WO2022000591A1 - 介质波导滤波器的测试工装 - Google Patents

介质波导滤波器的测试工装 Download PDF

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Publication number
WO2022000591A1
WO2022000591A1 PCT/CN2020/102981 CN2020102981W WO2022000591A1 WO 2022000591 A1 WO2022000591 A1 WO 2022000591A1 CN 2020102981 W CN2020102981 W CN 2020102981W WO 2022000591 A1 WO2022000591 A1 WO 2022000591A1
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Prior art keywords
test
circuit board
filter
dielectric waveguide
test tool
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PCT/CN2020/102981
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English (en)
French (fr)
Inventor
韩莉
李陆龙
王红军
姜华
岳月华
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AAC Technologies Holdings Shenzhen Co Ltd
AAC Module Technologies Changzhou Co Ltd
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AAC Acoustic Technologies Shenzhen Co Ltd
AAC Module Technologies Changzhou Co Ltd
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Application filed by AAC Acoustic Technologies Shenzhen Co Ltd, AAC Module Technologies Changzhou Co Ltd filed Critical AAC Acoustic Technologies Shenzhen Co Ltd
Publication of WO2022000591A1 publication Critical patent/WO2022000591A1/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals

Definitions

  • the invention relates to the field of filter component testing, in particular to a testing tool for a dielectric waveguide filter.
  • filters have played an extremely important role in the processing of electronic signals, which are mainly used to filter signals of used frequencies and suppress interfering signals.
  • filters when the filter is tested, it will have an impact on the filter, and even damage the filter in severe cases, and the structure of many filter testing tooling is very complicated, and the process of testing the filter is very complicated. Cumbersome and time-consuming.
  • the purpose of the present invention is to provide a simpler and more convenient testing tool for the dielectric waveguide filter.
  • the invention provides a test tool for a dielectric waveguide filter, including a test tool base, the test tool base includes a first surface and a second surface opposite to the first surface, the first surface is mounted with a pressure head and a test circuit board, the side of the test circuit board located on the first surface is provided with a grounding plug-in and a signal transmission plug-in, the side of the test circuit board located on the second surface is provided with a test SMA connector, the The test SMA connector is connected to the transmission insert.
  • a limit fixture is provided on the top of the test circuit board, and the limit fixture is fixed on the first surface.
  • the limiting fixture has an installation position, and a signal shielding block is fixedly connected inside the installation position.
  • a filter to be tested is also arranged in the installation position, and the filter is arranged on the top of the signal shielding block.
  • grounding plug and the signal transmission plug are connected to the filter through the signal shielding block.
  • the top of the filter is provided with the pressure head, and the pressure head is pressed against the filter.
  • first surface is provided with a first groove for accommodating the test circuit board
  • second surface is provided with a second groove for accommodating the test SMA device.
  • grounding plug-in is a grounding pin
  • signal transmission plug-in is an input/output pin
  • mounting holes for accommodating the test SMA connectors are opened between the first surface and the second surface, the number of the mounting holes is two, and the two test SMA connectors are correspondingly mounted on the test SMA connectors. in the mounting hole.
  • the invention provides a test tool for a dielectric waveguide filter, including a test tool base, the test tool base includes a first surface and a second surface opposite to the first surface, the first surface is mounted with a pressure head and a test circuit board, the side of the test circuit board located on the first surface is provided with a grounding plug-in and a signal transmission plug-in, the side of the test circuit board located on the second surface is provided with a test SMA connector, the The test SMA connector is connected to the transmission insert.
  • the side of the test circuit board exposed to the second surface is welded with a test SMA head, and the test SMA head is close to this side.
  • Fig. 1 is the overall structure exploded schematic diagram of the test tool of the present invention
  • Fig. 2 is the overall structure schematic diagram of the present invention
  • Fig. 3 is the structural schematic diagram of the limiting fixture of the present invention.
  • Fig. 4 is the sectional view of A-A direction in Fig. 3;
  • Fig. 5 is the schematic diagram of the test circuit board of the present invention.
  • FIG. 6 is a schematic diagram of the test SMA connector of the present invention.
  • a test fixture for a dielectric waveguide filter includes a test fixture base 1 , and the test fixture base 1 includes a first surface 11 and a second surface 12 disposed opposite to the first surface 11 .
  • the first surface 11 is installed with an indenter 2 and a test circuit board 3, and the test circuit board 3 is provided with a grounding plug-in and a signal transmission plug-in on one side of the first surface 11.
  • the grounding plug-in is the grounding Pin 8, and the signal transmission plug-in
  • the side of the test circuit board 3 located on the second surface 12 is provided with a test SMA connector 6, and the test SMA connector 6 is connected with the transmission plug-in.
  • the first surface 11 is provided with a first groove for accommodating the test circuit board 3
  • the second surface 12 is provided with a second groove for accommodating the test SMA device
  • the first surface 11 and the second surface Mounting holes for accommodating the test SMA connectors 6 are opened between 12 , there are two mounting holes, and the two test SMA connectors 6 are correspondingly mounted in the mounting holes.
  • the test fixture of the dielectric waveguide filter includes a test fixture base 1, and the test fixture base 1 includes a first surface 11 and a second surface 12 opposite to the first surface 11.
  • the first surface 11 is installed with a An indenter 2, the first surface 11 is also provided with a first groove for accommodating the test circuit board 3, the size and thickness of the first groove are consistent with the shape of the test circuit board 3, so that the appearance of the first surface 11 is Clean and flat, the side of the test circuit board 3 close to the first surface 11 is provided with a ground pin 8 and an input/output pin 9, the ground pin 8 and the input/output pin 9 are exposed on the first surface 11, and the test circuit board is 3.
  • the side close to the second surface 12 is provided with a test SMA connector 6, the first surface 11 and the second surface 12 are provided with mounting holes for accommodating the test SMA connector 6, and the test SMA connector 6 is opened from the second side of the test tool base 1.
  • the surface 12 is exposed, and the second groove of the second surface 12 of the test jig base 1 can be used to place the instrument connected to the test SM connector 6 .
  • the input/output pins 9 on both sides of the test circuit board 3 and the test SMA connector 6 are connected, and the test SMA connector 6 is directly connected to the input/output pin 9 through the test circuit board 3 .
  • the top of the test circuit board 3 is provided with a limit fixture 4, which is fixed on the first surface 11 of the test fixture base 1.
  • the limit fixture 4 is provided with an installation position, and a signal shielding block 7 is fixedly connected to the inside of the installation position.
  • the inside of the installation position of the position fixture 4 is fixedly connected to the signal shielding block 7 by means of screws.
  • a filter 5 to be tested is also placed in the installation position of the limiting fixture 4 , the filter 5 is also arranged on the top of the signal shielding block 7 , and the ground Pin 8 and the input/output Pin 9 are connected through the signal shielding block 7 on filter 5.
  • the limit fixture 4 defines the position of the filter 5. When the test tool is working, the position of the filter 5 will not change, and the test is more convenient.
  • the installation position of the limit fixture 4 can be divided into two parts. , a part is close to the test circuit board 3, this part is fixed with a signal shielding block 7, the ground pin 8 and the input/output pin 9 can penetrate the signal shielding block 7, the function of the signal shielding block 7 is to pass the test filter 5 When the performance is high, some external interference can be shielded, thereby preventing the impact on the test signal, and the installation position of the limit fixture 4 is close to the other part of the indenter 2.
  • a filter 5 is placed, and the size of the filter 5 is the same as The size of the installation position is the same, the filter 5 is placed on the signal shielding block 7 , the input/output pin 9 and the grounding pin 8 can directly contact the filter 5 through the signal shielding block 7 .
  • the top of the filter 5 is provided with a pressure head 2, and the pressure head 2 is pressed against the filter 5, that is, the filter 5 is fixed in the limit fixture 4, which plays a fixed role, so that the filter 5 can be connected with the filter 5.
  • Ground pin 8 and input/output pin 9 are in contact.
  • the present invention provides a test tool for a dielectric waveguide filter, including a test tool base 1 , and the test tool base 1 includes a first surface 11 and a second surface disposed opposite to the first surface 11 12.
  • An indenter 2 and a test circuit board 3 are installed on the first surface 11.
  • the test circuit board 3 is provided with a grounding plug-in and a signal transmission plug-in on one side of the first surface 11.
  • One side of the second surface 12 is provided with a test SMA connector 6, and the test SMA connector 6 is connected to the transmission plug-in.
  • the instrument for testing the filter is connected to the test SMA connector 6 at the bottom of the test tool base 1, and the test SMA connector 6 is welded to the test circuit board 3, and the other side of the test circuit board 3 is welded with the ground pin 8 and the input/output pin. 9.
  • the test SMA connector 6 corresponds to the input/output pin 9, and the input/output pin 9 and ground pin 8 can directly contact the filter 5 through the signal shielding block 7, and the indenter 2 directly presses the filter 5. It can be ensured that the filter 5 can definitely contact the input/output pin 9 and the ground pin 8, that is, the test SMA connector 6 directly contacts the filter 5 when the input/output pin 9 is in contact with the filter 5.
  • the performance of the filter 5 can be directly tested under the condition that the test SMA connector 6 does not contact the filter 5, and the signal shielding block 7 can also shield the external interference signal, thereby reducing the impact on the test signal, Moreover, the test tool has a simple structure and is convenient to use.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Waveguide Connection Structure (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

一种介质波导滤波器（5）的测试工装，包括测试工装底座（1），测试工装底座（1）包括第一表面（11）和与第一表面（11）相对设置的第二表面（12），第一表面（11）安装有一压头（2）和一测试电路板（3），测试电路板（3）位于第一表面（11）的一侧设置有接地插件（8）和信号传输插件（9），测试电路板位（3）于第二表面（12）的一侧设置有测试SMA接头（6），测试SMA接头（6）与信号传输插件（9）连接。提出的测试电路板（3）靠近第二表面（12）的一侧焊接有测试SMA接头（6），测试SMA接头（6）靠近这一侧，在测试滤波器（5）的时候，测试SMA接头（6）可以不用直接与滤波器（5）接触，即也不会破坏滤波器（5），而且该测试工装的结构简单方便。

Description

介质波导滤波器的测试工装 技术领域
本发明涉及滤波器件测试领域，尤其涉及一种介质波导滤波器的测试工装。
 背景技术
长久以来，滤波器一直在电子信号的处理中起着极其重要的作用，它主要用于过滤使用频率的信号和抑制干扰信号。但是在现有的技术中，对滤波器进行检测的时候，会对滤波器产生影响，严重的甚至会破坏滤波器，而且很多对滤波器测试的工装的结构都很复杂，检测滤波器的过程繁琐、耗时长。
因此，有必要提供一种既能不破坏滤波器、又快速简便的检测介质波导滤波器的测试工装。
 技术问题
本发明的目的在于提供一种更为简单方便的介质波导滤波器的测试工装。
 技术解决方案
本发明的技术方案如下：
本发明提供了一种介质波导滤波器的测试工装，包括测试工装底座，所述测试工装底座包括第一表面和与所述第一表面相对设置的第二表面，所述第一表面安装有一压头和一测试电路板，所述测试电路板位于第一表面的一侧设置有接地插件和信号传输插件，所述测试电路板位于所述第二表面的一侧设置有测试SMA接头，所述测试SMA接头与所述传输插件连接。
进一步的，所述测试电路板顶部设置有一限位夹具，所述限位夹具固定于所述第一表面。
进一步的，所述限位夹具具有一安装位，所述安装位内部固定连接有一信号屏蔽块。
进一步的，所述安装位内还设置有待测试滤波器，所述滤波器设置于所述信号屏蔽块顶部。
进一步的，所述接地插件和信号传输插件贯穿所述信号屏蔽块连接于所述滤波器。
进一步的，所述滤波器的顶部设置有所述压头，所述压头抵压于所述滤波器。
进一步的，所述第一表面开设有用于容置所述测试电路板的第一凹槽，所述第二表面开设有用于容置测试SMA器件的第二凹槽。
进一步的，所述接地插件为接地Pin针，所述信号传输插件为输入/输出Pin针。
进一步的，所述第一表面与所述第二表面之间开设有用于容置所述测试SMA接头的安装孔，所述安装孔为2个，2个所述测试SMA接头对应安装于所述安装孔内。
 有益效果
本发明的有益效果在于：
本发明提供了一种介质波导滤波器的测试工装，包括测试工装底座，所述测试工装底座包括第一表面和与所述第一表面相对设置的第二表面，所述第一表面安装有一压头和一测试电路板，所述测试电路板位于第一表面的一侧设置有接地插件和信号传输插件，所述测试电路板位于所述第二表面的一侧设置有测试SMA接头，所述测试SMA接头与所述传输插件连接。本发明中测试电路板暴露于第二表面的一侧焊接有测试SMA头，测试SMA头靠近这一侧，在测试滤波器的时候，测试SMA头可以不用直接与滤波器接触，即也不会破坏滤波器，而且该测试工装的结构简单方便。
 附图说明
图1为本发明的测试工装的整体结构爆炸示意图；
图2为本发明的整体结构示意图；
图3为本发明的限位夹具的结构示意图；
图4为图3中A-A方向的剖视图；
图5为本发明的测试电路板的示意图；
图6为本发明的测试SMA接头的示意图。
 本发明的实施方式
需要说明的是，在不冲突的情况下，本申请中的实施例及实施例中的特征可以相互组合。下面将参考附图并结合实施例来详细说明本发明。
应该指出，以下详细说明都是例示性的，旨在对本发明提供进一步的说明。除非另有指明，本文使用的所有技术和科学术语具有与本申请所属技术领域的普通技术人员通常理解的相同含义。
需要注意的是，这里所使用的术语仅是为了描述具体实施方式，而非意图限制根据本发明的示例性实施方式。如在这里所使用的，除非上下文另外明确指出，否则单数形式也意图包括复数形式，此外，还应当理解的是，当在本说明书中使用术语“包含”和/或“包括”时，其指明存在特征、步骤、操作、器件、组件和/或它们的组合。
下面结合附图和实施方式对本发明作进一步说明。参见图1，一种介质波导滤波器的测试工装，包括测试工装底座1，所述测试工装底座1包括第一表面11和与第一表面11相对设置的第二表面12，所述第一表面11安装有一压头2和一测试电路板3，测试电路板3位于第一表面11的一侧设置有接地插件和信号传输插件，本实施例中，接地插件为接地Pin针8，信号传输插件为输入/输出Pin针9，测试电路板3位于第二表面12的一侧设置有测试SMA接头6，测试SMA接头6与所述传输插件连接。
在本实施例中，第一表面11开设有用于容置测试电路板3的第一凹槽，第二表面12开设有容置测试SMA器件的第二凹槽，第一表面11与第二表面12之间开设有用于容置测试SMA接头6的安装孔，安装孔为2个，2个测试SMA接头6对应安装于安装孔内。
在本实施例中，介质波导滤波器的测试工装包括一个测试工装底座1，测试工装底座1包括了第一表面11和与第一表面11相对设置的第二表面12，第一表面11安装了一个压头2，第一表面11还开设有一个用于容置测试电路板3的第一凹槽，第一凹槽的大小和厚度与测试电路板3外形一致，使得第一表面11的外观干净平整，测试电路板3靠近第一表面11的一侧设有接地Pin针8和输入/输出Pin针9，接地Pin针8和输入/输出Pin针9暴露于第一表面11，测试电路板3靠近第二表面12的一侧设有测试SMA接头6，第一表面11与第二表面12开设有容置于测试SMA接头6的安装孔，测试SMA接头6从测试工装底座1的第二表面12露出来，测试工装底座1的第二表面12的第二凹槽可以用来放置连接测试SM接头6的仪器。测试电路板3两侧的输入/输出pin针9、测试SMA接头6连接，测试SMA接头6通过测试电路板3直接与输入/输出pin针9连接。
测试电路板3的顶部设置有一限位夹具4，并固定于测试工装底座1的第一表面11，限位夹具4设有一安装位，安装位的内部固定连接有一信号屏蔽块7，且，限位夹具4的安装位内部通过螺丝固定连接所述信号屏蔽块7。
具体的，限位夹具4的安装位内还放置有待测试滤波器5，滤波器5还设置于信号屏蔽块7的顶部，接地Pin针8和输入/输出Pin针9贯穿了信号屏蔽块7连接于滤波器5。
该限位夹具4限定了滤波器5的位置，该测试工装工作的时候，滤波器5的位置不会变，测试的时候也更方便，该限位夹具4的安装位具体可分为两部分，一部分靠近测试电路板3，这一部分固定有一信号屏蔽块7，接地pin针8、输入/输出pin针9均可穿透信号屏蔽块7，信号屏蔽块7的作用是在通过测试滤波器5的性能的时候，可以屏蔽外界的某些干扰，从而防止对测试信号造成影响，而该限位夹具4的安装位靠近压头2的另一部分放置有滤波器5，该滤波器5的大小与该安装位位置的大小一致，滤波器5放置于信号屏蔽块7上，输入/输出pin针9、接地pin针8可透过信号屏蔽块7直接与滤波器5接触。
进一步的，滤波器5的顶部设置有压头2，压头2抵压于滤波器5，即将滤波器5固定于限位夹具4中，起到了一个固定的作用，使滤波器5一定可以与接地pin针8、输入/输出pin针9接触。
综上所述，本发明提供了一种介质波导滤波器的测试工装，包括测试工装底座1，所述测试工装底座1包括第一表面11和与所述第一表面11相对设置的第二表面12，所述第一表面11安装有一压头2和一测试电路板3，所述测试电路板3位于第一表面11的一侧设置有接地插件和信号传输插件，所述测试电路板3位于所述第二表面12的一侧设置有测试SMA接头6，所述测试SMA接头6与所述传输插件连接。测试滤波器的仪器通过连接测试工装底座1的底部的测试SMA接头6，测试SMA接头6焊接于测试电路板3上，测试电路板3的另一面焊接有接地pin针8、输入/输出pin针9，测试SMA接头6与输入/输出pin针9相对应，而输入/输出pin针9、接地pin针8可通过信号屏蔽块7直接与滤波器5接触，压头2直接抵压住滤波器5，可保证滤波器5一定可以接触到输入/输出pin针9、接地pin针8，即测试SMA接头6直接在输入/输出pin针9接触到滤波器5的情况下，对滤波器5进行测试，这样就可以在测试SMA接头6不接触滤波器5的情况下，直接对滤波器5的性能进行一个测试，信号屏蔽块7还可屏蔽外界的干扰信号，从而减少对测试信号的影响，而且该测试工装的结构简单，使用方便。
需要说明的是，本发明的说明书和权利要求书及上述附图中的术语“第一”、“第二”等是用于区别类似的对象，而不必用于描述特定的顺序或先后次序。应该理解这样使用的数据在适当情况下可以互换，以便这里描述的本申请的实施方式例如能够以除了在这里图示或描述的那些以外的顺序实施。此外，术语“包括”和“具有”以及他们的任何变形，意图在于覆盖不排他的包含，例如，包含了一系列步骤或单元的过程、方法、系统、产品或设备不必限于清楚地列出的那些步骤或单元，而是可包括没有清楚地列出的或对于这些过程、方法、产品或设备固有的其它步骤或单元。
以上所述的仅是本发明的实施方式，在此应当指出，对于本领域的普通技术人员来说，在不脱离本发明创造构思的前提下，还可以做出改进，但这些均属于本发明的保护范围。

Claims (9)

  1. 一种介质波导滤波器的测试工装，包括测试工装底座，所述测试工装底座包括第一表面和与所述第一表面相对设置的第二表面，其特征在于，所述第一表面安装有一压头和一测试电路板，所述测试电路板位于所述第一表面的一侧设置有接地插件和信号传输插件，所述测试电路板位于所述第二表面的一侧设置有测试SMA接头，所述测试SMA接头与所述传输插件连接。
  2. 根据权利要求1所述的介质波导滤波器的测试工装，其特征在于：所述测试电路板顶部设置有一限位夹具，所述限位夹具固定于所述第一表面。
  3. 根据权利要求2所述的介质波导滤波器的测试工装，其特征在于：所述限位夹具具有一安装位，所述安装位内部固定连接有一信号屏蔽块。
  4. 根据权利要求3所述的介质波导滤波器的测试工装，其特征在于：所述安装位内还设置有待测试滤波器，所述滤波器设置于所述信号屏蔽块顶部。
  5. 根据权利要求4所述的介质波导滤波器的测试工装，其特征在于：所述接地插件和信号传输插件贯穿所述信号屏蔽块连接于所述滤波器。
  6. 根据权利要求5所述的介质波导滤波器的测试工装，其特征在于：所述滤波器的顶部设置有所述压头，所述压头抵压于所述滤波器。
  7. 根据权利要求1-6任一项所述的介质波导滤波器的测试工装，其特征在于：所述第一表面开设有用于容置所述测试电路板的第一凹槽，所述第二表面开设有用于容置测试SMA器件的第二凹槽。
  8. 根据权利要求7所述的介质波导滤波器的测试工装，其特征在于：所述接地插件为接地Pin针，所述信号传输插件为输入/输出Pin针。
  9. 根据权利要求7所述的介质波导滤波器的测试工装，其特征在于：所述第一表面与所述第二表面之间开设有用于容置所述测试SMA接头的安装孔，所述安装孔为2个，2个所述测试SMA接头对应安装于所述安装孔内。
PCT/CN2020/102981 2020-06-30 2020-07-20 介质波导滤波器的测试工装 Ceased WO2022000591A1 (zh)

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