WO2021128471A1 - 用于测量显示面板闪烁度的检测装置及检测方法 - Google Patents

用于测量显示面板闪烁度的检测装置及检测方法 Download PDF

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WO2021128471A1
WO2021128471A1 PCT/CN2020/070688 CN2020070688W WO2021128471A1 WO 2021128471 A1 WO2021128471 A1 WO 2021128471A1 CN 2020070688 W CN2020070688 W CN 2020070688W WO 2021128471 A1 WO2021128471 A1 WO 2021128471A1
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display panel
brightness
waveform signal
measuring
flicker
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PCT/CN2020/070688
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English (en)
French (fr)
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张云
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惠州市华星光电技术有限公司
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Publication of WO2021128471A1 publication Critical patent/WO2021128471A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the present application relates to the field of display technology, and in particular to a detection device and a detection method for measuring the flicker degree of a display panel.
  • the AC driving polarity reversal method is generally used. Due to the introduction of the common electrode signal (VCOM) in this method, the driving voltage is not completely symmetrical during the polarity reversal switching. This phenomenon will cause the flicker that is visible to the human eye under the specific test screen ( Flicker), the flicker is generally used to describe this flicker.
  • the degree of flicker directly describes the quality and reliability of liquid crystal display panels, such as thin film transistors (Thin Film Transistors). The stronger the leakage current of Transistor (TFT), the greater the flicker.
  • the FMA method uses the AC component of the brightness change to represent the flicker degree than the DC component, and usually requires the use of a photoelectric signal conversion probe.
  • the contrast method is usually used to measure the flicker.
  • the light emitted from the LCD display is only within ⁇ 2.5 degrees (LED universal measuring probe (diameter ⁇ 10) (CA-PSU32/35) and LED flicker measuring probe (diameter ⁇ 10) (CA-PS32/35) ): The light perpendicular to the LCD screen within the range of ⁇ 5 degrees is guided to the optical fiber by the objective lens.
  • the present application provides a detection device and a detection method for measuring the flicker degree of a display panel, which can accurately measure the flicker degree of the display panel when the display panel is at low brightness, and can make the adjustment of the common electrode more accurate when the display panel is produced, thereby improving the display product performance quality.
  • an embodiment of the present application provides a detection device for measuring the flicker degree of a display panel, including: a measuring probe, an analog-to-digital conversion device, and a measurement processing device;
  • the measuring probe is used to scan the display panel to be tested provided with a flickering picture, convert the brightness of the display panel into a voltage signal, and obtain the analog brightness waveform signal of the display panel;
  • the analog-to-digital conversion device is used for Receive the analog brightness waveform signal output by the measuring probe and convert it into a first digital brightness waveform signal;
  • the measurement processing device is used to process the first digital brightness waveform signal output by the analog-to-digital conversion device through multiple moving averages It is converted into a clearly displayed second digital brightness waveform signal, and the flicker degree of the display panel is calculated.
  • the measuring probe includes a plurality of photodiodes and a measuring subunit; wherein, the plurality of photodiodes are used to obtain the brightness signal of the display panel, so The measurement subunit is used to average the at least one brightness signal to obtain an analog brightness waveform signal of the display panel.
  • the measurement processing device is also used for filtering the first digital brightness waveform signal.
  • the detection device for measuring the flicker degree of the display panel when the moving average processing is performed, the average of the remaining measurement values after removing the maximum value and the minimum value from more than four measurement values is taken.
  • Flicker is the flicker degree of the display panel
  • L max is a detection value used to indicate that the display panel is at the maximum display brightness
  • L min is a detection value used to indicate that the display panel is at the minimum display brightness.
  • an embodiment of the present application also provides a detection method for measuring the flicker degree of a display panel, the method including:
  • S20 Scan the display panel with a measuring probe, convert the brightness of the display panel into a voltage signal, and obtain an analog brightness waveform signal of the display panel;
  • S30 Receive the analog brightness waveform signal output by the measuring probe through the analog-to-digital conversion device, and convert it into a first digital brightness waveform signal;
  • S60 Calculate and obtain the flicker degree of the display panel through the second digital brightness waveform signal.
  • the S20 includes:
  • S202 Convert the brightness signal into an analog brightness waveform signal.
  • the measuring probe in the detection method for measuring the flicker degree of a display panel, includes a plurality of photodiodes and a measuring subunit; wherein, the plurality of photodiodes are used to obtain the display panel
  • the measurement subunit is used to average the at least one brightness signal to obtain an analog brightness waveform signal of the display panel.
  • the analog-to-digital conversion device is a high-speed multi-function data acquisition card.
  • the measurement value remaining after the maximum value and the minimum value are removed from the four or more measurement values Average.
  • the detection device and detection method for measuring the flicker degree of the display panel measure the flicker image of the display panel by using a measuring probe containing a plurality of photodiodes, and use the moving average method for processing
  • the flicker waveform data reduces the cost of measuring the flicker of the display panel while measuring the flicker of the display panel when low brightness is achieved.
  • FIG. 1 is a schematic structural diagram of a detection device for measuring the flicker degree of a display panel provided by an embodiment of the application.
  • FIG. 2 is a schematic flowchart of a detection method for measuring the flicker degree of a display panel provided by an embodiment of the application.
  • Fig. 3 is a 1 gray-scale flicker waveform diagram of the original data collected by the measuring probe in Fig. 2 after filtering.
  • Fig. 4 is a 1 gray scale flicker waveform diagram obtained after several moving average processing of the 1 gray scale flicker waveform diagram of the original data in Fig. 3.
  • Fig. 5 is the final version of the 1 gray-scale flicker waveform diagram obtained after multiple moving average processing of the 1 gray-scale flicker waveform diagram in Fig. 4.
  • VA-type displays have very low brightness in low gray scales, and the flickering brightness is only about 50% of the corresponding gray scale, so the brightness is lower.
  • the brightness of 1 gray scale flicker is only about 0.01 ⁇ 0.05. This makes it difficult for the instrument to effectively collect data differences when the positive and negative polarities are reversed.
  • High-brightness gray scales such as 32 gray scales do not have such problems.
  • FIG. 1 it is a schematic structural diagram of a detection device for measuring the flicker degree of a display panel provided by an embodiment of this application.
  • the detection device for measuring the flicker degree of the display panel includes:
  • the measuring probe 20 is used to scan the display panel 10 to be tested provided with flashing images, convert the brightness of the display panel 10 into a voltage signal, and obtain the analog brightness waveform signal of the display panel 10;
  • the analog-to-digital conversion device 30 is configured to receive the analog brightness waveform signal output by the measuring probe 20 and convert it into a first digital brightness waveform signal;
  • the measurement processing device 40 is configured to convert the first digital brightness waveform signal output by the analog-to-digital conversion device 30 into a clearly displayed second digital brightness waveform signal through multiple moving average processing, and calculate the flicker of the display panel 10 degree.
  • the measurement processing device 40 may be connected to the display panel 10 through a printed circuit board assembly (PCBA), provide flashing images to the display panel 10, and send control commands; wherein, the The display panel 10 will flicker after receiving the flickering picture.
  • the measuring probe 20 can collect the analog brightness waveform signal of the display panel 10.
  • the measurement probe 20 includes a plurality of photodiodes and a measurement subunit, the plurality of photodiodes are used to obtain the brightness signal of the display panel 10, and the measurement subunit is used to combine the at least A brightness signal is averaged to obtain the analog brightness waveform signal of the display panel 10.
  • one photodiode can be used, or multiple photodiodes can be used. Multiple photodiodes can improve the accuracy of data collection; in one embodiment, the photodiode can be a photodiode of the Photo diode model of ELDIM. (It can measure the flicker value as low as -80dB level from the LED driven by the computer).
  • the photodiode can collect the brightness signal of the display panel 10 in a scanning manner.
  • the brightness signal collected here is an analog brightness waveform signal, which is referred to as an analog brightness waveform signal hereinafter.
  • the measuring subunit can be omitted and the analog brightness waveform signal can be directly output.
  • the analog-to-digital conversion device 30 is a high-rate multifunctional data acquisition card (DAQ acquisition card).
  • DAQ acquisition card high-rate multifunctional data acquisition card
  • the measurement processing device 40 is preferably a personal computer (PC), and the measurement processing device 40 further includes a low-pass filtering device and a calculation device.
  • PC personal computer
  • the low-pass filtering device is used to perform filtering processing on the received first digital brightness waveform signal. This is because in the measurement process, due to factors such as backlight, model, instrument, etc., a lot of abnormal data are collected, especially the dirty particles of the backlight, and the data needs to be filtered.
  • the calculation device is used to convert the first digital brightness waveform signal output by the analog-to-digital conversion device 30 into a clearly displayed second digital brightness waveform signal through multiple moving average processing.
  • the moving average processing is performed, the average of the remaining measurement values after removing the maximum value and the minimum value from more than four measurement values is taken.
  • the calculation device calculates the flicker degree of the display panel by the following formula:
  • Flicker is the flicker degree of the display panel
  • L max is a detection value used to indicate that the display panel is at the maximum display brightness
  • L min is a detection value used to indicate that the display panel is at the minimum display brightness.
  • FIG. 2 it is a schematic flowchart of a detection method for measuring the flicker degree of a display panel provided by an embodiment of this application.
  • the method includes:
  • the S10 further includes:
  • the display panel 10 is provided with a flickering picture; wherein the display panel 10 will flicker after receiving the flickering picture.
  • S20 Scan the display panel with a measuring probe, convert the brightness of the display panel into a voltage signal, and obtain an analog brightness waveform signal of the display panel.
  • the S20 further includes:
  • a measuring probe is provided.
  • the measuring probe includes a plurality of photodiodes and a measuring subunit.
  • the display panel is scanned by the measuring probe, and the brightness of the display panel is converted into a voltage signal to obtain the Analog brightness waveform signal.
  • the plurality of photodiodes are used to obtain the brightness signal of the display panel, and the measurement subunit is used to average the at least one brightness signal to obtain the analog brightness waveform signal of the display panel 10.
  • one photodiode can be used, or multiple photodiodes can be used. Multiple photodiodes can improve the accuracy of data collection; when the measurement probe uses one photodiode, the measurement subunit can be omitted , Directly output the analog brightness waveform signal.
  • the photodiode may be ELDIM's Photo A photodiode of the diode model (which can measure the flicker value as low as -80dB from an LED driven by a computer).
  • S30 Receive the analog brightness waveform signal output by the measuring probe through the analog-to-digital conversion device, and convert it into a first digital brightness waveform signal.
  • the S30 further includes:
  • the analog brightness waveform signal output by the measuring probe is received by an analog-digital conversion device, and converted into a first digital brightness waveform signal.
  • the analog-to-digital conversion device is a high-speed multifunctional data acquisition card (DAQ acquisition card).
  • S40 Perform low-pass filtering processing on the first digital brightness waveform signal.
  • the S40 further includes:
  • the measurement processing device After the first digital brightness waveform signal is input to the measurement processing device, the measurement processing device performs low-pass filter processing on the first digital brightness waveform signal. This is because in the measurement process, due to factors such as backlight, model, instrument, etc., a lot of abnormal data are collected, especially the dirty particles of the backlight, and the data needs to be filtered.
  • the measurement processing device is preferably a personal computer (PC).
  • S50 Perform multiple moving average processing on the first digital brightness waveform signal that has been processed by low-pass filtering to obtain a clearly displayed second digital brightness waveform signal.
  • the S50 further includes:
  • the first digital brightness waveform signal after the low-pass filtering process is subjected to multiple moving average processing to obtain a clearly displayed second digital brightness waveform signal.
  • the moving average processing is performed, the average of the remaining measurement values after removing the maximum value and the minimum value from more than four measurement values is taken.
  • FIG. 3 it is a 1-gray-scale flicker waveform diagram of the original data collected by the measuring probe after filtering processing.
  • the horizontal axis is time and the vertical axis is brightness.
  • the measuring probe adopts a photodiode of the Photo diode model of ELDIM Company (which can measure the flicker value as low as -80dB level emitted by the LED driven by the computer). It can be seen from Figure 3 that the waveform graph is messy and it is difficult to calculate the flicker value.
  • FIG. 4 it is a 1 gray-scale flicker waveform diagram obtained by moving average processing of the original data in Fig. 3, the horizontal axis is time, and the vertical axis is brightness.
  • the measuring probe adopts a photodiode of the Photo diode model of ELDIM Company (which can measure the flicker value as low as -80dB level emitted by the LED driven by the computer). It can be seen from Figure 4 that the waveform diagram is clearer than Figure 3, but it is still difficult to calculate the flicker value.
  • FIG. 5 it is the final version of the 1 gray-scale flicker waveform diagram obtained by multiple moving average processing of the 1 gray-scale flicker waveform diagram in FIG. 4.
  • the horizontal axis is time and the vertical axis is brightness.
  • the measuring probe adopts a photodiode of the Photo diode model of ELDIM Company (which can measure the flicker value as low as -80dB level emitted by the LED driven by the computer). It can be seen from Fig. 5 that compared to Fig. 3, the waveform can be clearly displayed, and the flicker value can be calculated.
  • S60 Calculate and obtain the flicker degree of the display panel through the second digital brightness waveform signal.
  • the S60 further includes:
  • the flicker degree of the display panel is calculated by the second digital brightness waveform signal that can be clearly displayed.
  • the flicker degree of the display panel is calculated by the following formula:
  • Flicker is the flicker degree of the display panel
  • L max is a detection value used to indicate that the display panel is at the maximum display brightness
  • L min is a detection value used to indicate that the display panel is at the minimum display brightness.
  • the photodiode of the Photo diode model of ELDIM and the high-speed multifunctional data acquisition card (DAQ acquisition card) provided by the embodiment of the application cost only about 2,000 yuan, while a CA310 needs more than 8W.
  • the use of the above-mentioned device can better save costs; on the other hand, it can realize the measurement of low-brightness flicker value of the display panel, which cannot be achieved by other instruments such as CA310.
  • this application uses a measuring probe containing multiple photodiodes to measure the flicker screen of the display panel, and uses the moving average method to process the flicker waveform data, so that the flicker of the display panel is measured when low brightness is achieved, and the flicker is reduced.
  • the cost of measuring the flicker degree of the display panel uses a measuring probe containing multiple photodiodes to measure the flicker screen of the display panel, and uses the moving average method to process the flicker waveform data, so that the flicker of the display panel is measured when low brightness is achieved, and the flicker is reduced.

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Abstract

一种用于测量显示面板（10）闪烁度的检测装置及检测方法。检测装置包括：用于将显示面板（10）的亮度转换成模拟亮度波形信号的测量探头（20）、用于将模拟亮度波形信号转换成数字亮度波形信号的模数转换装置（30）以及用于将数字亮度波形信号计算获得显示面板（10）的闪烁度的测量处理装置（40）。

Description

用于测量显示面板闪烁度的检测装置及检测方法 技术领域
本申请涉及显示技术领域，尤其涉及一种用于测量显示面板闪烁度的检测装置及检测方法。
 背景技术
在液晶显示面板的驱动过程中，一般会采用交流驱动极性反转的方式。由于在这一方式中引入了公共电极信号(VCOM)，在极性反转的切换中会发生驱动电压不完全对称的现象，这种现象会带来特定测试画面下人眼可见的闪烁现象（Flicker），一般采用闪烁度来描述这一闪烁。闪烁度的大小直接描述了液晶显示面板的品质可靠度，比如薄膜晶体管(Thin Film Transistor，TFT)漏电流越强，往往会导致闪烁度越大。更重要地是，当闪烁度较大时，往往意味着公共电极信号偏离极性反转的中心对称位置较大，这意味着显示面板发生图像残留 (Image Sticking，IS)的风险变大。所以，如何测量与调节特性测试画面下闪烁度的大小，是液晶显示面板设计和制造中一项重要的课题。
现有的技术中，对闪烁度进行测量的方法通常包括FMA方法以及JEITA方法以及VESA 方法。其中FMA方法用亮度变化的交流分量比直流分量代表闪烁度，通常需要使用光电信号转换的探头。最常用的探头CA310中，通常使用对比法测量闪烁度。在测量时，从液晶显示屏发出的光线，只有在±2.5度(LED通用测量探头(直径为Φ10)(CA-PSU32/35) 和LED闪烁测量探头(直径为Φ10) (CA-PS32/35)：±5度)范围内与液晶显示屏垂直的光才由物镜引导到光纤。在此种方法中，需要满足在探测视域内的最小像素数目，才能保证足够的光能量进入到探测设备，然而，在画面较暗、灰阶度较低的情况下，例如VA（ vertical alignmen，垂直配向）系列的LCD（ Liquid Crystal Display，液晶显示器），亮度低于1nits（单位面积的发光强度）时，闪烁度的测试模式对应的亮度更低，从而导致该设备无法探测闪烁度。
因此，亟需提供一种用于测量显示面板闪烁度的检测装置及检测方法，来解决上述技术问题。
 技术问题
本申请提供一种用于测量显示面板闪烁度的检测装置及检测方法，可以准确测量显示面板处于低亮度时的闪烁度，可以使在生产显示面板时公共电极调整更加准确，从而提高显示产品的品质。
 技术解决方案
第一方面，本申请实施例提供一种提供一种用于测量显示面板闪烁度的检测装置，包括：测量探头、模数转换装置以及测量处理装置；
其中，所述测量探头用于扫描提供有闪烁画面的待测显示面板，将所述显示面板的亮度转换成电压信号，获得所述显示面板的模拟亮度波形信号；所述模数转换装置用于接收所述测量探头输出的模拟亮度波形信号，并转换成第一数字亮度波形信号；所述测量处理装置用于将所述模数转换装置输出的第一数字亮度波形信号通过多次移动平均处理转换成清晰显示的第二数字亮度波形信号，计算获得所述显示面板的闪烁度。
在所述的用于测量显示面板闪烁度的检测装置中，所述测量探头包括多个光电二极管以及测量子单元；其中，多个所述光电二极管用于获得所述显示面板的亮度信号，所述测量子单元用于将所述至少一个亮度信号取平均值，获得所述显示面板的模拟亮度波形信号。
在所述的用于测量显示面板闪烁度的检测装置中，所述测量处理装置还用于对所述第一数字亮度波形信号进行滤波处理。
在所述的用于测量显示面板闪烁度的检测装置中，当进行所述移动平均处理时，取从4个以上的测量值中去掉最大值以及最小值后剩余的测量值的平均。
在所述的用于测量显示面板闪烁度的检测装置中，所述测量处理装置通过下述公式计算所述显示面板的闪烁度：Flicker=2*（L max-L min）／（L max+L min）*100%；
其中，Flicker为所述显示面板的闪烁度，L max为用于表示所述显示面板处于最大显示亮度的检测值，L min为用于表示所述显示面板处于最小显示亮度的检测值。
第二方面，本申请实施例还提供一种用于测量显示面板闪烁度的检测方法，所述方法包括：
S10，给待测显示面板提供闪烁画面；
S20，利用一测量探头扫描所述显示面板，将所述显示面板的亮度转换成电压信号，获得所述显示面板的模拟亮度波形信号；
S30，通过模数转换装置接收所述测量探头输出的模拟亮度波形信号，并转换成第一数字亮度波形信号；
S40，将所述第一数字亮度波形信号进行低通滤波处理；
S50，将经过低通滤波处理后的所述第一数字亮度波形信号进行多次移动平均处理，得到清晰显示的第二数字亮度波形信号；
S60，通过所述第二数字亮度波形信号，计算获得所述显示面板的闪烁度。
在所述的用于测量显示面板闪烁度的检测方法中，所述S20包括：
S201，利用一测量探头获得所述显示面板的亮度信号；
S202，将所述亮度信号转换成模拟亮度波形信号。
在所述的用于测量显示面板闪烁度的检测方法中，所述S20中，所述测量探头包括多个光电二极管以及测量子单元；其中，多个所述光电二极管用于获得所述显示面板的亮度信号，所述测量子单元用于将所述至少一个亮度信号取平均值，获得所述显示面板的模拟亮度波形信号。
在所述的用于测量显示面板闪烁度的检测方法中，所述S30中，所述模数转换装置为高速率多功能数据采集卡。
在所述的用于测量显示面板闪烁度的检测方法中，所述S50中，当进行所述移动平均处理时，取从4个以上的测量值中去掉最大值以及最小值后剩余的测量值的平均。
 有益效果
相较于现有技术，本申请实施例提供的用于测量显示面板闪烁度的检测装置及检测方法，通过使用含有多个光电二极管的测量探头测量显示面板的闪烁画面，且运用移动平均法处理闪烁波形数据，在实现低亮度时对显示面板进行闪烁度测量的同时，减少了测量显示面板闪烁度的成本。
 附图说明
图1为本申请实施例提供的用于测量显示面板闪烁度的检测装置的结构示意图。
图2为本申请实施例提供的用于测量显示面板闪烁度的检测方法的流程示意图。
图3为图2中所述测量探头经滤波处理后采集到的原始数据的1灰阶闪烁波形图。
图4为图3中原始数据的1灰阶闪烁波形图经几次移动平均处理后得到的1灰阶闪烁波形图。
图5为图4中1灰阶闪烁波形图经多次移动平均处理后得到的最终版的1灰阶闪烁波形图。
 本发明的实施方式
本申请提供的一种用于测量显示面板闪烁度的检测装置及检测方法，为使本申请的目的、技术方案及效果更加清楚、明确，以下参照附图并举实施例对本申请进一步详细说明。应当理解，此处所描述的具体实施例仅用以解释本申请，并不用于限定本申请。
目前VA型显示器，低灰阶亮度很低，并且闪烁的亮度只有对应灰阶的50%左右，所以亮度更低。通常1灰阶闪烁亮度只有0.01~0.05左右。这导致正负极性反转时，仪器很难有效的采集到数据差异，而32灰阶等高亮度灰阶没有这样的问题。
如图1所示，为本申请实施例提供的用于测量显示面板闪烁度的检测装置的结构示意图。其中，所述用于测量显示面板闪烁度的检测装置包括：
测量探头20，用于扫描提供有闪烁画面的待测显示面板10，将所述显示面板10的亮度转换成电压信号，获得所述显示面板10的模拟亮度波形信号；
模数转换装置30，用于接收所述测量探头20输出的模拟亮度波形信号，并转换成第一数字亮度波形信号；
测量处理装置40，用于将所述模数转换装置30输出的第一数字亮度波形信号通过多次移动平均处理转换成清晰显示的第二数字亮度波形信号，计算获得所述显示面板10的闪烁度。其中，所述测量处理装置40可以通过印刷电路装配板（printed circuit board assembly，PCBA）与所述显示面板10相连接，向所述显示面板10提供闪烁画面，以及发送控制命令；其中，所述显示面板10在收到闪烁画面后会出现闪烁现象，此时所述测量探头20可以收集所述显示面板10的模拟亮度波形信号。
具体地，所述测量探头20包括多个光电二级管以及测量子单元，多个所述光电二极管用于获得所述显示面板10的亮度信号，所述测量子单元，用于将所述至少一个亮度信号取平均值，获得所述显示面板10的模拟亮度波形信号。
优选地，可以采取一个光电二极管，也可以采用多个光电二极管，采用多个光电二极管可以提高采集数据的准确性；在一个实施例中，该光电二极管可以是ELDIM公司的Photo diode型号的光电二极管（可测由电脑驱动的LED发出的低至-80dB水平的闪烁值）。所述光电二极管可以通过扫描的方式收集所述显示面板10的亮度信号，此处所收集到的亮度信号为模拟形式的亮度波形信号，下称为模拟亮度波形信号。
优选地，当所述测量探头20采用一个光电二极管时，则可以省掉所述测量子单元，直接将模拟亮度波形信号输出。
具体地，所述模数转换装置30为高速率多功能数据采集卡（DAQ采集卡）。
具体地，所述测量处理装置40优选为个人电脑（PC），所述测量处理装置40还包括低通滤波装置以及计算装置。
所述低通滤波装置用于对接收到的所述第一数字亮度波形信号进行滤波处理。这是因为，在测量过程中，由于背光、型号、仪器等因素，导致采集到很多异常数据，特别是背光的脏颗粒，为此需要对数据进行滤波处理。
所述计算装置用于将所述模数转换装置30输出的所述第一数字亮度波形信号通过多次移动平均处理转换成清晰显示的第二数字亮度波形信号。当进行所述移动平均处理时，取从4个以上的测量值中去掉最大值以及最小值后剩余的测量值的平均。
所述计算装置通过下述公式计算所述显示面板的闪烁度：
Flicker=2*（L max-L min）／（L max+L min）*100%
其中，Flicker为所述显示面板的闪烁度，L max为用于表示所述显示面板处于最大显示亮度的检测值，L min为用于表示所述显示面板处于最小显示亮度的检测值。
如图2所示，为本申请实施例提供的用于测量显示面板闪烁度的检测方法的流程示意图。其中，所述方法包括：
S10，给待测显示面板提供闪烁画面。
具体地，所述S10还包括：
向所述显示面板10提供闪烁画面；其中，所述显示面板10在收到闪烁画面后会出现闪烁现象。
S20，利用一测量探头扫描所述显示面板，将所述显示面板的亮度转换成电压信号，获得所述显示面板的模拟亮度波形信号。
具体地，所述S20还包括：
提供一测量探头，所述测量探头包括多个光电二级管以及测量子单元，通过所述测量探头扫描所述显示面板，将所述显示面板的亮度转换成电压信号，获得所述显示面板的模拟亮度波形信号。
其中，多个所述光电二极管用于获得所述显示面板的亮度信号，所述测量子单元，用于将所述至少一个亮度信号取平均值，获得所述显示面板10的模拟亮度波形信号。
优选地，可以采取一个光电二极管，也可以采用多个光电二极管，采用多个光电二极管可以提高采集数据的准确性；当所述测量探头采用一个光电二极管时，则可以省掉所述测量子单元，直接将模拟亮度波形信号输出。
在一个实施例中，该光电二极管可以是ELDIM公司的Photo diode型号的光电二极管（可测由电脑驱动的LED发出的低至-80dB水平的闪烁值）。
S30，通过模数转换装置接收所述测量探头输出的模拟亮度波形信号，并转换成第一数字亮度波形信号。
具体地，所述S30还包括：
通过模数转换装置接收所述测量探头输出的模拟亮度波形信号，并转换成第一数字亮度波形信号。其中，所述模数转换装置高速率多功能数据采集卡（DAQ采集卡）。
S40，将所述第一数字亮度波形信号进行低通滤波处理。
具体地，所述S40还包括：
所述第一数字亮度波形信号输入至测量处理装置后，所述测量处理装置将所述第一数字亮度波形信号进行低通滤波处理。这是因为，在测量过程中，由于背光、型号、仪器等因素，导致采集到很多异常数据，特别是背光的脏颗粒，为此需要对数据进行滤波处理。所述测量处理装置优选为个人电脑（PC）。
S50，将经过低通滤波处理后的所述第一数字亮度波形信号进行多次移动平均处理，得到清晰显示的第二数字亮度波形信号。
具体地，所述S50还包括：
将经过低通滤波处理后的所述第一数字亮度波形信号进行多次移动平均处理，得到清晰显示的第二数字亮度波形信号。当进行所述移动平均处理时，取从4个以上的测量值中去掉最大值以及最小值后剩余的测量值的平均。
在一实施例中，如图3所示，为所述测量探头经滤波处理后采集到的原始数据的1灰阶闪烁波形图，横轴为时间，纵轴为亮度。此时，所述测量探头采用ELDIM公司的Photo diode型号的光电二极管（可测由电脑驱动的LED发出的低至-80dB水平的闪烁值）。由图3可知，其波形图杂乱无章，难以计算闪烁值。
如图4所示，为图3中原始数据经过移动平均处理得到的1灰阶闪烁波形图，横轴为时间，纵轴为亮度。此时，所述测量探头采用ELDIM公司的Photo diode型号的光电二极管（可测由电脑驱动的LED发出的低至-80dB水平的闪烁值）。由图4可知，其波形图相对于图3较清晰些，但还是难以计算闪烁值。
如图5所示，为图4中1灰阶闪烁波形图经过多次移动平均处理得到的最终版的1灰阶闪烁波形图，横轴为时间，纵轴为亮度。此时，所述测量探头采用ELDIM公司的Photo diode型号的光电二极管（可测由电脑驱动的LED发出的低至-80dB水平的闪烁值）。由图5可知，其波形图相对于图3已经可以明显显示，可以计算闪烁值。
S60，通过所述第二数字亮度波形信号，计算获得所述显示面板的闪烁度。
具体地，所述S60还包括：
通过可以明显显示的所述第二数字亮度波形信号，计算获得所述显示面板的闪烁度。其中，通过下述公式计算所述显示面板的闪烁度：
Flicker=2*（L max-L min）／（L max+L min）*100%
其中，Flicker为所述显示面板的闪烁度，L max为用于表示所述显示面板处于最大显示亮度的检测值，L min为用于表示所述显示面板处于最小显示亮度的检测值。
本申请实施例提供的ELDIM公司的Photo diode型号的光电二极管以及高速率多功能数据采集卡（DAQ采集卡），成本只有2000元左右，而一台CA310需要8W以上。一方面，使用上述装置能更好地节约成本；另一方面可以实现显示面板低亮度闪烁值的测量，这是CA310等其它仪器是无法实现的。
以上各个操作的具体实施可参见前面的实施例，在此不再赘述。
综上所述，本申请通过使用含有多个光电二极管的测量探头测量显示面板的闪烁画面，且运用移动平均法处理闪烁波形数据，在实现低亮度时对显示面板进行闪烁度测量的同时，减少了测量显示面板闪烁度的成本。
可以理解的是，对本领域普通技术人员来说，可以根据本申请的技术方案及其发明构思加以等同替换或改变，而所有这些改变或替换都应属于本申请所附的权利要求的保护范围。

Claims (10)

  1. 一种用于测量显示面板闪烁度的检测装置，其中，包括：
    测量探头，用于扫描提供有闪烁画面的待测显示面板，将所述显示面板的亮度转换成电压信号，获得所述显示面板的模拟亮度波形信号；
    模数转换装置，用于接收所述测量探头输出的模拟亮度波形信号，并转换成第一数字亮度波形信号；
    测量处理装置，用于将所述模数转换装置输出的第一数字亮度波形信号通过多次移动平均处理转换成清晰显示的第二数字亮度波形信号，计算获得所述显示面板的闪烁度。
  2. 如权利要求1所述的用于测量显示面板闪烁度的检测装置，其中，所述测量探头包括：
    多个光电二极管，用于获得所述显示面板的亮度信号；
    测量子单元，用于将所述至少一个亮度信号取平均值，获得所述显示面板的模拟亮度波形信号。
  3. 如权利要求1所述的用于测量显示面板闪烁度的检测装置，其中，所述测量处理装置还用于对所述第一数字亮度波形信号进行滤波处理。
  4. 如权利要求1所述的用于测量显示面板闪烁度的检测装置，其中，当进行所述移动平均处理时，取从4个以上的测量值中去掉最大值以及最小值后剩余的测量值的平均。
  5. 如权利要求1所述的用于测量显示面板闪烁度的检测装置，其中，所述测量处理装置通过下述公式计算所述显示面板的闪烁度：
    Flicker=2*（L max-L min）／（L max+L min）*100%
    其中，Flicker 为所述显示面板的闪烁度，L max为用于表示所述显示面板处于最大显示亮度的检测值，L min为用于表示所述显示面板处于最小显示亮度的检测值。
  6. 一种用于测量显示面板闪烁度的检测方法，其中，所述方法包括：
    S10，给待测显示面板提供闪烁画面；
    S20，利用一测量探头扫描所述显示面板，将所述显示面板的亮度转换成电压信号，获得所述显示面板的模拟亮度波形信号；
    S30，通过模数转换装置接收所述测量探头输出的模拟亮度波形信号，并转换成第一数字亮度波形信号；
    S40，将所述第一数字亮度波形信号进行低通滤波处理；
    S50，将经过低通滤波处理后的所述第一数字亮度波形信号进行多次移动平均处理，得到清晰显示的第二数字亮度波形信号；
    S60，通过所述第二数字亮度波形信号，计算获得所述显示面板的闪烁度。
  7. 如权利要求6所述的用于测量显示面板闪烁度的检测方法，其中，所述S20包括：
    S201，利用一测量探头获得所述显示面板的亮度信号；
    S202，将所述亮度信号转换成模拟亮度波形信号。
  8. 如权利要求6所述的用于测量显示面板闪烁度的检测方法，其中，所述S20中，所述测量探头包括：
    多个光电二极管，用于获得所述显示面板的亮度信号；
    测量子单元，用于将所述至少一个亮度信号取平均值，获得所述显示面板的模拟亮度波形信号。
  9. 如权利要求6所述的用于测量显示面板闪烁度的检测方法，其中，所述S30中，所述模数转换装置为高速率多功能数据采集卡。
  10. 如权利要求6所述的用于测量显示面板闪烁度的检测方法，其中，所述S50中，当进行所述移动平均处理时，取从4个以上的测量值中去掉最大值以及最小值后剩余的测量值的平均。
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