WO2021164281A1 - Sondes à rayons x à double résolution à spectre d'énergie double, système de sonde et procédé d'imagerie - Google Patents

Sondes à rayons x à double résolution à spectre d'énergie double, système de sonde et procédé d'imagerie Download PDF

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Publication number
WO2021164281A1
WO2021164281A1 PCT/CN2020/121196 CN2020121196W WO2021164281A1 WO 2021164281 A1 WO2021164281 A1 WO 2021164281A1 CN 2020121196 W CN2020121196 W CN 2020121196W WO 2021164281 A1 WO2021164281 A1 WO 2021164281A1
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visible light
light sensor
dual
image
fluorescent material
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PCT/CN2020/121196
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English (en)
Chinese (zh)
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徐永
程佳
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江苏康众数字医疗科技股份有限公司
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Publication of WO2021164281A1 publication Critical patent/WO2021164281A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/362—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with scintillation detectors
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis

Definitions

  • the invention relates to the imaging field of X-ray detectors, in particular to an X-ray detector with dual energy spectrum and dual resolution, a detection system and an imaging method.
  • the detector in the X-ray imaging system plays a decisive role in the imaging of the system.
  • the need for dual-energy and dual-resolution angiography with DSA function in the large C system is becoming more and more clear.
  • the principle of dual-energy imaging in CT systems is to use different energy sources to achieve dual-energy imaging, but it takes a certain amount of time to switch between energy sources during the switching process, which affects the efficiency of the system, and there is a movement of the measured object Possibly, movement artifacts are formed.
  • the present invention provides a dual-energy spectrum dual-resolution X-ray detector, detection system and imaging method.
  • the upper and lower detectors can respectively output high-resolution images and high-energy absorption images. .
  • You can also get the image of interest through image algorithm.
  • the technical solution is as follows:
  • the present invention provides an X-ray detector with dual energy spectrum and dual resolution, including a first visible light sensor, a first fluorescent material layer, a packaging material spacer, a second fluorescent material layer, and a first visible light sensor, a first fluorescent material layer, a second fluorescent material layer, and a 2.
  • a visible light sensor the first visible light sensor is closer to the X-ray source than the second visible light sensor, and the resolution of the first visible light sensor is greater than that of the second visible light sensor;
  • the first visible light sensor is used to absorb visible photons generated by the first fluorescent material layer being excited by X-rays; the second visible light sensor is used to absorb visible photons generated by the second fluorescent material layer being excited by X-rays The visible photons; the encapsulation material spacer is used to isolate the visible photons generated by the X-ray excitation of the first fluorescent material layer and the visible photons generated by the X-ray excitation of the second fluorescent material layer.
  • the thickness of the second fluorescent material layer is greater than the thickness of the first fluorescent material layer.
  • the dual-energy spectrum dual-resolution X-ray detector further includes a packaging material wall layer provided along the sides of the first fluorescent material layer and the second fluorescent material layer, and the packaging material wall layer One edge of the encapsulation material abuts the first visible light sensor, the other edge abuts the second visible light sensor, and the edge of the encapsulation material barrier layer abuts the inner surface of the encapsulation material wall layer.
  • first visible light sensor and the second visible light sensor have the same shape and size
  • first fluorescent material layer and the second fluorescent material layer have the same shape and size
  • the area of the first visible light sensor is larger than that of the first visible light sensor.
  • the fluorescent material layer and the packaging material wall layer have a recessed structure relative to the first visible light sensor and the second visible light sensor.
  • the encapsulation material barrier layer and the encapsulation material wall layer are both made of X fluorescent encapsulation material, and the encapsulation material is aluminum film and hot melt adhesive.
  • the X-ray conversion material contained in the first fluorescent material layer and the second fluorescent material layer is cesium iodide, PbF 2 crystal, NaBi(WO 4 ) 2 crystal, NaI:Tl crystal or CsI:Tl crystal.
  • the present invention provides a dual-energy spectrum dual-resolution X-ray detection system, including an X-ray source, a first image acquisition device, a second image acquisition device, and the aforementioned dual-energy spectrum dual-resolution X-ray detection system.
  • a high-speed X-ray detector the first image acquisition device is electrically connected with a first visible light sensor to acquire a first image
  • the second image acquisition device is electrically connected with a second visible light sensor to acquire a second image.
  • the dual-energy spectrum dual-resolution X-ray detection system further includes a processor that is electrically connected to the first image acquisition device and the second image acquisition device, and the processor is capable of The first image collected by the first image collecting device and the second image collected by the second image collecting device are processed for image operation.
  • the present invention provides an imaging method based on the above-mentioned dual-energy spectrum dual-resolution X-ray detection system, which includes the following steps:
  • the second image collected by the second image collecting device is output.
  • the imaging method further includes:
  • a processor is used to perform image arithmetic processing on the first image and the second image to obtain a synthesized combined image.
  • the two fluorescent material layers are separated by encapsulation materials, and the X-rays passing through one fluorescent material layer and the two fluorescent material layers form two different energy spectra, in which the X of the second fluorescent material layer penetrates -The ray is in the high-energy spectrum, and the high-energy absorption image is obtained accordingly;
  • FIG. 1 is a schematic structural diagram of an X-ray detector with dual energy spectrum and dual resolution provided by an embodiment of the present invention
  • Fig. 2 is a schematic structural diagram of a dual-energy spectrum dual-resolution X-ray detection system provided by an embodiment of the present invention.
  • the reference signs include: 1-first visible light sensor, 2-second visible light sensor, 3-first fluorescent material layer, 4-second fluorescent material layer, 5-packaging material barrier layer, 6-packaging material wall layer .
  • the present invention provides a dual-energy spectrum dual-resolution X-ray detector. See Figure 1, which includes a first visible light sensor 1, a first fluorescent material layer 3, a packaging material spacer 5, and a second The fluorescent material layer 4 and the second visible light sensor 2, wherein the first visible light sensor 1 and the second visible light sensor 2 are two TFT plates with different resolutions. Specifically, as shown in FIG. 1, the first If the visible light sensor 1 is closer to the X-ray source than the second visible light sensor 2, the resolution of the first visible light sensor 1 is set to be greater than that of the second visible light sensor 2.
  • the first visible light sensor 1 is used to absorb the visible photons generated by the first fluorescent material layer 3 being excited by X-rays; the second visible light sensor 2 is used to absorb the X-rays generated by the second fluorescent material layer 4 Visible photons generated by the excitation of rays.
  • the dual-energy spectrum dual-resolution X-ray detector further includes a packaging material wall layer 6 arranged along the sides of the first fluorescent material layer 3 and the second fluorescent material layer 4, and One edge of the packaging material wall layer 6 is against the first visible light sensor 1, the other edge is against the second visible light sensor 2, and the edge of the packaging material barrier layer 5 is against the inner surface of the packaging material wall layer 6. .
  • the encapsulation material spacer layer 5 and the encapsulation material wall layer 6 are jointly used to isolate the visible photons generated by the X-ray excitation of the first fluorescent material layer 3 and the second fluorescent material layer 4 generated by the X-ray excitation Visible photons.
  • the packaging material spacer 5 and the packaging material wall layer 6 are both made of X fluorescent packaging materials, and the packaging materials are preferably aluminum films and hot melt adhesives.
  • the aluminum film is packaged by hot melt adhesive.
  • the aluminum film of the packaging material wall layer 6 is installed between the first visible light sensor 1 and the second visible light sensor 2 by hot melt adhesive to form the X -The side wall of the radiation detector;
  • the aluminum film of the packaging material barrier layer 5 is bonded to the aluminum film of the packaging material wall layer 6 by hot melt adhesive to connect the packaging material wall layer 6 with the upper and lower visible light layers
  • the space enclosed by the sensors (the first visible light sensor 1 on the upper layer and the second visible light sensor 2 on the lower layer) is divided into upper and lower layers. As can be seen in conjunction with FIG.
  • the first fluorescent material layer 3 and the lower space are used to fill the second fluorescent material layer 4.
  • the thickness of the second fluorescent material layer 4 is greater than the thickness of the first fluorescent material layer 3.
  • the X-ray conversion material contained in the first fluorescent material layer 3 and the second fluorescent material layer 4 is cesium iodide (CsI) or other scintillators.
  • the first fluorescent material The X-ray to visible light materials of layer 3 and second fluorescent material layer 4 can be the same or different.
  • the other scintillators mentioned above can be modified high-density Cherenkov crystal materials to make them into scintillation crystals, such as PbF 2 , NaBi (WO 4 ) 2 and other crystals; it can also be NaI:Tl or CsI:Tl crystals and so on.
  • the reason why the second fluorescent material layer 4 is thicker is that the X-ray energy spectrum passing through the first fluorescent material layer 3 and entering the second fluorescent material layer 4 is narrowed and the rays are hardened, that is, entering the second fluorescent material layer 4
  • the intensity of X-rays of the fluorescent material layer 4 becomes higher.
  • the second fluorescent material layer 4 can absorb high-intensity X-rays, it is assumed that the photons absorbed by the first visible light sensor 1 and the photons absorbed by the second visible light sensor 2 If the number is close or the same, the thickness of the second fluorescent material layer 4 is greater than that of the first fluorescent material layer 3. Otherwise, most of the X-rays will be absorbed in the first fluorescent material layer 3, which will affect the second visible light. The photon absorption of sensor 2 and the imaging quality of the underlying detector.
  • the first visible light sensor 1 and the second visible light sensor 2 have the same shape and size, that is, the first image formed by the first visible light sensor 1 and the second image formed by the second visible light sensor 2 are for the same object.
  • the two images obtained by imaging, the size and angle of the object in these two images are the same, which provides the possibility to apply various image algorithms to the two images;
  • the shape of the first fluorescent material layer 3 and the second fluorescent material layer 4 Same as the size, the area of the first visible light sensor 1 is larger than the first fluorescent material layer 3, and the packaging material wall layer 6 has a recessed structure relative to the first visible light sensor 1 and the second visible light sensor 2 , So that there are no gaps between the packaging material wall layer 6 and the side walls of the first fluorescent material layer 3 and the second fluorescent material layer 4, so as to ensure that the first fluorescent material layer 3 is excited by X-rays.
  • the visible photons can be efficiently absorbed by the first visible light sensor 1, and it is ensured that the visible photons generated by the second fluorescent material layer 4 being excited by
  • a dual-energy spectrum dual-resolution X-ray detection system includes an X-ray source and a first image acquisition device.
  • a second image acquisition device and the above-mentioned dual energy spectrum dual resolution X-ray detector the first image acquisition device is electrically connected to the first visible light sensor 1 to acquire a first image
  • the collecting device is electrically connected with the second visible light sensor 2 to collect the second image.
  • This X-ray detection system can output two forms of images at one exposure.
  • the first fluorescent material layer 3 absorbs low-energy X-rays and converts them into visible photons that are absorbed by the first visible light sensor 1 with high resolution.
  • the first image acquisition device collects and obtains high-resolution images, which have a good imaging effect on low-density tissues, and can obtain very clear images; X-rays that are not absorbed by the first fluorescent material layer 3 penetrate
  • the second fluorescent material layer 4 changes (narrows) the energy spectrum and is hardened, and the ray intensity becomes higher, which is absorbed in the second fluorescent material layer 4 and converted into visible photons to be absorbed by the second visible light sensor 2 with low resolution.
  • the second image acquisition device acquires high-energy absorption images, and high-energy X-ray imaging is suitable for imaging tissues with higher density, such as breasts.
  • the low resolution of the second visible light sensor 2 here is relative to the high resolution of the first visible light sensor 1.
  • the second visible light sensor 2 If the resolution of the second visible light sensor 2 is too high, the pixel Too small a size is not conducive to the absorption of visible photons by the second visible light sensor 2. Therefore, the second visible light sensor 2 with too high resolution may not be able to image due to the low absorption efficiency of visible photons.
  • the dual-energy spectrum dual-resolution X-ray detection system further includes a processor that is electrically connected to the first image acquisition device and the second image acquisition device, and The processor can perform image operation processing on the first image collected by the first image collecting device and the second image collected by the second image collecting device.
  • the X-ray detection system can output three forms of images at one exposure. In addition to the above-mentioned high-resolution images and high-energy absorption images, it can also output a combined image. The combined image can be a comparison of the first image. Perform image addition or subtraction or other more image processing operations with the second image.
  • each layer of the fluorescent material that is, the first fluorescent material layer 3 and the second fluorescent material layer 4
  • the intermediate filter that is, the encapsulating material spacer 5
  • the X-ray spectrum of the layer is tailored to capture information of a specific energy spectrum. Further, by comparing the original X-ray energy spectrum (the energy spectrum before entering the object) and the two-dimensional space image of the object obtained by the X-ray imaging system of each layer, the X-ray of the object can be restored.
  • the dual energy spectrum detector can be well applied in the field of angiography.
  • the flat-panel detector adopting a layered design can obtain efficient collection and utilization of various information including time, space, and energy spectrum.
  • an imaging method based on the above-mentioned dual-energy spectrum dual-resolution X-ray detection system includes the following steps:
  • the target obtains a high-resolution image
  • output the first image x1 collected by the first image acquisition device For example, if an X-ray film is currently taken on an orthopedic patient, the first image x1 is selected to be output;
  • the second image x2 collected by the second image acquisition device is output. For example, if an X-ray film is currently taken on a breast patient, the second image x2 is selected to be output.
  • the imaging method further includes:
  • a processor is used to perform image arithmetic processing on the first image x1 and the second image x2 to obtain a synthesized combined image f(x1)+f(x2).
  • image arithmetic processing on the first image x1 and the second image x2 to obtain a synthesized combined image f(x1)+f(x2).
  • the current imaging of thicker but low-density tissues, such as the hip joint requires subtraction of the first image and the second image. After balancing the resolution and quantum detection efficiency, the composite of interest can be output.
  • image The image algorithm f(x1)+f(x2) performed on the first image and the second image in the present invention can be any image synthesis algorithm in the prior art, and will not be repeated here.

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Abstract

La présente invention porte sur des sondes à rayons X à double résolution à spectre d'énergie double, sur un système de sonde et sur un procédé d'imagerie. Les sondes comprennent un premier capteur de lumière visible (1), une première couche de matériau fluorescent (3), une couche de séparation de matériau d'encapsulation (5), une seconde couche de matériau fluorescent (4), et un second capteur de lumière visible (2), qui sont tous dans un agencement de couches se chevauchant ; le premier capteur de lumière visible (1) est plus proche d'une source de rayons X que le second capteur de lumière visible (2) et la résolution du premier capteur de lumière visible (1) est supérieure à celle du second capteur de lumière visible (2) ; le premier capteur de lumière visible (1) absorbe des photons de lumière visible produits par la première couche de matériau fluorescent (3) sous l'excitation de rayons X et le second capteur de lumière visible (2) absorbe des photons de lumière visible produits par la seconde couche de matériau fluorescent (4) sous une excitation par rayons X ; et la couche de séparation de matériau d'encapsulation (5) est utilisée pour séparer les photons de lumière visible produits par la première couche de matériau fluorescent (3) sous une excitation par rayons X des photons de lumière visible produits par la seconde couche de matériau fluorescent (4) sous une excitation par rayons X. Des sondes de couche supérieure et inférieure du système de sonde peuvent délivrer respectivement en sortie des images à haute résolution et des images à absorption d'énergie élevée et des images dignes d'intérêt peuvent en outre être obtenues au moyen d'un algorithme d'image.
PCT/CN2020/121196 2020-02-21 2020-10-15 Sondes à rayons x à double résolution à spectre d'énergie double, système de sonde et procédé d'imagerie WO2021164281A1 (fr)

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CN202010107082.5A CN111198397A (zh) 2020-02-21 2020-02-21 双能谱双分辨率的x-射线探测器、探测系统及成像方法
CN202010107082.5 2020-02-21

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CN111198397A (zh) * 2020-02-21 2020-05-26 江苏康众数字医疗科技股份有限公司 双能谱双分辨率的x-射线探测器、探测系统及成像方法

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WO2019134882A1 (fr) * 2018-01-02 2019-07-11 Koninklijke Philips N.V. Détecteur pour imagerie par rayons x
CN111198397A (zh) * 2020-02-21 2020-05-26 江苏康众数字医疗科技股份有限公司 双能谱双分辨率的x-射线探测器、探测系统及成像方法
CN211826543U (zh) * 2020-02-21 2020-10-30 江苏康众数字医疗科技股份有限公司 双能谱双分辨率的x-射线探测器及探测系统

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101506905A (zh) * 2006-07-14 2009-08-12 卡尔斯特里姆保健公司 非对称双屏数字x射线照相装置
US20130075618A1 (en) * 2007-10-01 2013-03-28 Hamamatsu Photonics K.K. Radiation detector
CN103026262A (zh) * 2010-07-26 2013-04-03 富士胶片株式会社 放射线检测器
CN103220978A (zh) * 2010-11-18 2013-07-24 皇家飞利浦电子股份有限公司 具有单一探测器的pet-ct系统
CN108139491A (zh) * 2015-10-21 2018-06-08 皇家飞利浦有限公司 用于低能量辐射量子和高能量辐射量子的组合探测的辐射探测器
CN207318734U (zh) * 2017-10-30 2018-05-04 同源微（北京）半导体技术有限公司 一种线阵列双能量x射线探测器
WO2019134882A1 (fr) * 2018-01-02 2019-07-11 Koninklijke Philips N.V. Détecteur pour imagerie par rayons x
CN111198397A (zh) * 2020-02-21 2020-05-26 江苏康众数字医疗科技股份有限公司 双能谱双分辨率的x-射线探测器、探测系统及成像方法
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