WO2021218200A1 - Conical optical fiber and nanowire combined plasmon probe and working method thereof - Google Patents
Conical optical fiber and nanowire combined plasmon probe and working method thereof Download PDFInfo
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- WO2021218200A1 WO2021218200A1 PCT/CN2020/138715 CN2020138715W WO2021218200A1 WO 2021218200 A1 WO2021218200 A1 WO 2021218200A1 CN 2020138715 W CN2020138715 W CN 2020138715W WO 2021218200 A1 WO2021218200 A1 WO 2021218200A1
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- nanowire
- plasmon
- tapered
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- metal film
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- 239000000523 sample Substances 0.000 title claims abstract description 74
- 239000002070 nanowire Substances 0.000 title claims abstract description 59
- 239000013307 optical fiber Substances 0.000 title claims abstract description 14
- 238000000034 method Methods 0.000 title claims abstract description 11
- 229910052751 metal Inorganic materials 0.000 claims abstract description 34
- 239000002184 metal Substances 0.000 claims abstract description 34
- 239000000835 fiber Substances 0.000 claims abstract description 18
- 239000010931 gold Substances 0.000 claims description 8
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 7
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 6
- 229910052709 silver Inorganic materials 0.000 claims description 6
- 239000004332 silver Substances 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- 239000002041 carbon nanotube Substances 0.000 claims description 4
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 4
- 238000010168 coupling process Methods 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 abstract description 13
- 238000005259 measurement Methods 0.000 abstract description 12
- 238000012545 processing Methods 0.000 abstract description 8
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000003384 imaging method Methods 0.000 abstract description 5
- 238000010183 spectrum analysis Methods 0.000 abstract description 4
- 230000035945 sensitivity Effects 0.000 abstract description 2
- 239000010408 film Substances 0.000 description 19
- 238000005530 etching Methods 0.000 description 7
- 238000012876 topography Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000002086 nanomaterial Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 238000001069 Raman spectroscopy Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000007888 film coating Substances 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
Definitions
- the invention belongs to the fields of nano extreme processing, spectral analysis, super-resolution imaging and the like, and particularly relates to a plasmon probe combining a tapered optical fiber with a nanowire and a working method thereof.
- Scanning near-field optical microscope can realize optical imaging and chemical composition verification, and can break through the optical diffraction limit, realize nanometer resolution processing and measurement, and is widely used in near-field Raman detection, near-field super-resolution imaging and near-field optical processing And other fields.
- the resolution of the scanning near-field optical microscope depends on the near-field probe technology, the most commonly used are aperture probes and non-porous probes.
- the smaller cone angle and aperture size of the aperture probe results in a smaller light transmission rate, weak detection signal, and limited resolution capability, generally 50 nm-100 nm.
- the resolving power of the non-porous probe is determined by its tip diameter, which can reach 10 nm.
- non-porous near-field probes are generally externally directly illuminated, which will introduce a large background signal and require the use of complex interference and phase-locking techniques.
- plasmon probes have been developed in recent years, which stimulate the propagation of surface plasmons by etching a specific structure on the traditional probe to achieve nano-focusing at the tip of the probe.
- the weak local light field of the existing plasmon probe tip makes it limited in super-resolution measurement and super-diffraction processing; and it can only measure the optical and topographic information of the sample surface. The measurement of complex three-dimensional nanostructures with high aspect ratio is limited.
- the present invention proposes a tapered fiber combined nanowire plasmon probe and its working method.
- the present invention can achieve greater local field enhancement at the tip of the needle and has higher resolution. Rate and signal detection sensitivity, at the same time, it can realize surface and high aspect ratio complex three-dimensional structure topography and optical information measurement.
- a plasmon probe with a tapered optical fiber combined with a nanowire comprising a tapered probe core, a metal film covering layer and a nanowire.
- the metal film covering layer is evenly distributed on the outer surface of the tapered probe core.
- the wire is arranged at the needle tip position of the metal film covering layer; the surface of the metal film covering layer is provided with a plurality of annular slit plasmon enhancement structures, and the plurality of annular slit plasmon enhancement structures can form resonance interference enhancement.
- the shape of the tapered probe core is a cone, the cone angle is 20°-40°, and the diameter of the cone tip is 25 nm-100 nm.
- the material of the metal thin film covering layer is gold, silver or aluminum, and the thickness is 40nm-100nm.
- the ring-shaped slit plasmon enhancement structure is a groove structure, the groove structure extends from the surface of the metal film covering layer to the surface of the tapered probe core, and the groove structure runs along the tapered probe core. ⁇ axial direction extension.
- the width of the ring-shaped slit plasmon enhancement structure is 50 nm to 150 nm.
- the nanowire material is gold or silver or carbon nanotubes.
- the diameter of the nanowire is 2 nm to 50 nm, and the length is 20 nm to 500 nm.
- the nanowires are grown or assembled at the tip of the metal film covering layer.
- the working method of the tapered optical fiber combined with the nanowire plasmon probe of the present invention includes the following processes:
- the fiber radial waveguide mode propagates in the core of the tapered probe, and the wave vector matches to excite the surface plasmon to propagate on the outer surface of the metal film coating.
- the ring-shaped slit plasmon enhancement structure forms resonant interference to enhance the local light field of the surface plasmon, and then the nanowire surface plasmon propagation is excited by the butt coupling method to form a locally enhanced surface at the lower end of the nanowire Nano-scale light field.
- the present invention has the following beneficial effects:
- the tapered fiber combined with nanowire plasmon probe of the present invention has: (1) The tip local field optical field strength: the radial waveguide mode excites the surface plasmon through the wave vector matching condition, and at the same time, it is formed by the annular slit, etc. The excimer-enhancing structure forms resonance interference, which can increase the electromagnetic field density and generate a large local optical field at the tip of the needle. (2) High resolution: The topography and optical information measurement are carried out by nanowires with extremely small diameters. The resolution of the optical field and topography depends on the diameter of the nanowires, and a resolution of 10 nm can be achieved.
- FIG. 1 is a schematic diagram of the XZ plane of the plasmon probe with tapered optical fiber combined with nanowire according to the present invention
- FIG. 2 is a schematic diagram of the XY plane of the plasmon probe with tapered fiber combined with nanowire according to the present invention
- 1 is the tapered probe core
- 2 is the metal film covering layer
- 3 is the ring-shaped slit plasmon enhancement structure
- 4 is the nanowire
- 5 is the fiber radial waveguide mode.
- the tapered optical fiber combined with nanowire plasmon probe of the present invention includes a tapered probe core 1, a metal thin film cover layer 2, a ring-shaped slit plasmon enhancement structure 3, and a nanowire Line 4.
- the metal film covering layer 2 is evenly distributed on the outer surface of the tapered probe core 1, and a number of annular slit plasmon enhancement structures 3 are opened (which can be opened by etching) on the metal film covering layer 2.
- the nanowire 4 is grown or assembled at the needle tip position of the metal film covering layer 2, and several annular slit plasmon enhancement structures 3 can form a resonance interference enhancement effect.
- the annular slit plasmon enhancement structure 3 is a groove structure, and the groove structure extends from the surface of the metal film covering layer 2 to the surface of the tapered probe core 1.
- the groove structure extends along the axial direction of the tapered probe core 1. For example, taking the orientation shown in FIG. 1 as an example, the annular slit plasmon enhancement structure 3 is arranged in the up and down direction.
- the fiber radial waveguide mode 5 is coupled to the tapered probe core 1 and propagates in it, and the surface plasmon is excited by the wave vector matching condition.
- the excimer propagates on the outer surface of the metal film covering layer 2, and at the same time, the specially designed annular slit plasmon enhancement structure 3 forms resonance interference to further enhance the surface plasmon local light field.
- the surface plasmons of the nanowire 4 are excited to propagate through the butt coupling method, which can form a localization at the lower end of the nanowire 4 Field-enhanced nano-scale light field.
- the nano-locally enhanced light field can be used for super-resolution imaging, spectral analysis and super-diffraction processing, and the nanowires with high aspect ratio can be applied to the measurement of complex three-dimensional nanostructures with small disturbance and high aspect ratio.
- the tapered probe core 1 is etched and processed by bare optical fiber, the shape is a cone, the cone angle is 20° ⁇ 40°, and the cone tip diameter is 25 nm ⁇ 100 nm. .
- the metal film covering layer 2 is made of gold, silver or aluminum, uniformly covering the outer surface of the tapered probe core to form a non-porous probe.
- the thickness of the covering layer is 40 nm ⁇ 100 nm.
- the ring-shaped slit plasmon-enhancing structure 3 is etched on the metal film cover layer 2, and the etching direction is parallel to the axis direction of the tapered probe core 1, and
- the etching depth is 20 nm ⁇ 100 nm
- the etching width is 50 nm ⁇ 150 nm
- the ring-shaped slit plasmon enhanced structure 3 is coaxial with the tapered probe core 1.
- the nanowire 4 is made of gold, silver or carbon nanotubes, which are grown or assembled on the needle tip of the metal film covering layer 2.
- the nanowire 4 has a diameter of 2 nm to 50 nm and a length of 20 nm to 500 nm.
- the structure of the novel plasmon probe of the tapered fiber combined with the nanowire in this embodiment is shown in Figure 1 and Figure 2.
- the core of the tapered probe is formed by chemical wet etching, and the cone angle is 32° ,
- the cone tip diameter is 30 nm
- the metal film covering layer 2 is made of gold (Au) and the thickness is 80 nm
- the annular slit plasmon enhanced structure 3 is completely etched, the etching depth is 80 nm, and the etching width is 100 nm
- the nanowire 4 is made of carbon nanotubes with a diameter of 10 nm and a length of 100 nm, assembled at the tip of the metal film covering layer 2.
- Radial light with a wavelength of 632.8 nm is coupled to the tapered probe core 1 and propagates in its intrinsic radial waveguide mode 5.
- the surface plasmon is excited by the wave vector matching condition to propagate on the outer surface of the metal film covering layer 2.
- the specially designed annular slit plasmon enhancement structure 3 forms a resonance interference enhancement effect, which further enhances the local optical field of the surface plasmon.
- the surface plasmon increases The position of the tip of the tapered probe gathers and generates a great electric field density, and then the surface plasmon propagation of the nanowire 4 is excited by the butt coupling method, and a locally enhanced nano-scale light field can be formed at the lower end of the nanowire 4.
- the nanowire 4 When performing super-resolution imaging and spectral analysis, the nanowire 4 is penetrated into a small disturbance measurement environment or a complex three-dimensional structure with high aspect ratio.
- the local enhanced light field of the nanowire 4 needle tip is coupled with the sample , And then the signal with the near-field optical or composition information of the sample can be collected by the external lens to the photodetector; the signal can also be reverse-coupled into the optical fiber by the nanowire 4, the metal film cover layer 2 and the tapered probe core 1 collect.
- the morphology information of the sample can be restored by extracting the mechanical signal of the detection nanowire 4.
- the nanowire 4 needle tip local enhanced light field can enhance the interaction between the sample and the needle tip light field.
- the material can be processed by the needle tip local light field while monitoring the probe Z Orientation position and scanning operation of the probe can realize nano-scale processing of complex patterns of the sample.
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (9)
- 一种锥形光纤结合纳米线的等离激元探针,其特征在于,包括锥形探针纤芯(1)、金属薄膜覆盖层(2)和纳米线(4),金属薄膜覆盖层(2)均匀分布在锥形探针纤芯(1)的外表面,纳米线(4)设置在金属薄膜覆盖层(2)针尖位置;金属薄膜覆盖层(2)表面开设有若干环形狭缝等离激元增强结构(3),若干环形狭缝等离激元增强结构(3)能够形成共振干涉增强。A plasmon probe with a tapered optical fiber combined with a nanowire, which is characterized in that it comprises a tapered probe core (1), a metal film covering layer (2) and a nanowire (4), and a metal film covering layer ( 2) Evenly distributed on the outer surface of the tapered probe core (1), the nanowires (4) are arranged at the needle tip position of the metal film covering layer (2); the surface of the metal film covering layer (2) is provided with a number of annular slits, etc. The ion-enhanced structure (3) and several ring-shaped slit plasmon-enhanced structures (3) can form resonance interference enhancement.
- 根据权利要求1所述的一种锥形光纤结合纳米线的等离激元探针,其特征在于,所述的锥形探针纤芯(1)形状为锥体,锥体角为20°~40°,锥体针尖直径为25 nm~100nm。The tapered optical fiber combined with nanowire plasmon probe according to claim 1, wherein the shape of the tapered probe core (1) is a cone with a cone angle of 20° ~40°, the diameter of the cone tip is 25 nm to 100 nm.
- 根据权利要求1所述的一种锥形光纤结合纳米线的等离激元探针,其特征在于,所述的金属薄膜覆盖层(2)材料为金或银或铝,厚度为40nm~100nm。The tapered optical fiber combined with nanowire plasmon probe according to claim 1, characterized in that the material of the metal film covering layer (2) is gold, silver or aluminum, and the thickness is 40nm-100nm .
- 根据权利要求1所述的一种锥形光纤结合纳米线的等离激元探针,其特征在于,环形狭缝等离激元增强结构(3)为凹槽结构,凹槽结构由金属薄膜覆盖层(2)的表面延伸至锥形探针纤芯(1)的表面,所述凹槽结构沿锥形探针纤芯(1)的轴线方向延伸。The tapered optical fiber combined with nanowire plasmon probe according to claim 1, wherein the ring-shaped slit plasmon enhancement structure (3) is a groove structure, and the groove structure is made of a metal film The surface of the covering layer (2) extends to the surface of the tapered probe core (1), and the groove structure extends along the axial direction of the tapered probe core (1).
- 根据权利要求1或4所述的一种锥形光纤结合纳米线的等离激元探针,其特征在于,环形狭缝等离激元增强结构(3)的宽度为50nm~150nm。The tapered fiber combined nanowire plasmon probe according to claim 1 or 4, wherein the width of the ring-shaped slit plasmon enhancement structure (3) is 50 nm to 150 nm.
- 根据权利要求1所述的一种锥形光纤结合纳米线的等离激元探针,其特征在于,所述的纳米线(4)材料为金或银或碳纳米管。The tapered fiber combined nanowire plasmon probe according to claim 1, wherein the material of the nanowire (4) is gold, silver or carbon nanotubes.
- 根据权利要求1或6所述的一种锥形光纤结合纳米线的等离激元探针,其特征在于,所述的纳米线(4)直径为2nm~50nm,长度为20nm~500nm。The tapered fiber combined nanowire plasmon probe according to claim 1 or 6, wherein the nanowire (4) has a diameter of 2nm-50nm and a length of 20nm-500nm.
- 根据权利要求1所述的一种锥形光纤结合纳米线的等离激元探针,其特征在于,所述的纳米线(4)生长或组装在金属薄膜覆盖层(2)针尖位置。The tapered optical fiber combined with nanowire plasmon probe according to claim 1, wherein the nanowire (4) is grown or assembled at the tip of the metal film covering layer (2).
- 权利要求1-8任意一项所述的锥形光纤结合纳米线的等离激元探针的工作方法,其特征在于,包括如下过程:The working method of the tapered fiber combined nanowire plasmon probe according to any one of claims 1-8, characterized in that it comprises the following process:锥形光纤结合纳米线的等离激元探针处于工作状态时,光纤径向波导模式(5)在锥形探针纤芯(1)内传播,波矢匹配激发表面等离激元在金属薄膜覆盖层(2)外表面传播,同时环形狭缝等离激元增强结构(3)形成共振干涉,增强表面等离激元局域光场,然后由对接耦合方式激发纳米线(4)表面等离激元传播,在纳米线(4)下端形成局域增强的纳米尺度光场。When the tapered fiber combined with the nanowire plasmon probe is in the working state, the fiber radial waveguide mode (5) propagates in the tapered probe core (1), and the wave vector matches to excite the surface plasmon in the metal The film cover layer (2) spreads on the outer surface, and the ring-shaped slit plasmon enhancement structure (3) forms resonance interference to enhance the surface plasmon local light field, and then the surface of the nanowire (4) is excited by the butt coupling method The plasmon propagates and forms a locally enhanced nano-scale light field at the lower end of the nanowire (4).
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CN112964908B (en) * | 2021-02-04 | 2022-05-20 | 西安交通大学 | Scattering type tapered tip optical fiber probe for exciting and collecting near-field optical signals and working method thereof |
CN112858729A (en) * | 2021-02-04 | 2021-05-28 | 西安交通大学 | Plasmon probe with conical optical fiber combined with semi-ring asymmetric nano slit and working method thereof |
CN113390790A (en) * | 2021-05-24 | 2021-09-14 | 西安交通大学 | Optical fiber nano probe with large length-diameter ratio and preparation method and application thereof |
CN113376405A (en) * | 2021-06-04 | 2021-09-10 | 西安交通大学 | Optical fiber probe and assembling method thereof |
CN114624483B (en) * | 2022-05-13 | 2022-08-02 | 苏州联讯仪器有限公司 | Telescopic chip probe and chip test system |
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