arranged above There are diversion ramps that slope in the direction of the trays.
  4. 根据权利要求2或3所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述保护气通道包括多个通气小孔,所述通气小孔环绕所述进气引导件的边缘设置。The CVD reaction module of a silicon carbide epitaxial equipment according to claim 2 or 3, wherein the protective gas channel comprises a plurality of ventilation holes, and the ventilation holes surround the edge of the air inlet guide set up.
  5. 根据权利要求1所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述内衬包括对接在一起的进气端内衬和排气端内衬,所述进气端内衬和排气端内衬紧贴加热层的内壁,所述进气端内衬和排气端内衬的对接位置为托盘的中心线,所述进气端内衬和排气端内衬对应托盘的位置均设置有圆弧缺 口。The CVD reaction module of a silicon carbide epitaxy equipment according to claim 1, wherein the lining comprises an inlet end liner and an exhaust end liner that are butted together, and the inlet end liner The inner lining of the intake end and the lining of the exhaust end are closely attached to the inner wall of the heating layer, the butting position of the inner lining of the intake end and the inner lining of the exhaust end is the center line of the tray, and the inner lining of the intake end and the inner lining of the exhaust end correspond to the tray There are arc gaps at the positions.
  6. 根据权利要求1所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述转动组件包括设置在所述升降杆和顶盘内的中空气道,所述托盘的底部设置有弧形的导气槽,所述托盘在升降杆引入的气体的驱动下转动。The CVD reaction module of a silicon carbide epitaxy equipment according to claim 1, wherein the rotating assembly comprises an air channel arranged in the lift rod and the top tray, and the bottom of the tray is provided with an arc The tray is driven by the gas introduced by the lifting rod to rotate.
  7. 根据权利要求6所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述托盘的底部向下延伸设置有凸台,所述顶盘的边缘设置有与所述凸台相匹配的围挡,所述凸台位于所述围挡内。The CVD reaction module of a silicon carbide epitaxial equipment according to claim 6, wherein the bottom of the tray is provided with a boss extending downward, and the edge of the top plate is provided with a boss matching the boss The enclosure, the boss is located in the enclosure.
  8. 根据权利要求6所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述升降杆的底部还设置有观察窗,所述托盘底部正对中空气道的位置设置有直沟槽。The CVD reaction module of a silicon carbide epitaxy equipment according to claim 6, wherein the bottom of the lift rod is further provided with an observation window, and the bottom of the tray is provided with a straight groove at a position facing the air channel .
  9. 根据权利要求1所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述转动组件包括设置于升降杆下端的第一电机,所述第一电机的输出轴垂直于顶盘所在的平面且通过升降杆与顶盘紧固连接。The CVD reaction module of a silicon carbide epitaxy equipment according to claim 1, wherein the rotating assembly comprises a first motor disposed at the lower end of the lift rod, and the output shaft of the first motor is perpendicular to the position where the top plate is located. The plane is fastened with the top plate through the lifting rod.
  10. 根据权利要求1所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述加热层的制作材料为石墨或碳化硅,所述石英壳体外绕设有用于提供加热能量的感应线圈。The CVD reaction module of a silicon carbide epitaxy device according to claim 1, wherein the heating layer is made of graphite or silicon carbide, and an induction coil for providing heating energy is wound around the quartz shell. .
  11. 根据权利要求1、6或8所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述升降杆包括靠近加热层的隔热段以及向外延伸的外伸段,所述外伸段的外端与石英壳体之间还设置有用于动态密封的波纹管。The CVD reaction module of a silicon carbide epitaxy equipment according to claim 1, 6 or 8, wherein the lift rod comprises a heat insulating section close to the heating layer and an outwardly extending section, the outer section A bellows for dynamic sealing is also arranged between the outer end of the extension and the quartz shell.
  12. 根据权利要求1所述的一种碳化硅外延设备的CVD反应模块,其特征在于,所述石英壳体对应保温层底部的位置设置有托架。The CVD reaction module of a silicon carbide epitaxy equipment according to claim 1, wherein a bracket is provided at a position of the quartz shell corresponding to the bottom of the thermal insulation layer.
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CN114775047A (en) * 2022-04-12 2022-07-22 广州志橙半导体有限公司 Reaction device for epitaxial growth
CN114775047B (en) * 2022-04-12 2022-12-20 广州志橙半导体有限公司 Reaction device for epitaxial growth

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