WO2021137330A1

WO2021137330A1 - Optical device

Info

Publication number: WO2021137330A1
Application number: PCT/KR2019/018829
Authority: WO
Inventors: 고용준; 김태형; 김미숙; 김보람; 이승현; 최주승; 안용호; 최완섭; 김외동
Original assignee: 엘지전자 주식회사
Priority date: 2019-12-31
Filing date: 2019-12-31
Publication date: 2021-07-08

Abstract

An optical device of the present invention may be characterized by: a light irradiation unit that irradiates light toward a specific space; a light receiving unit for receiving light and generating electric signals in response to an amount of the received light; and discriminating peaks of the electrical signals, sensing a volume flow rate of dust passing through the specific space through a time difference between the peaks of the electrical signals, and calculating a dust concentration in the specific space by using the volume flow rate.

Description

optical device

The present invention relates to an optical device. Specifically, the present invention relates to an apparatus for measuring the number and concentration of particles suspended in air without a flow generator, and a method for manufacturing the same.

In modern society, continuous industrialization is worsening air quality including fine dust worldwide, and interest and concerns about air pollution in cities are increasing. In particular, fine dust, a particulate matter (PM), accounts for most of the particles generated by artificial industrial activities, and depending on the size of the particles, 10 μm or less is defined as PM10, and 2.5 μm or less is PM2. 5 is marked. Dust particles suspended in the air are collectively referred to as total suspended particles (TSPs). Particles smaller than 1000 μm correspond to particles of less than 70 μm.

A method widely used as a technique for measuring fine dust is a light scattering method. The light scattering method uses the principle that when light is irradiated to particulate matter (PM) suspended in the atmosphere, the light is scattered by the particles, and when light of particulate matter with the same physical properties is irradiated, the amount of scattered light is proportional to the mass concentration. This is a method to calculate the amount of particulate matter.

A dust measuring device using a conventional light scattering method includes a measuring unit for measuring dust through light scattering, a flow path structure for guiding dust to the measuring unit, and a flow generating device (eg, a heater or a fan) for flowing dust in the flow path structure. was containing However, there is a problem in that the flow path structure and the flow generating device increase the volume of the dust measuring device, thereby reducing portability.

An object of the optical device according to an embodiment is to provide an apparatus for measuring the number and concentration of particles suspended in air without a flow generating device and a flow path structure, and a manufacturing method therefor.

In order to achieve the above object, an optical device according to an embodiment includes a light irradiator for irradiating light toward a specific space, a light receiving unit for receiving light and generating an electrical signal in response to the received amount of light, and and a processor for discriminating a peak, detecting a volume flow rate of dust passing through the specific space through a time difference between the peaks of the electrical signal, and calculating a dust concentration in the specific space using the volume flow rate.

Also, according to an embodiment, the processor detects a mass flow rate of dust passing through the specific space through the peak value of the electrical signal, and calculates the dust concentration of the specific space using the volume flow rate and the mass flow rate It can be characterized as

In addition, according to an embodiment, the light irradiation unit may be characterized in that it irradiates a pulse wave to the specific space at a preset period.

Also, according to an embodiment, the processor may compare the time difference between the peaks of the electrical signal with a first set value to change the period of the pulse wave irradiated by the light irradiator.

In addition, according to an embodiment, when the time difference between the peaks of the electrical signal is greater than the first set value, the processor extends the period of the pulse wave irradiated by the light irradiation unit, and the time difference between the peaks of the electrical signal is When it is smaller than the first set value, it may be characterized in that the period of the pulse wave irradiated by the light irradiation unit is shortened.

Also, according to an embodiment, it may be characterized in that a plurality of the first set values are provided for each section.

Also, according to an embodiment, the processor may compare the peak value of the electrical signal with a second set value to change the ratio of the pulse wave irradiated by the light irradiator.

In addition, according to an embodiment, when the peak value of the electrical signal has a value less than or equal to the second set value continuously for more than a preset number of times, the processor is configured to turn on (off) versus on (off) pulses irradiated by the light irradiator. on) to increase the ratio, and when the peak value of the electrical signal has a value equal to or greater than the second set value continuously for more than a preset number of times, lowering the off-to-on ratio of the pulses irradiated by the light irradiator can be characterized as

Also, according to an embodiment, it may be characterized in that a plurality of second set values are provided for each section.

Also, according to an embodiment, the peak of the electrical signal may be obtained in a state in which noise caused by ambient light is removed.

In addition, according to an embodiment, the light irradiator may irradiate light of a specific wavelength, and the light receiver may receive light of the specific wavelength.

In addition, according to an embodiment, the light receiving unit may include a filter that passes the light of the specific wavelength.

In addition, according to an embodiment, the light irradiation unit includes a directional light source, and a first lens that transmits the light generated from the directional light source to the specific space, and the light receiving unit receives the light to generate the electrical signal A transistor and a second lens that transmits the light reflected from the specific space toward the transistor, wherein the light source and the transistor are provided on the same substrate.

Also, according to an embodiment, the light source and the transistor may be provided on the same plane of the substrate.

Also, according to an embodiment, the transistor may be provided on the substrate such that a central portion of a light receiving region for receiving light is provided on the optical axis of the second lens.

The optical device according to an embodiment may reduce the volume of the optical device by measuring the dust concentration without a flow path structure.

The optical device according to an embodiment may reduce the volume of the optical device and prevent noise generation by omitting the flow generating device for flowing dust in the flow path structure.

The optical device according to an embodiment may be easily managed since the measuring unit for sensing dust is exposed to the outside.

1 is a schematic diagram of a conventional optical device for measuring dust using a light scattering method.

2 is a schematic diagram of an optical device according to an embodiment;

3 is a detailed diagram for describing a structure of an optical device according to an exemplary embodiment.

4 is another embodiment of an optical device.

5 is another embodiment of an optical device.

6 is another embodiment of an optical device.

7 is a view for explaining a method of classifying a volume flow rate of dust in an optical device according to an exemplary embodiment.

8 is a view for explaining a method of classifying a mass flow rate of dust in an optical device according to an exemplary embodiment.

9 illustrates an electrical signal received by an optical device according to an exemplary embodiment.

10 illustrates a pulse wave irradiated by a light irradiator in an optical device according to an exemplary embodiment.

Hereinafter, the embodiments disclosed in the present specification will be described in detail with reference to the accompanying drawings, but the same or similar components are assigned the same reference numbers regardless of reference numerals, and redundant description thereof will be omitted. The suffixes "module" and "part" for the components used in the following description are given or mixed in consideration of only the ease of writing the specification, and do not have a meaning or role distinct from each other by themselves. In addition, in describing the embodiments disclosed in the present specification, if it is determined that detailed descriptions of related known technologies may obscure the gist of the embodiments disclosed in the present specification, the detailed description thereof will be omitted. In addition, the accompanying drawings are only for easy understanding of the embodiments disclosed in the present specification, and the technical spirit disclosed herein is not limited by the accompanying drawings, and all changes included in the spirit and scope of the present invention , should be understood to include equivalents or substitutes.

Terms including an ordinal number such as first, second, etc. may be used to describe various elements, but the elements are not limited by the terms. The above terms are used only for the purpose of distinguishing one component from another.

When a component is referred to as being “connected” or “connected” to another component, it is understood that the other component may be directly connected or connected to the other component, but other components may exist in between. it should be On the other hand, when it is mentioned that a certain element is "directly connected" or "directly connected" to another element, it should be understood that the other element does not exist in the middle.

The singular expression includes the plural expression unless the context clearly dictates otherwise.

In the present application, terms such as "comprises" or "have" are intended to designate that a feature, number, step, operation, component, part, or combination thereof described in the specification exists, but one or more other features It should be understood that this does not preclude the existence or addition of numbers, steps, operations, components, parts, or combinations thereof.

1 is a schematic diagram of a conventional optical device 200 for measuring dust using a light scattering method.

The optical device 200 for measuring dust using the light scattering method basically irradiates light toward the housing 210 , the dust flow passage 220 provided in the housing 210 , and the dust flow passage 220 . It may include a light irradiator 230 and a light receiver 240 for receiving the light reflected by the dust 300 .

The optical apparatus 200 for measuring dust using the light scattering method may measure the concentration of dust in response to the amount of light received by the light receiving unit 240 . A plurality of light receiving units 240 may be provided in some cases.

The optical device 200 for measuring dust by using the light scattering method may further include a flow generating device (not shown) to allow dust to flow in the dust flow passage 220 . The flow generating device may be a heater or a fan. The flow generating device configured as a heater may use convection to flow dust in the dust flow passage 220 . The flow generating device configured as a fan may use a pressure change to flow dust in the dust flow passage 220 .

The optical device 200 for measuring dust using the conventional light scattering method includes a dust flow path 220 and a flow generating device, so it has a large volume, generates noise, and an optical component (light irradiator 230 and There was a difficulty in cleaning and managing the light receiving unit 240).

Hereinafter, as an optical device according to an exemplary embodiment, an optical device in which the dust flow passage 220 and the flow generating device are omitted will be described.

2 is a schematic diagram of an optical device according to an embodiment;

The optical apparatus 400 according to an embodiment may include a light irradiator 410 for irradiating light toward a specific space, and a light receiving unit 420 for receiving light and generating an electrical signal in response to the received amount of light. .

The light irradiation unit 410 may include a directional light source 411 and a first lens 412 that transmits the light generated from the directional light source 411 to the specific space.

The light receiver 420 may include a transistor 421 that receives light and generates the electrical signal, and a second lens 422 that transmits the light reflected from the specific space toward the transistor 421 .

The optical device 400 according to an embodiment may include a circuit board 430 on which a light source 411 and a transistor 421 are provided, and a housing 440 on which the light source 411 and the transistor 421 are mounted. . The housing 440 may include a first lens 412 and a second lens 422 on one surface. The housing 440 may include a partition wall 441 separating a space in which the light source 411 and the transistor 421 are mounted.

The light source 411 and the transistor 421 may be provided on the same plane of the circuit board 430 . The light source 411 irradiates light to a specific space through the first lens 412 , and the transistor 421 receives the light reflected by the dust 300 existing in the specific space through the second lens 422 . can

3 is a detailed view for explaining in detail the structure of the optical device 400 according to an exemplary embodiment. Hereinafter, reference is made to the optical device 400 of FIG. 2 .

3 (a) is a partial front view of the optical device 400 viewed from the light irradiating direction, FIG. 3 (b) is a partial configuration side view of the optical device 400 viewed from the side in the light irradiating direction.

The light source 411 may irradiate light to the specific space 500 through the first lens 412 , and the transistor 421 receives the light reflected in the specific space 500 through the second lens 422 . can do.

A position at which the transistor 421 is provided on the circuit board 430 may be determined by a direction or an angle in which light reflected from a specific space 500 is incident on the second lens 422 . The transistor 421 corresponds to the angle θ formed by the light reflected in the specific space 500 with the optical axis of the second lens 422, so that the center B of the area for receiving the light is the second lens ( It may be provided on the circuit board 430 to be spaced apart from the optical axis of the 422 .

Specifically, referring to the embodiment of FIG. 3 , a specific space 500 is spaced apart by a first distance S2 in the optical axis direction of the second lens 422 , and in a direction perpendicular to the optical axis of the second lens 422 . When the second distance d is spaced apart, the angle θ formed by the light reflected in the specific space 500 with the optical axis of the second lens 422 may correspond to act(d/S2). In this case, when the transistor 421 is provided to be spaced apart from the second lens 422 by a third distance (S2/M), the center of the region receiving light from the transistor 421 is the optical axis of the second lens 422 . It may be provided to be spaced apart by (S2/M)*tan(θ).

In the optical device 400 according to an exemplary embodiment, light reflected from a specific space 500 is irradiated toward the center of a region in which the transistor 421 receives light, thereby improving light acquisition efficiency.

4 is another embodiment of an optical device 400 . Hereinafter, reference is made to the optical device 400 of FIG. 2 .

The optical apparatus 400 according to an embodiment may change a direction in which light is irradiated using the first lens 412 and a direction in which light is received using the second lens 421 .

Specifically, in FIG. 4( a ), the light irradiated from the light source 411 passes through the first lens 412 without refraction and is irradiated to a specific space 500 , and the second lens 422 illuminates the specific space 500 . The light provided to face the transistor 421 and received by the transistor 421 is refracted by the second lens 422 and is incident thereto. In this case, although it may be difficult to manufacture the second lens 421 , the light acquisition efficiency can be improved in that the amount of light received can be sufficiently secured.

Specifically, in FIG. 4( b ), a specific space 500 is provided between the first lens 412 and the second lens 422 , and the first lens 412 and the second lens 422 have a specific space, respectively. It is provided to face 500 , and the light irradiated from the light source 411 passes through the first lens 412 and is refracted toward the specific space 500 , and the light reflected in the specific space 500 passes through the second lens ( It may be deflected toward the transistor 421 through 422 . In this case, the optical device 400 may set the specific space 500 to be adjacent.

Specifically, in FIG. 4C , the first lens 412 is provided to face a specific space 500 , and the light irradiated from the light source 411 passes through the first lens 412 and passes through the specific space 500 . Light refracted toward and reflected from the specific space 500 may pass through the second lens 422 without refraction and be incident toward the transistor 421 .

5 is another embodiment of an optical device 400 . Hereinafter, reference is made to the optical device 400 of FIG. 2 .

The optical device 400 according to an exemplary embodiment may use a molding lens as the first lens 412 and the second lens 422 .

Specifically, the housing 400 may separate a space in which the light source 411 is mounted and a space in which the transistor 421 is mounted by a partition wall 441 . Each of the separated spaces may be filled with resin to configure the first lens 412 and the second lens 422 .

The housing 400 may include an inlet 442 through which resin is introduced, and an opening 443 through which light passes. The resin introduced into the inlet 442 may fill the inner space and form the lens surface by surface tension in the opening 443 .

The lens surfaces of the first lens 412 and the second lens 422 may be formed by at least one of the size of the opening 443 and the viscosity of the resin.

The inlet 442 may be filled with accessory parts after the resin is introduced and the first lens 442 and the second lens 422 are molded.

6 is another embodiment of an optical device. Hereinafter, reference is made to the optical device 400 of FIG. 2 .

The optical device 400 according to an embodiment may irradiate light of a specific wavelength from the light emitter 410 and receive the light of the specific wavelength from the light receiver 420 . This is to remove noise caused by ambient light.

To this end, the optical device 400 may use a filter 450 that passes only a specific wavelength. The filter 450 may be provided on a path through which the light is irradiated from the light emitting unit 410 and may be provided on a path through which the light is received from the light receiving unit 420 .

For example, the filter 450 may be provided on the first lens 412 and the second lens 422 as shown in FIG. 6 . The filter 450 may be provided integrally or may be provided separately on the first lens 412 and the second lens 422 . The filter 450 may be provided on the light source 411 and on the transistor 421 .

7 is a view for explaining a method of classifying a volume flow rate of dust in the optical device 400 according to an exemplary embodiment. Hereinafter, reference is made to the optical device 400 of FIG. 2 .

In order to measure the concentration of dust, it is necessary to know the volumetric flow rate of the air containing the dust. The conventional optical device 400 can recognize the volumetric flow rate of air passing through the dust flow path by driving the flow generating device. For example, the volume flow rate of air passing through the dust flow path could be recognized by the driving speed of the fan or the heat generation of the heater.

Since the optical device 400 according to an exemplary embodiment does not include the dust flow path and the flow generating device, the volume flow rate of dust passing through the merge flow path through the flow generating device cannot be recognized. However, the optical device 400 according to an embodiment may recognize the volumetric flow rate of air passing through a specific space through the peak-to-peak time difference of the electrical signal generated in response to the amount of light received by the light receiver 420 .

Specifically, the optical device 400 according to an embodiment includes a light irradiator 410 that irradiates light toward a specific space, a light receiver 420 that receives light and generates an electrical signal in response to the amount of light received, and A processor for discriminating the peak of the electrical signal, detecting a volume flow rate of dust passing through the specific space through a time difference between the peaks of the electrical signal, and calculating the dust concentration of the specific space using the volume flow rate can

A volume flow rate of dust passing through a specific space may correspond to a flow rate of dust passing through a specific space. When dust passes through the specific space, the light receiver 420 may acquire an electrical signal peak corresponding to the passing dust. The electrical signal peak may be obtained corresponding to time. The electric signal peak-to-peak time difference may correspond to a flow rate of dust passing through a specific space. When the flow velocity of dust passing through a specific space is high, the time difference between the peaks of the electrical signal may be short. Conversely, when the flow velocity of dust passing through a specific space is slow, the time difference between the peaks of the electrical signal may be long. FIG. 7(a) shows an embodiment in which the flow velocity of dust passing through a specific space is fast, and FIG. 7(b) shows an embodiment in which the flow velocity of dust passing through a specific space is slow.

A mass flow in addition to the volume flow may be required to obtain the concentration of dust. The concentration of dust can be obtained through mass flow versus volume flow. Here, the mass flow rate may be obtained using the amount of electric charge charged through the electric signal, or may be obtained through the peak value of the electric signal. Hereinafter, an embodiment of acquiring the volumetric flow rate through the peak value of the electrical signal will be described.

8 is a view for explaining a method of classifying a mass flow rate of dust in an optical device according to an exemplary embodiment. Hereinafter, reference is made to the optical device 400 of FIG. 2 .

The size of the dust may vary. Depending on the size of the dust, the effect on the human body may be different. For example, ultrafine dust can directly penetrate into the human alveoli and adversely affect the human body. Accordingly, in general, the concentration of fine dust is provided in response to the size of the dust.

The optical device according to an embodiment may acquire a mass flow rate of dust passing through a specific space through a peak value of an electrical signal acquired for a unit time. When the size of the dust is large, the peak value of the electrical signal may be large, and when the size of the dust is small, the peak value of the electrical signal may be small. The optical device according to an embodiment may convert a peak value of an electrical signal into a mass or size of dust, and obtain a mass flow rate of dust passing through a specific space.

Specifically, FIG. 8( a ) illustrates a case where the size of dust passing through a specific space is the same. When the size of the dust is the same, the peak values of the electrical signals may be the same. FIG. 8(b) illustrates a case where the size of dust passing through a specific space is different. The peak value of the electric signal corresponding to the large dust may be greater than the peak value of the electric signal corresponding to the small dust.

9 illustrates an electrical signal received by an optical device according to an exemplary embodiment. Hereinafter, reference is made to the optical device 400 of FIG. 2 .

The optical device according to an embodiment obtains a volume flow rate of dust passing through a specific space through the peak-to-peak parallax of the electrical signal acquired by the light receiver 420, and the dust passing through the specific space by spitting the peak value of the electrical signal may detect a mass flow rate of , and classify the dust concentration of the specific space through the mass flow rate compared to the volume flow rate.

In some cases, the optical device according to an embodiment may acquire the volumetric flow rate of dust passing through the specific space through the peak number of electrical signals acquired for a unit time. Also, the optical device according to an embodiment may acquire a volume flow rate of dust passing through the specific space through a peak value of an electrical signal acquired for a unit time.

In some cases, the optical device according to an exemplary embodiment may discriminate a peak of an electrical signal according to a peak value of the electrical signal, and may obtain a concentration of dust for each size. Specifically, an electrical signal having a peak value belonging to a specific range among electrical signals may be discriminated, and a concentration of dust corresponding to the specific range may be obtained using the classified electrical signal. The electrical signal corresponding to the ultrafine dust has a small peak value, and the value may fall within a specific range. The optical device according to an embodiment may obtain a concentration of ultrafine dust by discriminating an electric signal corresponding to the ultrafine dust through a peak value, and acquiring a volume flow rate and a mass flow rate through the classified electric signal.

Specifically, a method of obtaining a volume flow rate and a mass flow rate through FIG. 9 is examined. 9 shows an electrical signal acquired for a unit time. The optical device according to an embodiment may discriminate peaks 601 to 605 of five electrical signals for a unit time, and obtain a volumetric flow rate of dust. The optical device according to an embodiment may discriminate the size or mass of dust corresponding to each value of the peaks 601 to 605 of the electrical signal, and obtain a mass flow rate of the dust. The optical device according to an exemplary embodiment discriminates only the

electrical signals

602 , 603 , and 605 having a value less than or equal to a specific value v2 at the peaks 601 to 605 of the electrical signal, and uses the separated electrical signals to achieve ultra-fine The concentration of dust can be determined.

10 illustrates a pulse wave irradiated by a light irradiator in an optical device according to an exemplary embodiment. Hereinafter, reference is made to the optical device 400 of FIG. 2 .

In the optical device according to an embodiment, the light irradiator 410 may irradiate a pulse wave at a preset period. (See FIG. 10( a )) The pulse wave irradiated from the light irradiation unit 410 may be adjusted to correspond to at least one of a flow velocity and a size of dust. For example, the period of the pulse wave or the ratio of the pulse wave (off to on ratio) may be adjusted. (See Fig. 10(b), Fig. 10(c))

Also, when the flow velocity of dust passing through a specific space is high, the optical device according to an exemplary embodiment may shorten the period of the pulse wave as shown in FIG. 10( b ). The optical device 400 may change the period of the pulse wave irradiated by the light irradiator 410 by comparing the parallax between the peaks of the electrical signal with the first set value. Specifically, when the time difference between the peaks of the electrical signal is greater than the first set value, the optical device 400 extends the period of the pulse wave irradiated by the light irradiation unit 410, and the time difference between the peaks of the electrical signal is When the value is smaller than the first set value, the period of the pulse wave irradiated by the light irradiator may be shortened. Here, a plurality of the first set values may be provided for each section.

Specifically, when the size of dust passing through a specific space is small, the optical device according to an exemplary embodiment may increase the ratio of pulse waves as shown in FIG. This is because the size of the dust is small and the dust passing through the pulse wave may not be measured. The optical device 400 may compare the peak value of the electrical signal with the second set value to change the ratio of the pulse wave irradiated by the light irradiator 410 . Specifically, in the optical device 400, when the peak value of the electrical signal has a value equal to or less than the second set value continuously for more than a preset number of times, the off versus on of the pulse irradiated by the light irradiator 410 is on (on). ) increase the ratio, and when the peak value of the electrical signal has a value equal to or greater than the second set value continuously for more than a preset number of times, the off-to-on ratio of the pulse irradiated by the light irradiation unit 410 is can be lowered Here, a plurality of second set values may be provided for each section.

The above detailed description should not be construed as restrictive in all respects and should be considered as illustrative. The scope of the present invention should be determined by a reasonable interpretation of the appended claims, and all modifications within the equivalent scope of the present invention are included in the scope of the present invention.

Claims

a light irradiation unit irradiating light toward a specific space;

a light receiving unit that receives light and issues an electrical signal in response to the received light amount; and

to discriminate the peak of the electrical signal,

Detecting the volumetric flow rate of dust passing through the specific space through the peak-to-peak time difference of the electrical signal,

The optical device of claim 1, wherein the dust concentration in the specific space is calculated using the volumetric flow rate.
According to claim 1,

the processor

Detecting the mass flow rate of dust passing through the specific space through the peak value of the electrical signal,

The optical device of claim 1, wherein the dust concentration in the specific space is calculated using the volume flow rate and the mass flow rate.
3. The method of claim 2,

The light irradiation unit

An optical device characterized in that the pulse wave is irradiated to the specific space at a preset period.
4. The method of claim 3,

the processor

The optical device of claim 1, wherein the time difference between the peaks of the electrical signal is compared with a first set value, and the period of the pulse wave irradiated by the light irradiation unit is changed.
5. The method of claim 4,

the processor

When the time difference between the peaks of the electrical signal is greater than the first set value, the period of the pulse wave irradiated by the light irradiation unit is extended,

When the parallax between the peaks of the electrical signal becomes smaller than the first set value, the optical device of claim 1 , wherein the period of the pulse wave irradiated by the light irradiation unit is shortened.
5. The method of claim 4,

The first set value is

An optical device, characterized in that a plurality are provided for each section.
5. The method of claim 4,

the processor

and comparing the peak value of the electrical signal with a second set value to change the ratio of the pulse wave irradiated by the light irradiator.
8. The method of claim 7,

the processor

When the peak value of the electrical signal has a value less than the second set value continuously for more than a preset number of times, increase the off-to-on ratio in the pulse irradiated by the light irradiator,

When the peak value of the electrical signal has a value equal to or greater than the second set value continuously for more than a preset number of times, an optical device characterized in that the off-to-on ratio is lowered in the pulse irradiated by the light irradiator .
8. The method of claim 7,

The second set value is

An optical device, characterized in that a plurality are provided for each section.
According to claim 1,

The optical device, characterized in that the peak of the electrical signal is obtained in a state in which noise caused by ambient light is removed.
According to claim 1,

The light irradiation unit irradiates light of a specific wavelength,

The optical device, characterized in that the light receiving unit receives the light of the specific wavelength.
12. The method of claim 11,

The light receiving unit

and a filter that passes the light of the specific wavelength.
According to claim 1,

The light irradiation unit

directional light source; and

Including; a first lens for transmitting the light generated from the directional light source to the specific space;

The light receiving unit

a transistor for generating the electrical signal for receiving light; and

and a second lens that transmits the light reflected in the specific space toward the transistor.

The optical device, characterized in that the light source and the transistor are provided on the same substrate.
14. The method of claim 13,

The optical device, characterized in that the light source and the transistor are provided on the same plane of the substrate.
15. The method of claim 14,

the transistor is

and a central portion of a light receiving area for receiving light is provided on the substrate so as to be provided on the optical axis of the second lens.