WO2021259330A1 - 直流电源的老化测试电路及系统 - Google Patents
直流电源的老化测试电路及系统 Download PDFInfo
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- 230000032683 aging Effects 0.000 title claims abstract description 63
- 238000012360 testing method Methods 0.000 title claims abstract description 59
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
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- the embodiments of the present application relate to the technical field of power supply testing.
- DC power supplies As a power supply device for electronic equipment, DC power supplies have been used more and more widely in the fields of computers, communications, railways, aerospace, and household appliances. In order to improve the stability and reliability of power supply products, domestic and foreign manufacturers need to perform aging tests on DC power supplies during the production process of DC power supplies.
- One aspect of the embodiments of the present application provides an aging test circuit for a DC power supply, including a rectifier and voltage regulator module, a load module, a first port for connecting the positive input of the DC power supply to be tested, and a circuit for connecting the negative input of the DC power supply to be tested.
- the positive output of the voltage regulating module is connected to the first port, the negative output of the rectifying and regulating module is connected to the second port, and the fourth port is connected to the second port; and the output of the load module is connected to the first port,
- the input terminal is connected to the third port.
- Another aspect of the embodiments of the present application provides an aging test system for a DC power supply, including the above-mentioned aging test circuit for the DC power supply, and a DC power supply module to be tested; wherein the DC power supply module to be tested is a DC power supply, and the input of the DC power supply The positive pole is connected to the first port, the input negative pole of the DC power supply is connected to the second port, the output positive pole of the DC power supply is connected to the third port, and the output negative pole of the DC power supply is connected to the fourth port.
- an aging test system for a DC power supply including the above-mentioned aging test circuit for the DC power supply, and a DC power supply module to be tested; wherein the DC power supply module to be tested includes a total input positive electrode, a total input negative electrode, Total output positive, total output negative, and N DC power supplies; total input positive connected to the first port, and total input positive connected to the input positive of each DC power supply; total input negative connected to the second port, and total input negative Connect to the negative input of each DC power supply; the positive output of the total output is connected to the third port, and the positive output of the total output is connected to the positive output of the first DC power supply; the negative of the total output is connected to the fourth port; and, the nth DC power supply The output negative pole of is connected to the output positive pole of the n+1th DC power supply, and the total output negative pole is connected to the output negative pole of the Nth DC power supply, where N is a positive integer greater than 1, and n is a
- Fig. 1 is a circuit diagram of self-aging a DC power supply according to the related art.
- Fig. 2 is a circuit diagram of an aging test circuit of a DC power supply provided by an embodiment of the present application.
- Fig. 3 is a structural diagram of a aging test system for a DC power supply provided by an embodiment of the present application.
- Fig. 4 is a structural diagram of a aging test system for a DC power supply provided by an embodiment of the present application.
- Fig. 5 is a circuit diagram of a boost module of the aging test system for a DC power supply provided by an embodiment of the present application.
- Fig. 6 is a structural diagram of a aging test system for a DC power supply provided by an embodiment of the present application.
- the aging test usually uses energy feedback to the AC power grid for aging.
- the output end of the DC power supply is connected to an energy feedback type load to feed energy back to the AC power grid, realizing energy recycling.
- the energy feedback load needs to realize functions such as DC/DC boost, voltage stabilization, and DC/AC inverter, and it has the defect of low energy conversion efficiency.
- the self-aging circuit is shown in Figure 1.
- the output end of the DC power supply is connected to an energy feedback type load, and energy is fed back to the input end of the DC power supply.
- the self-aging capability conversion efficiency is higher.
- the design requirements for the energy regenerative load used for self-aging are high, which leads to the expensive price of the energy regenerative load, which in turn makes the cost of self-aging high.
- An embodiment of the application provides an aging test circuit for a DC power supply, including a rectifier and voltage regulator module, a load module, a first port for connecting the positive input of the DC power supply to be tested, and a second port for connecting the negative input of the DC power supply to be tested ,
- the third port used to connect the positive output of the DC power supply to be tested
- the fourth port used to connect the negative output of the DC power supply to be tested.
- the input terminal of the rectifier and voltage regulation module is used to connect to an external power source, the output anode of the rectifier and voltage regulation module is connected to the first port, the output cathode of the rectifier and voltage regulation module is connected to the second port, and the fourth port is connected to the second port.
- the voltage regulating module is used to regulate the voltage between the first port and the second port; the output end of the load module is connected to the first port, and the input end of the load module is connected to the third port.
- the aging test circuit of the DC power supply provided in the embodiment of the present application reduces the self-aging cost.
- the aging test circuit of the DC power supply may include: a first port 101, a second port 102, a third port 103, a fourth port 104, a rectification and voltage regulation module 105, and a load module 106; Port 102, third port 103, and fourth port 104 are respectively used to connect the input positive, input negative, output positive, and output negative of the DC power supply to be tested; the input end of the rectifier and voltage regulator module 105 is used to connect to an external power source, rectify and adjust The output anode of the voltage module 105 is connected to the first port 101, the output cathode of the rectifier and voltage regulator module is connected to the second port 102 and the fourth port 104; the input end of the load module 106 is connected to the third port 103, and the output of the load module 106 The terminal is connected to the first port 101.
- the external power source is commercial power
- the rectifying and voltage regulating module 105 is used to convert the commercial power into direct current, adjust the voltage of the converted direct current, and also control the power up and down of the entire aging test circuit.
- the rectification and voltage regulation module 105 may be a single-phase rectifier or a three-phase rectifier.
- the load module 106 is specifically an electronic load. Since the electronic load is small in size and easy to maintain, the cost of self-aging is further reduced.
- the DC power supply to be tested may be a single DC power supply or multiple DC power supplies connected in series.
- the aging test circuit of the DC power supply provided by the embodiment of the present application has the positive output of the rectifier and voltage regulator connected to the first port for connecting the positive input of the DC power supply to be tested, and the output negative electrode of the rectifier and voltage regulator is connected To the second port for connecting the negative input of the DC power supply to be tested and the fourth port for connecting the negative output of the DC power supply to be tested, the rectifier and voltage regulator module is used to adjust the voltage between the positive input and the negative input of the DC power supply to be tested.
- the output end of the load module is connected to the first port, and the input end of the load module is connected to the third port for connecting the positive output of the DC power supply to be tested.
- the load module can use energy feedback type loads, or electronic loads, etc. Other types of loads with lower cost reduce the cost of self-aging, and can realize load dynamic jump aging during the self-aging process, which further improves the energy conversion efficiency of self-aging.
- the embodiment of the present application also provides an aging test system for a DC power supply, which includes the above-mentioned aging test circuit for the DC power supply, and further includes a DC power supply module to be tested.
- the DC power supply module to be tested is a DC power supply, and the input anode of the DC power supply is connected to In the first port, the input negative electrode of the DC power supply is connected to the second port, the output positive electrode of the DC power supply is connected to the third port, and the output negative electrode of the DC power supply is connected to the fourth port.
- the aging test system of the DC power supply may include: a rectifier and voltage regulator module 201, a load module 202 and a DC power supply 203.
- the input terminal of the rectifier and voltage regulation module 201 is used to connect to an external power source
- the output anode of the rectifier and voltage regulation module 201 is connected to the input anode of the DC power supply 203
- the output cathode of the rectification and voltage regulation module 201 is connected to the input cathode of the DC power source 203.
- the output anode of the DC power supply 203 is connected to the input terminal of the load module 202, the output cathode of the DC power supply 203 is connected to the input cathode of the DC power supply 203, and the output terminal of the load module 202 is connected to the input anode of the DC power supply 203.
- the external power source is commercial power
- the rectifier and voltage regulator module 201 is used to convert the commercial power into direct current, adjust the voltage of the converted direct current, and also control the power up and down of the entire aging test circuit.
- the rectification and voltage regulation module 201 may be a single-phase rectifier or a three-phase rectifier.
- the rectifier and voltage regulator module 201 is connected to the mains to work, convert the city power into DC power and supply it to the DC power source 203. At this time, the rectifier and voltage regulator module 201 regulates the input voltage of the DC power source 203 to its specified input voltage Within the range, the DC power supply 203 is powered on, and the electric energy is fed back to the DC power supply 203 itself via the load module 202. In this process, the self-aging energy conversion efficiency can be performed by controlling the current adjustment system of the load module 202.
- the aging test system of the DC power supply provided by the embodiment of the present application is only connected to the output positive pole of the DC power supply, so the input voltage requirement of the load module is reduced, and the design requirements of the load module are reduced. Also reduce, the load module can use energy feedback type load, and can also use other types of loads with lower cost such as electronic load, which reduces the cost of self-aging, and can realize load dynamic jump aging during the self-aging process, and further Improved self-aging energy conversion efficiency.
- the embodiment of the application also provides an aging test system for a DC power supply, including the above-mentioned aging test circuit for the DC power supply, and further includes a DC power supply module to be tested.
- the DC power supply module to be tested includes a total input positive electrode, a total input negative electrode, and a total output positive electrode.
- the total output negative pole and N DC power supplies. The total input positive pole is connected to the first port; the total input negative pole is connected to the second port; the total output positive pole is connected to the third port; the total output negative pole is connected to the fourth port; the total input positive pole is connected to each port.
- each DC power supply The positive input of each DC power supply is connected, the negative total input is connected to the negative output of each DC power supply, the positive output of the total output is connected to the positive output of the first DC power supply, and the output negative of the nth DC power supply is connected to the n+1th DC
- the output positive pole of the power supply is connected, and the total output negative pole is connected to the output negative pole of the Nth DC power supply, where N is a positive integer greater than 1, and n is a positive integer less than N.
- the aging test system of the DC power supply may include: a rectifier and voltage regulator module 301, a load module 302, a boost module 303, a DC power supply 304, a DC power supply 305, a DC power supply 306, and DC power supply four 307.
- the input end of the rectification and voltage regulation module 301 is used to connect to an external power source.
- the output anode of the rectification and voltage regulation module 301 and the output end of the load module 302 are both connected to the DC power supply 304, DC power supply 305, DC power supply 306, and DC power supply.
- the positive input of 307, the negative output of the rectifier and voltage regulator module 301, and the negative output of the boost module 303 are all connected to the DC power supply one 304, DC power supply two 305, DC power supply three 306, DC power supply four 307 input negative, DC power supply
- the positive output of one 304 is connected to the positive input of the boost module 303
- the negative output of DC power supply one 304 is connected to the positive output of DC power supply two 305
- the output negative pole of DC power supply two 305 is connected to the output positive pole of DC power supply three 306.
- the output negative pole of the power supply three 306 is connected to the output positive pole of the DC power supply four 307, the output negative pole of the DC power supply four 307 is connected to the input negative pole of the boost module 303, and the output positive pole of the boost module 303 is connected to the input terminal of the load module 302.
- the external power source is commercial power
- the rectifying and voltage regulating module 301 is used to convert the commercial power into direct current, adjust the voltage of the converted direct current, and also control the power up and down of the entire aging test circuit.
- the rectification and voltage regulation module 301 may be a single-phase rectifier or a three-phase rectifier.
- the boost module 303 is a boost circuit composed of an inductor L, a switch Q (specifically, a switch tube such as a triode or a field effect tube), a diode VD and a capacitor C.
- the circuit is shown in Figure 5. .
- port L1 is used to connect the positive output of DC power supply one 304
- port N1 is used to connect the output negative pole of DC power supply four 307
- port L2 is used to connect the input end of load module 302
- port N2 is used to connect DC power supply one 304
- the number of connected DC power supplies to be tested is 4. In a specific application scenario, the number of connected DC power supplies to be tested is not limited.
- the rectifier and voltage regulator module 301 is connected to the mains to work, converts the mains into direct current and supplies it to DC power supply one 304, DC power supply two 305, DC power supply three 306, and DC power supply four 307 (hereinafter referred to as DC power supply Group 30N), and adjust the input voltage of the DC power supply group 30N to within its specified input voltage range.
- DC power supply Group 30N After the DC power supply group 30N is powered on, the DC power supply group 30N supplies power to the boost module 303.
- the boost module 303 does not work after power-on, and only realizes the current flow function.
- the DC power supply group 30N directly supplies power to the load module 302.
- the power of the DC power supply group 30N is Feed back to the DC power supply group 30N, and control the current to be static aging current or dynamic aging current; when the output voltage of the DC power supply group 30N is lower than the input voltage of the DC power supply group 30N, the boost module 303 will power on the DC power supply group 30N The output voltage is adjusted to slightly higher than the 30N input voltage of the DC power supply group.
- the boost module 303 supplies power to the load module 302. After the load module 302 is powered on, it feeds back the electric energy to the DC power supply group 30N, and controls the current to be static aging current or Dynamic aging current.
- the DC power supply aging test system shown in Figure 4 connects the DC power supply group with multiple DC power supplies in series to the aging test circuit, and the rectifier voltage regulating module is used for Adjust the voltage between the total input positive and the total input negative of the DC power supply group.
- the boost module is used to increase the voltage between the total output positive and the total output negative of the DC power supply group, and is connected to the output positive of the boost module. Connect the load module to the positive pole of the total input of the DC power supply group.
- the output voltage of the DC power supply group is adjusted by the boost module so that the load module can be Full-range high-precision adjustments from no-load to full-load can also achieve load dynamic jump aging, reducing energy loss during self-aging.
- the embodiment of the present application also provides an aging test system for a DC power supply.
- the aging test system for the DC power supply is a further improvement of the aging test system for the DC power supply shown in FIG. 4.
- the improvement lies in that in an implementable manner ,
- the DC power supply group under test also includes N fault freewheeling modules, the input terminal of the nth fault freewheeling module is connected to the output negative pole of the nth DC power supply, and the output terminal of the nth faulty freewheeling module is connected to the nth The positive output of the DC power supply; the nth fault freewheeling module is used to provide continuous current when the nth DC power supply fails.
- the aging test system of the DC power supply may include: a rectifier and voltage regulator module 401, a load module 402, a boost module 403, a DC power supply 404, a DC power supply 405, a DC power supply 406, a DC power supply 407, fault Freewheeling module one 408, faulty freewheeling module two 409, faulty freewheeling module three 410, and faulty freewheeling module four 411.
- the input terminal of the rectifier and voltage regulator module 401 is used to connect to an external power source, and the output anode of the rectifier and voltage regulator module 401 and the output terminal of the load module 402 are both connected to DC power source one 404, DC power source two 405, DC power source three 406, and DC power source.
- the positive input of the 407, the negative output of the rectifier and voltage regulator module 401, and the output negative of the boost module are all connected to the DC power supply one 404, the DC power supply two 405, the DC power supply three 406, the DC power supply four, the input negative pole of the 407, and the DC power supply one
- the positive output of 404 is connected to the positive input of the booster module 403, the negative output of DC power supply one 404 is connected to the positive output of DC power supply two 405, and the output negative pole of DC power supply two 405 is connected to the output positive pole of DC power supply three 406, DC power supply
- the output negative pole of the third 406 is connected to the output positive pole of the DC power supply four 407, the output negative pole of the DC power supply four 407 is connected to the input negative pole of the booster module 403, and the output positive pole of the booster module 403 is connected to the input terminal of the load module 402, the DC power supply
- the positive output and negative output of one 404 are respectively connected to the input and output ends of the fault freewheel
- the output positive pole and output negative pole of DC power supply three 406 are respectively connected to the input terminal and output terminal of fault freewheeling module three 410.
- the output positive pole and output negative pole of DC power supply four 407 are respectively connected to the input terminal and output terminal of fault freewheeling module four 411. end.
- the fault freewheeling module one 408, the fault freewheeling module two 409, the fault freewheeling module three 410, and the fault freewheeling module four 411 are respectively used in the DC power supply one 404, the DC power supply two 405, and the DC power supply 404, respectively.
- the fault freewheeling module 408 can be composed of a high-power diode, wherein the cathode of the diode is used as the input terminal of the fault freewheeling module 408, and the anode of the diode is used as the output terminal of the fault freewheeling module 408.
- the selection of the diode can be determined according to the current of the aging test system.
- the aging test system of the DC power supply shown in Fig. 6 is relative to the aging test system of the DC power supply shown in Fig. 4, a fault freewheeling module is connected in parallel between the output positive and negative poles of each DC power supply to be tested, and multiple DC power supplies are connected in parallel.
- the fault freewheeling module connected in parallel with the DC power supply can carry on freewheeling, ensuring that the boost module can raise multiple DC power supplies in the event of a DC power failure
- the total output voltage improves the reliability of the entire burn-in test system.
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Abstract
一种直流电源的老化测试电路，包括整流调压模块（105）、负载模块（106）、用于连接待测直流电源输入正极的第一端口（101）、用于连接待测直流电源输入负极的第二端口（102）、用于连接待测直流电源输出正极的第三端口（103），以及用于连接待测直流电源输出负极的第四端口（104）；其中，整流调压模块（105）的输入端用于与外部电源连接，整流调压模块（105）的输出正极连接至第一端口（101），整流调压模块（105）的输出负极连接至第二端口（102），第四端口（104）连接至第二端口（102）；以及，负载模块（106）的输出端连接至第一端口（101），负载模块（106）的输入端连接至第三端口（103）。还提供一种直流电源的老化测试系统。
Description
本申请要求在2020年6月24日提交中国专利局、申请号为202010592250.4的中国专利申请的优先权，该申请的全部内容通过引用结合在本申请中。
本申请实施例涉及电源测试技术领域。
直流电源作为电子设备的电力供应装置，在计算机、通信、铁路、航天、家用电器等领域得到了越来越广泛的应用。为提高电源产品的稳定性和可靠性，国内外厂商在直流电源的生产过程中需要对直流电源进行老化测试。
发明内容
本申请实施例的一个方面提供一种直流电源的老化测试电路，包括整流调压模块、负载模块、用于连接待测直流电源输入正极的第一端口、用于连接待测直流电源输入负极的第二端口、用于连接待测直流电源输出正极的第三端口，以及用于连接待测直流电源输出负极的第四端口；其中，整流调压模块的输入端用于与外部电源连接，整流调压模块的输出正极连接至第一端口，整流调压模块的输出负极连接至第二端口，第四端口连接至第二端口；以及，负载模块的输出端连接至第一端口，负载模块的输入端连接至第三端口。
本申请实施例的另一个方面提供一种直流电源的老化测试系统，包括上述的直流电源的老化测试电路，以及待测直流电源模块；其中待测直流电源模块为一个直流电源，直流电源的输入正极连接至第一端口，直流电源的输入负极连接至第二端口，直流电源的输出正极连接至第三端口，以及直流电源的输出负极连接至第四端口。
本申请实施例的再一个方面提供一种直流电源的老化测试系统， 包括上述直流电源的老化测试电路，以及待测直流电源模块；其中，待测直流电源模块包括总输入正极、总输入负极、总输出正极、总输出负极，以及N个直流电源；总输入正极连接至第一端口，且总输入正极与每个直流电源的输入正极连接；总输入负极连接至第二端口，且总输入负极与每个直流电源的输入负极连接；总输出正极连接至第三端口，且总输出正极与第一个直流电源的输出正极连接；总输出负极连接至第四端口；以及，第n个直流电源的输出负极与第n+1个直流电源的输出正极连接，总输出负极与第N个直流电源的输出负极连接，其中，N为大于1的正整数，n为小于N的正整数。
图1是根据相关技术中对直流电源进行自老化的电路图。
图2是本申请实施例提供的直流电源的老化测试电路的电路图。
图3是本申请实施例提供的直流电源的老化测试系统的结构图。
图4是本申请实施例提供的直流电源的老化测试系统的结构图。
图5是本申请实施例提供的直流电源的老化测试系统的升压模块的电路图。
图6是本申请实施例提供的直流电源的老化测试系统的结构图。
为使本申请实施例的目的、技术方案和优点更加清楚，下面将结合附图对本申请的实施例进行详细的阐述。然而，本领域的普通技术人员可以理解，在本申请实施例中，为了使读者更好地理解本申请而提出了许多技术细节。但是，即使没有这些技术细节和基于以下各实施例的种种变化和修改，也可以实现本申请所要求保护的技术方案。以下各个实施例的划分是为了描述方便，不应对本申请的具体实现方式构成任何限定，各个可实施方式在不矛盾的前提下可以相互结合相互引用。
相关技术中，老化测试通常采用能量回馈交流电网的方式进行老化。在该老化方式中，直流电源输出端接能量回馈型负载，将能量 回馈至交流电网，实现了能量的循环利用。但是能量回馈型负载需要实现DC/DC升压、稳压和DC/AC逆变等功能，且存在能量转换的效率低的缺陷。
为了克服能量转换效率低这一缺陷，目前广泛采用自老化的方式进行老化测试。自老化的电路如图1所示，直流电源输出端接能量回馈型负载，将能量回馈至直流电源输入端。相较于能量回馈交流电网的老化方式，自老化的能力转换效率较高。但是，由于自老化时负载的输入电压范围受限，对自老化使用的能量回馈型负载的设计要求高，导致能量回馈型负载的价格昂贵，进而使得自老化的成本高。
本申请实施例提供一种直流电源的老化测试电路，包括整流调压模块、负载模块、用于连接待测直流电源输入正极的第一端口、用于连接待测直流电源输入负极的第二端口、用于连接待测直流电源输出正极的第三端口，以及用于连接待测直流电源输出负极的第四端口。整流调压模块的输入端用于与外部电源连接，整流调压模块的输出正极连接至第一端口，整流调压模块的输出负极连接至第二端口，第四端口连接至第二端口，整流调压模块用于调节第一端口与第二端口之间的电压；负载模块的输出端连接至第一端口，负载模块的输入端连接至第三端口。本申请实施例提供的直流电源的老化测试电路降低了自老化成本。
参考图2，直流电源的老化测试电路可以包括：第一端口101、第二端口102、第三端口103、第四端口104、整流调压模块105以及负载模块106；第一端口101、第二端口102、第三端口103以及第四端口104分别用于连接待测直流电源的输入正极、输入负极、输出正极以及输出负极；整流调压模块105的输入端用于与外部电源连接，整流调压模块105的输出正极连接至第一端口101，整流调压模块的输出负极连接至第二端口102和第四端口104；负载模块106的输入端连接至第三端口103，负载模块106的输出端连接至第一端口101。
在一种可实施方式中，外部电源为市电，整流调压模块105用于将市电转换为直流电，并调节转换后的直流电的电压，还用于控制 整个老化测试电路的上下电。整流调压模块105可以是单相整流器或三相整流器。
在一种可实施方式中，负载模块106具体为电子负载，由于电子负载的体积小，易于维护，进一步降低了自老化的成本。
值得一提的是，在一种可实施方式中，待测直流电源可以是单个直流电源，也可以是多个串联的直流电源。
本申请实施例提供的直流电源的老化测试电路相对于相关技术而言，整流调压模块的输出正极连接至用于连接待测直流电源输入正极的第一端口，整流调压模块的输出负极连接至用于连接待测直流电源输入负极的第二端口和用于连接待测直流电源输出负极的第四端口，整流调压模块用于调节待测直流电源输入正极和输入负极之间的电压，负载模块的输出端连接至第一端口，负载模块的输入端连接至用于连接待测直流电源输出正极的第三端口。由于负载模块的输入端只与直流电源的输出正极相连，负载模块的输入电压的大小要求降低，对负载模块的设计要求也降低，负载模块可以使用能量回馈式负载，也可以使用电子负载等价格成本较低的其他类型的负载，降低了自老化成本，并且在自老化的过程中可以实现负载动态跳变老化，进一步提升了自老化的能量转换效率。
本申请实施例还提供一种直流电源的老化测试系统，包括上述的直流电源的老化测试电路，还包括待测直流电源模块，待测直流电源模块为一个直流电源，直流电源的输入正极连接至第一端口，直流电源的输入负极连接至第二端口，直流电源的输出正极连接至第三端口，直流电源的输出负极连接至第四端口。
参考图3，本申请实施例提供的直流电源的老化测试系统可以包括：整流调压模块201、负载模块202和直流电源203。其中，整流调压模块201的输入端用于与外部电源连接，整流调压模块201的输出正极连接至直流电源203的输入正极，整流调压模块201的输出负极连接至直流电源203的输入负极，直流电源203的输出正极连接至负载模块202的输入端，直流电源203的输出负极连接至直流电源203的输入负极，负载模块202的输出端连接至直流电源203的输入 正极。
在一种可实施方式中，外部电源为市电，整流调压模块201用于将市电转换为直流电，并调节转换后的直流电的电压，还用于控制整个老化测试电路的上下电。整流调压模块201可以是单相整流器或三相整流器。
在实际应用场景中，整流调压模块201接入市电工作，将市电转换为直流电并供电给直流电源203，此时整流调压模块201将直流电源203的输入电压调节至其规定输入电压范围内，直流电源203上电，并经由负载模块202将电能回馈至直流电源203自身。在此过程中，可以通过控制负载模块202的电流调整系统进行自老化的能量转换效率。
本申请实施例提供的直流电源的老化测试系统相对于相关技术而言，由于负载模块的输入端只与直流电源的输出正极相连，负载模块的输入电压的大小要求降低，对负载模块的设计要求也降低，负载模块可以使用能量回馈式负载，也可以使用电子负载等价格成本较低的其他类型的负载，降低了自老化成本，并且在自老化的过程中可以实现负载动态跳变老化，进一步提升了自老化的能量转换效率。
本申请实施例还提供一种直流电源的老化测试系统，包括上述直流电源的老化测试电路，还包括待测直流电源模块，待测直流电源模块包括总输入正极、总输入负极、总输出正极、总输出负极以及N个直流电源，总输入正极连接至第一端口；总输入负极连接至第二端口；总输出正极连接至第三端口；总输出负极连接至第四端口；总输入正极与每个直流电源的输入正极连接，总输入负极与每个直流电源的输出负极连接，总输出正极与第一个直流电源的输出正极连接，第n个直流电源的输出负极与第n+1个直流电源的输出正极连接，总输出负极与第N个直流电源的输出负极连接，其中，N为大于1的正整数，n为小于N的正整数。
参考图4，本申请实施例提供的直流电源的老化测试系统可以包括：整流调压模块301、负载模块302、升压摸块303、直流电源一304、直流电源二305、直流电源三306以及直流电源四307。整流调 压模块301的输入端用于与外部电源连接，整流调压模块301的输出正极和负载模块302的输出端均连接至直流电源一304、直流电源二305、直流电源三306、直流电源四307的输入正极，整流调压模块301的输出负极和升压模块303的输出负极均连接至直流电源一304、直流电源二305、直流电源三306、直流电源四307的输入负极，直流电源一304的输出正极连接至升压模块303的输入正极，直流电源一304的输出负极连接至直流电源二305的输出正极，直流电源二305的输出负极连接至直流电源三306的输出正极，直流电源三306的输出负极连接至直流电源四307的输出正极，直流电源四307的输出负极连接至升压模块303的输入负极，升压模块303的输出正极连接至负载模块302的输入端。
在一种可实施方式中，外部电源为市电，整流调压模块301用于将市电转换为直流电，并调节转换后的直流电的电压，还用于控制整个老化测试电路的上下电。整流调压模块301可以是单相整流器或三相整流器。
在一种可实施方式中，升压模块303为boost电路，由电感L、开关Q(具体可以是三极管或场效应管等开关管)、二极管VD和电容C构成，其电路如图5所示。其中，端口L1用于连接直流电源一304的输出正极，端口N1用于连接直流电源四307的输出负极，端口L2用于连接负载模块302的输入端，端口N2用于连接直流电源一304、直流电源二305、直流电源三306、直流电源四307的输入负极。
需要说明的是，图4所示的直流电源的老化测试系统中，接入的待测的直流电源数量为4，在具体的应用场景中，接入的待测直流电源的数量不受限制。
在实际应用场景中，整流调压模块301接入市电工作，将市电转换为直流电并供电给直流电源一304、直流电源二305、直流电源三306以及直流电源四307(下称直流电源组30N)，并将直流电源组30N的输入电压调节至其规定输入电压范围内，直流电源组30N上电后，直流电源组30N供电给升压模块303，当直流电源组30N的输出电压高于直流电源组30N的输入电压时，升压模块303上电后不 工作，仅实现通流功能，直流电源组30N直接供电给负载模块302，负载模块302上电后将直流电源组30N的电能回馈至直流电源组30N，并控制电流为静态老化电流或动态老化电流；当直流电源组30N的输出电压低于直流电源组30N的输入电压时，升压模块303上电后将直流电源组30N的输出电压调高至略高于直流电源组30N的输入电压，升压模块303供电给负载模块302，负载模块302上电后将电能回馈至直流电源组30N，并控制电流为静态老化电流或动态老化电流。
图4所示的直流电源的老化测试系统相对于图3所示的直流电源的老化测试系统而言，将多个直流电源串联后的直流电源组接入老化测试电路，整流调压模块用于调节直流电源组的总输入正极和总输入负极之间的电压大小，升压模块用于升高直流电源组的总输出正极和总输出负极之间的电压大小，并在升压模块的输出正极与直流电源组的总输入正极之间接入负载模块。如此设置，一方面，在使用一个负载的情况下同时对多个直流电源进行自老化，降低了负载的成本；另一方面，通过升压模块调节直流电源组的输出电压，使得负载模块可以在空载到满载进行全范围高精度调节，也能够实现负载动态跳变老化，降低了自老化过程中的能量损耗。
本申请实施例还提供一种直流电源的老化测试系统，该直流电源的老化测试系统是图4所示的直流电源的老化测试系统的进一步改进，改进之处在于，在一种可实施方式中，待测直流电源组还包括N个故障续流模块，第n个故障续流模块的输入端连接至第n个直流电源的输出负极，第n个故障续流模块的输出端连接至第n个直流电源的输出正极；第n个故障续流模块用于在第n个直流电源故障时提供持续电流。
参考图6，直流电源的老化测试系统可以包括：整流调压模块401、负载模块402、升压摸块403、直流电源一404、直流电源二405、直流电源三406、直流电源四407、故障续流模块一408、故障续流模块二409、故障续流模块三410以及故障续流模块四411。整流调压模块401的输入端用于与外部电源连接，整流调压模块401的输出正极和负载模块402的输出端均连接至直流电源一404、直流电源二 405、直流电源三406、直流电源四407的输入正极，整流调压模块401的输出负极和升压模块的输出负极均连接至直流电源一404、直流电源二405、直流电源三406、直流电源四407的输入负极，直流电源一404的输出正极连接至升压模块403的输入正极，直流电源一404的输出负极连接至直流电源二405的输出正极，直流电源二405的输出负极连接至直流电源三406的输出正极，直流电源三406的输出负极连接至直流电源四407的输出正极，直流电源四407的输出负极连接至升压模块403的输入负极，升压模块403的输出正极连接至负载模块402的输入端，直流电源一404的输出正极、输出负极分别连接至故障续流模块一408的输入端、输出端，直流电源二405的输出正极、输出负极分别连接至故障续流模块二409的输入端、输出端，直流电源三406的输出正极、输出负极分别连接至故障续流模块三410的输入端、输出端，直流电源四407的输出正极、输出负极分别连接至故障续流模块四411的输入端、输出端。
在一种可实施方式中，故障续流模块一408、故障续流模块二409、故障续流模块三410和故障续流模块四411分别用于在直流电源一404、直流电源二405、直流电源三406以及直流电源四407发生故障时进行续流。在实际应用场景中，如故障续流模块一408可以由一个大功率二极管构成，其中，二极管的阴极作为故障续流模块一408的输入端，二极管的阳极作为故障续流模块一408的输出端。并且，二极管的选型可以根据老化测试系统的电流大小确定。
图6所示的直流电源的老化测试系统相对于图4所示的直流电源的老化测试系统，每个待测试的直流电源的输出正负极之间并联一个故障续流模块，在多个直流电源进行自老化的过程中，任意一个直流电源发生故障时，与该直流电源并联的故障续流模块能够进行续流，保证升压模块在直流电源发生故障的情况下能够升高多个直流电源的总输出电压，提升了整个老化测试系统的可靠性。
本领域的普通技术人员可以理解，上述实施例是实现本申请的具体实施例，而在实际应用中，可以在形式上和细节上对其作各种改变，而不偏离本申请的精神和范围。
Claims (10)
- 一种直流电源的老化测试电路，包括整流调压模块、负载模块、用于连接待测直流电源输入正极的第一端口、用于连接待测直流电源输入负极的第二端口、用于连接待测直流电源输出正极的第三端口，以及用于连接待测直流电源输出负极的第四端口；其中所述整流调压模块的输入端用于与外部电源连接，所述整流调压模块的输出正极连接至所述第一端口，所述整流调压模块的输出负极连接至所述第二端口，所述第四端口连接至所述第二端口；以及所述负载模块的输出端连接至所述第一端口，所述负载模块的输入端连接至所述第三端口。
- 根据权利要求1所述的直流电源的老化测试电路，其中，所述负载模块为电子负载。
- 根据权利要求1所述的直流电源的老化测试电路，其中，所述整流调压模块为单相整流器或三相整流器。
- 一种直流电源的老化测试系统，包括根据权利要求1至3任一项所述的直流电源的老化测试电路，以及待测直流电源模块；其中所述待测直流电源模块为一个直流电源，所述直流电源的输入正极连接至所述第一端口，所述直流电源的输入负极连接至所述第二端口，所述直流电源的输出正极连接至所述第三端口，以及所述直流电源的输出负极连接至所述第四端口。
- 一种直流电源的老化测试系统，包括根据权利要求1至3任一项所述的直流电源的老化测试电路，以及待测直流电源模块；其中所述待测直流电源模块包括总输入正极、总输入负极、总输出正极、总输出负极，以及N个直流电源；所述总输入正极连接至所述第一端口，且所述总输入正极与每个所述直流电源的输入正极连接；所述总输入负极连接至所述第二端口，且所述总输入负极与每个所述直流电源的输入负极连接；所述总输出正极连接至所述第三端口，且所述总输出正极与第一个直流电源的输出正极连接；所述总输出负极连接至所述第四端口；以及第n个直流电源的输出负极与第n+1个直流电源的输出正极连接，所述总输出负极与第N个所述直流电源的输出负极连接，其中，所述N为大于1的正整数，所述n为小于N的正整数。
- 根据权利要求5所述的直流电源的老化测试系统，其中，所述直流电源的老化测试电路还包括升压模块；所述第三端口经由所述升压模块连接至所述负载模块的输入端；其中，所述升压模块的输入正极连接至所述第三端口，且所述升压模块的输出正极连接至所述负载模块的输入端；以及所述第四端口经由所述升压模块连接至所述第二端口；其中，所述升压模块的输入负极连接至所述第四端口，且所述升压模块的输出负极连接至所述第二端口。
- 根据权利要求6所述的直流电源的老化测试系统，其中，所述升压模块为boost电路。
- 根据权利要求7所述的直流电源的老化测试系统，其中，所述boost电路包括一个电感、一个开关、一个二极管和一个电容；所述电感的第一端与所述第三端口相连，所述电感的第二端经由所述二极管连接至所述负载模块的输入端，且所述电感的第二端还经由所述开关连接至所述第四端口；所述二极管的阳极与所述电感的第二端相连，且所述二极管的阴极与所述负载模块的输入端的输入端；以及所述电容串联在所述负载模块的输入端与所述第二端口之间。
- 根据权利要求6所述的直流电源的老化测试系统，其中，所述待测直流电源组还包括N个故障续流模块；以及第n个故障续流模块的输入端连接至第n个直流电源的输出正极，第n个故障续流模块的输出端连接至第n个直流电源的输出负极。
- 根据权利要求9所述的直流电源的老化测试系统，其中，每个所述故障续流模块为一个二极管，每个所述故障续流模块的输入端为所述二极管的阳极，且每个所述故障续流模块的输出端为所述二极管的阴极。
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10020137A1 (de) * | 2000-04-14 | 2001-10-25 | Daimler Chrysler Ag | Verfahren und Schaltung zur Rückspeisung der in einer Stromrichterbeschaltung anfallenden elektrischen Energie |
| WO2011150733A1 (zh) * | 2010-06-04 | 2011-12-08 | Wong Hon Ki | 电源老化系统及负载平衡控制方法 |
| CN202794482U (zh) * | 2012-08-27 | 2013-03-13 | 深圳市鼎泰佳创科技有限公司 | 节能式单通道输出小功率电源老化装置 |
| CN203101606U (zh) * | 2013-03-06 | 2013-07-31 | 马戎 | 一种电源及电子产品老化装置 |
| CN205027886U (zh) * | 2015-10-10 | 2016-02-10 | 江苏兆能电子有限公司 | 一种通用直流－直流电源节能老化系统 |
| CN107797078A (zh) * | 2016-08-30 | 2018-03-13 | 中兴通讯股份有限公司 | 一种能量回馈式电源老化方法及其装置 |
| CN109946626A (zh) * | 2017-12-20 | 2019-06-28 | 天津乐津静科技有限公司 | 一种稳压电源测试的负载电路 |
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Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10020137A1 (de) * | 2000-04-14 | 2001-10-25 | Daimler Chrysler Ag | Verfahren und Schaltung zur Rückspeisung der in einer Stromrichterbeschaltung anfallenden elektrischen Energie |
| WO2011150733A1 (zh) * | 2010-06-04 | 2011-12-08 | Wong Hon Ki | 电源老化系统及负载平衡控制方法 |
| CN202794482U (zh) * | 2012-08-27 | 2013-03-13 | 深圳市鼎泰佳创科技有限公司 | 节能式单通道输出小功率电源老化装置 |
| CN203101606U (zh) * | 2013-03-06 | 2013-07-31 | 马戎 | 一种电源及电子产品老化装置 |
| CN205027886U (zh) * | 2015-10-10 | 2016-02-10 | 江苏兆能电子有限公司 | 一种通用直流－直流电源节能老化系统 |
| CN107797078A (zh) * | 2016-08-30 | 2018-03-13 | 中兴通讯股份有限公司 | 一种能量回馈式电源老化方法及其装置 |
| CN109946626A (zh) * | 2017-12-20 | 2019-06-28 | 天津乐津静科技有限公司 | 一种稳压电源测试的负载电路 |
Cited By (1)
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|---|---|---|---|---|
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